IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B MAY 2015 1M x 36, 2M x 18 36Mb, FLOW THROUGH 'NO WAIT' STATE BUS SRAM FEATURES DESCRIPTION • 100 percent bus utilization The 36 Meg product family features high-speed, low-power synchronous static RAMs designed to provide a burstable, high-performance, 'no wait' state, device for networking and communications applications. They are organized as 1,048,476 words by 36 bits and 2,096,952 words by 18 bits, fabricated with ISSI's advanced CMOS technology. • No wait cycles between Read and Write • Internal self-timed write cycle • Individual Byte Write Control • Single Read/Write control pin • Clock controlled, registered address, data and control • Interleaved or linear burst sequence control using MODE input • Three chip enables for simple depth expansion and address pipelining • Power Down mode • Common data inputs and data outputs • CKE pin to enable clock and suspend operation • JEDEC 100-pin TQFP, 119-ball PBGA, and 165ball PBGA packages • Power supply: NLF: Vdd 3.3V (± 5%), Vddq 3.3V/2.5V (± 5%) NVF: Vdd 2.5V (± 5%), Vddq 2.5V (± 5%) NVVF: Vdd 1.8V (± 5%), Vddq 1.8V (± 5%) • JTAG Boundary Scan for PBGA packages • Industrial temperature available • Lead-free available Incorporating a 'no wait' state feature, wait cycles are eliminated when the bus switches from read to write, or write to read. This device integrates a 2-bit burst counter, high-speed SRAM core, and high-drive capability outputs into a single monolithic circuit. All synchronous inputs pass through registers are controlled by a positive-edge-triggered single clock input. Operations may be suspended and all synchronous inputs ignored when Clock Enable, CKE is HIGH. In this state the internal device will hold their previous values. All Read, Write and Deselect cycles are initiated by the ADV input. When the ADV is HIGH the internal burst counter is incremented. New external addresses can be loaded when ADV is LOW. Write cycles are internally self-timed and are initiated by the rising edge of the clock inputs and when WE is LOW. Separate byte enables allow individual bytes to be written. A burst mode pin (MODE) defines the order of the burst sequence. When tied HIGH, the interleaved burst sequence is selected. When tied LOW, the linear burst sequence is selected. FAST ACCESS TIME SymbolParameter tkq Clock Access Time tkc Cycle Time Frequency 6.5 6.5 7.5 133 7.5 7.5 8.5 117 Units ns ns MHz Copyright © 2013 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders for products. Integrated Silicon Solution, Inc. does not recommend the use of any of its products in life support applications where the failure or malfunction of the product can reasonably be expected to cause failure of the life support system or to significantly affect its safety or effectiveness. Products are not authorized for use in such applications unless Integrated Silicon Solution, Inc. receives written assurance to its satisfaction, that: a.) the risk of injury or damage has been minimized; b.) the user assume all such risks; and c.) potential liability of Integrated Silicon Solution, Inc is adequately protected under the circumstances Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. A 04/17/2015 1 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B BLOCK DIAGRAM A0-20 ( A0-21) Address Registers MODE ADV 1Mx36; 2Mx18 Memory Array Burst Logic A0-A1 A'0-A'1 K K Address Registers CLK A0-20 ( A0-21) A2-20(A2-A21) A0-20(A0-21) Address Registers /CKE Data-In Register K /CE Control register CE2 /CE2 ADV /WE /BWx (X=a,b,c,d or a,b) Data-In Register Control Logic K /OE Output Buffers ZZ 36(18) K DQx/DQPx 2 Integrated Silicon Solution, Inc. — www.issi.com Rev. A 04/17/2015 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B 165-PIN BGA 165-Ball, 13x15 mm BGA 119-PIN BGA 119-Ball, 14x22 mm BGA BOTTOM VIEW BOTTOM VIEW Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. A 04/17/2015 3 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B PIN CONFIGURATION — 1M x 36, 165-Ball PBGA (TOP VIEW) 1 2 3 4 5 6 7 8 9 10 11 A B C D E F G H J K NC NC DQPc DQc DQc DQc DQc NC DQd DQd A A NC DQc DQc DQc DQc NC DQd DQd CE CE2 Vddq Vddq Vddq Vddq Vddq NC Vddq Vddq BWc BWd VSS Vdd Vdd Vdd Vdd Vdd Vdd Vdd BWb BWa VSS VSS VSS VSS VSS VSS VSS VSS CE2 CLK VSS VSS VSS VSS VSS VSS VSS VSS CKE WE VSS VSS VSS VSS VSS VSS VSS VSS ADV OE VSS Vdd Vdd Vdd Vdd Vdd Vdd Vdd A A Vddq Vddq Vddq Vddq Vddq NC Vddq Vddq A A NC DQb DQb DQb DQb NC DQa DQa NC NC DQPb DQb DQb DQb DQb ZZ DQa DQa L M N P R DQd DQd DQPd NC MODE DQd DQd NC NC A Vddq Vddq Vddq A A Vdd Vdd VSS A A VSS VSS NC TDI TMS VSS VSS NC A1* A0* VSS VSS NC TDO TCK Vdd Vdd VSS A A Vddq Vddq Vddq A A DQa DQa NC A A DQa DQa DQPa NC A Note: A0 and A1 are the two least significant bits (LSB) of the address field and set the internal burst counter if burst is desired. PIN DESCRIPTIONS Symbol A A0, A1 ADV WE CLK CKE CE, CE2, CE2 BWa-BWd OE ZZ 4 Pin Name Synchronous Address Inputs Synchronous Burst Address Inputs Synchronous Burst Address Advance/ Load Synchronous Read/Write Control Input Synchronous Clock Synchronous Clock Enable Synchronous Chip Enable Synchronous Byte Write Inputs Asynchronous Output Enable Asynchronous Power Sleep Mode MODE Burst Sequence Selection TCK, TDI JTAG Pins TDO, TMS VDD Power Supply NC No Connect DQa-DQd Synchronous Data Inputs/Outputs DQPa-DQPd Synchronous Parity Data Inputs/Outputs VDDQ I/O Power Supply Vss Ground Integrated Silicon Solution, Inc. — www.issi.com Rev. A 04/17/2015 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B 119-PIN PBGA PACKAGE CONFIGURATION 1M x 36 (TOP VIEW) 1 2 3 4 5 6 7 A VDDQ A A A A A VDDQ B NC CE2 A ADV A CE2 NC C NC A A VDD A A NC D DQc DQPc VSS NC Vss DQPb DQb E DQc DQc VSS CE Vss DQb DQb F VDDQ DQc VSS OE Vss DQb VDDQ G DQc DQc BWc A BWb DQb DQb H DQc DQc VSS WE Vss DQb DQb J VDDQ VDD NC VDD NC VDD VDDQ K DQd DQd VSS CLK Vss DQa DQa L DQd DQd BWd NC BWa DQa DQa M VDDQ DQd VSS CKE Vss DQa VDDQ N DQd DQd VSS A 1* Vss DQa DQa P DQd DQPd VSS A0* Vss DQPa DQa R NC A MODE VDD NC A NC T NC NC A A A A ZZ U VDDQ TMS TDI TCK TDO NC VDDQ Note: A0 and A1 are the two least significant bits (LSB) of the address field and set the internal burst counter if burst is desired. PIN DESCRIPTIONS Symbol A A0, A1 ADV Pin Name Synchronous Address Inputs Synchronous Burst Address Inputs Synchronous Burst Address Advance/ Load WE Synchronous Read/Write Control Input CLK Synchronous Clock CKE Synchronous Clock Enable CE, CE2, CE2 Synchronous Chip Enable BWa-BWd Synchronous Byte Write Inputs OE Asynchronous Output Enable ZZ Asynchronous Power Sleep Mode MODE Burst Sequence Selection TCK, TDI JTAG Pins TDO, TMS VDD Power Supply NC No Connect DQa-DQd Synchronous Data Inputs/Outputs DQPa-DQPd Synchronous Parity Data Inputs/Outputs VDDQ I/O Power Supply Vss Ground Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. A 04/17/2015 5 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B 165-PIN PBGA PACKAGE CONFIGURATION 2M x 18 (TOP VIEW) 1 2 3 4 5 6 7 8 9 10 11 A NC A BWb NC CE2 CKE ADV A NC A NC NC VDDQ BWa Vss CLK Vss WE Vss VDDQ NC NC DQPa D NC DQb VDDQ VDD Vss Vss Vss OE Vss VDD A C NC Vss A A A B CE CE2 VDDQ NC DQa E NC DQb VDDQ VDD Vss Vss Vss VDD VDDQ NC DQa F NC DQb VDDQ VDD Vss Vss Vss VDD VDDQ NC DQa G NC DQb VDDQ Vss NC NC NC ZZ J DQb NC VDDQ VDD Vss Vss VDD VDD DQa NC Vss Vss NC NC Vss Vss VDDQ H VDD VDD Vss Vss VDD VDDQ DQa NC K DQb NC VDDQ VDD Vss Vss Vss VDD VDDQ DQa L DQb NC VDDQ VDD Vss Vss VDD VDDQ DQa M DQb NC VDDQ VDD Vss Vss Vss NC NC Vss VDD VDDQ DQa NC N DQPb NC Vss NC TDO A A NC R MODE A A A TMS A1* A 0* VDDQ A NC NC NC TDI NC NC Vss A NC P VDDQ A TCK A A A A Note: A0 and A1 are the two least significant bits (LSB) of the address field and set the internal burst counter if burst is desired. PIN DESCRIPTIONS Symbol A A0, A1 ADV Pin Name Synchronous Address Inputs Synchronous Burst Address Inputs Synchronous Burst Address Advance/ Load Synchronous Read/Write Control Input CLK Synchronous Clock CKE Synchronous Clock Enable CE, CE2, CE2 Synchronous Chip Enable BWa-BWb Synchronous Byte Write Inputs OE Asynchronous Output Enable ZZ Asynchronous Power Sleep Mode WE 6 MODE Burst Sequence Selection TCK, TDI JTAG Pins TDO, TMS VDD Power Supply NC No Connect DQa-DQb Synchronous Data Inputs/Outputs DQPa-DQPb Synchronous Parity Data Inputs/Outputs VDDQ I/O Power Supply Vss Ground Integrated Silicon Solution, Inc. — www.issi.com Rev. A 04/17/2015 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B 119-PIN PBGA PACKAGE CONFIGURATION 2M x 18 (TOP VIEW) 1 2 3 4 5 6 7 A VDDQ A A A A A VDDQ B NC CE2 A ADV A CE2 NC C NC A A VDD A A NC D DQb NC VSS NC Vss DQPa NC E DQb VSS CE Vss NC DQa F NC VDDQ NC VSS OE Vss DQa VDDQ G NC DQb BWb A NC NC DQa H DQb NC WE Vss DQa NC J VDDQ VDD VSS NC VDD NC VDD VDDQ K NC DQb VSS CLK Vss NC DQa L DQb NC NC NC BWa DQa NC M VDDQ DQb VSS CKE Vss NC VDDQ N DQb NC VSS A 1* Vss DQa NC P NC DQPb VSS A0* Vss NC DQa R NC A MODE VDD NC A NC T NC A A A A A ZZ U VDDQ TMS TDI TCK TDO NC VDDQ Note: A0 and A1 are the two least significant bits (LSB) of the address field and set the internal burst counter if burst is desired. PIN DESCRIPTIONS Symbol A A0, A1 ADV Pin Name Synchronous Address Inputs Synchronous Burst Address Inputs Synchronous Burst Address Advance/ Load WE Synchronous Read/Write Control Input CLK Synchronous Clock CKE Synchronous Clock Enable CE, CE2, CE2 Synchronous Chip Enable BWa-BWb Synchronous Byte Write Inputs OE Asynchronous Output Enable ZZ MODE Burst Sequence Selection TCK, TDI JTAG Pins TDO, TMS VDD Power Supply NC No Connect DQa-DQb Synchronous Data Inputs/Outputs DQPa-DQPb Synchronous Parity Data Inputs/Outputs VDDQ I/O Power Supply Vss Ground Asynchronous Power Sleep Mode Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. A 04/17/2015 7 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B PIN CONFIGURATION DQd VDDQ Vss DQd DQd DQd DQd Vss VDDQ MODE DQd DQd DQPd A OE ADV A CKE CLK WE CE2 VDD Vss BWa BWc BWb BWd CE2 CE A A DQPb DQb DQb VDDQ Vss DQb DQb DQb DQb Vss VDDQ DQb DQb Vss NC VDD ZZ DQa DQa VDDQ Vss DQa DQa DQa DQa Vss VDDQ DQa DQa DQPa A A DQd A NC Vss A DQc NC VDD A DQc A A A VDDQ NC Vss Vss DQc VDD DQc NC NC DQc DQc A1 A0 Vss A VDDQ A DQc A DQc 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 1 80 2 79 3 78 4 77 5 76 6 75 7 74 8 73 9 72 10 71 11 70 12 69 13 68 14 67 15 66 16 65 17 64 18 63 19 62 20 61 21 60 22 59 23 58 24 57 25 56 26 55 27 54 28 53 29 52 30 51 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 A DQPc A A 100-Pin TQFP 1M x 36 PIN DESCRIPTIONS Symbol A A0, A1 ADV Pin Name Synchronous Address Inputs Synchronous Burst Address Inputs Synchronous Burst Address Advance/ Load WE Synchronous Read/Write Control Input CLK Synchronous Clock CKE Synchronous Clock Enable CE, CE2, CE2 Synchronous Chip Enable BWa-BWd Synchronous Byte Write Inputs OE Asynchronous Output Enable ZZ Asynchronous Power Sleep Mode 8 MODE Burst Sequence Selection TCK, TDI JTAG Pins TDO, TMS VDD Power Supply NC No Connect DQa-DQd Synchronous Data Inputs/Outputs DQPa-DQPd Synchronous Parity Data Inputs/Outputs VDDQ I/O Power Supply Vss Ground Integrated Silicon Solution, Inc. — www.issi.com Rev. A 04/17/2015 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B PIN CONFIGURATION DQb DQPb NC Vss VDDQ MODE NC NC NC A ADV A OE CLK WE CKE CE2 VDD Vss BWa NC BWb NC CE2 CE A A A NC NC VDDQ Vss NC DQPa DQa DQa Vss VDDQ DQa DQa Vss NC VDD ZZ DQa DQa VDDQ Vss DQa DQa NC NC Vss VDDQ NC NC NC A A Vss DQb A DQb VDDQ A DQb A NC Vss A A A DQb NC VDD NC DQb VDD VDDQ Vss DQb Vss NC NC DQb A1 A0 NC NC A VDDQ Vss A NC A NC 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 1 80 2 79 3 78 4 77 5 76 6 75 7 74 8 73 9 72 10 71 11 70 12 69 13 68 14 67 15 66 16 65 17 64 18 63 19 62 20 61 21 60 22 59 23 58 24 57 25 56 26 55 27 54 28 53 29 52 30 51 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 A NC A A 100-Pin TQFP 2M x 18 PIN DESCRIPTIONS Symbol A A0, A1 ADV Pin Name Synchronous Address Inputs Synchronous Burst Address Inputs Synchronous Burst Address Advance/ Load WE Synchronous Read/Write Control Input CLK Synchronous Clock CKE Synchronous Clock Enable CE, CE2, CE2 Synchronous Chip Enable BWa-BWb Synchronous Byte Write Inputs OE Asynchronous Output Enable ZZ Asynchronous Power Sleep Mode MODE Burst Sequence Selection TCK, TDI JTAG Pins TDO, TMS VDD Power Supply NC No Connect DQa-DQb Synchronous Data Inputs/Outputs DQPa-DQPb Synchronous Parity Data Inputs/Outputs VDDQ I/O Power Supply Vss Ground Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. A 04/17/2015 9 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B STATE DIAGRAM READ READ READ BURST WRITE BEGIN READ DS DS READ WRITE DESELECT BURST BURST READ BEGIN WRITE BURST DS BURST DS DS WRITE READ BURST WRITE WRITE WRITE BURST SYNCHRONOUS TRUTH TABLE(1) Address OperationUsed CECE2CE2 Not Selected N/A H X X Not Selected N/A X L X Not Selected N/A X X H Not Selected Continue N/A X X X Begin Burst Read External Address L H L Continue Burst Read Next Address X X X NOP/Dummy Read External Address L H L Dummy Read Next Address X X X Begin Burst Write External Address L H L Continue Burst Write Next Address X X X NOP/Write Abort N/A L H L Write Abort Next Address X X X Ignore Clock Current Address X X X Notes: ADVWE L X L X L X H X L H H X L H H X L L H X L L H X X X BWx X X X X X X X X L L H H X OE X X X X L L H H X X X X X CKE L L L L L L L L L L L L H CLK ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ 1. 2. 3. 4. "X" means don't care. The rising edge of clock is symbolized by ↑ A continue deselect cycle can only be entered if a deselect cycle is executed first. WE = L means Write operation in Write Truth Table. WE = H means Read operation in Write Truth Table. 5. Operation finally depends on status of asynchronous pins (ZZ and OE). 10 Integrated Silicon Solution, Inc. — www.issi.com Rev. A 04/17/2015 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B ASYNCHRONOUS TRUTH TABLE(1) OperationZZ Sleep Mode H Read L L Write L Deselected L Notes: I/O STATUS High-Z DQ High-Z Din, High-Z High-Z OE X L H X X 1. X means "Don't Care". 2. For write cycles following read cycles, the output buffers must be disabled with OE, otherwise data bus contention will occur. 3. Sleep Mode means power Sleep Mode where stand-by current does not depend on cycle time. 4. Deselected means power Sleep Mode where stand-by current depends on cycle time. WRITE TRUTH TABLE (x18) Operation READ WRITE BYTE a WRITE BYTE b WRITE ALL BYTEs WRITE ABORT/NOP Notes: WE H L L L L BWa X L H L H BWb X H L L H 1. X means "Don't Care". 2. All inputs in this table must beet setup and hold time around the rising edge of CLK. Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. A 04/17/2015 11 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B WRITE TRUTH TABLE (x36) Operation READ WRITE BYTE a WRITE BYTE b WRITE BYTE c WRITE BYTE d WRITE ALL BYTEs WRITE ABORT/NOP Notes: WEBWaBWbBWcBWd H X X X X L L H H H L H L H H L H H L H L H H H L L L L L L L H H H H 1. X means "Don't Care". 2. All inputs in this table must beet setup and hold time around the rising edge of CLK. POWER UP SEQUENCE Vddq → Vdd1 → I/O Pins2 Notes: 1. Vdd can be applied at the same time as Vddq 2. Applying I/O inputs is recommended after Vddq is ready. The inputs of the I/O pins can be applied at the same time as Vddq provided Vih (level of I/O pins) is lower than Vddq. POWER-UP INITIALIZATION TIMING VDD power > 1ms VDD VDDQ Device Initialization Device ready for normal operation INTERLEAVED BURST ADDRESS TABLE (MODE = Vdd or NC) External Address A1 A0 00 01 10 11 12 1st Burst Address A1 A0 01 00 11 10 2nd Burst Address A1 A0 10 11 00 01 3rd Burst Address A1 A0 11 10 01 00 Integrated Silicon Solution, Inc. — www.issi.com Rev. A 04/17/2015 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B LINEAR BURST ADDRESS TABLE (MODE = Vss) 0,0 A1', A0' = 1,1 0,1 1,0 ABSOLUTE MAXIMUM RATINGS(1) Symbol Parameter Tstg Pd Iout Vin, Vout Vin Storage Temperature Power Dissipation Output Current (per I/O) Voltage Relative to Vss for I/O Pins Voltage Relative to Vss for for Address and Control Inputs NLF Value NVF/NVVF Value Unit –65 to +150 1.6 100 –0.5 to Vddq + 0.3 –0.3 to Vdd + 0.5 –65 to +150 1.6 100 –0.5 to Vddq + 0.3 –0.3 to Vdd + 0.3 °C W mA V V Notes: 1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. This device contains circuitry to protect the inputs against damage due to high static voltages or electric fields; however, precautions may be taken to avoid application of any voltage higher than maximum rated voltages to this high-impedance circuit. 3. This device contains circuitry that will ensure the output devices are in High-Z at power up. OPERATING RANGE (IS61/64NLFx) Range Commercial Industrial Automotive Ambient Temperature 0°C to +70°C -40°C to +85°C -40°C to +125°C Vdd 3.3V ± 5% 3.3V ± 5% 3.3V ± 5% Vddq 3.3V / 2.5V ± 5% 3.3V / 2.5V ± 5% 3.3V / 2.5V ± 5% Vdd 2.5V ± 5% 2.5V ± 5% 2.5V ± 5% Vddq 2.5V ± 5% 2.5V ± 5% 2.5V ± 5% Vdd 1.8V ± 5% 1.8V ± 5% 1.8V ± 5% Vddq 1.8V ± 5% 1.8V ± 5% 1.8V ± 5% OPERATING RANGE (IS61/64NVFx) Range Commercial Industrial Automotive Ambient Temperature 0°C to +70°C -40°C to +85°C -40°C to +125°C OPERATING RANGE (IS61/64NVVFx) Range Commercial Industrial Automotive Ambient Temperature 0°C to +70°C -40°C to +85°C -40°C to +125°C Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. A 04/17/2015 13 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B DC ELECTRICAL CHARACTERISTICS (Over Operating Range) 1, 2, 3 Symbol Parameter Voh Output HIGH Voltage Vol Output LOW Voltage Vih Vil Ili Input HIGH Voltage Input LOW Voltage Input Leakage Current Input Current of MODE Input Current of ZZ Output Leakage Current Ilo 3.3V2.5V1.8V Test Conditions Min. Max. Min.Max. Min.Max. Unit Ioh = –4.0 mA (3.3V) 2.4 — 2.0— Vddq - 0.4 — V Ioh = –1.0 mA (2.5V, 1.8V) Iol = 8.0 mA (3.3V) — 0.4 — 0.4 — 0.4 V Iol = 1.0 mA (2.5V, 1.8V) 2.0Vdd + 0.3 1.7Vdd + 0.3 0.6VddVdd + 0.3 V –0.3 0.8 –0.3 0.7 –0.30.3Vdd V (1,4) Vss ≤ Vin ≤ Vdd –5 5 –5 5 –5 5 µA Vss ≤ Vin ≤ Vdd(5) –30 5 –30 5 –30 5 Vss ≤ Vin ≤ Vdd(6) –5 30 –5 30 –5 30 Vss ≤ Vout ≤ Vddq, OE = Vih –5 5 –5 5 –5 5 µA Notes: 1. All voltages referenced to ground. 2. Overshoot: 3.3V and 2.5V: Vih (AC) ≤ Vdd + 1.5V (Pulse width less than tkc /2) 1.8V: Vih (AC) ≤ Vdd + 0.5V (Pulse width less than tkc /2) 3. Undershoot: 3.3V and 2.5V: Vil (AC) ≥ -1.5V (Pulse width less than tkc /2) 1.8V: Vil (AC) ≥ -0.5V (Pulse width less than tkc /2) 4. Except MODE and ZZ. 5. MODE is connected to pull-up resister internally. 6. ZZ is connected to pull-down resister internally POWER SUPPLY CHARACTERISTICS(1) (Over Operating Range) Symbol Parameter Icc AC Operating Supply Current Isb Standby Current TTL Input Isbi Standby Current CMOS Input 14 Test Conditions Temp. range Device Selected, Com. OE = Vih, ZZ ≤ Vil, Ind. All Inputs ≤ 0.2V or ≥ Vdd – 0.2V, Auto. Cycle Time ≥ tkc min. Device Deselected, Com. Vdd = Max., Ind. All Inputs ≤ Vil or ≥ Vih, Auto. ZZ ≤ Vil, f = Max. Device Deselected, Com. Vdd = Max., Ind. Vin ≤ Vss + 0.2V or ≥Vdd – 0.2V Auto. f = 0 6.5 MAX x18 x36 7.5 MAX x18 x36 430 430 400 400 300 300 300 300 280 280 280 280 Unit mA mA mA Integrated Silicon Solution, Inc. — www.issi.com Rev. A 04/17/2015 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B CAPACITANCE(1,2) Symbol Cin Cout Parameter Input Capacitance Input/Output Capacitance Conditions Vin = 0V Vout = 0V Max. 6 8 Unit pF pF Notes: 1. Tested initially and after any design or process changes that may affect these parameters. 2. Test conditions: Ta = 25°C, f = 1 MHz, Vdd = 3.3V. 3.3V I/O AC TEST CONDITIONS Parameter Input Pulse Level Input Rise and Fall Times Input and Output Timing and Reference Level Output Load Unit 0V to 3.0V 1.5 ns 1.5V See Figures 1 and 2 3.3V I/O OUTPUT LOAD EQUIVALENT 317 Ω +3.3V Zo= 50Ω OUTPUT OUTPUT 50Ω 5 pF Including jig and scope 351 Ω 1.5V Figure 1 Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. A 04/17/2015 Figure 2 15 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B 2.5V I/O AC TEST CONDITIONS Parameter Input Pulse Level Input Rise and Fall Times Input and Output Timing and Reference Level Output Load Unit 0V to 2.5V 1.5 ns 1.25V See Figures 3 and 4 2.5V I/O OUTPUT LOAD EQUIVALENT 1,667 Ω +2.5V ZO = 50Ω OUTPUT OUTPUT 50Ω 5 pF Including jig and scope 1,538 Ω 1.25V Figure 3 Figure 4 1.8V I/O AC TEST CONDITIONS Parameter Input Pulse Level Input Rise and Fall Times Input and Output Timing and Reference Level Output Load Unit 0V to 1.8V 1.5 ns 0.9V See Figures 5 and 6 1.8V I/O OUTPUT LOAD EQUIVALENT 1K Ω +1.8V ZO = 50Ω OUTPUT OUTPUT 50Ω 5 pF Including jig and scope 1K Ω 0.9V Figure 5 16 Figure 6 Integrated Silicon Solution, Inc. — www.issi.com Rev. A 04/17/2015 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B READ/WRITE CYCLE SWITCHING CHARACTERISTICS(1) (Over Operating Range) Symbol fmax tkc tkh tkl tkq tkqx(2) tkqlz(2,3) tkqhz(2,3) toeq toelz(2,3) Parameter Clock Frequency Cycle Time Clock High Time Clock Low Time Clock Access Time Clock High to Output Invalid Clock High to Output Low-Z Clock High to Output High-Z Output Enable to Output Valid Output Enable to Output Low-Z toehz(2,3) tas tws tces tse tadvs tds tah the twh tceh tadvh tdh tpower(4) Notes: Output Disable to Output High-Z Address Setup Time Read/Write Setup Time Chip Enable Setup Time Clock Enable Setup Time Address Advance Setup Time Data Setup Time Address Hold Time Clock Enable Hold Time Write Hold Time Chip Enable Hold Time Address Advance Hold Time Data Hold Time Vdd (typical) to First Access 1. 2. 3. 4. 6.5 Min. Max. — 133 7.5 — 2.2 — 2.2 — — 6.5 2.5 — 2.5 — — 3.8 — 3.2 0 — — 1.5 1.5 1.5 1.5 1.5 1.5 0.5 0.5 0.5 0.5 0.5 0.5 1 3.5 — — — — — — — — — — — — — 7.5 Min.Max. — 117 8.5 — 2.5 — 2.5 — — 7.5 2.5 — 2.5 — — 4.0 — 3.4 0 — — 3.5 1.5 — 1.5 — 1.5 — 1.5 — 1.5 — 1.5 — 0.5 — 0.5 — 0.5 — 0.5 — 0.5 — 0.5 — 1 — Unit MHz ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ms Configuration signal MODE is static and must not change during normal operation. Guaranteed but not 100% tested. This parameter is periodically sampled. Tested with load in Figure 2. tpower is the time that the power needs to be supplied above Vdd (min) initially before READ or WRITE operation can be initiated. Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. A 04/17/2015 17 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B SNOOZE MODE ELECTRICAL CHARACTERISTICS Symbol Isb2 tpds tpus tzzi trzzi Parameter Conditions Temperature Range Current during SNOOZE MODE ZZ ≥ Vdd - 0.2V Com. Ind. Auto. ZZ active to input ignored ZZ inactive to input sampled ZZ active to SNOOZE current ZZ inactive to exit SNOOZE current Min. Max. — — — — 2 — 0 Unit 250 2 — 2 — mA cycle cycle cycle ns SLEEP MODE TIMING CLK tPDS ZZ setup cycle tPUS ZZ recovery cycle ZZ tZZI Isupply ISB2 tRZZI All Inputs (except ZZ) Deselect or Read Only Deselect or Read Only Normal operation cycle Outputs (Q) High-Z Don't Care 18 Integrated Silicon Solution, Inc. — www.issi.com Rev. A 04/17/2015 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B READ CYCLE TIMING tKH tKL CLK tKC tADVS tADVH ADV tAS tAH Address A1 A3 A2 tWS tWH WRITE tSE tHE CKE tCES tCEH CE OE tOEQ tOEHZ Data Out Q1-1 tOEHZ tDS Q2-1 tKQ Q2-2 tKQHZ Q2-3 NOTES: WRITE = L means WE = L and BWx = L WE = L and BWX = L CE = L means CE1 = L, CE2 = H and CE2 = L CE = H means CE1 = H, or CE1 = L and CE2 = H, or CE1 = L and CE2 = L Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. A 04/17/2015 Q2-4 Q3-1 Q3-2 Q3-3 Q3-4 Don't Care Undefined 19 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B WRITE CYCLE TIMING tKH tKL CLK tKC ADV Address A1 A3 A2 WRITE tSE tHE CKE CE OE tDS Data In D1-1 D2-1 D2-2 D2-4 D2-3 D3-1 tDH D3-2 D3-3 D3-4 tOEHZ Data Out Q0-4 NOTES: WRITE = L means WE = L and BWx = L WE = L and BWX = L CE = L means CE1 = L, CE2 = H and CE2 = L CE = H means CE1 = H, or CE1 = L and CE2 = H, or CE1 = L and CE2 = L 20 Don't Care Undefined Integrated Silicon Solution, Inc. — www.issi.com Rev. A 04/17/2015 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B SINGLE READ/WRITE CYCLE TIMING tKH tKL CLK tSE tHE tKC CKE Address A1 A2 A3 A4 A5 A6 A7 A8 A9 WRITE CE ADV OE tOEQ Data Out tOELZ Q1 Q3 Q6 Q4 Q7 tDS tDH Data In D2 D5 NOTES: WRITE = L means WE = L and BWx = L CE = L means CE1 = L, CE2 = H and CE2 = L CE = H means CE1 = H, or CE1 = L and CE2 = H, or CE1 = L and CE2 = L Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. A 04/17/2015 Don't Care Undefined 21 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B CKE OPERATION TIMING tKH tKL CLK tSE tHE tKC CKE Address A1 A2 A3 A4 A5 A6 WRITE CE ADV OE tKQ Data Out tKQLZ tKQHZ Q1 Q3 Q4 tDS tDH Data In D2 NOTES: WRITE = L means WE = L and BWx = L CE = L means CE1 = L, CE2 = H and CE2 = L CE = H means CE1 = H, or CE1 = L and CE2 = H, or CE1 = L and CE2 = L 22 D5 Don't Care Undefined Integrated Silicon Solution, Inc. — www.issi.com Rev. A 04/17/2015 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B CE OPERATION TIMING tKH tKL CLK tSE tHE tKC CKE Address A1 A2 A3 A4 A5 WRITE CE ADV OE tOEQ Data Out tOELZ tKQHZ Q1 tKQ tKQLZ Q2 Q4 tDS tDH Data In D3 NOTES: WRITE = L means WE = L and BWx = L CE = L means CE1 = L, CE2 = H and CE2 = L CE = H means CE1 = H, or CE1 = L and CE2 = H, or CE1 = L and CE2 = L Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. A 04/17/2015 D5 Don't Care Undefined 23 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B IEEE 1149.1 SERIAL BOUNDARY SCAN (JTAG) TEST ACCESS PORT (TAP) - TEST CLOCK The serial boundary scan Test Access Port (TAP) is only available in the PBGA package. (Not available in TQFP package.) This port operates in accordance with IEEE Standard 1149.1-1900, but does not include all functions required for full 1149.1 compliance. These functions from the IEEE specification are excluded because they place added delay in the critical speed path of the SRAM. The TAP controller operates in a manner that does not conflict with the performance of other devices using 1149.1 fully compliant TAPs. The test clock is only used with the TAP controller. All inputs are captured on the rising edge of TCK and outputs are driven from the falling edge of TCK. DISABLING THE JTAG FEATURE The TDI pin is used to serially input information to the registers and can be connected to the input of any register. The register between TDI and TDO is chosen by the instruction loaded into the TAP instruction register. For information on instruction register loading, see the TAP Controller State Diagram. TDI is internally pulled up and can be disconnected if the TAP is unused in an application. TDI is connected to the Most Significant Bit (MSB) on any register. The SRAM can operate without using the JTAG feature. To disable the TAP controller, TCK must be tied LOW (Vss) to prevent clocking of the device. TDI and TMS are internally pulled up and may be disconnected. They may alternately be connected to Vdd through a pull-up resistor. TDO should be left disconnected. On power-up, the device will start in a reset state which will not interfere with the device operation. TEST MODE SELECT (TMS) The TMS input is used to send commands to the TAP controller and is sampled on the rising edge of TCK. This pin may be left disconnected if the TAP is not used. The pin is internally pulled up, resulting in a logic HIGH level. TEST DATA-IN (TDI) TAP CONTROLLER BLOCK DIAGRAM 0 Bypass Register 2 1 0 Instruction Register TDI Selection Circuitry 31 30 29 . . . Selection Circuitry 2 1 0 2 1 0 TDO Identification Register x . . . . . Boundary Scan Register* TCK TMS 24 TAP CONTROLLER Integrated Silicon Solution, Inc. — www.issi.com Rev. A 04/17/2015 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B TEST DATA OUT (TDO) The TDO output pin is used to serially clock data-out from the registers. The output is active depending on the current state of the TAP state machine (see TAP Controller State Diagram). The output changes on the falling edge of TCK and TDO is connected to the Least Significant Bit (LSB) of any register. PERFORMING A TAP RESET A Reset is performed by forcing TMS HIGH (Vdd) for five rising edges of TCK. RESET may be performed while the SRAM is operating and does not affect its operation. At power-up, the TAP is internally reset to ensure that TDO comes up in a high-Z state. TAP REGISTERS Registers are connected between the TDI and TDO pins and allow data to be scanned into and out of the SRAM test circuitry. Only one register can be selected at a time through the instruction registers. Data is serially loaded into the TDI pin on the rising edge of TCK and output on the TDO pin on the falling edge of TCK. Instruction Register Three-bit instructions can be serially loaded into the instruction register. This register is loaded when it is placed between the TDI and TDO pins. (See TAP Controller Block Diagram) At power-up, the instruction register is loaded with the IDCODE instruction. It is also loaded with the IDCODE instruction if the controller is placed in a reset state as previously described. When the TAP controller is in the Capture-IR state, the two least significant bits are loaded with a binary “01” pattern to allow for fault isolation of the board level serial test path. Bypass Register To save time when serially shifting data through registers, it is sometimes advantageous to skip certain states. The bypass register is a single-bit register that can be placed between TDI and TDO pins. This allows data to be shifted through the SRAM with minimal delay. The bypass reg- ister is set LOW (Vss) when the BYPASS instruction is executed. Boundary Scan Register The boundary scan register is connected to all input and output pins on the SRAM. Several no connect (NC) pins are also included in the scan register to reserve pins for higher density devices. The x36 configuration has a 75-bit-long register and the x18 configuration also has a 75-bit-long register. The boundary scan register is loaded with the contents of the RAM Input and Output ring when the TAP controller is in the Capture-DR state and then placed between the TDI and TDO pins when the controller is moved to the Shift-DR state. The EXTEST, SAMPLE/PRELOAD and SAMPLE-Z instructions can be used to capture the contents of the Input and Output ring. The Boundary Scan Order tables show the order in which the bits are connected. Each bit corresponds to one of the bumps on the SRAM package. The MSB of the register is connected to TDI, and the LSB is connected to TDO. Scan Register Sizes Register Name Instruction Bypass ID Boundary Scan Bit Size Bit Size (x18)(x36) 3 3 1 1 32 32 Identification (ID) Register The ID register is loaded with a vendor-specific, 32-bit code during the Capture-DR state when the IDCODE command is loaded to the instruction register. The IDCODE is hardwired into the SRAM and can be shifted out when the TAP controller is in the Shift-DR state. The ID register has vendor code and other information described in the Identification Register Definitions table. IDENTIFICATION REGISTER DEFINITIONS Instruction Field Revision Number (31:28) Device Depth (27:23) Device Width (22:18) ISSI Device ID (17:12) ISSI JEDEC ID (11:1) ID Register Presence (0) Description Reserved for version number. Defines depth of SRAM. 2M or 4M Defines Width of the SRAM. x36 or x18 Reserved for future use. Allows unique identification of SRAM vendor. Indicate the presence of an ID register. Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. A 04/17/2015 1M x 36 xxxx 01001 00100 xxxxx 00001010101 1 2M x 18 xxxx 01010 00011 xxxxx 00001010101 1 25 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B TAP INSTRUCTION SET SAMPLE/PRELOAD Eight instructions are possible with the three-bit instruction register and all combinations are listed in the Instruction Code table. Three instructions are listed as RESERVED and should not be used and the other five instructions are described below. The TAP controller used in this SRAM is not fully compliant with the 1149.1 convention because some mandatory instructions are not fully implemented. The TAP controller cannot be used to load address, data or control signals and cannot preload the Input or Output buffers. The SRAM does not implement the 1149.1 commands EXTEST or INTEST or the PRELOAD portion of SAMPLE/ PRELOAD; instead it performs a capture of the Inputs and Output ring when these instructions are executed. Instructions are loaded into the TAP controller during the Shift-IR state when the instruction register is placed between TDI and TDO. During this state, instructions are shifted from the instruction register through the TDI and TDO pins. To execute an instruction once it is shifted in, the TAP controller must be moved into the Update-IR state. SAMPLE/PRELOAD is a 1149.1 mandatory instruction. The PRELOAD portion of this instruction is not implemented, so the TAP controller is not fully 1149.1 compliant. When the SAMPLE/PRELOAD instruction is loaded to the instruction register and the TAP controller is in the Capture-DR state, a snapshot of data on the inputs and output pins is captured in the boundary scan register. It is important to realize that the TAP controller clock operates at a frequency up to 10 MHz, while the SRAM clock runs more than an order of magnitude faster. Because of the clock frequency differences, it is possible that during the Capture-DR state, an input or output will under-go a transition. The TAP may attempt a signal capture while in transition (metastable state). The device will not be harmed, but there is no guarantee of the value that will be captured or repeatable results. To guarantee that the boundary scan register will capture the correct signal value, the SRAM signal must be stabilized long enough to meet the TAP controller’s capture set-up plus hold times (tcs and tch). To insure that the SRAM clock input is captured correctly, designs need a way to stop (or slow) the clock during a SAMPLE/PRELOAD instruction. If this is not an issue, it is possible to capture all other signals and simply ignore the value of the CLK captured in the boundary scan register. Once the data is captured, it is possible to shift out the data by putting the TAP into the Shift-DR state. This places the boundary scan register between the TDI and TDO pins. Note that since the PRELOAD part of the command is not implemented, putting the TAP into the Update to the UpdateDR state while performing a SAMPLE/PRELOAD instruction will have the same effect as the Pause-DR command. EXTEST EXTEST is a mandatory 1149.1 instruction which is to be executed whenever the instruction register is loaded with all 0s. Because EXTEST is not implemented in the TAP controller, this device is not 1149.1 standard compliant. The TAP controller recognizes an all-0 instruction. When an EXTEST instruction is loaded into the instruction register, the SRAM responds as if a SAMPLE/PRELOAD instruction has been loaded. There is a difference between the instructions, unlike the SAMPLE/PRELOAD instruction, EXTEST places the SRAM outputs in a High-Z state. IDCODE The IDCODE instruction causes a vendor-specific, 32bit code to be loaded into the instruction register. It also places the instruction register between the TDI and TDO pins and allows the IDCODE to be shifted out of the device when the TAP controller enters the Shift-DR state. The IDCODE instruction is loaded into the instruction register upon power-up or whenever the TAP controller is given a test logic reset state. SAMPLE-Z The SAMPLE-Z instruction causes the boundary scan register to be connected between the TDI and TDO pins when the TAP controller is in a Shift-DR state. It also places all SRAM outputs into a High-Z state. 26 BYPASS When the BYPASS instruction is loaded in the instruction register and the TAP is placed in a Shift-DR state, the bypass register is placed between the TDI and TDO pins. The advantage of the BYPASS instruction is that it shortens the boundary scan path when multiple devices are connected together on a board. RESERVED These instructions are not implemented but are reserved for future use. Do not use these instructions. Integrated Silicon Solution, Inc. — www.issi.com Rev. A 04/17/2015 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B INSTRUCTION CODES Code InstructionDescription 000 EXTEST Captures the Input/Output ring contents. Places the boundary scan register between the TDI and TDO. Forces all SRAM outputs to High-Z state. This instruction is not 1149.1 compliant. 001 IDCODE Loads the ID register with the vendor ID code and places the register between TDI and TDO. This operation does not affect SRAM operation. 010 SAMPLE-Z Captures the Input/Output contents. Places the boundary scan register between TDI and TDO. Forces all SRAM output drivers to a High-Z state. 011 RESERVED Do Not Use: This instruction is reserved for future use. 100 SAMPLE/PRELOAD Captures the Input/Output ring contents. Places the boundary scan register between TDI and TDO. Does not affect the SRAM operation. This instruction does not implement 1149.1 preload function and is therefore not 1149.1 compliant. 101 RESERVED Do Not Use: This instruction is reserved for future use. 110 111 RESERVED BYPASS Do Not Use: This instruction is reserved for future use. Places the bypass register between TDI and TDO. This operation does not affect SRAM operation. TAP CONTROLLER STATE DIAGRAM Test Logic Reset 1 0 Run Test/Idle 1 Select DR 0 0 1 1 1 Capture DR 0 Shift DR 1 Exit1 DR 0 Select IR 0 1 Exit1 IR 0 Pause DR 0 1 0 1 Exit2 DR 1 Update DR 0 Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. 00C 02/20/2013 Capture IR 0 Shift IR 1 0 Pause IR 1 0 1 1 0 1 0 Exit2 IR 1 Update IR 0 27 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B TAP Electrical Characteristics (Vddq = 3.3V Operating Range) SymbolParameter Voh1 Output HIGH Voltage Voh2 Output HIGH Voltage Vol1 Output LOW Voltage Vol2 Output LOW Voltage Vih Input HIGH Voltage Vil Input LOW Voltage Ix Input Load Current Test Conditions Ioh = -4 mA Ioh = -100 µA Iol = 8 mA Iol = 100 µA Vss ≤ Vin ≤ Vddq TAP Electrical Characteristics (Vddq = 2.5V Operating Range) SymbolParameter Voh1 Output HIGH Voltage Voh2 Vol1 Vol2 Vih Vil Ix Output HIGH Voltage Output LOW Voltage Output LOW Voltage Input HIGH Voltage Input LOW Voltage Input Load Current Test Conditions Ioh = -1 mA Ioh = -100 µA Iol = 1 mA Iol = 100 µA Vss ≤ Vin ≤ Vddq TAP Electrical Characteristics (Vddq = 1.8V Operating Range) SymbolParameter Voh1 Output HIGH Voltage Vol1 Output LOW Voltage Vih Input HIGH Voltage Vil Input LOW Voltage Ix Input Load Current 28 Test Conditions Ioh = -1 mA Iol = 1 mA Vss ≤ Vin ≤ Vddq Min. Max. Units 2.4 — V 2.9 — V — 0.4 V — 0.2 V 2.0 Vdd+0.3 V -0.3 0.8 V -30 30 µA Min. 2.0 Max. — Units V 2.1 — — 0.4 — 0.2 1.7 Vdd+0.3 -0.3 0.7 -30 30 V V V V V µA Min. Max. Units Vdd-0.4 — V — 0.5 V 1.3 Vdd+0.3 V -0.3 0.7 V -30 30 µA Integrated Silicon Solution, Inc. — www.issi.com Rev. A 04/17/2015 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B TAP AC ELECTRICAL CHARACTERISTICS (OVER OPERATING RANGE) Parameter Symbol Min Max Units TCK cycle time tTHTH 100 – ns TCK high pulse width tTHTL 40 – ns TCK low pulse width tTLTH 40 – ns TMS Setup tMVTH 10 – ns TMS Hold tTHMX 10 – ns TDI Setup tDVTH 10 – ns TDI Hold tTHDX 10 – ns TCK Low to Valid Data tTLOV – 20 ns TAP AC TEST CONDITIONS (1.8V/2.5V/3.3V)Input pulse levels 0 to 1.8V/0 to 2.5V/0 to 3.0V 1.5ns Input rise and fall times Input timing reference levels Output reference levels Test load termination supply voltage Vtrig 0.9V/1.25V/1.5V 0.9V/1.25V/1.5V 0.9V/1.25V/1.5V 0.9V/1.25V/1.5V TAP Output Load Equivalent 50Ω Vtrig TDO 20 pF Z0 = 50Ω GND TAP TIMING 1 2 tTHTH 3 4 5 6 tTLTH TCK tTHTL tMVTH tTHMX TMS tDVTH tTHDX TDI tTLOV TDO tTLOX DON'T CARE UNDEFINED Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. A 04/17/2015 29 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B BOUNDARY SCAN ORDER Bit # 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 X36 Bump ID N6 N7 N10 P11 P8 R8 R9 P9 P10 R10 R11 H11 N11 M11 L11 K11 J11 M10 L10 K10 J10 H9 H10 G11 F11 E11 D11 G10 F10 E10 D10 C11 A11 B11 A10 B10 A9 B9 C10 A8 B8 A7 B7 B6 165 BGA Signal NC NC NC NC A18 A17 A16 A15 A14 A13 A12 ZZ DQa0 DQa1 DQa2 DQa6 DQa7 DQa3 DQa4 DQa5 DQa8 NC NC DQb8 DQb7 DQb5 DQb4 DQb6 DQb3 DQb2 DQb1 DQb0 NC NC A11 A10 A9 A8 NC ADV /OE /CKE /WE CLK X18 Bump ID N6 N7 N10 P11 P8 R8 R9 P9 P10 R10 R11 H11 N11 M11 L11 K11 J11 M10 L10 K10 J10 H9 H10 G11 F11 E11 D11 G10 F10 E10 D10 C11 A11 B11 A10 B10 A9 B9 C10 A8 B8 A7 B7 B6 Signal NC NC NC NC A18 A17 A16 A15 A14 A13 A12 ZZ NC NC NC NC NC DQa8 DQa7 DQa6 DQa5 NC NC DQa4 DQa3 DQa2 DQa1 NC NC NC NC DQa0 A21 NC A11 A10 A9 A8 NC ADV /OE /CKE /WE CLK Bit # 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 X36 Bump ID C7 R5 R7 U6 B5 C6 T3 T4 T5 T6 R6 T7 P6 N7 M6 L7 K6 P7 N6 L6 K7 H6 G7 F6 E7 H7 G6 E6 D7 D6 T1 R1 A6 A5 G4 A4 B7 B4 F4 M4 H4 K4 119 BGA Signal NC NC NC NC A18 A17 A16 A15 A14 A13 A12 ZZ DQa0 DQa1 DQa2 DQa6 DQa7 DQa3 DQa4 DQa5 DQa8 NC NC DQb8 DQb7 DQb5 DQb4 DQb6 DQb3 DQb2 DQb1 DQb0 NC NC A11 A10 A9 A8 NC ADV /OE /CKE /WE CLK X18 Bump ID C7 R5 R7 U6 B5 C6 T3 T4 T5 T6 R6 T7 P6 N7 M6 L7 K6 P7 N6 L6 K7 H6 G7 F6 E7 H7 G6 E6 D7 D6 T1 R1 A6 A5 G4 A4 B7 B4 F4 M4 H4 K4 Signal NC NC NC NC A18 A17 A16 A15 A14 A13 A12 ZZ NC NC NC NC NC DQa8 DQa7 DQa6 DQa5 NC NC DQa4 DQa3 DQa2 DQa1 NC NC NC NC DQa0 NC NC A11 A10 A9 A8 NC ADV /OE /CKE /WE CLK Continued on next page 30 Integrated Silicon Solution, Inc. — www.issi.com Rev. A 04/17/2015 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B Bit # 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 X36 Bump ID A6 B5 A5 A4 B4 B3 A3 A2 B2 C2 B1 A1 C1 D1 E1 F1 G1 D2 E2 F2 G2 H1 H2 H3 J1 K1 L1 M1 J2 K2 L2 M2 N1 N2 P1 R1 R2 P3 R3 P2 R4 P4 N5 P6 R6 * 165 BGA Signal /CE2 /Bwa /Bwb /Bwc /Bwd CE2 /CE1 A7 A6 NC NC NC DQc0 DQc1 DQc2 DQc6 DQc7 DQc3 DQc4 DQc5 DQc8 NC NC NC DQd8 DQd7 DQd5 DQd4 DQd6 DQd3 DQd2 DQd1 DQd0 NC NC MODE A5 A4 A3 NC A19 A2 NC A1 A0 Int X18 Bump ID A6 B5 A5 A4 B4 B3 A3 A2 B2 C2 B1 A1 C1 D1 E1 F1 G1 D2 E2 F2 G2 H1 H2 H3 J1 K1 L1 M1 J2 K2 L2 M2 N1 N2 P1 R1 R2 P3 R3 P2 R4 P4 N5 P6 R6 * Signal /CE2 /Bwa NC /Bwb NC CE2 /CE1 A7 A6 NC NC NC NC NC NC NC NC DQb8 DQb7 DQb6 DQb5 NC NC NC DQb4 DQb3 DQb2 DQb1 NC NC NC NC DQb0 NC NC MODE A5 A4 A3 NC A19 A2 NC A1 A0 Int Bit # 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. A 04/17/2015 X36 Bump ID B6 L5 G5 G3 L3 B2 E4 A3 A2 B1 C1 D4 D2 E1 F2 G1 H2 D1 E2 G2 H1 K2 L1 M2 N1 K1 L2 N2 P1 P2 L4 J5 R3 C2 B3 C3 R2 C5 T2 J3 N4 P4 * 119 BGA Signal /CE2 /Bwa /Bwb /Bwc /Bwd CE2 /CE1 A7 A6 NC NC NC DQc0 DQc1 DQc2 DQc6 DQc7 DQc3 DQc4 DQc5 DQc8 NC NC NC DQd8 DQd7 DQd5 DQd4 DQd6 DQd3 DQd2 DQd1 DQd0 NC NC MODE A4 A3 A2 A5 A19 NC NC A1 A0 Int X18 Bump ID B6 L5 G5 G3 L3 B2 E4 A3 A2 B1 C1 D4 D2 E1 F2 G1 H2 D1 E2 G2 H1 K2 L1 M2 N1 K1 L2 N2 P1 P2 L4 J5 R3 C2 B3 C3 R2 C5 T2 J3 N4 P4 * Signal /CE2 /Bwa NC /Bwb NC CE2 /CE1 A7 A6 NC NC NC NC NC NC NC NC DQb8 DQb7 DQb6 DQb5 NC NC NC DQb4 DQb3 DQb2 DQb1 NC NC NC NC DQb0 NC NC MODE A4 A3 A2 A5 A19 A21 NC A1 A0 Int 31 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B ORDERING INFORMATION Commercial Range: 0°C to 70°C (VDD = 3.3V / VDDQ = 2.5V/3.3V) Access Time 6.5ns 7.5ns x36 IS61NLF102436B-6.5TQ IS61NLF102436B-6.5B3 IS61NLF102436B-6.5B2 IS61NLF102436B-6.5TQL IS61NLF102436B-6.5B3L IS61NLF102436B-6.5B2L IS61NLF102436B-7.5TQ IS61NLF102436B-7.5B3 IS61NLF102436B-7.5B2 IS61NLF102436B-7.5TQL IS61NLF102436B-7.5B3L IS61NLF102436B-7.5B2L x18 IS61NLF204818B-6.5TQ IS61NLF204818B-6.5B3 IS61NLF204818B-6.5B2 IS61NLF204818B-6.5TQL IS61NLF204818B-6.5B3L IS61NLF204818B-6.5B2L IS61NLF204818B-7.5TQ IS61NLF204818B-7.5B3 IS61NLF204818B-7.5B2 IS61NLF204818B-7.5TQL IS61NLF204818B-7.5B3L IS61NLF204818B-7.5B2L Package 100 TQFP 165 PBGA 119 PBGA 100 TQFP, Lead-free 165 PBGA, Lead-free 119 PBGA, Lead-free 100 TQFP 165 PBGA 119 PBGA 100 TQFP, Lead-free 165 PBGA, Lead-free 119 PBGA, Lead-free Commercial Range: 0°C to 70°C (VDD = 2.5V / VDDQ = 2.5V) Access Time 6.5ns 7.5ns x36 IS61NVF102436B-6.5TQ IS61NVF102436B-6.5B3 IS61NVF102436B-6.5B2 IS61NVF102436B-6.5TQL IS61NVF102436B-6.5B3L IS61NVF102436B-6.5B2L IS61NVF102436B-7.5TQ IS61NVF102436B-7.5B3 IS61NVF102436B-7.5B2 IS61NVF102436B-7.5TQL IS61NVF102436B-7.5B3L IS61NVF102436B-7.5B2L x18 IS61NVF204818B-6.5TQ IS61NVF204818B-6.5B3 IS61NVF204818B-6.5B2 IS61NVF204818B-6.5TQL IS61NVF204818B-6.5B3L IS61NVF204818B-6.5B2L IS61NVF204818B-7.5TQ IS61NVF204818B-7.5B3 IS61NVF204818B-7.5B2 IS61NVF204818B-7.5TQL IS61NVF204818B-7.5B3L IS61NVF204818B-7.5B2L Package 100 TQFP 165 PBGA 119 PBGA 100 TQFP, Lead-free 165 PBGA, Lead-free 119 PBGA, Lead-free 100 TQFP 165 PBGA 119 PBGA 100 TQFP, Lead-free 165 PBGA, Lead-free 119 PBGA, Lead-free Commercial Range: 0°C to 70°C (VDD = 1.8V / VDDQ = 1.8V) Access Time 7.5ns 32 x36 IS61NVVF102436B-7.5TQ IS61NVVF102436B-7.5B3 IS61NVVF102436B-7.5B2 IS61NVVF102436B-7.5TQL IS61NVVF102436B-7.5B3L IS61NVVF102436B-7.5B2L x18 IS61NVVF204818B-7.5TQ IS61NVVF204818B-7.5B3 IS61NVVF204818B-7.5B2 IS61NVVF204818B-7.5TQL IS61NVVF204818B-7.5B3L IS61NVVF204818B-7.5B2L Package 100 TQFP 165 PBGA 119 PBGA 100 TQFP, Lead-free 165 PBGA, Lead-free 119 PBGA, Lead-free Integrated Silicon Solution, Inc. — www.issi.com Rev. A 04/17/2015 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B Industrial Range: -40°C to +85°C (VDD = 3.3V / VDDQ = 2.5V/3.3V) Access Time 6.5ns 7.5ns x36 IS61NLF102436B-6.5TQI IS61NLF102436B-6.5B3I IS61NLF102436B-6.5B2I IS61NLF102436B-6.5TQLI IS61NLF102436B-6.5B3LI IS61NLF102436B-6.5B2LI IS61NLF102436B-7.5TQI IS61NLF102436B-7.5B3I IS61NLF102436B-7.5B2I IS61NLF102436B-7.5TQLI IS61NLF102436B-7.5B3LI IS61NLF102436B-7.5B2LI x18 IS61NLF204818B-6.5TQI IS61NLF204818B-6.5B3I IS61NLF204818B-6.5B2I IS61NLF204818B-6.5TQLI IS61NLF204818B-6.5B3LI IS61NLF204818B-6.5B2LI IS61NLF204818B-7.5TQI IS61NLF204818B-7.5B3I IS61NLF204818B-7.5B2I IS61NLF204818B-7.5TQLI IS61NLF204818B-7.5B3LI IS61NLF204818B-7.5B2LI Package 100 TQFP 165 PBGA 119 PBGA 100 TQFP, Lead-free 165 PBGA, Lead-free 119 PBGA, Lead-free 100 TQFP 165 PBGA 119 PBGA 100 TQFP, Lead-free 165 PBGA, Lead-free 119 PBGA, Lead-free Industrial Range: -40°C to +85°C (VDD = 2.5V / VDDQ = 2.5V) Access Time 6.5ns 7.5ns x36 IS61NVF102436B-6.5TQI IS61NVF102436B-6.5B3I IS61NVF102436B-6.5B2I IS61NVF102436B-6.5TQLI IS61NVF102436B-6.5B3LI IS61NVF102436B-6.5B2LI IS61NVF102436B-7.5TQI IS61NVF102436B-7.5B3I IS61NVF102436B-7.5B2I IS61NVF102436B-7.5TQLI IS61NVF102436B-7.5B3LI IS61NVF102436B-7.5B2LI x18 IS61NVF204818B-6.5TQI IS61NVF204818B-6.5B3I IS61NVF204818B-6.5B2I IS61NVF204818B-6.5TQLI IS61NVF204818B-6.5B3LI IS61NVF204818B-6.5B2LI IS61NVF204818B-7.5TQI IS61NVF204818B-7.5B3I IS61NVF204818B-7.5B2I IS61NVF204818B-7.5TQLI IS61NVF204818B-7.5B3LI IS61NVF204818B-7.5B2LI Package 100 TQFP 165 PBGA 119 PBGA 100 TQFP, Lead-free 165 PBGA, Lead-free 119 PBGA, Lead-free 100 TQFP 165 PBGA 119 PBGA 100 TQFP, Lead-free 165 PBGA, Lead-free 119 PBGA, Lead-free Industrial Range: -40°C to +85°C (VDD = 1.8V / VDDQ = 1.8V) Access Time 7.5ns x36 IS61NVVF102436B-7.5TQI IS61NVVF102436B-7.5B3I IS61NVVF102436B-7.5B2I IS61NVVF102436B-7.5TQLI IS61NVVF102436B-7.5B3LI IS61NVVF102436B-7.5B2LI x18 IS61NVVF204818B-7.5TQI IS61NVVF204818B-7.5B3I IS61NVVF204818B-7.5B2I IS61NVVF204818B-7.5TQLI IS61NVVF204818B-7.5B3LI IS61NVVF204818B-7.5B2LI Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. A 04/17/2015 Package 100 TQFP 165 PBGA 119 PBGA 100 TQFP, Lead-free 165 PBGA, Lead-free 119 PBGA, Lead-free 33 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B Automotive(A3) Range: -40°C to +125°C (VDD = 3.3V / VDDQ = 2.5V/3.3V) Access Time 6.5ns (133MHz) x36 Please contact ISSI ([email protected]) 7.5ns (117MHz) IS64NLF102436B-7.5TQA3 IS64NLF102436B-7.5B3A3 IS64NLF102436B-7.5B2A3 IS64NLF102436B-7.5TQLA3 IS64NLF102436B-7.5B3LA3 IS64NLF102436B-7.5B2LA3 x18 IS64NLF204818B-7.5TQA3 IS64NLF204818B-7.5B3A3 IS64NLF204818B-7.5B2A3 IS64NLF204818B-7.5TQLA3 IS64NLF204818B-7.5B3LA3 IS64NLF204818B-7.5B2LA3 Package 100 TQFP 165 PBGA 119 PBGA 100 TQFP, Lead-free 165 PBGA, Lead-free 119 PBGA, Lead-free Automotive(A3) Range: -40°C to +125°C (VDD = 2.5V / VDDQ = 2.5V) Access Time 6.5ns x36 Please contact ISSI ([email protected]) 7.5ns (117MHz) IS64NVF102436B-7.5TQA3 IS64NVF102436B-7.5B3A3 IS64NVF102436B-7.5B2A3 IS64NVF102436B-7.5TQLA3 IS64NVF102436B-7.5B3LA3 IS64NVF102436B-7.5B2LA3 x18 IS64NVF204818B-7.5TQA3 IS64NVF204818B-7.5B3A3 IS64NVF204818B-7.5B2A3 IS64NVF204818B-7.5TQLA3 IS64NVF204818B-7.5B3LA3 IS64NVF204818B-7.5B2LA3 Package 100 TQFP 165 PBGA 119 PBGA 100 TQFP, Lead-free 165 PBGA, Lead-free 119 PBGA, Lead-free Automotive(A3) Range: -40°C to +125°C (VDD = 1.8V / VDDQ = 1.8V) Access Time 34 x36 Please contact ISSI ([email protected]) x18 Package Integrated Silicon Solution, Inc. — www.issi.com Rev. A 04/17/2015 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. A 04/17/2015 35 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B 36 Integrated Silicon Solution, Inc. — www.issi.com Rev. A 04/17/2015 Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. A 04/17/2015 Package Outline 1. CONTROLLING DIMENSION : MM . NOTE : 08/28/2008 IS61(64)NLF102436B/IS61(64)NVF/NVVF102436B IS61(64)NLF204818B/IS61(64)NVF/NVVF204818B 37