Contech Research

MARCH 17, 2009
TEST REPORT #209070
REVISION 1.1
QUALIFICATION TESTING
PART NUMBERS
SEAF-50-01-S-06-2-RA-GP
SEAM-50-02.0-S-06-2-GP
SAMTEC, INC.
APPROVED BY: DOMINIC ARPINO
PROGRAM MANAGER
CONTECH RESEARCH, INC.
Test Laboratory
Contech Research
An Independent Test and Research Laboratory
REVISION HISTORY
DATE
REV. NO.
DESCRIPTION
ENG.
3/17/2009
1.0
Initial Issue
DA
2/10/2011
1.1
Correct Mechanical Shock and
Vibration test conditions
APH
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CERTIFICATION
This is to certify that the evaluation described herein was
designed and executed by personnel of Contech Research, Inc.
It was performed with the concurrence of Samtec, Inc. of New
Albany, IN who was the test sponsor.
All equipment and measuring instruments used during testing
were calibrated and traceable to NIST according to ISO 10012-1
and ANSI/NCSL Z540-1 and MIL-STD-45662 as applicable.
All data, raw and summarized, analysis and conclusions
presented herein are the property of the test sponsor. No copy
of this report, except in full, shall be forwarded to any
agency, customer, etc., without the written approval of the
test sponsor and Contech Research.
APPROVED BY: DOMINIC ARPINO
PROGRAM MANAGER
CONTECH RESEARCH, INC.
DA:cf
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SCOPE
To perform Qualification testing on SEAF/SEAM connectors as
manufactured and submitted by the test sponsor Samtec, Inc.
APPLICABLE DOCUMENTS
1.
Unless otherwise specified, the following documents of
issue in effect at the time of testing performed form a
part of this report to the extent as specified herein. The
requirements of sub-tier specifications and/or standards
apply only when specifically referenced in this report.
2.
Samtec Test Plan: TC0853—2158
3.
Standard: EIA Publication 364
TEST SAMPLES AND PREPARATION
1.
The following test samples were submitted by the test
sponsor, Samtec, Inc., for the evaluation to be performed
by Contech Research, Inc.
Part Number
a) SEAF-50-01-S-06-2-RA-GP
b) SEAM-50-02.0-S-06-2-GP
2.
Test samples were supplied assembled and terminated to test
boards by the test sponsor.
3.
Test boards for mounting test samples were supplied by the
test sponsor.
4.
The test samples were tested mounted to printed circuit
boards.
5.
Figure #1 illustrates the mounted connectors used for test.
6.
Test leads were attached to the appropriate measurement
areas of the test samples and applicable mating elements.
7.
The test samples were tested in their ‘as received’
condition.
8.
Unless otherwise specified in the test procedures used, no
further preparation was used.
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TEST SELECTION
1.
See Test Plan Flow Diagram, Figure #2, for test sequences
used.
2.
Test set ups and/or procedures which are standard or common
are not detailed or documented herein provided they are
certified as being performed in accordance with the
applicable (industry or military) test methods, standards
and/or drawings as specified in the detail specification.
SAMPLE CODING
1.
All samples were coded. Mated test samples remained with
each other throughout the test group/sequences for which
they were designated. Coding was performed in a manner
which remained legible for the test duration.
2.
The test samples were coded in the following manner:
Group A: Group
Group
Group
Group
A
B1
B2
B3
–
–
–
–
A-A-1, A-A-2
A-B1-B, A-B1-2
A-B2-1, A-B2-2
A-B3-1, A-B3-2
Group B: Group A1 – B-A-1, B-A-2, B-A-3, B-A-4
B-A-5, B-A-6, B-A-7, B-A-8
Group C: Group A – C-A-1, C-A-2, C-A-3, C-A-4
C-A-5, C-A-6, C-A-7, C-A-8
Group D: Group A – D-A-1, D-A-2, D-A-3
Board Number
Group ID
Sequence
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FIGURE #1
TYPICAL TEST SAMPLE
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FIGURE #2
TEST PLAN FLOW DIAGRAM
SAMPLE PREPARATION
SEQ. A
IR
DWV
TH.
SHOCK
SEQ. B
TH.
SHOCK
DWV
LLCR
CYCLIC
HUMIDITY
DURABILITY
SEQ. C
SEQ.D
LLCR
MECH.
SHOCK
MECH.
SHOCK
DWV
RANDOM
VIBRATION
LLCR
LLCR
IR
TH. SHOCK
RANDOM
VIBRATION
CYCLIC
HUMDITY
LLCR
LLCR
IR
CYCLIC
HUMIDITY
LLCR
GR.A
GR.B1
GR. B2
GR. B3
GR. A
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GR. A
GR. A
Contech Research
An Independent Test and Research Laboratory
DATA SUMMARY
TEST
REQUIREMENTS
RESULTS
1000 MEGOHMS MIN.
NO DAMAGE
1000 MEGOHMS MIN.
NO DAMAGE
1000 MEGOHMS MIN.
>50,000 MEGOHMS
PASSED
>50,000 MEGOHMS
PASSED
>50,000 MEGOHMS
NO BREAKDOWN, ETC.
PASSED
NO DAMAGE
NO BREAKDOWN, ETC.
PASSED
PASSED
NO DAMAGE
NO BREAKDOWN, ETC.
PASSED
PASSED
RECORD
NO DAMAGE
+10.0 m MAX.CHG.
NO DAMAGE
+10.0 m MAX.CHG.
NO DAMAGE
+10.0 m MAX.CHG.
14.6 m
PASSED
+2.5 m
PASSED
+1.4 m
PASSED
+2.4 m
SEQUENCE A
GROUP A
INSULATION RESISTANCE
THERMAL SHOCK
INSULATION RESISTANCE
CYCLIC HUMIDITY
INSULATION RESISTANCE
GROUP B1
DWV
GROUP B2
THERMAL SHOCK
DWV
GROUP B3
CYCLIC HUMIDITY
DWV
SEQUENCE B
GROUP A DATA
LLCR
DURABILITY
LLCR
THERMAL SHOCK
LLCR
CYCLIC HUMIDITY
LLCR
Test Laboratory
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MAX.
MAX.CHG.
MAX.CHG.
MAX.CHG.
Contech Research
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DATA SUMMARY -continued
TEST
REQUIREMENTS
RESULTS
SEQUENCE C
GROUP A
LLCR
MECHANICAL SHOCK
LLCR
RANDOM VIBRATION
LLCR
RECORD
NO DAMAGE
+10.0 m MAX.CHG.
NO DAMAGE
+10.0 m MAX.CHG.
15.0 m MAX.
PASSED
+2.2 m MAX.CHG.
PASSED
+3.2 m MAX.CHG.
NO
50
NO
50
PASSED
PASSED
PASSED
PASSED
SEQUENCE D
GROUP A
MECHANICAL SHOCK
RANDOM VIBRATION
DAMAGE
NANOSECOND
DAMAGE
NANOSECOND
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EQUIPMENT LIST
ID#
27
150
244
282
297
321
323
340
545
553
614
629
684
874
1116
1147
1314
1315
1361
1366
1367
1368
1474
1549
1550
1609
5045
Next Cal
Last Cal
9/22/2009
9/22/2008
11/13/2009
3/12/2009
11/13/2008
3/12/2008
4/10/2009
3/13/2010
4/10/2008
3/13/2009
10/27/2009
4/24/2009
10/27/2008
4/24/2008
12/5/2009
3/5/2010
1/21/2010
3/5/2010
12/5/2008
3/5/2009
1/21/2009
3/5/2009
3/25/2009
3/25/2008
1/30/2010
1/21/2010
1/2/2010
12/5/2009
1/30/23009
1/21/2009
1/2/2009
12/5/2008
Equipment Name
Manufacturer
Model #
Serial #
Accuracy
Freq.Cal
Temp. Humid. Chamber
Drill Press Stand
Micro-Ohm Meter
Vibration Shaker Table
Micro-Ohm Meter
AC-DC Hipot/Megometer
Computer
X-Y Table
Event Detector
12 channel Power Unit
Oven
Digital Thermometer
Accelerometer
Computer
Computer
Digital O-Scope
Multiplexer card
Data Aquisition Multimeter
Multiplexer Card
Main Frame
Interface
Sine/Rnd Control digitizer
Vib Pwr Amp
Multiplexer Card
Multiplexer Card
Vert Thermal Shock Chamber
TDR -Sampling Head
Blue M Co.
Craftsman
Keithley Instr.
Ling Dynamics
Keithley Instr.
Hipotronics Co.
Legatech
NE Affiliated Tech
Anatech
PCB Co.
Tenney Co.
Omega Eng.
PCB. Co.
M&P
ARC. Co.
Tektronix
Keithley Co.
Keithley Co.
Keithley
Agilent H.P.
Agilent H.P.
Agilent H.P.
tira
Keithley
Keithley
C.S.Z.
Tektroniks
FR-256PC-1
25921
580-1
V-730
580
H300B
286-12
XY-6060
32/64 EHD
483A
TH Jr.
DP 116
353B04
Vectra
P111-450
11801C
7708
2700
7708
8408A
E8491A
E1432A
A58312
7708
7708
VTS-1.0-2-2-H/AC
SD-24
F2-249
N/A
467496
163
485414
DS16-201
N/A
N/A
941206
1303
9712-510
6232189
47648
us75203327
See Cal Cert
N/A
See Cal Cert
N/A
See Cal Cert
See Cal Cert
N/A
N/A
See Cal Cert
See Cal Cert
See Manual
±1.1DegC
See Cal Cert.
N/A
N/A
See Cal Cert.
See CERT
See CERT
See Cal Cert
N/A
N/A
See Manual
N/A
See Cert
See Cert
See Manual
See Cal Cert
Ea Test
N/A
12mon
N/A
12mon
12 mon.
N/A
N/A
12mon
12mon
Ea Test
12mon
12mon
N/A
N/A
12mon.
12mon
12mon
12mon
N/A
N/A
12mon
N/A
12mon
12mon
12mon
12mon
B030915
0862544
0862680
1067661
US35470169
003/06
171629
171626
08-VT14810
B0221502
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TEST RESULTS
SEQUENCE A
GROUP A
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PROJECT NO.: 209070
SPECIFICATION: TC0853-2158
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: SEAF/SEAM Conn.
-----------------------------------------------------------SAMPLE SIZE: 2 Samples
TECHNICIAN: DAM
-----------------------------------------------------------START DATE: 2/11/09
COMPLETE DATE: 2/11/09
-----------------------------------------------------------ROOM AMBIENT: 20C
RELATIVE HUMIDITY: 29%
-----------------------------------------------------------EQUIPMENT ID#: 321
-----------------------------------------------------------INSULATION RESISTANCE(IR)
PURPOSE:
To determine the resistance of insulation materials to leakage
of current through or on the surface of these materials when a
DC potential is applied.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 21.
2.
Test Conditions:
a)
b)
c)
d)
e)
3.
Between Adjacent Contacts
Between Rows
Mated Condition
Mounting Condition
Test Voltage
:
:
:
:
:
Yes
Yes
Mated
Mounted
500 DC
The test voltage was applied to specific test points on the
test board.
-----------------------------------------------------------REQUIREMENTS:
When the specified test voltage is applied, the insulation
resistance shall not be less than 1,000 megohms.
-----------------------------------------------------------RESULTS:
The insulation resistance exceeded 50,000 megohms.
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PROJECT NO.: 209070
SPECIFICATION: TC0853-2158
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: SEAF/SEAM Conn.
-----------------------------------------------------------SAMPLE SIZE: 2 Samples
TECHNICIAN: S.Rath
-----------------------------------------------------------START DATE: 2/18/09
COMPLETE DATE: 2/23/09
-----------------------------------------------------------ROOM AMBIENT: 20C
RELATIVE HUMIDITY: 24%
-----------------------------------------------------------EQUIPMENT ID#: 1314, 1315, 1361, 1609
-----------------------------------------------------------THERMAL SHOCK
PURPOSE:
To determine the resistance of a given electrical connector to
exposure at extremes of high and low temperatures and the shock
of alternate exposures to these extremes, simulating the worst
probable conditions of storage, transportation and application.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 32, with the following conditions.
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
Number of Cycles
Hot Extreme
Cold Extreme
Time at Temperature
Mating Conditions
Mounting Conditions
Transfer Time
:
:
:
:
:
:
:
100 Cycles
+85°C +3C/-0C
-55°C +0C/-3C
30 Minutes
Mated
Mounted
Within 1.0 minute
3.
The total number of cycles was performed continuously.
4.
All subsequent variable testing was performed in accordance
with the procedures as previously indicated.
5.
Prior to performing variable measurements, the test samples
were allowed to recover to room ambient conditions.
-----------------------------------------------------------REQUIREMENTS: See Next Page
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REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
The insulation resistance shall not be less than
1,000 megohms.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
The insulation resistance exceeded 50,000 megohms.
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PROJECT NO.: 209070
SPECIFICATION: TC0853-2158
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: SEAM/SEAF Conn.
-----------------------------------------------------------SAMPLE SIZE: 2 Samples
TECHNICIAN: DAM
-----------------------------------------------------------START DATE: 2/24/09
COMPLETE DATE: 3/6/09
-----------------------------------------------------------ROOM AMBIENT: 20C
RELATIVE HUMIDITY: 22%
-----------------------------------------------------------EQUIPMENT ID#: 27, 614, 629, 1314, 1315, 1361
-----------------------------------------------------------HUMIDITY (THERMAL CYCLING)
PURPOSE:
The purpose of this test is to permit evaluation of the
properties of materials used in connectors as they are
influenced or deteriorated by the effects of high humidity and
heat conditions. Measurements made under
high humidity conditions may reflect the peculiar conditions
under which the readings were made, and should be compared only
to initial readings when careful analysis indicates that such a
comparison is valid and applicable.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 31, with the following conditions.
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
h)
3.
Preconditioning (24 hours)
Relative Humidity
Temperature Conditions
Cold Cycle
Polarizing Voltage
Mating Conditions
Mounting Conditions
Duration
:
:
:
:
:
:
:
:
50C ± 5C
90% to 95%
25C to 65C
No
No
Mated
Mounted
240 hours
Prior to performing variable measurements, the test samples
were allowed to recover to room ambient conditions.
-continued on next page.
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PROCEDURE: -continued
4. All subsequent variable testing was performed in accordance
with the procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical deterioration of the
test samples as tested.
2.
The final insulation resistance shall not be less than
1,000 megohms.
-----------------------------------------------------------RESULTS:
1.
The test samples as tested showed no evidence of physical
deterioration.
2.
The final insulation resistance exceeded 50,000 megohms
after air dry of 2 hours.
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TEST RESULTS
SEQUENCE A
GROUP B1
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PROJECT NO.: 209070
SPECIFICATION: TC0853-2158
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: SEAM/SEAF Conn.
-----------------------------------------------------------SAMPLE SIZE: 2 Samples
TECHNICIAN: DAM
-----------------------------------------------------------START DATE: 2/11/09
COMPLETE DATE: 2/11/09
-----------------------------------------------------------ROOM AMBIENT: 20C
RELATIVE HUMIDITY: 26%
-----------------------------------------------------------EQUIPMENT ID#: 321
-----------------------------------------------------------DIELECTRIC WITHSTANDING VOLTAGE (SEA LEVEL)
PURPOSE:
To determine if the mated connectors can operate at its rated
voltage and withstand momentary overpotentials due to
switching, surges and other similar phenomenon.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 20.
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
3.
Between Adjacent Contacts
Between Rows
Mated Condition
Mounting Condition
Hold Time
Rate of Application
Test Voltage
:
:
:
:
:
:
:
Yes
Yes
Mated
Mounted
60 seconds
500 volts/sec.
900 VAC
The test voltage was applied to specific test points on the
test board.
-----------------------------------------------------------REQUIREMENTS:
When the specified test voltage is applied, there shall be no
evidence of breakdown, arcing, etc.
-----------------------------------------------------------RESULTS:
All test samples as tested met the requirements as specified.
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TEST RESULTS
SEQUENCE A
GROUP B2
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PROJECT NO.: 209070
SPECIFICATION: TC0853-2158
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: SEAM/SEAF Conn.
-----------------------------------------------------------SAMPLE SIZE: 2 Samples
TECHNICIAN: DAM
-----------------------------------------------------------START DATE: 2/18/09
COMPLETE DATE: 2/23/09
-----------------------------------------------------------ROOM AMBIENT: 20C
RELATIVE HUMIDITY: 24%
-----------------------------------------------------------EQUIPMENT ID#: 1334, 1315, 1361, 1609
-----------------------------------------------------------THERMAL SHOCK
PURPOSE:
To determine the resistance of a given electrical connector to
exposure at extremes of high and low temperatures and the shock
of alternate exposures to these extremes, simulating the worst
probable conditions of storage, transportation and application.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 32, with the following conditions.
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
Number of Cycles
Hot Extreme
Cold Extreme
Time at Temperature
Mating Conditions
Mounting Conditions
Transfer Time
:
:
:
:
:
:
:
100 Cycles
+85°C +3C/-0C
-55°C +0C/-3C
30 Minutes
Mated
Mounted
Within 1.0 minute
3.
The total number of cycles was performed continuously.
4.
All subsequent variable testing was performed in accordance
with the procedures as previously indicated.
5.
Prior to performing variable measurements, the test samples
were allowed to recover to room ambient conditions.
-----------------------------------------------------------REQUIREMENTS: See Next Page
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An Independent Test and Research Laboratory
REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
When a 900 test voltage is applied, there shall be no
evidence of arcing, breakdown, etc.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
There was no evidence of arcing, breakdown, etc., when a
900 voltage was applied.
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TEST RESULTS
SEQUENCE A
GROUP B3
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PROJECT NO.: 209070
SPECIFICATION: TC0853-2158
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: SEAM/SEAF Conn.
-----------------------------------------------------------SAMPLE SIZE: 2 Samples
TECHNICIAN: S.Rath
-----------------------------------------------------------START DATE: 11/20/08
COMPLETE DATE: 12/01/08
-----------------------------------------------------------ROOM AMBIENT: 21C
RELATIVE HUMIDITY: 23%
-----------------------------------------------------------EQUIPMENT ID#: 27, 321, 614, 629, 1315, 1549, 1550
-----------------------------------------------------------HUMIDITY (THERMAL CYCLING)
PURPOSE:
The purpose of this test is to permit evaluation of the
properties of materials used in connectors as they are
influenced or deteriorated by the effects of high humidity and
heat conditions. Measurements made under
high humidity conditions may reflect the peculiar conditions
under which the readings were made, and should be compared only
to initial readings when careful analysis indicates that such a
comparison is valid and applicable.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 31, with the following conditions.
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
h)
3.
Preconditioning (24 hours)
Relative Humidity
Temperature Conditions
Cold Cycle
Polarizing Voltage
Mating Conditions
Mounting Conditions
Duration
:
:
:
:
:
:
:
:
50C ± 5C
90% to 95%
25C to 65C
No
No
Mated
Mounted
240 hours
Prior to performing variable measurements, the test samples
were allowed to recover to room ambient conditions.
-continued on next page.
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PROCEDURE: -continued
4.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical deterioration of the
test samples as tested.
2.
There shall be no evidence of arcing or breakdown when
a 900 test voltage is applied.
-----------------------------------------------------------RESULTS:
1.
The test samples as tested showed no evidence of physical
deterioration.
2.
There was no evidence of breakdown, arcing, etc., when a
900 test voltage was applied.
Test Laboratory
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TEST RESULTS
SEQUENCE B
GROUP A
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PROJECT NO.: 209070
SPECIFICATION: TC0853-2158
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: SEAM/SEAF Conn.
-----------------------------------------------------------SAMPLE SIZE: 8 Samples
TECHNICIAN: DAM, AJP
-----------------------------------------------------------START DATE: 2/10/09
COMPLETE DATE: 2/10/09
-----------------------------------------------------------ROOM AMBIENT: 20C
RELATIVE HUMIDITY: 24%
-----------------------------------------------------------EQUIPMENT ID#: 244, 297, 323, 1116
-----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR)
PURPOSE:
1.
To evaluate contact resistance characteristics of the
contact systems under conditions were applied voltages and
currents do not alter the physical contact interface and
will detect oxides and films which degrade electrical
stability. It is also sensitive to and may detect the
presence of fretting corrosion induced by mechanical or
thermal environments as well as any significant loss of
contact pressure.
2.
This attribute was monitored after each preconditioning
and/or test exposure in order to determine said stability
of the contact systems as they progress through the
applicable test sequences.
3.
The electrical stability of the system is determined by
comparing the initial resistance value to that observed
after a given test exposure. The difference is the change
in resistance occurring whose magnitude establishes the
stability of the interface being evaluated.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 23 with the following conditions.
-continued on next page.
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PROCEDURE: -continued
2.
Test Conditions:
a) Test Current
: 10 milliamps maximum
b) Open Circuit Voltage
: 20 minutes
c) No. of Positions Tested : 25 per test sample
-----------------------------------------------------------REQUIREMENTS:
Low level circuit resistance shall be measured and recorded.
-----------------------------------------------------------RESULTS:
1.
The following is a summary of the data observed:
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
SIGNAL DATA
Sample ID#
B-A-1
B-A-2
B-A-3
B-A-4
B-A-5
B-A-6
B-A-7
B-A-8
2.
Avg.
Max.
Min.
12.0
11.4
11.8
11.9
12.1
11.7
12.5
11.9
14.4
13.1
13.8
14.3
13.9
13.7
14.6
14.1
8.5
8.4
8.5
8.1
9.0
8.6
9.1
8.7
See data files 20907001 through 20907008 for individual
data points.
Test Laboratory
TR#209070, REV.1.1
27 of 68
Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 209070
SPECIFICATION: TC0853-2158
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: SEAM/SEAF Conn.
-----------------------------------------------------------SAMPLE SIZE: 8 Samples
TECHNICIAN: AJP
-----------------------------------------------------------START DATE: 2/12/09
COMPLETE DATE: 2/12/09
-----------------------------------------------------------ROOM AMBIENT: 20C
RELATIVE HUMIDITY: 34%
-----------------------------------------------------------EQUIPMENT ID#: 150, 340
-----------------------------------------------------------DURABILITY
PURPOSE:
1.
This is a conditioning sequence which is used to induce the
type of wear on the contacting surfaces which may occur
under normal service conditions. The connectors are mated
and unmated a predetermined number of cycles. Upon
completion, the units being evaluated are exposed to the
environments as specified to assess any impact on
electrical stability resulting from wear or other wear
dependent phenomenon.
2.
This type of conditioning sequence is also used to
mechanically stress the connector system as would normally
occur in actual service. This sequence in conjunction with
other tests is used to determine if a significant loss of
contact pressure occurs from said stresses which in turn,
may result in an unstable electrical condition to exist.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 09.
2.
Test Conditions:
a) No. of Cycles
b) Rate
3.
:
:
100
1.0 inch per minute
The plug side was assembled to special holding devices, the
receptacle side was attached to an X,Y. Speed is
approximate.
-continued on next page.
Test Laboratory
TR#209070, REV.1.1
28 of 68
Contech Research
An Independent Test and Research Laboratory
PROCEDURE: -continued
4.
The test samples were axially aligned to accomplish the
mating and unmating function allowing for self-centering
movement.
5.
Care was taken to prevent the mating faces of the test
samples from contacting each other.
6.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples so tested.
2.
The change in low level circuit resistance shall not
exceed +10.0 milliohms.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
The following is a summary of the data observed:
CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
SIGNAL DATA
Sample ID#
B-A-1
B-A-2
B-A-3
B-A-4
B-A-5
B-A-6
B-A-7
B-A-8
3.
Avg.
Change
Max.
Change
+0.6
-0.7
+0.2
-0.2
-0.1
-0.1
+0.1
-0.1
+1.7
+0.5
+2.5
+0.6
+0.9
+0.4
+1.7
+0.7
See data files 20907001 through 20907008 for individual
data points.
Test Laboratory
TR#209070, REV.1.1
29 of 68
Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 209070
SPECIFICATION: TC0853-2158
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: SEAM/SEAF Conn.
-----------------------------------------------------------SAMPLE SIZE: 8 Samples
TECHNICIAN: DAM
-----------------------------------------------------------START DATE: 2/18/09
COMPLETE DATE: 2/23/09
-----------------------------------------------------------ROOM AMBIENT:
20C
RELATIVE HUMIDITY: 24%
-----------------------------------------------------------EQUIPMENT ID#: 1314, 1315, 1361, 1609
-----------------------------------------------------------THERMAL SHOCK
PURPOSE:
To determine the resistance of a given electrical connector to
exposure at extremes of high and low temperatures and the shock
of alternate exposures to these extremes, simulating the worst
probable conditions of storage, transportation and application.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with EIA
364, Test Procedure 32, with the following conditions.
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
h)
Number of Cycles
Hot Extreme
Cold Extreme
Time at Temperature
Mating Conditions
Mounting Conditions
Transfer Time
:
:
:
:
:
:
:
100 Cycles
+85°C +3C/-0C
-55°C +0C/-3C
30 Minutes
Mated
Mounted
Within 1.0 minute
3.
The total number of cycles was performed continuously.
4.
All subsequent variable testing was performed in accordance
with the procedures as previously indicated.
5.
Prior to performing variable measurements, the test samples
were allowed to recover to room ambient conditions.
-----------------------------------------------------------REQUIREMENTS: See Next Page
Test Laboratory
TR#209070, REV.1.1
30 of 68
Contech Research
An Independent Test and Research Laboratory
REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
The change in low level circuit resistance shall not exceed
+10.0 milliohms.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
The following is a summary of the observed data:
CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
SIGNAL DATA
3.
Sample ID#
Avg.
Change
Max.
Change
B-A-1
B-A-2
B-A-3
B-A-4
B-A-5
B-A-6
B-A-7
B-A-8
+0.1
-1.2
-0.4
-0.3
-0.4
-0.3
-0.6
+0.0
+0.9
-0.2
+0.4
+1.4
+0.6
+0.3
-0.2
+1.0
See data files 20907001 through 20907008 for individual
data points.
Test Laboratory
TR#209070, REV.1.1
31 of 68
Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 209070
SPECIFICATION: TC0853-2158
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: SEAM/SEAF Conn.
-----------------------------------------------------------SAMPLE SIZE: 8 Samples
TECHNICIAN: DAM
-----------------------------------------------------------START DATE: 2/23/09
COMPLETE DATE: 3/06/09
-----------------------------------------------------------ROOM AMBIENT: 20C
RELATIVE HUMIDITY: 22%
-----------------------------------------------------------EQUIPMENT ID#: 27, 1314, 1315, 1361
-----------------------------------------------------------HUMIDITY (THERMAL CYCLING)
PURPOSE:
To evaluate the impact on electrical stability of the contact
system when exposed to any environment which may generate
thermal/moisture type failure mechanisms such as:
a)
Fretting corrosion due to wear resulting from
micromotion, induced by thermal cycling. Humidity
accelerates the oxidation process.
b)
Oxidation of wear debris or from particulates from the
surrounding atmosphere which may have become entrapped
between the contacting surfaces.
c)
Failure mechanisms resulting from a wet oxidation
process.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 31, with the following conditions.
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
h)
Preconditioning (24 hours)
Relative Humidity
Temperature Conditions
Cold Cycle
Polarizing Voltage
Mating Conditions
Mounting Conditions
Duration
:
:
:
:
:
:
:
:
50C ± 5C
90% to 95%
25C to 65C
No
No
Mated
Mounted
240 hours
-continued on next page.
Test Laboratory
TR#209070, REV.1.1
32 of 68
Contech Research
An Independent Test and Research Laboratory
PROCEDURE: -continued
3.
Prior to performing variable measurements, the test samples
were allowed to recover to room ambient conditions.
4.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical deterioration of the
test samples as tested.
2.
The change in low level circuit resistance shall not exceed
+10.0 milliohms.
-----------------------------------------------------------RESULTS:
1.
The test samples as tested showed no evidence of physical
deterioration.
2.
The following is a summary of the data observed:
CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
SIGNAL DATA
3.
Sample ID#
Avg.
Change
Max.
Change
B-A-1
B-A-2
B-A-3
B-A-4
B-A-5
B-A-6
B-A-7
B-A-8
+0.0
-0.7
+0.4
+0.4
-0.2
+0.0
-0.4
+0.0
+1.2
+1.1
+1.5
+1.6
+2.3
+2.4
+1.8
+0.7
See data files 20907001 through 20907008 for individual
data points.
Test Laboratory
TR#209070, REV.1.1
33 of 68
Contech Research
An Independent Test and Research Laboratory
LLCR DATA FILES
FILE NUMBERS
20907001
20907002
20907003
20907004
20907005
20907006
20907007
20907008
Test Laboratory
TR#209070, REV.1.1
34 of 68
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project: 209070
Customer: Samtec
Product:Series SEAF/SEAM connector
Description :B-A-1
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec: EIA 364, TP23
Subgroup: Seq b Gp A
File No: 20907001
Tech: DAM
Current:
100mA
20
39
11Feb09
Initial
20
34
12Feb09
Durability
20
26
23Feb09
T.Shock
22
25
06Mar09
Aft Hum
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
8.6
11.8
14.0
14.4
11.6
12.9
13.4
8.7
13.7
11.4
8.8
13.6
13.1
13.3
11.1
13.8
13.0
11.8
9.9
13.5
10.8
13.0
13.0
11.4
8.5
0.0
0.4
0.2
0.1
0.9
1.0
1.0
0.8
-0.1
0.3
1.4
-0.3
0.6
0.0
0.2
0.7
0.4
0.3
1.1
0.4
1.5
0.5
0.5
1.7
0.9
0.0
-1.0
-0.4
-1.2
-0.1
0.2
0.0
-0.3
-0.3
0.2
0.1
0.0
0.4
0.9
0.7
0.4
0.3
0.5
0.0
0.8
0.8
0.7
0.0
0.6
-0.1
-0.1
-0.6
-0.4
-1.0
-0.2
0.4
0.2
-0.2
0.0
0.3
-0.2
0.2
-0.1
0.6
-0.1
-0.4
0.2
-0.3
-0.1
0.0
-0.1
0.3
1.2
-0.1
-0.4
MAX
MIN
AVG
STD
Open
Tech
14.4
8.5
12.0
1.8
0
AJP
1.7
-0.3
0.6
0.5
0
AJP
0.9
-1.2
0.1
0.5
0
DAM
1.2
-1.0
0.0
0.4
0
DAM
Equip ID
244
1116
244
1116
323
297
323
297
Test Laboratory
TR#209070, REV.1.1
35 of 68
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project: 209070
Customer: Samtec
Product:Series SEAF/SEAM connector
Description :B-A-2
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
20
39
11Feb09
Initial
Spec: EIA 364, TP23
Subgroup: Seq b Gp A
File No: 20907002
Tech: DAM
Current:
100mA
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
8.5
9.8
12.4
12.2
10.3
12.2
12.5
9.6
12.5
10.9
10.2
11.9
12.5
12.0
10.7
11.8
12.1
11.6
11.6
12.9
11.1
13.1
12.2
11.2
8.4
20
34
12Feb09
Dura
100X
-1.0
0.0
-0.2
-0.4
-0.7
-0.2
-0.4
-1.6
0.5
-1.1
-2.3
0.0
-0.9
-0.1
-0.7
-0.1
-0.7
-1.2
-2.9
-1.2
-0.9
-1.3
0.0
-0.2
-0.1
MAX
MIN
AVG
STD
Open
Tech
13.1
8.4
11.4
1.3
0
AJP
0.5
-2.9
-0.7
0.8
0.0
AJP
-0.2
-3.3
-1.2
0.7
0
DAM
1.1
-2.8
-0.7
0.9
0
DAM
Equip ID
244
1116
244
1116
323
297
323
297
Test Laboratory
TR#209070, REV.1.1
36 of 68
20
26
23Feb09
T.Shock
22
25
06Mar09
Hum
-0.9
-0.6
-1.0
-0.9
-0.9
-0.9
-0.2
-2.3
-1.2
-1.0
-2.7
-0.8
-1.5
-0.9
-1.2
-0.6
-1.3
-1.7
-3.3
-1.2
-1.9
-1.8
-0.5
-1.3
-0.6
-0.3
0.5
-0.7
-0.2
0.6
-0.4
-0.5
-1.8
-0.6
0.3
-2.1
0.2
-0.8
-0.5
-1.0
1.1
-0.7
-0.8
-2.8
-0.8
-1.5
-1.7
-0.6
-1.3
-0.7
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project: 209070
Customer: Samtec
Product:Series SEAF/SEAM connector
Description :B-A-3
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec: EIA 364, TP23
Subgroup: Seq b Gp A
File No: 20907003
Tech: DAM
Current:
100mA
20
39
11Feb09
Initial
20
34
12Feb09
Durability
20
26
23Feb09
T.Shock
22
25
06Mar09
Hum
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
8.5
10.8
13.8
13.5
10.7
13.3
13.4
8.5
12.9
10.7
9.3
13.0
12.8
13.8
11.1
13.1
13.0
11.9
9.9
13.3
11.6
13.4
13.0
11.1
8.7
0.2
0.1
-0.5
-0.2
0.2
-0.1
-0.6
0.3
0.4
0.3
1.1
0.3
0.3
0.8
-0.1
0.1
0.3
-0.3
2.5
0.7
-0.1
-0.3
0.2
-0.1
0.1
0.0
0.4
-0.7
-0.4
0.0
-0.5
-0.8
-0.4
-0.3
-0.2
-0.6
-0.2
-0.1
-0.5
-0.5
-0.6
-0.5
-0.7
-0.6
-1.7
-0.7
-0.5
-0.6
-0.4
-0.1
0.4
0.8
0.0
0.5
1.3
-0.1
-0.5
0.5
0.2
0.4
1.5
1.0
0.5
1.3
-0.2
-0.1
0.3
0.0
0.4
0.4
-0.3
0.2
0.3
0.3
0.0
MAX
MIN
AVG
STD
Open
Tech
13.8
8.5
11.8
1.8
0
AJP
2.5
-0.6
0.2
0.6
0
AJP
0.4
-1.7
-0.4
0.4
0
DAM
1.5
-0.5
0.4
0.5
0
DAM
Equip ID
244
1116
244
1116
323
297
323
297
Test Laboratory
TR#209070, REV.1.1
37 of 68
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project: 209070
Customer: Samtec
Product:Series SEAF/SEAM connector
Description :B-A-4
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec: EIA 364, TP23
Subgroup: Seq b Gp A
File No: 20907004
Tech: DAM
Current:
100mA
20
39
11Feb09
Initial
20
34
12Feb09
Durability
20
26
23Feb09
T.Shock
22
25
06Mar09
Hum
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
8.1
10.6
12.8
12.9
10.9
12.9
13.4
8.5
13.5
12.3
8.6
13.4
13.7
13.7
11.5
13.6
13.4
11.8
10.1
14.3
11.0
13.3
13.0
11.3
8.8
0.2
0.1
0.3
0.2
-0.2
0.2
-0.4
0.1
-0.1
-1.0
0.6
-0.4
-0.5
-0.6
-0.3
-0.4
-0.3
-0.5
-0.6
-1.1
-0.2
-0.3
0.0
0.1
0.2
0.3
0.2
0.7
0.8
-0.3
0.4
0.1
0.1
-0.4
-1.5
0.1
-0.8
-0.3
-0.9
-0.6
1.4
-0.7
-0.8
-1.2
-1.5
-0.8
-0.8
-0.3
-0.5
-0.2
0.6
1.6
1.5
1.2
0.5
0.8
0.6
0.4
0.5
-1.0
0.7
0.1
0.0
-0.2
0.3
0.3
0.0
-0.6
-0.1
-0.5
1.0
-0.2
0.8
1.2
0.7
MAX
MIN
AVG
STD
Open
Tech
14.3
8.1
11.9
1.9
0
AJP
0.6
-1.1
-0.2
0.4
0
AJP
1.4
-1.5
-0.3
0.7
0
DAM
1.6
-1.0
0.4
0.7
0
DAM
Equip ID
244
1116
244
1116
323
297
323
297
Test Laboratory
TR#209070, REV.1.1
38 of 68
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project: 209070
Customer: Samtec
Product:Series SEAF/SEAM connector
Description :B-A-5
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec: EIA 364, TP23
Subgroup: Seq b Gp A
File No: 20907005
Tech: DAM
Current:
100mA
20
39
11Feb09
Initial
20
34
12Feb09
Durability
20
26
23Feb09
T.Shock
22
25
06Mar09
Hum
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
9.0
10.7
13.5
13.9
10.7
13.9
13.4
9.8
13.4
10.9
10.0
13.8
13.7
13.8
10.9
13.6
13.9
11.3
10.3
13.7
11.7
12.7
13.1
11.0
9.3
0.0
0.4
-0.1
-0.4
0.1
-0.9
-0.4
-0.7
-0.5
0.4
-0.6
0.1
-0.9
-0.3
0.0
-0.2
-0.7
0.9
0.2
-0.3
-0.3
0.3
0.1
0.2
0.6
-0.7
0.6
-0.8
-0.9
0.4
-1.1
-0.3
-1.0
-0.3
-0.1
-0.5
-0.1
-0.6
-0.4
-0.3
-0.4
-1.0
0.4
-0.6
-0.4
-0.5
-0.1
-0.3
0.2
-0.2
-0.3
0.7
-0.2
-0.5
-0.1
-0.9
-0.8
-1.0
-0.5
-0.6
-0.9
2.3
-0.7
-0.5
-0.2
-0.9
-0.9
0.4
-0.7
-0.1
-0.3
0.4
0.3
0.2
-0.4
MAX
MIN
AVG
STD
Open
Tech
13.9
9.0
12.1
1.7
0
AJP
0.9
-0.9
-0.1
0.5
0
AJP
0.6
-1.1
-0.4
0.4
0
DAM
2.3
-1.0
-0.2
0.7
0
DAM
Equip ID
244
1116
244
1116
323
297
323
297
Test Laboratory
TR#209070, REV.1.1
39 of 68
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project: 209070
Customer: Samtec
Product:Series SEAF/SEAM connector
Description :B-A-6
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec: EIA 364, TP23
Subgroup: Seq b Gp A
File No: 20907006
Tech: DAM
Current:
100mA
20
39
11Feb09
Initial
20
34
12Feb09
Durability
20
26
23Feb09
T.Shock
22
25
06Mar09
Hum
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
8.7
11.4
13.5
13.6
11.0
13.7
13.1
9.1
13.3
10.7
8.7
12.6
12.6
13.0
10.7
13.2
13.2
11.7
9.8
13.4
10.9
13.0
13.1
10.9
8.6
0.0
-0.5
0.1
-0.4
-0.5
-0.4
-0.1
-0.6
-0.1
-0.4
0.3
0.1
0.4
-0.2
-0.2
-0.1
0.0
-0.4
0.0
-0.2
-0.3
-0.2
0.0
0.2
-0.1
-0.3
-0.6
-0.5
-0.7
-0.6
-0.5
-0.1
-0.9
-0.4
-0.3
-0.7
-0.2
-0.1
-0.3
-0.5
-0.1
-0.2
0.0
-0.4
0.3
-0.2
-0.6
0.1
0.0
-0.3
0.4
2.4
-0.1
-0.6
-0.1
0.2
0.2
-1.2
-0.1
0.1
-0.5
0.3
0.6
0.0
-0.3
0.2
0.8
0.1
-0.6
1.1
-0.5
-0.2
0.0
-0.4
-0.6
MAX
MIN
AVG
STD
Open
Tech
13.7
8.6
11.7
1.7
0
AJP
0.4
-0.6
-0.1
0.3
0
AJP
0.3
-0.9
-0.3
0.3
0
DAM
2.4
-1.2
0.0
0.7
0
DAM
Equip ID
244
1116
244
1116
323
297
323
297
Test Laboratory
TR#209070, REV.1.1
40 of 68
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project: 209070
Customer: Samtec
Product:Series SEAF/SEAM connector
Description :B-A-7
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec: EIA 364, TP23
Subgroup: Seq b Gp A
File No: 20907007
Tech: DAM
Current:
100mA
20
39
11Feb09
Initial
20
34
12Feb09
Durability
20
26
23Feb09
T.Shock
22
25
06Mar09
Hum
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
9.3
12.0
13.8
14.6
12.1
14.5
14.3
9.1
14.3
11.6
9.3
13.7
13.9
13.9
12.0
14.6
13.4
12.1
10.5
13.9
11.8
13.6
13.4
11.4
9.2
0.0
0.1
1.7
-0.4
0.8
-1.0
1.3
0.3
0.7
0.2
0.8
-0.3
-0.5
-0.3
-0.4
-0.1
0.2
-0.2
-0.3
0.2
0.5
0.1
-0.1
0.0
-0.1
-0.7
-0.9
-0.4
-1.3
-1.3
-0.5
-0.3
-0.9
-0.3
-0.8
-0.3
-0.4
-0.6
-0.8
-0.9
-1.1
-0.2
-0.3
-0.5
-0.5
-0.9
-0.4
-0.2
-0.3
-0.4
-0.6
-0.1
1.4
-0.1
-0.6
-0.5
-1.0
-1.1
-1.0
-1.4
-0.7
-0.6
-0.4
-0.9
-1.5
-1.3
0.1
-0.4
-0.9
1.1
1.8
-0.3
-0.1
0.3
-0.4
MAX
MIN
AVG
STD
Open
Tech
14.6
9.1
12.5
1.9
0
AJP
1.7
-1.0
0.1
0.6
0
AJP
-0.2
-1.3
-0.6
0.3
0
DAM
1.8
-1.5
-0.4
0.8
0
DAM
Equip ID
244
1116
244
1116
323
297
323
297
Test Laboratory
TR#209070, REV.1.1
41 of 68
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project: 209070
Customer: Samtec
Product:Series SEAF/SEAM connector
Description :B-A-8
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec: EIA 364, TP23
Subgroup: Seq b Gp A
File No: 20907008
Tech: DAM
Current:
100mA
20
39
11Feb09
Initial
20
34
12Feb09
Durability
20
26
23Feb09
T.Shock
22
25
06Mar09
Hum
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
9.2
11.0
14.0
13.6
11.4
13.0
14.1
8.9
13.4
11.3
9.3
13.0
12.8
12.8
11.1
14.0
12.9
11.3
9.5
14.0
10.6
13.1
13.1
11.1
8.7
-0.3
-0.2
-0.1
0.7
-0.3
0.4
-0.3
0.3
-0.1
-0.6
-0.5
-0.4
-0.2
-0.3
-0.4
-0.6
0.0
-0.1
-0.2
-0.3
0.1
0.0
0.0
-0.3
-0.1
0.0
0.6
0.1
1.0
-0.1
0.4
0.4
0.0
0.2
-0.4
-0.2
0.8
0.2
0.1
-0.5
-1.1
-0.2
0.3
0.0
-0.6
-0.3
-0.3
-0.3
-0.1
0.1
-0.1
0.1
0.1
0.7
-0.2
0.4
0.5
0.3
0.0
-0.5
-0.7
0.0
0.5
0.0
-0.4
0.5
0.0
0.4
0.0
-0.8
-0.2
-0.6
-0.3
-0.1
-0.4
MAX
MIN
AVG
STD
Open
Tech
14.1
8.7
11.9
1.8
0
AJP
0.7
-0.6
-0.1
0.3
0
AJP
1.0
-1.1
0.0
0.4
0
DAM
0.7
-0.8
0.0
0.4
0
DAM
Equip ID
244
1116
244
1116
323
297
323
297
Test Laboratory
TR#209070, REV.1.1
42 of 68
Contech Research
An Independent Test and Research Laboratory
TEST RESULTS
SEQUENCE C
GROUP A
Test Laboratory
TR#209070, REV.1.1
43 of 68
Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 209070
SPECIFICATION: TC0853-2158
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: SEAM/SEAF Conn.
-----------------------------------------------------------SAMPLE SIZE: 8 Samples
TECHNICIAN: DAM, AJP
-----------------------------------------------------------START DATE: 2/13/09
COMPLETE DATE: 2/13/09
-----------------------------------------------------------ROOM AMBIENT: 20C
RELATIVE HUMIDITY: 28%
-----------------------------------------------------------EQUIPMENT ID#: 244, 297, 323, 1116
-----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR)
PURPOSE:
1.
To evaluate contact resistance characteristics of the
contact systems under conditions were applied voltages and
currents do not alter the physical contact interface and
will detect oxides and films which degrade electrical
stability. It is also sensitive to and may detect the
presence of fretting corrosion induced by mechanical or
thermal environments as well as any significant loss of
contact pressure.
2.
This attribute was monitored after each preconditioning
and/or test exposure in order to determine said stability
of the contact systems as they progress through the
applicable test sequences.
3.
The electrical stability of the system is determined by
comparing the initial resistance value to that observed
after a given test exposure. The difference is the change
in resistance occurring whose magnitude establishes the
stability of the interface being evaluated.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 23 with the following conditions.
2.
Test Conditions:
a) Test Current
: 10 milliamps maximum
b) Open Circuit Voltage
: 20 minutes
c) No. of Positions Tested : 25 per test sample
-continued on next page.
Test Laboratory
TR#209070, REV.1.1
44 of 68
Contech Research
An Independent Test and Research Laboratory
PROCEDURE: -continued
3.
The points of application are shown in Figure #3.
-----------------------------------------------------------REQUIREMENTS:
Low level circuit resistance shall be measured and recorded.
-----------------------------------------------------------RESULTS:
1.
The following is a summary of the data observed:
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
SIGNAL DATA
2.
Sample ID#
Avg.
Max.
Min.
C-A-1
C-A-2
C-A-3
C-A-4
C-A-5
C-A-6
C-A-7
C-A-8
12.6
12.2
11.6
12.0
12.0
12.1
12.1
11.9
14.8
14.4
13.6
13.6
14.0
14.0
13.9
15.0
8.7
9.0
8.2
8.7
8.3
8.4
8.7
8.4
See data files 20907009 through 20907016 for individual
data points.
Test Laboratory
TR#209070, REV.1.1
45 of 68
Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 209070
SPECIFICATION: TC0853-2158
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: SEAM/SEAF Conn.
-----------------------------------------------------------SAMPLE SIZE: 8 Samples
TECHNICIAN: DAM
-----------------------------------------------------------START DATE: 2/17/09
COMPLETE DATE: 2/18/09
-----------------------------------------------------------ROOM AMBIENT: 20C
RELATIVE HUMIDITY: 24%
-----------------------------------------------------------EQUIPMENT ID#: 282, 545, 553, 684, 874, 1366, 1367, 1368, 1474
-----------------------------------------------------------MECHANICAL SHOCK (SPECIFIED PULSE)
PURPOSE:
To determine the mechanical and electrical integrity
of connectors for use with electronic equipment subjected to
shocks such as those expected from handling, transportation,
etc.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance EIA 364, Test
Procedure 27.
2.
Test Conditions:
a)
b)
c)
d)
e)
Peak Value
Duration
Wave Form
Velocity
No. of Shocks
:
:
:
:
:
100 G
6 milliseconds
Half-Sine
12.3 feet per second
3 Shocks/Direction, 3 Axes (18 Total)
3.
A stabilizing medium was used such that the mated test
samples did not separate during the test.
4.
Figure #3 illustrates the test sample fixturing utilized
during the test.
5.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS: See Next Page
Test Laboratory
TR#209070, REV.1.1
46 of 68
Contech Research
An Independent Test and Research Laboratory
REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
The change in low level circuit resistance shall not exceed
+10.0 milliohms.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
The following is a summary of the data observed:
CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
SIGNAL DATA
Sample ID#
C-A-1
C-A-2
C-A-3
C-A-4
C-A-5
C-A-6
C-A-7
C-A-8
Avg.
Change
-0.3
-0.4
+0.2
+0.4
+0.5
+0.2
-0.1
+0.6
Max.
Change
+0.5
+0.2
+1.0
+1.2
+1.4
+1.8
+0.5
+2.2
3.
See data files 20907009 through 20907016 for individual
data points.
4.
The Mechanical Shock characteristics are shown in Figures
#4 (Calibration Pulse) and #5 (Test Pulse). Each figure
displays the shock pulse contained within the upper and
lower limits as defined by the appropriate test
specification.
Test Laboratory
TR#209070, REV.1.1
47 of 68
Contech Research
An Independent Test and Research Laboratory
FIGURE #3
TYPICAL FIXTURING –
MECHANICAL SHOCK/RANDOM VIBRATION
Test Laboratory
TR#209070, REV.1.1
48 of 68
Contech Research
An Independent Test and Research Laboratory
FIGURE #4
Channel 5
Classical Shock
[g]
200
UPPER LIMIT------
Project: 209070
100G’s 6ms
Halfsine
Tech:DAM
Date: 18Feb09
Cal 1
ACCELERATION (g)
150
ACTUAL PULSE-----
100
50
0
-50
-100
LOWER LIMIT-----150
0.96
0.97
0.98
0.99
1.00
1.01
1.02
DURATION (Seconds)
1.04
[s]
Contech Research
Test Laboratory
TR#209070, REV.1.1
1.03
49 of 68
An Independent Test and Research Laboratory
FIGURE #5
Channel 5
Classical Shock
[g]
200
UPPER LIMIT------
Project: 209070
100G’s 6ms
Halfsine
Tech:DAM
Date: 18Feb09
Actual
ACCELERATION (g)
150
100
ACTUAL PULSE-----
50
0
-50
-100
LOWER LIMIT-----150
0.96
0.97
0.98
0.99
1.00
1.01
1.02
DURATION (Seconds)
1.04
[s]
Contech Research
Test Laboratory
TR#209070, REV.1.1
1.03
50 of 68
An Independent Test and Research Laboratory
PROJECT NO.: 209070
SPECIFICATION: TC0853-2158
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: SEAM/SEAF Conn.
-----------------------------------------------------------SAMPLE SIZE: 8 Samples
TECHNICIAN: DAM
-----------------------------------------------------------START DATE: 2/19/09
COMPLETE DATE: 2/19/09
-----------------------------------------------------------ROOM AMBIENT: 20C
RELATIVE HUMIDITY: 30%
-----------------------------------------------------------EQUIPMENT ID#: 282, 545, 553, 684, 874, 1366, 1367, 1368, 1474
-----------------------------------------------------------VIBRATION, RANDOM
PURPOSE:
1.
To establish the mechanical integrity of the test samples
exposed to external mechanical stresses.
2.
To determine if the contact system is susceptible to
fretting corrosion.
3.
To determine if the electrical stability of the system has
degraded when exposed to a vibratory environment.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 28.
2.
Test Conditions:
a)
b)
c)
D)
Power Spectral Density : 0.04 G2/Hz
G ’RMS’
: 7.56
Frequency
: 50 to 2000 Hz
Duration
: 2.0 hour per axis (3 axes total)
3.
A stabilizing medium was used such that the mated test
samples did not separate during the test.
4.
Figure #3 illustrates the test sample fixturing utilized
during the test.
-continued on next page.
Test Laboratory
TR#209070, REV.1.1
51 of 6868
Contech Research
An Independent Test and Research Laboratory
PROCEDURE: -continued
5.
All subsequent variable testing was performed in accordance
with procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
The change in low level circuit resistance shall not exceed
+10.0 milliohms.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
The following is a summary of the observed data:
CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
SIGNAL DATA
Sample ID#
C-A-1
C-A-2
C-A-3
C-A-4
C-A-5
C-A-6
C-A-7
C-A-8
3.
Avg.
Change
Max.
Change
-0.2
-0.2
+0.2
+0.2
+0.3
+0.2
-0.2
+0.2
+0.6
+0.5
+1.4
+1.7
+1.1
+1.3
+0.6
+3.2
See data files 20907009 through 20907016 for individual
data points.
Test Laboratory
TR#209070, REV.1.1
52 of 68
Contech Research
An Independent Test and Research Laboratory
LLCR DATA FILES
FILE NUMBERS
20907009
20907010
20907011
20907012
20907013
20907014
20907015
20907016
Test Laboratory
TR#209070, REV.1.1
53 of 68
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project: 209070
Customer: Samtec
Product:Series SEAF/SEAM connector
Description :C-A-1
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec: EIA 364, TP23
Subgroup: Seq c Gp A
File No: 20907009
Tech: DAM
Current:
100mA
20
28
13Feb09
Initial
20
24
18Feb09
M-Shock
20
28
20Feb09
R.Vib
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
9.5
11.3
14.6
13.6
11.2
13.9
14.4
8.7
14.2
11.4
9.6
13.7
13.4
14.2
12.5
14.8
13.8
12.5
10.9
14.6
12.4
14.3
14.4
11.8
8.9
-0.8
-0.3
-0.9
-0.5
0.4
0.4
-0.4
0.0
-0.5
-0.7
-0.7
0.5
0.4
0.2
-0.8
-1.7
0.1
-0.7
-0.7
0.0
-0.3
-0.7
-0.5
0.0
0.0
-0.3
0.1
-0.6
0.1
-0.1
0.1
0.0
0.6
0.1
0.0
0.2
0.4
0.4
-0.3
-1.0
-0.9
0.2
-0.6
-0.9
-0.3
-0.9
-0.8
-0.2
-0.5
0.0
MAX
MIN
AVG
STD
Open
Tech
14.8
8.7
12.6
1.9
0
DAM
0.5
-1.7
-0.3
0.5
0
BE
0.6
-1.0
-0.2
0.4
0
DAM
Equip ID
323
297
601
677
323
297
Test Laboratory
TR#209070, REV.1.1
54 of 68
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project: 209070
Customer: Samtec
Product:Series SEAF/SEAM connector
Description :C-A-2
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec: EIA 364, TP23
Subgroup: Seq c Gp A
File No: 20907010
Tech: DAM
Current:
100mA
20
28
13Feb09
Initial
20
24
18Feb09
M.Shock
20
28
20Feb09
R.Vib
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
9.0
11.4
14.1
14.4
11.7
13.3
13.2
9.7
13.7
11.9
9.5
13.5
13.0
13.0
12.4
13.3
13.2
12.7
10.3
14.0
11.8
12.9
13.1
11.0
9.2
-0.3
-0.5
-0.5
-0.1
-0.7
-0.2
-0.2
-1.0
-0.2
-0.7
-0.4
-0.5
-0.2
0.0
-1.5
-0.3
-0.4
-0.8
0.2
-0.5
-1.0
-0.1
0.2
0.2
-0.3
-0.3
0.0
-0.9
-0.8
-0.3
0.5
0.1
-0.9
0.1
0.1
-0.2
0.2
-0.3
-0.2
-1.3
-0.1
-0.5
-0.5
-0.3
-0.2
0.0
0.2
0.2
-0.2
-0.2
MAX
MIN
AVG
STD
Open
Tech
14.4
9.0
12.2
1.6
0
DAM
323
297
0.2
-1.5
-0.4
0.4
0
DAM
323
297
0.5
-1.3
-0.2
0.4
0
DAM
323
297
Equip ID
Test Laboratory
TR#209070, REV.1.1
55 of 68
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project: 209070
Customer: Samtec
Product:Series SEAF/SEAM connector
Description :C-A-3
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec: EIA 364, TP23
Subgroup: Seq c Gp A
File No: 20907011
Tech: DAM
Current:
100mA
20
28
13Feb09
Initial
20
24
18Feb09
M.Shock
20
28
20Feb09
R.Vib
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
8.3
10.9
13.2
13.6
10.6
12.7
13.2
8.4
12.3
11.2
8.5
12.9
13.2
13.1
11.1
13.5
12.7
11.3
9.7
13.5
10.8
12.7
12.7
10.7
8.2
0.2
-0.1
0.5
-0.1
0.2
0.2
1.0
0.3
0.5
-0.1
0.2
0.1
-0.3
0.1
0.1
0.0
0.1
0.3
-0.1
0.1
0.1
0.2
0.4
0.4
0.5
0.4
0.1
0.1
-0.9
0.6
-0.1
0.5
0.4
1.3
0.3
0.0
-0.1
-0.3
-0.3
0.0
-0.6
-0.3
0.4
0.1
-0.5
0.4
0.2
0.8
1.4
0.3
MAX
MIN
AVG
STD
Open
Tech
13.6
8.2
11.6
1.8
0
DAM
1.0
-0.3
0.2
0.3
0
DAM
1.4
-0.9
0.2
0.5
0
DAM
Equip ID
323
297
323
297
323
297
Test Laboratory
TR#209070, REV.1.1
56 of 68
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project: 209070
Customer: Samtec
Product:Series SEAF/SEAM connector
Description :C-A-4
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec: EIA 364, TP23
Subgroup: Seq c Gp A
File No: 20907012
Tech: DAM
Current:
100mA
20
28
13Feb09
Initial
20
24
18Feb09
M-Shock
20
28
20Feb09
R Vib
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
8.7
11.4
13.6
13.6
9.8
13.2
13.1
9.8
13.4
11.4
9.8
13.1
12.9
13.4
11.6
13.5
13.2
12.6
10.5
13.5
11.6
12.8
13.4
11.1
9.1
0.6
0.0
0.8
0.0
1.2
0.8
0.6
-0.4
0.3
0.2
-0.5
0.1
0.5
0.3
0.5
1.2
0.5
-0.3
0.2
0.9
-0.1
0.3
0.7
0.3
0.3
0.4
0.1
0.5
-0.1
1.7
0.0
0.0
0.0
0.1
0.2
-0.3
0.4
0.7
0.4
0.0
0.2
0.1
-0.2
0.6
0.1
0.0
0.2
-0.5
-0.1
0.3
MAX
MIN
AVG
STD
Open
Tech
13.6
8.7
12.0
1.6
0
DAM
1.2
-0.5
0.4
0.4
0
BE
1.7
-0.5
0.2
0.4
0
DAM
Equip ID
323
297
601
677
323
297
Test Laboratory
TR#209070, REV.1.1
57 of 68
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project: 209070
Customer: Samtec
Product:Series SEAF/SEAM connector
Description :C-A-5
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec: EIA 364, TP23
Subgroup: Seq c Gp A
File No: 20907013
Tech: DAM
Current:
100mA
20
28
13Feb09
Initial
20
24
18Feb09
M-Shock
20
28
20Feb09
R Vib
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
9.1
11.4
13.5
13.8
11.1
13.1
13.3
8.9
13.6
11.2
8.3
13.4
13.2
13.3
11.4
13.8
12.8
12.1
10.6
14.0
11.4
13.2
13.5
11.2
9.1
0.1
-0.1
0.6
-0.4
0.1
0.6
0.3
-0.4
-0.1
0.9
1.2
0.4
0.5
0.5
0.2
0.9
1.0
0.2
0.6
1.3
0.6
0.6
0.2
1.4
1.1
0.0
-0.1
0.6
0.5
0.5
1.1
0.1
0.4
0.4
1.1
0.8
0.7
0.7
0.1
0.5
0.0
0.9
-0.5
0.0
0.4
0.0
-0.1
-0.7
-0.1
0.1
MAX
MIN
AVG
STD
Open
Tech
14.0
8.3
12.0
1.7
0
DAM
1.4
-0.4
0.5
0.5
0
BE
1.1
-0.7
0.3
0.5
0
DAM
Equip ID
323
297
601
677
323
297
Test Laboratory
TR#209070, REV.1.1
58 of 68
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project: 209070
Customer: Samtec
Product:Series SEAF/SEAM connector
Description :C-A-6
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec: EIA 364, TP23
Subgroup: Seq c Gp A
File No: 20907014
Tech: DAM
Current:
100mA
20
28
13Feb09
Initial
20
24
18Feb09
M.Shock
20
28
20Feb09
R Vib
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
8.4
11.1
13.3
13.4
11.4
12.8
13.5
9.0
13.7
11.6
9.3
13.8
13.6
13.6
11.1
13.7
14.0
12.0
10.9
13.6
11.2
13.3
13.1
11.3
9.3
0.5
0.3
0.4
0.6
-0.1
0.7
-0.4
-0.3
0.3
-0.6
-0.8
0.3
0.5
0.5
-0.2
1.8
-0.4
-0.1
-0.3
1.2
0.2
-0.3
-0.1
-0.3
0.3
0.7
0.2
0.0
0.2
0.2
0.5
0.6
0.0
0.3
-0.1
0.0
0.3
0.0
0.4
-0.1
0.9
0.3
0.1
0.0
1.3
0.0
-0.4
0.4
-0.5
-0.1
MAX
MIN
AVG
STD
Open
Tech
14.0
8.4
12.1
1.7
0
DAM
1.8
-0.8
0.2
0.6
0
DAM
1.3
-0.5
0.2
0.4
0
DAM
Equip ID
323
297
323
297
323
297
Test Laboratory
TR#209070, REV.1.1
59 of 68
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project: 209070
Customer: Samtec
Product:Series SEAF/SEAM connector
Description :C-A-7
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec: EIA 364, TP23
Subgroup: Seq c Gp A
File No: 20907015
Tech: DAM
Current:
100mA
20
28
13Feb09
Initial
20
24
18Feb09
M.Shock
20
28
20Feb09
R Vib
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
8.7
11.4
13.6
13.9
11.2
13.2
13.4
9.0
13.3
11.5
8.9
13.4
13.5
13.4
11.2
13.8
13.2
12.0
10.5
13.5
11.5
13.3
13.2
12.0
9.2
0.1
-0.4
0.0
-0.2
-0.4
-0.1
0.0
0.5
-0.3
-0.8
0.0
-0.3
-0.4
-0.2
-0.2
-0.8
-0.2
0.2
-0.5
0.3
-0.2
0.0
0.2
-0.1
0.4
0.6
-0.6
-0.4
-0.1
-0.5
-0.2
-0.1
-0.4
-0.2
-0.4
-0.1
0.0
-0.3
-0.1
-0.4
0.0
0.2
-0.1
-0.3
0.5
-0.7
-0.3
0.3
-0.4
-0.1
MAX
MIN
AVG
STD
Open
Tech
13.9
8.7
12.1
1.7
0
DAM
0.5
-0.8
-0.1
0.3
0
DAM
0.6
-0.7
-0.2
0.3
0
DAM
Equip ID
323
297
323
297
323
297
Test Laboratory
TR#209070, REV.1.1
60 of 68
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project: 209070
Customer: Samtec
Product:Series SEAF/SEAM connector
Description :C-A-8
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec: EIA 364, TP23
Subgroup: Seq c Gp A
File No: 20907016
Tech: DAM
Current:
100mA
20
28
13Feb09
Initial
20
24
18Feb09
M-Shock
20
28
20Feb09
R.Vib
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
8.4
11.3
12.6
13.8
10.6
13.3
13.0
8.7
13.0
10.5
8.9
13.2
13.2
13.4
10.9
13.3
13.5
11.9
10.5
15.0
10.5
13.9
13.4
11.3
9.3
0.3
-0.3
0.5
0.7
0.7
1.1
1.8
0.3
1.7
0.4
-0.1
0.8
0.9
0.1
0.4
0.7
2.2
0.0
-0.3
-0.3
1.0
0.4
0.3
1.8
0.1
-0.1
-0.7
0.2
-0.1
-0.1
0.1
0.6
-0.2
0.8
0.3
-0.5
1.9
0.9
0.6
0.1
3.2
-0.3
-0.1
-0.1
-1.0
1.0
-0.5
-0.6
-0.2
0.0
MAX
MIN
AVG
STD
Open
Tech
15.0
8.4
11.9
1.8
0
DAM
2.2
-0.3
0.6
0.7
0
BE
3.2
-1.0
0.2
0.9
0
DAM
Equip ID
323
297
601
677
323
297
Test Laboratory
TR#209070, REV.1.1
61 of 68
Contech Research
An Independent Test and Research Laboratory
TEST RESULTS
SEQUENCE D
GROUP A
Test Laboratory
TR#209070, REV.1.1
62 of 68
Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 209070
SPECIFICATION: TC0853-2158
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: SEAM/SEAF Conn.
-----------------------------------------------------------SAMPLE SIZE: 3 Samples
TECHNICIAN: DAM
-----------------------------------------------------------START DATE: 2/17/09
COMPLETE DATE: 2/18/09
-----------------------------------------------------------ROOM AMBIENT: 20C
RELATIVE HUMIDITY: 21%
-----------------------------------------------------------EQUIPMENT ID#: 282,545, 553, 684, 874, 1147, 1366, 1367, 1368,
1474, 5045R
-----------------------------------------------------------MECHANICAL SHOCK (SPECIFIED PULSE)
PURPOSE:
To determine the mechanical and electrical integrity
of connectors for use with electronic equipment subjected to
shocks such as those expected from handling, transportation,
etc.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 27, Test Condition C.
2.
Test Conditions:
a)
b)
c)
d)
e)
Peak Value
Duration
Wave Form
Velocity
No. of Shocks
:
:
:
:
:
100 G
6 milliseconds
Half-Sine
12.3 feet per second
3 Shocks/Direction, 3 Axes (18 Total)
3.
Figure #3 illustrates the test sample fixturing utilized
during the test.
4.
The samples were characterized to assure that the low
nanosecond event being monitored will trigger the detector.
5.
After characterization, it was determined the samples could
be monitored for a 50 nanosecond event.
-continued on next page.
Test Laboratory
TR#209070, REV.1.1
63 of 68
Contech Research
An Independent Test and Research Laboratory
PROCEDURE: -continued
6.
The low nanosecond monitoring was performed in accordance
with EIA 364, Test Procedure 87.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of axial movement of the test
samples relative to each other.
2.
There shall be no low nanosecond event detected greater
than 50 nanoseconds.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
There was no low nanosecond event detected greater than 50
nanoseconds.
3.
The Mechanical Shock characteristics are shown in Figures
#6 (Calibration Pulse) and #7 (Test Pulse). Each figure
displays the shock pulse contained within the upper and
lower limits as defined by the appropriate test
specification.
Test Laboratory
TR#209070, REV.1.1
64 of 68
Contech Research
An Independent Test and Research Laboratory
FIGURE #6
Channel 5
Classical Shock
[g]
200
UPPER LIMIT------
Project: 209070
100G’s 6ms
Halfsine
Tech:DAM
Date: 18Feb09
Cal 1
ACCELERATION (g)
150
ACTUAL PULSE-----
100
50
0
-50
-100
LOWER LIMIT-----150
0.96
0.97
0.98
0.99
1.00
1.01
1.02
DURATION (Seconds)
1.04
[s]
Contech Research
Test Laboratory
TR#209070, REV.1.1
1.03
65 of 68
An Independent Test and Research Laboratory
FIGURE #7
Channel 5
Classical Shock
[g]
200
UPPER LIMIT------
Project: 209070
100G’s 6ms
Halfsine
Tech:DAM
Date: 18Feb09
Actual
ACCELERATION (g)
150
100
ACTUAL PULSE-----
50
0
-50
-100
LOWER LIMIT-----150
0.96
0.97
0.98
0.99
1.00
1.01
1.02
DURATION (Seconds)
Test Laboratory
TR#209070, REV.1.1
66 of 68
1.03
1.04
[s]
Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 209070
SPECIFICATION: TC0853-2158
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: SEAM/SEAF Conn.
-----------------------------------------------------------SAMPLE SIZE: 3 Samples
TECHNICIAN: DAM
-----------------------------------------------------------START DATE: 2/19/09
COMPLETE DATE: 2/20/09
-----------------------------------------------------------ROOM AMBIENT:
20C
RELATIVE HUMIDITY: 30%
-----------------------------------------------------------EQUIPMENT ID#: 282,545, 553, 684, 874, 1147, 1366, 1367, 1368,
1474, 5045R
-----------------------------------------------------------VIBRATION, RANDOM
PURPOSE:
1.
To determine if electrical discontinuities at the level
specified exist.
2.
To determine if the contact system is susceptible to
fretting corrosion.
3.
To determine if the electrical stability of the system has
degraded when exposed to a vibratory environment.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 28, Test Condition V, Test Letter B.
2.
Test Conditions:
a)
b)
c)
d)
Power Spectral Density : 0.04 G2/Hz
G ’RMS’
: 7.56
Frequency
: 50 to 2000 Hz
Duration
: 2.0 hours per axis
(3 axes total)
3.
Figure #4 illustrates the test sample fixturing utilized
during the test.
4.
Prior to testing, the connectors were characterized to
assure that the desired event being monitored were capable
of being detected.
-continued on next page.
Test Laboratory
TR#209070, REV.1.1
67 of 68
Contech Research
An Independent Test and Research Laboratory
PROCEDURE: -continued
5.
After characterization, it was determined the samples could
be monitored for a 50 nanosecond event.
6.
The low nanosecond event detection was performed in
accordance with EIA 364, Test Procedure 87.
7.
Due to the design of the PCB only the signal contacts were
monitored for the 50 nanosecond detection.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
There shall be no events detected greater than
50 nanoseconds.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
There was no evidence of low nanosecond events in excess of
50 nanoseconds.
Test Laboratory
TR#209070, REV.1.1
68 of 68
Contech Research
An Independent Test and Research Laboratory