IDT 841S012BKILF

Crystal-to-0.7V Differential HCSL/
LVCMOS Frequency Synthesizer
ICS841S012I
DATA SHEET
NRND
GENERAL DESCRIPTION
FEATURES
The ICS841S012I is an optimized PCIe, sRIO and
ICS
Gigabit Ethernet Frequency Synthesizer and a
HiPerClockS™ member of HiperClock s™ family of high performance clock solutions from IDT. The ICS841S012I
uses a 25MHz parallel resonant crystal to generate 33.33MHz - 200MHz clock signals, replacing multiple
oscillator and fanout buffer solutions. The device supports
±0.25% center-spread, and -0.5% down- spread clocking with
two spread select pins (SSC[1:0]). The VCO operates at a frequency of 2GHz. The device has three output banks: Bank A
with two HCSL outputs, 100MHz – 250MHz; Bank B with seven
33.33MHz – 200MHz LVCMOS/ LVTTL outputs; and Bank C
with one 33.33MHz – 200MHz LVCMOS/LVTTL output.
• Two 0.7V differential HCSL outputs (Bank A), configurable for
PCIe (100MHz or 250MHz) and sRIO (100MHz or 125MHz)
clock signals
Eight LVCMOS/LVTTL outputs (Banks B/C),
18Ω typical output impedance
Two REF_OUT LVCMOS/LVTTL clock outputs,
23Ω typical output impedance
• Selectable crystal oscillator interface, 25MHz, 18pF parallel
resonant crystal or one LVCMOS/LVTTL single-ended
reference clock input
• Supports the following output frequencies:
HCSL Bank A: 100MHz, 125MHz, 200MHz and 250MHz
LVCMOS/LVTTL Bank B/C: 33.33MHz, 50MHz, 66.67MHz,
100MHz, 125MHz, 133.33MHz, 166.67MHz and 200MHz
All Banks A, B and C have their own dedicated frequency
select pins and can be independently set for the frequencies
mentioned above. The low jitter character istic of the
ICS841S012I makes it an ideal clock source for PCIe, sRIO
and Gigabit Ethernet applications. Designed for networking and
industrial applications, the ICS841S012I can also drive the highspeed clock inputs of communication processors, DSPs,
switches and bridges.
• VCO: 2GHz
• Spread spectrum clock: ±0.25% center-spread (typical) and
-0.6% down-spread (typical)
• PLL bypass and output enable
• RMS period jitter: 20ps (typical), QB outputs
• Full 3.3V supply mode
• -40°C to 85°C ambient operating temperature
• Available in lead-free (RoHS 6) package
• Not Recommended for New Designs
VDDOB
VDDOB
QB6
GND
QB5
VDDOB
QB4
GND
QB3
VDDOB
QB2
GND
QB1
QB0
PIN ASSIGNMENT
56 55 54 53 52 51 50 49 48 47 46 45 44 43
42
VDD
REF_OUT0
1
2
REF_OUT1
GND
GND
3
4
5
6
7
8
9
10
11
ICS841S012BKI REVISION A NOVEMBER 10, 2009
1
56-Lead VFQFN
8mm x 8mm x 0.925mm
package body
K Package
Top View
37
36
35
34
33
32
31
30
29
VDDOC
QC
GND
QBC_OE
VDDA
VDDA
GND
GND
IREF
QA0
nQA0
QA1
nQA1
VDD
GND
VDD
F_SELB2
F_SELB1
F_SELB0
F_SELC2
F_SELC1
F_SELC0
F_SELA1
F_SELA0
QA_OE
12
13
14
15 16 17 18 19 20 21 22 23 24 25 26 27 28
GND
REF_OE
nMR
VDD
40
39
38
ICS841S012I
SSC1
SSC0
REF_IN
VDD
REF_SEL
XTAL_IN
XTAL_OUT
BYPASS
41
©2009 Integrated Device Technology, Inc.
ICS841S012I Data Sheet
CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER
BLOCK DIAGRAM
QA_OE
Pullup
F_SELA[1:0]
Pulldown
BYPASS
Pulldown
2
QA0
nQA0
÷NA
25MHz
XTAL_IN
OSC
nQA1
1
0
PLL
VCO
XTAL_OUT
QB0
2GHz
REF_IN
Pulldown
REF_SEL
Pulldown
QA1
0
1
QB1
QB2
M = ÷80
QB3
÷NB
QB4
F_SELB[2:0]
Pulldown
3
QB5
IREF
QB6
÷NC
F_SELC[2:0]
Pulldown
nMR
Pullup
QBC_OE
Pullup
SSC[1:0]
Pullup
QC
3
2
Spread
Spectrum
REF_OUT0
REF_OUT1
REF_OE
Pulldown
ICS841S012BKI REVISION A NOVEMBER 10, 2009
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©2009 Integrated Device Technology, Inc.
ICS841S012I Data Sheet
CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER
TABLE 1. PIN DESCRIPTIONS
Number
Name
1, 7, 14, 28, 29
2,
3
4, 5, 15, 27,
35, 36, 40, 46,
50, 54
6
VDD
REF_OUT0,
REF_OUT1
Type
Power
Core supply pins.
Single-ended LVCMOS/LVTTL reference clock outputs.
23Ω typical output impedance.
Output
GND
Power
REF_IN
Input
8
REF_SEL
Input
9,
10
XTAL_IN,
XTAL_OUT
Input
11
BYPASS
Input
12
REF_OE
Input
13
nMR
Input
16,
17
18,
19,
20
21,
22,
23
24,
25
SSC1,
SSC0
F_SELB2,
F_SELB1,
F_SELB0
F_SELC2,
F_SELC1,
F_SELC0
F_SELA1,
F_SELA0
26
Description
Power supply ground.
Pulldown Single-ended LVCMOS/LVTTL reference clock input.
Reference select pin. When HIGH selects REF_IN. When LOW,
Pulldown
selects crystal. LVCMOS/LVTTL interface levels. See Table 3E.
Crystal oscillator interface. XTAL_OUT is the output. XTAL_IN is the input.
External tuning capacitor must be used for proper operation.
When HIGH bypasses PLL. When LOW, selects PLL.
Pulldown
LVCMOS/LVTTL interface levels. See Table 3J.
Active HIGH REF_OUT enables/disables pin.
Pulldown
LVCMOS/LVTTL interface levels. See Table 3H.
Active LOW Master Reset. When logic LOW, the internal dividers are reset
and the outputs are in high impedance (HI-Z). When logic HIGH, the
Pullup
internal dividers and the outputs are enabled. LVCMOS/LVTTL interface
levels. See Table 3I.
Input
Pullup
SSC control pin. LVCMOS/LVTTL interface levels. See Table 3D.
Input
Pulldown
Frequency select pins for QBx outputs. See Table 3B.
LVCMOS/LVTTL interface levels.
Input
Pulldown
Frequency select pins for QC output. See Table 3C.
LVCMOS/LVTTL interface levels.
Input
Pulldown
QA_OE
Input
Pullup
30, 31
32, 33
nQA1, QA1
nQA0, QA0
Output
34
IREF
Output
37, 38
VDDA
Power
39
QBC_OE
Input
41
QC
Output
42
VDDOC
Power
Frequency select pins for QAx/nQAx outputs. See Table 3A.
LVCMOS/LVTTL interface levels.
Output enable pin for Bank A outputs.
LVCMOS/LVTTL interface levels. See Table 3F.
Differential Bank A clock outputs. HCSL interface levels.
Pullup
External fixed precision resistor (475Ω) from this pin to ground provides a
reference current used for differential current-mode QAx/nQAx clock
outputs.
Analog supply pin.
Output enable pin for Bank B and Bank C outputs.
LVCMOS/LVTTL Interface levels. See Table 3G.
Single-ended Bank C clock output. LVCMOS/LVTTL interface levels. 18Ω
typical output impedance.
Output supply pin for QC LVCMOS output.
43, 48, 52, 56
VDDOB
Power
Output supply pins for QBx LVCMOS outputs.
44, 45,
QB0, QB1,
Single-ended Bank B clock outputs. LVCMOS/LVTTL interface levels. 18Ω
47, 49,
QB2, QB3,
Output
typical output impedance.
51, 53, 55
QB4, QB5, QB6
NOTE: Pullup and Pulldown refer to internal input resistors. See Table 2, Pin Characteristics, for typical values.
ICS841S012BKI REVISION A NOVEMBER 10, 2009
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©2009 Integrated Device Technology, Inc.
ICS841S012I Data Sheet
CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER
TABLE 2. PIN CHARACTERISTICS
Symbol
Parameter
CIN
Input Capacitance
Test Conditions
CPD
Power Dissipation
Capacitance
QB[0:6], QC
Minimum
Typical
VDD, VDDOB, VDDOC = 3.465V
Maximum
Units
4
pF
4
pF
RPULLUP
Input Pullup Resistor
51
kΩ
RPULLDOWN
Input Pulldown Resistor
51
kΩ
ROUT
Output Impedance
QB[0:6], QC
18
Ω
REF_OUT[1:0]
23
Ω
TABLE 3A. F_SELA FREQUENCY SELECT FUNCTION TABLE
Inputs
Output Frequency (25MHz Ref.)
F_SELA1
F_SELA0
M Divider Value
NA Divider Value
QA[0:1]/nQA[0:1] (MHz)
L
L
80
20
100 (default)
L
H
80
16
125
H
L
80
10
200
H
H
80
8
250
TABLE 3B. F_SELB FREQUENCY SELECT FUNCTION TABLE
Inputs
Output Frequency (25MHz Ref.)
F_SELB2
F_SELB1
F_SELB0
M Divider Value
NB Divider Value
QB[0:6] (MHz)
L
L
L
80
60
33.33 (default)
L
L
H
80
40
50
L
H
L
80
30
66.67
L
H
H
80
20
10 0
H
L
L
80
16
125
H
L
H
80
15
133.33
H
H
L
80
12
166.67
H
H
H
80
10
200
TABLE 3C. F_SELC FREQUENCY SELECT FUNCTION TABLE
Inputs
Output Frequency (25MHz Ref.)
F_SELC2
F_SELC1
F_SELC0
M Divider Value
NC Divider Value
QC (MHz)
L
L
L
80
60
33.33 (default)
L
L
H
80
40
50
L
H
L
80
30
66.67
L
H
H
80
20
100
H
L
L
80
16
125
H
L
H
80
15
133.33
H
H
L
80
12
166.67
H
H
H
80
10
200
ICS841S012BKI REVISION A NOVEMBER 10, 2009
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©2009 Integrated Device Technology, Inc.
ICS841S012I Data Sheet
CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER
TABLE 3D. SSC FUNCTION TABLE
TABLE 3E. REF_SEL FUNCTION TABLE
Input
Input
SSC1
0
SSC0
0
0
1
1
0
±0.25% Center-spread
1
1
SSC Off (default)
REF_SEL
0 (default)
Mode
0 to -0.5% Down-spread
1
±0.25% Center-spread
TABLE 3F. QA_OE FUNCTION TABLE
Input Reference
XTAL
REF_IN
TABLE 3G. QBC_OE FUNCTION TABLE
Input
QA_OE
0
1 (default)
Input
Function
QBC_OE
0
Function
QA[0:1]/nQA[0:1] disabled (High-Impedance)
QA[0:1]/nQA[0:1] enabled
1 (default)
QB[0:6] and QC enabled
TABLE 3H. REF_OE FUNCTION TABLE
TABLE 3I. nMR FUNCTION TABLE
Input
REF_OE
0 (default)
1
QB[0:6] and QC disabled (High-Impedance)
Input
Function
Function
Device reset, output divider disabled
0
(High-Impedance)
1 (default) Output enabled
NOTE: This device requires a reset signal after power-up to
function properly.
nMR
REF_OUT[0:1] disabled (High-Impedance)
REF_OUT[0:1] enabled
TABLE 3J. BYPASS FUNCTION TABLE
Input
BYPASS
0 (default)
1
Function
PLL
Bypass (reference ÷N)
ICS841S012BKI REVISION A NOVEMBER 10, 2009
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©2009 Integrated Device Technology, Inc.
ICS841S012I Data Sheet
CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER
ABSOLUTE MAXIMUM RATINGS
Supply Voltage, VDD
4.6V
Inputs, VI
-0.5V to VDD + 0.5 V
Outputs, VO
-0.5V to VDDO + 0.5V
NOTE: Stresses beyond those listed under Absolute
Maximum Ratings may cause permanent damage to the
device. These ratings are stress specifications only. Functional operation of product at these conditions or any conditions beyond
those listed in the DC Characteristics or AC Characteristics is not
implied. Exposure to absolute maximum rating conditions for extended periods may affect product reliability.
Package Thermal Impedance, θJA 31.4°C/W (0 mps)
Storage Temperature, TSTG
-65°C to 150°C
TABLE 4A. POWER SUPPLY DC CHARACTERISTICS, VDD = VDDOB = VDDOC = 3.3V±5%, TA = -40°C TO 85°C
Symbol
VDD
Parameter
Core Supply Voltage
VDDA
Test Conditions
Minimum
3.135
Typical
3.3
Maximum
3.465
Units
V
Analog Supply Voltage
VDD – 0.20
3.3
VDD
V
VDDOB, VDDOC
Output Supply Voltage
3.135
3.3
3.465
V
IDD
Power Supply Current
330
mA
IDDA
Analog Supply Current
20
mA
Maximum
Units
HCSL Loaded, LVCMOS No Load
TABLE 4B. LVCMOS/LVTTL DC CHARACTERISTICS, VDD = VDDOB = VDDOC = 3.3V±5%, TA = -40°C TO 85°C
Symbol Parameter
Test Conditions
Minimum Typical
VIH
Input High Voltage
2
VDD + 0.3
V
VIL
Input Low Voltage
-0.3
0.8
V
VDD = VIN = 3.465V
10
µA
VDD = VIN = 3.465V
150
µA
IIH
IIL
Input
High Current
Input
Low Current
QA_OE, QBC_OE,
nMR, SSC0, SSC1,
F_SELA[0:1], F_SELB[0:2].
F_SELC[0:2], REF_OE,
BYPASS, REF_IN, REF_SEL
QA_OE, QBC_OE,
nMR, SSC0, SSC1,
VDD = 3.465V, VIN = 0V
-150
µA
F_SELA[0:1], F_SELB[0:2].
F_SELC[0:2], REF_OE,
BYPASS, REF_IN, REF_SEL
VDD = 3.465V, VIN = 0V
-10
µA
2.6
V
VOH
Output High Voltage
VDDOB, VDDOC = IOH = -2mA
VOL
Output Low Voltage
VDDOB, VDDOC = IOL = 2mA
0.5
V
TABLE 5. CRYSTAL CHARACTERISTICS
Parameter
Test Conditions
Mode of Oscillation
Minimum
Typical
Maximum
Units
Fundamental
Frequency
25
MHz
Equivalent Series Resistance (ESR)
50
Ω
Shunt Capacitance
7
pF
100
µW
Drive Level
NOTE: Characterized using an 18pF parallel resonant cr ystal.
ICS841S012BKI REVISION A NOVEMBER 10, 2009
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©2009 Integrated Device Technology, Inc.
ICS841S012I Data Sheet
CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER
TABLE 6. AC CHARACTERISTICS, VDD = VDDOB = VDDOC = 3.3V±5%, TA = -40°C TO 85°C
Symbol
Parameter
Test Conditions
QB[0:6]
fOUT
Output Frequency
QA[0:1]/nQA[0:1]
QC
tsk(b)
Bank Skew;
NOTE 1, 2
Minimum
Maximum
Units
33.33
200
MHz
10 0
250
MHz
33.33
200
MHz
80
ps
QB[0:6]
QA[0:1]/nQA[0:1]
50
ps
Across Banks B and C
(at Same Frequency)
160
ps
65
ps
All Outputs at Same Frequency
100
ps
QC
100
ps
QA[0:1]/nQA[0:1]
10
ps
20
ps
29
33.33
kHz
510
1200
mV
tsk(o)
Output Skew; NOTE 1, 3
tjit(cc)
Cycle-to-Cycle
Jitter ; NOTE 1
QA[0:1]/nQA[0:1]
tjit(per)
FM
VHIGH
VLOW
VCROSS
ΔVCROSS
tR / tF
RMS Period Jitter
Typical
QB[0:6]
QB[0:6], QC
SSC Modulation
Banks A, B, C
Frequency
Voltage High; NOTE 4, 5
Voltage Low; NOTE 4, 6
Absolute Crossing Voltage;
NOTE 4, 7, 8
Total Variation of VCROSS over all edges;
NOTE 4, 7, 9
Bank A
Output Rise/Fall
Time
Banks B, C
All Outputs at Same Frequency,
REF_OE = 0
-150
100
mV
600
mV
350
mV
±150mV from crosspoint
25
10 0
ps
20% - 80%
150
420
ns
Bank A
45
55
%
odc
Output Duty Cycle
Banks B, C
45
55
%
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the
device is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after
thermal equilibrium has been reached under these conditions.
NOTE 1: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 2: Defined as skew within a bank of outputs at the same supply voltage and with equal load conditions.
NOTE 3: Defined as skew between outputs at the same supply voltages and with equal load conditions.
Measured at VDDOB, C/2.
NOTE 4: Measurement taken from single-ended waveform.
NOTE 5: Defined as the maximum instantaneous voltage including overshoot. See Parameter Measurement Information Section.
NOTE 6: Defined as the minimum instantaneous voltage including undershoot. See Parameter Measurement Information Section.
NOTE 7: Measured at crossing point where the instantaneous voltage value of the rising edge of Qx equals the falling edge of nQx.
See Parameter Measurement Information Section.
NOTE 8: Refers to the total variation from the lowest crossing point to the highest, regardless of which edge is crossing. Refers to all
crossing points for this measurement. See Parameter Measurement Information Section.
NOTE 9: Defined as the total variation of all crossing voltage of rising Qx and falling nQx. This is the maximum allowed variance in
the VCROSS for any par ticular system. See Parameter Measurement Information Section.
ICS841S012BKI REVISION A NOVEMBER 10, 2009
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©2009 Integrated Device Technology, Inc.
ICS841S012I Data Sheet
CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER
PARAMETER MEASUREMENT INFORMATION
3.3V±5%
1.65V±5%
3.3V±5%
1.65V±5%
VDD,
VDDOB,
VDDOC
SCOPE
VDD
0Ω
50Ω
Measurement
Point
50Ω
Measurement
Point
VDDA
VDDA
49.9Ω
Qx
2pF
HCSL
LVCMOS
0Ω
GND
GND
49.9Ω
RREF = 475Ω
2pF
-1.65V±5%
0V
3.3V CORE/3.3V LVCMOS OUTPUT LOAD AC TEST CIRCUIT
3.3V CORE/3.3V HCSL OUTPUT LOAD AC TEST CIRCUIT
VOH
nQx
VREF
Qx
VOL
1σ contains 68.26% of all measurements
2σ contains 95.4% of all measurements
3σ contains 99.73% of all measurements
4σ contains 99.99366% of all measurements
6σ contains (100-1.973x10-7)% of all measurements
nQy
Qy
tsk(o)
Histogram
Reference Point
Mean Period
(Trigger Edge)
(First edge after trigger)
HCSL OUTPUT SKEW
RMS PERIOD JITTER
Qx:Qx
VDDOX
2
V
DDOX
Qx
2
VDDOX
2
Qx:Qx
V
DDOX
Qy
tsk(b)
2
tsk(o)
(where X = Bank B or Bank C)
LVCMOS BANK SKEW
LVCMOS OUTPUT SKEW
ICS841S012BKI REVISION A NOVEMBER 10, 2009
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©2009 Integrated Device Technology, Inc.
ICS841S012I Data Sheet
CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER
PARAMETER MEASUREMENT INFORMATION,
CONTINUED
nQA[0:1]
80%
80%
QA[0:1]
➤
➤
tcycle n
tcycle n+1
QC,
QB0:QB6
➤
20%
20%
tR
➤
tjit(cc) = tcycle n – tcycle n+1
1000 Cycles
tF
LVCMOS RISE/FALL TIME
DIFFERENTIAL CYCLE-TO-CYCLE JITTER
VMAX
nQ
nQ
VCROSS_MAX
VCROSS_DELTA
VCROSS_MIN
Q
Q
VMIN
SINGLE-ENDED MEASUREMENT POINTS FOR ABSOLUTE CROSS POINT
AND SWING
SINGLE-ENDED MEASUREMENT POINTS FOR DELTA CROSS POINT
Clock Period (Differential)
V
DDOX
QC,
QB0:QB6
Positive Duty
Cycle (Differential)
2
t PW
t
Negative Duty
Cycle (Differential)
PERIOD
0.0V
odc =
t PW
x 100%
Q - nQ
t PERIOD
LVCMOS OUTPUT DUTY CYCLE/PULSE WIDTH/PERIOD
Rise Edge Rate
DIFFERENTIAL MEASUREMENT POINTS FOR DUTY CYCLE/PERIOD
Fall Edge Rate
+150mV
0.0V
-150mV
Q - nQ
DIFFERENTIAL MEASUREMENT POINTS FOR RISE/FALL TIME
ICS841S012BKI REVISION A NOVEMBER 10, 2009
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©2009 Integrated Device Technology, Inc.
ICS841S012I Data Sheet
CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER
APPLICATION INFORMATION
POWER SUPPLY FILTERING TECHNIQUES
As in any high speed analog circuitry, the power supply pins are
vulnerable to random noise. To achieve optimum jitter performance, power supply isolation is required. The ICS841S012I provides separate power supplies to isolate any high switching noise
from the outputs to the internal PLL. VDD, VDDA, VDDOB, and VDDOC
should be individually connected to the power supply
plane through vias, and 0.01µF bypass capacitors should be used
for each pin. Figure 1 illustrates this for a generic VDD pin and
also shows that VDDA requires that an additional10Ω resistor
along with a 10µF bypass capacitor be connected to the VDDA pin.
The 10Ω resistor can also be replaced by a ferrite bead.
3.3V
VDD
.01μF
10Ω
VDDA
.01μF
10μF
FIGURE 1. POWER SUPPLY FILTERING
RECOMMENDATIONS FOR UNUSED INPUT AND OUTPUT PINS
INPUTS:
OUTPUTS:
CRYSTAL INPUTS
For applications not requiring the use of the crystal oscillator
input, both XTAL_IN and XTAL_OUT can be left floating. Though
not required, but for additional protection, a 1kΩ resistor can be
tied from XTAL_IN to ground.
LVCMOS OUTPUTS
All unused LVCMOS output can be left floating. We recommend
that there is no trace attached.
DIFFERENTIAL OUTPUT
All unused differential outputs can be left floating. We recommend
that there is no trace attached. Both sides of the differential output
pair should either be left floating or terminated.
REF_IN INPUT
For applications not requiring the use of the reference clock,
it can be left floating. Though not required, but for additional
protection, a 1kΩ resistor can be tied from the REF_IN to ground.
LVCMOS CONTROL PINS
All control pins have internal pull-ups or pull-downs; additional
resistance is not required but can be added for additional
protection. A 1kΩ resistor can be used.
ICS841S012BKI REVISION A NOVEMBER 10, 2009
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©2009 Integrated Device Technology, Inc.
ICS841S012I Data Sheet
CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER
CRYSTAL INPUT INTERFACE
and were chosen to minimize the ppm error. NOTE: External tuning capacitors must be used for proper operations.
The ICS841S012I has been characterized with 18pF parallel
resonant crystals. The capacitor values shown in Figure 2 below
were determined using a 25MHz, 18pF parallel resonant crystal
XTAL_IN
C1
15p
X1
18pF Parallel Crystal
XTAL_OUT
C2
22p
FIGURE 2. CRYSTAL INPUT INTERFACE
LVCMOS TO XTAL INTERFACE
equals the transmission line impedance. In addition, matched
termination at the crystal input will attenuate the signal in half.
This can be done in one of two ways. First, R1 and R2 in parallel
should equal the transmission line impedance. For most 50Ω
applications, R1 and R2 can be 100Ω. This can also be
accomplished by removing R1 and making R2 50Ω. By overdriving
the crystal oscillator, the device will be functional, but note the
device performance is guaranteed by using a quartz crystal.
The XTAL_IN input can accept a single-ended LVCMOS signal
through an AC coupling capacitor. A general interface diagram is
shown in Figure 3. The XTAL_OUT pin can be left floating. The
input edge rate can be as slow as 10ns. For LVCMOS signals, it is
recommended that the amplitude be reduced from full swing to
half swing in order to prevent signal interference with the power
rail and to reduce noise. This configuration requires that the output
impedance of the driver (Ro) plus the series resistance (Rs)
VDD
VDD
R1
Ro
.1uf
Rs
Zo = 50
Zo = Ro + Rs
XTAL_IN
R2
XTAL_OUT
FIGURE 3. GENERAL DIAGRAM FOR LVCMOS DRIVER TO XTAL INPUT INTERFACE
ICS841S012BKI REVISION A NOVEMBER 10, 2009
11
©2009 Integrated Device Technology, Inc.
ICS841S012I Data Sheet
CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER
SPREAD SPECTRUM
The ICS841S012BI triangle modulation frequency deviation
will not exceed 0.7% down-spread from the nominal clock frequency (+0.0% / -0.5%). An example of the amount of down
spread relative to the nominal clock frequency can be seen in
the frequency domain, as shown in Figure 4B. The ratio of this
width to the fundamental frequency is typically 0.4%, and will
not exceed 0.7%. The resulting spectral reduction will be greater
than 5dB, as shown in Figure 4B. It is important to note the
ICS841S012DI 5dB minimum spectral reduction is the component-specific EMI reduction, and will not necessarily be the
same as the system EMI reduction.
Spread-spectrum clocking is a frequency modulation technique
for EMI reduction. When spread-spectrum is enabled, a 32kHz
triangle waveform is used with 0.6% down-spread (+0.0% / 0.5%) from the nominal output frequency. An example of a triangle frequency modulation profile is shown in Figure 4A below. The ramp profile can be expressed as:
• Fnom = Nominal Clock Frequency in Spread OFF mode
• Fm = Nominal Modulation Frequency (30kHz)
• δ = Modulation Factor (0.6% down spread)
1,
2Fm
(1 - δ) fnom - 2 Fm x δ x Fnom x t when 1 < t < 1
2Fm
Fm
➤
(1 - δ) fnom + 2 Fm x δ x Fnom x t when 0 < t <
Fnom
Frequency
Δ − 10 dBm
B
A
(1 - δ) Fnom
1/fm
➤
0.5/fm
➤
δ = .6% ➤
Time
FIGURE 4A. TRIANGLE FREQUENCY MODULATION
FIGURE 4B. 200MHZ CLOCK OUTPUT IN FREQUENCY DOMAIN
(A) SPREAD -S PECTRUM OFF (B) SPREAD -S PECTRUM ON
ICS841S012BKI REVISION A NOVEMBER 10, 2009
12
©2009 Integrated Device Technology, Inc.
ICS841S012I Data Sheet
CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER
VFQFN EPAD THERMAL RELEASE PATH
are application specific and dependent upon the package power
dissipation as well as electrical conductivity requirements. Thus,
thermal and electrical analysis and/or testing are recommended
to determine the minimum number needed. Maximum thermal
and electrical performance is achieved when an array of vias is
incorporated in the land pattern. It is recommended to use as
many vias connected to ground as possible. It is also
recommended that the via diameter should be 12 to 13mils (0.30
to 0.33mm) with 1oz copper via barrel plating. This is desirable to
avoid any solder wicking inside the via during the soldering process
which may result in voids in solder between the exposed pad/
slug and the thermal land. Precautions should be taken to
eliminate any solder voids between the exposed heat slug and
the land pattern. Note: These recommendations are to be used
as a guideline only. For further information, refer to the Application
Note on the Surface Mount Assembly of Amkor’s Thermally/
Electrically Enhance Leadframe Base Package, Amkor
Technology.
In order to maximize both the removal of heat from the package
and the electrical perfor mance, a land patter n must be
incorporated on the Printed Circuit Board (PCB) within the footprint
of the package corresponding to the exposed metal pad or
exposed heat slug on the package, as shown in Figure 5. The
solderable area on the PCB, as defined by the solder mask, should
be at least the same size/shape as the exposed pad/slug area on
the package to maximize the thermal/electrical performance.
Sufficient clearance should be designed on the PCB between the
outer edges of the land pattern and the inner edges of pad pattern
for the leads to avoid any shorts.
While the land pattern on the PCB provides a means of heat
transfer and electrical grounding from the package to the board
through a solder joint, thermal vias are necessary to effectively
conduct from the surface of the PCB to the ground plane(s). The
land pattern must be connected to ground through these vias.
The vias act as “heat pipes”. The number of vias (i.e. “heat pipes”)
PIN
PIN PAD
SOLDER
EXPOSED HEAT SLUG
GROUND PLANE
SOLDER
LAND PATTERN
THERMAL VIA
PIN
PIN PAD
(GROUND PAD)
FIGURE 5. P.C.ASSEMBLY FOR EXPOSED PAD THERMAL RELEASE PATH –SIDE VIEW (DRAWING NOT TO SCALE)
ICS841S012BKI REVISION A NOVEMBER 10, 2009
13
©2009 Integrated Device Technology, Inc.
ICS841S012I Data Sheet
CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER
RECOMMENDED TERMINATION
Figure 6A is the recommended termination for applications
which require the receiver and driver to be on a separate PCB.
All traces should be 50Ω impedance.
FIGURE 6A. RECOMMENDED TERMINATION
Figure 6B is the recommended termination for applications
which require a point to point connection and contain the
driver and receiver on the same PCB. All traces should all be
50Ω impedance.
FIGURE 6B. RECOMMENDED TERMINATION
ICS841S012BKI REVISION A NOVEMBER 10, 2009
14
©2009 Integrated Device Technology, Inc.
ICS841S012I Data Sheet
CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER
SCHEMATIC EXAMPLE
Figure 7 shows an example of the ICS841S012I application
schematic. In this example, the device is operated at VD D= VDDOB =
VDDOC = 3.3V. The 18pF parallel resonant 25MHz crystal is used.
The C1= 33pF and C2 = 33pF are recommended for frequency
accuracy. For different board layout, the C1 and C2 may be
slightly adjusted for optimizing frequency accuracy. Two examples
of HCSL and one example of LVCMOS termination are shown in
this schematic. The decoupling capacitors should be located as
close as possible to the power pin.
Logic Control Input Examples
R1
35
Zo = 50
QB0
Set Logic
Input to '1'
VDD
Set Logic
Input to '0'
VDD
VDD
R2
10
LVCMOS
VDDA
RU1
1K
RU2
Not Install
VDDO
C5
10u
C6
0.01u
To Logic
Input
pins
VDD
To Logic
Input
pins
RD2
1K
R4
REF_OUT0
REF_OUT1
Q1
Zo = 50 Ohm
REF_IN
43
REF_SEL
25MHz, CL=18pF
C1
15pF
BYPASS
REF_OE
nMR
X1
XTAL_OUT
GND
SSC1
SSC0
F_SELB2
F_SELB1
F_SELB0
F_SELC2
F_SELC1
F_SELC0
F_SELA1
F_SELA0
QA_OE
GND
VDD
Note: External tuning
capacitors must be used for
proper operation.
XTAL_IN
VDD
REF_OUT0
REF_OUT1
GND
GND
REF_IN
VDD
REF_SEL
XTAL_IN
XTAL_OUT
BYPASS
REF_OE
nMR
VDD
C2
22pF
ICS841S012i
C3
0.01u
VDDOC
QC
GND
QBC_OE
VDDA
VDDA
GND
GND
IREF
QA0
nQA0
QA1
nQA1
VDD
42
41
40
39
38
37
36
35
34
33
32
31
30
29
C4
10u
R5
33
Zo = 50
+
TL3
R7
33
Zo = 50
IREF
-
TL5
QA0
nQA0
R8
50
QA1
R9
50
Using for PCI Express
Add-In Card
R10
475 Ohm
15
16
17
18
19
20
21
22
23
24
25
26
27
28
Driv er_LVCMOS
1
2
3
4
5
6
7
8
9
10
11
12
13
14
10
VDDA
VDDOB
QB6
GND
QB5
VDDOB
QB4
GND
QB3
VDDOB
QB2
GND
QB1
QB0
VDDOB
VDD
R6
Zo = 50
LVCMOS
U1
Ro ~ 7 Ohm
30
VDD
VDDO
56
55
54
53
52
51
50
49
48
47
46
45
44
43
RD1
Not Install
R3
REF_OUT1
HCSL Termination
SSC1
SSC0
F_SELB2
F_SELB1
F_SELB0
F_SELC2
F_SELC1
F_SELC0
F_SELA1
F_SELA0
QA_OE
Note: This device requires a
reset signal at nMR after
power-up to function properly.
Zo = 50
+
TL6
nQA1
VDDO
VDD=3.3V
(U1, 42) VDDO
VDD
(U1, 43)
(U1, 48)
(U1, 52)
(U1, 1)
(U1, 56)
VDD
0.1u
C8
0.1u
C9
0.1u
C10
0.1u
C11
0.1u
C12
0.1u
-
TL7
(U1, 7)
(U1, 28)
(U1, 14)
R11
50
(U1, 29)
VDDO=3.3V
C7
Zo = 50
C13
C14
0.1u
0.1u
C15
0.1u
C16
R12
50
Using for PCI Express
Point-to-Point
Connection
0.1u
FIGURE 7. ICS841S012I SCHEMATIC EXAMPLE
ICS841S012BKI REVISION A NOVEMBER 10, 2009
15
©2009 Integrated Device Technology, Inc.
ICS841S012I Data Sheet
CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER
POWER CONSIDERATIONS
This section provides information on power dissipation and junction temperature for the ICS841S012I.
Equations and example calculations are also provided.
1. Power Dissipation.
The total power dissipation for the ICS841S012I is the sum of the core power plus the power dissipated in the load(s).
The following is the power dissipation for VDD = 3.3V + 5% = 3.465V, which gives worst case results.
Core and HCSL Output Power Dissipation
The maximum IDD current at 85° is 300mA. The HCSL output current (17mA per output pair) is included in this value. For power
considerations, this output current is treated separately from the core current, so for power calculations,
I = 300mA - 2 * 17mA = 266mA.
DD
•
Power (core) = VDD_MAX * (IDD + IDDA ) = 3.465V * (266mA + 20mA) = 991.0mW
Power (HCSL) = 44.5mW/Load Output Pair
If all outputs are loaded, the total power is 2 * 44.5mW = 89mW
LVCMOS Output Power Dissipation
•
Dynamic Power Dissipation at 200MHz (QB, QC)
Power (200MHz) = CPD * Frequency * (VDDO)2 = 4pF * 200MHz * (3.465V)2 = 9.6mW per output
Total Power (200MHz) = 9.6mW * 8 = 76.7mW
•
Dynamic Power Dissipation at 25MHz (REF_OUT)
Power (25MHz) = CPD * Frequency * (VDDO)2 = 4pF * 25MHz * (3.465V)2 = 1.2mW per output
Total Power (25MHz) = 1.2mW * 2 = 2.4mW
Total Power Dissipation
•
Total Power
= Power (core) + Power (HCSL) + Total Power (200MHz) + Total Power (25MHz)
= 991.0mW + 89mW + 76.7mW + 2.4mW
= 1159mW
ICS841S012BKI REVISION A NOVEMBER 10, 2009
16
©2009 Integrated Device Technology, Inc.
ICS841S012I Data Sheet
CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER
2. Junction Temperature.
Junction temperature, Tj, is the temperature at the junction of the bond wire and bond pad and directly affects the reliability
of the device. The maximum recommended junction temperature for HiPerClockSTM devices is 125°C.
The equation for Tj is as follows: Tj = θJA * Pd_total + TA
Tj = Junction Temperature
θJA = Junction-to-Ambient Thermal Resistance
Pd_total = Total Device Power Dissipation (example calculation is in section 1 above)
TA = Ambient Temperature
In order to calculate junction temperature, the appropriate junction-to-ambient thermal resistance θJA must be used.
Assuming 1 meter per second air flow and a multi-layer board, the appropriate value is 31.4°C/W per Table 7.
Therefore, Tj for an ambient temperature of 85°C with all outputs switching is:
85°C + 1.159W * 31.4°C/W = 121.4°C. This is below the limit of 125°C.
This calculation is only an example. Tj will obviously vary depending on the number of loaded outputs, supply voltage, air
flow, and the type of board (multi-layer).
TABLE 7. THERMAL RESISTANCE θJA FOR 56 LEAD VFQFN, FORCED CONVECTION
θJA by Velocity (Meters per second)
0
Multi-Layer PCB, JEDEC Standard Test Boards
ICS841S012BKI REVISION A NOVEMBER 10, 2009
31.4°C/W
17
1
2.5
27.5°C/W
24.6°C/W
©2009 Integrated Device Technology, Inc.
ICS841S012I Data Sheet
CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER
3. Calculations and Equations.
The purpose of this section is to calculate power dissipation on the IC per HCSL output pair.
HCSL output driver circuit and termination are shown in Figure 8.
VDD
IOUT = 17mA
➤
VOUT
RREF =
475Ω ± 1%
RL
50Ω
IC
FIGURE 8. HCSL DRIVER CIRCUIT AND TERMINATION
HCSL is a current steering output which sources a maximum of 17mA of current per output. To calculate worst case on-chip power
dissipation, use the following equations which assume a 50Ω load to ground.
The highest power dissipation occurs at maximum VDD .
Power
= (VDD_MAX – VOUT ) * IOUT,
since VOUT = IOUT * RL
= (VDD_MAX – IOUT * RL) * IOUT
= (3.465V – 17mA * 50Ω) * 17mA
Total Power Dissipation per output pair = 44.5mW
ICS841S012BKI REVISION A NOVEMBER 10, 2009
18
©2009 Integrated Device Technology, Inc.
ICS841S012I Data Sheet
CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER
RELIABILITY INFORMATION
TABLE 8. θJAVS. AIR FLOW TABLE FOR 56 LEAD VFQFN
θJA by Velocity (Meters per second)
0
Multi-Layer PCB, JEDEC Standard Test Boards
31.4°C/W
1
2.5
27.5°C/W
24.6°C/W
TRANSISTOR COUNT
The transistor count for ICS841S012I is: 11,537
ICS841S012BKI REVISION A NOVEMBER 10, 2009
19
©2009 Integrated Device Technology, Inc.
ICS841S012I Data Sheet
CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER
PACKAGE OUTLINE - K SUFFIX FOR 56 LEAD VFQFN
(Ref.)
S eating Plan e
N &N
Even
(N -1)x e
(R ef.)
A1
Ind ex Area
L
A3
N
N
e (Ty p.)
2 If N & N
1
Anvil
Singula tion
are Even
2
OR
E2
(N -1)x e
(Re f.)
E2
2
To p View
b
A
(Ref.)
D
e
D2
2
N &N
Odd
0. 08
Chamfer 4x
0.6 x 0.6 max
OPTIONAL
C
Th er mal
Ba se
D2
C
NOTE: The following package mechanical drawing is a generic
drawing that applies to any pin count VFQFN package. This drawing is not intended to convey the actual pin count or pin layout of
this device. The pin count and pinout are shown on the front page.
The package dimensions are in Table 9 below.
TABLE 9. PACKAGE DIMENSIONS
JEDEC VARIATION
ALL DIMENSIONS IN MILLIMETERS
SYMBOL
MINIMUM
MAXIMUM
56
N
A
0.80
1.0
A1
0
0.05
0.25 Reference
A3
b
0.18
0.30
e
0.50 BASIC
ND
14
NE
14
8.0
D
D2
4.35
4.65
8.0
E
E2
5.05
5.35
L
0.3
0.55
Reference Document: JEDEC Publication 95, MO-220
ICS841S012BKI REVISION A NOVEMBER 10, 2009
20
©2009 Integrated Device Technology, Inc.
ICS841S012I Data Sheet
CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER
TABLE 10. ORDERING INFORMATION
Part/Order Number
Marking
Package
Shipping Packaging
Temperature
tray
-40°C to 85°C
841S012BKILF
ICS841S012BIL
56 lead "Lead-Free" VFQFN
841S012BKILFT
ICS841S012BIL
56 lead "Lead-Free" VFQFN
1000 tape & reel
-40°C to 85°C
NOTE: Par ts that are ordered with an "LF" suffix to the par t number are the Pb-Free configuration and are RoHS compliant.
While the information presented herein has been checked for both accuracy and reliability, Integrated Device Technology, Incorporated (IDT) assumes no responsibility for either its use or for
infringement of any patents or other rights of third parties, which would result from its use. No other circuits, patents, or licenses are implied. This product is intended for use in normal commercial and
industrial applications. Any other applications such as those requiring high reliability or other extraordinary environmental requirements are not recommended without additional processing by IDT. IDT
reserves the right to change any circuitry or specifications without notice. IDT does not authorize or warrant any IDT product for use in life support devices or critical medical instruments.
ICS841S012BKI REVISION A NOVEMBER 10, 2009
21
©2009 Integrated Device Technology, Inc.
ICS841S012I Data Sheet
CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER
REVISION HISTORY SHEET
Rev
A
A
Table
T4A
Page
6
11
15
1
Description of Change
Power Supply DC Characteristics Table - added Test Conditions to IDD row.
Updated Figure 2, Cr ystal Input Interface from 33pF to 15pF/22pF.
Updated Schematic Layout.
Add NRND and bullet.
ICS841S012BKI REVISION A NOVEMBER 10, 2009
22
Date
8/11/09
9/10/09
©2009 Integrated Device Technology, Inc.
ICS841S012I Data Sheet
CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER
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in this document, including descriptions of product features and performance, is subject to change without notice. Performance specifications and the operating parameters of the described products are
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Copyright 2009. All rights reserved.