XICOR X25F032S

APPLICATION NOTE
A V A I L A B L E
AN61 • AN75 • AN77 • AN79 • AN82
X25F064/032/016/008
SerialFlash™ Memory With Block LockTM Protection
FEATURES
DESCRIPTION
• 1MHz Clock Rate
• SPI Serial Interface
• 64K/32K/16K/8K Bits
— 32 Byte Small Sector Program Mode
• Low Power CMOS
— <1µA Standby Current
— <5mA Active Current
• 1.8V – 3.6V or 5V “Univolt” Read and
Program Power Supply Versions
• Block Lock Protection
— Protect 1/4, 1/2, or all of E2PROM Array
• Built-in Inadvertent Program Protection
— Power-Up/Power-Down protection circuitry
— Program Enable Latch
— Program Protect Pin
• Self-Timed Program Cycle
— 5ms Program Cycle Time (Typical)
• High Reliability
— Endurance: 100,000 cycles per byte
— Data Retention: 100 Years
— ESD protection: 2000V on all pins
• 8-Lead PDlP Package
• 8-Lead 150 mil SOIC Packages
• 32K, 16K, 8K available in 14-Lead TSSOP,
64K available in 20-Lead TSSOP
The X25F064/032/016/008 family are 8/16/32/64K-bit
CMOS SerialFlash memory, internally organized
X 8. They feature a “Univolt” Program and Read voltage,
Serial Peripheral Interface (SPI), and software protocol
allowing operation on a simple three-wire bus. The bus
signals are a clock input (SCK), plus separate data in
(SI) and data out (SO) lines. Access to the device is
controlled through a chip select (CS) input, allowing any
number of devices to share the same bus.
The X25F064/032/016/008 also features two additional
inputs that provide the end user with added flexibility. By
asserting the HOLD input, the X25F064/032/016/008
will ignore transitions on its inputs, thus allowing the host
to service higher priority interrupts. The PP input can be
used as a hardwire input to the X25F064/032/016/008
disabling all program attempts to the status register,
thus providing a mechanism for limiting end user capability of altering 0, 1/4, 1/2, or all of the memory.
The X25F064/032/016/008 utilizes Xicor’s proprietary
flash cell, providing a minimum endurance
of 100,000 cycles and a minimum data retention of
100 years.
FUNCTIONAL DIAGRAM
DATA REGISTER
SI
SECTOR DECODE LOGIC
SO
SCK
32
COMMAND
DECODE
AND CONTROL
LOGIC
X
DECODE
LOGIC
8
MEMORY
ARRAY
CS
STATUS
REGISTER
HOLD
PP
PROGRAMMING
CONTROL LOGIC
HIGH VOLTAGE
CONTROL
6685 ILL F01.4
SerialFlash™ and Block Lock™ Protection are trademarks of Xicor, Inc.
© Xicor, Inc. 1995, 1996 Patents Pending
6685-3.1 8/29/96 T3/C0/D0 SH
Characteristics subject to change without notice
X25F064/032/016/008
PIN DESCRIPTIONS
Hold (HOLD)
Serial Output (SO)
HOLD is used in conjunction with the CS pin to select the
device. Once the part is selected and a serial sequence
is underway, HOLD may be used to pause the serial
communication with the controller without resetting the
serial sequence. To pause, HOLD must be brought
LOW while SCK is LOW. To resume communication,
HOLD is brought HIGH, again while SCK is LOW. If the
pause feature is not used, HOLD should be held HIGH
at all times.
SO is a push-pull serial data output pin. During a read
cycle, data is shifted out on this pin. Data is clocked out
by the falling edge of the serial clock.
Serial Input (SI)
SI is the serial data input pin. All opcodes, byte
addresses, and data to be written to the memory are
input on this pin. Data is latched by the rising edge of the
serial clock.
PIN CONFIGURATION
Serial Clock (SCK)
The Serial Clock controls the serial bus timing for data
input and output. Opcodes, addresses, or data present
on the SI pin are latched on the rising edge of the clock
input, while data on the SO pin change after the falling
edge of the clock input.
8-Lead DIP/SOIC
CS
1
SO
2 X25F064/ 7
032/016/
3
6
008
4
5
PP
VSS
Chip Select (CS)
8
14-Lead TSSOP
When CS is HIGH, the X25F064/032/016/008 is
deselected and the SO output pin is at high impedance
and unless an internal program operation is underway
the X25F064/032/016/008 will be in the standby power
mode. CS LOW enables the X25F064/032/016/008,
placing it in the active power mode. It should be noted
that after power-up, a HIGH to LOW transition on CS is
required prior to the start of any operation.
HOLD
SCK
SI
20-Lead TSSOP
CS
1
14
VCC
NC
1
20
NC
SO
2
13
HOLD
CS
2
19
VCC
NC
3
12
NC
NC
3
18
NC
NC
4
NC
SO
4
17
HOLD
NC
NC
5
16
NC
NC
X25F032/
016/008 11
5
10
PP
6
9
SCK
NC
6
15
NC
VSS
7
8
SI
PP
7
14
SCK
VSS
8
13
SI
NC
9
12
NC
NC
10
11
NC
Program Protect (PP)
When PP is LOW and the nonvolatile bit PPEN is “1”,
nonvolatile programming of the X25F064/032/016/008
status register is disabled, but the part otherwise functions normally. When PP is held HIGH, all functions,
including nonvolatile programming operate normally.
PP going LOW while CS is still LOW will interrupt
programming of the X25F064/032/016/008 status register. If the internal program cycle has already been
initiated, PP going LOW will have no effect on programming.
VCC
X25F064
6685 ILL F02.4
PIN NAMES
The PP pin function is blocked when the PPEN bit in
the status register is “0”. This allows the user to install the
X25F064/032/016/008 into a system with PP pin
grounded and still be able to program the status register.
The PP pin functions will be enabled when the PPEN bit
is set “0”.
SYMBOL
DESCRIPTION
CS
SO
SI
SCK
PP
VSS
VCC
HOLD
NC
Chip Select Input
Serial Output
Serial Input
Serial Clock Input
Program Protect Input
Ground
Supply Voltage
Hold Input
No Connect
6685 PGM T01.1
2
X25F064/032/016/008
PRINCIPLES OF OPERATION
formatted as follows:
The X25F064/032/016/008 family are SerialFlash
Memory designed to interface directly with the synchronous serial peripheral interface (SPI) of many popular
microcontroller families.
7
PPEN
6
X
5
X
4
X
3
BL1
2
BL0
1
PEL
0
PIP
6685 PGM T02.2
PPEN, BL0, and BL1 are set by the PRSR instruction.
PEL and PIP are “read-only” and automatically set by
other operations.
The X25F064/032/016/008 family contains an 8-bit
instruction register. It is accessed via the SI input, with
data being clocked in on the rising SCK. CS must be
LOW and the HOLD and PP inputs must be HIGH during
the entire operation. The PP input is “Don’t Care” if
PPEN is set “0”.
The Programming-In-Process (PIP) bit indicates
whether the X25F064/032/016/008 device is busy
with a program operation. When set to a “1”
programming is in progress, when set to a “0” no
programming is in progress. During programming, all
other bits are set to “1”.
Table 1 contains a list of the instructions and their
operation codes. All instructions, addresses and data
are transferred MSB first.
The Program Enable Latch (PEL) bit indicates the
status of the program enable latch. When set to a “1” the
latch is set; when set to a “0” the latch is reset.
Data input is sampled on the first rising edge of SCK after
CS goes LOW. SCK is static, allowing the user to stop
the clock and then resume operations. If the clock line is
shared with other peripheral devices on the SPI bus, the
user can assert the HOLD input to place the X25F064/
032/016/008 into a “PAUSE” condition. After
releasing HOLD, the X25F064/032/016/008 device will
resume operation from the point when HOLD was first
asserted.
The Block Lock (BL0 and BL1) bits are nonvolatile and
allow the user to select one of four levels of protection.
The X25F064/032/016/008 device array is divided into
four equal segments. One, two, or all four of the segments may be locked. That is, the user may read the
segments, but will be unable to alter (program) data
within the selected segments. The partitioning is controlled as illustrated below.
Program Enable Latch
The X25F064/032/016/008 device contains a
program enable latch. This latch must be SET before a
program operation will be completed internally. The
PREN instruction will set the latch and the PRDI
instruction will reset the latch. This latch is automatically
reset on power-up and after the completion of a sector
program or status register write cycle.
Status Register Bits
BL1
BL0
0
0
1
1
0
1
0
1
Array Addresses
Locked
None
upper fourth
upper half
All
6685 PGM T03.1
Status Register
Program-Protect Enable
The RDSR instruction provides access to the status
register. The status register may be read at any time,
even during a program cycle. The status register is
The Program-Protect-Enable bit (PPEN) in the
X25F064/032/016/008 status register acts as an
enable bit for the PP pin.
Table 1. Instruction Set
Instruction Name
PREN
PRDI
RDSR
PRSR
READ
Instruction Format*
0000 0110
0000 0100
0000 0101
0000 0001
0000 0011
PROGRAM
0000 0010
Operation
Set the Program Enable Latch (Enable Program Operations)
Reset the Program Enable Latch (Disable Program Operations)
Read Status Register
Program Status Register
Read from Memory Array beginning at Selected Address
Program Memory Array beginning at Selected Address
(32 Bytes)
6685 PGM T04.2
*Instructions are shown MSB in leftmost position. Instructions are transferred MSB first.
3
X25F064/032/016/008
PPEN PP
0
0
1
1
X
X
X
X
LOW
LOW
HIGH
HIGH
Locked
PEL Blocks
0
1
0
1
0
1
Unlocked
Blocks
tion. After the read status register opcode is sent, the
contents of the status register are shifted out on the SO
line. The Read Status Register Sequence is illustrated
in Figure 2.
Status
Register
Locked
Locked
Locked
Locked Programmable Programmable
Locked
Locked
Locked
Locked Programmable
Locked
Locked
Locked
Locked
Locked Programmable Programmable
Programming Sequence
Prior to any attempt to program the X25F064/032/016/
008 device, the program enable latch must first be set by
issuing the PREN instruction (See Figure 3). CS is first
taken LOW, then the PREN instruction is clocked into
the X25F064/032/016/008 device. After all eight bits of
the instruction are transmitted, CS must then be taken
HIGH. If the user continues the programming operation
without taking CS HIGH after issuing the PREN instruction, the programming operation will be ignored.
6685 PGM T05.2
The Program Protect (PP) pin and the nonvolatile
Program Protect Enable (PPEN) bit in the Status Register control the programmable hardware write protect
feature. Hardware program protection is enabled when
PP pin is LOW, and the PPEN bit is “1”. Hardware
program protection is disabled when either the PP pin is
HIGH or the PPEN bit is “0”. When the chip is hardware
program protected, nonvolatile programming of the Status Register in disabled, including the Block Lock bits
and the PPEN bit itself, as well as the Block Lock
sections in the memory array. Only the sections of the
memory array that are not Block Locked can be programmed.
Note:
To program the SerialFlash memory array, the user
issues the PROGRAM instruction, followed by the address of the first location in the sector and then the data
to be programmed. The data is programmed in a 256clock operation. CS must go LOW and remain LOW for
the duration of the operation. The 32 bytes must reside
in the same sector and cannot cross sector boundaries.
If the address counter reaches the end of the sector
and the clock continues, or if fewer than 32 bytes are
clocked in, the contents of the sector cannot be guaranteed.
Since the PPEN bit is program protected, it
cannot be changed back to a “0”, as long as
the PP pin is held LOW.
For the program operation to be completed, CS can only
be brought HIGH after bit 0 of data byte 32 is clocked in.
If it is brought HIGH at any other time the program
operation will not be completed. Refer to Figure 4 below
for a detailed illustration of the programming sequence
and time frames in which CS going HIGH is valid.
Clock and Data Timing
Data input on the SI line is latched on the rising edge of
SCK. Data is output on the SO line by the falling edge of
SCK.
Read Sequence
To program the status register, the PRSR instruction is
followed by the data to be programmed. Data bits 0, 1,
4, 5 and 6 must be “0”. This sequence is shown in Figure 5.
When reading from the SerialFlash memory array, CS is
first pulled LOW to select the device. The 8-bit READ
instruction is transmitted to the X25F064/032/016/008
device, followed by the 16-bit address. After the read
opcode and address are sent, the data stored in the
memory at the selected address is shifted out on the SO
line. The data stored in memory at the next address can
be read sequentially by continuing to provide clock
pulses. The address is automatically incremented to the
next higher address after each byte of data is shifted out.
When the highest address is reached the address
counter rolls over to address $0000, allowing the read
cycle to be continued indefinitely. The read operation is
terminated by taking CS HIGH. Refer to the Read
SerialFlash Memory Array Operation Sequence illustrated
in Figure 1.
While the program cycle is in progress, following a
status register or memory write sequence, the status
register may be read to check the PIP bit. During this
time the PIP bit will be HIGH.
Hold Operation
The HOLD input should be HIGH (at VIH) under normal
operation. If a data transfer is to be interrupted HOLD
can be pulled LOW to suspend the transfer until it can be
resumed. The only restriction is that the SCK input
must be LOW when HOLD is first pulled LOW and SCK
must also be LOW when HOLD is released.
The HOLD input may be tied HIGH either directly to VCC
or tied to VCC through a resistor.
To read the status register, the CS line is first pulled
LOW to select the device followed by the 8-bit instruc4
X25F064/032/016/008
Operational Notes
Data Protection
The device powers-up in the following state:
The following circuitry has been included to prevent
inadvertent programming:
• The device is in the low power standby state.
• The program enable latch is reset upon power-up.
• A HIGH to LOW transition on CS is required to
enter an active state and receive an instruction.
• A program enable instruction must be issued to set
the program enable latch.
• SO pin is high impedance.
• CS must come HIGH at the proper clock count in
order to start a program cycle.
• The program enable latch is reset.
Figure 1. Read SerialFlash Memory Array Operation Sequence
CS
0
1
2
3
4
5
6
7
8
9
10
20 21 22 23 24 25 26 27 28 29 30
SCK
INSTRUCTION
16 BIT ADDRESS
15 14 13
SI
3
2
1
0
DATA OUT
HIGH IMPEDANCE
7
SO
6
5
4
MSB
CS
1
2
3
4
5
6
7
8
9
10 11 12 13 14
7
6
5
SCK
INSTRUCTION
SI
DATA OUT
HIGH IMPEDANCE
SO
MSB
5
4
3
2
2
1
0
6685 ILL F03
Figure 2. Read Status Register Operation Sequence
0
3
1
0
6685 ILL F04
X25F064/032/016/008
Figure 3. Program Enable Latch Sequence
CS
0
1
2
3
4
5
6
7
SCK
INSTRUCTION
SI
SO
HIGH IMPEDANCE
6685 ILL F05.1
6
X25F064/032/016/008
Figure 4. Programming Sequence
CS
0
1
2
3
4
5
6
7
8
9
20 21 22 23 24 25 26 27 28 29 30 31
10
SCK
INSTRUCTION
DATA BYTE 1
16 BIT ADDRESS
15 14 13
SI
3
2
1
7
0
6
5
4
3
2
1
0
CS
32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47
SCK
DATA BYTE 2
SI
7
6
5
4
3
DATA BYTE 3
2
1
0
7
6
5
4
3
DATA BYTE 32
2
1
0
6
5
4
3
2
1
0
6685 ILL F07.1
Figure 5. Program Status Register Operation Sequence
CS
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15
SCK
DATA BYTE
INSTRUCTION
7
SI
6
5
4
3
2
1
0
HIGH IMPEDANCE
SO
6685 ILL F08
7
X25F064/032/016/008
ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias .................. –65°C to +135°C
Storage Temperature ....................... –65°C to +150°C
Voltage on any Pin with Respect to VSS ......... –1V to +7V
D.C. Output Current ............................................. 5mA
Lead Temperature
(Soldering, 10 Seconds) ............................. 300°C
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
This is a stress rating only and the functional operation
of the device at these or any other conditions above
those listed in the operational sections of this specification
is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
RECOMMENDED OPERATING CONDITIONS
Temp
Commercial
Extended
Industrial
Min.
0°C
–20°C
–40°C
Supply Voltage
X25F064/032/016/008
X25F064/032/016/008–5
Max.
+70°C
+85°C
+85°C
Limits
1.8V to 3.6V
4.5V to 5.5V
6685 PGM T07.3
6685 PGM T06.2
D.C. OPERATING CHARACTERISTICS (Over the recommended operating conditions unless otherwise specified.)
Limits
Symbol
Parameter
Min.
Max.
Units
5
mA
ICC
VCC Supply Current (Active)
ISB1(2)
ISB2
ILI
ILO
VIL(1)
VIH(1)
VOL1
VOH1
VOL2
VOH2
VCC Supply Current (Standby)
1
VCC Supply Current (Standby)
10
Input Leakage Current
10
Output Leakage Current
–1
10
Input LOW Voltage
VCC x 0.7 VCC x 0.3
Input HIGH Voltage
VCC + 0.5
Output LOW Voltage
0.4
Output HIGH Voltage
VCC – 0.3
Output LOW Voltage
0.4
Output HIGH Voltage
VCC – 0.8
µA
µA
µA
µA
V
V
V
V
V
V
Test Conditions
SCK = VCC x 0.1/VCC x 0.9 @ 1MHz,
SO = Open, CS = VSS
CS = VCC, VIN = VSS or VCC, VCC = 3.6V
CS = VCC, VIN = VSS or VCC, VCC = 5V
VIN = VSS to VCC
VOUT = VSS to VCC
IOL = 1.5mA, VCC = 2.7V
IOH = –0.4mA, VCC = 2.7V
IOL = 3mA, VCC = 5V
IOH = –1.6mA, VCC = 5V
6685 PGM T08.4
POWER-UP TIMING
Symbol
tPUR(3)
Parameter
Power-up to Read Operation
tPUW(3)
Power-up to Write Operation
Min.
Max.
1
Units
ms
5
ms
6685 PGM T09
CAPACITANCE TA = 25°C, f = 1MHz, VCC = 5V.
Symbol
COUT(2)
CIN(2)
Notes:
Test
Output Capacitance (SO)
Input Capacitance (SCK, SI, CS, WP, HOLD)
Max.
8
6
Units
pF
pF
Conditions
VOUT = 0V
VIN = 0V
6685 PGM T10.1
(1) VIL min. and VIH max. are for reference only and are not tested.
(2) This parameter is periodically sampled and not 100% tested.
(3) tPUR and tPUW are the delays required from the time VCC is stable until the specified operation can be initiated. These parameters
are periodically sampled and not 100% tested.
8
X25F064/032/016/008
EQUIVALENT A.C. LOAD CIRCUIT
Input Pulse Levels
VCC x 0.1 to VCC x 0.9
Input Rise and Fall Times
10ns
Input and Output Timing Level
VCC x 0.5
5V
2.7V
1.44KΩ
1.64KΩ
6685 PGM T11
OUTPUT
OUTPUT
4.63KΩ
A.C. TEST CONDITIONS
100pF
1.95KΩ
100pF
6685 ILL F09.3
A.C. CHARACTERISTICS (Over recommended operating conditions, unless otherwise specified)
Data Input Timing
Symbol
fSCK
tCYC
tLEAD
tLAG
tWH
tWL
tSU
tH
tRI(4)
tFI(4)
tHD
tCD
tCS
tPC(5)
Parameter
Clock Frequency
Cycle Time
CS Lead Time
CS Lag Time
Clock HIGH Time
Clock LOW Time
Data Setup Time
Data Hold Time
Data In Rise Time
Data In Fall Time
HOLD Setup Time
HOLD Hold Time
CS Deselect Time
Program Cycle Time
Min.
0
1000
500
500
400
400
100
100
Max.
1
2
2
200
200
2
10
Units
MHz
ns
ns
ns
ns
ns
ns
ns
µs
µs
ns
ns
µs
ms
6685 PGM T12.3
Data Output Timing
Symbol
fSCK
tDIS
tV
tHO
tRO(4)
tFO(4)
tLZ(4)
tHZ(4)
Parameter
Clock Frequency
Output Disable Time
Output Valid from Clock LOW
Output Hold Time
Output Rise Time
Output Fall Time
HOLD HIGH to Output in Low Z
HOLD LOW to Output in High Z
Min.
Max.
Units
0
1
500
400
MHz
ns
ns
ns
ns
ns
ns
ns
0
300
300
100
100
6685 PGM T13.2
Notes: (4) This parameter is periodically sampled and not 100% tested.
(5) tWC is the time from the rising edge of CS after a valid write sequence has been sent to the end of the self-timed internal
nonvolatile program cycle.
9
X25F064/032/016/008
Serial Output Timing
CS
tCYC
tWH
tLAG
SCK
tV
SO
SI
tHO
MSB OUT
tWL
tDIS
MSB–1 OUT
LSB OUT
ADDR
LSB IN
6685 ILL F10
Serial Input Timing
tCS
CS
tLEAD
tLAG
SCK
tSU
SI
tH
tRI
MSB IN
tFI
LSB IN
HIGH IMPEDANCE
SO
6685 ILL F11
10
X25F064/032/016/008
Hold Timing
CS
tHD
tCD
tCD
tHD
SCK
tHZ
tLZ
SO
SI
HOLD
6685 ILL F12
11
X25F064/032/016/008
PACKAGING INFORMATION
8-LEAD PLASTIC DUAL IN-LINE PACKAGE TYPE P
0.430 (10.92)
0.360 (9.14)
0.260 (6.60)
0.240 (6.10)
PIN 1 INDEX
PIN 1
0.300
(7.62) REF.
HALF SHOULDER WIDTH ON
ALL END PINS OPTIONAL
0.145 (3.68)
0.128 (3.25)
SEATING
PLANE
0.025 (0.64)
0.015 (0.38)
0.065 (1.65)
0.045 (1.14)
0.150 (3.81)
0.125 (3.18)
0.020 (0.51)
0.016 (0.41)
0.110 (2.79)
0.090 (2.29)
0.015 (0.38)
MAX.
0.060 (1.52)
0.020 (0.51)
0.325 (8.25)
0.300 (7.62)
0°
15°
TYP. 0.010 (0.25)
NOTE:
1. ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS)
2. PACKAGE DIMENSIONS EXCLUDE MOLDING FLASH
3926 FHD F01
12
X25F064/032/016/008
PACKAGING INFORMATION
8-LEAD PLASTIC SMALL OUTLINE GULL WING PACKAGE TYPE S
0.150 (3.80)
0.158 (4.00)
0.228 (5.80)
0.244 (6.20)
PIN 1 INDEX
PIN 1
0.014 (0.35)
0.019 (0.49)
0.188 (4.78)
0.197 (5.00)
(4X) 7°
0.053 (1.35)
0.069 (1.75)
0.004 (0.19)
0.010 (0.25)
0.050 (1.27)
0.010 (0.25)
X 45°
0.020 (0.50)
0.050" TYPICAL
0.050"
TYPICAL
0° – 8°
0.0075 (0.19)
0.010 (0.25)
0.250"
0.016 (0.410)
0.037 (0.937)
0.030"
TYPICAL
8 PLACES
FOOTPRINT
NOTE: ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS)
3926 FHD F22.1
13
X25F064/032/016/008
PACKAGING INFORMATION
14-LEAD PLASTIC, TSSOP PACKAGE TYPE V
.025 (.65) BSC
.169 (4.3)
.252 (6.4) BSC
.177 (4.5)
.193 (4.9)
.200 (5.1)
.047 (1.20)
.0075 (.19)
.0118 (.30)
.002 (.05)
.006 (.15)
.010 (.25)
Gage Plane
0° – 8°
Seating Plane
.019 (.50)
.029 (.75)
Detail A (20X)
.031 (.80)
.041 (1.05)
See Detail “A”
NOTE: ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS)
3926 FHD F32
14
X25F064/032/016/008
PACKAGING INFORMATION
20-LEAD PLASTIC, TSSOP PACKAGE TYPE V
.025 (.65) BSC
.169 (4.3)
.252 (6.4) BSC
.177 (4.5)
.252 (6.4)
.300 (6.6)
.047 (1.20)
.0075 (.19)
.0118 (.30)
.002 (.05)
.006 (.15)
.010 (.25)
Gage Plane
0° – 8°
Seating Plane
.019 (.50)
.029 (.75)
Detail A (20X)
.031 (.80)
.041 (1.05)
See Detail “A”
NOTE: ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS)
3926 FHD F45
15
X25F064/032/016/008
ORDERING INFORMATION
X25FXXX
P
T
–X
VCC Range
Blank = 1.8V to 3.6V
5 = 4.5V to 5.5V
Device
Temperature Range
Blank = Commercial = 0°C to +70°C
E = Extended = –20°C to +85°C
I = Industrial = –40°C to +85°C
Package
X25F064
P = 8-Lead Plastic DIP
S = 8-Lead SOIC
V = 20-Lead TSSOP
X25F032
X25F016
X25F008
P = 8-Lead Plastic DIP
S = 8-Lead SOIC
V = 14-Lead TSSOP
Part Mark Convention
P = 8-Lead Plastic DIP
Blank = 8-Lead SOIC
V = 14/20-Lead TSSOP
X25FXXX
X25F064
X25F032
X25F016
X25F008
X
Blank = 1.8V to 3.6V, 0°C to +70°C
5 = 4.5V to 5.5V, 0°C to +70°C
I5 = 4.5V to 5.5V, –40°C to +85°C
LIMITED WARRANTY
Devices sold by Xicor, Inc. are covered by the warranty and patent indemnification provisions appearing in its Terms of Sale only. Xicor, Inc. makes no warranty,
express, statutory, implied, or by description regarding the information set forth herein or regarding the freedom of the described devices from patent infringement.
Xicor, Inc. makes no warranty of merchantability or fitness for any purpose. Xicor, Inc. reserves the right to discontinue production and change specifications and
prices at any time and without notice.
Xicor, Inc. assumes no responsibility for the use of any circuitry other than circuitry embodied in a Xicor, Inc. product. No other circuits, patents, licenses are
implied.
U.S. PATENTS
Xicor products are covered by one or more of the following U.S. Patents: 4,263,664; 4,274,012; 4,300,212; 4,314,265; 4,326,134; 4,393,481; 4,404,475;
4,450,402; 4,486,769; 4,488,060; 4,520,461; 4,533,846; 4,599,706; 4,617,652; 4,668,932; 4,752,912; 4,829, 482; 4,874, 967; 4,883, 976. Foreign patents and
additional patents pending.
LIFE RELATED POLICY
In situations where semiconductor component failure may endanger life, system designers using this product should design the system with appropriate error
detection and correction, redundancy and backup features to prevent such an occurrence.
Xicor's products are not authorized for use in critical components in life support devices or systems.
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and whose
failure to perform, when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant
injury to the user.
2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or effectiveness.
16