FREESCALE MSC8156ETVT1000B

Freescale Semiconductor
Data Sheet: Product Preview
Document Number: MSC8156E
Rev. 0, 12/2010
MSC8156E
FC-PBGA–783
29 mm × 29 mm
Six-Core Digital Signal
Processor with Security
• Six StarCore SC3850 DSP subsystems, each with an SC3850 DSP
core, 32 Kbyte L1 instruction cache, 32 Kbyte L1 data cache,
unified 512 Kbyte L2 cache configurable as M2 memory in
64 Kbyte increments, memory management unit (MMU),
extended programmable interrupt controller (EPIC), two
general-purpose 32-bit timers, debug and profiling support,
low-power Wait, Stop, and power-down processing modes, and
ECC/EDC support.
• Chip-level arbitration and switching system (CLASS) that
provides full fabric non-blocking arbitration between the cores
and other initiators and the M2 memory, shared M3 memory,
DDR SRAM controllers, device configuration control and status
registers, MAPLE-B, and other targets.
• 1056 Kbyte 128-bit wide M3 memory, 1024 Kbytes of which can
be turned off to save power.
• 96 Kbyte boot ROM.
• Three input clocks (one global and two differential).
• Five PLLs (three global and two Serial RapidIO PLLs).
• Multi-Accelerator Platform Engine for Baseband (MAPLE-B)
with a programmable system interface, Turbo decoding, Viterbi
decoding, and FFT/iFFT and DFT/iDFT processing. MAPLE-B
can be disabled when not required to reduce overall power
consumption.
• Security Engine (SEC) optimized to process all the algorithms
associated with IPSec, IKE, SSL/TLS, 3GPP, and LTE using 4
crypto-channels with multi-command descriptor chains,
integrated controller for assignment of the eight execution units
(PKEU, DEU, AESU, AFEU, MDEU, KEU, SNOW, and the
random number generator (RNG), and XOR engine to accelerate
parity checking for RAID storage applications.
• Two DDR controllers with up to a 400 MHz clock (800 MHz data
rate), 64/32 bit data bus, supporting up to a total 2 Gbyte in up to
four banks (two per controller) and support for DDR2 and DDR3.
• DMA controller with 32 unidirectional channels supporting 16
memory-to-memory channels with up to 1024 buffer descriptors
per channel, and programmable priority, buffer, and multiplexing
configuration. It is optimized for DDR SDRAM.
• Up to four independent TDM modules with programmable word
size (2, 4, 8, or 16-bit), hardware-base A-law/μ-law conversion,
up to 62.5 Mbps data rate for each TDM link, and with glueless
interface to E1 or T1 framers that can interface with
H-MVIP/H.110 devices, TSI, and codecs such as AC-97.
• High-speed serial interface that supports two Serial RapidIO
interfaces, one PCI Express interface, and two SGMII interfaces
(multiplexed). The Serial RapidIO interfaces support 1x/4x
operation up to 3.125 Gbaud with a single messaging unit and two
DMA units. The PCI Express controller supports 32- and 64-bit
addressing, x4, x2, and x1 link.
• QUICC Engine technology subsystem with dual RISC
processors, 48 Kbyte multi-master RAM, 48 Kbyte instruction
RAM, supporting two communication controllers for two Gigabit
Ethernet interfaces (RGMII or SGMII), to offload scheduling
tasks from the DSP cores, and an SPI.
• I/O Interrupt Concentrator consolidates all chip maskable
interrupt and non-maskable interrupt sources and routes then to
INT_OUT, NMI_OUT, and the cores.
• UART that permits full-duplex operation with a bit rate of up to
6.25 Mbps.
• Two general-purpose 32-bit timers for RTOS support per SC3850
core, four timer modules with four 16-bit fully programmable
timers, and eight software watchdog timers (SWT).
• Eight programmable hardware semaphores.
• Up to 32 virtual interrupts and a virtual NMI asserted by simple
write access.
• I2C interface.
• Up to 32 GPIO ports, sixteen of which can be configured as
external interrupts.
• Boot interface options include Ethernet, Serial RapidIO interface,
I2C, and SPI.
• Supports standard JTAG interface
• Low power CMOS design, with low-power standby and
power-down modes, and optimized power-management circuitry.
• 45 nm SOI CMOS technology.
This document contains information on a product under development. Freescale reserves
the right to change or discontinue this product without notice.
© 2008, 2010 Freescale Semiconductor, Inc.
Table of Contents
1
2
3
4
5
6
Pin Assignment. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4
1.1 FC-PBGA Ball Layout Diagram. . . . . . . . . . . . . . . . . . . .4
1.2 Signal List By Ball Location. . . . . . . . . . . . . . . . . . . . . . .5
Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . .23
2.1 Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . .23
2.2 Recommended Operating Conditions. . . . . . . . . . . . . .24
2.3 Thermal Characteristics . . . . . . . . . . . . . . . . . . . . . . . .25
2.4 CLKIN Requirements . . . . . . . . . . . . . . . . . . . . . . . . . .25
2.5 DC Electrical Characteristics . . . . . . . . . . . . . . . . . . . .25
2.6 AC Timing Characteristics. . . . . . . . . . . . . . . . . . . . . . .36
Hardware Design Considerations . . . . . . . . . . . . . . . . . . . . . .52
3.1 Power Supply Ramp-Up Sequence . . . . . . . . . . . . . . .52
3.2 PLL Power Supply Design Considerations . . . . . . . . . .55
3.3 Clock and Timing Signal Board Layout Considerations 56
3.4 SGMII AC-Coupled Serial Link Connection Example . .57
3.5 Connectivity Guidelines . . . . . . . . . . . . . . . . . . . . . . . .57
3.6 Guide to Selecting Connections for Remote Power
Supply Sensing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .64
Ordering Information. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .63
Package Information. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .64
Product Documentation . . . . . . . . . . . . . . . . . . . . . . . . . . . . .65
List of Figures
Figure 1.
Figure 2.
Figure 2.
Figure 4.
Figure 4.
Figure 5.
Figure 6.
Figure 7.
Figure 8.
Figure 9.
MSC8156E Block Diagram . . . . . . . . . . . . . . . . . . . . . . . 3
MSC8156E FC-PBGA Package, Top View . . . . . . . . . . . 4
MSC8156E FC-PBGA Package, Top View . . . . . . . . . . . 4
Differential Voltage Definitions for Transmitter or
Receiver . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
Receiver of SerDes Reference Clocks . . . . . . . . . . . . . 29
SerDes Transmitter and Receiver Reference Circuits . 30
Differential Reference Clock Input DC Requirements
(External DC-Coupled) . . . . . . . . . . . . . . . . . . . . . . . . . 30
Differential Reference Clock Input DC Requirements
(External AC-Coupled) . . . . . . . . . . . . . . . . . . . . . . . . . 31
Single-Ended Reference Clock Input DC Requirements 31
SGMII Transmitter DC Measurement Circuit . . . . . . . . 33
Figure 11.DDR2 and DDR3 SDRAM Interface Input Timing
Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Figure 11.MCK to MDQS Timing . . . . . . . . . . . . . . . . . . . . . . . . . . 38
Figure 12.DDR SDRAM Output Timing . . . . . . . . . . . . . . . . . . . . . 39
Figure 13.DDR2 and DDR3 Controller Bus AC Test Load. . . . . . . 39
Figure 16.DDR2 and DDR3 SDRAM Differential Timing
Specifications. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
Figure 15.Differential Measurement Points for Rise and Fall Time 41
Figure 16.Single-Ended Measurement Points for Rise and Fall Time
Matching . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
Figure 17.Single Frequency Sinusoidal Jitter Limits . . . . . . . . . . . 43
Figure 18.SGMII AC Test/Measurement Load. . . . . . . . . . . . . . . . 44
Figure 19.TDM Receive Signals . . . . . . . . . . . . . . . . . . . . . . . . . . 45
Figure 20.TDM Transmit Signals . . . . . . . . . . . . . . . . . . . . . . . . . . 46
Figure 21.TDM AC Test Load . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
Figure 22.Timer AC Test Load . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
Figure 23.MII Management Interface Timing . . . . . . . . . . . . . . . . . 47
Figure 24.RGMII AC Timing and Multiplexing . . . . . . . . . . . . . . . . 48
Figure 25.SPI AC Test Load . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49
Figure 26.SPI AC Timing in Slave Mode (External Clock). . . . . . . 49
Figure 27.SPI AC Timing in Master Mode (Internal Clock) . . . . . . 49
Figure 28.Test Clock Input Timing . . . . . . . . . . . . . . . . . . . . . . . . . 50
Figure 29.Boundary Scan (JTAG) Timing . . . . . . . . . . . . . . . . . . . 51
Figure 30.Test Access Port Timing . . . . . . . . . . . . . . . . . . . . . . . . 51
Figure 31.TRST Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
Figure 32.Supply Ramp-Up Sequence with VDD Ramping Before
VDDIO and CLKIN Starting With VDDIO . . . . . . . . . . . . . 52
Figure 33.Supply Ramp-Up Sequence . . . . . . . . . . . . . . . . . . . . . 53
Figure 34.Reset Connection in Functional Application . . . . . . . . . 55
Figure 35.Reset Connection in Debugger Application. . . . . . . . . . 55
Figure 36.PLL Supplies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56
Figure 37.SerDes PLL Supplies . . . . . . . . . . . . . . . . . . . . . . . . . . 56
Figure 42.4-Wire AC-Coupled SGMII Serial Link Connection
Example. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
Figure 39.MSC8156E Mechanical Information, 783-ball FC-PBGA
Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 64
MSC8156E Six-Core Digital Signal Processor with Security Data Sheet, Rev. 0
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Freescale Semiconductor
DDR Interface 64/32-bit
JTAG
DDR Interface 64/32-bit
DDR
Controller
DDR
Controller
I/O-Interrupt
Concentrator
M3 Memory
1056 Kbyte
UART
Clocks
Timers
CLASS
Reset
High-Speed Serial Interface
DFT/
IDFT
FFT/
IFFT
Turbo/
Viterbi
4 TDMs
32 Kbyte 32 Kbyte
L1
L1
ICache DCache
DMA
MAPLE-B
SEC
SC3850
DSP Core
QUICCEngine™
Subsystem
DMA
RMU
Dual RISC Processors
SGMII
SPI Ethernet Ethernet
DMA
Serial Serial
PCI
RapidIO RapidIO Expr
x2
SerDes 1
SerDes 2
Six DSP Cores at 1 GHz
Four TDMs 256-Channels each
SPI RGMII RGMII
Note: The arrow direction indicates master or slave.
Virtual
Interrupts
Boot ROM
I2C
Other
Modules
512 Kbyte
L2 Cache / M2 Memory
Semaphores
4x 3.125 Gbaud
PCI-EX 1x/2x/4x
Two SGMII
4x 3.125 Gbaud
Two SGMII
Figure 1. MSC8156E Block Diagram
MSC8156E Six-Core Digital Signal Processor with Security Data Sheet, Rev. 0
Freescale Semiconductor
3
Pin Assignment
1
Pin Assignment
This section includes diagrams of the MSC8156E package ball grid array layouts and tables showing how the pinouts are
allocated for the package.
1.1
FC-PBGA Ball Layout Diagram
The top view of the FC-PBGA package is shown in Figure 2 with the ball location index numbers.
Top View
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
MSC8156E
T
U
V
W
Y
AA
AB
AC
AD
AE
AF
AG
AH
Figure 2. MSC8156E FC-PBGA Package, Top View
MSC8156E Six-Core Digital Signal Processor with Security Data Sheet, Rev. 0
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Freescale Semiconductor
1.2
Signal List By Ball Location
Table 1 presents the signal list sorted by ball number. When designing a board, make sure that the power rail for each signal is
appropriately considered. The specified power rail must be tied to the voltage level specified in this document if any of the
related signal functions are used (active)
Note:
The information in Table 1 and Table 2 distinguishes among three concepts. First, the power pins are the balls of the
device package used to supply specific power levels for different device subsystems (as opposed to signals). Second,
the power rails are the electrical lines on the board that transfer power from the voltage regulators to the device. They
are indicated here as the reference power rails for signal lines; therefore, the actual power inputs are listed as N/A
with regard to the power rails. Third, symbols used in these tables are the names for the voltage levels (absolute,
recommended, and so on) and not the power supplies themselves.
Table 1. Signal List by Ball Number
Signal Name1,2
Ball Number
Pin Type10
Power Rail
Name
A2
M2DQS3
I/O
GVDD2
A3
M2DQS3
I/O
GVDD2
A4
M2ECC0
I/O
GVDD2
A5
M2DQS8
I/O
GVDD2
A6
M2DQS8
I/O
GVDD2
A7
M2A5
O
GVDD2
A8
M2CK1
O
GVDD2
A9
M2CK1
O
GVDD2
A10
M2CS0
O
GVDD2
A11
M2BA0
O
GVDD2
A12
M2CAS
O
GVDD2
A13
M2DQ34
I/O
GVDD2
A14
M2DQS4
I/O
GVDD2
A15
M2DQS4
I/O
GVDD2
A16
M2DQ50
I/O
GVDD2
A17
M2DQS6
I/O
GVDD2
A18
M2DQS6
I/O
GVDD2
A19
M2DQ48
I/O
GVDD2
A20
M2DQ49
A21
VSS
A22
Reserved
I/O
GVDD2
Ground
N/A
NC
—
A23
SXPVDD1
Power
N/A
A24
SXPVSS1
Ground
N/A
A25
Reserved
NC
—
A26
Reserved
NC
—
A27
SXCVDD1
Power
N/A
A28
SXCVSS1
Ground
N/A
B1
M2DQ24
I/O
GVDD2
B2
GVDD2
Power
N/A
B3
M2DQ25
I/O
GVDD2
B4
VSS
Ground
N/A
B5
GVDD2
Power
N/A
B6
M2ECC1
I/O
GVDD2
B7
VSS
Ground
N/A
B8
GVDD2
Power
N/A
MSC8156E Six-Core Digital Signal Processor with Security Data Sheet, Rev. 0
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Table 1. Signal List by Ball Number (continued)
Signal Name1,2
Ball Number
Pin Type10
Power Rail
Name
B9
M2A13
O
GVDD2
B10
VSS
Ground
N/A
B11
GVDD2
Power
N/A
B12
M2CS1
O
GVDD2
B13
VSS
Ground
N/A
B14
GVDD2
Power
N/A
B15
M2DQ35
I/O
GVDD2
B16
VSS
Ground
N/A
B17
GVDD2
Power
N/A
B18
M2DQ51
I/O
GVDD2
B19
VSS
Ground
N/A
B20
GVDD2
Power
N/A
B21
Reserved
NC
—
B22
Reserved
NC
—
B23
SR1_TXD0
O
SXPVDD1
B24
SR1_TXD0
O
SXPVDD1
B25
SXCVDD1
Power
N/A
B26
SXCVSS1
Ground
N/A
B27
SR1_RXD0
I
SXCVDD1
B28
SR1_RXD0
I
SXCVDD1
C1
M2DQ28
I/O
GVDD2
C2
M2DM3
O
GVDD2
C3
M2DQ26
I/O
GVDD2
C4
M2ECC4
I/O
GVDD2
C5
M2DM8
O
GVDD2
C6
M2ECC2
I/O
GVDD2
C7
M2CKE1
O
GVDD2
C8
M2CK0
O
GVDD2
C9
M2CK0
O
GVDD2
C10
M2BA1
O
GVDD2
C11
M2A1
O
GVDD2
C12
M2WE
O
GVDD2
C13
M2DQ37
I/O
GVDD2
C14
M2DM4
O
GVDD2
C15
M2DQ36
I/O
GVDD2
C16
M2DQ32
I/O
GVDD2
C17
M2DQ55
I/O
GVDD2
C18
M2DM6
O
GVDD2
C19
M2DQ53
I/O
GVDD2
GVDD2
C20
M2DQ52
I/O
C21
Reserved
NC
—
C22
SR1_IMP_CAL_RX
I
SXCVDD1
C23
SXPVSS1
Ground
N/A
C24
SXPVDD1
Power
N/A
C25
SR1_REF_CLK
I
SXCVDD1
C26
SR1_REF_CLK
I
SXCVDD1
MSC8156E Six-Core Digital Signal Processor with Security Data Sheet, Rev. 0
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Table 1. Signal List by Ball Number (continued)
Signal Name1,2
Ball Number
Pin Type10
Power Rail
Name
C27
Reserved
NC
—
C28
Reserved
NC
—
N/A
D1
GVDD2
Power
D2
VSS
Ground
N/A
D3
M2DQ29
I/O
GVDD2
D4
GVDD2
Power
N/A
D5
VSS
Ground
N/A
D6
M2ECC5
I/O
GVDD2
D7
GVDD2
Power
N/A
D8
VSS
Ground
N/A
D9
M2A8
O
GVDD2
D10
GVDD2
Power
N/A
D11
VSS
Ground
N/A
D12
M2A0
O
GVDD2
D13
GVDD2
Power
N/A
D14
VSS
Ground
N/A
D15
M2DQ39
I/O
GVDD2
D16
GVDD2
Power
N/A
D17
VSS
Ground
N/A
D18
M2DQ54
I/O
GVDD2
D19
GVDD2
Power
N/A
D20
VSS
Ground
N/A
D21
SXPVSS1
Ground
N/A
D22
SXPVDD1
Power
N/A
D23
SR1_TXD1
O
SXPVDD1
D24
SR1_TXD1
O
SXPVDD1
D25
SXCVSS1
Ground
N/A
D26
SXCVDD1
Power
N/A
D27
SR1_RXD1
I
SXCVDD1
D28
SR1_RXD1
I
SXCVDD1
E1
M2DQ31
I/O
GVDD2
E2
M2DQ30
I/O
GVDD2
E3
M2DQ27
I/O
GVDD2
E4
M2ECC7
I/O
GVDD2
E5
M2ECC6
I/O
GVDD2
E6
M2ECC3
I/O
GVDD2
E7
M2A9
O
GVDD2
E8
M2A6
O
GVDD2
E9
M2A3
O
GVDD2
E10
M2A10
O
GVDD2
E11
M2RAS
O
GVDD2
E12
M2A2
O
GVDD2
E13
M2DQ38
I/O
GVDD2
E14
M2DQS5
I/O
GVDD2
E15
M2DQS5
I/O
GVDD2
E16
M2DQ33
I/O
GVDD2
MSC8156E Six-Core Digital Signal Processor with Security Data Sheet, Rev. 0
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Table 1. Signal List by Ball Number (continued)
Signal Name1,2
Ball Number
Pin Type10
Power Rail
Name
E17
M2DQ56
I/O
GVDD2
E18
M2DQ57
I/O
GVDD2
E19
M2DQS7
I/O
GVDD2
E20
Reserved
NC
—
E21
Reserved
NC
—
E22
Reserved
NC
—
E23
SXPVDD1
Power
N/A
E24
SXPVSS1
Ground
N/A
E25
SR1_PLL_AGND9
Ground
SXCVSS1
E26
SR1_PLL_AVDD9
Power
SXCVDD1
E27
SXCVSS1
Ground
N/A
E28
SXCVDD1
Power
N/A
F1
VSS
Ground
N/A
F2
GVDD2
Power
N/A
F3
M2DQ16
I/O
GVDD2
F4
VSS
Ground
N/A
F5
GVDD2
Power
N/A
F6
M2DQ17
I/O
GVDD2
F7
VSS
Ground
N/A
F8
GVDD2
Power
N/A
F9
M2BA2
O
GVDD2
F10
VSS
Ground
N/A
F11
GVDD2
Power
N/A
F12
M2A4
O
GVDD2
F13
VSS
Ground
N/A
F14
GVDD2
Power
N/A
F15
M2DQ42
I/O
GVDD2
F16
VSS
Ground
N/A
F17
GVDD2
Power
N/A
F18
M2DQ58
I/O
GVDD2
F19
M2DQS7
I/O
GVDD2
F20
GVDD2
Power
N/A
F21
SXPVDD1
Power
N/A
F22
SXPVSS1
Ground
N/A
F23
SR1_TXD2/SG1_TX
4
O
SXPVDD1
F24
SR1_TXD2/SG1_TX4
O
SXPVDD1
F25
SXCVDD1
Ground
N/A
F26
SXCVSS1
Power
N/A
F27
SR1_RXD2/SG1_RX4
I
SXCVDD1
F28
SR1_RXD2/SG1_RX4
I
SXCVDD1
G1
M2DQS2
I/O
GVDD2
G2
M2DQS2
I/O
GVDD2
G3
M2DQ19
I/O
GVDD2
G4
M2DM2
O
GVDD2
G5
M2DQ21
I/O
GVDD2
G6
M2DQ22
I/O
GVDD2
MSC8156E Six-Core Digital Signal Processor with Security Data Sheet, Rev. 0
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Table 1. Signal List by Ball Number (continued)
Signal Name1,2
Ball Number
Pin Type10
Power Rail
Name
G7
M2CKE0
O
GVDD2
G8
M2A11
O
GVDD2
G9
M2A7
O
GVDD2
G10
M2CK2
O
GVDD2
G11
M2APAR_OUT
O
GVDD2
G12
M2ODT1
O
GVDD2
G13
M2APAR_IN
I
GVDD2
G14
M2DQ43
I/O
GVDD2
G15
M2DM5
O
GVDD2
G16
M2DQ44
I/O
GVDD2
G17
M2DQ40
I/O
GVDD2
G18
M2DQ59
I/O
GVDD2
G19
M2DM7
O
GVDD2
G20
M2DQ60
I/O
GVDD2
G21
Reserved
NC
—
G22
Reserved
NC
—
G23
SXPVSS1
Ground
N/A
G24
SXPVDD1
Power
N/A
G25
SR1_IMP_CAL_TX
I
SXCVDD1
G26
SXCVSS1
Ground
N/A
G27
Reserved
NC
—
G28
Reserved
NC
—
GVDD2
Power
N/A
H2
VSS
Ground
N/A
H3
M2DQ18
I/O
GVDD2
H4
GVDD2
Power
N/A
H5
VSS
Ground
N/A
H6
M2DQ20
I/O
GVDD2
H7
GVDD2
Power
N/A
H8
VSS
Ground
N/A
H9
M2A15
O
GVDD2
H10
M2CK2
O
GVDD2
H11
M2MDIC0
I/O
GVDD2
H12
M2VREF
I
GVDD2
H13
M2MDIC1
I/O
GVDD2
H14
M2DQ46
I/O
GVDD2
H15
M2DQ47
I/O
GVDD2
H16
M2DQ45
I/O
GVDD2
H17
M2DQ41
I/O
GVDD2
H18
M2DQ62
I/O
GVDD2
H19
M2DQ63
I/O
GVDD2
H20
M2DQ61
I/O
GVDD2
H21
Reserved
NC
—
H22
Reserved
NC
—
H23
SR1_TXD3/SG2_TX4
O
SXPVDD1
H24
SR1_TXD3/SG2_TX4
O
SXPVDD1
H1
MSC8156E Six-Core Digital Signal Processor with Security Data Sheet, Rev. 0
Freescale Semiconductor
9
Table 1. Signal List by Ball Number (continued)
Signal Name1,2
Ball Number
Pin Type10
Power Rail
Name
H25
SXCVSS1
Ground
N/A
H26
SXCVDD1
Power
N/A
H27
SR1_RXD3/SG2_RX4
I
SXCVDD1
H28
SR1_RXD3/SG2_RX4
I
SXCVDD1
J1
M2DQS1
I/O
GVDD2
J2
M2DQS1
I/O
GVDD2
J3
M2DQ10
I/O
GVDD2
J4
M2DQ11
I/O
GVDD2
J5
M2DQ14
I/O
GVDD2
J6
M2DQ23
I/O
GVDD2
J7
M2ODT0
O
GVDD2
J8
M2A12
O
GVDD2
J9
M2A14
O
GVDD2
J10
VSS
Ground
N/A
J11
GVDD2
Power
N/A
J12
VSS
Ground
N/A
J13
GVDD2
Power
N/A
J14
VSS
Ground
N/A
N/A
J15
GVDD2
Power
J16
VSS
Ground
N/A
J17
GVDD2
Power
N/A
J18
VSS
Ground
N/A
J19
GVDD2
Power
N/A
J20
Reserved
NC
—
J21
Reserved
NC
—
J22
Reserved
NC
—
J23
SXPVDD1
Power
N/A
J24
SXPVSS1
Ground
N/A
J25
SXCVDD1
Power
N/A
J26
SXCVSS1
Ground
N/A
J27
SXCVDD1
Power
N/A
J28
SXCVSS1
Ground
N/A
K1
VSS
Ground
N/A
K2
GVDD2
Power
N/A
O
GVDD2
K3
M2DM1
K4
VSS
Ground
N/A
K5
GVDD2
Power
N/A
K6
M2DQ0
I/O
GVDD2
K7
VSS
Ground
N/A
K8
GVDD2
Power
N/A
K9
M2DQ5
I/O
GVDD2
K10
VSS
Ground
N/A
K11
VDD
Power
N/A
K12
VSS
Ground
N/A
K13
VDD
Power
N/A
K14
VSS
Ground
N/A
MSC8156E Six-Core Digital Signal Processor with Security Data Sheet, Rev. 0
10
Freescale Semiconductor
Table 1. Signal List by Ball Number (continued)
Signal Name1,2
Ball Number
Pin Type10
Power Rail
Name
K15
VDD
Power
N/A
K16
VSS
Ground
N/A
K17
VDD
Power
N/A
K18
VSS
Ground
N/A
K19
VDD
Power
N/A
K20
Reserved
NC
—
K21
Reserved
NC
—
K22
Reserved
NC
—
K23
SXPVDD2
Power
N/A
K24
SXPVSS2
Ground
N/A
N/A
K25
SXCVDD2
Power
K26
SXCVSS2
Ground
N/A
K27
SXCVDD2
Power
N/A
K28
SXCVSS2
Ground
N/A
L1
M2DQ9
I/O
GVDD2
L2
M2DQ12
I/O
GVDD2
L3
M2DQ13
I/O
GVDD2
L4
M2DQS0
I/O
GVDD2
L5
M2DQS0
I/O
GVDD2
L6
M2DM0
O
GVDD2
L7
M2DQ3
I/O
GVDD2
L8
M2DQ2
I/O
GVDD2
L9
M2DQ4
I/O
GVDD2
N/A
L10
VDD
Power
L11
VSS
Ground
N/A
L12
M3VDD
Power
N/A
L13
VSS
Ground
N/A
L14
VDD
Power
N/A
L15
VSS
Ground
N/A
L16
VDD
Power
N/A
L17
VSS
Ground
N/A
L18
VDD
Power
N/A
L19
VSS
Ground
N/A
L20
Reserved
NC
—
L21
Reserved
NC
—
L22
Reserved
NC
—
L23
SR2_TXD3/PE_TXD3/SG2_TX4
O
SXPVDD2
L24
SR2_TXD3/PE_TXD3/SG2_TX4
O
SXPVDD2
L25
SXCVSS2
Ground
N/A
L26
SXCVDD2
Power
N/A
L27
SR2_RXD3/PE_RXD3/SG2_RX4
I
SXCVDD2
L28
SR2_RXD3/PE_RXD3/SG2_RX4
I
SXCVDD2
I/O
GVDD2
M1
M2DQ8
M2
VSS
Ground
N/A
M3
GVDD2
Power
N/A
M4
M2DQ15
I/O
GVDD2
MSC8156E Six-Core Digital Signal Processor with Security Data Sheet, Rev. 0
Freescale Semiconductor
11
Table 1. Signal List by Ball Number (continued)
Signal Name1,2
Ball Number
Pin Type10
Power Rail
Name
M5
M2DQ1
I/O
GVDD2
M6
VSS
Ground
N/.A
M7
GVDD2
Power
N/A
M8
M2DQ7
I/O
GVDD2
M9
M2DQ6
I/O
GVDD2
M10
VSS
Ground
N/A
M11
VDD
Power
N/A
M12
VSS
Ground
N/A
M13
VDD
Power
N/A
M14
VSS
Ground
N/A
N/A
M15
VDD
Power
M16
VSS
Ground
N/A
M17
VDD
Power
N/A
M18
VSS
Ground
N/A
M19
VDD
Power
N/A
M20
Reserved
NC
—
M21
Reserved
NC
—
M22
Reserved
NC
—
M23
SXPVSS2
Ground
N/A
M24
SXPVDD2
Power
N/A
M25
SR2_IMP_CAL_TX
I
SXCVDD2
M26
SXCVSS2
Ground
N/A
M27
Reserved
NC
—
M28
Reserved
N1
VSS
N2
TRST7
7
NC
—
Ground
N/A
I
QVDD
I
QVDD
N3
PORESET
N4
VSS
Ground
N/A
N5
TMS7
I
QVDD
N6
CLKOUT
O
QVDD
N7
VSS
Ground
N/A
N8
VSS
Ground
N/A
N9
VSS
Ground
N/A
N10
VDD
Power
N/A
N11
VSS
Ground
N/A
N12
M3VDD
Power
N/A
N13
VSS
Ground
N/A
N14
VDD
Power
N/A
N15
VSS
Ground
N/A
N/A
N16
VDD
Power
N17
VSS
Ground
N/A
N18
VDD
Power
N/A
N19
VSS
Ground
N/A
N20
Reserved
NC
—
N21
SXPVDD2
Power
N/A
N22
SXPVSS2
Ground
N/A
MSC8156E Six-Core Digital Signal Processor with Security Data Sheet, Rev. 0
12
Freescale Semiconductor
Table 1. Signal List by Ball Number (continued)
Signal Name1,2
Ball Number
Pin Type10
Power Rail
Name
N23
SR2_TXD2/PE_TXD2/SG1_TX4
O
SXPVDD2
N24
SR2_TXD2/PE_TXD2/SG1_TX4
O
SXPVDD2
N/A
N25
SXCVDD2
Power
N26
SXCVSS2
Ground
N/A
N27
SR2_RXD2/PE_RXD2/SG1_RX4
I
SXCVDD2
N28
SR2_RXD2/PE_RXD2/SG1_RX4
I
SXCVDD2
P1
CLKIN
I
QVDD
P2
EE0
I
QVDD
P3
QVDD
Power
N/A
P4
VSS
Ground
N/A
P5
STOP_BS
I
QVDD
P6
QVDD
Power
N/A
P7
VSS
Ground
N/A
P8
PLL0_AVDD9
Power
VDD
P9
PLL2_AVDD9
Power
VDD
P10
VSS
Ground
N/A
P11
VDD
Power
N/A
P12
VSS
Ground
N/A
P13
VDD
Power
N/A
P14
VSS
Ground
N/A
P15
MVDD
Power
N/A
P16
VSS
Ground
N/A
P17
MVDD
Power
N/A
P18
VSS
Ground
N/A
P19
VDD
Power
N/A
P20
Reserved
NC
—
P21
Reserved
NC
—
P22
Reserved
NC
—
P23
SXPVDD2
Power
N/A
P24
SXPVSS2
Ground
N/A
P25
SR2_PLL_AGND9
Ground
SXCVSS2
P26
SR2_PLL_AVDD9
Power
SXCVDD2
P27
SXCVSS2
Ground
N/A
P28
SXCVDD2
Power
N/A
R1
VSS
Ground
N/A
R2
NMI
I
QVDD
R3
NMI_OUT6
O
QVDD
6,7
I/O
QVDD
O
QVDD
QVDD
R4
HRESET
R5
INT_OUT6
R6
EE1
O
R7
VSS
Ground
N/A
R8
PLL1_AVDD9
Power
VDD
R9
VSS
Ground
N/A
R10
VDD
Power
N/A
R11
VSS
Non-user
N/A
R12
VDD
Power
N/A
MSC8156E Six-Core Digital Signal Processor with Security Data Sheet, Rev. 0
Freescale Semiconductor
13
Table 1. Signal List by Ball Number (continued)
Signal Name1,2
Ball Number
Pin Type10
Power Rail
Name
R13
VSS
Ground
N/A
R14
VDD
Power
N/A
R15
VSS
Ground
N/A
R16
MVDD
Power
N/A
R17
VSS
Ground
N/A
R18
VDD
Power
N/A
R19
VSS
Ground
N/A
R20
VSS
Non-user
N/A
R21
SXPVSS2
Ground
N/A
R22
SXPVDD2
Power
N/A
R23
SR2_TXD1/PE_TXD1
4
O
SXPVDD2
R24
SR2_TXD1/PE_TXD14
O
SXPVDD2
R25
SXCVSS2
Ground
N/A
R26
SXCVDD2
Power
N/A
R27
SR2_RXD1/PE_RXD14
I
SXCVDD2
R28
SR2_RXD1/PE_RXD14
I
SXCVDD2
T1
VSS
Ground
N/A
T2
TCK
I
QVDD
T3
SRESET6,7
I/O
QVDD
T4
TDI
I
QVDD
T5
VSS
Ground
N/A
T6
TDO
Power
QVDD
T7
VSS
Ground
N/A
T8
VSS
Ground
N/A
T9
QVDD
Power
N/A
T10
VSS
Ground
N/A
T11
VDD
Power
N/A
T12
VSS
Ground
N/A
T13
M3VDD
Power
N/A
T14
VSS
Ground
N/A
T15
VDD
Power
N/A
T16
VSS
Ground
N/A
T17
MVDD
Power
N/A
T18
VSS
Ground
N/A
T19
VDD
Power
N/A
T20
VSS
Ground
N/A
T21
VSS
Non-user
N/A
T22
SR2_IMP_CAL_RX
I
SXCVDD2
T23
SXPVSS2
Ground
N/A
T24
SXPVDD2
Power
N/A
T25
SR2_REF_CLK
I
SXCVDD2
T26
SR2_REF_CLK
I
SXCVDD2
T27
Reserved
NC
—
T28
Reserved
NC
—
U1
M1DQ8
I/O
GVDD1
U2
VSS
Ground
N/A
MSC8156E Six-Core Digital Signal Processor with Security Data Sheet, Rev. 0
14
Freescale Semiconductor
Table 1. Signal List by Ball Number (continued)
Signal Name1,2
Ball Number
Pin Type10
Power Rail
Name
U3
GVDD1
Power
N/A
U4
M1DQ15
I/O
GVDD1
U5
M1DQ1
I/O
GVDD1
U6
VSS
Ground
N/A
U7
GVDD1
Power
N/A
U8
M1DQ7
I/O
GVDD1
U9
M1DQ6
I/O
GVDD1
N/A
U10
VDD
Power
U11
VSS
Ground
N/A
U12
M3VDD
Power
N/A
U13
VSS
Ground
N/A
U14
VDD
Power
N/A
U15
VSS
Ground
N/A
U16
VDD
Power
N/A
U17
VSS
Ground
N/A
U18
VDD
Power
N/A
U19
VSS
Ground
N/A
U20
VSS
Ground
N/A
U21
VSS
Ground
N/A
U22
VSS
Non-user
N/A
U23
SR2_TXD0/PE_TXD04
O
SXPVDD2
U24
SR2_TXD0/PE_TXD04
O
SXPVDD2
U25
SXCVDD2
Power
N/A
U26
SXCVSS2
Ground
N/A
U27
SR2_RXD0/PE_RXD04
I
SXCVDD2
U28
SR2_RXD0/PE_RXD04
I
SXCVDD2
V1
M1DQ9
I/O
GVDD1
V2
M1DQ12
I/O
GVDD1
V3
M1DQ13
I/O
GVDD1
V4
M1DQS0
I/O
GVDD1
V5
M1DQS0
I/O
GVDD1
V6
M1DM0
O
GVDD1
V7
M1DQ3
I/O
GVDD1
V8
M1DQ2
I/O
GVDD1
I/O
GVDD1
V9
M1DQ4
V10
VSS
Ground
N/A
V11
VDD
Power
N/A
V12
VSS
Ground
N/A
V13
VDD
Power
N/A
V14
VSS
Ground
N/A
V15
VDD
Power
N/A
V16
VSS
Ground
N/A
V17
VDD
Power
N/A
V18
VSS
Ground
N/A
V19
VDD
Power
N/A
V20
NVDD
Power
N/A
MSC8156E Six-Core Digital Signal Processor with Security Data Sheet, Rev. 0
Freescale Semiconductor
15
Table 1. Signal List by Ball Number (continued)
Signal Name1,2
Ball Number
Pin Type10
Power Rail
Name
V21
RCW_LSEL_3/RC20
I/O
NVDD
V22
RCW_LSEL_2/RC19
I/O
NVDD
N/A
V23
SXPVDD2
Power
V24
SXPVSS2
Ground
N/A
V25
RCW_LSEL_1/RC18
I/O
NVDD
V26
RC21
I
NVDD
V27
SXCVDD2
Power
N/A
V28
SXCVSS2
Ground
N/A
W1
VSS
Ground
N/A
W2
GVDD1
Power
N/A
W3
M1DM1
O
GVDD1
W4
VSS
Ground
N/A
W5
GVDD1
Power
N/A
W6
M1DQ0
I/O
GVDD1
W7
VSS
Ground
N/A
W8
GVDD1
Power
N/A
W9
M1DQ5
I/O
GVDD1
W10
VDD
Power
N/A
W11
VSS
Ground
N/A
W12
VDD
Power
N/A
W13
VSS
Ground
N/A
W14
VDD
Power
N/A
W15
VSS
Ground
N/A
W16
VDD
Power
N/A
W17
VSS
Ground
N/A
W18
VDD
Power
N/A
W19
VSS
Ground
N/A
W20
VSS
Ground
N/A
W21
RCW_LSEL0/RC17
I/O
NVDD
W22
GPIO19/SPI_MISO5,8
I/O
NVDD
W23
VSS
Ground
N/A
W24
NVDD
Power
N/A
W25
GPIO11/IRQ11/RC115,8
I/O
NVDD
W26
GPIO3/DRQ1/IRQ3/RC35,8
I/O
NVDD
W27
GPIO7/IRQ7/RC7
5,8
I/O
NVDD
W28
GPIO2/IRQ2/RC25,8
I/O
NVDD
Y1
M1DQS1
I/O
GVDD1
Y2
M1DQS1
I/O
GVDD1
Y3
M1DQ10
I/O
GVDD1
Y4
M1DQ11
I/O
GVDD1
Y5
M1DQ14
I/O
GVDD1
Y6
M1DQ23
I/O
GVDD1
Y7
M1ODT0
O
GVDD1
Y8
M1A12
O
GVDD1
Y9
M1A14
O
GVDD1
Y10
VSS
Ground
N/A
MSC8156E Six-Core Digital Signal Processor with Security Data Sheet, Rev. 0
16
Freescale Semiconductor
Table 1. Signal List by Ball Number (continued)
Signal Name1,2
Ball Number
Pin Type10
Power Rail
Name
Y11
GVDD1
Power
N/A
Y12
VSS
Ground
N/A
Y13
GVDD1
Power
N/A
Y14
VSS
Ground
N/A
Y15
GVDD1
Power
N/A
Y16
VSS
Ground
N/A
Y17
GVDD1
Power
N/A
Y18
VSS
Ground
N/A
Y19
GVDD1
Power
N/A
Y20
VSS
Ground
N/A
Y21
NVDD
Power
N/A
Y22
GPIO20/SPI_SL5,8
I/O
NVDD
Y23
GPIO17/SPI_SCK5,8
I/O
NVDD
Y24
GPIO14/DRQ0/IRQ14/RC145,8
I/O
NVDD
Y25
GPIO12/IRQ12/RC125,8
I/O
NVDD
Y26
GPIO8/IRQ8/RC85,8
I/O
NVDD
Y27
NVDD
Power
N/A
Y28
VSS
Ground
N/A
AA1
GVDD1
Power
N/A
AA2
VSS
Ground
N/A
AA3
M1DQ18
I/O
GVDD1
AA4
GVDD1
Power
N/A
AA5
VSS
Ground
N/A
AA6
M1DQ20
I/O
GVDD1
AA7
GVDD1
Power
N/A
AA8
VSS
Ground
N/A
AA9
M1A15
O
GVDD1
AA10
M1CK2
O
GVDD1
AA11
M1MDIC0
I/O
GVDD1
AA12
M1VREF
I
GVDD1
AA13
M1MDIC1
I/O
GVDD1
AA14
M1DQ46
I/O
GVDD1
AA15
M1DQ47
I/O
GVDD1
AA16
M1DQ45
I/O
GVDD1
AA17
M1DQ41
I/O
GVDD1
AA18
M1DQ62
I/O
GVDD1
AA19
M1DQ63
I/O
GVDD1
AA20
M1DQ61
AA21
VSS
5,8
I/O
GVDD1
Ground
N/A
AA22
GPIO21
I/O
NVDD
AA23
GPIO18/SPI_MOSI5,8
I/O
NVDD
AA24
GPIO16/RC165,8
I/O
NVDD
5,8
AA25
GPIO4/DDN1/IRQ4/RC4
I/O
NVDD
AA26
GPIO9/IRQ9/RC95,8
I/O
NVDD
AA27
GPIO6/IRQ6/RC65,8
I/O
NVDD
AA28
5,8
I/O
NVDD
GPIO1/IRQ1/RC1
MSC8156E Six-Core Digital Signal Processor with Security Data Sheet, Rev. 0
Freescale Semiconductor
17
Table 1. Signal List by Ball Number (continued)
Signal Name1,2
Ball Number
Pin Type10
Power Rail
Name
AB1
M1DQS2
I/O
GVDD1
AB2
M1DQS2
I/O
GVDD1
AB3
M1DQ19
I/O
GVDD1
AB4
M1DM2
O
GVDD1
AB5
M1DQ21
I/O
GVDD1
AB6
M1DQ22
I/O
GVDD1
AB7
M1CKE0
O
GVDD1
AB8
M1A11
O
GVDD1
AB9
M1A7
O
GVDD1
AB10
M1CK2
O
GVDD1
AB11
M1APAR_OUT
O
GVDD1
AB12
M1ODT1
O
GVDD1
AB13
M1APAR_IN
I
GVDD1
AB14
M1DQ43
I/O
GVDD1
AB15
M1DM5
O
GVDD1
AB16
M1DQ44
I/O
GVDD1
AB17
M1DQ40
I/O
GVDD1
AB18
M1DQ59
I/O
GVDD1
AB19
M1DM7
O
GVDD1
AB20
M1DQ60
I/O
GVDD1
AB21
VSS
Ground
N/A
AB22
GPIO31/I2C_SDA5,8
I/O
NVDD
AB23
GPIO27/TMR4/RCW_SRC05,8
I/O
NVDD
AB24
GPIO25/TMR2/RCW_SRC15,8
I/O
NVDD
AB25
GPIO24/TMR1/RCW_SRC25,8
I/O
NVDD
AB26
GPIO10/IRQ10/RC105,8
I/O
NVDD
AB27
GPIO5/IRQ5/RC5
5,8
I/O
NVDD
AB28
GPIO0/IRQ0/RC05,8
I/O
NVDD
AC1
VSS
Ground
N/A
AC2
GVDD1
Power
N/A
AC3
M1DQ16
I/O
GVDD1
AC4
VSS
Ground
N/A
AC5
GVDD1
Power
N/A
AC6
M1DQ17
I/O
GVDD1
AC7
VSS
Ground
N/A
AC8
GVDD1
Power
N/A
AC9
M1BA2
O
GVDD1
AC10
VSS
Ground
N/A
AC11
GVDD1
Power
N/A
AC12
M1A4
O
GVDD1
AC13
VSS
Ground
N/A
AC14
GVDD1
Power
N/A
AC15
M1DQ42
I/O
GVDD1
AC16
VSS
Ground
N/A
AC17
GVDD1
Power
N/A
AC18
M1DQ58
I/O
GVDD1
MSC8156E Six-Core Digital Signal Processor with Security Data Sheet, Rev. 0
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Freescale Semiconductor
Table 1. Signal List by Ball Number (continued)
Signal Name1,2
Ball Number
Pin Type10
Power Rail
Name
AC19
VSS
Ground
N/A
AC20
GVDD1
Power
N/A
AC21
VSS
Ground
N/A
AC22
NVDD
Power
N/A
AC23
GPIO30/I2C_SCL5,8
I/O
NVDD
AC24
GPIO26/TMR35,8
I/O
NVDD
AC25
VSS
Ground
N/A
AC26
NVDD
Power
N/A
AC27
GPIO23/TMR05,8
I/O
NVDD
AC28
GPIO225,8
I/O
NVDD
AD1
M1DQ31
I/O
GVDD1
AD2
M1DQ30
I/O
GVDD1
AD3
M1DQ27
I/O
GVDD1
AD4
M1ECC7
I/O
GVDD1
AD5
M1ECC6
I/O
GVDD1
AD6
M1ECC3
I/O
GVDD1
AD7
M1A9
O
GVDD1
AD8
M1A6
O
GVDD1
GVDD1
AD9
M1A3
O
AD10
M1A10
O
GVDD1
AD11
M1RAS
O
GVDD1
AD12
M1A2
O
GVDD1
AD13
M1DQ38
I/O
GVDD1
AD14
M1DQS5
I/O
GVDD1
AD15
M1DQS5
I/O
GVDD1
AD16
M1DQ33
I/O
GVDD1
AD17
M1DQ56
I/O
GVDD1
AD18
M1DQ57
I/O
GVDD1
AD19
M1DQS7
I/O
GVDD1
AD20
M1DQS7
I/O
GVDD1
AD21
VSS
Ground
N/A
AD22
GE2_TX_CTL
O
NVDD
AD23
GPIO15/DDN0/IRQ15/RC155,8
I/O
NVDD
AD24
GPIO13/IRQ13/RC135,8
I/O
NVDD
AD25
GE_MDC
O
NVDD
AD26
GE_MDIO
I/O
NVDD
AD27
TDM2TCK/GE1_TD33
I/O
NVDD
AD28
3
TDM2RCK/GE1_TD0
I/O
NVDD
AE1
GVDD1
Power
N/A
AE2
VSS
Ground
N/A
AE3
M1DQ29
I/O
GVDD1
AE4
GVDD1
Power
N/A
AE5
VSS
Ground
N/A
AE6
M1ECC5
I/O
GVDD1
AE7
GVDD1
Power
N/A
AE8
VSS
Ground
N/A
MSC8156E Six-Core Digital Signal Processor with Security Data Sheet, Rev. 0
Freescale Semiconductor
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Table 1. Signal List by Ball Number (continued)
Signal Name1,2
Ball Number
Pin Type10
Power Rail
Name
AE9
M1A8
O
GVDD1
AE10
GVDD1
Power
N/A
AE11
VSS
Ground
N/A
AE12
M1A0
O
GVDD1
AE13
GVDD1
Power
N/A
AE14
VSS
Ground
N/A
AE15
M1DQ39
I/O
GVDD1
N/A
AE16
GVDD1
Power
AE17
VSS
Ground
N/A
AE18
M1DQ54
I/O
GVDD1
N/A
AE19
GVDD1
Power
AE20
VSS
Ground
N/A
AE21
GPIO29/UART_TXD5,8
I/O
NVDD
AE22
TDM1TCK/GE2_RX_CLK3
I
NVDD
AE23
TDM1RSN/GE2_RX_CTL3
I/O
NVDD
AE24
VSS
Ground
N/A
AE25
TDM3RCK/GE1_GTX_CLK3
I/O
NVDD
AE26
TDM3TSN/GE1_RX_CLK3
I/O
NVDD
AE27
TDM2RSN/GE1_TD2
3
I/O
NVDD
AE28
TDM2RDT/GE1_TD13
I/O
NVDD
AF1
M1DQ28
I/O
GVDD1
AF2
M1DM3
O
GVDD1
AF3
M1DQ26
I/O
GVDD1
AF4
M1ECC4
I/O
GVDD1
AF5
M1DM8
O
GVDD1
AF6
M1ECC2
I/O
GVDD1
AF7
M1CKE1
O
GVDD1
AF8
M1CK0
O
GVDD1
AF9
M1CK0
O
GVDD1
AF10
M1BA1
O
GVDD1
AF11
M1A1
O
GVDD1
AF12
M1WE
O
GVDD1
AF13
M1DQ37
I/O
GVDD1
AF14
M1DM4
O
GVDD1
AF15
M1DQ36
I/O
GVDD1
AF16
M1DQ32
I/O
GVDD1
AF17
M1DQ55
I/O
GVDD1
AF18
M1DM6
O
GVDD1
AF19
M1DQ53
I/O
GVDD1
AF20
M1DQ52
I/O
GVDD1
AF21
GPIO28/UART_RXD5,8
I/O
NVDD
AF22
TDM0RSN/GE2_TD23
I/O
NVDD
AF23
TDM0TDT/GE2_TD3
3
I/O
NVDD
AF24
NVDD
AF25
TDM2TSN/GE1_TX_CTL3
AF26
GE1_RX_CTL
Power
N/A
I/O
NVDD
I
NVDD
MSC8156E Six-Core Digital Signal Processor with Security Data Sheet, Rev. 0
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Freescale Semiconductor
Table 1. Signal List by Ball Number (continued)
Signal Name1,2
Ball Number
Pin Type10
Power Rail
Name
AF27
TDM2TDT/GE1_TX_CLK3
I/O
NVDD
AF28
TDM3RSN/GE1_RD13
I/O
NVDD
AG1
M1DQ24
I/O
GVDD1
AG2
GVDD1
Power
N/A
AG3
M1DQ25
I/O
GVDD1
AG4
VSS
Ground
N/A
AG5
GVDD1
Power
N/A
AG6
M1ECC1
I/O
GVDD1
AG7
VSS
Ground
N/A
AG8
GVDD1
Power
N/A
O
GVDD1
AG9
M1A13
AG10
VSS
Ground
N/A
AG11
GVDD1
Power
N/A
AG12
M1CS1
O
GVDD1
AG13
VSS
Ground
N/A
AG14
GVDD1
Power
N/A
AG15
M1DQ35
I/O
GVDD1
AG16
VSS
Ground
N/A
AG17
GVDD1
Power
N/A
AG18
M1DQ51
I/O
GVDD1
AG19
VSS
Ground
N/A
AG20
GVDD1
Power
N/A
AG21
NVDD
Power
N/A
AG22
TDM1TSN/GE2_TD13
I/O
NVDD
AG23
TDM1RDT/GE2_TX_CLK3
I/O
NVDD
AG24
TDM0TCK/GE2_GTX_CLK3
I/O
NVDD
I/O
NVDD
3
AG25
TDM1TDT/GE2_TD0
AG26
VSS
Ground
N/A
AG27
NVDD
Power
N/A
AG28
TDM3RDT/GE1_RD03
I/O
NVDD
AH1
Reserved.
NC
—
AH2
M1DQS3
I/O
GVDD1
AH3
M1DQS3
I/O
GVDD1
AH4
M1ECC0
I/O
GVDD1
AH5
M1DQS8
I/O
GVDD1
AH6
M1DQS8
I/O
GVDD1
AH7
M1A5
O
GVDD1
AH8
M1CK1
O
GVDD1
AH9
M1CK1
O
GVDD1
AH10
M1CS0
O
GVDD1
AH11
M1BA0
O
GVDD1
AH12
M1CAS
O
GVDD1
AH13
M1DQ34
I/O
GVDD1
AH14
M1DQS4
I/O
GVDD1
AH15
M1DQS4
I/O
GVDD1
AH16
M1DQ50
I/O
GVDD1
MSC8156E Six-Core Digital Signal Processor with Security Data Sheet, Rev. 0
Freescale Semiconductor
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Table 1. Signal List by Ball Number (continued)
Signal Name1,2
Ball Number
Pin Type10
Power Rail
Name
AH17
M1DQS6
I/O
GVDD1
AH18
M1DQS6
I/O
GVDD1
AH19
M1DQ48
I/O
GVDD1
AH20
M1DQ49
I/O
GVDD1
AH21
VSS
Ground
N/A
AH22
TDM0RCK/GE2_RD23
I/O
NVDD
AH23
TDM0RDT/GE2_RD33
I/O
NVDD
AH24
TDM0TSN/GE2_RD03
I/O
NVDD
AH25
TDM1RCK/GE2_RD13
I/O
NVDD
AH26
TDM3TDT/GE1_RD33
I/O
NVDD
AH27
TDM3TCK/GE1_RD2
3
I
NVDD
AH28
VSS
Ground
N/A
Notes:
1.
Reserved signals should be disconnected for compatibility with future revisions of the device. Non-user signals are reserved
for manufacturing and test purposes only. The assigned signal name is used to indicate whether the signal must be
unconnected (Reserved), pulled down (VSS), or pulled up (VDD).
2. Signal function during power-on reset is determined by the RCW source type.
3. Selection of TDM versus RGMII functionality is determined by the RCW bit values.
4. Selection of RapidIO, SGMII, and PCI Express functionality is determined by the RCW bit values.
5. Selection of the GPIO function and other functions is done by GPIO register setup. For configuration details, see the GPIO
chapter in the MSC8156E Reference Manual.
6. Open-drain signal.
7. Internal 20 KΩ pull-up resistor.
8. For signals with GPIO functionality, the open-drain and internal 20 KΩ pull-up resistor can be configured by GPIO register
programming. See the GPIO chapter of the MSC8156E Reference Manual for configuration details.
9. Connect to power supply via external filter. See Section 3.2, PLL Power Supply Design Considerations for details.
10. Pin types are: Ground = all VSS connections; Power = all VDD connections; I = Input; O = Output; I/O = Input/Output; NC =
not connected.
MSC8156E Six-Core Digital Signal Processor with Security Data Sheet, Rev. 0
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Freescale Semiconductor
Electrical Characteristics
2
Electrical Characteristics
This document contains detailed information on power considerations, DC/AC electrical characteristics, and AC timing
specifications. For additional information, see the MSC8156E Reference Manual.
2.1
Maximum Ratings
In calculating timing requirements, adding a maximum value of one specification to a minimum value of another specification
does not yield a reasonable sum. A maximum specification is calculated using a worst case variation of process parameter values
in one direction. The minimum specification is calculated using the worst case for the same parameters in the opposite direction.
Therefore, a “maximum” value for a specification never occurs in the same device with a “minimum” value for another
specification; adding a maximum to a minimum represents a condition that can never exist.
Table 2 describes the maximum electrical ratings for the MSC8156E.
Table 2. Absolute Maximum Ratings
Rating
Core supply voltage
• Cores 0–5
Power Rail Name
Symbol
Value
Unit
VDD
VDD
–0.3 to 1.1
V
VDDPLL0
VDDPLL1
VDDPLL2
–0.3 to 1.1
–0.3 to 1.1
–0.3 to 1.1
V
V
V
PLL supply voltage3
M3 memory supply voltage
M3VDD
VDDM3
–0.3 to 1.1
V
MAPLE-B supply voltage
MVDD
VDDM
–0.3 to 1.1
V
GVDD1, GVDD2
VDDDDR
–0.3 to 1.98
–0.3 to 1.65
V
V
MVREF
–0.3 to 0.51 × VDDDDR
V
VINDDR
–0.3 to VDDDDR + 0.3
V
VDDIO
–0.3 to 2.625
V
VINIO
–0.3 to VDDIO + 0.3
V
DDR memory supply voltage
• DDR2 mode
• DDR3 mode
DDR reference voltage
MVREF
Input DDR voltage
I/O voltage excluding DDR and RapidIO lines
NVDD, QVDD
Input I/O voltage
RapidIO pad voltage
SXPVDD1,
SXPVDD2
VDDSXP
–0.3 to 1.26
V
Rapid I/O core voltage
SXCVDD1,
SXCVDD2
VDDSXC
–0.3 to 1.21
V
VDDRIOPLL
–0.3 to 1.21
V
VINRIO
–0.3 to VDDSXC + 0.3
V
TJ
–40 to 105
°C
TSTG
–55 to +150
°C
Rapid I/O PLL voltage3
Input RapidIO I/O voltage
Operating temperature
Storage temperature range
Notes:
1.
2.
3.
Functional operating conditions are given in Table 3.
Absolute maximum ratings are stress ratings only, and functional operation at the maximum is not guaranteed. Stress beyond
the listed limits may affect device reliability or cause permanent damage.
PLL supply voltage is specified at input of the filter and not at pin of the MSC8156E (see Figure 36 and Figure 37)
MSC8156E Six-Core Digital Signal Processor with Security Data Sheet, Rev. 0
Freescale Semiconductor
23
Electrical Characteristics
2.2
Recommended Operating Conditions
Table 3 lists recommended operating conditions. Proper device operation outside of these conditions is not guaranteed.
Table 3. Recommended Operating Conditions
Rating
Core supply voltage
Symbol
Min
Nominal
Max
Unit
VDD
0.97
1.0
1.05
V
M3 memory supply voltage
VDDM3
0.97
1.0
1.05
V
MAPLE-B supply voltage
VDDM
0.97
1.0
1.05
V
MVREF
1.7
1.425
0.49 × VDDDDR
1.8
1.5
0.5 × VDDDDR
1.9
1.575
0.51 × VDDDDR
V
V
V
VDDIO
2.375
2.5
2.625
V
Rapid I/O pad voltage
VDDSXP
0.97
1.0
1.05
V
Rapid I/O core voltage
VDDSXC
0.97
1.0
1.05
V
TJ
TJ
TA
TJ
0
0
–40
—
90
105
—
105
°C
°C
°C
DDR memory supply voltage
• DDR2 mode
• DDR3 mode
DDR reference voltage
I/O voltage excluding DDR and
RapidIO lines
Operating temperature range:
• Standard
• Higher
• Extended
VDDDDR
MSC8156E Six-Core Digital Signal Processor with Security Data Sheet, Rev. 0
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Freescale Semiconductor
Electrical Characteristics
2.3
Thermal Characteristics
Table 4 describes thermal characteristics of the MSC8156E for the FC-PBGA packages.
Table 4. Thermal Characteristics for the MSC8156E
Characteristic
FC-PBGA
29 × 29 mm2
Symbol
Unit
Natural
Convection
200 ft/min
(1 m/s) airflow
RθJA
18
12
°C/W
Junction-to-ambient, four-layer board
RθJA
13
9
°C/W
Junction-to-board (bottom)3
RθJB
5
°C/W
Junction-to-case4
RθJC
0.6
°C/W
Junction-to-ambient1, 2
1, 2
Notes:
1.
2.
3.
4.
2.4
Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board)
temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal
resistance.
Junction-to-ambient thermal resistance determined per JEDEC JESD51-3 and JESDC51-6. Thermal test board meets JEDEC
specification for the specified package.
Junction-to-board thermal resistance determined per JEDEC JESD 51-8. Thermal test board meets JEDEC specification for
the specified package.
Junction-to-case at the top of the package determined using MIL- STD-883 Method 1012.1. The cold plate temperature is used
for the case temperature. Reported value includes the thermal resistance of the interface layer
CLKIN Requirements
Table 5 summarizes the required characteristics for the CLKIN signal.
Table 5. CLKIN Requirements
Parameter/Condition1
Symbol
Min
Typ
Max
Unit
Notes
CLKIN duty cycle
—
40
—
60
%
2
CLKIN slew rate
—
1
—
4
V/ns
3
CLKIN peak period jitter
—
—
—
±150
ps
—
CLKIN jitter phase noise at –56 dBc
AC input swing limits
Input capacitance
Notes:
2.5
1.
2.
3.
4.
—
—
—
500
KHz
4
ΔVAC
1.5
—
—
V
—
CIN
—
—
15
pf
—
For clock frequencies, see the Clock chapter in the MSC8156E Reference Manual.
Measured at the rising edge and/or the falling edge at VDDIO/2.
Slew rate as measured from ±20% to 80% of voltage swing at clock input.
Phase noise is calculated as FFT of TIE jitter.
DC Electrical Characteristics
This section describes the DC electrical characteristics for the MSC8156E.
2.5.1
DDR SDRAM DC Electrical Characteristics
This section describes the DC electrical specifications for the DDR SDRAM interface of the MSC8156E.
Note:
DDR2 SDRAM uses VDDDDR(typ) = 1.8 V and DDR3 SDRAM uses VDDDDR(typ) = 1.5 V.
MSC8156E Six-Core Digital Signal Processor with Security Data Sheet, Rev. 0
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Electrical Characteristics
2.5.1.1
DDR2 (1.8 V) SDRAM DC Electrical Characteristics
Table 6 provides the recommended operating conditions for the DDR SDRAM controller when interfacing to DDR2 SDRAM.
Note:
At recommended operating conditions (see Table 3) with VDDDDR = 1.8 V.
Table 6. DDR2 SDRAM Interface DC Electrical Characteristics
Parameter/Condition
Symbol
Min
Max
Unit
Notes
MVREF
0.49 × VDDDDR
0.51 × VDDDDR
V
2, 3, 4
Input high voltage
VIH
MVREF + 0.125
VDDDDR + 0.3
V
5
Input low voltage
VIL
–0.3
MVREF – 0.125
V
5
I/O leakage current
IOZ
–50
50
μA
6
Output high current (VOUT (VOH) = 1.37 V)
IOH
–13.4
—
mA
7
Output low current (VOUT (VOL) = 0.33 V)
IOL
13.4
—
mA
7
I/O reference voltage
Notes:
1.
2.
3.
4.
5.
6.
7.
2.5.1.2
VDDDDR is expected to be within 50 mV of the DRAM VDD supply voltage at all times. The DRAM and memory controller can
use the same or different sources.
MVREF is expected to be equal to 0.5 × VDDDDR, and to track VDDDDR DC variations as measured at the receiver.
Peak-to-peak noise on MVREF may not exceed ±2% of the DC value.
VTT is not applied directly to the device. It is the supply to which far end signal termination is made and is expected to be equal
to MVREF with a minimum value of MVREF – 0.4 and a maximum value of MVREF + 0.04 V. VTT should track variations in the
DC-level of MVREF.
The voltage regulator for MVREF must be able to supply up to 300 μA.
Input capacitance load for DQ, DQS, and DQS signals are available in the IBIS models.
Output leakage is measured with all outputs are disabled, 0 V ≤ VOUT ≤ VDDDDR.
Refer to the IBIS model for the complete output IV curve characteristics.
DDR3 (1.5V) SDRAM DC Electrical Characteristics
Table 7 provides the recommended operating conditions for the DDR SDRAM controller when interfacing to DDR3 SDRAM.
Note:
At recommended operating conditions (see Table 3) with VDDDDR = 1.5 V.
Table 7. DDR3 SDRAM Interface DC Electrical Characteristics
Parameter/Condition
Symbol
Min
Max
Unit
Notes
MVREF
0.49 × VDDDDR
0.51 × VDDDDR
V
2,3,4
Input high voltage
VIH
MVREF + 0.100
VDDDDR
V
5
Input low voltage
VIL
GND
MVREF – 0.100
V
5
I/O leakage current
IOZ
–50
50
μA
6
I/O reference voltage
Notes:
1.
2.
3.
4.
5.
6.
VDDDDR is expected to be within 50 mV of the DRAM VDD at all times. The DRAM and memory controller can use the same or
different sources.
MVREF is expected to be equal to 0.5 × VDDDDR and to track VDDDDR DC variations as measured at the receiver.
Peak-to-peak noise on MVREF may not exceed ±1% of the DC value.
VTT is not applied directly to the device. It is the supply to which far end signal termination is made and is expected to be
equal to MVREF with a minimum value of MVREF – 0.4 and a maximum value of MVREF + 0.04 V. VTT should track variations
in the DC-level of MVREF.
The voltage regulator for MVREF must be able to supply up to 250 μA.
Input capacitance load for DQ, DQS, and DQS signals are available in the IBIS models.
Output leakage is measured with all outputs are disabled, 0 V ≤ VOUT ≤ VDDDDR.
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2.5.1.3
DDR2/DDR3 SDRAM Capacitance
Table 8 provides the DDR controller interface capacitance for DDR2 and DDR3 memory.
Note:
At recommended operating conditions (see Table 3) with VDDDDR = 1.8 V for DDR2 memory or VDDDDR = 1.5 V for
DDR3 memory.
Table 8. DDR2/DDR3 SDRAM Capacitance
Parameter
Symbol
Min
Max
Unit
Notes
I/O capacitance: DQ, DQS, DQS
CIO
6
8
pF
1, 2
Delta I/O capacitance: DQ, DQS, DQS
CDIO
—
0.5
pF
1, 2
Notes:
1.
2.
2.5.1.4
This parameter is sampled. VDDDDR = 1.8 V ± 0.1 V (for DDR2), f = 1 MHz, TA = 25°C, VOUT = VDDDDR/2,
VOUT (peak-to-peak) = 0.2 V.
This parameter is sampled. VDDDDR = 1.5 V ± 0.075 V (for DDR3), f = 1 MHz, TA = 25°C, VOUT = VDDDDR/2,
VOUT (peak-to-peak) = 0.175 V.
DDR Reference Current Draw
Table 9 lists the current draw characteristics for MVREF.
Note:
Values when used at recommended operating conditions (see Table 3).
Table 9. Current Draw Characteristics for MVREF
Parameter / Condition
Current draw for MVREFn
• DDR2 SDRAM
• DDR3 SDRAM
2.5.2
Symbol
Min
IMVREFn
—
Max
Unit
300
250
μA
μA
High-Speed Serial Interface (HSSI) DC Electrical Characteristics
The MSC8156E features an HSSI that includes two 4-channel SerDes ports used for high-speed serial interface applications
(PCI Express, Serial RapidIO interfaces, and SGMII). This section and its subsections describe the common portion of the
SerDes DC, including the DC requirements for the SerDes reference clocks and the SerDes data lane transmitter (Tx) and
receiver (Rx) reference circuits. The data lane circuit specifications are specific for each supported interface, and they have
individual subsections by protocol. The selection of individual data channel functionality is done via the Reset Configuration
Word High Register (RCWHR) SerDes Protocol selection fields (S1P and S2P). Specific AC electrical characteristics are
defined in Section 2.6.2, “HSSI AC Timing Specifications.”
2.5.2.1
Signal Term Definitions
The SerDes interface uses differential signaling to transfer data across the serial link. This section defines terms used in the
description and specification of differential signals. Figure 3 shows how the signals are defined. For illustration purposes only,
one SerDes lane is used in the description. Figure 3 shows the waveform for either a transmitter output (SR[1–2]_TX and
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SR[1–2]_TX) or a receiver input (SR[1–2]_RX and SR[1–2]_RX). Each signal swings between A volts and B volts where
A > B.
SR[1–2]_TX or
SR[1–2]_RX
A Volts
Vcm = (A + B)/2
SR[1–2]_TX or
SR[1–2]_RX
B Volts
Differential Swing, VID or VOD = A – B
Differential Peak Voltage, VDIFFp = |A – B|
Differential Peak-Peak Voltage, VDIFFpp = 2 × VDIFFp (not shown)
Figure 3. Differential Voltage Definitions for Transmitter or Receiver
Using this waveform, the definitions are listed in Table 10. To simplify the illustration, the definitions assume that the SerDes
transmitter and receiver operate in a fully symmetrical differential signaling environment.
Table 10. Differential Signal Definitions
Term
Definition
Single-Ended Swing
The transmitter output signals and the receiver input signals SR[1–2]_TX, SR[1–2]_TX, SR[1–2]_RX
and SR[1–2]_RX each have a peak-to-peak swing of A – B volts. This is also referred to as each
signal wire’s single-ended swing.
Differential Output Voltage, VOD (or
Differential Output Swing):
The differential output voltage (or swing) of the transmitter, VOD, is defined as the difference of the
two complimentary output voltages: VSR[1–2]_TX – VSR[1–2]_TX. The VOD value can be either positive
or negative.
Differential Input Voltage, VID (or
Differential Input Swing)
The differential input voltage (or swing) of the receiver, VID, is defined as the difference of the two
complimentary input voltages: VSR[1–2]_RX – VSR[1–2]_RX. The VID value can be either positive or
negative.
Differential Peak Voltage, VDIFFp
The peak value of the differential transmitter output signal or the differential receiver input signal is
defined as the differential peak voltage, VDIFFp = |A – B| volts.
Differential Peak-to-Peak, VDIFFp-p
Since the differential output signal of the transmitter and the differential input signal of the receiver
each range from A – B to –(A – B) volts, the peak-to-peak value of the differential transmitter output
signal or the differential receiver input signal is defined as differential peak-to-peak voltage,
VDIFFp-p = 2 × VDIFFp = 2 × |(A – B)| volts, which is twice the differential swing in amplitude, or twice
of the differential peak. For example, the output differential peak-peak voltage can also be calculated
as VTX-DIFFp-p = 2 × |VOD|.
Differential Waveform
The differential waveform is constructed by subtracting the inverting signal (SR[1–2]_TX, for
example) from the non-inverting signal (SR[1–2]_TX, for example) within a differential pair. There is
only one signal trace curve in a differential waveform. The voltage represented in the differential
waveform is not referenced to ground. Refer to Figure 15 as an example for differential waveform.
Common Mode Voltage, Vcm
The common mode voltage is equal to half of the sum of the voltages between each conductor of a
balanced interchange circuit and ground. In this example, for SerDes output,
Vcm_out = (VSR[1–2]_TX + VSR[1–2]_TX) ÷ 2 = (A + B) ÷ 2, which is the arithmetic mean of the two
complimentary output voltages within a differential pair. In a system, the common mode voltage may
often differ from one component’s output to the other’s input. It may be different between the receiver
input and driver output circuits within the same component. It is also referred to as the DC offset on
some occasions.
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To illustrate these definitions using real values, consider the example of a current mode logic (CML) transmitter that has a
common mode voltage of 2.25 V and outputs, TD and TD. If these outputs have a swing from 2.0 V to 2.5 V, the peak-to-peak
voltage swing of each signal (TD or TD) is 500 mV p-p, which is referred to as the single-ended swing for each signal. Because
the differential signaling environment is fully symmetrical in this example, the transmitter output differential swing (VOD) has
the same amplitude as each signal single-ended swing. The differential output signal ranges between 500 mV and –500 mV. In
other words, VOD is 500 mV in one phase and –500 mV in the other phase. The peak differential voltage (VDIFFp) is 500 mV.
The peak-to-peak differential voltage (VDIFFp-p) is 1000 mV p-p.
2.5.2.2
SerDes Reference Clock Receiver Characteristics
The SerDes reference clock inputs are applied to an internal PLL whose output creates the clock used by the corresponding
SerDes lanes. The SerDes reference clock inputs are SR1_REF_CLK/SR1_REF_CLK or SR2_REF_CLK/SR2_REF_CLK.
Figure 4 shows a receiver reference diagram of the SerDes reference clocks.
50 Ω
SR[1–2]_REF_CLK
Input
Amp
SR[1–2]_REF_CLK
50 Ω
Figure 4. Receiver of SerDes Reference Clocks
The characteristics of the clock signals are as follows:
•
•
•
•
The supply voltage requirements for VDDSXC are as specified in Table 3.
The SerDes reference clock receiver reference circuit structure is as follows:
— The SR[1–2]_REF_CLK and SR[1–2]_REF_CLK are internally AC-coupled differential inputs as shown in
Figure 4. Each differential clock input (SR[1–2]_REF_CLK or SR[1–2]_REF_CLK) has on-chip 50-Ω
termination to GNDSXC followed by on-chip AC-coupling.
— The external reference clock driver must be able to drive this termination.
— The SerDes reference clock input can be either differential or single-ended. Refer to the differential mode and
single-ended mode descriptions below for detailed requirements.
The maximum average current requirement also determines the common mode voltage range.
— When the SerDes reference clock differential inputs are DC coupled externally with the clock driver chip, the
maximum average current allowed for each input pin is 8 mA. In this case, the exact common mode input voltage
is not critical as long as it is within the range allowed by the maximum average current of 8 mA because the input
is AC-coupled on-chip.
— This current limitation sets the maximum common mode input voltage to be less than 0.4 V (0.4 V / 50 = 8 mA)
while the minimum common mode input level is 0.1 V above GNDSXC. For example, a clock with a 50/50 duty
cycle can be produced by a clock driver with output driven by its current source from 0 mA to 16 mA (0–0.8 V),
such that each phase of the differential input has a single-ended swing from 0 V to 800 mV with the common mode
voltage at 400 mV.
— If the device driving the SR[1–2]_REF_CLK and SR[1–2]_REF_CLK inputs cannot drive 50 Ω to GNDSXC DC or
the drive strength of the clock driver chip exceeds the maximum input current limitations, it must be AC-coupled
externally.
The input amplitude requirement is described in detail in the following sections.
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2.5.2.3
SerDes Transmitter and Receiver Reference Circuits
Figure 5 shows the reference circuits for SerDes data lane transmitter and receiver.
50 Ω SR[1–2]_TXm
SR[1–2]_RXm
50 Ω
Transmitter
Receiver
50 Ω
SR[1–2]_TXm
SR[1–2]_RXm
50 Ω
Note: The [1–2] indicates the specific SerDes Interface (1 or 2) and the m indicates the
specific channel within that interface (0,1,2,3). Actual signals are assigned by the
HRCW assignments at reset (see Chapter 5, Reset in the reference manual for details)
Figure 5. SerDes Transmitter and Receiver Reference Circuits
2.5.3
DC-Level Requirements for SerDes Interfaces
The following subsections define the DC-level requirements for the SerDes reference clocks, the PCI Express data lines, the
Serial RapidIO data lines, and the SGMII data lines.
2.5.3.1
DC-Level Requirements for SerDes Reference Clocks
The DC-level requirement for the SerDes reference clock inputs is different depending on the signaling mode used to connect
the clock driver chip and SerDes reference clock inputs, as described below:
•
Differential Mode
— The input amplitude of the differential clock must be between 400 mV and 1600 mV differential peak-peak (or
between 200 mV and 800 mV differential peak). In other words, each signal wire of the differential pair must have
a single-ended swing of less than 800 mV and greater than 200 mV. This requirement is the same for both external
DC-coupled or AC-coupled connection.
— For an external DC-coupled connection, the maximum average current requirements sets the requirement for
average voltage (common mode voltage) as between 100 mV and 400 mV. Figure 6 shows the SerDes reference
clock input requirement for DC-coupled connection scheme.
SR[1–2]_REF_CLK
200 mV < Input Amplitude or Differential Peak < 800 mV
Vmax < 800 mV
100 mV < Vcm < 400 mV
Vmin > 0 V
SR[1–2]_REF_CLK
Figure 6. Differential Reference Clock Input DC Requirements (External DC-Coupled)
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— For an external AC-coupled connection, there is no common mode voltage requirement for the clock driver.
Because the external AC-coupling capacitor blocks the DC-level, the clock driver and the SerDes reference clock
receiver operate in different command mode voltages. The SerDes reference clock receiver in this connection
scheme has its common mode voltage set to GNDSXC. Each signal wire of the differential inputs is allowed to
swing below and above the command mode voltage GNDSXC. Figure 7 shows the SerDes reference clock input
requirement for AC-coupled connection scheme.
200 mV < Input Amplitude or Differential Peak < 800 mV
SR[1–2]_REF_CLK
Vmax < Vcm + 400 mV
Vcm
Vmin > Vcm – 400 mV
SR[1–2]_REF_CLK
Figure 7. Differential Reference Clock Input DC Requirements (External AC-Coupled)
•
Single-Ended Mode
— The reference clock can also be single-ended. The SR[1–2]_REF_CLK input amplitude (single-ended swing)
must be between 400 mV and 800 mV peak-peak (from VMIN to VMAX) with SR[1–2]_REF_CLK either left
unconnected or tied to ground.
— The SR[1–2]_REF_CLK input average voltage must be between 200 and 400 mV. Figure 8 shows the SerDes
reference clock input requirement for single-ended signaling mode.
— To meet the input amplitude requirement, the reference clock inputs may need to be DC- or AC-coupled
externally. For the best noise performance, the reference of the clock could be DC- or AC-coupled into the unused
phase (SR[1–2]_REF_CLK) through the same source impedance as the clock input (SR[1–2]_REF_CLK) in use.
400 mV < SR[1–2]_REF_CLK Input Amplitude < 800 mV
SR[1–2]_REF_CLK
0V
SR[1–2]_REF_CLK
Figure 8. Single-Ended Reference Clock Input DC Requirements
2.5.3.2
DC-Level Requirements for PCI Express Configurations
The DC-level requirements for PCI Express implementations have separate requirements for the Tx and Rx lines. The
MSC8156E supports a 2.5 Gbps PCI Express interface defined by the PCI Express Base Specification, Revision 1.0a. The
transmitter specifications are defined in Table 11 and the receiver specifications are defined in Table 12.
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Note:
Specifications are valid at the recommended operating conditions listed in Table 3.
Table 11. PCI Express (2.5 Gbps) Differential Transmitter (Tx) Output DC Specifications
Parameter
Differential peak-to-peak output voltage
De-emphasized differential output voltage (ratio)
DC differential Tx impedance
Transmitter DC impedance
Notes:
Symbol
Min
Typical
Max
Units
Notes
VTX-DIFFp-p
800
1000
1200
mV
1
VTX-DE-RATIO
3.0
3.5
4.0
dB
2
ZTX-DIFF-DC
80
100
120
Ω
3
ZTX-DC
40
50
60
Ω
4
VTX-DIFFp-p = 2 × |VTX-D+ – VTX-D-| Measured at the package pins with a test load of 50 Ω to GND on each pin.
Ratio of the VTX-DIFFp-p of the second and following bits after a transition divided by the VTX-DIFFp-p of the first bit after a
transition. Measured at the package pins with a test load of 50 Ω to GND on each pin.
Tx DC differential mode low impedance
Required Tx D+ as well as D– DC Impedance during all states
1.
2.
3.
4.
Table 12. PCI Express (2.5 Gbps) Differential Receiver (Rx) Input DC Specifications
Parameter
Symbol
Min
Typical
Max
Units
Notes
Differential input peak-to-peak voltage
VRX-DIFFp-p
120
1000
1200
mV
1
DC differential Input Impedance
ZRX-DIFF-DC
80
100
120
Ω
2
ZRX-DC
40
50
60
Ω
3
ZRX-HIGH-IMP-DC
50
—
—
ΚΩ
4
VRX-IDLE-DET-DIFFp-p
65
—
175
mV
5
DC input impedance
Powered down DC input impedance
Electrical idle detect threshold
Notes:
1.
2.
3.
4.
5.
2.5.3.3
VRX-DIFFp-p = 2 × |VRX-D+ – VRX-D-| Measured at the package pins with a test load of 50 Ω to GND on each pin.
Rx DC differential mode impedance. Impedance during all LTSSM states. When transitioning from a fundamental reset to
detect (the initial state of the LTSSM), there is a 5 ms transition time before the receiver termination values must be met on all
unconfigured lanes of a port.
Required Rx D+ as well as D– DC Impedance (50 ±20% tolerance). Measured at the package pins with a test load of 50 Ω to
GND on each pin. Impedance during all LTSSM states. When transitioning from a fundamental reset to detect (the initial state
of the LTSSM), there is a 5 ms transition time before the receiver termination values must be met on all unconfigured lanes of
a port.
Required Rx D+ as well as D– DC Impedance when the receiver terminations do not have power. The Rx DC common mode
impedance that exists when no power is present or fundamental reset is asserted. This helps ensure that the receiver detect
circuit does not falsely assume a receiver is powered on when it is not. This term must be measured at 300 mV above the Rx
ground.
VRX-IDLE-DET-DIFFp-p = 2 × |VRX-D+ – VRX-D–|. Measured at the package pins of the receiver
DC-Level Requirements for Serial RapidIO Configurations
This sections provided various DC-level requirements for Serial RapidIO Configurations.
Note:
Specifications are valid at the recommended operating conditions listed in Table 3.
Table 13. Serial RapidIO Transmitter DC Specifications
Parameter
Symbol
Min
Typical
Max
Units
Notes
VO
–0.40
—
2.30
V
1
Long run differential output voltage
VDIFFPP
800
—
1600
mVp-p
—
Short run differential output voltage
VDIFFPP
500
—
1000
mVp-p
—
Output voltage
Note:
Voltage relative to COMMON of either signal comprising a differential pair.
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Table 14. Serial RapidIO Receiver DC Specifications
Parameter
Differential input voltage
Notes:
1.
2.5.3.4
Note:
Symbol
Min
Typical
Max
Units
Notes
VIN
200
—
1600
mVp-p
1
Measured at receiver.
DC-Level Requirements for SGMII Configurations
Specifications are valid at the recommended operating conditions listed in Table 3
Table 15 describes the SGMII SerDes transmitter AC-coupled DC electrical characteristics. Transmitter DC characteristics are
measured at the transmitter outputs (SR[1–2]_TX[n] and SR[1–2]_TX[n]) as shown in Figure 9.
Table 15. SGMII DC Transmitter Electrical Characteristics5
Parameter
Symbol
DC Input voltage range
—
Input differential voltage
LSTS = 0
VRX_DIFFp-p
LSTS = 1
Loss of signal threshold
LSTS = 0
VLOS
LSTS = 1
Receiver differential input impedance
Notes:
1.
2.
3.
4.
5.
Min
ZRX_DIFF
Typ
Max
Unit
Notes
—
1
1200
mV
2, 4
mV
3, 4
W
—
N/A
100
—
175
—
30
—
100
65
—
175
80
—
120
Input must be externally AC-coupled.
VRX_DIFFp-p is also referred to as peak-to-peak input differential voltage.
The concept of this parameter is equivalent to the Electrical Idle Detect Threshold parameter in the PCI Express interface.
Refer to the PCI Express Differential Receiver (RX) Input Specifications section of the PCI Express Specification document. for
details.
The LSTS shown in the table refers to the LSTSAB or LSTSEF bit fields of the SerDes Control Register.
The supply voltage is 1.0 V.
SGMII SerDes
Interface
50 Ω SR[1–2]_TXn
50 Ω
Transmitter
Vos
VOD
50 Ω
SR[1–2]_TXn
50 Ω
Figure 9. SGMII Transmitter DC Measurement Circuit
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Table 16 describes the SGMII SerDes receiver AC-coupled DC electrical characteristics.
Table 16. SGMII DC Receiver Electrical Characteristics5
Parameter
DC Input voltage range
Input
differential
voltage
Loss of
signal
threshold
1.
2.
3.
4.
5.
Min
—
SRDSnCR4[EICE{12:10}] = 0b001 for SGMII1
SRDSnCR4[EICF{4:2}] = 0b001 for SGMII2
VRX_DIFFp-p
SRDSnCR4[EICE{12:10}] = 0b100 for SGMII1
SRDSnCR4[EICF{4:2}] = 0b100 for SGMII2
SRDSnCR4[EICE{12:10}] = 0b001 for SGMII1
SRDSnCR4[EICF{4:2}] = 0b001 for SGMII2
VLOS
SRDSnCR4[EICE{12:10}] = 0b100 for SGMII1
SRDSnCR4[EICF{4:2}] = 0b100 for SGMII2
Receiver differential input impedance
Notes:
Symbol
ZRX_DIFF
Typ
Max
Unit
Notes
—
1
1200
mV
2, 4
mV
3, 4
W
—
N/A
100
—
175
—
30
—
100
65
—
175
80
—
120
Input must be externally AC-coupled.
VRX_DIFFp-p is also referred to as peak-to-peak input differential voltage.
The concept of this parameter is equivalent to the Electrical Idle Detect Threshold parameter in the PCI Express interface.
Refer to the PCI Express Differential Receiver (RX) Input Specifications section of the PCI Express Specification document.
for details.
The values for SGMII1 and SGMII2 are selected in the SRDS control registers.
The supply voltage is 1.0 V.
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2.5.4
RGMII and Other Interface DC Electrical Characteristics
Table 17 describes the DC electrical characteristics for the following interfaces:
•
•
•
•
•
•
•
•
•
•
•
•
RGMII Ethernet
SPI
TDM
GPIO
UART
TIMER
EE
I 2C
Interrupts (IRQn, NMI_OUT, INT_OUT)
Clock and resets (CLKIN, PORESET, HRESET, SRESET)
DMA External Request
JTAG signals
Table 17. 2.5 V I/O DC Electrical Characteristics
Characteristic
Symbol
Min
Max
Unit
Notes
Input high voltage
VIH
1.7
—
V
1
Input low voltage
VIL
—
0.7
V
1
Input high current (VIN = VDDIO)
IIN
—
10
μA
2
Output low current (VIN = GND)
IIL
–15
—
μA
2
Output high voltage (VDDIO = min, IOH = –1.0 mA
VOH
2.0
VDDIO + 0.3
V
1
Output low voltage (VDDIO = min, IOL= 1.0 mA)
VOL
GND – 0.3
0.40
V
1
Notes:
1.
2.
The min VIL and max VIH values are based on the respective min and max VIN values listed in Table 3.
The symbol VIN represents the input voltage of the supply. It is referenced in Table 3.
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2.6
AC Timing Characteristics
This section describes the AC timing characteristics for the MSC8156E.
2.6.1
DDR SDRAM AC Timing Specifications
This section describes the AC electrical characteristics for the DDR SDRAM interface.
2.6.1.1
DDR SDRAM Input AC Timing Specifications
Table 18 provides the input AC timing specifications for the DDR SDRAM when VDDDDR (typ) = 1.8 V.
Table 18. DDR2 SDRAM Input AC Timing Specifications for 1.8 V Interface
Parameter
Symbol
Min
Max
Unit
AC input low voltage
VIL
—
MVREF – 0.20
V
AC input high voltage
VIH
MVREF + 0.20
—
V
Note:
At recommended operating conditions with VDDDDR of 1.8 ± 5%.
Table 19 provides the input AC timing specifications for the DDR SDRAM when VDDDDR (typ) = 1.5 V.
Table 19. DDR3 SDRAM Input AC Timing Specifications for 1.5 V Interface
Parameter
Symbol
Min
Max
Unit
AC input low voltage
VIL
—
MVREF – 0.175
V
AC input high voltage
VIH
MVREF + 0.175
—
V
Note:
At recommended operating conditions with VDDDDR of 1.5 ± 5%.
Table 20 provides the input AC timing specifications for the DDR SDRAM interface.
Table 20. DDR SDRAM Input AC Timing Specifications
Parameter
Symbol
Controller Skew for MDQS—MDQ/MECC/MDM
• 800 MHz data rate
• 667 MHz data rate
tCISKEW
Tolerated Skew for MDQS—MDQ/MECC/MDM
• 800 MHz data rate
• 667 MHz data rate
tDISKEW
Notes:
1.
2.
3.
Min
Max
Unit
–200
–240
200
240
ps
ps
–425
–510
425
510
ps
ps
Notes
1, 2
2, 3
tCISKEW represents the total amount of skew consumed by the controller between MDQS[n] and any corresponding bit that is
captured with MDQS[n]. Subtract this value from the total timing budget.
At recommended operating conditions with VDDDDR (1.8 V or 1.5 V) ± 5%
The amount of skew that can be tolerated from MDQS to a corresponding MDQ signal is called tDISKEW.This can be
determined by the following equation: tDISKEW = ±(T ÷ 4 – abs(tCISKEW)) where T is the clock period and abs(tCISKEW) is the
absolute value of tCISKEW.
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Figure 10 shows the DDR2 and DDR3 SDRAM interface input timing diagram.
MCK[n]
MCK[n]
tMCK
MDQS[n]
tDISKEW
MDQ[n]
D0
D1
tDISKEW
tDISKEW
Figure 10. DDR2 and DDR3 SDRAM Interface Input Timing Diagram
2.6.1.2
DDR SDRAM Output AC Timing Specifications
Table 21 provides the output AC timing specifications for the DDR SDRAM interface.
Table 21. DDR SDRAM Output AC Timing Specifications
Parameter
MCK[n] cycle time
Symbol 1
Min
Max
Unit
tMCK
2.5
5
ns
Notes
2
3
ADDR/CMD output setup with respect to MCK
• 800 MHz data rate
• 667 MHz data rate
tDDKHAS
ADDR/CMD output hold with respect to MCK
• 800 MHz data rate
• 667 MHz data rate
tDDKHAX
MCSn output setup with respect to MCK
• 800 MHz data rate
• 667 MHz data rate
tDDKHCS
MCSn output hold with respect to MCK
• 800 MHz data rate
• 667 MHz data rate
tDDKHCX
MCK to MDQS Skew
• 800 MHz data rate
• 667 MHz data rate
tDDKHMH
MDQ/MECC/MDM output setup with respect to MDQS
• 800 MHz
• 667 MHz
tDDKHDS,
tDDKLDS
MDQ/MECC/MDM output hold with respect to MDQS
• 800 MHz
• 667 MHz
tDDKHDX,
tDDKLDX
MDQS preamble
tDDKHMP
–0.9 × tMCK
—
ns
—
MDQS postamble
tDDKHME
–0.4 × tMCK
–0.6 × tMCK
ns
—
0.917
1.10
—
—
ns
ns
0.767
1.02
—
—
ns
ns
0.917
1.10
—
—
ns
ns
0.767
1.02
—
—
ns
ns
–0.4
–0.6
0.375
0.6
300
375
—
—
ps
ps
300
375
—
—
ps
ps
3
3
3
ns
4
5
5
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Electrical Characteristics
Table 21. DDR SDRAM Output AC Timing Specifications (continued)
Symbol 1
Parameter
Notes:
1.
2.
3.
4.
5.
6.
Note:
Min
Max
Unit
Notes
The symbols used for timing specifications follow the pattern of t(first two letters of functional block)(signal)(state) (reference)(state) for
inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. Output hold time can be read as DDR timing
(DD) from the rising or falling edge of the reference clock (KH or KL) until the output went invalid (AX or DX). For example,
tDDKHAS symbolizes DDR timing (DD) for the time tMCK memory clock reference (K) goes from the high (H) state until outputs
(A) are setup (S) or output valid time. Also, tDDKLDX symbolizes DDR timing (DD) for the time tMCK memory clock reference (K)
goes low (L) until data outputs (D) are invalid (X) or data output hold time.
All MCK/MCK referenced measurements are made from the crossing of the two signals.
ADDR/CMD includes all DDR SDRAM output signals except MCK/MCK, MCS, and MDQ/MECC/MDM/MDQS.
Note that tDDKHMH follows the symbol conventions described in note 1. For example, tDDKHMH describes the DDR timing (DD)
from the rising edge of the MCK(n) clock (KH) until the MDQS signal is valid (MH). tDDKHMH can be modified through control of
the DQSS override bits in the TIMING_CFG_2 register. This will typically be set to the same delay as the clock adjust in the
CLK_CNTL register. The timing parameters listed in the table assume that these two parameters have been set to the same
adjustment value. See the MSC8156E Reference Manual for a description and understanding of the timing modifications
enabled by use of these bits.
Determined by maximum possible skew between a data strobe (MDQS) and any corresponding bit of data (MDQ), ECC
(MECC), or data mask (MDM). The data strobe should be centered inside of the data eye at the pins of the MSC8156E.
At recommended operating conditions with VDDDDR (1.5 V or 1,8 V) ± 5%.
For the ADDR/CMD setup and hold specifications in Table 21, it is assumed that the clock control register is set to
adjust the memory clocks by ½ applied cycle.
Figure 11 shows the DDR SDRAM output timing for the MCK to MDQS skew measurement (tDDKHMH).
MCK[n]
MCK[n]
tMCK
tDDKHMHmax) = 0.6 ns or 0.375 ns
MDQS
tDDKHMH(min) = –0.6 ns or –0.375 ns
MDQS
Figure 11. MCK to MDQS Timing
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Electrical Characteristics
Figure 12 shows the DDR SDRAM output timing diagram.
MCK[n]
MCK[n]
tMCK
tDDKHAS, tDDKHCS
tDDKHAX ,tDDKHCX
ADDR/CMD
Write A0
NOOP
tDDKHMP
tDDKHMH
MDQS[n]
tDDKHME
tDDKHDS
tDDKLDS
MDQ[x]
D0
D1
tDDKLDX
tDDKHDX
Figure 12. DDR SDRAM Output Timing
Figure 13 provides the AC test load for the DDR2 and DDR3 controller bus.
Output
Z0 = 50 Ω
RL = 50 Ω
VDDDDR/2
Figure 13. DDR2 and DDR3 Controller Bus AC Test Load
2.6.1.3
DDR2 and DDR3 SDRAM Differential Timing Specifications
This section describes the DC and AC differential timing specifications for the DDR2 and DDR3 SDRAM controller interface.
Figure 14 shows the differential timing specification.
GVDD
VTR
GVDD/2
VOX or VIX
VCP
GND
Figure 14. DDR2 and DDR3 SDRAM Differential Timing Specifications
Note:
VTR specifies the true input signal (such as MCK or MDQS) and VCP is the complementary input signal (such as
MCK or MDQS).
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Electrical Characteristics
Table 22 provides the DDR2 differential specifications for the differential signals MDQS/MDQS and MCK/MCK.
Table 22. DDR2 SDRAM Differential Electrical Characteristics
Parameter
Symbol
Min
Max
Unit
Input AC differential cross-point voltage
VIXAC
0.5 × GVDD – 0.175
0.5 × GVDD + 0.175
V
Output AC differential cross-point voltage
VOXAC
0.5 × GVDD – 0.125
0.5 × GVDD + 0.125
V
Table 23 provides the DDR3 differential specifications for the differential signals MDQS/MDQS and MCK/MCK.
Table 23. DDR3 SDRAM Differential Electrical Characteristics
Parameter
Symbol
Min
Max
Unit
Input AC differential cross-point voltage
VIXAC
0.5 × GVDD – 0.150
0.5 × GVDD + 0.150
V
Output AC differential cross-point voltage
VOXAC
0.5 × GVDD – 0.115
0.5 × GVDD + 0.115
V
2.6.2
HSSI AC Timing Specifications
The following subsections define the AC timing requirements for the SerDes reference clocks, the PCI Express data lines, the
Serial RapidIO data lines, and the SGMII data lines.
2.6.2.1
AC Requirements for SerDes Reference Clock
Table 24 lists AC requirements for the SerDes reference clocks.
Note:
Specifications are valid at the recommended operating conditions listed in Table 3.
Table 24. SR[1–2]_REF_CLK and SR[1–2]_REF_CLK Input Clock Requirements
Parameter
Symbol
Min
Typical
Max
Units
Notes
SR[1–2]_REF_CLK/SR[1–2]_REF_CLK
frequency range
tCLK_REF
—
100/125
—
MHz
1
SR[1–2]_REF_CLK/SR[1–2]_REF_CLK clock
frequency tolerance
tCLK_TOL
–350
—
350
ppm
—
SR[1–2]_REF_CLK/SR[1–2]_REF_CLK
reference clock duty cycle (measured at 1.6 V)
tCLK_DUTY
40
50
60
%
—
SR[1–2]_REF_CLK/SR[1–2]_REF_CLK max
deterministic peak-peak jitter at 10-6 BER
tCLK_DJ
—
—
42
ps
—
SR[1–2]_REF_CLK/SR[1–2]_REF_CLK total
reference clock jitter at 10-6 BER (peak-to-peak
jitter at ref_clk input)
tCLK_TJ
—
—
86
ps
2
tCLKRR/tCLKFR
1
—
4
V/ns
3
Differential input high voltage
VIH
200
—
—
mV
4
Differential input low voltage
VIL
—
—
–200
mV
4
Rise-Fall
Matching
—
—
20
%
5, 6
SR[1–2]_REF_CLK/SR[1–2]_REF_CLK
rising/falling edge rate
Rising edge rate (SR[1–2]_REF_CLK) to falling
edge rate (SR[1–2]_REF_CLK) matching
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Table 24. SR[1–2]_REF_CLK and SR[1–2]_REF_CLK Input Clock Requirements (continued)
Parameter
Notes:
1.
2.
3.
4.
5.
6.
Symbol
Min
Typical
Max
Units
Notes
Caution: Only 100 and 125 have been tested. Other values will not work correctly with the rest of the system.
Limits from PCI Express CEM Rev 1.0a
Measured from –200 mV to +200 mV on the differential waveform (derived from SR[1–2]_REF_CLK minus
SR[1–2]_REF_CLK). The signal must be monotonic through the measurement region for rise and fall time. The 400 mV
measurement window is centered on the differential zero crossing. See Figure 15.
Measurement taken from differential waveform
Measurement taken from single-ended waveform
Matching applies to rising edge for SR[1–2]_REF_CLK and falling edge rate for SR[1–2]_REF_CLK. It is measured using a
200 mV window centered on the median cross point where SR[1–2]_REF_CLK rising meets SR[1–2]_REF_CLK falling. The
median cross point is used to calculate the voltage thresholds that the oscilloscope uses for the edge rate calculations. The
rise edge rate of SR[1–2]_REF_CLK should be compared to the fall edge rate of SR[1–2]_REF_CLK; the maximum allowed
difference should not exceed 20% of the slowest edge rate. See Figure 16.
Rise Edge Rate
Fall Edge Rate
VIH = +200 mV
0.0 V
VIL = –200 mV
SR[1–2]_REF_CLK –
SR[1–2]_REF_CLK
Figure 15. Differential Measurement Points for Rise and Fall Time
Figure 16. Single-Ended Measurement Points for Rise and Fall Time Matching
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Electrical Characteristics
2.6.2.2
PCI Express AC Physical Layer Specifications
The AC requirements for PCI Express implementations have separate requirements for the Tx and Rx lines. The MSC8156E
supports a 2.5 Gbps PCI Express interface defined by the PCI Express Base Specification, Revision 1.0a. The transmitter
specifications are defined in Table 25 and the receiver specifications are defined in Table 26. The parameters are specified at
the component pins. the AC timing specifications do not include REF_CLK jitter.
Note:
Specifications are valid at the recommended operating conditions listed in Table 3.
Table 25. PCI Express (2.5 Gbps) Differential Transmitter (Tx) Output AC Specifications
Parameter
Symbol
Min
Typical
Max
Units
Unit interval
Minimum Tx eye width
Maximum time between the jitter median and
maximum deviation from the median.
AC coupling capacitor
Notes:
1.
2.
3.
4.
5.
Notes
UI
399.88
400.00
400.12
ps
1
TTX-EYE
0.70
—
—
UI
2, 3
TTX-EYE-MEDIAN-
—
—
0.15
UI
3, 4
75
—
200
nF
5
to-MAX-JITTER
CTX
Each UI is 400 ps ± 300 ppm. UI does not account for spread spectrum clock dictated variations. No test load is necessarily
associated with this value.
The maximum transmitter jitter can be derived as TTX-MAX-JITTER = 1 – TTX-EYE = 0.3 UI.
Specified at the measurement point into a timing and voltage compliance test load as shown in Figure 7 and measured over
any 250 consecutive Tx UIs. A TTX-EYE = 0.70 UI provides for a total sum of deterministic and random jitter budget of
TTX-JITTER-MAX = 0.30 UI for the transmitter collected over any 250 consecutive Tx UIs. The TTX-EYE-MEDIAN-to-MAX-JITTER
median is less than half of the total Tx jitter budget collected over any 250 consecutive Tx UIs. It should be noted that the
median is not the same as the mean. The jitter median describes the point in time where the number of jitter points on either
side is approximately equal as opposed to the averaged time value. Jitter is defined as the measurement variation of the
crossing points (VTX-DIFFp-p = 0 V) in relation to a recovered Tx UI. A recovered Tx UI is calculated over 3500 consecutive
unit intervals of sample data.
Jitter is measured using all edges of the 250 consecutive UI in the center of the 3500 UI used for calculating the Tx UI.
All transmitters shall be AC-coupled. The AC coupling is required either within the media or within the transmitting component
itself. The SerDes transmitter does not have built-in Tx capacitance. An external AC coupling capacitor is required.
Table 26. PCI Express (2.5 Gbps) Differential Receiver (Rx) Input AC Specifications
Parameter
Unit Interval
Minimum receiver eye width
Maximum time between the jitter median
and maximum deviation from the median.
Notes:
1.
2.
3.
4.
5.
Symbol
Min
Typical
Max
Units
Notes
UI
399.88
400.00
400.12
ps
1
TRX-EYE
0.4
—
—
UI
2, 3, 4
TRX-EYE-MEDIAN-to-MAX
—
—
0.3
UI
3, 4, 5
-JITTER
Each UI is 400 ps ± 300 ppm. UI does not account for spread spectrum clock dictated variations. No test load is necessarily
associated with this value.
The maximum interconnect media and transmitter jitter that can be tolerated by the receiver can be derived as
TRX-MAX-JITTER = 1 – TRX-EYE = 0.6 UI.
Specified at the measurement point and measured over any 250 consecutive UIs. The test load in Figure 7 should be used as
the Rx device when taking measurements. If the clocks to the Rx and Tx are not derived from the same reference clock, the
Tx UI recovered from 3500 consecutive UI must be used as a reference for the eye diagram.
A TRX-EYE = 0.40 UI provides for a total sum of 0.60 UI deterministic and random jitter budget for the transmitter and
interconnect collected any 250 consecutive UIs. The TRX-EYE-MEDIAN-to-MAX-JITTER specification ensures a jitter distribution in
which the median and the maximum deviation from the median is less than half of the total. UI jitter budget collected over any
250 consecutive Tx UIs. It should be noted that the median is not the same as the mean. The jitter median describes the point
in time where the number of jitter points on either side is approximately equal as opposed to the averaged time value. If the
clocks to the Rx and Tx are not derived from the same reference clock, the Tx UI recovered from 3500 consecutive UI must
be used as the reference for the eye diagram.
Jitter is defined as the measurement variation of the crossing points (VRX-DIFFp-p = 0 V) in relation to a recovered Tx UI. A
recovered Tx UI is calculated over 3500 consecutive unit intervals of sample data. Jitter is measured using all edges of the
250 consecutive UI in the center of the 3500 UI used for calculating the Tx UI. It is recommended that the recovered Tx UI is
calculated using all edges in the 3500 consecutive UI interval with a fit algorithm using a minimization merit function. Least
squares and median deviation fits have worked well with experimental and simulated data.
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Electrical Characteristics
2.6.2.3
Note:
Serial RapidIO AC Timing Specifications
Specifications are valid at the recommended operating conditions listed in Table 3.
Table 27 defines the transmitter AC specifications for the Serial RapidIO interface. The AC timing specifications do not include
REF_CLK jitter.
Table 27. Serial RapidIO Transmitter AC Timing Specifications
Characteristic
Symbol
Min
Typical
Max
Unit
Deterministic Jitter
JD
—
—
0.17
UI p-p
Total Jitter
JT
—
—
0.35
UI p-p
Unit Interval: 1.25 GBaud
UI
800 – 100ppm
800
800 + 100ppm
ps
Unit Interval: 2.5 GBaud
UI
400 – 100ppm
400
400 + 100ppm
ps
Unit Interval: 3.125 GBaud
UI
320 – 100ppm
320
320 + 100ppm
ps
Table 28 defines the Receiver AC specifications for the Serial RapidIO interface. The AC timing specifications do not include
REF_CLK jitter.
Table 28. Serial RapidIO Receiver AC Timing Specifications
Characteristic
Symbol
Min
Typical
Max
Unit
Notes
Deterministic Jitter Tolerance
JD
0.37
—
—
UI p-p
1
Combined Deterministic and Random Jitter
Tolerance
JDR
0.55
—
—
UI p-p
1
JT
0.65
—
—
UI p-p
1, 2
Total Jitter Tolerance
Bit Error Rate
Unit Interval: 1.25 GBaud
BER
—
—
UI
800 – 100ppm
800
10
–12
800 + 100ppm
—
—
ps
—
Unit Interval: 2.5 GBaud
UI
400 – 100ppm
400
400 + 100ppm
ps
—
Unit Interval: 3.125 GBaud
UI
320 – 100ppm
320
320 + 100ppm
ps
—
Notes:
1.
2.
Measured at receiver.
Total jitter is composed of three components, deterministic jitter, random jitter, and single frequency sinusoidal jitter. The
sinusoidal jitter may have any amplitude and frequency in the unshaded region of Figure 17. The sinusoidal jitter component
is included to ensure margin for low frequency jitter, wander, noise, crosstalk, and other variable system effects.
8.5 UI p-p
Sinusoidal
Jitter
Amplitude
0.10 UI p-p
22.1 kHz
Frequency
1.875 MHz
20 MHz
Figure 17. Single Frequency Sinusoidal Jitter Limits
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Electrical Characteristics
2.6.2.4
Note:
SGMII AC Timing Specifications
Specifications are valid at the recommended operating conditions listed in Table 3.
Transmitter and receiver AC characteristics are measured at the transmitter outputs (SR[1–2]_TX[n] and SR[1–2]_TX[n]) or at
the receiver inputs (SR[1–2]_RX[n] and SR[1–2]_RX[n]) as depicted in Figure 18, respectively.
D+ Package
Pin
C = CTX
TX
Silicon
+ Package
C = CTX
D– Package
Pin
R = 50 Ω
R = 50 Ω
Figure 18. SGMII AC Test/Measurement Load
Table 29 provides the SGMII transmit AC timing specifications. A source synchronous clock is not supported. The AC timing
specifications do not include REF_CLK jitter.
Table 29. SGMII Transmit AC Timing Specifications
Parameter
Symbol
Min
Typ
Max
Unit
Notes
Deterministic Jitter
JD
—
—
0.17
UI p-p
—
Total Jitter
JT
—
—
0.35
UI p-p
2
Unit Interval
UI
799.92
800
800.08
ps
1
Notes:
1.
2.
See Figure 17 for single frequency sinusoidal jitter limits
Each UI is 800 ps ± 100 ppm.
Table 30 provides the SGMII receiver AC timing specifications. The AC timing specifications do not include REF_CLK jitter.
Table 30. SGMII Receive AC Timing Specifications
Parameter
Deterministic Jitter Tolerance
Combined Deterministic and Random Jitter Tolerance
Total Jitter Tolerance
Bit Error Ratio
Unit Interval
Notes:
1.
2.
3.
Symbol
Min
Typ
Max
Unit
Notes
JD
0.37
—
—
UI p-p
1, 2
JDR
0.55
—
—
UI p-p
1, 2
JT
0.65
—
—
UI p-p
1,2
BER
—
—
10-12
—
—
UI
799.92
800.00
800.08
ps
3
Measured at receiver.
Refer to RapidIOTM 1x/4x LP Serial Physical Layer Specification for interpretation of jitter specifications. Also see Figure 17.
Each UI is 800 ps ± 100 ppm.
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Electrical Characteristics
2.6.3
TDM Timing
Table 31 provides the input and output AC timing specifications for the TDM interface.
Table 31. TDM AC Timing Specifications for 62.5 MHz1
Symbol2
Min
Max
Unit
tDM
16.0
—
ns
TDMxRCK/TDMxTCK high pulse width
tDM_HIGH
7.0
—
ns
TDMxRCK/TDMxTCK low pulse width
tDM_LOW
7.0
—
ns
TDM all input setup time
tDMIVKH
3.6
—
ns
TDMxRD hold time
tDMRDIXKH
1.9
—
ns
TDMxTFS/TDMxRFS input hold time
tDMFSIXKH
1.9
—
ns
TDMxTCK High to TDMxTD output active
tDM_OUTAC
2.5
—
ns
TDMxTCK High to TDMxTD output valid
tDMTKHOV
—
9.8
ns
TDMxTD hold time
tDMTKHOX
2.5
—
ns
TDMxTCK High to TDMxTD output high impedance
tDM_OUTHI
—
9.8
ns
TDMxTFS/TDMxRFS output valid
tDMFSKHOV
—
9.25
ns
TDMxTFS/TDMxRFS output hold time
tDMFSKHOX
2.0
—
ns
Parameter
TDMxRCK/TDMxTCK
Notes:
1.
2.
3.
4.
The symbols used for timing specifications follow the pattern t(first two letters of functional block)(signal)(state)(reference)(state) for inputs
and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tHIKHOX symbolizes the output internal
timing (HI) for the time tserial memory clock reference (K) goes from the high state (H) until outputs (O) are invalid (X).
Output values are based on 30 pF capacitive load.
Inputs are referenced to the sampling that the TDM is programmed to use. Outputs are referenced to the programming edge
they are programmed to use. Use of the rising edge or falling edge as a reference is programmable. TDMxTCK and TDMxRCK are
shown using the rising edge.
All values are based on a maximum TDM interface frequency of 62.5 MHz.
Figure 19 shows the TDM receive signal timing.
tDM
tDM_HIGH
tDM_LOW
TDMxRCK
tDMIVKH
tDMRDIXKH
TDMxRD
tDMIVKH
tDMFSIXKH
TDMxRFS
tDMFSKHOV
~
~
TDMxRFS (output)
tDMFSKHOX
Figure 19. TDM Receive Signals
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Electrical Characteristics
Figure 20 shows the TDM transmit signal timing.
tDM
tDM_HIGH
TDMxTCK
tDM_LOW
tDM_OUTHI
tDMTKHOV
TDMxTD
TDMxRCK
tDMFSKHOV
TDMxTFS (output)
tDMFSIXKH
tDMIVKH
tDMTKHOX
~
~ ~
~
tDM_OUTAC
tDMFSKHOX
TDMxTFS (input)
Figure 20. TDM Transmit Signals
Figure 21 provides the AC test load for the TDM/SI.
Z0 = 50 Ω
Output
RL = 50 Ω
VDDIO/2
Figure 21. TDM AC Test Load
2.6.4
Timers AC Timing Specifications
Table 32 lists the timer input AC timing specifications.
Table 32. Timers Input AC Timing Specifications
Characteristics
Timers inputs—minimum pulse width
Notes:
Note:
1.
2.
Symbol
Minimum
Unit
Notes
TTIWID
8
ns
1, 2
The maximum allowed frequency of timer outputs is 125 MHz. Configure the timer modules appropriately.
Timer inputs and outputs are asynchronous to any visible clock. Timer outputs should be synchronized before use by any
external synchronous logic. Timer inputs are required to be valid for at least tTIWID ns to ensure proper operation.
For recommended operating conditions, see Table 3.
Figure 22 shows the AC test load for the timers.
Output
Z0 = 50 Ω
RL = 50 Ω
VDDIO/2
Figure 22. Timer AC Test Load
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Electrical Characteristics
2.6.5
Ethernet Timing
This section describes the AC electrical characteristics for the Ethernet interface.
There are programmable delay units (PDU) that should be programmed differently for each interface to meet timing. There is
a general configuration register 4 (GCR4) used to configure the timing. For additional information, see the MSC8156E
Reference Manual.
2.6.5.1
Management Interface Timing
Table 33 lists the timer input Ethernet controller management interface timing specifications shown in Table 23.
Table 33. Ethernet Controller Management Interface Timing
Characteristics
GE_MDC to GE_MDIO
delay2
Symbol
Min
Max
Unit
tMDKHDX
10
70
ns
GE_MDIO to GE_MDC rising edge setup time
tMDDVKH
7
—
ns
GE_MDC rising edge to GE_MDIO hold time
tMDDXKH
0
—
ns
Notes:
1.
2.
Program the GE_MDC frequency (fMDC) to a maximum value of 2.5 MHz (400 ns period for tMDC). The value depends on the
source clock and configuration of MIIMCFG[MCS] and UPSMR[MDCP]. For example, for a source clock of 400 MHz to
achieve fMDC = 2.5 MHz, program MIIMCFG[MCS] = 0x4 and UPSMR[MDCP] = 0. See the MSC8156E Reference Manual for
configuration details.
The value depends on the source clock. For example, for a source clock of 267 MHz, the delay is 70 ns. For a source clock of
333 MHz, the delay is 58 ns.
tMDC
GE_MDC
GE_MDIO
(Input)
tMDDVKH
GE_MDIO
(Output)
tMDDXKH
tMDKHDX
Figure 23. MII Management Interface Timing
2.6.5.2
RGMII AC Timing Specifications
Table 34 presents the RGMII AC timing specifications for applications requiring an on-board delayed clock.
Table 34. RGMII at 1 GHz2 with On-Board Delay3 AC Timing Specifications
Parameter/Condition
Symbol
Min
Data to clock output skew (at transmitter)
tSKEWT
–-0.5
—
0.5
ns
Data to clock input skew (at receiver) 4
tSKEWR
1
—
2.6
ns
4
Notes:
1.
2.
3.
4.
Typ
Max
Unit
At recommended operating conditions with VDDIO of 2.5 V ± 5%.
RGMII at 100 MHz support is guaranteed by design.
Program GCR4 as 0x00000000.
This implies that PC board design requires clocks to be routed such that an additional trace delay of greater than 1.5 ns and
less than 2.0 ns is added to the associated clock signal.
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Electrical Characteristics
Table 35 presents the RGMII AC timing specification for applications required non-delayed clock on board.
Table 35. RGMII at 1 GHz2 with No On-Board Delay3 AC Timing Specifications
Parameter/Condition
Symbol
Min
Typ
Max
Unit
4
tSKEWT
–2,6
—
–1.0
ns
tSKEWR
–0.5
—
0.5
ns
Data to clock output skew (at transmitter)
4
Data to clock input skew (at receiver)
Notes:
1.
2.
3.
4.
At recommended operating conditions with VDDIO of 2.5 V ± 5%.
RGMII at 100 MHz support is guaranteed by design.
GCR4 should be programmed as 0x000CC330.
This implies that PC board design requires clocks to be routed with no additional trace delay
Figure 24 shows the RGMII AC timing and multiplexing diagrams.
GTX_CLK
(At transmitter)
tSKEWT
TXD[3:0]
txd[3:0]
txd[7:4]
rxd[3:0]
rxd[8:5]
TX_CTL
RXD[3:0]
RX_CTL
tSKEWR
RX_CLK
(At Receiver)
Figure 24. RGMII AC Timing and Multiplexing
2.6.6
SPI Timing
Table 36 lists the SPI input and output AC timing specifications.
Table 36. SPI AC Timing Specifications
Symbol 1
Min
Max
Unit
Note
SPI outputs valid—Master mode (internal clock) delay
tNIKHOV
—
6
ns
2
SPI outputs hold—Master mode (internal clock) delay
tNIKHOX
0.5
—
ns
2
SPI outputs valid—Slave mode (external clock) delay
tNEKHOV
—
12
ns
2
SPI outputs hold—Slave mode (external clock) delay
tNEKHOX
2
—
ns
2
tNIIVKH
12
—
ns
—
Parameter
SPI inputs—Master mode (internal clock) input setup time
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Electrical Characteristics
Table 36. SPI AC Timing Specifications
Symbol 1
Min
Max
Unit
Note
SPI inputs—Master mode (internal clock) input hold time
tNIIXKH
0
—
ns
—
SPI inputs—Slave mode (external clock) input setup time
tNEIVKH
4
—
ns
—
SPI inputs—Slave mode (external clock) input hold time
tNEIXKH
2
—
ns
—
Parameter
Notes:
1.
2.
The symbols used for timing specifications follow the pattern of t(first two letters of functional block)(signal)(state)
(reference)(state) for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example,
tNIKHOX symbolizes the internal timing (NI) for the time SPICLK clock reference (K) goes to the high state (H)
until
outputs (O) are invalid (X).
Output specifications are measured from the 50% level of the rising edge of SPICLK to the 50% level of the signal.
Timings are measured at the pin.
Figure 25 provides the AC test load for the SPI.
Z0 = 50 Ω
Output
RL = 50 Ω
VDDIO/2
Figure 25. SPI AC Test Load
Figure 26 and Figure 27 represent the AC timings from Table 36. Note that although the specifications generally reference the
rising edge of the clock, these AC timing diagrams also apply when the falling edge is the active edge.
Figure 26 shows the SPI timings in slave mode (external clock).
SPICLK (input)
tNEIVKH
Input Signals:
SPIMOSI
(See note)
tNEIXKH
tNEKHOX
tNEKHOV
Output Signals:
SPIMISO
(See note)
Note: measured with SPMODE[CI] = 0, SPMODE[CP] = 0
Figure 26. SPI AC Timing in Slave Mode (External Clock)
Figure 27 shows the SPI timings in master mode (internal clock).
SPICLK (output)
tNIIVKH
Input Signals:
SPIMISO
(See note)
tNIIXKH
tNIKHOX
tNIKHOV
Output Signals:
SPIMOSI
(See note)
Note: measured with SPMODE[CI] = 0, SPMODE[CP] = 0
Figure 27. SPI AC Timing in Master Mode (Internal Clock)
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2.6.7
Asynchronous Signal Timing
Table 34 lists the asynchronous signal timing specifications.
Table 37. Signal Timing
Characteristics
Input
Output
Note:
Symbol
Type
Min
tIN
Asynchronous
One CLKIN cycle
tOUT
Asynchronous
Application dependent
Input value relevant for EE0, IRQ[15–0], and NMI only.
The following interfaces use the specified asynchronous signals:
•
Note:
•
•
•
•
•
2.6.8
GPIO. Signals GPIO[31–0], when used as GPIO signals, that is, when the alternate multiplexed special functions are
not selected.
When used as a general purpose input (GPI), the input signal should be driven until it is acknowledged by the
MSC8156E device, that is, when the expected input value is read from the GPIO data register.
EE port. Signals EE0, EE1.
Boot function. Signal STOP_BS.
I2C interface. Signals I2C_SCL and I2C_SDA.
Interrupt inputs. Signals IRQ[15–0] and NMI.
Interrupt outputs. Signals INT_OUT and NMI_OUT (minimum pulse width is 32 ns).
JTAG Signals
Table 38 lists the JTAG timing specifications shown in Figure 28 through Figure 31.
Table 38. JTAG Timing
All frequencies
Characteristics
Symbol
Unit
Min
Max
TCK cycle time
tTCKX
36.0
—
TCK clock high phase measured at VM = VDDIO/2
tTCKH
15.0
—
ns
Boundary scan input data setup time
tBSVKH
0.0
—
ns
Boundary scan input data hold time
ns
tBSXKH
15.0
—
ns
TCK fall to output data valid
tTCKHOV
—
20.0
ns
TCK fall to output high impedance
tTCKHOZ
—
24.0
ns
TMS, TDI data setup time
tTDIVKH
0.0
—
ns
TMS, TDI data hold time
tTDIXKH
5.0
—
ns
TCK fall to TDO data valid
tTDOHOV
—
10.0
ns
TCK fall to TDO high impedance
tTDOHOZ
—
12.0
ns
tTRST
100.0
—
ns
TRST assert time
Note:
All timings apply to OnCE module data transfers as well as any other transfers via the JTAG port.
Figure 28 shows the test clock input timing diagram
tTCKX
tTCKH
VM
TCK
(Input)
tTCKR
VM
tTCKR
Figure 28. Test Clock Input Timing
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Figure 29 shows the boundary scan (JTAG) timing diagram.
TCK
(Input)
tBSXKH
tBSVKH
Data
Inputs
Input Data Valid
tTCKHOV
Data
Outputs
Output Data Valid
tTCKHOZ
Data
Outputs
Figure 29. Boundary Scan (JTAG) Timing
Figure 30 shows the test access port timing diagram
TCK
(Input)
tTDIVKH
TDI
TMS
(Input)
tTDIXKH
Input Data Valid
tTDOHOV
TDO
(Output)
Output Data Valid
tTDOHOZ
TDO
(Output)
Figure 30. Test Access Port Timing
Figure 31 shows the TRST timing diagram.
TRST
(Input)
tTRST
Figure 31. TRST Timing
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Hardware Design Considerations
3
Hardware Design Considerations
The following sections discuss areas to consider when the MSC8156E device is designed into a system.
3.1
Power Supply Ramp-Up Sequence
The following subsections describe the required device initialization sequence.
3.1.1
Clock, Reset, and Supply Coordination
Starting the device requires coordination between several inputs including: clock, reset, and power supplies. Follow this
guidelines when starting up an MSC8156E device:
•
•
•
PORESET and TRST must be asserted externally for the duration of the supply ramp-up, using the VDDIO supply.
TRST deassertion does not have to be synchronized with PORESET deassertion. However, TRST must be deasserted
before normal operation begins to ensure correct functionality of the device.
CLKIN should toggle at least 32 cycles before PORESET deassertion to guarantee correct device operation. The 32
cycles should only be counted from the time after VDDIO reaches its nominal value (see timing 1 in Figure 32).
CLKIN should either be stable low during ramp-up of VDDIO supply (and start its swings after ramp-up) or should
swing within VDDIO range during VDDIO ramp-up, so its amplitude grows as VDDIO grows during ramp-up.
Figure 32 shows a sequence in which VDDIO ramps-up after VDD and CLKIN begins to toggle with the raise of VDDIO supply.
VDDIO = Nominal
VDD = Nominal
Voltage
1
VDDIO Nominal
VDD Nominal
Time
PORESET/TRST asserted
VDD applied
CLKIN starts toggling
PORESET deasserted
VDDIO applied
Figure 32. Supply Ramp-Up Sequence with VDD Ramping Before VDDIO and CLKIN Starting With VDDIO
Note:
For details on power-on reset flow and duration, see the Reset chapter in the MSC8156E Reference Manual.
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Hardware Design Considerations
3.1.2
Power-On Ramp Time
This section describes the AC electrical specification for the power-on ramp rate requirements for all voltage supplies (including
GVDD/SXPVDD/SXCVDD/QVDD/GVDD/NVDD, all VDD supplies, MVREF, and all AVDD supplies). Controlling the
power-on ramp time is required to avoid falsely triggering the ESD circuitry. Table 39 defines the power supply ramp time
specification.
Table 39. Power Supply Ramp Rate
Parameter
Min
Max
Unit
Required ramp rate.
—
36000
V/s
Required ramp time.
25
50
µs
Notes:
1.
2.
3.1.3
Ramp time is specified as a linear ramp from 10% to 90% of nominal voltage of the specific voltage supply. If the ramp is
non-linear (for example, exponential), the maximum rate of change from 200 to 500 mV is the most critical because this range
might falsely trigger the ESD circuitry.
Required over the full recommended operating temperature range (see Table 3).
Power Supply Guidelines
Use the following guidelines for power-up sequencing:
•
•
•
•
•
•
Couple M3VDD with the VDD power rail using an extremely low impedance path.
Couple inputs PLL1_AVDD, PLL2_AVDD and PLL3_AVDD with the VDD power rail using an RC filter (see Figure
36).
There is no dependency in power-on/power-off sequence between the GVDD1, GVDD2, NVDD, and QVDD power
rails.
Couple inputs M1VREF and M2VREF with the GVDD1 and GVDD2 power rails, respectively. They should rise at
the same time as or after their respective power rail.
There is no dependency between RapidIO supplies: SXCVDD1, SXCVDD2, SXPVDD1 and SXPVDD2 and other
MSC8156E supplies in the power-on/power-off sequence
Couple inputs SR1_PLL_AVDD and SR2_PLL_AVDD with SXCVDD1 and SXCVDD2 power rails, respectively,
using an RC filter (see Figure 37).
External voltage applied to any input line must not exceed the I/O supply voltage related to this line by more than 0.6 V at any
time, including during power-up. Some designs require pull-up voltages applied to selected input lines during power-up for
configuration purposes. This is an acceptable exception to the rule during start-up. However, each such input can draw up to
80 mA per input pin per MSC8156E device in the system during power-up. An assertion of the inputs to the high voltage level
before power-up should be with slew rate less than 4 V/ns.
The device power rails should rise in the following sequence:
1.
2.
VDD (and all coupled supplies)
After the above rails rise to 90% of their nominal voltage, the following I/O power rails may rise in any sequence (see
Figure 33): QVDD, NVDD, GVDD1, and GVDD2.
NVDD, QVDD, GVDD1, GVDD2
VDD, MVDD, M3VDD
90%
Figure 33. Supply Ramp-Up Sequence
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Hardware Design Considerations
Notes: 1.
2.
3.
4.
5.
6.
If the M3 memory is not used, M3VDD can be tied to GND.
If the MAPLE-B is not used, MVDD can be tied to GND.
If the HSSI port1 is not used, SXCVDD1and SXPVDD1 must be connected to the designated power supplies.
If the HSSI port2 is not used, SXCVDD2 and SXPVDD2 must be connected to the designated power supplies.
If the DDR port 1 interface is not used, it is recommended that GVDD1 be left unconnected.
If the DDR port 2 interface is not used, it is recommended that GVDD2 be left unconnected.
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Hardware Design Considerations
3.1.4
Reset Guidelines
When a debugger is not used, implement the connection scheme shown in Figure 34.
MSC815x
TRST
On-board PORESET source
(example: voltage monitor)
PORESET
Figure 34. Reset Connection in Functional Application
When a debugger is used, implement the connection scheme shown in Figure 35.
VDDIO
On-board TRST source
(example: OnCE)
10 ΚΩ
MSC815x
TRST
On-board PORESET source
(example: voltage monitor)
PORESET
Figure 35. Reset Connection in Debugger Application
3.2
PLL Power Supply Design Considerations
Each global PLL power supply must have an external RC filter for the PLLn_AVDD input (see Figure 36) in which the
following components are defined as listed:
•
•
•
Note:
R = 5 Ω ± 5%
C1 = 10 µF ± 10%, 0603, X5R, with ESL ≤ 0.5 nH, low ESL Surface Mount Capacitor.
C2 = 1.0 µF ± 10%, 0402, X5R, with ESL ≤ 0.5 nH, low ESL Surface Mount Capacitor.
A higher capacitance value for C2 may be used to improve the filter as long as the other C2 parameters do not change.
All three PLLs can connect to a single supply voltage source (such as a voltage regulator) as long as the external RC filter is
applied to each PLL separately. For optimal noise filtering, place the circuit as close as possible to its PLLn_AVDD inputs.
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Hardware Design Considerations
.
MSC8156E
R
VDD Power Rail
(Voltage Regulator)
PLL0_AVDD
C1
C2
VSS
R
PLL1_AVDD
C2
C1
VSS
R
PLL2_AVDD
C2
C1
VSS
Figure 36. PLL Supplies
Each SerDes PLL power supply must be filtered using a circuit similar to the one shown in Figure 37, to ensure stability of the
internal clock. For maximum effectiveness, the filter circuit should be placed as closely as possible to the SRn_PLL_AVDD ball
to ensure it filters out as much noise as possible. The ground connection should be near the SRn_PLL_AVDD ball. The 0.003 μF
capacitor is closest to the ball, followed by the two 2.2 μF capacitors, and finally the 1 Ω resistor to the board supply plane. The
capacitors are connected from SRn_PLL_AVDD to the ground plane. Use ceramic chip capacitors with the highest possible
self-resonant frequency. All trances should be kept short, wide, and direct.
1Ω
VDDSXC
SRn_PLL_AVDD
2.2 μF
2.2 μF
0.003 μF
SRn_PLL_AGND
as short as possible
GNDSXC
Figure 37. SerDes PLL Supplies
3.3
Clock and Timing Signal Board Layout Considerations
When laying out the system board, use the following guidelines:
•
•
Keep clock and timing signal paths as short as possible and route with 50 Ω impedance.
Use a serial termination resistor placed close to the clock buffer to minimize signal reflection. Use the following
equation to compute the resistor value:
Rterm = Rim – Rbuf
where Rim = trace characteristic impedance
Rbuf = clock buffer internal impedance.
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Hardware Design Considerations
3.4
SGMII AC-Coupled Serial Link Connection Example
Figure 38 shows an example of a 4-wire AC-coupled serial link connection. For additional layout suggestions, see AN3556
MSC815x High Speed Serial Interface Hardware Design Considerations, available on the Freescale website or from your local
sales office or representative.
SR[1–2]_TX[[1–2]
CTX
SR[1–2]_RX[1–2]
50 Ω
50 Ω
Transmitter
50 Ω
SR[1–2]_TX[1–2]
SGMII
SerDes Interface
Receiver
SR[1–2]_RX[1–2]
CTX
50 Ω
50 Ω
CTX
SR[1–2]_TX[1–2]
50 Ω
Transmitter
SR[1–2]_RX[1–2]]
50 Ω
Receiver
SR[1–2]_RX[1–2]
50 Ω
CTX
SR[1–2]_TX[1–2]
Figure 38. 4-Wire AC-Coupled SGMII Serial Link Connection Example
3.5
Note:
Connectivity Guidelines
Although the package actually uses a ball grid array, the more conventional term pin is used to denote signal
connections in this discussion.
First, select the pin multiplexing mode to allocate the required I/O signals. Then use the guidelines presented in the following
subsections for board design and connections. The following conventions are used in describing the connectivity requirements:
1.
2.
3.
4.
5.
Note:
GND indicates using a 10 kΩ pull-down resistor (recommended) or a direct connection to the ground plane. Direct
connections to the ground plane may yield DC current up to 50 mA through the I/O supply that adds to overall power
consumption.
VDD indicates using a 10 kΩ pull-up resistor (recommended) or a direct connection to the appropriate power supply.
Direct connections to the supply may yield DC current up to 50 mA through the I/O supply that adds to overall power
consumption.
Mandatory use of a pull-up or pull-down resistor is clearly indicated as “pull-up/pull-down.” For buses, each pin on
the bus should have its own resistor.
NC indicates “not connected” and means do not connect anything to the pin.
The phrase “in use” indicates a typical pin connection for the required function.
Please see recommendations #1 and #2 as mandatory pull-down or pull-up connection for unused pins in case of
subset interface connection.
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Hardware Design Considerations
3.5.1
DDR Memory Related Pins
This section discusses the various scenarios that can be used with either of the MSC8156E DDR ports.
Note:
The signal names in Table 40, Table 41 and Table 42 are generic names for a DDR SDRAM interface. For actual pin
names refer to Table 1.
3.5.1.1
DDR Interface Is Not Used
Table 40. Connectivity of DDR Related Pins When the DDR Interface Is Not Used
Signal Name
Pin Connection
MDQ[0–63]
NC
MDQS[7–0]
NC
MDQS[7–0]
NC
MA[15–0]
NC
MCK[0–2]
NC
MCK[0–2]
NC
MCS[1–0]
NC
MDM[7–0]
NC
MBA[2–0]
NC
MCAS
NC
MCKE[1–0]
NC
MODT[1–0]
NC
MMDIC[1–0]
NC
MRAS
NC
MWE
NC
MECC[7–0]
NC
MDM8
NC
MDQS8
NC
MDQS8
NC
MAPAR_OUT
NC
MAPAR_IN
NC
3
MVREF
NC
GVDD1/GVDD23
NC
Notes:
1.
2.
3.
For the signals listed in this table, the initial M stands for M1 or M2 depending on which DDR controller is not used.
If the DDR controller is not used, disable the internal DDR clock by setting the appropriate bit in the System Clock Control
Register (SCCR) and put all DDR I/O in sleep mode by setting DRx_GCR[DDRx_DOZE] (for DDR controller x). See the
Clocks and General Configuration Registers chapters in the MSC8156E Reference Manual for details.
For MSC8156E Revision 1 silicon, these pins were connected to GND. For newer revisions of the MSC8156E, connecting
these pins to GND increases device power consumption.
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Hardware Design Considerations
3.5.1.2
DDR Interface Is Used With 32-Bit DDR Memory Only
Table 41 lists unused pin connection when using 32-bit DDR memory. The 32 most significant data lines are not used.
Table 41. Connectivity of DDR Related Pins When Using 32-bit DDR Memory Only
Signal Name
Pin Connection
MDQ[31–0]
in use
MDQ[63–32]
NC
MDQS[3–0]
in use
MDQS[7–4]
NC
MDQS[3–0]
in use
MDQS[7–4]
NC
MA[15–0]
in use
MCK[2–0]
in use
MCK[2–0]
in use
MCS[1–0]
in use
MDM[3–0]
in use
MDM[7–4]
NC
MBA[2–0]
in use
MCAS
in use
MCKE[1–0]
in use
MODT[1–0]
in use
MMDIC[1–0]
in use
MRAS
in use
MWE
in use
MVREF
in use
GVDD1/GVDD2
in use
Notes:
1.
2.
3.5.1.3
For the signals listed in this table, the initial M stands for M1 or M2 depending on which DDR controller is not used.
For MSC8156E Revision 1 silicon, these pins were connected to GND (or VDD). For newer revisions of the MSC8156E,
connecting these pins to GND increases device power consumption.
ECC Unused Pin Connections
When the error code correction mechanism is not used in any 32- or 64-bit DDR configuration, refer to Table 42 to determine
the correct pin connections.
Table 42. Connectivity of Unused ECC Mechanism Pins
Signal Name
Pin connection
MECC[7–0]
NC
MDM8
NC
MDQS8
NC
MDQS8
NC
Notes:
1.
2.
For the signals listed in this table, the initial M stands for M1 or M2 depending on which DDR controller is not used.
For MSC8156E Revision 1 silicon, these pins were connected to GND (or VDD). For newer revisions of the MSC8156E,
connecting these pins to GND increases device power consumption.
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Hardware Design Considerations
3.5.1.4
DDR2 Unused MAPAR Pin Connections
When the MAPAR signals are not used, refer to Table 43 to determine the correct pin connections.
Table 43. Connectivity of MAPAR Pins for DDR2
Signal Name
Pin connection
MAPAR_OUT
NC
MAPAR_IN
NC
Notes:
3.5.2
3.5.2.1
1.
2.
For the signals listed in this table, the initial M stands for M1 or M2 depending on which DDR controller is used for DDR2.
For MSC8156E Revision 1 silicon, these pins were connected to GND. For newer revisions of the MSC8156E, connecting
these pins to GND increases device power consumption.
HSSI-Related Pins
HSSI Port Is Not Used
The signal names in Table 44 and Table 45 are generic names for a RapidIO interface. For actual pin names refer to Table 1.
Table 44. Connectivity of Serial RapidIO Interface Related Pins When the RapidIO Interface Is Not Used
Signal Name
Pin Connection
SR_IMP_CAL_RX
NC
SR_IMP_CAL_TX
NC
SR[1–2]_REF_CLK
SXCVSS
SR[1–2]_REF_CLK
SXCVSS
SR[1–2]_RXD[3–0]
SXCVSS
SR[1–2]_RXD[3–0]
SXCVSS
SR[1–2]_TXD[3–0]
NC
SR[1–2]_TXD[3–0]
NC
SR[1–2]_PLL_AVDD
In use
SR[1–2]_PLL_AGND
In use
SXPVSS
In use
SXCVSS
In use
SXPVDD
In use
SXCVDD
In use
Note:
3.5.2.2
All lanes in the HSSI SerDes should be powered down. Refer to the MSC8156E Reference Manual for details.
HSSI Specific Lane Is Not Used
Table 45. Connectivity of HSSI Related Pins When Specific Lane Is Not Used
Signal Name
Pin Connection
SR_IMP_CAL_RX
In use
SR_IMP_CAL_TX
In use
SR[1–2]_REF_CLK
In use
SR[1–2]_REF_CLK
In use
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Table 45. Connectivity of HSSI Related Pins When Specific Lane Is Not Used (continued)
Signal Name
Pin Connection
SR[1–2]_RXDn
SXCVSS
SR[1–2]_RXDn
SXCVSS
SR[1–2]_TXDn
NC
SR[1–2]_TXDn
NC
SR[1–2]_PLL_AVDD
in use
SR[1–2]_PLL_AGND
in use
SXPVSS
in use
SXCVSS
in use
SXPVDD
in use
SXCVDD
in use
Note:
The n indicates the lane number {0,1,2,3} for all unused lanes.
3.5.3
RGMII Ethernet Related Pins
Note:
Table 46 and Table 47 assume that the alternate function of the specified pin is not used. If the alternate function is
used, connect the pin as required to support that function.
Table 46. Connectivity of RGMII Related Pins When the RGMII Interface Is Not Used
Signal Name
Pin Connection
GE1_RX_CTL
GND
GE2_TX_CTL
NC
Note:
Assuming GE1 and GE2 are disabled in the reset configuration word.
GE_MDC and GE_MDIO pins should be connected as required by the specified protocol. If neither GE1 nor GE2 is used,
Table 47 lists the recommended management pin connections.
Table 47. Connectivity of GE Management Pins When GE1 and GE2 Are Not Used
Signal Name
Pin Connection
GE_MDC
NC
GE_MDIO
NC
3.5.4
TDM Interface Related Pins
Table 48 lists the board connections of the TDM pins when an entire specific TDM is not used. For multiplexing options that
select a subset of a TDM interface, use the connections described in Table 48 for those signals that are not selected. Table 48
assumes that the alternate function of the specified pin is not used. If the alternate function is used, connect that pin as required
to support the selected function.
Table 48. Connectivity of TDM Related Pins When TDM Interface Is Not Used
Signal Name
Pin Connection
TDMnRCLK
GND
TDMnRDAT
GND
TDMnRSYN
GND
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Hardware Design Considerations
Table 48. Connectivity of TDM Related Pins When TDM Interface Is Not Used
Signal Name
Pin Connection
TDMnTCLK
GND
TDMnTxDAT
GND
TDMnTSYN
GND
VDDIO
2.5 V
Notes:
1.
2.
3.5.5
x = {0, 1, 2,3}
In case of subset of TDM interface usage please make sure to disable unused TDM modules. See TDM chapter in the
MSC8156E Reference Manual for details.
Miscellaneous Pins
Table 49 lists the board connections for the pins not required by the system design. Table 49 assumes that the alternate function
of the specified pin is not used. If the alternate function is used, connect that pin as required to support the selected function.
Table 49. Connectivity of Individual Pins When They Are Not Required
Signal Name
CLKOUT
Pin Connection
NC
EE0
GND
EE1
NC
GPIO[31–0]
NC
SCL
See the GPIO connectivity guidelines in this table.
SDA
See the GPIO connectivity guidelines in this table.
INT_OUT
NC
IRQ[15–0]
See the GPIO connectivity guidelines in this table.
VDDIO
NMI
NMI_OUT
NC
RC[21–0]
GND
STOP_BS
GND
TCK
GND
TDI
GND
TDO
NC
TMR[4–0]
See the GPIO connectivity guidelines in this table.
TMS
GND
TRST
See Section 3.1 for guidelines.
URXD
See the GPIO connectivity guidelines in this table.
UTXD
See the GPIO connectivity guidelines in this table.
DDN[1–0]
See the GPIO connectivity guidelines in this table.
DRQ[1–0]
See the GPIO connectivity guidelines in this table.
RCW_LSEL_0
GND
RCW_LSEL_1
GND
RCW_LSEL_2
GND
RCW_LSEL_3
GND
VDDIO
2.5 V
Note:
For details on configuration, see the MSC8156E Reference Manual. For additional information, refer to the MSC815x
and MSC825x DSP Family Design Checklist.
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Ordering Information
3.6
Guide to Selecting Connections for Remote Power Supply
Sensing
To assure consistency of input power levels, some applications use a practice of connecting the remote sense signal input of an
on-board power supply to one of power supply pins of the IC device. The advantage of using this connection is the ability to
compensate for the slow components of the IR drop caused by resistive supply current path from on-board power supply to the
pins layer on the package. However, because of specific device requirements, not every ball connection can be selected as the
remote sense pin. Some of these pins must be connected to the appropriate power supply or ground to ensure correct device
functionality. Some connections supply critical power to a specific high usage area of the IC die; using such a connection as a
non-supply pin could impact necessary supply current during high current events. The following balls can be used as the board
supply remote sense output without degrading the power and ground supply quality:
•
•
•
VDD: W10, T19
VSS: J18, Y10
M3VDD: None
Do not use any other connections for remote sensing. Use of any other connections for this purpose can result in application and
device failure.
4
Ordering Information
Consult a Freescale Semiconductor sales office or authorized distributor to determine product availability and place an order.
Part
Package Type
MSC8156E Flip Chip Plastic Ball Grid Array (FC-PBGA)
Spheres
Core
Voltage
Lead-free
1.0 V
Core
Frequency
(MHz)
Order Number
0° C to 105°C
1000
MSC8156ESVT1000B
–40° to 105°C
1000
MSC8156ETVT1000B
Operating
Temperature
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63
Package Information
5
Package Information
NOTES:
1.
2.
3.
4.
5.
6.
7.
ALL DIMENSIONS IN MILLIMETERS.
DIMENSIONING AND TOLERANCING PER ASME Y14.5M-1994.
MAXIMUM SOLDER BALL DIAMETER MEASURE PARALLEL TO DATUM A.
DATUM A, THE SEATING PLANE, IS DETERMINED BY THE SPHERICAL CROWNS OF THE SOLDER
BALLS.
PARALLELISM MEASUREMENT SHALL EXCLUDE ANY EFFECT OF MARK ON TOP SURFACE OF
PACKAGE.
ALL DIMENSIONS ARE SYMMETRIC ACROSS THE PACKAGE CENTER LINES, UNLESS DIMENSIONED
OTHERWISE.
29.2MM MAXIMUM PACKAGE ASSEMBLY (LID + LAMINATE) X AND Y.
Figure 39. MSC8156E Mechanical Information, 783-ball FC-PBGA Package
MSC8156E Six-Core Digital Signal Processor with Security Data Sheet, Rev. 0
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Product Documentation
6
Product Documentation
Following is a general list of supporting documentation:
•
•
•
•
•
•
7
MSC8156E Technical Data Sheet (MSC8156E). Details the signals, AC/DC characteristics, clock signal
characteristics, package and pinout, and electrical design considerations of the MSC8156E device.
MSC8156E Reference Manual (MSC8156ERM). Includes functional descriptions of the extended cores and all the
internal subsystems including configuration and programming information.
Application Notes. Cover various programming topics related to the StarCore DSP core and the MSC8156E device.
QUICC Engine Block Reference Manual with Protocol Interworking (QEIWRM). Provides detailed information
regarding the QUICC Engine technology including functional description, registers, and programming information.
SC3850 DSP Core Reference Manual. Covers the SC3850 core architecture, control registers, clock registers, program
control, and instruction set.
MSC8156SC3850 DSP Core Subsystem Reference Manual. Covers core subsystem architecture, functionality, and
registers.
Revision History
Table 50 provides a revision history for this data sheet.
Table 50. Document Revision History
Rev.
Date
0
Dec. 2010
Description
• Initial public release.
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Revision History
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Revision History
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67
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Document Number: MSC8156E
Rev. 0
12/2010
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