Preliminary Information ICmic TM This X84160/640/128 device has been acquired by IC MICROSYSTEMS from Xicor, Inc. IC MICROSYSTEMS MPSTM EEPROM X84160/640/128 16K/64K/128K Advanced MPS™ Micro Port Saver EEPROM with Block Lock™ Protection FEATURES bytewide memory control functions, takes a fraction of the board space and consumes much less power. Replacing serial memories, the µPort Saver provides all the serial benefits, such as low cost, low power, low voltage, and small package size while releasing I/Os for more important uses. •Up to 15MHz data transfer rate •20ns Read Access Time •Direct Interface to Microprocessors and Microcontrollers —Eliminates I/O port requirements —No interface glue logic required —Eliminates need for parallel to serial converters •Low Power CMOS —1.8V–3.6V, 2.5V–5.5V and 5V ± 10% Versions —Standby Current Less than 1µA The µPort Saver memory outputs data within 20ns of an active read signal. This is less than the read access time of most hosts and provides “no-wait-state” operation. This prevents bottlenecks on the bus. With rates to 15MHz, the µPort Saver supplies data faster than required by most host read cycle specifications. This eliminates the need for software NOPs. —Active Current Less than 1mA •Byte or Page Write Capable —32-Byte Page Write Mode •New Programmable Block Lock™ Protection —Software Write Protection —Programmable Hardware Write Protection •Block Lock (0, 1/4, 1/2, or all of the array) •Typical Nonvolatile Write Cycle Time: 3ms •High Reliability —100,000 Endurance Cycles —Guaranteed Data Retention: 100 Years •Small Package Options —8-Lead Mini-DIP Package —8, 14-Lead SOIC Packages —8, 20, 28-Lead TSSOP Packages —8-Lead XBGA Packages The µPort Saver memories communicate over one line of the data bus using a sequence of standard bus read and write operations. This “bit serial” interface allows the µPort Saver to work well in 8-bit, 16 bit, 32-bit, and 64-bit systems. The X84160/640/128 provide additional data security features through Block Lock and programmable Hardware Write Protection. These allow some or all of the array to be write protected by software command or by hardware. System Configuration, Company ID, calibration information, or other critical data can be secured against unexpected or inadvertent program operations, leaving the remainder of the memory available for the system or user access A Write Protect (WP) pin prevents inadvertent writes to the memory. DESCRIPTION Xicor EEPROMs are designed and tested for applications requiring extended endurance. Inherent data retention is greater than 100 years. The µPort Saver memories need no serial ports or special hardware and connect to the processor memory bus. Replacing bytewide data memory, the µPort Saver uses BLOCK DIAGRAM Internal Block Diagram MPS System Connection Ports Saved µP µC A15 WP DSP ASIC RISC A0 D7 CE P0/CS P1/CLK P2/DI P3/DO D0 OE H.V. GENERATION TIMING & CONTROL I/O COMMAND DECODE OE AND CONTROL WE LOGIC X DEC EEPROM ARRAY 16K x 8 8K x 8 2K x 8 WE Y DECODE DATA REGISTER © Xicor, Inc. 1998 Patents Pending 7067 1.1 6/10/98 T10/C0/D3 1 Characteristics subject to change without notice X84160/640/128 PIN CONFIGURATIONS: Drawings are to the same scale, actual package sizes are shown in inches: WP V SS 8 V CC 2 X84160 3 X84640 7 6 NC OE 4 5 WE .190 in. NC VCC CE I/O 1 2 3 4 8 7 6 5 X84160 OE WE WP VSS .114 in. .252 in. .230 in. 20-LEAD TSSOP CE 1 14 V CC I/O 2 13 NC NC 3 12 NC NC 4 11 NC NC 5 10 WP V SS 6 NC OE 9 8 7 .390 in. 1 2 3 4 5 6 7 8 9 10 WE 28-LEAD TSSOP .238 in. VCC 1 8 I/O 2 7 CE 3 6 VSS OE 4 5 WP NC NC CE CE CE I/O NC NC NC WP VSS NC NC NC 1 2 3 4 5 6 7 8 9 10 11 12 13 14 X84128 e 8-LEAD XBGA: Top View NC X84640 .252 in. .230 in. WE 20 19 18 17 16 15 14 13 12 11 . 252 in. PIN DESCRIPTIONS Chip Enable (CE) et .078 in. 28 27 26 25 24 23 22 21 20 19 18 17 16 15 NC NC VCC NC NC NC NC OE WE NC .250 in. NC NC NC NC VCC NC NC .394 in. NC NC OE WE NC NC NC P X84128 NC NC CE I/O NC NC NC WP VSS NC Data Input/Output CE Chip Enable Input OE Output Enable Input WE Write Enable Input WP Write Protect Input VCC Supply Voltage VSS Ground NC No Connect PACKAGE SELECTION GUIDE ro 14-LEAD SOIC I/O du c CE I/O PIN NAMES 8-LEAD TSSOP 1 t 8-LEAD PDIP 8-LEAD SOIC 84160 8-Lead PDIP 8-Lead SOIC 8-Lead TSSOP 84640 8-Lead CSP/BGA 8-Lead PDIP 8-Lead SOIC 20-Lead TSSOP 84128 8-Lead CSP/BGA 8-Lead PDIP 14-Lead SOIC 28-Lead TSSOP Write Protect (WP) The Write Protect input controls the Hardware Write Protect feature. When WP is LOW and the nonvoltaile bit WPEN is “1”, nonvolatile writes of the X84160/640/128 control register is disabled, but the part otherwise functions normally. When WP is held HIGH, all functions, including nonvolatile write operate normally. WP going LOW while CS is still LOW will interrupt a write to the X84160/640/128 control register. If the internal Write cycle has already been initiated, WP going LOW will have no effect on write. bs ol The Chip Enable input must be LOW to enable all read/ write operations. When CE is HIGH, the chip is deselected, the I/O pin is in the high impedance state, and unless a nonvolatile write operation is underway, the device is in the standby power mode. Output Enable (OE) The Output Enable input must be LOW to enable the output buffer and to read data from the device on the I/O line. The WP pin function is blocked when the WPEN bit in the control register is “0”. This allows the user to install the X84160/640/128 in a system with WP pin grounded and still be able to write to the control register. The WP pin functions will be enabled when the WPEN bit is set “1”. O Write Enable (WE) The Write Enable input must be LOW to write either data or command sequences to the device. Data In/Data Out (I/O) Data and command sequences are serially written to or serially read from the device through the I/O pin. 2 X84160/640/128 sequence and enter the low power standby state, otherwise the device will await further reads in the sequential read mode. DEVICE OPERATION The X84160/640/128 are serial EEPROMs designed to interface directly with most microprocessor buses. Standard CE, OE, and WE signals control the read and write operations, and a single l/O line is used to send and receive data and commands serially. t Sequential Read The byte address is automatically incremented to the next higher address after each byte of data is read. The data stored in the memory at the next address can be read sequentially by continuing to issue read cycles. When the highest address in the array is reached, the address counter rolls over to address 0000h and reading may be continued indefinitely. du c Data Timing Data input on the l/O line is latched on the rising edge of either WE or CE, whichever occurs first. Data output on the l/O line is active whenever both OE and CE are LOW. Care should be taken to ensure that WE and OE are never both LOW while CE is LOW. bs CE ol Figure 1. Read Sequence et e P ro Read Sequence A read sequence consists of sending a 16-bit address followed by the reading of data serially. The address is written by issuing 16 separate write cycles (WE and CE LOW, OE HIGH) to the part without a read cycle between the write cycles. The address is sent serially, most significant bit first, over the I/O line. Note that this sequence is fully static, with no special timing restrictions, and the processor is free to perform other tasks on the bus whenever the device CE pin is HIGH. Once the 16 address bits are sent, a byte of data can be read on the I/O line by issuing 8 separate read cycles (OE and CE LOW, WE HIGH). At this point, writing a ‘1’ will terminate the read Reset Sequence The reset sequence resets the device and sets an internal write enable latch. A reset sequence can be sent at any time by performing a read/write “0”/read operation (see Figs. 1 and 2). This breaks the multiple read or write cycle sequences that are normally used to read from or write to the part. The reset sequence can be used at any time to interrupt or end a sequential read or page load. As soon as the write “0” cycle is complete, the part is reset (unless a nonvolatile write cycle is in progress). The second read cycle in this sequence, and any further read cycles, will read a HIGH on the l/O pin until a valid read sequence (which includes the address) is issued. The reset sequence must be issued at the beginning of both read and write sequences to be sure the device initiates these operations properly. OE O WE I/O (IN) "0" A15 A14 A13 A12 A11 A10 A9 A8 A7 A6 A5 A4 A3 A2 I/O (OUT) A1 A0 D7 D6 D5 D4 D3 D2 D1 D0 RESET LOAD ADDRESS WHEN ACCESSING: X84160 ARRAY: A15–A11=0 X84640 ARRAY: A15–A13=0 X84128 ARRAY: A15–A14=0 READ DATA 7008 FRM F04.1 3 X84160/640/128 Figure 2: Write Sequence t CE WE "0" A15 A14 A13 A12 A11 A10 A9 A8 A7 A6 A5 A4 A3 A2 A1 A0 I/O (OUT) X84160 ARRAY: A15–A11=0 X84640 ARRAY: A15–A13=0 X84128 ARRAY: A15–A14=0 e WHEN ACCESSING: LOAD ADDRESS LOAD DATA P RESET et Write Sequence A nonvolatile write sequence consists of sending a reset sequence, a 16-bit address, up to 32 bytes of data, and then a special “start nonvolatile write cycle” command sequence. D7 D6 D5 D4 D3 D2 D1 D0 ro I/O (IN) du c OE "1" "0" START NONVOLATILE WRITE 7008 FRM F05.1 page, where data loading can continue. For this reason, sending more than 256 consecutive data bits will result in overwriting previous data. A nonvolatile write cycle will not start if a partial or incomplete write sequence is issued. The internal write enable latch is reset when the nonvolatile write cycle is completed and after an invalid write to prevent inadvertent writes. Note that this sequence is fully static, with no special timing restrictions. The processor is free to perform other tasks on the bus whenever the chip enable pin (CE) is HIGH. bs ol The reset sequence is issued first (as described in the Reset Sequence section) to set an internal write enable latch. The address is written serially by issuing 16 separate write cycles (WE and CE LOW, OE HIGH) to the part without any read cycles between the writes. The address is sent serially, most significant bit first, on the l/O pin. Up to 32 bytes of data are written by issuing a multiple of 8 write cycles. Again, no read cycles are allowed between writes. Nonvolatile Write Status The status of a nonvolatile write cycle can be determined at any time by simply reading the state of the l/O pin on the device. This pin is read when OE and CE are LOW and WE is HIGH. During a nonvolatile write cycle the l/O pin is LOW. When the nonvolatile write cycle is complete, the l/O pin goes HIGH. A reset sequence can also be issued during a nonvolatile write cycle with the same result: I/O is LOW as long as a nonvolatile write cycle is in progress, and l/O is HIGH when the nonvolatile write cycle is done. O The nonvolatile write cycle is initiated by issuing a special read/write “1”/read sequence. The first read cycle ends the page load, then the write “1” followed by a read starts the nonvolatile write cycle. The device recognizes 32byte pages (e.g., beginning at addresses XXXXXX00000 for X84160). When sending data to the part, attempts to exceed the upper address of the page will result in the address counter “wrapping-around” to the first address on the 4 X84160/640/128 The Write Protect (WP) pin and the nonvolatile Write Protect Enable (WPEN) bit in the Status Register control the programmable hardware write protect feature. Hardware write protection is enabled when WP pin is LOW, and the WPEN bit is “1”. Hardware write protection is disabled when either the WP pin is HIGH or the WPEN bit is “0”. When the chip is hardware write protected, nonvolatile write is disabled to the Control Register, including the Block Protect bits and the WPEN bit itself, as well as the block-protected sections in the memory array. Only the sections of the memory array that are not block-protected can be written. CONTROL REGISTER A read from FFFFh returns the one byte contents of the control register unused bits return 0. Continued reads return undefined data. A write to address FFFFh changes the value of the bits. Unused bits are written as “0”. Writing more than one byte to the control register is a violation and the operation will be aborted. After sending one byte to the control register, a start nonvolatile write cycle will latch in the new state. Table 1 5 4 3 2 1 0 WPEN 0 0 0 BP1 BP0 0 0 BP1, BP0: Block Protect Bits The Block Protect (BP0 and BP1) bits are nonvolatile and allow the user to select one of four levels of protection. The X84160/640/128 is divided into four segments. One, two, or all four of the segments may be protected. That is, the user may read the segments but will be unable to alter (write) data within the selected segments. The partitioning is controlled as illustrated in table 3 below. ro 6 When the WP pin is tied to VSS and the WPEN bit is HIGH, the WPEN bit is write protected. It cannot be changed back to a “0”, as long as the WP pin is held LOW. P 7 Note: du c t The X84160/640/128 has one register that contains control bits for the devices. The control bits, WPEN, BP1, and BP0, are shown in Table 1. To read or change the contents of this register requires a one byte operation to address FFFFh. Protected Blocks 0 X Protected 1 LOW Protected X HIGH Protected Unprotected Blocks Status Register et WP Writable Writable Writable Protected Writable Writable ol WPEN e WPEN: Write Protect Enable Bit The Write-Protect-Enable (WPEN) bit is an enable bit for the WP pin. Table 2 Table 3. Block Lock Protection bs Control Register Bits Array Address Protected BP0 X84160 X84640 X84128 0 0 None None None 0 1 0600h–07FFh 1800h–1FFFh 3000h–3FFFh upper 1/4 1 0 0400h–07FFh 1000h–1FFFh 2000h–3FFFh upper 1/2 1 1 0000–07FFh 0000–1FFFh 0000h–3FFFh Full Array (Not including the control register.) O BP1 5 Array X84160/640/128 —A reset sequence must be issued to set the internal write enable latch before starting a write sequence. Low Power Operation The device enters an idle state, which draws minimal current when: —A special “start nonvolatile write” command sequence is required to start a nonvolatile write cycle. —an illegal sequence is entered. The following are the more common illegal sequences: t —The internal Write Enable latch is reset automatically at the end of a nonvolatile write cycle. du c • Read/Write/Write—any time —The internal Write Enable latch is reset and remains reset as long as the WP pin is LOW, which blocks all nonvolatile write cycles. • Read/Write ‘1’—When writing the address or writing data. • Write ‘1’—when reading data —The internal Write Enable latch resets on an invalid write operation. • Read/Read/Write ‘1’—after data is written to device, but before entering the NV write sequence. SYMBOL TABLE ro —the device powers-up; —a nonvolatile write operation completes. WAVEFORM P While a sequential read is in progress, the device remains in an active state. This state draws more current than the idle state, but not as much as during a read itself. To go back to the lowest power condition, an invalid condition is created by writing a ‘1’ after the last bit of a read operation. et e Write Protection The following circuitry has been included to prevent inadvertent nonvolatile writes: O bs ol —The internal Write Enable latch is reset upon power-up. 6 INPUTS OUTPUTS Must be steady Will be steady May change from LOW to HIGH Will change from LOW to HIGH May change from HIGH to LOW Will change from HIGH to LOW Don’t Care: Changes Allowed N/A Changing: State Not Known Center Line is High Impedance X84160/640/128 *COMMENT Temperature under Bias ...................... –65°C to +135°C Storage Temperature ........................... –65°C to +150°C Terminal Voltage with Respect to VSS .......................................–1V to +7V DC Output Current................................................... 5mA Lead Temperature (Soldering, 10 seconds)..........300°C Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and the functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. du c t ABSOLUTE MAXIMUM RATINGS* RECOMMENDED OPERATING CONDITIONS Min. Max. Supply Voltage Limits Commercial 0°C +70°C X84160/640/128 4.5V to 5.5V Industrial –40°C +85°C X84160/640/128 – 2.5 2.5V to 5.5V +125°C X84160/640/128 – 1.8 1.8V to 3.6V Military† –55°C Notes: † Contact factory for Military availability ro Temperature D.C. OPERATING CHARACTERISTICS (VCC = 5V ±10%) (Over the recommended operating conditions, unless otherwise specified.) Symbol Parameter Min. P Limits Max. Units Test Conditions 1 mA OE = VIL, WE = VIH, I/O = Open, CE clocking = VCC x 0.1/VCC x 0.9 @ 10 MHz 2 mA ICC During Nonvolatile Write Cycle All Inputs at CMOS Levels VCC Supply Current (Read) ICC2 VCC Supply Current (Write) ISB1 VCC Standby Current 1 µA CE = VCC, Other Inputs = VCC or VSS ILI Input Leakage Current 10 µA VIN = VSS to VCC ILO Output Leakage Current 10 µA VOUT = VSS to VCC VlL (1) Input LOW Voltage –0.5 VCC x 0.3 V VIH (1) Input HIGH Voltage VCC x 0.7 VCC + 0.5 V VOL Output LOW Voltage 0.4 V IOL = 2.1mA V IOH = –1mA et ol bs VOH e ICC1 Output HIGH Voltage VCC – 0.8 O Notes: (1) VIL Min. and VIH Max. are for reference only and are not tested. 7 X84160/640/128 D.C. OPERATING CHARACTERISTICS (VCC = 2.5V to 5.5V) (Over the recommended operating conditions, unless otherwise specified.) Parameter Limits Min. Max. Units Test Conditions OE = VIL, WE = VIH, I/O = Open, CE clocking = VCC x 0.1/VCC x 0.9 @ VCC = 2.5, 5 MHz t Symbol VCC Supply Current (Read) 300 µA ICC2 VCC Supply Current (Write) 2 mA ISB1 VCC Standby Current 1 µA ILI Input Leakage Current 10 µA ILO Output Leakage Current 10 µA VlL(1) Input LOW Voltage –0.5 VCC x 0.3 V Input HIGH Voltage VCC x 0.7 VCC + 0.5 V 0.4 V IOL = 1mA, VCC = 3V V IOH = –400µA, VCC = 3V Output LOW Voltage VOH Output HIGH Voltage VCC – 0.4 ICC During Nonvolatile Write Cycle All Inputs at CMOS Levels CE = VCC, Other Inputs = VCC or VSS VIN = VSS to VCC VOUT = VSS to VCC ro VOL P VIH (1) du c ICC1 Parameter Limits et Symbol e D.C. OPERATING CHARACTERISTICS (VCC = 1.8V to 3.6V) (Over the recommended operating conditions, unless otherwise specified.) Min. Units Test Conditions 200 µA OE = VIL, WE = VIH, I/O = Open, CE clocking = VCC x 0.1/VCC x 0.9 @ VCC = 1.8V, 4 MHz Max. VCC Supply Current (Read) ICC2 VCC Supply Current (Write) 1 mA ICC During Nonvolatile Write Cycle All Inputs at CMOS Levels ISB1 VCC Standby Current 1 µA CE = VCC, Other Inputs = VCC or VSS ILI Input Leakage Current 10 µA VIN = VSS to VCC Output Leakage Current 10 µA VOUT = VSS to VCC bs ILO ol ICC1 VlL(1) –0.5 VCC x 0.3 V VIH(1) Input HIGH Voltage VCC x 0.7 VCC + 0.5 V VOL Output LOW Voltage 0.4 V IOL = 0.5mA, VCC = 2V VOH Output HIGH Voltage V IOH = –250µA, VCC = 2V O Input LOW Voltage VCC – 0.2 Notes: (1) VIL Min. and VIH Max. are for reference only and are not tested. 8 X84160/640/128 CAPACITANCE TA = +25°C, f = 1MHz, VCC = 5V CI/O Parameter (2) CIN(2) Max. Units Test Conditions Input/Output Capacitance 8 pF VI/O = 0V Input Capacitance 6 pF VIN = 0V t Symbol du c Notes: (2) Periodically sampled, but not 100% tested. POWER-UP TIMING Symbol Parameter (3) Power-up to Read Operation tPUW(3) Power-up to Write Operation tPUR Max. Units 2 ms 5 ms ro Notes: (3) Time delays required from the time the VCC is stable until the specific operation can be initiated. Periodically sampled, but not 100% tested. A.C. CONDITIONS OF TEST VCC x 0.1 to VCC x 0.9 P Input Pulse Levels Input Rise and Fall Times 5ns VCC x 0.5 e Input and Output Timing Levels et EQUIVALENT A.C. LOAD CIRCUITS 5V OUTPUT OUTPUT OUTPUT 30pF 4.58KΩ 30pF O bs 3.03KΩ 2.8K Ω 2.39KΩ ol 2.06KΩ 2V 3V 9 5.6K Ω 30pF X84160/640/128 A.C. CHARACTERISTICS (Over the recommended operating conditions, unless otherwise specified.) Read Cycle Limits – X84160/640/128 Min. Max Min. tRC Read Cycle Time tCE CE Access Time 20 tOE OE Access Time 20 tOEL OE Pulse Width 20 35 tOEH OE High Recovery Time 50 90 tLOW CE LOW Time 20 35 tHIGH CE HIGH Time 50 tLZ(4) CE LOW to Output In Low Z 0 tHZ(4) CE HIGH to Output In High Z 0 15 tOLZ(4) OE LOW to Output In Low Z 0 tOHZ(4) OE HIGH to Output In High Z 0 tOH Output Hold from CE or OE HIGH 0 tWES WE HIGH Setup Time tWEH WE HIGH Hold Time 125 Min. 250 Max. Units ns 25 70 ns 25 70 ns 70 ns 180 ns 70 ns ro 70 Max. du c Parameter P Symbol t VCC = 4.5V – 5.5V VCC = 2.5V – 5.5V VCC = 1.8V – 3.6V 90 180 ns 0 0 ns 0 0 0 15 25 0 25 0 0 30 ns ns 30 ns 0 ns 25 25 25 ns 25 25 25 ns et e 0 ol Notes: (4) Periodically sampled, but not 100% tested. tHZ and tOHZ are measured from the point where CE or OE goes HIGH (whichever occurs first) to the time when I/O is no longer being driven into a 5pF load. tRC tLOW tHIGH tCE bs CE WE tWES t OEL tOE O OE t OEH tWEH t OHZ I/O DATA t OLZ t LZ 10 HIGH Z tOH t HZ X84160/640/128 Write Cycle Limits – X84160/640/128 VCC = 4.5V – 5.5V VCC = 2.5V – 5.5V VCC = 1.8V – 3.6V Parameter tNVWC(5) Nonvolatile Write Cycle Time tWC Write Cycle Time 70 125 tWP WE Pulse Width 20 35 tWPH WE HIGH Recovery Time 50 90 tCS Write Setup Time 0 0 tCH Write Hold Time 0 0 tCP CE Pulse Width 20 35 tCPH CE HIGH Recovery Time 50 90 tOES OE HIGH Setup Time 25 tOEH OE HIGH Hold Time 25 tDS(6) Data Setup Time 12 Data Hold Time 5 tWPSU WP HIGH Setup 100 tWPHD(7) WP HIGH Hold 100 Min. Max. Min. 5 250 Max. Units 5 ms du c 5 ns ns 180 ns 0 ns 0 ns 70 ns 180 ns 25 50 ns 25 50 ns 20 30 ns 5 5 ns 100 150 ns 100 150 ns ro 50 P (7) Max. e tDH(6) Min. t Symbol O bs ol et Notes: (5) tNVWC is the time from the falling edge of OE or CE (whichever occurs last) of the second read cycle in the “start nonvolatile write cycle” sequence until the self-timed, internal nonvolatile write cycle is completed. (6) Data is latched into the X84160/640/128 on the rising edge of CE or WE, whichever occurs first. (7) Periodically sampled, but not 100% tested. 11 X84160/640/128 CE Controlled Write Cycle tCPH tCP tOEH OE tCS tCH WE tWP tWPH tWPSU tWPHD tDS I/O ro WP du c tOES t CE tDH DATA HIGH Z P tWC e WE Controlled Write Cycle tCPH CE et tCP tOES ol OE bs WE WP tCH tOEH tWPH tWP t WPHD tWPSU tDS t DH DATA O I/O t CS HIGH Z tWC 12 X84160/640/128 1200±30 VSS WE WP 3912±30 NC P CE 3912±30 ro 280±20 VCC OE e 1000±30 500±20 I/O du c 140±20 X84640Z: Bottom View t 8-LEAD XBGA TYPE 1982±30 140±20 NOTE: ALL DIMENSIONS IN µM ALL DIMENSIONS ARE TYPICAL VALUES O bs ol 430±20 et 1982±30 13 X84160/640/128 ro VCC 280±20 P e O 430±30 bs ol 1500±30 et VSS WE 6046±30 NC CE 6046±30 500±20 1200±30 I/O du c 140±20 X84128: Bottom View t 8-LEAD XBGA TYPE OE WP 1982±30 1982±30 140±20 NOTE: ALL DIMENSIONS IN µM ALL DIMENSIONS ARE TYPICAL VALUES 14 X84160/640/128 8-LEAD PLASTIC DUAL IN-LINE PACKAGE TYPE P du c t 0.430 (10.92) 0.360 (9.14) 0.260 (6.60) 0.240 (6.10) PIN 1 INDEX ro PIN 1 HALF SHOULDER WIDTH ON ALL END PINS OPTIONAL e SEATING PLANE P 0.300 (7.62) REF. et 0.150 (3.81) 0.125 (3.18) ol bs O 0.145 (3.68) 0.128 (3.25) 0.025 (0.64) 0.015 (0.38) 0.065 (1.65) 0.045 (1.14) 0.020 (0.51) 0.016 (0.41) 0.110 (2.79) 0.090 (2.29) .073 (1.84) MAX. 0.060 (1.52) 0.020 (0.51) 0.325 (8.25) 0.300 (7.62) 0° 15° TYP .0.010 (0.25) NOTE: 1. ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS) 2. PACKAGE DIMENSIONS EXCLUDE MOLDING FLASH 15 X84160/640/128 du c t 8-LEAD PLASTIC SMALL OUTLINE GULL WING PACKAGE TYPE S 0.150 (3.80) 0.158 (4.00) PIN 1 INDEX 0.014 (0.35) 0.019 (0.49) P 0.188 (4.78) 0.197 (5.00) et e (4X) 7° 0.050 (1.27) ro PIN 1 0.053 (1.35) 0.069 (1.75) 0.004 (0.19) 0.010 (0.25) 0.050" TYPICAL 0.050" TYPICAL 0.0075 (0.19) 0.010 (0.25) 0.250" 0.016 (0.410) 0.037 (0.937) O bs ol 0.010 (0.25) 0.020 (0.50) X 45° 0° – 8° 0.228 (5.80) 0.244 (6.20) FOOTPRINT NOTE: ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS) 16 0.030" TYPICAL 8 PLACES X84160/640/128 PACKAGING INFORMATION du c t 14-LEAD PLASTIC SMALL OUTLINE GULL WING PACKAGE TYPE S 0.150 (3.80) 0.158 (4.00) 0.228 (5.80) 0.244 (6.20) PIN 1 INDEX ro PIN 1 P 0.014 (0.35) 0.020 (0.51) 0.336 (8.55) 0.345 (8.75) et e (4X) 7° 0.004 (0.10) 0.010 (0.25) ol 0.050 (1.27) 0.053 (1.35) 0.069 (1.75) 0.050" Typical bs 0.010 (0.25) X 45° 0.020 (0.50) 0.050" T ypical O 0° – 8° 0.250" 0.0075 (0.19) 0.010 (0.25) 0.016 (0.410) 0.037 (0.937) FOO TPRINT 0.030" Typical 14 Places NOTE: ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS) 17 X84160/640/128 PACKAGING INFORMATION t 8-LEAD PLASTIC, TSSOP, PACKAGE TYPE V du c .025 (.65) BSC P .114 (2.9) .122 (3.1) ro .169 (4.3) .252 (6.4) BSC .177 (4.5) e .047 (1.20) .0075 (.19) .0118 (.30) ol et .002 (.05) .006 (.15) .010 (.25) Gage Plane 0° – 8° Seating Plane .019 (.50) .029 (.75) O bs Detail A (20X) .031 (.80) .041 (1.05) See Detail “A” NOTE: ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS) 18 X84160/640/128 PACKAGING INFORMATION t 20-LEAD PLASTIC, TSSOP P ACKAGE TYPE V du c .025 (.65) BSC ro .169 (4.3) .252 (6.4) BSC .177 (4.5) P .252 (6.4) .300 (6.6) e .047 (1.20) .002 (.05) .006 (.15) ol et .0075 (.19) .0118 (.30) .010 (.25) Gage Plane O bs 0° – 8° Seating Plane .019 (.50) .029 (.75) Detail A (20X) .031 (.80) .041 (1.05) See Detail “A” NOTE: ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS) 19 X84160/640/128 PACKAGING INFORMATION t 28-LEAD PLASTIC, TSSOP P ACKAGE TYPE V du c .025 (.65) BSC P .394 (10.0) ro .169 (4.3) .252 (6.4) BSC .177 (4.5) e .047 (1.20) .002 (.05) .006 (.15) et .0075 (.19) .0118 (.30) .010 (.25) Gage Plane Seating Plane .019 (.50) .029 (.75) Detail A (20X) O bs ol 0° – 8° .031 (.80) .041 (1.05) See Detail “A” NOTE: ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS) 20 X84160/640/128 ORDERING INFORMATION X84160/640/128 P T G –V Device VCC Range Blank = 4.5V to 5.5V, 10 MHz 2.5 = 2.5V to 5.5V, 5 MHz 1.8 = 1.8V to 3.6V, 4 MHz G = RoHS Compliant Lead Free package Blank = Standard package. Non lead free Temperature Range Blank = Commercial = 0°C to +70°C E = Extended = –20°C to +85°C I = Industrial = –40°C to +85°C Military = –55°C to +125°C (contact factory) Packages: X84160 P = 8-Lead PDIP S8 = 8-Lead SOIC *PART MARK CONVENTION 8-Lead TSSOP EYWW 8160XXG G = RoHS compliant lead free AG = 1.8 to 3.6V, 0 to +70°C AH = 1.8 to 3.6V, -40 to +85°C F = 2.5 to 5.5V, 0 to +70°C G = 2.5 to 5.5V, -40 to +85°C Blank = 4.5 to 5.5V, 0 to +70°C I = 4.5 to 5.5V, -40 to +85°C 8-Lead XBGA PACKAGE Complete Part Number X84640ZE-2.5 X84640ZI-2.5 X84128ZE-2.5 X84128 ZI-2.5 V8 = 8-Lead TSSOP 8-Lead SOIC/PDIP Blank = 8-Lead SOIC P = 8-Lead PDIP G = RoHS compliant lead free AG = 1.8 to 3.6V, 0 to +70°C AH = 1.8 to 3.6V, -40 to +85°C F = 2.5 to 5.5V, 0 to +70°C G = 2.5 to 5.5V, -40 to +85°C X84160G XXX Blank = 4.5 to 5.5V, 0 to +70°C I = 4.5 to 5.5V, -40 to +85°C Top Mark XAP XAR XAN XAO *All parts and package types not included will receive standard marking. 21 X84640 P = 8-Lead PDIP S8 = 8-Lead SOIC V20 = 20-Lead TSSOP Z = 8-Lead XBGA X84128 P = 8-Lead PDIP S14 = 14-Lead SOIC V28 = 28-Lead TSSOP Z = 8-Lead XBGA X84160/640/128 LIMITED WARRANTY Devices sold by Xicor, Inc. are covered by the warranty and patent indemnification provisions appearing in its Terms of Sale only. Xicor, Inc. makes no warranty, express, statutory, implied, or by description regarding the information set forth herein or regarding the freedom of the described devices from patent infringement. Xicor, Inc. makes no warranty of merchantability or fitness for any purpose. Xicor, Inc. reserves the right to discontinue production and change specifications and prices at any time and without notice. Xicor, Inc. assumes no responsibility for the use of any circuitry other than circuitry embodied in a Xicor, Inc. product. No other circuits, patents, licenses are implied. U.S. PATENTS Xicor products are covered by one or more of the following U.S. Patents: 4,263,664; 4,274,012; 4,300,212; 4,314,265; 4,326,134; 4,393,481; 4,404,475; 4,450,402; 4,486,769; 4,488,060; 4,520,461; 4,533,846; 4,599,706; 4,617,652; 4,668,932; 4,752,912; 4,829, 482; 4,874, 967; 4,883, 976. Foreign patents and additional patents pending. LIFE RELATED POLICY In situations where semiconductor component failure may endanger life, system designers using this product should design the system with appropriate error detection and correction, redundancy and back-up features to prevent such an occurence. Xicor's products are not authorized for use in critical components in life support devices or systems. 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and whose failure to perform, when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. 22