APPLICATION NOTE: AN-83-001 TITLE: Mechanical Switch Extended Life Test Report Reference: RF Mechanical Switch, RF Relay Switch Report Date: August, 21.2009 Report Issued by: Ted Heil Report Reviewed by: Harvey Kaylie Report Status: Initial Release File Name s:\users\hkoffice\ted_heil_ntwk\projects_ntwk\projects - archive\mechanical switches_2008.06.13\life test report\mechanical switch life test report_4an.doc File Date No. Pages 7/31/2013 12:53:00 PM 19 AN-83-001 Rev.: C M142736 (07/31/13) File: AN83001.doc This document and its contents are the property of Mini-Circuits. Sheet 1 of 19 APPLICATION NOTE: AN-83-001 Document: File Save Date: AN83001.doc 7/31/2013 12:53:00 PM Page Contents 1 Purpose ...........................................................................................................................................3 2 Scope: ..............................................................................................................................................3 3 Background:.....................................................................................................................................3 4 Design Approach ..............................................................................................................................3 5 Tests Performed...............................................................................................................................3 6 Switch Tune-Up................................................................................................................................5 7 Production Life Testing.....................................................................................................................5 8 Test Summary ..................................................................................................................................6 9 Test Methods and Conditions...........................................................................................................7 10 Detailed Test Results – Test 1: Life Tests (without Tune-Up) ........................................................8 11 Detailed Test Results – Test 2: Extended Life Tests (with Tune-Up) ............................................ 12 12 Detailed Test Results – Test 3: Sleep Testing.............................................................................. 14 13 Conclusion ................................................................................................................................. 16 14 Appendix RF TEST DATA ............................................................................................................. 17 AN-83-001 Rev.: C M142736 (07/31/13) File: AN83001.doc This document and its contents are the property of Mini-Circuits. Sheet 2 of 19 2 of 19 APPLICATION NOTE: AN-83-001 Document: File Save Date: AN83001.doc 7/31/2013 12:53:00 PM Page 1 Purpose To validate the extended life performance of the Mini-Circuits Mechanical Switch Product line in the defined environment under defined operating conditions. 2 Scope: • • • MSP2T-18XL MSP2TA-18XL MTS-18XL-B 3 Background: Prior to developing our Mechanical Switch, Mini-Circuits purchased a significant quantity of mechanical switches for use in our production test facilities. These switches utilized a combination of springs and solenoids to accomplish the switching. Most operated for less than 1 million cycles, or approximately 50 days in our production environment. This turnover prompted Mini-Circuits to develop our own design to address the short operating life, long lead times, and high cost of using commercially available Mechanical Relay switches. 4 Design Approach Design Objective: Develop a long life mechanical switch Design Criteria: 1. Eliminate the use of any springs 2. Select combinations of materials based upon compatibility and ability to mate with limited wear. 3. Simplicity of design with the minimum number of components possible 4. Cost effectiveness to meet internal and external market demands 5 Tests Performed 5.1 Life Testing In a production test environment, a failure is very important. When using commercially available mechanical relays, we observed a number of cases where “good” products failed as a result of a bad switch in our test system. It was commonly believed that a mechanical switch has “failed” when it fails to switch states (was closed when expected to be open, or open when expected to be closed), i.e. AN-83-001 Rev.: C M142736 (07/31/13) File: AN83001.doc This document and its contents are the property of Mini-Circuits. Sheet 3 of 19 3 of 19 APPLICATION NOTE: AN-83-001 Document: File Save Date: AN83001.doc 7/31/2013 12:53:00 PM Page catastrophic failure. We learned that a mechanical switch will actually show many cycles of degraded performance prior to reaching catastrophic failure. For customer use purposes, the number of failed switching cycles is a more meaningful criteria for determining the “failure” of a mechanical switch. For example, many commercially available mechanical switches are specified at one-million cycle life expectancy; however, we have seen that these switches often exhibit failed performance starting at 800K cycles. In a test environment, every failed performance cycle can mean a rejected good DUT. To determine if a switch has failed life test, we define “Life Test Failure” as an accumulation of individual cycle performance failures. The failure criteria of any one performance cycle is one that measures DC resistance exceeding 240 milliohms. That is equivalent to an increase in RF insertion loss at low frequencies of 0.021dB (see chart below). The Mini-Circuits criteria for Mechanical Switch Life Test Failure is a unit which passes both of the following conditions: 1. First 10 cumulative cycle failures occurs at greater than 5 million total switch cycles (equals 2 DPPM) - and 2. Cumulative of 1000 cycle failures occurs at greater than 10 million total switch cycles 0.20 0.18 Loss (dB) . 0.16 0.14 0.12 0.10 Spec 0.08 0.06 0.04 0.02 0.00 0.000 0.500 1.000 1.500 2.000 Contact resistance (Ohms) Figure 1 – First Failure 5.2 Sleep Mode Testing Sleep testing validates the ability of a mechanical switch to remain in a fixed state for an extended period of time, and still switch reliably to another state when energized. This parameter is a result of applications where mechanical relay switches are used to switch-in redundant paths in the event of a failure in the main path. A switch functioning in this mode is often referred to as operating in “sleep mode”. AN-83-001 Rev.: C M142736 (07/31/13) File: AN83001.doc This document and its contents are the property of Mini-Circuits. Sheet 4 of 19 4 of 19 APPLICATION NOTE: AN-83-001 Document: File Save Date: AN83001.doc 7/31/2013 12:53:00 PM Page Mini-Circuits’ has, and continues to test switches in this mode of operation. Sets of 10 switches are stored in a fixed state over a period a four (4) years. At specific intervals, switches are removed and tested for their ability to “switch” after the period of inactivity. 6 Switch Tune-Up Even though the life of the Mini-Circuits switches is far greater than any other switch on the market today, even our switches will fail – at some point. Mini-Circuits unique construction makes it very practical to clean the switch contact assembly enabling switch performance recovery for extending the switch life to well over 100 million cycles. Mini-Circuits also validated the effectiveness of the “tune-up” on our mechanical switches, subjecting switches to extended life testing with “tune-ups” after any switch reached 1000 cumulative failed cycles. We achieved a total life cycle of greater than 300 million cycles. 7 Production Life Testing It is a Mini-Circuits internal quality requirement that each production lot of Mechanical RF Switches be subjected to sample life testing prior to Lot Acceptance. On each production lot, a minimum of two (2) switches are randomly selected and subjected to the same DC life test as outlined above. All units are required to pass the First Failure and the Cumulative Failure criteria for lot acceptance. Data is recorded on all lots and a sample summary is included herein Production Life Test data is used in this report as basis for Life Testing. (referred herein in TEST 1: Life Testing - without Tune-Up) AN-83-001 Rev.: C M142736 (07/31/13) File: AN83001.doc This document and its contents are the property of Mini-Circuits. Sheet 5 of 19 5 of 19 APPLICATION NOTE: AN-83-001 Document: File Save Date: AN83001.doc 7/31/2013 12:53:00 PM Page 8 Test Summary 8.1 TEST 1: Life Testing (without Tune-Up) Seventy-five(75) switches tested over a period of 1 year Model: MSP2T-18XL and MSP2TA-18XL Test Results First Failure Occurs at 1000 Cum Failures Occur at Units Min Avg Max Cycle Number Cycle Number 5,096,137 18,798,751 44,252,850 10,476,000 33,045,867 83,526,000 Table 1 – Life Test Results 8.2 TEST 2: Extended Life Testing – after Tune-ups Five (5) switches tested Test Results: All units exceed 300 million cycles after Unit No. 1 2 3 4 5 No. Cycles Achieved 336 million 336 million 306 million 339 million 339 million No. Tune-Ups Req.’d 23 17 29 21 20 Table 2 – Extended Life Test Results Testing terminated after 300 Million Cycles (units show no permanent wear and continue to operate) 8.3 TEST 3: Sleep Mode Testing 20 units tested (10 units MSP2T-18, 10 units MSP2T-18XL) All units energized in State”1” Units Energized to State “2” over 4 years All units successfully switched to State “2” AN-83-001 Rev.: C M142736 (07/31/13) File: AN83001.doc This document and its contents are the property of Mini-Circuits. Sheet 6 of 19 6 of 19 APPLICATION NOTE: AN-83-001 Document: File Save Date: AN83001.doc 7/31/2013 12:53:00 PM Page 9 Test Methods and Conditions 9.1 Life Tests (Tests 1 and Tests 2): Test Conditions: • Contact resistance is measured at DC, between the probes of the connectors in the ON path in every cycle. • • • DC current = 2 mA The cycle time is ~110 milliseconds PORT X to PORT Y All tests performed at room temperature (+25C) Failure Criteria: Individual Switch Cycle Failure: Contact resistance >240 mΩ max Switch Assembly Failure Recordings a) First Failure: The first time a contact exhibits greater than 240 milliohms DC resistance b) Cumulative Failures: A cumulative of 1000 cycles in which the DC resistance measures greater than 240 milliohms 9.2 Sleep time test Mini-Circuits switches have passed four year sleep time test. Sleep Time defines the period over which switch is not energized and hence not switched. Test Conditions: • • • • Frequency 1, 100 & 1000 MHz at low RF power, 0 dBm Twenty (20) switches randomly selected from production lot: MSP2T-18 10 pcs MSP2T-18XL 10 pcs RF test before sleep test. RF test after sleep test. Failure Criteria: • . Must work when switched for the first time and meet specifications AN-83-001 Rev.: C M142736 (07/31/13) File: AN83001.doc This document and its contents are the property of Mini-Circuits. Sheet 7 of 19 7 of 19 APPLICATION NOTE: AN-83-001 Document: File Save Date: AN83001.doc 7/31/2013 12:53:00 PM Page 10 Detailed Test Results – Test 1: Life Tests (without Tune-Up) 10.1 TEST PROCESS – TEST 1 Life Test (without Tuneup) Life Test Data is derived from results of Production Life Test process, performed as follows: START PRODUCTION ASSEMBLY AND TEST per QC SHEET (includes 100% RF TEST) DAILY DATA REVIEW IS SWITCH CYCLE NO COUNT at FIRST 10 FAILURES >5M CYCLES? SELECT SWITCHES FOR LIFE TEST FROM PRODUCTION LOT CALIBRATE EQUIPMENT (DC RESISTANCE MEASUREMENT) YES IS TOTAL No. YES FAILURES >1000 ? IS TOTAL No. NO YES NO RUN MECHANICAL SWITCH LIFE TEST SOFTWARE IS TOTAL No. SWITCH CYCLES >10M CYCLES? YES PROCESSING for LIFE TEST FAILURES SWITCH C YC LES >10M CYCLES MOVE SWITCH STATE (each Port) NO NOTIFY ENGINEERING TEST MANAGER -FINAL DATA REVIEW -SIGN QC SHEET -APPROVE PRODUCTION RUN RECORD DC RESISTANCE (FAILURE is >240 milliohm) NO IS TOTAL NO. FAILURES >1000 YES STOP TEST SERVICE MAINTENACE ON FAILED UNIT, RESTOCK FOR TEST DEPARTMENT Figure 2 – Production Life Testing – Process Flow AN-83-001 Rev.: C M142736 (07/31/13) File: AN83001.doc This document and its contents are the property of Mini-Circuits. Sheet 8 of 19 8 of 19 APPLICATION NOTE: AN-83-001 Document: File Save Date: 10.2 AN83001.doc 7/31/2013 12:53:00 PM Page DC Resistance Measurement DC Resistance is measured at each switching cycle for each Port on Life Test units. Data is collected and reviewed on a daily basis. Life Test Units are tested to failure; i.e. Greater than 1000 Cumulative cycles with DC Resistance >240mΩ. Typical DC Life test data on a single unit is presented below in Figure 3 below. FIRST FAIL: 12.39M CYCLES 1000 CYCLE FAIL: 24.01M Figure 3 – Sample Life Test Data – one Switch AN-83-001 Rev.: C M142736 (07/31/13) File: AN83001.doc This document and its contents are the property of Mini-Circuits. Sheet 9 of 19 9 of 19 APPLICATION NOTE: AN-83-001 Document: File Save Date: 10.3 AN83001.doc 7/31/2013 12:53:00 PM Page 75 Unit Data Distribution – Test 1: Life Tests (without Tune-Up) First Failure – Production Distribution Results Mechanical Switch Life Testing Results First Failure 7 de 6 ts 5 eT sti n4 Uf or 3 eb 2 m u N 1 0 Millions of Cycles Figure 4 –Switch First Failures – Recorded Cycle - Distribution 1000 Cumulative Failures – Production Distribution Results Mechanical Switch Life Testing Results 1000 Cumulative failures 7 6 edt 5 se Ts ti 4 n Uf or 3 eb m uN 2 1 0 Millions of Cycles Figure 5 –Switch 1000 Cumulative Failures – Recorded Cycle - Distribution AN-83-001 Rev.: C M142736 (07/31/13) File: AN83001.doc This document and its contents are the property of Mini-Circuits. Sheet 10 of 19 10 of 19 APPLICATION NOTE: AN-83-001 Document: File Save Date: 10.4 AN83001.doc 7/31/2013 12:53:00 PM Page DETAILED TEST DATA – Test 1: Life Tests (without Tune-Up) LIFE TEST REPORT DATA Models: Time Period CT Run No. Run Number 1 5 7 N59890 1 5 8 N59890 1 5 9 N59890 1 7 1 N61840 1 7 2 N61840 1 7 3 N61840 1 8 7 N73210 1 8 8 N73210 1 8 9 N73210 1 12 1 N76230 1 12 2 N76230 1 12 3 N76230 1 14 1 N82720 1 14 2 N82720 1 14 3 N82720 1 8 4 N73210 1 8 5 N73210 1 8 6 N73210 1 16 1 N79510 1 16 2 N79510 1 16 3 N79510 1 8 1 N73210 1 8 2 N73210 1 8 3 N73210 1 19 1 N92790 1 19 2 N92790 1 19 3 N92790 1 24 1 N97820 1 24 2 N97820 1 24 3 N97820 1 25 1 N01200 1 25 3 N01200 1 26 1 N01210 1 26 2 N01210 1 26 3 N01210 1 28 1 N01220 1 28 2 N01220 1 28 3 N01220 1 29 1 N01230 1 29 2 N01230 1 29 3 N01230 1 30 1 N05490 1 30 2 N05490 1 30 3 N05490 1 31 1 N05510 1 31 2 N05510 1 31 3 N05510 1 34 1 N05520 1 34 2 N05520 1 35 3 N01240 1 35 1 N01240 1 35 2 N01240 1 36 1 N07280 1 36 2 N07280 1 36 3 N07280 1 37 1 N07290 1 37 2 N07290 1 37 3 N07290 1 39 1 N07300 1 39 2 N07300 1 39 3 N07300 1 39 4 N07300 1 40 1 N12090 1 40 2 N12090 1 40 3 N12090 1 41 1 N07310 1 41 2 N07310 1 42 1 N14600 1 42 2 N14600 1 42 3 N14600 1 42 4 N14600 1 44 1 N07320 1 44 2 N07320 1 44 3 N07320 1 45 1 N05520 No. Runs Min Max Average STDEV MSP2T-18XL MSP2TA-18XL 01/18/08 01/12/09 Model No. MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2TA-18XL MSP2TA-18XL MSP2TA-18XL MSP2TA-18XL MSP2TA-18XL MSP2TA-18XL MSP2TA-18XL MSP2TA-18XL MSP2TA-18XL MSP2TA-18XL MSP2TA-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2TA-18XL MSP2TA-18XL MSP2TA-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2TA-18XL MSP2TA-18XL MSP2TA-18XL MSP2TA-18XL MSP2TA-18XL MSP2TA-18XL MSP2TA-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2TA-18XL MSP2TA-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2T-18XL MSP2TA-18XL MSP2TA-18XL MSP2TA-18XL MSP2T-18XL Unit No. 0041 0033 0038 0017 0020 0050 0040 0044 0012 0001 0002 0027 0011 0020 0008 0040 0044 0012 0001 0032 0052 0040 0044 0012 0035 0055 0081 0021 0092 0100 0019 0076 0023 0037 0045 0058 0061 0083 0021 0067 0088 0010 0052 0093 0001 0002 0003 0021 0041 0031 0041 0043 0001 0002 0003 0001 0036 0088 0065 0096 0102 0130 0030 0033 0048 0025 0062 0031 0053 0110 0127 0034 0040 0050 0050 Run DATE Run Qty Release Date 01/18/08 90 28-Jan-08 01/18/08 90 01/18/08 90 02/14/08 100 18-Feb-08 02/14/08 100 02/14/08 100 02/20/08 100 28-Feb-08 02/20/08 100 02/20/08 100 03/14/08 100 27-Mar-08 03/14/08 100 03/14/08 100 03/26/08 100 9-Apr-08 03/26/08 100 03/26/08 100 03/27/08 100 14-Apr-09 03/27/08 100 03/27/08 100 03/28/08 100 25-Apr-08 03/28/08 100 03/28/08 100 05/01/08 100 15-May-09 05/01/08 100 05/01/08 100 05/02/08 100 15-May-08 05/02/08 99 05/02/08 99 06/24/08 100 3-Jul-08 06/24/08 100 06/24/08 100 06/30/08 100 7-Jul-08 06/30/08 100 07/09/08 100 16-Jul-08 07/09/08 100 07/09/08 100 07/23/08 100 1-Aug-08 07/23/08 100 07/23/08 100 07/30/08 100 8-Aug-08 07/30/08 100 07/30/08 100 08/05/08 100 13-Aug-08 08/05/08 100 08/05/08 100 08/06/08 100 13-Aug-08 08/06/08 100 08/06/08 100 49 16-Sep-08 09/10/08 49 09/10/08 09/10/08 37 16-Sep-08 63 3-Oct-08 09/26/08 63 09/26/08 10/03/08 100 13-Oct-08 10/03/08 100 10/03/08 100 10/15/08 100 24-Oct-08 10/15/08 100 10/15/08 100 11/18/08 137 26-Nov-08 11/18/08 137 11/18/08 137 11/18/08 137 11/20/08 100 26-Nov-08 11/20/08 100 11/20/08 100 12/03/08 100 16-Dec-09 12/03/08 100 12/16/08 150 22-Dec-08 12/16/08 150 12/16/08 150 12/16/08 150 01/08/09 100 16-Jan-09 01/08/09 100 01/08/09 100 01/12/09 51 22-Jan-09 Life Test Qty 3 3 3 3 3 4 3 3 3 3 3 3 3 3 3 3 2 1 2 3 3 4 3 3 4 3 2 First Failure 1000 Cum Fail 75 75 5,096,137 10,476,000 44,252,850 83,526,000 18,798,751 33,045,867 9,675,126 15,422,011 No. Failures at First Failure 1000 Cum Fail TEST STOP 31,172,114 37,203,000 1000 20,759,979 22,325,000 1000 23,564,880 25,691,000 1000 26,939,466 42,849,000 1000 28,195,716 47,836,000 1000 30,601,417 43,353,000 1000 20,659,367 29,580,000 1000 27,911,046 28,223,000 1000 30,601,417 35,472,000 1000 10,499,055 13,823,000 1000 26,703,742 40,925,000 1000 18,582,758 20,902,000 1000 9,165,115 10,643,000 1000 40,864,775 45,414,000 1000 28,325,529 41,480,000 1000 19,563,929 22,676,000 1000 16,376,513 60,545,000 1000 12,379,073 24,012,000 1000 12,822,783 18,334,000 1000 28,054,932 44,704,000 1000 26,693,321 32,055,000 1000 28,457,105 50,239,000 1000 18,262,282 29,609,000 1000 14,555,303 71,963,000 1000 44,252,850 64,260,000 1000 21,608,347 58,286,000 1000 32,252,419 83,526,000 946* 21,817,045 47,478,000 1000 22,753,600 48,740,000 1000 11,990,051 50,000,000 291* 11,483,701 32,275,000 1000 26,578,121 43,830,000 1000 22,459,922 44,584,000 1000 14,809,803 35,989,000 1000 19,115,307 37,028,000 1000 35,599,736 50,000,000 412* 17,523,486 42,901,000 1000 23,463,694 44,729,000 1000 7,344,686 32,790,000 1000 7,342,293 25,843,000 1000 21,364,154 34,155,000 1000 20,055,732 42,004,000 1000 18,870,088 50,000,000 496* 40,649,155 50,000,000 3* 38,331,892 49,241,000 1000 27,598,369 40,208,000 1000 25,385,306 50,000,000 604* 10,737,191 25,619,000 1000 10,399,379 22,772,000 1000 9,411,508 16,835,000 1000 17,015,585 22,434,000 1000 10,049,030 20,737,000 1000 15,992,340 20,782,000 1000 14,702,337 20,412,000 1000 6,454,447 17,736,000 1000 11,348,571 12,029,000 1000 8,653,387 18,824,000 1000 6,633,372 13,499,000 1000 5,676,884 20,444,000 1000 13,326,921 30,748,000 1000 15,986,248 24,187,000 1000 14,867,459 19,616,000 1000 15,609,451 26,409,000 1000 16,387,139 28,144,000 1000 32,946,303 32,946,000 1000 6,812,588 13,833,000 1000 9,556,473 11,139,000 1000 7,416,966 31,190,000 1000 7,334,380 16,385,000 1000 7,337,631 29,561,000 1000 24,230,600 32,696,000 1000 5,794,741 14,478,000 1000 7,244,288 14,138,000 1000 5,096,137 10,476,000 1000 8,523,567 12,648,000 1000 * Life Test terminated prior to 1000 cycle failures for units exceeding 50 million cycles - Change instituted May.02.2008 Table 3 –Life Test Data (without Tune-up) – Details 75 Switches (Specific Data from highlighted unit in Figure 3) AN-83-001 Rev.: C M142736 (07/31/13) File: AN83001.doc This document and its contents are the property of Mini-Circuits. Sheet 11 of 19 11 of 19 APPLICATION NOTE: AN-83-001 Document: File Save Date: AN83001.doc 7/31/2013 12:53:00 PM Page 11 Detailed Test Results – Test 2: Extended Life Tests (with Tune-Up) 11.1 TEST PROCESS – TEST 2 Extended Life Test (with Tuneup) START PERFORM PRODUCTION LIFE TEST (1000 Cumulative failures) SELECT FOUR (4) SWITCHES FOR EXTENDED LIFE TEST FROM PRODUCTION LIFE TEST ON EACH SWITCH PERFORM 100% RF TEST RUN PRODUCTION LIFE TEST PROGRAM IS TOTAL No. FAILURES >1000 ? RECORD CYCLE at TUNE-UP PERFORM MECHANICAL SWITCHTUNE-UP PROCEDURE PERFORM 100% RF TEST PASS UNIT PASS / FAIL FAIL RECORD No. CYCLES AT FINAL FAILURE STOP Figure 6 – Extended Life Test Data (with Tune-up) Process Flow AN-83-001 Rev.: C M142736 (07/31/13) File: AN83001.doc This document and its contents are the property of Mini-Circuits. Sheet 12 of 19 12 of 19 APPLICATION NOTE: AN-83-001 Document: File Save Date: 11.2 AN83001.doc 7/31/2013 12:53:00 PM Page 13 of 19 TEST RESULTS– TEST 2 Extended Life Test (with Tuneup) Run: E39070 Start Date: October 19th, 2006 End: March 3rd 2008 Tune-up # Switch# 2 13 15 17 18 1 2 3 4 5 6 7 8 18 19 9 14 30 41 45 38 41 61 76 93 151 170 42 114 164 186 211 63 79 87 100 106 57 66 100 140 174 54 73 78 137 167 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 190 236 116 193 179 206 256 123 211 196 225 273 133 227 216 238 286 142 242 229 240 293 150 252 244 247 306 154 258 247 255 315 159 270 258 256 327 166 282 270 260 336 178 292 285 264 276 291 299 311 322 336 191 304 299 202 310 310 210 319 323 219 327 339 230 339 232 246 24 25 26 27 28 29 259 264 274 285 292 306 Table 4 - Cumulative Number of Cycles Completed (in millions) prior to Each Tune-up AN-83-001 Rev.: C M142736 (07/31/13) File: AN83001.doc This document and its contents are the property of Mini-Circuits. Sheet 13 of 19 APPLICATION NOTE: AN-83-001 Document: File Save Date: AN83001.doc 7/31/2013 12:53:00 PM Page 12 Detailed Test Results – Test 3: Sleep Testing 12.1 TEST PROCESS – TEST 3 Sleep Test START SELECT TWENTY (20) SWITCHES FOR SLEEP TEST FROM APPROVED PRODUCTION LOT MSP2T-18 10 units MSP2T-18XL 10 units SH ON EACH SWITCH TN ONEACHSWITCH EACH SWITCHIN OM STORAGE IN FIXED 3= STATEONTEST EACH SWITCH SETUP: ENERGIZE SWITCH : ITA ON EACH SWITCH 6 SH SELECT SWITCHBASED J1 to IN TEST SETUP: W =T T ON EACH SWITCH UPON SPECIFIED ENERGIZE SWITCH : MAINTAIN STATE IA NO 9= SH S TEST SETUP: SCHEDULE ON EACH SWITCH J1 to IN ENERGIZE W: M TI TN 2 RAE SWITCH SR TEST SETUP: MAINTAIN STATE AW: OM 1 S Y5 J1 to IN ENERGIZE ONTEST EACH SWITCH PERFORM and RECORD SWITCH EAY S SETUP: . H PERFORM and RECORD = 1 100% RF100% TEST RF TEST MAINTAIN J1 toSTATE IN ENERGIZE TIA : TNO = ON EACH SWITCH SWITCH .0 R MAINTAIN J1 toSTATE IN TEST SETUP: ITA 2= AYE SRA PERFORM and RECORD M W ON EACH SWITCH ENERGIZE SWITCH MAINTAIN STATE TI .52 EY TEST and RECORD TEST SETUP: W: SWITCH WAIT "X" PERIOD100% of RFPERFORM ON EACH J1 to IN ENERGIZE SWITCHAW: of RF TEST = 0.3 TIME WAIT "X" PERIOD100% MAINTAIN PERFORM and RECORD J1 toSTATE IN TEST SETUP: TIA TIME ENERGIZE TESTSWITCH SETUP:: =T TEST and RECORD WAIT "X" PERIOD100% of RFPERFORM MAINTAIN STATE WSWITCHIA: J1 to IN ENERGIZE TEST SETUP: TIME 100% RF TEST W WAIT "X" PERIOD of MAINTAIN STATE J1 to IN TEST SETUP: PERFORM and RECORD ENERGIZE SWITCH : TIME MAINTAIN STATE : WAIT "X" PERIOD 100% TEST and RECORD of RFPERFORM J2 to IN ENERGIZE SWITCH J2 toSTATE IN TEST SETUP: TIME WAIT "X" PERIOD MAINTAIN of RF TEST 100% ENERGIZE SWITCH : TIME PERFORM and RECORD MAINTAIN STATETEST SETUP: J2 to IN ENERGIZE SWITCH : WAIT "X" PERIOD100% TEST and RECORD of RFPERFORM PERFORM and RECORD TEST SETUP: TIME WAIT "X" PERIOD MAINTAIN STATE 100% of RF TEST J2 to IN 100% RFPERFORM TEST ENERGIZE SWITCH : TIME TEST SETUP: and RECORD J2 toSTATE IN ENERGIZE SWITCH : WAIT "X" PERIOD of 100% RF TEST MAINTAIN MAINTAIN J2 toSTATE IN TEST SETUP: TIME WAIT "X" PERIOD of PERFORM and RECORD ENERGIZE SWITCH MAINTAIN STATE TEST and RECORD STOP 100% RFPERFORM TEST SETUP:: TIME J2 to IN ENERGIZE SWITCH : TEST and RECORD STOP 100% RFPERFORM MAINTAIN J2 toSTATE IN TEST SETUP: ENERGIZE TESTSWITCH SETUP:: 100% RFPERFORM TEST and RECORD MAINTAIN STATE STOP J2 to INENERGIZE SWITCH : 100% RF TEST MAINTAIN J2 toSTATE IN PERFORM and RECORD STOP MAINTAIN STATE 100% RF TEST PERFORM and RECORD STOP TEST STOP 100% RFPERFORM and RECORD 100% RFPERFORM TEST and RECORD STOP 100% RF TEST STOP STOP STOP SR AE Y5 .3 =T IA W SR AE Y5 .3 =T IA W FINAL REPORT Figure 7 – Sleep Test Process Flow AN-83-001 Rev.: C M142736 (07/31/13) File: AN83001.doc This document and its contents are the property of Mini-Circuits. Sheet 14 of 19 14 of 19 APPLICATION NOTE: AN-83-001 Document: File Save Date: 12.2 AN83001.doc 7/31/2013 12:53:00 PM TEST RESULTS – TEST 3 Sleep Tests MODEL Number Serial Number MSP2T-18 N46550-0008 N46570-0010 N46570-0011 N46570-0012 N46570-0013 N48290-0031 N48290-0044 N48290-0045 N48290-0046 N48290-0048 MSP2T-18XL Test Completed (Sched.) 2/12/05 4/12/05 7/12/05 10/12/05 1/12/06 7/12/06 1/12/07 7/12/07 1/12/08 1/12/09 N05490-0033 3/18/2009 N05490-0034 5/18/2009 N05490-0035 7/18/2009 N05490-0036 10/18/09 N05490-0037 02/18/10 N05490-0038 07/18/10 N05510-0045 02/18/11 N05510-0074 07/18/11 N05510-0081 07/18/12 N05490-0096 07/18/13 Page Pre-Test Sleep Time Results PostTest Results PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS 3 months 6 months 9 months 12 months 1.5 years 2.0 years 2.5 years 3.0 years 3.5 years 4.0 years 3 months 6 months 9 months 12 months 1.5 years 2.0 years 2.5 years 3.0 years 3.5 years 4.0 years Table 5 – Sleep Test Results NOTE: Actual data for Model shaded in YELLOW is in APPENDIX 1 AN-83-001 Rev.: C M142736 (07/31/13) File: AN83001.doc This document and its contents are the property of Mini-Circuits. Sheet 15 of 19 15 of 19 APPLICATION NOTE: AN-83-001 Document: File Save Date: AN83001.doc 7/31/2013 12:53:00 PM Page 13 Conclusion Due to the design approach as outlined in section 4, for all practical purposes, these switches do not wear out and have a lifetime far exceeding switches commercially available. They have the ability to be used in excess of 300 million cycles with periodic tune-up, meeting all electrical performance as outlined in our catalog datasheet. AN-83-001 Rev.: C M142736 (07/31/13) File: AN83001.doc This document and its contents are the property of Mini-Circuits. Sheet 16 of 19 16 of 19 APPLICATION NOTE: AN-83-001 Document: File Save Date: AN83001.doc 7/31/2013 12:53:00 PM Page 14 Appendix RF TEST DATA Typical Test Data taken on Switch, BEFORE and AFTER Sleep Test 14.1 BEFORE SLEEP TEST DATA Figure 8a – RF TEST DATA - Before Sleep Test INSERTION LOSS – RUN N46570 - S/N 0012 (D/C 0451) AN-83-001 Rev.: C M142736 (07/31/13) File: AN83001.doc This document and its contents are the property of Mini-Circuits. Sheet 17 of 19 17 of 19 APPLICATION NOTE: AN-83-001 Document: File Save Date: AN83001.doc 7/31/2013 12:53:00 PM Page Figure 8b – RF TEST DATA - Before Sleep Test ISOLATION – RUN N46570 - S/N 0012 (D/C 0451) AN-83-001 Rev.: C M142736 (07/31/13) File: AN83001.doc This document and its contents are the property of Mini-Circuits. Sheet 18 of 19 18 of 19 APPLICATION NOTE: AN-83-001 Document: File Save Date: 14.1 AN83001.doc 7/31/2013 12:53:00 PM Page AFTERSLEEP TEST DATA Figure 9 – RF TEST DATA – After Sleep Test INSERTION LOSS and ISOLATION – N46570 - S/N 0012 (D/C 0451) AN-83-001 Rev.: C M142736 (07/31/13) File: AN83001.doc This document and its contents are the property of Mini-Circuits. Sheet 19 of 19 19 of 19