Am29PDL640G Data Sheet RETIRED PRODUCT This product has been retired and is not available for designs. For new and current designs, S29PL064J supersedes Am29PDL640G and is the factory-recommended migration path. Please refer to the S29PL064J datasheet for specifications and ordering information. Availability of this document is retained for reference and historical purposes only. April 2005 The following document specifies Spansion memory products that are now offered by both Advanced Micro Devices and Fujitsu. Although the document is marked with the name of the company that originally developed the specification, these products will be offered to customers of both AMD and Fujitsu. Continuity of Specifications There is no change to this datasheet as a result of offering the device as a Spansion product. Any changes that have been made are the result of normal datasheet improvement and are noted in the document revision summary, where supported. Future routine revisions will occur when appropriate, and changes will be noted in a revision summary. For More Information Please contact your local AMD or Fujitsu sales office for additional information about Spansion memory solutions. Publication Number 26573 Revision B Amendment +2 Issue Date December 13, 2005 THIS PAGE LEFT INTENTIONALLY BLANK. Am29PDL640G 64 Megabit (4 M x 16-Bit) CMOS 3.0 Volt-only, Simultaneous Read/Write Flash Memory with Enhanced VersatileIOTM Control This product has been retired and is not available for designs. For new and current designs, S29PL064J supersedes Am29PDL640G and is the factory-recommended migration path. Please DISTINCTIVE CHARACTERISTICS refer to the S29PL064J datasheet for specifications and ordering information. Availability of this document is retained for reference and historical purposes only. ARCHITECTURAL ADVANTAGES 64 Mbit Page Mode device — Page size of 8 words: Fast page read access from random locations within the page Single power supply operation — Full Voltage range: 2.7 to 3.1 volt read, erase, and program operations for battery-powered applications Simultaneous Read/Write Operation — Data can be continuously read from one bank while executing erase/program functions in another bank — Zero latency switching from write to read operations SOFTWARE FEATURES Software command-set compatible with JEDEC 42.4 standard — Backward compatible with Am29F and Am29LV families CFI (Common Flash Interface) complaint — Provides device-specific information to the system, allowing host software to easily reconfigure for different Flash devices Erase Suspend / Erase Resume — Suspends an erase operation to allow read or program operations in other sectors of same bank FlexBank Architecture — 4 separate banks, with up to two simultaneous operations per device — Bank A: 8 Mbit (4 Kw x 8 and 32Kw x 15) — Bank B: 24 Mbit (32 Kw x 48) — Bank C: 24 Mbit (32 Kw x 48) — Bank D: 8 Mbit (4 Kw x 8 and 32 Kw x 15) Enhanced VersatileI/OTM (VIO) Control — Output voltage generated and input voltages tolerated on all control inputs and I/Os is determined by the voltage on the VIO pin Unlock Bypass Program command — Reduces overall programming time when issuing multiple program command sequences SecSiTM (Secured Silicon) Sector region — Up to 128 words accessible through a command sequence WP#/ACC (Write Protect/Accelerate) input — At VIL, protects the first and last two 4K word sectors, regardless of sector protect/unprotect status — At VIH, allows removal of sector protection — At VHH, provides faster programming times in a factory setting Both top and bottom boot blocks in one device Manufactured on 0.17 µm process technology 20-year data retention at 125°C Minimum 1 million erase cycle guarantee per sector PERFORMANCE CHARACTERISTICS High Performance — Page access times as fast as 25 ns — Random access times as fast as 65 ns Power consumption (typical values at 10 MHz) — 25 mA active read current — 15 mA program/erase current — 0.2 µA typical standby mode current HARDWARE FEATURES Ready/Busy# pin (RY/BY#) — Provides a hardware method of detecting program or erase cycle completion Hardware reset pin (RESET#) — Hardware method to reset the device to reading array data Persistent Sector Protection — A command sector protection method to lock combinations of individual sectors and sector groups to prevent program or erase operations within that sector — Sectors can be locked and unlocked in-system at VCC level Password Sector Protection — A sophisticated sector protection method to lock combinations of individual sectors and sector groups to prevent program or erase operations within that sector using a user-defined 64-bit password Package options — 63-ball Fine-pitch BGA — 80-ball Fine-pitch BGA This Data Sheet states AMD’s current technical specifications regarding the Products described herein. This Data Sheet may be revised by subsequent versions or modifications due to changes in technical specifications. Publication# 26573 Rev: B Amendment/+2 Issue Date: December 13, 2005 Refer to AMD’s Website (www.amd.com) for the latest information. D A T A S H E E T GENERAL DESCRIPTION The Am29PDL640G is a 64 Mbit, 3.0 volt-only Page Mode and Simultaneous Read/Write Flash memory device organized as 4 Mwords. The device is offered in 63- or 80-ball Fine-pitch BGA packages. The word-wide data (x16) appears on DQ15-DQ0. This device can be programmed in-system or in standard EPROM programmers. A 12.0 V VPP is not required for write or erase operations. The device offers fast page access times of 25, 30, and 45 ns, with corresponding random access times of 65, 70, 85, and 90 ns, respectively, allowing high speed microprocessors to operate without wait states. To eliminate bus contention the device has separate chip enable (CE#), write enable (WE#) and output enable (OE#) controls. Simultaneous Read/Write Operation with Zero Latency The Simultaneous Read/Write architecture provides simultaneous operation by dividing the memory space into 4 banks, which can be considered to be four separate memory arrays as far as certain operations are concerned. The device can improve overall system performance by allowing a host system to program or erase in one bank, then immediately and simultaneously read from another bank with zero latency (with two simultaneous operations operating at any one time). This releases the system from waiting for the completion of a program or erase operation, greatly improving system performance. The device can be organized in both top and bottom sector configurations. The banks are organized as follows: Bank Sectors A 8 Mbit (4 Kw x 8 and 32 Kw x 15) B 24 Mbit (32 Kw x 48) C 24 Mbit (32 Kw x 48) D 8 Mbit (4 Kw x 8 and 32 Kw x 15) Page Mode Features The device is AC timing, input/output, and package compatible with 4 Mbit x16 page mode mask ROM. The page size is 8 words. After initial page access is accomplished, the page mode operation provides fast read access speed of random locations within that page. Standard Flash Memory Features The device requires a single 3.0 volt power supply (2.7 V to 3.1 V) for both read and write functions. Internally generated and regulated voltages are provided for the program and erase operations. 2 The device is entirely command set compatible with the JEDEC 42.4 single-power-supply Flash standard. Commands are written to the command register using standard microprocessor write timing. Register contents serve as inputs to an internal state-machine that controls the erase and programming circuitry. Write cycles also internally latch addresses and data needed for the programming and erase operations. Reading data out of the device is similar to reading from other Flash or EPROM devices. Device programming occurs by executing the program command sequence. The Unlock Bypass mode facilitates faster programming times by requiring only two write cycles to program data instead of four. Device erasure occurs by executing the erase command sequence. The host system can detect whether a program or erase operation is complete by reading the DQ7 (Data# Polling) and DQ6 (toggle) status bits. After a program or erase cycle has been completed, the device is ready to read array data or accept another command. The sector erase architecture allows memory sectors to be erased and reprogrammed without affecting the data contents of other sectors. The device is fully erased when shipped from the factory. Hardware data protection measures include a low VCC detector that automatically inhibits write operations during power transitions. The hardware sector protection feature disables both program and erase operations in any combination of sectors of memory. This can be achieved in-system or via programming equipment. The Erase Suspend/Erase Resume feature enables the user to put erase on hold for any period of time to read data from, or program data to, any sector that is not selected for erasure. True background erase can thus be achieved. If a read is needed from the SecSi Sector area (One Time Program area) after an erase suspend, then the user must use the proper command sequence to enter and exit this region. The device offers two power-saving features. When addresses have been stable for a specified amount of time, the device enters the automatic sleep mode. The system can also place the device into the standby mode. Power consumption is greatly reduced in both these modes. AMD’s Flash technology combined years of Flash memory manufacturing experience to produce the highest levels of quality, reliability and cost effectiveness. The device electrically erases all bits within a sector simultaneously via Fowler-Nordheim tunneling. The data is programmed using hot electron injection. Am29PDL640G December 13, 2005 D A T A S H E E T TABLE OF CONTENTS Product Selector Guide . . . . . . . . . . . . . . . . . . . . . 5 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 Simultaneous READ/Write Block Diagram . . . . . 6 Connection Diagrams . . . . . . . . . . . . . . . . . . . . . . 7 Pin Description. . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 Logic Symbol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 Ordering Information . . . . . . . . . . . . . . . . . . . . . . 10 Device Bus Operations . . . . . . . . . . . . . . . . . . . . 11 Table 1. Am29PDL640G Device Bus Operations ...........................11 Requirements for Reading Array Data ................................... 11 Random Read (Non-Page Read) ........................................... 11 Page Mode Read .................................................................... 11 Table 2. Page Select .......................................................................12 Simultaneous Operation ......................................................... 12 Table 3. Bank Select .......................................................................12 Writing Commands/Command Sequences ............................ 12 Accelerated Program Operation ............................................. 12 Autoselect Functions .............................................................. 12 Standby Mode ........................................................................ 12 Automatic Sleep Mode ........................................................... 13 RESET#: Hardware Reset Pin ............................................... 13 Output Disable Mode .............................................................. 13 Table 4. Am29PDL640G Sector Architecture .................................13 Table 5. Bank Address ....................................................................15 Table 6. SecSiTM Sector Addresses ...............................................15 Autoselect Mode..................................................................... 15 Table 7. Autoselect Codes (High Voltage Method) ........................16 Table 8. Am29PDL640G Boot Sector/Sector Block Addresses for Protection/Unprotection ...................................................................16 Sector Protection . . . . . . . . . . . . . . . . . . . . . . . . . 17 Persistent Sector Protection ................................................... 17 Persistent Protection Bit (PPB) ............................................... 17 Persistent Protection Bit Lock (PPB Lock) ............................. 17 Dynamic Protection Bit (DYB) ................................................ 17 Table 9. Sector Protection Schemes ...............................................18 Persistent Sector Protection Mode Locking Bit ...................... 18 Password Protection Mode ..................................................... 18 Password and Password Mode Locking Bit ........................... 19 64-bit Password ...................................................................... 19 Write Protect (WP#) ................................................................ 19 Persistent Protection Bit Lock ................................................. 19 High Voltage Sector Protection .............................................. 20 Figure 1. In-System Sector Protection/ Sector Unprotection Algorithms ...................................................... 21 Temporary Sector Unprotect .................................................. 22 Figure 2. Temporary Sector Unprotect Operation........................... 22 SecSi™ (Secured Silicon) Sector Flash Memory Region ............................................................ 22 SecSi Sector Protection Bit .................................................... 23 Figure 3. SecSi Sector Protect Verify.............................................. 23 Hardware Data Protection ...................................................... 23 Low VCC Write Inhibit ............................................................ 23 Write Pulse “Glitch” Protection ............................................... 23 Logical Inhibit .......................................................................... 23 Power-Up Write Inhibit ............................................................ 23 Common Flash Memory Interface (CFI) . . . . . . . 23 Table 10. CFI Query Identification String ............................ 25 December 13, 2005 Table 11. System Interface String................................................... 25 Table 12. Device Geometry Definition................................. 26 Table 13. Primary Vendor-Specific Extended Query........... 27 Command Definitions. . . . . . . . . . . . . . . . . . . . . . 28 Reading Array Data ................................................................ 28 Reset Command ..................................................................... 28 Autoselect Command Sequence ............................................ 28 Enter SecSi™ Sector/Exit SecSi Sector Command Sequence .............................................................. 29 Word Program Command Sequence ...................................... 29 Unlock Bypass Command Sequence ..................................... 29 Figure 4. Program Operation ......................................................... 30 Chip Erase Command Sequence ........................................... 30 Sector Erase Command Sequence ........................................ 30 Erase Suspend/Erase Resume Commands ........................... 31 Figure 5. Erase Operation.............................................................. 31 Password Program Command ................................................ 31 Password Verify Command .................................................... 32 Password Protection Mode Locking Bit Program Command .. 32 Persistent Sector Protection Mode Locking Bit Program Command ............................................................................... 32 SecSi Sector Protection Bit Program Command .................... 32 PPB Lock Bit Set Command ................................................... 32 DYB Write Command ............................................................. 32 Password Unlock Command .................................................. 33 PPB Program Command ........................................................ 33 All PPB Erase Command ........................................................ 33 DYB Write Command ............................................................. 33 PPB Lock Bit Set Command ................................................... 33 PPB Status Command ............................................................ 33 PPB Lock Bit Status Command .............................................. 33 Sector Protection Status Command ....................................... 33 Command Definitions Tables.................................................. 34 Table 14. Memory Array Command Definitions ............................. 34 Table 15. Sector Protection Command Definitions ........................ 35 Write Operation Status . . . . . . . . . . . . . . . . . . . . . 36 DQ7: Data# Polling ................................................................. 36 Figure 6. Data# Polling Algorithm .................................................. 36 RY/BY#: Ready/Busy#............................................................ 37 DQ6: Toggle Bit I .................................................................... 37 Figure 7. Toggle Bit Algorithm........................................................ 37 DQ2: Toggle Bit II ................................................................... 38 Reading Toggle Bits DQ6/DQ2 ............................................... 38 DQ5: Exceeded Timing Limits ................................................ 38 DQ3: Sector Erase Timer ....................................................... 38 Table 16. Write Operation Status ................................................... 39 Absolute Maximum Ratings. . . . . . . . . . . . . . . . . 40 Figure 8. Maximum Negative Overshoot Waveform ...................... 40 Figure 9. Maximum Positive Overshoot Waveform........................ 40 DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 41 Test Conditions. . . . . . . . . . . . . . . . . . . . . . . . . . . 42 Figure 10. Test Setup.................................................................... 42 Figure 11. Input Waveforms and Measurement Levels ................. 42 AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 43 Read-Only Operations ........................................................... 43 Figure 12. Read Operation Timings ............................................... 43 Figure 13. Page Read Operation Timings...................................... 44 Am29PDL640G 3 D A T A S H E E T Hardware Reset (RESET#) .................................................... 45 Figure 14. Reset Timings................................................................ 45 Erase and Program Operations .............................................. 46 Figure 15. Program Operation Timings........................................... 47 Figure 16. Accelerated Program Timing Diagram........................... 47 Figure 17. Chip/Sector Erase Operation Timings ........................... 48 Figure 18. Back-to-back Read/Write Cycle Timings ....................... 49 Figure 19. Data# Polling Timings (During Embedded Algorithms).. 49 Figure 20. Toggle Bit Timings (During Embedded Algorithms)....... 50 Figure 21. DQ2 vs. DQ6.................................................................. 50 Temporary Sector Unprotect .................................................. 51 Figure 22. Temporary Sector Unprotect Timing Diagram ............... 51 Figure 23. Sector/Sector Block Protect and Unprotect Timing Diagram .............................................................. 52 Figure 24. Alternate CE# Controlled Write (Erase/Program) Operation Timings.......................................................................... 54 Erase And Programming Performance. . . . . . . . 55 Latchup Characteristics . . . . . . . . . . . . . . . . . . . . 55 BGA Ball Capacitance . . . . . . . . . . . . . . . . . . . . . 55 Data Retention. . . . . . . . . . . . . . . . . . . . . . . . . . . . 55 Physical Dimensions . . . . . . . . . . . . . . . . . . . . . . 56 FBE080—80-Ball Fine-pitch Ball Grid Array 12 x 11 mm package .............................................................. 56 FBE063—63-Ball Fine-pitch Ball Grid Array 12 x 11 mm package .............................................................. 57 Revision Summary . . . . . . . . . . . . . . . . . . . . . . . . 58 Alternate CE# Controlled Erase and Program Operations ..... 53 4 Am29PDL640G December 13, 2005 D A T A S H E E T PRODUCT SELECTOR GUIDE Part Number Speed Option Am29PDL640G VCC, VIO = 2.7–3.1 V 63 73 83 VCC = 2.7–3.1 V, VIO= 1.65–1.95 V 98 Max Access Time, ns (tACC) 65 70 85 90 Max CE# Access, ns (tCE) 65 70 85 90 Max Page Access, ns (tPACC) 25 25 30 45 Max OE# Access, ns (tOE) 25 25 30 45 BLOCK DIAGRAM DQ15–DQ0 RY/BY# (See Note) VCC VSS Sector Switches VIO RESET# Input/Output Buffers Erase Voltage Generator WE# State Control Command Register PGM Voltage Generator Chip Enable Output Enable Logic CE# OE# A21–A3 Timer Y-Decoder STB Address Latch VCC Detector X-Decoder STB Data Latch Y-Gating Cell Matrix A2–A0 Note:RY/BY# is an open drain output. December 13, 2005 Am29PDL640G 5 D A T A S H E E T SIMULTANEOUS READ/WRITE BLOCK DIAGRAM VCC VSS OE# Mux Bank A Bank B X-Decoder A21–A0 Status DQ15–DQ0 Control Mux DQ15–DQ0 CE# WP#/ACC STATE CONTROL & COMMAND REGISTER X-Decoder A21–A0 DQ0–DQ15 Bank C Address Bank C X-Decoder A21–A0 Bank D Address Y-gate RESET# WE# DQ15–DQ0 Bank B Address DQ15–DQ0 RY/BY# DQ15–DQ0 A21–A0 X-Decoder Y-gate Bank A Address A21–A0 Bank D Mux 6 Am29PDL640G December 13, 2005 D A T A S H E E T CONNECTION DIAGRAMS 80-Ball Fine-pitch BGA Top View, Balls Facing Down A8 B8 C8 D8 E8 F8 G8 H8 J8 K8 L8 M8 NC NC NC NC NC VIO VSS NC NC NC NC NC A7 B7 C7 D7 E7 F7 G7 H7 J7 K7 L7 M7 NC NC A13 A12 A14 A15 A16 NC DQ15 VSS NC NC C6 D6 E6 F6 G6 H6 J6 K6 A9 A8 A10 A11 DQ7 DQ14 DQ13 DQ6 C5 D5 E5 F5 G5 H5 J5 K5 WE# RESET# A21 A19 DQ5 DQ12 VCC DQ4 C4 D4 RY/BY# WP#/ACC E4 F4 G4 H4 J4 K4 A18 A20 DQ2 DQ10 DQ11 DQ3 C3 D3 E3 F3 G3 H3 J3 K3 A7 A17 A6 A5 DQ0 DQ8 DQ9 DQ1 A2 B2 C2 D2 E2 F2 G2 H2 J2 K2 L2 M2 NC NC A3 A4 A2 A1 A0 CE# OE# VSS NC NC A1 B1 C1 D1 E1 F1 G1 H1 J1 K1 L1 M1 NC NC NC NC NC NC NC VIO NC NC NC NC December 13, 2005 Am29PDL640G 7 D A T A S H E E T CONNECTION DIAGRAMS 63-Ball Fine-pitch BGA Top View, Balls Facing Down A8 B8 L8 M8 NC NC NC* NC* A7 B7 C7 D7 E7 F7 G7 H7 J7 K7 L7 M7 NC NC A13 A12 A14 A15 A16 NC DQ15 VSS NC* NC* C6 D6 E6 F6 G6 H6 J6 K6 A9 A8 A10 A11 DQ7 DQ14 DQ13 DQ6 C5 D5 E5 F5 G5 H5 J5 K5 WE# RESET# A21 A19 DQ5 DQ12 VCC DQ4 C4 D4 E4 F4 G4 H4 J4 K4 A18 A20 DQ2 DQ10 DQ11 DQ3 RY/BY# WP#/ACC A2 D3 E3 F3 G3 H3 J3 K3 A7 A17 A6 A5 DQ0 DQ8 DQ9 DQ1 C2 D2 E2 F2 G2 H2 J2 K2 L2 M2 OE# VSS NC* NC* L1 M1 NC* NC* A3 NC* A1 C3 A4 A2 A1 A0 CE# B1 * Balls are shorted together via the substrate but not connected to the die. NC* NC* Notes:VIO = VCC for 63-Ball Fine-pitch BGA package. 8 Am29PDL640G December 13, 2005 D A T A S H E E T PIN DESCRIPTION A21–A0 LOGIC SYMBOL = 22 Addresses 22 DQ15–DQ0 = 16 Data Inputs/Outputs A21–A0 CE# = Chip Enable OE# = Output Enable WE# = Write Enable CE# WP#/ACC = Hardware Write Protect/Program Acceleration Input OE# RESET# = Hardware Reset Pin, Active Low WP#/ACC RY/BY# = Ready/Busy Output RESET# VCC = 3.0 Volt-only Single Power Supply (see Product Selector Guide for speed options and voltage supply tolerances) VIO = Output Buffer Power Supply (not available in 63-ball FBGA package) VSS = Device Ground NC = Pin Not Connected Internally December 13, 2005 16 DQ15–DQ0 Am29PDL640G WE# RY/BY# VIO (N/A 63-ball FBGA) 9 D A T A S H E E T ORDERING INFORMATION Standard Products AMD standard products are available in several packages and operating ranges. The order number (Valid Combination) is formed by a combination of the following: Am29PDL640G 63 WS I OPTIONAL PROCESSING Blank = Standard Processing N = 16-byte ESN devices (Contact an AMD representative for more information) TEMPERATURE RANGE I = Industrial (–40°C to +85°C) PACKAGE TYPE WH = 63-ball Fine-pitch Ball Grid Array 0.8 mm pitch, 12 x 11 mm package (FBE063) WS = 80-Ball Fine-pitch Ball Grid Array 0.8 mm pitch, 12 x 11 mm package (FBE080) SPEED OPTION See Product Selector Guide and Valid Combinations DEVICE NUMBER/DESCRIPTION Am29PDL640G 64 Megabit (4 M x 16-Bit) CMOS Flash Memory 3.0 Volt-only Read, Program, and Erase Valid Combinations Valid Combinations for BGA Packages Order Number Package Marking Am29PDL640G63 WHI PD640G63V Am29PDL640G63 WSI PD640G63U Am29PDL640G73 WHI PD640G73V Am29PDL640G73 WSI PD640G73U Am29PDL640G83 WHI PD640G83V Am29PDL640G83 WSI PD640G83U Am29PDL640G98 WSI PD640G98U 10 Speed (ns) VIO Range 65 70 2.7– 3.1 V I 85 90 Valid Combinations list configurations planned to be supported in volume for this device. Consult the local AMD sales office to confirm availability of specific valid combinations and to check on newly released combinations. Note: For the Am29PDL640G, the last digit of the speed indicator specifies VIO range. Speed grades ending in 3 (such as 73,83) indicate a 3 Volt VIO range; speed grades ending in 8 (such as 98) indicate a 1.8V VIO range. 1.65– 1.95 V Am29PDL640G December 13, 2005 D A T A S H E E T DEVICE BUS OPERATIONS This section describes the requirements and use of the device bus operations, which are initiated through the internal command register. The command register itself does not occupy any addressable memory location. The register is a latch used to store the commands, along with the address and data information needed to execute the command. The contents of the Table 1. register serve as inputs to the internal state machine. The state machine outputs dictate the function of the device. Table 1 lists the device bus operations, the inputs and control levels they require, and the resulting output. The following subsections describe each of these operations in further detail. Am29PDL640G Device Bus Operations CE# OE# WE# RESET# WP#/ACC Addresses (Note 1) DQ15– DQ0 Read L L H H X AIN DOUT Write L H L H X AIN DIN VIO± 0.3 V X X VIO ± 0.3 V X X High-Z Output Disable L H H H X X High-Z Reset X X X L X X High-Z Temporary Sector Unprotect (High Voltage) X X X VID X AIN DIN Operation Standby Legend: L = Logic Low = VIL, H = Logic High = VIH, VID = 11.5–12.5 V, VHH = 8.5–9.5 V, X = Don’t Care, SA = Sector Address, AIN = Address In, DIN = Data In, DOUT = Data Out Notes: 1. Addresses are A21–A0. 2. The sector protect and sector unprotect functions may also be implemented via programming equipment. See the High Voltage Sector Protection section. Requirements for Reading Array Data Random Read (Non-Page Read) To read array data from the outputs, the system must drive the CE# and OE# pins to VIL. CE# is the power control and selects the device. OE# is the output control and gates array data to the output pins. WE# should remain at VIH. Address access time (tACC) is equal to the delay from stable addresses to valid output data. The chip enable access time (t CE ) is the delay from the stable addresses and stable CE# to valid data at the output inputs. The output enable access time is the delay from the falling edge of the OE# to valid data at the output inputs (assuming the addresses have been stable for at least tACC–tOE time). The internal state machine is set for reading array data upon device power-up, or after a hardware reset. This ensures that no spurious alteration of the memory content occurs during the power transition. No command is necessary in this mode to obtain array data. Standard microprocessor read cycles that assert valid addresses on the device address inputs produce valid data on the device data outputs. Each bank remains enabled for read access until the command register contents are altered. Refer to the AC Read-Only Operations table for timing specifications and to Figure 12 for the timing diagram. ICC1 in the DC Characteristics table represents the active current specification for reading array data. December 13, 2005 Page Mode Read The device is capable of fast page mode read and is compatible with the page mode Mask ROM read operation. This mode provides faster read access speed for random locations within a page. The page size of the device is 8 words, with the appropriate page being selected by the higher address bits A21–A3 and the LSB bits A2–A0 determining the specific word within that page. This is an asynchronous operation with the microprocessor supplying the specific word location. The random or initial page access is equal to tACC or tCE and subsequent page read accesses (as long as the locations specified by the microprocessor falls within that page) is equivalent to tPACC. When CE# is Am29PDL640G 11 D A T A S H E E T deasserted and reasserted for a subsequent access, the access time is tACC or tCE. Here again, CE# selects the device and OE# is the output control and should be used to gate data to the output inputs if the device is selected. Fast page mode accesses are obtained by keeping A21–A3 constant and changing A2 to A0 to select the specific word within that page. Table 2. Page Select Word A2 A1 A0 Word 0 0 0 0 Word 1 0 0 1 Word 2 0 1 0 Word 3 0 1 1 Word 4 1 0 0 Word 5 1 0 1 Word 6 1 1 0 Word 7 1 1 1 Simultaneous Operation The device is capable of reading data from one bank of memory while a program or erase operation is in progress in another bank of memory (simultaneous operation), in addition to the conventional features (read, program, erase-suspend read, and erase-suspend program). The bank selected can be selected by bank addresses (A21–A19) with zero latency. The simultaneous operation can execute multi-function mode in the same bank. Table 3. Bank Select Bank A21–A19 Bank A 000 Bank B 001, 010, 011 Bank C 100, 101, 110 Bank D 111 An erase operation can erase one sector, multiple sectors, or the entire device. Table 4 indicates the address space that each sector occupies. A “bank address” is the address bits required to uniquely select a bank. Similarly, a “sector address” refers to the address bits required to uniquely select a sector. The “Command Definitions” section has details on erasing a sector or the entire chip, or suspending/resuming the erase operation. ICC2 in the DC Characteristics table represents the active current specification for the write mode. The AC Characteristics section contains timing specification tables and timing diagrams for write operations. Accelerated Program Operation The device offers accelerated program operations through the ACC function. This function is primarily intended to allow faster manufacturing throughput at the factory. If the system asserts VHH on this pin, the device automatically enters the aforementioned Unlock Bypass mode, temporarily unprotects any protected sectors, and uses the higher voltage on the pin to reduce the time required for program operations. The system would use a two-cycle program command sequence as required by the Unlock Bypass mode. Removing VHH from the WP#/ACC pin returns the device to normal operation. Note that VHH must not be asserted on WP#/ACC for operations other than accelerated programming, or device damage may result. In addition, the WP#/ACC pin should be raised to VCC when not in use. That is, the WP#/ACC pin should not be left floating or unconnected; inconsistent behavior of the device may result. Autoselect Functions Writing Commands/Command Sequences To write a command or command sequence (which includes programming data to the device and erasing sectors of memory), the system must drive WE# and CE# to VIL, and OE# to VIH. The device features an Unlock Bypass mode to facilitate faster programming. Once a bank enters the Unlock Bypass mode, only two write cycles are required to program a word, instead of four. The “Word Pro- 12 gram Command Sequence” section has details on programming data to the device using both standard and Unlock Bypass command sequences. If the system writes the autoselect command sequence, the device enters the autoselect mode. The system can then read autoselect codes from the internal register (which is separate from the memory array) on DQ15–DQ0. Standard read cycle timings apply in this mode. Refer to the Autoselect Mode and Autoselect Command Sequence sections for more information. Standby Mode When the system is not reading or writing to the device, it can place the device in the standby mode. In this mode, current consumption is greatly reduced, and the outputs are placed in the high impedance state, independent of the OE# input. Am29PDL640G December 13, 2005 D A T A S H E E T The device enters the CMOS standby mode when the CE# and RESET# pins are both held at VIO ± 0.3 V. (Note that this is a more restricted voltage range than VIH.) If CE# and RESET# are held at VIH, but not within VIO ± 0.3 V, the device will be in the standby mode, but the standby current will be greater. The device requires standard access time (t CE ) for read access when the device is in either of these standby modes, before it is ready to read data. If the device is deselected during erasure or programming, the device draws active current until the operation is completed. ICC3 in the DC Characteristics table represents the CMOS standby current specification. tem can thus monitor RY/BY# to determine whether the reset operation is complete. If RESET# is asserted when a program or erase operation is not executing (RY/BY# pin is “1”), the reset operation is completed within a time of tREADY (not during Embedded Algorithms). The system can read data tRH after the RESET# pin returns to VIH. Refer to the AC Characteristics tables for RESET# parameters and to Figure 14 for the timing diagram. Output Disable Mode When the OE# input is at VIH, output from the device is disabled. The output pins (except for RY/BY#) are placed in the high impedance state. Table 4. The automatic sleep mode minimizes Flash device energy consumption. The device automatically enables this mode when addresses remain stable for t ACC + 30 ns. The automatic sleep mode is independent of the CE#, WE#, and OE# control signals. Standard address access timings provide new data when addresses are changed. While in sleep mode, output data is latched and always available to the system. Note that during automatic sleep mode, OE# must be at VIH before the device reduces current to the stated sleep mode specification. ICC5 in the DC Characteristics table represents the automatic sleep mode current specification. RESET#: Hardware Reset Pin Bank Bank A Automatic Sleep Mode The RESET# pin provides a hardware method of resetting the device to reading array data. When the RESET# pin is driven low for at least a period of tRP, the device immediately terminates any operation in progress, tristates all output pins, and ignores all read/write commands for the duration of the RESET# pulse. The device also resets the internal state machine to reading array data. The operation that was interrupted should be reinitiated once the device is ready to accept another command sequence, to ensure data integrity. Am29PDL640G Sector Architecture Sector Sector Address A21–A12 Sector Size (Kwords) Address Range SA0 0000000000 4 00000h–00FFFh SA1 0000000001 4 01000h–01FFFh SA2 0000000010 4 02000h–02FFFh SA3 0000000011 4 03000h–03FFFh SA4 0000000100 4 04000h–04FFFh SA5 0000000101 4 05000h–05FFFh SA6 0000000110 4 06000h–06FFFh SA7 0000000111 4 07000h–07FFFh SA8 0000001xxx 32 08000h–0FFFFh SA9 0000010xxx 32 10000h–17FFFh SA10 0000011xxx 32 18000h–1FFFFh SA11 0000100xxx 32 20000h–27FFFh SA12 0000101xxx 32 28000h–2FFFFh SA13 0000110xxx 32 30000h–37FFFh SA14 0000111xxx 32 38000h–3FFFFh SA15 0001000xxx 32 40000h–47FFFh SA16 0001001xxx 32 48000h–4FFFFh SA17 0001010xxx 32 50000h–57FFFh SA18 0001011xxx 32 58000h–5FFFFh SA19 0001100xxx 32 60000h–67FFFh SA20 0001101xxx 32 68000h–6FFFFh SA21 0001101xxx 32 70000h–77FFFh SA22 0001111xxx 32 78000h–7FFFFh Current is reduced for the duration of the RESET# pulse. When RESET# is held at VSS±0.3 V, the device draws CMOS standby current (ICC4). If RESET# is held at VIL but not within VSS±0.3 V, the standby current will be greater. The RESET# pin may be tied to the system reset circuitry. A system reset would thus also reset the Flash memory, enabling the system to read the boot-up firmware from the Flash memory. If RESET# is asserted during a program or erase operation, the RY/BY# pin remains a “0” (busy) until the internal reset operation is complete, which requires a time of tREADY (during Embedded Algorithms). The sysDecember 13, 2005 Am29PDL640G 13 D A T A S H E E T Table 4. 14 Sector Sector Address A21–A12 Sector Size (Kwords) Address Range Table 4. Bank Am29PDL640G Sector Architecture Sector Sector Address A21–A12 Sector Size (Kwords) Address Range SA23 0010000xxx 32 80000h–87FFFh SA71 1000000xxx 32 200000h–207FFFh SA24 0010001xxx 32 88000h–8FFFFh SA72 1000001xxx 32 208000h–20FFFFh SA25 0010010xxx 32 90000h–97FFFh SA73 1000010xxx 32 210000h–217FFFh SA26 0010011xxx 32 98000h–9FFFFh SA74 1000011xxx 32 218000h–21FFFFh SA27 0010100xxx 32 A0000h–A7FFFh SA75 1000100xxx 32 220000h–227FFFh SA28 0010101xxx 32 A8000h–AFFFFh SA76 1000101xxx 32 228000h–22FFFFh SA29 0010110xxx 32 B0000h–B7FFFh SA77 1000110xxx 32 230000h–237FFFh SA30 0010111xxx 32 B8000h–BFFFFh SA78 1000111xxx 32 238000h–23FFFFh SA31 0011000xxx 32 C0000h–C7FFFh SA79 1001000xxx 32 240000h–247FFFh SA32 0011001xxx 32 C8000h–CFFFFh SA80 1001001xxx 32 248000h–24FFFFh SA33 0011010xxx 32 D0000h–D7FFFh SA81 1001010xxx 32 250000h–257FFFh SA34 0011011xxx 32 D8000h–DFFFFh SA82 1001011xxx 32 258000h–25FFFFh SA35 0011000xxx 32 E0000h–E7FFFh SA83 1001100xxx 32 260000h–267FFFh SA36 0011101xxx 32 E8000h–EFFFFh SA84 1001101xxx 32 268000h–26FFFFh SA37 0011110xxx 32 F0000h–F7FFFh SA85 1001110xxx 32 270000h–277FFFh SA38 0011111xxx 32 F8000h–FFFFFh SA86 1001111xxx 32 278000h–27FFFFh SA39 0100000xxx 32 F9000h–107FFFh SA87 1010000xxx 32 280000h–28FFFFh SA40 0100001xxx 32 108000h–10FFFFh SA88 1010001xxx 32 288000h–28FFFFh SA41 0100010xxx 32 110000h–117FFFh SA89 1010010xxx 32 290000h–297FFFh SA42 0101011xxx 32 118000h–11FFFFh SA90 1010011xxx 32 298000h–29FFFFh SA43 0100100xxx 32 120000h–127FFFh SA91 1010100xxx 32 2A0000h–2A7FFFh SA44 0100101xxx 32 128000h–12FFFFh SA92 1010101xxx 32 2A8000h–2AFFFFh SA93 1010110xxx 32 2B0000h–2B7FFFh SA94 1010111xxx 32 2B8000h–2BFFFFh SA45 0100110xxx 32 130000h–137FFFh SA46 0100111xxx 32 138000h–13FFFFh Bank C Bank B Bank Am29PDL640G Sector Architecture SA47 0101000xxx 32 140000h–147FFFh SA95 1011000xxx 32 2C0000h–2C7FFFh SA48 0101001xxx 32 148000h–14FFFFh SA96 1011001xxx 32 2C8000h–2CFFFFh SA49 0101010xxx 32 150000h–157FFFh SA97 1011010xxx 32 2D0000h–2D7FFFh SA50 0101011xxx 32 158000h–15FFFFh SA98 1011011xxx 32 2D8000h–2DFFFFh SA51 0101100xxx 32 160000h–167FFFh SA99 1011100xxx 32 2E0000h–2E7FFFh SA52 0101101xxx 32 168000h–16FFFFh SA100 1011101xxx 32 2E8000h–2EFFFFh SA53 0101110xxx 32 170000h–177FFFh SA101 1011110xxx 32 2F0000h–2FFFFFh SA54 0101111xxx 32 178000h–17FFFFh SA102 1011111xxx 32 2F8000h–2FFFFFh SA55 0110000xxx 32 180000h–187FFFh SA103 1100000xxx 32 300000h–307FFFh SA56 0110001xxx 32 188000h–18FFFFh SA104 1100001xxx 32 308000h–30FFFFh SA57 0110010xxx 32 190000h–197FFFh SA105 1100010xxx 32 310000h–317FFFh SA58 0110011xxx 32 198000h–19FFFFh SA106 1100011xxx 32 318000h–31FFFFh SA59 0100100xxx 32 1A0000h–1A7FFFh SA107 1100100xxx 32 320000h–327FFFh SA60 0110101xxx 32 1A8000h–1AFFFFh SA108 1100101xxx 32 328000h–32FFFFh SA61 0110110xxx 32 1B0000h–1B7FFFh SA109 1100110xxx 32 330000h–337FFFh SA62 0110111xxx 32 1B8000h–1BFFFFh SA110 1100111xxx 32 338000h–33FFFFh SA63 0111000xxx 32 1C0000h–1C7FFFh SA111 1101000xxx 32 340000h–347FFFh SA64 0111001xxx 32 1C8000h–1CFFFFh SA112 1101001xxx 32 348000h–34FFFFh SA65 0111010xxx 32 1D0000h–1D7FFFh SA113 1101010xxx 32 350000h–357FFFh SA66 0111011xxx 32 1D8000h–1DFFFFh SA114 1101011xxx 32 358000h–35FFFFh SA67 0111100xxx 32 1E0000h–1E7FFFh SA115 1101100xxx 32 360000h–367FFFh SA68 0111101xxx 32 1E8000h–1EFFFFh SA116 1101101xxx 32 368000h–36FFFFh SA69 0111110xxx 32 1F0000h–1F7FFFh SA117 1101110xxx 32 370000h–377FFFh SA70 0111111xxx 32 1F8000h–1FFFFFh SA118 1101111xxx 32 378000h–37FFFFh Am29PDL640G December 13, 2005 D A T A S H E E T Table 4. Bank D Bank Am29PDL640G Sector Architecture Sector Address A21–A12 Sector Sector Size (Kwords) Address Range SA119 1110000xxx 32 380000h–387FFFh SA120 1110001xxx 32 388000h–38FFFFh SA121 1110010xxx 32 390000h–397FFFh SA122 1110011xxx 32 398000h–39FFFFh SA123 1110100xxx 32 3A0000h–3A7FFFh SA124 1110101xxx 32 3A8000h–3AFFFFh SA125 1110110xxx 32 3B0000h–3B7FFFh SA126 1110111xxx 32 3B8000h–3BFFFFh SA127 1111000xxx 32 3C0000h–3C7FFFh SA128 1111001xxx 32 3C8000h–3CFFFFh SA129 1111010xxx 32 3D0000h–3D7FFFh SA130 1111011xxx 32 3D8000h–3DFFFFh SA131 1111100xxx 32 3E0000h–3E7FFFh SA132 1111101xxx 32 3E8000h–3EFFFFh SA133 1111110xxx 32 3F0000h–3F7FFFh SA134 1111111000 4 3F8000h–3F8FFFh SA135 1111111001 4 3F9000h–3F9FFFh SA136 1111111010 4 3FA000h–3FAFFFh SA137 1111111011 4 3FB000h–3FBFFFh SA138 1111111100 4 3FC000h–3FCFFFh SA139 1111111101 4 3FD000h–3FDFFFh SA140 1111111110 4 3FE000h–3FEFFFh SA141 1111111111 4 3FF000h–3FFFFFh Table 5. Bank A B C D Table 6. Bank Address A21–A19 000 001, 010, 011 100, 101, 110 111 Autoselect Mode The autoselect mode provides manufacturer and device identification, and sector protection verification, through identifier codes output on DQ7–DQ0. This mode is primarily intended for programming equipment to automatically match a device to be programmed with its corresponding programming algorithm. However, the autoselect codes can also be accessed in-system through the command register. When using programming equipment, the autoselect mode requires VID on address pin A9. Address pins must be as shown in Table 7. In addition, when verifying sector protection, the sector address must appear on the appropriate highest order address bits (see Table 4). Table 7 shows the remaining address bits that are don’t care. When all necessary bits have been set as required, the programming equipment may then read the corresponding identifier code on DQ7–DQ0. However, the autoselect codes can also be accessed in-system through the command register, for instances when the device is erased or programmed in a system without access to high voltage on the A9 pin. The command sequence is illustrated in Table 14. Note that if a Bank Address (BA) on address bits A21, A20, and A19 is asserted during the third write cycle of the autoselect command, the host system can read autoselect data that bank and then immediately read array data from the other bank, without exiting the autoselect mode. To access the autoselect codes in-system, the host system can issue the autoselect command via the command register, as shown in Table 14. This method does not require V ID. Refer to the Autoselect Command Sequence section for more information. SecSiTM Sector Addresses Device Sector Size Address Range Am29PDL640G 128 words 00000h–0007Fh December 13, 2005 Am29PDL640G 15 D A T A S H E E T Table 7. Autoselect Codes (High Voltage Method) Description Device ID Manufacturer ID: AMD CE# OE# WE# A21 to A12 L L H X A10 A9 A8 A7 X VID X X A6 A5 to A4 A3 A2 A1 A0 DQ15 to DQ0 L X L L L L 0001h L L L H 227Eh H H H L 2215h H H H H 2201h H L H L 0001h (protected), 0000h (unprotected) H 0080h (factory locked), 0000h (not factory locked) Read Cycle 1 Read Cycle 2 L L H X X VID X L L L Read Cycle 3 Sector Protection Verification SecSi Indicator Bit (DQ7) L L L L H H SA X X VID X VID X X L L X L H X L L H Legend: L = Logic Low = VIL, H = Logic High = VIH, BA = Bank Address, SA = Sector Address, X = Don’t care. Note: The autoselect codes may also be accessed in-system via command sequences. Table 8. Am29PDL640G Boot Sector/Sector Block Addresses for Protection/Unprotection 16 Sector A21–A12 Sector/ Sector Block Size 01111XXXXX 128 (4x32) Kwords A21–A12 Sector/ Sector Block Size SA67–SA70 Sector SA71–SA74 10000XXXXX 128 (4x32) Kwords SA0 0000000000 4 Kwords SA75–SA78 10001XXXXX 128 (4x32) Kwords SA1 0000000001 4 Kwords SA79–SA82 10010XXXXX 128 (4x32) Kwords SA2 0000000010 4 Kwords SA83–SA86 10011XXXXX 128 (4x32) Kwords SA3 0000000011 4 Kwords SA87–SA90 10100XXXXX 128 (4x32) Kwords SA4 0000000100 4 Kwords SA91–SA94 10101XXXXX 128 (4x32) Kwords SA5 0000000101 4 Kwords SA95–SA98 10110XXXXX 128 (4x32) Kwords SA6 0000000110 4 Kwords SA99–SA102 10111XXXXX 128 (4x32) Kwords SA7 0000000111 4 Kwords SA103–SA106 11000XXXXX 128 (4x32) Kwords SA107–SA110 11001XXXXX 128 (4x32) Kwords SA8–SA10 0000001XXX, 0000010XXX, 0000011XXX SA111–SA114 11010XXXXX 128 (4x32) Kwords SA115–SA118 11011XXXXX 128 (4x32) Kwords SA119–SA122 11100XXXXX 128 (4x32) Kwords SA123–SA126 11101XXXXX 128 (4x32) Kwords SA127–SA130 11110XXXXX 128 (4x32) Kwords SA131–SA133 1111100XXX, 1111101XXX, 1111110XXX 96 (3x32) Kwords 96 (3x32) Kwords SA11–SA14 00001XXXXX 128 (4x32) Kwords SA15–SA18 00010XXXXX 128 (4x32) Kwords SA19–SA22 00011XXXXX 128 (4x32) Kwords SA23–SA26 00100XXXXX 128 (4x32) Kwords SA27-SA30 00101XXXXX 128 (4x32) Kwords SA31-SA34 00110XXXXX 128 (4x32) Kwords SA35-SA38 00111XXXXX 128 (4x32) Kwords SA134 1111111000 4 Kwords SA39-SA42 01000XXXXX 128 (4x32) Kwords SA135 1111111001 4 Kwords SA43-SA46 01001XXXXX 128 (4x32) Kwords SA136 1111111010 4 Kwords SA47-SA50 01010XXXXX 128 (4x32) Kwords SA137 1111111011 4 Kwords SA51-SA54 01011XXXXX 128 (4x32) Kwords SA138 1111111100 4 Kwords SA55–SA58 01100XXXXX 128 (4x32) Kwords SA139 1111111101 4 Kwords SA59–SA62 01101XXXXX 128 (4x32) Kwords SA140 1111111101 4 Kwords SA63–SA66 01110XXXXX 128 (4x32) Kwords SA141 1111111111 4 Kwords Am29PDL640G December 13, 2005 D A T A S H E E T SECTOR PROTECTION The Am29PDL640G features several levels of sector protection, which can disable both the program and erase operations in certain sectors or sector groups: ■ Persistently Locked—The sector is protected and cannot be changed. Persistent Sector Protection ■ Dynamically Locked—The sector is protected and can be changed by a simple command. A command sector protection method that replaces the old 12 V controlled protection method. ■ Unlocked—The sector is unprotected and can be changed by a simple command. Password Sector Protection To achieve these states, three types of “bits” are used: A highly sophisticated protection method that requires a password before changes to certain sectors or sector groups are permitted Persistent Protection Bit (PPB) WP# Hardware Protection A write protect pin that can prevent program or erase operations in sectors 0, 1, 140, and 141. All parts default to operate in the Persistent Sector Protection mode. The customer must then choose if the Persistent or Password Protection method is most desirable. There are two one-time programmable non-volatile bits that define which sector protection method will be used. If the Persistent Sector Protection method is desired, programming the Persistent Sector Protection Mode Locking Bit permanently sets the device to the Persistent Sector Protection mode. If the Password Sector Protection method is desired, programming the Password Mode Locking Bit permanently sets the device to the Password Sector Protection mode. It is not possible to switch between the two protection modes once a locking bit has been set. One of the two modes must be selected when the device is first programmed. This prevents a program or virus from later setting the Password Mode Locking Bit, which would cause an unexpected shift from the default Persistent Sector Protection Mode into the Password Protection Mode. A single Persistent (non-volatile) Protection Bit is assigned to a maximum four sectors (see the sector address tables for specific sector protection groupings). All 4 Kword boot-block sectors have individual sector Persistent Protection Bits (PPBs) for greater flexibility. Each PPB is individually modifiable through the PPB Write Command. The device erases all PPBs in parallel. If any PPB requires erasure, the device must be instructed to preprogram all of the sector PPBs prior to PPB erasure. Otherwise, a previously erased sector PPBs can potentially be over-erased. The flash device does not have a built-in means of preventing sector PPBs over-erasure. Persistent Protection Bit Lock (PPB Lock) The Persistent Protection Bit Lock (PPB Lock) is a global volatile bit. When set to “1”, the PPBs cannot be changed. When cleared (“0”), the PPBs are changeable. There is only one PPB Lock bit per device. The PPB Lock is cleared after power-up or hardware reset. There is no command sequence to unlock the PPB Lock. Dynamic Protection Bit (DYB) The WP# Hardware Protection feature is always available, independent of the software managed protection method chosen. A volatile protection bit is assigned for each sector. After power-up or hardware reset, the contents of all DYBs is “0”. Each DYB is individually modifiable through the DYB Write Command. The device is shipped with all sectors unprotected. AMD offers the option of programming and protecting sectors at the factory prior to shipping the device through AMD’s ExpressFlash™ Service. Contact an AMD representative for details. When the par ts are first shipped, the PPBs are cleared, the DYBs are cleared, and PPB Lock is defaulted to power up in the cleared state – meaning the PPBs are changeable. It is possible to determine whether a sector is protected or unprotected. See Autoselect Mode for details. Persistent Sector Protection The Persistent Sector Protection method replaces the 12 V controlled protection method in previous AMD flash devices. This new method provides three different sector protection states: December 13, 2005 When the device is first powered on the DYBs power up cleared (sectors not protected). The Protection State for each sector is determined by the logical OR of the PPB and the DYB related to that sector. For the sectors that have the PPBs cleared, the DYBs control whether or not the sector is protected or unprotected. By issuing the DYB Write command sequences, the DYBs will be set or cleared, thus placing each sector in the protected or unprotected state. These are the so-called Dynamic Locked or Unlocked states. They are called dynamic states because it is very easy to Am29PDL640G 17 D A T A S H E E T switch back and forth between the protected and unprotected conditions. This allows software to easily protect sectors against inadvertent changes yet does not prevent the easy removal of protection when changes are needed. The DYBs maybe set or cleared as often as needed. The PPBs allow for a more static, and difficult to change, level of protection. The PPBs retain their state across power cycles because they are non-volatile. Individual PPBs are set with a command but must all be cleared as a group through a complex sequence of program and erasing commands. The PPBs are also limited to 100 erase cycles. The PPB Lock bit adds an additional level of protection. Once all PPBs are programmed to the desired settings, the PPB Lock may be set to “1”. Setting the PPB Lock disables all program and erase commands to the non-volatile PPBs. In effect, the PPB Lock Bit locks the PPBs into their current state. The only way to clear the PPB Lock is to go through a power cycle. System boot code can determine if any changes to the PPB are needed; for example, to allow new system code to be downloaded. If no changes are needed then the boot code can set the PPB Lock to disable any further changes to the PPBs during system operation. The WP#/ACC write protect pin adds a final level of hardware protection to sectors 0, 1, 140, and 141. When this pin is low it is not possible to change the contents of these sectors. These sectors generally hold system boot code. The WP#/ACC pin can prevent any changes to the boot code that could override the choices made while setting up sector protection during system initialization. It is possible to have sectors that have been persistently locked, and sectors that are left in the dynamic state. The sectors in the dynamic state are all unprotected. If there is a need to protect some of them, a simple DYB Write command sequence is all that is necessary. The DYB write command for the dynamic sectors switch the DYBs to signify protected and unprotected, respectively. If there is a need to change the status of the persistently locked sectors, a few more steps are required. First, the PPB Lock bit must be disabled by either putting the device through a power-cycle, or hardware reset. The PPBs can then be changed to reflect the desired settings. Setting the PPB lock bit once again will lock the PPBs, and the device operates normally again. The best protection is achieved by executing the PPB lock bit set command early in the boot code, and protect the boot code by holding WP#/ACC = VIL. 18 Table 9. Sector Protection Schemes DYB PPB PPB Lock 0 0 0 Unprotected—PPB and DYB are changeable 0 0 1 Unprotected—PPB not changeable, DYB is changeable 0 1 0 1 0 0 1 1 0 0 1 1 1 0 1 1 1 1 Sector State Protected—PPB and DYB are changeable Protected—PPB not changeable, DYB is changeable Table 9 contains all possible combinations of the DYB, PPB, and PPB lock relating to the status of the sector. In summary, if the PPB is set, and the PPB lock is set, the sector is protected and the protection can not be removed until the next power cycle clears the PPB lock. If the PPB is cleared, the sector can be dynamically locked or unlocked. The DYB then controls whether or not the sector is protected or unprotected. If the user attempts to program or erase a protected sector, the device ignores the command and returns to read mode. A program command to a protected sector enables status polling for approximately 1 µs before the device returns to read mode without having modified the contents of the protected sector. An erase command to a protected sector enables status polling for approximately 50 µs after which the device returns to read mode without having erased the protected sector. The programming of the DYB, PPB, and PPB lock for a given sector can be ver ified by wr iting a DYB/PPB/PPB lock verify command to the device. Persistent Sector Protection Mode Locking Bit Like the password mode locking bit, a Persistent Sector Protection mode locking bit exists to guarantee that the device remain in software sector protection. Once set, the Persistent Sector Protection locking bit prevents programming of the password protection mode locking bit. This guarantees that a hacker could not place the device in password protection mode. Password Protection Mode The Password Sector Protection Mode method allows an even higher level of security than the Persistent Sector Protection Mode. There are two main differences between the Persistent Sector Protection and the Password Sector Protection Mode: Am29PDL640G December 13, 2005 D A T A S H E E T ■ When the device is first powered on, or comes out of a reset cycle, the PPB Lock bit set to the locked state, rather than cleared to the unlocked state. ■ The only means to clear the PPB Lock bit is by writing a unique 64-bit Password to the device. The Password Sector Protection method is otherwise identical to the Persistent Sector Protection method. A 64-bit password is the only additional tool utilized in this method. The password is stored in a one-time programmable (OTP) region of the flash memory. Once the Password Mode Locking Bit is set, the password is permanently set with no means to read, program, or erase it. The password is used to clear the PPB Lock bit. The Password Unlock command must be written to the flash, along with a password. The flash device internally compares the given password with the pre-programmed password. If they match, the PPB Lock bit is cleared, and the PPBs can be altered. If they do not match, the flash device does nothing. There is a built-in 2 µs delay for each “password check.” This delay is intended to thwart any efforts to run a program that tries all possible combinations in order to crack the password. Password and Password Mode Locking Bit In order to select the Password sector protection scheme, the customer must first program the password. The password may be correlated to the unique Electronic Serial Number (ESN) of the particular flash device. Each ESN is different for every flash device; therefore each password should be different for every flash device. While programming in the password region, the customer may perform Password Verify operations. Once the desired password is programmed in, the customer must then set the Password Mode Locking Bit. This operation achieves two objectives: 1. Permanently sets the device to operate using the Password Protection Mode. It is not possible to reverse this function. 2. Disables all further commands to the password region. All program, and read operations are ignored. Both of these objectives are important, and if not carefully considered, may lead to unrecoverable errors. The user must be sure that the Password Protection method is desired when setting the Password Mode Locking Bit. More importantly, the user must be sure that the password is correct when the Password Mode Locking Bit is set. Due to the fact that read operations are disabled, there is no means to verify what the password is afterwards. If the password is lost after setting the Password Mode Locking Bit, there will be no way to clear the PPB Lock bit. December 13, 2005 The Password Mode Locking Bit, once set, prevents reading the 64-bit password on the DQ bus and further password programming. The Password Mode Locking Bit is not erasable. Once Password Mode Locking Bit is programmed, the Persistent Sector Protection Locking Bit is disabled from programming, guaranteeing that no changes to the protection scheme are allowed. 64-bit Password The 64-bit Password is located in its own memory space and is accessible through the use of the Password Program and Verify commands (see “Password Verify Command”). The password function works in conjunction with the Password Mode Locking Bit, which when set, prevents the Password Verify command from reading the contents of the password on the pins of the device. Write Protect (WP#) The Write Protect feature provides a hardware method of protecting sectors 0, 1, 140, and 141 without using VID. This function is provided by the WP# pin and overrides the previously discussed High Voltage Sector Protection method. If the system asserts VIL on the WP#/ACC pin, the device disables program and erase functions in the two outermost 4 Kword sectors on both ends of the flash array independent of whether it was previously protected or unprotected. If the system asserts VIH on the WP#/ACC pin, the device reverts to whether sectors 0, 1, 140, and 141 were last set to be protected or unprotected. That is, sector protection or unprotection for these sectors depends on whether they were last protected or unprotected using the method described in High Voltage Sector Protection. Note that the WP#/ACC pin must not be left floating or unconnected; inconsistent behavior of the device may result. Persistent Protection Bit Lock The Persistent Protection Bit (PPB) Lock is a volatile bit that reflects the state of the Password Mode Locking Bit after power-up reset. If the Password Mode Lock Bit is also set after a hardware reset (RESET# asserted) or a power-up reset, the ONLY means for clearing the PPB Lock Bit in Password Protection Mode is to issue the Password Unlock command. Successful execution of the Password Unlock command clears the PPB Lock Bit, allowing for sector PPBs modifications. Asserting RESET#, taking the device through a power-on reset, or issuing the PPB Lock Bit Set command sets the PPB Lock Bit to a “1” when the Password Mode Lock Bit is not set. Am29PDL640G 19 D A T A S H E E T If the Password Mode Locking Bit is not set, including Persistent Protection Mode, the PPB Lock Bit is cleared after power-up or hardware reset. The PPB Lock Bit is set by issuing the PPB Lock Bit Set command. Once set the only means for clearing the PPB Lock Bit is by issuing a hardware or power-up reset. The Password Unlock command is ignored in Persistent Protection Mode. 20 High Voltage Sector Protection Sector protection and unprotection may also be implemented using programming equipment. The procedure requires high voltage (VID) to be placed on the RESET# pin. Refer to Figure Note: for details on this procedure. Note that for sector unprotect, all unprotected sectors must first be protected prior to the first sector write cycle. Am29PDL640G December 13, 2005 D A T A S H E E T START START Protect all sectors: The indicated portion of the sector protect algorithm must be performed for all unprotected sectors prior to issuing the first sector unprotect address PLSCNT = 1 RESET# = VID Wait 4 μs Temporary Sector Unprotect Mode No PLSCNT = 1 RESET# = VID Wait 4 μs First Write Cycle = 60h? First Write Cycle = 60h? Temporary Sector Unprotect Mode Yes Yes Set up sector address No All sectors protected? Sector Protect: Write 60h to sector address with A6-A0 = 0111010 Yes Set up first sector address Sector Unprotect: Write 60h to sector address with A6-A0 = 1111010 Wait 100 µs Increment PLSCNT No Verify Sector Protect: Write 40h to sector address with A6-A0 = 0000010 Reset PLSCNT = 1 Read from sector address with A6-A0 = 0000010 Wait 1.2 ms Verify Sector Unprotect: Write 40h to sector address with A6-A0 = 0000010 Increment PLSCNT No No PLSCNT = 25? Yes Yes Remove VID from RESET# No Yes Protect another sector? PLSCNT = 1000? No Write reset command Remove VID from RESET# Sector Protect complete Write reset command Device failed Read from sector address with A6-A0 = 0000010 Data = 01h? Sector Protect complete Sector Protect Algorithm Yes Remove VID from RESET# Write reset command Set up next sector address No Data = 00h? Yes Last sector verified? No Yes Remove VID from RESET# Sector Unprotect complete Write reset command Device failed Sector Unprotect complete Sector Unprotect Algorithm Note:These algorithms are valid only in Persistent Sector Protection Mode. They are not valid in Password Protection Mode. Figure 1. In-System Sector Protection/ Sector Unprotection Algorithms December 13, 2005 Am29PDL640G 21 D A T A S H E E T Temporary Sector Unprotect This feature allows temporary unprotection of previously protected sectors to change data in-system. The Sector Unprotect mode is activated by setting the RESET# pin to VID. During this mode, formerly protected sectors can be programmed or erased by selecting the sector addresses. Once VID is removed from the RESET# pin, all the previously protected sectors are protected again. Figure 2 shows the algorithm, and Figure 22 shows the timing diagrams, for this feature. AMD offers the device with the SecSi Sector either facto r y locked or custo mer lockable. The factory-locked version is always protected when shipped from the factory, and has the SecSi (Secured Silicon) Sector Indicator Bit permanently set to a “1.” The customer-lockable version is shipped with the SecSi Sector unprotected, allowing customers to utilize the sector in any manner they choose. The customer-lockable version has the SecSi (Secured Silicon) Sector Indicator Bit permanently set to a “0.” Thus, the SecSi Sector Indicator Bit prevents customer-lockable devices from being used to replace devices that are factory locked. The system accesses the SecSi Sector through a command sequence (see “Enter SecSi™ Sector/Exit SecSi Sector Command Sequence”). After the system has written the Enter SecSi Sector command sequence, it may read the SecSi Sector by using the addresses normally occupied by the boot sectors. This mode of operation continues until the system issues the Exit SecSi Sector command sequence, or until power is removed from the device. On power-up, or following a hardware reset, the device reverts to sending commands to the normal address space. Note that the ACC function and unlock bypass modes are not available when the SecSi Sector is enabled. START RESET# = VID (Note 1) Perform Erase or Program Operations RESET# = VIH Factory Locked: SecSi Sector Programmed and Protected At the Factory Temporary Sector Unprotect Completed (Note 2) Notes: 1. All protected sectors unprotected (If WP#/ACC = VIL, sectors 0, 1, 140, 141 will remain protected). 2. All previously protected sectors are protected once again. In a factory locked device, the SecSi Sector is protected when the device is shipped from the factory. The SecSi Sector cannot be modified in any way. The device is preprogrammed with both a random number and a secure ESN. The SecSi Sector is located at addresses 000000h–00007Fh in Persistent Protection mode, and at addresses 000005h–00007Fh in Password Protection mode. The device is available preprogrammed with one of the following: ■ A random, secure ESN only Figure 2. Temporary Sector Unprotect Operation ■ Customer code through the ExpressFlash service ■ Both a random, secure ESN and customer code through the ExpressFlash service. SecSi™ (Secured Silicon) Sector Flash Memory Region The SecSi (Secured Silicon) Sector feature provides a Flash memory region that enables permanent part identification through an Electronic Serial Number (ESN). The SecSi Sector is up to 128 words in length, and uses a SecSi Sector Indicator Bit (DQ7) to indicate whether or not the SecSi Sector is locked when shipped from the factory. This bit is permanently set at the factory and cannot be changed, which prevents cloning of a factory locked part. This ensures the security of the ESN once the product is shipped to the field. 22 Customers may opt to have their code programmed by AMD through the AMD ExpressFlash service. AMD programs the customer’s code, with or without the random ESN. The devices are then shipped from AMD’s factory with the SecSi Sector permanently locked. Contact an AMD representative for details on using AMD’s ExpressFlash service. Customer Lockable: SecSi Sector NOT Programmed or Protected At the Factory If the security feature is not required, the SecSi Sector can be treated as an additional Flash memory space. The SecSi Sector can be read any number of times, but can be programmed and locked only once. Note Am29PDL640G December 13, 2005 D A T A S H E E T that the accelerated programming (ACC) and unlock bypass functions are not available when programming the SecSi Sector. The SecSi Sector area can be protected using one of the following procedures: ■ Write the three-cycle Enter SecSi Sector Region command sequence, and then follow the in-system sector protect algorithm as shown in Figure Note:, except that RESET# may be at either VIH or VID. This allows in-system protection of the SecSi Sector Region without raising any device pin to a high voltage. Note that this method is only applicable to the SecSi Sector. ■ To verify the protect/unprotect status of the SecSi Sector, follow the algorithm shown in Figure 3. Once the SecSi Sector is locked and verified, the system must write the Exit SecSi Sector Region command sequence to return to reading and writing the remainder of the array. Hardware Data Protection The command sequence requirement of unlock cycles for programming or erasing provides data protection against inadvertent writes. In addition, the following hardware data protection measures prevent accidental erasure or programming, which might otherwise be caused by spurious system level signals during VCC power-up and power-down transitions, or from system noise. Low VCC Write Inhibit When VCC is less than VLKO, the device does not accept any write cycles. This protects data during VCC power-up and power-down. The command register and all internal program/erase circuits are disabled, and the device resets to the read mode. Subsequent writes are ignored until VCC is greater than VLKO. The system must provide the proper signals to the control pins to prevent unintentional writes when V CC is greater than VLKO. The SecSi Sector lock must be used with caution since, once locked, there is no procedure available for unlocking the SecSi Sector area and none of the bits in the SecSi Sector memory space can be modified in any way. Write Pulse “Glitch” Protection SecSi Sector Protection Bit Write cycles are inhibited by holding any one of OE# = VIL, CE# = VIH or WE# = VIH. To initiate a write cycle, CE# and WE# must be a logical zero while OE# is a logical one. The SecSi Sector Protection Bit prevents programming of the SecSi Sector memory area. Once set, the SecSi Sector memory area contents are non-modifiable. START RESET# = VIH or VID Wait 1 μs Write 60h to any address Write 40h to SecSi Sector address with A6 = 0, A1 = 1, A0 = 0 Read from SecSi Sector address with A6 = 0, A1 = 1, A0 = 0 Figure 3. If data = 00h, SecSi Sector is unprotected. If data = 01h, SecSi Sector is protected. Remove VIH or VID from RESET# Write reset command SecSi Sector Protect Verify complete SecSi Sector Protect Verify December 13, 2005 Noise pulses of less than 5 ns (typical) on OE#, CE# or WE# do not initiate a write cycle. Logical Inhibit Power-Up Write Inhibit If WE# = CE# = VIL and OE# = VIH during power up, the device does not accept commands on the rising edge of WE#. The internal state machine is automatically reset to the read mode on power-up. COMMON FLASH MEMORY INTERFACE (CFI) The Common Flash Interface (CFI) specification outlines device and host system software interrogation handshake, which allows specific vendor-specified software algorithms to be used for entire families of devices. Software support can then be device-independent, JEDEC ID-independent, and forward- and backward-compatible for the specified flash device families. Flash vendors can standardize their existing interfaces for long-term compatibility. This device enters the CFI Query mode when the system writes the CFI Query command, 98h, to address 55h, any time the device is ready to read array data. The system can read CFI information at the addresses given in Tables 10–13. To terminate reading CFI data, the system must write the reset command. The CFI Query mode is not accessible when the device is exe- Am29PDL640G 23 D A T A S H E E T cuting an Embedded Program or embedded Erase algorithm. The system can also write the CFI query command when the device is in the autoselect mode. The device enters the CFI query mode, and the system can read CFI data at the addresses given in Tables 10–13. The system must write the reset command to return the device to reading array data. 24 For further information, please refer to the CFI Specification and CFI Publication 100, available via the World Wide Web at http://www.amd.com/flash/cfi. Alternatively, contact an AMD representative for copies of these documents. Am29PDL640G December 13, 2005 D A T A S H E E T Table 10. CFI Query Identification String Addresses Data Description 10h 11h 12h 0051h 0052h 0059h Query Unique ASCII string “QRY” 13h 14h 0002h 0000h Primary OEM Command Set 15h 16h 0040h 0000h Address for Primary Extended Table 17h 18h 0000h 0000h Alternate OEM Command Set (00h = none exists) 19h 1Ah 0000h 0000h Address for Alternate OEM Extended Table (00h = none exists) Table 11. System Interface String Addresses Data 1Bh 0027h VCC Min. (write/erase) D7–D4: volt, D3–D0: 100 millivolt 1Ch 0031h VCC Max. (write/erase) D7–D4: volt, D3–D0: 100 millivolt 1Dh 0000h VPP Min. voltage (00h = no VPP pin present) 1Eh 0000h VPP Max. voltage (00h = no VPP pin present) 1Fh 0004h Typical timeout per single byte/word write 2N µs 20h 0000h Typical timeout for Min. size buffer write 2N µs (00h = not supported) 21h 0009h Typical timeout per individual block erase 2N ms 22h 0000h Typical timeout for full chip erase 2N ms (00h = not supported) 23h 0005h Max. timeout for byte/word write 2N times typical 24h 0000h Max. timeout for buffer write 2N times typical 25h 0004h Max. timeout per individual block erase 2N times typical 26h 0000h Max. timeout for full chip erase 2N times typical (00h = not supported) December 13, 2005 Description Am29PDL640G 25 D A T A S H E E T Table 12. Addresses 26 Device Geometry Definition Data Description N 27h 0017h Device Size = 2 byte 28h 29h 0001h 0000h Flash Device Interface description (refer to CFI publication 100) 2Ah 2Bh 0000h 0000h Max. number of byte in multi-byte write = 2N (00h = not supported) 2Ch 0003h Number of Erase Block Regions within device 2Dh 2Eh 2Fh 30h 0007h 0000h 0020h 0000h Erase Block Region 1 Information (refer to the CFI specification or CFI publication 100) 31h 32h 33h 34h 007Dh 0000h 0000h 0001h Erase Block Region 2 Information (refer to the CFI specification or CFI publication 100) 35h 36h 37h 38h 0007h 0000h 0020h 0000h Erase Block Region 3 Information (refer to the CFI specification or CFI publication 100) 39h 3Ah 3Bh 3Ch 0000h 0000h 0000h 0000h Erase Block Region 4 Information (refer to the CFI specification or CFI publication 100) Am29PDL640G December 13, 2005 D A T A S H E E T Table 13. Primary Vendor-Specific Extended Query Addresses Data Description 40h 41h 42h 0050h 0052h 0049h Query-unique ASCII string “PRI” 43h 0031h Major version number, ASCII (reflects modifications to the silicon) 44h 0033h Minor version number, ASCII (reflects modifications to the CFI table) 45h 0004h Address Sensitive Unlock (Bits 1-0) 0 = Required, 1 = Not Required Silicon Revision Number (Bits 7-2) 46h 0002h Erase Suspend 0 = Not Supported, 1 = To Read Only, 2 = To Read & Write 47h 0001h Sector Protect 0 = Not Supported, X = Number of sectors in per group 48h 0001h Sector Temporary Unprotect 00 = Not Supported, 01 = Supported 49h 0007h Sector Protect/Unprotect scheme 01 =29F040 mode, 02 = 29F016 mode, 03 = 29F400, 04 = 29LV800 mode 4Ah 0077h Simultaneous Operation 00 = Not Supported, X = Number of Sectors excluding Bank 1 4Bh 0000h Burst Mode Type 00 = Not Supported, 01 = Supported 4Ch 0002h Page Mode Type 00 = Not Supported, 01 = 4 Word Page, 02 = 8 Word Page 4Dh 0085h 4Eh 0095h 4Fh 0001h 50h 0001h 57h 0004h 58h 0017h 59h 0030h 5Ah 0030h 5Bh 0017h ACC (Acceleration) Supply Minimum 00h = Not Supported, D7-D4: Volt, D3-D0: 100 mV ACC (Acceleration) Supply Maximum 00h = Not Supported, D7-D4: Volt, D3-D0: 100 mV Top/Bottom Boot Sector Flag December 13, 2005 00h = Uniform device, 02h = Bottom Boot Device, 03h = Top Boot Device, 04h = Both Top and Bottom Program Suspend 0 = Not supported, 1 = Supported Bank Organization 00 = Data at 4Ah is zero, X = Number of Banks Bank 1 Region Information X = Number of Sectors in Bank 1 Bank 2 Region Information X = Number of Sectors in Bank 2 Bank 3 Region Information X = Number of Sectors in Bank 3 Bank 4 Region Information X = Number of Sectors in Bank 4 Am29PDL640G 27 D A T A S H E E T COMMAND DEFINITIONS Writing specific address and data commands or sequences into the command register initiates device operations. Table 14 defines the valid register command sequences. Writing incorrect address and data values or writing them in the improper sequence may place the device in an unknown state. A reset command is then required to return the device to reading array data. All addresses are latched on the falling edge of WE# or CE#, whichever happens later. All data is latched on the rising edge of WE# or CE#, whichever happens first. Refer to the AC Characteristics section for timing diagrams. Reading Array Data The device is automatically set to reading array data after device power-up. No commands are required to retrieve data. Each bank is ready to read array data after completing an Embedded Program or Embedded Erase algorithm. After the device accepts an Erase Suspend command, the corresponding bank enters the erase-suspend-read mode, after which the system can read data from any non-erase-suspended sector within the same bank. The system can read array data using the standard read timing, except that if it reads at an address within erase-suspended sectors, the device outputs status data. After completing a programming operation in the Erase Suspend mode, the system may once again read array data with the same exception. See the Erase Suspend/Erase Resume Commands section for more information. The system must issue the reset command to return a bank to the read (or erase-suspend-read) mode if DQ5 goes high during an active program or erase operation, or if the bank is in the autoselect mode. See the next section, Reset Command, for more information. Note that the ACC function and unlock bypass modes are not available when the SecSi Sector is enabled. See also Requirements for Reading Array Data in the Device Bus Operations section for more information. The Read-Only Operations table provides the read parameters, and Figure 12 shows the timing diagram. Reset Command Writing the reset command resets the banks to the read or erase-suspend-read mode. Address bits are don’t cares for this command. The reset command may be written between the sequence cycles in an erase command sequence before 28 erasing begins. This resets the bank to which the system was writing to the read mode. Once erasure begins, however, the device ignores reset commands until the operation is complete. The reset command may be written between the sequence cycles in a program command sequence before programming begins. This resets the bank to which the system was writing to the read mode. If the program command sequence is written to a bank that is in the Erase Suspend mode, writing the reset com man d r etur n s th at b ank to the era se-suspend-read mode. Once programming begins, however, the device ignores reset commands until the operation is complete. The reset command may be written between the sequence cycles in an autoselect command sequence. Once in the autoselect mode, the reset command must be written to return to the read mode. If a bank entered the autoselect mode while in the Erase Suspend mode, writing the reset command returns that bank to the erase-suspend-read mode. If DQ5 goes high during a program or erase operation, writing the reset command returns the banks to the read mode (or erase-suspend-read mode if that bank was in Erase Suspend). Autoselect Command Sequence The autoselect command sequence allows the host system to access the manufacturer and device codes, and determine whether or not a sector is protected. The autoselect command sequence may be written to an address within a bank that is either in the read or erase-suspend-read mode. The autoselect command may not be written while the device is actively programming or erasing in the other bank. The autoselect command sequence is initiated by first writing two unlock cycles. This is followed by a third write cycle that contains the bank address and the autoselect command. The bank then enters the autoselect mode. The system may read any number of autoselect codes without reinitiating the command sequence. Table 14 shows the address and data requirements. To determine sector protection information, the system must write to the appropriate bank address (BA) and sector address (SA). Table 4 shows the address range and bank number associated with each sector. The system must write the reset command to return to the read mode (or erase-suspend-read mode if the bank was previously in Erase Suspend). Am29PDL640G December 13, 2005 D A T A S H E E T Enter SecSi™ Sector/Exit SecSi Sector Command Sequence The SecSi Sector region provides a secured data area containing a random, eight word electronic serial number (ESN). The system can access the SecSi Sector region by issuing the three-cycle Enter SecSi Sector command sequence. The device continues to access the SecSi Sector region until the system issues the four-cycle Exit SecSi Sector command sequence. The Exit SecSi Sector command sequence returns the device to normal operation. The SecSi Sector is not accessible when the device is executing an Embedded Program or embedded Erase algorithm. Table 14 shows the address and data requirements for both command sequences. See also “SecSi™ (Secured Silicon) Sector Flash Memory Region” for further information. Note that the ACC function and unlock bypass modes are not available when the SecSi Sector is enabled. Word Program Command Sequence Programming is a four-bus-cycle operation. The program command sequence is initiated by writing two unlock write cycles, followed by the program set-up command. The program address and data are written next, which in turn initiate the Embedded Program algorithm. The system is not required to provide further controls or timings. The device automatically provides internally generated program pulses and verifies the programmed cell margin. Table 14 shows the address and data requirements for the program command sequence. When the Embedded Program algorithm is complete, that bank then returns to the read mode and addresses are no longer latched. The system can determine the status of the program operation by using DQ7, DQ6, or RY/BY#. Refer to the Write Operation Status section for information on these status bits. Any commands written to the device during the Embedded Program Algorithm are ignored. Note that a hardware reset immediately terminates the program operation. The program command sequence should be reinitiated once that bank has returned to the read mode, to ensure data integrity. Note that the SecSi Sector, autoselect, and CFI functions are unavailable when a program operation is in progress. Programming is allowed in any sequence and across sector boundaries. A bit cannot be programmed December 13, 2005 from “0” back to a “1.” Attempting to do so may cause that bank to set DQ5 = 1, or cause the DQ7 and DQ6 status bits to indicate the operation was successful. However, a succeeding read will show that the data is still “0.” Only erase operations can convert a “0” to a “1.” Unlock Bypass Command Sequence The unlock bypass feature allows the system to program data to a bank faster than using the standard program command sequence. The unlock bypass command sequence is initiated by first writing two unlock cycles. This is followed by a third write cycle containing the unlock bypass command, 20h. That bank then enters the unlock bypass mode. A two-cycle unlock bypass program command sequence is all that is required to program in this mode. The first cycle in this sequence contains the unlock bypass program command, A0h; the second cycle contains the program address and data. Additional data is programmed in the same manner. This mode dispenses with the initial two unlock cycles required in the standard program command sequence, resulting in faster total programming time. Table 14 shows the requirements for the command sequence. During the unlock bypass mode, only the Unlock Bypass Program and Unlock Bypass Reset commands are valid. To exit the unlock bypass mode, the system must issue the two-cycle unlock bypass reset command sequence. The first cycle must contain the bank address and the data 90h. The second cycle need only contain the data 00h. The bank then returns to the read mode. The device offers accelerated program operations through the WP#/ACC pin. When the system asserts VHH on the WP#/ACC pin, the device automatically enters the Unlock Bypass mode. The system may then write the two-cycle Unlock Bypass program command sequence. The device uses the higher voltage on the WP#/ACC pin to accelerate the operation. Note that the WP#/ACC pin must not be at VHH any operation other than accelerated programming, or device damage may result. In addition, the WP#/ACC pin must not be left floating or unconnected; inconsistent behavior of the device may result. Figure 4 illustrates the algorithm for the program operation. Refer to the Erase and Program Operations table in the AC Characteristics section for parameters, and Figure 15 for timing diagrams. Am29PDL640G 29 D A T A S H E E T Any commands written during the chip erase operation are ignored. However, note that a hardware reset immediately terminates the erase operation. If that occurs, the chip erase command sequence should be reinitiated once that bank has returned to reading array data, to ensure data integrity. START Figure 5 illustrates the algorithm for the erase operation. Refer to the Erase and Program Operations tables in the AC Characteristics section for parameters, and Figure 17 section for timing diagrams. Write Program Command Sequence Embedded Program algorithm in progress Data Poll from System Sector Erase Command Sequence Verify Data? Sector erase is a six bus cycle operation. The sector erase command sequence is initiated by writing two unlock cycles, followed by a set-up command. Two additional unlock cycles are written, and are then followed by the address of the sector to be erased, and the sector erase command.Table 14 shows the address and data requirements for the sector erase command sequence. No Yes Increment Address No The device does not require the system to preprogram prior to erase. The Embedded Erase algorithm automatically programs and verifies the entire memory for an all zero data pattern prior to electrical erase. The system is not required to provide any controls or timings during these operations. Last Address? Yes Programming Completed Note: See Table 14 for program command sequence. Figure 4. Program Operation Chip Erase Command Sequence Chip erase is a six bus cycle operation. The chip erase command sequence is initiated by writing two unlock cycles, followed by a set-up command. Two additional unlock write cycles are then followed by the chip erase command, which in turn invokes the Embedded Erase algorithm. The device does not require the system to preprogram prior to erase. The Embedded Erase algorithm automatically preprograms and verifies the entire memory for an all zero data pattern prior to electrical erase. The system is not required to provide any controls or timings during these operations. Table 14 shows the address and data requirements for the chip erase command sequence. When the Embedded Erase algorithm is complete, that bank returns to the read mode and addresses are no longer latched. The system can determine the status of the erase operation by using DQ7, DQ6, DQ2, or RY/BY#. Refer to the Write Operation Status section for information on these status bits. Note that the SecSi Sector, autoselect, and CFI functions are unavailable when an erase operation is in progress. 30 After the command sequence is written, a sector erase time-out of 80 µs occurs. During the time-out period, additional sector addresses and sector erase commands may be written. Loading the sector erase buffer may be done in any sequence, and the number of sectors may be from one sector to all sectors. The time between these additional cycles must be less than 80 µs, otherwise erasure may begin. Any sector erase address and command following the exceeded time-out may or may not be accepted. It is recommended that processor interrupts be disabled during this time to ensure all commands are accepted. The interrupts can be re-enabled after the last Sector Erase command is written. Any command other than Sector Erase or Erase Suspend during the time-out period resets that bank to the read mode. The system must rewrite the command sequence and any additional addresses and commands. Note that the SecSi Sector, autoselect, and CFI functions are unavailable when an erase operation is in progress. The system can monitor DQ3 to determine if the sector erase timer has timed out (See the section on DQ3: Sector Erase Timer.). The time-out begins from the rising edge of the final WE# pulse in the command sequence. When the Embedded Erase algorithm is complete, the bank returns to reading array data and addresses are no longer latched. Note that while the Embedded Erase operation is in progress, the system can read Am29PDL640G December 13, 2005 D A T A S H E E T data from the non-erasing bank. The system can determine the status of the erase operation by reading DQ7, DQ6, DQ2, or RY/BY# in the erasing bank. Refer to the Write Operation Status section for information on these status bits. Once the sector erase operation has begun, only the Erase Suspend command is valid. All other commands are ignored. However, note that a hardware reset immediately terminates the erase operation. If that occurs, the sector erase command sequence should be reinitiated once that bank has returned to reading array data, to ensure data integrity. Figure 5 illustrates the algorithm for the erase operation. Refer to the Erase and Program Operations tables in the AC Characteristics section for parameters, and Figure 17 section for timing diagrams. In the erase-suspend-read mode, the system can also issue the autoselect command sequence. The device allows reading autoselect codes even at addresses within erasing sectors, since the codes are not stored in the memory array. When the device exits the autoselect mode, the device reverts to the Erase Suspend mode, and is ready for another valid operation. Refer to the Autoselect Mode and Autoselect Command Sequence sections for details. To resume the sector erase operation, the system must write the Erase Resume command (address bits are don’t care). The bank address of the erase-suspended bank is required when writing this command. Further writes of the Resume command are ignored. Another Erase Suspend command can be written after the chip has resumed erasing. Erase Suspend/Erase Resume Commands START The Erase Suspend command, B0h, allows the system to interrupt a sector erase operation and then read data from, or program data to, any sector not selected for erasure. The bank address is required when writing this command. This command is valid only during the sector erase operation, including the 80 µs time-out period during the sector erase command sequence. The Erase Suspend command is ignored if written during the chip erase operation or Embedded Program algorithm. Write Erase Command Sequence (Notes 1, 2) Data Poll to Erasing Bank from System When the Erase Suspend command is written during the sector erase operation, the device requires a maximum of 20 µs to suspend the erase operation. However, when the Erase Suspend command is written during the sector erase time-out, the device immediately terminates the time-out period and suspends the erase operation. Addresses are “don’t-cares” when writing the Erase suspend command. No Embedded Erase algorithm in progress Data = FFh? Yes Erasure Completed After the erase operation has been suspended, the bank enters the erase-suspend-read mode. The system can read data from or program data to any sector not selected for erasure. (The device “erase suspends” all sectors selected for erasure.) Reading at any address within erase-suspended sectors produces status information on DQ7–DQ0. The system can use DQ7, or DQ6 and DQ2 together, to determine if a sector is actively erasing or is erase-suspended. Refer to the Write Operation Status section for information on these status bits. Password Program Command After an erase-suspended program operation is complete, the bank returns to the erase-suspend-read mode. The system can determine the status of the program operation using the DQ7 or DQ6 status bits, just as in the standard Word Program operation. Refer to the Write Operation Status section for more information. The Password Program Command permits programming the password that is used as part of the hardware protection scheme. The actual password is 64-bits long. Four Password Program commands are required to program the password. The system must enter the unlock cycle, password program command (38h) and the program address/data for each portion December 13, 2005 Notes: 1. See Table 14 for erase command sequence. 2. See the section on DQ3 for information on the sector erase timer. Figure 5. Am29PDL640G Erase Operation 31 D A T A S H E E T of the password when programming. There are no provisions for entering the 2-cycle unlock cycle, the password program command, and all the password data. There is no special addressing order required for programming the password. Also, when the password is undergoing programming, Simultaneous Operation is disabled. Read operations to any memory location will return the programming status. Once programming is complete, the user must issue a Read/Reset command to return the device to normal operation. Once the Password is written and verified, the Password Mode Locking Bit must be set in order to prevent verification. The Password Program Command is only capable of programming “0”s. Programming a “1” after a cell is programmed as a “0” results in a time-out by the Embedded Program Algorithm™ with the cell remaining as a “0”. The password is all ones when shipped from the factory. All 64-bit password combinations are valid as a password. Persistent Sector Protection Mode Locking Bit Program Command Password Verify Command The SecSi Sector Protection Bit Program Command programs the SecSi Sector Protection Bit, which prevents the SecSi sector memory from being cleared. If the SecSi Sector Protection Bit is verified as programmed without margin, the SecSi Sector Protection Bit Program Command should be reissued to improve program margin. Exiting the VCC -level SecSi Sector Protection Bit Program Command is accomplished by writing the Read/Reset command. The Password Verify Command is used to verify the Password. The Password is verifiable only when the Password Mode Locking Bit is not programmed. If the Password Mode Locking Bit is programmed and the user attempts to verify the Password, the device will always drive all F’s onto the DQ data bus. The Password Verify command is permitted if the SecSi sector is enabled. Also, the device will not operate in Simultaneous Operation when the Password Verify command is executed. Only the password is returned regardless of the bank address. The lower two address bits (A1-A0) are valid during the Password Verify. Writing the Read/Reset command returns the device back to normal operation. Password Protection Mode Locking Bit Program Command The Password Protection Mode Locking Bit Program Command programs the Password Protection Mode Locking Bit, which prevents further verifies or updates to the Password. Once programmed, the Password Protection Mode Locking Bit cannot be erased! If the Password Protection Mode Locking Bit is verified as program without margin, the Password Protection Mode Locking Bit Program command can be executed to improve the program margin. Once the Password Protection Mode Locking Bit is programmed, the Persistent Sector Protection Locking Bit program circuitry is disabled, thereby forcing the device to remain in the Password Protection mode. Exiting the Mode Locking Bit Program command is accomplished by writing the Read/Reset command. 32 The Persistent Sector Protection Mode Locking Bit Program Command programs the Persistent Sector Protection Mode Locking Bit, which prevents the Password Mode Locking Bit from ever being programmed. If the Persistent Sector Protection Mode Locking Bit is verified as programmed without margin, the Persistent Sector Protection Mode Locking Bit Program Command should be reissued to improve program margin. By disabling the program circuitry of the Password Mode Locking Bit, the device is forced to remain in the Persistent Sector Protection mode of operation, once this bit is set. Exiting the Persistent Protection Mode Locking Bit Program command is accomplished by writing the Read/Reset command. SecSi Sector Protection Bit Program Command PPB Lock Bit Set Command The PPB Lock Bit Set command is used to set the PPB Lock bit if it is cleared either at reset or if the Password Unlock command was successfully executed. There is no PPB Lock Bit Clear command. Once the PPB Lock Bit is set, it cannot be cleared unless the device is taken through a power-on clear or the Password Unlock command is executed. Upon setting the PPB Lock Bit, the PPBs are latched into the DYBs. If the Password Mode Locking Bit is set, the PPB Lock Bit status is reflected as set, even after a power-on reset cycle. Exiting the PPB Lock Bit Set command is accomplished by writing the Read/Reset command (only in the Persistent Protection Mode). DYB Write Command The DYB Write command is used to set or clear a DYB for a given sector. The high order address bits (A21–A12) are issued at the same time as the code 01h or 00h on DQ7-DQ0. All other DQ data bus pins are ignored during the data write cycle. The DYBs are modifiable at any time, regardless of the state of the PPB or PPB Lock Bit. The DYBs are cleared at power-up or hardware reset.Exiting the DYB Write command is accomplished by writing the Read/Reset command. Am29PDL640G December 13, 2005 D A T A S H E E T Password Unlock Command The Password Unlock command is used to clear the PPB Lock Bit so that the PPBs can be unlocked for modification, thereby allowing the PPBs to become accessible for modification. The exact password must be entered in order for the unlocking function to occur. This command cannot be issued any faster than 2 µs at a time to prevent a hacker from running through all 64-bit combinations in an attempt to correctly match a password. If the command is issued before the 2 µs execution window for each portion of the unlock, the command will be ignored. Once the Password Unlock command is entered, the RY/BY# indicates that the device is busy. Approximately 2 µs is required for each portion of the unlock. Once the first portion of the password unlock completes (RY/BY# is not low or DQ6 does not toggle when read), the Password Unlock command and next part of the password are written. The system must thus monitor RY/BY# or the status bits to confirm when to write the next portion of the password. Note that immediately following successful unlock, write the SecSi Sector exit command before attempting to verify, program, or erase the PPBs. PPB Program Command The PPB Program command is used to program, or set, a given PPB. Each PPB is individually programmed (but is bulk erased with the other PPBs). The specific sector address (A21–A12) are written at the same time as the program command 60h with A6 = 0. If the PPB Lock Bit is set and the corresponding PPB is set for the sector, the PPB Program command will not execute and the command will time-out without programming the PPB. After programming a PPB, two additional cycles are needed to determine whether the PPB has been programmed with margin. If the PPB has been programmed without margin, the program command should be reissued to improve the program margin. Also note that the total number of PPB program/erase cycles is limited to 100 cycles. Cycling the PPBs beyond 100 cycles is not guaranteed. The PPB Program command does not follow the Embedded Program algorithm. All PPB Erase Command The All PPB Erase command is used to erase all PPBs in bulk. There is no means for individually erasing a specific PPB. Unlike the PPB program, no specific sector address is required. However, when the PPB erase command is written all Sector PPBs are erased in parallel. If the PPB Lock Bit is set the ALL PPB Erase command will not execute and the command will time-out without erasing the PPBs. After December 13, 2005 erasing the PPBs, two additional cycles are needed to determine whether the PPB has been erased with margin. If the PPBs has been erased without margin, the erase command should be reissued to improve the program margin. It is the responsibility of the user to preprogram all PPBs prior to issuing the All PPB Erase command. If the user attempts to erase a cleared PPB, over-erasure may occur making it difficult to program the PPB at a later time. Also note that the total number of PPB program/erase cycles is limited to 100 cycles. Cycling the PPBs beyond 100 cycles is not guaranteed. DYB Write Command The DYB Write command is used for setting the DYB, which is a volatile bit that is cleared at reset. There is one DYB per sector. If the PPB is set, the sector is protected regardless of the value of the DYB. If the PPB is cleared, setting the DYB to a 1 protects the sector from programs or erases. Since this is a volatile bit, removing power or resetting the device will clear the DYBs. The bank address is latched when the command is written. PPB Lock Bit Set Command The PPB Lock Bit set command is used for setting the DYB, which is a volatile bit that is cleared at reset. There is one DYB per sector. If the PPB is set, the sector is protected regardless of the value of the DYB. If the PPB is cleared, setting the DYB to a 1 protects the sector from programs or erases. Since this is a volatile bit, removing power or resetting the device will clear the DYBs. The bank address is latched when the command is written. PPB Status Command The programming of the PPB for a given sector can be verified by writing a PPB status verify command to the device. PPB Lock Bit Status Command The programming of the PPB Lock Bit for a given sector can be verified by writing a PPB Lock Bit status verify command to the device. Note that immediately following the PPB Lock Status Command write the SecSi Sector Exit command before attempting to verify, program, or erase the PPBs. Sector Protection Status Command The programming of either the PPB or DYB for a given sector or sector group can be verified by writing a Sector Protection Status command to the device. Note that there is no single command to independently verify the programming of a DYB for a given sector group. Am29PDL640G 33 D A T A S H E E T Command Definitions Tables Table 14. Memory Array Command Definitions Cycles Bus Cycles (Notes 1–4) Command (Notes) Read (5) 1 RA Reset (6) 1 XXX F0 Manufacturer ID 4 555 AA 2AA 55 Device ID (10) 6 555 AA 2AA 55 Autoselect (Note 7) Addr Data Addr Data Addr Data Addr Data (BA) 555 90 (BA)X00 01 (BA) 555 90 (BA)X01 7E Addr Data Addr Data (BA)X0E 15 (BA)X0F 01 RD SecSi Sector Factory Protect (8) 4 555 AA 2AA 55 (BA) 555 90 X03 (see note 8) Sector Group Protect Verify (9) 4 555 AA 2AA 55 (BA) 555 90 (SA)X02 XX00/ XX01 Program 4 555 AA 2AA 55 555 A0 PA PD Chip Erase 6 555 AA 2AA 55 555 80 555 AA 2AA 55 555 10 Sector Erase 6 555 AA 2AA 55 555 80 555 AA 2AA 55 SA 30 Program/Erase Suspend (11) 1 BA B0 Program/Erase Resume (12) 1 BA 30 CFI Query (13) 1 55 98 Accelerated Program (14) 2 XX A0 PA PD Unlock Bypass Entry (15) 3 555 AA 2AA 55 555 20 Unlock Bypass Program (15) 2 XX A0 PA PD XX 10 XX 00 Unlock Bypass Erase (15) 2 XX 80 Unlock Bypass CFI (13, 15) 1 XX 98 Unlock Bypass Reset (15) 2 XX 90 Legend: BA = Address of bank switching to autoselect mode, bypass mode, or erase operation. Determined by A21:A19, see Tables 4 and 5 for more detail. PA = Program Address (A21:A0). Addresses latch on falling edge of WE# or CE# pulse, whichever happens later. PD = Program Data (DQ15:DQ0) written to location PA. Data latches on rising edge of WE# or CE# pulse, whichever happens first. Notes: 1. See Table 1 for description of bus operations. 2. All values are in hexadecimal. RA = Read Address (A21:A0). RD = Read Data (DQ15:DQ0) from location RA. SA = Sector Address (A21:A12) for verifying (in autoselect mode) or erasing. WD = Write Data. See “Configuration Register” definition for specific write data. Data latched on rising edge of WE#. X = Don’t care 8. The data is 80h for factory locked and 00h for not factory locked. 9. The data is 00h for an unprotected sector group and 01h for a protected sector group. 3. Shaded cells in table denote read cycles. All other cycles are write operations. 10. Device ID must be read across cycles 4, 5, and 6. 4. During unlock and command cycles, when lower address bits are 555 or 2AAh as shown in table, address bits higher than A11 (except where BA is required) and data bits higher than DQ7 are don’t cares. 11. System may read and program in non-erasing sectors, or enter autoselect mode, when in Program/Erase Suspend mode. Program/Erase Suspend command is valid only during a sector erase operation, and requires bank address. 5. No unlock or command cycles required when bank is reading array data. 12. Program/Erase Resume command is valid only during Erase Suspend mode, and requires bank address. 6. The Reset command is required to return to reading array (or to erase-suspend-read mode if previously in Erase Suspend) when bank is in autoselect mode, or if DQ5 goes high (while bank is providing status information). 13. Command is valid when device is ready to read array data or when device is in autoselect mode. 7. 34 Fourth cycle of autoselect command sequence is a read cycle. System must provide bank address to obtain manufacturer ID or device ID information. See Autoselect Command Sequence section for more information. 14. WP#/ACC must be at VID during the entire operation of command. 15. Unlock Bypass Entry command is required prior to any Unlock Bypass operation. Unlock Bypass Reset command is required to return to the reading array. Am29PDL640G December 13, 2005 D A T A S H E E T Sector Protection Command Definitions Command (Notes) Cycles Table 15. Addr Data Addr Data Addr Data Reset 1 XXX F0 SecSi Sector Entry 3 555 AA 2AA 55 555 88 SecSi Sector Exit 4 555 AA 2AA 55 555 90 XX 00 SecSi Protection Bit Program (5, 6) 6 555 AA 2AA 55 555 60 OW 68 SecSi Protection Bit Status 4 555 AA 2AA 55 555 60 OW RD(0) XX[0-3] PD[0-3] Bus Cycles (Notes 1-4) Addr Data Addr Data Addr Data OW 48 OW RD(0) Password Program (5, 7, 8) 4 555 AA 2AA 55 555 38 Password Verify (8, 9) 4 555 AA 2AA 55 555 C8 PWA[0-3] PWD[0-3] Password Unlock (7, 10, 11, 17) 4 555 AA 2AA 55 555 28 PWA[0-3] PWD[0-3] PPB Program (5, 6, 12) 6 555 AA 2AA 55 555 60 (SA)WP 68 (SA)WP 48 (SA)WP RD(0) All PPB Erase (5, 13, 14) 6 555 AA 2AA 55 555 60 EP 60 (SA)EP 40 (SA)WP RD(0) PPB Lock Bit Set 3 555 AA 2AA 55 555 78 PL 48 PL RD(0) SL 48 SL RD(0) PPB Lock Bit Status (15, 18) 4 555 AA 2AA 55 555 58 SA RD(1) DYB Write (7) 4 555 AA 2AA 55 555 48 SA X1 DYB Erase (7) 4 555 AA 2AA 55 555 48 SA X0 DYB Status 4 555 AA 2AA 55 555 58 SA RD(0) PPMLB Program (5, 6, 12) 6 555 AA 2AA 55 555 60 PL 68 PPMLB Status (5) 4 555 AA 2AA 55 555 60 PL RD(0) SPMLB Program (5, 6, 12) 6 555 AA 2AA 55 555 60 SL 68 SPMLB Status (5) 4 555 AA 2AA 55 555 60 SL RD(0) Legend: DYB = Dynamic Protection Bit OW = Address (A6:A0) is (0011010) PD[3:0] = Password Data (1 of 4 portions) PPB = Persistent Protection Bit PWA = Password Address. A1:A0 selects portion of password. PWD = Password Data being verified. PL = Password Protection Mode Lock Address (A5:A0) is (001010) RD(0) = Read Data DQ0 for protection indicator bit. RD(1) = Read Data DQ1 for PPB Lock status. SA = Sector Address where security command applies. Address bits A21:A12 uniquely select any sector. SL = Persistent Protection Mode Lock Address (A5:A0) is (010010) WP = PPB Address (A6:A0) is (0111010) (Note 16) EP = PPB Erase Address (A6:A0) is (1111010) (Note 16) X = Don’t care PPMLB = Password Protection Mode Locking Bit SPMLB = Persistent Protection Mode Locking Bit 1. See Table 1 for description of bus operations. 11. A 2 µs timeout is required between any two portions of password. 2. All values are in hexadecimal. 12. A 100 µs timeout is required between cycles 4 and 5. 3. Shaded cells in table denote read cycles. All other cycles are write operations. 13. A 1.2 ms timeout is required between cycles 4 and 5. 4. During unlock and command cycles, when lower address bits are 555 or 2AAh as shown in table, address bits higher than A11 (except where BA is required) and data bits higher than DQ7 are don’t cares. 14. Cycle 4 erases all PPBs. Cycles 5 and 6 validate bits have been fully erased when DQ0 = 0. If DQ0 = 1 in cycle 6, erase command must be issued and verified again. Before issuing erase command, all PPBs should be programmed to prevent PPB overerasure. 5. The reset command returns device to reading array. 15. DQ1 = 1 if PPB locked, 0 if unlocked. 6. Cycle 4 programs the addressed locking bit. Cycles 5 and 6 validate bit has been fully programmed when DQ0 = 1. If DQ0 = 0 in cycle 6, program command must be issued and verified again. 16. For all other parts that use the Persistent Protection Bit (excluding PDL128G), the WP and EP addresses are 00000010. 7. Data is latched on the rising edge of WE#. 8. Entire command sequence must be entered for each portion of password. 9. Command sequence returns FFh if PPMLB is set. 10. The password is written over four consecutive cycles, at addresses 0-3. December 13, 2005 17. Immediately following successful unlock, write the SecSi Sector Exit command before attempting to verify, program, or erase the PPBs. 18. Immediately following the PPB Lock Status command write the SecSi Sector Exit command before attempting to verify, program, or erase the PPBs. Am29PDL640G 35 D A T A S H E E T WRITE OPERATION STATUS The device provides several bits to determine the status of a program or erase operation: DQ2, DQ3, DQ5, DQ6, and DQ7. Table 16 and the following subsections describe the function of these bits. DQ7 and DQ6 each offer a method for determining whether a program or erase operation is complete or in progress. The device also provides a hardware-based output signal, RY/BY#, to determine whether an Embedded Program or Erase operation is in progress or has been completed. pleted the program or erase operation and DQ7 has valid data, the data outputs on DQ15–DQ0 may be still invalid. Valid data on DQ15–DQ0 will appear on successive read cycles. Table 16 shows the outputs for Data# Polling on DQ7. Figure 6 shows the Data# Polling algorithm. Figure 19 in the AC Characteristics section shows the Data# Polling timing diagram. DQ7: Data# Polling The Data# Polling bit, DQ7, indicates to the host system whether an Embedded Program or Erase algorithm is in progress or completed, or whether a bank is in Erase Suspend. Data# Polling is valid after the rising edge of the final WE# pulse in the command sequence. During the Embedded Program algorithm, the device outputs on DQ7 the complement of the datum programmed to DQ7. This DQ7 status also applies to programming during Erase Suspend. When the Embedded Program algorithm is complete, the device outputs the datum programmed to DQ7. The system must provide the program address to read valid status information on DQ7. If a program address falls within a protected sector, Data# Polling on DQ7 is active for approximately 1 µs, then that bank returns to the read mode. START Read DQ7–DQ0 Addr = VA DQ7 = Data? No No During the Embedded Erase algorithm, Data# Polling produces a “0” on DQ7. When the Embedded Erase algorithm is complete, or if the bank enters the Erase Suspend mode, Data# Polling produces a “1” on DQ7. The system must provide an address within any of the sectors selected for erasure to read valid status information on DQ7. 36 DQ5 = 1? Yes Read DQ7–DQ0 Addr = VA After an erase command sequence is written, if all sectors selected for erasing are protected, Data# Polling on DQ7 is active for approximately 100 µs, then the bank returns to the read mode. If not all selected sectors are protected, the Embedded Erase algorithm erases the unprotected sectors, and ignores the selected sectors that are protected. However, if the system reads DQ7 at an address within a protected sector, the status may not be valid. When the system detects DQ7 has changed from the complement to true data, it can read valid data at DQ15–DQ0 on the following read cycles. Just prior to the completion of an Embedded Program or Erase operation, DQ7 may change asynchronously with DQ15–DQ0 while Output Enable (OE#) is asserted low. That is, the device may change from providing status information to valid data on DQ7. Depending on when the system samples the DQ7 output, it may read the status or valid data. Even if the device has com- Yes DQ7 = Data? Yes No FAIL PASS Notes: 1. VA = Valid address for programming. During a sector erase operation, a valid address is any sector address within the sector being erased. During chip erase, a valid address is any non-protected sector address. 2. DQ7 should be rechecked even if DQ5 = “1” because DQ7 may change simultaneously with DQ5. Am29PDL640G Figure 6. Data# Polling Algorithm December 13, 2005 D A T A S H E E T RY/BY#: Ready/Busy# The RY/BY# is a dedicated, open-drain output pin which indicates whether an Embedded Algorithm is in progress or complete. The RY/BY# status is valid after the rising edge of the final WE# pulse in the command sequence. Since RY/BY# is an open-drain output, several RY/BY# pins can be tied together in parallel with a pull-up resistor to VCC. If the output is low (Busy), the device is actively erasing or programming. (This includes programming in the Erase Suspend mode.) If the output is high (Ready), the device is in the read mode, the standby mode, or one of the banks is in the erase-suspend-read mode. DQ6 also toggles during the erase-suspend-program mode, and stops toggling once the Embedded Program algorithm is complete. Table 16 shows the outputs for Toggle Bit I on DQ6. Figure 7 shows the toggle bit algorithm. Figure 20 in the “AC Characteristics” section shows the toggle bit timing diagrams. Figure 21 shows the differences between DQ2 and DQ6 in graphical form. See also the subsection on DQ2: Toggle Bit II. START Table 16 shows the outputs for RY/BY#. Read Byte (DQ7–DQ0) Address =VA DQ6: Toggle Bit I Toggle Bit I on DQ6 indicates whether an Embedded Program or Erase algorithm is in progress or complete, or whether the device has entered the Erase Suspend mode. Toggle Bit I may be read at any address, and is valid after the rising edge of the final WE# pulse in the command sequence (prior to the program or erase operation), and during the sector erase time-out. During an Embedded Program or Erase algorithm operation, successive read cycles to any address cause DQ6 to toggle. The system may use either OE# or CE# to control the read cycles. When the operation is complete, DQ6 stops toggling. Read Byte (DQ7–DQ0) Address =VA Toggle Bit = Toggle? Yes No After an erase command sequence is written, if all sectors selected for erasing are protected, DQ6 toggles for approximately 100 µs, then returns to reading array data. If not all selected sectors are protected, the Embedded Erase algorithm erases the unprotected sectors, and ignores the selected sectors that are protected. DQ5 = 1? Yes Read Byte Twice (DQ7–DQ0) Address = VA The system can use DQ6 and DQ2 together to determine whether a sector is actively erasing or is erase-suspended. When the device is actively erasing (that is, the Embedded Erase algorithm is in progress), DQ6 toggles. When the device enters the Erase Suspend mode, DQ6 stops toggling. However, the system must also use DQ2 to determine which sectors are erasing or erase-suspended. Alternatively, the system can use DQ7 (see the subsection on DQ7: Data# Polling). If a program address falls within a protected sector, DQ6 toggles for approximately 1 µs after the program command sequence is written, then returns to reading array data. Toggle Bit = Toggle? No Yes Program/Erase Operation Not Complete, Write Reset Command Program/Erase Operation Complete Note: The system should recheck the toggle bit even if DQ5 = “1” because the toggle bit may stop toggling as DQ5 changes to “1.” See the subsections on DQ6 and DQ2 for more information. Figure 7. December 13, 2005 No Am29PDL640G Toggle Bit Algorithm 37 D A T A S H E E T DQ2: Toggle Bit II The “Toggle Bit II” on DQ2, when used with DQ6, indicates whether a particular sector is actively erasing (that is, the Embedded Erase algorithm is in progress), or whether that sector is erase-suspended. Toggle Bit II is valid after the rising edge of the final WE# pulse in the command sequence. the toggle bit and DQ5 through successive read cycles, determining the status as described in the previous paragraph. Alternatively, it may choose to perform other system tasks. In this case, the system must start at the beginning of the algorithm when it returns to determine the status of the operation (top of Figure 7). DQ5: Exceeded Timing Limits DQ2 toggles when the system reads at addresses within those sectors that have been selected for erasure. (The system may use either OE# or CE# to control the read cycles.) But DQ2 cannot distinguish whether the sector is actively erasing or is erase-suspended. DQ6, by comparison, indicates whether the device is actively erasing, or is in Erase Suspend, but cannot distinguish which sectors are selected for erasure. Thus, both status bits are required for sector and mode information. Refer to Table 16 to compare outputs for DQ2 and DQ6. DQ5 indicates whether the program or erase time has exceeded a specified internal pulse count limit. Under these conditions DQ5 produces a “1,” indicating that the program or erase cycle was not successfully completed. Figure 7 shows the toggle bit algorithm in flowchart form, and the section “DQ2: Toggle Bit II” explains the algorithm. See also the DQ6: Toggle Bit I subsection. Figure 20 shows the toggle bit timing diagram. Figure 21 shows the differences between DQ2 and DQ6 in graphical form. Under both these conditions, the system must write the reset command to return to the read mode (or to the erase-suspend-read mode if a bank was previously in the erase-suspend-program mode). Reading Toggle Bits DQ6/DQ2 Refer to Figure 7 for the following discussion. Whenever the system initially begins reading toggle bit status, it must read DQ15–DQ0 at least twice in a row to determine whether a toggle bit is toggling. Typically, the system would note and store the value of the toggle bit after the first read. After the second read, the system would compare the new value of the toggle bit with the first. If the toggle bit is not toggling, the device has completed the program or erase operation. The system can read array data on DQ15–DQ0 on the following read cycle. However, if after the initial two read cycles, the system determines that the toggle bit is still toggling, the system also should note whether the value of DQ5 is high (see the section on DQ5). If it is, the system should then determine again whether the toggle bit is toggling, since the toggle bit may have stopped toggling just as DQ5 went high. If the toggle bit is no longer toggling, the device has successfully completed the program or erase operation. If it is still toggling, the device did not completed the operation successfully, and the system must write the reset command to return to reading array data. The remaining scenario is that the system initially determines that the toggle bit is toggling and DQ5 has not gone high. The system may continue to monitor 38 The device may output a “1” on DQ5 if the system tries to program a “1” to a location that was previously programmed to “0.” Only an erase operation can change a “0” back to a “1.” Under this condition, the device halts the operation, and when the timing limit has been exceeded, DQ5 produces a “1.” DQ3: Sector Erase Timer After writing a sector erase command sequence, the system may read DQ3 to determine whether or not erasure has begun. (The sector erase timer does not apply to the chip erase command.) If additional sectors are selected for erasure, the entire time-out also applies after each additional sector erase command. When the time-out period is complete, DQ3 switches from a “0” to a “1.” If the time between additional sector erase commands from the system can be assumed to be less than 50 µs, the system need not monitor DQ3. See also the Sector Erase Command Sequence section. After the sector erase command is written, the system should read the status of DQ7 (Data# Polling) or DQ6 (Toggle Bit I) to ensure that the device has accepted the command sequence, and then read DQ3. If DQ3 is “1,” the Embedded Erase algorithm has begun; all further commands (except Erase Suspend) are ignored until the erase operation is complete. If DQ3 is “0,” the device will accept additional sector erase commands. To ensure the command has been accepted, the system software should check the status of DQ3 prior to and following each subsequent sector erase command. If DQ3 is high on the second status check, the last command might not have been accepted. Table 16 shows the status of DQ3 relative to the other status bits. Am29PDL640G December 13, 2005 D A T A S H E E T Table 16. Standard Mode Erase Suspend Mode Status Embedded Program Algorithm Embedded Erase Algorithm Erase Erase-Suspend- Suspended Sector Read Non-Erase Suspended Sector Erase-Suspend-Program Write Operation Status DQ7 (Note 2) DQ7# 0 DQ6 Toggle Toggle DQ5 (Note 1) 0 0 DQ3 N/A 1 DQ2 (Note 2) No toggle Toggle RY/BY# 0 0 1 No toggle 0 N/A Toggle 1 Data Data Data Data Data 1 DQ7# Toggle 0 N/A N/A 0 Notes: 1. DQ5 switches to ‘1’ when an Embedded Program or Embedded Erase operation has exceeded the maximum timing limits. Refer to the section on DQ5 for more information. 2. DQ7 and DQ2 require a valid address when reading status information. Refer to the appropriate subsection for further details. 3. When reading write operation status bits, the system must always provide the bank address where the Embedded Algorithm is in progress. The device outputs array data if the system addresses a non-busy bank. December 13, 2005 Am29PDL640G 39 D A T A S H E E T ABSOLUTE MAXIMUM RATINGS Storage Temperature Plastic Packages . . . . . . . . . . . . . . . –65°C to +150°C 20 ns Ambient Temperature with Power Applied. . . . . . . . . . . . . . –65°C to +125°C +0.8 V Voltage with Respect to Ground –0.5 V VCC (Note 1) . . . . . . . . . . . . . . . . . –0.5 V to +4.0 V A9, OE#, and RESET# (Note 2) . . . . . . . . . . . . . . . . . . . . –0.5 V to +12.5 V 20 ns –2.0 V 20 ns WP#/ACC (Note 2) . . . . . . . . . . . –0.5 V to +10.5 V All other pins (Note 1) . . . . . . –0.5 V to VCC +0.5 V Figure 8. Maximum Negative Overshoot Waveform Output Short Circuit Current (Note 3) . . . . . . 200 mA Notes: 1. Minimum DC voltage on input or I/O pins is –0.5 V. Dur ing voltage transitions, input or I/O pins may overshoot V SS to –2.0 V for periods of up to 20 ns. Maximum DC voltage on input or I/O pins is VCC +0.5 V. See Figure 8. During voltage transitions, input or I/O pins may overshoot to VCC +2.0 V for periods up to 20 ns. See Figure 9. 2. Minimum DC input voltage on pins A9, OE#, RESET#, and WP#/ACC is –0.5 V. During voltage transitions, A9, OE#, WP#/ACC, and RESET# may overshoot V SS to –2.0 V for periods of up to 20 ns. See Figure 8. Maximum DC input voltage on pin A9, OE#, and RESET# is +12.5 V which may overshoot to +14.0 V for periods up to 20 ns. Maximum DC input voltage on WP#/ACC is +9.5 V which may overshoot to +12.0 V for periods up to 20 ns. 20 ns VCC +2.0 V VCC +0.5 V 2.0 V 20 ns 20 ns Figure 9. Maximum Positive Overshoot Waveform 3. No more than one output may be shorted to ground at a time. Duration of the short circuit should not be greater than one second. Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this data sheet is not implied. Exposure of the device to absolute maximum rating conditions for extended periods may affect device reliability. OPERATING RANGES Supply Voltages Industrial (I) Devices VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.7–3.1 V Ambient Temperature (TA) . . . . . . . . . –40°C to +85°C VIO (see Note) . . . . . . . . . . . 1.65–1.95 V or 2.7–3.1 V Note: For all AC and DC specifications, VIO = VCC; contact AMD for other VIO options. Operating ranges define those limits between which the functionality of the device is guaranteed. 40 Am29PDL640G December 13, 2005 D A T A S H E E T DC CHARACTERISTICS CMOS Compatible Parameter Symbol Parameter Description Test Conditions ILI Input Load Current VIN = VSS to VCC, VCC = VCC max ILIT A9, OE#, RESET# Input Load Current VCC = VCC max; VID= 12.5 V ILO Output Leakage Current VOUT = VSS to VCC, OE# = VIH VCC = VCC max ICC1 VCC Active Read Current (Notes 1, 2) CE# = VIL, OE# = VIH, VCC = VCC max ICC2 VCC Active Write Current (Notes 2, 3) CE# = VIL, OE# = VIH, WE# = VIL Min Typ Max Unit ±1.0 µA 35 µA ±1.0 µA 5 MHz 10 20 10 MHz 25 45 15 30 mA mA ICC3 VCC Standby Current (Note 2) CE#, RESET#, WP#/ACC = VIO ± 0.3 V 1 5 µA ICC4 VCC Reset Current (Note 2) RESET# = VSS ± 0.3 V 1 5 µA ICC5 Automatic Sleep Mode (Notes 2, 4) VIH = VIO ± 0.3 V; VIL = VSS ± 0.3 V 1 5 µA ICC6 VCC Active Read-While-Program Current (Notes 1, 2) CE# = VIL, OE# = VIH Word 21 45 mA ICC7 VCC Active Read-While-Erase Current (Notes 1, 2) CE# = VIL, OE# = VIH Word 21 45 mA ICC8 VCC Active Program-While-EraseSuspended Current (Notes 2, 5) CE# = VIL, OE# = VIH 17 35 mA VIL Input Low Voltage VIH Input High Voltage VHH Voltage for ACC Program Acceleration VID Voltage for Autoselect and Temporary Sector Unprotect VOL Output Low Voltage VOH Output High Voltage VIO = 1.65–1.95 V –0.4 0.4 V VIO = 2.7–3.1 V –0.5 0.8 V VIO–0.4 VIO+0.4 V 2 VCC+0.3 V VCC = 3.0 V ± 10% 8.5 9.5 V VCC = 3.0 V ± 10% 11.5 12.5 V VIO = 1.65–1.95 V VIO = 2.7–3.1 V IOL = 100 µA, VCC = VCC min, VIO = 1.65–1.95 V 0.1 V IOL = 4.0 mA, VCC = VCC min, VIO = 2.7–3.1 V 0.4 V IOH = –100 µA, VCC = VCC min, VIO = 1.65–1.95 V IOH = –2.0 mA, VCC = VCC min, VIO = 2.7–3.1 V VLKO Low VCC Lock-Out Voltage (Note 5) V 2.4 V 2.3 Notes: 1. The ICC current listed is typically less than 2 mA/MHz, with OE# at VIH. 2. Maximum ICC specifications are tested with VCC = VCCmax. 3. ICC active while Embedded Erase or Embedded Program is in progress. December 13, 2005 VIO–0.1 2.5 V 4. Automatic sleep mode enables the low power mode when addresses remain stable for tACC + 30 ns. Typical sleep mode current is 200 nA. 5. Not 100% tested. Am29PDL640G 41 D A T A S H E E T TEST CONDITIONS Table 17. 3.0 V Test Condition 2.7 kΩ Device Under Test Test Specifications 63, 98 Output Load 30 Input Rise and Fall Times 6.2 kΩ Figure 10. 70 pF 5 ns 0.0–3.0 V Input timing measurement reference levels 1.5 V Output timing measurement reference levels 1.5 V Input Pulse Levels Note: Diodes are IN3064 or equivalent Unit 1 TTL gate Output Load Capacitance, CL (including jig capacitance) CL 73, 83 Test Setup KEY TO SWITCHING WAVEFORMS WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H 3.0 V Input Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) 1.5 V Measurement Level 1.5 V Output 0.0 V Figure 11. 42 Input Waveforms and Measurement Levels Am29PDL640G December 13, 2005 D A T A S H E E T AC CHARACTERISTICS Read-Only Operations Parameter Speed Options JEDEC Std. Description tAVAV tRC Read Cycle Time (Note 1) tAVQV tACC Address to Output Delay tELQV tCE Chip Enable to Output Delay tPACC Test Setup 63 73 83 98 Unit Min 65 70 85 90 ns CE#, OE# = VIL Max 65 70 85 90 ns OE# = VIL Max 65 70 85 90 ns Page Access Time Max 25 30 45 ns tGLQV tOE Output Enable to Output Delay Max 25 30 45 ns tEHQZ tDF Chip Enable to Output High Z (Notes 1, 3) Max 25 30 45 ns tGHQZ tDF Output Enable to Output High Z (Notes 1, 3) Max 25 30 45 ns tAXQX tOH Output Hold Time From Addresses, CE# or OE#, Whichever Occurs First Min 4 tOEH Output Enable Hold Time (Note 1) 5 ns Read Min 0 ns Toggle and Data# Polling Min 10 ns Notes: 1. Not 100% tested. 2. See Figure 10 and Table 17 for test specifications 3. Measurements performed by placing a 50 ohm termination on the data pin with a bias of VCC/2. The time from OE# high to the data bus driven to VCC/2 is taken as tDF. . tRC Addresses Stable Addresses tACC CE#f tRH tRH tDF tOE OE# tOEH WE# tCE tOH HIGH Z HIGH Z Valid Data Data RESET# RY/BY# 0V Figure 12. December 13, 2005 Read Operation Timings Am29PDL640G 43 D A T A S H E E T AC CHARACTERISTICS Same Page A21-A3 A2-A0 Aa tACC Data Ab tPACC Qa Ad Ac tPACC Qb tPACC Qc Qd CE# OE# Figure 13. 44 Page Read Operation Timings Am29PDL640G December 13, 2005 D A T A S H E E T AC CHARACTERISTICS Hardware Reset (RESET#) Parameter JEDEC Std Description All Speed Options Unit tReady RESET# Pin Low (During Embedded Algorithms) to Read Mode (See Note) Max 20 µs tReady RESET# Pin Low (NOT During Embedded Algorithms) to Read Mode (See Note) Max 500 ns tRP RESET# Pulse Width Min 500 ns tRH Reset High Time Before Read (See Note) Min 50 ns tRPD RESET# Low to Standby Mode Min 20 µs tRB RY/BY# Recovery Time Min 0 ns Note: Not 100% tested. RY/BY# CE#, OE# tRH RESET# tRP tReady Reset Timings NOT during Embedded Algorithms Reset Timings during Embedded Algorithms tReady RY/BY# tRB CE#, OE# RESET# tRP Figure 14. December 13, 2005 Reset Timings Am29PDL640G 45 D A T A S H E E T AC CHARACTERISTICS Erase and Program Operations Parameter Speed Options JEDEC Std Description tAVAV tWC Write Cycle Time (Note 1) Min tAVWL tAS Address Setup Time Min 0 ns tASO Address Setup Time to OE# low during toggle bit polling Min 15 ns tAH Address Hold Time Min 45 ns tAHT Address Hold Time From CE# or OE# high during toggle bit polling Min 0 ns tDVWH tDS Data Setup Time Min 35 ns tWHDX tDH Data Hold Time Min 0 ns tOEPH Output Enable High during toggle bit polling Min 20 ns tGHWL tGHWL Read Recovery Time Before Write (OE# High to WE# Low) Min 0 ns tELWL tCS CE# Setup Time Min 0 ns tWHEH tCH CE# Hold Time Min 0 ns tWLWH tWP Write Pulse Width Min 35 ns tWHDL tWPH Write Pulse Width High Min 30 ns tSR/W Latency Between Read and Write Operations Min 0 ns tWLAX 63 73 83 98 Unit 65 70 85 90 ns tWHWH1 tWHWH1 Programming Operation (Note 2) Typ 6 µs tWHWH1 tWHWH1 Accelerated Programming Operation (Note 2) Typ 4 µs tWHWH2 tWHWH2 Sector Erase Operation (Note 2) Typ 0.2 sec tVCS VCC Setup Time (Note 1) Min 50 µs tRB Write Recovery Time from RY/BY# Min 0 ns Program/Erase Valid to RY/BY# Delay Max 90 ns tBUSY Notes: 1. Not 100% tested. 2. See the “Erase And Programming Performance” section for more information. 46 Am29PDL640G December 13, 2005 D A T A S H E E T AC CHARACTERISTICS Program Command Sequence (last two cycles) tAS tWC Addresses Read Status Data (last two cycles) 555h PA PA PA tAH CE# tCH OE# tWHWH1 tWP WE# tWPH tCS tDS tDH PD A0h Data Status tBUSY DOUT tRB RY/BY# VCC tVCS Notes: 1. PA = program address, PD = program data, DOUT is the true data at the program address. Figure 15. Program Operation Timings VHH WP#/ACC VIL or VIH VIL or VIH tVHH Figure 16. December 13, 2005 tVHH Accelerated Program Timing Diagram Am29PDL640G 47 D A T A S H E E T AC CHARACTERISTICS Erase Command Sequence (last two cycles) tAS tWC 2AAh Addresses Read Status Data VA SA VA 555h for chip erase tAH CE# tCH OE# tWP WE# tWPH tCS tWHWH2 tDS tDH Data 55h 30h Status DOUT 10 for Chip Erase tBUSY tRB RY/BY# tVCS VCC Note: SA = sector address (for Sector Erase), VA = Valid Address for reading status data (see “Write Operation Status” Figure 17. 48 Chip/Sector Erase Operation Timings Am29PDL640G December 13, 2005 D A T A S H E E T AC CHARACTERISTICS Addresses tWC tWC tRC Valid PA Valid RA tWC tAH tAS Valid PA Valid PA tAS tCPH tACC tAH tCE CE# tCP tOE OE# tOEH tGHWL tWP WE# tDF tWPH tDS tOH tDH Valid Out Valid In Data Valid In Valid In tSR/W WE# Controlled Write Cycle Read Cycle Figure 18. CE# Controlled Write Cycles Back-to-back Read/Write Cycle Timings tRC Addresses VA VA VA tACC tCE CE# tCH tOE OE# tOEH tDF WE# tOH High Z DQ7 Complement Complement DQ6–DQ0 Status Data Status Data True Valid Data High Z True Valid Data tBUSY RY/BY# Note: VA = Valid address. Illustration shows first status cycle after command sequence, last status read cycle, and array data read cycle. Figure 19. Data# Polling Timings (During Embedded Algorithms) December 13, 2005 Am29PDL640G 49 D A T A S H E E T AC CHARACTERISTICS tAHT tAS Addresses tAHT tASO CE# tCEPH tOEH WE# tOEPH OE# tDH DQ6/DQ2 tOE Valid Data Valid Status Valid Status Valid Status (first read) (second read) (stops toggling) Valid Data RY/BY# Note: VA = Valid address; not required for DQ6. Illustration shows first two status cycle after command sequence, last status read cycle, and array data read cycle Figure 20. Enter Embedded Erasing WE# Erase Suspend Erase Toggle Bit Timings (During Embedded Algorithms) Enter Erase Suspend Program Erase Suspend Read Erase Suspend Program Erase Resume Erase Suspend Read Erase Erase Complete DQ6 DQ2 Note: DQ2 toggles only when read at an address within an erase-suspended sector. The system may use OE# or CE# to toggle DQ2 and DQ6. Figure 21. DQ2 vs. DQ6 50 Am29PDL640G December 13, 2005 D A T A S H E E T AC CHARACTERISTICS Temporary Sector Unprotect Parameter JEDEC Std Description All Speed Options Unit tVIDR VID Rise and Fall Time (See Note) Min 500 ns tVHH VHH Rise and Fall Time (See Note) Min 250 ns tRSP RESET# Setup Time for Temporary Sector Unprotect Min 4 µs tRRB RESET# Hold Time from RY/BY# High for Temporary Sector Unprotect Min 4 µs Note: Not 100% tested. VID VID RESET# VIL or VIH VIL or VIH tVIDR tVIDR Program or Erase Command Sequence CE# WE# tRRB tRSP RY/BY# Figure 22. Temporary Sector Unprotect Timing Diagram December 13, 2005 Am29PDL640G 51 D A T A S H E E T AC CHARACTERISTICS VID VIH RESET# SA, A6, A1, A0 Valid* Valid* Sector Group Protect/Unprotect Data 60h 60h Valid* Verify 40h Status 1 µs CE# Sector Group Protect: 150 µs Sector Group Unprotect: 15 ms WE# OE# * For sector protect, A6 = 0, A1 = 1, A0 = 0. For sector unprotect, A6 = 1, A1 = 1, A0 = 0. Figure 23. Sector/Sector Block Protect and Unprotect Timing Diagram 52 Am29PDL640G December 13, 2005 D A T A S H E E T AC CHARACTERISTICS Alternate CE# Controlled Erase and Program Operations Parameter Speed Options JEDEC Std. Description 63 73 83 98 Unit tAVAV tWC Write Cycle Time (Note 1) Min 65 70 85 90 ns tAVWL tAS Address Setup Time Min 0 ns tELAX tAH Address Hold Time Min 45 ns tDVEH tDS Data Setup Time Min 35 ns tEHDX tDH Data Hold Time Min 0 ns tGHEL tGHEL Read Recovery Time Before Write (OE# High to WE# Low) Min 0 ns tWLEL tWS WE# Setup Time Min 0 ns tEHWH tWH WE# Hold Time Min 0 ns tELEH tCP CE# Pulse Width Min 35 ns tEHEL tCPH CE# Pulse Width High Min 30 ns tWHWH1 tWHWH1 Programming Operation (Note 2) Typ 6 µs tWHWH1 tWHWH1 Accelerated Programming Operation (Note 2) Typ 4 µs tWHWH2 tWHWH2 Sector Erase Operation (Note 2) Typ 0.2 sec Notes: 1. Not 100% tested. 2. See the “Erase And Programming Performance” section for more information. December 13, 2005 Am29PDL640G 53 D A T A S H E E T AC CHARACTERISTICS 555 for program 2AA for erase PA for program SA for sector erase 555 for chip erase Data# Polling Addresses PA tWC tAS tAH tWH WE# tGHEL OE# tWHWH1 or 2 tCP CE# tWS tCPH tBUSY tDS tDH DQ7# Data tRH A0 for program 55 for erase DOUT PD for program 30 for sector erase 10 for chip erase RESET# RY/BY# Notes: 1. Figure indicates last two bus cycles of a program or erase operation. 2. PA = program address, SA = sector address, PD = program data. 3. DQ7# is the complement of the data written to the device. DOUT is the data written to the device. 4. Waveforms are for the word mode. Figure 24. 54 Alternate CE# Controlled Write (Erase/Program) Operation Timings Am29PDL640G December 13, 2005 D A T A S H E E T ERASE AND PROGRAMMING PERFORMANCE Parameter Typ (Note 1) Max (Note 2) Unit Comments Sector Erase Time 0.4 5 sec Chip Erase Time 56 Excludes 00h programming prior to erasure (Note 4) Word Program Time 7 210 µs Accelerated Word Program Time 4 120 µs Chip Program Time (Note 3) 28 84 sec sec Excludes system level overhead (Note 5) Notes: 1. Typical program and erase times assume the following conditions: 25°C, 3.0 V VCC, 1,000,000 cycles. Additionally, programming typicals assume checkerboard pattern. 2. Under worst case conditions of 90°C, VCC = 2.7 V, 1,000,000 cycles. 3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes program faster than the maximum program times listed. 4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure. 5. System-level overhead is the time required to execute the two- or four-bus-cycle sequence for the program command. See Tables Table 14 for further information on command definitions. 6. The device has a minimum erase and program cycle endurance of 1,000,000 cycles. LATCHUP CHARACTERISTICS Description Min Max Input voltage with respect to VSS on all pins except I/O pins (including A9, OE#, and RESET#) –1.0 V 13 V Input voltage with respect to VSS on all I/O pins –1.0 V VCC + 1.0 V –100 mA +100 mA VCC Current Note: Includes all pins except VCC. Test conditions: VCC = 3.0 V, one pin at a time. BGA BALL CAPACITANCE Parameter Symbol Parameter Description Test Setup Typ Max Unit CIN Input Capacitance VIN = 0 4.2 5.0 pF COUT Output Capacitance VOUT = 0 5.4 6.5 pF CIN2 Control Pin Capacitance VIN = 0 3.9 4.7 pF Notes: 1. Sampled, not 100% tested. 2. Test conditions TA = 25°C, f = 1.0 MHz. DATA RETENTION Parameter Description Test Conditions Min Unit 150°C 10 Years 125°C 20 Years Minimum Pattern Data Retention Time December 13, 2005 Am29PDL640G 55 D A T A S H E E T PHYSICAL DIMENSIONS FBE080—80-Ball Fine-pitch Ball Grid Array 12 x 11 mm package 0.20 (4X) D1 A D eD 8 eE 7 6 7 SE 5 E E1 4 3 2 1 M K J H G F E D C B A A1 CORNER 7 B A1 CORNER INDEX MARK 10 L 6 NXOb SD φ0.08 M Z φ0.15 M Z A B TOP VIEW BOTTOM VIEW 0.25 Z A2 A A1 SEATING PLANE Z 0.08 Z SIDE VIEW NOTES: PACKAGE 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M-1994. 2. ALL DIMENSIONS ARE IN MILLIMETERS. 3. BALL POSITION DESIGNATION PER JESD 95-1, SPP-010. 4. e REPRESENTS THE SOLDER BALL GRID PITCH. 5. SYMBOL "MD" IS THE BALL ROW MATRIX SIZE IN THE "D" DIRECTION. SYMBOL "ME" IS THE BALL COLUMN MATRIX SIZE IN THE "E" DIRECTION. N IS THE TOTAL NUMBER OF SOLDER BALLS. FBE 080 JEDEC N/A 10.95 mm x 11.95 mm PACKAGE MIN. NOM. MAX. SYMBOL NOTE A --- --- A1 0.20 --- --- BALL HEIGHT A2 0.84 --- 0.94 BODY THICKNESS 1.20 OVERALL THICKNESS D 11.95 BSC. BODY SIZE E 10.95 BSC. 8.80 BSC. BODY SIZE BALL FOOTPRINT 6 DIMENSION "b" IS MEASURED AT THE MAXIMUM BALL DIAMETER IN A PLANE PARALLEL TO DATUM Z. 5.60 BSC. 12 BALL FOOTPRINT ROW MATRIX SIZE D DIRECTION 7 ME 8 ROW MATRIX SIZE E DIRECTION N b 80 SD AND SE ARE MEASURED WITH RESPECT TO DATUMS A AND B AND DEFINE THE POSITION OF THE CENTER SOLDER BALL IN THE OUTER ROW. WHEN THERE IS AN ODD NUMBER OF SOLDER BALLS IN THE OUTER ROW PARALLEL TO THE D OR E DIMENSION, RESPECTIVELY, SD OR SE = 0.000. D1 E1 MD 0.25 0.30 TOTAL BALL COUNT 0.35 BALL DIAMETER WHEN THERE IS AN EVEN NUMBER OF SOLDER BALLS IN THE OUTER ROW, SD OR SE = e/2 e 0.80 BSC. BALL PITCH SD / SE 0.40 BSC. SOLDER BALL PLACEMENT A3-A6, B3-B6, L3-L6, M3-M6 DEPOPULATED SOLDER BALLS 8. "+" IN THE PACKAGE DRAWING INDICATES THE THEORETICAL CENTER OF DEPOPULATED BALLS. E PACKAGE OUTLINE TYPE 9 FOR PACKAGE THICKNESS, "A" IS THE CONTROLLING DIMENSION. 10 A1 CORNER TO BE IDENTIFIED BY CHAMFER, INK MARK, METALLIZED MARKINGS INDENTION OR OTHER MEANS. 3150\38.9G 56 Am29PDL640G December 13, 2005 D A T A S H E E T PHYSICAL DIMENSIONS FBE063—63-Ball Fine-pitch Ball Grid Array 12 x 11 mm package Dwg rev AF; 10/99 December 13, 2005 Am29PDL640G 57 D A T A S H E E T REVISION SUMMARY July 12, 2002 Connection Diagram Initial release. Added Note. Revision A+1 (July 29, 2002) Removed the 64-ball Fortified BGA connection diagram. Global Ordering Information Changed all references to DPB to DYB Removed the Extended temperature range. Table 7. Autoselect Codes (High Voltage Method) Removed the PC package type. Changed the A5 to A4 and A3 Sector Protection Verification fields from L to H. Table 1. Am29PDL640G Device Bus Operations and Standby Mode Table 9. Sector Protection Schemes Changed VCC± 0.3 V to VIO± 0.3 V. Added field: Unprotected-PPB not changeable, DYB is changeable. Table 14. Memory Array Command Definitions Deleted Configuration Register Verify and Write from table. Figure 1. In-System Sector Protection/Sector Unprotection Algorithms Deleted Note #15. Added Note Table 14. Memory Array Command Definitions (x32 Mode) Table 15. Sector Protection Command Definitions Changed All PPB Erase address from WP to EP. Added SecSi Sector Factory Protect and Sector Group Protect Verify fields to tables. Added “EP = PPB Erase Address (A6:A0) is (1111010) (Note 16)” to legend. Added Notes 8 and 9 Added “the EP address is 01000010” to note #16. Table 15. Sector Protection Command Definitions (x32 mode) Operating Ranges Changed variables in Cycle field for Password Program (from 5 to 4), PPMLB Status (from 6 to 4), and SPMLB Status (from 6 to 4). DC Characteristics Removed IACC parameter from CMOS Compatable table. Changed specific references from ACC to WP#/ACC. FBGA Ball Capacitance Changed table from TSOP Pin Capacitance to FBGA Ball Capacitance and modified values within table to reflect change. Removed the Extended temperature range. CMOS Compatible Changed VCC to VIO in ICC3 and ICC5 Test Conditions. Changed Typical from 0.2 to 1 in ICC3, ICC4, and ICC5 Parameters. Added Min and/or Max to VIL, VIH, VOL, and VOH. Revision B (January 14, 2003) Distinctive Characteristics, Product Selector Guide, and Ordering Information Added 65 ns speed grade. Customer Lockable: SecSi Sector NOT Programmed or Protected at the factory. CFI Modified end of last paragraph to “reading array data” Special Package Handling Instructions Modified wording to include molded packages (TSOP, BGA, PLCC, PDIP, SSOP). Revision A+2 (September 30, 2002) Distinctive Characteristics and General Description Added second bullet, SecSi sector-protect verify text and figure 3. Command Definitions Modified last sentence of the first paragraph to state that writing a wrong address will return the device to an unknown state and that a reset command is required to return the device to reading array data. Removed the 64-ball Fortified BGA from Package options. 58 Am29PDL640G December 13, 2005 D A T A S H E E T SecSi Sector Flash Memory Region, and Enter SecSi Sector/Exit SecSi Sector Command Sequence Noted that the ACC function and unlock bypass modes are not available when the SecSi sector is enabled. Byte/Word Program Command Sequence, Sector Erase Command Sequence, and Chip Erase Command Sequence Noted that the SecSi Sector, autoselect, and CFI functions are unavailable when a program or erase operation is in progress. Common Flash Memory Interface (CFI) Table 15. Sector Protection Command Definitions Added Note # 17 and 18. Table 17. Test Specifications, Read-Only Operations, and Erase and Programing Operations Added 63 option to tables. Revision B+1 (February 26, 2003) Table 17. Test Specification Updated output load capacitance. Revision B+2 (December 13, 2005) Global Changed CFI website address. Test Conditions Modified speed grade option rows to state “All Speeds”. Table 17. Test Specifications, Read-Only Operations, and Erase and Programing Operations This product has been retired and is not available for designs. For new and current designs, S29PL064J supersedes Am29PDL640G and is the factory-recomm e n d e d m i g r a t i o n p a t h . P l e a s e r e fe r t o t h e S29PL064J datasheet for specifications and ordering information. Availability of this document is retained for reference and historical purposes only. Noted that one must write SecSi Sector reset before PPB program/erase. Trademarks Copyright © 2002-2005 Advanced Micro Devices, Inc. All rights reserved. AMD, the AMD logo, and combinations thereof are registered trademarks of Advanced Micro Devices, Inc. ExpressFlash is a trademark of Advanced Micro Devices, Inc. Product names used in this publication are for identification purposes only and may be trademarks of their respective companies. December 13, 2005 Am29PDL640G 59