AN185 - Infineon

Low Barrier Schottky Diode BAT62
RF Power Detection
A pplication Note AN185
Revision: V1.0
Date: 21-12-2009
RF and Protection Devices
Edition 21-12-2009
Published by
Infineon Technologies AG
81726 Munich, Germany
© 2010 Infineon Technologies AG
All Rights Reserved.
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Application Note AN185
RF Power Detection
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Application Note AN185
Revision History: 21-12-2009
Previous Revision: Previous_Revision_Number
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Subjects (major changes since last revision)
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Low Barrier Schottky Diode BAT62
RF Power Detection
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List of Tables
Table of Contents
1
Introduction ........................................................................................................................................ 5
2
Low Barrier RF Schottky Diode ........................................................................................................ 5
3
RF Power Detection for mobile phones (GSM, DCS, PCN) ............................................................ 9
4
Links and References ...................................................................................................................... 11
List of Figures
Figure 1
Figure 2
Figure 3
Figure 4
Figure 5
Figure 6
Figure 7
Figure 8
Differential peak power detection network ........................................................................................... 5
Equivalent circuit of BAT62-07L4 compromising the two Si-dies with the package parasitic. ............. 7
Voltage Current Characteristics for different temperature values ........................................................ 7
The rf rectification of a sinusoidal voltage at 900 MHz in dependence of the load resistance. ........... 8
Block diagram of a typical power detection network used for mobile phones ................................... 9
Differential peak power detection design consisting of two Schottky diodes (Detector Diode +
Reference Diode in one package – BAT62-07L4) being used for temperature compensation ........... 9
Input Matching versus input power at room temperature .................................................................. 10
Detector Voltage over Pin for the corner ambient temperature values at -30°C, 25°C, and 85°C .... 10
List of Tables
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RF Power Detection
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1
Introduction
Device:
Low Barrier Schottky Diode BAT62
Application:
RF Power Detection
Radio frequency devices must control the transmitted rf power efficiently in order to minimize both power
consumption and rf interference with other electronic devices. This is leading to a demand on rf power detectors
for the wireless market such as cell phones, cordless phones, WLAN, RFID tags, and wireless communication
infrastructure.
This application note is focusing on a solution for rf power detection for hand cells working with a constant
envelope modulation scheme such as the GMSK (Gaussian Minimum Shift Keying) for GSM. In this case a
peak detector is a good choice. However, communication systems with high crest factors like UMTS will use
rms power detectors.
The low barrier rf Schottky diode (BAT62) from Infineon Technologies can be used as an rf rectifier in peak
power detectors. The conventional design concept includes one diode as rf rectifier and the second reference
diode for temperature compensation together with reducing the impact on power detection by the variation of
manufacturing process. A temperature compensated differential peak power detector with differential amplifier is
shown in Figure 1 incorporating two Schottky diodes (detector and reference diode), input matching, and biasing
network.
Figure 1
Differential peak power detection network
2
Low Barrier RF Schottky Diode
The device characteristic of the Schottky diode is similar to a typical one sided abrupt pn diode which follows the
same current voltage characteristic as being shown in equation (1). However, there are some magnificiant
differences between the pn junction diode and the Schottky diode. For example, the Schottky diode exhibits a
lower forward voltage drop (0.15V to 0.45V) than the pn diode (0.7V to 1.7V). Furthermore, the voltage drop of
Schottky diodes in forward direction can be adjusted by the applied contact material and also zero biased
Schottky diodes can be processed based on p-doped materials.
Furthermore, pn junction diodes belong to minority semiconductor devices suffering on the low recombination
velocity of the minority carriers in the space charge region, whereas, the Schottky diodes are controlled by the
charge transport over the barrier from the majority carriers. This leads to very fast switching action for the
Schottky diodes and makes it very attractive for rf rectification at frequencies above 1GHz.
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

 qU j 
  1
I  I S (T )   exp
 nkT 


(1)
(n: ideality factor, IS :saturation current ,Uj : junction voltage, T : Temperature)
In normal forward operation at room temperature and moderate doping concentration (Nd < 10
charge transports can be identified.
− Transport of electrons from semiconductor over the barrier to the metal
− Tunneling of electrons through the barrier
− Recombination in the space charge region
− Injection of holes from the metal to the semiconductor
2.1
17
-3
cm ) four basic
Low Barrier RF Schottky Diode BAT62-L704
In order to guarantee temperature compensation of the detector diode due to temperature effects the reference
device must be a mirror device from the detector diode. This can be guaranteed by the rf Schottky device
BAT62-07L4 where 2 rf Schottky devices are housed in TSLP-4-4, a small leadless package with package size
of only 0.8mm x 1.2mm x 0.4mm.
If the diode is used in a circuit simulator, the diode is typically implemented by a spice netlist. Below, an extract
of the spice model is shown being used for the Si-die BAT62 which can be downloaded at the IFX product
overview website http://www.infineon.com/cms/en/product/.
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++
.SUBCKT D168 1 2
D1 1 2 D1
R1 1 2 40e6
.MODEL D1 D(IS=250.0n N=1.04 RS=190.0 XTI=1.5 EG=0.53
+ CJO=284.2f M=0.17 VJ=0.224 FC=0.5 TT=55.0p BV=42.0 IBV=10.0u)
.ENDS D168
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++
The dc characteristics of the diode are determined by the saturation current IS and the ideality factor N. The
bulk resistance of RS=190 is included which describes the IU-characteristic of the device beyond 400mV
which is leading to current limitation. This can easily be seen by replacing the junction voltage Uj by Uext – I · RS
in equation (1) whereas Uext refers to the external applied voltage. Charge storage effects are modeled by the
transit time, TT, and a nonlinear depletion layer capacitance which is determined by the parameters CJO, VJ,
and M. The temperature dependence of the saturation current is defined by the parameters EG, the activation
energy and XTI, the saturation current temperature exponent. The nominal temperature at which these
parameters were measured is TNOM. Reverse breakdown is modeled by an exponential increase in the reverse
diode current and is determined by the parameters BV and IBV. Additionally, a resistor of 40MOhm is connected
in parallel to the diode in order to adjust the leakage current.
The two diodes are housed in the TSLP-4-4 package. The combination of package parasitic and device is
shown in Figure 2. The package model takes into account the rf cross coupling between the neighboring diodes
as well as the serial parasitic of the wire bonds.
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Figure 2
Equivalent circuit of BAT62-07L4 compromising the two Si-dies with the package parasitic
The voltage current characteristics are shown in Figure 3 whereas in Figure 4 the load dependent rectified
voltage over rf input power is shown. Especially, the temperature dependent rectified voltage is dominated by
the rf voltages smaller than 300mV
Figure 3
Voltage Current Characteristics for different temperature values
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Figure 4
The rf rectification of a sinusoidal voltage at 900 MHz in dependence of the load resistance
In this section two low barrier Schottky diodes housed in TSLP-4-4 with
− Low capacitance (0.3pF)
− Internal ESD protection (Guard Ring) (HBM -1A)
− Operation up to 5 GHz
were presented.
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3
RF Power Detection for mobile phones (GSM, DCS, PCN)
The transmitted output power of the PA is controlled by the automatic power control (APC). The monitoring of
the transmitted power will be done by a directional coupler with a coupling of about 20dB. This rf power will then
be represented by the corresponding rectified signal of the power detector (see Figure 5).
Figure 5
Block diagram of a typical power detection network used for mobile phones
3.1
Design Concept for Power Detection at Lowband (~900MHz)
The widely used differential peak power detection method with temperature compensation was designed and
optimized with ADS2008 by applying a large signal simulation.
Figure 6
Differential peak power detection design consisting of two Schottky diodes (Detector Diode
+ Reference Diode in one package – BAT62-07L4) being used for temperature compensation
A matching circuit at the input has to transform the input impedance (50 Ohm in this example) to a (higher)
impedance level, which is provided by R_RF_load and the diode´s capacitance. In order to improve bandwidth
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or harmonic suppression the matching circuit can be adopted additionally and the component values should be
used as a reference. In the product implementation, component values may differ slightly depending on the
output impedance of the directional coupler at the TX-link, component place, and board parasitics (e.g. Cp1).
Over and above, additional filter circuits can be used to increase the sensitivity of the receiver.
The power detection depends on operation temperature as well as on the rf input power. The saturation current
of a Schottky diode strongly depends on device temperature. Additionally, the rf power cause a change in the
device operation point due to the rf rectification of the ac current (self biasing) and herewith to a change in the
matching as being shown in Figure 7.
Figure 7
Input Matching versus input power at room temperature
In Figure 8 are the detector output voltages over rf power shown at different temperature values -30°C, 25°C,
and 85°C).
Figure 8
Detector Voltage over Pin for the corner ambient temperature values at -30°C, 25°C, and
85°C
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4
Links and References
1. Antognetti and G. Massobrio. Semiconductor device modeling with SPICE , New York: McGraw-Hill, Second
Edition 1993.
2. Datasheet - BAT62: http://www.infineon.com/cms/en/product/
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AN185