PHILIPS PHP47NQ10T

PHP47NQ10T; PHB47NQ10T
N-channel enhancement mode field-effect transistor
Rev. 01 — 16 May 2001
Product data
1. Description
N-channel enhancement mode field-effect power transistor in a plastic package using
TrenchMOS™1 technology.
Product availability:
PHP47NQ10T in SOT78 (TO-220AB)
PHB47NQ10T in SOT404 (D2-PAK).
2. Features
■ Fast switching
■ Very low on-state resistance.
3. Applications
■ DC to DC converters
■ Switched mode power supplies.
c
4. Pinning information
c
Table 1:
Pinning - SOT78 and SOT404, simplified outline and symbol
Pin
Description
1
gate (g)
2
drain (d)
3
source (s)
mb
mounting base;
connected to
drain (d)
Simplified outline
Symbol
mb
mb
[1]
d
g
2
1
3
MBK116
MBK106
1 2 3
SOT78 (TO-220AB)
SOT404 (D2-PAK)
[1]
It is not possible to make connection to pin 2 of the SOT404 package.
1.
TrenchMOS is a trademark of Royal Philips Electronics.
MBB076
s
Philips Semiconductors
PHP47NQ10T; PHB47NQ10T
N-channel enhancement mode field-effect transistor
5. Quick reference data
Table 2:
Quick reference data
Symbol
Parameter
Conditions
Typ
Max
Unit
VDS
drain-source voltage (DC)
Tj = 25 to 175 °C
−
100
V
ID
drain current (DC)
Tmb = 25 °C; VGS = 10 V
−
47
A
Ptot
total power dissipation
Tmb = 25 °C
−
166
W
Tj
junction temperature
−
175
°C
RDSon
drain-source on-state resistance
20
28
mΩ
Min
Max
Unit
Tj = 25 °C; VGS = 10 V; ID = 25 A
6. Limiting values
Table 3: Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol
Parameter
Conditions
VDS
drain-source voltage (DC)
Tj = 25 to 175 °C
−
100
V
VDGR
drain-gate voltage (DC)
Tj = 25 to 175 °C; RGS = 20 kΩ
−
100
V
VGS
gate-source voltage (DC)
−
±20
V
ID
drain current (DC)
Tmb = 25 °C; VGS = 10 V
Figure 2 and 3
−
47
A
Tmb = 100 °C; VGS = 10 V
Figure 2
−
33
A
IDM
peak drain current
Tmb = 25 °C; pulsed; tp ≤ 10 µs;
Figure 3
−
187
A
Tmb = 25 °C; Figure 1
Ptot
total power dissipation
−
166
W
Tstg
storage temperature
−55
175
°C
Tj
operating junction temperature
−55
175
°C
Source-drain diode
IS
source (diode forward) current
(DC)
Tmb = 25 °C
−
47
A
ISM
peak source (diode forward)
current
Tmb = 25 °C; pulsed; tp ≤ 10 µs
−
187
A
unclamped inductive load;
IAS = 30 A; tp = 0.1 ms; VDD ≤ 25 V;
RGS = 50 Ω; VGS = 5 V; starting
Tj = 25 °C; Figure 4
−
45
mJ
Avalanche ruggedness
EAS
non-repetitive avalanche energy
© Philips Electronics N.V. 2001. All rights reserved.
9397 750 08243
Product data
Rev. 01 — 16 May 2001
2 of 14
PHP47NQ10T; PHB47NQ10T
Philips Semiconductors
N-channel enhancement mode field-effect transistor
03aa24
03aa16
120
Pder
(%)
100
120
Ider
(%)
100
80
80
60
60
40
40
20
20
0
0
0
50
100
150
0
200
o
Tmb ( C)
50
100
150
200
o
Tmb ( C)
VGS ≥ 10 V
P tot
P der = ---------------------- × 100%
P
°
ID
I der = ------------------- × 100%
I
°
tot ( 25 C )
D ( 25 C )
Fig 1. Normalized total power dissipation as a
function of mounting base temperature.
Fig 2. Normalized continuous drain current as a
function of mounting base temperature.
003aaa097
103
003aaa098
102
ID
(A)
IAS
RDSon = VDS / ID
(A)
tp =
1 µs
102
25 oC
10 µs
10
100 µs
10
1 ms
D.C.
o
Tj prior to avalanche = 150 C
10 ms
100ms
1
1
1
10
102
3
VDS (V) 10
10-3
Tmb = 25 °C; IDM is single pulse.
10-1
1
tp (ms)
10
Unclamped inductive load; VDD ≤ 25 V; RGS = 50 Ω;
VGS = 5 V; starting Tj = 25 °C and 150 °C.
Fig 3. Safe operating area; continuous and peak drain
currents as a function of drain-source voltage.
Fig 4. Non-repetitive avalanche ruggedness current
as a function of pulse duration.
© Philips Electronics N.V. 2001. All rights reserved.
9397 750 08243
Product data
10-2
Rev. 01 — 16 May 2001
3 of 14
PHP47NQ10T; PHB47NQ10T
Philips Semiconductors
N-channel enhancement mode field-effect transistor
7. Thermal characteristics
Table 4:
Thermal characteristics
Symbol
Parameter
Conditions
Value
Unit
Rth(j-mb)
thermal resistance from junction to mounting Figure 5
base
0.9
K/W
Rth(j-a)
thermal resistance from junction to ambient
SOT78 package; vertical in still air.
60
K/W
Rth(j-a)
thermal resistance from junction to ambient
SOT404 package; mounted on
printed circuit board; minimum
footprint.
50
K/W
7.1 Transient thermal impedance
003aaa099
1
δ=
Zth (j-mb)
0.5
(K/W)
0.2
10-1
0.1
0.05
0.02
10-2
δ=
P
Single pulse
tp
T
t
tp
T
10-3
10-7
10-6
10-5
10-4
10-3
10-2
10-1
1
10
tp (s)
Fig 5. Transient thermal impedance from junction to mounting base as a function of
pulse duration.
© Philips Electronics N.V. 2001. All rights reserved.
9397 750 08243
Product data
Rev. 01 — 16 May 2001
4 of 14
PHP47NQ10T; PHB47NQ10T
Philips Semiconductors
N-channel enhancement mode field-effect transistor
8. Characteristics
Table 5: Characteristics
Tj = 25 °C unless otherwise specified
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
ID = 250 µA; VGS = 0 V
100
−
−
V
Tj = 25 °C
2
3
4
V
Tj = 175 °C
1
−
−
V
Tj = 25 °C
−
0.05
10
µA
Tj = 175 °C
−
−
500
µA
−
2
100
nA
Tj = 25 oC
−
20
28
mΩ
Tj = 175 °C
−
−
76
mΩ
−
66
−
nC
−
12
−
nC
−
21
−
nC
−
2320
3100
pF
−
315
378
pF
−
187
256
pF
Static characteristics
V(BR)DSS
drain-source breakdown
voltage
VGS(th)
gate-source threshold voltage ID = 1 mA; VDS = VGS;
Figure 10
IDSS
drain-source leakage current
VGS = 0 V; VDS = 100 V
IGSS
gate-source leakage current
VDS = 0 V; VGS = ±20 V
RDSon
drain-source on-state
resistance
VGS = 10 V; ID = 25 A;
Figure 8 and 9
Dynamic characteristics
Qg(tot)
total gate charge
Qgs
gate-source charge
Qgd
gate-drain (Miller) charge
Ciss
input capacitance
Coss
output capacitance
Crss
reverse transfer capacitance
td(on)
turn-on delay time
tr
rise time
td(off)
tf
ID = 40 A; VDD = 80 V;
VGS = 10 V; Figure 15
VGS = 0 V; VDS = 25 V;
f = 1 MHz; Figure 13
−
15
23
ns
−
70
105
ns
turn-off delay time
−
83
116
ns
fall time
−
45
63
ns
VDD = 30 V; RD = 1.2 Ω;
VGS = 10 V; RG = 10 Ω
Source-drain diode
VSD
source-drain (diode forward)
voltage
IS = 25 A; VGS = 0 V;
Figure 14
−
0.85
1.2
V
trr
reverse recovery time
−
66
−
ns
Qr
recovered charge
IS = 47 A;
dIS/dt = −100 A/µs;
VGS = -10 V; VR = 30 V
−
0.24
−
µC
© Philips Electronics N.V. 2001. All rights reserved.
9397 750 08243
Product data
Rev. 01 — 16 May 2001
5 of 14
PHP47NQ10T; PHB47NQ10T
Philips Semiconductors
N-channel enhancement mode field-effect transistor
003aaa100
180
003aaa101
100
VGS = 10 V
ID
160
(A)
140
20 V
8.0 V
ID
(A)
80
7.5 V
120
7.0 V
100
6.5 V
60
80
6.0 V
40
o
60
5.5 V
40
5.0 V
20
Tj = 175 oC
20
25 oC
4.5 V
0
0
2
4
6
0
8
10
VDS (V)
0
Tj = 25 °C
4
6
VGS (V)
8
Tj = 25 °C and 175 °C; VDS > ID × RDSon
Fig 6. Output characteristics: drain current as a
function of drain-source voltage; typical values.
Fig 7. Transfer characteristics: drain current as a
function of gate-source voltage; typical values.
003aaa103
003aaa102
65
2.0
6.5 V
6.0 V
VGS = 5.5 V
RDSon 60
a
1.8
(mΩ) 55
1.6
50
1.4
1.2
45
7.0 V
40
1.0
7.5 V
35
0.8
8.0 V
30
0.6
10 V
25
0.4
20
0.2
0
-60
15
5
25
45
65
85
105
125
ID (A)
Tj = 25 °C
-20
20
60
100
140
180
Tj (oC)
R DSon
a = --------------------------R DSon ( 25 °C )
Fig 8. Drain-source on-state resistance as a function
of drain current; typical values.
Fig 9. Normalized drain-source on-state resistance
factor as a function of junction temperature.
© Philips Electronics N.V. 2001. All rights reserved.
9397 750 08243
Product data
2
Rev. 01 — 16 May 2001
6 of 14
PHP47NQ10T; PHB47NQ10T
Philips Semiconductors
N-channel enhancement mode field-effect transistor
VGS(th)
(V)
003aaa078
10-1
003aaa023
4.5
ID
(A)
4
10-2
max
3.5
2%
10-3
3
typ
98%
typ
2.5
10-4
2
min
1.5
10-5
1
0.5
10-6
0
-60
-20
20
60
100
140
Tj (oC)
0
1
2
3
4
180
5
VGS (V)
Tj = 25 °C
ID = 1 mA; VDS = VGS
Fig 10. Gate-source threshold voltage as a function of
junction temperature.
003aaa104
45
Fig 11. Sub-threshold drain current as a function of
gate-source voltage.
003aaa105
5
Ciss,
Coss,
gfs
(S) 40
Ciss
Crss 4
(nF)
35
30
3
Coss
25
20
2
Crss
15
1
10
5
0
10-2
0
0
20
40
60
80
100
10-1
Tj = 25 °C; VDS = 25 V
10
102
VGS = 0 V; f = 1 MHz
Fig 12. Forward transconductance as a function of
drain current; typical values.
Fig 13. Input, output and reverse transfer capacitances
as a function of drain-source voltage; typical
values.
© Philips Electronics N.V. 2001. All rights reserved.
9397 750 08243
Product data
1
VDS (V)
ID (A)
Rev. 01 — 16 May 2001
7 of 14
PHP47NQ10T; PHB47NQ10T
Philips Semiconductors
N-channel enhancement mode field-effect transistor
003aaa106
100
(A)
003aaa107
10
IS
VGS
(V)
80
8
VDD = 20 V
60
Tj = 175 oC
6
VDD = 80 V
25 oC
40
4
20
2
0
0
0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
0
10
20
30
VSD (V)
50
60
70
QG (nC)
Tj = 25 °C and 175 °C; VGS = 0 V
ID = 40 A; VDD = 20 V and 80 V
Fig 14. Source (diode forward) current as a function of
source-drain (diode forward) voltage; typical
values.
Fig 15. Gate-source voltage as a function of gate
charge; typical values.
© Philips Electronics N.V. 2001. All rights reserved.
9397 750 08243
Product data
40
Rev. 01 — 16 May 2001
8 of 14
PHP47NQ10T; PHB47NQ10T
Philips Semiconductors
N-channel enhancement mode field-effect transistor
9. Package outline
Plastic single-ended package; heatsink mounted; 1 mounting hole; 3-lead TO-220AB
E
SOT78
A
A1
p
q
mounting
base
D1
D
L2
L1(1)
Q
b1
L
1
2
3
b
c
e
e
0
5
10 mm
scale
DIMENSIONS (mm are the original dimensions)
UNIT
A
A1
b
b1
c
D
D1
E
e
L
L1(1)
L2
max.
p
q
Q
mm
4.5
4.1
1.39
1.27
0.9
0.7
1.3
1.0
0.7
0.4
15.8
15.2
6.4
5.9
10.3
9.7
2.54
15.0
13.5
3.30
2.79
3.0
3.8
3.6
3.0
2.7
2.6
2.2
Note
1. Terminals in this zone are not tinned.
OUTLINE
VERSION
REFERENCES
IEC
SOT78
JEDEC
EIAJ
3-lead TO-220AB
SC-46
EUROPEAN
PROJECTION
ISSUE DATE
00-09-07
01-02-16
Fig 16. SOT78 (TO-220AB)
© Philips Electronics N.V. 2001. All rights reserved.
9397 750 08243
Product data
Rev. 01 — 16 May 2001
9 of 14
PHP47NQ10T; PHB47NQ10T
Philips Semiconductors
N-channel enhancement mode field-effect transistor
Plastic single-ended surface mounted package (Philips version of D2-PAK); 3 leads
(one lead cropped)
SOT404
A
A1
E
mounting
base
D1
D
HD
2
Lp
1
3
c
b
e
e
Q
0
2.5
5 mm
scale
DIMENSIONS (mm are the original dimensions)
UNIT
A
A1
b
c
D
max.
D1
E
e
Lp
HD
Q
mm
4.50
4.10
1.40
1.27
0.85
0.60
0.64
0.46
11
1.60
1.20
10.30
9.70
2.54
2.90
2.10
15.80
14.80
2.60
2.20
OUTLINE
VERSION
REFERENCES
IEC
JEDEC
EIAJ
EUROPEAN
PROJECTION
ISSUE DATE
99-06-25
01-02-12
SOT404
Fig 17. SOT404 (D2-PAK).
© Philips Electronics N.V. 2001. All rights reserved.
9397 750 08243
Product data
Rev. 01 — 16 May 2001
10 of 14
Philips Semiconductors
PHP47NQ10T; PHB47NQ10T
N-channel enhancement mode field-effect transistor
10. Revision history
Table 6:
Revision history
Rev Date
01
20010516
CPCN
Description
-
Product data. Initial version.
© Philips Electronics N.V. 2001. All rights reserved.
9397 750 08243
Product data
Rev. 01 — 16 May 2001
11 of 14
PHP47NQ10T; PHB47NQ10T
Philips Semiconductors
N-channel enhancement mode field-effect transistor
11. Data sheet status
Data sheet status [1]
Product status [2]
Definition
Objective data
Development
This data sheet contains data from the objective specification for product development. Philips Semiconductors
reserves the right to change the specification in any manner without notice.
Preliminary data
Qualification
This data sheet contains data from the preliminary specification. Supplementary data will be published at a
later date. Philips Semiconductors reserves the right to change the specification without notice, in order to
improve the design and supply the best possible product.
Product data
Production
This data sheet contains data from the product specification. Philips Semiconductors reserves the right to
make changes at any time in order to improve the design, manufacturing and supply. Changes will be
communicated according to the Customer Product/Process Change Notification (CPCN) procedure
SNW-SQ-650A.
[1]
[2]
Please consult the most recently issued data sheet before initiating or completing a design.
The product status of the device(s) described in this data sheet may have changed since this data sheet was published. The latest information is available on the Internet at
URL http://www.semiconductors.philips.com.
12. Definitions
13. Disclaimers
Short-form specification — The data in a short-form specification is
extracted from a full data sheet with the same type number and title. For
detailed information see the relevant data sheet or data handbook.
Life support — These products are not designed for use in life support
appliances, devices, or systems where malfunction of these products can
reasonably be expected to result in personal injury. Philips Semiconductors
customers using or selling these products for use in such applications do so
at their own risk and agree to fully indemnify Philips Semiconductors for any
damages resulting from such application.
Limiting values definition — Limiting values given are in accordance with
the Absolute Maximum Rating System (IEC 60134). Stress above one or
more of the limiting values may cause permanent damage to the device.
These are stress ratings only and operation of the device at these or at any
other conditions above those given in the Characteristics sections of the
specification is not implied. Exposure to limiting values for extended periods
may affect device reliability.
Application information — Applications that are described herein for any
of these products are for illustrative purposes only. Philips Semiconductors
make no representation or warranty that such applications will be suitable for
the specified use without further testing or modification.
Right to make changes — Philips Semiconductors reserves the right to
make changes, without notice, in the products, including circuits, standard
cells, and/or software, described or contained herein in order to improve
design and/or performance. Philips Semiconductors assumes no
responsibility or liability for the use of any of these products, conveys no
licence or title under any patent, copyright, or mask work right to these
products, and makes no representations or warranties that these products
are free from patent, copyright, or mask work right infringement, unless
otherwise specified.
© Philips Electronics N.V. 2001 All rights reserved.
9397 750 08243
Product data
Rev. 01 — 16 May 2001
12 of 14
Philips Semiconductors
PHP47NQ10T; PHB47NQ10T
N-channel enhancement mode field-effect transistor
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(SCA72)
© Philips Electronics N.V. 2001. All rights reserved.
9397 750 08243
Product data
Rev. 01 — 16 May 2001
13 of 14
Philips Semiconductors
PHP47NQ10T; PHB47NQ10T
N-channel enhancement mode field-effect transistor
Contents
1
2
3
4
5
6
7
7.1
8
9
10
11
12
13
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Pinning information . . . . . . . . . . . . . . . . . . . . . . 1
Quick reference data . . . . . . . . . . . . . . . . . . . . . 2
Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 2
Thermal characteristics. . . . . . . . . . . . . . . . . . . 4
Transient thermal impedance . . . . . . . . . . . . . . 4
Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Package outline . . . . . . . . . . . . . . . . . . . . . . . . . 9
Revision history . . . . . . . . . . . . . . . . . . . . . . . . 11
Data sheet status . . . . . . . . . . . . . . . . . . . . . . . 12
Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Disclaimers. . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
© Philips Electronics N.V. 2001.
Printed in The Netherlands
All rights are reserved. Reproduction in whole or in part is prohibited without the prior
written consent of the copyright owner.
The information presented in this document does not form part of any quotation or
contract, is believed to be accurate and reliable and may be changed without notice. No
liability will be accepted by the publisher for any consequence of its use. Publication
thereof does not convey nor imply any license under patent- or other industrial or
intellectual property rights.
Date of release: 16 May 2001
Document order number: 9397 750 08243