IRF IRFH6200TRPBF

PD - 97493C
IRFH6200PbF
HEXFET® Power MOSFET
V DS
20
V
R DS(on) max
1.20
m
Qg (typical)
155
nC
R G (typical)
1.3

(@VGS = 4.5V)
ID
(@Tmb = 25°C)
100
h
PQFN 5X6 mm
A
Applications
Charge and discharge switch for battery application
Load switch for 12V (typical) bus
Features and Benefits
Features
Low RDSon ( 1.20m
Low Thermal Resistance to PCB (0.8°C/W)
Low Profile ( 0.9 mm)
Benefits
Lower Conduction Losses
Enable better thermal dissipation
results in Increased Power Density
Industry-Standard Pinout
Compatible with Existing Surface Mount Techniques
RoHS Compliant Containing no Lead, no Bromide and no Halogen
Orderable part number
Package Type
IRFH6200TRPBF
IRFH6200TR2PBF
PQFN 5mm x 6mm
PQFN 5mm x 6mm

Multi-Vendor Compatibility
Easier Manufacturing
Environmentally Friendlier
Standard Pack
Form
Quantity
Tape and Reel
4000
Tape and Reel
400
Note
Absolute Maximum Ratings
Parameter
Max.
VDS
Drain-to-Source Voltage
20
VGS
Gate-to-Source Voltage
±12
ID @ TA = 25°C
Continuous Drain Current, VGS @ 4.5V
45
ID @ TA = 70°C
Continuous Drain Current, VGS @ 4.5V
ID @ Tmb = 25°C
Continuous Drain Current, VGS @ 4.5V
36
100
ID @ Tmb = 100°C
IDM
Continuous Drain Current, VGS @ 4.5V
Pulsed Drain Current
PD @TA = 25°C
Power Dissipation
c
PD @Tmb = 25°C
g
Power Dissipation g
TJ
Linear Derating Factor
Operating Junction and
TSTG
Storage Temperature Range
h
h
V
A
100
400
3.6
g
Units
156
0.029
-55 to + 150
W
W/°C
°C
Notes  through † are on page 8
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1
October 12, 2012
IRFH6200PbF
Static @ TJ = 25°C (unless otherwise specified)
Min.
Typ.
BVDSS
VDSS/TJ
Drain-to-Source Breakdown Voltage
Breakdown Voltage Temp. Coefficient
Parameter
20
–––
–––
6.4
–––
–––
RDS(on)
Static Drain-to-Source On-Resistance
–––
–––
0.80
1.10
1.20
1.50
VGS(th)
VGS(th)
Gate Threshold Voltage
Gate Threshold Voltage Coefficient
0.5
–––
0.8
-6.6
1.1
–––
IDSS
Drain-to-Source Leakage Current
–––
–––
1.0
Gate-to-Source Forward Leakage
–––
–––
–––
–––
150
100
Gate-to-Source Reverse Leakage
Forward Transconductance
–––
260
–––
–––
-100
–––
Total Gate Charge
Gate-to-Source Charge
–––
–––
155
22
230
–––
Gate-to-Drain Charge
–––
53
–––
Gate Resistance
Turn-On Delay Time
Rise Time
–––
–––
–––
1.3
14
74
–––
–––
–––
Turn-Off Delay Time
–––
140
–––
Fall Time
Input Capacitance
–––
–––
160
10890
–––
–––
Output Capacitance
Reverse Transfer Capacitance
–––
–––
2890
2180
–––
–––
IGSS
gfs
Qg
Qgs
Qgd
RG
td(on)
tr
td(off)
tf
Ciss
Coss
Crss
Max. Units
Conditions
V
VGS = 0V, ID = 250μA
mV/°C Reference to 25°C, ID = 1mA
m
VGS = 4.5V, ID = 50A
VGS = 2.5V, ID = 50A
e
e
V
VDS = VGS, ID = 150μA
mV/°C
μA
nA
S
nC
VDS = 16V, VGS = 0V
VDS = 16V, VGS = 0V, TJ = 125°C
VGS = 12V
VGS = -12V
VDS = 10V, ID = 50A
VDS = 10V
VGS = 4.5V
ID = 50A (See Fig.17 & 18)

ns
VDD = 10V, VGS = 4.5V
ID = 50A
RG=1.0
See Fig.15
VGS = 0V
pF
VDS = 10V
ƒ = 1.0MHz
Avalanche Characteristics
EAS
IAR
Parameter
Single Pulse Avalanche Energy
Avalanche Current
c
d
Typ.
–––
Max.
780
Units
mJ
–––
30
A
Diode Characteristics
Parameter
IS
Continuous Source Current
ISM
(Body Diode)
Pulsed Source Current
VSD
trr
Qrr
ton
Min.
–––
Typ.
–––
Max. Units
100
A
–––
c
–––
Conditions
MOSFET symbol
400
showing the
integral reverse
D
G
(Body Diode)
Diode Forward Voltage
–––
–––
1.2
V
p-n junction diode.
TJ = 25°C, IS = 50A, VGS = 0V
Reverse Recovery Time
Reverse Recovery Charge
–––
–––
86
350
130
525
ns
nC
TJ = 25°C, IF = 50A, VDD = 10V
di/dt = 260A/μs
Forward Turn-On Time
S
e
e
Time is dominated by parasitic Inductance
Thermal Resistance
Parameter
RJC-mb
Typ.
Max.
0.5
0.8
RJC (Top)
Junction-to-Mounting Base
Junction-to-Case
f
–––
15
RJA
Junction-to-Ambient
–––
35
–––
22
RJA (<10s)
2
October 12, 2012
g
Junction-to-Ambient g
Units
°C/W
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IRFH6200PbF
1000
1000
100
BOTTOM
TOP
ID, Drain-to-Source Current (A)
ID, Drain-to-Source Current (A)
TOP
VGS
10V
4.5V
3.5V
2.5V
2.0V
1.8V
1.5V
1.3V
BOTTOM
100
10
1.3V
1.3V
60μs PULSE WIDTH
60μs PULSE WIDTH
Tj = 150°C
Tj = 25°C
10
1
0.1
1
10
0.1
100
10
100
Fig 2. Typical Output Characteristics
Fig 1. Typical Output Characteristics
1000
1.6
RDS(on) , Drain-to-Source On Resistance
(Normalized)
ID, Drain-to-Source Current (A)
1
V DS, Drain-to-Source Voltage (V)
V DS, Drain-to-Source Voltage (V)
100
T J = 175°C
T J = 25°C
10
VDS = 10V
60μs PULSE WIDTH
1.0
ID = 50A
VGS = 4.5V
1.4
1.2
1.0
0.8
0.6
0.5
1.0
1.5
2.0
2.5
-60 -40 -20 0
Fig 4. Normalized On-Resistance vs. Temperature
Fig 3. Typical Transfer Characteristics
100000
20 40 60 80 100 120 140 160
T J , Junction Temperature (°C)
VGS, Gate-to-Source Voltage (V)
14.0
VGS = 0V,
f = 1 MHZ
C iss = C gs + C gd, C ds SHORTED
C rss = C gd
VGS, Gate-to-Source Voltage (V)
ID= 50A
C oss = C ds + C gd
C, Capacitance (pF)
VGS
10V
4.5V
3.5V
2.5V
2.0V
1.8V
1.5V
1.3V
Ciss
10000
Coss
Crss
12.0
VDS= 16V
VDS= 10V
10.0
8.0
6.0
4.0
2.0
0.0
1000
1
10
100
VDS, Drain-to-Source Voltage (V)
Fig 5. Typical Capacitance vs.Drain-to-Source Voltage
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0
100
200
300
400
QG, Total Gate Charge (nC)
Fig 6. Typical Gate Charge vs.Gate-to-Source Voltage
3
October 12, 2012
IRFH6200PbF
1000
ID, Drain-to-Source Current (A)
ISD, Reverse Drain Current (A)
1000
T J = 150°C
100
T J = 25°C
10
OPERATION IN THIS AREA
LIMITED BY R DS(on)
100μsec
100
10msec
DC
10
Tc = 25°C
Tj = 150°C
Single Pulse
VGS = 0V
1.0
1
0.0
0.2
0.4
0.6
0.8
1.0
0.1
1.2
1
10
100
VDS, Drain-to-Source Voltage (V)
VSD, Source-to-Drain Voltage (V)
Fig 7. Typical Source-Drain Diode Forward Voltage
Fig 8. Maximum Safe Operating Area
1.6
300
VGS(th) , Gate threshold Voltage (V)
Limited By Package
250
ID, Drain Current (A)
1msec
200
150
100
50
1.4
1.2
1.0
0.8
ID = 150μA
0.6
ID = 500μA
0.4
ID = 1.0mA
ID = 1.0A
0.2
0.0
0
25
50
75
100
125
-75 -50 -25
150
0
25
50
75 100 125 150
T J , Temperature ( °C )
T C , Case Temperature (°C)
Fig 9. Maximum Drain Current vs.
Case Temperature
Fig 10. Threshold Voltage vs. Temperature
Thermal Response ( Z thJC ) °C/W
10
1
D = 0.50
0.1
0.20
0.10
0.05
0.01
0.02
0.01
0.001
0.0001
1E-006
SINGLE PULSE
( THERMAL RESPONSE )
1E-005
0.0001
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc
0.001
0.01
0.1
1
t1 , Rectangular Pulse Duration (sec)
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Mounting Base
4
October 12, 2012
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4
3500
EAS , Single Pulse Avalanche Energy (mJ)
RDS(on), Drain-to -Source On Resistance (m )
IRFH6200PbF
ID = 50A
ID
TOP
19A
21A
BOTTOM 30A
3000
3
2500
2000
2
1500
T J = 125°C
1000
1
T J = 25°C
500
0
0
0
2
4
6
8
10
12
25
50
75
100
125
150
Starting T J , Junction Temperature (°C)
VGS, Gate -to -Source Voltage (V)
Fig 13. Maximum Avalanche Energy vs. Drain Current
Fig 12. On-Resistance vs. Gate Voltage
1000
Avalanche Current (A)
Allowed avalanche Current vs avalanche
pulsewidth, tav, assuming Tj = 125°C and
Tstart =25°C (Single Pulse)
100
10
Allowed avalanche Current vs avalanche
pulsewidth, tav, assuming  j = 25°C and
Tstart = 125°C.
1
1.0E-06
1.0E-05
1.0E-04
1.0E-03
1.0E-02
1.0E-01
tav (sec)
Fig 14. Typical Avalanche Current vs. Pulsewidth
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October 12, 2012
IRFH6200PbF
D.U.T
Driver Gate Drive
ƒ
-
‚
-
-
„
*
D.U.T. ISD Waveform
Reverse
Recovery
Current
+

RG
dv/dt controlled by RG
Driver same type as D.U.T.
I SD controlled by Duty Factor "D"
D.U.T. - Device Under Test
P.W.
Period
VGS=10V
Circuit Layout Considerations
 Low Stray Inductance
Ground Plane
Low Leakage Inductance
Current Transformer
+
D=
Period
P.W.
+
V DD
+
Body Diode Forward
Current
di/dt
D.U.T. VDS Waveform
Diode Recovery
dv/dt
Re-Applied
Voltage
-
Body Diode
VDD
Forward Drop
Inductor Curent
ISD
Ripple  5%
* VGS = 5V for Logic Level Devices
Fig 15. Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET® Power MOSFETs
V(BR)DSS
tp
15V
DRIVER
L
VDS
D.U.T
RG
+
V
- DD
IAS
20V
A
I AS
0.01
tp
Fig 16b. Unclamped Inductive Waveforms
Fig 16a. Unclamped Inductive Test Circuit
VGS
VDS
RD
V DS
90%
D.U.T.
RG
+
-V DD
10%
VGS
V10V
GS
Pulse Width µs
Duty Factor 
td(on)
tr
td(off)
tf
Fig 17b. Switching Time Waveforms
Fig 17a. Switching Time Test Circuit
Id
Vds
Vgs
L
DUT
0
1K
VCC
Vgs(th)
S
Qgs1 Qgs2
Fig 18a. Gate Charge Test Circuit
6
October 12, 2012
Qgd
Qgodr
Fig 18b. Gate Charge Waveform
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IRFH6200PbF
PQFN 5x6 Outline "B" Package Details
For more information on board mounting, including footprint and stencil recommendation, please refer to application note AN-1136:
http://www.irf.com/technical-info/appnotes/an-1136.pdf
For more information on package inspection techniques, please refer to application note AN-1154:
http://www.irf.com/technical-info/appnotes/an-1154.pdf
PQFN 5x6 Outline "B" Part Marking
INTERNATIONAL
RECTIFIER LOGO
DATE CODE
ASSEMBLY
SITE CODE
(Per SCOP 200-002)
PIN 1
IDENTIFIER
XXXX
XYWWX
XXXXX
PART NUMBER
(“4 or 5 digits”)
MARKING CODE
(Per Marking Spec)
LOT CODE
(Eng Mode - Min last 4 digits of EATI#)
(Prod Mode - 4 digits of SPN code)
Note: For the most current drawing please refer to IR website at: http://www.irf.com/package/
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7
October 12, 2012
IRFH6200PbF
PQFN 5x6 Outline "B" Tape and Reel
Qualification information†
Qualification level
Moisture Sensitivity Level
RoHS compliant
†
††
†††
Indus trial
(per JE DE C JE S D47F
PQFN 5mm x 6mm
††
†††
guidelines )
MS L1
†††
(per JE DE C J-S T D-020D
Yes
)
Qualification standards can be found at International Rectifier’s web site
http://www.irf.com/product-info/reliability
Higher qualification ratings may be available should the user have such requirements.
Please contact your International Rectifier sales representative for further information:
http://www.irf.com/whoto-call/salesrep/
Applicable version of JEDEC standard at the time of product release.
Notes:
 Repetitive rating; pulse width limited by max. junction temperature.
‚ Starting TJ = 25°C, L = 1.7mH, RG = 25, IAS = 30A.
ƒ Pulse width  400μs; duty cycle  2%.
„ Ris measured at TJ of approximately 90°C.
… When mounted on 1 inch square 2 oz copper pad on 1.5x1.5 in. board of FR-4 material.
† Calculated continuous current based on maximum allowable junction temperature. Package is limited to 100A by production test
capability.
Data and specifications subject to change without notice.
IR WORLD HEADQUARTERS: 101 N. Sepulveda Blvd., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information. 10/2012
8
October 12, 2012
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