A43L4616A - AMIC Technology

A43L4616A
4M X 16 Bit X 4 Banks Synchronous DRAM
Preliminary
Document Title
4M X 16 Bit X 4 Banks Synchronous DRAM
Revision History
History
Issue Date
Remark
0.0
Initial issue
April 18, 2008
Preliminary
0.1
Add Test Mode description
August 13, 2008
0.2
Error Correction:
September 14, 2009
0.3
Remove the x8 configuration
February 22, 2010
0.4
Modify DC, AC spec. and add full page mode
May 11, 2010
Rev. No.
Change Clock Frequency from 133MHz to 100MHz at CL=2
PRELIMINARY
(May, 2010, Version 0.4)
AMIC Technology, Corp.
A43L4616A
4M X 16 Bit X 4 Banks Synchronous DRAM
Preliminary
Features
„
„
„
„
„
„
„
„
„
„
„
„
„
JEDEC standard 3.3V power supply
LVTTL compatible with multiplexed address
Four banks / Pulse RAS
MRS cycle with address key programs
- CAS Latency (2,3)
- Burst Length (1,2,4,8, FP)
- Burst Type (Sequential & Interleave)
„ All inputs are sampled at the positive going edge of the
system clock
„ Clock Frequency: 166MHz @ CL=3, 100Mhz @ CL=2
143MHz @ CL=3, 100Mhz @ CL=2
133MHz @ CL=3, 100Mhz @ CL=2
Industrial temperature operation: -40°C to +85°C for -U
Automotive temperature operation : -40°C to +85°C for -A
Burst Read Single-bit Write operation
DQM for masking
Auto & self refresh
64ms refresh period (8K cycle)
54 Pin TSOP (II)
Lead-free product available
All Pb-free (lead-free) product are RoHS compliant
General Description
The A43L4616A is 268,435,456 bits synchronous high data
rate Dynamic RAM organized as 4 X 4,194,304 words by
16 bits, fabricated with AMIC’s high performance CMOS
technology. Synchronous design allows precise cycle
control with the use of system clock. I/O transactions are
PRELIMINARY
(May, 2010, Version 0.4)
possible on every clock cycle. Range of operating
frequencies, programmable latencies allows the same
device to be useful for a variety of high bandwidth, high
performance memory system applications.
1
AMIC Technology, Corp.
A43L4616A
Pin Configuration
„ TSOP (II)
1
54
VSS
DQ0
2
53
DQ15
VDDQ
3
52
VSSQ
DQ1
4
51
DQ14
DQ2
5
50
DQ13
VSSQ
6
49
VDDQ
DQ3
7
48
DQ12
DQ4
8
47
DQ11
VDDQ
9
46
VSSQ
DQ5
10
45
DQ10
DQ6
11
44
DQ9
VSSQ
12
43
VDDQ
DQ7
13
42
DQ8
VDD
14
41
VSS
LDQM
15
40
NC
WE
16
39
UDQM
CAS
17
38
CK
RAS
18
37
CKE
CS
19
36
A12
BS0
20
35
A11
BS1
21
34
A9
A10/AP
22
33
A8
A0
23
32
A7
A1
24
31
A6
A2
25
30
A5
A3
26
29
A4
VDD
27
28
VSS
(May, 2010, Version 0.4)
A43L4616AV
PRELIMINARY
VDD
2
AMIC Technology, Corp.
A43L4616A
Block Diagram
LWE
I/O Control
Data Input Register
Bank Select
4M X 16
Output Buffer
Sense AMP
4M X 16
4M X 16
DQi
4M X 16
Column Decoder
Column Buffer
LCBR
LRAS
Address Register
ADD
Row Decoder
Row Buffer
Refresh Counter
CLK
DQM
Latency & Burst Length
LRAS
Programming Register
LCAS
LRAS
LCBR
DQM
LWE
LWCBR
Timing Register
CLK
CKE
CS
RAS
CAS
WE
DQM
Notes: This figure shows the A43L4616A.
PRELIMINARY
(May, 2010, Version 0.4)
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AMIC Technology, Corp.
A43L4616A
Pin Descriptions
Symbol
Name
Description
CLK
System Clock
Active on the positive going edge to sample all inputs.
CS
Chip Select
Disables or Enables device operation by masking or enabling all inputs except CLK,
CKE and L(U)DQM
Masks system clock to freeze operation from the next clock cycle.
CKE
Clock Enable
CKE should be enabled at least one clock + tss prior to new command.
Disable input buffers for power down in standby.
Row / Column addresses are multiplexed on the same pins.
A0~A12
Address
Row address : RA0~RA12, Column address: CA0~CA8.
Selects bank to be activated during row address latch time.
BS0, BS1
Bank Select Address
Selects band for read/write during column address latch time.
RAS
Row Address Strobe
Latches row addresses on the positive going edge of the CLK with RAS low.
Enables row access & precharge.
CAS
WE
Column Address
Strobe
Write Enable
Latches column addresses on the positive going edge of the CLK with CAS low.
Enables column access.
Enables write operation and Row precharge.
Makes data output Hi-Z, tSHZ after the clock and masks the output.
L(U)DQM
Data Input/Output
Mask
Blocks data input when L(U)DQM active.
LDQM corresponds to DQ0 ~ DQ7, UDQM corresponds to DQ8 ~ DQ15
DQ0-15
Data Input/Output
Data inputs/outputs are multiplexed on the same pins.
VDD/VSS
Power Supply/Ground
Power Supply: +3.3V±0.3V/Ground
VDDQ/VSSQ
Data Output
Power/Ground
Provide isolated Power/Ground to DQs for improved noise immunity.
NC
No Connection
PRELIMINARY
(May, 2010, Version 0.4)
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AMIC Technology, Corp.
A43L4616A
Absolute Maximum Ratings*
*Comments
Voltage on any pin relative to VSS (Vin, Vout ) . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -1.0V to +4.6V
Voltage on VDD supply relative to VSS (VDD, VDDQ )
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-1.0V to +4.6V
Storage Temperature (TSTG) . . . . . . . . . . -55°C to +150°C
Soldering Temperature X Time (TSOLDER) . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260°C X 10sec
Power Dissipation (PD) . . . . . . . . . . . . . . . . . . . . . . . . .1W
Short Circuit Current (Ios) . . . . . . . . . . . . . . . . . . . . 50mA
Permanent device damage may occur if “Absolute Maximum
Ratings” are exceeded.
Functional operation should be restricted to recommended
operating condition.
Exposure to higher than recommended voltage for extended
periods of time could affect device reliability.
Capacitance (TA=25°C, f=1MHz)
Parameter
Input Capacitance
Symbol
Condition
Min
Typ
Max
CI1
A0 to A12, BS0,
BS1
2
3.5
CI2
CLK, CKE, CS ,
2
3.5
3.5
5.5
RAS , CAS , WE ,
L(U)DQM
Data Input/Output Capacitance
CI/O
DQ0 to DQ15
DC Electrical Characteristics
Recommend operating conditions (Voltage referenced to VSS = 0V, TA = 0°C to +70°C, -40°C to +85°C for industrial
temperature range or -40°C to +85°C for automotive temperature range)
Parameter
Symbol
Min
Typ
Max
Unit
VDD,VDDQ
3.0
3.3
3.6
V
Input High Voltage
VIH
2.0
VDD
VDD+0.3
V
Note 1
Input Low Voltage
VIL
-0.3
0
0.8
V
Note 2
Output High Voltage
VOH
2.4
-
-
V
IOH = -2mA
Output Low Voltage
VOL
-
-
0.4
V
IOL = 2mA
Input Leakage Current
IIL
-10
-
10
μA
Note 3
Output Leakage Current
IOL
-10
-
10
μA
Note 4
Supply Voltage
Output Loading Condition
Note
See Figure 1
Note:
1. VIH (max) = 4.6V AC (pulse width ≤ 10ns).
2. VIL (min) = -1.5V AC (pulse width ≤ 10ns).
3. Any input 0V ≤ VIN ≤ VDD + 0.3V, all other pins are not under test = 0V
4. Dout is disabled, 0V ≤ Vout ≤ VDD
PRELIMINARY
(May, 2010, Version 0.4)
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AMIC Technology, Corp.
A43L4616A
Decoupling Capacitance Guide Line
Recommended decoupling capacitance added to power line at board.
Parameter
Symbol
Value
Unit
Decoupling Capacitance between VDD and VSS
CDC1
0.1 + 0.01
μF
Decoupling Capacitance between VDDQ and VSSQ
CDC2
0.1 + 0.01
μF
Note: 1. VDD and VDDQ pins are separated each other.
All VDD pins are connected in chip. All VDDQ pins are connected in chip.
2. VSS and VSSQ pins are separated each other
All VSS pins are connected in chip. All VSSQ pins are connected in chip.
DC Electrical Characteristics
(Recommended operating condition unless otherwise noted, TA = 0 to 70°C, -40°C to +85°C for industrial temperature range or
-40°C to +85°C for automotive temperature range)
Symbol
Icc1
Icc2 P
Icc2 PS
ICC2N
ICC2NS
ICC3N
ICC3NS
ICC3P
Parameter
Speed
Test Conditions
-6
-7
-75
110
110
105
Unit
Notes
mA
1
Operating Current
(One Bank Active)
Burst Length = 1
tRC = tRC(min), tCC = tCC(min), IOL = 0mA
Precharge Standby
Current in power-down
mode
CKE = VIL(max), tCC = 10ns
12
CKL = VIL(max), tCC = ∞
5
CKE = VIH(min), CS = VIH(min), tCC = 10ns
Input signals are changed one time during 20ns
38
CKE = VIH(min), CLK = VIL(max), tCC = ∞
Input signals are stable.
28
CKE = VIH(min), CS = VIH(min), tCC = 10ns
Input signals are changed one time during 20ns
65
mA
CKE = VIH(min), CLK = VIL(max), tCC = ∞
Input signals are stable
45
mA
Precharge Standby
Current in non powerdown mode
Active Standby current
in non power-down
mode (One Bank Active)
mA
mA
Active Standby current
in power-down mode
(One Bank Active)
CKE = VIL(max), tcc=10ns
35
mA
CKE & CLK = VIL(max), tcc= ∞
20
mA
ICC4
Operating Current
(Burst Mode)
IOL = 0mA, Burst Length = 4
All bank Activated, tCCD = tCCD (min)
105
100
95
mA
1
ICC5
Refresh Current
tRC = tRC (min)
150
140
130
mA
2
ICC6
Self Refresh Current
CKE = 0.2V
6
6
6
mA
ICC3PS
Note: 1. Measured with outputs open. Addresses are changed only one time during tCC(min).
2. Refresh period is 64ms. Addresses are changed only one time during tCC(min).
3. Unless otherwise noted, input swing IeveI is CMOS (VIH /VIL=VDDQ/VSSQ).
PRELIMINARY
(May, 2010, Version 0.4)
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AMIC Technology, Corp.
A43L4616A
AC Operating Test Conditions
(VDD = 3.3V ±0.3V, TA = 0°C to +70°C, -40°C to +85°C for industrial temperature range or -40°C to +85°C for automotive
temperature range)
Parameter
Value
AC input levels
VIH/VIL = 2.4V/0.4V
Input timing measurement reference level
1.4V
Input rise and all time (See note3)
tr/tf = 1ns/1ns
Output timing measurement reference level
1.4V
Output load condition
See Fig.2
3.3V
1200Ω
VOH(DC) = 2.4V, IOH = -2mA
VOL(DC) = 0.4V, IOL = 2mA
VTT =1.4V
50Ω
Output
ZO=50Ω
OUTPUT
870Ω
30pF
30pF
(Fig. 2) AC Output Load Circuit
(Fig. 1) DC Output Load Circuit
AC Characteristics
(AC operating conditions unless otherwise noted)
Symbol
Parameter
CAS
Latency
3
tCC
-7
Max
6
Min
CLK to valid
3
Output delay
2
10
Max
5.4
2.5
1
ns
1,2
-
ns
2
5.4
-
2.5
2.5
ns
-
5.4
-
Note
10
5.4
5.4
Unit
Max
7.5
-
Output data hold time
Min
10
-
2
-75
7
-
3
tOH
Min
CLK cycle time
2
tSAC
-6
6
2.5
2.5
2.5
tCH
CLK high pulse width
2.5
-
2.5
-
2.5
-
ns
3
tCL
CLK low pulse width
2.5
-
2.5
-
2.5
-
ns
3
tSS
Input setup time
1.5
-
1.5
-
1.5
-
ns
3
tSH
Input hold time
1
-
1
-
1
-
ns
3
tSLZ
CLK to output in Low-Z
1
-
1
-
1
-
ns
2
tSHZ
CLK to output In Hi-Z
ns
-
2, 3
3
5.4
-
5.4
-
2
5.4
5.4
-
5.4
6
*All AC parameters are measured from half to half.
Note : 1. Parameters depend on programmed CAS latency.
2. If clock rising time is longer than 1ns, (tr/2-0.5)ns should be added to the parameter.
3. Assumed input rise and fall time (tr & tf) = 1ns.
If tr & tf is longer than 1ns, transient time compensation should be considered,
i.e., [(tr + tf)/2-1]ns should be added to the parameter.
PRELIMINARY
(May, 2010, Version 0.4)
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AMIC Technology, Corp.
A43L4616A
Operating AC Parameter
(AC operating conditions unless otherwise noted)
Version
Symbol
Parameter
CAS
Latency
-6
-7
-75
Unit
Note
tRRD(min)
Row active to row active delay
12
14
15
ns
1
tRCD(min)
RAS to CAS delay
18
20
20
ns
1
tRP(min)
Row precharge time
18
20
20
ns
1
42
45
45
ns
1
100
100
100
μs
60
63
65
ns
1
1
1
1
CLK
2
2
tRAS(min)
Row active time
tRAS(max)
tRC(min)
Row cycle time
tCDL(min)
Last data in new col. Address delay
tRDL(min)
Last data in row precharge
2
2
2
CLK
tDAL(min)
Last data in to Active delay
5
5
5
CLK
tBDL(min)
Last data in to burst stop
1
1
1
CLK
tCCD(min)
Col. Address to col. Address delay
1
1
1
CLK
tMRD(min)
Mode register set cycle time
2
2
2
CLK
tREF(max)
Refresh interval time
64
64
64
ms
tARFC(min)
Auto refresh cycle time
60
70
75
ns
2,3
2
Note: 1. The minimum number of clock cycles is determined by dividing the minimum time required with clock cycle time and
then rounding off to the next higher integer.
2. Minimum delay is required to complete write.
PRELIMINARY
(May, 2010, Version 0.4)
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AMIC Technology, Corp.
A43L4616A
Simplified Truth Table
Command
CKEn-1 CKEn
CS
RAS CAS
WE DQM BS0 A10 A9~A0,
Notes
BS1 /AP A11,A12
Register
Refresh
Mode Register Set
H
Auto Refresh
Self
Refresh
X
L
L
L
L
X
OP CODE
L
L
L
H
X
X
L
H
H
H
X
X
3
H
Entry
Exit
H
L
L
H
Bank Active & Row Addr.
H
Read &
Auto Precharge Disable
Column Addr. Auto Precharge Enable
X
X
X
X
L
L
H
H
X
V
H
X
L
H
L
H
X
V
Write &
Auto Precharge Disable
Column Addr. Auto Precharge Enable
H
X
L
H
L
L
X
V
Burst Stop
H
X
L
H
H
L
X
H
X
L
L
H
L
X
H
L
L
H
H
H
H
X
X
X
Exit
L
H
X
X
X
X
Entry
H
L
Clock Suspend or
Active Power Down
Entry
Precharge Power Down Mode
Exit
DQM
L
H
L
H
H
H
X
X
X
L
V
V
V
H
X
X
X
L
H
H
H
H
X
X
X
H
No Operation Command
Column
Addr.
H
Column
Addr.
L
H
H
X
X
3
Row Addr.
L
Bank Selection
Both Banks
3
3
H
Precharge
1,2
H
4
4
4,5
4
4,5
X
V
L
X
H
X
X
X
X
X
X
X
V
X
X
X
6
(V = Valid, X = Don’t Care, H = Logic High, L = Logic Low)
Note : 1. OP Code: Operand Code
A0~A12, BS0, BS1: Program keys. (@MRS)
2. MRS can be issued only when all banks are at precharge state.
A new command can be issued after 2 clock cycle of MRS.
3. Auto refresh functions as same as CBR refresh of DRAM.
The automatical precharge without Row precharge command is meant by “Auto”.
Auto/Self refresh can be issued only when all banks are at precharge state.
4. BS0, BS1 : Bank select address.
If both BS1 and BS0 are “Low” at read, write, row active and precharge, bank A is selected.
If both BS1 is “Low” and BS0 is “High” at read, write, row active and precharge, bank B is selected.
If both BS1 is “High” and BS0 is “Low” at read, write, row active and precharge, bank C is selected.
If both BS1 and BS0 are “High” at read, write, row active and precharge, bank D is selected.
If A10/AP is “High” at row precharge, BS1 and BS0 is ignored and all banks are selected.
5. During burst read or write with auto precharge, new read/write command cannot be issued.
Another bank read/write command can be issued at every burst length.
6. DQM sampled at positive going edge of a CLK masks the data-in at the very CLK (Write DQM latency is 0)
but masks the data-out Hi-Z state after 2 CLK cycles. (Read DQM latency is 2)
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(May, 2010, Version 0.4)
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AMIC Technology, Corp.
A43L4616A
Mode Register Filed Table to Program Modes
Register Programmed with MRS
Address
BS0
Function
BS1
A12
RFU
A11
A10/AP
RFU
A9
A8
W.B.L
(Note 1)
A7
TM
A6
A5
A4
A3
CAS Latency
A2
BT
A1
A0
Burst Length
(Note 2)
Test Mode
CAS Latency
Burst Type
Burst Length
A8
A7
Type
A6
A5
A4
Latency
A3
Type
A2
A1
A0
BT=0
BT=1
0
0
Mode Register Set
0
0
0
Reserved
0
Sequential
0
0
0
1
1
0
1
Vendor
0
0
1
Reserved
1
Interleave
0
0
1
2
2
1
0
Use
0
1
0
2
0
1
0
4
4
1
1
Only
0
1
1
3
0
1
1
8
8
1
0
0
Reserved
1
0
0
Reserved
Reserved
Write Burst Length
A9
Length
1
0
1
Reserved
1
0
1
Reserved
Reserved
0
Burst
1
1
0
Reserved
1
1
0
Reserved
Reserved
1
Single Bit
1
1
1
Reserved
1
1
1
Full Page
Reserved
Power Up Sequence
1.
2.
3.
4.
5.
Apply power and start clock, Attempt to maintain CKE = “H”, DQM = “H” and the other pins are NOP condition at inputs.
Maintain stable power, stable clock and NOP input condition for a minimum of 200μs.
Issue precharge commands for all banks of the devices.
Issue 2 or more auto-refresh commands.
Issue a mode register set command to initialize the mode register.
The device is now ready for normal operation.
Note : 1. RFU(Reserved for Future Use) should stay “0” during MRS cycle.
2. If A9 is high during MRS cycle, “Burst Read Single Bit Write” function will be enabled.
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(May, 2010, Version 0.4)
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AMIC Technology, Corp.
A43L4616A
Burst Sequence (Burst Length = 4)
Initial address
Sequential
Interleave
A1
A0
0
0
0
1
2
3
0
1
2
3
0
1
1
2
3
0
1
0
3
2
1
0
2
3
0
1
2
3
0
1
1
1
3
0
1
2
3
2
1
0
Burst Sequence (Burst Length = 8)
Initial address
Sequential
Interleave
A2
A1
A0
0
0
0
0
1
2
3
4
5
6
7
0
1
2
3
4
5
6
7
0
0
1
1
2
3
4
5
6
7
0
1
0
3
2
5
4
7
6
0
1
0
2
3
4
5
6
7
0
1
2
3
0
1
6
7
4
5
0
1
1
3
4
5
6
7
0
1
2
3
2
1
0
7
6
5
4
1
0
0
4
5
6
7
0
1
2
3
4
5
6
7
0
1
2
3
1
0
1
5
6
7
0
1
2
3
4
5
4
7
6
1
0
3
2
1
1
0
6
7
0
1
2
3
4
5
6
7
4
5
2
3
0
1
1
1
1
7
0
1
2
3
4
5
6
7
6
5
4
3
2
1
0
PRELIMINARY
(May, 2010, Version 0.4)
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AMIC Technology, Corp.
A43L4616A
Device Operations
command decoder so that RAS , CAS and WE , and all
the address inputs are ignored.
Clock (CLK)
Power-Up
The clock input is used as the reference for all SDRAM
operations. All operations are synchronized to the positive
going edge of the clock. The clock transitions must be
monotonic between VIL and VIH. During operation with CKE
high all inputs are assumed to be in valid state (low or high)
for the duration of set up and hold time around positive edge
of the clock for proper functionality and ICC specifications.
The following sequence is recommended for POWER UP
1. Power must be applied to either CKE and DQM inputs to
pull them high and other pins are NOP condition at the
inputs before or along with VDD (and VDDQ) supply.
The clock signal must also be asserted at the same time.
2. After VDD reaches the desired voltage, a minimum pause
of 200 microseconds is required with inputs in NOP
condition.
3. Both banks must be precharged now.
4. Perform a minimum of 2 Auto refresh cycles to stabilize
the internal circuitry.
5. Perform a MODE REGISTER SET cycle to program the
CAS latency, burst length and burst type as the default
value of mode register is undefined.
At the end of one clock cycle from the mode register set
cycle, the device is ready for operation.
When the above sequence is used for Power-up, all the
out-puts will be in high impedance state. The high
impedance of outputs is not guaranteed in any other
power-up sequence.
Clock Enable (CKE)
The clock enable (CKE) gates the clock onto SDRAM. If CKE
goes low synchronously with clock (set-up and hold time
same as other inputs), the internal clock is suspended from
the next clock cycle and the state of output and burst
address is frozen as long as the CKE remains low. All other
inputs are ignored from the next clock cycle after CKE goes
low. When all banks are in the idle state and CKE goes low
synchronously with clock, the SDRAM enters the power
down mode from the next clock cycle. The SDRAM remains
in the power down mode ignoring the other inputs as long as
CKE remains low. The power down exit is synchronous as
the internal clock is suspended. When CKE goes high at
least “tSS + 1 CLOCK” before the high going edge of the
clock, then the SDRAM becomes active from the same clock
edge accepting all the input commands.
Mode Register Set (MRS)
The mode register stores the data for controlling the various
operation modes of SDRAM. It programs the CAS latency,
addressing mode, burst length, test mode and various
vendor specific options to make SDRAM useful for variety of
different applications. The default value of the mode register
is not defined, therefore the mode register must be written
after power up to operate the SDRAM. The mode register is
written by asserting low on CS , RAS , CAS , WE (The
SDRAM should be in active mode with CKE already high
prior to writing the mode register). The state of address pins
A0~A11, BS0 and BS1 in the same cycle as
CS , RAS , CAS , WE going low is the data written in the
mode register. One clock cycle is required to complete the
write in the mode register. The mode register contents can
be changed using the same command and clock cycle
requirements during operation as long as all banks are in the
idle state. The mode register is divided into various fields
depending on functionality. The burst length field uses
A0~A2, burst type uses A3, addressing mode uses A4~A6,
A7~A8, A11,A12, BS0 and BS1 are used for vendor specific
options or test mode. And the write burst length is
programmed using A9. A7~A8, A11,A12, BS0 and BS1 must
be set to low for normal SDRAM operation.
Refer to table for specific codes for various burst length,
addressing modes and CAS latencies.
Bank Select (BS0, BS1)
This SDRAM is organized as 4 independent banks of
4,194,304 words X 16 bits memory arrays. The BS0, BS1
inputs is latched at the time of assertion of RAS and CAS
to select the bank to be used for the operation. The bank
select BS0, BS1 is latched at bank activate, read, write mode
register set and precharge operations.
Address Input (A0 ~ A12)
The 22 address bits required to decode the 4,194,304 word
locations are multiplexed into 13 address input pins
(A0~A12). The 13 bit row address is latched along with
RAS , BS0 and BS1 during bank activate command. The 9
bit column address is latched along with CAS , WE , BS0
and BS1during read or write command.
NOP and Device Deselect
When RAS , CAS and WE are high, the SDRAM performs
no operation (NOP). NOP does not initiate any new
operation, but is needed to complete operations which
require more than single clock like bank activate, burst read,
auto refresh, etc. The device deselect is also a NOP and is
entered by asserting CS high. CS high disables the
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Device Operations (continued)
Bank Activate
Burst Write
The bank activate command is used to select a random row
in an idle bank. By asserting low on RAS and CS with
desired row and bank addresses, a row access is initiated.
The read or write operation can occur after a time delay of
tRCD(min) from the time of bank activation. tRCD(min) is an
internal timing parameter of SDRAM, therefore it is
dependent on operating clock frequency. The minimum
number of clock cycles required between bank activate and
read or write command should be calculated by dividing
tRCD(min) with cycle time of the clock and then rounding off
the result to the next higher integer. The SDRAM has 4
internal banks on the same chip and shares part of the
internal circuitry to reduce chip area, therefore it restricts the
activation of all banks simultaneously. Also the noise
generated during sensing of each bank of SDRAM is high
requiring some time for power supplies to recover before the
other bank can be sensed reliably. tRRD(min) specifies the
minimum time required between activating different banks.
The number of clock cycles required between different bank
activation must be calculated similar to tRCD specification.
The minimum time required for the bank to be active to
initiate sensing and restoring the complete row of dynamic
cells is determined by tRAS(min) specification before a
precharge command to that active bank can be asserted.
The maximum time any bank can be in the active state is
determined by tRAS(max). The number of cycles for both
tRAS(min) and tRAS(max) can be calculated similar to tRCD
specification.
The burst write command is similar to burst read command,
and is used to write data into the SDRAM consecutive clock
cycles in adjacent addresses depending on burst length and
burst sequence. By asserting low on CS , CAS and WE
with valid column address, a write burst is initiated. The data
inputs are provided for the initial address in the same clock
cycle as the burst write command. The input buffer is
deselected at the end of the burst length, even though the
internal writing may not have been completed yet. The burst
write can be terminated by issuing a burst read and DQM for
blocking data inputs or burst write in the same or the other
active bank. The burst stop command is valid only at full
page burst length where the writing continues at the end of
burst and the burst is wrap around. The write burst can also
be terminated by using DQM for blocking data and
precharging the bank “tRDL” after the last data input to be
written into the active row. See DQM OPERATION also.
DQM Operation
The DQM is used to mask input and output operation. It
works similar to OE during read operation and inhibits writing
during write operation. The read latency is two cycles from
DQM and zero cycle for write, which means DQM masking
occurs two cycles later in the read cycle and occurs in the
same cycle during write cycle. DQM operation is
synchronous with the clock, therefore the masking occurs for
a complete cycle. The DQM signal is important during burst
interrupts of write with read or precharge in the SDRAM. Due
to asynchronous nature of the internal write, the DQM
operation is critical to avoid unwanted or incomplete writes
when the complete burst write is not required.
Burst Read
The burst read command is used to access burst of data on
consecutive clock cycles from an active row in an active
bank. The burst read command is issued by asserting low on
Precharge
CS and CAS with WE being high on the positive edge of
The precharge operation is performed on an active bank by
the clock. The bank must be active for at least tRCD(min)
before the burst read command is issued. The first output
appears CAS latency number of clock cycles after the issue
of burst read command. The burst length, burst sequence
and latency from the burst read command is determined by
the mode register which is already programmed. The burst
read can be initiated on any column address of the active
row. The address wraps around if the initial address does not
start from a boundary such that number of outputs from each
I/O are equal to the burst length programmed in the mode
register. The output goes into high-impedance at the end of
the burst, unless a new burst read was initiated to keep the
data output gapless. The burst read can be terminated by
issuing another burst read or burst write in the same bank or
the other active bank or a precharge command to the same
bank. The burst stop command is valid at every page burst
length.
asserting low on CS , RAS , WE and A10/AP with valid BA
of the bank to be precharged. The precharge command can
be asserted anytime after tRAS(min) is satisfied from the bank
activate command in the desired bank. “tRP” is defined as the
minimum time required to precharge a bank.
The minimum number of clock cycles required to complete
row precharge is calculated by dividing “tRP” with clock cycle
time and rounding up to the next higher integer. Care should
be taken to make sure that burst write is completed or DQM
is used to inhibit writing before precharge command is
asserted. The maximum time any bank can be active is
specified by tRAS(max). Therefore, each bank has to be
precharged within tRAS(max) from the bank activate
command. At the end of precharge, the bank enters the idle
state and is ready to be activated again.
Entry to Power Down, Auto refresh, Self refresh and Mode
register Set etc, is possible only when both banks are in idle
state.
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Device Operations (continued)
required to complete the auto refresh operation is specified
by “tRC(min)”. The minimum number of clock cycles required
can be calculated by driving “tRC” with clock cycle time and
then rounding up to the next higher integer. The auto refresh
command must be followed by NOP’s until the auto refresh
operation is completed. Both banks will be in the idle state at
the end of auto refresh operation. The auto refresh is the
preferred refresh mode when the SDRAM is being used for
normal data transactions. The auto refresh cycle can be
performed once in 15.6us or a burst of 8192 auto refresh
cycles once in 64ms.
Auto Precharge
The precharge operation can also be performed by using
auto precharge. The SDRAM internally generates the timing
to satisfy tRAS(min) and “tRP” for the programmed burst length
and CAS latency. The auto precharge command is issued at
the same time as burst read or burst write by asserting high
on A10/AP. If burst read or burst write command is issued
with low on A10/AP, the bank is left active until a new
command is asserted. Once auto precharge command is
given, no new commands are possible to that particular bank
until the bank achieves idle state.
Self Refresh
Four Banks Precharge
The self refresh is another refresh mode available in the
SDRAM. The self refresh is the preferred refresh mode for
data retention and low power operation of SDRAM. In self
refresh mode, the SDRAM disables the internal clock and all
the input buffers except CKE. The refresh addressing and
timing is internally generated to reduce power consumption.
The self refresh mode is entered from all banks idle state by
asserting low on CS , RAS , CAS and CKE with high on
WE . Once the self refresh mode is entered, only CKE state
being low matters, all the other inputs including clock are
ignored to remain in the self refresh.
The self refresh is exited by restarting the external clock and
then asserting high on CKE. This must be followed by NOP’s
for a minimum time of “tRC” before the SDRAM reaches idle
state to begin normal operation. If the system uses burst auto
refresh during normal operation, it is recommended to used
burst 8192 auto refresh cycles immediately after exiting self
refresh.
All banks can be precharged at the same time by using
Precharge all command. Asserting low on CS , RAS and
WE with high on A10/AP after both banks have satisfied
tRAS(min) requirement, performs precharge on both banks. At
the end of tRP after performing precharge all, both banks are
in idle state.
Auto Refresh
The storage cells of SDRAM need to be refreshed every
64ms to maintain data. An auto refresh cycle accomplishes
refresh of a single row of storage cells. The internal counter
increments automatically on every auto refresh cycle to
refresh all the rows. An auto refresh command is issued by
asserting low on CS , RAS and CAS with high on CKE and
WE . The auto refresh command can only be asserted with
both banks being in idle state and the device is not in power
down mode (CKE is high in the previous cycle). The time
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Basic feature And Function Descriptions
1. CLOCK Suspend
1) Click Suspended During Write (BL=4)
2) Clock Suspended During Read (BL=4)
CLK
CMD
WR
RD
CKE
Masked by CKE
Masked by CKE
Internal
CLK
DQ(CL2)
D0
D1
D2
D3
DQ(CL3)
D0
D1
D2
D3
Q0
Q1
Q0
Q2
Q3
Q1
Q2
Not Written
Q3
Suspended Dout
Note: CLK to CLK disable/enable=1 clock
2. DQM Operation
* Note : 1. DQM makes data out Hi-Z after 2 clocks which should masked by CKE “L”.
2. DQM masks both data-in and data-out.
2) Read Mask (BL=4)
1) Write Mask (BL=4)
CLK
CMD
WR
RD
DQM
Masked by CKE
DQ(CL2)
D0
D1
D3
DQ(CL3)
D0
D1
D3
Masked by CKE
Q0
Hi-Z
Hi-Z
DQM to Data-in Mask = 0CLK
Q2
Q3
Q1
Q2
Q3
DQM to Data-out Mask = 2
2) Read Mask (BL=4)
CLK
CMD
RD
CKE
DQM
DQ(CL2)
DQ(CL3)
PRELIMINARY
Q0
Hi-Z
Hi-Z
(May, 2010, Version 0.4)
Hi-Z
Q2
Hi-Z
Q1
15
Q4
Q3
Hi-Z
Hi-Z
Q6
Q7
Q8
Q5
Q6
Q7
AMIC Technology, Corp.
A43L4616A
3. CAS Interrupt (I)
1) Read interrupted by Read (BL=4)Note 1
CLK
CMD
RD
ADD
A
RD
B
QA0
DQ(CL2)
DQ(CL3)
QB0
QB1 QB2
QB3
QA0
QB0
QB2
QB1
QB3
tCCD
Note2
2) Write interrupted by Write (BL =2)
3) Write interrupted by Read (BL =2)
CLK
CMD
WR
ADD
A
DQ
DA0
WR
tCCD
WR
tCCD
Note2
B
DB0
RD
A
DB1
tCDL
Note3
Note2
B
DQ(CL2)
DA0
DQ(CL3)
DA0
QB0
QB1
QB0
QB1
tCDL
Note3
Note : 1. By “Interrupt”, It is possible to stop burst read/write by external command before the end of burst.
By “ CAS Interrupt”, to stop burst read/write by CAS access; read, write and block write.
2. tCCD : CAS to CAS delay. (=1CLK)
3. tCDL : Last data in to new column address delay. (= 1CLK).
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4. CAS Interrupt (II) : Read Interrupted Write & DQM
(1) CL=2, BL=4
CLK
i) CMD
RD
WR
DQM
D0
DQ
ii) CMD
Hi-Z
DQ
D0
RD
iii) CMD
D2
D3
D1
D2
D3
D1
D2
D3
D1
D2
WR
RD
DQM
D1
WR
DQM
Hi-Z
D0
DQ
iv) CMD
RD
WR
DQM
Q0
DQ
Hi-Z
Note 1
D0
D3
(2) CL=3, BL=4
CLK
i) CMD
RD
WR
DQM
D0
DQ
ii) CMD
RD
D1
D2
D3
D1
D2
D3
D1
D2
D3
D1
D2
D3
D1
D2
WR
DQM
D0
DQ
iii) CMD
RD
WR
DQM
D0
WR
DQ
iv) CMD
RD
WR
DQM
Hi-Z
DQ
v) CMD
D0
RD
WR
DQM
Q0
DQ
Hi-Z
Note 2
D0
D3
* Note : 1. To prevent bus contention, there should be at least one gap between data in and data out.
2. To prevent bus contention, DQM should be issued which makes a least one gap between data in and data out.
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5. Write Interrupted by Precharge & DQM
CLK
Note 2
CMD
WR
PRE
Note 1
DQM
D0
DQ
D1
D2
D3
Masked by DQM
Note : 1. To inhibit invalid write, DQM should be issued.
2. This precharge command and burst write command should be of the same bank, otherwise it is not precharge
interrupt but only another bank precharge of dual banks operation.
6. Precharge
1) Normal Write (BL=4)
CLK
CMD
WR
DQ
D0
PRE
D1
D2
D3
tRDL
2) Read (BL=4)
CLK
CMD
RD
PRE
DQ(CL2)
Q0
DQ(CL3)
Q1
Q2
Q3
Q0
Q1
Q2
Q3
7. Auto Precharge
1) Normal Write (BL=4)
CLK
CMD
WR
DQ
D0
D1
D2
D3
Note 1
Auto Precharge Starts
2) Read (BL=4)
CLK
CMD
DQ(CL2)
RD
Q0
DQ(CL3)
Q1
Q2
Q3
Q0
Q1
Q2
Q3
Note 1
Auto Precharge Starts
* Note : 1. The row active command of the precharge bank can be issued after tRP from this point.
The new read/write command of other active bank can be issued from this point.
At burst read/write with auto precharge, CAS interrupt of the same/another bank is illegal.
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8. Burst Stop & Interrupted by Precharge
1) Normal Write (BL=4)
2) Write Burst Stop (BL=8)
CLK
CMD
CLK
WR
CMD
PRE
DQM
DQ
WR
STOP
DQM
D0
D1
D2
DQ
D3
D0
D1
D2
D3
tRDL Note 1
1) Read Interrupted by Precharge (BL=4)
D5
4) Read Burst Stop (BL=4)
CLK
CMD
D4
tBDL Note 2
CLK
RD
PRE
DQ(CL2)
Q0
Q1
Q0
DQ(CL3)
CMD
Note 3
1
DQ(CL2)
Q1
2
DQ(CL3)
RD
STOP
Q0
Q1
Q0
1
Q1
2
9. MRS
Mode Register Set
CLK
Note 1
CMD
PRE
MRS
tRP
ACT
2CLK
Note : 1. tRDL: 1CLK
2. tBDL: 1CLK; Last data in to burst stop delay.
Read or write burst stop command is valid at every burst length.
3. Number of valid output data after row precharge or burst stop: 1,2 for CAS latency = 2, 3 respectively.
4. PRE: All banks precharge if necessary.
MRS can be issued only when all banks are in precharged state.
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10. Clock Suspend Exit & Power Down Exit
2) Power Down (=Precharge Power Down) Exit
1) Clock Suspend (=Active Power Down) Exit
CLK
CLK
CKE
Internal
CLK
CKE
tSS
tSS
Internal
CLK
Note 1
RD
CMD
Note 2
NOP
CMD
ACT
11. Auto Refresh & Self Refresh
Note 3
1) Auto Refresh
CKE
~
CLK
Note 4
Note 5
PRE
AR
CMD
~ ~
~
Internal
CLK
CMD
tRP
tRC
Note 6
~
2) Self Refresh
~
CLK
Note 4
PRE
SR
CMD
~
CMD
~
~
CKE
tRP
tRC
* Note : 1. Active power down : one or more bank active state.
2. Precharge power down : both bank precharge state.
3. The auto refresh is the same as CBR refresh of conventional DRAM.
No precharge commands are required after Auto Refresh command.
During tRC from auto refresh command, other command can not be accepted.
4. Before executing auto/self refresh command, both banks must be idle state.
5. MRS, Bank Active, Auto/Self Refresh, Power Down Mode Entry.
6. During self refresh mode, refresh interval and refresh operation are performed internally.
After self refresh entry, self refresh mode is kept while CKE is LOW.
During self refresh mode, all inputs expect CKE will be don’t cared, and outputs will be in Hi-Z state.
During tRC from self refresh exit command, any other command can not be accepted.
Before/After self refresh mode, burst auto refresh cycle (8K cycles ) is recommended.
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12. About Burst Type Control
Basic
MODE
Sequential counting
At MRS A3=”0”. See the BURST SEQUENCE TABE.(BL=4,8)
BL=1,2,4,8 and Full Page
Interleave counting
At MRS A3=” 1”. See the BURST SEQUENCE TABE.(BL=4,8)
BL=4,8 At BL=1,2 Interleave Counting = Sequential Counting
Random
MODE
Random column Access
tCCD = 1 CLK
Every cycle Read/Write Command with random column address can realize
Random Column Access.
That is similar to Extended Data Out (EDO) Operation of convention DRAM.
13. About Burst Length Control
At MRS A2,1,0 = “000”.
1
At auto precharge, tRAS should not be violated.
At MRS A2,1,0 = “001”.
Basic
MODE
Special
MODE
2
At auto precharge, tRAS should not be violated.
4
At MRS A2,1,0 = “010”
8
At MRS A2,1,0 = “011”.
Full Page
At MRS A2,1,0 = “111”
BRSW
At MRS A9=”1”.
Read burst = 1,2,4,8, FP write Burst =1
At auto precharge of write, tRAS should not be violated.
Interrupt
MODE
Before the end of burst, Row precharge command of the same bank
RAS Interrupt
(Interrupted by Precharge) Stops read/write burst with Row precharge.
tRDL=2 with DQM, valid DQ after burst stop is 1,2 for CL=2,3 respectively
During read/write burst with auto precharge, RAS interrupt cannot be issued.
CAS Interrupt
Before the end of burst, new read/write stops read/write burst and starts new
read/write burst or block write.
During read/write burst with auto precharge, CAS interrupt can not be issued.
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Power On Sequence & Auto Refresh
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
CLOCK
CS
tRP
tRC
~
~
~
~
KEY
Ra
BS
Ra
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
WE
High-Z
Precharge
(All Banks)
Auto Refresh
~
~
High level is necessary
~
~
DQ
~
~
A10/AP
~
~
BS0, BS1
~
~
ADDR
~
~
CAS
~
~
~
~
RAS
DQM
~
~
High level is necessary
~
~
CKE
Auto Refresh
Mode Regiser Set
Row Active
(A-Bank)
: Don't care
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Single Bit Read-Write-Read Cycles (Same Page) @CAS Latency=3, Burst Length=1
tCH
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
CLOCK
tCL
tCC
High
CKE
tRA
S
tRC
tSH
*Note 1
CS
tSS
tRCD
tRP
tSH
RAS
tSS
tCCD
tSH
CAS
tSS
tSH
ADDR
tSS
Ra
Ca
Cb
tSS
Cc
Rb
tSH
*Note 2
BS0, BS1
BS
A10/AP
Ra
*Note 2,3
*Note 4
*Note 2
BS
*Note 2,3
BS
*Note 2,3
BS
BS
BS
*Note 3
*Note 3
*Note 3
*Note 4
Rb
tSH
WE
tSS
tSS
tSH
DQM
tRA
C
tSH
tSA
C
DQ
Qa
tSLZ
tOH
Db
Qc
tSS
tSHZ
Row Active
Read
Write
Read
Row Active
Precharge
: Don't care
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* Note : 1. All inputs can be don’t care when CS is high at the CLK high going edge.
2. Bank active & read/write are controlled by BS0, BS1.
BS1
BS0
Active & Read/Write
0
0
Bank A
0
1
Bank B
1
0
Bank C
1
1
Bank D
3. Enable and disable auto precharge function are controlled by A10/AP in read/write command.
A10/AP
0
1
BS1
BS0
Operation
0
0
Disable auto precharge, leave bank A active at end of burst.
0
1
Disable auto precharge, leave bank B active at end of burst.
1
0
Disable auto precharge, leave bank C active at end of burst.
1
1
Disable auto precharge, leave bank D active at end of burst.
0
0
Enable auto precharge, precharge bank A at end of burst.
0
1
Enable auto precharge, precharge bank B at end of burst.
1
0
Enable auto precharge, precharge bank C at end of burst.
1
1
Enable auto precharge, precharge bank D at end of burst.
4. A10/AP and BS0, BS1 control bank precharge when precharge command is asserted.
PRELIMINARY
A10/AP
BS1
BS0
Precharge
0
0
0
Bank A
0
0
1
Bank B
0
1
0
Bank C
0
1
1
Bank D
1
X
X
All Banks
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Read & Write Cycle at Same Bank @Burst Length=4
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
CLOCK
CKE
High
tRC
*Note 1
CS
tRCD
RAS
*Note 2
CAS
ADDR
Ra
Ca0
Rb
Cb0
BS0
BS1
A10/AP
Ra
Rb
WE
DQM
tOH
DQ
(CL = 2)
Qa0
tRAC
*Note 3
Qa1
tSAC
Qa2
Qa3
Db0
Db1
*Note 4
tSHZ
Db2
Db3
tRDL
tOH
DQ
(CL = 3)
Qa0
tRAC
*Note 3
Row Active
(A-Bank)
tSAC
Read
(A-Bank)
Qa1
Qa2
Qa3
tSHZ
Precharge
(A-Bank)
Db0
*Note 4
Row Active
(A-Bank)
Db1
Db2
Db3
tRDL
Write
(A-Bank)
Precharge
(A-Bank)
: Don't care
*Note : 1. Minimum row cycle times is required to complete internal DRAM operation.
2. Row precharge can interrupt burst on any cycle. [CAS latency-1] valid output data available after Row
enters precharge. Last valid output will be Hi-Z after tSHZ from the clock.
3. Access time from Row address. tCC*(tRCD + CAS latency-1) + tSAC
4. Output will be Hi-Z after the end of burst. (1,2,4 & 8)
PRELIMINARY
(May, 2010, Version 0.4)
25
AMIC Technology, Corp.
A43L4616A
Page Read & Write Cycle at Same Bank @Burst Length=4
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
CLOCK
High
CKE
CS
tRCD
RAS
*Note 2
CAS
ADDR
Ra
Ca
Cb
Cc
Cd
BS0
BS1
A10/AP
Ra
tRDL
tCDL
WE
*Note1
*Note3
DQM
DQ
(CL=2)
Qa0
DQ
(CL=3)
Row Active
(A-Bank)
Read
(A-Bank)
Qa1
Qb0
Qb1
Qb2
Dc0
Dc1
Dd0
Dd1
Qa0
Qa1
Qb0
Qb1
Dc0
Dc1
Dd0
Dd1
Write
(A-Bank)
Read
(A-Bank)
Write
(A-Bank)
Precharge
(A-Bank)
: Don't care
*Note : 1. To write data before burst read ends, DQM should be asserted three cycle prior to write
command to avoid bus contention.
2. Row precharge will interrupt writing. Last data input, tRDL before Row precharge, will be written.
3. DQM should mask invalid input data on precharge command cycle when asserting precharge
before end of burst. Input data after Row precharge cycle will be masked internally.
PRELIMINARY
(May, 2010, Version 0.4)
26
AMIC Technology, Corp.
A43L4616A
Page Read Cycle at Different Bank @Burst Length = 4
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
CLOCK
CKE
High
*Note 1
CS
*Note 2
RAS
CAS
ADDR
RAa
RBb
RAa
RBb
CAa
CBb
RCc
RDd
CCc
CDd
BS1
BS0
A10/AP
RCc
RDd
WE
DQM
DQ
(CL=2)
QAa0 QAa1
DQ
(CL=3)
Row Active
(A-Bank)
QBb0
QBb1 QBb2
QAa0 QAa1
QAa2
QBb0
Read
(B-Bank)
Read
(A-Bank)
Row Active
(B-Bank)
QAa2
Row Active
(C-Bank)
QCc0
QCc1
QCc2
QDd0 QDd1 QDd2
QBb1 QBb2
QCc0
QCc1
QCc2
Read
(C-Bank)
Row Active
(D-Bank)
Precharge
(A-Bank)
* Note : 1. CS can be don’t care when RAS, CAS and
Precharge
(B-Bank)
WE
Read
(D-Bank)
QDd0 QDd1 QDd2
Precharge
(D-Bank)
Precharge
(C-Bank)
: Don't care
are high at the clock high going edge.
2. To interrupt a burst read by row precharge, both the read ad the precharge banks must be the same.
PRELIMINARY
(May, 2010, Version 0.4)
27
AMIC Technology, Corp.
A43L4616A
Page Write Cycle at Different Bank @Burst Length=4
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
CLOCK
CKE
High
CS
RAS
*Note 2
CAS
ADDR
RAa
RBb
RAa
RBb
CAa
CBb
RCc
RDd
RCc
RDd
CCc
CDd
BS1
BS0
A10/AP
DAa0 DAa1
DQ
DAa2
DAa3
DBb0 DBb1
DBb2
DBb3
DCc0
DCc1
DDd0
DDd1
CDd2
tRDL
tCDL
WE
*Note 1
DQM
Row Active
(A-Bank)
Write
(A-Bank)
Row Active
(B-Bank)
Write
(B-Bank)
Row Active
(D-Bank)
Row Active
(C-Bank)
Precharge
(All Banks)
Write
(D-Bank)
Write
(C-Bank)
: Don't care
* Note:
1. To interrupt burst write by Row precharge, DQM should be asserted to mask invalid input data.
2. To interrupt burst write by Row precharge, both the write and precharge banks must be the same.
PRELIMINARY
(May, 2010, Version 0.4)
28
AMIC Technology, Corp.
A43L4616A
Read & Write Cycle at Different Bank @Burst Length=4
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
CLOCK
CKE
High
CS
RAS
CAS
ADDR
RAa
CAa
RDb
CDb
RBc
CBc
BS1
BS0
A10/AP
RAa
RDb
RBC
tCDL
*Note 1
WE
DQM
DQ
(CL=2)
QAa0
DQ
(CL=3)
Row Active
(A-Bank)
QAa1
QAa2 QAa3
QAa0
QAa1 QAa2
Read
(A-Bank)
DDb0
QAa3
Precharge
(A-Bank)
DDb1
DDb2
DDb3
DDb0 DDb1
DDb2
DDb3
Write
(D-Bank)
Row Active
(D-Bank)
QBc0
QBc1
QBc2
QBc0
QBc1
Read
(B-Bank)
Row Active
(B-Bank)
: Don't care
* Note : tCDL should be met to complete write.
PRELIMINARY
(May, 2010, Version 0.4)
29
AMIC Technology, Corp.
A43L4616A
Read & Write Cycle with Auto Precharge @Burst Length=4
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
DDb1
DDb2
DDb3
DDb0 DDb1
DDb2
DDb3
18
19
CLOCK
High
CKE
CS
RAS
CAS
ADDR
RAa
RBb
RAa
RBb
CAa
CBb
BS1
BS0
A10/AP
WE
DQM
DQ
(CL=2)
QAa0
DQ
(CL=3)
Row Active
(A-Bank)
QAa1
QAa2 QAa3
QAa0
QAa1 QAa2
QAa3
Auto Precharge
Start Point
(A-Bank/CL=3)
Read with
Auto Precharge
(A-Bank)
Row Active
(D-Bank)
DDb0
Write with
Auto Precharge
(D-Bank)
Auto Precharge
Start Point
(D-Bank)
Auto Precharge
Start Point
(A-Bank/CL=2)
: Don't care
*Note : tRCD should be controlled to meet minimum tRAS before internal precharge start.
(In the case of Burst Length=1 & 2, BRSW mode)
PRELIMINARY
(May, 2010, Version 0.4)
30
AMIC Technology, Corp.
A43L4616A
Clock Suspension & DQM Operation Cycle @CAS Latency = 2, Burst Length=4
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
CLOCK
CKE
CS
RAS
CAS
ADDR
Ra
Ca
Cc
Cb
BS1
BS0
A10/AP
Ra
WE
* Note 1
DQM
Qa0
DQ
Qa1
Qa2
Qb0
Qa3
tSHZ
Row Active
Read
Bank 0
Clock
Suspension
Qb1
Dc0
Dc2
tSHZ
Read
Bank 0
Write
DQM
Read DQM
Write
Bank 0
Clock
Suspension
: Don't care
* Note : DQM needed to prevent bus contention.
PRELIMINARY
(May, 2010, Version 0.4)
31
AMIC Technology, Corp.
A43L4616A
Read Interrupted by Precharge Command & Read Burst Stop Cycle @Burst Length= 8
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
CLOCK
CKE
High
CS
RAS
CAS
ADDR
RAa
CAa
CAb
BS1
BS0
A10/AP
RAa
WE
DQM
1
DQ
(CL=2)
QAa0
QAa1
QAa2
QAa3 QAa4
QAa0
QAa1
QAa2 QAa3
1
QAb0
QAb1
QAb2
QAb3
QAb4
QAb5
QAb0 QAb1
QAb2
QAb3
QAb4
2
DQ
(CL=3)
Row Active
(A-Bank)
Read
(A-Bank)
Burst Stop
QAa4
2
Read
(A-Bank)
QAb5
Precharge
(A-Bank)
: Don't care
* Note : 1. At full page mode, burst is wrap-around at the end of burst. So auto precharge is impossible.
2. About the valid DQ’s after burst stop, it is same as the case of RAS interrupt.
Both cases are illustrated above timing diagram. See the label 1,2 on them.
But at burst write, burst stop and RAS interrupt should be compared carefully.
Refer the timing diagram of “Full page write burst stop cycle”.
3. Burst stop is valid at every burst length.
PRELIMINARY
(May, 2010, Version 0.4)
32
AMIC Technology, Corp.
A43L4616A
Write Interrupted by Precharge Command & Write Burst Stop Cycle @ Burst Length = 8
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
CLOCK
CKE
High
CS
RAS
CAS
ADDR
RAa
CAa
CAb
BS1
BS0
A10/AP
RAa
tRDL
tBDL
* Note 2
WE
DQM
DAa0
DQ
Row Active
(A-Bank)
DAa1
DAa2
Write
(A-Bank)
DAa3 DAa4
DAb0
Burst Stop
Write
(A-Bank)
DAb1
DAb2
DAb3
DAb4
DAb5
Precharge
(A-Bank)
: Don't care
* Note : 1. At full page mode, burst is wrap-around at the end of burst. So auto precharge is impossible.
2. Data-in at the cycle of interrupted by precharge cannot be written into the corresponding memory cell.
It is defined by AC parameter of tRDL(=2CLK).
DQM at write interrupted by precharge command is needed to prevent invalid write.
DQM should mask invalid input data on precharge command cycle when asserting precharge before end of burst.
Input data after Row precharge cycle will be masked internally.
3. Burst stop is valid at every burst length.
PRELIMINARY
(May, 2010, Version 0.4)
33
AMIC Technology, Corp.
A43L4616A
Active/Precharge Power Down Mode @CAS Lantency=2, Burst Length=4
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
~
~
tSS
~
~
~
~
CLOCK
* Note 2
tSS
tSS
tSS
CKE
~
~
* Note 1
*Note 3
~
~
~
~
~
~
CS
~
~
~
~
~
~
~
~
~
~
~
~
Ra
~
~
~
~
~
~
~
~
~
~
~
~
BS0
~
~
Ra
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
DQM
~
~
~
~
WE
~
~
~
~
A10/AP
Ca
~
~
~
~
BS1
~
~
~
~
ADDR
~
~
~
~
~
~
~
~
CAS
~
~
RAS
tSHZ
DQ
Precharge
Power-down
Entry
Qa0
Precharge
Power-down
Exit
Row
Read
Qa1
Qa2
Precharge
Active
Active
Power-down
Exit
Active
Power-down
Entry
: Don't care
* Note : 1. All banks should be in idle state prior to entering precharge power down mode.
2. CKE should be set high at least “1CLK + tSS” prior to Row active command.
3. Cannot violate minimum refresh specification. (64ms)
PRELIMINARY
(May, 2010, Version 0.4)
34
AMIC Technology, Corp.
A43L4616A
Self Refresh Entry & Exit Cycle
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
~
~
* Note 4
tSS
CKE
* Note 1
tRC
min.
~
~
* Note 2
~
~
~
~
CLOCK
* Note 6
~
~
* Note 3
~
~
~
~
tSS
* Note 5
~
~
~
~
* Note 7
~
~
RAS
~
~
~
~
CS
~
~
~
~
~
~
~
~
CAS
~
~
~
~
~
~
~
~
ADDR
~
~
~
~
~
~
~
~
BS0, BS1
~
~
~
~
~
~
~
~
A10/AP
~
~
~
~
~
~
~
~
WE
Hi-Z
~
~
~
~
DQ
~
~
~
~
~
~
~
~
DQM
* Note 7
Hi-Z
Self Refresh Exit
Self Refresh Entry
Auto Refresh
: Don't care
* Note : TO ENTER SELF REFRESH MODE
1. CS , RAS & CAS and CKE should be low at the same clock cycle.
2. After 1 clock cycle, all the inputs including the system clock can be don’t care except for CKE.
3. The device remains in self refresh mode as long as CKE stays “Low”.
(cf.) Once the device enters self refresh mode, minimum tRAS is required before exit from self refresh.
TO EXIT SELF REFRESH MODE
4. System clock restart and be stable before returning CKE high.
5. CS starts from high.
6. Minimum tRC is required after CKE going high to complete self refresh exit.
7. 8K cycle of burst auto refresh is required before self refresh entry and after self refresh exit.
If the system uses burst refresh.
PRELIMINARY
(May, 2010, Version 0.4)
35
AMIC Technology, Corp.
A43L4616A
Mode Register Set Cycle
0
1
2
3
Auto Refresh Cycle
4
5
6
0
1
2
3
4
5
6
7
8
9
10
CKE
High
~
~
~
~
CLOCK
High
~
~
*Note 2
tRC
~
~
CS
~
~
~
~
RAS
~
~
* Note 1
~
~
CAS
~
~
* Note 3
Ra
~
~
Key
ADDR
~
~
~
~
WE
~
~
DQ
Hi-Z
~
~
~
~
DQM
Hi-Z
MRS
Auto Refresh
New Command
New
Command
: Don't care
* All banks precharge should be completed before Mode Register Set cycle and auto refresh cycle.
MODE REGISTER SET CYCLE
* Note : 1. CS , RAS , CAS &
mode register.
WE
activation at the same clock cycle with address key will set internal
2. Minimum 2 clock cycles is required before new RAS activation.
3. Please refer to Mode Register Set table.
PRELIMINARY
(May, 2010, Version 0.4)
36
AMIC Technology, Corp.
A43L4616A
Function Truth Table (Table 1)
Current
State
IDLE
CS
RAS CAS
WE
BA
Address
Action
H
X
X
X
X
X
NOP
L
H
H
H
X
X
NOP
L
H
H
L
X
X
ILLEGAL
2
L
H
L
X
BA
CA, A10/AP ILLEGAL
2
L
L
H
H
BA
RA
L
L
H
L
BA
A10/PA
L
L
L
H
X
X
L
L
L
L
OP Code
Row Active; Latch Row Address
NOP
4
Auto Refresh or Self Refresh
5
Mode Register Access
5
H
X
X
X
X
X
NOP
L
H
H
H
X
X
NOP
Row
L
H
H
L
X
X
ILLEGAL
Active
L
H
L
H
BA
CA,A10/AP Begin Read; Latch CA; Determine AP
L
H
L
L
BA
CA,A10/AP Begin Write; Latch CA; Determine AP
L
L
H
H
BA
RA
ILLEGAL
L
L
H
L
BA
PA
Precharge
L
L
L
X
X
X
ILLEGAL
Read
Write
Read with
Auto
Precharge
PRELIMINARY
Note
2
2
H
X
X
X
X
X
NOP(Continue Burst to End →Row Active)
L
H
H
H
X
X
NOP(Continue Burst to End →Row Active)
L
H
H
L
X
X
Term burst →Row Active
L
H
L
H
BA
CA,A10/AP Term burst; Begin Read; Latch CA; Determine AP
3
L
H
L
L
BA
CA,A10/AP Term burst; Begin Write; Latch CA; Determine AP
3
L
L
H
H
BA
L
L
H
L
BA
RA
ILLEGAL
2
CA,A10/AP Term Burst; Precharge timing for Reads
3
L
L
L
X
X
X
ILLEGAL
H
X
X
X
X
X
NOP(Continue Burst to End→Row Active)
L
H
H
H
X
X
NOP(Continue Burst to End→Row Active)
L
H
H
L
X
X
Term burst →Row Active
L
H
L
H
BA
CA,A10/AP Term burst; Begin Read; Latch CA; Determine AP
3
L
H
L
L
BA
CA,A10/AP Term burst; Begin Write; Latch CA; Determine AP
3
L
L
H
H
BA
RA
L
L
H
L
BA
A10/AP
L
L
L
X
X
X
ILLEGAL
ILLEGAL
2
Term Burst; Precharge timing for Writes
3
H
X
X
X
X
X
NOP(Continue Burst to End→Precharge)
L
H
H
H
X
X
NOP(Continue Burst to End→Precharge)
L
H
H
L
X
X
ILLEGAL
L
H
L
H
BA
CA,A10/AP ILLEGAL
2
L
H
L
L
BA
CA,A10/AP ILLEGAL
2
L
L
H
X
BA
RA, PA
ILLEGAL
L
L
L
X
X
X
ILLEGAL
(May, 2010, Version 0.4)
37
2
AMIC Technology, Corp.
A43L4616A
Function Truth Table (Table 1, Continued)
Current
State
CS
RAS CAS
WE
BS
Address
Action
Note
H
X
X
X
X
X
NOP(Continue Burst to End→Precharge)
H
X
X
NOP(Continue Burst to End→Precharge)
X
ILLEGAL
L
H
H
Write with
L
H
H
L
X
Auto
L
H
L
H
BA
CA,A10/AP ILLEGAL
2
Precharge
L
H
L
L
BA
CA,A10/AP ILLEGAL
2
L
L
H
X
BA
Precharge
Row
Activating
Refreshing
Mode
Register
Accessing
RA, PA
ILLEGAL
L
L
L
X
X
X
ILLEGAL
H
X
X
X
X
X
NOP→Idle after tRP
L
H
H
H
X
X
NOP→Idle after tRP
L
H
H
L
X
X
ILLEGAL
L
H
L
X
BA
L
L
H
H
BA
RA
L
L
H
L
BA
A10/PA
2
CA,A10/AP ILLEGAL
2
ILLEGAL
2
NOP→Idle after tRP
2
4
L
L
L
X
X
X
ILLEGAL
H
X
X
X
X
X
NOP→Row Active after tRCD
L
H
H
H
X
X
NOP→Row Active after tRCD
L
H
H
L
X
X
ILLEGAL
L
H
L
X
BA
L
L
H
H
BA
RA
ILLEGAL
2
L
L
H
L
BA
A10/PA
ILLEGAL
2
2
CA,A10/AP ILLEGAL
L
L
L
X
X
X
ILLEGAL
H
X
X
X
X
X
NOP→Idle after tRC
L
H
H
X
X
X
NOP→Idle after tRC
L
H
L
X
X
X
ILLEGAL
L
L
H
X
X
X
ILLEGAL
L
L
L
X
X
X
ILLEGAL
H
X
X
X
X
X
NOP→Idle after 2 clocks
L
H
H
H
H
X
NOP→Idle after 2 clocks
L
H
H
L
X
X
ILLEGAL
L
H
L
X
X
X
ILLEGAL
L
L
X
X
X
X
ILLEGAL
Abbreviations
RA = Row Address
NOP = No Operation Command
BS = Bank Address
CA = Column Address
2
AP = Auto Precharge
PA = Precharge All
Note: 1. All entries assume that CKE was active (High) during the preceding clock cycle and the current clock cycle.
2. Illegal to bank in specified state: Function may be legal in the bank indicated by BA, depending on the state of that bank.
3. Must satisfy bus contention, bus turn around, and/or write recovery requirements.
4. NOP to bank precharging or in idle state. May precharge bank indicated by BS (and PA).
5. Illegal if any banks is not idle.
PRELIMINARY
(May, 2010, Version 0.4)
38
AMIC Technology, Corp.
A43L4616A
Function Truth Table for CKE (Table 2)
Current
State
Self
Refresh
Both
Bank
Precharge
Power
Down
All
Banks
Idle
Any State
Other than
Listed
Above
CKE
n-1
H
CKE
n
X
L
CS
RAS CAS
WE
Address
Action
Note
X
X
X
X
X
INVALID
H
H
X
X
X
X
Exit Self Refresh→ABI after tRC
6
L
H
L
H
H
H
X
Exit Self Refresh→ABI after tRC
6
L
H
L
H
H
L
X
ILLEGAL
L
H
L
H
L
X
X
ILLEGAL
L
H
L
L
X
X
X
ILLEGAL
L
L
X
X
X
X
X
NOP(Maintain Self Refresh)
H
X
X
X
X
X
X
INVALID
L
H
H
X
X
X
X
Exit Power Down→ABI
7
L
H
L
H
H
H
X
Exit Power Down→ABI
7
L
H
L
H
H
L
X
ILLEGAL
L
H
L
H
L
X
X
ILLEGAL
L
H
L
L
X
X
X
ILLEGAL
L
L
X
X
X
X
X
NOP(Maintain Power Down Mode)
H
H
X
X
X
X
X
Refer to Table 1
H
L
H
X
X
X
X
Enter Power Down
8
8
H
L
L
H
H
H
X
Enter Power Down
H
L
L
H
H
L
X
ILLEGAL
H
L
L
H
L
X
X
ILLEGAL
H
L
L
L
H
H
RA
H
L
L
L
L
H
X
H
L
L
L
L
L
Row (& Bank ) Active
Enter Self Refresh
8
OPCODE MRS
L
L
X
X
X
X
X
NOP
H
H
X
X
X
X
X
Refer to Operations in Table 1
H
L
X
X
X
X
X
Begin Clock Suspend next cycle
9
L
H
X
X
X
X
X
Exit Clock Suspend next cycle
9
L
L
X
X
X
X
X
Maintain clock Suspend
Abbreviations : ABI = All Banks Idle
Note: 6. After CKE’s low to high transition to exit self refresh mode, a minimum of tRC(min) has to be elapse before issuing a
new command.
7. CKE low to high transition is asynchronous as if it restarts internal clock.
A minimum setup time “tSS + one clock” must be satisfied before any command can be issued other than exit.
8. Power-down and self refresh can be entered only when all the banks are in idle state.
9. Must be a legal command.
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(May, 2010, Version 0.4)
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AMIC Technology, Corp.
A43L4616A
Part Numbering Scheme
A43 X XX XX X X X X X X
Package Material
Blank: normal
F: PB free
Temperature
Blank : 0°C ~ 70 °C
U : -40°C ~ 85°C Industrial grade
A : -40 °C ~ 85 °C Automative grade
Speed
95: 105 MHz
75: 133 MHz
7: 143 MHz
6: 166 MHz
55: 183 MHz
5: 200 MHz
Package Type
V: TSOP
G: CSP
Device Version*
Mobile Function*
I/O Width
08: 8 I/O
16: 16 I/O
32: 32 I/O
Device Density
06: 1M
16: 2M
26: 4M
36: 8M
46: 16M
56: 32M
83: 256K
Operating Vcc
L: 3V~3.6V
P: 2.3V~2.7V
E: 1.7V~2.0V
Device Type
A43: AMIC SDRAM
* Optional
PRELIMINARY
(May, 2010, Version 0.4)
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AMIC Technology, Corp.
A43L4616A
Ordering Information
Part No.
Cycle Time (ns)
Clock Frequency (MHz)
Access Time
6
[email protected] CL = 3
5.4 ns
A43L4616AV-6F
Package
54 Pb-Free TSOP (II)
A43L4616AV-6UF
54 Pb-Free TSOP (II)
A43L4616AV-7F
54 Pb-Free TSOP (II)
A43L4616AV-7UF
7
[email protected] CL = 3
5.4 ns
A43L4616AV-7AF
54 Pb-Free TSOP (II)
54 Pb-Free TSOP (II)
A43L4616AV-75F
54 Pb-Free TSOP (II)
7.5
[email protected] CL = 3
A43L4616AV-75UF
5.4 ns
54 Pb-Free TSOP (II)
Note: -U is for industrial operating temperature range -40ºC to +85ºC.
-A is for automotive operating temperature range -40ºC to +85ºC.
PRELIMINARY
(May, 2010, Version 0.4)
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AMIC Technology, Corp.
A43L4616A
Package Information
unit: mm
TSOP 54L (Type II) Outline Dimensions
Detail "A"
1
E
28
E1
54
27
D
θ
A
A2
ZD
c
A1
b
D
e
0.10 C
L
C
Detail "A"
Dimensions in mm
Symbol
Min
Nom
Max
A
-
-
1.20
A1
0.05
-
0.15
A2
0.95
1.00
1.05
b
0.28
-
0.45
c
0.12
-
0.21
D
22.12
22.22
22.32
E
11.56
11.76
11.96
E1
10.06
10.16
10.26
L
0.40
0.50
0.60
e
θ
0.80 BSC
0°
-
ZD
8°
0.71 REF
Notes:
1. Dimension D does not include mold protrusions or gate burrs.
2. Dimension E1 does not include interlead mold protrusions.
3. Dimension b does not include damber protrusion / intrusion.
4. All dimensions and tolerances take reference to JEDEC MS-024 FA.
PRELIMINARY
(May, 2010, Version 0.4)
42
AMIC Technology, Corp.