Reliability Data Report Product Family R552 LT6654 / LT6656 / LT6657 Reliability Data Report Report Number: R552 Report generated on: Wed Apr 06 17:02:49 PDT 2016 OPERATING LIFE TEST PACKAGE TYPE SOT Totals SAMPLE SIZE 622 622 OLDEST DATE NEWEST DATE K DEVICE HRS CODE CODE (+125°C) 0935 - 1406 - 634 634 1 No. of FAILURES 2,3 0 0 HIGHLY ACCELERATED STRESS TEST AT +130 DEG C / 85% RH PACKAGE TYPE SOT Totals SAMPLE SIZE 541 541 OLDEST DATE NEWEST DATE K DEVICE HRS No. of FAILURES 4 CODE CODE (+85°C) 1010 - 1406 - 2093 2,093 0 0 K DEVICE HRS No. of FAILURES PRESSURE COOKER TEST AT 15 PSIG , +121 DEG C PACKAGE TYPE SAMPLE SIZE QFN/DFN 50 SOT Totals 2576 2,626 OLDEST DATE NEWEST DATE CODE CODE 1245 1245 1 0 0946 - 1411 - 116 117 0 0 OLDEST DATE NEWEST DATE K DEVICE No. of FAILURES CYCLES TEMP CYCLE FROM -65 TO 150 DEG C PACKAGE TYPE SAMPLE SIZE CODE CODE QFN/DFN 50 1245 1245 5 0 SOT Totals 2926 2,976 0946 - 1411 - 500 505 0 0 OLDEST DATE NEWEST DATE K DEVICE No. of FAILURES THERMAL SHOCK FROM -65 TO 150 DEG C PACKAGE TYPE SAMPLE SIZE CODE CODE CYCLES QFN/DFN SOT 50 2870 1245 0946 1245 1411 5 493 0 0 Totals 2,920 - - 498 0 OLDEST DATE NEWEST DATE K DEVICE HRS No. of FAILURES CODE CODE 1313 - 1313 - 154 154 0 0 HIGH TEMPERATURE BAKE AT 175 DEG C PACKAGE TYPE SOT Totals SAMPLE SIZE 154 154 (1) Assumes Activation Energy = 1.0 Electron Volts (2) Failure Rate Equivalent to +55 °C, 60% Confidence Level =2.89 FITS (3) Mean Time Between Failure in Years = 39479.88 (4) Assumes 20X Acceleration from 85 °C to +130 °C Note 1: 1 FIT = 1 Failure in One Billion Hours. Note 2: HAST, Temp Cycle & Thermal Shock are subjected to J-STD-020 MSL Preconditioning Reliability Data Report Report Number: R552 Report generated on: Wed Apr 06 17:02:49 PDT 2016 HIGH TEMPERATURE BAKE AT 150 DEG C PACKAGE TYPE SAMPLE SIZE OLDEST DATE NEWEST DATE QFN/DFN 50 SOT Totals K DEVICE HRS No. of FAILURES CODE CODE 1245 154 1010 1245 50 0 1010 154 204 - 0 - 204 0