INTERSIL HI1172JCB

HI1172
TM
Data Sheet
6-Bit, 20MSPS, Video A/D Converter
(CMOS)
HI1172 is a 6-bit, CMOS A/D converter for video use. The
adoption of a 2-step parallel conversion achieves speeds of
20MSPS minimum, 35MSPS typical.
Ordering Information
PART
NUMBER
-20 to 75
File Number
4102.2
Features
• Resolution . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-Bit
• Maximum Sampling Frequency . . . . . . . . . . . . . .20MSPS
• Low Power Consumption at 20MSPS (Typ)
(Reference Current Excluded) . . . . . . . . . . . . . . . . .40mW
• Built-In Sample and Hold Circuit
TEMP. RANGE
(oC)
HI1172JCB
September 2000
PACKAGE
16 Ld SOIC
PKG. NO.
M16.2-S
• Three-State TTL Compatible Output
• Power Supply . . . . . . . . . . . . . . . . . . . . . . . . . . . 5V Single
• Low Input Capacitance . . . . . . . . . . . . . . . . . . . . . . . . .4pF
Pinout
• Reference Impedance . . . . . . . . . . . . . . . . . . . 250Ω (Typ)
HI1172 (SOIC)
TOP VIEW
Applications
D0 1
16 AVSS
• Video Digitizing
D1 2
15 DVDD
• Wireless Communications
D2 3
14 AVDD
D3 4
13 VRB
D4 5
12 VIN
D5 6
11 VRT
CLK 7
10 AVDD
DVSS 8
9 DVDD
Related Literature
• Technical Brief TB363 “Guidelines for Handling and
Processing Moisture Sensitive Surface Mount Devices
(SMDs)”
Functional Block Diagram
REFERENCE VOLTAGE
D0
1
D1
2
D2
3
D3
4
D4
5
D5
6
CLK
7
DVSS
8
16 AVSS
LOWER
DATA
LATCHES
LOWER
ENCODER
(3-BIT)
LOWER
COMPARATORS WITH
S/H (3-BIT)
15 DVDD
14 AVDD
13 VRB
UPPER
DATA
LATCHES
LOWER
ENCODER
(3-BIT)
LOWER
COMPARATORS WITH
S/H (3-BIT)
UPPER
ENCODER
(3-BIT)
UPPER
COMPARATORS WITH
S/H (3-BIT)
12 VIN
11 VRT
10 AVDD
9
DVDD
CLOCK GENERATOR
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
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HI1172
Typical Application Circuit
(LSB) D0
D1
+5V
D2
D3
VRB
D4
VIN
(MSB) D5
VRT
+
C4
C3
+5V
CLK
+5V
+
C1
+
-
0.1
C2
VRT
+
+
VRB
-
-
0.1
Pin Descriptions
PIN
NUMBER
SYMBOL
1 to 6
D0 to D5
EQUIVALENT CIRCUIT
DESCRIPTION
D0 (LSB) to D5 (MSB) Output.
D1
7
CLK
Clock Input.
DVDD
7
DVSS
8
DVSS
Digital GND.
9, 15
DVDD
Digital +5V.
10, 14
AVDD
Analog +5V.
11
VRT
13
VRB
Reference Voltage (Top).
AVDD
Reference Voltage (Bottom).
11
13
AVSS
12
VIN
AVDD
Analog Input.
12
AVSS
16
AVSS
Analog GND.
2
VIN
HI1172
Absolute Maximum Ratings
TA = 25oC
Thermal Information
Thermal Resistance (Typical, Note 1)
θJA (oC/W)
SOIC Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
120
Maximum Junction Temperature (Plastic Package) . . . . . . . .150oC
Maximum Storage Temperature Range . . . . . . . . . . -65oC to 150oC
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . .300oC
(SOIC - Lead Tips Only)
Supply Voltage (VDD). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7V
Reference Voltage (VRT, VRB). . . . . . . . . . . . . . . . . . . . VDD to VSS
Analog Input Voltage (VIN). . . . . . . . . . . . . . . . . . . . . . . VDD to VSS
Digital Input Voltage (CLK). . . . . . . . . . . . . . . . . . . . . . . VDD to VSS
Digital Output Voltage (VOH , VOL). . . . . . . . . . . . . . . . . VDD to VSS
Operating Conditions
Supply Voltage Range, AVDD, AVSS . . . . . . . . . . . . 4.75V to 5.25V
Reference Voltage, DVDD, DVSS
VRT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.9V to 5V
VRB . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0V to 4.1V
VRT - VRB. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.9V to AVDD
Analog Input Voltage (VIN). . . . . . . . . . . . . . . . . . . . . . . VRB to VRT
Clock Pulse Width
tPW1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25ns (Min)
tPW0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25ns (Min)
Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . . . -20oC to 75oC
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. θJA is measured with the component mounted on an evaluation PC board in free air.
VDD = +5V, VRB = 1V, VRT = 2V, TA = 25oC
Electrical Specifications
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNITS
0.5
-
20
MSPS
Conversion Speed, fC
fC
VIN = 1V to 2V
fIN = 1kHz Ramp
Integral Non-Linearity
EL
fC = 20MSPS
VIN = 1V to 2V
-
±0.3
±0.5
LSB
Differential Non-Linearity
ED
fC = 20MSPS
VIN = 1V to 2V
-
±0.3
±0.5
LSB
Supply Current
IDD
fC = 20MSPS
NTSC Ramp Wave Input
-
7
12
mA
Reference Pin Current
IREF
3
4
5.7
mA
Analog Input (-1dB)
BW
-
18
-
MHz
Analog Input Capacitance
CIN
-
4
-
pF
RREF
175
250
325
Ω
EOT
0
-20
-40
mV
EOB
15
35
55
mV
VIH
4.0
-
-
V
VIL
-
-
1.0
V
VIH = VDD
-
-
5
µA
VIL = 0V
-
-
5
µA
VOH = VDD = 0.5V
-1.1
-
-
mA
VOL = 0.4V
3.7
-
-
mA
Reference Resistance (VRT to VRB)
Offset Voltage
Digital Input Voltage
Digital Input Current
IIH
VIN = 1.5V + 0.07VRMS
VDD = Max
IIL
Digital Output Current
IOH
IOL
VDD = Min
Output Data Delay
TDL
With TTL 1 Gate and 10pF Load
-
18
30
ns
Differential Gain Error
DG
NTSC 40 IRE Mod
-
1.0
-
%
Differential Phase Error
DP
Ramp, fC = 14.3MSPS
-
1.0
-
deg
Aperture Jitter
tAJ
-
40
-
ps
Sampling Delay
tSD
-
4
-
ns
3
HI1172
Test Circuits
+V
S2
-
S1 : ON IF A < B
S2 : ON IF B > A
S1
+
-V
A<B
A>B
COMPARATOR
VIN
DUT
HI1172
6
“0”
A6
B6
A1
A0
B1
B0
6
BUFFER
“1”
DVM
000 • • • 00
TO
111 • • • 10
6
CLK (20MHz)
CONTROLLER
FIGURE 1. INTEGRAL NON-LINEARITY ERROR, DIFFERENTIAL NON-LINEARITY, OFFSET VOLTAGE
2V
ERROR RATE
fC -1kHz
SG
HPF
1V
1
100
IAE
0
-40
SG
(CW)
VIN
AMP
2
NTSC
SIGNAL
SOURCE
6
TTL
HI1172
1
6
10-BIT
D/A
ECL
40 IRE
MODULATION
COUNTER
HI20201
620
2
CLK
VECTOR
SCOPE
2V
BURST
DG
DP
-5.2V
620
1V
SYNC
-5.2V
TTL
fC
ECL
FIGURE 2. MAXIMUM OPERATIONAL SPEED, DIFFERENTIAL GAIN ERROR, DIFFERENTIAL PHASE ERROR
I
2.0V
VDD
VRT
2.0V
IOL
VIN
1.0V
1.0V
CLK
VRB
CLK
VOL
VOH
+
-
GND
FIGURE 3. DIGITAL OUTPUT CURRENT TEST CIRCUIT
4
IOH
VIN
VRB
GND
VDD
VRT
+
-
HI1172
Timing Diagrams
tPW1
tPW0
CLOCK
ANALOG INPUT
DATA OUTPUT
N
N+1
N-3
N+3
N-2
N-1
N-2
N+4
N
N+1
tD = 18ns
FIGURE 4. TIMING CHART 1
VI (1)
VI (2)
VI (3)
VI (4)
ANALOG INPUT
EXTERNAL CLOCK
UPPER COMPARATOR BLOCK
S (1)
S (1)
DIGITAL OUTPUT
S (3)
C (1)
C (0)
RV (3)
H (3)
C (3)
LD (1)
S (2)
LD (-2)
OUT (-2)
C (4)
MD (3)
S (3)
LD (-1)
H (0)
S (4)
RV (2)
H (2)
C (2)
LD (0)
OUT (-1)
FIGURE 5. TIMING CHART 2
5
C (3)
MD (2)
RV (1)
H (1)
LOWER DATA A
LOWER DATA B
C (2)
MD (1)
RV (0)
LOWER REFERENCE VOLTAGE
LOWER COMPARATOR BLOCK B
S (2)
MD (0)
UPPER DATA
LOWER COMPARATOR BLOCK A
C (1)
S (4)
H (4)
LD (2)
OUT (0)
OUT (1)
HI1172
Digital Output
Compatibility between analog input voltage and the digital
output code is indicated in the chart below.
DIGITAL OUTPUT CODE
INPUT SIGNAL
VOLTAGE
STEP
MSB
VRT
0
1
•
•
•
•
•
•
•
•
•
•
31
1
0
0
0
0
1
•
32
0
1
1
1
1
1
•
•
•
•
•
•
•
•
•
VRB
63
Operation
0
LSB
1
0
1
0
1
1
1
Notes On Operation
0
0
0
(See Block Diagram and Waveform)
The HI1172 is a 2-step parallel system A/D converter
featuring a 3-bit upper comparators group and 2 lower
comparators groups of 3-bit each. The reference voltage that
is equal to the voltage between VRT-VRB/8 is constantly
applied to the upper 3-bit comparator block. Voltage that
corresponded to the upper data is fed through the reference
supply to the lower data.
This IC uses an offset cancel type comparator and operates
synchronously with an external clock. It features the
following operating modes which are respectively indicated
on the timing chart with S, H, C symbols, i.e., input sampling
(auto zero) mode, input hold mode and comparison mode.
The operation of respective parts is as indicated in the chart.
Input voltage Vi (1) is sampled with the falling edge of the
first clock by means of the upper comparator block and the
lower comparator A block.
6
The upper comparators block finalizes comparison data MD
(1) with the rising edge of the first clock. simultaneously the
reference supply generates the lower reference voltage RV
(1) that corresponded to the upper results. The lower
comparator block finalizes comparison data LD (1) with the
rising edge of the second clock. MD (1) and LD (1) are
combined and output as Out (1) with the rising edge of the
3rd clock. Accordingly there is a 2.5 clock delay from the
analog input sampling point to the digital data output.
• VDD, VSS - To reduce noise effects, separate the
analog and digital systems close to the device. For both
the digital and analog VDD pins, use a ceramic
capacitor of about 0.1µF set as close as possible to the
pin to bypass to the respective GNDs.
• Analog Input - Compared with a flash type A/D
converter, the input capacitance of the analog input is
rather small. However it is necessary to drive with an
amplifier featuring sufficient bandwidth and drive
capability. When driving with an amplifier of low output
impedance, parasitic oscillation may occur. That may
be prevented by inserting a resistance of about 100Ω in
series between the amplifier output and A/D input.
• Clock Input - The clock line wiring should be as short
as possible. Also, to avoid any interference with other
signals, separate it from the other circuits.
• Reference Input - Voltage between VRT to VRB is
compatible with the dynamic range of the analog input.
By bypassing VRT and VRB pins to GND with a
capacitor of about 0.1µF, stable characteristics are
obtained.
• Timing - Analog input is sampled with the falling edge
of CLK and output as digital data with a delay of 2.5
clocks and with the following rising edge. The delay
from the clock rising edge to the data output is about
18ns.
• About Latch Up - It is necessary that AVDD and DVDD
pins to be the common source of power supply. This is
to avoid latch up due to the voltage difference between
AVDD and DVDD pins when power is ON.
HI1172
Small Outline Plastic Packages (SOIC)
M16.2-S
N
INDEX
AREA
1
2
16 LEAD SMALL OUTLINE PLASTIC PACKAGE (200 MIL)
H
INCHES
E
3
L
SEATING PLANE
D
A
e
A1
B
SYMBOL
MIN
MAX
MIN
MAX
NOTES
A
0.067
0.078
1.70
2.00
-
A1
0.002
0.011
0.05
0.30
-
B
0.014
0.021
0.35
0.55
-
C
0.006
0.011
0.15
0.30
-
D
0.386
0.405
9.80
10.30
1
E
0.205
0.220
5.20
5.60
2
e
α
C
0.15(0.006)
0.24 M
MILLIMETERS
0.050 BSC
1.27 BSC
-
H
0.296
0.326
7.50
8.3
-
L
0.012
0.027
0.30
0.70
3
10o
0o
N
α
16
0o
16
4
10o
Rev. 0 2/96
NOTES:
1. Dimension “D” does not include mold flash, protrusions or gate burrs.
2. Dimension “E” does not include interlead flash or protrusions.
3. “L” is the length of terminal for soldering to a substrate.
4. “N” is the number of terminal positions.
5. Terminal numbers are shown for reference only.
6. Controlling dimension: MILLIMETER. Converted inch dimensions
are not necessarily exact.
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site www.intersil.com
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