M27W401 4 Mbit (512Kb x 8) Low Voltage UV EPROM and OTP EPROM ■ 2.7V to 3.6V LOW VOLTAGE in READ OPERATION ■ ACCESS TIME: – 70ns at VCC = 3.0V to 3.6V 32 32 – 80ns at VCC = 2.7V to 3.6V ■ PIN COMPATIBLE with M27C4001 ■ LOW POWER CONSUMPTION: 1 1 FDIP32W (F) PDIP32 (B) PLCC32 (K) TSOP32 (N) 8 x 20 mm – 15µA max Standby Current – 15mA max Active Current at 5MHz ■ PROGRAMMING TIME 100µs/byte ■ HIGH RELIABILITY CMOS TECHNOLOGY – 2,000V ESD Protection – 200mA Latchup Protection Immunity ■ ELECTRONIC SIGNATURE Figure 1. Logic Diagram – Manufacturer Code: 20h – Device Code: 41h DESCRIPTION The M27W401 is a low voltage 4 Mbit EPROM offered in the two ranges UV (ultra violet erase) and OTP (one time programmable). It is ideally suited for microprocessor systems requiring large data or program storage and is organised as 524,288 by 8 bits. The M27W401 operates in the read mode with a supply voltage as low as 2.7V at –40 to 85°C temperature range. The decrease in operating power allows either a reduction of the size of the battery or an increase in the time between battery recharges. The FDIP32W (window ceramic frit-seal package) has a transparent lid which allows the user to expose the chip to ultraviolet light to erase the bit pattern. A new pattern can then be written to the device by following the programming procedure. For application where the content is programmed only one time and erasure is not required, the M27W401 is offered in PDIP32, PLCC32 and TSOP32 (8 x 20 mm) packages. March 2000 VCC VPP 19 8 A0-A18 E Q0-Q7 M27W401 G VSS AI01590 1/15 M27W401 VCC A18 A17 A14 A13 A8 A9 A11 G A10 E Q7 Q6 Q5 Q4 Q3 A12 A15 A16 VPP VCC A18 A17 1 32 2 31 3 30 4 29 5 28 6 27 7 26 8 25 M27W401 9 24 10 23 11 22 12 21 13 20 14 19 15 18 16 17 1 32 A7 A6 A5 A4 A3 A2 A1 A0 Q0 9 M27W401 25 AI01591 AI02676 Figure 2C. TSOP Connections A11 A9 A8 A13 A14 A17 A18 VCC VPP A16 A15 A12 A7 A6 A5 A4 1 8 9 16 Table 1. Signal Names 32 M27W401 (Normal) 25 24 17 AI01592 2/15 G A10 E Q7 Q6 Q5 Q4 Q3 VSS Q2 Q1 Q0 A0 A1 A2 A3 A14 A13 A8 A9 A11 G A10 E Q7 17 Q1 Q2 VPP A16 A15 A12 A7 A6 A5 A4 A3 A2 A1 A0 Q0 Q1 Q2 VSS Figure 2B. LCC Connections VSS Q3 Q4 Q5 Q6 Figure 2A. DIP Connections A0-A18 Address Inputs Q0-Q7 Data Outputs E Chip Enable G Output Enable VPP Program Supply VCC Supply Voltage VSS Ground M27W401 Table 2. Absolute Maximum Ratings (1) Symbol Value Unit Ambient Operating Temperature (3) –40 to 85 °C TBIAS Temperature Under Bias –50 to 125 °C TSTG Storage Temperature –65 to 150 °C VIO (2) Input or Output Voltage (except A9) –2 to 7 V Supply Voltage –2 to 7 V –2 to 13.5 V –2 to 14 V TA VCC VA9 (2) Parameter A9 Voltage Program Supply Voltage VPP Note: 1. Except for the rating ”Operating Temperature Range”, stresses above those listed in the Table ”Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other relevant quality documents. 2. Minimum DC voltage on Input or Output is –0.5V with possible undershoot to –2.0V for a period less than 20ns. Maximum DC voltage on Output is VCC +0.5V with possible overshoot to VCC +2V for a period less than 20ns. 3. Depends on range. Table 3. Operating Modes E G A9 VPP Q7-Q0 Read VIL VIL X VCC or VSS Data Out Output Disable VIL V IH X VCC or VSS Hi-Z VIL Pulse V IH X VPP Data In Verify VIH VIL X VPP Data Out Program Inhibit VIH V IH X VPP Hi-Z Standby VIH X X VCC or VSS Hi-Z Electronic Signature VIL VIL VID VCC Codes Mode Program Note: X = VIH or VIL, VID = 12V ± 0.5V. Table 4. Electronic Signature Identifier A0 Q7 Q6 Q5 Q4 Q3 Q2 Q1 Q0 Hex Data Manufacturer’s Code VIL 0 0 1 0 0 0 0 0 20h Device Code VIH 0 1 0 0 0 0 0 1 41h 3/15 M27W401 Table 5. AC Measurement Conditions High Speed Standard Input Rise and Fall Times ≤ 10ns ≤ 20ns Input Pulse Voltages 0 to 3V 0.4V to 2.4V 1.5V 0.8V and 2V Input and Output Timing Ref. Voltages Figure 3. AC Testing Input Output Waveform Figure 4. AC Testing Load Circuit 1.3V High Speed 1N914 3V 1.5V 3.3kΩ 0V DEVICE UNDER TEST Standard 2.4V OUT CL 2.0V 0.8V 0.4V AI01822 CL = 30pF for High Speed CL = 100pF for Standard CL includes JIG capacitance AI01823B Table 6. Capacitance (1) (TA = 25 °C, f = 1 MHz) Symbol C IN COUT Parameter Input Capacitance Output Capacitance Test Condit ion Min Max Unit VIN = 0V 6 pF VOUT = 0V 12 pF Note: 1. Sampled only, not 100% tested. DEVICE OPERATION The operating modes of the M27W401 are listed in the Operating Modes table. A single power supply is required in the read mode. All inputs are TTL levels except for VPP and 12V on A9 for Electronic Signature. Read Mode The M27W401 has two control functions, both of which must be logically active in order to obtain data at the outputs. Chip Enable (E) is the power control and should be used for device selection. Output Enable (G) is the output control and should be used to gate data to the output pins, independent of device selection. Assuming that the addresses are stable, the address access time 4/15 (tAVQV) is equal to the delay from E to output (tELQV). Data is available at the output after a delay of t GLQV from the falling edge of G, assuming that E has been low and the addresses have been stable for at least tAVQV-tGLQV. Standby Mode The M27W401 has a standby mode which reduces the supply current from 15mA to 15µA with low voltage operation VCC ≤ 3.6V, see Read Mode DC Characteristics table for details. The M27W401 is placed in the standby mode by applying a CMOS high signal to the E input. When in the standby mode, the outputs are in a high impedance state, independent of the G input. M27W401 Table 7. Read Mode DC Characteristics (1) (TA = –40 to 85°C; VCC = 2.7V to 3.6V; VPP = VCC) Symbol Parameter Test Condition Min Max Unit 0V ≤ VIN ≤ V CC ±10 µA 0V ≤ VOUT ≤ VCC ±10 µA E = VIL, G = VIL, IOUT = 0mA, f = 5MHz, V CC ≤ 3.6V 15 mA E = VIH 1 mA E > VCC – 0.2V, VCC ≤ 3.6V 15 µA VPP = VCC 10 µA ILI Input Leakage Current ILO Output Leakage Current ICC Supply Current ICC1 Supply Current (Standby) TTL ICC2 Supply Current (Standby) CMOS IPP Program Current VIL Input Low Voltage –0.6 0.2 VCC V VIH (2) Input High Voltage 0.7 VCC VCC + 0.5 V VOL Output Low Voltage 0.4 V VOH Output High Voltage TTL IOL = 2.1mA IOH = –400µA 2.4 V Note: 1. VCC must be applied simultaneously with or before VPP and removed simultaneously or after V PP. 2. Maximum DC voltage on Output is VCC +0.5V. Two Line Output Control Because EPROMs are usually used in larger memory arrays, this product features a 2 line control function which accommodates the use of multiple memory connection. The two line control function allows: a. the lowest possible memory power dissipation, b. complete assurance that output bus contention will not occur. For the most efficient use of these two control lines, E should be decoded and used as the primary device selecting function, while G should be made a common connection to all devices in the array and connected to the READ line from the system control bus. This ensures that all deselected memory devices are in their low power standby mode and that the output pins are only active when data is required from a particular memory device. System Considerations The power switching characteristics of Advanced CMOS EPROMs require careful decoupling of the devices. The supply current, I CC, has three segments that are of interest to the system designer: the standby current level, the active current level, and transient current peaks that are produced by the falling and rising edges of E. The magnitude of the transient current peaks is dependent on the capacitive and inductive loading of the device at the output. The associated transient voltage peaks can be suppressed by complying with the two line output control and by properly selected decoupling capacitors. It is recommended that a 0.1µF ceramic capacitor be used on every device between VCC and VSS. This should be a high frequency capacitor of low inherent inductance and should be placed as close to the device as possible. In addition, a 4.7µF bulk electrolytic capacitor should be used between VCC and VSS for every eight devices. The bulk capacitor should be located near the power supply connection point.The purpose of the bulk capacitor is to overcome the voltage drop caused by the inductive effects of PCB traces. 5/15 M27W401 Table 8. Read Mode AC Characteristics (1) (TA = –40 to 85°C; VCC = 2.7V to 3.6V; VPP = VCC) M27W401 Symbol Alt Parameter -100 (-120/-150/-200) -80 (3) Test Condition Unit VCC = 3.0V to 3.6V VCC = 2.7V to 3.6V VCC = 2.7V to 3.6V Min Max Min Max Min Max tAVQV tACC Address Valid to Output Valid E = VIL, G = VIL 70 80 100 ns tELQV tCE Chip Enable Low to Output Valid G = VIL 70 80 100 ns tGLQV tOE Output Enable Low to Output Valid E = VIL 40 50 60 ns tEHQZ (2) tDF Chip Enable High to Output Hi-Z G = VIL 0 50 0 50 0 60 ns tGHQZ (2) tDF Output Enable High to Output Hi-Z E = VIL 0 50 0 50 0 60 ns tAXQX tOH Address Transition to Output Transition E = VIL, G = VIL 0 0 0 ns Note: 1. VCC must be applied simultaneously with or before VPP and removed simultaneously or after V PP. 2. Sampled only, not 100% tested. 3. Speed obtained with High Speed AC measurement conditions. Figure 5. Read Mode AC Waveforms A0-A18 VALID tAVQV VALID tAXQX E tGLQV tEHQZ G tELQV Q0-Q7 tGHQZ Hi-Z AI00724B 6/15 M27W401 Table 9. Programming Mode DC Characteristics (1) (TA = 25 °C; VCC = 6.25V ± 0.25V; VPP = 12.75V ± 0.25V) Symbol Parameter Test Condition Min 0V ≤ VIN ≤ V CC Max Unit ±10 µA 50 mA 50 mA ILI Input Leakage Current ICC Supply Current IPP Program Current V IL Input Low Voltage –0.3 0.8 V VIH Input High Voltage 2 VCC + 0.5 V VOL Output Low Voltage 0.4 V VOH Output High Voltage TTL VID A9 Voltage E = VIL IOL = 2.1mA IOH = –400µA 2.4 V 11.5 12.5 V Note: 1. VCC must be applied simultaneously with or before VPP and removed simultaneously or after V PP. Table 10. Programming Mode AC Characteristics (1) (TA = 25 °C; VCC = 6.25V ± 0.25V; VPP = 12.75V ± 0.25V) Symbol Alt Parameter Test Condition Min Max tAVEL tAS Address Valid to Chip Enable Low 2 µs tQVEL tDS Input Valid to Chip Enable Low 2 µs tVPHEL tVPS VPP High to Chip Enable Low 2 µs t VCHEL tVCS VCC High to Chip Enable Low 2 µs tELEH tPW Chip Enable Program Pulse Width 95 tEHQX tDH Chip Enable High to Input Transition 2 µs tQXGL tOES Input Transition to Output Enable Low 2 µs tGLQV tOE Output Enable Low to Output Valid tGHQZ tDFP Output Enable High to Output Hi-Z 0 tGHAX tAH Output Enable High to Address Transition 0 105 Unit µs 100 ns 130 ns ns Note: 1. VCC must be applied simultaneously with or before VPP and removed simultaneously or after V PP. 2. Sampled only, not 100% tested. Programming The M27W401 has been designed to be fully compatible with the M27C4001 and has the same electronic signature. As a result the M27W401 can be programmed as the M27C4001 on the same programming equipment applying 12.75V on VPP and 6.25V on VCC by the use of the same PRESTO II algorithm. When delivered (and after each ‘1’s erasure for UV EPROM), all bits of the M27W401 are in the ’1’ state. Data is introduced by selectively program- ming ’0’s into the desired bit locations. Although only ’0’s will be programmed, both ’1’s and ’0’s can be present in the data word. The only way to change a ‘0’ to a ‘1’ is by die exposure to ultraviolet light (UV EPROM). The M27W401 is in the programming mode when VPP input is at 12.75V, G is at VIH and E is pulsed to VIL. The data to be programmed is applied to 8 bits in parallel to the data output pins. The levels required for the address and data inputs are TTL. VCC is specified to be 6.25V ± 0.25V 7/15 M27W401 Figure 6. Programming and Verify Modes AC Waveforms VALID A0-A18 tAVPL Q0-Q7 DATA IN tQVEL DATA OUT tEHQX VPP tVPHEL tGLQV tGHQZ VCC tVCHEL tGHAX E tELEH tQXGL G PROGRAM VERIFY AI00725 Figure 7. Programming Flowchart VCC = 6.25V, VPP = 12.75V n=0 E = 100µs Pulse NO ++n = 25 YES FAIL NO ++ Addr VERIFY YES Last Addr NO YES CHECK ALL BYTES 1st: VCC = 5V 2nd: VCC = 2.7V AI00760C 8/15 PRESTO II Programming Algorithm PRESTO II Programming Algorithm allows the whole array to be programmed with a guaranteed margin, in a typical time of 52.5 seconds. Programming with PRESTO II consists of applying a sequence of 100µs program pulses to each byte until a correct verify occurs (see Figure 7). During programming and verify operation, a MARGIN MODE circuit is automatically activated in order to guarantee that each cell is programmed with enough margin. No overprogram pulse is applied since the verify in MARGIN MODE at VCC much higher than 3.6V, provides the necessary margin to each programmed cell. Program Inhibit Programming of multiple M27W401s in parallel with different data is also easily accomplished. Except for E, all like inputs including G of the parallel M27W401 may be common. A TTL low level pulse applied to a M27W401’s E input, with VPP at 12.75V, will program that M27W401. A high level E input inhibits the other M27W401s from being programmed. Program Verify A verify (read) should be performed on the programmed bits to determine that they were correctly programmed. The verify is accomplished with G at VIL, E at VIH, VPP at 12.75V and VCC at 6.25V. M27W401 On-Board Programming The M27W401 can be directly programmed in the application circuit. See the relevant Application Note AN620. Electronic Signature The Electronic Signature (ES) mode allows the reading out of a binary code from an EPROM that will identify its manufacturer and type. This mode is intended for use by programming equipment to automatically match the device to be programmed with its corresponding programming algorithm. The ES mode is functional in the 25°C ± 5°C ambient temperature range that is required when programming the M27W401. To activate the ES mode, the programming equipment must force 11.5V to 12.5V on address line A9 of the M27W401 with VPP = VCC = 5V. Two identifier bytes may then be sequenced from the device outputs by toggling address line A0 from VIL to VIH. All other address lines must be held at V IL during Electronic Signature mode. Byte 0 (A0 = VIL) represents the manufacturer code and byte 1 (A0 = VIH) the device identifier code. For the STMicroelectronics M27W401, these two identifier bytes are given in Table 4 and can be read-out on outputs Q7 to Q0. Note that the M27W401 and M27C4001 have the same identifier bytes. ERASURE OPERATION (applies to UV EPROM) The erasure characteristics of the M27W401 are such that erasure begins when the cells are exposed to light with wavelengths shorter than approximately 4000 Å. It should be noted that sunlight and some type of fluorescent lamps have wavelengths in the 3000-4000 Å range. Data shows that constant exposure to room level fluorescent lighting could erase a typical M27W401 in about 3 years, while it would take approximately 1 week to cause erasure when exposed to direct sunlight. If the M27W401 is to be exposed to these types of lighting conditions for extended periods of time, it is suggested that opaque labels be put over the M27W401 window to prevent unintentional erasure. The recommended erasure procedure for the M27W401 is exposure to short wave ultraviolet light which has wavelength of 2537 Å. The integrated dose (i.e. UV intensity x exposure time) for erasure should be a minimum of 15 W-sec/cm2. The erasure time with this dosage is approximately 15 to 20 minutes using an ultraviolet lamp with 12000 µW/cm2 power rating. The M27W401 should be placed within 2.5 cm (1 inch) of the lamp tubes during the erasure. Some lamps have a filter on their tubes which should be removed before erasure. 9/15 M27W401 Table 11. Ordering Information Scheme Example: M27W401 -80 K 6 TR Device Type M27 Supply Voltage W = 2.7V to 3.6V Device Function 401 = 4 Mbit (512Kb x 8) Speed -80 (1,2) = 80 ns -100 = 100 ns Not For New Design (3) -120 = 120 ns -150 = 150 ns -200 = 200 ns Package F = FDIP32W (4) B = PDIP32 K = PLCC32 N = TSOP32: 8 x 20 mm (4) Temperature Range 6 = –40 to 85 °C Optio ns TR = Tape & Reel Packing Note: 1. 2. 3. 4. High Speed, see AC Characteristics section for further information. This speed also guarantees 70ns access time at VCC = 3.0V to 3.6V. These speeds are replaced by the 100ns. Packages option available on request. Please contact STMicroelectronics local Sales Office. For a list of available options (Speed, Package, etc...) or for further information on any aspect of this device, please contact the STMicroelectronics Sales Office nearest to you. Table 12. Revision History Date Revision Details July 1999 First Issue 03/10/00 FDIP42W Package Dimension, L Max added (Table 13) TSOP32 Package Dimension changed (Table 16) 0 to 70°C Temperature Range deleted 10/15 M27W401 Table 13. FDIP32W - 32 pin Ceramic Frit-seal DIP with window, Package Mechanical Data mm Symb Typ inches Min Max A Typ Min 5.72 Max 0.225 A1 0.51 1.40 0.020 0.055 A2 3.91 4.57 0.154 0.180 A3 3.89 4.50 0.153 0.177 B 0.41 0.56 0.016 0.022 B1 – – – – C 1.45 0.23 0.30 0.009 0.012 D 41.73 42.04 1.643 1.655 – – 1.500 – – 0.600 D2 38.10 E 15.24 E1 0.057 – – 13.06 13.36 – – 0.514 0.526 e 2.54 – – 0.100 – – eA 14.99 – – 0.590 – – eB 16.18 18.03 0.637 0.710 L 3.18 4.10 0.125 0.161 S 1.52 2.49 0.060 0.098 – – – – α 4° 11° 4° 11° N 32 Ø 7.11 0.280 32 Figure 8. FDIP32W - 32 pin Ceramic Frit-seal DIP with window, Package Outline A2 A3 A1 B1 B A L e α eA D2 C eB D S N ∅ E1 E 1 FDIPW-a Drawing is not to scale. 11/15 M27W401 Table 14. PDIP32 - 32 lead Plastic DIP, 600 mils width, Package Mechanical Data mm Symb Typ inches Min Max A – A1 Min Max 5.08 – 0.200 0.38 – 0.015 – A2 3.56 4.06 0.140 0.160 B 0.38 0.51 0.015 0.020 – – – – C 0.20 0.30 0.008 0.012 D 41.78 42.04 1.645 1.655 B1 1.52 Typ 0.060 D2 38.10 – – 1.500 – – E 15.24 – – 0.600 – – 13.59 13.84 0.535 0.545 E1 e1 2.54 – – 0.100 – – eA 15.24 – – 0.600 – – eB 15.24 17.78 0.600 0.700 L 3.18 3.43 0.125 0.135 S 1.78 2.03 0.070 0.080 α 0° 10° 0° 10° N 32 32 Figure 9. PDIP32 - 32 lead Plastic DIP, 600 mils width, Package Outline A2 A1 B1 B A L e1 α eA D2 C eB D S N E1 E 1 PDIP Drawing is not to scale. 12/15 M27W401 Table 15. PLCC32 - 32 lead Plastic Leaded Chip Carrier, Package Mechanical Data Symb mm Typ inches Min Max A 2.54 A1 Typ Min Max 3.56 0.100 0.140 1.52 2.41 0.060 0.095 A2 – 0.38 – 0.015 B 0.33 0.53 0.013 0.021 B1 0.66 0.81 0.026 0.032 D 12.32 12.57 0.485 0.495 D1 11.35 11.56 0.447 0.455 D2 9.91 10.92 0.390 0.430 E 14.86 15.11 0.585 0.595 E1 13.89 14.10 0.547 0.555 E2 12.45 13.46 0.490 0.530 – – – – 0.00 0.25 0.000 0.010 – – – – e 1.27 F R 0.89 0.050 0.035 N 32 32 Nd 7 7 Ne 9 9 CP 0.10 0.004 Figure 10. PLCC32 - 32 lead Plastic Leaded Chip Carrier, Package Outline D D1 A1 A2 1 N B1 E1 E Ne e D2/E2 F B 0.51 (.020) 1.14 (.045) A Nd R CP PLCC Drawing is not to scale. 13/15 M27W401 Table 16. TSOP32 - 32 lead Plastic Thin Small Outline, 8 x 20mm, Package Mechanical Data mm inch Symbol Typ Min Max A Typ Min 1.200 0.0472 A1 0.050 0.150 0.0020 0.0059 A2 0.950 1.050 0.0374 0.0413 B 0.150 0.270 0.0059 0.0106 C 0.100 0.210 0.0039 0.0083 D 19.800 20.200 0.7795 0.7953 D1 18.300 18.500 0.7205 0.7283 – – – – E 7.900 8.100 0.3110 0.3189 L 0.500 0.700 0.0197 0.0276 α 0° 5° 0° 5° e 0.500 CP 0.0197 0.100 N 0.0039 32 32 Figure 11. TSOP32 - 32 lead Plastic Thin Small Outline, 8 x 20mm, Package Outline A2 1 N e E B N/2 D1 A CP D DIE C TSOP-a Drawing is not to scale. 14/15 Max A1 α L M27W401 Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in lif e support devices or systems without express written approval of STMicroelectronics. The ST logo is registered trademark of STMicroelectronics 2000 STMicroelectronics - All Rights Reserved All other names are the property of their respective owners. STMicroelectronics GROUP OF COMPANIES Australia - Brazil - China - Finland - France - Germany - Hong Kong - India - Italy - Japan - Malaysia - Malta - Morocco Singapore - Spain - Sweden - Switzerland - United Kingdom - U.S.A . http://w ww.st.com 15/15