Dual-Axis ±5 g Accelerometer with SPI Interface ADIS16006 FEATURES GENERAL DESCRIPTION Dual-axis accelerometer SPI® digital output interface Internal temperature sensor Highly integrated; minimal external components Bandwidth externally selectable 1.9 mg resolution at 60 Hz Externally controlled electrostatic self-test 3.0 V to 5.25 V single-supply operation Low power: <2 mA 3500 g shock survival 7.2 mm × 7.2 mm × 3.6 mm package The ADIS16006 is a low cost, low power, complete dual-axis accelerometer with an integrated serial peripheral interface (SPI). An integrated temperature sensor is also available on the SPI interface. The ADIS16006 measures acceleration with a fullscale range of ±5 g (minimum). The ADIS16006 can measure both dynamic acceleration (that is, vibration) and static acceleration (that is, gravity). The typical noise floor is 200 μg/√Hz, allowing signals below 1.9 mg (60 Hz bandwidth) to be resolved. The bandwidth of the accelerometer is set with optional capacitors, CX and CY, at the XFILT and YFILT pins. Digital output data for both axes is available via the serial interface. APPLICATIONS Industrial vibration/motion sensing Platform stabilization Dual-axis tilt sensing Tracking, recording, analysis devices Alarms, security devices An externally driven self-test pin (ST) allows the user to verify the accelerometer functionality. The ADIS16006 is available in a 7.2 mm × 7.2 mm × 3.6 mm, 12-terminal LGA package. FUNCTIONAL BLOCK DIAGRAM VCC ADIS16006 SCLK DUAL-AXIS ±5g ACCELEROMETER SERIAL INTERFACE DIN DOUT CS CDC TCS COM ST YFILT XFILT CY CX 05975-001 TEMP SENSOR Figure 1. Rev. 0 Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2006 Analog Devices, Inc. All rights reserved. ADIS16006 TABLE OF CONTENTS Features .............................................................................................. 1 Self-Test ....................................................................................... 11 Applications....................................................................................... 1 Serial Interface ............................................................................ 11 General Description ......................................................................... 1 Accelerometer Serial Interface.................................................. 11 Functional Block Diagram .............................................................. 1 Temperature Sensor Serial Interface........................................ 12 Revision History ............................................................................... 2 Power Supply Decoupling ......................................................... 12 Specifications..................................................................................... 3 Setting the Bandwidth ............................................................... 13 Timing Characteristics ................................................................ 4 Selecting Filter Characteristics: The Noise/Bandwidth Trade-Off ............................................. 13 Circuit and Timing Diagrams..................................................... 4 Absolute Maximum Ratings............................................................ 6 ESD Caution.................................................................................. 6 Pin Configuration and Function Descriptions............................. 7 Typical Performance Characteristics ............................................. 8 Applications..................................................................................... 14 Second Level Assembly ............................................................. 14 Outline Dimensions ....................................................................... 15 Ordering Guide .......................................................................... 15 Theory of Operation ...................................................................... 11 REVISION HISTORY 3/06—Revision 0: Initial Version Rev. 0 | Page 2 of 16 ADIS16006 SPECIFICATIONS TA = −40°C to +125°C, VCC = 5 V, CX = CY = 0 μF, acceleration = 0 g, unless otherwise noted. All minimum and maximum specifications are guaranteed. Typical specifications are not guaranteed. Table 1. Parameter ACCELEROMETER SENSOR INPUT Measurement Range 1 Nonlinearity Package Alignment Error Alignment Error Cross Axis Sensitivity ACCELEROMETER SENSITIVITY Sensitivity at XFILT, YFILT Sensitivity Change due to Temperature 2 ZERO g BIAS LEVEL 0 g Voltage at XFILT, YFILT 0 g Offset vs. Temperature ACCELEROMETER NOISE PERFORMANCE Noise Density ACCELEROMETER FREQUENCY RESPONSE 3, 4 CX, CY Range RFILT Tolerance Sensor Bandwidth Sensor Resonant Frequency ACCELEROMETER SELF-TEST Logic Input Low Logic Input High ST Input Resistance to COM Output Change at XOUT, YOUT 5 TEMPERATURE SENSOR Accuracy Resolution Update Rate Temperature Conversion Time DIGITAL INPUT Input High Voltage (VINH) T Input Low Voltage (VINL) Input Current Input Capacitance DIGITAL OUTPUT Output High Voltage (VOH) Output Low Voltage (VOL) Conditions Each axis Min Typ Max ±0.5 ±1.5 ±0.1 ±1.5 ±2.5 ±5 % of full scale X sensor to Y sensor ±3 Unit g % degrees degrees % Each axis 242 256 ±0.3 272 LSB/g % 1905 2048 ±0.1 2190 LSB LSB/°C Delta from 25°C Each axis @ 25°C 200 0 24 CX = 0μF, CY = 0μF Self-Test 0 to Self-Test 1 0.8 × VCC 30 102 VCC = 3 V to 5.25 V VCC = 4.75 V to 5.25 V VCC = 3.0 V to 3.6 V VCC = 3.0 V to 5.25 V VIN = 0 V or VCC ISOURCE = 200 μA, VCC = 3.0 V to 5.25 V ISINK = 200 μA Rev. 0 | Page 3 of 16 32 2.26 5.5 50 205 μg/√Hz rms 10 40 μF kΩ kHz kHz 0.2 × VCC V V kΩ LSB 307 ±2 10 400 25 °C Bits μs μs 1 10 V V V μA pF 2.4 2.1 −10 0.8 10 VCC − 0.5 0.4 V V ADIS16006 Parameter POWER SUPPLY Operating Voltage Range Quiescent Supply Current Power-Down Current Turn-On Time 6 Conditions Min Typ 3.0 FSCLK = 50 kSPS 1.5 1.0 20 CX, CY = 0.1 μF Max Unit 5.25 1.9 V mA mA ms 1 Guaranteed by measurement of initial offset and sensitivity. 2 Defined as the output change from ambient to maximum temperature or ambient to minimum temperature. 3 Actual bandwidth response controlled by user-supplied external capacitor (CX, CY). 4 See the Setting the Bandwidth section for more information on how to reduce the bandwidth. 5 Self-test response changes as the square of VCC. 6 Larger values of CX and CY increase turn-on time. Turn-on time is approximately (160 × (0.0022 + CX or CY) + 4) in milliseconds, where CX and CY are in μF. TIMING CHARACTERISTICS TA = −40°C to +125°C, acceleration = 0 g, unless otherwise noted. Table 2. Parameter 1, 2 fSCLK 3 tCONVERT tACQ t1 t2 4 t34 t4 t5 t6 t7 t8 5 t9 VCC = 3.3 V 10 2 14.5 × tSCLK 1.5 × tSCLK 10 60 100 20 20 0.4 × tSCLK 0.4 × tSCLK 80 5 VCC = 5 V 10 2 14.5 × tSCLK 1.5 × tSCLK 10 30 75 20 20 0.4 × tSCLK 0.4 × tSCLK 80 5 Unit kHz min MHz max Description Throughput time = tCONVERT + tACQ = 16 × tSCLK TCS/CS to SCLK setup time Delay from TCS/CS until DOUT three-state disabled Data access time after SCLK falling edge Data setup time prior to SCLK rising edge Data hold time after SCLK rising edge SCLK high pulse width SCLK low pulse width TCS/CS rising edge to DOUT high impedance Power-up time from shutdown ns min ns max ns max ns min ns min ns min ns min ns max μs typ 1 Guaranteed by design. All input signals are specified with tR and tF = 5 ns (10% to 90% of VCC) and timed from a voltage level of 1.6 V. The 3.3 V operating range spans from 3.0 V to 3.6 V. The 5 V operating range spans from 4.75 V to 5.25 V. 2 See Figure 3 and Figure 4. 3 Mark/space ratio for the SCLK input is 40/60 to 60/40. 4 Measured with the load circuit in Figure 2 and defined as the time required for the output to cross 0.4 V or 2.0 V with VCC = 3.3 V and time for an output to cross 0.8 V or 2.4 V with VCC = 5.0 V. 5 t8 is derived from the measured time taken by the data outputs to change 0.5 V when loaded with the circuit in Figure 2. The measured number is then extrapolated back to remove the effects of charging or discharging the 50 pF capacitor. This means that the time, t8, quoted in the Timing Characteristics is the true bus relinquish time of the part and is independent of the bus loading. CIRCUIT AND TIMING DIAGRAMS 200µA 1.6V CL 50pF 200µA IOH 05975-002 TO OUTPUT PIN IOL Figure 2. Load Circuit for Digital Output Timing Specifications Rev. 0 | Page 4 of 16 ADIS16006 tACQ tCONVERT CS t6 t1 1 SCLK 2 3 t2 DOUT 4 t7 THREE-STATE 5 6 15 16 t8 t3 THREE-STATE 4 LEADING ZEROS DB9 DB10 DB11 DB0 t4 DIN ZERO ZERO ZERO ADD0 ONE ZERO 05975-003 t5 DON’T CARE PM0 Figure 3. Accelerometer Serial Interface Timing Diagram TCS t6 1 DOUT THREESTATE 2 3 t3 LEADING ZERO 4 11 15 t7 16 t8 THREE-STATE DB9 DB8 DB0 05975-004 t1 SCLK DIN Figure 4. Temperature Serial Interface Timing Diagram Rev. 0 | Page 5 of 16 ADIS16006 ABSOLUTE MAXIMUM RATINGS Table 3. Parameter Acceleration (Any Axis, Unpowered) Acceleration (Any Axis, Powered) VCC All Other Pins Output Short-Circuit Duration (Any Pin to Common) Operating Temperature Range Storage Temperature Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Rating 3500 g 3500 g −0.3 V to +7.0 V (COM − 0.3 V) to (VCC + 0.3 V) Indefinite −40°C to +125°C −65°C to +150°C Table 4. Package Characteristics Package Type 12-Lead LGA θCA 200°C/W θJC 25°C/W Device Weight 0.3 grams ESD CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although this product features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality. 1.0755 8× BSC 0.670 8× BSC 5.873 2× 0.500 12× BSC Figure 5. Second Level Assembly Pad Layout Rev. 0 | Page 6 of 16 05975-005 1.127 12× BSC ADIS16006 TCS CS 12 VCC SCLK PIN CONFIGURATION AND FUNCTION DESCRIPTIONS 11 10 1 9 XFILT 8 YFILT 7 NC DIN 3 TOP VIEW (Not to Scale) 5 6 ST 2 NC DOUT COM 4 NC = NO CONNECT 05975-006 ADIS16006 Figure 6. Pin Configuration Table 5. Pin Function Descriptions Pin No. Mnemonic Description 1 TCS 2 DOUT 3 DIN 4 5, 7 6 8 COM NC ST YFILT 9 XFILT 10 CS 11 12 VCC SCLK Temperature Chip Select. Active low logic input. This input frames the serial data transfer for the temperature sensor output. Data Out, Logic Output. The conversion of the ADIS16006 is provided on this output as a serial data stream. The bits are clocked out on the falling edge of the SCLK input. Data In, Logic Input. Data to be written into the ADIS16006’s control register is provided on this input and is clocked into the register on the rising edge of SCLK. Common. Reference point for all circuitry on the ADIS16006. No Connect. Self-Test Input. Active high logic input. Simulates a nominal 0.75 g test input for diagnostic purpose. Y Channel Filter Node. Used in conjunction with an optional external capacitor to band limit the noise contribution from the accelerometer. X Channel Filter Node. Used in conjunction with an optional external capacitor to band limit the noise contribution from the accelerometer. Chip Select. Active low logic input. This input provides the dual function of initiating the accelerometer conversions on the ADIS16006 and framing the serial data transfer for the accelerometer output. Power Supply Input. The VCC range for the ADIS16006 is 3.0 V to 5.25 V. Serial Clock, Logic Input. SCLK provides the serial clock for accessing data from the part and writing serial data to the control register. This clock input is also used as the clock source for the ADIS16006’s conversion process. Rev. 0 | Page 7 of 16 ADIS16006 TYPICAL PERFORMANCE CHARACTERISTICS 25 262 261 SENSITIVITY (LSB/g) PERCENT OF POPULATION (%) B3-Y B3-X 260 B1-Y B5-X 259 B2-X B1-X 258 257 B5-Y B4-X 256 B2-Y B4-Y AVERAGE = 2040.66 STANDARD DEVIATION = 23.19 20 15 10 5 2075 2080 2085 2090 2080 2085 2090 OUTPUT (LSB) 05975-010 2070 2075 2065 2060 2055 2050 2045 2040 2070 TEMPERATURE (°C) 2035 150 2030 125 2025 100 2020 75 2015 50 2010 25 2005 0 2000 –25 05975-007 0 254 –50 1995 255 Figure 10. X-Axis 0 g Bias at 25°C Figure 7. Sensitivity vs. Temperature (±1 g Stimulus) 40 2048 AVERAGE = 2055.875 STANDARD DEVIATION = 6.464 35 AVG AT 5.25V AVG AT 4.75V 2044 AVG AT 3.60V 2042 AVG AT 3.30V AVG AT 3.00V 2040 30 25 20 15 10 2065 2060 2055 2050 2045 OUTPUT (LSB) 05975-011 TEMPERATURE (°C) 2040 120 2035 100 2030 80 2025 60 2020 40 2015 20 2010 0 2005 –20 05975-008 0 2038 –40 2000 5 1995 BIAS LEVEL (LSB) PERCENT OF POPULATION (%) 5.25V 2046 Figure 11. Y-Axis 0 g Bias at 25°C Figure 8. X-Axis 0 g Bias vs. Temperature 2048 60 2047 PERCENT OF POPULATION (%) +125°C 2045 2044 +25°C 2043 2042 –40°C 2041 2040 50 40 30 20 10 2038 3.0 3.5 4.0 4.5 5.0 VCC (V) 5.5 0 80 85 90 95 100 105 110 115 120 125 130 135 140 NOISE (µg/ Hz) Figure 12. Noise (X-Axis) at VCC = 5 V, 25°C Figure 9. X-Axis 0 g Bias vs. Supply Voltage Rev. 0 | Page 8 of 16 05975-012 2039 05975-009 BIAS LEVEL (LSB) 2046 ADIS16006 45 250 AVG AT 5.25V AVG AT 5.00V 200 35 30 SELF TEST (LSB) PERCENT OF POPULATION (%) 40 25 20 15 10 AVG AT 4.75V 150 AVG AT 3.60V 100 AVG AT 3.30V AVG AT 3.00V 50 80 85 90 95 100 105 110 115 120 125 130 135 140 NOISE (µg/ Hz) 0 –50 05975-013 0 150 250 AVERAGE = 202.2137 STANDARD DEVIATION = 12.09035 230 +125°C 210 30 190 SELF TEST (LSB) 25 20 15 +25°C 170 –40°C 150 130 110 10 90 5 110 130 150 170 190 210 230 250 270 290 OUTPUT (LSB) 50 3.0 05975-014 0 5.5 5.5 +125°C 1.7 30 1.6 CURRENT (mA) 25 20 15 +25°C 1.5 1.4 1.2 5 1.1 1.0 3.0 05975-015 –40°C 1.3 10 OUTPUT (LSB) 5.0 1.8 35 40 45 50 55 60 65 70 75 80 85 90 95 100 105 110 4.5 Figure 17. Self-Test X-Axis vs. Supply Voltage AVERAGE = 82.89281 STANDARD DEVIATION = 4.908012 0 4.0 VCC (V) Figure 14. X-Axis Self-Test at 25°C, VCC = 5 V 40 3.5 05975-017 70 05975-018 PERCENT OF POPULATION (%) 100 Figure 16. Self-Test X-Axis vs. Temperature 35 PERCENT OF POPULATION (%) 50 TEMPERATURE (°C) Figure 13. Noise (Y-Axis) at VCC = 5 V, 25°C 40 0 05975-016 5 3.5 4.0 4.5 5.0 VCC (V) Figure 15. X-Axis Self-Test at 25°C, VCC = 3.3 V Figure 18. Supply Current vs. Supply Voltage Rev. 0 | Page 9 of 16 ADIS16006 1.3 45 VCC = 5.0V 1.2 1.1 CURRENT (mA) PERCENT OF POPULATION (%) VCC = 3.3V 35 25 15 +125°C 1.0 +25°C 0.9 –40°C 0.8 5 1.15 1.19 1.23 1.27 1.31 1.35 1.39 1.43 1.47 1.51 1.55 1.59 CURRENT (mA) 0.6 3.0 05975-023 –5 3.5 4.0 4.5 5.0 5.5 VCC (V) 05975-020 0.7 Figure 21. Power-Down Supply Current vs. Supply Voltage Figure 19. Supply Current at 25°C 0.6 60 50 0.4 VCC = 3.3V SAMPLING ERROR 0.2 40 30 20 0 –0.2 –0.4 –0.6 10 0 0.70 0.74 0.78 0.82 0.86 0.90 0.94 0.98 1.02 1.06 1.10 CURRENT (mA) –1.0 1 10 FREQUENCY (MHz) Figure 20. Power-Down Supply Current Figure 22. Sampling Error vs. Sampling Frequency Rev. 0 | Page 10 of 16 100 05975-024 –0.8 05975-019 PERCENT OF POPULATION (%) VCC = 5.0V ADIS16006 THEORY OF OPERATION The ADIS16006 is a low cost, low power, complete dual-axis accelerometer with an integrated serial peripheral interface (SPI) and an integrated temperature sensor whose output is also available on the SPI interface. The ADIS16006 is capable of measuring acceleration with a full-scale range of ±5 g (minimum). The ADIS16006 can measure both dynamic acceleration (that is, vibration) and static acceleration (that is, gravity). SELF-TEST The ST pin controls the self-test feature. When this pin is set to VCC, an electrostatic force is exerted on the beam of the accelerometer. The resulting movement of the beam allows the user to test if the accelerometer is functional. The typical change in output is 801 mg (corresponding to 205 LSB) for VCC = 5.0 V. This pin may be left open-circuit or connected to common in normal use. The ST pin should never be exposed to voltage greater than VCC + 0.3 V. If the system design is such that this condition cannot be guaranteed (that is, multiple supply voltages present), a low VF clamping diode between ST and VCC is recommended. SERIAL INTERFACE The serial interface on the ADIS16006 consists of five wires: CS, TCS, SCLK, DIN, and DOUT. Both accelerometer axes and the temperature sensor data are available on the serial interface. The CS and TCS are used to select the accelerometer or temperature sensor outputs, respectively. CS and TCS cannot be active at the same time. The SCLK input provides access to data from the internal data registers. ACCELEROMETER SERIAL INTERFACE Accelerometer Control Register MSB DONTC LSB ZERO ZERO ZERO ZERO ONE ZERO PM0 Table 6. Accelerometer Control Register Bit Functions Bit 7 6, 5, 4 3 Mnemonic DONTC ZERO ADD0 2 1 0 ONE ZERO PM0 Comments Don’t care. Can be 1 or 0. These bits should be held low. This address bit selects the X-axis or Y-axis outputs. A 0 selects the X-axis; a 1 selects the Y-axis. This bit should be held high. This bit should be held low. This bit selects the operation mode for the accelerometer; set to 0 for normal operation and 1 for power-down mode. Power-Down By setting PM0 to 1 when updating the accelerometer control register, the ADIS16006 is put into a shutdown mode. The information stored in the control register is maintained during shutdown. The ADIS16006 changes modes as soon as the control register is updated. Therefore, if the part is in shutdown mode and PM0 is changed to 0, the part powers up on the 16th SCLK rising edge. ADD0 By setting ADD0 to 0 when updating the accelerometer control register, the X-axis output is selected. By setting ADD0 to 1, the Y-axis output is selected. ZERO ZERO is defined as the logic low level. ONE Figure 3 shows the detailed timing diagram for serial interfacing to the accelerometer in the ADIS16006. The serial clock provides the conversion clock. CS initiates the conversion process and data transfer and also frames the serial data transfer for the accelerometer output. The accelerometer output is sampled on the second rising edge of the SCLK input after the falling edge of the CS. The conversion requires 16 SCLK cycles to complete. The rising edge of CS puts the bus back into three-state. If CS remains low, the next digital conversion is initiated. The details for the control register bit functions are shown in Table 6. ONE is defined as the logic high level. DONTC DONTC is defined as don’t care and can be a low or high logic level. Accelerometer Conversion Details Every time the accelerometer is sampled, the sampling function discharges the internal CX or CY filtering capacitors by up to 2% of their initial values (assuming no additional external filtering capacitors have been added). The recovery time for the filter capacitor to recharge is approximately 10 μs. Thus, sampling the accelerometer at a rate of 10 kSPS or less does not induce a sampling error. However, as sampling frequencies increase above 10 kSPS, one can expect sampling errors to attenuate the actual acceleration levels. Rev. 0 | Page 11 of 16 ADIS16006 TEMPERATURE SENSOR SERIAL INTERFACE Read Operation Figure 4 shows the timing diagram for a serial read from the temperature sensor. The TCS line enables the SCLK input. Ten bits of data and a leading 0 are transferred during a read operation. Read operations occur during streams of 16 clock pulses. The serial data can be received into two bytes to accommodate the entire 10-bit data stream. If only eight bits of resolution are required, then the data can be received into a single byte. At the end of the read operation, the DOUT line remains in the state of the last bit of data clocked out until TCS goes high, at which time the DOUT line from the temperature sensor goes three-state. Write Operation Figure 4 also shows the timing diagram for the serial write to the temperature sensor. The write operation takes place at the same time as the read operation. Data is clocked into the control register on the rising edge of SCLK. DIN should remain low for the entire cycle. Temperature Sensor Control Register MSB ZERO LSB ZERO ZERO ZERO ZERO ZERO ZERO ZERO Note that if the TCS is brought low every 350 μs (±30%) or less, the same temperature value is output onto the DOUT line every time without changing. It is recommended that the TCS line not be brought low every 350 μs (±30%) or less. The ±30% covers process variation. The TCS should become active (high to low) outside this range. The device is designed to autoconvert every 350 μs. If the temperature sensor is accessed during the conversion process, an internal signal is generated to prevent any update of the temperature value register during the conversion. This prevents the user from reading back spurious data. The design of this feature results in this internal lockout signal being reset only at the start of the next autoconversion. Therefore, if the TCS line goes active before the internal lockout signal is reset to its inactive mode, the internal lockout signal is not reset. To ensure that no lockout signal is set, bring TCS low at a greater time than 350 μs (±30%). As a result, the temperature sensor is not interrupted during a conversion process. In the automatic conversion mode, every time a read or write operation takes place, the internal clock oscillator is restarted at the end of the read or write operation. The result of the conversion is typically available 25 μs later. Reading from the device before conversion is complete provides the same set of data. Table 7. Temperature Sensor Control Register Bit Functions Table 8. Temperature Sensor Data Format Bit 7 to 0 Temperature –40°C –25°C –0.25°C 0°C +0.25°C +10°C +25°C +50°C +75°C +100°C +125°C Mnemonic ZERO Comments All bits should be held low. ZERO ZERO is defined as the logic low level. Output Data format The output data format for the temperature sensor is twos complement. Table 8 shows the relationship between the digital output and the temperature. Temperature Sensor Conversion Details The ADIS16006 features a 10-bit digital temperature sensor that allows accurate measurement of the ambient device temperature. Digital Output (DB9 … DB0) 11 0110 0000 11 1001 1100 11 1111 1111 00 0000 0000 00 0000 0001 00 0010 1000 00 0110 0100 00 1100 1000 01 0010 1100 01 1001 0000 01 1111 0100 POWER SUPPLY DECOUPLING The conversion clock for the temperature sensor is internally generated so no external clock is required except when reading from and writing to the serial port. In normal mode, an internal clock oscillator runs the automatic conversion sequence. A conversion is initiated approximately every 350 μs. At this time, the temperature sensor wakes up and performs a temperature conversion. This temperature conversion typically takes 25 μs, at which time the temperature sensor automatically shuts down. The result of the most recent temperature conversion is available in the serial output register at any time. Once the conversion is finished, an internal oscillator starts counting and is designed to time out every 350 μs. The temperature sensor then powers up and does a conversion. The ADIS16006 integrates two decoupling capacitors that are 0.047 μF in value. For local operation of the ADIS16006, no additional power supply decoupling capacitance is required. However, if the system power supply presents a substantial amount of noise, additional filtering can be required. If additional capacitors are required, connect the ground terminal of each of these capacitors directly to the underlying ground plane. Finally, note that all analog and digital grounds should be referenced to the same system ground reference point. Rev. 0 | Page 12 of 16 ADIS16006 SETTING THE BANDWIDTH The ADIS16006 has provisions for band limiting the accelerometer. Capacitors can be added at the XFILT and YFILT pins to implement further low-pass filtering for antialiasing and noise reduction. The equation for the 3 dB bandwidth is With the single pole roll-off characteristic, the typical noise of the ADIS16006 is determined by rmsNoise = (200 μg/root Hz) x (root (BW x 1.57)) At 100 Hz, the noise is F−3dB = 1/(2π(32 kΩ) × (C(XFILT, YFILT) + 2200 pF)) rmsNoise = (200 μg/root Hz) x (root (100 x 1.57)) =2.5 mg Capacitor (μF) 4.7 0.47 0.10 0.047 0.022 0.01 0 10 DIGITAL OUTPUT (IN LSBs) X-AXIS: 1792 Y-AXIS: 2048 7 2 9 11 1 12 3 Bandwidth (Hz) 1 10 50 100 200 400 2250 Percentage of Time That Noise Exceeds Nominal Peak-to-Peak Value 32% 4.6% 0.27% 0.006% 4 8 7 3 6 5 Top View Not to Scale 4 6 5 Rev. 0 | Page 13 of 16 9 DIGITAL OUTPUT (IN LSBs) X-AXIS: 2048 Y-AXIS: 2048 1 8 8 4 DIGITAL OUTPUT (IN LSBs) X-AXIS: 2304 Y-AXIS: 2048 11 12 05975-021 10 The ADIS16006 noise has the characteristics of white Gaussian noise, which contributes equally at all frequencies and is described in terms of μg/√Hz (that is, the noise is proportional to the square root of the accelerometer’s bandwidth). The user should limit bandwidth to the lowest frequency needed by the application to maximize the resolution and dynamic range of the accelerometer. DIGITAL OUTPUT (IN LSBs) X-AXIS: 2048 Y-AXIS: 1792 7 3 9 The ADIS16006 has a typical bandwidth of 2.25 kHz with no external filtering. The analog bandwidth may be further decreased to reduce noise and improve resolution. 1 3 2 7 1 2 6 12 DIGITAL OUTPUT (IN LSBs) X-AXIS: 2048 Y-AXIS: 2304 5 The accelerometer bandwidth selected ultimately determines the measurement resolution (smallest detectable acceleration). Filtering can be used to lower the noise floor, which improves the resolution of the accelerometer. Resolution is dependent on the analog filter bandwidth at XFILT and YFILT. 11 10 9 6 4 SELECTING FILTER CHARACTERISTICS: THE NOISE/BANDWIDTH TRADE-OFF 5 12 Table 9. Filter Capacitor Selection, CXFILT and CYFILT Peak-to-Peak Value 2 × rms 4 × rms 6 × rms 8 × rms 11 A minimum capacitance of 0 pF for CXFILT and CYFILT is allowable. Table 10. Estimation of Peak-to-Peak Noise 10 The tolerance of the internal resistor (RFILT) can vary typically as much as ±25% of its nominal value (32 kΩ); thus, the bandwidth varies accordingly. 8 F−3dB = 5 μF/(C(XFILT, YFILT) + 2200 pF) Often, the peak value of the noise is desired. Peak-to-peak noise can be estimated only by statistical methods. Table 10 is useful for estimating the probabilities of exceeding various peak values, given the rms value. 2 or more simply, Figure 23. Output Response vs. Orientation ADIS16006 APPLICATIONS Table 11. SECOND LEVEL ASSEMBLY The ADIS16006 can be attached to the second-level assembly board using SN63 (or equivalent) or lead-free solder. Figure 24 and Table 11 provide acceptable solder reflow profiles for each solder type. Note that these profiles cannot be the optimum profile for the user’s application. In no case shall 260°C be exceeded. It is recommended that the user develop a reflow profile based upon the specific application. In general, keep in mind the lowest peak temperature and shortest dwell time above the melt temperature of the solder result in less shock and stress to the product. In addition, evaluating the cooling rate and peak temperature can result in a more reliable assembly. Time (TSMIN to TSMAX) (ts) TSMAX to TL Ramp-Up Rate Time Maintained Above Liquidous (TL) Liquidous Temperature (TL) Time (tL) CRITICAL ZONE TL TO TP tP TP Profile Feature Average Ramp Rate (TL to TP) Preheat Minimum Temperature (TSMIN) Maximum Temperature (TSMAX) Peak Temperature (TP) tL TSMAX Time Within 5°C of Actual Peak Temperature (tp) Ramp-Down Rate Time 25°C to Peak Temperature TSMIN tS RAMP-DOWN PREHEAT t25°C TO PEAK TIME 05975-022 TEMPERATURE RAMP-UP TL Figure 24. Acceptable Solder Reflow Profiles Rev. 0 | Page 14 of 16 Condition Sn63/Pb37 Pb-free 3°C/sec max 3°C/sec max 100°C 150°C 60 sec to 120 sec 150°C 200°C 60 sec to 150 sec 3°C/sec 3°C/sec 183°C 60 sec to 150 sec 240°C + 0°C/−5°C 10 sec to 30 sec 6°C/sec max 6 min max 217°C 60 sec to 150 sec 260°C + 0°C/−5°C 20 sec to 40 sec 6°C/sec max 8 min max ADIS16006 OUTLINE DIMENSIONS 7.33 MAX SQ 1.3025 BSC 10 PIN 1 INDICATOR 12 1.00 BSC 9 1 7 3 PIN 1 INDICATOR 0.797 BSC 6 TOP VIEW 0.227 BSC (4 PLCS) 4 BOTTOM VIEW 0.373 BSC (12 PLCS) 5.00 TYP 031706-A 3.60 MAX SIDE VIEW Figure 25. 12-Terminal Land Grid Array [LGA] (CC-12-1) Dimensions shown in millimeters ORDERING GUIDE Model ADIS16006CCCZ 1 ADIS16006/PCB 1 Temperature Range −40°C to +125°C Package Description 12-Terminal Land Grid Array (LGA) Evaluation Board Z = Pb-free part. Rev. 0 | Page 15 of 16 Package Option CC-12-1 ADIS16006 NOTES ©2006 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D05975-0-3/06(0) T T Rev. 0 | Page 16 of 16