TOSHIBA TC74AC32F

TC74AC32P/F/FN/FT
TOSHIBA CMOS Digital Integrated Circuit
Silicon Monolithic
TC74AC32P,TC74AC32F,TC74AC32FN,TC74AC32FT
Quad 2-Input OR Gate
The TC74AC32 is an advanced high speed CMOS 2-INPUT OR
GATE fabricated with silicon gate and double-layer metal wiring
C2MOS technology.
It achieves the high speed operation similar to equivalent
Bipolar Schottky TTL while maintaining the CMOS low power
dissipation.
The internal circuit is composed of 2 stages including buffer
output, which provide high noise immunity and stable output.
All inputs are equipped with protection circuits against static
discharge or transient excess voltage.
Note: xxxFN (JEDEC SOP) is not available in
Japan.
TC74AC32P
TC74AC32F
Features
•
High speed: tpd = 4.1 ns (typ.) at VCC = 5 V
•
Low power dissipation: ICC = 4 μA (max) at Ta = 25°C
•
High noise immunity: VNIH = VNIL = 28% VCC (min)
•
Symmetrical output impedance: |IOH| = IOL = 24 mA (min)
•
Capability of driving 50 Ω
transmission lines.
∼ tpHL
Balanced propagation delays: tpLH −
•
Wide operating voltage range: VCC (opr) = 2 to 5.5 V
•
Pin and function compatible with 74F32
TC74AC32FN
TC74AC32FT
Weight
DIP14-P-300-2.54
SOP14-P-300-1.27A
SOL14-P-150-1.27
TSSOP14-P-0044-0.65A
1
: 0.96 g (typ.)
: 0.18 g (typ.)
: 0.12 g (typ.)
: 0.06 g (typ.)
2007-10-01
TC74AC32P/F/FN/FT
Pin Assignment
IEC Logic Symbol
1A
1
14
VCC
1B
2
13
4B
1Y
3
12
4A
2A
11
4
1A
1B
2A
2B
3A
3B
4Y
2B
5
10
3B
2Y
6
9
3A
GND
7
8
3Y
4A
4B
(1)
(2)
> 1
(3)
(4)
1Y
(6)
(5)
(9)
2Y
(8)
(10)
(12)
3Y
(11)
(13)
4Y
(top view)
Truth Table
A
B
Y
H
H
H
L
H
H
H
L
H
L
L
L
Absolute Maximum Ratings (Note 1)
Characteristics
Symbol
Rating
Unit
Supply voltage range
VCC
−0.5 to 7.0
V
DC input voltage
VIN
−0.5 to VCC + 0.5
V
DC output voltage
VOUT
−0.5 to VCC + 0.5
V
Input diode current
IIK
±20
mA
Output diode current
IOK
±50
mA
DC output current
IOUT
±50
mA
DC VCC/ground current
ICC
±100
mA
Power dissipation
PD
500 (DIP) (Note 2)/180 (SOP/TSSOP)
mW
Storage temperature
Tstg
−65 to 150
°C
Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or
even destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 2: 500 mW in the range of Ta = −40 to 65°C. From Ta = 65 to 85°C a derating factor of −10 mW/°C should be
applied up to 300 mW.
2
2007-10-01
TC74AC32P/F/FN/FT
Operating Ranges (Note)
Characteristics
Symbol
Rating
Unit
Supply voltage
VCC
2.0 to 5.5
V
Input voltage
VIN
0 to VCC
V
VOUT
0 to VCC
V
−40 to 85
°C
Output voltage
Operating temperature
Topr
Input rise and fall time
Note:
0 to 100 (VCC = 3.3 ± 0.3 V)
dt/dV
ns/V
0 to 20 (VCC = 5 ± 0.5 V)
The operating ranges must be maintained to ensure the normal operation of the device.
Unused inputs must be tied to either VCC or GND.
Electrical Characteristics
DC Characteristics
Ta =
−40 to 85°C
Ta = 25°C
Characteristics
High-level input
voltage
Low-level input
voltage
Symbol
Test Condition
―
VIH
―
VIL
IOH = −50 μA
High-level output
voltage
VOH
VIN
= VIH or
IOH = −4 mA
VIL
IOH = −24 mA
IOH = −75 mA
(Note)
IOL = 50 μA
Low-level output
voltage
VOL
VIN
= VIL
VCC
(V)
Min
Typ.
Max
Min
Max
2.0
1.50
―
―
1.50
―
3.0
2.10
―
―
2.10
―
5.5
3.85
―
―
3.85
―
2.0
―
―
0.50
―
0.50
3.0
―
―
0.90
―
0.90
5.5
―
―
1.65
―
1.65
2.0
1.9
2.0
―
1.9
―
3.0
2.9
3.0
―
2.9
―
4.5
4.4
4.5
―
4.4
―
3.0
2.58
―
―
2.48
―
4.5
3.94
―
―
3.80
―
5.5
―
―
―
3.85
―
2.0
―
0.0
0.1
―
0.1
3.0
―
0.0
0.1
―
0.1
4.5
―
0.0
0.1
―
0.1
IOL = 12 mA
3.0
―
―
0.36
―
0.44
IOL = 24 mA
4.5
―
―
0.36
―
0.44
5.5
―
―
―
―
1.65
IOL = 75 mA
(Note)
Unit
V
V
V
V
Input leakage
current
IIN
VIN = VCC or GND
5.5
―
―
±0.1
―
±1.0
μA
Quiescent supply
current
ICC
VIN = VCC or GND
5.5
―
―
4.0
―
40.0
μA
Note:
This spec indicates the capability of driving 50 Ω transmission lines.
One output should be tested at a time for a 10 ms maximum duration.
3
2007-10-01
TC74AC32P/F/FN/FT
AC Characteristics (CL = 50 pF, RL = 500 Ω, input: tr = tf = 3 ns)
Characteristics
Propagation delay
time
Symbol
tpLH
tpHL
Input capacitance
CIN
Power dissipation
capacitance
CPD
Note:
Test Condition
―
Ta =
−40 to 85°C
Ta = 25°C
Unit
VCC (V)
Min
Typ.
Max
Min
Max
3.3 ± 0.3
―
6.1
10.3
1.0
11.9
5.0 ± 0.5
―
5.2
7.4
1.0
8.5
―
5
10
―
10
pF
―
64
―
―
―
pF
―
(Note)
ns
CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating
current consumption without load.
Average operating current can be obtained by the equation:
ICC (opr) = CPD·VCC·fIN + ICC/4 (per gate)
4
2007-10-01
TC74AC32P/F/FN/FT
Package Dimensions
Weight: 0.96 g (typ.)
5
2007-10-01
TC74AC32P/F/FN/FT
Package Dimensions
Weight: 0.18 g (typ.)
6
2007-10-01
TC74AC32P/F/FN/FT
Package Dimensions (Note)
Note: This package is not available in Japan.
Weight: 0.12 g (typ.)
7
2007-10-01
TC74AC32P/F/FN/FT
Package Dimensions
Weight: 0.06 g (typ.)
8
2007-10-01
TC74AC32P/F/FN/FT
RESTRICTIONS ON PRODUCT USE
20070701-EN GENERAL
• The information contained herein is subject to change without notice.
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc.
• The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his
document shall be made at the customer’s own risk.
• The products described in this document shall not be used or embedded to any downstream products of which
manufacture, use and/or sale are prohibited under any applicable laws and regulations.
• The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which
may result from its use. No license is granted by implication or otherwise under any patents or other rights of
TOSHIBA or the third parties.
• Please contact your sales representative for product-by-product details in this document regarding RoHS
compatibility. Please use these products in this document in compliance with all applicable laws and regulations
that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses
occurring as a result of noncompliance with applicable laws and regulations.
9
2007-10-01