SPANSION S75PL127JCDBAWU0

S75PL127J MCPs
Stacked Multi-Chip Product (MCP)
CODE Flash, pSRAM and DATA Flash 128M (8M x 16-Bit CMOS 3.0 VoltOnly, Simultaneous Operation, Page Mode CODE Flash Memory, with
64M/32M (4M/2M x 16-Bit) pSRAM and 512M/256/128M (32M/16M/8M x 16Bit) Data Flash Memory
Data Sheet
MCP Features
„
„
Power supply voltage of 2.7 to 3.1 volt
High Performance
— 65ns for PL-J, 70ns for pSRAM, and 110ns for GL-N
„
Package
— 9 x 12 mm 84 ball FBGA
„
Operating Temperature
ADVANCE
INFORMATION
— –25°C to +85°C (Wireless)
— Page access - 25ns
Other temperature grade options
„
— Please contact the factory through the local sales
support team
General Description
The 75PL Series is a product line of stacked Multi-Chip Product (MCP) packages
and consists of:
„ One S29PL127J based CODE Flash device(s)
„ pSRAM
„ One or more S29GLxxxN based DATA Flash device(s)
Data Flash
32M pSRAM
Code Flash
Density
128M
256M
512M
128M
S75PL127JBD
S75PL127JBE
S75PL127JBF
Data Flash
64M pSRAM
Code Flash
Density
128M
256M
512M
128M
S75PL127JCD
S75PL127JCE
S75PL127JCF
Publication Number S75PL127J_00
Revision A
Amendment 1
Issue Date January 6, 2005
A d v a n c e
S75PL127J MCPs .................................................1
General Description ...................................................1
Product Selector Guide ............................................ 5
MCP Block Diagram ................................................ 6
Connection Diagram ................................................ 7
Pin Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Logic Symbol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Ordering Information ............................................... 9
Valid Combinations .................................................10
Data: S29GL128N ................................................................................................ 10
Data: S29GL256N ................................................................................................ 11
Data: S29GL512N ............................................................................................... 12
S29PL127J/S29PL064J/S29PL032J for MCP ..... 13
General Description .................................................15
Simultaneous Read/Write Operation with Zero Latency .......................15
Page Mode Features ............................................................................................15
Standard Flash Memory Features ....................................................................15
Pin Description .........................................................17
Device Bus Operations ............................................18
Table 1. PL127J Device Bus Operations ................................ 18
Requirements for Reading Array Data ......................................................... 18
Random Read (Non-Page Read) ................................................................ 18
Page Mode Read .............................................................................................. 19
Table 2. Page Select .......................................................... 19
Simultaneous Read/Write Operation ........................................................... 19
Table 3. Bank Select .......................................................... 19
Writing Commands/Command Sequences ................................................ 20
Accelerated Program Operation .............................................................. 20
Autoselect Functions .................................................................................... 20
Standby Mode .......................................................................................................20
Automatic Sleep Mode ...................................................................................... 21
RESET#: Hardware Reset Pin ......................................................................... 21
Output Disable Mode ........................................................................................ 21
Table 4. PL127J Sector Architecture ..................................... 22
Table 5. SecSiTM Sector Addresses ...................................... 27
Autoselect Mode .................................................................................................27
Table 6. Autoselect Codes (High Voltage Method) .................. 28
Table 7. PL127J Boot Sector/Sector Block Addresses for
Protection/Unprotection ..................................................... 29
Selecting a Sector Protection Mode ............................................................. 30
Table 8. Sector Protection Schemes ..................................... 30
Sector Protection ................................................... 30
Sector Protection Schemes .................................. 30
Password Sector Protection ........................................................................... 30
WP# Hardware Protection ............................................................................ 30
Selecting a Sector Protection Mode ............................................................. 30
Persistent Sector Protection ................................. 31
Persistent Protection Bit (PPB) ........................................................................31
Persistent Protection Bit Lock (PPB Lock) ..................................................31
Persistent Sector Protection Mode Locking Bit ........................................33
Password Protection Mode ................................... 33
Password and Password Mode Locking Bit ................................................34
64-bit Password ...................................................................................................34
Write Protect (WP#) ........................................................................................34
Persistent Protection Bit Lock ....................................................................35
High Voltage Sector Protection ......................................................................35
Figure 1. In-System Sector Protection/Sector
Unprotection Algorithms...................................................... 36
Temporary Sector Unprotect .........................................................................37
Figure 2. Temporary Sector Unprotect Operation .................... 37
SecSi™ (Secured Silicon) Sector Flash Memory Region ...........................37
Factory-Locked Area (64 words) ..............................................................37
Customer-Lockable Area (64 words) ......................................................38
SecSi Sector Protection Bits ........................................................................38
Figure 3. SecSi Sector Protect Verify..................................... 39
Hardware Data Protection ..............................................................................39
2
I n f o r m a t i o n
Low VCC Write Inhibit ................................................................................ 39
Write Pulse “Glitch” Protection ............................................................... 39
Logical Inhibit ................................................................................................... 39
Power-Up Write Inhibit ............................................................................... 39
Common Flash Memory Interface (CFI) ............ 40
Table 9. CFI Query Identification String ................................ 40
Table 10. System Interface String ........................................ 41
Table 11. Device Geometry Definition ................................... 41
Table 12. Primary Vendor-Specific Extended Query ................ 42
Command Definitions .............................................44
Reading Array Data ...........................................................................................44
Reset Command .................................................................................................44
Autoselect Command Sequence .................................................................... 45
Enter SecSi™ Sector/Exit SecSi Sector Command Sequence ................ 45
Word Program Command Sequence ........................................................... 45
Unlock Bypass Command Sequence ........................................................46
Figure 4. Program Operation ............................................... 47
Chip Erase Command Sequence ................................................................... 47
Sector Erase Command Sequence ................................................................48
Figure 5. Erase Operation ................................................... 49
Erase Suspend/Erase Resume Commands ..................................................49
Command Definitions Tables .........................................................................50
Table 13. Memory Array Command Definitions ...................... 50
Table 14. Sector Protection Command Definitions .................. 51
Write Operation Status ........................................ 52
DQ7: Data# Polling ............................................................................................ 52
Figure 6. Data# Polling Algorithm ........................................ 54
RY/BY#: Ready/Busy# ........................................................................................55
DQ6: Toggle Bit I ............................................................................................... 55
Figure 7. Toggle Bit Algorithm ............................................. 56
DQ2: Toggle Bit II .............................................................................................. 56
Reading Toggle Bits DQ6/DQ2 ..................................................................... 56
DQ5: Exceeded Timing Limits ........................................................................ 57
DQ3: Sector Erase Timer ................................................................................ 57
Table 15. Write Operation Status ......................................... 58
Absolute Maximum Ratings ...................................59
Figure 8. Maximum Overshoot Waveforms ............................ 59
Operating Ranges ................................................... 60
Industrial (I) Devices ..........................................................................................60
Wireless Devices ................................................................................................60
Supply Voltages ...................................................................................................60
DC Characteristics .................................................. 61
Table 16. CMOS Compatible ................................................ 61
AC Characteristic ....................................................62
Test Conditions .................................................................................................. 62
Figure 9. Test Setups ........................................................ 62
Table 17. Test Specifications ............................................... 62
SWITCHING WAVEFORMS ......................................................................... 63
Table 18. KEY TO SWITCHING WAVEFORMS .......................... 63
Figure 10. Input Waveforms and Measurement Levels ............ 63
VCC RampRate ................................................................................................... 63
Read Operations .................................................................................................64
Table 19. Read-Only Operations .......................................... 64
Figure 11. Read Operation Timings ...................................... 64
Figure 12. Page Read Operation Timings............................... 65
Reset ....................................................................................................................... 65
Table 20. Hardware Reset (RESET#) .................................... 65
Figure 13. Reset Timings .................................................... 66
Erase/Program Operations .............................................................................. 67
Table 21. Erase and Program Operations .............................. 67
Timing Diagrams .................................................................................................68
Figure 14. Program Operation Timings .................................
Figure 15. Accelerated Program Timing Diagram....................
Figure 16. Chip/Sector Erase Operation Timings ....................
Figure 17. Back-to-back Read/Write Cycle Timings.................
Figure 18. Data# Polling Timings (During Embedded
Algorithms).......................................................................
Figure 19. Toggle Bit Timings (During Embedded
Algorithms).......................................................................
Figure 20. DQ2 vs. DQ6 .....................................................
68
68
69
69
70
70
71
27631A5 September 28, 2004
A d v a n c e
I n f o r m a t i o n
Protect/Unprotect .................................................. 71
Table 22. Temporary Sector Unprotect ................................. 71
Figure 21. Temporary Sector Unprotect Timing Diagram.......... 71
Figure 22. Sector/Sector Block Protect and Unprotect
Timing Diagram ................................................................. 72
Controlled Erase Operations ..........................................................................73
Table 23. Alternate CE# Controlled Erase and Program
Operations ....................................................................... 73
Table 24. Alternate CE# Controlled Write (Erase/Program) Operation Timings ..................................................................... 74
Table 25. Erase And Programming Performance .................... 75
BGA Pin Capacitance ............................................ 75
S29GLxxxN MirrorBit
TM
Flash Family ........... 77
General Description ................................................78
Product Selector Guide ..........................................80
Block Diagram ........................................................ 81
Pin Description ....................................................... 82
Logic Symbol .......................................................... 83
S29GL512N ........................................................................................................83
S29GL256N .......................................................................................................83
S29GL128N .......................................................................................................83
Device Bus Operations ........................................... 84
Table 1. Device Bus Operations ........................................... 84
VersatileIOTM (VIO) Control ............................................................................ 84
Requirements for Reading Array Data ........................................................ 84
Page Mode Read ............................................................................................. 85
Writing Commands/Command Sequences ................................................ 85
Write Buffer .................................................................................................... 85
Accelerated Program Operation .............................................................. 85
Autoselect Functions .................................................................................... 86
Standby Mode ...................................................................................................... 86
Automatic Sleep Mode ..................................................................................... 86
RESET#: Hardware Reset Pin ........................................................................ 86
Output Disable Mode ....................................................................................... 87
Table 2. Sector Address Table–S29GL512N ........................... 87
Table 3. Sector Address Table–S29GL256N ..........................102
Table 4. Sector Address Table–S29GL128N ..........................109
Autoselect Mode ................................................................................................ 113
Table 5. Autoselect Codes, (High Voltage Method) ...............114
Sector Protection ............................................................................................... 114
Persistent Sector Protection ...................................................................... 114
Password Sector Protection ....................................................................... 114
WP# Hardware Protection ........................................................................ 114
Selecting a Sector Protection Mode ........................................................ 114
Advanced Sector Protection .......................................................................... 115
Lock Register ....................................................................................................... 115
Table 6. Lock Register .......................................................116
Table 11. Primary Vendor-Specific Extended Query ............... 126
Command Definitions .......................................... 126
Reading Array Data ..........................................................................................127
Reset Command ................................................................................................127
Autoselect Command Sequence ...................................................................127
Enter Secured Silicon Sector/Exit Secured Silicon
Sector Command Sequence ...........................................................................128
Word Program Command Sequence ..........................................................128
Unlock Bypass Command Sequence .......................................................129
Write Buffer Programming .........................................................................129
Accelerated Program ...................................................................................130
Figure 1. Write Buffer Programming Operation .................... 131
Figure 2. Program Operation ............................................. 132
Program Suspend/Program Resume Command Sequence ...................132
Figure 3. Program Suspend/Program Resume...................... 133
Chip Erase Command Sequence .................................................................. 133
Sector Erase Command Sequence ...............................................................134
Figure 4. Erase Operation ................................................. 135
Erase Suspend/Erase Resume Commands ................................................. 135
Lock Register Command Set Definitions ...................................................136
Password Protection Command Set Definitions .....................................136
Non-Volatile Sector Protection Command Set Definitions .................138
Global Volatile Sector Protection Freeze Command Set .....................138
Volatile Sector Protection Command Set .................................................139
Secured Silicon Sector Entry Command ....................................................140
Secured Silicon Sector Exit Command .......................................................140
Command Definitions ....................................................................................... 141
Table 12. S29GL512N, S29GL256N, S29GL128N
Command Definitions, x16 ................................................ 141
Write Operation Status ..................................................................................144
DQ7: Data# Polling ...........................................................................................144
Figure 5. Data# Polling Algorithm ...................................... 145
RY/BY#: Ready/Busy# ......................................................................................145
DQ6: Toggle Bit I ..............................................................................................146
Figure 6. Toggle Bit Algorithm ........................................... 147
DQ2: Toggle Bit II .............................................................................................147
Reading Toggle Bits DQ6/DQ2 ....................................................................148
DQ5: Exceeded Timing Limits .......................................................................148
DQ3: Sector Erase Timer ...............................................................................148
DQ1: Write-to-Buffer Abort ..........................................................................149
Table 13. Write Operation Status ....................................... 149
Absolute Maximum Ratings ................................ 150
Figure 7. Maximum Negative Overshoot Waveform .............. 150
Figure 8. Maximum Positive Overshoot Waveform................ 150
Operating Ranges ................................................. 150
DC Characteristics ................................................. 151
Test Conditions ......................................................152
Figure 9. Test Setup ........................................................ 152
Table 14. Test Specifications ............................................. 152
Persistent Sector Protection .......................................................................... 116
Dynamic Protection Bit (DYB) .................................................................. 116
Persistent Protection Bit (PPB) ................................................................. 117
Persistent Protection Bit Lock (PPB Lock Bit) ..................................... 117
Key to Switching Waveforms .............................. 152
Persistent Protection Mode Lock Bit ..........................................................118
Password Sector Protection ........................................................................... 119
Password and Password Protection Mode Lock Bit ............................... 119
64-bit Password .................................................................................................120
Persistent Protection Bit Lock (PPB Lock Bit) .........................................120
Secured Silicon Sector Flash Memory Region ..........................................120
Write Protect (WP#) ...................................................................................... 122
Hardware Data Protection ............................................................................ 122
Low VCC Write Inhibit .............................................................................. 122
Write Pulse “Glitch” Protection .............................................................. 122
Logical Inhibit ................................................................................................. 122
Power-Up Write Inhibit .............................................................................. 122
Figure 11. Read Operation Timings .................................... 154
Figure 12. Page Read Timings ........................................... 154
Table 7. Sector Protection Schemes ....................................118
Common Flash Memory Interface (CFI) ............ 122
Table 8. CFI Query Identification String............................... 123
Table 9. System Interface String ........................................ 124
Table 10. Device Geometry Definition ................................. 125
September 28, 2004 27631A5
Figure 10. Input Waveforms and Measurement Levels .......... 152
AC Characteristics .................................................153
Read-Only Operations–S29GL128N, S29GL256N, S29GL512N .......... 153
Hardware Reset (RESET#) ............................................................................. 155
Figure 13. Reset Timings .................................................. 155
Erase and Program Operations–S29GL128N, S29GL256N,
S29GL512N ..........................................................................................................156
Figure 14. Program Operation Timings ...............................
Figure 15. Accelerated Program Timing Diagram..................
Figure 16. Chip/Sector Erase Operation Timings ..................
Figure 17. Data# Polling Timings (During Embedded
Algorithms).....................................................................
Figure 18. Toggle Bit Timings (During Embedded Algorithms)
Figure 19. DQ2 vs. DQ6 ...................................................
157
157
158
159
160
160
Alternate CE# Controlled Erase and Program OperationsS29GL128N, S29GL256N, S29GL512N .........................................................161
3
A d v a n c e
Figure 20. Alternate CE# Controlled Write (Erase/
Program) Operation Timings .............................................. 162
Erase And Programming Performance .............. 163
TSOP Pin and BGA Package Capacitance ......... 163
pSRAM Type 2 ................................................164
Features ................................................................ 164
Product Information ............................................ 164
Pin Description ..................................................... 164
Power Up Sequence ............................................. 165
Timing Diagrams ...................................................166
Power Up ............................................................................................................ 166
Figure 21. Power Up 1 (CS1# Controlled) ............................ 166
Figure 22. Power Up 2 (CS2 Controlled) .............................. 166
Functional Description ........................................ 166
Absolute Maximum Ratings ................................. 167
DC Recommended Operating Conditions ......... 167
Capacitance (Ta = 25°C, f = 1 MHz) .................... 167
DC and Operating Characteristics ..................... 167
Common .............................................................................................................. 167
16M pSRAM .........................................................................................................168
32M pSRAM ........................................................................................................168
64M pSRAM ........................................................................................................ 169
AC Operating Conditions ................................... 169
Test Conditions (Test Load and Test Input/Output Reference) ....... 169
Figure 23. Output Load ..................................................... 169
Figure 29. Timing Waveform of Write Cycle(3)
(CS2 Controlled) ............................................................. 173
Figure 30. Timing Waveform of Write Cycle(4) (UB#, LB#
Controlled) ..................................................................... 173
pSRAM Type 6 ................................................174
Features .................................................................
Pin Description .....................................................
Functional Description .........................................
Absolute Maximum Ratings ................................
DC Recommended Operating Conditions
(Ta = -40°C to 85°C) .............................................
DC Characteristics (Ta = -40°C to 85°C,
VDD = 2.6 to 3.3 V) (See Note 3 to 4) ................
Capacitance (Ta = 25°C, f = 1 MHz) ....................
AC Characteristics and Operating
Conditions .............................................................
174
174
175
175
175
176
176
176
(Ta = -40°C to 85°C, VDD = 2.6 to 3.3 V) (See Note 5 to 11) ............176
AC Test Conditions .............................................. 177
Timing Diagrams ................................................... 178
Read Timings .......................................................................................................178
Figure 1. Read Cycle ........................................................ 178
Figure 2. Page Read Cycle (8 Words Access) ....................... 179
Write Timings .................................................................................................... 180
Figure 3. Write Cycle #1 (WE# Controlled) (See Note 8) ...... 180
Figure 4. Write Cycle #2 (CE# Controlled) (See Note 8) ....... 181
ACC Characteristics (Ta = -40°C to 85°C, VCC = 2.7 to 3.1 V) ........ 170
Deep Power-down Timing ..............................................................................181
Read Timings ....................................................................................................... 171
Power-on Timing ................................................................................................181
Timing Diagrams ....................................................171
Figure 24. Timing Waveform of Read Cycle(1)...................... 171
Figure 25. Timing Waveform of Read Cycle(2)...................... 171
Figure 26. Timing Waveform of Read Cycle(2)...................... 171
Write Timings .................................................................................................... 172
Figure 27. Write Cycle #1 (WE# Controlled) ........................ 172
Figure 28. Write Cycle #2 (CS1# Controlled) ....................... 172
4
I n f o r m a t i o n
Figure 5. Deep Power Down Timing.................................... 181
Figure 6. Power-on Timing ................................................ 181
Provisions of Address Skew ...........................................................................182
Read ...................................................................................................................182
Figure 7. Read ................................................................ 182
Write .................................................................................................................182
Figure 8. Write ................................................................ 182
Revision Summary .........................................183
27631A5 September 28, 2004
P r e l i m i a r y
Product Selector Guide
Device-Model#
PL127J
Access
Times (ns)
S75PL127JBD-KU
S75PL127JBD-KB
S75PL127JCD-KU
65
S75PL127JCE-KU
65
S75PL127JCF-KU
S75PL127JCF-KB
January 6, 2005 S75PL127J_00_A1_E
70
Type 6
(110ns)
9x12 mm 84-ball FBGA
Type 2
256 Mb
Type 6
(110ns)
9x12 mm 84-ball FBGA
Type 2
Type 6
32 Mb
65
128 Mb
Type 6
64 Mb
S75PL127JBF-KU
Type 2
Type 2
32 Mb
S75PL127JCE-KB
S75PL127JBF-KB
70
64 Mb
S75PL127JBE-KU
Package
Type 6
32 Mb
S75PL127JCD-KB
S75PL127JBE-KB
pSRAM
Data
pSRAM
Access
Storage
density Time (ns) Supplier Density
70
64 Mb
S75PL127J MCPs
Type 2
512 Mb
Type 6
(110ns)
9x12 mm 84-ball FBGA
Type 2
5
A d v a n c e
I n f o r m a t i o n
MCP Block Diagram
VCCf
Flash-Only Address
Amax*-A22
VCCf
16
23
Shared Address
DQ15 to DQ0
WP#ACC
WP#
F1-CE# (See Note)
CE#
OE#
OE#
WE#
WE#
F-RST#
DQ15 to DQ0
S29PL127J
S29GL-N
RY/BY#
RDY
RESET#
VSS
VSS
F2-CW# (See Note)
R-VCC
VCC
VCCO
16
23
DQ15 to DQ0
R-CE#
CE#
WE#
OE#
R-UB#
UB#
R-LB#
LB#
(Note 1) R-CE2
pSRAM
VSSQ
VSS
Note:
F1-CE# and F2-CE# are the chip-enable pins for the PL and GL Flash devices, respectively.
Amax -A24 for GL512, A23 for GL256N, A22 for GL128 and PL127J. Flash-only addressess
may be shared between PL and GL, but is not shared with pSRAM. For more details, refer
to the table following the connection diagram.
6
S75PL127J MCPs
S75PL127J_00_A1_E January 6, 2005
P r e l i m i a r y
Connection Diagram
Legend:
Top View
A1
A2
DNU
DNU
B2
B3
B4
B5
B6
B7
B8
B9
RFU
VSS
RFU
RFU
F-VCC
RFU
RFU
RFU
C2
C3
C4
C5
C6
C7
C8
C9
RFU
A7
WE#
A8
A11
F2-CE#
D2
D3
D4
D5
D6
D7
D8
D9
A3
A6
R-UB#
F-RST#
R-CE2
A19
A12
A15
R-LB# F1-WP/ACC
All Shared
GL (Data) only
pSRAM only
Reserved for Future Use
E2
E3
E4
E5
E6
E7
E8
E9
A2
A5
A18
RY/BY#
A20
A9
A13
A21
F2
F3
F4
F5
F6
F7
F8
F9
A1
A4
A17
RFU
A23
A10
A14
A22
G2
G3
G4
G5
G6
G7
G8
G9
A0
VSS
DQ1
RFU
RFU
DQ6
A24
A16
H2
H3
H4
H5
H6
H7
H8
H9
F1-CE#
OE#
DQ9
DQ3
DQ4
DQ13
DQ15
RFU
J2
J3
J4
J5
J6
J7
J8
J9
R-CE1#
DQ0
DQ10
F-VCC
R-VCC
DQ12
DQ7
VSS
K2
K4
K4
K5
K6
K7
K8
K9
RFU
DQ8
DQ2
DQ11
RFU
DQ5
L2
L3
L4
L5
L6
L7
L8
L9
RFU
RFU
VSS
F-VCC
RFU
RFU
RFU
RFU
PL (Code) Only
PL and GL Shared
Shared (See Table Below)
DQ14 F2-WP#/ACC
DNU
DNU
Note:
Connect 2-WP#/ ACC (K9) to Flash Vcc.
MCP
GL-Only Addresses PL-GL Shared Addresses
PL, GL, and pSRAM
Shared Addresses
S75PL127JBD
-
A22–A21
A20–A0
S75PL127JCD
-
A22
A21–A0
S75PL127JBE
A23
A22–A21
A20–A0
S75PL127JCE
A23
A22
A21–A0
S75PL127JBF
A24-A23
A22–A21
A20–A0
S75PL127JCF
A24-A23
A22
A21–A0
January 6, 2005 S75PL127J_00_A1_E
S75PL127J MCPs
7
A d v a n c e
I n f o r m a t i o n
Pin Description
Amax–A0
=
Address Inputs
DQ15–DQ0
= 16 Data Inputs/Outputs (Common)
F1-CE#
= Chip Enable for PL
F2-CE
= Chip Enable for GL
=
R-CE#1
= Chip Enable 1 (pSRAM)
R-CE#2
= Chip Enable 2 (pSRAM)
OE#
= Output Enable (Common)
WE#
= Write Enable (Common)
RY/BY#
= Ready/Busy Output (Flash)
R-UB#
R-LB#
= Lower Byte Control (pSRAM)
F-RST#
= Hardware Reset Pin (Flash)
F1-WP#/ACC
8
= Upper Byte Control (pSRAM)
= Hardware Write Protect /Acceleration Pin (PL)
Hardware Write Protect/Acceleration Pin (GL) Should be tied to Vcc
F-VCC
= Flash 3.0 volt-only single power supply
R-VCCs
= pSRAM Power Supply
VSS
= Device Ground (Common)
DNU
= Do Not Use
S75PL127J MCPs
S75PL127J_00_A1_E January 6, 2005
P r e l i m i a r y
Ordering Information
S75PL
127
J
C
D
BA
W
K
Z
0
PACKING TYPE
0
= Tray
2
= 7” Tape and Reel
3
= 13” Tape and Reel
SUPPPLIER; SPEED COMBINATION
B
= pSRAM2, 70 ns
U
= pSRAM6, 70 ns
PACKAGE HEIGHT; DATA TYPE; PSRAM SPEED
K
= 1.4 mm, GL as data; 70 ns
TEMPERATURE RANGE
W
= Wireless (-25°C to +85°C)
PACKAGE TYPE
BA
= Very Thin Fine-Pitch BGA Lead (Pb)-free compliant package
BF
= Very Thin Fine-Pitch BGA Lead (Pb)-free package
GL DATA Flash Density
D
= 128 Mb
E
= 256 Mb
F
= 512 Mb
pSRAM Density
B
= 32 Mb
C
= 64 Mb
PROCESS TECHNOLOGY
J
= 110 nm, Floating Gate
PL CODE FLASH DENSITY
127 = 128 Mb
PRODUCT FAMILY
S75PL = Multi-Chip Product (MCP)
3.0 V Simultaneous Read/Write Page Mode
CODE Flash + pSRAM + 3.0V DATA Flash
January 6, 2005 S75PL127J_00_A1_E
S75PL127J MCPs
9
A d v a n c e
I n f o r m a t i o n
Valid Combinations
Data: S29GL128N
Package
Package
Base Ordering
&
Modifier/
Part Number Temperature Model Number
S75PL127JBD
S75PL127JBD
S75PL127JCD
BAW
KU
Type 6 / 70
KB
Type 2 / 70
KU
Type 6/ 70
S75PL127JCD
KB
S75PL127JBD
KU
S75PL127JBD
S75PL127JCD
BFW
S75PL127JCD
Packing
Type
PL127J
Speed
Options pSRAM Supplier/ Package
Access Time (ns) Marking
(ns)
0, 2, 3,
(Note 1)
65
Type 2 / 70
Type 6 / 70
KB
Type 2 / 70
KU
Type 6 / 70
KB
Type 2 / 70
(Note 2)
Notes:
1. Type 0 is standard. Specify other options as required.
2. BGA package marking omits leading S and packing type designator from ordering part number.
Valid Combinations
Valid Combinations list configurations planned to be supported in volume for this device.
Consult your local sales office to confirm availability of specific valid combinations and to
check on newly released combinations.
Data: S29GL256N
Package
Package
Base Ordering
&
Modifier/
Part Number Temperature Model Number
S75PL127JBE
S75PL127JBE
S75PL127JCE
BAW
KU
Type 6 / 70
KB
Type 2 / 70
KU
Type 6 / 70
S75PL127JCE
KB
S75PL127JBE
KU
S75PL127JBE
S75PL127JCE
S75PL127JCE
BFW
PL127J
Speed
Packing Options pSRAM Supplier/ Package
Type
Access Time (ns) Marking
(ns)
0, 2, 3,
(Note 1)
65
Type 2 / 70
Type 6 / 70
KB
Type 2 / 70
KU
Type 6 / 70
KB
Type 2 / 70
(Note 2)
Notes:
1. Type 0 is standard. Specify other options as required.
2. BGA package marking omits leading S and packing type designator from ordering part number.
Valid Combinations
Valid Combinations list configurations planned to be supported in volume for this device.
Consult your local sales office to confirm availability of specific valid combinations and to
check on newly released combinations.
10
S75PL127J MCPs
S75PL127J_00_A1_E January 6, 2005
P r e l i m i a r y
Data: S29GL512N
Package
Package
Base Ordering
Packing
&
Modifier/
Part Number Temperature Model Number
Type
S75PL127JBF
S75PL127JBF
S75PL127JCF
BAW
KU
Type 6 / 70
KB
Type 2 / 70
KU
Type 6 / 70
S75PL127JCF
KB
S75PL127JBF
KU
S75PL127JBF
S75PL127JCF
S75PL127JCF
BFW
PL127J
Speed
Options pSRAM Supplier/ Package
Access Time (ns) Marking
(ns)
0, 2, 3,
(Note 1)
65
Type 2 / 70
Type 6 / 70
KB
Type 2 / 70
KU
Type 6 / 70
KB
Type 2 / 70
(Note 2)
Notes:
1. Type 0 is standard. Specify other options as required.
2. BGA package marking omits leading S and packing type designator from ordering part number.
Valid Combinations
Valid Combinations list configurations planned to be supported in volume for this device.
Consult your local sales office to confirm availability of specific valid combinations and to
check on newly released combinations.
January 6, 2005 S75PL127J_00_A1_E
S75PL127J MCPs
11
S29PL127J/S29PL064J/S29PL032J for MCP
128/64/32 Megabit (8/4/2 M x 16-Bit)
CMOS 3.0 Volt-only, Simultaneous Read/Write
Flash Memory with Enhanced VersatileIOTM Control
PRELIMINARY
Distinctive Characteristics
ARCHITECTURAL ADVANTAGES
„
„
„
„
„
128/64/32 Mbit Page Mode devices
— Page size of 8 words: Fast page read access from
random locations within the page
— Up to 64 factory-locked words
Single power supply operation
— Full Voltage range: 2.7 to 3.1 volt read, erase, and
program operations for battery-powered applications
Simultaneous Read/Write Operation
— Data can be continuously read from one bank while
executing erase/program functions in another bank
— Zero latency switching from write to read operations
FlexBank Architecture (PL127J/PL064J/PL032J)
— 4 separate banks, with up to two simultaneous
operations per device
— Bank A:
PL127J -16 Mbit (4 Kw x 8 and 32 Kw x 31)
PL064J - 8 Mbit (4 Kw x 8 and 32 Kw x 15)
PL032J - 4 Mbit (4 Kw x 8 and 32 Kw x 7)
— Up to 64 customer-lockable words
„
Both top and bottom boot blocks in one device
„
Manufactured on 110 nm process technology
„
Data Retention: 20 years typical
„
Cycling Endurance: 1 million cycles per sector
typical
PERFORMANCE CHARACTERISTICS
— Bank B:
PL127J - 48 Mbit (32 Kw x 96)
PL064J - 24 Mbit (32 Kw x 48)
PL032J - 12 Mbit (32 Kw x 24)
„
High Performance
— Page access times as fast as 20 ns
— Random access times as fast as 55 ns
„
Power consumption (typical values at 10 MHz)
— 45 mA active read current
— 17 mA program/erase current
— 0.2 µA typical standby mode current
SOFTWARE FEATURES
— Bank C:
PL127J - 48 Mbit (32 Kw x 96)
PL064J - 24 Mbit (32 Kw x 48)
PL032J - 12 Mbit (32 Kw x 24)
„
SecSiTM (Secured Silicon) Sector region
— Up to 128 words accessible through a command
sequence
„
— Bank D:
PL127J -16 Mbit (4 Kw x 8 and 32 Kw x 31)
PL064J - 8 Mbit (4 Kw x 8 and 32 Kw x 15)
PL032J - 4 Mbit (4 Kw x 8 and 32 Kw x 7)
Software command-set compatible with JEDEC
42.4 standard
— Backward compatible with Am29F, Am29LV,
Am29DL, and AM29PDL families and MBM29QM/RM,
MBM29LV, MBM29DL, MBM29PDL families
„
Enhanced VersatileI/OTM (VIO) Control
— Output voltage generated and input voltages
tolerated on all control inputs and I/Os is determined
by the voltage on the VIO pin
CFI (Common Flash Interface) compliant
— Provides device-specific information to the system,
allowing host software to easily reconfigure for
different Flash devices
„
Erase Suspend / Erase Resume
— Suspends an erase operation to allow read or
program operations in other sectors of same bank
„
Unlock Bypass Program command
— Reduces overall programming time when issuing
multiple program command sequences
— VIO options at 1.8 V and 3 V I/O for PL127J devices
— 3V VIO for PL064J and PL032J devices
Publication Number S29PL127J_064J_032J_MCP
Revision A
Amendment 3
Issue Date August 12, 2004
P r e l i m i n a r y
HARDWARE FEATURES
„
Ready/Busy# pin (RY/BY#)
— Provides a hardware method of detecting program or
erase cycle completion
„
Hardware reset pin (RESET#)
— Hardware method to reset the device to reading
array data
„
WP#/ ACC (Write Protect/Acceleration) input
— At VIL, hardware level protection for the first and
last two 4K word sectors.
— At VIH, allows removal of sector protection
— At VHH, provides accelerated programming in a
factory setting
„
14
Persistent Sector Protection
— A command sector protection method to lock
combinations of individual sectors and sector groups
to prevent program or erase operations within that
sector
— Sectors can be locked and unlocked in-system at VCC
level
„
Password Sector Protection
— A sophisticated sector protection method to lock
combinations of individual sectors and sector groups
to prevent program or erase operations within that
sector using a user-defined 64-bit password
„
Package options
— Standard discrete pinouts
11 x 8 mm, 80-ball Fine-pitch BGA (PL127J)
(VBG080)
8 x 6 mm, 48-ball Fine pitch BGA (PL064J/PL032J)
(VBK048)
— MCP-compatible pinout
8 x 11.6 mm, 64-ball Fine-pitch BGA (PL127J) 7 x 9
mm, 56-ball Fine-pitch BGA (PL064J and PL032J)
Compatible with MCP pinout, allowing easy
integration of RAM into existing designs
S29PL127J/S29PL064J/S29PL032J for MCP
S29PL127J_064J_032J_MCP_00_A3 August 12, 2004
P r e l i m i n a r y
General Description
The PL127J/PL064J/PL032J is a 128/128/64/32 Mbit, 3.0 volt-only Page Mode
and Simultaneous Read/Write Flash memory device organized as 8/8/4/2
Mwords. The devices are offered in the following packages:
„ 11mm x 8mm, 64-ball Fine-pitch BGA standalone (all)
„ 9mm x 8mm, 80-ball Fine-pitch BGA standalone (PL127J)
„ 8mm x 11.6mm, 64-ball Fine pitch BGA multi-chip compatible (PL127J)
The word-wide data (x16) appears on DQ15-DQ0. This device can be programmed in-system or in standard EPROM programmers. A 12.0 V VPP is not
required for write or erase operations.
The device offers fast page access times of 20 to 30 ns, with corresponding random access times of 55 to 70 ns, respectively, allowing high speed
microprocessors to operate without wait states. To eliminate bus contention the
device has separate chip enable (CE#), write enable (WE#) and output enable
(OE#) controls.
Simultaneous Read/Write Operation with Zero Latency
The Simultaneous Read/Write architecture provides simultaneous operation
by dividing the memory space into 4 banks, which can be considered to be four
separate memory arrays as far as certain operations are concerned. The device
can improve overall system performance by allowing a host system to program
or erase in one bank, then immediately and simultaneously read from another
bank with zero latency (with two simultaneous operations operating at any one
time). This releases the system from waiting for the completion of a program or
erase operation, greatly improving system performance.
The device can be organized in both top and bottom sector configurations. The
banks are organized as follows:
Bank
PL127J Sectors
A
16 Mbit (4 Kw x 8 and 32 Kw x 31)
B
48 Mbit (32 Kw x 96)
C
48 Mbit (32 Kw x 96)
D
16 Mbit (4 Kw x 8 and 32 Kw x 31)
Page Mode Features
The page size is 8 words. After initial page access is accomplished, the page mode
operation provides fast read access speed of random locations within that page.
Standard Flash Memory Features
The device requires a single 3.0 volt power supply (2.7 V to 3.6 V) for both
read and write functions. Internally generated and regulated voltages are provided for the program and erase operations.
The device is entirely command set compatible with the JEDEC 42.4 singlepower-supply Flash standard. Commands are written to the command register using standard microprocessor write timing. Register contents serve as inputs
to an internal state-machine that controls the erase and programming circuitry.
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
S29PL127J/S29PL064J/S29PL032J for MCP
15
P r e l i m i n a r y
Write cycles also internally latch addresses and data needed for the programming
and erase operations. Reading data out of the device is similar to reading from
other Flash or EPROM devices.
Device programming occurs by executing the program command sequence. The
Unlock Bypass mode facilitates faster programming times by requiring only two
write cycles to program data instead of four. Device erasure occurs by executing
the erase command sequence.
The host system can detect whether a program or erase operation is complete by
reading the DQ7 (Data# Polling) and DQ6 (toggle) status bits. After a program
or erase cycle has been completed, the device is ready to read array data or accept another command.
The sector erase architecture allows memory sectors to be erased and reprogrammed without affecting the data contents of other sectors. The device is fully
erased when shipped from the factory.
Hardware data protection measures include a low VCC detector that automatically inhibits write operations during power transitions. The hardware sector
protection feature disables both program and erase operations in any combination of sectors of memory. This can be achieved in-system or via programming
equipment.
The Erase Suspend/Erase Resume feature enables the user to put erase on
hold for any period of time to read data from, or program data to, any sector that
is not selected for erasure. True background erase can thus be achieved. If a read
is needed from the SecSi Sector area (One Time Program area) after an erase
suspend, then the user must use the proper command sequence to enter and exit
this region.
The device offers two power-saving features. When addresses have been stable
for a specified amount of time, the device enters the automatic sleep mode.
The system can also place the device into the standby mode. Power consumption
is greatly reduced in both these modes.
The device electrically erases all bits within a sector simultaneously via FowlerNordheim tunneling. The data is programmed using hot electron injection.
16
S29PL127J/S29PL064J/S29PL032J for MCP
S29PL127J_064J_032J_MCP_00_A3 August 12, 2004
P r e l i m i n a r y
Pin Description
Amax–A0
DQ15–DQ0
CE#
OE#
WE#
VSS
NC
RY/BY#
=
=
=
=
=
=
=
=
WP#/ACC
=
VIO
=
VCC
=
RESET#
CE#1
=
=
Address bus
16-bit data inputs/outputs/float
Chip Enable Inputs
Output Enable Input
Write Enable
Device Ground
Pin Not Connected Internally
Ready/Busy output and open drain.
When RY/BY#= VIH, the device is ready to accept
read operations and commands. When RY/BY#=
VOL, the device is either executing an embedded
algorithm or the device is executing a hardware
reset operation.
Write Protect/Acceleration Input.
When WP#/ACC= VIL, the highest and lowest two
4K-word sectors are write protected regardless of
other sector protection configurations. When WP#/
ACC= VIH, these sector are unprotected unless the
DYB or PPB is programmed. When WP#/ACC= 12V,
program and erase operations are accelerated.
Input/Output Buffer Power Supply
(1.65 V to 1.95 V (for PL127J) or 2.7 V to 3.6 V (for
all PLxxxJ devices)
Chip Power Supply
(2.7 V to 3.6 V or 2.7 to 3.3 V)
Hardware Reset Pin
Chip Enable Inputs
Notes:
1. Amax = A22 (PL127J), A21 (PL064J), A20 (PL032J)
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
S29PL127J/S29PL064J/S29PL032J for MCP
17
P r e l i m i n a r y
Device Bus Operations
This section describes the requirements and use of the device bus operations,
which are initiated through the internal command register. The command register
itself does not occupy any addressable memory location. The register is a latch
used to store the commands, along with the address and data information
needed to execute the command. The contents of the register serve as inputs to
the internal state machine. The state machine outputs dictate the function of the
device. Table 1 lists the device bus operations, the inputs and control levels they
require, and the resulting output. The following subsections describe each of
these operations in further detail.
Table 1. PL127J Device Bus Operations
CE#
OE#
WE#
RESET#
WP#/ACC
Addresses
(Amax–A0)
DQ15–
DQ0
Read
L
L
H
H
X
AIN
DOUT
Write
L
H
L
H
X (Note 2)
AIN
DIN
VIO±
0.3 V
X
X
VIO ±
0.3 V
X (Note 2)
X
High-Z
Output Disable
L
H
H
H
X
X
High-Z
Reset
X
X
X
L
X
X
High-Z
Temporary Sector Unprotect (High Voltage)
X
X
X
VID
X
AIN
DIN
Operation
Standby
Legend: L= Logic Low = VIL, H = Logic High = VIH,
VID = 11.5-12.5 V, VHH = 8.5-9.5 V, X = Don’t Care,
SA = Sector Address, AIN = Address In, DIN = Data
In, DOUT = Data Out
Notes:
1. The sector protect and sector unprotect functions may also be implemented via programming equipment. See the
High Voltage Sector Protection section.
2. WP#/ACC must be high when writing to upper two and lower two sectors.
Requirements for
Reading Array Data
To read array data from the outputs, the system must drive the OE# and appropriate CE# pins. OE# is the output control and gates array data to the output
pins. WE# should remain at VIH.
The internal state machine is set for reading array data upon device power-up,
or after a hardware reset. This ensures that no spurious alteration of the memory
content occurs during the power transition. No command is necessary in this
mode to obtain array data. Standard microprocessor read cycles that assert valid
addresses on the device address inputs produce valid data on the device data
outputs. Each bank remains enabled for read access until the command register
contents are altered.
Refer to Table 19 for timing specifications and to Figure 11 for the timing diagram.
ICC1 in the DC Characteristics table represents the active current specification for
reading array data.
Random Read (Non-Page Read)
Address access time (tACC) is equal to the delay from stable addresses to valid
output data. The chip enable access time (tCE) is the delay from the stable addresses and stable CE# to valid data at the output inputs. The output enable access time is the delay from the falling edge of the OE# to valid data at the output
inputs (assuming the addresses have been stable for at least tACC–tOE time).
18
S29PL127J/S29PL064J/S29PL032J for MCP
S29PL127J_064J_032J_MCP_00_A3 August 12, 2004
P r e l i m i n a r y
Page Mode Read
The device is capable of fast page mode read and is compatible with the page
mode Mask ROM read operation. This mode provides faster read access speed for
random locations within a page. Address bits Amax–A3 select an 8 word page,
and address bits A2–A0 select a specific word within that page. This is an asynchronous operation with the microprocessor supplying the specific word location.
The random or initial page access is tACC or tCE and subsequent page read accesses (as long as the locations specified by the microprocessor falls within that
page) is equivalent to tPACC. Fast page mode accesses are obtained by keeping
Amax–A3 constant and changing A2–A0 to select the specific word within that
page.
Table 2.
Page Select
Word
A2
A1
A0
Word 0
0
0
0
Word 1
0
0
1
Word 2
0
1
0
Word 3
0
1
1
Word 4
1
0
0
Word 5
1
0
1
Word 6
1
1
0
Word 7
1
1
1
Simultaneous Read/Write Operation
In addition to the conventional features (read, program, erase-suspend read, and
erase-suspend program), the device is capable of reading data from one bank of
memory while a program or erase operation is in progress in another bank of
memory (simultaneous operation). The bank can be selected by bank addresses
(PL127J: A22–A20, L064J: A21–A19, PL032J: A20–A18) with zero latency.
The simultaneous operation can execute multi-function mode in the same bank.
Table 3.
Bank Select
Bank
PL127J: A22–A20
PL064J: A21–A19
PL032J: A20–A18
Bank A
000
Bank B
001, 010, 011
Bank C
100, 101, 110
Bank D
111
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
S29PL127J/S29PL064J/S29PL032J for MCP
19
P r e l i m i n a r y
Writing Commands/Command Sequences
To write a command or command sequence (which includes programming data
to the device and erasing sectors of memory), the system must drive WE# and
CE# to VIL, and OE# to VIH.
The device features an Unlock Bypass mode to facilitate faster programming.
Once a bank enters the Unlock Bypass mode, only two write cycles are required
to program a word, instead of four. The “Word Program Command Sequence”
section has details on programming data to the device using both standard and
Unlock Bypass command sequences.
An erase operation can erase one sector, multiple sectors, or the entire device.
Table 4 indicates the set of address space that each sector occupies. A “bank address” is the set of address bits required to uniquely select a bank. Similarly, a
“sector address” refers to the address bits required to uniquely select a sector.
The “Command Definitions” section has details on erasing a sector or the entire
chip, or suspending/resuming the erase operation.
ICC2 in the DC Characteristics table represents the active current specification for
the write mode. See the timing specification tables and timing diagrams in the
Reset for write operations.
Accelerated Program Operation
The device offers accelerated program operations through the ACC function. This
function is primarily intended to allow faster manufacturing throughput at the
factory.
If the system asserts VHH on this pin, the device automatically enters the aforementioned Unlock Bypass mode, temporarily unprotects any protected sectors,
and uses the higher voltage on the pin to reduce the time required for program
operations. The system would use a two-cycle program command sequence as
required by the Unlock Bypass mode. Removing VHH from the WP#/ACC pin returns the device to normal operation. Note that VHH must not be asserted on
WP#/ACC for operations other than accelerated programming, or device damage
may result. In addition, the WP#/ACC pin should be raised to VCC when not in
use. That is, the WP#/ACC pin should not be left floating or unconnected; inconsistent behavior of the device may result.
Autoselect Functions
If the system writes the autoselect command sequence, the device enters the autoselect mode. The system can then read autoselect codes from the internal
register (which is separate from the memory array) on DQ15–DQ0. Standard
read cycle timings apply in this mode. Refer to the SecSiTM Sector Addresses and
Autoselect Command Sequence for more information.
Standby Mode
When the system is not reading or writing to the device, it can place the device
in the standby mode. In this mode, current consumption is greatly reduced, and
the outputs are placed in the high impedance state, independent of the OE#
input.
The device enters the CMOS standby mode when the CE# and RESET# pins are
both held at VIO ± 0.3 V. (Note that this is a more restricted voltage range than
VIH.) If CE# and RESET# are held at VIH, but not within VIO ± 0.3 V, the device
will be in the standby mode, but the standby current will be greater. The device
20
S29PL127J/S29PL064J/S29PL032J for MCP
S29PL127J_064J_032J_MCP_00_A3 August 12, 2004
P r e l i m i n a r y
requires standard access time (tCE) for read access when the device is in either
of these standby modes, before it is ready to read data.
If the device is deselected during erasure or programming, the device draws active current until the operation is completed.
ICC3 in “DC Characteristics” represents the CMOS standby current specification.
Automatic Sleep Mode
The automatic sleep mode minimizes Flash device energy consumption. The device automatically enables this mode when addresses remain stable for tACC +
30 ns. The automatic sleep mode is independent of the CE#, WE#, and OE# control signals. Standard address access timings provide new data when addresses
are changed. While in sleep mode, output data is latched and always available to
the system. Note that during automatic sleep mode, OE# must be at VIH before
the device reduces current to the stated sleep mode specification. ICC5 in “DC
Characteristics” represents the automatic sleep mode current specification.
RESET#: Hardware Reset Pin
The RESET# pin provides a hardware method of resetting the device to reading
array data. When the RESET# pin is driven low for at least a period of tRP, the
device immediately terminates any operation in progress, tristates all output
pins, and ignores all read/write commands for the duration of the RESET# pulse.
The device also resets the internal state machine to reading array data. The operation that was interrupted should be reinitiated once the device is ready to
accept another command sequence, to ensure data integrity.
Current is reduced for the duration of the RESET# pulse. When RESET# is held
at VSS±0.3 V, the device draws CMOS standby current (ICC4). If RESET# is held
at VIL but not within VSS±0.3 V, the standby current will be greater.
The RESET# pin may be tied to the system reset circuitry. A system reset would
thus also reset the Flash memory, enabling the system to read the boot-up firmware from the Flash memory.
If RESET# is asserted during a program or erase operation, the RY/BY# pin remains a “0” (busy) until the internal reset operation is complete, which requires
a time of tREADY (during Embedded Algorithms). The system can thus monitor RY/
BY# to determine whether the reset operation is complete. If RESET# is asserted
when a program or erase operation is not executing (RY/BY# pin is “1”), the reset
operation is completed within a time of tREADY (not during Embedded Algorithms).
The system can read data tRH after the RESET# pin returns to VIH.
Refer to the AC Characteristic tables for RESET# parameters and to 13 for the
timing diagram.
Output Disable Mode
When the OE# input is at VIH, output from the device is disabled. The output pins
(except for RY/BY#) are placed in the highest Impedance state
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
S29PL127J/S29PL064J/S29PL032J for MCP
21
P r e l i m i n a r y
Table 4. PL127J Sector Architecture
Bank A
Bank
22
Sector
Sector Address (A22-A12)
Sector Size (Kwords)
Address Range (x16)
SA0
00000000000
4
000000h–000FFFh
SA1
00000000001
4
001000h–001FFFh
SA2
00000000010
4
002000h–002FFFh
SA3
00000000011
4
003000h–003FFFh
SA4
00000000100
4
004000h–004FFFh
SA5
00000000101
4
005000h–005FFFh
SA6
00000000110
4
006000h–006FFFh
SA7
00000000111
4
007000h–007FFFh
SA8
00000001XXX
32
008000h–00FFFFh
SA9
00000010XXX
32
010000h–017FFFh
SA10
00000011XXX
32
018000h–01FFFFh
SA11
00000100XXX
32
020000h–027FFFh
SA12
00000101XXX
32
028000h–02FFFFh
SA13
00000110XXX
32
030000h–037FFFh
SA14
00000111XXX
32
038000h–03FFFFh
SA15
00001000XXX
32
040000h–047FFFh
SA16
00001001XXX
32
048000h–04FFFFh
SA17
00001010XXX
32
050000h–057FFFh
SA18
00001011XXX
32
058000h–05FFFFh
SA19
00001100XXX
32
060000h–067FFFh
SA20
00001101XXX
32
068000h–06FFFFh
SA21
00001110XXX
32
070000h–077FFFh
SA22
00001111XXX
32
078000h–07FFFFh
SA23
00010000XXX
32
080000h–087FFFh
SA24
00010001XXX
32
088000h–08FFFFh
SA25
00010010XXX
32
090000h–097FFFh
SA26
00010011XXX
32
098000h–09FFFFh
SA27
00010100XXX
32
0A0000h–0A7FFFh
SA28
00010101XXX
32
0A8000h–0AFFFFh
SA29
00010110XXX
32
0B0000h–0B7FFFh
SA30
00010111XXX
32
0B8000h–0BFFFFh
SA31
00011000XXX
32
0C0000h–0C7FFFh
SA32
00011001XXX
32
0C8000h–0CFFFFh
SA33
00011010XXX
32
0D0000h–0D7FFFh
SA34
00011011XXX
32
0D8000h–0DFFFFh
SA35
00011100XXX
32
0E0000h–0E7FFFh
SA36
00011101XXX
32
0E8000h–0EFFFFh
SA37
00011110XXX
32
0F0000h–0F7FFFh
SA38
00011111XXX
32
0F8000h–0FFFFFh
S29PL127J/S29PL064J/S29PL032J for MCP
S29PL127J_064J_032J_MCP_00_A3 August 12, 2004
P r e l i m i n a r y
Table 4.
Bank B
Bank
PL127J Sector Architecture (Continued)
Sector
Sector Address (A22-A12)
Sector Size (Kwords)
Address Range (x16)
SA39
00100000XXX
32
100000h–107FFFh
SA40
00100001XXX
32
108000h–10FFFFh
SA41
00100010XXX
32
110000h–117FFFh
SA42
00100011XXX
32
118000h–11FFFFh
SA43
00100100XXX
32
120000h–127FFFh
SA44
00100101XXX
32
128000h–12FFFFh
SA45
00100110XXX
32
130000h–137FFFh
SA46
00100111XXX
32
138000h–13FFFFh
SA47
00101000XXX
32
140000h–147FFFh
SA48
00101001XXX
32
148000h–14FFFFh
SA49
00101010XXX
32
150000h–157FFFh
SA50
00101011XXX
32
158000h–15FFFFh
SA51
00101100XXX
32
160000h–167FFFh
SA52
00101101XXX
32
168000h–16FFFFh
SA53
00101110XXX
32
170000h–177FFFh
SA54
00101111XXX
32
178000h–17FFFFh
SA55
00110000XXX
32
180000h–187FFFh
SA56
00110001XXX
32
188000h–18FFFFh
SA57
00110010XXX
32
190000h–197FFFh
SA58
00110011XXX
32
198000h–19FFFFh
SA59
00110100XXX
32
1A0000h–1A7FFFh
SA60
00110101XXX
32
1A8000h–1AFFFFh
SA61
00110110XXX
32
1B0000h–1B7FFFh
SA62
00110111XXX
32
1B8000h–1BFFFFh
SA63
00111000XXX
32
1C0000h–1C7FFFh
SA64
00111001XXX
32
1C8000h–1CFFFFh
SA65
00111010XXX
32
1D0000h–1D7FFFh
SA66
00111011XXX
32
1D8000h–1DFFFFh
SA67
00111100XXX
32
1E0000h–1E7FFFh
SA68
00111101XXX
32
1E8000h–1EFFFFh
SA69
00111110XXX
32
1F0000h–1F7FFFh
SA70
00111111XXX
32
1F8000h–1FFFFFh
SA71
01000000XXX
32
200000h–207FFFh
SA72
01000001XXX
32
208000h–20FFFFh
SA73
01000010XXX
32
210000h–217FFFh
SA74
01000011XXX
32
218000h–21FFFFh
SA75
01000100XXX
32
220000h–227FFFh
SA76
01000101XXX
32
228000h–22FFFFh
SA77
01000110XXX
32
230000h–237FFFh
SA78
01000111XXX
32
238000h–23FFFFh
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
S29PL127J/S29PL064J/S29PL032J for MCP
23
P r e l i m i n a r y
Table 4.
Bank B
Bank
24
PL127J Sector Architecture (Continued)
Sector
Sector Address (A22-A12)
Sector Size (Kwords)
Address Range (x16)
SA79
01001000XXX
32
240000h–247FFFh
SA80
01001001XXX
32
248000h–24FFFFh
SA81
01001010XXX
32
250000h–257FFFh
SA82
01001011XXX
32
258000h–25FFFFh
SA83
01001100XXX
32
260000h–267FFFh
SA84
01001101XXX
32
268000h–26FFFFh
SA85
01001110XXX
32
270000h–277FFFh
SA86
01001111XXX
32
278000h–27FFFFh
SA87
01010000XXX
32
280000h–287FFFh
SA88
01010001XXX
32
288000h–28FFFFh
SA89
01010010XXX
32
290000h–297FFFh
SA90
01010011XXX
32
298000h–29FFFFh
SA91
01010100XXX
32
2A0000h–2A7FFFh
SA92
01010101XXX
32
2A8000h–2AFFFFh
SA93
01010110XXX
32
2B0000h–2B7FFFh
SA94
01010111XXX
32
2B8000h–2BFFFFh
SA95
01011000XXX
32
2C0000h–2C7FFFh
SA96
01011001XXX
32
2C8000h–2CFFFFh
SA97
01011010XXX
32
2D0000h–2D7FFFh
SA98
01011011XXX
32
2D8000h–2DFFFFh
SA99
01011100XXX
32
2E0000h–2E7FFFh
SA100
01011101XXX
32
2E8000h–2EFFFFh
SA101
01011110XXX
32
2F0000h–2F7FFFh
SA102
01011111XXX
32
2F8000h–2FFFFFh
SA103
01100000XXX
32
300000h–307FFFh
SA104
01100001XXX
32
308000h–30FFFFh
SA105
01100010XXX
32
310000h–317FFFh
SA106
01100011XXX
32
318000h–31FFFFh
SA107
01100100XXX
32
320000h–327FFFh
SA108
01100101XXX
32
328000h–32FFFFh
SA109
01100110XXX
32
330000h–337FFFh
SA110
01100111XXX
32
338000h–33FFFFh
SA111
01101000XXX
32
340000h–347FFFh
SA112
01101001XXX
32
348000h–34FFFFh
SA113
01101010XXX
32
350000h–357FFFh
SA114
01101011XXX
32
358000h–35FFFFh
SA115
01101100XXX
32
360000h–367FFFh
SA116
01101101XXX
32
368000h–36FFFFh
SA117
01101110XXX
32
370000h–377FFFh
SA118
01101111XXX
32
378000h–37FFFFh
S29PL127J/S29PL064J/S29PL032J for MCP
S29PL127J_064J_032J_MCP_00_A3 August 12, 2004
P r e l i m i n a r y
Table 4.
Bank C
Bank B
Bank
PL127J Sector Architecture (Continued)
Sector
Sector Address (A22-A12)
Sector Size (Kwords)
Address Range (x16)
SA119
01110000XXX
32
380000h–387FFFh
SA120
01110001XXX
32
388000h–38FFFFh
SA121
01110010XXX
32
390000h–397FFFh
SA122
01110011XXX
32
398000h–39FFFFh
SA123
01110100XXX
32
3A0000h–3A7FFFh
SA124
01110101XXX
32
3A8000h–3AFFFFh
SA125
01110110XXX
32
3B0000h–3B7FFFh
SA126
01110111XXX
32
3B8000h–3BFFFFh
SA127
01111000XXX
32
3C0000h–3C7FFFh
SA128
01111001XXX
32
3C8000h–3CFFFFh
SA129
01111010XXX
32
3D0000h–3D7FFFh
SA130
01111011XXX
32
3D8000h–3DFFFFh
SA131
01111100XXX
32
3E0000h–3E7FFFh
SA132
01111101XXX
32
3E8000h–3EFFFFh
SA133
01111110XXX
32
3F0000h–3F7FFFh
SA134
01111111XXX
32
3F8000h–3FFFFFh
SA135
10000000XXX
32
400000h–407FFFh
SA136
10000001XXX
32
408000h–40FFFFh
SA137
10000010XXX
32
410000h–417FFFh
SA138
10000011XXX
32
418000h–41FFFFh
SA139
10000100XXX
32
420000h–427FFFh
SA140
10000101XXX
32
428000h–42FFFFh
SA141
10000110XXX
32
430000h–437FFFh
SA142
10000111XXX
32
438000h–43FFFFh
SA143
10001000XXX
32
440000h–447FFFh
SA144
10001001XXX
32
448000h–44FFFFh
SA145
10001010XXX
32
450000h–457FFFh
SA146
10001011XXX
32
458000h–45FFFFh
SA147
10001100XXX
32
460000h–467FFFh
SA148
10001101XXX
32
468000h–46FFFFh
SA149
10001110XXX
32
470000h–477FFFh
SA150
10001111XXX
32
478000h–47FFFFh
SA151
10010000XXX
32
480000h–487FFFh
SA152
10010001XXX
32
488000h–48FFFFh
SA153
10010010XXX
32
490000h–497FFFh
SA154
10010011XXX
32
498000h–49FFFFh
SA155
10010100XXX
32
4A0000h–4A7FFFh
SA156
10010101XXX
32
4A8000h–4AFFFFh
SA157
10010110XXX
32
4B0000h–4B7FFFh
SA158
10010111XXX
32
4B8000h–4BFFFFh
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
S29PL127J/S29PL064J/S29PL032J for MCP
25
P r e l i m i n a r y
Table 4.
Bank C
Bank
26
PL127J Sector Architecture (Continued)
Sector
Sector Address (A22-A12)
Sector Size (Kwords)
Address Range (x16)
SA159
10011000XXX
32
4C0000h–4C7FFFh
SA160
10011001XXX
32
4C8000h–4CFFFFh
SA161
10011010XXX
32
4D0000h–4D7FFFh
SA162
10011011XXX
32
4D8000h–4DFFFFh
SA163
10011100XXX
32
4E0000h–4E7FFFh
SA164
10011101XXX
32
4E8000h–4EFFFFh
SA165
10011110XXX
32
4F0000h–4F7FFFh
SA166
10011111XXX
32
4F8000h–4FFFFFh
SA167
10100000XXX
32
500000h–507FFFh
SA168
10100001XXX
32
508000h–50FFFFh
SA169
10100010XXX
32
510000h–517FFFh
SA170
10100011XXX
32
518000h–51FFFFh
SA171
10100100XXX
32
520000h–527FFFh
SA172
10100101XXX
32
528000h–52FFFFh
SA173
10100110XXX
32
530000h–537FFFh
SA174
10100111XXX
32
538000h–53FFFFh
SA175
10101000XXX
32
540000h–547FFFh
SA176
10101001XXX
32
548000h–54FFFFh
SA177
10101010XXX
32
550000h–557FFFh
SA178
10101011XXX
32
558000h–15FFFFh
SA179
10101100XXX
32
560000h–567FFFh
SA180
10101101XXX
32
568000h–56FFFFh
SA181
10101110XXX
32
570000h–577FFFh
SA182
10101111XXX
32
578000h–57FFFFh
SA183
10110000XXX
32
580000h–587FFFh
SA184
10110001XXX
32
588000h–58FFFFh
SA185
10110010XXX
32
590000h–597FFFh
SA186
10110011XXX
32
598000h–59FFFFh
SA187
10110100XXX
32
5A0000h–5A7FFFh
SA188
10110101XXX
32
5A8000h–5AFFFFh
SA189
10110110XXX
32
5B0000h–5B7FFFh
SA190
10110111XXX
32
5B8000h–5BFFFFh
SA191
10111000XXX
32
5C0000h–5C7FFFh
SA192
10111001XXX
32
5C8000h–5CFFFFh
SA193
10111010XXX
32
5D0000h–5D7FFFh
SA194
10111011XXX
32
5D8000h–5DFFFFh
SA195
10111100XXX
32
5E0000h–5E7FFFh
SA196
10111101XXX
32
5E8000h–5EFFFFh
SA197
10111110XXX
32
5F0000h–5F7FFFh
SA198
10111111XXX
32
5F8000h–5FFFFFh
S29PL127J/S29PL064J/S29PL032J for MCP
S29PL127J_064J_032J_MCP_00_A3 August 12, 2004
P r e l i m i n a r y
Table 4.
Bank C
Bank
PL127J Sector Architecture (Continued)
Sector
Sector Address (A22-A12)
Sector Size (Kwords)
Address Range (x16)
SA199
11000000XXX
32
600000h–607FFFh
SA200
11000001XXX
32
608000h–60FFFFh
SA201
11000010XXX
32
610000h–617FFFh
SA202
11000011XXX
32
618000h–61FFFFh
SA203
11000100XXX
32
620000h–627FFFh
SA204
11000101XXX
32
628000h–62FFFFh
SA205
11000110XXX
32
630000h–637FFFh
SA206
11000111XXX
32
638000h–63FFFFh
SA207
11001000XXX
32
640000h–647FFFh
SA208
11001001XXX
32
648000h–64FFFFh
SA209
11001010XXX
32
650000h–657FFFh
SA210
11001011XXX
32
658000h–65FFFFh
SA211
11001100XXX
32
660000h–667FFFh
SA212
11001101XXX
32
668000h–66FFFFh
SA213
11001110XXX
32
670000h–677FFFh
SA214
11001111XXX
32
678000h–67FFFFh
SA215
11010000XXX
32
680000h–687FFFh
SA216
11010001XXX
32
688000h–68FFFFh
SA217
11010010XXX
32
690000h–697FFFh
SA218
11010011XXX
32
698000h–69FFFFh
SA219
11010100XXX
32
6A0000h–6A7FFFh
SA220
11010101XXX
32
6A8000h–6AFFFFh
SA221
11010110XXX
32
6B0000h–6B7FFFh
SA222
11010111XXX
32
6B8000h–6BFFFFh
SA223
11011000XXX
32
6C0000h–6C7FFFh
SA224
11011001XXX
32
6C8000h–6CFFFFh
SA225
11011010XXX
32
6D0000h–6D7FFFh
SA226
11011011XXX
32
6D8000h–6DFFFFh
SA227
11011100XXX
32
6E0000h–6E7FFFh
SA228
11011101XXX
32
6E8000h–6EFFFFh
SA229
11011110XXX
32
6F0000h–6F7FFFh
SA230
11011111XXX
32
6F8000h–6FFFFFh
Table 5.
SecSiTM Sector Addresses
Sector Size
Address Range
Factory-Locked Area
64 words
000000h-00003Fh
Customer-Lockable Area
64 words
000040h-00007Fh
Autoselect Mode
The autoselect mode provides manufacturer and device identification, and sector
protection verification, through identifier codes output on DQ7–DQ0. This mode
is primarily intended for programming equipment to automatically match a device
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
S29PL127J/S29PL064J/S29PL032J for MCP
27
P r e l i m i n a r y
to be programmed with its corresponding programming algorithm. However, the
autoselect codes can also be accessed in-system through the command register.
When using programming equipment, the autoselect mode requires VID on address pin A9. Address pins must be set as shown in Table 6. In addition, when
verifying sector protection, the sector address must appear on the appropriate
highest order address bits (see Table 3). Table 6 shows the remaining address
bits that are don’t care. When all necessary bits have been set as required, the
programming equipment may then read the corresponding identifier code on
DQ7–DQ0. However, the autoselect codes can also be accessed in-system
through the command register, for instances when the device is erased or programmed in a system without access to high voltage on the A9 pin. The command
sequence is illustrated in Table 13. Note that if a Bank Address (BA) (on address
bits PL127J: A22–A20, PL064J: A21–A19, PL032J: A20–A18) is asserted during
the third write cycle of the autoselect command, the host system can read autoselect data that bank and then immediately read array data from the other
bank, without exiting the autoselect mode.
To access the autoselect codes in-system, the host system can issue the autoselect command via the command register, as shown in Table 13. This method does
not require V ID . Refer to the Autoselect Command Sequence for more
information.
Table 6. Autoselect Codes (High Voltage Method)
CE#
OE#
WE#
Amax
to
A12
A1
0
A9
A8
A7
A6
A5
to
A4
A3
A2
A1
A0
DQ15
to DQ0
Manufacturer ID:
Spansion
products
L
L
H
BA
X
VID
X
L
L
X
L
L
L
L
0001h
L
L
L
H
227Eh
H
H
H
L
2220h (PL127J)
2202h (PL064J)
220Ah (PL032J)
H
H
H
H
2200h (PL127J)
2201h (PL064J)
2201h (PL032J)
Device ID
Description
Read
Cycle 1
L
Read
Cycle 2
L
Read
Cycle 3
L
L
H
BA
X
VID
X
L
L
L
Sector Protection
Verification
L
L
H
SA
X
VID
X
L
L
L
L
L
H
L
0001h (protected),
0000h (unprotected)
SecSi Indicator
Bit (DQ7, DQ6)
L
L
H
BA
X
VID
X
X
L
X
L
L
H
H
00C4h (factory and
customer locked), 0084h
(factory locked), 0004h
(not locked)
Legend: L = Logic Low = VIL, H = Logic High = VIH, BA = Bank Address, SA = Sector Address, X = Don’t care.
Note: The autoselect codes may also be accessed in-system via command sequences
28
S29PL127J/S29PL064J/S29PL032J for MCP
S29PL127J_064J_032J_MCP_00_A3 August 12, 2004
P r e l i m i n a r y
Table 7.
PL127J Boot Sector/Sector Block Addresses for Protection/Unprotection
Sector
A22-A12
Sector/
Sector Block Size
Sector
A22-A12
Sector/
Sector Block Size
SA0
00000000000
4 Kwords
SA131-SA134
011111XXXXX
128 (4x32) Kwords
SA1
00000000001
4 Kwords
SA135-SA138
100000XXXXX
128 (4x32) Kwords
SA2
00000000010
4 Kwords
SA139-SA142
100001XXXXX
128 (4x32) Kwords
SA3
00000000011
4 Kwords
SA143-SA146
100010XXXXX
128 (4x32) Kwords
SA4
00000000100
4 Kwords
SA147-SA150
100011XXXXX
128 (4x32) Kwords
SA5
00000000101
4 Kwords
SA151-SA154
100100XXXXX
128 (4x32) Kwords
SA6
00000000110
4 Kwords
SA155-SA158
100101XXXXX
128 (4x32) Kwords
SA7
00000000111
4 Kwords
SA159-SA162
100110XXXXX
128 (4x32) Kwords
SA8
00000001XXX
32 Kwords
SA163-SA166
100111XXXXX
128 (4x32) Kwords
SA9
00000010XXX
32 Kwords
SA167-SA170
101000XXXXX
128 (4x32) Kwords
SA10
00000011XXX
32 Kwords
SA171-SA174
101001XXXXX
128 (4x32) Kwords
SA11-SA14
000001XXXXX
128 (4x32) Kwords
SA175-SA178
101010XXXXX
128 (4x32) Kwords
SA15-SA18
000010XXXXX
128 (4x32) Kwords
SA179-SA182
101011XXXXX
128 (4x32) Kwords
SA19-SA22
000011XXXXX
128 (4x32) Kwords
SA183-SA186
101100XXXXX
128 (4x32) Kwords
SA23-SA26
000100XXXXX
128 (4x32) Kwords
SA187-SA190
101101XXXXX
128 (4x32) Kwords
SA27-SA30
000101XXXXX
128 (4x32) Kwords
SA191-SA194
101110XXXXX
128 (4x32) Kwords
SA31-SA34
000110XXXXX
128 (4x32) Kwords
SA195-SA198
101111XXXXX
128 (4x32) Kwords
SA35-SA38
000111XXXXX
128 (4x32) Kwords
SA199-SA202
110000XXXXX
128 (4x32) Kwords
SA39-SA42
001000XXXXX
128 (4x32) Kwords
SA203-SA206
110001XXXXX
128 (4x32) Kwords
SA43-SA46
001001XXXXX
128 (4x32) Kwords
SA207-SA210
110010XXXXX
128 (4x32) Kwords
SA47-SA50
001010XXXXX
128 (4x32) Kwords
SA211-SA214
110011XXXXX
128 (4x32) Kwords
SA51-SA54
001011XXXXX
128 (4x32) Kwords
SA215-SA218
110100XXXXX
128 (4x32) Kwords
SA55-SA58
001100XXXXX
128 (4x32) Kwords
SA219-SA222
110101XXXXX
128 (4x32) Kwords
SA59-SA62
001101XXXXX
128 (4x32) Kwords
SA223-SA226
110110XXXXX
128 (4x32) Kwords
SA63-SA66
001110XXXXX
128 (4x32) Kwords
SA227-SA230
110111XXXXX
128 (4x32) Kwords
SA67-SA70
001111XXXXX
128 (4x32) Kwords
SA231-SA234
111000XXXXX
128 (4x32) Kwords
SA71-SA74
010000XXXXX
128 (4x32) Kwords
SA235-SA238
111001XXXXX
128 (4x32) Kwords
SA75-SA78
010001XXXXX
128 (4x32) Kwords
SA239-SA242
111010XXXXX
128 (4x32) Kwords
SA79-SA82
010010XXXXX
128 (4x32) Kwords
SA243-SA246
111011XXXXX
128 (4x32) Kwords
SA83-SA86
010011XXXXX
128 (4x32) Kwords
SA247-SA250
111100XXXXX
128 (4x32) Kwords
SA87-SA90
010100XXXXX
128 (4x32) Kwords
SA251-SA254
111101XXXXX
128 (4x32) Kwords
SA91-SA94
010101XXXXX
128 (4x32) Kwords
SA255-SA258
111110XXXXX
128 (4x32) Kwords
SA95-SA98
010110XXXXX
128 (4x32) Kwords
SA259
11111100XXX
32 Kwords
SA99-SA102
010111XXXXX
128 (4x32) Kwords
SA260
11111101XXX
32 Kwords
SA103-SA106
011000XXXXX
128 (4x32) Kwords
SA261
11111110XXX
32 Kwords
SA107-SA110
011001XXXXX
128 (4x32) Kwords
SA262
11111111000
4 Kwords
SA111-SA114
011010XXXXX
128 (4x32) Kwords
SA263
11111111001
4 Kwords
SA115-SA118
011011XXXXX
128 (4x32) Kwords
SA264
11111111010
4 Kwords
SA119-SA122
011100XXXXX
128 (4x32) Kwords
SA265
11111111011
4 Kwords
SA123-SA126
011101XXXXX
128 (4x32) Kwords
SA127-SA130
011110XXXXX
128 (4x32) Kwords
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
S29PL127J/S29PL064J/S29PL032J for MCP
29
P r e l i m i n a r y
Selecting a Sector Protection Mode
The device is shipped with all sectors unprotected. Optional Spansion programming services enable programming and protecting sectors at the factory prior to
shipping the device. Contact your local sales office for details.
It is possible to determine whether a sector is protected or unprotected. See the
SecSiTM Sector Addresses for details.
Table 8. Sector Protection Schemes
DYB
PPB
PPB Lock
Sector State
0
0
0
Unprotected—PPB and DYB are changeable
0
0
1
Unprotected—PPB not changeable, DYB is changeable
0
1
0
1
0
0
1
1
0
0
1
1
1
0
1
1
1
1
Protected—PPB and DYB are changeable
Protected—PPB not changeable, DYB is changeable
Sector Protection
The PL127J, PL064J, and PL032J features several levels of sector protection,
which can disable both the program and erase operations in certain sectors or
sector groups.
Sector Protection Schemes
Password Sector Protection
A highly sophisticated protection method that requires a password before
changes to certain sectors or sector groups are permitted
WP# Hardware Protection
A write protect pin that can prevent program or erase operations in sectors SA1133, SA1-134, SA2-0 and SA2-1.
The WP# Hardware Protection feature is always available, independent of the
software managed protection method chosen.
Selecting a Sector Protection Mode
All parts default to operate in the Persistent Sector Protection mode. The customer must then choose if the Persistent or Password Protection method is most
desirable. There are two one-time programmable non-volatile bits that define
which sector protection method will be used. If the Persistent Sector Protection
method is desired, programming the Persistent Sector Protection Mode Locking
Bit permanently sets the device to the Persistent Sector Protection mode. If the
Password Sector Protection method is desired, programming the Password Mode
Locking Bit permanently sets the device to the Password Sector Protection mode.
It is not possible to switch between the two protection modes once a locking bit
has been set. One of the two modes must be selected when the device is first
programmed. This prevents a program or virus from later setting the Password
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Mode Locking Bit, which would cause an unexpected shift from the default Persistent Sector Protection Mode into the Password Protection Mode.
The device is shipped with all sectors unprotected. Optional Spansion programming services enable programming and protecting sectors at the factory prior to
shipping the device. Contact your local sales office for details.
It is possible to determine whether a sector is protected or unprotected. See Autoselect Mode for details.
Persistent Sector Protection
The Persistent Sector Protection method replaces the 12 V controlled protection
method in previous flash devices. This new method provides three different sector protection states:
„ Persistently Locked—The sector is protected and cannot be changed.
„ Dynamically Locked—The sector is protected and can be changed by a simple
command.
„ Unlocked—The sector is unprotected and can be changed by a simple command.
To achieve these states, three types of “bits” are used:
„ Persistent Protection Bit
„ Persistent Protection Bit Lock
„ Persistent Sector Protection Mode Locking Bit
Persistent Protection Bit (PPB)
A single Persistent (non-volatile) Protection Bit is assigned to a maximum four
sectors (see the sector address tables for specific sector protection groupings).
All 4 Kword boot-block sectors have individual sector Persistent Protection Bits
(PPBs) for greater flexibility. Each PPB is individually modifiable through the PPB
Write Command.
The device erases all PPBs in parallel. If any PPB requires erasure, the device
must be instructed to preprogram all of the sector PPBs prior to PPB erasure. Otherwise, a previously erased sector PPBs can potentially be over-erased. The flash
device does not have a built-in means of preventing sector PPBs over-erasure.
Persistent Protection Bit Lock (PPB Lock)
The Persistent Protection Bit Lock (PPB Lock) is a global volatile bit. When set to
“1”, the PPBs cannot be changed. When cleared (“0”), the PPBs are changeable.
There is only one PPB Lock bit per device. The PPB Lock is cleared after powerup or hardware reset. There is no command sequence to unlock the PPB Lock.
Dynamic Protection Bit (DYB)
A volatile protection bit is assigned for each sector. After power-up or hardware
reset, the contents of all DYBs is “0”. Each DYB is individually modifiable through
the DYB Write Command.
When the parts are first shipped, the PPBs are cleared, the DYBs are cleared, and
PPB Lock is defaulted to power up in the cleared state – meaning the PPBs are
changeable.
When the device is first powered on the DYBs power up cleared (sectors not protected). The Protection State for each sector is determined by the logical OR of
the PPB and the DYB related to that sector. For the sectors that have the PPBs
cleared, the DYBs control whether or not the sector is protected or unprotected.
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By issuing the DYB Write command sequences, the DYBs will be set or cleared,
thus placing each sector in the protected or unprotected state. These are the socalled Dynamic Locked or Unlocked states. They are called dynamic states because it is very easy to switch back and forth between the protected and
unprotected conditions. This allows software to easily protect sectors against inadvertent changes yet does not prevent the easy removal of protection when
changes are needed. The DYBs maybe set or cleared as often as needed.
The PPBs allow for a more static, and difficult to change, level of protection. The
PPBs retain their state across power cycles because they are non-volatile. Individual PPBs are set with a command but must all be cleared as a group through
a complex sequence of program and erasing commands. The PPBs are also limited to 100 erase cycles.
The PPB Lock bit adds an additional level of protection. Once all PPBs are programmed to the desired settings, the PPB Lock may be set to “1”. Setting the PPB
Lock disables all program and erase commands to the non-volatile PPBs. In effect, the PPB Lock Bit locks the PPBs into their current state. The only way to clear
the PPB Lock is to go through a power cycle. System boot code can determine if
any changes to the PPB are needed; for example, to allow new system code to
be downloaded. If no changes are needed then the boot code can set the PPB
Lock to disable any further changes to the PPBs during system operation.
The WP#/ACC write protect pin adds a final level of hardware protection to sectors SA1-133, SA1-134, SA2-0 and SA2-1. When this pin is low it is not possible
to change the contents of these sectors. These sectors generally hold system
boot code. The WP#/ACC pin can prevent any changes to the boot code that could
override the choices made while setting up sector protection during system
initialization.
For customers who are concerned about malicious viruses there is another level
of security - the persistently locked state. To persistently protect a given sector
or sector group, the PPBs associated with that sector need to be set to “1”. Once
all PPBs are programmed to the desired settings, the PPB Lock should be set to
“1”. Setting the PPB Lock automatically disables all program and erase commands
to the Non-Volatile PPBs. In effect, the PPB Lock “freezes” the PPBs into their current state. The only way to clear the PPB Lock is to go through a power cycle.
It is possible to have sectors that have been persistently locked, and sectors that
are left in the dynamic state. The sectors in the dynamic state are all unprotected.
If there is a need to protect some of them, a simple DYB Write command sequence is all that is necessary. The DYB write command for the dynamic sectors
switch the DYBs to signify protected and unprotected, respectively. If there is a
need to change the status of the persistently locked sectors, a few more steps
are required. First, the PPB Lock bit must be disabled by either putting the device
through a power-cycle, or hardware reset. The PPBs can then be changed to reflect the desired settings. Setting the PPB lock bit once again will lock the PPBs,
and the device operates normally again.
The best protection is achieved by executing the PPB lock bit set command early
in the boot code, and protect the boot code by holding WP#/ACC = VIL.
Table 8 contains all possible combinations of the DYB, PPB, and PPB lock relating
to the status of the sector.
In summary, if the PPB is set, and the PPB lock is set, the sector is protected and
the protection can not be removed until the next power cycle clears the PPB lock.
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If the PPB is cleared, the sector can be dynamically locked or unlocked. The DYB
then controls whether or not the sector is protected or unprotected.
If the user attempts to program or erase a protected sector, the device ignores
the command and returns to read mode. A program command to a protected sector enables status polling for approximately 1 µs before the device returns to read
mode without having modified the contents of the protected sector. An erase
command to a protected sector enables status polling for approximately 50 µs
after which the device returns to read mode without having erased the protected
sector.
The programming of the DYB, PPB, and PPB lock for a given sector can be verified
by writing a DYB/PPB/PPB lock verify command to the device. There is an alternative means of reading the protection status. Take RESET# to VIL and hold WE#
at VIH.(The high voltage A9 Autoselect Mode also works for reading the status of
the PPBs). Scanning the addresses (A18–A11) while (A6, A1, A0) = (0, 1, 0) will
produce a logical ‘1” code at device output DQ0 for a protected sector or a “0” for
an unprotected sector. In this mode, the other addresses are don’t cares. Address
location with A1 = VIL are reserved for autoselect manufacturer and device
codes.
Persistent Sector Protection Mode Locking Bit
Like the password mode locking bit, a Persistent Sector Protection mode locking
bit exists to guarantee that the device remain in software sector protection. Once
set, the Persistent Sector Protection locking bit prevents programming of the
password protection mode locking bit. This guarantees that a hacker could not
place the device in password protection mode.
Password Protection Mode
The Password Sector Protection Mode method allows an even higher level of security than the Persistent Sector Protection Mode. There are two main differences
between the Persistent Sector Protection and the Password Sector Protection
Mode:
When the device is first powered on, or comes out of a reset cycle, the PPB Lock
bit set to the locked state, rather than cleared to the unlocked state.
The only means to clear the PPB Lock bit is by writing a unique 64-bit Password
to the device.
The Password Sector Protection method is otherwise identical to the Persistent
Sector Protection method.
A 64-bit password is the only additional tool utilized in this method.
Once the Password Mode Locking Bit is set, the password is permanently set with
no means to read, program, or erase it. The password is used to clear the PPB
Lock bit. The Password Unlock command must be written to the flash, along with
a password. The flash device internally compares the given password with the
pre-programmed password. If they match, the PPB Lock bit is cleared, and the
PPBs can be altered. If they do not match, the flash device does nothing. There
is a built-in 2 µs delay for each “password check.” This delay is intended to thwart
any efforts to run a program that tries all possible combinations in order to crack
the password.
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P r e l i m i n a r y
Password and Password Mode Locking Bit
In order to select the Password sector protection scheme, the customer must first
program the password. The password may be correlated to the unique Electronic
Serial Number (ESN) of the particular flash device. Each ESN is different for every
flash device; therefore each password should be different for every flash device.
While programming in the password region, the customer may perform Password
Verify operations.
Once the desired password is programmed in, the customer must then set the
Password Mode Locking Bit. This operation achieves two objectives:
Permanently sets the device to operate using the Password Protection Mode. It is
not possible to reverse this function.
Disables all further commands to the password region. All program, and read operations are ignored.
Both of these objectives are important, and if not carefully considered, may lead
to unrecoverable errors. The user must be sure that the Password Protection
method is desired when setting the Password Mode Locking Bit. More importantly,
the user must be sure that the password is correct when the Password Mode
Locking Bit is set. Due to the fact that read operations are disabled, there is no
means to verify what the password is afterwards. If the password is lost after setting the Password Mode Locking Bit, there will be no way to clear the PPB Lock bit.
The Password Mode Locking Bit, once set, prevents reading the 64-bit password
on the DQ bus and further password programming. The Password Mode Locking
Bit is not erasable. Once Password Mode Locking Bit is programmed, the Persistent Sector Protection Locking Bit is disabled from programming, guaranteeing
that no changes to the protection scheme are allowed.
64-bit Password
The 64-bit Password is located in its own memory space and is accessible through
the use of the Password Program and Verify commands (see “Password Verify
Command”). The password function works in conjunction with the Password
Mode Locking Bit, which when set, prevents the Password Verify command from
reading the contents of the password on the pins of the device.
Write Protect (WP#)
The Write Protect feature provides a hardware method of protecting the upper
two and lower two sectors without using VID. This function is provided by the WP#
pin and overrides the previously discussed High Voltage Sector Protection
method.
If the system asserts VIL on the WP#/ACC pin, the device disables program and
erase functions in the two outermost 4 Kword sectors on both ends of the flash
array independent of whether it was previously protected or unprotected.
If the system asserts VIH on the WP#/ACC pin, the device reverts the upper two
and lower two sectors to whether they were last set to be protected or unprotected. That is, sector protection or unprotection for these sectors depends on
whether they were last protected or unprotected using the method described in
the High Voltage Sector Protection.
Note that the WP#/ACC pin must not be left floating or unconnected; inconsistent
behavior of the device may result.
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Persistent Protection Bit Lock
The Persistent Protection Bit (PPB) Lock is a volatile bit that reflects the state of
the Password Mode Locking Bit after power-up reset. If the Password Mode Lock
Bit is also set after a hardware reset (RESET# asserted) or a power-up reset, the
ONLY means for clearing the PPB Lock Bit in Password Protection Mode is to issue
the Password Unlock command. Successful execution of the Password Unlock
command clears the PPB Lock Bit, allowing for sector PPBs modifications. Asserting RESET#, taking the device through a power-on reset, or issuing the PPB Lock
Bit Set command sets the PPB Lock Bit to a “1” when the Password Mode Lock Bit
is not set.
If the Password Mode Locking Bit is not set, including Persistent Protection Mode,
the PPB Lock Bit is cleared after power-up or hardware reset. The PPB Lock Bit is
set by issuing the PPB Lock Bit Set command. Once set the only means for clearing the PPB Lock Bit is by issuing a hardware or power-up reset. The Password
Unlock command is ignored in Persistent Protection Mode.
High Voltage Sector Protection
Sector protection and unprotection may also be implemented using programming
equipment. The procedure requires high voltage (VID) to be placed on the RESET# pin. Refer to Figure 1 for details on this procedure. Note that for sector
unprotect, all unprotected sectors must first be protected prior to the first sector
write cycle.
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P r e l i m i n a r y
START
START
Protect all sectors:
The indicated portion
of the sector protect
algorithm must be
performed for all
unprotected sectors
prior to issuing the
first sector
unprotect address
PLSCNT = 1
RESET# = VID
Wait 4 µs
Temporary Sector
Unprotect Mode
No
PLSCNT = 1
RESET# = VID
Wait 4 µs
First Write
Cycle = 60h?
First Write
Cycle = 60h?
Temporary Sector
Unprotect Mode
Yes
Yes
Set up sector
address
No
All sectors
protected?
Sector Protect:
Write 60h to sector
address with
A7-A0 =
00000010
Yes
Set up first sector
address
Sector Unprotect:
Write 60h to sector
address with
A7-A0 =
01000010
Wait 100 µs
Increment
PLSCNT
No
Verify Sector
Protect: Write 40h
to sector address
with A7-A0 =
00000010
Reset
PLSCNT = 1
Read from
sector address
with A7-A0 =
00000010
Wait 1.2 ms
Verify Sector
Unprotect: Write
40h to sector
address with
A7-A0 =
00000010
Increment
PLSCNT
No
No
PLSCNT
= 25?
Yes
Yes
Remove VID
from RESET#
No
Yes
Protect another
sector?
No
Write reset
command
Remove VID
from RESET#
Sector Protect
complete
Write reset
command
Device failed
Read from
sector address
with A7-A0 =
00000010
Data = 01h?
Sector Protect
complete
Sector Protect
Algorithm
PLSCNT
= 1000?
Yes
Remove VID
from RESET#
Write reset
command
Set up
next sector
address
No
Data = 00h?
Yes
Last sector
verified?
No
Yes
Remove VID
from RESET#
Sector Unprotect
complete
Write reset
command
Device failed
Sector Unprotect
complete
Sector Unprotect
Algorithm
Figure 1. In-System Sector Protection/Sector Unprotection Algorithms
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Temporary Sector Unprotect
This feature allows temporary unprotection of previously protected sectors to
change data in-system. The Sector Unprotect mode is activated by setting the
RESET# pin to VID. During this mode, formerly protected sectors can be programmed or erased by selecting the sector addresses. Once VID is removed from
the RESET# pin, all the previously protected sectors are protected again. 2 shows
the algorithm, and 21 shows the timing diagrams, for this feature. While PPB lock
is set, the device cannot enter the Temporary Sector Unprotection Mode.
START
RESET# = VID
(Note 1)
Perform Erase or
Program Operations
RESET# = VIH
Temporary Sector
Unprotect Completed
(Note 2)
Notes:
1. All protected sectors unprotected (If WP#/ACC = VIL, upper two and lower two
sectors will remain protected).
2. All previously protected sectors are protected once again
Figure 2. Temporary Sector Unprotect Operation
SecSi™ (Secured Silicon) Sector Flash Memory Region
The SecSi (Secured Silicon) Sector feature provides a Flash memory region that
enables permanent part identification through an Electronic Serial Number (ESN)
The 128-word SecSi sector is divided into 64 factory-lockable words that can be
programmed and locked by the customer. The SecSi sector is located at addresses 000000h-00007Fh in both Persistent Protection mode and Password
Protection mode. It uses indicator bits (DQ6, DQ7) to indicate the factory-locked
and customer-locked status of the part.
The system accesses the SecSi Sector through a command sequence (see the
Enter SecSi™ Sector/Exit SecSi Sector Command Sequence). After the system
has written the Enter SecSi Sector command sequence, it may read the SecSi
Sector by using the addresses normally occupied by the boot sectors. This mode
of operation continues until the system issues the Exit SecSi Sector command sequence, or until power is removed from the device. On power-up, or following a
hardware reset, the device reverts to sending commands to the normal address
space. Note that the ACC function and unlock bypass modes are not available
when the SecSi Sector is enabled.
Factory-Locked Area (64 words)
The factory-locked area of the SecSi Sector (000000h-00003Fh) is locked when
the part is shipped, whether or not the area was programmed at the factory. The
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SecSi Sector Factory-locked Indicator Bit (DQ7) is permanently set to a “1”. Optional Spansion programming services can program the factory-locked area with
a random ESN, a customer-defined code, or any combination of the two. Because
only Spansion can program and protect the factory-locked area, this method ensures the security of the ESN once the product is shipped to the field. Contact
your local sales office for details on using Spansion’s programming services. Note
that the ACC function and unlock bypass modes are not available when the SecSi
sector is enabled.
Customer-Lockable Area (64 words)
The customer-lockable area of the SecSi Sector (000040h-00007Fh) is shipped
unprotected, which allows the customer to program and optionally lock the area
as appropriate for the application. The SecSi Sector Customer-locked Indicator
Bit (DQ6) is shipped as “0” and can be permanently locked to “1” by issuing the
SecSi Protection Bit Program Command. The SecSi Sector can be read any number of times, but can be programmed and locked only once. Note that the
accelerated programming (ACC) and unlock bypass functions are not available
when programming the SecSi Sector.
The Customer-lockable SecSi Sector area can be protected using one of the
following procedures:
„ Write the three-cycle Enter SecSi Sector Region command sequence, and
then follow the in-system sector protect algorithm as shown in Figure 1, except that RESET# may be at either VIH or VID. This allows in-system protection of the SecSi Sector Region without raising any device pin to a high
voltage. Note that this method is only applicable to the SecSi Sector.
„ To verify the protect/unprotect status of the SecSi Sector, follow the algorithm shown in Figure 3.
Once the SecSi Sector is locked and verified, the system must write the Exit SecSi
Sector Region command sequence to return to reading and writing the remainder
of the array.
The SecSi Sector lock must be used with caution since, once locked, there is no
procedure available for unlocking the SecSi Sector area and none of the bits in
the SecSi Sector memory space can be modified in any way.
SecSi Sector Protection Bits
The SecSi Sector Protection Bits prevent programming of the SecSi Sector memory area. Once set, the SecSi Sector memory area contents are non-modifiable.
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P r e l i m i n a r y
START
RESET# =
VIH or VID
Wait 1 µs
Write 60h to
any address
Write 40h to SecSi
Sector address
with A6 = 0,
A1 = 1, A0 = 0
Read from SecSi
Sector address
with A6 = 0,
A1 = 1, A0 = 0
If data = 00h,
SecSi Sector is
unprotected.
If data = 01h,
SecSi Sector is
protected.
Remove VIH or VID
from RESET#
Write reset
command
SecSi Sector
Protect Verify
complete
Figure 3. SecSi Sector Protect Verify
Hardware Data Protection
The command sequence requirement of unlock cycles for programming or erasing
provides data protection against inadvertent writes. In addition, the following
hardware data protection measures prevent accidental erasure or programming,
which might otherwise be caused by spurious system level signals during VCC
power-up and power-down transitions, or from system noise.
Low VCC Write Inhibit
When VCC is less than VLKO, the device does not accept any write cycles. This protects data during VCC power-up and power-down. The command register and all
internal program/erase circuits are disabled, and the device resets to the read
mode. Subsequent writes are ignored until VCC is greater than VLKO. The system
must provide the proper signals to the control pins to prevent unintentional writes
when VCC is greater than VLKO.
Write Pulse “Glitch” Protection
Noise pulses of less than 3 ns (typical) on OE#, CE#, or WE# do not initiate a
write cycle.
Logical Inhibit
Write cycles are inhibited by holding any one of OE# = VIL, CE# = VIH or WE# =
VIH. To initiate a write cycle, CE# and WE# must be a logical zero while OE# is a
logical one.
Power-Up Write Inhibit
If WE# = CE# = VIL and OE# = VIH during power up, the device does not accept
commands on the rising edge of WE#. The internal state machine is automatically
reset to the read mode on power-up.
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Common Flash Memory Interface (CFI)
The Common Flash Interface (CFI) specification outlines device and host system
software interrogation handshake, which allows specific vendor-specified software algorithms to be used for entire families of devices. Software support can
then be device-independent, JEDEC ID-independent, and forward- and backward-compatible for the specified flash device families. Flash vendors can
standardize their existing interfaces for long-term compatibility.
This device enters the CFI Query mode when the system writes the CFI Query
command, 98h, to address 55h, any time the device is ready to read array data.
The system can read CFI information at the addresses given in Tables 9–12. To
terminate reading CFI data, the system must write the reset command. The CFI
Query mode is not accessible when the device is executing an Embedded Program
or embedded Erase algorithm.
The system can also write the CFI query command when the device is in the autoselect mode. The device enters the CFI query mode, and the system can read
CFI data at the addresses given in Tables 9–12. The system must write the reset
command to return the device to reading array data.
For further information, please refer to the CFI Specification and CFI Publication
100. Contact your local sales office for copies of these documents.
Table 9.
40
CFI Query Identification String
Addresses
Data
Description
10h
11h
12h
0051h
0052h
0059h
Query Unique ASCII string “QRY”
13h
14h
0002h
0000h
Primary OEM Command Set
15h
16h
0040h
0000h
Address for Primary Extended Table
17h
18h
0000h
0000h
Alternate OEM Command Set (00h = none exists)
19h
1Ah
0000h
0000h
Address for Alternate OEM Extended Table (00h = none exists)
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Table 10.
Addresses
System Interface String
Data
Description
1Bh
0027h
VCC Min. (write/erase)
D7–D4: volt, D3–D0: 100 millivolt
1Ch
0036h
VCC Max. (write/erase)
D7–D4: volt, D3–D0: 100 millivolt
1Dh
0000h
VPP Min. voltage (00h = no VPP pin present)
1Eh
0000h
VPP Max. voltage (00h = no VPP pin present)
1Fh
0003h
Typical timeout per single byte/word write 2N µs
20h
0000h
Typical timeout for Min. size buffer write 2N µs (00h = not supported)
21h
0009h
Typical timeout per individual block erase 2N ms
22h
0000h
Typical timeout for full chip erase 2N ms (00h = not supported)
23h
0004h
Max. timeout for byte/word write 2N times typical
24h
0000h
Max. timeout for buffer write 2N times typical
25h
0004h
Max. timeout per individual block erase 2N times typical
26h
0000h
Max. timeout for full chip erase 2N times typical (00h = not supported)
Table 11. Device Geometry Definition
Addresses
Data
27h
0018h (PL127J)
0017h (PL064J)
0016h (PL032J)
28h
29h
0001h
0000h
Flash Device Interface description (refer to CFI publication 100)
2Ah
2Bh
0000h
0000h
Max. number of byte in multi-byte write = 2N
(00h = not supported)
2Ch
0003h
Number of Erase Block Regions within device
2Dh
2Eh
2Fh
30h
0007h
0000h
0020h
0000h
Erase Block Region 1 Information
(refer to the CFI specification or CFI publication 100)
31h
00FDh (PL127J)
007Dh (PL064J)
003Dh (PL032J)
32h
33h
34h
0000h
0000h
0001h
35h
36h
37h
38h
0007h
0000h
0020h
0000h
Erase Block Region 3 Information
(refer to the CFI specification or CFI publication 100)
39h
3Ah
3Bh
3Ch
0000h
0000h
0000h
0000h
Erase Block Region 4 Information
(refer to the CFI specification or CFI publication 100)
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
Description
Device Size = 2N byte
Erase Block Region 2 Information
(refer to the CFI specification or CFI publication 100)
S29PL127J/S29PL064J/S29PL032J for MCP
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Table 12.
Primary Vendor-Specific Extended Query
Addresses
Data
40h
41h
42h
0050h
0052h
0049h
Query-unique ASCII string “PRI”
43h
0031h
Major version number, ASCII (reflects modifications to the silicon)
44h
0033h
Minor version number, ASCII (reflects modifications to the CFI table)
45h
TBD
Description
Address Sensitive Unlock (Bits 1-0)
0 = Required, 1 = Not Required
Silicon Revision Number (Bits 7-2)
42
46h
0002h
Erase Suspend
0 = Not Supported, 1 = To Read Only, 2 = To Read & Write
47h
0001h
Sector Protect
0 = Not Supported, X = Number of sectors in per group
48h
0001h
Sector Temporary Unprotect
00 = Not Supported, 01 = Supported
49h
0007h (PLxxxJ)
Sector Protect/Unprotect scheme
07 = Advanced Sector Protection
4Ah
00E7h (PL127J)
0077h (PL064J)
003Fh (PL032J)
Simultaneous Operation
00 = Not Supported, X = Number of Sectors excluding Bank 1
4Bh
0000h
4Ch
0002h (PLxxxJ)
4Dh
0085h
ACC (Acceleration) Supply Minimum
00h = Not Supported, D7-D4: Volt, D3-D0: 100 mV
4Eh
0095h
ACC (Acceleration) Supply Maximum
00h = Not Supported, D7-D4: Volt, D3-D0: 100 mV
4Fh
0001h
Top/Bottom Boot Sector Flag
00h = Uniform device, 01h = Both top and bottom boot with write protect,
02h = Bottom Boot Device, 03h = Top Boot Device,
04h = Both Top and Bottom
50h
0001h
Program Suspend
0 = Not supported, 1 = Supported
57h
0004h
Bank Organization
00 = Data at 4Ah is zero, X = Number of Banks
58h
0027h (PL127J)
0017h (PL064J)
000Fh (PL032J)
Bank 1 Region Information
X = Number of Sectors in Bank 1
59h
0060h (PL127J)
0030h (PL064J)
0018h (PL032J)
Bank 2 Region Information
X = Number of Sectors in Bank 2
5Ah
0060h (PL127J)
0030h (PL064J)
0018h (PL032J)
Bank 3 Region Information
X = Number of Sectors in Bank 3
Burst Mode Type
00 = Not Supported, 01 = Supported
Page Mode Type
00 = Not Supported, 01 = 4 Word Page, 02 = 8 Word Page
S29PL127J/S29PL064J/S29PL032J for MCP
S29PL127J_064J_032J_MCP_00_A3 August 12, 2004
P r e l i m i n a r y
Table 12.
Addresses
Data
5Bh
0027h (PL127J)
0017h (PL064J)
000Fh (PL032J)
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
Primary Vendor-Specific Extended Query (Continued)
Description
Bank 4 Region Information
X = Number of Sectors in Bank 4
S29PL127J/S29PL064J/S29PL032J for MCP
43
P r e l i m i n a r y
Command Definitions
Writing specific address and data commands or sequences into the command
register initiates device operations. Table 13 defines the valid register command
sequences. Writing incorrect address and data values or writing them in the
improper sequence may place the device in an unknown state. A reset command is then required to return the device to reading array data.
All addresses are latched on the falling edge of WE# or CE#, whichever happens
later. All data is latched on the rising edge of WE# or CE#, whichever happens
first. Refer to the AC Characteristic section for timing diagrams.
Reading Array Data
The device is automatically set to reading array data after device power-up. No
commands are required to retrieve data. Each bank is ready to read array data
after completing an Embedded Program or Embedded Erase algorithm.
After the device accepts an Erase Suspend command, the corresponding bank
enters the erase-suspend-read mode, after which the system can read data from
any non-erase-suspended sector within the same bank. The system can read
array data using the standard read timing, except that if it reads at an address
within erase-suspended sectors, the device outputs status data. After completing
a programming operation in the Erase Suspend mode, the system may once
again read array data with the same exception. See the Erase Suspend/Erase Resume Commands section for more information.
The system must issue the reset command to return a bank to the read (or erasesuspend-read) mode if DQ5 goes high during an active program or erase operation, or if the bank is in the autoselect mode. See the next section, Reset
Command, for more information.
See also Requirements for Reading Array Data in the Device Bus Operations section for more information. The AC Characteristic table provides the read
parameters, and Figure 12 shows the timing diagram.
Reset Command
Writing the reset command resets the banks to the read or erase-suspend-read
mode. Address bits are don’t cares for this command.
The reset command may be written between the sequence cycles in an erase
command sequence before erasing begins. This resets the bank to which the system was writing to the read mode. Once erasure begins, however, the device
ignores reset commands until the operation is complete.
The reset command may be written between the sequence cycles in a program
command sequence before programming begins. This resets the bank to which
the system was writing to the read mode. If the program command sequence is
written to a bank that is in the Erase Suspend mode, writing the reset command
returns that bank to the erase-suspend-read mode. Once programming begins,
however, the device ignores reset commands until the operation is complete.
The reset command may be written between the sequence cycles in an autoselect
command sequence. Once in the autoselect mode, the reset command must be
written to return to the read mode. If a bank entered the autoselect mode while
in the Erase Suspend mode, writing the reset command returns that bank to the
erase-suspend-read mode.
44
S29PL127J/S29PL064J/S29PL032J for MCP
S29PL127J_064J_032J_MCP_00_A3 August 12, 2004
P r e l i m i n a r y
If DQ5 goes high during a program or erase operation, writing the reset command
returns the banks to the read mode (or erase-suspend-read mode if that bank
was in Erase Suspend).
Autoselect Command Sequence
The autoselect command sequence allows the host system to access the manufacturer and device codes, and determine whether or not a sector is protected.
The autoselect command sequence may be written to an address within a bank
that is either in the read or erase-suspend-read mode. The autoselect command
may not be written while the device is actively programming or erasing in the
other bank.
The autoselect command sequence is initiated by first writing two unlock cycles.
This is followed by a third write cycle that contains the bank address and the autoselect command. The bank then enters the autoselect mode. The system may
read any number of autoselect codes without reinitiating the command sequence.
Table 13 shows the address and data requirements. To determine sector protection information, the system must write to the appropriate bank address (BA) and
sector address (SA). Table 3 shows the address range and bank number associated with each sector.
The system must write the reset command to return to the read mode (or erasesuspend-read mode if the bank was previously in Erase Suspend).
Enter SecSi™ Sector/Exit SecSi Sector Command Sequence
The SecSi Sector region provides a secured data area containing a random, eight
word electronic serial number (ESN). The system can access the SecSi Sector region by issuing the three-cycle Enter SecSi Sector command sequence. The
device continues to access the SecSi Sector region until the system issues the
four-cycle Exit SecSi Sector command sequence. The Exit SecSi Sector command
sequence returns the device to normal operation. The SecSi Sector is not accessible when the device is executing an Embedded Program or embedded Erase
algorithm. Table 13 shows the address and data requirements for both command
sequences. See also “SecSi™ (Secured Silicon) Sector Flash Memory Region” for
further information. Note that the ACC function and unlock bypass modes are not
available when the SecSi Sector is enabled.
Word Program Command Sequence
Programming is a four-bus-cycle operation. The program command sequence is
initiated by writing two unlock write cycles, followed by the program set-up command. The program address and data are written next, which in turn initiate the
Embedded Program algorithm. The system is not required to provide further controls or timings. The device automatically provides internally generated program
pulses and verifies the programmed cell margin. Table 13 shows the address and
data requirements for the program command sequence. Note that the SecSi Sector, autoselect, and CFI functions are unavailable when a [program/erase]
operation is in progress.
When the Embedded Program algorithm is complete, that bank then returns to
the read mode and addresses are no longer latched. The system can determine
the status of the program operation by using DQ7, DQ6, or RY/BY#. Refer to the
Write Operation Status section for information on these status bits.
Any commands written to the device during the Embedded Program Algorithm
are ignored. Note that a hardware reset immediately terminates the program
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
S29PL127J/S29PL064J/S29PL032J for MCP
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P r e l i m i n a r y
operation. The program command sequence should be reinitiated once that bank
has returned to the read mode, to ensure data integrity. Note that the SecSi Sector, autoselect and CFI functions are unavailable when the SecSi Sector is
enabled.
Programming is allowed in any sequence and across sector boundaries. A bit
cannot be programmed from “0” back to a “1.” Attempting to do so may
cause that bank to set DQ5 = 1, or cause the DQ7 and DQ6 status bits to indicate
the operation was successful. However, a succeeding read will show that the data
is still “0.” Only erase operations can convert a “0” to a “1.”
Unlock Bypass Command Sequence
The unlock bypass feature allows the system to program data to a bank faster
than using the standard program command sequence. The unlock bypass command sequence is initiated by first writing two unlock cycles. This is followed by
a third write cycle containing the unlock bypass command, 20h. That bank then
enters the unlock bypass mode. A two-cycle unlock bypass program command
sequence is all that is required to program in this mode. The first cycle in this sequence contains the unlock bypass program command, A0h; the second cycle
contains the program address and data. Additional data is programmed in the
same manner. This mode dispenses with the initial two unlock cycles required in
the standard program command sequence, resulting in faster total programming
time. Table 13 shows the requirements for the command sequence.
During the unlock bypass mode, only the Unlock Bypass Program and Unlock Bypass Reset commands are valid. To exit the unlock bypass mode, the system
must issue the two-cycle unlock bypass reset command sequence. (See Table 14)
The device offers accelerated program operations through the WP#/ACC pin.
When the system asserts VHH on the WP#/ACC pin, the device automatically enters the Unlock Bypass mode. The system may then write the two-cycle Unlock
Bypass program command sequence. The device uses the higher voltage on the
WP#/ACC pin to accelerate the operation. Note that the WP#/ACC pin must not
be at VHH any operation other than accelerated programming, or device damage
may result. In addition, the WP#/ACC pin must not be left floating or unconnected; inconsistent behavior of the device may result.
4 illustrates the algorithm for the program operation. Refer to the Erase/Program
Operations table in the AC Characteristics section for parameters, and Figure 14
for timing diagrams.
46
S29PL127J/S29PL064J/S29PL032J for MCP
S29PL127J_064J_032J_MCP_00_A3 August 12, 2004
P r e l i m i n a r y
START
Write Program
Command Sequence
Data Poll
from System
Embedded
Program
algorithm
in progress
Verify Data?
No
Yes
Increment Address
No
Last Address?
Yes
Programming
Completed
Note: See Table 13 for program command sequence.
Figure 4. Program Operation
Chip Erase Command Sequence
Chip erase is a six bus cycle operation. The chip erase command sequence is initiated by writing two unlock cycles, followed by a set-up command. Two
additional unlock write cycles are then followed by the chip erase command,
which in turn invokes the Embedded Erase algorithm. The device does not require
the system to preprogram prior to erase. The Embedded Erase algorithm automatically preprograms and verifies the entire memory for an all zero data pattern
prior to electrical erase. The system is not required to provide any controls or timings during these operations. Table 13 shows the address and data requirements
for the chip erase command sequence.
When the Embedded Erase algorithm is complete, that bank returns to the read
mode and addresses are no longer latched. The system can determine the status
of the erase operation by using DQ7, DQ6, DQ2, or RY/BY#. Refer to the Write
Operation Status section for information on these status bits.
Any commands written during the chip erase operation are ignored. Note that
SecSi Sector, autoselect, and CFI functions are unavailable when a [program/
erase] operation is in progress. However, note that a hardware reset immediately terminates the erase operation. If that occurs, the chip erase command
sequence should be reinitiated once that bank has returned to reading array data,
to ensure data integrity.
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
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P r e l i m i n a r y
5 illustrates the algorithm for the erase operation. Refer to the Erase/Program
Operations tables in the AC Characteristics section for parameters, and Figure 16
section for timing diagrams.
Sector Erase Command Sequence
Sector erase is a six bus cycle operation. The sector erase command sequence is
initiated by writing two unlock cycles, followed by a set-up command. Two additional unlock cycles are written, and are then followed by the address of the
sector to be erased, and the sector erase command. Table 13 shows the address
and data requirements for the sector erase command sequence.
The device does not require the system to preprogram prior to erase. The Embedded Erase algorithm automatically programs and verifies the entire memory
for an all zero data pattern prior to electrical erase. The system is not required to
provide any controls or timings during these operations.
After the command sequence is written, a sector erase time-out of 50 µs occurs.
During the time-out period, additional sector addresses and sector erase commands may be written. Loading the sector erase buffer may be done in any
sequence, and the number of sectors may be from one sector to all sectors. The
time between these additional cycles must be less than 50 µs, otherwise erasure
may begin. Any sector erase address and command following the exceeded timeout may or may not be accepted. It is recommended that processor interrupts be
disabled during this time to ensure all commands are accepted. The interrupts
can be re-enabled after the last Sector Erase command is written. Any command other than Sector Erase or Erase Suspend during the time-out
period resets that bank to the read mode. The system must rewrite the command sequence and any additional addresses and commands. Note that SecSi
Sector, autoselect, and CFI functions are unavailable when a [program/erase]
operation is in progress.
The system can monitor DQ3 to determine if the sector erase timer has timed out
(See the section on DQ3: Sector Erase Timer). The time-out begins from the rising edge of the final WE# pulse in the command sequence.
When the Embedded Erase algorithm is complete, the bank returns to reading
array data and addresses are no longer latched. Note that while the Embedded
Erase operation is in progress, the system can read data from the non-erasing
bank. The system can determine the status of the erase operation by reading
DQ7, DQ6, DQ2, or RY/BY# in the erasing bank. Refer to the Write Operation Status section for information on these status bits.
Once the sector erase operation has begun, only the Erase Suspend command is
valid. All other commands are ignored. However, note that a hardware reset immediately terminates the erase operation. If that occurs, the sector erase
command sequence should be reinitiated once that bank has returned to reading
array data, to ensure data integrity.
5 illustrates the algorithm for the erase operation. Refer to the Erase/Program
Operations tables in the AC Characteristics section for parameters, and Figure 16
section for timing diagrams.
48
S29PL127J/S29PL064J/S29PL032J for MCP
S29PL127J_064J_032J_MCP_00_A3 August 12, 2004
P r e l i m i n a r y
START
Write Erase
Command Sequence
(Notes 1, 2)
Data Poll to Erasing
Bank from System
Embedded
Erase
algorithm
in progress
No
Data = FFh?
Yes
Erasure Completed
Notes:
1. See Table 13 for erase command sequence.
2. See the section on DQ3 for information on the sector erase timer.
Figure 5. Erase Operation
Erase Suspend/Erase Resume Commands
The Erase Suspend command, B0h, allows the system to interrupt a sector erase
operation and then read data from, or program data to, any sector not selected
for erasure. The bank address is required when writing this command. This command is valid only during the sector erase operation, including the 80 µs time-out
period during the sector erase command sequence. The Erase Suspend command
is ignored if written during the chip erase operation or Embedded Program
algorithm.
When the Erase Suspend command is written during the sector erase operation,
the device requires a maximum of 35 µs to suspend the erase operation. However, when the Erase Suspend command is written during the sector erase
time-out, the device immediately terminates the time-out period and suspends
the erase operation. Addresses are “don’t-cares” when writing the Erase suspend
command.
After the erase operation has been suspended, the bank enters the erase-suspend-read mode. The system can read data from or program data to any sector
not selected for erasure. (The device “erase suspends” all sectors selected for
erasure.) Reading at any address within erase-suspended sectors produces status information on DQ7–DQ0. The system can use DQ7, or DQ6 and DQ2
together, to determine if a sector is actively erasing or is erase-suspended. Refer
to the Write Operation Status section for information on these status bits.
After an erase-suspended program operation is complete, the bank returns to the
erase-suspend-read mode. The system can determine the status of the program
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
S29PL127J/S29PL064J/S29PL032J for MCP
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P r e l i m i n a r y
operation using the DQ7 or DQ6 status bits, just as in the standard Word Program
operation. Refer to the Write Operation Status section for more information.
In the erase-suspend-read mode, the system can also issue the autoselect command sequence. The device allows reading autoselect codes even at addresses
within erasing sectors, since the codes are not stored in the memory array. When
the device exits the autoselect mode, the device reverts to the Erase Suspend
mode, and is ready for another valid operation. Refer to the SecSiTM Sector Addresses and the Autoselect Command Sequence sections for details.
To resume the sector erase operation, the system must write the Erase Resume
command (address bits are don’t care). The bank address of the erase-suspended bank is required when writing this command. Further writes of the
Resume command are ignored. Another Erase Suspend command can be written
after the chip has resumed erasing.
If the Persistent Sector Protection Mode Locking Bit is verified as programmed
without margin, the Persistent Sector Protection Mode Locking Bit Program Command should be reissued to improve program margin. If the SecSi Sector
Protection Bit is verified as programmed without margin, the SecSi Sector Protection Bit Program Command should be reissued to improve program margin.
µµAfter programming a PPB, two additional cycles are needed to determine
whether the PPB has been programmed with margin. If the PPB has been programmed without margin, the program command should be reissued to improve
the program margin. Also note that the total number of PPB program/erase cycles
is limited to 100 cycles. Cycling the PPBs beyond 100 cycles is not guaranteed.
After erasing the PPBs, two additional cycles are needed to determine whether
the PPB has been erased with margin. If the PPBs has been erased without margin, the erase command should be reissued to improve the program margin. The
programming of either the PPB or DYB for a given sector or sector group can be
verified by writing a Sector Protection Status command to the device.
Note that there is no single command to independently verify the programming
of a DYB for a given sector group.
Command Definitions Tables
Command (Notes)
Cycles
Table 13.
Memory Array Command Definitions
Bus Cycles (Notes 1–4)
Addr
Data
Addr
Data
Addr
Data
Addr
Data
Addr
Data
Addr
Data
(BA)
X0E
(Note
10)
(BA)
X0F
(Note
10)
Read (Note 5)
1
RA
RD
Reset (Note 6)
1
XXX
F0
Manufacturer ID
4
555
AA
2AA
55
(BA)
555
90
(BA)
X00
01
Device ID (Note 10)
6
555
AA
2AA
55
(BA)
555
90
(BA)
X01
227E
SecSi Sector Factory
Protect (Note 8)
4
555
AA
2AA
55
(BA)
555
90
X03
(Note
8)
Sector Group Protect
Verify (Note 9)
4
555
AAA
2AA
55
(BA)
555
90
(SA)
X02
XX00/
XX01
Program
4
555
AA
2AA
55
555
A0
PA
PD
Chip Erase
6
555
AA
2AA
55
555
80
555
AA
2AA
55
555
10
Sector Erase
6
555
AA
2AA
55
555
80
555
AA
2AA
55
SA
30
Program/Erase Suspend (Note 11)
1
BA
B0
Program/Erase Resume (Note 12)
1
BA
30
Autoselect
(Note 7)
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S29PL127J_064J_032J_MCP_00_A3 August 12, 2004
P r e l i m i n a r y
Cycles
Table 13.
Command (Notes)
Memory Array Command Definitions
Bus Cycles (Notes 1–4)
Addr
Data
Addr
Data
PD
CFI Query (Note 13)
1
55
98
Accelerated Program (Note 15)
2
XX
A0
PA
Unlock Bypass Entry (Note 15)
3
555
AA
2AA
55
Unlock Bypass Program (Note 15)
2
XX
A0
PA
PD
Unlock Bypass Erase (Note 15)
2
XX
80
XX
10
Unlock Bypass CFI (Notes 13, 15)
1
XX
98
Unlock Bypass Reset (Note 15)
2
XXX
90
XXX
00
Legend:
BA = Address of bank switching to autoselect mode, bypass
mode, or erase operation. Determined by PL127J: Amax:A20,
PL064J: Amax:A19, PL032J: Amax:A18.
PA = Program Address (Amax:A0). Addresses latch on falling
edge of WE# or CE# pulse, whichever happens later.
PD = Program Data (DQ15:DQ0) written to location PA. Data
latches on rising edge of WE# or CE# pulse, whichever happens
first.
Addr
Data
555
20
Addr
Data
Addr
Data
Addr
Data
RA = Read Address (Amax:A0).
RD = Read Data (DQ15:DQ0) from location RA.
SA = Sector Address (Amax:A12) for verifying (in autoselect
mode) or erasing.
WD = Write Data. See “Configuration Register” definition for
specific write data. Data latched on rising edge of WE#.
X = Don’t care
Notes:
1. See Table 1 for description of bus operations.
2. All values are in hexadecimal.
9. The data is 00h for an unprotected sector group and 01h for
a protected sector group.
10. Device ID must be read across cycles 4, 5, and 6. PL127J
(X0Eh = 2220h, X0Fh = 2200h),PL064J (X0Eh = 2202h,
X0Fh = 2201h), PL032J (X0Eh = 220Ah, X0Fh = 2201h).
3. Shaded cells in table denote read cycles. All other cycles are
write operations.
4. During unlock and command cycles, when lower address bits
are 555 or 2AAh as shown in table, address bits higher than
A11 (except where BA is required) and data bits higher than
DQ7 are don’t cares.
11. System may read and program in non-erasing sectors, or
enter autoselect mode, when in Program/Erase Suspend
mode. Program/Erase Suspend command is valid only
during a sector erase operation, and requires bank address.
5. No unlock or command cycles required when bank is reading
array data.
12. Program/Erase Resume command is valid only during Erase
Suspend mode, and requires bank address.
6. The Reset command is required to return to reading array
(or to erase-suspend-read mode if previously in Erase
Suspend) when bank is in autoselect mode, or if DQ5 goes
high (while bank is providing status information).
13. Command is valid when device is ready to read array data or
when device is in autoselect mode.
14. WP#/ACC must be at VID during the entire operation of
command.
7. Fourth cycle of autoselect command sequence is a read
cycle. System must provide bank address to obtain
manufacturer ID or device ID information. See Autoselect
Command Sequence section for more information.
15. Unlock Bypass Entry command is required prior to any
Unlock Bypass operation. Unlock Bypass Reset command is
required to return to the reading array.
8. The data is C4h for factory and customer locked, 84h for
factory locked and 04h for not locked.
Command (Notes)
Cycles
Table 14.
Sector Protection Command Definitions
Bus Cycles (Notes 1-4)
Addr
Data
Addr
Data Addr Data
Addr
Data
Addr
Data
Addr
Data
68
OW
48
OW
RD(0)
OW
48
OW
RD(0)
XX[0-3]
PD[0-3]
Reset
1
XXX
F0
SecSi Sector Entry
3
555
AA
2AA
55
555
88
SecSi Sector Exit
4
555
AA
2AA
55
555
90
XX
00
SecSi Protection Bit
Program (Notes 5, 6)
6
555
AA
2AA
55
555
60
OW
SecSi Protection Bit
Status
5
555
AA
2AA
55
555
60
Password Program
(Notes 5, 7, 8)
4
555
AA
2AA
55
555
38
Password Verify (Notes
6, 8, 9)
4
555
AA
2AA
55
555
C8
Password Unlock (Notes
7
7, 10, 11)
555
AA
2AA
55
555
28
PWA[0]
PWD[0]
PPB Program (Notes 5,
6, 12)
555
AA
2AA
55
555
60
(SA)WP
68
6
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
Addr
Data
PWA[0-3] PWD[0-3]
PWA[1] PWD[1] PWA[2] PWD[2] PWA[3]
(SA)WP
S29PL127J/S29PL064J/S29PL032J for MCP
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(SA)WP
PWD[3]
RD(0)
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P r e l i m i n a r y
Table 14.
Sector Protection Command Definitions
PPB Status
4
555
AA
2AA
55
555
90
(SA)WP
RD(0)
All PPB Erase (Notes 5,
6, 13, 14)
6
555
AA
2AA
55
555
60
WP
60
PPB Lock Bit Set
3
555
AA
2AA
55
555
78
PPB Lock Bit Status
(Note 15)
4
555
AA
2AA
55
555
58
SA
RD(1)
DYB Write (Note 7)
4
555
AA
2AA
55
555
48
SA
X1
DYB Erase (Note 7)
4
555
AA
2AA
55
555
48
SA
X0
DYB Status (Note 6)
4
555
AA
2AA
55
555
58
SA
RD(0)
PPMLB Program (Notes
5, 6, 12)
6
555
AA
2AA
55
555
60
PL
68
PPMLB Status (Note 5)
5
555
AA
2AA
55
555
60
PL
SPMLB Program (Notes
5, 6, 12)
6
555
AA
2AA
55
555
60
SL
SPMLB Status (Note 5)
5
555
AA
2AA
55
555
60
SL
(SA)
40
(SA)WP
RD(0)
PL
48
PL
RD(0)
48
PL
RD(0)
68
SL
48
SL
RD(0)
48
SL
RD(0)
Legend:
DYB = Dynamic Protection Bit
OW = Address (A7:A0) is (00011010)
PD[3:0] = Password Data (1 of 4 portions)
PPB = Persistent Protection Bit
PWA = Password Address. A1:A0 selects portion of password.
PWD = Password Data being verified.
PL = Password Protection Mode Lock Address (A7:A0) is
(00001010)
RD(0) = Read Data DQ0 for protection indicator bit.
RD(1) = Read Data DQ1 for PPB Lock status.
SA = Sector Address where security command applies. Address
bits Amax:A12 uniquely select any sector.
SL = Persistent Protection Mode Lock Address (A7:A0) is
(00010010)
WP = PPB Address (A7:A0) is (00000010)
X = Don’t care
PPMLB = Password Protection Mode Locking Bit
SPMLB = Persistent Protection Mode Locking Bit
Notes:
1. See Table 1 for description of bus operations.
2. All values are in hexadecimal.
9. Command sequence returns FFh if PPMLB is set.
3. Shaded cells in table denote read cycles. All other cycles are
write operations.
4. During unlock and command cycles, when lower address bits
are 555 or 2AAh as shown in table, address bits higher than
A11 (except where BA is required) and data bits higher than
DQ7 are don’t cares.
5. The reset command returns device to reading array.
6. Cycle 4 programs the addressed locking bit. Cycles 5 and 6
validate bit has been fully programmed when DQ0 = 1. If
DQ0 = 0 in cycle 6, program command must be issued and
verified again.
7. Data is latched on the rising edge of WE#.
10. The password is written over four consecutive cycles, at
addresses 0-3.
11. A 2 µs timeout is required between any two portions of
password.
12. A 100 µs timeout is required between cycles 4 and 5.
13. A 1.2 ms timeout is required between cycles 4 and 5.
14. Cycle 4 erases all PPBs. Cycles 5 and 6 validate bits have
been fully erased when DQ0 = 0. If DQ0 = 1 in cycle 6,
erase command must be issued and verified again. Before
issuing erase command, all PPBs should be programmed to
prevent PPB overerasure.
15. DQ1 = 1 if PPB locked, 0 if unlocked.
8. Entire command sequence must be entered for each portion
of password.
Write Operation Status
The device provides several bits to determine the status of a program or erase operation: DQ2, DQ3, DQ5, DQ6, and DQ7. Table 15 and the following subsections describe
the function of these bits. DQ7 and DQ6 each offer a method for determining whether
a program or erase operation is complete or in progress. The device also provides a
hardware-based output signal, RY/BY#, to determine whether an Embedded Program
or Erase operation is in progress or has been completed.
DQ7: Data# Polling
The Data# Polling bit, DQ7, indicates to the host system whether an Embedded Program or Erase algorithm is in progress or completed, or whether a bank is in Erase
Suspend. Data# Polling is valid after the rising edge of the final WE# pulse in the command sequence.
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S29PL127J/S29PL064J/S29PL032J for MCP
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During the Embedded Program algorithm, the device outputs on DQ7 the complement
of the datum programmed to DQ7. This DQ7 status also applies to programming during
Erase Suspend. When the Embedded Program algorithm is complete, the device outputs the datum programmed to DQ7. The system must provide the program address
to read valid status information on DQ7. If a program address falls within a protected
sector, Data# Polling on DQ7 is active for approximately 1 µs, then that bank returns
to the read mode.
During the Embedded Erase algorithm, Data# Polling produces a “0” on DQ7.
When the Embedded Erase algorithm is complete, or if the bank enters the Erase
Suspend mode, Data# Polling produces a “1” on DQ7. The system must provide
an address within any of the sectors selected for erasure to read valid status information on DQ7.
After an erase command sequence is written, if all sectors selected for erasing
are protected, Data# Polling on DQ7 is active for approximately 400 µs, then the
bank returns to the read mode. If not all selected sectors are protected, the Embedded Erase algorithm erases the unprotected sectors, and ignores the selected
sectors that are protected. However, if the system reads DQ7 at an address within
a protected sector, the status may not be valid.
When the system detects DQ7 has changed from the complement to true data,
it can read valid data at DQ15–DQ0 on the following read cycles. Just prior to the
completion of an Embedded Program or Erase operation, DQ7 may change asynchronously with DQ15–DQ0 while Output Enable (OE#) is asserted low. That is,
the device may change from providing status information to valid data on DQ7.
Depending on when the system samples the DQ7 output, it may read the status
or valid data. Even if the device has completed the program or erase operation
and DQ7 has valid data, the data outputs on DQ15–DQ0 may be still invalid. Valid
data on DQ15–DQ0 will appear on successive read cycles.
Table 15 shows the outputs for Data# Polling on DQ7. 6 shows the Data# Polling
algorithm. 18 in the AC Characteristic section shows the Data# Polling timing
diagram.
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
S29PL127J/S29PL064J/S29PL032J for MCP
53
P r e l i m i n a r y
START
Read DQ7–DQ0
Addr = VA
DQ7 = Data?
Yes
No
No
DQ5 = 1?
Yes
Read DQ7–DQ0
Addr = VA
DQ7 = Data?
Yes
No
FAIL
PASS
Notes:
1. VA = Valid address for programming. During a sector erase operation, a valid address is
any sector address within the sector being erased. During chip erase, a valid address is
any non-protected sector address.
2. DQ7 should be rechecked even if DQ5 = “1” because DQ7 may change simultaneously
with DQ5.
Figure 6. Data# Polling Algorithm
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S29PL127J/S29PL064J/S29PL032J for MCP
S29PL127J_064J_032J_MCP_00_A3 August 12, 2004
P r e l i m i n a r y
RY/BY#: Ready/Busy#
The RY/BY# is a dedicated, open-drain output pin which indicates whether an
Embedded Algorithm is in progress or complete. The RY/BY# status is valid after
the rising edge of the final WE# pulse in the command sequence. Since RY/BY#
is an open-drain output, several RY/BY# pins can be tied together in parallel with
a pull-up resistor to VCC.
If the output is low (Busy), the device is actively erasing or programming. (This
includes programming in the Erase Suspend mode.) If the output is high (Ready),
the device is in the read mode, the standby mode, or one of the banks is in the
erase-suspend-read mode.
Table 15 shows the outputs for RY/BY#.
DQ6: Toggle Bit I
Toggle Bit I on DQ6 indicates whether an Embedded Program or Erase algorithm
is in progress or complete, or whether the device has entered the Erase Suspend
mode. Toggle Bit I may be read at any address, and is valid after the rising edge
of the final WE# pulse in the command sequence (prior to the program or erase
operation), and during the sector erase time-out.
During an Embedded Program or Erase algorithm operation, successive read cycles to any address cause DQ6 to toggle. The system may use either OE# or CE#
to control the read cycles. When the operation is complete, DQ6 stops toggling.
After an erase command sequence is written, if all sectors selected for erasing
are protected, DQ6 toggles for approximately 400 µs, then returns to reading
array data. If not all selected sectors are protected, the Embedded Erase algorithm erases the unprotected sectors, and ignores the selected sectors that are
protected.
The system can use DQ6 and DQ2 together to determine whether a sector is actively erasing or is erase-suspended. When the device is actively erasing (that is,
the Embedded Erase algorithm is in progress), DQ6 toggles. When the device enters the Erase Suspend mode, DQ6 stops toggling. However, the system must
also use DQ2 to determine which sectors are erasing or erase-suspended. Alternatively, the system can use DQ7 (see the DQ7: Data# Polling).
If a program address falls within a protected sector, DQ6 toggles for approximately 1 µs after the program command sequence is written, then returns to
reading array data.
DQ6 also toggles during the erase-suspend-program mode, and stops toggling
once the Embedded Program algorithm is complete.
Table 15 shows the outputs for Toggle Bit I on DQ6. Figure 7 shows the toggle bit
algorithm. Figure 19 in “Read Operation Timings” shows the toggle bit timing diagrams. Figure 20 shows the differences between DQ2 and DQ6 in graphical
form. See also the DQ2: Toggle Bit II.
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
S29PL127J/S29PL064J/S29PL032J for MCP
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P r e l i m i n a r y
START
Read Byte
(DQ7–DQ0)
Address =VA
Read Byte
(DQ7–DQ0)
Address =VA
Toggle Bit
= Toggle?
No
Yes
No
DQ5 = 1?
Yes
Read Byte Twice
(DQ7–DQ0)
Address = VA
Toggle Bit
= Toggle?
No
Yes
Program/Erase
Operation Not
Complete, Write
Reset Command
Program/Erase
Operation Complete
Note: The system should recheck the toggle bit even if DQ5 = “1” because the toggle
bit may stop toggling as DQ5 changes to “1.” See the DQ6: Toggle Bit I and DQ2:
Toggle Bit II for more information.
Figure 7. Toggle Bit Algorithm
DQ2: Toggle Bit II
The “Toggle Bit II” on DQ2, when used with DQ6, indicates whether a particular
sector is actively erasing (that is, the Embedded Erase algorithm is in progress),
or whether that sector is erase-suspended. Toggle Bit II is valid after the rising
edge of the final WE# pulse in the command sequence.
DQ2 toggles when the system reads at addresses within those sectors that have
been selected for erasure. (The system may use either OE# or CE# to control the
read cycles.) But DQ2 cannot distinguish whether the sector is actively erasing or
is erase-suspended. DQ6, by comparison, indicates whether the device is actively
erasing, or is in Erase Suspend, but cannot distinguish which sectors are selected
for erasure. Thus, both status bits are required for sector and mode information.
Refer to Table 15 to compare outputs for DQ2 and DQ6.
Figure 7 shows the toggle bit algorithm in flowchart form, and the DQ2: Toggle
Bit II explains the algorithm. See also the DQ6: Toggle Bit I. Figure 19 shows the
toggle bit timing diagram. Figure 20 shows the differences between DQ2 and DQ6
in graphical form.
Reading Toggle Bits DQ6/DQ2
Refer to Figure 7 for the following discussion. Whenever the system initially begins reading toggle bit status, it must read DQ7–DQ0 at least twice in a row to
determine whether a toggle bit is toggling. Typically, the system would note and
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S29PL127J/S29PL064J/S29PL032J for MCP
S29PL127J_064J_032J_MCP_00_A3 August 12, 2004
P r e l i m i n a r y
store the value of the toggle bit after the first read. After the second read, the
system would compare the new value of the toggle bit with the first. If the toggle
bit is not toggling, the device has completed the program or erase operation. The
system can read array data on DQ7–DQ0 on the following read cycle.
However, if after the initial two read cycles, the system determines that the toggle
bit is still toggling, the system also should note whether the value of DQ5 is high
(see the section on DQ5). If it is, the system should then determine again
whether the toggle bit is toggling, since the toggle bit may have stopped toggling
just as DQ5 went high. If the toggle bit is no longer toggling, the device has successfully completed the program or erase operation. If it is still toggling, the
device did not completed the operation successfully, and the system must write
the reset command to return to reading array data.
The remaining scenario is that the system initially determines that the toggle bit
is toggling and DQ5 has not gone high. The system may continue to monitor the
toggle bit and DQ5 through successive read cycles, determining the status as described in the previous paragraph. Alternatively, it may choose to perform other
system tasks. In this case, the system must start at the beginning of the algorithm when it returns to determine the status of the operation (top of Figure 7).
DQ5: Exceeded Timing Limits
DQ5 indicates whether the program or erase time has exceeded a specified internal pulse count limit. Under these conditions DQ5 produces a “1,” indicating that the
program or erase cycle was not successfully completed.
The device may output a “1” on DQ5 if the system tries to program a “1” to a
location that was previously programmed to “0.” Only an erase operation can
change a “0” back to a “1.” Under this condition, the device halts the operation, and when the timing limit has been exceeded, DQ5 produces a “1.”
Under both these conditions, the system must write the reset command to return
to the read mode (or to the erase-suspend-read mode if a bank was previously
in the erase-suspend-program mode).
DQ3: Sector Erase Timer
After writing a sector erase command sequence, the system may read DQ3 to determine whether or not erasure has begun. (The sector erase timer does not
apply to the chip erase command.) If additional sectors are selected for erasure,
the entire time-out also applies after each additional sector erase command.
When the time-out period is complete, DQ3 switches from a “0” to a “1.” See also
the Sector Erase Command Sequence.
After the sector erase command is written, the system should read the status of
DQ7 (Data# Polling) or DQ6 (Toggle Bit I) to ensure that the device has accepted
the command sequence, and then read DQ3. If DQ3 is “1,” the Embedded Erase
algorithm has begun; all further commands (except Erase Suspend) are ignored
until the erase operation is complete. If DQ3 is “0,” the device will accept additional sector erase commands. To ensure the command has been accepted, the
system software should check the status of DQ3 prior to and following each subsequent sector erase command. If DQ3 is high on the second status check, the
last command might not have been accepted.
Table 15 shows the status of DQ3 relative to the other status bits.
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
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P r e l i m i n a r y
Table 15.
DQ7
(Note 2)
DQ6
DQ5
(Note 1)
DQ3
DQ2
(Note 2)
RY/BY#
DQ7#
Toggle
0
N/A
No toggle
0
0
Toggle
0
1
Toggle
0
Erase
Suspended Sector
1
No toggle
0
N/A
Toggle
1
Non-Erase
Suspended Sector
Data
Data
Data
Data
Data
1
DQ7#
Toggle
0
N/A
N/A
0
Status
Standard
Mode
Erase
Suspend
Mode
Embedded Program Algorithm
Embedded Erase Algorithm
Erase-SuspendRead
Write Operation Status
Erase-Suspend-Program
Notes:
1. DQ5 switches to ‘1’ when an Embedded Program or Embedded Erase operation has exceeded the maximum timing
limits. Refer to the section on DQ5 for more information.
2. DQ7 and DQ2 require a valid address when reading status information. Refer to the appropriate subsection for
further details.
3. When reading write operation status bits, the system must always provide the bank address where the Embedded
Algorithm is in progress. The device outputs array data if the system addresses a non-busy bank.
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S29PL127J/S29PL064J/S29PL032J for MCP
S29PL127J_064J_032J_MCP_00_A3 August 12, 2004
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Absolute Maximum Ratings
Storage Temperature Plastic Packages . . . . . . . . . . . . . . . . .–65°C to +150°C
Ambient Temperature with Power Applied. . . . . . . . . . . . . . .–65°C to +125°C
Voltage with Respect to Ground
VCC (Note 1). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to +4.0 V
RESET# (Note 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to +13.0 V
WP#/ACC (Note 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to +10.5 V
All other pins (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to VCC +0.5 V
Output Short Circuit Current (Note 3) . . . . . . . . . . . . . . . . . . . . . . . 200 mA
Notes:
1. Minimum DC voltage on input or I/O pins is –0.5 V. During voltage transitions,
input or I/O pins may overshoot VSS to –2.0 V for periods of up to 20 ns. Maximum
DC voltage on input or I/O pins is VCC +0.5 V. During voltage transitions, input or
I/O pins may overshoot to VCC +2.0 V for periods up to 20 ns. See Figure 8.
2. Minimum DC input voltage on pins A9, OE#, RESET#, and WP#/ACC is –0.5 V.
During voltage transitions, A9, OE#, WP#/ACC, and RESET# may overshoot VSS
to –2.0 V for periods of up to 20 ns. See Figure 8. Maximum DC input voltage on
pin A9, OE#, and RESET# is +12.5 V which may overshoot to +14.0 V for periods
up to 20 ns. Maximum DC input voltage on WP#/ACC is +9.5 V which may
overshoot to +12.0 V for periods up to 20 ns.
3. No more than one output may be shorted to ground at a time. Duration of the
short circuit should not be greater than one second.
4. Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those indicated in the operational
sections of this data sheet is not implied. Exposure of the device to absolute maximum rating conditions for extended periods may affect device reliability.
20 ns
20 ns
20 ns
VCC
+2.0 V
VCC
+0.5 V
+0.8 V
–0.5 V
–2.0 V
2.0 V
20 ns
20 ns
Maximum Negative Overshoot Waveform
20 ns
Maximum Positive Overshoot Waveform
Figure 8. Maximum Overshoot Waveforms
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
S29PL127J/S29PL064J/S29PL032J for MCP
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P r e l i m i n a r y
Operating Ranges
Operating ranges define those limits between which the functionality of the device is guaranteed.
Industrial (I) Devices
Ambient Temperature (TA) . . . . . . . . . . . . . . . . . . . . . . . . . –40°C to +85°C
Wireless Devices
Ambient Temperature (TA) . . . . . . . . . . . . . . . . . . . . . . . . . –25°C to +85°C
Supply Voltages
VCC
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2.7–3.1 V
VIO (see Note) . . 1.65–1.95 V (for PL127J) or 2.7–3.1 V (for all PLxxxJ devices)
Notes:
For all AC and DC specifications, VIO = VCC; contact your local sales office for other
VIO options.
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S29PL127J/S29PL064J/S29PL032J for MCP
S29PL127J_064J_032J_MCP_00_A3 August 12, 2004
P r e l i m i n a r y
DC Characteristics
Table 16.
Parameter
Symbol
CMOS Compatible
Parameter Description
Test Conditions
Min
Typ
Max
Unit
±1.0
µA
ILI
Input Load Current
VIN = VSS to VCC,
VCC = VCC max
ILIT
A9, OE#, RESET# Input Load Current
VCC = VCC max; VID= 12.5 V
35
µA
ILR
Reset Leakage Current
VCC = VCC max; VID= 12.5 V
35
µA
ILO
Output Leakage Current
VOUT = VSS to VCC, OE# = VIH
VCC = VCC max
±1.0
µA
ICC1
VCC Active Read Current (Notes 1, 2)
OE# = VIH, VCC = VCC max
(Note 1)
ICC2
VCC Active Write Current (Notes 2, 3)
ICC3
ICC4
5 MHz
15
25
10 MHz
45
55
OE# = VIH, WE# = VIL
15
25
mA
VCC Standby Current (Note 2)
CE#, RESET#, WP#/ACC
= VIO ± 0.3 V
0.2
5
µA
VCC Reset Current (Note 2)
RESET# = VSS ± 0.3 V
0.2
5
µA
ICC5
Automatic Sleep Mode (Notes 2, 4)
VIH = VIO ± 0.3 V;
VIL = VSS ± 0.3 V
0.2
5
µA
ICC6
VCC Active Read-While-Program Current
(Notes 1, 2)
OE# = VIH,
ICC7
VCC Active Read-While-Erase Current
(Notes 1, 2)
OE# = VIH,
ICC8
VCC Active Program-While-EraseSuspended Current (Notes 2, 5)
ICC9
VCC Active Page Read Current (Note 2)
VIL
Input Low Voltage
mA
5 MHz
21
45
10 MHz
46
70
5 MHz
21
45
10 MHz
46
70
OE# = VIH
17
25
mA
OE# = VIH, 8 word Page Read
10
15
mA
mA
mA
VIO = 1.65–1.95 V (PL127J)
–0.4
0.4
V
VIO = 2.7–3.6 V
–0.5
0.8
V
VIO–0.4
VIO+0.4
V
VIO = 2.7–3.6 V
2.0
VCC+0.3
V
VIO = 1.65–1.95 V (PL127J)
VIH
Input High Voltage
VHH
Voltage for ACC Program Acceleration
VCC = 3.0 V ± 10%
8.5
9.5
V
VID
Voltage for Autoselect and Temporary
Sector Unprotect
VCC = 3.0 V ± 10%
11.5
12.5
V
V
Output Low Voltage
IOL = 100 µA, VCC = VCC min, VIO = 1.65–
1.95 V (PL127J)
0.1
VOL
IOL = 2.0 mA, VCC = VCC min, VIO = 2.7–3.6
V
0.4
V
VOH
VLKO
Output High Voltage
IOH = –100 µA, VCC = VCC min, VIO = 1.65–
1.95 V (PL127J)
VIO–0.1
V
IOH = –2.0 mA, VCC = VCC min, VIO = 2.7–3.6
V
2.4
V
Low VCC Lock-Out Voltage (Note 5)
2.3
2.5
V
Notes:
1. The ICC current listed is typically less than 5 mA/MHz, with OE# at VIH.
2. Maximum ICC specifications are tested with VCC = VCCmax.
3. ICC active while Embedded Erase or Embedded Program is in progress.
4. Automatic sleep mode enables the low power mode when addresses remain stable for tACC + 30 ns. Typical sleep
mode current is 1 mA.
5. Not 100% tested.
6. Valid CE1#/CE2# conditions: (CE1# = VIL, CE2# = VIH,) or (CE1# = VIH, CE2# = VIL) or (CE1# = VIH, CE2# = VIH)
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
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P r e l i m i n a r y
AC Characteristic
Test Conditions
3.6 V
2.7 kΩ
Device
Under
Test
CL
Device
Under
Test
CL
6.2 kΩ
VIO = 3.0 V
Note: Diodes are IN3064 or equivalent
VIO = 1.8 V (PL127J)
Figure 9.
Test Setups
Table 17. Test Specifications
Test Condition
All Speeds
Output Load
Unit
1 TTL gate
Output Load Capacitance, CL (including jig capacitance)
VIO = 1.8 V
(PL127J)
Input Rise and Fall Times
30
pF
5
ns
VIO = 3.0 V
Input Pulse Levels
VIO = 1.8 V
(PL127J)
0.0 - 1.8
VIO = 3.0 V
0.0–3.0
V
Input timing measurement reference levels
VIO/2
V
Output timing measurement reference levels
VIO/2
V
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S29PL127J_064J_032J_MCP_00_A3 August 12, 2004
P r e l i m i n a r y
SWITCHING WAVEFORMS
Table 18. KEY TO SWITCHING WAVEFORMS
WAVEFORM
INPUTS
OUTPUTS
Steady
Changing from H to L
Changing from L to H
VIO
Don’t Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Center Line is High Impedance State (High Z)
VIO/2
In
Measurement Level
VIO/2
Output
0.0 V
Figure 10. Input Waveforms and Measurement Levels
VCC RampRate
All DC characteristics are specified for a VCC ramp rate > 1V/100 µs and VCC
>=VCCQ - 100 mV. If the VCC ramp rate is < 1V/100 µs, a hardware reset
required.+
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
S29PL127J/S29PL064J/S29PL032J for MCP
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Read Operations
Table 19.
Read-Only Operations
Parameter
Speed Options
JEDEC
Std.
Description
Test Setup
tAVAV
tRC
Read Cycle Time (Note 1)
tAVQV
tACC
Address to Output Delay
tELQV
tCE
Chip Enable to Output Delay
55
60
65
70
Unit
Min
55
60
65
70
ns
CE#, OE# = VIL
Max
55
60
65
70
ns
OE# = VIL
Max
55
60
65
70
ns
Max
20
25
30
ns
20
25
30
ns
tPACC Page Access Time
tGLQV
tOE
Output Enable to Output Delay
Max
tEHQZ
tDF
Chip Enable to Output High Z (Note 3)
Max
16
ns
tGHQZ
tDF
Output Enable to Output High Z (Notes 1,
3)
Max
16
ns
tAXQX
tOH
Output Hold Time From Addresses, CE# or
OE#, Whichever Occurs First (Note 3)
Min
5
ns
Read
Min
0
ns
tOEH
Output Enable Hold
Time (Note 1)
Toggle and
Data# Polling
Min
10
ns
Notes:
1. Not 100% tested.
2. See Figure 9 and Table 17 for test specifications
3. Measurements performed by placing a 50 ohm termination on the data pin with a bias of VCC /2. The time from OE#
high to the data bus driven to VCC /2 is taken as tDF.
4. For 70pF Output Load Capacitance, 2 ns will be added to the above tACC,tCE,tPACC,tOE values for all speed grades
tRC
Addresses Stable
Addresses
tACC
CE#
tRH
tRH
tDF
tOE
OE#
tOEH
WE#
tCE
tOH
HIGH Z
HIGH Z
Valid Data
Data
RESET#
RY/BY#
0V
Figure 11. Read Operation Timings
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S29PL127J/S29PL064J/S29PL032J for MCP
S29PL127J_064J_032J_MCP_00_A3 August 12, 2004
P r e l i m i n a r y
Same Page
Amax-A3
A2-A0
Aa
tACC
Data
Ab
Qa
Ad
Ac
tPACC
tPACC
Qb
tPACC
Qc
Qd
CE#
OE#
Figure 12. Page Read Operation Timings
Reset
Table 20. Hardware Reset (RESET#)
Parameter
JEDEC
Std
Description
All Speed Options
Unit
tReady
RESET# Pin Low (During Embedded Algorithms)
to Read Mode (See Note)
Max
35
µs
tReady
RESET# Pin Low (NOT During Embedded
Algorithms) to Read Mode (See Note)
Max
500
ns
tRP
RESET# Pulse Width
Min
500
ns
tRH
Reset High Time Before Read (See Note)
Min
50
ns
tRPD
RESET# Low to Standby Mode
Min
20
µs
tRB
RY/BY# Recovery Time
Min
0
ns
Note: Not 100% tested.
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
S29PL127J/S29PL064J/S29PL032J for MCP
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P r e l i m i n a r y
RY/BY#
CE#, OE#
tRH
RESET#
tRP
tReady
Reset Timings NOT during Embedded Algorithms
Reset Timings during Embedded Algorithms
tReady
RY/BY#
tRB
CE#, OE#
RESET#
tRP
Figure 13. Reset Timings
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S29PL127J/S29PL064J/S29PL032J for MCP
S29PL127J_064J_032J_MCP_00_A3 August 12, 2004
P r e l i m i n a r y
Erase/Program Operations
Table 21. Erase and Program Operations
Parameter
Speed Options
JEDEC
Std
Description
tAVAV
tWC
Write Cycle Time (Note 1)
Min
tAVWL
tAS
Address Setup Time
Min
0
ns
tASO
Address Setup Time to OE# low during toggle bit
polling
Min
15
ns
tAH
Address Hold Time
Min
tAHT
Address Hold Time From CE# or OE# high during
toggle bit polling
Min
tDVWH
tDS
Data Setup Time
Min
tWHDX
tDH
Data Hold Time
Min
0
ns
tOEPH
Output Enable High during toggle bit polling
Min
10
ns
tGHWL
tGHWL
Read Recovery Time Before Write
(OE# High to WE# Low)
Min
0
ns
tELWL
tCS
CE# Setup Time
Min
0
ns
tWHEH
tCH
CE# Hold Time
Min
0
ns
tWLWH
tWP
Write Pulse Width
Min
35
40
ns
tWHDL
tWPH
Write Pulse Width High
Min
20
25
ns
tSR/W
Latency Between Read and Write Operations
Min
0
ns
tWLAX
55
60
65
70
Unit
55
60
65
70
ns
30
35
0
25
ns
ns
30
ns
tWHWH1
tWHWH1
Programming Operation (Note 2)
Typ
6
µs
tWHWH1
tWHWH1
Accelerated Programming Operation (Note 2)
Typ
4
µs
tWHWH2
tWHWH2
Sector Erase Operation (Note 2)
Typ
0.5
sec
tVCS
VCC Setup Time (Note 1)
Min
50
µs
tRB
Write Recovery Time from RY/BY#
Min
0
ns
Program/Erase Valid to RY/BY# Delay
Max
90
ns
tBUSY
Notes:
1. Not 100% tested.
2. See the “Erase And Programming Performance” section for more information.
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
S29PL127J/S29PL064J/S29PL032J for MCP
67
P r e l i m i n a r y
Timing Diagrams
Program Command Sequence (last two cycles)
tAS
tWC
Addresses
Read Status Data (last two cycles)
555h
PA
PA
PA
tAH
CE#
tCH
OE#
tWHWH1
tWP
WE#
tWPH
tCS
tDS
tDH
PD
A0h
Data
Status
tBUSY
DOUT
tRB
RY/BY#
VCC
tVCS
Notes:
1. PA = program address, PD = program data, DOUT is the true data at the program address
Figure 14.
Program Operation Timings
VHH
WP#/ACC
VIL or VIH
VIL or VIH
tVHH
tVHH
Figure 15.
68
Accelerated Program Timing Diagram
S29PL127J/S29PL064J/S29PL032J for MCP
S29PL127J_064J_032J_MCP_00_A3 August 12, 2004
P r e l i m i n a r y
Erase Command Sequence (last two cycles)
tAS
tWC
2AAh
Addresses
Read Status Data
VA
SA
VA
555h for chip erase
tAH
CE#
tCH
OE#
tWP
WE#
tWPH
tCS
tWHWH2
tDS
tDH
Data
55h
30h
Status
DOUT
10 for Chip Erase
tBUSY
tRB
RY/BY#
tVCS
VCC
Notes:
1. SA = sector address (for Sector Erase), VA = Valid Address for reading status data (see “Write Operation Status”
Figure 16. Chip/Sector Erase Operation Timings
Addresses
tWC
tWC
tRC
Valid PA
Valid RA
tWC
tAS
Valid PA
Valid PA
tAH
tAS
tCPH
tACC
tAH
tCE
CE#
tCP
tOE
OE#
tOEH
tGHWL
tWP
WE#
tWPH
tDF
tDS
tOH
tDH
Data
Valid
Out
Valid
In
Valid
In
Valid
In
tSR/W
WE# Controlled Write Cycle
Read Cycle
CE# Controlled Write Cycles
Figure 17. Back-to-back Read/Write Cycle Timings
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
S29PL127J/S29PL064J/S29PL032J for MCP
69
P r e l i m i n a r y
tRC
Addresses
VA
VA
VA
tACC
tCE
CE#
tCH
tOE
OE#
tOEH
tDF
WE#
tOH
High Z
DQ7
Complement
Complement
DQ6–DQ0
Status Data
Status Data
Valid Data
True
High Z
Valid Data
True
tBUSY
RY/BY#
Note: VA = Valid address. Illustration shows first status cycle after command sequence, last status read cycle, and
array data read cycle
Figure 18. Data# Polling Timings (During Embedded Algorithms)
tAHT
tAS
Addresses
tAHT
tASO
CE#
tCEPH
tOEH
WE#
tOEPH
OE#
tDH
DQ6/DQ2
Valid Data
tOE
Valid
Status
Valid
Status
Valid
Status
(first read)
(second read)
(stops toggling)
Valid Data
RY/BY#
Notes:
1. VA = Valid address; not required for DQ6. Illustration shows first two status cycle after command sequence, last
status read cycle, and array data read cycle
Figure 19. Toggle Bit Timings (During Embedded Algorithms)
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S29PL127J/S29PL064J/S29PL032J for MCP
S29PL127J_064J_032J_MCP_00_A3 August 12, 2004
P r e l i m i n a r y
Enter
Embedded
Erasing
Erase
Suspend
Erase
WE#
Enter Erase
Suspend Program
Erase
Resume
Erase
Suspend
Program
Erase Suspend
Read
Erase
Complete
Erase
Erase Suspend
Read
DQ6
DQ2
Note:Note: DQ2 toggles only when read at an address within an erase-suspended sector. The system may use OE#
or CE# to toggle DQ2 and DQ6.
Figure 20.
DQ2 vs. DQ6
Protect/Unprotect
Table 22. Temporary Sector Unprotect
Parameter
JEDEC
Std
Description
All Speed Options
Unit
tVIDR
VID Rise and Fall Time (See Note)
Min
500
ns
tVHH
VHH Rise and Fall Time (See Note)
Min
250
ns
tRSP
RESET# Setup Time for Temporary Sector
Unprotect
Min
4
µs
tRRB
RESET# Hold Time from RY/BY# High for
Temporary Sector Unprotect
Min
4
µs
Note: Not 100% tested.
VID
VID
RESET#
VIL or VIH
VIL or VIH
tVIDR
tVIDR
Program or Erase Command Sequence
CE#
WE#
tRSP
tRRB
RY/BY#
Figure 21. Temporary Sector Unprotect Timing Diagram
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
S29PL127J/S29PL064J/S29PL032J for MCP
71
P r e l i m i n a r y
VID
VIH
RESET#
SA, A6,
A1, A0
Valid*
Valid*
Sector Group Protect/Unprotect
Data
60h
60h
Valid*
Verify
40h
Status
1 µs
Sector Group Protect: 150 µs
Sector Group Unprotect: 15 ms
CE#
WE#
OE#
Notes:
1. For sector protect, A6 = 0, A1 = 1, A0 = 0. For sector unprotect, A6 = 1, A1 = 1, A0 = 0.
Figure 22.
72
Sector/Sector Block Protect and Unprotect Timing Diagram
S29PL127J/S29PL064J/S29PL032J for MCP
S29PL127J_064J_032J_MCP_00_A3 August 12, 2004
P r e l i m i n a r y
Controlled Erase Operations
Table 23. Alternate CE# Controlled Erase and Program Operations
Parameter
Speed Options
JEDEC
Std
Description
55
60
65
70
Unit
tAVAV
tWC
Write Cycle Time (Note 1)
Min
55
60
65
70
ns
tAVWL
tAS
Address Setup Time
Min
tELAX
tAH
Address Hold Time
Min
30
35
ns
tDVEH
tDS
Data Setup Time
Min
25
30
ns
tEHDX
tDH
Data Hold Time
Min
0
ns
tGHEL
tGHEL
Read Recovery Time Before Write
(OE# High to WE# Low)
Min
0
ns
tWLEL
tWS
WE# Setup Time
Min
0
ns
tEHWH
tWH
WE# Hold Time
Min
0
ns
tELEH
tCP
CE# Pulse Width
Min
35
40
ns
tEHEL
tCPH
CE# Pulse Width High
Min
20
25
ns
tWHWH1
tWHWH1
Programming Operation (Note 2)
Typ
6
µs
tWHWH1
tWHWH1
Accelerated Programming Operation (Note 2)
Typ
4
µs
tWHWH2
tWHWH2
Sector Erase Operation (Note 2)
Typ
0.5
sec
0
ns
Notes:
1. Not 100% tested.
2. See the “Erase And Programming Performance” section for more information.
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
S29PL127J/S29PL064J/S29PL032J for MCP
73
P r e l i m i n a r y
555 for program
2AA for erase
PA for program
SA for sector erase
555 for chip erase
Data# Polling
Addresses
PA
tWC
tAS
tAH
tWH
WE#
tGHEL
OE#
tCP
CE#
tWS
tWHWH1 or 2
tCPH
tBUSY
tDS
tDH
DQ7#
Data
tRH
A0 for program
55 for erase
DOUT
PD for program
30 for sector erase
10 for chip erase
RESET#
RY/BY#
Notes:
1. Figure indicates last two bus cycles of a program or erase operation.
2. PA = program address, SA = sector address, PD = program data.
3. DQ7# is the complement of the data written to the device. DOUT is the data written to the device
Table 24. Alternate CE# Controlled Write (Erase/Program) Operation Timings
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S29PL127J/S29PL064J/S29PL032J for MCP
S29PL127J_064J_032J_MCP_00_A3 August 12, 2004
P r e l i m i n a r y
Table 25.
Parameter
Erase And Programming Performance
Typ (Note 1)
Max (Note 2)
Unit
0.5
2
sec
Sector Erase Time
Chip Erase Time
PL127J
135
216
sec
PL064J
71
113.6
sec
PL032J
39
62.4
sec
6
100
µs
Word Program Time
Accelerated Word Program Time
Chip Program Time
(Note 3)
4
60
µs
PL127J
50.4
200
sec
PL064J
25.2
50.4
sec
PL032J
12.6
25.2
sec
Comments
Excludes 00h programming
prior to erasure (Note 4)
Excludes system level
overhead (Note 5)
Notes:
1. Typical program and erase times assume the following conditions: 25×C, 3.0 V VCC, 100,000 cycles. Additionally,
programming typicals assume checkerboard pattern. All values are subject to change.
2. Under worst case conditions of 90×C, VCC = 2.7 V, 100,000 cycles. All values are subject to change.
3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most
bytes program faster than the maximum program times listed.
4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure.
5. System-level overhead is the time required to execute the two- or four-bus-cycle sequence for the program
command. See Table 13 for further information on command definitions.
6. The device has a minimum erase and program cycle endurance of 100,000 cycles.
BGA Pin Capacitance
Parameter Symbol
Parameter Description
Test Setup
Typ
Max
Unit
CIN
Input Capacitance
VIN = 0
6.3
7
pF
COUT
Output Capacitance
VOUT = 0
7.0
8
pF
CIN2
Control Pin Capacitance
VIN = 0
5.5
8
pF
CIN3
WP#/ACC Pin Capacitance
VIN = 0
11
12
pF
Notes:
1. Sampled, not 100% tested.
2. Test conditions TA = 25°C, f = 1.0 MHz.
August 12, 2004 S29PL127J_064J_032J_MCP_00_A3
S29PL127J/S29PL064J/S29PL032J for MCP
75
P r e l i m i n a r y
76
S29PL127J/S29PL064J/S29PL032J for MCP
S29PL127J_064J_032J_MCP_00_A3 August 12, 2004
S29GLxxxN MirrorBitTM Flash Family
S29GL512N, S29GL256N, S29GL128N
512 Megabit, 256 Megabit, and 128 Megabit, 3.0 Volt-only
Page Mode Flash Memory featuring 110 nm MirrorBit
process technology
Data Sheet
ADVANCE
INFORMATION
Distinctive Characteristics
Architectural Advantages
Software & Hardware Features
„
Single power supply operation
— 3 volt read, erase, and program operations
„
Enhanced VersatileI/O™ control
— All input levels (address, control, and DQ input levels)
and outputs are determined by voltage on VIO input.
VIO range is 1.65 to VCC
„
Manufactured on 110 nm MirrorBit process
technology
„
Secured Silicon Sector region
— 128-word/256-byte sector for permanent, secure
identification through an 8-word/16-byte random
Electronic Serial Number, accessible through a
command sequence
— May be programmed and locked at the factory or by
the customer
„
Flexible sector architecture
— S29GL512N: Five hundred twelve 64 Kword (128
Kbyte) sectors
— S29GL256N: Two hundred fifty-six 64 Kword (128
Kbyte) sectors
„
Software features
— Program Suspend & Resume: read other sectors
before programming operation is completed
— Erase Suspend & Resume: read/program other
sectors before an erase operation is completed
— Data# polling & toggle bits provide status
— Unlock Bypass Program command reduces overall
multiple-word programming time
— CFI (Common Flash Interface) compliant: allows host
system to identify and accommodate multiple flash
devices
„
Hardware features
— Advanced Sector Protection
— WP#/ACC input accelerates programming time
(when high voltage is applied) for greater throughput
during system production. Protects first or last sector
regardless of sector protection settings
— Hardware reset input (RESET#) resets device
— Ready/Busy# output (RY/BY#) detects program or
erase cycle completion
— S29GL128N: One hundred twenty-eight 64 Kword
(128 Kbyte) sectors
„
Compatibility with JEDEC standards
— Provides pinout and software compatibility for singlepower supply flash, and superior inadvertent write
protection
„
100,000 erase cycles per sector typical
„
20-year data retention typical
Performance Characteristics
„
„
High performance
— 90 ns access time (S29GL128N, S29GL256N,
S29GL512N)
— 8-word/16-byte page read buffer
— 25 ns page read times
— 16-word/32-byte write buffer reduces overall
programming time for multiple-word updates
Low power consumption (typical values at 3.0 V, 5
MHz)
— 25 mA typical active read current;
— 50 mA typical erase/program current
— 1 µA typical standby mode current
Publication Number S29GLxxxN_MCP
Revision A
Amendment 1
Issue Date December 15, 2004
This document contains information on a product under development at Spansion LLC. The information is intended to help you evaluate this product. Spansion LLC
reserves the right to change or discontinue work on this proposed product without notice.
A d v a n c e
I n f o r m a t i o n
General Description
The S29GL512/256/128N family of devices are 3.0V single power flash memory
manufactured using 110 nm MirrorBit technology. The S29GL512N is a 512 Mbit,
organized as 33,554,432 words or 67,108,864 bytes. The S29GL256N is a 256
Mbit, organized as 16,777,216 words or 33,554,432 bytes. The S29GL128N is a
128 Mbit, organized as 8,388,608 words or 16,777,216 bytes. The device can be
programmed either in the host system or in standard EPROM programmers.
Access times as fast as 90 ns (S29GL128N, S29GL256N, S29GL512N) are available. Note that each access time has a specific operating voltage range (VCC) and
an I/O voltage range (VIO), as specified in the “Product Selector Guide” section.
The devices are offered in a 56-pin TSOP or 64-ball Fortified BGA package. Each
device has separate chip enable (CE#), write enable (WE#) and output enable
(OE#) controls.
Each device requires only a single 3.0 volt power supply for both read and
write functions. In addition to a VCC input, a high-voltage accelerated program
(WP#/ACC) input provides shorter programming times through increased current. This feature is intended to facilitate factory throughput during system
production, but may also be used in the field if desired.
The devices are entirely command set compatible with the JEDEC singlepower-supply Flash standard. Commands are written to the device using
standard microprocessor write timing. Write cycles also internally latch addresses
and data needed for the programming and erase operations.
The sector erase architecture allows memory sectors to be erased and reprogrammed without affecting the data contents of other sectors. The device is fully
erased when shipped from the factory.
Device programming and erasure are initiated through command sequences.
Once a program or erase operation has begun, the host system need only poll the
DQ7 (Data# Polling) or DQ6 (toggle) status bits or monitor the Ready/Busy#
(RY/BY#) output to determine whether the operation is complete. To facilitate
programming, an Unlock Bypass mode reduces command sequence overhead
by requiring only two write cycles to program data instead of four.
The Enhanced VersatileI/O™ (VIO) control allows the host system to set the
voltage levels that the device generates and tolerates on all input levels (address,
chip control, and DQ input levels) to the same voltage level that is asserted on
the VIO pin. This allows the device to operate in a 1.8 V or 3 V system environment as required.
Hardware data protection measures include a low VCC detector that automatically inhibits write operations during power transitions. Persistent Sector
Protection provides in-system, command-enabled protection of any combination of sectors using a single power supply at VCC. Password Sector Protection
prevents unauthorized write and erase operations in any combination of sectors
through a user-defined 64-bit password.
The Erase Suspend/Erase Resume feature allows the host system to pause an
erase operation in a given sector to read or program any other sector and then
complete the erase operation. The Program Suspend/Program Resume feature enables the host system to pause a program operation in a given sector to
read any other sector and then complete the program operation.
The hardware RESET# pin terminates any operation in progress and resets the
device, after which it is then ready for a new operation. The RESET# pin may be
78
S29GLxxxN MirrorBitTM Flash Family
S29GLxxxN_MCP_A1 December 15, 2004
A d v a n c e
I n f o r m a t i o n
tied to the system reset circuitry. A system reset would thus also reset the device,
enabling the host system to read boot-up firmware from the Flash memory
device.
The device reduces power consumption in the standby mode when it detects
specific voltage levels on CE# and RESET#, or when addresses have been stable
for a specified period of time.
The Secured Silicon Sector provides a 128-word/256-byte area for code or
data that can be permanently protected. Once this sector is protected, no further
changes within the sector can occur.
The Write Protect (WP#/ACC) feature protects the first or last sector by asserting a logic low on the WP# pin.
MirrorBit flash technology combines years of Flash memory manufacturing experience to produce the highest levels of quality, reliability and cost effectiveness.
The device electrically erases all bits within a sector simultaneously via hot-hole
assisted erase. The data is programmed using hot electron injection.
December 15, 2004 S29GLxxxN_MCP_A1
S29GLxxxN MirrorBitTM Flash Family
79
A d v a n c e
I n f o r m a t i o n
Product Selector Guide
S29GL512N
Part Number
Speed Option
S29GL512N
VCC = 2.7–3.6 V
VCC = 3.0-3.6V
VIO = 2.7–3.6 V
10
11
VIO = 1.65–1.95 V
11
VIO = 3.0-3.6V
90
Max. Access Time (ns)
90
100
110
110
Max. CE# Access Time (ns)
90
100
110
110
Max. Page access time (ns)
25
25
25
30
Max. OE# Access Time (ns)
25
25
25
30
10
11
S29GL256N
Part Number
Speed Option
S29GL256N
VCC = 2.7–3.6 V
VCC = Regulated (3.0-3.6V)
VIO = 2.7–3.6 V
VIO = 1.65–1.95 V
11
VIO = Regulated (3.0-3.6V)
90
Max. Access Time (ns)
90
100
110
110
Max. CE# Access Time (ns)
90
100
110
110
Max. Page access time (ns)
25
25
25
30
Max. OE# Access Time (ns)
25
25
25
30
10
11
S29GL128N
Part Number
Speed Option
S29GL128N
VCC = 2.7–3.6 V
VCC = Regulated (3.0-3.6V)
VIO = 2.7–3.6 V
VIO = 1.65–1.95 V
VIO = Regulated (3.0-3.6V)
11
90
Max. Access Time (ns)
90
100
110
110
Max. CE# Access Time (ns)
90
100
110
110
Max. Page access time (ns)
25
25
25
30
Max. OE# Access Time (ns)
25
25
25
30
80
S29GLxxxN MirrorBitTM Flash Family
S29GLxxxN_MCP_A1 December 15, 2004
A d v a n c e
I n f o r m a t i o n
Block Diagram
VCC
DQ15–DQ0 (A-1)
RY/BY#
Sector Switches
VSS
VIO
Erase Voltage
Generator
RESET#
WE#
WP#/ACC
Input/Output
Buffers
State
Control
Command
Register
PGM Voltage
Generator
Chip Enable
Output Enable
Logic
CE#
OE#
VCC Detector
Timer
AMax**–A0
Address Latch
STB
STB
Data
Latch
Y-Decoder
Y-Gating
X-Decoder
Cell Matrix
Notes:
1. AMax GL512N = A24, AMax GL256N = A23, AMax GL128N = A22
December 15, 2004 S29GLxxxN_MCP_A1
S29GLxxxN MirrorBitTM Flash Family
81
A d v a n c e
I n f o r m a t i o n
Pin Description
82
A24–A0
A23–A0
A22–A0
DQ14–DQ0
DQ15/A-1
=
=
=
=
=
CE#
OE#
WE#
WP#/ACC
=
=
=
=
RESET#
RY/BY#
VCC
=
=
=
VIO
VSS
NC
=
=
=
25 Address inputs (512 Mb)
24 Address inputs (256 Mb)
23 Address inputs (128 Mb)
15 Data inputs/outputs
DQ15 (Data input/output, word mode), A-1 (LSB
Address input
Chip Enable input
Output Enable input
Write Enable input
Hardware Write Protect input;
Acceleration input
Hardware Reset Pin input
Ready/Busy output
3.0 volt-only single power supply
(see Product Selector Guide for speed options and
voltage supply tolerances)
Output Buffer power
Device Ground
Pin Not Connected Internally
S29GLxxxN MirrorBitTM Flash Family
S29GLxxxN_MCP_A1 December 15, 2004
A d v a n c e
I n f o r m a t i o n
Logic Symbol
S29GL512N
25
A24–A0
16 or 8
DQ15–DQ0
(A-1)
CE#
OE#
WE#
WP#/ACC
RESET#
VIO
RY/BY#
S29GL256N
24
A23–A0
16 or 8
DQ15–DQ0
(A-1)
CE#
OE#
WE#
WP#/ACC
RESET#
VIO
RY/BY#
S29GL128N
23
A22–A0
CE#
16 or 8
DQ15–DQ0
(A-1)
OE#
WE#
WP#/ACC
RESET#
VIO
December 15, 2004 S29GLxxxN_MCP_A1
RY/BY#
S29GLxxxN MirrorBitTM Flash Family
83
A d v a n c e
I n f o r m a t i o n
Device Bus Operations
This section describes the requirements and use of the device bus operations,
which are initiated through the internal command register. The command register
itself does not occupy any addressable memory location. The register is a latch
used to store the commands, along with the address and data information
needed to execute the command. The contents of the register serve as inputs to
the internal state machine. The state machine outputs dictate the function of the
device. Table 1 lists the device bus operations, the inputs and control levels they
require, and the resulting output. The following subsections describe each of
these operations in further detail.
Table 1.
Device Bus Operations
CE#
OE#
WE#
RESET#
WP#/
ACC
Addresses
(Note 1)
DQ0–DQ15
Read
L
L
H
H
X
AIN
DOUT
Write (Program/Erase)
L
H
L
H
Note 2
AIN
(Note 3)
Accelerated Program
L
H
L
H
VHH
AIN
(Note 3)
X
X
VCC ±
0.3 V
H
X
High-Z
Operation
Standby
VCC
± 0.3 V
Output Disable
L
H
H
H
X
X
High-Z
Reset
X
X
X
L
X
X
High-Z
Legend: L = Logic Low = VIL, H = Logic High = VIH, VID = 11.5–12.5 V, VHH = 11.5–12.5V, X = Don’t Care, SA = Sector
Address, AIN = Address In, DIN = Data In, DOUT = Data Out
Notes:
1. Addresses are AMax:A0 in word mode. Sector addresses are AMax:A16 in both modes.
2. If WP# = VIL, the first or last sector group remains protected. If WP# = VIH, the first or last sector will be
protected or unprotected as determined by the method described in “Write Protect (WP#)”. All sectors are
unprotected when shipped from the factory (The Secured Silicon Sector may be factory protected depending
on version ordered.)
3. DIN or DOUT as required by command sequence, data polling, or sector protect algorithm (see Figure 2, Figure 4, and
Figure 5).
VersatileIOTM (VIO) Control
The VersatileIOTM (VIO) control allows the host system to set the voltage levels
that the device generates and tolerates on CE# and DQ I/Os to the same voltage
level that is asserted on VIO. See Ordering Information for VIO options on this
device.
For example, a VI/O of 1.65 V to 3.6 V allows for I/O at the 1.8 or 3 volt levels,
driving and receiving signals to and from other 1.8-V or 3-V devices on the same
data bus.
Requirements for Reading Array Data
To read array data from the outputs, the system must drive the CE# and OE#
pins to VIL. CE# is the power control and selects the device. OE# is the output
control and gates array data to the output pins. WE# should remain at VIH.
The internal state machine is set for reading array data upon device power-up,
or after a hardware reset. This ensures that no spurious alteration of the memory
84
S29GLxxxN MirrorBitTM Flash Family
S29GLxxxN_MCP_A1 December 15, 2004
A d v a n c e
I n f o r m a t i o n
content occurs during the power transition. No command is necessary in this
mode to obtain array data. Standard microprocessor read cycles that assert valid
addresses on the device address inputs produce valid data on the device data
outputs. The device remains enabled for read access until the command register
contents are altered.
See “Reading Array Data” on page 127 for more information. Refer to the AC
Read-Only Operations table for timing specifications and to Figure 11 for the timing diagram. Refer to the DC Characteristics table for the active current
specification on reading array data.
Page Mode Read
The device is capable of fast page mode read and is compatible with the page
mode Mask ROM read operation. This mode provides faster read access speed for
random locations within a page. The page size of the device is 8 words/16 bytes.
The appropriate page is selected by the higher address bits A(max)–A3. Address
bits A2–A0 determine the specific word within a page. This is an asynchronous
operation; the microprocessor supplies the specific word location.
The random or initial page access is equal to tACC or tCE and subsequent page
read accesses (as long as the locations specified by the microprocessor falls
within that page) is equivalent to tPACC. When CE# is de-asserted and reasserted
for a subsequent access, the access time is tACC or tCE. Fast page mode accesses
are obtained by keeping the “read-page addresses” constant and changing the
“intra-read page” addresses.
Writing Commands/Command Sequences
To write a command or command sequence (which includes programming data
to the device and erasing sectors of memory), the system must drive WE# and
CE# to VIL, and OE# to VIH.
The device features an Unlock Bypass mode to facilitate faster programming.
Once the device enters the Unlock Bypass mode, only two write cycles are required to program a word or byte, instead of four. The “Word Program Command
Sequence” section has details on programming data to the device using both
standard and Unlock Bypass command sequences.
An erase operation can erase one sector, multiple sectors, or the entire device.
Table 2, Table 4, and Table 5 indicate the address space that each sector occupies.
Refer to the DC Characteristics table for the active current specification for the
write mode. The AC Characteristics section contains timing specification tables
and timing diagrams for write operations.
Write Buffer
Write Buffer Programming allows the system write to a maximum of 16 words/32
bytes in one programming operation. This results in faster effective programming
time than the standard programming algorithms. See “Write Buffer” for more
information.
Accelerated Program Operation
The device offers accelerated program operations through the ACC function. This
is one of two functions provided by the WP#/ACC pin. This function is primarily
intended to allow faster manufacturing throughput at the factory.
December 15, 2004 S29GLxxxN_MCP_A1
S29GLxxxN MirrorBitTM Flash Family
85
A d v a n c e
I n f o r m a t i o n
If the system asserts VHH on this pin, the device automatically enters the aforementioned Unlock Bypass mode, temporarily unprotects any protected sector
groups, and uses the higher voltage on the pin to reduce the time required for
program operations. The system would use a two-cycle program command sequence as required by the Unlock Bypass mode. Removing VHH from the WP#/
ACC pin returns the device to normal operation. Note that the WP#/ACC pin must
not be at VHH for operations other than accelerated programming, or device damage may result. WP# has an internal pullup; when unconnected, WP# is at VIH.
Autoselect Functions
If the system writes the autoselect command sequence, the device enters the autoselect mode. The system can then read autoselect codes from the internal
register (which is separate from the memory array) on DQ7–DQ0. Standard read
cycle timings apply in this mode. Refer to the “Autoselect Mode” section on page
113 and “Autoselect Command Sequence” section on page 127 sections for more
information.
Standby Mode
When the system is not reading or writing to the device, it can place the device
in the standby mode. In this mode, current consumption is greatly reduced, and
the outputs are placed in the high impedance state, independent of the OE#
input.
The device enters the CMOS standby mode when the CE# and RESET# pins are
both held at VIO ± 0.3 V. (Note that this is a more restricted voltage range than
VIH.) If CE# and RESET# are held at VIH, but not within VIO ± 0.3 V, the device
will be in the standby mode, but the standby current will be greater. The device
requires standard access time (tCE) for read access when the device is in either
of these standby modes, before it is ready to read data.
If the device is deselected during erasure or programming, the device draws active current until the operation is completed.
Refer to the “DC Characteristics” section on page 151 for the standby current
specification.
Automatic Sleep Mode
The automatic sleep mode minimizes Flash device energy consumption. The device automatically enables this mode when addresses remain stable for tACC +
30 ns. The automatic sleep mode is independent of the CE#, WE#, and OE# control signals. Standard address access timings provide new data when addresses
are changed. While in sleep mode, output data is latched and always available to
the system. Refer to the “DC Characteristics” section on page 151 for the
automatic sleep mode current specification.
RESET#: Hardware Reset Pin
The RESET# pin provides a hardware method of resetting the device to reading
array data. When the RESET# pin is driven low for at least a period of tRP, the
device immediately terminates any operation in progress, tristates all output
pins, and ignores all read/write commands for the duration of the RESET# pulse.
The device also resets the internal state machine to reading array data. The operation that was interrupted should be reinitiated once the device is ready to
accept another command sequence, to ensure data integrity.
86
S29GLxxxN MirrorBitTM Flash Family
S29GLxxxN_MCP_A1 December 15, 2004
A d v a n c e
I n f o r m a t i o n
Current is reduced for the duration of the RESET# pulse. When RESET# is held
at VSS±0.3 V, the device draws CMOS standby current (ICC5). If RESET# is held
at VIL but not within VSS±0.3 V, the standby current will be greater.
The RESET# pin may be tied to the system reset circuitry. A system reset would
thus also reset the Flash memory, enabling the system to read the boot-up firmware from the Flash memory.
Refer to the AC Characteristics tables for RESET# parameters and to Figure 13
for the timing diagram.
Output Disable Mode
When the OE# input is at VIH, output from the device is disabled. The output pins
are placed in the high impedance state.
Table 2. Sector Address Table–S29GL512N
Sector
A24–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA0
0
0
0
0
0
0
0
0
0
128/64
0000000–000FFFF
SA1
0
0
0
0
0
0
0
0
1
128/64
0010000–001FFFF
SA2
0
0
0
0
0
0
0
1
0
128/64
0020000–002FFFF
SA3
0
0
0
0
0
0
0
1
1
128/64
0030000–003FFFF
SA4
0
0
0
0
0
0
1
0
0
128/64
0040000–004FFFF
SA5
0
0
0
0
0
0
1
0
1
128/64
0050000–005FFFF
SA6
0
0
0
0
0
0
1
1
0
128/64
0060000–006FFFF
SA7
0
0
0
0
0
0
1
1
1
128/64
0070000–007FFFF
SA8
0
0
0
0
0
1
0
0
0
128/64
0080000–008FFFF
SA9
0
0
0
0
0
1
0
0
1
128/64
0090000–009FFFF
SA10
0
0
0
0
0
1
0
1
0
128/64
00A0000–00AFFFF
SA11
0
0
0
0
0
1
0
1
1
128/64
00B0000–00BFFFF
SA12
0
0
0
0
0
1
1
0
0
128/64
00C0000–00CFFFF
SA13
0
0
0
0
0
1
1
0
1
128/64
00D0000–00DFFFF
SA14
0
0
0
0
0
1
1
1
0
128/64
00E0000–00EFFFF
SA15
0
0
0
0
0
1
1
1
1
128/64
00F0000–00FFFFF
SA16
0
0
0
0
1
0
0
0
0
128/64
0100000–010FFFF
SA17
0
0
0
0
1
0
0
0
1
128/64
0110000–011FFFF
SA18
0
0
0
0
1
0
0
1
0
128/64
0120000–012FFFF
SA19
0
0
0
0
1
0
0
1
1
128/64
0130000–013FFFF
SA20
0
0
0
0
1
0
1
0
0
128/64
0140000–014FFFF
SA21
0
0
0
0
1
0
1
0
1
128/64
0150000–015FFFF
SA22
0
0
0
0
1
0
1
1
0
128/64
0160000–016FFFF
SA23
0
0
0
0
1
0
1
1
1
128/64
0170000–017FFFF
December 15, 2004 S29GLxxxN_MCP_A1
S29GLxxxN MirrorBitTM Flash Family
87
A d v a n c e
Table 2.
Sector Address Table–S29GL512N (Continued)
Sector
88
I n f o r m a t i o n
A24–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA24
0
0
0
0
1
1
0
0
0
128/64
0180000–018FFFF
SA25
0
0
0
0
1
1
0
0
1
128/64
0190000–019FFFF
SA26
0
0
0
0
1
1
0
1
0
128/64
01A0000–01AFFFF
SA27
0
0
0
0
1
1
0
1
1
128/64
01B0000–01BFFFF
SA28
0
0
0
0
1
1
1
0
0
128/64
01C0000–01CFFFF
SA29
0
0
0
0
1
1
1
0
1
128/64
01D0000–01DFFFF
SA30
0
0
0
0
1
1
1
1
0
128/64
01E0000–01EFFFF
SA31
0
0
0
0
1
1
1
1
1
128/64
01F0000–01FFFFF
SA32
0
0
0
1
0
0
0
0
0
128/64
0200000–020FFFF
SA33
0
0
0
1
0
0
0
0
1
128/64
0210000–021FFFF
SA34
0
0
0
1
0
0
0
1
0
128/64
0220000–022FFFF
SA35
0
0
0
1
0
0
0
1
1
128/64
0230000–023FFFF
SA36
0
0
0
1
0
0
1
0
0
128/64
0240000–024FFFF
SA37
0
0
0
1
0
0
1
0
1
128/64
0250000–025FFFF
SA38
0
0
0
1
0
0
1
1
0
128/64
0260000–026FFFF
SA39
0
0
0
1
0
0
1
1
1
128/64
0270000–027FFFF
SA40
0
0
0
1
0
1
0
0
0
128/64
0280000–028FFFF
SA41
0
0
0
1
0
1
0
0
1
128/64
0290000–029FFFF
SA42
0
0
0
1
0
1
0
1
0
128/64
02A0000–02AFFFF
SA43
0
0
0
1
0
1
0
1
1
128/64
02B0000–02BFFFF
SA44
0
0
0
1
0
1
1
0
0
128/64
02C0000–02CFFFF
SA45
0
0
0
1
0
1
1
0
1
128/64
02D0000–02DFFFF
SA46
0
0
0
1
0
1
1
1
0
128/64
02E0000–02EFFFF
SA47
0
0
0
1
0
1
1
1
1
128/64
02F0000–02FFFFF
SA48
0
0
0
1
1
0
0
0
0
128/64
0300000–030FFFF
SA49
0
0
0
1
1
0
0
0
1
128/64
0310000–031FFFF
SA50
0
0
0
1
1
0
0
1
0
128/64
0320000–032FFFF
SA51
0
0
0
1
1
0
0
1
1
128/64
0330000–033FFFF
SA52
0
0
0
1
1
0
1
0
0
128/64
0340000–034FFFF
SA53
0
0
0
1
1
0
1
0
1
128/64
0350000–035FFFF
SA54
0
0
0
1
1
0
1
1
0
128/64
0360000–036FFFF
SA55
0
0
0
1
1
0
1
1
1
128/64
0370000–037FFFF
SA56
0
0
0
1
1
1
0
0
0
128/64
0380000–038FFFF
SA57
0
0
0
1
1
1
0
0
1
128/64
0390000–039FFFF
SA58
0
0
0
1
1
1
0
1
0
128/64
03A0000–03AFFFF
S29GLxxxN MirrorBitTM Flash Family
S29GLxxxN_MCP_A1 December 15, 2004
A d v a n c e
Table 2.
I n f o r m a t i o n
Sector Address Table–S29GL512N (Continued)
Sector
A24–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA59
0
0
0
1
1
1
0
1
1
128/64
03B0000–03BFFFF
SA60
0
0
0
1
1
1
1
0
0
128/64
03C0000–03CFFFF
SA61
0
0
0
1
1
1
1
0
1
128/64
03D0000–03DFFFF
SA62
0
0
0
1
1
1
1
1
0
128/64
03E0000–03EFFFF
SA63
0
0
0
1
1
1
1
1
1
128/64
03F0000–03FFFFF
SA64
0
0
1
0
0
0
0
0
0
128/64
0400000–040FFFF
SA65
0
0
1
0
0
0
0
0
1
128/64
0410000–041FFFF
SA66
0
0
1
0
0
0
0
1
0
128/64
0420000–042FFFF
SA67
0
0
1
0
0
0
0
1
1
128/64
0430000–043FFFF
SA68
0
0
1
0
0
0
1
0
0
128/64
0440000–044FFFF
SA69
0
0
1
0
0
0
1
0
1
128/64
0450000–045FFFF
SA70
0
0
1
0
0
0
1
1
0
128/64
0460000–046FFFF
SA71
0
0
1
0
0
0
1
1
1
128/64
0470000–047FFFF
SA72
0
0
1
0
0
1
0
0
0
128/64
0480000–048FFFF
SA73
0
0
1
0
0
1
0
0
1
128/64
0490000–049FFFF
SA74
0
0
1
0
0
1
0
1
0
128/64
04A0000–04AFFFF
SA75
0
0
1
0
0
1
0
1
1
128/64
04B0000–04BFFFF
SA76
0
0
1
0
0
1
1
0
0
128/64
04C0000–04CFFFF
SA77
0
0
1
0
0
1
1
0
1
128/64
04D0000–04DFFFF
SA78
0
0
1
0
0
1
1
1
0
128/64
04E0000–04EFFFF
SA79
0
0
1
0
0
1
1
1
1
128/64
04F0000–04FFFFF
SA80
0
0
1
0
1
0
0
0
0
128/64
0500000–050FFFF
SA81
0
0
1
0
1
0
0
0
1
128/64
0510000–051FFFF
SA82
0
0
1
0
1
0
0
1
0
128/64
0520000–052FFFF
SA83
0
0
1
0
1
0
0
1
1
128/64
0530000–053FFFF
SA84
0
0
1
0
1
0
1
0
0
128/64
0540000–054FFFF
SA85
0
0
1
0
1
0
1
0
1
128/64
0550000–055FFFF
SA86
0
0
1
0
1
0
1
1
0
128/64
0560000–056FFFF
SA87
0
0
1
0
1
0
1
1
1
128/64
0570000–057FFFF
SA88
0
0
1
0
1
1
0
0
0
128/64
0580000–058FFFF
SA89
0
0
1
0
1
1
0
0
1
128/64
0590000–059FFFF
SA90
0
0
1
0
1
1
0
1
0
128/64
05A0000–05AFFFF
SA91
0
0
1
0
1
1
0
1
1
128/64
05B0000–05BFFFF
SA92
0
0
1
0
1
1
1
0
0
128/64
05C0000–05CFFFF
SA93
0
0
1
0
1
1
1
0
1
128/64
05D0000–05DFFFF
December 15, 2004 S29GLxxxN_MCP_A1
S29GLxxxN MirrorBitTM Flash Family
89
A d v a n c e
Table 2.
Sector Address Table–S29GL512N (Continued)
Sector
90
I n f o r m a t i o n
A24–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA94
0
0
1
0
1
1
1
1
0
128/64
05E0000–05EFFFF
SA95
0
0
1
0
1
1
1
1
1
128/64
05F0000–05FFFFF
SA96
0
0
1
1
0
0
0
0
0
128/64
0600000–060FFFF
SA97
0
0
1
1
0
0
0
0
1
128/64
0610000–061FFFF
SA98
0
0
1
1
0
0
0
1
0
128/64
0620000–062FFFF
SA99
0
0
1
1
0
0
0
1
1
128/64
0630000–063FFFF
SA100
0
0
1
1
0
0
1
0
0
128/64
0640000–064FFFF
SA101
0
0
1
1
0
0
1
0
1
128/64
0650000–065FFFF
SA102
0
0
1
1
0
0
1
1
0
128/64
0660000–066FFFF
SA103
0
0
1
1
0
0
1
1
1
128/64
0670000–067FFFF
SA104
0
0
1
1
0
1
0
0
0
128/64
0680000–068FFFF
SA105
0
0
1
1
0
1
0
0
1
128/64
0690000–069FFFF
SA106
0
0
1
1
0
1
0
1
0
128/64
06A0000–06AFFFF
SA107
0
0
1
1
0
1
0
1
1
128/64
06B0000–06BFFFF
SA108
0
0
1
1
0
1
1
0
0
128/64
06C0000–06CFFFF
SA109
0
0
1
1
0
1
1
0
1
128/64
06D0000–06DFFFF
SA110
0
0
1
1
0
1
1
1
0
128/64
06E0000–06EFFFF
SA111
0
0
1
1
0
1
1
1
1
128/64
06F0000–06FFFFF
SA112
0
0
1
1
1
0
0
0
0
128/64
0700000–070FFFF
SA113
0
0
1
1
1
0
0
0
1
128/64
0710000–071FFFF
SA114
0
0
1
1
1
0
0
1
0
128/64
0720000–072FFFF
SA115
0
0
1
1
1
0
0
1
1
128/64
0730000–073FFFF
SA116
0
0
1
1
1
0
1
0
0
128/64
0740000–074FFFF
SA117
0
0
1
1
1
0
1
0
1
128/64
0750000–075FFFF
SA118
0
0
1
1
1
0
1
1
0
128/64
0760000–076FFFF
SA119
0
0
1
1
1
0
1
1
1
128/64
0770000–077FFFF
SA120
0
0
1
1
1
1
0
0
0
128/64
0780000–078FFFF
SA121
0
0
1
1
1
1
0
0
1
128/64
0790000–079FFFF
SA122
0
0
1
1
1
1
0
1
0
128/64
07A0000–07AFFFF
SA123
0
0
1
1
1
1
0
1
1
128/64
07B0000–07BFFFF
SA124
0
0
1
1
1
1
1
0
0
128/64
07C0000–07CFFFF
SA125
0
0
1
1
1
1
1
0
1
128/64
07D0000–07DFFFF
SA126
0
0
1
1
1
1
1
1
0
128/64
07E0000–07EFFFF
SA127
0
0
1
1
1
1
1
1
1
128/64
07F0000–07FFFFF
SA128
0
1
0
0
0
0
0
0
0
128/64
0800000–080FFFF
S29GLxxxN MirrorBitTM Flash Family
S29GLxxxN_MCP_A1 December 15, 2004
A d v a n c e
Table 2.
I n f o r m a t i o n
Sector Address Table–S29GL512N (Continued)
Sector
A24–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA129
0
1
0
0
0
0
0
0
1
128/64
0810000–081FFFF
SA130
0
1
0
0
0
0
0
1
0
128/64
0820000–082FFFF
SA131
0
1
0
0
0
0
0
1
1
128/64
0830000–083FFFF
SA132
0
1
0
0
0
0
1
0
0
128/64
0840000–084FFFF
SA133
0
1
0
0
0
0
1
0
1
128/64
0850000–085FFFF
SA134
0
1
0
0
0
0
1
1
0
128/64
0860000–086FFFF
SA135
0
1
0
0
0
0
1
1
1
128/64
0870000–087FFFF
SA136
0
1
0
0
0
1
0
0
0
128/64
0880000–088FFFF
SA137
0
1
0
0
0
1
0
0
1
128/64
0890000–089FFFF
SA138
0
1
0
0
0
1
0
1
0
128/64
08A0000–08AFFFF
SA139
0
1
0
0
0
1
0
1
1
128/64
08B0000–08BFFFF
SA140
0
1
0
0
0
1
1
0
0
128/64
08C0000–08CFFFF
SA141
0
1
0
0
0
1
1
0
1
128/64
08D0000–08DFFFF
SA142
0
1
0
0
0
1
1
1
0
128/64
08E0000–08EFFFF
SA143
0
1
0
0
0
1
1
1
1
128/64
08F0000–08FFFFF
SA144
0
1
0
0
1
0
0
0
0
128/64
0900000–090FFFF
SA145
0
1
0
0
1
0
0
0
1
128/64
0910000–091FFFF
SA146
0
1
0
0
1
0
0
1
0
128/64
0920000–092FFFF
SA147
0
1
0
0
1
0
0
1
1
128/64
0930000–093FFFF
SA148
0
1
0
0
1
0
1
0
0
128/64
0940000–094FFFF
SA149
0
1
0
0
1
0
1
0
1
128/64
0950000–095FFFF
SA150
0
1
0
0
1
0
1
1
0
128/64
0960000–096FFFF
SA151
0
1
0
0
1
0
1
1
1
128/64
0970000–097FFFF
SA152
0
1
0
0
1
1
0
0
0
128/64
0980000–098FFFF
SA153
0
1
0
0
1
1
0
0
1
128/64
0990000–099FFFF
SA154
0
1
0
0
1
1
0
1
0
128/64
09A0000–09AFFFF
SA155
0
1
0
0
1
1
0
1
1
128/64
09B0000–09BFFFF
SA156
0
1
0
0
1
1
1
0
0
128/64
09C0000–09CFFFF
SA157
0
1
0
0
1
1
1
0
1
128/64
09D0000–09DFFFF
SA158
0
1
0
0
1
1
1
1
0
128/64
09E0000–09EFFFF
SA159
0
1
0
0
1
1
1
1
1
128/64
09F0000–09FFFFF
SA160
0
1
0
1
0
0
0
0
0
128/64
0A00000–0A0FFFF
SA161
0
1
0
1
0
0
0
0
1
128/64
0A10000–0A1FFFF
SA162
0
1
0
1
0
0
0
1
0
128/64
0A20000–0A2FFFF
SA163
0
1
0
1
0
0
0
1
1
128/64
0A30000–0A3FFFF
December 15, 2004 S29GLxxxN_MCP_A1
S29GLxxxN MirrorBitTM Flash Family
91
A d v a n c e
Table 2.
Sector Address Table–S29GL512N (Continued)
Sector
92
I n f o r m a t i o n
A24–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA164
0
1
0
1
0
0
1
0
0
128/64
0A40000–0A4FFFF
SA165
0
1
0
1
0
0
1
0
1
128/64
0A50000–0A5FFFF
SA166
0
1
0
1
0
0
1
1
0
128/64
0A60000–0A6FFFF
SA167
0
1
0
1
0
0
1
1
1
128/64
0A70000–0A7FFFF
SA168
0
1
0
1
0
1
0
0
0
128/64
0A80000–0A8FFFF
SA169
0
1
0
1
0
1
0
0
1
128/64
0A90000–0A9FFFF
SA170
0
1
0
1
0
1
0
1
0
128/64
0AA0000–0AAFFFF
SA171
0
1
0
1
0
1
0
1
1
128/64
0AB0000–0ABFFFF
SA172
0
1
0
1
0
1
1
0
0
128/64
0AC0000–0ACFFFF
SA173
0
1
0
1
0
1
1
0
1
128/64
0AD0000–0ADFFFF
SA174
0
1
0
1
0
1
1
1
0
128/64
0AE0000–0AEFFFF
SA175
0
1
0
1
0
1
1
1
1
128/64
0AF0000–0AFFFFF
SA176
0
1
0
1
1
0
0
0
0
128/64
0B00000–0B0FFFF
SA177
0
1
0
1
1
0
0
0
1
128/64
0B10000–0B1FFFF
SA178
0
1
0
1
1
0
0
1
0
128/64
0B20000–0B2FFFF
SA179
0
1
0
1
1
0
0
1
1
128/64
0B30000–0B3FFFF
SA180
0
1
0
1
1
0
1
0
0
128/64
0B40000–0B4FFFF
SA181
0
1
0
1
1
0
1
0
1
128/64
0B50000–0B5FFFF
SA182
0
1
0
1
1
0
1
1
0
128/64
0B60000–0B6FFFF
SA183
0
1
0
1
1
0
1
1
1
128/64
0B70000–0B7FFFF
SA184
0
1
0
1
1
1
0
0
0
128/64
0B80000–0B8FFFF
SA185
0
1
0
1
1
1
0
0
1
128/64
0B90000–0B9FFFF
SA186
0
1
0
1
1
1
0
1
0
128/64
0BA0000–0BAFFFF
SA187
0
1
0
1
1
1
0
1
1
128/64
0BB0000–0BBFFFF
SA188
0
1
0
1
1
1
1
0
0
128/64
0BC0000–0BCFFFF
SA189
0
1
0
1
1
1
1
0
1
128/64
0BD0000–0BDFFFF
SA190
0
1
0
1
1
1
1
1
0
128/64
0BE0000–0BEFFFF
SA191
0
1
0
1
1
1
1
1
1
128/64
0BF0000–0BFFFFF
SA192
0
1
1
0
0
0
0
0
0
128/64
0C00000–0C0FFFF
SA193
0
1
1
0
0
0
0
0
1
128/64
0C10000–0C1FFFF
SA194
0
1
1
0
0
0
0
1
0
128/64
0C20000–0C2FFFF
SA195
0
1
1
0
0
0
0
1
1
128/64
0C30000–0C3FFFF
SA196
0
1
1
0
0
0
1
0
0
128/64
0C40000–0C4FFFF
SA197
0
1
1
0
0
0
1
0
1
128/64
0C50000–0C5FFFF
SA198
0
1
1
0
0
0
1
1
0
128/64
0C60000–0C6FFFF
S29GLxxxN MirrorBitTM Flash Family
S29GLxxxN_MCP_A1 December 15, 2004
A d v a n c e
Table 2.
I n f o r m a t i o n
Sector Address Table–S29GL512N (Continued)
Sector
A24–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA199
0
1
1
0
0
0
1
1
1
128/64
0C70000–0C7FFFF
SA200
0
1
1
0
0
1
0
0
0
128/64
0C80000–0C8FFFF
SA201
0
1
1
0
0
1
0
0
1
128/64
0C90000–0C9FFFF
SA202
0
1
1
0
0
1
0
1
0
128/64
0CA0000–0CAFFFF
SA203
0
1
1
0
0
1
0
1
1
128/64
0CB0000–0CBFFFF
SA204
0
1
1
0
0
1
1
0
0
128/64
0CC0000–0CCFFFF
SA205
0
1
1
0
0
1
1
0
1
128/64
0CD0000–0CDFFFF
SA206
0
1
1
0
0
1
1
1
0
128/64
0CE0000–0CEFFFF
SA207
0
1
1
0
0
1
1
1
1
128/64
0CF0000–0CFFFFF
SA208
0
1
1
0
1
0
0
0
0
128/64
0D00000–0D0FFFF
SA209
0
1
1
0
1
0
0
0
1
128/64
0D10000–0D1FFFF
SA210
0
1
1
0
1
0
0
1
0
128/64
0D20000–0D2FFFF
SA211
0
1
1
0
1
0
0
1
1
128/64
0D30000–0D3FFFF
SA212
0
1
1
0
1
0
1
0
0
128/64
0D40000–0D4FFFF
SA213
0
1
1
0
1
0
1
0
1
128/64
0D50000–0D5FFFF
SA214
0
1
1
0
1
0
1
1
0
128/64
0D60000–0D6FFFF
SA215
0
1
1
0
1
0
1
1
1
128/64
0D70000–0D7FFFF
SA216
0
1
1
0
1
1
0
0
0
128/64
0D80000–0D8FFFF
SA217
0
1
1
0
1
1
0
0
1
128/64
0D90000–0D9FFFF
SA218
0
1
1
0
1
1
0
1
0
128/64
0DA0000–0DAFFFF
SA219
0
1
1
0
1
1
0
1
1
128/64
0DB0000–0DBFFFF
SA220
0
1
1
0
1
1
1
0
0
128/64
0DC0000–0DCFFFF
SA221
0
1
1
0
1
1
1
0
1
128/64
0DD0000–0DDFFFF
SA222
0
1
1
0
1
1
1
1
0
128/64
0DE0000–0DEFFFF
SA223
0
1
1
0
1
1
1
1
1
128/64
0DF0000–0DFFFFF
SA224
0
1
1
1
0
0
0
0
0
128/64
0E00000–0E0FFFF
SA225
0
1
1
1
0
0
0
0
1
128/64
0E10000–0E1FFFF
SA226
0
1
1
1
0
0
0
1
0
128/64
0E20000–0E2FFFF
SA227
0
1
1
1
0
0
0
1
1
128/64
0E30000–0E3FFFF
SA228
0
1
1
1
0
0
1
0
0
128/64
0E40000–0E4FFFF
SA229
0
1
1
1
0
0
1
0
1
128/64
0E50000–0E5FFFF
SA230
0
1
1
1
0
0
1
1
0
128/64
0E60000–0E6FFFF
SA231
0
1
1
1
0
0
1
1
1
128/64
0E70000–0E7FFFF
SA232
0
1
1
1
0
1
0
0
0
128/64
0E80000–0E8FFFF
SA233
0
1
1
1
0
1
0
0
1
128/64
0E90000–0E9FFFF
December 15, 2004 S29GLxxxN_MCP_A1
S29GLxxxN MirrorBitTM Flash Family
93
A d v a n c e
Table 2.
Sector Address Table–S29GL512N (Continued)
Sector
94
I n f o r m a t i o n
A24–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA234
0
1
1
1
0
1
0
1
0
128/64
0EA0000–0EAFFFF
SA235
0
1
1
1
0
1
0
1
1
128/64
0EB0000–0EBFFFF
SA236
0
1
1
1
0
1
1
0
0
128/64
0EC0000–0ECFFFF
SA237
0
1
1
1
0
1
1
0
1
128/64
0ED0000–0EDFFFF
SA238
0
1
1
1
0
1
1
1
0
128/64
0EE0000–0EEFFFF
SA239
0
1
1
1
0
1
1
1
1
128/64
0EF0000–0EFFFFF
SA240
0
1
1
1
1
0
0
0
0
128/64
0F00000–0F0FFFF
SA241
0
1
1
1
1
0
0
0
1
128/64
0F10000–0F1FFFF
SA242
0
1
1
1
1
0
0
1
0
128/64
0F20000–0F2FFFF
SA243
0
1
1
1
1
0
0
1
1
128/64
0F30000–0F3FFFF
SA244
0
1
1
1
1
0
1
0
0
128/64
0F40000–0F4FFFF
SA245
0
1
1
1
1
0
1
0
1
128/64
0F50000–0F5FFFF
SA246
0
1
1
1
1
0
1
1
0
128/64
0F60000–0F6FFFF
SA247
0
1
1
1
1
0
1
1
1
128/64
0F70000–0F7FFFF
SA248
0
1
1
1
1
1
0
0
0
128/64
0F80000–0F8FFFF
SA249
0
1
1
1
1
1
0
0
1
128/64
0F90000–0F9FFFF
SA250
0
1
1
1
1
1
0
1
0
128/64
0FA0000–0FAFFFF
SA251
0
1
1
1
1
1
0
1
1
128/64
0FB0000–0FBFFFF
SA252
0
1
1
1
1
1
1
0
0
128/64
0FC0000–0FCFFFF
SA253
0
1
1
1
1
1
1
0
1
128/64
0FD0000–0FDFFFF
SA254
0
1
1
1
1
1
1
1
0
128/64
0FE0000–0FEFFFF
SA255
0
1
1
1
1
1
1
1
1
128/64
0FF0000–0FFFFFF
SA256
1
0
0
0
0
0
0
0
0
128/64
1000000–100FFFF
SA257
1
0
0
0
0
0
0
0
1
128/64
1010000–101FFFF
SA258
1
0
0
0
0
0
0
1
0
128/64
1020000–102FFFF
SA259
1
0
0
0
0
0
0
1
1
128/64
1030000–103FFFF
SA260
1
0
0
0
0
0
1
0
0
128/64
1040000–104FFFF
SA261
1
0
0
0
0
0
1
0
1
128/64
1050000–105FFFF
SA262
1
0
0
0
0
0
1
1
0
128/64
1060000–106FFFF
SA263
1
0
0
0
0
0
1
1
1
128/64
1070000–107FFFF
SA264
1
0
0
0
0
1
0
0
0
128/64
1080000–108FFFF
SA265
1
0
0
0
0
1
0
0
1
128/64
1090000–109FFFF
SA266
1
0
0
0
0
1
0
1
0
128/64
10A0000–10AFFFF
SA267
1
0
0
0
0
1
0
1
1
128/64
10B0000–10BFFFF
SA268
1
0
0
0
0
1
1
0
0
128/64
10C0000–10CFFFF
S29GLxxxN MirrorBitTM Flash Family
S29GLxxxN_MCP_A1 December 15, 2004
A d v a n c e
Table 2.
I n f o r m a t i o n
Sector Address Table–S29GL512N (Continued)
Sector
A24–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA269
1
0
0
0
0
1
1
0
1
128/64
10D0000–10DFFFF
SA270
1
0
0
0
0
1
1
1
0
128/64
10E0000–10EFFFF
SA271
1
0
0
0
0
1
1
1
1
128/64
10F0000–10FFFFF
SA272
1
0
0
0
1
0
0
0
0
128/64
1100000–110FFFF
SA273
1
0
0
0
1
0
0
0
1
128/64
1110000–111FFFF
SA274
1
0
0
0
1
0
0
1
0
128/64
1120000–112FFFF
SA275
1
0
0
0
1
0
0
1
1
128/64
1130000–113FFFF
SA276
1
0
0
0
1
0
1
0
0
128/64
1140000–114FFFF
SA277
1
0
0
0
1
0
1
0
1
128/64
1150000–115FFFF
SA278
1
0
0
0
1
0
1
1
0
128/64
1160000–116FFFF
SA279
1
0
0
0
1
0
1
1
1
128/64
1170000–117FFFF
SA280
1
0
0
0
1
1
0
0
0
128/64
1180000–118FFFF
SA281
1
0
0
0
1
1
0
0
1
128/64
1190000–119FFFF
SA282
1
0
0
0
1
1
0
1
0
128/64
11A0000–11AFFFF
SA283
1
0
0
0
1
1
0
1
1
128/64
11B0000–11BFFFF
SA284
1
0
0
0
1
1
1
0
0
128/64
11C0000–11CFFFF
SA285
1
0
0
0
1
1
1
0
1
128/64
11D0000–11DFFFF
SA286
1
0
0
0
1
1
1
1
0
128/64
11E0000–11EFFFF
SA287
1
0
0
0
1
1
1
1
1
128/64
11F0000–11FFFFF
SA288
1
0
0
1
0
0
0
0
0
128/64
1200000–120FFFF
SA289
1
0
0
1
0
0
0
0
1
128/64
1210000–121FFFF
SA290
1
0
0
1
0
0
0
1
0
128/64
1220000–122FFFF
SA291
1
0
0
1
0
0
0
1
1
128/64
1230000–123FFFF
SA292
1
0
0
1
0
0
1
0
0
128/64
1240000–124FFFF
SA293
1
0
0
1
0
0
1
0
1
128/64
1250000–125FFFF
SA294
1
0
0
1
0
0
1
1
0
128/64
1260000–126FFFF
SA295
1
0
0
1
0
0
1
1
1
128/64
1270000–127FFFF
SA296
1
0
0
1
0
1
0
0
0
128/64
1280000–128FFFF
SA297
1
0
0
1
0
1
0
0
1
128/64
1290000–129FFFF
SA298
1
0
0
1
0
1
0
1
0
128/64
12A0000–12AFFFF
SA299
1
0
0
1
0
1
0
1
1
128/64
12B0000–12BFFFF
SA300
1
0
0
1
0
1
1
0
0
128/64
12C0000–12CFFFF
SA301
1
0
0
1
0
1
1
0
1
128/64
12D0000–12DFFFF
SA302
1
0
0
1
0
1
1
1
0
128/64
12E0000–12EFFFF
SA303
1
0
0
1
0
1
1
1
1
128/64
12F0000–12FFFFF
December 15, 2004 S29GLxxxN_MCP_A1
S29GLxxxN MirrorBitTM Flash Family
95
A d v a n c e
Table 2.
Sector Address Table–S29GL512N (Continued)
Sector
96
I n f o r m a t i o n
A24–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA304
1
0
0
1
1
0
0
0
0
128/64
1300000–130FFFF
SA305
1
0
0
1
1
0
0
0
1
128/64
1310000–131FFFF
SA306
1
0
0
1
1
0
0
1
0
128/64
1320000–132FFFF
SA307
1
0
0
1
1
0
0
1
1
128/64
1330000–133FFFF
SA308
1
0
0
1
1
0
1
0
0
128/64
1340000–134FFFF
SA309
1
0
0
1
1
0
1
0
1
128/64
1350000–135FFFF
SA310
1
0
0
1
1
0
1
1
0
128/64
1360000–136FFFF
SA311
1
0
0
1
1
0
1
1
1
128/64
1370000–137FFFF
SA312
1
0
0
1
1
1
0
0
0
128/64
1380000–138FFFF
SA313
1
0
0
1
1
1
0
0
1
128/64
1390000–139FFFF
SA314
1
0
0
1
1
1
0
1
0
128/64
13A0000–13AFFFF
SA315
1
0
0
1
1
1
0
1
1
128/64
13B0000–13BFFFF
SA316
1
0
0
1
1
1
1
0
0
128/64
13C0000–13CFFFF
SA317
1
0
0
1
1
1
1
0
1
128/64
13D0000–13DFFFF
SA318
1
0
0
1
1
1
1
1
0
128/64
13E0000–13EFFFF
SA319
1
0
0
1
1
1
1
1
1
128/64
13F0000–13FFFFF
SA320
1
0
1
0
0
0
0
0
0
128/64
1400000–140FFFF
SA321
1
0
1
0
0
0
0
0
1
128/64
1410000–141FFFF
SA322
1
0
1
0
0
0
0
1
0
128/64
1420000–142FFFF
SA323
1
0
1
0
0
0
0
1
1
128/64
1430000–143FFFF
SA324
1
0
1
0
0
0
1
0
0
128/64
1440000–144FFFF
SA325
1
0
1
0
0
0
1
0
1
128/64
1450000–145FFFF
SA326
1
0
1
0
0
0
1
1
0
128/64
1460000–146FFFF
SA327
1
0
1
0
0
0
1
1
1
128/64
1470000–147FFFF
SA328
1
0
1
0
0
1
0
0
0
128/64
1480000–148FFFF
SA329
1
0
1
0
0
1
0
0
1
128/64
1490000–149FFFF
SA330
1
0
1
0
0
1
0
1
0
128/64
14A0000–14AFFFF
SA331
1
0
1
0
0
1
0
1
1
128/64
14B0000–14BFFFF
SA332
1
0
1
0
0
1
1
0
0
128/64
14C0000–14CFFFF
SA333
1
0
1
0
0
1
1
0
1
128/64
14D0000–14DFFFF
SA334
1
0
1
0
0
1
1
1
0
128/64
14E0000–14EFFFF
SA335
1
0
1
0
0
1
1
1
1
128/64
14F0000–14FFFFF
SA336
1
0
1
0
1
0
0
0
0
128/64
1500000–150FFFF
SA337
1
0
1
0
1
0
0
0
1
128/64
1510000–151FFFF
SA338
1
0
1
0
1
0
0
1
0
128/64
1520000–152FFFF
S29GLxxxN MirrorBitTM Flash Family
S29GLxxxN_MCP_A1 December 15, 2004
A d v a n c e
Table 2.
I n f o r m a t i o n
Sector Address Table–S29GL512N (Continued)
Sector
A24–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA339
1
0
1
0
1
0
0
1
1
128/64
1530000–153FFFF
SA340
1
0
1
0
1
0
1
0
0
128/64
1540000–154FFFF
SA341
1
0
1
0
1
0
1
0
1
128/64
1550000–155FFFF
SA342
1
0
1
0
1
0
1
1
0
128/64
1560000–156FFFF
SA343
1
0
1
0
1
0
1
1
1
128/64
1570000–157FFFF
SA344
1
0
1
0
1
1
0
0
0
128/64
1580000–158FFFF
SA345
1
0
1
0
1
1
0
0
1
128/64
1590000–159FFFF
SA346
1
0
1
0
1
1
0
1
0
128/64
15A0000–15AFFFF
SA347
1
0
1
0
1
1
0
1
1
128/64
15B0000–15BFFFF
SA348
1
0
1
0
1
1
1
0
0
128/64
15C0000–15CFFFF
SA349
1
0
1
0
1
1
1
0
1
128/64
15D0000–15DFFFF
SA350
1
0
1
0
1
1
1
1
0
128/64
15E0000–15EFFFF
SA351
1
0
1
0
1
1
1
1
1
128/64
15F0000–15FFFFF
SA352
1
0
1
1
0
0
0
0
0
128/64
1600000–160FFFF
SA353
1
0
1
1
0
0
0
0
1
128/64
1610000–161FFFF
SA354
1
0
1
1
0
0
0
1
0
128/64
1620000–162FFFF
SA355
1
0
1
1
0
0
0
1
1
128/64
1630000–163FFFF
SA356
1
0
1
1
0
0
1
0
0
128/64
1640000–164FFFF
SA357
1
0
1
1
0
0
1
0
1
128/64
1650000–165FFFF
SA358
1
0
1
1
0
0
1
1
0
128/64
1660000–166FFFF
SA359
1
0
1
1
0
0
1
1
1
128/64
1670000–167FFFF
SA360
1
0
1
1
0
1
0
0
0
128/64
1680000–168FFFF
SA361
1
0
1
1
0
1
0
0
1
128/64
1690000–169FFFF
SA362
1
0
1
1
0
1
0
1
0
128/64
16A0000–16AFFFF
SA363
1
0
1
1
0
1
0
1
1
128/64
16B0000–16BFFFF
SA364
1
0
1
1
0
1
1
0
0
128/64
16C0000–16CFFFF
SA365
1
0
1
1
0
1
1
0
1
128/64
16D0000–16DFFFF
SA366
1
0
1
1
0
1
1
1
0
128/64
16E0000–16EFFFF
SA367
1
0
1
1
0
1
1
1
1
128/64
16F0000–16FFFFF
SA368
1
0
1
1
1
0
0
0
0
128/64
1700000–170FFFF
SA369
1
0
1
1
1
0
0
0
1
128/64
1710000–171FFFF
SA370
1
0
1
1
1
0
0
1
0
128/64
1720000–172FFFF
SA371
1
0
1
1
1
0
0
1
1
128/64
1730000–173FFFF
SA372
1
0
1
1
1
0
1
0
0
128/64
1740000–174FFFF
SA373
1
0
1
1
1
0
1
0
1
128/64
1750000–175FFFF
December 15, 2004 S29GLxxxN_MCP_A1
S29GLxxxN MirrorBitTM Flash Family
97
A d v a n c e
Table 2.
Sector Address Table–S29GL512N (Continued)
Sector
98
I n f o r m a t i o n
A24–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA374
1
0
1
1
1
0
1
1
0
128/64
1760000–176FFFF
SA375
1
0
1
1
1
0
1
1
1
128/64
1770000–177FFFF
SA376
1
0
1
1
1
1
0
0
0
128/64
1780000–178FFFF
SA377
1
0
1
1
1
1
0
0
1
128/64
1790000–179FFFF
SA378
1
0
1
1
1
1
0
1
0
128/64
17A0000–17AFFFF
SA379
1
0
1
1
1
1
0
1
1
128/64
17B0000–17BFFFF
SA380
1
0
1
1
1
1
1
0
0
128/64
17C0000–17CFFFF
SA381
1
0
1
1
1
1
1
0
1
128/64
17D0000–17DFFFF
SA382
1
0
1
1
1
1
1
1
0
128/64
17E0000–17EFFFF
SA383
1
0
1
1
1
1
1
1
1
128/64
17F0000–17FFFFF
SA384
1
1
0
0
0
0
0
0
0
128/64
1800000–180FFFF
SA385
1
1
0
0
0
0
0
0
1
128/64
1810000–181FFFF
SA386
1
1
0
0
0
0
0
1
0
128/64
1820000–182FFFF
SA387
1
1
0
0
0
0
0
1
1
128/64
1830000–183FFFF
SA388
1
1
0
0
0
0
1
0
0
128/64
1840000–184FFFF
SA389
1
1
0
0
0
0
1
0
1
128/64
1850000–185FFFF
SA390
1
1
0
0
0
0
1
1
0
128/64
1860000–186FFFF
SA391
1
1
0
0
0
0
1
1
1
128/64
1870000–187FFFF
SA392
1
1
0
0
0
1
0
0
0
128/64
1880000–188FFFF
SA393
1
1
0
0
0
1
0
0
1
128/64
1890000–189FFFF
SA394
1
1
0
0
0
1
0
1
0
128/64
18A0000–18AFFFF
SA395
1
1
0
0
0
1
0
1
1
128/64
18B0000–18BFFFF
SA396
1
1
0
0
0
1
1
0
0
128/64
18C0000–18CFFFF
SA397
1
1
0
0
0
1
1
0
1
128/64
18D0000–18DFFFF
SA398
1
1
0
0
0
1
1
1
0
128/64
18E0000–18EFFFF
SA399
1
1
0
0
0
1
1
1
1
128/64
18F0000–18FFFFF
SA400
1
1
0
0
1
0
0
0
0
128/64
1900000–190FFFF
SA401
1
1
0
0
1
0
0
0
1
128/64
1910000–191FFFF
SA402
1
1
0
0
1
0
0
1
0
128/64
1920000–192FFFF
SA403
1
1
0
0
1
0
0
1
1
128/64
1930000–193FFFF
SA404
1
1
0
0
1
0
1
0
0
128/64
1940000–194FFFF
SA405
1
1
0
0
1
0
1
0
1
128/64
1950000–195FFFF
SA406
1
1
0
0
1
0
1
1
0
128/64
1960000–196FFFF
SA407
1
1
0
0
1
0
1
1
1
128/64
1970000–197FFFF
SA408
1
1
0
0
1
1
0
0
0
128/64
1980000–198FFFF
S29GLxxxN MirrorBitTM Flash Family
S29GLxxxN_MCP_A1 December 15, 2004
A d v a n c e
Table 2.
I n f o r m a t i o n
Sector Address Table–S29GL512N (Continued)
Sector
A24–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA409
1
1
0
0
1
1
0
0
1
128/64
1990000–199FFFF
SA410
1
1
0
0
1
1
0
1
0
128/64
19A0000–19AFFFF
SA411
1
1
0
0
1
1
0
1
1
128/64
19B0000–19BFFFF
SA412
1
1
0
0
1
1
1
0
0
128/64
19C0000–19CFFFF
SA413
1
1
0
0
1
1
1
0
1
128/64
19D0000–19DFFFF
SA414
1
1
0
0
1
1
1
1
0
128/64
19E0000–19EFFFF
SA415
1
1
0
0
1
1
1
1
1
128/64
19F0000–19FFFFF
SA416
1
1
0
1
0
0
0
0
0
128/64
1A00000–1A0FFFF
SA417
1
1
0
1
0
0
0
0
1
128/64
1A10000–1A1FFFF
SA418
1
1
0
1
0
0
0
1
0
128/64
1A20000–1A2FFFF
SA419
1
1
0
1
0
0
0
1
1
128/64
1A30000–1A3FFFF
SA420
1
1
0
1
0
0
1
0
0
128/64
1A40000–1A4FFFF
SA421
1
1
0
1
0
0
1
0
1
128/64
1A50000–1A5FFFF
SA422
1
1
0
1
0
0
1
1
0
128/64
1A60000–1A6FFFF
SA423
1
1
0
1
0
0
1
1
1
128/64
1A70000–1A7FFFF
SA424
1
1
0
1
0
1
0
0
0
128/64
1A80000–1A8FFFF
SA425
1
1
0
1
0
1
0
0
1
128/64
1A90000–1A9FFFF
SA426
1
1
0
1
0
1
0
1
0
128/64
1AA0000–1AAFFFF
SA427
1
1
0
1
0
1
0
1
1
128/64
1AB0000–1ABFFFF
SA428
1
1
0
1
0
1
1
0
0
128/64
1AC0000–1ACFFFF
SA429
1
1
0
1
0
1
1
0
1
128/64
1AD0000–1ADFFFF
SA430
1
1
0
1
0
1
1
1
0
128/64
1AE0000–1AEFFFF
SA431
1
1
0
1
0
1
1
1
1
128/64
1AF0000–1AFFFFF
SA432
1
1
0
1
1
0
0
0
0
128/64
1B00000–1B0FFFF
SA433
1
1
0
1
1
0
0
0
1
128/64
1B10000–1B1FFFF
SA434
1
1
0
1
1
0
0
1
0
128/64
1B20000–1B2FFFF
SA435
1
1
0
1
1
0
0
1
1
128/64
1B30000–1B3FFFF
SA436
1
1
0
1
1
0
1
0
0
128/64
1B40000–1B4FFFF
SA437
1
1
0
1
1
0
1
0
1
128/64
1B50000–1B5FFFF
SA438
1
1
0
1
1
0
1
1
0
128/64
1B60000–1B6FFFF
SA439
1
1
0
1
1
0
1
1
1
128/64
1B70000–1B7FFFF
SA440
1
1
0
1
1
1
0
0
0
128/64
1B80000–1B8FFFF
SA441
1
1
0
1
1
1
0
0
1
128/64
1B90000–1B9FFFF
SA442
1
1
0
1
1
1
0
1
0
128/64
1BA0000–1BAFFFF
SA443
1
1
0
1
1
1
0
1
1
128/64
1BB0000–1BBFFFF
December 15, 2004 S29GLxxxN_MCP_A1
S29GLxxxN MirrorBitTM Flash Family
99
A d v a n c e
Table 2.
I n f o r m a t i o n
Sector Address Table–S29GL512N (Continued)
Sector
A24–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA444
1
1
0
1
1
1
1
0
0
128/64
1BC0000–1BCFFFF
SA445
1
1
0
1
1
1
1
0
1
128/64
1BD0000–1BDFFFF
SA446
1
1
0
1
1
1
1
1
0
128/64
1BE0000–1BEFFFF
SA447
1
1
0
1
1
1
1
1
1
128/64
1BF0000–1BFFFFF
SA448
1
1
1
0
0
0
0
0
0
128/64
1C00000–1C0FFFF
SA449
1
1
1
0
0
0
0
0
1
128/64
1C10000–1C1FFFF
SA450
1
1
1
0
0
0
0
1
0
128/64
1C20000–1C2FFFF
SA451
1
1
1
0
0
0
0
1
1
128/64
1C30000–1C3FFFF
SA452
1
1
1
0
0
0
1
0
0
128/64
1C40000–1C4FFFF
SA453
1
1
1
0
0
0
1
0
1
128/64
1C50000–1C5FFFF
SA454
1
1
1
0
0
0
1
1
0
128/64
1C60000–1C6FFFF
SA455
1
1
1
0
0
0
1
1
1
128/64
1C70000–1C7FFFF
SA456
1
1
1
0
0
1
0
0
0
128/64
1C80000–1C8FFFF
SA457
1
1
1
0
0
1
0
0
1
128/64
1C90000–1C9FFFF
SA458
1
1
1
0
0
1
0
1
0
128/64
1CA0000–1CAFFFF
SA459
1
1
1
0
0
1
0
1
1
128/64
1CB0000–1CBFFFF
SA460
1
1
1
0
0
1
1
0
0
128/64
1CC0000–1CCFFFF
SA461
1
1
1
0
0
1
1
0
1
128/64
1CD0000–1CDFFFF
SA462
1
1
1
0
0
1
1
1
0
128/64
1CE0000–1CEFFFF
SA463
1
1
1
0
0
1
1
1
1
128/64
1CF0000–1CFFFFF
SA464
1
1
1
0
1
0
0
0
0
128/64
1D00000–1D0FFFF
SA465
1
1
1
0
1
0
0
0
1
128/64
1D10000–1D1FFFF
SA466
1
1
1
0
1
0
0
1
0
128/64
1D20000–1D2FFFF
SA467
1
1
1
0
1
0
0
1
1
128/64
1D30000–1D3FFFF
SA468
1
1
1
0
1
0
1
0
0
128/64
1D40000–1D4FFFF
SA469
1
1
1
0
1
0
1
0
1
128/64
1D50000–1D5FFFF
SA470
1
1
1
0
1
0
1
1
0
128/64
1D60000–1D6FFFF
SA471
1
1
1
0
1
0
1
1
1
128/64
1D70000–1D7FFFF
SA472
1
1
1
0
1
1
0
0
0
128/64
1D80000–1D8FFFF
SA473
1
1
1
0
1
1
0
0
1
128/64
1D90000–1D9FFFF
SA474
1
1
1
0
1
1
0
1
0
128/64
1DA0000–1DAFFFF
SA475
1
1
1
0
1
1
0
1
1
128/64
1DB0000–1DBFFFF
SA476
1
1
1
0
1
1
1
0
0
128/64
1DC0000–1DCFFFF
SA477
1
1
1
0
1
1
1
0
1
128/64
1DD0000–1DDFFFF
SA478
1
1
1
0
1
1
1
1
0
128/64
1DE0000–1DEFFFF
100
S29GLxxxN MirrorBitTM Flash Family
S29GLxxxN_MCP_A1 December 15, 2004
A d v a n c e
Table 2.
I n f o r m a t i o n
Sector Address Table–S29GL512N (Continued)
Sector
A24–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA479
1
1
1
0
1
1
1
1
1
128/64
1DF0000–1DFFFFF
SA480
1
1
1
1
0
0
0
0
0
128/64
1E00000–1E0FFFF
SA481
1
1
1
1
0
0
0
0
1
128/64
1E10000–1E1FFFF
SA482
1
1
1
1
0
0
0
1
0
128/64
1E20000–1E2FFFF
SA483
1
1
1
1
0
0
0
1
1
128/64
1E30000–1E3FFFF
SA484
1
1
1
1
0
0
1
0
0
128/64
1E40000–1E4FFFF
SA485
1
1
1
1
0
0
1
0
1
128/64
1E50000–1E5FFFF
SA486
1
1
1
1
0
0
1
1
0
128/64
1E60000–1E6FFFF
SA487
1
1
1
1
0
0
1
1
1
128/64
1E70000–1E7FFFF
SA488
1
1
1
1
0
1
0
0
0
128/64
1E80000–1E8FFFF
SA489
1
1
1
1
0
1
0
0
1
128/64
1E90000–1E9FFFF
SA490
1
1
1
1
0
1
0
1
0
128/64
1EA0000–1EAFFFF
SA491
1
1
1
1
0
1
0
1
1
128/64
1EB0000–1EBFFFF
SA492
1
1
1
1
0
1
1
0
0
128/64
1EC0000–1ECFFFF
SA493
1
1
1
1
0
1
1
0
1
128/64
1ED0000–1EDFFFF
SA494
1
1
1
1
0
1
1
1
0
128/64
1EE0000–1EEFFFF
SA495
1
1
1
1
0
1
1
1
1
128/64
1EF0000–1EFFFFF
SA496
1
1
1
1
1
0
0
0
0
128/64
1F00000–1F0FFFF
SA497
1
1
1
1
1
0
0
0
1
128/64
1F10000–1F1FFFF
SA498
1
1
1
1
1
0
0
1
0
128/64
1F20000–1F2FFFF
SA499
1
1
1
1
1
0
0
1
1
128/64
1F30000–1F3FFFF
SA500
1
1
1
1
1
0
1
0
0
128/64
1F40000–1F4FFFF
SA501
1
1
1
1
1
0
1
0
1
128/64
1F50000–1F5FFFF
SA502
1
1
1
1
1
0
1
1
0
128/64
1F60000–1F6FFFF
SA503
1
1
1
1
1
0
1
1
1
128/64
1F70000–1F7FFFF
SA504
1
1
1
1
1
1
0
0
0
128/64
1F80000–1F8FFFF
SA505
1
1
1
1
1
1
0
0
1
128/64
1F90000–1F9FFFF
SA506
1
1
1
1
1
1
0
1
0
128/64
1FA0000–1FAFFFF
SA507
1
1
1
1
1
1
0
1
1
128/64
1FB0000–1FBFFFF
SA508
1
1
1
1
1
1
1
0
0
128/64
1FC0000–1FCFFFF
SA509
1
1
1
1
1
1
1
0
1
128/64
1FD0000–1FDFFFF
SA510
1
1
1
1
1
1
1
1
0
128/64
1FE0000–1FEFFFF
SA511
1
1
1
1
1
1
1
1
1
128/64
1FF0000–1FFFFFF
December 15, 2004 S29GLxxxN_MCP_A1
S29GLxxxN MirrorBitTM Flash Family
101
A d v a n c e
I n f o r m a t i o n
Table 3. Sector Address Table–S29GL256N
Sector
102
A23–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA0
0
0
0
0
0
0
0
0
128/64
0000000–000FFFF
SA1
0
0
0
0
0
0
0
1
128/64
0010000–001FFFF
SA2
0
0
0
0
0
0
1
0
128/64
0020000–002FFFF
SA3
0
0
0
0
0
0
1
1
128/64
0030000–003FFFF
SA4
0
0
0
0
0
1
0
0
128/64
0040000–004FFFF
SA5
0
0
0
0
0
1
0
1
128/64
0050000–005FFFF
SA6
0
0
0
0
0
1
1
0
128/64
0060000–006FFFF
SA7
0
0
0
0
0
1
1
1
128/64
0070000–007FFFF
SA8
0
0
0
0
1
0
0
0
128/64
0080000–008FFFF
SA9
0
0
0
0
1
0
0
1
128/64
0090000–009FFFF
SA10
0
0
0
0
1
0
1
0
128/64
00A0000–00AFFFF
SA11
0
0
0
0
1
0
1
1
128/64
00B0000–00BFFFF
SA12
0
0
0
0
1
1
0
0
128/64
00C0000–00CFFFF
SA13
0
0
0
0
1
1
0
1
128/64
00D0000–00DFFFF
SA14
0
0
0
0
1
1
1
0
128/64
00E0000–00EFFFF
SA15
0
0
0
0
1
1
1
1
128/64
00F0000–00FFFFF
SA16
0
0
0
1
0
0
0
0
128/64
0100000–010FFFF
SA17
0
0
0
1
0
0
0
1
128/64
0110000–011FFFF
SA18
0
0
0
1
0
0
1
0
128/64
0120000–012FFFF
SA19
0
0
0
1
0
0
1
1
128/64
0130000–013FFFF
SA20
0
0
0
1
0
1
0
0
128/64
0140000–014FFFF
SA21
0
0
0
1
0
1
0
1
128/64
0150000–015FFFF
SA22
0
0
0
1
0
1
1
0
128/64
0160000–016FFFF
SA23
0
0
0
1
0
1
1
1
128/64
0170000–017FFFF
SA24
0
0
0
1
1
0
0
0
128/64
0180000–018FFFF
SA25
0
0
0
1
1
0
0
1
128/64
0190000–019FFFF
SA26
0
0
0
1
1
0
1
0
128/64
01A0000–01AFFFF
SA27
0
0
0
1
1
0
1
1
128/64
01B0000–01BFFFF
SA28
0
0
0
1
1
1
0
0
128/64
01C0000–01CFFFF
SA29
0
0
0
1
1
1
0
1
128/64
01D0000–01DFFFF
SA30
0
0
0
1
1
1
1
0
128/64
01E0000–01EFFFF
SA31
0
0
0
1
1
1
1
1
128/64
01F0000–01FFFFF
SA32
0
0
1
0
0
0
0
0
128/64
0200000–020FFFF
SA33
0
0
1
0
0
0
0
1
128/64
0210000–021FFFF
S29GLxxxN MirrorBitTM Flash Family
S29GLxxxN_MCP_A1 December 15, 2004
A d v a n c e
I n f o r m a t i o n
Table 3. Sector Address Table–S29GL256N (Continued)
Sector
A23–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA34
0
0
1
0
0
0
1
0
128/64
0220000–022FFFF
SA35
0
0
1
0
0
0
1
1
128/64
0230000–023FFFF
SA36
0
0
1
0
0
1
0
0
128/64
0240000–024FFFF
SA37
0
0
1
0
0
1
0
1
128/64
0250000–025FFFF
SA38
0
0
1
0
0
1
1
0
128/64
0260000–026FFFF
SA39
0
0
1
0
0
1
1
1
128/64
0270000–027FFFF
SA40
0
0
1
0
1
0
0
0
128/64
0280000–028FFFF
SA41
0
0
1
0
1
0
0
1
128/64
0290000–029FFFF
SA42
0
0
1
0
1
0
1
0
128/64
02A0000–02AFFFF
SA43
0
0
1
0
1
0
1
1
128/64
02B0000–02BFFFF
SA44
0
0
1
0
1
1
0
0
128/64
02C0000–02CFFFF
SA45
0
0
1
0
1
1
0
1
128/64
02D0000–02DFFFF
SA46
0
0
1
0
1
1
1
0
128/64
02E0000–02EFFFF
SA47
0
0
1
0
1
1
1
1
128/64
02F0000–02FFFFF
SA48
0
0
1
1
0
0
0
0
128/64
0300000–030FFFF
SA49
0
0
1
1
0
0
0
1
128/64
0310000–031FFFF
SA50
0
0
1
1
0
0
1
0
128/64
0320000–032FFFF
SA51
0
0
1
1
0
0
1
1
128/64
0330000–033FFFF
SA52
0
0
1
1
0
1
0
0
128/64
0340000–034FFFF
SA53
0
0
1
1
0
1
0
1
128/64
0350000–035FFFF
SA54
0
0
1
1
0
1
1
0
128/64
0360000–036FFFF
SA55
0
0
1
1
0
1
1
1
128/64
0370000–037FFFF
SA56
0
0
1
1
1
0
0
0
128/64
0380000–038FFFF
SA57
0
0
1
1
1
0
0
1
128/64
0390000–039FFFF
SA58
0
0
1
1
1
0
1
0
128/64
03A0000–03AFFFF
SA59
0
0
1
1
1
0
1
1
128/64
03B0000–03BFFFF
SA60
0
0
1
1
1
1
0
0
128/64
03C0000–03CFFFF
SA61
0
0
1
1
1
1
0
1
128/64
03D0000–03DFFFF
SA62
0
0
1
1
1
1
1
0
128/64
03E0000–03EFFFF
SA63
0
0
1
1
1
1
1
1
128/64
03F0000–03FFFFF
SA64
0
1
0
0
0
0
0
0
128/64
0400000–040FFFF
SA65
0
1
0
0
0
0
0
1
128/64
0410000–041FFFF
SA66
0
1
0
0
0
0
1
0
128/64
0420000–042FFFF
SA67
0
1
0
0
0
0
1
1
128/64
0430000–043FFFF
SA68
0
1
0
0
0
1
0
0
128/64
0440000–044FFFF
December 15, 2004 S29GLxxxN_MCP_A1
S29GLxxxN MirrorBitTM Flash Family
103
A d v a n c e
I n f o r m a t i o n
Table 3. Sector Address Table–S29GL256N (Continued)
Sector
104
A23–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA69
0
1
0
0
0
1
0
1
128/64
0450000–045FFFF
SA70
0
1
0
0
0
1
1
0
128/64
0460000–046FFFF
SA71
0
1
0
0
0
1
1
1
128/64
0470000–047FFFF
SA72
0
1
0
0
1
0
0
0
128/64
0480000–048FFFF
SA73
0
1
0
0
1
0
0
1
128/64
0490000–049FFFF
SA74
0
1
0
0
1
0
1
0
128/64
04A0000–04AFFFF
SA75
0
1
0
0
1
0
1
1
128/64
04B0000–04BFFFF
SA76
0
1
0
0
1
1
0
0
128/64
04C0000–04CFFFF
SA77
0
1
0
0
1
1
0
1
128/64
04D0000–04DFFFF
SA78
0
1
0
0
1
1
1
0
128/64
04E0000–04EFFFF
SA79
0
1
0
0
1
1
1
1
128/64
04F0000–04FFFFF
SA80
0
1
0
1
0
0
0
0
128/64
0500000–050FFFF
SA81
0
1
0
1
0
0
0
1
128/64
0510000–051FFFF
SA82
0
1
0
1
0
0
1
0
128/64
0520000–052FFFF
SA83
0
1
0
1
0
0
1
1
128/64
0530000–053FFFF
SA84
0
1
0
1
0
1
0
0
128/64
0540000–054FFFF
SA85
0
1
0
1
0
1
0
1
128/64
0550000–055FFFF
SA86
0
1
0
1
0
1
1
0
128/64
0560000–056FFFF
SA87
0
1
0
1
0
1
1
1
128/64
0570000–057FFFF
SA88
0
1
0
1
1
0
0
0
128/64
0580000–058FFFF
SA89
0
1
0
1
1
0
0
1
128/64
0590000–059FFFF
SA90
0
1
0
1
1
0
1
0
128/64
05A0000–05AFFFF
SA91
0
1
0
1
1
0
1
1
128/64
05B0000–05BFFFF
SA92
0
1
0
1
1
1
0
0
128/64
05C0000–05CFFFF
SA93
0
1
0
1
1
1
0
1
128/64
05D0000–05DFFFF
SA94
0
1
0
1
1
1
1
0
128/64
05E0000–05EFFFF
SA95
0
1
0
1
1
1
1
1
128/64
05F0000–05FFFFF
SA96
0
1
1
0
0
0
0
0
128/64
0600000–060FFFF
SA97
0
1
1
0
0
0
0
1
128/64
0610000–061FFFF
SA98
0
1
1
0
0
0
1
0
128/64
0620000–062FFFF
SA99
0
1
1
0
0
0
1
1
128/64
0630000–063FFFF
SA100
0
1
1
0
0
1
0
0
128/64
0640000–064FFFF
SA101
0
1
1
0
0
1
0
1
128/64
0650000–065FFFF
SA102
0
1
1
0
0
1
1
0
128/64
0660000–066FFFF
SA103
0
1
1
0
0
1
1
1
128/64
0670000–067FFFF
S29GLxxxN MirrorBitTM Flash Family
S29GLxxxN_MCP_A1 December 15, 2004
A d v a n c e
I n f o r m a t i o n
Table 3. Sector Address Table–S29GL256N (Continued)
Sector
A23–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA104
0
1
1
0
1
0
0
0
128/64
0680000–068FFFF
SA105
0
1
1
0
1
0
0
1
128/64
0690000–069FFFF
SA106
0
1
1
0
1
0
1
0
128/64
06A0000–06AFFFF
SA107
0
1
1
0
1
0
1
1
128/64
06B0000–06BFFFF
SA108
0
1
1
0
1
1
0
0
128/64
06C0000–06CFFFF
SA109
0
1
1
0
1
1
0
1
128/64
06D0000–06DFFFF
SA110
0
1
1
0
1
1
1
0
128/64
06E0000–06EFFFF
SA111
0
1
1
0
1
1
1
1
128/64
06F0000–06FFFFF
SA112
0
1
1
1
0
0
0
0
128/64
0700000–070FFFF
SA113
0
1
1
1
0
0
0
1
128/64
0710000–071FFFF
SA114
0
1
1
1
0
0
1
0
128/64
0720000–072FFFF
SA115
0
1
1
1
0
0
1
1
128/64
0730000–073FFFF
SA116
0
1
1
1
0
1
0
0
128/64
0740000–074FFFF
SA117
0
1
1
1
0
1
0
1
128/64
0750000–075FFFF
SA118
0
1
1
1
0
1
1
0
128/64
0760000–076FFFF
SA119
0
1
1
1
0
1
1
1
128/64
0770000–077FFFF
SA120
0
1
1
1
1
0
0
0
128/64
0780000–078FFFF
SA121
0
1
1
1
1
0
0
1
128/64
0790000–079FFFF
SA122
0
1
1
1
1
0
1
0
128/64
07A0000–07AFFFF
SA123
0
1
1
1
1
0
1
1
128/64
07B0000–07BFFFF
SA124
0
1
1
1
1
1
0
0
128/64
07C0000–07CFFFF
SA125
0
1
1
1
1
1
0
1
128/64
07D0000–07DFFFF
SA126
0
1
1
1
1
1
1
0
128/64
07E0000–07EFFFF
SA127
0
1
1
1
1
1
1
1
128/64
07F0000–07FFFFF
SA128
1
0
0
0
0
0
0
0
128/64
0800000–080FFFF
SA129
1
0
0
0
0
0
0
1
128/64
0810000–081FFFF
SA130
1
0
0
0
0
0
1
0
128/64
0820000–082FFFF
SA131
1
0
0
0
0
0
1
1
128/64
0830000–083FFFF
SA132
1
0
0
0
0
1
0
0
128/64
0840000–084FFFF
SA133
1
0
0
0
0
1
0
1
128/64
0850000–085FFFF
SA134
1
0
0
0
0
1
1
0
128/64
0860000–086FFFF
SA135
1
0
0
0
0
1
1
1
128/64
0870000–087FFFF
SA136
1
0
0
0
1
0
0
0
128/64
0880000–088FFFF
SA137
1
0
0
0
1
0
0
1
128/64
0890000–089FFFF
SA138
1
0
0
0
1
0
1
0
128/64
08A0000–08AFFFF
December 15, 2004 S29GLxxxN_MCP_A1
S29GLxxxN MirrorBitTM Flash Family
105
A d v a n c e
I n f o r m a t i o n
Table 3. Sector Address Table–S29GL256N (Continued)
Sector
106
A23–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA139
1
0
0
0
1
0
1
1
128/64
08B0000–08BFFFF
SA140
1
0
0
0
1
1
0
0
128/64
08C0000–08CFFFF
SA141
1
0
0
0
1
1
0
1
128/64
08D0000–08DFFFF
SA142
1
0
0
0
1
1
1
0
128/64
08E0000–08EFFFF
SA143
1
0
0
0
1
1
1
1
128/64
08F0000–08FFFFF
SA144
1
0
0
1
0
0
0
0
128/64
0900000–090FFFF
SA145
1
0
0
1
0
0
0
1
128/64
0910000–091FFFF
SA146
1
0
0
1
0
0
1
0
128/64
0920000–092FFFF
SA147
1
0
0
1
0
0
1
1
128/64
0930000–093FFFF
SA148
1
0
0
1
0
1
0
0
128/64
0940000–094FFFF
SA149
1
0
0
1
0
1
0
1
128/64
0950000–095FFFF
SA150
1
0
0
1
0
1
1
0
128/64
0960000–096FFFF
SA151
1
0
0
1
0
1
1
1
128/64
0970000–097FFFF
SA152
1
0
0
1
1
0
0
0
128/64
0980000–098FFFF
SA153
1
0
0
1
1
0
0
1
128/64
0990000–099FFFF
SA154
1
0
0
1
1
0
1
0
128/64
09A0000–09AFFFF
SA155
1
0
0
1
1
0
1
1
128/64
09B0000–09BFFFF
SA156
1
0
0
1
1
1
0
0
128/64
09C0000–09CFFFF
SA157
1
0
0
1
1
1
0
1
128/64
09D0000–09DFFFF
SA158
1
0
0
1
1
1
1
0
128/64
09E0000–09EFFFF
SA159
1
0
0
1
1
1
1
1
128/64
09F0000–09FFFFF
SA160
1
0
1
0
0
0
0
0
128/64
0A00000–0A0FFFF
SA161
1
0
1
0
0
0
0
1
128/64
0A10000–0A1FFFF
SA162
1
0
1
0
0
0
1
0
128/64
0A20000–0A2FFFF
SA163
1
0
1
0
0
0
1
1
128/64
0A30000–0A3FFFF
SA164
1
0
1
0
0
1
0
0
128/64
0A40000–0A4FFFF
SA165
1
0
1
0
0
1
0
1
128/64
0A50000–0A5FFFF
SA166
1
0
1
0
0
1
1
0
128/64
0A60000–0A6FFFF
SA167
1
0
1
0
0
1
1
1
128/64
0A70000–0A7FFFF
SA168
1
0
1
0
1
0
0
0
128/64
0A80000–0A8FFFF
SA169
1
0
1
0
1
0
0
1
128/64
0A90000–0A9FFFF
SA170
1
0
1
0
1
0
1
0
128/64
0AA0000–0AAFFFF
SA171
1
0
1
0
1
0
1
1
128/64
0AB0000–0ABFFFF
SA172
1
0
1
0
1
1
0
0
128/64
0AC0000–0ACFFFF
SA173
1
0
1
0
1
1
0
1
128/64
0AD0000–0ADFFFF
S29GLxxxN MirrorBitTM Flash Family
S29GLxxxN_MCP_A1 December 15, 2004
A d v a n c e
I n f o r m a t i o n
Table 3. Sector Address Table–S29GL256N (Continued)
Sector
A23–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA174
1
0
1
0
1
1
1
0
128/64
0AE0000–0AEFFFF
SA175
1
0
1
0
1
1
1
1
128/64
0AF0000–0AFFFFF
SA176
1
0
1
1
0
0
0
0
128/64
0B00000–0B0FFFF
SA177
1
0
1
1
0
0
0
1
128/64
0B10000–0B1FFFF
SA178
1
0
1
1
0
0
1
0
128/64
0B20000–0B2FFFF
SA179
1
0
1
1
0
0
1
1
128/64
0B30000–0B3FFFF
SA180
1
0
1
1
0
1
0
0
128/64
0B40000–0B4FFFF
SA181
1
0
1
1
0
1
0
1
128/64
0B50000–0B5FFFF
SA182
1
0
1
1
0
1
1
0
128/64
0B60000–0B6FFFF
SA183
1
0
1
1
0
1
1
1
128/64
0B70000–0B7FFFF
SA184
1
0
1
1
1
0
0
0
128/64
0B80000–0B8FFFF
SA185
1
0
1
1
1
0
0
1
128/64
0B90000–0B9FFFF
SA186
1
0
1
1
1
0
1
0
128/64
0BA0000–0BAFFFF
SA187
1
0
1
1
1
0
1
1
128/64
0BB0000–0BBFFFF
SA188
1
0
1
1
1
1
0
0
128/64
0BC0000–0BCFFFF
SA189
1
0
1
1
1
1
0
1
128/64
0BD0000–0BDFFFF
SA190
1
0
1
1
1
1
1
0
128/64
0BE0000–0BEFFFF
SA191
1
0
1
1
1
1
1
1
128/64
0BF0000–0BFFFFF
SA192
1
1
0
0
0
0
0
0
128/64
0C00000–0C0FFFF
SA193
1
1
0
0
0
0
0
1
128/64
0C10000–0C1FFFF
SA194
1
1
0
0
0
0
1
0
128/64
0C20000–0C2FFFF
SA195
1
1
0
0
0
0
1
1
128/64
0C30000–0C3FFFF
SA196
1
1
0
0
0
1
0
0
128/64
0C40000–0C4FFFF
SA197
1
1
0
0
0
1
0
1
128/64
0C50000–0C5FFFF
SA198
1
1
0
0
0
1
1
0
128/64
0C60000–0C6FFFF
SA199
1
1
0
0
0
1
1
1
128/64
0C70000–0C7FFFF
SA200
1
1
0
0
1
0
0
0
128/64
0C80000–0C8FFFF
SA201
1
1
0
0
1
0
0
1
128/64
0C90000–0C9FFFF
SA202
1
1
0
0
1
0
1
0
128/64
0CA0000–0CAFFFF
SA203
1
1
0
0
1
0
1
1
128/64
0CB0000–0CBFFFF
SA204
1
1
0
0
1
1
0
0
128/64
0CC0000–0CCFFFF
SA205
1
1
0
0
1
1
0
1
128/64
0CD0000–0CDFFFF
SA206
1
1
0
0
1
1
1
0
128/64
0CE0000–0CEFFFF
SA207
1
1
0
0
1
1
1
1
128/64
0CF0000–0CFFFFF
SA208
1
1
0
1
0
0
0
0
128/64
0D00000–0D0FFFF
December 15, 2004 S29GLxxxN_MCP_A1
S29GLxxxN MirrorBitTM Flash Family
107
A d v a n c e
I n f o r m a t i o n
Table 3. Sector Address Table–S29GL256N (Continued)
Sector
108
A23–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA209
1
1
0
1
0
0
0
1
128/64
0D10000–0D1FFFF
SA210
1
1
0
1
0
0
1
0
128/64
0D20000–0D2FFFF
SA211
1
1
0
1
0
0
1
1
128/64
0D30000–0D3FFFF
SA212
1
1
0
1
0
1
0
0
128/64
0D40000–0D4FFFF
SA213
1
1
0
1
0
1
0
1
128/64
0D50000–0D5FFFF
SA214
1
1
0
1
0
1
1
0
128/64
0D60000–0D6FFFF
SA215
1
1
0
1
0
1
1
1
128/64
0D70000–0D7FFFF
SA216
1
1
0
1
1
0
0
0
128/64
0D80000–0D8FFFF
SA217
1
1
0
1
1
0
0
1
128/64
0D90000–0D9FFFF
SA218
1
1
0
1
1
0
1
0
128/64
0DA0000–0DAFFFF
SA219
1
1
0
1
1
0
1
1
128/64
0DB0000–0DBFFFF
SA220
1
1
0
1
1
1
0
0
128/64
0DC0000–0DCFFFF
SA221
1
1
0
1
1
1
0
1
128/64
0DD0000–0DDFFFF
SA222
1
1
0
1
1
1
1
0
128/64
0DE0000–0DEFFFF
SA223
1
1
0
1
1
1
1
1
128/64
0DF0000–0DFFFFF
SA224
1
1
1
0
0
0
0
0
128/64
0E00000–0E0FFFF
SA225
1
1
1
0
0
0
0
1
128/64
0E10000–0E1FFFF
SA226
1
1
1
0
0
0
1
0
128/64
0E20000–0E2FFFF
SA227
1
1
1
0
0
0
1
1
128/64
0E30000–0E3FFFF
SA228
1
1
1
0
0
1
0
0
128/64
0E40000–0E4FFFF
SA229
1
1
1
0
0
1
0
1
128/64
0E50000–0E5FFFF
SA230
1
1
1
0
0
1
1
0
128/64
0E60000–0E6FFFF
SA231
1
1
1
0
0
1
1
1
128/64
0E70000–0E7FFFF
SA232
1
1
1
0
1
0
0
0
128/64
0E80000–0E8FFFF
SA233
1
1
1
0
1
0
0
1
128/64
0E90000–0E9FFFF
SA234
1
1
1
0
1
0
1
0
128/64
0EA0000–0EAFFFF
SA235
1
1
1
0
1
0
1
1
128/64
0EB0000–0EBFFFF
SA236
1
1
1
0
1
1
0
0
128/64
0EC0000–0ECFFFF
SA237
1
1
1
0
1
1
0
1
128/64
0ED0000–0EDFFFF
SA238
1
1
1
0
1
1
1
0
128/64
0EE0000–0EEFFFF
SA239
1
1
1
0
1
1
1
1
128/64
0EF0000–0EFFFFF
SA240
1
1
1
1
0
0
0
0
128/64
0F00000–0F0FFFF
SA241
1
1
1
1
0
0
0
1
128/64
0F10000–0F1FFFF
SA242
1
1
1
1
0
0
1
0
128/64
0F20000–0F2FFFF
SA243
1
1
1
1
0
0
1
1
128/64
0F30000–0F3FFFF
S29GLxxxN MirrorBitTM Flash Family
S29GLxxxN_MCP_A1 December 15, 2004
A d v a n c e
I n f o r m a t i o n
Table 3. Sector Address Table–S29GL256N (Continued)
Sector
A23–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA244
1
1
1
1
0
1
0
0
128/64
0F40000–0F4FFFF
SA245
1
1
1
1
0
1
0
1
128/64
0F50000–0F5FFFF
SA246
1
1
1
1
0
1
1
0
128/64
0F60000–0F6FFFF
SA247
1
1
1
1
0
1
1
1
128/64
0F70000–0F7FFFF
SA248
1
1
1
1
1
0
0
0
128/64
0F80000–0F8FFFF
SA249
1
1
1
1
1
0
0
1
128/64
0F90000–0F9FFFF
SA250
1
1
1
1
1
0
1
0
128/64
0FA0000–0FAFFFF
SA251
1
1
1
1
1
0
1
1
128/64
0FB0000–0FBFFFF
SA252
1
1
1
1
1
1
0
0
128/64
0FC0000–0FCFFFF
SA253
1
1
1
1
1
1
0
1
128/64
0FD0000–0FDFFFF
SA254
1
1
1
1
1
1
1
0
128/64
0FE0000–0FEFFFF
SA255
1
1
1
1
1
1
1
1
128/64
0FF0000–0FFFFFF
Table 4. Sector Address Table–S29GL128N
Sector
A22–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA0
0
0
0
0
0
0
128/64
0000000–000FFFF
SA1
0
0
0
0
0
1
128/64
0010000–001FFFF
SA2
0
0
0
0
1
0
128/64
0020000–002FFFF
SA3
0
0
0
0
1
1
128/64
0030000–003FFFF
SA4
0
0
0
1
0
0
128/64
0040000–004FFFF
SA5
0
0
0
1
0
1
128/64
0050000–005FFFF
SA6
0
0
0
1
1
0
128/64
0060000–006FFFF
SA7
0
0
0
1
1
1
128/64
0070000–007FFFF
SA8
0
0
1
0
0
0
128/64
0080000–008FFFF
SA9
0
0
1
0
0
1
128/64
0090000–009FFFF
SA10
0
0
1
0
1
0
128/64
00A0000–00AFFFF
SA11
0
0
1
0
1
1
128/64
00B0000–00BFFFF
SA12
0
0
1
1
0
0
128/64
00C0000–00CFFFF
SA13
0
0
1
1
0
1
128/64
00D0000–00DFFFF
SA14
0
0
1
1
1
0
128/64
00E0000–00EFFFF
SA15
0
0
1
1
1
1
128/64
00F0000–00FFFFF
SA16
0
1
0
0
0
0
128/64
0100000–010FFFF
SA17
0
1
0
0
0
1
128/64
0110000–011FFFF
December 15, 2004 S29GLxxxN_MCP_A1
S29GLxxxN MirrorBitTM Flash Family
109
A d v a n c e
Table 4.
Sector
110
I n f o r m a t i o n
Sector Address Table–S29GL128N (Continued)
A22–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA18
0
1
0
0
1
0
128/64
0120000–012FFFF
SA19
0
1
0
0
1
1
128/64
0130000–013FFFF
SA20
0
1
0
1
0
0
128/64
0140000–014FFFF
SA21
0
1
0
1
0
1
128/64
0150000–015FFFF
SA22
0
1
0
1
1
0
128/64
0160000–016FFFF
SA23
0
1
0
1
1
1
128/64
0170000–017FFFF
SA24
0
1
1
0
0
0
128/64
0180000–018FFFF
SA25
0
1
1
0
0
1
128/64
0190000–019FFFF
SA26
0
1
1
0
1
0
128/64
01A0000–01AFFFF
SA27
0
1
1
0
1
1
128/64
01B0000–01BFFFF
SA28
0
1
1
1
0
0
128/64
01C0000–01CFFFF
SA29
0
1
1
1
0
1
128/64
01D0000–01DFFFF
SA30
0
1
1
1
1
0
128/64
01E0000–01EFFFF
SA31
0
1
1
1
1
1
128/64
01F0000–01FFFFF
SA32
1
0
0
0
0
0
128/64
0200000–020FFFF
SA33
1
0
0
0
0
1
128/64
0210000–021FFFF
SA34
1
0
0
0
1
0
128/64
0220000–022FFFF
SA35
1
0
0
0
1
1
128/64
0230000–023FFFF
SA36
1
0
0
1
0
0
128/64
0240000–024FFFF
SA37
1
0
0
1
0
1
128/64
0250000–025FFFF
SA38
1
0
0
1
1
0
128/64
0260000–026FFFF
SA39
1
0
0
1
1
1
128/64
0270000–027FFFF
SA40
1
0
1
0
0
0
128/64
0280000–028FFFF
SA41
1
0
1
0
0
1
128/64
0290000–029FFFF
SA42
1
0
1
0
1
0
128/64
02A0000–02AFFFF
SA43
1
0
1
0
1
1
128/64
02B0000–02BFFFF
SA44
1
0
1
1
0
0
128/64
02C0000–02CFFFF
SA45
1
0
1
1
0
1
128/64
02D0000–02DFFFF
SA46
1
0
1
1
1
0
128/64
02E0000–02EFFFF
SA47
1
0
1
1
1
1
128/64
02F0000–02FFFFF
SA48
1
1
0
0
0
0
128/64
0300000–030FFFF
SA49
1
1
0
0
0
1
128/64
0310000–031FFFF
SA50
1
1
0
0
1
0
128/64
0320000–032FFFF
SA51
1
1
0
0
1
1
128/64
0330000–033FFFF
SA52
1
1
0
1
0
0
128/64
0340000–034FFFF
S29GLxxxN MirrorBitTM Flash Family
S29GLxxxN_MCP_A1 December 15, 2004
A d v a n c e
Table 4.
I n f o r m a t i o n
Sector Address Table–S29GL128N (Continued)
Sector
A22–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA53
1
1
0
1
0
1
128/64
0350000–035FFFF
SA54
1
1
0
1
1
0
128/64
0360000–036FFFF
SA55
1
1
0
1
1
1
128/64
0370000–037FFFF
SA56
1
1
1
0
0
0
128/64
0380000–038FFFF
SA57
1
1
1
0
0
1
128/64
0390000–039FFFF
SA58
1
1
1
0
1
0
128/64
03A0000–03AFFFF
SA59
1
1
1
0
1
1
128/64
03B0000–03BFFFF
SA60
1
1
1
1
0
0
128/64
03C0000–03CFFFF
SA61
1
1
1
1
0
1
128/64
03D0000–03DFFFF
SA62
1
1
1
1
1
0
128/64
03E0000–03EFFFF
SA63
1
1
1
1
1
1
128/64
03F0000–03FFFFF
SA64
0
0
0
0
0
0
128/64
0400000–040FFFF
SA65
0
0
0
0
0
1
128/64
0410000–041FFFF
SA66
0
0
0
0
1
0
128/64
0420000–042FFFF
SA67
0
0
0
0
1
1
128/64
0430000–043FFFF
SA68
0
0
0
1
0
0
128/64
0440000–044FFFF
SA69
0
0
0
1
0
1
128/64
0450000–045FFFF
SA70
0
0
0
1
1
0
128/64
0460000–046FFFF
SA71
0
0
0
1
1
1
128/64
0470000–047FFFF
SA72
0
0
1
0
0
0
128/64
0480000–048FFFF
SA73
0
0
1
0
0
1
128/64
0490000–049FFFF
SA74
0
0
1
0
1
0
128/64
04A0000–04AFFFF
SA75
0
0
1
0
1
1
128/64
04B0000–04BFFFF
SA76
0
0
1
1
0
0
128/64
04C0000–04CFFFF
SA77
0
0
1
1
0
1
128/64
04D0000–04DFFFF
SA78
0
0
1
1
1
0
128/64
04E0000–04EFFFF
SA79
0
0
1
1
1
1
128/64
04F0000–04FFFFF
SA80
0
1
0
0
0
0
128/64
0500000–050FFFF
SA81
0
1
0
0
0
1
128/64
0510000–051FFFF
SA82
0
1
0
0
1
0
128/64
0520000–052FFFF
SA83
0
1
0
0
1
1
128/64
0530000–053FFFF
SA84
0
1
0
1
0
0
128/64
0540000–054FFFF
SA85
0
1
0
1
0
1
128/64
0550000–055FFFF
SA86
0
1
0
1
1
0
128/64
0560000–056FFFF
SA87
0
1
0
1
1
1
128/64
0570000–057FFFF
December 15, 2004 S29GLxxxN_MCP_A1
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Table 4.
Sector
112
I n f o r m a t i o n
Sector Address Table–S29GL128N (Continued)
A22–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA88
0
1
1
0
0
0
128/64
0580000–058FFFF
SA89
0
1
1
0
0
1
128/64
0590000–059FFFF
SA90
0
1
1
0
1
0
128/64
05A0000–05AFFFF
SA91
0
1
1
0
1
1
128/64
05B0000–05BFFFF
SA92
0
1
1
1
0
0
128/64
05C0000–05CFFFF
SA93
0
1
1
1
0
1
128/64
05D0000–05DFFFF
SA94
0
1
1
1
1
0
128/64
05E0000–05EFFFF
SA95
0
1
1
1
1
1
128/64
05F0000–05FFFFF
SA96
1
0
0
0
0
0
128/64
0600000–060FFFF
SA97
1
0
0
0
0
1
128/64
0610000–061FFFF
SA98
1
0
0
0
1
0
128/64
0620000–062FFFF
SA99
1
0
0
0
1
1
128/64
0630000–063FFFF
SA100
1
0
0
1
0
0
128/64
0640000–064FFFF
SA101
1
0
0
1
0
1
128/64
0650000–065FFFF
SA102
1
0
0
1
1
0
128/64
0660000–066FFFF
SA103
1
0
0
1
1
1
128/64
0670000–067FFFF
SA104
1
0
1
0
0
0
128/64
0680000–068FFFF
SA105
1
0
1
0
0
1
128/64
0690000–069FFFF
SA106
1
0
1
0
1
0
128/64
06A0000–06AFFFF
SA107
1
0
1
0
1
1
128/64
06B0000–06BFFFF
SA108
1
0
1
1
0
0
128/64
06C0000–06CFFFF
SA109
1
0
1
1
0
1
128/64
06D0000–06DFFFF
SA110
1
0
1
1
1
0
128/64
06E0000–06EFFFF
SA111
1
0
1
1
1
1
128/64
06F0000–06FFFFF
SA112
1
1
0
0
0
0
128/64
0700000–070FFFF
SA113
1
1
0
0
0
1
128/64
0710000–071FFFF
SA114
1
1
0
0
1
0
128/64
0720000–072FFFF
SA115
1
1
0
0
1
1
128/64
0730000–073FFFF
SA116
1
1
0
1
0
0
128/64
0740000–074FFFF
SA117
1
1
0
1
0
1
128/64
0750000–075FFFF
SA118
1
1
0
1
1
0
128/64
0760000–076FFFF
SA119
1
1
0
1
1
1
128/64
0770000–077FFFF
SA120
1
1
1
0
0
0
128/64
0780000–078FFFF
SA121
1
1
1
0
0
1
128/64
0790000–079FFFF
SA122
1
1
1
0
1
0
128/64
07A0000–07AFFFF
S29GLxxxN MirrorBitTM Flash Family
S29GLxxxN_MCP_A1 December 15, 2004
A d v a n c e
Table 4.
I n f o r m a t i o n
Sector Address Table–S29GL128N (Continued)
Sector
A22–A16
Sector Size
(Kbytes/
Kwords)
Address Range
(in hexadecimal)
SA123
1
1
1
0
1
1
128/64
07B0000–07BFFFF
SA124
1
1
1
1
0
0
128/64
07C0000–07CFFFF
SA125
1
1
1
1
0
1
128/64
07D0000–07DFFFF
SA126
1
1
1
1
1
0
128/64
07E0000–07EFFFF
SA127
1
1
1
1
1
1
128/64
07F0000–07FFFFF
Autoselect Mode
The autoselect mode provides manufacturer and device identification, and sector
group protection verification, through identifier codes output on DQ7–DQ0. This
mode is primarily intended for programming equipment to automatically match a
device to be programmed with its corresponding programming algorithm. However, the autoselect codes can also be accessed in-system through the command
register.
When using programming equipment, the autoselect mode requires VID on address pin A9. Address pins A6, A3, A2, A1, and A0 must be as shown in Table 5.
In addition, when verifying sector protection, the sector address must appear on
the appropriate highest order address bits (see Table 2). Table 5 shows the remaining address bits that are don’t care. When all necessary bits have been set
as required, the programming equipment may then read the corresponding identifier code on DQ7–DQ0.
To access the autoselect codes in-system, the host system can issue the autoselect command via the command register, as shown in Table 12. This method does
not require VID. Refer to the Autoselect Command Sequence section for more
information.
December 15, 2004 S29GLxxxN_MCP_A1
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Table 5. Autoselect Codes, (High Voltage Method)
A9
A8
to
A7
A6
A5
to
A4
A3
to
A2
A1
A0
DQ8 to
DQ15
DQ7 to DQ0
VID
X
L
X
L
L
L
00
01h
L
L
H
22
7Eh
H
H
L
22
23h
Cycle 3
H
H
H
22
01h
Cycle 1
L
L
H
22
7Eh
Description
Device ID
Device ID
Device ID
S29GL128N S29GL256N S29GL512N
Manufacturer ID:
Spansion Product
CE#
OE#
WE
#
L
L
H
A22 A14
to
to
A15 A10
X
X
Cycle 1
Cycle 2
Cycle 2
L
L
L
L
H
H
X
X
X
X
VID
VID
X
H
H
L
22
22h
H
H
H
22
01h
Cycle 1
L
L
H
22
7Eh
H
H
L
22
21h
H
H
H
22
01h
L
L
H
X
X
VID
X
L
X
Cycle 3
Cycle 2
X
L
L
X
X
Cycle 3
Sector Group
Protection Verification
L
L
H
SA
X
VID
X
L
X
L
H
L
X
01h (protected),
00h (unprotected)
Secured Silicon Sector
Indicator Bit (DQ7),
WP# protects highest
address sector
L
L
H
X
X
VID
X
L
X
L
H
H
X
98h (factory locked),
18h (not factory locked)
Secured Silicon Sector
Indicator Bit (DQ7),
WP# protects lowest
address sector
L
L
H
X
X
VID
X
L
X
L
H
H
X
88h (factory locked),
08h (not factory locked)
Legend: L = Logic Low = VIL, H = Logic High = VIH, SA = Sector Address, X = Don’t care.
Sector Protection
The device features several levels of sector protection, which can disable both the
program and erase operations in certain sectors or sector groups:
Persistent Sector Protection
A command sector protection method that replaces the old 12 V controlled protection method.
Password Sector Protection
A highly sophisticated protection method that requires a password before
changes to certain sectors or sector groups are permitted
WP# Hardware Protection
A write protect pin that can prevent program or erase operations in the outermost
sectors.
The WP# Hardware Protection feature is always available, independent of the
software managed protection method chosen.
Selecting a Sector Protection Mode
All parts default to operate in the Persistent Sector Protection mode. The customer must then choose if the Persistent or Password Protection method is most
desirable. There are two one-time programmable non-volatile bits that define
which sector protection method will be used. If the customer decides to continue
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using the Persistent Sector Protection method, they must set the Persistent
Sector Protection Mode Locking Bit. This will permanently set the part to operate only using Persistent Sector Protection. If the customer decides to use the
password method, they must set the Password Mode Locking Bit. This will
permanently set the part to operate only using password sector protection.
It is important to remember that setting either the Persistent Sector Protection Mode Locking Bit or the Password Mode Locking Bit permanently
selects the protection mode. It is not possible to switch between the two methods
once a locking bit has been set. It is important that one mode is explicitly
selected when the device is first programmed, rather than relying on the
default mode alone. This is so that it is not possible for a system program or
virus to later set the Password Mode Locking Bit, which would cause an unexpected shift from the default Persistent Sector Protection Mode into the Password
Protection Mode.
The device is shipped with all sectors unprotected. The factory offers the option
of programming and protecting sectors at the factory prior to shipping the device
through the ExpressFlash™ Service. Contact your sales representative for details.
It is possible to determine whether a sector is protected or unprotected. See “Autoselect Command Sequence” section on page 127 for details.
Advanced Sector Protection
Advanced Sector Protection features several levels of sector protection, which can
disable both the program and erase operations in certain sectors.
Persistent Sector Protection is a method that replaces the old 12V controlled
protection method.
Password Sector Protection is a highly sophisticated protection method that
requires a password before changes to certain sectors are permitted.
Lock Register
The Lock Register consists of 3 bits (DQ2, DQ1, and DQ0). These DQ2, DQ1, DQ0
bits of the Lock Register are programmable by the user. Users are not allowed to
program both DQ2 and DQ1 bits of the Lock Register to the 00 state. If the user
tries to program DQ2 and DQ1 bits of the Lock Register to the 00 state, the device
will abort the Lock Register back to the default 11 state. The programming time
of the Lock Register is same as the typical word programming time without utilizing the Write Buffer of the device. During a Lock Register programming
sequence execution, the DQ6 Toggle Bit I will toggle until the programming of the
Lock Register has completed to indicate programming status. All Lock Register
bits are readable to allow users to verify Lock Register statuses.
The Customer Secured Silicon Sector Protection Bit is DQ0, Persistent Protection
Mode Lock Bit is DQ1, and Password Protection Mode Lock Bit is DQ2 are accessible by all users. Each of these bits are non-volatile. DQ15-DQ3 are reserved and
must be 1's when the user tries to program the DQ2, DQ1, and DQ0 bits of the
Lock Register. The user is not required to program DQ2, DQ1 and DQ0 bits of the
Lock Register at the same time. This allows users to lock the Secured Silicon Sector and then set the device either permanently into Password Protection Mode or
Persistent Protection Mode and then lock the Secured Silicon Sector at separate
instances and time frames.
„ Secured Silicon Sector Protection allows the user to lock the Secured Silicon
Sector area
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„ Persistent Protection Mode Lock Bit allows the user to set the device permanently to operate in the Persistent Protection Mode
„ Password Protection Mode Lock Bit allows the user to set the device permanently to operate in the Password Protection Mode
Table 6. Lock Register
DQ15-3
DQ2
DQ1
DQ0
Don’t Care
Password Protection
Mode Lock Bit
Persistent Protection
Mode Lock Bit
Secured Silicon
Sector Protection
Bit
Persistent Sector Protection
The Persistent Sector Protection method replaces the old 12 V controlled protection method while at the same time enhancing flexibility by providing three
different sector protection states:
„ Dynamically Locked-The sector is protected and can be changed by a simple command
„ Persistently Locked-A sector is protected and cannot be changed
„ Unlocked-The sector is unprotected and can be changed by a simple command
In order to achieve these states, three types of “bits” are going to be used:
Dynamic Protection Bit (DYB)
A volatile protection bit is assigned for each sector. After power-up or hardware
reset, the contents of all DYB bits are in the “unprotected state”. Each DYB is individually modifiable through the DYB Set Command and DYB Clear Command.
When the parts are first shipped, all of the Persistent Protect Bits (PPB) are
cleared into the unprotected state. The DYB bits and PPB Lock bit are defaulted
to power up in the cleared state or unprotected state - meaning the all PPB bits
are changeable.
The Protection State for each sector is determined by the logical OR of the PPB
and the DYB related to that sector. For the sectors that have the PPB bits cleared,
the DYB bits control whether or not the sector is protected or unprotected. By issuing the DYB Set and DYB Clear command sequences, the DYB bits will be
protected or unprotected, thus placing each sector in the protected or unprotected state. These are the so-called Dynamic Locked or Unlocked states. They
are called dynamic states because it is very easy to switch back and forth between the protected and un-protected conditions. This allows software to easily
protect sectors against inadvertent changes yet does not prevent the easy removal of protection when changes are needed.
The DYB bits maybe set or cleared as often as needed. The PPB bits allow for a
more static, and difficult to change, level of protection. The PPB bits retain their
state across power cycles because they are Non-Volatile. Individual PPB bits are
set with a program command but must all be cleared as a group through an erase
command.
The PPB Lock Bit adds an additional level of protection. Once all PPB bits are programmed to the desired settings, the PPB Lock Bit may be set to the “freeze
state”. Setting the PPB Lock Bit to the “freeze state” disables all program and
erase commands to the Non-Volatile PPB bits. In effect, the PPB Lock Bit locks the
PPB bits into their current state. The only way to clear the PPB Lock Bit to the
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“unfreeze state” is to go through a power cycle, or hardware reset. The Software
Reset command will not clear the PPB Lock Bit to the “unfreeze state”. System
boot code can determine if any changes to the PPB bits are needed e.g. to allow
new system code to be downloaded. If no changes are needed then the boot code
can set the PPB Lock Bit to disable any further changes to the PPB bits during
system operation.
The WP# write protect pin adds a final level of hardware protection. When this
pin is low it is not possible to change the contents of the WP# protected sectors.
These sectors generally hold system boot code. So, the WP# pin can prevent any
changes to the boot code that could override the choices made while setting up
sector protection during system initialization.
It is possible to have sectors that have been persistently locked, and sectors that
are left in the dynamic state. The sectors in the dynamic state are all unprotected.
If there is a need to protect some of them, a simple DYB Set command sequence
is all that is necessary. The DYB Set and DYB Clear commands for the dynamic
sectors switch the DYB bits to signify protected and unprotected, respectively. If
there is a need to change the status of the persistently locked sectors, a few more
steps are required. First, the PPB Lock Bit must be disabled to the “unfreeze
state” by either putting the device through a power-cycle, or hardware reset. The
PPB bits can then be changed to reflect the desired settings. Setting the PPB Lock
Bit once again to the “freeze state” will lock the PPB bits, and the device operates
normally again.
Note: to achieve the best protection, it's recommended to execute the PPB Lock
Bit Set command early in the boot code, and protect the boot code by holding
WP# = VIL.
Persistent Protection Bit (PPB)
A single Persistent (non-volatile) Protection Bit is assigned to each sector. If a PPB
is programmed to the protected state through the “PPB Program” command, that
sector will be protected from program or erase operations will be read-only. If a
PPB requires erasure, all of the sector PPB bits must first be erased in parallel
through the “All PPB Erase” command. The “All PPB Erase” command will preprogrammed all PPB bits prior to PPB erasing. All PPB bits erase in parallel, unlike
programming where individual PPB bits are programmable. The PPB bits have the
same endurance as the flash memory.
Programming the PPB bit requires the typical word programming time without utilizing the Write Buffer. During a PPB bit programming and A11 PPB bit erasing
sequence execution, the DQ6 Toggle Bit I will toggle until the programming of the
PPB bit or erasing of all PPB bits has completed to indicate programming and
erasing status. Erasing all of the PPB bits at once requires typical sector erase
time. During the erasing of all PPB bits, the DQ3 Sector Erase Timer bit will output
a 1 to indicate the erasure of all PPB bits are in progress. When the erasure of all
PPB bits has completed, the DQ3 Sector Erase Timer bit will output a 0 to indicate
that all PPB bits have been erased. Reading the PPB Status bit requires the initial
access time of the device.
Persistent Protection Bit Lock (PPB Lock Bit)
A global volatile bit. When set to the “freeze state”, the PPB bits cannot be
changed. When cleared to the “unfreeze state”, the PPB bits are changeable.
There is only one PPB Lock Bit per device. The PPB Lock Bit is cleared to the “un-
December 15, 2004 S29GLxxxN_MCP_A1
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freeze state” after power-up or hardware reset. There is no command sequence
to unlock or “unfreeze” the PPB Lock Bit.
Configuring the PPB Lock Bit to the freeze state requires approximately 100ns.
Reading the PPB Lock Status bit requires the initial access time of the device.
Table 7. Sector Protection Schemes
Protection States
Sector State
DYB Bit
PPB Bit
PPB Lock Bit
Unprotect
Unprotect
Unfreeze
Unprotected – PPB and DYB are changeable
Unprotect
Unprotect
Freeze
Unprotected – PPB not changeable, DYB is
changeable
Unprotect
Protect
Unfreeze
Protected – PPB and DYB are changeable
Unprotect
Protect
Freeze
Protected – PPB not changeable, DYB is changeable
Protect
Unprotect
Unfreeze
Protected – PPB and DYB are changeable
Protect
Unprotect
Freeze
Protected – PPB not changeable, DYB is changeable
Protect
Protect
Unfreeze
Protected – PPB and DYB are changeable
Protect
Protect
Freeze
Protected – PPB not changeable, DYB is changeable
Table 7 contains all possible combinations of the DYB bit, PPB bit, and PPB Lock
Bit relating to the status of the sector. In summary, if the PPB bit is set, and the
PPB Lock Bit is set, the sector is protected and the protection cannot be removed
until the next power cycle or hardware reset clears the PPB Lock Bit to “unfreeze
state”. If the PPB bit is cleared, the sector can be dynamically locked or unlocked.
The DYB bit then controls whether or not the sector is protected or unprotected.
If the user attempts to program or erase a protected sector, the device ignores
the command and returns to read mode. A program command to a protected sector enables status polling for approximately 1 µs before the device returns to read
mode without having modified the contents of the protected sector. An erase
command to a protected sector enables status polling for approximately 50 µs
after which the device returns to read mode without having erased the protected
sector. The programming of the DYB bit, PPB bit, and PPB Lock Bit for a given sector can be verified by writing a DYB Status Read, PPB Status Read, and PPB Lock
Status Read commands to the device.
The Autoselect Sector Protection Verification outputs the OR function of the DYB
bit and PPB bit per sector basis. When the OR function of the DYB bit and PPB bit
is a 1, the sector is either protected by DYB or PPB or both. When the OR function
of the DYB bit and PPB bit is a 0, the sector is unprotected through both the DYB
and PPB.
Persistent Protection Mode Lock Bit
Like the Password Protection Mode Lock Bit, a Persistent Protection Mode Lock Bit
exists to guarantee that the device remain in software sector protection. Once
programmed, the Persistent Protection Mode Lock Bit prevents programming of
the Password Protection Mode Lock Bit. This guarantees that a hacker could not
place the device in Password Protection Mode. The Password Protection Mode
Lock Bit resides in the “Lock Register”.
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Password Sector Protection
The Password Sector Protection method allows an even higher level of security
than the Persistent Sector Protection method. There are two main differences between the Persistent Sector Protection and the Password Sector Protection
methods:
„ When the device is first powered on, or comes out of a reset cycle, the PPB
Lock Bit is set to the locked state, or the freeze state, rather than cleared to
the unlocked state, or the unfreeze state.
„ The only means to clear and unfreeze the PPB Lock Bit is by writing a unique
64-bit Password to the device.
The Password Sector Protection method is otherwise identical to the Persistent
Sector Protection method.
A 64-bit password is the only additional tool utilized in this method.
The password is stored in a one-time programmable (OTP) region outside of the
flash memory. Once the Password Protection Mode Lock Bit is set, the password
is permanently set with no means to read, program, or erase it. The password is
used to clear and unfreeze the PPB Lock Bit. The Password Unlock command must
be written to the flash, along with a password. The flash device internally compares the given password with the pre-programmed password. If they match, the
PPB Lock Bit is cleared to the “unfreezed state”, and the PPB bits can be altered.
If they do not match, the flash device does nothing. There is a built-in 2 µs delay
for each “password check” after the valid 64-bit password has been entered for
the PPB Lock Bit to be cleared to the “unfreezed state”. This delay is intended to
thwart any efforts to run a program that tries all possible combinations in order
to crack the password.
Password and Password Protection Mode Lock Bit
In order to select the Password Sector Protection method, the customer must first
program the password. The factory recommends that the password be somehow
correlated to the unique Electronic Serial Number (ESN) of the particular flash device. Each ESN is different for every flash device; therefore each password should
be different for every flash device. While programming in the password region,
the customer may perform Password Read operations. Once the desired password is programmed in, the customer must then set the Password Protection
Mode Lock Bit. This operation achieves two objectives:
1. It permanently sets the device to operate using the Password Protection Mode.
It is not possible to reverse this function.
2. It also disables all further commands to the password region. All program, and
read operations are ignored.
Both of these objectives are important, and if not carefully considered, may lead
to unrecoverable errors. The user must be sure that the Password Sector Protection method is desired when programming the Password Protection Mode Lock
Bit. More importantly, the user must be sure that the password is correct when
the Password Protection Mode Lock Bit is programmed. Due to the fact that read
operations are disabled, there is no means to read what the password is afterwards. If the password is lost after programming the Password Protection Mode
Lock Bit, there will be no way to clear and unfreeze the PPB Lock Bit. The Password Protection Mode Lock Bit, once programmed, prevents reading the 64-bit
password on the DQ bus and further password programming. The Password Protection Mode Lock Bit is not erasable. Once Password Protection Mode Lock Bit is
December 15, 2004 S29GLxxxN_MCP_A1
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programmed, the Persistent Protection Mode Lock Bit is disabled from programming, guaranteeing that no changes to the protection scheme are allowed.
64-bit Password
The 64-bit Password is located in its own memory space and is accessible through
the use of the Password Program and Password Read commands. The password
function works in conjunction with the Password Protection Mode Lock Bit, which
when programmed, prevents the Password Read command from reading the contents of the password on the pins of the device.
Persistent Protection Bit Lock (PPB Lock Bit)
A global volatile bit. The PPB Lock Bit is a volatile bit that reflects the state of the
Password Protection Mode Lock Bit after power-up reset. If the Password Protection Mode Lock Bit is also programmed after programming the Password, the
Password Unlock command must be issued to clear and unfreeze the PPB Lock Bit
after a hardware reset (RESET# asserted) or a power-up reset. Successful execution of the Password Unlock command clears and unfreezes the PPB Lock Bit,
allowing for sector PPB bits to be modified. Without issuing the Password Unlock
command, while asserting RESET#, taking the device through a power-on reset,
or issuing the PPB Lock Bit Set command sets the PPB Lock Bit to a the “freeze
state”.
If the Password Protection Mode Lock Bit is not programmed, the device defaults
to Persistent Protection Mode. In the Persistent Protection Mode, the PPB Lock Bit
is cleared to the “unfreeze state” after power-up or hardware reset. The PPB Lock
Bit is set to the “freeze state” by issuing the PPB Lock Bit Set command. Once set
to the “freeze state” the only means for clearing the PPB Lock Bit to the “unfreeze
state” is by issuing a hardware or power-up reset. The Password Unlock command is ignored in Persistent Protection Mode.
Reading the PPB Lock Bit requires a 200ns access time.
Secured Silicon Sector Flash Memory Region
The Secured Silicon Sector feature provides a Flash memory region that enables
permanent part identification through an Electronic Serial Number (ESN). The
Secured Silicon Sector is 256 bytes in length, and uses a Secured Silicon Sector
Indicator Bit (DQ7) to indicate whether or not the Secured Silicon Sector is locked
when shipped from the factory. This bit is permanently set at the factory and cannot be changed, which prevents cloning of a factory locked part. This ensures the
security of the ESN once the product is shipped to the field.
The factory offers the device with the Secured Silicon Sector either customer
lockable (standard shipping option) or factory locked (contact an AMD sales representative for ordering information). The customer-lockable version is shipped
with the Secured Silicon Sector unprotected, allowing customers to program the
sector after receiving the device. The customer-lockable version also has the Secured Silicon Sector Indicator Bit permanently set to a “0.” The factory-locked
version is always protected when shipped from the factory, and has the Secured
Silicon Sector Indicator Bit permanently set to a “1.” Thus, the Secured Silicon
Sector Indicator Bit prevents customer-lockable devices from being used to replace devices that are factory locked. Note that the ACC function and unlock
bypass modes are not available when the Secured Silicon Sector is enabled.
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The Secured Silicon sector address space in this device is allocated as follows:
Secured Silicon Sector Address
Range
Customer Lockable
000000h–000007h
ESN Factory Locked
ESN
ESN or determined by
customer
Unavailable
Determined by customer
Determined by customer
000008h–00007Fh
ExpressFlash
Factory Locked
The system accesses the Secured Silicon Sector through a command sequence
(see “Write Protect (WP#)”). After the system has written the Enter Secured Silicon Sector command sequence, it may read the Secured Silicon Sector by using
the addresses normally occupied by the first sector (SA0). This mode of operation
continues until the system issues the Exit Secured Silicon Sector command sequence, or until power is removed from the device. On power-up, or following a
hardware reset, the device reverts to sending commands to sector SA0.
Customer Lockable: Secured Silicon Sector NOT Programmed or
Protected At the Factory
Unless otherwise specified, the device is shipped such that the customer may
program and protect the 256-byte Secured Silicon sector.
The system may program the Secured Silicon Sector using the write-buffer, accelerated and/or unlock bypass methods, in addition to the standard
programming command sequence. See “Command Definitions” .
Programming and protecting the Secured Silicon Sector must be used with caution since, once protected, there is no procedure available for unprotecting the
Secured Silicon Sector area and none of the bits in the Secured Silicon Sector
memory space can be modified in any way.
The Secured Silicon Sector area can be protected using one of the following
procedures:
„ Write the three-cycle Enter Secured Silicon Sector Region command sequence, and then follow the in-system sector protect algorithm, except that
RESET# may be at either VIH or VID. This allows in-system protection of the
Secured Silicon Sector without raising any device pin to a high voltage. Note
that this method is only applicable to the Secured Silicon Sector.
„ To verify the protect/unprotect status of the Secured Silicon Sector, follow the
algorithm.
Once the Secured Silicon Sector is programmed, locked and verified, the system
must write the Exit Secured Silicon Sector Region command sequence to return
to reading and writing within the remainder of the array.
Factory Locked: Secured Silicon Sector Programmed and
Protected At the Factory
In devices with an ESN, the Secured Silicon Sector is protected when the device
is shipped from the factory. The Secured Silicon Sector cannot be modified in any
way. An ESN Factory Locked device has an 16-byte random ESN at addresses
000000h–000007h. Please contact your sales representative for details on ordering ESN Factory Locked devices.
Customers may opt to have their code programmed by the factory through the
ExpressFlash service (Express Flash Factory Locked). The devices are then
shipped from the factory with the Secured Silicon Sector permanently locked.
Contact your sales representative for details on using the ExpressFlash service.
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Write Protect (WP#)
The Write Protect function provides a hardware method of protecting the first or
last sector group without using VID. Write Protect is one of two functions provided
by the WP#/ACC input.
If the system asserts VIL on the WP#/ACC pin, the device disables program and
erase functions in the first or last sector group independently of whether those
sector groups were protected or unprotected using the method described in“Advanced Sector Protection” section on page 115. Note that if WP#/ACC is at VIL
when the device is in the standby mode, the maximum input load current is increased. See the table in “DC Characteristics” section on page 151.
If the system asserts VIH on the WP#/ACC pin, the device reverts to
whether the first or last sector was previously set to be protected or unprotected using the method described in “Sector Group Protection and
Unprotection”. Note that WP# has an internal pullup; when unconnected, WP# is at VIH.
Hardware Data Protection
The command sequence requirement of unlock cycles for programming or erasing
provides data protection against inadvertent writes (refer to Table 12 for command definitions). In addition, the following hardware data protection measures
prevent accidental erasure or programming, which might otherwise be caused by
spurious system level signals during VCC power-up and power-down transitions,
or from system noise.
Low VCC Write Inhibit
When VCC is less than VLKO, the device does not accept any write cycles. This protects data during VCC power-up and power-down. The command register and all
internal program/erase circuits are disabled, and the device resets to the read
mode. Subsequent writes are ignored until VCC is greater than VLKO. The system
must provide the proper signals to the control pins to prevent unintentional writes
when VCC is greater than VLKO.
Write Pulse “Glitch” Protection
Noise pulses of less than 5 ns (typical) on OE#, CE# or WE# do not initiate a write
cycle.
Logical Inhibit
Write cycles are inhibited by holding any one of OE# = VIL, CE# = VIH or WE# =
VIH. To initiate a write cycle, CE# and WE# must be a logical zero while OE# is a
logical one.
Power-Up Write Inhibit
If WE# = CE# = VIL and OE# = VIH during power up, the device does not accept
commands on the rising edge of WE#. The internal state machine is automatically
reset to the read mode on power-up.
Common Flash Memory Interface (CFI)
The Common Flash Interface (CFI) specification outlines device and host system
software interrogation handshake, which allows specific vendor-specified software algorithms to be used for entire families of devices. Software support can
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then be device-independent, JEDEC ID-independent, and forward- and backward-compatible for the specified flash device families. Flash vendors can
standardize their existing interfaces for long-term compatibility.
This device enters the CFI Query mode when the system writes the CFI Query
command, 98h, to address 55h, any time the device is ready to read array data.
The system can read CFI information at the addresses given in Tables 8-11. To
terminate reading CFI data, the system must write the reset command.
The system can also write the CFI query command when the device is in the autoselect mode. The device enters the CFI query mode, and the system can read
CFI data at the addresses given in Tables 8–11. The system must write the reset
command to return the device to reading array data.
For further information, please refer to the CFI Specification and CFI Publication
100, available via the World Wide Web at http://www.amd.com/flash/cfi. Alternatively, contact your sales representative for copies of these documents.
Table 8.
CFI Query Identification String
Addresses
(x16)
Data
10h
11h
12h
0051h
0052h
0059h
Query Unique ASCII string “QRY”
13h
14h
0002h
0000h
Primary OEM Command Set
15h
16h
0040h
0000h
Address for Primary Extended Table
17h
18h
0000h
0000h
Alternate OEM Command Set (00h = none exists)
19h
1Ah
0000h
0000h
Address for Alternate OEM Extended Table (00h = none exists)
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Description
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Table 9.
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System Interface String
Addresses
(x16)
Data
1Bh
0027h
VCC Min. (write/erase)
D7–D4: volt, D3–D0: 100 millivolt
1Ch
0036h
VCC Max. (write/erase)
D7–D4: volt, D3–D0: 100 millivolt
1Dh
0000h
VPP Min. voltage (00h = no VPP pin present)
1Eh
0000h
VPP Max. voltage (00h = no VPP pin present)
1Fh
0007h
Typical timeout per single byte/word write 2N µs
20h
0007h
Typical timeout for Min. size buffer write 2N µs (00h = not supported)
21h
000Ah
Typical timeout per individual block erase 2N ms
22h
0000h
Typical timeout for full chip erase 2N ms (00h = not supported)
23h
0001h
Max. timeout for byte/word write 2N times typical
24h
0005h
Max. timeout for buffer write 2N times typical
25h
0004h
Max. timeout per individual block erase 2N times typical
26h
0000h
Max. timeout for full chip erase 2N times typical (00h = not supported)
Description
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Table 10.
Addresses
(x16)
Device Geometry Definition
Data
Description
27h
001Ah
0019h
0018h
28h
29h
0002h
0000h
Flash Device Interface description (refer to CFI publication 100)
2Ah
2Bh
0005h
0000h
Max. number of byte in multi-byte write = 2N
(00h = not supported)
2Ch
0001h
Number of Erase Block Regions within device (01h = uniform device,
02h = boot device)
2Dh
2Eh
2Fh
30h
00xxh
000xh
0000h
000xh
Erase Block Region 1 Information
(refer to the CFI specification or CFI publication 100)
00FFh, 001h, 0000h, 0002h = 512 Mb
00FFh, 0000h, 0000h, 0002h = 256 Mb
007Fh, 0000h, 0000h, 0002h = 128 Mb
31h
32h
33h
34h
0000h
0000h
0000h
0000h
Erase Block Region 2 Information (refer to CFI publication 100)
35h
36h
37h
38h
0000h
0000h
0000h
0000h
Erase Block Region 3 Information (refer to CFI publication 100)
39h
3Ah
3Bh
3Ch
0000h
0000h
0000h
0000h
Erase Block Region 4 Information (refer to CFI publication 100)
December 15, 2004 S29GLxxxN_MCP_A1
Device Size = 2N byte
1A = 512 Mb, 19 = 256 Mb, 18 = 128 Mb
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Table 11. Primary Vendor-Specific Extended Query
Addresses
(x16)
Data
40h
41h
42h
0050h
0052h
0049h
Query-unique ASCII string “PRI”
43h
0031h
Major version number, ASCII
44h
0033h
Minor version number, ASCII
45h
0010h
Address Sensitive Unlock (Bits 1-0)
0 = Required, 1 = Not Required
Description
Process Technology (Bits 7-2) 0100b = 110 nm MirrorBit
46h
0002h
Erase Suspend
0 = Not Supported, 1 = To Read Only, 2 = To Read & Write
47h
0001h
Sector Protect
0 = Not Supported, X = Number of sectors in per group
48h
0000h
Sector Temporary Unprotect
00 = Not Supported, 01 = Supported
49h
0008h
Sector Protect/Unprotect scheme
0008h = Advanced Sector Protection
4Ah
0000h
Simultaneous Operation
00 = Not Supported, X = Number of Sectors in Bank
4Bh
0000h
Burst Mode Type
00 = Not Supported, 01 = Supported
4Ch
0002h
Page Mode Type
00 = Not Supported, 01 = 4 Word Page, 02 = 8 Word Page
4Dh
00B5h
4Eh
00C5h
4Fh
00xxh
50h
0001h
ACC (Acceleration) Supply Minimum
00h = Not Supported, D7-D4: Volt, D3-D0: 100 mV
ACC (Acceleration) Supply Maximum
00h = Not Supported, D7-D4: Volt, D3-D0: 100 mV
WP# Protection
04h = Uniform sectors bottom WP# protect, 05h = Uniform sectors
top WP# protect
Program Suspend
00h = Not Supported, 01h = Supported
Command Definitions
Writing specific address and data commands or sequences into the command
register initiates device operations. Table 12 defines the valid register command
sequences. Writing incorrect address and data values or writing them in the improper sequence may place the device in an unknown state. A reset command is
then required to return the device to reading array data.
All addresses are latched on the falling edge of WE# or CE#, whichever happens
later. All data is latched on the rising edge of WE# or CE#, whichever happens
first. Refer to the AC Characteristics section for timing diagrams.
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Reading Array Data
The device is automatically set to reading array data after device power-up. No
commands are required to retrieve data. The device is ready to read array data
after completing an Embedded Program or Embedded Erase algorithm.
After the device accepts an Erase Suspend command, the device enters the
erase-suspend-read mode, after which the system can read data from any nonerase-suspended sector. After completing a programming operation in the Erase
Suspend mode, the system may once again read array data with the same exception. See the Erase Suspend/Erase Resume Commands section for more
information.
The system must issue the reset command to return the device to the read (or
erase-suspend-read) mode if DQ5 goes high during an active program or erase
operation, or if the device is in the autoselect mode. See the next section, Reset
Command, for more information.
See also Requirements for Reading Array Data in the Device Bus Operations section for more information. The Read-Only Operations–“AC Characteristics”
section provides the read parameters, and Figure 11 shows the timing diagram.
Reset Command
Writing the reset command resets the device to the read or erase-suspend-read
mode. Address bits are don’t cares for this command.
The reset command may be written between the sequence cycles in an erase
command sequence before erasing begins. This resets the device to the read
mode. Once erasure begins, however, the device ignores reset commands until
the operation is complete.
The reset command may be written between the sequence cycles in a program
command sequence before programming begins. This resets the device to the
read mode. If the program command sequence is written while the device is in
the Erase Suspend mode, writing the reset command returns the device to the
erase-suspend-read mode. Once programming begins, however, the device ignores reset commands until the operation is complete.
The reset command may be written between the sequence cycles in an autoselect
command sequence. Once in the autoselect mode, the reset command must be
written to return to the read mode. If the device entered the autoselect mode
while in the Erase Suspend mode, writing the reset command returns the device
to the erase-suspend-read mode.
If DQ5 goes high during a program or erase operation, writing the reset command
returns the device to the read mode (or erase-suspend-read mode if the device
was in Erase Suspend).
Note that if DQ1 goes high during a Write Buffer Programming operation, the system must write the Write-to-Buffer-Abort Reset command sequence to reset the
device for the next operation.
Autoselect Command Sequence
The autoselect command sequence allows the host system to access the manufacturer and device codes, and determine whether or not a sector is protected.
Table 12 shows the address and data requirements. This method is an alternative
to that shown in Table 5, which is intended for PROM programmers and requires
VID on address pin A9. The autoselect command sequence may be written to an
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address that is either in the read or erase-suspend-read mode. The autoselect
command may not be written while the device is actively programming or
erasing.
The autoselect command sequence is initiated by first writing two unlock cycles.
This is followed by a third write cycle that contains the autoselect command. The
device then enters the autoselect mode. The system may read at any address any
number of times without initiating another autoselect command sequence:
„ A read cycle at address XX00h returns the manufacturer code.
„ Three read cycles at addresses 01h, 0Eh, and 0Fh return the device code.
„ A read cycle to an address containing a sector address (SA), and the address
02h on A7–A0 in word mode returns 01h if the sector is protected, or 00h if
it is unprotected.
The system must write the reset command to return to the read mode (or erasesuspend-read mode if the device was previously in Erase Suspend).
Enter Secured Silicon Sector/Exit Secured Silicon
Sector Command Sequence
The Secured Silicon Sector region provides a secured data area containing an 8word/16-byte random Electronic Serial Number (ESN). The system can access
the Secured Silicon Sector region by issuing the three-cycle Enter Secured Silicon
Sector command sequence. The device continues to access the Secured Silicon
Sector region until the system issues the four-cycle Exit Secured Silicon Sector
command sequence. The Exit Secured Silicon Sector command sequence returns
the device to normal operation. Table 12 shows the address and data requirements for both command sequences. See also “Secured Silicon Sector Flash
Memory Region” for further information. Note that the ACC function and unlock
bypass modes are not available when the Secured Silicon Sector is enabled.
Word Program Command Sequence
Programming is a four-bus-cycle operation. The program command sequence is
initiated by writing two unlock write cycles, followed by the program set-up command. The program address and data are written next, which in turn initiate the
Embedded Program algorithm. The system is not required to provide further controls or timings. The device automatically provides internally generated program
pulses and verifies the programmed cell margin. Table 12 shows the address and
data requirements for the word program command sequence.
When the Embedded Program algorithm is complete, the device then returns to
the read mode and addresses are no longer latched. The system can determine
the status of the program operation by using DQ7 or DQ6. Refer to the Write Operation Status section for information on these status bits.
Any commands written to the device during the Embedded Program Algorithm
are ignored. Note that the Secured Silicon Sector, autoselect, and CFI
functions are unavailable when a program operation is in progress. Note
that a hardware reset immediately terminates the program operation. The program command sequence should be reinitiated once the device has returned to
the read mode, to ensure data integrity.
Programming is allowed in any sequence of address locations and across sector
boundaries. Programming to the same word address multiple times without intervening erases (incremental bit programming) requires a modified
programming method. For such application requirements, please contact your
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local Spansion representative. Word programming is supported for backward
compatibility with existing Flash driver software and for occasional writing of individual words. Use of Write Buffer Programming is strongly recommended for
general programming use when more than a few words are to be programmed.
The effective word programming time using Write Buffer Programming is much
shorter than the single word programming time. Any word cannot be programmed from “0” back to a “1.” Attempting to do so may cause the device
to set DQ5 = 1, or cause the DQ7 and DQ6 status bits to indicate the operation
was successful. However, a succeeding read will show that the data is still “0.”
Only erase operations can convert a “0” to a “1.”
Unlock Bypass Command Sequence
The unlock bypass feature allows the system to program words to the device
faster than using the standard program command sequence. The unlock bypass
command sequence is initiated by first writing two unlock cycles. This is followed
by a third write cycle containing the unlock bypass command, 20h. The device
then enters the unlock bypass mode. A two-cycle unlock bypass program command sequence is all that is required to program in this mode. The first cycle in
this sequence contains the unlock bypass program command, A0h; the second
cycle contains the program address and data. Additional data is programmed in
the same manner. This mode dispenses with the initial two unlock cycles required
in the standard program command sequence, resulting in faster total programming time. Table 12 shows the requirements for the command sequence.
During the unlock bypass mode, only the Unlock Bypass Program and Unlock Bypass Reset commands are valid. To exit the unlock bypass mode, the system
must issue the two-cycle unlock bypass reset command sequence. (See Table
12).
Write Buffer Programming
Write Buffer Programming allows the system write to a maximum of 16 words/32
bytes in one programming operation. This results in faster effective programming
time than the standard programming algorithms. The Write Buffer Programming
command sequence is initiated by first writing two unlock cycles. This is followed
by a third write cycle containing the Write Buffer Load command written at the
Sector Address in which programming will occur. The fourth cycle writes the sector address and the number of word locations, minus one, to be programmed. For
example, if the system will program 6 unique address locations, then 05h should
be written to the device. This tells the device how many write buffer addresses
will be loaded with data and therefore when to expect the Program Buffer to Flash
command. The number of locations to program cannot exceed the size of the
write buffer or the operation will abort.
The fifth cycle writes the first address location and data to be programmed. The
write-buffer-page is selected by address bits AMAX–A4. All subsequent address/
data pairs must fall within the selected-write-buffer-page. The system then
writes the remaining address/data pairs into the write buffer. Write buffer locations may be loaded in any order.
The write-buffer-page address must be the same for all address/data pairs loaded
into the write buffer. (This means Write Buffer Programming cannot be performed
across multiple write-buffer pages. This also means that Write Buffer Programming cannot be performed across multiple sectors. If the system attempts to load
programming data outside of the selected write-buffer page, the operation will
abort.)
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Note that if a Write Buffer address location is loaded multiple times, the address/
data pair counter will be decremented for every data load operation. The host
system must therefore account for loading a write-buffer location more than
once. The counter decrements for each data load operation, not for each unique
write-buffer-address location. Note also that if an address location is loaded more
than once into the buffer, the final data loaded for that address will be
programmed.
Once the specified number of write buffer locations have been loaded, the system
must then write the Program Buffer to Flash command at the sector address. Any
other address and data combination aborts the Write Buffer Programming operation. The device then begins programming. Data polling should be used while
monitoring the last address location loaded into the write buffer. DQ7, DQ6, DQ5,
and DQ1 should be monitored to determine the device status during Write Buffer
Programming.
The write-buffer programming operation can be suspended using the standard
program suspend/resume commands. Upon successful completion of the Write
Buffer Programming operation, the device is ready to execute the next command.
The Write Buffer Programming Sequence can be aborted in the following ways:
„ Load a value that is greater than the page buffer size during the Number of
Locations to Program step.
„ Write to an address in a sector different than the one specified during the
Write-Buffer-Load command.
„ Write an Address/Data pair to a different write-buffer-page than the one selected by the Starting Address during the write buffer data loading stage of
the operation.
„ Write data other than the Confirm Command after the specified number of
data load cycles.
The abort condition is indicated by DQ1 = 1, DQ7 = DATA# (for the last address
location loaded), DQ6 = toggle, and DQ5=0. A Write-to-Buffer-Abort Reset command sequence must be written to reset the device for the next operation. Note
that the full 3-cycle Write-to-Buffer-Abort Reset command sequence is required
when using Write-Buffer-Programming features in Unlock Bypass mode.
Write buffer programming is allowed in any sequence. Note that the Secured Silicon sector, autoselect, and CFI functions are unavailable when a program
operation is in progress. This flash device is capable of handling multiple write
buffer programming operations on the same write buffer address range without
intervening erases. For applications requiring incremental bit programming, a
modified programming method is required, please contact your local Spansion
representative. Any bit in a write buffer address range cannot be programmed from “0” back to a “1.” Attempting to do so may cause the device
to set DQ5 = 1, or cause the DQ7 and DQ6 status bits to indicate the operation
was successful. However, a succeeding read will show that the data is still “0.”
Only erase operations can convert a “0” to a “1.”
Accelerated Program
The device offers accelerated program operations through the WP#/ACC pin.
When the system asserts VHH on the WP#/ACC pin, the device automatically enters the Unlock Bypass mode. The system may then write the two-cycle Unlock
Bypass program command sequence. The device uses the higher voltage on the
WP#/ACC pin to accelerate the operation. Note that the WP#/ACC pin must not
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be at VHH for operations other than accelerated programming, or device damage
may result. WP# has an internal pullup; when unconnected, WP# is at VIH.
Figure 2 illustrates the algorithm for the program operation. Refer to the Erase
and Program Operations–“AC Characteristics” section for parameters, and Figure
14 for timing diagrams.
Write “Write to Buffer”
command and
Sector Address
Part of “Write to Buffer”
Command Sequence
Write number of addresses
to program minus 1(WC)
and Sector Address
Write first address/data
Yes
WC = 0 ?
No
Abort Write to
Buffer Operation?
Write to a different
sector address
Yes
Write to buffer ABORTED.
Must write “Write-to-buffer
Abort Reset” command
sequence to return
to read mode.
No
(Note 1)
Write next address/data pair
WC = WC - 1
Write program buffer to
flash sector address
Notes:
1. When Sector Address is specified, any
address in the selected sector is acceptable.
However, when loading Write-Buffer
address locations with data, all addresses
must fall within the selected Write-Buffer
Page.
Read DQ15 - DQ0 at
Last Loaded Address
DQ7 = Data?
No
2. DQ7 may change simultaneously with DQ5.
Therefore, DQ7 should be verified.
Yes
3. If this flowchart location was reached
because DQ5= “1”, then the device FAILED.
If this flowchart location was reached
because DQ1= “1”, then the Write to Buffer
operation was ABORTED. In either case, the
proper reset command must be written
before the device can begin another
operation. If DQ1=1, write the WriteBuffer-Programming-Abort-Reset
command. if DQ5=1, write the Reset
command.
No
No
DQ1 = 1?
DQ5 = 1?
Yes
Yes
Read DQ15 - DQ0 with
address = Last Loaded
Address
(Note 2)
DQ7 = Data?
4. See Table 12 for command sequences
required for write buffer programming.
Yes
No
(Note 3)
FAIL or ABORT
PASS
Figure 1. Write Buffer Programming Operation
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START
Write Program
Command Sequence
Data Poll
from System
Embedded
Program
algorithm
in progress
Verify Data?
No
Yes
Increment Address
No
Last Address?
Yes
Programming
Completed
Note: See Table 12 for program command sequence.
Figure 2.
Program Operation
Program Suspend/Program Resume Command Sequence
The Program Suspend command allows the system to interrupt a programming
operation or a Write to Buffer programming operation so that data can be read
from any non-suspended sector. When the Program Suspend command is written
during a programming process, the device halts the program operation within 15
µs maximum (5µs typical) and updates the status bits. Addresses are not required when writing the Program Suspend command.
After the programming operation has been suspended, the system can read array
data from any non-suspended sector. The Program Suspend command may also
be issued during a programming operation while an erase is suspended. In this
case, data may be read from any addresses not in Erase Suspend or Program
Suspend. If a read is needed from the Secured Silicon Sector area (One-time Program area), then user must use the proper command sequences to enter and exit
this region. Note that the Secured Silicon Sector autoselect, and CFI functions are
unavailable when program operation is in progress.
The system may also write the autoselect command sequence when the device
is in the Program Suspend mode. The system can read as many autoselect codes
as required. When the device exits the autoselect mode, the device reverts to the
Program Suspend mode, and is ready for another valid operation. See Autoselect
Command Sequence for more information.
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After the Program Resume command is written, the device reverts to programming. The system can determine the status of the program operation using the
DQ7 or DQ6 status bits, just as in the standard program operation. See Write Operation Status for more information.
The system must write the Program Resume command (address bits are don’t
care) to exit the Program Suspend mode and continue the programming operation. Further writes of the Resume command are ignored. Another Program
Suspend command can be written after the device has resume programming.
Program Operation
or Write-to-Buffer
Sequence in Progress
Write address/data
XXXh/B0h
Write Program Suspend
Command Sequence
Command is also valid for
Erase-suspended-program
operations
Wait 15 µs
Read data as
required
No
Autoselect and SecSi Sector
read operations are also allowed
Data cannot be read from erase- or
program-suspended sectors
Done
reading?
Yes
Write address/data
XXXh/30h
Write Program Resume
Command Sequence
Device reverts to
operation prior to
Program Suspend
Figure 3.
Program Suspend/Program Resume
Chip Erase Command Sequence
Chip erase is a six bus cycle operation. The chip erase command sequence is initiated by writing two unlock cycles, followed by a set-up command. Two
additional unlock write cycles are then followed by the chip erase command,
which in turn invokes the Embedded Erase algorithm. The device does not require
the system to preprogram prior to erase. The Embedded Erase algorithm automatically preprograms and verifies the entire memory for an all zero data pattern
prior to electrical erase. The system is not required to provide any controls or timings during these operations. Table 12 shows the address and data requirements
for the chip erase command sequence.
When the Embedded Erase algorithm is complete, the device returns to the read
mode and addresses are no longer latched. The system can determine the status
of the erase operation by using DQ7, DQ6, or DQ2. Refer to the Write Operation
Status section for information on these status bits.
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Any commands written during the chip erase operation are ignored, including
erase suspend commands. However, note that a hardware reset immediately
terminates the erase operation. If that occurs, the chip erase command sequence
should be reinitiated once the device has returned to reading array data, to ensure data integrity.
Figure 4 illustrates the algorithm for the erase operation. Note that the Secured
Silicon Sector, autoselect, and CFI functions are unavailable when an
erase operation in is progress. Refer to the “Erase And Programming Performance” section on page 163 in the AC Characteristics section for parameters, and
Figure 16 section for timing diagrams.
Sector Erase Command Sequence
Sector erase is a six bus cycle operation. The sector erase command sequence is
initiated by writing two unlock cycles, followed by a set-up command. Two additional unlock cycles are written, and are then followed by the address of the
sector to be erased, and the sector erase command. Table 12 shows the address
and data requirements for the sector erase command sequence.
The device does not require the system to preprogram prior to erase. The Embedded Erase algorithm automatically programs and verifies the entire memory
for an all zero data pattern prior to electrical erase. The system is not required to
provide any controls or timings during these operations.
After the command sequence is written, a sector erase time-out of 50 µs occurs.
During the time-out period, additional sector addresses and sector erase commands may be written. Loading the sector erase buffer may be done in any
sequence, and the number of sectors may be from one sector to all sectors. The
time between these additional cycles must be less than 50 µs, otherwise erasure
may begin. Any sector erase address and command following the exceeded timeout may or may not be accepted. It is recommended that processor interrupts be
disabled during this time to ensure all commands are accepted. The interrupts
can be re-enabled after the last Sector Erase command is written. Any command other than Sector Erase or Erase Suspend during the time-out
period resets the device to the read mode. Note that the Secured Silicon
Sector, autoselect, and CFI functions are unavailable when an erase operation in is progress. The system must rewrite the command sequence and
any additional addresses and commands.
The system can monitor DQ3 to determine if the sector erase timer has timed out
(See the section on DQ3: Sector Erase Timer.). The time-out begins from the rising edge of the final WE# pulse in the command sequence.
When the Embedded Erase algorithm is complete, the device returns to reading
array data and addresses are no longer latched. The system can determine the
status of the erase operation by reading DQ7, DQ6, or DQ2 in the erasing sector.
Refer to the Write Operation Status section for information on these status bits.
Once the sector erase operation has begun, only the Erase Suspend command is
valid. All other commands are ignored. However, note that a hardware reset immediately terminates the erase operation. If that occurs, the sector erase
command sequence should be reinitiated once the device has returned to reading
array data, to ensure data integrity.
Figure 4 illustrates the algorithm for the erase operation. Refer to the Erase and
Program Operations table in the AC Characteristics section for parameters, and
Figure 16 section for timing diagrams.
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START
Write Erase
Command Sequence
(Notes 1, 2)
Data Poll to Erasing
Bank from System
No
Embedded
Erase
algorithm
in progress
Data = FFh?
Yes
Erasure Completed
Notes:
1. See Table 12 for program command sequence.
2. See the section on DQ3 for information on the sector
erase timer.
Figure 4. Erase Operation
Erase Suspend/Erase Resume Commands
The Erase Suspend command, B0h, allows the system to interrupt a sector erase
operation and then read data from, or program data to, any sector not selected
for erasure. This command is valid only during the sector erase operation, including the 50 µs time-out period during the sector erase command sequence. The
Erase Suspend command is ignored if written during the chip erase operation or
Embedded Program algorithm.
When the Erase Suspend command is written during the sector erase operation,
the device requires a typical of 5 µs (maximum of 20 µs) to suspend the erase
operation. However, when the Erase Suspend command is written during the sector erase time-out, the device immediately terminates the time-out period and
suspends the erase operation.
After the erase operation has been suspended, the device enters the erase-suspend-read mode. The system can read data from or program data to any sector
not selected for erasure. (The device “erase suspends” all sectors selected for
erasure.) Reading at any address within erase-suspended sectors produces status information on DQ7–DQ0. The system can use DQ7, or DQ6 and DQ2
together, to determine if a sector is actively erasing or is erase-suspended. Refer
to the Write Operation Status section for information on these status bits.
After an erase-suspended program operation is complete, the device returns to
the erase-suspend-read mode. The system can determine the status of the pro-
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gram operation using the DQ7 or DQ6 status bits, just as in the standard word
program operation. Refer to the Write Operation Status section for more
information.
In the erase-suspend-read mode, the system can also issue the autoselect command sequence. Refer to the “Autoselect Mode” section and “Autoselect
Command Sequence” section on page 127 sections for details.
To resume the sector erase operation, the system must write the Erase Resume
command. The address of the erase-suspended sector is required when writing
this command. Further writes of the Resume command are ignored. Another
Erase Suspend command can be written after the chip has resumed erasing. It is
important to allow an interval of at least 5 ms between Erase Resume and Erase
Suspend.
Lock Register Command Set Definitions
The Lock Register Command Set permits the user to one-time program the Secured Silicon Sector Protection Bit, Persistent Protection Mode Lock Bit, and
Password Protection Mode Lock Bit. The Lock Register bits are all readable after
an initial access delay.
The Lock Register Command Set Entry command sequence must be issued
prior to any of the following commands listed, to enable proper command
execution.
Note that issuing the Lock Register Command Set Entry command disables
reads and writes for the flash memory.
„ Lock Register Program Command
„ Lock Register Read Command
The Lock Register Command Set Exit command must be issued after the execution of the commands to reset the device to read mode. Otherwise the device
will hang. If this happens, the flash device must be reset. Please refer to RESET#
for more information. It is important to note that the device will be in either Persistent Protection mode or Password Protection mode depending on the mode
selected prior to the device hang.
For either the Secured Silicon Sector to be locked, or the device to be permanently set to the Persistent Protection Mode or the Password Protection Mode, the
associated Lock Register bits must be programmed. Note that the Persistent
Protection Mode Lock Bit and Password Protection Mode Lock Bit can
never be programmed together at the same time. If so, the Lock Register
Program operation will abort.
The Lock Register Command Set Exit command must be initiated to reenable reads and writes to the main memory.
Password Protection Command Set Definitions
The Password Protection Command Set permits the user to program the 64-bit
password, verify the programming of the 64-bit password, and then later unlock
the device by issuing the valid 64-bit password.
The Password Protection Command Set Entry command sequence must be
issued prior to any of the commands listed following to enable proper command
execution.
Note that issuing the Password Protection Command Set Entry command
disabled reads and writes the main memory.
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„ Password Program Command
„ Password Read Command
„ Password Unlock Command
The Password Program command permits programming the password that is
used as part of the hardware protection scheme. The actual password is 64-bits
long. There is no special addressing order required for programming the password. The password is programmed in 8-bit or 16-bit portions. Each
portion requires a Password Program Command.
Once the Password is written and verified, the Password Protection Mode Lock Bit
in the “Lock Register” must be programmed in order to prevent verification. The
Password Program command is only capable of programming “0”s. Programming
a “1” after a cell is programmed as a “0” results in a time-out by the Embedded
Program AlgorithmTM with the cell remaining as a “0”. The password is all F’s when
shipped from the factory. All 64-bit password combinations are valid as a
password.
The Password Read command is used to verify the Password. The Password is
verifiable only when the Password Protection Mode Lock Bit in the “Lock Register”
is not programmed. If the Password Protection Mode Lock Bit in the “Lock Register” is programmed and the user attempts to read the Password, the device will
always drive all F’s onto the DQ databus.
The lower two address bits (A1–A0) for word mode and (A1–A-1) for by byte
mode are valid during the Password Read, Password Program, and Password Unlock commands. Writing a “1” to any other address bits (AMAX-A2) will
abort the Password Read and Password Program commands.
The Password Unlock command is used to clear the PPB Lock Bit to the “unfreeze
state” so that the PPB bits can be modified. The exact password must be entered
in order for the unlocking function to occur. This 64-bit Password Unlock command sequence will take at least 2 µs to process each time to prevent a
hacker from running through the all 64-bit combinations in an attempt
to correctly match the password. If another password unlock is issued
before the 64-bit password check execution window is completed, the
command will be ignored. If the wrong address or data is given during
password unlock command cycle, the device may enter the write-tobuffer abort state. In order to exit the write-to-abort state, the write-tobuffer-abort-reset command must be given. Otherwise the device will
hang.
The Password Unlock function is accomplished by writing Password Unlock command and data to the device to perform the clearing of the PPB Lock Bit to the
“unfreeze state”. The password is 64 bits long. A1 and A0 are used for matching.
Writing the Password Unlock command does not need to be address order specific. An example sequence is starting with the lower address A1-A0=00, followed
by A1-A0=01, A1-A0=10, and A1-A0=11 if the device is configured to operate in
word mode.
Approximately 2 µs is required for unlocking the device after the valid
64-bit password is given to the device. It is the responsibility of the microprocessor to keep track of the entering the portions of the 64-bit
password with the Password Unlock command, the order, and when to
read the PPB Lock bit to confirm successful password unlock. In order to
re-lock the device into the Password Protection Mode, the PPB Lock Bit Set command can be re-issued.
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The Password Protection Command Set Exit command must be issued after
the execution of the commands listed previously to reset the device to read
mode. Otherwise the device will hang.
Note that issuing the Password Protection Command Set Exit command reenables reads and writes for the main memory.
Non-Volatile Sector Protection Command Set Definitions
The Non-Volatile Sector Protection Command Set permits the user to program the
Persistent Protection Bits (PPB bits), erase all of the Persistent Protection Bits
(PPB bits), and read the logic state of the Persistent Protection Bits (PPB bits).
The Non-Volatile Sector Protection Command Set Entry command sequence must be issued prior to any of the commands listed following to enable
proper command execution.
Note that issuing the Non-Volatile Sector Protection Command Set Entry
command disables reads and writes for the main memory.
„ PPB Program Command
The PPB Program command is used to program, or set, a given PPB bit. Each PPB
bit is individually programmed (but is bulk erased with the other PPB bits). The
specific sector address (A24-A16 for S29GL512N, A23-A16 for S29GL256N, A22A16 for S29GL128N) is written at the same time as the program command. If the
PPB Lock Bit is set to the “freeze state”, the PPB Program command will not execute and the command will time-out without programming the PPB bit.
„ All PPB Erase Command
The All PPB Erase command is used to erase all PPB bits in bulk. There is no
means for individually erasing a specific PPB bit. Unlike the PPB program, no specific sector address is required. However, when the All PPB Erase command is
issued, all Sector PPB bits are erased in parallel. If the PPB Lock Bit is set to
“freeze state”, the ALL PPB Erase command will not execute and the command
will time-out without erasing the PPB bits.
The device will preprogram all PPB bits prior to erasing when issuing the All PPB
Erase command. Also note that the total number of PPB program/erase cycles has
the same endurance as the flash memory array.
„ PPB Status Read Command
The programming state of the PPB for a given sector can be verified by writing a
PPB Status Read Command to the device. This requires an initial access time
latency.
The Non-Volatile Sector Protection Command Set Exit command must be
issued after the execution of the commands listed previously to reset the device
to read mode.
Note that issuing the Non-Volatile Sector Protection Command Set Exit
command re-enables reads and writes for the main memory.
Global Volatile Sector Protection Freeze Command Set
The Global Volatile Sector Protection Freeze Command Set permits the user to set
the PPB Lock Bit and reading the logic state of the PPB Lock Bit.
The Global Volatile Sector Protection Freeze Command Set Entry command sequence must be issued prior to any of the commands listed following to
enable proper command execution.
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Reads and writes from the main memory are not allowed.
„ PPB Lock Bit Set Command
The PPB Lock Bit Set command is used to set the PPB Lock Bit to the “freeze state”
if it is cleared either at reset or if the Password Unlock command was successfully
executed. There is no PPB Lock Bit Clear command. Once the PPB Lock Bit is set
to the “freeze state”, it cannot be cleared unless the device is taken through a
power-on clear (for Persistent Protection Mode) or the Password Unlock command
is executed (for Password Protection Mode). If the Password Protection Mode Lock
Bit is programmed, the PPB Lock Bit status is reflected as set to the “freeze state”,
even after a power-on reset cycle.
„ PPB Lock Bit Status Read Command
The programming state of the PPB Lock Bit can be verified by executing a PPB
Lock Bit Status Read command to the device.
The Global Volatile Sector Protection Freeze Command Set Exit command
must be issued after the execution of the commands listed previously to reset the
device to read mode.
Volatile Sector Protection Command Set
The Volatile Sector Protection Command Set permits the user to set the Dynamic
Protection Bit (DYB) to the “protected state”, clear the Dynamic Protection Bit
(DYB) to the “unprotected state”, and read the logic state of the Dynamic Protection Bit (DYB).
The Volatile Sector Protection Command Set Entry command sequence
must be issued prior to any of the commands listed following to enable proper
command execution.
Note that issuing the Volatile Sector Protection Command Set Entry command disables reads and writes from main memory.
„ DYB Set Command
„ DYB Clear Command
The DYB Set and DYB Clear commands are used to protect or unprotect a DYB for
a given sector. The high order address bits are issued at the same time as the
code 00h or 01h on DQ7-DQ0. All other DQ data bus pins are ignored during the
data write cycle. The DYB bits are modifiable at any time, regardless of the state
of the PPB bit or PPB Lock Bit. The DYB bits are cleared to the “unprotected state”
at power-up or hardware reset.
—DYB Status Read Command
The programming state of the DYB bit for a given sector can be verified by writing
a DYB Status Read command to the device. This requires an initial access delay.
The Volatile Sector Protection Command Set Exit command must be issued
after the execution of the commands listed previously to reset the device to read
mode.
Note that issuing the Volatile Sector Protection Command Set Exit command re-enables reads and writes to the main memory.
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Secured Silicon Sector Entry Command
The Secured Silicon Sector Entry command allows the following commands to be
executed
„ Read from Secured Silicon Sector
„ Program to Secured Silicon Sector
Once the Secured Silicon Sector Entry Command is issued, the Secured Silicon
Sector Exit command has to be issued to exit Secured Silicon Sector Mode.
Secured Silicon Sector Exit Command
The Secured Silicon Sector Exit command may be issued to exit the Secured Silicon Sector Mode.
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Command Definitions
Cycles
Table 12. S29GL512N, S29GL256N, S29GL128N Command Definitions, x16
Command (Notes)
Bus Cycles (Notes 2–5)
First
Second
Addr
Data
Third
Fourth
Addr
Data
Addr
Data
Addr
Data
Fifth
Sixth
Addr
Data
Addr
Data
X0E
Note
17
X0F
Note
17
1
RA
RD
Reset (7)
1
XXX
F0
Manufacturer ID
4
555
AA
2AA
55
555
90
X00
01
Device ID
4
555
AA
2AA
55
555
90
X01
227E
Sector Protect Verify
4
555
AA
2AA
55
555
90
(SA)
X02
Secure Device Verify (9)
4
555
AA
2AA
55
555
90
X03
Note
10
CFI Query (11)
1
55
98
Program
4
555
AA
2AA
55
555
A0
PA
PD
Write to Buffer
3
555
AA
2AA
55
SA
25
SA
WC
PA
PD
WBL
PD
Program Buffer to Flash (confirm)
1
SA
29
Write-to-Buffer-Abort Reset (16)
3
555
AA
2AA
55
555
F0
Unlock Bypass
3
555
AA
2AA
55
555
20
Unlock Bypass Program (12)
2
XXX
A0
PA
PD
Unlock Bypass Sector Erase (12)
2
XXX
80
SA
30
Autoselect (Note 8)
Read (6)
XX00
XX01
Unlock Bypass Chip Erase (12)
2
XXX
80
XXX
10
Unlock Bypass Reset (13)
2
XXX
90
XXX
00
Chip Erase
6
555
AA
2AA
55
555
80
555
AA
2AA
55
555
10
Sector Erase
6
555
AA
2AA
55
555
80
555
AA
2AA
55
SA
30
Erase Suspend/Program Suspend (14)
1
XXX
B0
Erase Resume/Program Resume (15)
1
XXX
30
XX
00
Secured Silicon SEctor
Sector Command Definitions
Secured Silicon Sector Entry
3
555
AA
2AA
55
555
88
Secured Silicon Sector Exit (18)
4
555
AA
2AA
55
555
90
Lock Register
Lock Register Command Set Definitions
Lock Register Command Set Entry
3
555
AA
2AA
55
Lock Register Bits Program (22)
2
XXX
A0
XXX
Data
Lock Register Bits Read (22)
1
00
Data
Lock Register Command Set Exit (18, 23)
2
XXX
90
XXX
00
555
40
Password Protection Command Set Definitions
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Cycles
A d v a n c e
Password
Command (Notes)
I n f o r m a t i o n
Bus Cycles (Notes 2–5)
First
Second
Third
Addr
Data
Addr
Data
Addr
Data
Password Protection Command Set Entry
3
555
AA
2AA
55
555
60
Password Program (20)
2
XXX
A0
PWA
x
PWD
x
Password Read (19)
4
XXX
PWD
0
01
PWD
1
02
Password Unlock (19)
7
00
25
00
03
00
00
29
XXX
90
XXX
00
Password Protection Command Set Exit (18,
23)
2
Fourth
Addr
Data
PWD
2
03
PWD
3
PWD
0
01
PWD
1
Fifth
Sixth
Addr
Data
Addr
Data
02
PWD
2
03
PWD
3
PPB
Non-Volatile Sector Protection Command Set Definitions
Nonvolatile Sector Protection Command Set
Entry
3
555
AA
2AA
55
PPB Program (24, 25)
2
XXX
A0
SA
00
All PPB Erase
2
XXX
80
00
30
PPB Status Read (25)
1
SA
RD
(0)
Non-Volatile Sector Protection Command Set
Exit (18)
2
XXX
90
XXX
00
555
C0
PPB Lock Bit
Global Non-Volatile Sector Protection Freeze Command Set Definitions
Global Non-Volatile Sector Protection Freeze
Command Set Entry
3
555
AA
2AA
55
PPB Lock Bit Set (25)
2
XXX
A0
XXX
00
PPB Lock Status Read (25)
1
XXX
RD
(0)
Global Non-Volatile Sector Protection Freeze
Command Set Exit (18)
2
XXX
90
XXX
00
555
50
DYB
Volatile Sector Protection Command Set Definitions
Volatile Sector Protection Command Set Entry
3
555
AA
2AA
55
DYB Set (24, 25)
2
XXX
A0
SA
00
DYB Clear (25)
2
XXX
A0
SA
01
DYB Status Read (25)
1
SA
RD
(0)
Volatile Sector Protection Command Set Exit
(18)
2
XXX
90
XXX
00
555
E0
Legend:
X = Don’t care
RA = Address of the memory to be read.
RD = Data read from location RA during read operation.
PA = Address of the memory location to be programmed. Addresses latch on the falling edge of the WE# or CE# pulse, whichever
happens later.
PD = Data to be programmed at location PA. Data latches on the rising edge of the WE# or CE# pulse, whichever happens first.
SA = Address of the sector to be verified (in autoselect mode) or erased. Address bits Amax–A16 uniquely select any sector.
WBL = Write Buffer Location. The address must be within the same write buffer page as PA.
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WC = Word Count is the number of write buffer locations to load minus 1.
PWD = Password
PWDx = Password word0, word1, word2, and word3.
DATA = Lock Register Contents: PD(0) = Secured Silicon Sector Protection Bit, PD(1) = Persistent Protection Mode Lock Bit, PD(2)
= Password Protection Mode Lock Bit.
Notes:
1. See Table 1 for description of bus operations.
2. All values are in hexadecimal.
3. Except for the read cycle, and the 4th, 5th, and 6th cycle of the autoselect command sequence, all bus cycles are write
cycles.
4. Data bits DQ15-DQ8 are don't cares for unlock and command cycles.
5. Address bits AMAX:A16 are don't cares for unlock and command cycles, unless SA or PA required. (AMAX is the Highest
Address pin.).
6. No unlock or command cycles required when reading array data.
7. The Reset command is required to return to reading array data when device is in the autoselect mode, or if DQ5 goes high
(while the device is providing status data).
8. The fourth, fifth, and sixth cycle of the autoselect command sequence is a read cycle.
9. The data is 00h for an unprotected sector and 01h for a protected sector. See “Autoselect Command Sequence” for more
information. This is same as PPB Status Read except that the protect and unprotect statuses are inverted here.
10. The data value for DQ7 is “1” for a serialized and protected OTP region and “0” for an unserialized and unprotected Secured
Silicon Sector region. See “Secured Silicon Sector Flash Memory Region” for more information. For S29GLxxxNH: XX18h/18h
= Not Factory Locked. XX98h/98h = Factory Locked. For S29GLxxxNL: XX08h/08h = Not Factory Locked. XX88h/88h =
Factory Locked.
11. Command is valid when device is ready to read array data or when device is in autoselect mode.
12. The Unlock-Bypass command is required prior to the Unlock-Bypass-Program command.
13. The Unlock-Bypass-Reset command is required to return to reading array data when the device is in the unlock bypass
mode.
14. The system may read and program/program suspend in non-erasing sectors, or enter the autoselect mode, when in the
Erase Suspend mode. The Erase Suspend command is valid only during a sector erase operation.
15. The Erase Resume/Program Resume command is valid only during the Erase Suspend/Program Suspend modes.
16. Issue this command sequence to return to READ mode after detecting device is in a Write-to-Buffer-Abort state. NOTE: the
full command sequence is required if resetting out of ABORT while using Unlock Bypass Mode.
17. S29GL512NH/L = 2223h/23h, 2201h/01h; S29GL256NH/L = 2222h/22h, 2201h/01h; S29GL128NH/L = 2221h/21h, 2201h/
01h.
18. The Exit command returns the device to reading the array.
19. Note that the password portion can be entered or read in any order as long as the entire 64-bit password is entered or read.
20. For PWDx, only one portion of the password can be programmed per each “A0” command.
21. The All PPB Erase command embeds programming of all PPB bits before erasure.
22. All Lock Register bits are one-time programmable. Note that the program state = “0” and the erase state = “1”. Also note
that of both the Persistent Protection Mode Lock Bit and the Password Protection Mode Lock Bit cannot be programmed at the
same time or the Lock Register Bits Program operation will abort and return the device to read mode. Lock Register bits that
are reserved for future use will default to “1's”. The Lock Register is shipped out as “FFFF's” before Lock Register Bit program
execution.
23. If any of the Entry command was initiated, an Exit command must be issued to reset the device into read mode. Otherwise
the device will hang.
24. If ACC = VHH, sector protection will match when ACC = VIH
25. Protected State = “00h”, Unprotected State = “01h”.
December 15, 2004 S29GLxxxN_MCP_A1
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A d v a n c e
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Write Operation Status
The device provides several bits to determine the status of a program or erase
operation: DQ2, DQ3, DQ5, DQ6, and DQ7. Table 13 and the following subsections describe the function of these bits. DQ7 and DQ6 each offer a method for
determining whether a program or erase operation is complete or in progress.
The device also provides a hardware-based output signal, RY/BY#, to determine
whether an Embedded Program or Erase operation is in progress or has been
completed.
Note that all Write Operation Status DQ bits are valid only after 4 µs delay.
DQ7: Data# Polling
The Data# Polling bit, DQ7, indicates to the host system whether an Embedded
Program or Erase algorithm is in progress or completed, or whether the device is
in Erase Suspend. Data# Polling is valid after the rising edge of the final WE#
pulse in the command sequence.
During the Embedded Program algorithm, the device outputs on DQ7 the complement of the datum programmed to DQ7. This DQ7 status also applies to
programming during Erase Suspend. When the Embedded Program algorithm is
complete, the device outputs the datum programmed to DQ7. The system must
provide the program address to read valid status information on DQ7. If a program address falls within a protected sector, Data# Polling on DQ7 is active for
approximately 1 µs, then the device returns to the read mode.
During the Embedded Erase algorithm, Data# Polling produces a “0” on DQ7.
When the Embedded Erase algorithm is complete, or if the device enters the
Erase Suspend mode, Data# Polling produces a “1” on DQ7. The system must
provide an address within any of the sectors selected for erasure to read valid
status information on DQ7.
After an erase command sequence is written, if all sectors selected for erasing
are protected, Data# Polling on DQ7 is active for approximately 100 µs, then the
device returns to the read mode. If not all selected sectors are protected, the Embedded Erase algorithm erases the unprotected sectors, and ignores the selected
sectors that are protected. However, if the system reads DQ7 at an address within
a protected sector, the status may not be valid.
Just prior to the completion of an Embedded Program or Erase operation, DQ7
may change asynchronously with DQ0–DQ6 while Output Enable (OE#) is asserted low. That is, the device may change from providing status information to
valid data on DQ7. Depending on when the system samples the DQ7 output, it
may read the status or valid data. Even if the device has completed the program
or erase operation and DQ7 has valid data, the data outputs on DQ0–DQ6 may
be still invalid. Valid data on DQ0–DQ7 will appear on successive read cycles.
Table 13 shows the outputs for Data# Polling on DQ7. Figure 5 shows the Data#
Polling algorithm. Figure 17 in the AC Characteristics section shows the Data#
Polling timing diagram.
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START
Read DQ15–DQ0
Addr = VA
DQ7 = Data?
Yes
No
No
DQ5 = 1
Yes
Read DQ15–DQ0
Addr = VA
DQ7 = Data?
Yes
No
FAIL
PASS
Notes:
1. VA = Valid address for programming. During a sector
erase operation, a valid address is any sector address
within the sector being erased. During chip erase, a
valid address is any non-protected sector address.
2. DQ7 should be rechecked even if DQ5 = “1” because
DQ7 may change simultaneously with DQ5.
Figure 5. Data# Polling Algorithm
RY/BY#: Ready/Busy#
The RY/BY# is a dedicated, open-drain output pin which indicates whether an
Embedded Algorithm is in progress or complete. The RY/BY# status is valid after
the rising edge of the final WE# pulse in the command sequence. Since RY/BY#
is an open-drain output, several RY/BY# pins can be tied together in parallel with
a pull-up resistor to VCC.
If the output is low (Busy), the device is actively erasing or programming. (This
includes programming in the Erase Suspend mode.) If the output is high (Ready),
the device is in the read mode, the standby mode, or in the erase-suspend-read
mode. Table 13 shows the outputs for RY/BY#.
December 15, 2004 S29GLxxxN_MCP_A1
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A d v a n c e
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DQ6: Toggle Bit I
Toggle Bit I on DQ6 indicates whether an Embedded Program or Erase algorithm
is in progress or complete, or whether the device has entered the Erase Suspend
mode. Toggle Bit I may be read at any address, and is valid after the rising edge
of the final WE# pulse in the command sequence (prior to the program or erase
operation), and during the sector erase time-out.
During an Embedded Program or Erase algorithm operation, successive read cycles to any address cause DQ6 to toggle. The system may use either OE# or CE#
to control the read cycles. When the operation is complete, DQ6 stops toggling.
After an erase command sequence is written, if all sectors selected for erasing
are protected, DQ6 toggles for approximately 100 µs, then returns to reading
array data. If not all selected sectors are protected, the Embedded Erase algorithm erases the unprotected sectors, and ignores the selected sectors that are
protected.
The system can use DQ6 and DQ2 together to determine whether a sector is actively erasing or is erase-suspended. When the device is actively erasing (that is,
the Embedded Erase algorithm is in progress), DQ6 toggles. When the device enters the Erase Suspend mode, DQ6 stops toggling. However, the system must
also use DQ2 to determine which sectors are erasing or erase-suspended. Alternatively, the system can use DQ7 (see the subsection on DQ7: Data# Polling).
If a program address falls within a protected sector, DQ6 toggles for approximately 1 µs after the program command sequence is written, then returns to
reading array data.
DQ6 also toggles during the erase-suspend-program mode, and stops toggling
once the Embedded Program algorithm is complete.
Table 13 shows the outputs for Toggle Bit I on DQ6. Figure 6 shows the toggle bit
algorithm. Figure 18 in the “AC Characteristics” section shows the toggle bit timing diagrams. Figure 19 shows the differences between DQ2 and DQ6 in graphical
form. See also the subsection on DQ2: Toggle Bit II.
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START
Read DQ7–DQ0
Read DQ7–DQ0
Toggle Bit
= Toggle?
No
Yes
No
DQ5 = 1?
Yes
Read DQ7–DQ0
Twice
Toggle Bit
= Toggle?
No
Yes
Program/Erase
Operation Not
Complete, Write
Reset Command
Program/Erase
Operation Complete
Note:
The system should recheck the toggle bit even if
DQ5 = “1” because the toggle bit may stop toggling
as DQ5 changes to “1.” See the subsections on DQ6
and DQ2 for more information.
Figure 6. Toggle Bit Algorithm
DQ2: Toggle Bit II
The “Toggle Bit II” on DQ2, when used with DQ6, indicates whether a particular
sector is actively erasing (that is, the Embedded Erase algorithm is in progress),
or whether that sector is erase-suspended. Toggle Bit II is valid after the rising
edge of the final WE# pulse in the command sequence.
DQ2 toggles when the system reads at addresses within those sectors that have
been selected for erasure. (The system may use either OE# or CE# to control the
December 15, 2004 S29GLxxxN_MCP_A1
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147
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read cycles.) But DQ2 cannot distinguish whether the sector is actively erasing or
is erase-suspended. DQ6, by comparison, indicates whether the device is actively
erasing, or is in Erase Suspend, but cannot distinguish which sectors are selected
for erasure. Thus, both status bits are required for sector and mode information.
Refer to Table 13 to compare outputs for DQ2 and DQ6.
Figure 6 shows the toggle bit algorithm in flowchart form, and the section “DQ2:
Toggle Bit II” explains the algorithm. See also the RY/BY#: Ready/Busy# subsection. Figure 18 shows the toggle bit timing diagram. Figure 19 shows the
differences between DQ2 and DQ6 in graphical form.
Reading Toggle Bits DQ6/DQ2
Refer to Figure 6 and Figure 19 for the following discussion. Whenever the system
initially begins reading toggle bit status, it must read DQ7–DQ0 at least twice in
a row to determine whether a toggle bit is toggling. Typically, the system would
note and store the value of the toggle bit after the first read. After the second
read, the system would compare the new value of the toggle bit with the first. If
the toggle bit is not toggling, the device has completed the program or erase operation. The system can read array data on DQ7–DQ0 on the following read cycle.
However, if after the initial two read cycles, the system determines that the toggle
bit is still toggling, the system also should note whether the value of DQ5 is high
(see the section on DQ5). If it is, the system should then determine again
whether the toggle bit is toggling, since the toggle bit may have stopped toggling
just as DQ5 went high. If the toggle bit is no longer toggling, the device has successfully completed the program or erase operation. If it is still toggling, the
device did not completed the operation successfully, and the system must write
the reset command to return to reading array data.
The remaining scenario is that the system initially determines that the toggle bit
is toggling and DQ5 has not gone high. The system may continue to monitor the
toggle bit and DQ5 through successive read cycles, determining the status as described in the previous paragraph. Alternatively, it may choose to perform other
system tasks. In this case, the system must start at the beginning of the algorithm when it returns to determine the status of the operation (top of Figure 6).
DQ5: Exceeded Timing Limits
DQ5 indicates whether the program, erase, or write-to-buffer time has exceeded a specified internal pulse count limit. Under these conditions DQ5
produces a “1,” indicating that the program or erase cycle was not successfully
completed.
The device may output a “1” on DQ5 if the system tries to program a “1” to a
location that was previously programmed to “0.” Only an erase operation can
change a “0” back to a “1.” Under this condition, the device halts the operation, and when the timing limit has been exceeded, DQ5 produces a “1.”
In all these cases, the system must write the reset command to return the device
to the reading the array (or to erase-suspend-read if the device was previously
in the erase-suspend-program mode).
DQ3: Sector Erase Timer
After writing a sector erase command sequence, the system may read DQ3 to determine whether or not erasure has begun. (The sector erase timer does not
apply to the chip erase command.) If additional sectors are selected for erasure,
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the entire time-out also applies after each additional sector erase command.
When the time-out period is complete, DQ3 switches from a “0” to a “1.” If the
time between additional sector erase commands from the system can be assumed to be less than 50 µs, the system need not monitor DQ3. See also the
Sector Erase Command Sequence section.
After the sector erase command is written, the system should read the status of
DQ7 (Data# Polling) or DQ6 (Toggle Bit I) to ensure that the device has accepted
the command sequence, and then read DQ3. If DQ3 is “1,” the Embedded Erase
algorithm has begun; all further commands (except Erase Suspend) are ignored
until the erase operation is complete. If DQ3 is “0,” the device will accept additional sector erase commands. To ensure the command has been accepted, the
system software should check the status of DQ3 prior to and following each subsequent sector erase command. If DQ3 is high on the second status check, the
last command might not have been accepted.
Table 13 shows the status of DQ3 relative to the other status bits.
DQ1: Write-to-Buffer Abort
DQ1 indicates whether a Write-to-Buffer operation was aborted. Under these
conditions DQ1 produces a “1”. The system must issue the Write-to-Buffer-AbortReset command sequence to return the device to reading array data. See Write
Buffer section for more details.
Table 13.
DQ7
(Note 2)
DQ6
DQ5
(Note 1)
DQ3
DQ2
(Note 2)
DQ1
RY/
BY#
Embedded Program Algorithm
DQ7#
Toggle
0
N/A
No toggle
0
0
Embedded Erase Algorithm
0
Toggle
0
1
Toggle
N/A
0
Status
Standard
Mode
Program
Suspend
Mode
Erase
Suspend
Mode
Write-toBuffer
Write Operation Status
ProgramSuspend
Read
EraseSuspend
Read
Program-Suspended
Sector
Invalid (not allowed)
1
Data
1
Non-Program
Suspended Sector
Erase-Suspended
Sector
1
No toggle
0
Non-Erase
Suspended Sector
N/A
Toggle
N/A
Data
1
1
Erase-Suspend-Program
(Embedded Program)
DQ7#
Toggle
0
N/A
N/A
N/A
0
Busy (Note 3)
DQ7#
Toggle
0
N/A
N/A
0
0
Abort (Note 4)
DQ7#
Toggle
0
N/A
N/A
1
0
Notes:
1. DQ5 switches to ‘1’ when an Embedded Program, Embedded Erase, or Write-to-Buffer operation has exceeded the maximum
timing limits. Refer to the section on DQ5 for more information.
2. DQ7 and DQ2 require a valid address when reading status information. Refer to the appropriate subsection for further
details.
3. The Data# Polling algorithm should be used to monitor the last loaded write-buffer address location.
4. DQ1 switches to ‘1’ when the device has aborted the write-to-buffer operation.
December 15, 2004 S29GLxxxN_MCP_A1
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Absolute Maximum Ratings
Storage Temperature, Plastic Packages . . . . . . . . . . . . . . . . –65°C to +150°C
Ambient Temperature with Power Applied . . . . . . . . . . . . . . –65°C to +125°C
Voltage with Respect to Ground:
VCC (Note 1). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .–0.5 V to +4.0 V
VIO . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .–0.5 V to +4.0 V
A9, OE#, and ACC (Note 2) . . . . . . . . . . . . . . . . . . . –0.5 V to +12.5 V
All other pins (Note 1) . . . . . . . . . . . . . . . . . . . . .–0.5 V to VCC + 0.5V
Output Short Circuit Current (Note 3) . . . . . . . . . . . . . . . . . . . 200 mA
Notes:
1. Minimum DC voltage on input or I/Os is –0.5 V. During voltage transitions, inputs
or I/Os may overshoot VSS to –2.0 V for periods of up to 20 ns. See Figure 7.
Maximum DC voltage on input or I/Os is VCC + 0.5 V. During voltage transitions,
input or I/O pins may overshoot to VCC + 2.0 V for periods up to 20 ns. See Figure
8.
2. Minimum DC input voltage on pins A9, OE#, and ACC is –0.5 V. During voltage
transitions, A9, OE#, and ACC may overshoot VSS to –2.0 V for periods of up to
20 ns. See Figure 7. Maximum DC input voltage on pin A9, OE#, and ACC is +12.5
V which may overshoot to +14.0V for periods up to 20 ns.
3. No more than one output may be shorted to ground at a time. Duration of the short
circuit should not be greater than one second.
4. Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only; functional operation
of the device at these or any other conditions above those indicated in the
operational sections of this data sheet is not implied. Exposure of the device to
absolute maximum rating conditions for extended periods may affect device
reliability.
20 ns
20 ns
20 ns
VCC
+2.0 V
VCC
+0.5 V
+0.8 V
–0.5 V
–2.0 V
2.0 V
20 ns
20 ns
Figure 7. Maximum Negative
Overshoot Waveform
20 ns
Figure 8. Maximum Positive
Overshoot Waveform
Operating Ranges
Industrial (I) Devices
Ambient Temperature (TA) . . . . . . . . . . . . . . . . . . . . . . . . . –40°C to +85°C
Supply Voltages
VCC
. . . . . . . . . . . . . . . . . . . . . . . . . . +2.7 V to +3.6 V or +3.0V to 3.6V
VIO (Note 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +1.65V to 1.95V or VCC
Notes:
1. Operating ranges define those limits between which the functionality of the device is guaranteed.
2. See “Product Selector Guide” section on page 80.
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DC Characteristics
CMOS Compatible-S29GL128N, S29GL256N, S29GL512N
Parameter
Symbol
Parameter Description
(Notes)
Test Conditions
ILI
Input Load Current (1)
VIN = VSS to VCC,
VCC = VCC max
ILIT
A9 Input Load Current
VCC = VCC max; A9 = 12.5 V
ILO
Output Leakage Current
VOUT = VSS to VCC,
VCC = VCC max
ICC1
ICC2
VCC Active Read Current (1)
VCC Intra-Page Read Current (1)
Min
Typ
Max
WP/ACC: ±2.0
Others: ±1.0
Unit
µA
35
µA
±1.0
µA
CE# = VIL, OE# = VIH, VCC = VCCmax,
f = 5 MHz
30
50
CE# = VIL, OE# = VIH, VCC = VCCmax,
f = 10 MHz
60
90
CE# = VIL, OE# = VIH, VCC = VCCmax
f = 10 MHz
1
10
CE# = VIL, OE# = VIH, VCC = VCCmax,
f=33 MHz
5
20
50
80
mA
mA
mA
ICC3
VCC Active Erase/Program Current (2, 3) CE# = VIL, OE# = VIH, VCC = VCCmax
ICC4
VCC Standby Current
CE#, RESET# = VSS ± 0.3 V, OE# =
VIH, VCC = VCCmax VIL = VSS + 0.3 V/0.1V
1
5
mA
ICC5
VCC Reset Current
VCC = VCCmax;
VIL = VSS + 0.3 V/-0.1V,
RESET# = VSS ± 0.3 V
1
5
µA
ICC6
Automatic Sleep Mode (4)
VCC = VCCmax
VIH = VCC ± 0.3 V,
VIL = VSS + 0.3 V/-0.1V,
WP#/ACC = VIH
1
5
µA
IACC
ACC Accelerated Program Current
CE# = VIL, OE# = VIH, VCC = VCCmax,
WP#/ACC = VIH
WP#/ACC
pin
10
20
VCC pin
50
80
mA
VIL
Input Low Voltage (5)
–0.1
0.3 x VIO
V
VIH
Input High Voltage (5)
0.7 x VIO
VIO + 0.3
V
VHH
Voltage for ACC Erase/Program
Acceleration
VCC = 2.7 –3.6 V
11.5
12.5
V
VID
Voltage for Autoselect and Temporary
Sector Unprotect
VCC = 2.7 –3.6 V
11.5
12.5
V
VOL
Output Low Voltage (5)
IOL = 100 µA
0.15 x VIO
V
VOH
Output High Voltage (5)
IOH = -100 µA
VLKO
Low VCC Lock-Out Voltage (3)
0.85 x VIO
2.3
V
2.5
V
Notes:
1. The ICC current listed is typically less than 2 mA/MHz, with OE# at VIH.
2. ICC active while Embedded Erase or Embedded Program or Write Buffer Programming is in progress.
3. Not 100% tested.
4. Automatic sleep mode enables the lower power mode when addresses remain stable tor tACC + 30 ns.
5. VIO = 1.65–1.95 V or 2.7–3.6 V
6. VCC = 3 V and VIO = 3V or 1.8V. When VIO is at 1.8V, I/O pins cannot operate at 3V.
December 15, 2004 S29GLxxxN_MCP_A1
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Test Conditions
Table 14.
3.3 V
2.7 kΩ
Device
Under
Test
CL
6.2 kΩ
Note: Diodes are IN3064 or equivalent.
Figure 9.
Test Specifications
Test Condition
All Speeds
Unit
Output Load
1 TTL gate
Output Load Capacitance, CL
(including jig capacitance)
30
pF
Input Rise and Fall Times
5
ns
Input Pulse Levels
0.0–VIO
V
Input timing measurement
reference levels (See Note)
0.5VIO
V
Output timing measurement
reference levels
0.5 VIO
V
Test Setup
Note: If VIO < VCC, the reference level is 0.5 VIO.
Key to Switching Waveforms
Waveform
Inputs
Outputs
Steady
Changing from H to L
Changing from L to H
VIO
Input
Don’t Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Center Line is High Impedance State (High Z)
0.5 VIO
Measurement Level
0.5 VIO V
Output
0.0 V
Note: If VIO < VCC, the input measurement reference level is 0.5 VIO.
Figure 10.
152
Input Waveforms and Measurement Levels
S29GLxxxN MirrorBitTM Flash Family
S29GLxxxN_MCP_A1 December 15, 2004
A d v a n c e
I n f o r m a t i o n
AC Characteristics
Read-Only Operations–S29GL128N, S29GL256N, S29GL512N
Parameter
Speed Options
JEDEC
Std.
Description
Test Setup
tAVAV
tRC
Read Cycle Time
tAVQV
tACC
Address to Output Delay
(Note 2)
tELQV
tCE
Chip Enable to Output Delay
(Note 3)
VIO = VCC = 3 V
VIO = 1.8 V, VCC = 3 V
VIO = VCC = 3 V
VIO = 1.8 V, VCC = 3 V
VIO = VCC = 3 V
VIO = 1.8 V, VCC = 3 V
tPACC Page Access Time
Min
Max
Max
90
100 110 110 Unit
90
100
110
110
90
100
110
110
90
100
110
110
ns
ns
ns
Max
25
25
25
30
ns
25
25
35
35
ns
tGLQV
tOE
Output Enable to Output Delay
Max
tEHQZ
tDF
Chip Enable to Output High Z (Note 1)
Max
20
ns
tGHQZ
tDF
Output Enable to Output High Z
(Note 1)
Max
20
ns
tAXQX
tOH
Output Hold Time From Addresses, CE#
or OE#, Whichever Occurs First
Min
0
ns
Read
Min
0
ns
tOEH
Output Enable Hold
Time (Note 1)
Toggle and
Data# Polling
Min
10
ns
Min
35
ns
tCEH
Chip Enable Hold Time Read
Notes:
1. Not 100% tested.
2. CE#, OE# = VIL
3. OE# = VIL
4. See Figure 9 and Table 14 for test specifications.
5. Unless otherwise indicated, AC specifications for 90 ns, 100 ns, and 110 ns speed options are tested with VIO = VCC = 3 V.
AC specifications for 110 ns speed options are tested with VIO = 1.8 V and VCC = 3.0 V.
December 15, 2004 S29GLxxxN_MCP_A1
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153
A d v a n c e
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AC Characteristics
tRC
Addresses Stable
Addresses
tACC
CE#
tCEH
tRH
tRH
tDF
tOE
OE#
tOEH
WE#
tCE
tOH
HIGH Z
HIGH Z
Output Valid
Outputs
RESET#
RY/BY#
0V
Figure 11.
Same Page
Amax-A2
A2-A0*
Aa
tACC
Data Bus
Read Operation Timings
Ab
Qa
Ad
Ac
tPACC
tPACC
Qb
tPACC
Qc
Qd
CE#
OE#
Notes:
1. Figure shows word mode.
Figure 12. Page Read Timings
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S29GLxxxN MirrorBitTM Flash Family
S29GLxxxN_MCP_A1 December 15, 2004
A d v a n c e
I n f o r m a t i o n
AC Characteristics
Hardware Reset (RESET#)
Parameter
JEDEC
Std.
Description
Speed (Note 2)
Unit
tReady
RESET# Pin Low (During Embedded Algorithms)
to Read Mode (See Note)
Max
20
ns
tReady
RESET# Pin Low (NOT During Embedded
Algorithms) to Read Mode (See Note)
Max
500
ns
tRP
RESET# Pulse Width
Min
500
ns
tRH
Reset High Time Before Read (See Note)
Min
50
ns
tRPD
RESET# Low to Standby Mode
Min
20
µs
tRB
RY/BY# Recovery Time
Min
0
ns
Notes:
1. Not 100% tested. If ramp rate is equal to or faster than 1V/100µs with a falling edge of the RESET# pin initiated, the
RESET# pin needs to be held low only for 100µs for power-up.
2. Next generation devices may have different reset speeds.
RY/BY#
CE#, OE#
tRH
RESET#
tRP
tReady
Reset Timings NOT during Embedded Algorithms
Reset Timings during Embedded Algorithms
tReady
RY/BY#
tRB
CE#, OE#
RESET#
tRP
tRH
Figure 13.
December 15, 2004 S29GLxxxN_MCP_A1
Reset Timings
S29GLxxxN MirrorBitTM Flash Family
155
A d v a n c e
I n f o r m a t i o n
AC Characteristics
Erase and Program Operations–S29GL128N, S29GL256N, S29GL512N
Parameter
Speed Options
JEDEC
Std.
Description
tAVAV
tWC
Write Cycle Time (Note 1)
Min
tAVWL
tAS
Address Setup Time
Min
0
ns
tASO
Address Setup Time to OE# low during toggle
bit polling
Min
15
ns
tAH
Address Hold Time
Min
45
ns
tAHT
Address Hold Time From CE# or OE# high
during toggle bit polling
Min
0
ns
tDVWH
tDS
Data Setup Time
Min
45
ns
tWHDX
tDH
Data Hold Time
Min
0
ns
tCEPH
CE# High during toggle bit polling
Min
20
tOEPH
Output Enable High during toggle bit polling
Min
20
ns
tGHWL
tGHWL
Read Recovery Time Before Write
(OE# High to WE# Low)
Min
0
ns
tELWL
tCS
CE# Setup Time
Min
0
ns
tWHEH
tCH
CE# Hold Time
Min
0
ns
tWLWH
tWP
Write Pulse Width
Min
35
ns
tWHDL
tWPH
Write Pulse Width High
Min
30
ns
Write Buffer Program Operation (Notes 2, 3)
Typ
240
µs
Effective Write Buffer Program
Operation (Notes 2, 4)
Per Word
Typ
15
µs
Accelerated Effective Write Buffer
Program Operation (Notes 2, 4)
Per Word
Typ
13.5
µs
Program Operation (Note 2)
Word
Typ
60
µs
Accelerated Programming
Operation (Note 2)
Word
Typ
54
µs
Typ
0.5
sec
tWLAX
tWHWH1 tWHWH1
tWHWH2 tWHWH2 Sector Erase Operation (Note 2)
90
100
110
110
Unit
90
100
110
110
ns
tVHH
VHH Rise and Fall Time (Note 1)
Min
250
ns
tVCS
VCC Setup Time (Note 1)
Min
50
µs
tBUSY
Erase/Program Valid to RY/BY# Delay
Min
90
ns
Notes:
1. Not 100% tested.
2. See the “Erase and Programming Performance” section for more information.
3. For 1–16 words/1–32 bytes programmed.
4. Effective write buffer specification is based upon a 16-word/32-byte write buffer operation.
5. Unless otherwise indicated, AC specifications for 90 ns, 100 ns, and 110 ns speed options are tested with VIO = VCC
= 3 V. AC specifications for 110 ns speed options are tested with VIO = 1.8 V and VCC = 3.0 V.
156
S29GLxxxN MirrorBitTM Flash Family
S29GLxxxN_MCP_A1 December 15, 2004
A d v a n c e
I n f o r m a t i o n
AC Characteristics
Program Command Sequence (last two cycles)
tAS
tWC
Addresses
Read Status Data (last two cycles)
555h
PA
PA
PA
tAH
CE#
tCH
OE#
tWHWH1
tWP
WE#
tWPH
tCS
tDS
tDH
PD
A0h
Data
Status
tBUSY
DOUT
tRB
RY/BY#
VCC
tVCS
Notes:
1. PA = program address, PD = program data, DOUT is the true data at the program address.
2. Illustration shows device in word mode.
Figure 14.
Program Operation Timings
VHH
ACC
VIL or VIH
VIL or VIH
tVHH
tVHH
Figure 15.
Accelerated Program Timing Diagram
Notes:
1. Not 100% tested.
2. CE#, OE# = VIL
3. OE# = VIL
4. See Figure 9 and Table 14 for test specifications.
December 15, 2004 S29GLxxxN_MCP_A1
S29GLxxxN MirrorBitTM Flash Family
157
A d v a n c e
I n f o r m a t i o n
AC Characteristics
Erase Command Sequence (last two cycles)
tAS
tWC
2AAh
Addresses
Read Status Data
VA
SA
VA
555h for chip erase
tAH
CE#
tCH
OE#
tWP
WE#
tWPH
tCS
tWHWH2
tDS
tDH
Data
55h
In
Progress
30h
Complete
10 for Chip Erase
tBUSY
tRB
RY/BY#
tVCS
VCC
Notes:
1. SA = sector address (for Sector Erase), VA = Valid Address for reading status data (see “Write Operation Status”.
2. These waveforms are for the word mode.
Figure 16.
158
Chip/Sector Erase Operation Timings
S29GLxxxN MirrorBitTM Flash Family
S29GLxxxN_MCP_A1 December 15, 2004
A d v a n c e
I n f o r m a t i o n
AC Characteristics
tRC
Addresses
VA
VA
VA
tACC
tCE
CE#
tCH
tOE
OE#
tOEH
tDF
WE#
tOH
High Z
DQ7
Complement
Complement
Status Data
Status Data
True
Valid Data
High Z
DQ6–DQ0
True
Valid Data
tBUSY
RY/BY#
Note:
1. VA = Valid address. Illustration shows first status cycle after command sequence, last status read cycle, and array data read
cycle.
2. tOE for data polling is 45 ns when VIO = 1.65 to 2.7 V and is 35 ns when VIO = 2.7 to 3.6 V
Figure 17. Data# Polling Timings (During Embedded Algorithms)
December 15, 2004 S29GLxxxN_MCP_A1
S29GLxxxN MirrorBitTM Flash Family
159
A d v a n c e
I n f o r m a t i o n
AC Characteristics
tAHT
tAS
Addresses
tAHT
tASO
CE#
tCEPH
tOEH
WE#
tOEPH
OE#
tDH
DQ2 and DQ6
tOE
Valid Data
Valid
Status
Valid
Status
Valid
Status
(first read)
(second read)
(stops toggling)
Valid Data
RY/BY#
Note: VA = Valid address; not required for DQ6. Illustration shows first two status cycle after command
sequence, last status read cycle, and array data read cycle
Figure 18. Toggle Bit Timings (During Embedded Algorithms)
Enter
Embedded
Erasing
WE#
Erase
Suspend
Erase
Enter Erase
Suspend Program
Erase Suspend
Read
Erase
Resume
Erase
Erase Suspend
Suspend
Read
Program
Erase
Erase
Complete
DQ6
DQ2
Note: DQ2 toggles only when read at an address within an erase-suspended sector. The system may use OE#
or CE# to toggle DQ2 and DQ6.
Figure 19.
160
DQ2 vs. DQ6
S29GLxxxN MirrorBitTM Flash Family
S29GLxxxN_MCP_A1 December 15, 2004
A d v a n c e
I n f o r m a t i o n
AC Characteristics
Alternate CE# Controlled Erase and Program OperationsS29GL128N, S29GL256N, S29GL512N
Parameter
Speed Options
JEDEC
Std.
Description
tAVAV
tWC
Write Cycle Time (Note 1)
Min
tAVWL
tAS
Address Setup Time
Min
0
ns
Min
15
ns
Min
45
ns
Min
0
ns
TASO
tELAX
tAH
tAHT
Address Setup Time to OE# low during
toggle bit polling
Address Hold Time
Address Hold Time From CE# or OE# high
during toggle bit polling
90
100
110
110
Unit
90
100
110
110
ns
tDVEH
tDS
Data Setup Time
Min
45
ns
tEHDX
tDH
Data Hold Time
Min
0
ns
tCEPH
CE# High during toggle bit polling
Min
20
ns
tOEPH
OE# High during toggle bit polling
Min
20
ns
tGHEL
tGHEL
Read Recovery Time Before Write
(OE# High to WE# Low)
Min
0
ns
tWLEL
tWS
WE# Setup Time
Min
0
ns
tEHWH
tWH
WE# Hold Time
Min
0
ns
tELEH
tCP
CE# Pulse Width
Min
35
ns
tEHEL
tCPH
CE# Pulse Width High
Min
30
ns
Write Buffer Program Operation (Notes 2,
3)
Typ
240
µs
Effective Write Buffer
Program Operation (Notes
2, 4)
Per Word
Typ
15
µs
tWHWH1 tWHWH1 Effective Accelerated Write
Buffer Program Operation
(Notes 2, 4)
Per Word
Typ
13.5
µs
Program Operation (Note 2)
Word
Typ
60
µs
Accelerated Programming
Operation (Note 2)
Word
Typ
54
µs
Typ
0.5
sec
tWHWH2 tWHWH2 Sector Erase Operation (Note 2)
Notes:
1. Not 100% tested.
2. See the “AC Characteristics” section for more information.
3. For 1–16 words/1–32 bytes programmed.
4. Effective write buffer specification is based upon a 16-word/32-byte write buffer operation.
5. Unless otherwise indicated, AC specifications for 90 ns, 100ns, and 110 ns speed options are tested with VIO = VCC
= 3 V. AC specifications for 110 ns speed options are tested with VIO = 1.8 V and VCC = 3.0 V.
December 15, 2004 S29GLxxxN_MCP_A1
S29GLxxxN MirrorBitTM Flash Family
161
A d v a n c e
I n f o r m a t i o n
AC Characteristics
555 for program
2AA for erase
PA for program
SA for sector erase
555 for chip erase
Data# Polling
Addresses
PA
tWC
tAS
tAH
tWH
WE#
tGHEL
OE#
tCP
CE#
tWS
tWHWH1 or 2
tCPH
tBUSY
tDS
tDH
DQ7#
Data
tRH
A0 for program
55 for erase
DOUT
PD for program
30 for sector erase
10 for chip erase
RESET#
RY/BY#
Notes:
1. Figure indicates last two bus cycles of a program or erase operation.
2. PA = program address, SA = sector address, PD = program data.
3. DQ7# is the complement of the data written to the device. DOUT is the data written to the device.
4. Waveforms are for the word mode.
Figure 20. Alternate CE# Controlled Write (Erase/Program) Operation Timings
162
S29GLxxxN MirrorBitTM Flash Family
S29GLxxxN_MCP_A1 December 15, 2004
A d v a n c e
I n f o r m a t i o n
Erase And Programming Performance
Typ
(Note 1)
Max
(Note 2)
Unit
0.5
3.5
sec
S29GL128N
64
256
S29GL256N
128
512
S29GL512N
256
1024
Parameter
Sector Erase Time
Chip Erase Time
240
µs
Total Accelerated Effective
Write Buffer Programming
Time (Note 3)
200
µs
Chip Program Time
123
S29GL256N
246
S29GL512N
492
Excludes 00h
programming prior to
erasure (Note 5)
sec
Total Write Buffer
Programming Time
(Note 3)
S29GL128N
Comments
Excludes system level
overhead (Note 6)
sec
Notes:
1. Typical program and erase times assume the following conditions: 25°C, 3.0 V VCC, 10,000 cycles, checkerboard
pattern.
2. Under worst case conditions of 90°C, VCC = 3.0 V, 100,000 cycles.
3. Effective write buffer specification is based upon a 16-word write buffer operation.
4. The typical chip programming time is considerably less than the maximum chip programming time listed, since most
words program faster than the maximum program times listed.
5. In the pre-programming step of the Embedded Erase algorithm, all bits are programmed to 00h before erasure.
6. System-level overhead is the time required to execute the two- or four-bus-cycle sequence for the program
command. See Table 12 for further information on command definitions.
TSOP Pin and BGA Package Capacitance
Parameter Symbol
Parameter Description
Test Setup
CIN
Input Capacitance
VIN = 0
COUT
Output Capacitance
VOUT = 0
CIN2
Control Pin Capacitance
VIN = 0
Typ
Max
Unit
TSOP
6
7.5
pF
BGA
4.2
5.0
pF
TSOP
8.5
12
pF
BGA
5.4
6.5
pF
TSOP
7.5
9
pF
BGA
3.9
4.7
pF
Notes:
1. Sampled, not 100% tested.
2. Test conditions TA = 25°C, f = 1.0 MHz.
December 15, 2004 S29GLxxxN_MCP_A1
S29GLxxxN MirrorBitTM Flash Family
163
A d v a n c e
I n f o r m a t i o n
pSRAM Type 2
16Mb (1Mb Word x 16-bit)
32Mb (2Mb Word x 16-bit)
64Mb (4Mb Word x 16-bit)
Features
„ Process Technology: CMOS
„ Organization: x16 bit
„ Power Supply Voltage: 2.7~3.1V
„ Three State Outputs
„ Compatible with Low Power SRAM
Product Information
Density
VCC Range
Standby
(ISB1, Max.)
Operating
(ICC2, Max.)
Mode
16Mb
2.7-3.1V
80 µA
30 mA
Dual CS
16Mb
2.7-3.1V
80 µA
35 mA
Dual CS and Page Mode
32Mb
2.7-3.1V
100 µA
35 mA
Dual CS
32Mb
2.7-3.1V
100 µA
40 mA
Dual CS and Page Mode
64Mb
2.7-3.1V
TBD
TBD
Dual CS
64Mb
2.7-3.1V
TBD
TBD
Dual CS and Page Mode
Pin Description
Pin Name
CS1#, CS2
I/O
Chip Select
I
OE#
Output Enable
I
WE#
Write Enable
I
Lower/Upper Byte Enable
I
Address Inputs
I
LB#, UB#
A0-A19 (16M)
A0-A20 (32M)
A0-A21 (64M)
I/O0-I/O15
Data Inputs/Outputs
I/O
VCC/VCCQ
Power Supply
—
VSS/VSSQ
Ground
—
Not Connection
—
Do Not Use
—
NC
DNU
164
Description
pSRAM Type 2
pSRAM_Type02_15A0 May 3, 2004
A d v a n c e
I n f o r m a t i o n
Power Up Sequence
1.
Apply power.
2.
Maintain stable power (VCC min.=2.7V) for a minimum 200 µs with
CS1#=high or CS2=low.
May 3, 2004 pSRAM_Type02_15A0
pSRAM Type 2
165
A d v a n c e
I n f o r m a t i o n
Timing Diagrams
Power Up
Min.200 µs
~
~
VCC(Min)
~
~
VCC
~
~~
~
CS1#
CS2
Power Up Mode
Normal Operation
Figure 21. Power Up 1 (CS1# Controlled)
Notes:
1. After VCC reaches VCC(Min.), wait 200 µs with CS1# high. Then the device gets into the normal operation.
Min. 200µs
~
~
VCC(Min)
~
~~
~
VCC
CS1#
~
~
CS2
Power Up Mode
Normal Operation
Figure 22. Power Up 2 (CS2 Controlled)
Notes:
1. After VCC reaches VCC(Min.), wait 200 µs with CS2 low. Then the device gets into the normal operation.
Functional Description
Mode
CS1#
CS2
OE#
WE#
LB#
UB#
I/O1-8
I/O9-16
Power
Deselected
H
X
X
X
X
X
High-Z
High-Z
Standby
Deselected
X
L
X
X
X
X
High-Z
High-Z
Standby
Deselected
X
X
X
X
H
H
High-Z
High-Z
Standby
Output Disabled
L
H
H
H
L
X
High-Z
High-Z
Active
Outputs Disabled
L
H
H
H
X
L
High-Z
High-Z
Active
Lower Byte Read
L
H
L
H
L
H
DOUT
High-Z
Active
Upper Byte Read
L
H
L
H
H
L
High-Z
DOUT
Active
Word Read
L
H
L
H
L
L
DOUT
DOUT
Active
Lower Byte Write
L
H
X
L
L
H
DIN
High-Z
Active
Upper Byte Write
L
H
X
L
H
L
High-Z
DIN
Active
Word Write
L
H
X
L
L
L
DIN
DIN
Active
Legend:X = Don’t care (must be low or high state).
166
pSRAM Type 2
pSRAM_Type02_15A0 May 3, 2004
A d v a n c e
I n f o r m a t i o n
Absolute Maximum Ratings
Item
Symbol
Ratings
Unit
VIN , VOUT
-0.2 to VCC+0.3V
V
Voltage on VCC supply relative to VSS
VCC
-0.2 to 3.6V
V
Power Dissipation
PD
1.0
W
Operating Temperature
TA
-40 to 85
°C
Voltage on any pin relative to VSS
Notes:
1. Stresses greater than those listed under "Absolute Maximum Ratings" section may cause permanent damage to the device.
Functional operation should be restricted to be used under recommended operating condition. Exposure to absolute
maximum rating conditions longer than 1 second may affect reliability.
DC Recommended Operating Conditions
Symbol
Parameter
Min
Typ
Max
Unit
VCC
Power Supply Voltage
2.7
2.9
3.1
VSS
Ground
0
0
0
VIH
Input High Voltage
2.2
—
VCC + 0.3 (Note 2)
VIL
Input Low Voltage
-0.2 (Note 3)
—
0.6
V
Notes:
1. TA=-40 to 85°C, otherwise specified.
2. Overshoot: VCC+1.0V in case of pulse width ≤ 20ns.
3. Undershoot: -1.0V in case of pulse width ≤ 20ns.
4. Overshoot and undershoot are sampled, not 100% tested.
Capacitance (Ta = 25°C, f = 1 MHz)
Symbol
Parameter
Test Condition
Min
Max
Unit
CIN
Input Capacitance
VIN = 0V
—
8
pF
COIO
Input/Output Capacitance
VOUT = 0V
—
10
pF
Note: This parameter is sampled periodically and is not 100% tested.
DC and Operating Characteristics
Common
Item
Symbol
Test Conditions
Min
Typ
Max
Unit
Input Leakage Current
ILI
VIN=VSS to VCC
-1
—
1
µA
Output Leakage Current
ILO
CS1#=VIH or CS2=VIL or OE#=VIH or WE#=VIL or
LB#=UB#=VIH, VIO=VSS to VCC
-1
—
1
µA
Output Low Voltage
VOL
IOL=2.1mA
—
—
0.4
V
Output High Voltage
VOH
IOH=-1.0mA
2.4
—
—
V
May 3, 2004 pSRAM_Type02_15A0
pSRAM Type 2
167
A d v a n c e
I n f o r m a t i o n
16M pSRAM
Item
Symbol
—
—
7
mA
Async
Cycle time=Min, IIO=0mA, 100% duty,
CS1#=VIL, CS2=VIH LB#=VIL and/or UB#=VIL,
VIN=VIH or VIL
—
—
30
mA
Page
Cycle time=tRC+3tPC, IIO=0mA, 100% duty,
CS1#=VIL, CS2=VIH LB#=VIL and/or UB#=VIL,
VIN-VIH or VIL
35
mA
80
mA
ICC2
Standby Current (CMOS)
Min Typ Max Unit
Cycle time=1µs, 100% duty, IIO=0mA,
CS1#≤0.2V, LB#≤0.2V and/or UB#≤0.2V,
CS2≥VCC-0.2V, VIN≤0.2V or VIN≥VCC-0.2V
ICC1
Average Operating
Current
Test Conditions
ISB1 (Note 1)
Other inputs=0-VCC
1. CS1# ≥ VCC - 0.2, CS2 ≥ VCC - 0.2V (CS1#
controlled) or
—
—
2. 0V ≤ CS2 ≤ 0.2V (CS2 controlled)
Notes:
1. Standby mode is supposed to be set up after at least one active operation after power up. ISB1 is measure after 60ms from
the time when standby mode is set up.
32M pSRAM
Item
Symbol
—
—
7
mA
Async
Cycle time=Min, IIO=0mA, 100% duty,
CS1#=VIL, CS2=VIH LB#=VIL and/or UB#=VIL,
VIN=VIH or VIL
—
—
35
mA
Page
Cycle time=tRC+3tPC, IIO=0mA, 100% duty,
CS1#=VIL, CS2=VIH LB#=VIL and/or UB#=VIL,
VIN-VIH or VIL
40
mA
ICC2
Standby Current (CMOS)
Min Typ Max Unit
Cycle time=1µs, 100% duty, IIO=0mA,
CS1#≤0.2V, LB#≤0.2V and/or UB#≤0.2V,
CS2≥VCC-0.2V, VIN≤0.2V or VIN≥VCC-0.2V
ICC1
Average Operating
Current
Test Conditions
ISB1 (Note 1)
Other inputs=0-VCC
1. CS1# ≥ VCC - 0.2, CS2 ≥ VCC - 0.2V (CS1#
controlled) or
—
—
100 mA
2. 0V ≤ CS2 ≤ 0.2V (CS2 controlled)
Notes:
1. Standby mode is supposed to be set up after at least one active operation after power up. ISB1 is measure after 60ms from
the time when standby mode is set up.
168
pSRAM Type 2
pSRAM_Type02_15A0 May 3, 2004
A d v a n c e
I n f o r m a t i o n
64M pSRAM
Item
Symbol
Test Conditions
Cycle time=1µs, 100% duty, IIO=0mA,
CS1#≤0.2V, LB#≤0.2V and/or UB#≤0.2V,
CS2≥VCC-0.2V, VIN≤0.2V or VIN≥VCC-0.2V
—
—
TBD
mA
Async
Cycle time=Min, IIO=0mA, 100% duty,
CS1#=VIL, CS2=VIH LB#=VIL and/or UB#=VIL,
VIN=VIH or VIL
—
—
TBD
mA
Page
Cycle time=tRC+3tPC, IIO=0mA, 100% duty,
CS1#=VIL, CS2=VIH LB#=VIL and/or UB#=VIL,
VIN-VIH or VIL
TBD
mA
TBD
mA
ICC1
Average Operating
Current
ICC2
Standby Current (CMOS)
Min Typ Max Unit
Other inputs=0-VCC
1. CS1# ≥ VCC - 0.2, CS2 ≥ VCC - 0.2V (CS1#
controlled) or
ISB1 (Note 1)
—
—
2. 0V ≤ CS2 ≤ 0.2V (CS2 controlled)
Notes:
1. Standby mode is supposed to be set up after at least one active operation after power up. ISB1 is measure after 60ms from
the time when standby mode is set up.
AC Operating Conditions
Test Conditions (Test Load and Test Input/Output Reference)
„ Input pulse level: 0.4 to 2.2V
„ Input rising and falling time: 5ns
„ Input and output reference voltage: 1.5V
„ Output load (See Figure 23): CL=50pF
Dout
CL
Figure 23. Output Load
Note: Including scope and jig capacitance.
May 3, 2004 pSRAM_Type02_15A0
pSRAM Type 2
169
A d v a n c e
I n f o r m a t i o n
ACC Characteristics (Ta = -40°C to 85°C, VCC = 2.7 to 3.1 V)
Speed Bins
70ns
Write
Read
Symbol
Parameter
Min
Max
Unit
tRC
Read Cycle Time
70
—
ns
tAA
Address Access Time
—
70
ns
tCO
Chip Select to Output
—
70
ns
tOE
Output Enable to Valid Output
—
35
ns
tBA
UB#, LB# Access Time
—
70
ns
tLZ
Chip Select to Low-Z Output
10
—
ns
tBLZ
UB#, LB# Enable to Low-Z Output
10
—
ns
tOLZ
Output Enable to Low-Z Output
5
—
ns
tHZ
Chip Disable to High-Z Output
0
25
ns
tBHZ
UB#, LB# Disable to High-Z Output
0
25
ns
tOHZ
Output Disable to High-Z Output
0
25
ns
tOH
Output Hold from Address Change
5
—
ns
tPC
Page Cycle Time
25
—
ns
tPA
Page Access Time
—
20
ns
tWC
Write Cycle Time
70
—
ns
tCW
Chip Select to End of Write
60
—
ns
tAS
Address Set-up Time
0
—
ns
tAW
Address Valid to End of Write
60
—
ns
tBW
UB#, LB# Valid to End of Write
60
—
ns
tWP
Write Pulse Width
55 (Note 1)
—
ns
tWR
Write Recovery Time
0
—
ns
tWHZ
Write to Output High-Z
0
25
ns
tDW
Data to Write Time Overlap
30
—
ns
tDH
Data Hold from Write Time
0
—
ns
tOW
End Write to Output Low-Z
5
—
ns
Notes:
1. tWP (min)=70ns for continuous write operation over 50 times.
170
pSRAM Type 2
pSRAM_Type02_15A0 May 3, 2004
A d v a n c e
I n f o r m a t i o n
Timing Diagrams
Read Timings
tRC
Address
tAA
tOH
Data Out
Data Valid
Previous Data Valid
Figure 24. Timing Waveform of Read Cycle(1)
Notes:
1. Address Controlled, CS1#=OE#=VIL, CS2=WE#=VIH, UB# and/or LB#=VIL.
tRC
Address
tOH
tAA
tCO
CS1#
CS2
tHZ
tBA
UB#, LB#
tBHZ
tOE
OE#
Data out
tOLZ
tBLZ
tLZ
High-Z
tOHZ
Data Valid
Figure 25. Timing Waveform of Read Cycle(2)
Notes:
1. WE#=VIH.
Address
1)
A1~A0
Valid
Address
Valid
Address
Valid
Address
tAA
Valid
Address
Valid
Address
tPC
CS1#
CS2
tCO
OE#
DQ15~DQ0
High Z
tOE
tPA
Data
Valid
tOHZ
Data
Valid
Data
Valid
Data
Valid
Figure 26. Timing Waveform of Read Cycle(2)
Notes:
May 3, 2004 pSRAM_Type02_15A0
pSRAM Type 2
171
A d v a n c e
I n f o r m a t i o n
1. 16Mb: A2 ~ A19, 32Mb: A2 ~ A20, 64Mb: A2 ~ A21.
tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit conditions and are not
referenced to output voltage levels.
At any given temperature and voltage condition, tHZ(Max.) is less than tLZ(Min.) both for a given device
and from device to device interconnection.
tOE(max) is met only when OE# becomes enabled after tAA(max).
If invalid address signals shorter than min. T.RC are continuously repeated for over 4µs, the device needs
a normal read timing (tRC) or needs to sustain standby state for min. tRC at least once in every 4µs.
Write Timings
tWC
Address
tCW
tWR
CS1#
CS2
tAW
tBW
UB#, LB#
tWP
WE#
tAS
Data in
tDW
High-Z
tDH
High-Z
Data Valid
tWHZ
Data out
tOW
Data Undefined
Figure 27. Write Cycle #1 (WE# Controlled)
tWC
Address
tAS
tWR
tCW
CS1#
tAW
CS2
tBW
UB#, LB#
tWP
WE#
tDW
Data Valid
Data in
Data out
tDH
High-Z
Figure 28. Write Cycle #2 (CS1# Controlled)
172
pSRAM Type 2
pSRAM_Type02_15A0 May 3, 2004
A d v a n c e
I n f o r m a t i o n
tWC
Address
tAS
tWR
tCW
CS1#
tAW
CS2
tBW
UB#, LB#
tWP(1)
WE#
tDW
tDH
Data Valid
Data in
Data out
High-Z
Figure 29. Timing Waveform of Write Cycle(3)(CS2 Controlled)
tWC
Address
tWR
tCW
CS1#
tAW
CS2
tBW
UB#, LB#
tAS
tWP
WE#
tDW
tDH
Data Valid
Data in
Data out
High-Z
Figure 30. Timing Waveform of Write Cycle(4) (UB#, LB# Controlled)
Notes:
1. A write occurs during the overlap (tWP) of low CS1# and low WE#. A write begins when CS1# goes low and WE# goes low
with asserting UB# or LB# for single byte operation or simultaneously asserting UB# and LB# for double byte operation. A
write ends at the earliest transition when CS1# goes high and WE# goes high. The tWP is measured from the beginning of
write to the end of write.
2. tCW is measured from the CS1# going low to the end of write.
3. tAS is measured from the address valid to the beginning of write.
4. tWR is measured from the end of write to the address change. tWR is applied in case a write ends with CS1# or WE# going
high.
May 3, 2004 pSRAM_Type02_15A0
pSRAM Type 2
173
P r e l i m i n a r y
pSRAM Type 6
2M Word by 16-bit Cmos Pseudo Static RAM (32M Density)
4M Word by 16-bit Cmos Pseudo Static RAM (64M Density)
Features
„ Single power supply voltage of 2.6 to 3.3 V
„ Direct TTL compatibility for all inputs and outputs
„ Deep power-down mode: Memory cell data invalid
„ Page operation mode:
— Page read operation by 8 words
„ Logic compatible with SRAM R/W ( ) pin
„ Standby current
— Standby = 70 µA (32M)
— Standby = 100 µA (64M)
— Deep power-down Standby = 5 µA
„ Access Times
32M
64M
Access Time
70 ns
CE1# Access Time
70 ns
OE# Access Time
25 ns
Page Access Time
30 ns
Pin Description
Pin Name
Description
A0 to A21
Address Inputs
A0 to A2
Page Address Inputs
I/O1 to I/O16
Data Inputs/Outputs
CE1#
Chip Enable Input
CE2
Chip select Input
WE#
Write Enable Input
OE#
Output Enable Input
LB#,UB#
Data Byte Control Inputs
VDD
Power Supply
GND
Ground
NC
Ocotober 16, 2004 pSRAM_Type06_14_A1
Not Connection
pSRAM Type 6
174
P r e l i m i n a r y
Functional Description
Mode
CE1#
CE2
OE#
WE#
LB#
UB#
Address
I/O1-8
I/O9-16
Power
Read(Word)
L
H
L
H
L
L
X
DOUT
DOUT
IDDO
Read(Lower Byte)
L
H
L
H
L
H
X
DOUT
High-Z
IDDO
Read(Upper Byte)
L
H
L
H
H
L
X
High-Z
DOUT
IDDO
Write(Word)
L
H
X
L
L
L
X
DIN
DIN
IDDO
Write(Lower Byte)
L
H
X
L
L
H
X
DIN
Invalid
IDDO
Write(Upper Byte)
L
H
X
L
H
L
X
Invalid
DIN
IDDO
Outputs Disabled
L
H
H
H
X
X
X
High-Z
High-Z
IDDO
Standby
H
H
X
X
X
X
X
High-Z
High-Z
IDDO
Deep Power-down Standby
H
L
X
X
X
X
X
High-Z
High-Z
IDDSD
Legend:L = Low-level Input (VIL), H = High-level Input (VIH), X = VIL or VIH, High-Z = High Impedence.
Absolute Maximum Ratings
Symbol
Rating
Value
Unit
VDD
Power Supply Voltage
-1.0 to 3.6
V
VIN
Input Voltage
-1.0 to 3.6
V
VOUT
Output Voltage
-1.0 to 3.6
V
Topr
Operating Temperature
-40 to 85
°C
Tstrg
Storage Temperature
-55 to 150
°C
PD
Power Dissipation
0.6
W
IOUT
Short Circuit Output Current
50
mA
Note: ESD Immunity: Spansion Flash memory Multi-Chip Products (MCPs) may contain component devices that are
developed by Spansion and component devices that are developed by a third party (third-party components). Spansion
components are tested and guaranteed to the ESD immunity levels listed in the corresponding Spansion Flash memory
Qualification Database. Third-party components are neither tested nor guaranteed by Spansion for ESD immunity. However, ESD test results for third-party components may be available from the component manufacturer. Component manufacturer contact information is listed in the Spansion MCP Qualification Report, when available. The Spansion Flash
memory Qualification Database and Spansion MCP Qualification Report are available from AMD and Fujitsu sales offices.
DC Recommended Operating Conditions (Ta = -40°C to 85°C)
Symbol
Parameter
Min
Typ
Max
VDD
Power Supply Voltage
2.6
2.75
3.3
VIH
Input High Voltage
2.0
—
VDD + 0.3 (Note)
VIL
Input Low Voltage
-0.3 (Note)
—
0.4
Unit
V
Note: VIH (Max) VDD = 1.0 V with 10 ns pulse width. VIL (Min) -1.0 V with 10 ns pulse width.
Ocotober 16, 2004 pSRAM_Type06_14_A1
pSRAM Type 6
175
P r e l i m i n a r y
DC Characteristics (Ta = -40°C to 85°C, VDD = 2.6 to 3.3 V) (See Note 3 to 4)
Symbol
Parameter
Test Condition
Min
Typ.
Max
Unit
IIL
Input Leakage
Current
VIN = 0 V to VDD
-1.0
—
+1.0
µA
ILO
Output Leakage
Current
Output disable, VOUT = 0 V to VDD
-1.0
—
+1.0
µA
VOH
Output High Voltage
IOH = - 0.5 mA
2.0
¾
V
V
VOL
Output Low Voltage
IOL = 1.0 mA
—
—
0.4
V
IDDO1
Operating Current
CE1#= VIL, CE2 = VIH, IOUT = 0
mA, tRC = min
ET5UZ8A-43DS
—
—
40
ET5VB5A-43DS
—
—
50
IDDO2
Page Access
Operating Current
CE1#= VIL, CE2 = VIH, IOUT = 0 mA
Page add. cycling, tRC = min
—
—
25
mA
IDDS
Standby
Current(MOS)
CE1# = VDD - 0.2 V,
CE2 = VDD - 0.2 V
ET5UZ8A-43DS
—
—
70
mA
ET5VB5A-43DS
—
—
100
µA
IDDSD
Deep Power-down
Standby Current
CE2 = 0.2 V
—
—
5
µA
mA
Capacitance (Ta = 25°C, f = 1 MHz)
Symbol
Parameter
Test Condition
Max
Unit
CIN
Input Capacitance
VIN = GND
10
pF
COUT
Output Capacitance
VOUT = GND
10
pF
Note: This parameter is sampled periodically and is not 100% tested.
AC Characteristics and Operating Conditions
(Ta = -40°C to 85°C, VDD = 2.6 to 3.3 V) (See Note 5 to 11)
Symbol
Parameter
Min
Max
Unit
tRC
Read Cycle Time
70
10000
ns
tACC
Address Access Time
—
70
ns
tCO
Chip Enable (CE1#) Access Time
—
70
ns
tOE
Output Enable Access Time
—
25
ns
tBA
Data Byte Control Access Time
—
25
ns
tCOE
Chip Enable Low to Output Active
10
—
ns
tOEE
Output Enable Low to Output Active
0
—
ns
tBE
Data Byte Control Low to Output Active
0
—
ns
tOD
Chip Enable High to Output High-Z
—
20
ns
tODO
Output Enable High to Output High-Z
—
20
ns
tBD
Data Byte Control High to Output High-Z
—
20
ns
Ocotober 16, 2004 pSRAM_Type06_14_A1
pSRAM Type 6
176
P r e l i m i n a r y
Symbol
Parameter
Min
Max
Unit
tOH
Output Data Hold Time
10
—
ns
tPM
Page Mode Time
70
10000
ns
tPC
Page Mode Cycle Time
30
—
ns
tAA
Page Mode Address Access Time
—
30
ns
tAOH
Page Mode Output Data Hold Time
10
—
ns
tWC
Write Cycle Time
70
10000
ns
tWP
Write Pulse Width
50
—
ns
tCW
Chip Enable to End of Write
70
—
ns
tBW
Data Byte Control to End of Write
60
—
ns
tAW
Address Valid to End of Write
60
—
ns
tAS
Address Set-up Time
0
—
ns
tWR
Write Recovery Time
0
—
ns
tCEH
Chip Enable High Pulse Width
10
—
ns
tWEH
Write Enable High Pulse Width
6
—
ns
20
ns
tODW
WE# Low to Output High-Z
—
tOEW
WE# High to Output Active
0
ns
tDS
Data Set-up Time
30
—
ns
tDH
Data Hold Time
0
—
ns
tCS
CE2 Set-up Time
0
—
ns
tCH
CE2 Hold Time
300
—
µs
tDPD
CE2 Pulse Width
10
—
ms
tCHC
CE2 Hold from CE1#
0
—
ns
tCHP
CE2 Hold from Power On
30
—
µs
AC Test Conditions
Parameter
Output load
Input pulse level
Condition
30 pF + 1 TTL Gate
VDD - 0.2 V, 0.2 V
Timing measurements
VDD x 0.5
Reference level
VDD x 0.5
tR, tF
Ocotober 16, 2004 pSRAM_Type06_14_A1
5 ns
pSRAM Type 6
177
P r e l i m i n a r y
Timing Diagrams
Read Timings
tRC
Address
A0 toA20(32M)
A0 to A21(64M)
tACC
tOH
tCO
CE1#
Fix-H
CE2
tOE
tOD
OE#
tODO
WE#
tBA
UB#, LB#
tBE
DOUT
I/O1 to O16
I/
tBD
tOEE
Hi-Z
VALID DATA OUT
tCOE
Hi-Z
INDETERMINATE
Figure 1. Read Cycle
Ocotober 16, 2004 pSRAM_Type06_14_A1
pSRAM Type 6
178
P r e l i m i n a r y
tPM
Address
A0 toA2
tRC
tPC
tPC
tPC
Address
A3 toA20(32M)
A3 toA21(64M)
CE1#
Fix-H
CE2
OE#
WE#
UB#, LB#
tBA
DOUT
I/O1 to I/O1
6
tOE
tBE
DOUT
Hi-Z
tCOE
tCO
tACC
Figure 2.
Ocotober 16, 2004 pSRAM_Type06_14_A1
tAOH
tOEE
tAOH
DOUT
DOUT
tAA
tAOH
tAA
tOD
tBD
tOH
DOUT
Hi-Z
tAA
tODO
* Maximum words
8
Page Read Cycle (8 Words Access)
pSRAM Type 6
179
P r e l i m i n a r y
Write Timings
tWC
Address
A0 toA20(32M)
A0 toA21(64M)
tAW
tWEH
tAS
tWP
tWR
WE#
tCW
tWR
tBW
tWR
CE1#
tCH
CE2
UB#, LB#
tODW
DOUT
(See Note 10)
Hi-Z
I/O1 to I/O1
6
DIN
tOEW
tDS
(See Note )9
(See Note11)
tDH
VALID DATA IN
(See Note )9
I/O1 to I/O1
6
Figure 3. Write Cycle #1 (WE# Controlled) (See Note 8)
Ocotober 16, 2004 pSRAM_Type06_14_A1
pSRAM Type 6
180
P r e l i m i n a r y
tWC
Address
A0 toA20(32M)
A0 toA21(64M)
tAW
tAS
tWP
tWR
WE#
tCEH
tCW
tWR
CE1#
tCH
CE2
tBW
tWR
UB#, LB#
tBE
DOUT
tODW
Hi-Z
I/O1 to I/O1
6
Hi-Z
tCOE
tDS
DIN
(See Note )9
I/O1 to I/O1
6
Figure 4.
tDH
VALID DATA IN
Write Cycle #2 (CE# Controlled) (See Note 8)
Deep Power-down Timing
CE1#
tDPD
CE2
tCS
tCH
Figure 5.
Deep Power Down Timing
Power-on Timing
VDD
CE1#
VDD min
tCHC
CE2
tCH
tCHP
Figure 6. Power-on Timing
Ocotober 16, 2004 pSRAM_Type06_14_A1
pSRAM Type 6
181
P r e l i m i n a r y
Provisions of Address Skew
Read
In case multiple invalid address cycles shorter than tRC min sustain over 10 µs in
an active status, at least one valid address cycle over tRC min is required during
10µs.
over 10
ms
CE1#
WE#
Address
tRC min
Figure 7.
Read
Write
In case multiple invalid address cycles shorter than tWC min sustain over 10 µs in
an active status, at least one valid address cycle over tWC min is required during
10 µs.
CE1#
tWPmin
WE#
Address
tWCmin
Figure 8. Write
Notes:
1. Stresses greater than listed under "Absolute Maximum Ratings" section may cause permanent damage to the device.
2. All voltages are reference to GND.
3. IDDO depends on the cycle time.
4. IDDO depends on output loading. Specified values are defined with the output open condition.
5. AC measurements are assumed tR, tF = 5 ns.
6. Parameters tOD, tODO, tBD and tODW define the time at which the output goes the open condition and are not output voltage
reference levels.
7. Data cannot be retained at deep power-down stand-by mode.
8. If OE# is high during the write cycle, the outputs will remain at high impedance.
9. During the output state of I/O signals, input signals of reverse polarity must not be applied.
10. If CE1# or LB#/UB# goes LOW coincident with or after WE# goes LOW, the outputs will remain at high impedance.
11. If CE1# or LB#/UB# goes HIGH coincident with or before WE# goes HIGH, the outputs will remain at high impedance.
Ocotober 16, 2004 pSRAM_Type06_14_A1
pSRAM Type 6
182
P r e l i m i n a r y
Revision Summary
Revision A0 (November 9, 2004)
Initial Release
Revision A1 (January 6, 2005)
Global
Changed text designations from Flash to PL127J.
Pin Connection
Changed Pinout reference.
Block Diagram
Changed pin names on a couple pins.
Changed device designations from Flash to PL127J.
S29GLxxxN_MCP section
Added updated version to this section.
January 6, 2005 S75PL127J_00A0
S75PL127J MCPs
183
P r e l i m i a r y
Colophon
The products described in this document are designed, developed and manufactured as contemplated for general use, including without limitation, ordinary
industrial use, general office use, personal use, and household use, but are not designed, developed and manufactured as contemplated (1) for any use that
includes fatal risks or dangers that, unless extremely high safety is secured, could have a serious effect to the public, and could lead directly to death, personal
injury, severe physical damage or other loss (i.e., nuclear reaction control in nuclear facility, aircraft flight control, air traffic control, mass transport control,
medical life support system, missile launch control in weapon system), or (2) for any use where chance of failure is intolerable (i.e., submersible repeater and
artificial satellite). Please note that Spansion will not be liable to you and/or any third party for any claims or damages arising in connection with above-mentioned uses of the products. Any semiconductor devices have an inherent chance of failure. You must protect against injury, damage or loss from such failures
by incorporating safety design measures into your facility and equipment such as redundancy, fire protection, and prevention of over-current levels and other
abnormal operating conditions. If any products described in this document represent goods or technologies subject to certain restrictions on export under
the Foreign Exchange and Foreign Trade Law of Japan, the US Export Administration Regulations or the applicable laws of any other country, the prior authorization by the respective government entity will be required for export of those products.
Trademarks and Notice
The contents of this document are subject to change without notice. This document may contain information on a Spansion product under development by
Spansion LLC. Spansion LLC reserves the right to change or discontinue work on any product without notice. The information in this document is provided
as is without warranty or guarantee of any kind as to its accuracy, completeness, operability, fitness for particular purpose, merchantability, non-infringement
of third-party rights, or any other warranty, express, implied, or statutory. Spansion LLC assumes no liability for any damages of any kind arising out of the
use of the information in this document.
Copyright © 2005 Spansion LLC. All rights reserved. Spansion, the Spansion logo, MirrorBit, combinations thereof, and ExpressFlash are trademarks of Spansion LLC. Other company and product names used in this publication are for identification purposes only and may be trademarks of their respective companies.
184
S75PL127J MCPs
S75PL127J_00A0 January 6, 2005