TTL MEMORIES SERIES 54/74. 54S/74S PROGRAMMABLE READ-ONLY MEMORIES BULLETIN NO. DL-S 7512258 , MAY 1975 • Titanium-Tungsten (Ti-W) Fuse Li nks for Fast , Low-Voltage , Reliable Programming • • AII Schottky-Clamped PROM's Offer: Fast Chip Se lect to Simplify System Decode Choice of Three-State or Open-Collector Outputs P-N-P Inputs for Reduced Loading on System Buffers/Drivers TYPE NUMBER (PACKAGES) 0 一55 C 回 to 1250 C CS 1 6ql ADE 9c1 1 GND$113| NC 12 BIT SIZE SN54188A(J , W) SN54S188(J , W) SN54S288(J , W) SN54S287(J , W) SN54S387(J , W) SN54S470(J) SN54S47 1(J) SN54S472(J) SN54S473(J) SN74188A(J , N) SN74S188(J , N) SN74S288(J , N) SN74S287(J , N) SN74S387(J , N) SN74S470(J , N) SN74S47 1( J , N) SN74S472(J , N) SN74S473(J , N) |rvcc 23 GND 2 22 口口 1 21 DO 2 20 D03 IP19 D04 18 DO 5 17 1 口 06 Applications Include: Microprogramming/Firmware Loaders Code Converters/Character Generators Translators/Emulators Address Mapping/Look-Up Tables OUTPUT 512 bits (64W x 8 B) SN74186(J , N) U Full Decoding and Chip Select Simplify System Design to 700 C (ORGANIZATION) CONFIGURA Tl ON SN54186(J , W) 512 BITS (64 WORDS BY 8 BITS) '186 M11| ADNCAZ3 。,OC • 256 bits (32W x 8 B) 1024 bits (256 W x 4 B) 2048 bits (256 W x 8 B) 4096 bits (512Wx8B) 256 BITS (32 WORDS BY 8 BITS) '188A , 'S188 , 'S288 DO 2 2(1 1 DO 3 3( 11 口 o 4 4r1 1 口 o 5 5( 11 口 066(11 口 o 7 7( 11 GND 8(]1 11) 15 11 )14 11J 13 11 )12 lI ìll 11 ìl0 ID9 cs AD E AD D AD C ADB AD A DO 8 TYPICAL ACCESS TIME (n5) FROM ADDRESS open-collector 50 55 open-collector open-collector three-state three.state open-collector open.collector three-state three'5tate open-collector 30 25 25 42 42 50 50 55 55 34 12 12 15 15 20 20 20 20 2048 BITS 1024 BITS (256 WORDS BY 4 BITS) (256 WORDS BY 8 BITS) 'S470 , 'S471 'S287 , 'S387 ADF 2( 11 AD E 3(11 AD D 4(1 1 ADA 5r1 1 ADB 6(11 AD C 7(11 GND 8(11 11)15 A 口 H 11)14 CS2 11J 13 CS 1 1I ~12 口 01 lI ìll D02 11)1 口口 03 11) 9 DO 4 F:, 16 DO 7 15 DO 8 |BM TOT 13 GND 2 NC-No mternal connection troisused for testingpurposes The logic at TO is undefined FROM CHIP SELECT Pin assignments for all 口 f 20 VCC 19 AD H 18 AD G 17 AD F 16 CS 2 15 CS 1 14 DO B 13 DO 7 12 D06 11 DO 5 4096 BITS (512 WORDS BY 8 BITS) 'S472 , 'S473 川 FEmvcc ADB 11 - 11)19 ADI 2( AD C 3 AD E DO 1 口 02 DO 3 DO 4 GND 1 16 AD F 15 CS 14 DO 8 13 口 07 12 D06 11 DO 5 these memories are the same for all packages. description These monolithic TTL programmable read-only memories (PROM's) feature titanium-tungsten (Ti-W) fuse links with each link designed to program in one millisecond or less. The Schottky-clamped versions of these PROM's offer considerable flexibility for upgrading existing designs or improving new designs as they feature full Schottky clamping for improved performance , low-current MOS-compatible p-n-p inputs , choice of bus-driving three-state or open-collector outputs , and improved chip-select access times. The high-complexity 2048- and 4096-bit PROM's can be used to significantly improve system memories as all are offered in the 20-pin dual-in-line package having pin-row spacings of 0.300 inch. 盯 问 RW肌 --NO TU SWU MDU AH Xm Tm- UEM Ni sn SH Nmm Em 『EIEX E TE 182 densitγfor fixed 575 SERIES 54/74, 54S/74S PROGRAMMABLE READ-ONLY MEMORIES description (continued) Data can be electronicallγprogrammed , as desired , at any bit location in accordance with the programming procedure specified. A 川 PROM's , except the 'S287 and 'S387 , are supplied with a low.logic-Ievel output condition stored at each bit location. The programming procedure open-circuits Ti-W metal links , which reverses the stored logic level at selected locations. 丁 he procedure is irreversible; once altered , the output for that bit location is permanently programmed. Outputs never having been altered may later be programmed to supply the opposite output leve l. Operation of the unit within the recommended operating conditions will not alter the memory content. A low level at the chip-select input(s) enables each PROM except the '186 , which is enabled by a high level at both chip-select inputs. The opposite level at any chip-select input causes the outputs to be off. The three-state output offers the convenience of an open-collector output with the speed of a totem-pole output; it can be bus-connected to other similar outputsγet it retains the fast rise time characteristic of the TTL totem-pole output. The open-collector output offers the capability of direct interface with a data line having a passive pull-up. schematics of inputs and outputs '186, '188A 下白 '186 , '188A EOUIVALENT OF EACHINPUT N …。一 V P CU CT TYPICAL OF ALL OUTPUTS -1. M ~OU TeUT 回 Programming circuit not shown 盯 η-o川 A quA『 -aLEl 国 '-cu F3 。 可 V cc oonu-HB 气J a EOUIVALENT OF EACHINPUT EM『'-明 ra- SAUT-UEEL 唱 'S188, 'S287 , 'S288, 'S387 'S470 , 'S471 , 'S472 , 'S473 3s-TL m-mb-AT , 'S287 , 'S288 'S471 , 'S472 TYPICAL OF ALL OUTPUTS Vcc U T P' U T JNPUT OUTPUT Programming circuit not shown Programming circuit not shown absolute maximum ratings over operating free-air temperature range (unless otherwise noted) ·oto +k 、, FL 。 --一 101 。 ·户U 。UFU EυFD Runu +k 755 5 旷旷 IFD ro-r呵 D,‘叮 VVVCCC 。 Supply voltage (see Note 1) Input voltage Off-state output voltage Operating free-air temperature range: SN54' , SN54S' Circuits SN74' , SN74S' Circuits Storage temperature range NOTE1: Voltage vaJues are with respect to network ground terminal (GND 2 of '186) ,. For '186 GND 1 and both GND 2 terminaJs are all connected to system ground except during programming. The supply-voJtage rating d 口 es n 口 t appJy during programming of the '188 , '188A , or the 5451745 PROM's. 575 TEXAS JNCORPORATED INSTRUMENTS 183 TVPES SN54186. SN74186 PROGRAMMA8LE READ-ONLY MEMORIES recommended conditions for programming Vcc GND 1 Supply voltages (see Note 2) MIN 4.75 High level Input conditions (see Note 3 and 4) Low level Output voltage Output current , output being programmed Duration of programming pulse (see Note 5) Programming duty cycle Free-air temperature • NOM MAX UNITI 5 5.25 V I -6 t 一5 Open circuit or equivalent -6 t V 一5 一 6.5 t 丰 V 95 mA 一 120 -130 1 20 ms 25 35 % o 55 。 C t Absolute ma 川 mum ratings. 丰 Clamp to ensure output does not exceed 一 0.5 V with respect to G ND 1. NOTES: 2. Voltage values are with respect to the GND 2 terminals. 3. The high.level (of f) output of a Series 54 /7 4 or 54S /7 4S open-collector gate with no pull-up resistor meets the requirements for a high-Ievel input condition. 4. The low-Ievel input voltage must be within :t 0.5 v 口 Its of the applied voltage at GND 1 5. Programming is guaranteed if the pulse is applied to the output for 10 ms. Typically , programming occurs in less than 1 ms. step-by-step programming procedure Programming the SN54186 or SN74186 is performed individually for each of the 512 bit locations and consists basicallγof applying a current pulse to each output terminal where a low logic level is to be changed to a high (oft) leve l. The power supply and ground connections described below are designed to ensure that alteration of the memory content occurs during the programming procedure only. 回 1. Connect the memory as shown in Figure 1. To address a particular word in the memory , set the input switches to the binary equivalent of that word where a low logic level is as specified under "recommended conditions for programming" and a high logic level is either an open circuit or connection to an open-collector TTL gate with no pull-up resistor. 2. Applγa 3. Repeat Step 2 for each high-Ievel output desired in the word addressed (program only one bit at a time). Anγbit that is to remain at a low level should have its respective output open-circuited during the entire programming cycle for the addressed word. programming current pulse as specified to the pin associated with the first bit to be changed from a low-Ievel to a high-Ievel output. 4. Set the next input address and repeat steps 2 and 3 at a programming duty cycle of 35% maximum. This procedure is repeated for each input address for which a specific output word pattern is desired. A low logic level can always be changed to a high logic level simply by repeating Steps 1 and 2. Once programmed to provide a high logic level , the output cannot be changed to supply a low logic leve l. NOTE: When verification indicates that a bit did not program , repeat steps 2 through 4. If the bit did n 口 t program after the second application of a 1-millisecond programming pulse , repeat steps 2 through 4 using programming pulse time of 10 to 20 millisec 口 nds. Regardless of the programming pulse duration , its total average pulse time should be no more than 35% of the programming cycle. nγ •N P L ℃ tJ1 。 OPENCOLLECTOR OUTPUT INO PULL.UP RESISTORI 007 CS1 CS2 GNO 1 008 -5 V tu -6 V FIGURE 1-PROGRAMMING CONNECTIONS E S 阳 出 TMUUEU Rwm Tn RIDe,ET NU sm旧 阳 N 刀引 TH Am xo SI ER IN 184 575 TYPES SN54188A, SN74188A, AND SERIES 54S/74S PROGRAMMABLE READ-ONLY MEMORIES recommended conditions for programming Supply voltage. VCC (see Note 6) Steady state Progra 口1 pulse Input voltage High level. VIH Low level. VIL '188A SN54S'. SN74S' NOM MAX MIN NOM MAX 5 5.75 4.75 5 5.75 11 t 10 10.5 11 t 10.5 5 5 2.4 。 0.5 。 0.5 See load circuit See load circuit (Figure 2) (Figure 2) MIN 4.75 10 2 .4 Termination of all outputs except the one to be programmed Voltage applied to output to be programmed. VO(p r) (see Note 7) 0.25 +0.3 -0.8 20 35 55 o 0.25 0.3 V I Duration of VCC programming pulse Y (see Figure 3 and Note 8) 1 20 ms Programming duty cycle 25 25 35 % I 。c Free-air temperature 。 。 55 r Absolute maximum ratings. NOTES: 6. Voltage values are with respect to the GND 2 terminals. 7. The '188A , 'S 188 , 'S288 , 'S470 , 'S471 , 'S472 , and 'S473 are supplied with all bit locations containing a low logic level , and programming a bit changes the output of the bit to high logic leve l. The 'S287 and 'S387 are supplied with all bit outputs at a high logic level , and programming a bit changes it to a low logic leve l. 8. Programming is guaranteed if the pulse applied is 10 ms long. Typically , programming occurs in 1 ms step-by-step programming procedure 1. Apply steady-state supply voltage (VCC =5 V) and address the word to be programmed. 回 2. Verify that the bit location needs to be programmed. If not. proceed to the next bit. 3. If the bit requires programming. disable the outputs by applying a high-Iogic-Ievel voltage to the chip-select input{s). 4. Only one bit location is programmed at a time. Connect each output not being programmed to 5 V through 3.9 k S1 and apply the voltage specified in the table to the output to be programmed. Maximum current out of the programming output supply during programming is 150 mA. 5. Step VCC to 10.5 V nomina l. Maximum supply current required during programming is 750 mA. 6. Applγa low-Iogic-Ievel voltage to the chip-select input{s). This should occur between 10μ5 and 1 ms after VCC has reached its 10.5-V leve l. See programming sequence of Figure 3. 7. After the X pulse time (1 ms) is reached. a high logic level is applied to the chip-select inputs to disable the outputs. 10μ5 to 1 ms after the chip-select input{s) reach a high logic level , VCC should be stepped down to 5 V at which level verification can be accomplished. 8. Within 9. The chip-select input{s) may be taken to a low logic level (to permit program verification) 10μs or more after V CC reaches its steady-state value of 5 V. 10. At a Y pulse duty cycle of 35% or less. repeat steps 1 through 8 for each output where it is desired to program a bit. NOTES: A) vcc should be removed between program pulses to reduce dissipation and chip temperatures. See Figure 3. B) When verificat 旧 n indicates that a bit did not program , repeat steps 3 through 9. If the bit did not program after the second application of a 1.ms X pulse , repeat steps 3 through 9 using an X pulse time of 10 to 20 ms. Regardless of the x duration , the total average pulse time of Y should be no more than 35% of the programming cycle 5V ~ 3.9 k l! OUTPUT ---..,) LOAD CIRCUIT FO I'{ EACH OUTPUT NOT BEING PROGRAMMED OR FOR PROGRAM VERIFICATION FIGURE 2 V'L APPlY REMOVE VO(prl VO(p叫 FIGURE 3-VOLTAGE WAVEFORMS FOR PROGRAMMING a17 RED- S T Tm-UEUEH NU smm 坦 忧 涅 RW肌 NC 盯 IB Nω川 EE 且 S TRxo Am E 575 185 TVPES SN54186. SN54188A. SN74186. SN74188A PROGRAMMABLE READ-ONLY MEMORIES recommended operating conditions MIN Supply voltage , VCC SN54186 SN74186 SN54188A SN74188A NOM 405 5 MAX MIN 505 4075 NOM UNIT MAX 5 5025 V Higholevel output voltage , VOH 505 505 V Lo w- Ieve1 output current , IOL 12 12 mA 70 。c Operating free-air temperature , T A 一 55 125 o electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER '186 TEST CONDITIONSt MIN VIH Higholevel inputvoltage VIL Low-Ievel input voltage VIK Input clamp voltage IOH Higholevel output current VOL Low-Ievel output voltage 回 '188A MAX 2 VCC = MIN , 11 = -12 mA Vcc = MIN , VIH = 2 V. VIL = 008 V Input current at maximum Vcc = MIN , VIH = 2V , VIL = 008 V , IOL = 12 mA Vcc = MAX , VI = 505 V IIH High-Ievel input current Vcc = MAX , VI = 2 .4 V IIL Low-Ievel input current Vcc = MAX , VI = 0 .4 V ICC Supply current Vcc = MAX , See Note 9 ICCH Supplycurrent , alloutputshigh ICCL Supply current , all outputslow Co Off-state output capacitance 11 TYP 丰 input voltage VO = 2 V , TYP 丰 MAX UNIT V 2 008 008 一1. 5 一1. 5 VOH = 2 .4 V 100 VOH=505V 200 100 0 .4 0 .4 5 V V μA V 1 1 mA 40 40 μA mA 80th CS at 0 V 47 95 80th CS at 405 V 80 120 Vcc = MAX VCC = 5 V , MIN mA See Note 10 50 80 See Note 11 82 110 f = 1 MHz 605 mA pF 605 tF口 r conditions shown as MIN or MAX , use the appropriate value specified under recommended operating conditions o 0 +AII typical values are at VCC = 5 V , T A = 25 Co NOTES: 90 ICC of '186 is measured with all outputs open and the address inputs at 405 Vo Typical values are for 50% of the bits programmedo 100 ICCH of '188A is measured with all inputs at 405 V , all outputs openo 110 ICCL of '188A is measured with the chip-select input grounded , all other inputs at 405 V , and all outputs openo The typical value shown is for the worst-case condition of all eight outputs low at one timeo This condition may not be possible after the device has been programmed switching characteristics, VCC = 5 V, TA = 25 C 0 TYPE TEST CONDITIONS tpLH (n51 ta(adl (n51 ta(CS!CSI (n51 Access time from Access time from chip select (enable time) address Propagation delay tin、 e , low-to-h igh-Ievel output from chip select (disable time) '186 同百7 CL = 30 pF , RL2 = 600 n, RL 1 = 400 n, See Figure 4 TYP MAX TYP MAX TYP 50 75 55 75 40 75 30 50 34 50 23 50 Eω T TmREDeh N3SU Rwm UEU SEγ N 缸 克 肝 回 tB sm川 Nω川 EE 且 S TRxo Am E 186 MAX 575 SERIES 54S/74S PROGRAMMABLE READ-ONLY MEMORIES WITH OPEN-COLLECTOR OUTPUTS recommended operating conditions 'S387 , 'S188 Supply voltage , VCC MIN NOM Series 54S 4.5 5 Series 74S 4.75 5 UNIT 'S470 , 'S473 MAX MIN NOM MAX 5.5 4.5 5 5.5 5.25 4.75 5 5.25 V High-Ievel output voltage , VOH 5.5 5.5 V Low-Ievel output current , IOL 20 16 mA Ope r<l ting free-air temperature , T A -55 125 -55 。 70 o Series 74S 125. 。c 70 electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) 「 PARAMETER VIH High-Ievel input voltage VIL Low-Ievel input voltage VIK Input clamp voltage TEST CONDITIONSt MIN TYP 丰 11 =一 18mA Vcc = MIN , High-Ievel output current Low-Ievel output voltage V 一1. 2 V μA VIH=2V , 100 Vcc = MIN , VIH = 2 V , VIL = 0.8 V , IOL = MAX 11 Input current at maximum input voltage Vcc = MAX , VI = 5.5 V IIH High-Ievel input current Vcc = MAX , VI = 2.7 V IIL Low-Ievel input current Vcc = MAX , VI=0.5V Vcc = MAX , ICC 0.8 50 VIL = 0.8 V VOL Supply current UNIT V Vcc = MIN , IOH MAX 2 'S188 0.5 25 μAI 一 250 μAI 80 110 Chip select(s) at 0 V , 'S387 100 135 Outputs open , 'S4 70 110 155 See Note 12 'S473 120 回 V switching characteristics over recommended ranges of T A and VCC (unless otherwise noted) TYPE TEST CONDITIONS tpLH (ns) Propagation delay time , ta(ad) (ns) ta( Cs) (ns) Access time from Access time from address chip select (enable time) low-to.high-Ieveloutput from chip select (disable time) TYP 丰 MAX TYP 丰 MAX TYP 丰 MAX SN54S188 25 50 12 30 12 30 SN74S188 25 40 12 25 12 25 SN54S387 CL=30pF , 42 75 15 401' 15 401' SN74S387 RL1 =300 .11, 42 65 15 35 15 35 SN54S470 RL2 = 600 .11, 50 80 20 40 15 35 SN74S470 See Figure 4 50 70 20 35 15 30 SN54S473 55 20 15 SN74S473 55 20 15 t For conditions shown as M 1N 口 r MAX , use the appropriate value specified under recommended operating conditions. 0 丰 AII typical values are at VCC = 5 V , T A = 25 C. 0 • An SN54S387 in the W p~~kage operating at free-air temperatures above 108 C requires a heat sink that provides a thermal resistance from case to free air , ReCA' 口 f not more than 42 oC/W. PTentative specí ~ications. NOTE 12: The typical values of ICC shown are with all outputs low. S EM NU SET T 187 坦 旦 RtDC 山 阿 盯 川VEU TMSWU EEENC IB RM以 Am xo SX Nω 川 E T 575 SERIES 54S/74S PROGRAMMABLE READ-ONLY MEMORIES WITH 3-STATE OUTPUTS recornrnended operating conditions 'S287 'S288 'S471 , 'S472 Supply voltage , VCC High-Ievel output current , 10H MIN NOM Series 54S 4.5 5 Series 74S 4.75 5 MAX UNIT MIN NOM MAX 5.5 4.5 5 5.5 5.25 4.75 5 5.25 Series 54S 一2 -2 Series 74S -6.5 一 6.5 Low-Ievel output current , 10L 16 Operating free-air temperature , T A 20 Series 54S 一 55 125 一 55 Series 74S o 70 o 125. V mA mA 。C 70 electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER 回 VIH High-Ievel input voltage VIL Low-Ievel input voltage VIK Input clamp voltage VOH High-Ievel output voltage TEST CONDITIONSt Vcc = MIN , 11 = -18 mA Vcc = MIN , VIH = 2 V , VIL = 0.8 V , 10H = MAX Vcc = MIN , VIH = 2 V , Low-Ievel output voltage VIL = 0.8 V , 10L = MAX l Off-state output current , high-Ievel voltage applied Vcc = MAX , VIH=2V , Off-state output current , Vcc = MAX , low-Ievel voltage applied VO = 0.5 V 10ZL Input current at maximum 11 input voltage TYP 丰 SN74S' MAX MIN 2 .4 VIH = 2 V , VI = 5.5V MAX UNIT V 0.8 0.8 V 一 1.2 一1. 2 V 3 .4 VO=2 .4 V Vcc = MAX , TYP 丰 2 2 VOL OZH SN54S' MIN 2 .4 V 3.2 0.5 0.5 V 50 50 μA 一50 -50 μA 11 mA IIH High-Ievel input current Vcc = MAX , VI = 2.7 V 25 25 μA IIL Low-Ievel input current Vcc = MAX , VI = 0.5 V 一250 一 250 μA 10S Short-circuit output current S 一 100 mA ICC Supply current 一30 Vcc = MAX Vcc= MAX , 'S287 Chip select(s) at 0 V , Outputs open , See Note 12 一 100 100 135 'S288 80 'S471 110 'S472 120 -30 100 135 110 80 110 155 110 155 I I mA 120 switching characteristics over recommended ranges of T A and VCC (unless otherwise noted) TYPE TEST CONDITIONS ta(ad) (ns) ta(CS) (ns) tpxz (n5) Access time Access time from Disable time from from address chip select (enable time) MAX TYP 丰 MAX TYP 丰 42 75p 15 40p 12 SN54S287 SN74S287 SN54S288 SN74S288 SN54S471 SN74S471 SN54S472 high or low level TYP 丰 CL = 30 pF for ta(ad) and ta(CS) , 5 pF for tpxz; RL = 300 S1; See Figure 5 SN74S472 MAX 42 65 15 35 12 25 50 12 30 8 25 40 12 25 8 20 50 80 20 40 15 35 50 70 20 35 15 30 55 20 15 55 20 15 30 t For conditi 口 ns shown as MIN or MAX , use the appropriate value specified under rec 口 mmended operati 吨 conditions. 0 iAIlt川 al values are 川 cc = 5 V , T A = 25 C Not more than one output sh 口 uld be shorted at a time and duration of the short-circuit should not exceed one second. o .An SN54S287 in the W package operating at free-air temperatures above 10S C requires a heat sink that provides a thermal resistance from 0 case-to-free-air , ReCA' 口f not more than 42 C/W. NOTE 12: The typl;;I.values of ICC shown are with all outputs low. pTentative specifications 。 TmTm s1T Qun Rwm UEU Em N: NC FADe 品 ''且 盯 tE sm旧 Nω川 THxo Am SI E 188 575 SERIES 54/74 , 54S/74S PROGRAMMABLE READ-ONLY MEMORIES PARAMETER MEASUREMENT INFORMATION Vcc CHIP CS 3V SELECT INPUT(S) FROM OUTPUT UNDER TEST RL2 = 600 n VOLTAGE WAVEFORM5 LOAD CIRCUIT NOTES: A. The input pulse generat口 r has the following characteristics: Zout "" 50 n and PRR';; 1 MHz. For Series 54 /7 4 , t r ';; 7 ns , tf .;; 7 ns. For Series 54S /7 4S , tr .;; 2.5 ns , tf';; 2.5 ns. B. CL includes pr口 be and jig capacitance. C. The pulse generator is connected to the input under test. The other inputs, memory content permitting , are connected so that the input will switch the output under test. 回 FIGURE 4-SWITCHING TIMES OF '186 , '188A , '5188, 'S470 , 'S387 , AND 'S473 Vcc ADDRES5 INPUT5 (5ee N 口 te A) TEST POINT OUTPUT (51 and 52 closed) FROM OUTPUT uNDER TEST ACCESS TIME FROM ADDRESS INPUTS VOL TAGE WAVEFORMS CHIP5ELECT INPUT5 (See Note B) 3V 1.5 V '→-一一一 OV !唾钟 tpLZ __""4.5V i←一→←ta( Cs) WAVEFORM 1 CL includes probe and jig capacitance AII diodes are 1 N3064 f飞一 --VOL 问一一嗣-ta( Cs) 1.5 Lτ 」二 VOH V 、、t. 0.5 V tpHZ 忡..、-坦 OV tpxz = tpHZ or tpLZ ACCESS (ENABLE) T1 ME AND DISABLE TIME FROM CHIP SELECT VOLTAGE WAVEFORMS LOAD CIRCUIT NOTES: lμ[0.5 V See Note C) WAVEFORM 2 (51 open , 52 closed , See Note C) A. When measuring access times from address inputs , the chip.select input(s) 以 are) low. B. When measuring access and disable times from chip.select input(s) , the address inputs are steady.state C. Wavef口 rm 1 is for the output with internal conditions such that the output is low except when disabled. Waveform 2 is for the output with internal conditions such that the output is high except when disabled. D. Input waveforms are supplied by pulse generators having the following characteristics: tr .;; 2.5 ns , tf .;; 2.5 ns , PRR .;; 1 MHz , and Zout "" 50 n. FIGURE 5-SWITCHING TIMES OF 'S287 , 'S288 , 'S471 , AND 'S472 R川肌 NC sm 川 EE 且 tB Nω川 们 啊 TEXAS INSTRUMENTS RESERVES THE RIGHT TO MAKE <HANGES AT ANY T1 ME IN ORDER TO IMPROVE DESIGN AND TO SUPPl Y THE BEST PRODUCT POSSIBlE THXOSX E PRINTED IN U.5 A TI connol Ollume ony relponlibilily for ony circuill Ihown or repre\enl Ihol Ihey ore "ee from polenl infringemenl A 575 TM- UEU TE MDU EW Ni SU 189