TI SN74BCT2827CDW

SN54BCT2827C, SN74BCT2827C
10-BIT BUS/MOS MEMORY DRIVERS
WITH 3-STATE OUTPUTS
SCBS007E – APRIL 1987 – REVISED NOVEMBER 1993
•
•
•
•
OE1
A1
A2
A3
A4
A5
A6
A7
A8
A9
A10
GND
1
24
2
23
3
22
4
21
5
20
6
19
7
18
8
17
9
16
10
15
11
14
12
13
VCC
Y1
Y2
Y3
Y4
Y5
Y6
Y7
Y8
Y9
Y10
OE2
SN54BCT2827C . . . FK PACKAGE
(TOP VIEW)
A2
A1
description
These 10-bit buffers and bus drivers are
specifically designed to drive the capacitive input
characteristics of MOS DRAMs. They provide
high-performance bus interface for wide data
paths or buses carrying parity.
A3
A4
A5
NC
A6
A7
A8
4
3 2 1 28 27 26
25
6
24
7
23
8
22
9
21
10
20
11
19
12 13 14 15 16 17 18
A9
A10
GND
NC
The 3-state control gate is a 2-input AND gate with
active-low inputs so if either output-enable (OE1
or OE2) input is high, all ten outputs are in the
high-impedance state. The outputs are also in the
high-impedance state during power-up and
power-down conditions. The outputs remain in the
high-impedance state while the device is powered
down.
5
Y3
Y4
Y5
NC
Y6
Y7
Y8
OE2
Y10
Y9
•
•
SN54BCT2827C . . . JT OR W PACKAGE
SN74BCT2827C . . . DW OR NT PACKAGE
(TOP VIEW)
BiCMOS Design Substantially Reduces ICCZ
Output Ports Have Equivalent 25-Ω
Resistors; No External Resistors Are
Required
Specifically Designed to Drive MOS DRAMs
3-State Outputs Drive Bus Lines or Buffer
Memory Address Registers
Flow-Through Architecture Optimizes
PCB Layout
Power-Up High-Impedance State
ESD Protection Exceeds 2000 V Per
MIL-STD-883C, Method 3015
Package Options Include Plastic
Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK) and Flatpacks (W), and
Standard Plastic and Ceramic 300-mil DIPs
(JT, NT)
OE1
NC
VCC
Y1
Y2
•
•
NC - No internal connection
The SN54BCT2827C is characterized for operation over the full military temperature range of
– 55°C to 125°C. The SN74BCT2827C is
characterized for operation from 0°C to 70°C.
FUNCTION TABLE
INPUTS
A
OUTPUT
Y
OE1
OE2
L
L
L
L
L
L
H
H
H
X
X
Z
X
H
X
Z
Copyright  1993, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
2–1
SN54BCT2827C, SN74BCT2827C
10-BIT BUS/MOS MEMORY DRIVERS
WITH 3-STATE OUTPUTS
SCBS007E – APRIL 1987 – REVISED NOVEMBER 1993
logic symbol†
1
OE1
OE2
A1
A2
A3
A4
A5
A6
A7
A8
A9
A10
logic diagram (positive logic)
OE1
&
2
3
OE2
EN
13
23
1
22
4
21
5
20
6
19
7
18
8
17
9
16
10
15
11
14
A1
1
13
2
23
Y1
Y2
Y3
Y4
To Nine Other Channels
Y5
Y6
Y7
Y8
Y9
Y10
† This symbol is in accordance with ANSI/IEEE Std 91-1984
and IEC Publication 617-12.
Pin numbers shown are for the DW, JT, NT, and W packages.
schematic of each output
VCC
Output
GND
2–2
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
Y1
SN54BCT2827C, SN74BCT2827C
10-BIT BUS/MOS MEMORY DRIVERS
WITH 3-STATE OUTPUTS
SCBS007E – APRIL 1987 – REVISED NOVEMBER 1993
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)†
Supply voltage range, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.5 V to 7 V
Input voltage range, VI (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.5 V to 7 V
Voltage range applied to any output in the disabled or power-off state, VO . . . . . . . . . . . . . . . – 0.5 V to 5.5 V
Voltage range applied to any output in the high state, VO . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.5 V to VCC
Input clamp current, IIK . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 30 mA
Current into any output in the low state . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 mA
Operating free-air temperature range: SN54BCT2827C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 55°C to 125°C
SN74BCT2827C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C
Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 65°C to 150°C
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: The input negative-voltage rating may be exceeded if the input clamp current rating is observed.
recommended operating conditions
SN54BCT2827C
VCC
VIH
Supply voltage
VIL
IIK
Low-level input voltage
IOH
IOL
High-level output current
Low-level output current
TA
Operating free-air temperature
High-level input voltage
SN74BCT2827C
MIN
NOM
MAX
MIN
NOM
MAX
4.5
5
5.5
4.5
5
5.5
2
2
Input clamp current
– 55
UNIT
V
V
0.8
0.8
V
– 18
– 18
mA
–1
–1
mA
12
12
mA
70
°C
125
0
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
VIK
VOH
TEST CONDITIONS
VCC = 4.5 V,
VCC = 4.5 V to 5.5 V,
II = – 18 mA
IOH = – 1 mA
VOL
VCC = 4
4.5
5V
IOL = 1 mA
IOL = 12 mA
IOZH
IOZL
VCC = 5.5 V,
VCC = 5.5 V,
VO = 2.7 V
VO = 0.5 V
IOL(sink)
II
VCC = 4.5 V,
VCC = 5.5 V,
VO = 2 V
VI = 7 V
IIH
IIL
IO§
VCC = 5.5 V,
VCC = 5.5 V,
VI = 2.7 V
VI = 0.5 V
VCC = 5.5 V,
VCC = 5.5 V,
VO = 2.25 V
Outputs open
VCC = 5.5 V,
VCC = 5 V,
Outputs open
ICCL
ICCZ
Ci
SN54BCT2827C
TYP‡
MAX
MIN
SN74BCT2827C
TYP‡
MAX
MIN
– 1.2
VCC –2
– 1.2
VCC –2
0.5
0.15
0.5
0.35
0.8
0.35
0.8
V
20
20
µA
– 20
– 20
µA
50
50
mA
0.1
0.1
mA
20
20
µA
– 0.2
VI = 2.5 V or 0.5 V
VI = 2.5 V or 0.5 V
V
V
0.15
– 30
UNIT
– 112
– 30
– 0.2
mA
– 112
mA
28
40
28
40
mA
3.8
6
3.8
6
mA
5
5
pF
Co
VCC = 5 V,
8
8
pF
‡ All typical values are at VCC = 5 V, TA = 25°C.
§ The output conditions have been chosen to produce a current that closely approximates one half of the true short circuit output current, IOS.
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
2–3
SN54BCT2827C, SN74BCT2827C
10-BIT BUS/MOS MEMORY DRIVERS
WITH 3-STATE OUTPUTS
SCBS007E – APRIL 1987 – REVISED NOVEMBER 1993
switching characteristics (see Note 2)
PARAMETER
FROM
(INPUT)
VCC = 4.5 V to 5.5 V,
CL = 50 pF,
R1 = 500 Ω,
R2 = 500 Ω,
TA = MIN to MAX†
VCC = 5 V,
CL = 50 pF,
R1 = 500 Ω,
R2 = 500 Ω,
TA = 25°C
TO
(OUTPUT)
′BCT2827C
tPLH
tPHL
A
Y
tPZH
tPZL
OE
Y
tPHZ
tPLZ
OE
Y
SN54BCT2827C
SN74BCT2827C
MIN
TYP
MAX
MIN
MAX
MIN
0.9
3.6
5.2
0.9
6.6
0.9
6
2
5.1
7.2
2
8.2
2
7.8
2.8
5.6
8
2.8
10.7
2.8
10.7
5
8.9
11
5
13.7
5
12.9
3.2
6.7
8.5
3.2
14
3.2
13
2.7
5.3
10.5
2.7
11
2.7
10
† For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
NOTE 2: Load circuits and voltage waveforms are shown in Section 1.
2–4
UNIT
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
MAX
ns
ns
ns
IMPORTANT NOTICE
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright  1998, Texas Instruments Incorporated