IDT IDT709149S

IDT709149S
HIGH-SPEED 36K (4K x 9-BIT)
SYNCHRONOUS PIPELINED
DUAL-PORT SRAM
Features
◆
◆
◆
◆
◆
13ns cycle time, 76MHz operation in pipeline mode
– Self-timed write allows for fast cycle times
TTL-compatible, singles 5V (±10%) power supply
Clock Enable feature
Guaranteed data output hold times
Industrial temperature range (–40°C to +85°C) is available
for selected speeds.
◆
Architecture based on Dual-Port SRAM cells
– Allows full simultaneous access from both ports
High-speed clock-to-data output times
– Commercial: 8/10/12ns (max.)
Low-power operation
– IDT709149S
Active: 1500mW (typ.)
Standby: 75mW (typ.)
4K X 9 bits
Synchronous operation
– 4ns setup to clock, 1ns hold on all control, data, and
address inputs
– Data input, address, and control registers
– Fast 8ns clock to data out
◆
◆
◆
◆
Description
The IDT709149 is a high-speed 4K x 9 bit synchronous Dual-Port
SRAM. The memory array is based on Dual-Port memory cells to allow
simultaneous access from both ports. Registers on control, data, and
address inputs provide low set-up and hold times. The timing latitude
provided by this approach will allow systems to be designed with very
Functional Block Diagram
WRITE
LOGIC
SENSE
AMPS
MEMOR
MEMORY
YARRAY
ARRAY
DECODER DECODER
REG
en
OEL
CLKL
WRITE
LOGIC
REGISTER
REGISTER
I/O0-8L
I/O0-8R
FT/PIPEDR
0/1
0
SENSE
AMPS
1
REG
en
OER
CLKR
CLKENR
CLKENL
R/WL
REG
CEL
Selftimed
Write
Logic
Selftimed
Write
Logic
A0L-A11L A0R-A11R
REG
R/WR
CER
3494 drw 01
SEPTEMBER 1999
1
©1999 Integrated Device Technology, Inc.
DSC-3494/4
IDT709149S
High-Speed 36K (4K x 9-bit) Synchronous Pipelined Dual-Port Static RAM
short cycle times. This device has been optimized for applications
having unidirectional data flow or bi-directional data flow in bursts, by
utilizing input data registers.
The IDT709149 utilizes a 9-bit wide data path to allow for parity at
the user's option. This feature is especially useful in data communication applications where it is necessary to use a parity bit for transmission/reception error checking.
Industrial and Commercial Temperature Ranges
Fabricated using IDT’s CMOS high-performance technology, these
Dual-Ports typically operate on only 800mW of power at maximum
high-speed clock-to-data output times as fast as 8ns. An automatic
power down feature, controlled by CE, permits the on-chip circuitry
of each port to enter a very low standby power mode.
The IDT709149 is packaged in an 80-pin TQFP.
N/C
N/C
A5L
A4L
A3L
A2L
A1L
A0L
CLKENL
CLKL
CLKR
CLKENR
A0R
A1R
A2R
A3R
A4R
A5R
A6R
N/C
Pin Configurations(1,2,3)
Reference
N/C
A6L
A7L
A8L
A9L
A10L
A11L
N/C
OEL
VCC
VCC
R/WL
N/C
N/C
CEL
GND
I/O8L
I/O7L
I/O6L
N/C
1
2
80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61
60
59
3
58
4
57
5
56
6
55
7
IDT709149PF
PN80-1(4)
8
9
10
80-Pin TQFP
Top View(5)
11
12
54
53
52
51
50
49
13
48
14
47
15
46
16
45
17
44
18
43
19
42
20
41
21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40
N/C
A7R
A8R
A9R
A10R
A11R
N/C
,
OER
FT/PIPEDR
GND
GND
R/WR
N/C
N/C
CER
GND
I/O8R
I/O7R
I/O6R
N/C
N/C
N/C
I/O5L
VCC
I/O4L
I/O3L
I/O2L
I/O1L
I/O0L
GND
GND
I/O0R
I/O1R
I/O2R
I/O3R
VCC
I/O4R
I/O5R
N/C
N/C
3494 drw 02
NOTES:
1. All VCC pins must be connected to power supply.
2. All ground pins must be connected to ground supply.
3. Package body is approximately 14mm x 14mm x 1.4mm.
4, This package code is used to reference the package diagram.
5. This text does not indicate the orientaion of the actual part-marking.
6.42
2
IDT709149S
High-Speed 36K (4K x 9-bit) Synchronous Pipelined Dual-Port Static RAM
Absolute Maximum Ratings(1)
Symbol
Rating
Commercial
& Industrial
Unit
Terminal Voltage
with Respect
to GND
-0.5 to +7.0
V
V TERM(2)
Terminal Voltage
-0.5 to VCC
V
TBIAS
Temperature
Under Bias
-55 to +125
o
TSTG
Storage
Temperature
-55 to +125
o
IOUT
DC Output Current
V TERM(2)
Industrial and Commercial Temperature Ranges
Maximum Operating Temperature
and Supply Voltage(1,2)
Grade
GND
Vcc
0OC to +70OC
0V
5.0V + 10%
-40OC to +85OC
0V
5.0V + 10%
Ambient Temperature
Commercial
50
Industrial
C
3494 tbl 02
NOTES:
1. This is the parameter TA.
2. Industrial temperature: for specific speeds, packages and powers contact your
sales office.
C
mA
3494 tbl 01
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may
cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated in the
operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect reliability.
2. VTERM must not exceed Vcc + 10% for more than 25% of the cycle time or 10ns
maximum, and is limited to < 20mA for the period of VTERM > Vcc + 10%.
Recommended DC Operating
Conditions
Symbol
VCC
Supply Voltage
GND
Ground
V IH
Input High Voltage
V IL
Capacitance (TA = +25°C, f = 1.0MHz)
Symbol
Parameter
Conditions
Max.
Unit
CIN
Input Capacitance
VIN = 3dV
8
pF
COUT
Output Capacitance
VOUT = 3dV
9
pF
Parameter
Input Low Voltage
Min.
Typ.
Max.
Unit
4.5
5.0
5.5
V
0
0
0
V
2.2
____
(1)
-0.5
(2)
6.0
0.8
____
V
V
3494 tbl 03
NOTES:
1. VIL > -1.5V for pulse width less than 10ns.
2. VTERM must not exceed Vcc + 10%.
3494 tbl 04
NOTES:
1. These parameters are determined by device characterization, but are not production tested.
2. 3dV references the interpolated capacitance when the input and output switch from
0V to 3V or from 3V to 0V.
DC Electrical Characteristics Over the Operating
Temperature and Supply Voltage Range (VCC = 5.0V ± 10%)
709149S
Symbol
Parameter
Test Conditions
Min.
Max.
Unit
|ILI|
Input Leakage Current(1)
V CC = 5.5V, VIN = 0V to V CC
___
10
µA
|ILO|
Output Leakage Current
VOUT = 0V to V CC
___
10
µA
V OL
Output Low Voltage
IOL = +4mA
___
0.4
V
V OH
Output High Voltage
IOH = -4mA
2.4
___
V
3494 tbl 05
NOTE:
1. At V CC < 2.0V, input leakages are undefined
6.42
3
IDT709149S
High-Speed 36K (4K x 9-bit) Synchronous Pipelined Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
DC Electrical Characteristics Over the Operating
Temperature and Supply Voltage Range(4,5) (VCC = 5V ± 10%)
709149S8
Com'l Only
Symbol
Parameter
ICC
ISB 1
ISB 2
ISB 3
ISB 4
Test Condition
Version
709149S10
Com'l Only
709149S12
Com'l Only
Typ.
Max.
Typ.
Max.
Typ.
Max.
Unit
COM'L
____
320
____
310
____
300
mA
IND
____
____
____
____
____
____
Dynamic Operating
Current
(Both Ports Active)
CEL and CER = VIL,
Outputs Open
f = fMA X(1)
Standby Current
(Both Ports - TTL
Level Inputs)
CEL and CER = VIH
f = fMA X(1)
COM'L
____
150
____
150
____
140
IND
____
____
____
____
____
____
Standby Current
(One Port - TTL
Level Inputs)
CE"A " = VIL and CE"B" = VIH(3)
Active Port Outputs Open,
f=fMA X(1)
COM'L
____
230
____
220
____
210
IND
____
____
____
____
____
____
Full Standby Current
(Both Ports - All
CMOS Level Inputs)
CEL and
CER > VCC - 0.2V,
V IN > V CC - 0.2V or
V IN < 0.2V, f = 0(2)
COM'L
____
15
____
15
____
15
IND
____
____
____
____
____
____
Full Standby Current
(One Port - All
CMOS Level Inputs)
CE"A " < 0.2V and
CE"B " > VCC - 0.2V(3)
V IN > V CC - 0.2V or V IN < 0.2V
Active Port Outputs Open,
f = fMA X(1)
COM'L
____
220
____
210
____
200
IND
____
____
____
____
____
____
mA
mA
mA
mA
3494 tbl 0 6
NOTES:
1. At f = fMAX, address and control lines (except Output Enable) are cycling at the maximum frequency clock cycle of 1/tCLK, using "AC TEST CONDITIONS" at input levels of
GND to 3V.
2. f = 0 means no address, clock, or control lines change. Applies only to input at CMOS level standby.
3. Port "A" may be either left or right port. Port "B" is the opposite from port "A".
4. Vcc = 5V, TA = 25°C for Typ, and are not production tested. ICC DC = 150mA (Typ).
5. Industrial temperature: for specific speeds, packages and powers contact your sales office.
AC Test Conditions
Input Pulse Levels
GND to 3.0V
Input Rise/Fall Times
3ns Max.
Input Timing Reference Levels
1.5V
Output Reference Levels
1.5V
Output Load
Figures 1,2 and 3
8
3494 tbl 07
7
9pF is the I/O capacitance
of this device, and 30pF is the
AC Test Load Capacitance
6
5V
5V
893Ω
∆tCD
(Typical, ns)
893Ω
347Ω
30pF
4
3
2
DATAOUT
DATAOUT
5
347Ω
1
5pF*
0
3494 drw 03
Figure 1. AC Output Test load.
3494 drw 04
,
Figure 2. Output Test Load
(For tCKLZ , tCKHZ, tOLZ, and tOHZ).
*Including scope and jig.
6.42
4
-1
20 40 60 80 100 120 140 160 180 200
Capacitance (pF)
3494 drw 05
Figure 3. Typical Output Derating (Lumped Capacitive Load).
,
IDT709149S
High-Speed 36K (4K x 9-bit) Synchronous Pipelined Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
AC Electrical Characteristics Over the Operating Temperature Range—
(Read and Write Cycle Timing)(4)
(Commercial: V CC = 5V ± 10%, TA = 0°C to +70°C)
709149S8
Com'l Only
Symbol
tCYC1
tCYC2
tCH1
Parameter
Clock Cycle Time (Flow-Through) (3)
Clock Cycle Time (Pipelined)
(3)
709149S10
Com'l Only
709124S12
Com'l Only
Min.
Max.
Min.
Max.
Min.
Max.
Unit
16
____
20
____
20
____
ns
ns
13
____
15
____
16
____
(3)
6
____
7
____
8
____
ns
(3)
6
____
7
____
8
____
ns
Clock High Time (Flow-Through)
tCL1
Clock Low Time (Flow-Through)
tCH2
Clock High Time (Pipelined) (3)
6
____
6
____
6
____
ns
tCL2
(3)
6
____
6
____
6
____
ns
____
12
____
15
____
20
ns
____
8
____
10
____
12
ns
tCD1
Clock Low Time (Pipelined)
Clock to Data Valid (Flow-Through)
(3)
(3)
tCD2
Clock to Data Valid (Pipelined)
tS
Registered Signal Set-up Time
4
____
4
____
5
____
ns
tH
Registered Signal Hold Time
1
____
1
____
1
____
ns
tDC
Data Output Hold After Clock High
1
____
1
____
1
____
ns
2
____
2
____
2
____
ns
____
7
____
7
____
9
ns
____
8
____
8
____
10
ns
0
____
0
____
0
____
ns
____
7
____
7
____
9
ns
4
____
5
____
ns
ns
tCKLZ
Clock High to Output Low-Z
(1,2)
(1,2)
tCKHZ
Clock High to Output High-Z
tOE
Output Enable to Output Valid
tOLZ
(1,2)
Output Enable to Output Low-Z
(1,2)
tOHZ
Output Disable to Output High-Z
tSCK
Clock Enable, Disable Set-Up Time
4
____
tHCK
Clock Enable, Disable Hold Time
1
____
1
____
1
____
tCWDD
Write Port Clock High to Read Data Delay
____
25
____
30
____
35
ns
3494 tbl 08
NOTES:
1. Transition is measured ±200mV from Low or High-impedance voltage with the Output Test Load (Figure 2).
2. This parameter is guaranteed by device characterization, but is not production tested.
3. The Pipelined output parameters (tCYC2, t CD2) always apply to the Left Port. The Right Port uses the Pipelined tCYC2 and tCD2 when FT/PIPEDR = VIH and the FlowThrough parameters (t CYC1, tCD1 ) when FT/PIPEDR = VIL.
4. Industrial temperature: for specific speeds, packages and powers contact your sales office.
6.42
5
IDT709149S
High-Speed 36K (4K x 9-bit) Synchronous Pipelined Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
Timing Waveform of Read Cycle for Flow-Through Output on Right Port
(FT/PipedR = VIL)
tCYC1
tCH1
CLK
tCL1
tSCK
tHCK
tSCK
CLKEN
tS
tH
CE
R/W
ADDRESS
An
An + 1
An + 2
An + 3
tCKHZ (1)
tDC
tCD1
DATAOUT
Qn
Qn + 1
tCKLZ (1)
tOHZ
Qn + 1
(1)
tOLZ
(1)
tOE
OE
3494 drw 06
Timing Waveform of Left Port Write to Flow-Through Right Port Read
(FT/Piped R = V IL)(2,3)
CLK "L"
R/W "L"
ADDR "L"
DATA IN "L"
MATCH
NO
MATCH
VALID
VALID
tCCS
CLK "R"
R/W "R"
ADDR "R"
NO
MATCH
MATCH
tCWDD
tCD1
DATA OUT "R"
VALID
VALID
tDC
3494 drw 07
NOTES:
1. Transition is measured ±200mV from Low or High-impedance voltage with the Output Test Load (Figure 2).
2. CEL = CER = VIL, CLKENL = CLKENR = VIL
3. OE = VIL for the reading port, port 'R'.
6.42
6
IDT709149S
High-Speed 36K (4K x 9-bit) Synchronous Pipelined Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
Timing Waveform of Read Cycle for Pipelined Operation
(Left Port; Right Port when FT/PipedR = VIH)(3)
tCYC2
tCH2
tCL2
CLK
CE
tS
tH
tS
tH
tS
tH
R/W
An
ADDRESS
An + 1
(1 Latency)
An + 2
tDC
tCD2
DATAOUT
Qn
tCKLZ
OE
An + 3
tCD2
Qn + 1
(1)
tOHZ
Qn + 2
(1)
tOLZ
(1)
(2)
tOE
3494 drw 08
NOTES:
1. Transition is measured ±200mV from Low or High-impedance voltage with the Output Test Load (Figure 2).
2. OE is asynchronously controlled; all other inputs are synchronous to the rising clock edge.
3. CLKEN L and CLKENR = V IL.
6.42
7
IDT709149S
High-Speed 36K (4K x 9-bit) Synchronous Pipelined Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
Timing Waveform of Pipelined Read-to-Write-to-Read (OE = VIL)
tCYC2
tCH2
tCL2
CLK
CE
tS
tH
tS
R/W
ADDRESS
tS
tH
tH
An
tS tH
An +1
An + 2
tS
DATAIN
An + 4
An + 3
An + 2
tH
Dn + 2
tCD2
(2)
tCKHZ
(1)
(1)
tCKLZ
tCD2
Qn + 3
Qn
DATAOUT
(3)
READ
NOP
WRITE
READ
3494 drw 09
Timing Waveform of Pipelined Read-to-Write-to-Read (OE Controlled)
tCH2
tCYC2
tCL2
CLK
tS
tH
CE
tS
R/W
tS
tH
An
ADDRESS
tS
tH
An +1
An + 2
tH
tS
DATAIN
Dn + 3
Dn + 2
tCD2
(2)
An + 3
An + 4
An + 5
tH
tCKLZ(1)
tCD2
Qn
DATAOUT
Qn + 4
(1)
tOHZ
OE
WRITE
READ
NOTES:
1. Transition is measured ±200mV from Low or High-impedance voltage with the Output Test Load (Figure 2).
2. Output state (High, Low, or High-impedance) is determined by the previous cycle control signals.
3. "NOP" is "No Operation." Data in memory at the selected address may be corrupted and should be re-written to guarantee data integrity.
6.42
8
READ
3494 drw 10
IDT709149S
High-Speed 36K (4K x 9-bit) Synchronous Pipelined Dual-Port Static RAM
Functional Description
The IDT709149 provides a true synchronous Dual-Port Static RAM
interface. Registered inputs provide very short set-up and hold times
on address, data, and all critical control inputs. All internal registers are
clocked on the rising edge of the clock signal. An asynchronous output
enable is provided to ease asynchronous bus interfacing.
The internal write pulse width is dependent only on the low to high
transitions of the clock signal to initiate a write allowing the shortest
Industrial and Commercial Temperature Ranges
possible realized cycle times. Clock enable inputs are provided to stall
the operation of the address and data input registers without introducing clock skew for very fast interleaved memory applications.
A HIGH on the CE input for one clock cycle will power down the
internal circuitry to reduce static power consumption.
When piplelined mode is enabled, two cycles are required with
CE LOW to reactivate the outputs.
Truth Table I: Read/Write Control(1)
Inputs
Synchronous(3)
Outputs
Asynchronous
Mode
CLK
CE
R/W
OE
I/O 0-8
↑
H
X
X
High-Z
Deselected—Power Down
↑
L
L
X
DATAIN
Selected and Write Enable
↑
L
H
L
DATA OUT
↑
X
X
H
High-Z
Read Selected and Data Output Enabled Read (1 Latency)
Data I/O Disabled
3494 tbl 09
Truth Table II: Clock Enable Function Table(1)
Inputs
Register Outputs(4)
Register Inputs
Operating Mode
CLK(3)
CLKEN(2)
ADDR
DATAIN
ADDR
DATAOUT
Load "1"
↑
L
H
H
H
H
Load "0"
↑
L
L
L
L
L
Hold (do nothing)
↑
H
X
X
NC
NC
X
H
X
X
NC
NC
3494 tbl 10
NOTES:
1. 'H' = HIGH voltage level steady state, 'h' = HIGH voltage level one set-up time prior to the LOW-to-HIGH clock transition, 'L' = LOW voltage level steady state 'l' = LOW voltage
level one set-up time prior to the LOW-to-HIGH clock transition, 'X' = Don't care, 'NC' = No change
2. CLKEN = VIL must be clocked in during Power-Up.
3. Control signals are initialted and terminated on the rising edge of the CLK, depending on their input level. When R/W and CE are LOW, a write cycle is initiated on the LOWto-HIGH transition of the CLK. Termination of a write cycle is done on the next LOW-to-HIGH transistion of the CLK.
4. The register outputs are internal signals from the register inputs being clocked in or disabled by CLKEN.
6.42
9
IDT709149S
High-Speed 36K (4K x 9-bit) Synchronous Pipelined Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
Ordering Information
IDT
XXXX
A
999
A
A
Device
Type
Power
Speed
Package
Process/
Temperature
Range
Blank
Commercial (0°C to +70°C)
PF
80-pin TQFP (PN80-1)
8
10
12
Commercial Only
Commercial Only
Commercial Only
S
Standard Power
709149
36K (4K x 9-Bit) Synchronous
Pipelined Dual-Port RAM
Speed in nanoseconds
3494 drw 11
NOTE:
1. Industrial temperature range is available.
For specific speeds, packages and poewrs contact your sales office.
Datasheet Document History
3/8/99:
6/3/99:
9/1/99:
Initiated datasheet document history
Converted to new format
Cosmetic and typographical corrections
Added additional notes to pin configurations
Changed drawing format
Removed Preliminary
CORPORATE HEADQUARTERS
2975 Stender Way
Santa Clara, CA 95054
for SALES:
800-345-7015 or 408-727-6116
fax: 408-492-8674
www.idt.com
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
6.42
10
for Tech Support:
831-754-4613
[email protected]