ONSEMI NCN4555MNR2G

NCN4555
1.8V / 3V SIM Card Power
Supply and Level Shifter
The NCN4555 is a level shifter analog circuit designed to translate
the voltages between a SIM Card and an external microcontroller or
MPU. A built−in LDO−type DC−DC converter makes the NCN4555
useable to drive 1.8 V and 3.0 V SIM card. The device fulfills the
ISO7816−3 smart card interface standard as well as GSM 11.11 and
related (11.12 and 11.18) and 3G mobile requirements (IMT−2000/3G
TS 31.101). With the STOP pin a low current shutdown mode can be
activated making the battery life longer. The Card power supply
voltage (SIM_VCC) is selected using a single pin (MOD_VCC).
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QFN−16
MN SUFFIX
CASE 488AK
1
Features
•
•
•
•
•
•
•
Supports 1.8 V or 3.0 V Operating SIM Card
The LDO is able to Supply More than 50 mA under 1.8 V and 3.0 V
Built−in Pullup Resistor for I/O Pin in Both Directions
All Pins are Fully ESD Protected According to ISO−7816
Specifications – ESD Protection on SIM Pins in Excess of 7 kV
(Human Body Model)
Supports up to More than 5 MHz Clock
Low−Profile 3x3 QFN−16 Package
Pb−Free Packages are Available*
MARKING DIAGRAM
ÇÇÇ
ÇÇÇ
16
1
NCN
4555
ALYWG
G
Typical Applications
•
•
•
•
SIM Card Interface Circuit for 2G, 2.5G and 3G Mobile Phones
Identification Module
Smart Card Readers
Wireless PC Cards
1.8 V to 5.5 V
2.7 V to 5.5 V
0.1mF 0.1mF
GND
3
1
P3
P2
P1
P0
2
14
13
15
ORDERING INFORMATION
5
VDD
STOP
MOD_VCC
RST
NCN4555
MPU or Microcontroller
VBB
CLK
SIM_VCC
SIM_RST
SIM_CLK
I/O
SIM_I/O
GND
SIM Card
Detect
GND
A = Assembly Location
L
= Wafer Lot
Y = Year
W = Work Week
G
= Pb−Free Package
(Note: Microdot may be in either location)
7
1
2
3
4
9
11
VCC GND
RST
CLK
I/O
C4
C8
DET
8
5
6
7
8
DET
1mF
10
Device
Package
Shipping †
NCN4555MN
QFN−16
123 Units / Rail
NCN4555MNG
QFN−16
(Pb−Free)
123 Units / Rail
NCN4555MNR2
QFN−16
3000/Tape & Reel
QFN−16
(Pb−Free)
3000/Tape & Reel
NCN4555MNR2G
GND
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D.
Figure 1. Typical Interface Application
*For additional information on our Pb−Free strategy and soldering details, please
download the ON Semiconductor Soldering and Mounting Techniques
Reference Manual, SOLDERRM/D.
© Semiconductor Components Industries, LLC, 2006
March, 2006 − Rev. 1
1
Publication Order Number:
NCN4555/D
NCN4555
STOP
1
MOD_VCC
2
NC
I/O
RST CLK
16
15
14
Exposed Pad (EP)
13
12
NC
11
SIM_CLK
NCN4555
VDD
3
10
GND
NC
4
9
SIM_RST
5
6
7
8
VBAT NC SIM_VCC SIM_I/O
Figure 2. QFN−16 Pinout (Top View)
VBAT (2.7 V to 5.5 V)
5
STOP 1
7 SIM_VCC
50 mA LDO
1.8 V/3.0 V
MOD_VCC 2
GND
VDD
(1.8 V to 5.5 V) 3
RST 14
9 SIM_RST
GND
CLK 13
11 SIM_CLK
GND
18 kW
I/O 15
GND
14 kW
I/O
DATA
DATA
8 SIM_I/O
I/O
GND
GND
Figure 3. NCN4555 Block Diagram
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2
10 GND
NCN4555
PIN DESCRIPTIONS
PIN
Name
Type
1
STOP
INPUT
Power Down Mode pin:
STOP = Low ³ Low current shutdown mode activated
STOP = High ³ Normal Operation
A Low level on this pin resets the SIM interface, switching off the SIM_VCC.
Description
2
MOD_VCC
INPUT
The signal present on this pin programs the SIM_VCC value:
MOD_VCC = Low ³ SIM_VCC = 1.8 V
MOD_VCC = High ³ SIM_VCC = 3 V
3
VDD
POWER
4
NC
5
VBAT
6
NC
7
SIM_VCC
POWER
This pin is connected to the SIM card power supply pin. An internal LDO converter is
programmable by the external MPU to supply either 1.8 V or 3.0 V output voltage. An external
1.0 mF minimum ceramic capacitor recommended must be connected across SIM_VCC and GND.
During a normal operation, the SIM_VCC voltage can be set to 1.8 V followed by a 3.0 V value, or
can start directly to any of these two values.
8
SIM_I/O
INPUT/
OUTPUT
This pin handles the connection to the serial I/O of the card connector. A bidirectional level
translator adapts the serial I/O signal between the card and the micro controller. A 14 kW (typical)
pullup resistor provides a High impedance state for the SIM card I/O link.
9
SIM_RST
OUTPUT
This pin is connected to the RESET pin of the card connector. A level translator adapts the
external Reset (RST) signal to the SIM card.
10
GND
GROUND
This pin is the GROUND reference for the integrated circuit and associated signals. Care must be
taken to avoid voltage spikes when the device operates in a normal operation.
11
SIM_CLK
OUTPUT
This pin is connected to the CLOCK pin of the card connector. The CLOCK (CLK) signal comes
from the external clock generator, the internal level shifter being used to adapt the voltage defined
for the SIM_VCC.
12
NC
13
CLK
INPUT
The clock signal, coming from the external controller, must have a Duty Cycle within the Min/Max
values defined by the specification (typically 50%). The built−in level shifter translates the input
signal to the external SIM card CLK input.
14
RST
INPUT
The RESET signal present at this pin is connected to the SIM card through the internal level
shifter which translates the level according to the SIM_VCC programmed value.
15
I/O
INPUT/
OUTPUT
16
NC
This pin is connected to the system controller power supply. It configures the level shifter input
stage to accept the signals coming from the microprocessor. A 0.1 mF capacitor shall be used to
bypass the power supply voltage. When VDD is below 1.1 V typical the SIM_VCC is disabled. The
NCN4555 comes into a shutdown mode.
No Connect
POWER
DC−DC converter supply input. The input voltage ranges from 2.7V up to 5.5V. This pin has to be
bypass by a 0.1 mF capacitor.
No Connect
No Connect
This pin is connected to an external microcontroller or cellular phone management unit. A
bidirectional level translator adapts the serial I/O signal between the smart card and the external
controller. A built−in constant 18 kW (typical) resistor provides a high impedance state when not
activated.
No Connect
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3
NCN4555
ATTRIBUTES
Characteristics
Values
ESD protection
HBM, SIM card pins (7, 8, 9, 10 & 11) (Note 1)
HBM, All other pins (Note 1)
MM, SIM card pins (7, 8, 9, 10 & 11) (Note 2)
MM, All other pins (Note 2)
CDM, SIM card pins (7, 8, 9, 10 & 11) (Note 3)
CDM , All other pins (Note 3)
> 7 kV
> 2 kV
> 600 V
> 200 V
> 2 kV
> 600 V
Moisture sensitivity (Note 4) QFN−16
Flammability Rating
Level 1
Oxygen Index: 28 to 34
UL 94 V−0 @ 0.125 in
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
1.
2.
3.
4.
Human Body Model, R =1500 W, C = 100 pF.
Machine Model.
CDM, Charged Device Model.
For additional information, see Application Note AND8003/D.
MAXIMUM RATINGS (Note 5)
Rating
Symbol
Value
Unit
LDO Power Supply Voltage
VBAT
−0.5 ≤ VBAT ≤ 6
V
Power Supply from Microcontroller Side
VDD
−0.5 ≤ VDD ≤ 6
V
SIM_VCC
−0.5 ≤ SIM_VCC ≤ 6
V
Vin
−0.5 ≤ Vin ≤VDD + 0.5
but < 6.0
±5
V
mA
−0.5 ≤ Vout ≤ VDD + 0.5
but < 6.0
±10
V
mA
Iout
−0.5 ≤ Vout ≤ SIM_VCC + 0.5
but < 6.0
15 (internally limited)
V
mA
PD
RqJA
440
90
mW
°C/W
Operating Ambient Temperature Range
TA
−25 to +85
°C
Operating Junction Temperature Range
TJ
−25 to +125
°C
TJmax
+125
°C
Tstg
−65 to + 150
°C
External Card Power Supply
Digital Input Pins
Iin
Digital Output Pins
Vout
Iout
SIM card Output Pins
Vout
QFN−16 Low Profile package
Power Dissipation @ TA = + 85°C
Thermal Resistance Junction−to−Air
Maximum Junction Temperature
Storage Temperature Range
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
5. Maximum electrical ratings are defined as those values beyond which damage to the device may occur at TA = +25°C
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NCN4555
POWER SUPPLY SECTION (−25°C to +85°C)
Pin
Symbol
5
VBAT
Power Supply
5
I VBAT
Operating current – ICC = 0 mA (Note 6)
5
I VBAT_SD
Shutdown current – STOP= Low (Note 7)
3
VDD
Operating Voltage
3
IVDD
Operating Current – fCLK = 1 MHz (Note 8)
3
IVDD_SD
3
VDD
7
SIM_VCC
7
ISIM_VCC_SC
Rating
Min
Typ
2.7
22
1.8
7.0
Shutdown Current – STOP = Low
Undervoltage Lockout
0.6
MOD_VCC = High, VBAT = 3.0 V, ISIM_VCC = 50 mA
MOD_VCC = High, VBAT = 3.3 V to 5.5 V, ISIM_VCC = 0 mA to 50 mA
MOD_VCC = Low, VBAT = 2.7 V to 5.5 V, ISIM_VCC = 0 mA to 50 mA
2.8
1.7
2.8
3.0
1.8
Short –Circuit Current – SIM_VCC shorted to ground , TA=25°C
Max
Unit
5.5
V
30
mA
3.0
mA
5.5
V
12
mA
1.0
mA
1.5
V
3.2
1.9
V
V
V
175
mA
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
6. As long as VBAT – VDD v 2.5 V. For VBAT – VDD > 2.5 V the maximum value increases up to 35 mA (typical being in the +25 mA range).
7. As long as VBAT – VDD v 2.5 V.
8. Guaranteed by design over the operating temperature range specified.
DIGITAL INPUT/OUTPUT SECTION CLOCK, RESET, I/O, STOP, MOD_VCC
Pin
Symbol
1,2, 13,
14, 15
Vin
IIH & IIL
Rating
Min
Input Voltage Range (STOP, MOD_VCC, RST, CLK, I/O)
Input Current (STOP, MOD_VCC, RST, CLK)
Typ
Max
Unit
0
VDD
V
−100
100
nA
13, 14
VIH
VIL
High Level Input Voltage (RST, CLK)
Low Level Input Voltage (RST, CLK)
0.7 * VDD
VDD
0.2 * VDD
V
V
1, 2
VIH
VIL
High Level Input Voltage (STOP, MOD_VCC)
Low Level Input Voltage (STOP, MOD_VCC)
0.7 * VDD
0
VDD
0.4
V
V
15
VOH_I/O
VOL_I/O
IIH
IIL
High Level Output Voltage (SIM_I/O = SIM_VCC, IOH_I/O = −20 mA)
Low Level Output Voltage (SIM_I/O = 0 V, IOH_I/O = 200 mA)
High Level Input Current (I/O)
Low Level Input Current (I/O)
0.7 * VDD
0
−20
VDD
0.4
20
1.0
V
V
mA
mA
15
Rpu_I/O
I/0 Pullup Resistor
24
kW
12
18
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
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NCN4555
SIM INTERFACE SECTION (Note 9)
Pin
Symbol
9
SIM_RST
Rating
Min
SIM_VCC = +3.0 V (MOD_VCC = High)
Output RESET VOH @ Isim_rst = −20 mA
Output RESET VOL @ Isim_rst = +200 mA
Output RESET Rise Time @ Cout = 30 pF
Output RESET Fall Time @ Cout = 30 pF
SIM_VCC = +1.8 V (MOD_VCC = Low)
Output RESET VOH @ Isim_rst = −20 mA
Output RESET VOL @ Isim_rst = +200 mA
Output RESET Rise Time @ Cout = 30 pF
Output RESET Fall Time @ Cout = 30 pF
11
SIM_CLK
SIM_VCC = +3.0 V (MOD_VCC = High)
Output Duty Cycle
Max Output Frequency
Output VOH @ Isim_clk = −20 mA
Output VOL @ Isim_clk = +200 mA
Output SIM_CLK Rise Time @ Cout = 30 pF
Output SIM_CLK Fall Time @ Cout = 30 pF
SIM_VCC = +1.8 V (MOD_VCC = Low)
Output Duty Cycle
Max Output Frequency
Output VOH @ Isim_clk = −20 mA
Output VOL @ Isim_clk = +200 mA
Output SIM_CLK Rise Time @ Cout = 30 pF
Output SIM_CLK Fall Time @ Cout = 30 pF
8
SIM_I/O
SIM_VCC = +3.0 V (MOD_VCC = High)
Output VOH @ ISIM_IO = −20 mA, VI/O = VDD
Output VOL @ ISIM_IO = +1 mA, VI/O = 0 V
SIM_I/O Rise Time @ Cout = 30 pF
SIM_I/O Fall Time @ Cout = 30 pF
SIM_VCC = +1.8 V (MOD_VCC = High)
Output VOH @ ISIM_IO = −20 mA, VI/O =VDD
Output VOL @ ISIM_IO = +1.0 mA, VI/O = 0 V
SIM_I/O Rise Time @ Cout = 30 pF
SIM_I/O Fall Time @ Cout = 30 pF
8
Rpu_SIM_I/O
Card I/O Pullup Resistor
Typ
Max
Unit
0.9 * SIM_VCC
0
SIM_VCC
0.4
1
1
V
V
ms
ms
0.9 * SIM_VCC
0
SIM_VCC
0.4
1
1
V
V
ms
ms
40
5
0.9 * SIM_VCC
0
60
%
MHz
V
V
ns
ns
SIM_VCC
0.4
18
18
40
5
0.9 * SIM_VCC
0
60
SIM_VCC
0.4
18
18
%
MHz
V
V
ns
ns
0.8 * SIM_VCC
0
SIM_VCC
0.4
1
1
V
V
ms
ms
0.8 * SIM_VCC
0
SIM_VCC
0.3
1
1
V
V
ms
ms
18
kW
10
14
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
9. All the dynamic specifications (AC specifications) are guaranteed by design over the operating temperature range.
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NCN4555
TYPICAL CHARACTERISTICS
100
100
VBAT = 5.5 V
VBAT = 5.5 V
90
IVCC_SC_3.0 V (mA)
IVCC_SC_1.8 V (mA)
90
80
70
VBAT = 2.7 V
60
50
−50
−30
−10
10
30
50
70
80
70
60
50
−50
90
VBAT = 3.3 V
−30
TEMPERATURE (°C)
30
50
70
90
Figure 5. Short Circuit Current IVCC_SC vs
Temperature at SIM_VCC = 3.0 V (MOD_VCC = HIGH)
30
30
VBAT = 3.3 V
IVCC_SC_1.8 V (mA)
IVCC_SC_3.0 V (mA)
10
TEMPERATURE (°C)
Figure 4. Short Circuit Current IVCC_SC vs
Temperature at SIM_VCC = 1.8 V (MOD_VCC = LOW)
25
VBAT = 5.5 V
20
15
10
−50
−10
−30
−10
10
30
50
TEMPERATURE (°C)
70
25
VBAT = 5.5 V
20
15
10
−50
90
VBAT = 2.7 V
Figure 6. IBAT vs temperature at 3.0 V
−30
−10
10
30
50
TEMPERATURE (°C)
70
Figure 7. IVBAT vs Temperature at 1.8 V
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7
90
NCN4555
APPLICATION INFORMATION
CARD SUPPLY CONVERTER
In order to guarantee a stable and satisfying operating of
the LDO the SIM_VCC output will be connected to a 1.0 mF
bypass ceramic capacitor to the ground. At the input, VBAT
will be bypassed to the ground with a 0.1 mF ceramic
capacitor.
The NCN4555 interface DC−DC converter is a
Low Dropout Voltage Regulator capable of suppling a
current in excess of 50 mA under 1.8 V or 3.0 V. This device
features a very low quiescent current typically lower than
25 mA (Figure 6 and 7). MOD_VCC is a select input
allowing a logic level signal to select a regulated voltage of
1.8 V (MOD_VCC = LOW) or 3.0 V (MOD_VCC = HIGH).
Additionally, the NCN4555 has a shutdown input allowing
it to turn off or turn on the regulator output. The shutdown
mode power consumption is typically in the range of a few
tens of nA (30 nA Typical). Figure 8 shows a simplified
view of the NCN4555 voltage regulator. The SIM_VCC
output is internally current limited and protected against
short circuits. The short−circuit current IVCC is constant
over the temperature and SIM_VCC. It varies with VBAT
typically in the range of 60 mA to 90 mA (Figure 4 and 5).
LEVEL SHIFTERS
The level shifters accommodate the voltage difference
that might exist between the microcontroller and the smart
card. The RESET and CLOCK level shifters are
monodirectional and feature both the same architecture.
The bidirectional I/O line provides a way to automatically
adapt the voltage difference between the MCU and the SIM
card in both directions. In addition with the pullup resistor,
an active pullup circuit (Figure 8, Q1 and Q2) provides a fast
charge of the stray capacitance, yielding a rise time fully
within the ISO7816 specifications.
SIM_VCC
VBAT
Ilim
Q1
R1
−
+
CIN = 0.1 mF
COUT = 1.0 mF
+
R2
MOD_VCC
VREF
STOP
GND
Figure 8. Simplified Block Diagram of the LDO Voltage Regulator
VDD
SIM_VCC
Q1
Q2
18 k
14 k
200 ns
200 ns
I/O
SIM_I/O
GND
Q3
GND
IO/CONTROL
LOGIC
Figure 9. Basic I/O Line Interface
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NCN4555
ESD PROTECTION
The typical waveform provided in Figure 10 shows how
the accelerator operates. During the first 200 ns (typical),
the slope of the rise time is solely a function of the pullup
resistor associated with the stray capacitance. During this
period, the PMOS devices are not activated since the input
voltage is below their Vgs threshold. When the input slope
crosses the Vgsth, the opposite one shot is activated,
providing a low impedance to charge the capacitance, thus
increasing the rise time as depicted in Figure 10. The same
mechanism applies for the opposite side of the line to make
sure the system is optimum.
The NCN4555 SIM interface features an HBM ESD
voltage protection in excess of 7 kV for all the SIM pins
(SIM_IO, SIM_CLK, SIM_RST, SIM_VCC and GND). All
the other pins (microcontroller side) sustain at least 2 kV.
These values are guaranteed for the device in its full integrity
without considering the external capacitors added to the
circuit for a proper operating. Consequently in the operating
conditions it is able to sustain much more than 7 kV on its
SIM pins making it perfectly protected against electrostatic
discharge well over the HBM ESD voltages required by the
ISO7816 standard (4 kV).
INPUT SCHMITT TRIGGERS
PRINTED CIRCUIT BOARD LAYOUT
All the Logic input pins (excepted I/O and SIM_I/O, See
Figure 3) have built−in Schmitt trigger circuits to prevent
the NCN4555 against uncontrolled operation. The typical
dynamic characteristics of the related pins are depicted
Figure 11.
The output signal is guaranteed to go High when the input
voltage is above 0.7 x VDD, and will go Low when the input
voltage is below 0.2 x VDD or 0.4 V depending on the input
considered (see the Digital Input Table on page 5).
Careful layout routing will be applied to achieve a good
and efficient operating of the device in its mobile or portable
environment and fully exploit its performance.
The bypass capacitors have to be connected as close as
possible to the device pins (SIM_VCC, VDD or VBAT) in
order to reduce as much as possible parasitic behaviors
(ripple and noise). It is recommended to use
ceramic capacitors.
The exposed pad of the QFN−16 package will be
connected to the ground as well as the unconnected pins
(NC). A relatively large ground plane is recommended.
Figures 12 and 13 shows an example of PCB device
implementation in an evaluation environment.
SHUTDOWN OPERATING
In order to save power or for other purpose required by the
application it is possible to put the NCN4555 in a shutdown
mode by setting Low the pin STOP. On the other hand the
device enters automatically in a shutdown mode when VDD
becomes lower than 1.1 V typically.
OUTPUT
VDD
ON
OFF
INPUT
0.2 x VDD
or 0.4 V
Figure 10. SIM_IO Typical Rise and Fall Times with
Stray Capacitance > 30 pF
(33 pF Capacitor Connected on the Board)
0.7 x VDD
Figure 11. Typical Schmitt Trigger Characteristics
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J1
GND
J2
GND
J3
GND
1
1
1
CLK RST I/O
IP1 IP2 IP3
10
GND
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J9
GND
S2
STOP
NC
NC
NC
NC
NC
NC
NC
12
11
10
9
8
7
6
5
4
3
2
1
CONTROL & I/O
1
2
10 k
10 k
R3
R2
1
1
1
D4
2
V1
VBAT
J10
GND
VDD
MBRA140T3
2
1
V2
VDD
J11
GND
D1
R1
VBAT
D3
C1
J6
1
VDD
IP10
100 nF
1
2
1
STOP MOD
IP4 IP5
MBRA140T3
VBAT
2.2 k
VDD
NC
13
CLK SIM_CLK
14
RST SIM_RST
15
I/O
SIM_I/O
16
NC
GND
GND_EXP
1 STOP
2
MOD_VCC
4
NC
NC
5
VBAT SIM_VCC
3
C2
10 mF
1
7
6
GND
SIM_VCC
GND
10
IP9
NC
R6
POI2
GND
CON2
1
SIM_I/O
IP8
SIM_CLK
11
9SIM_RST
8 SIM_I/O
12
1
SIM_CLK SIM_RST
IP6
IP7
J8
J5
MOD_VCC
J4 STOP
I/O
RST
CLK
GND
2.2 k
R5
SENSE_SIM_V CC
GND
MOD_VCC
S1
GND
GND
Figure 12. NCN4555 engineering test board schematic diagram
GND
Q1
2N2222
8
NC
C8
7
I/O
6
NC
VDD
5
GND
SIM_CARD
VDD
4
C4
3
CLK
2
RST
1
VCC
NCN4555
EVALUATION BOARD AND PCB GUIDELINES
NCN4555
EVALUATION BOARD AND PCB GUIDELINES
Top Layer
Bottom Layer
Figure 13. NCN4555 Printed Circuit Board Layout
(Engineering board)
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11
NCN4555
PACKAGE DIMENSIONS
QFN−16 3*3*0.75 MM, 0.5 P
CASE 488AK−01
ISSUE O
D
PIN 1
LOCATION
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION b APPLIES TO PLATED
TERMINAL AND IS MEASURED BETWEEN
0.25 AND 0.30 MM FROM TERMINAL.
4. COPLANARITY APPLIES TO THE EXPOSED
PAD AS WELL AS THE TERMINALS.
5. Lmax CONDITION CAN NOT VIOLATE 0.2 MM
SPACING BETWEEN LEAD TIP AND FLAG.
A
B
ÇÇÇ
ÇÇÇ
ÇÇÇ
E
DIM
A
A1
A3
b
D
D2
E
E2
e
K
L
0.15 C
TOP VIEW
0.15 C
(A3)
0.10 C
A
16 X
0.08 C
SIDE VIEW
MILLIMETERS
MIN
MAX
0.70
0.80
0.00
0.05
0.20 REF
0.18
0.30
3.00 BSC
1.65
1.85
3.00 BSC
1.65
1.85
0.50 BSC
0.20
−−−
0.30
0.50
SEATING
PLANE
A1
C
D2
16X
e
L
5
NOTE 5
EXPOSED PAD
8
4
9
E2
16X
K
12
1
16
16X
0.10 C A B
0.05 C
13
b
BOTTOM VIEW
NOTE 3
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