CDDFN10-3304N

CHIP DIODES
February, 2013
Additional Assembly/Test Location
for TVS Diode DFN Packages
To support our fast growing demand, secure continuity of supply and provide maximum flexibility to our customers,
Bourns is adding an additional assembly/test location in China for the assembly/test of the DFN package for our
TVS diode products. The affected part number using the DFN package is the Model CDDFN10-3304N TVS/Steering
Diode Array.
Product Labeling:
The product marking is unchanged except for the country code information.
Identification of the Changed Product:
Bourns maintains traceability back to source wafer lots and assembly sites for all products.
Impact on Form, Fit, Function and Reliability:
The package outline dimensions will continue to meet the current Bourns data sheet. Product ratings and electrical
characteristics are unaffected by the change. There is no impact on form, fit, function, quality or reliability. For
qualification information and results, please see the data below.
Implementation Dates are as Follows:
• Last date of manufacture of existing product: Bourns has no plans to discontinue assembly and test of products at
its existing subcontract sites.
• Deliveries to customers from new site may occur from July, 2013 onward.
• First date code from new site: 1313
New Assembly/Test Location Qualification:
Qualification Information:
Die Technology
Product Name
Top Metal
Back Metal
Assembly Site
Pins/Package
Mold Compound
Die Attach
Bond Wire
L/F Material
Marking
Termination Finish
All Products
TVS Diode Products
CDDFN10-3304N
Al
AlNiAu
China
DFN 10
CEL9220
8006N
Au
Copper
Laser
Matte Sn (Pb Free)
ESD1307
Additional Assembly/Test Location for TVS Diode DFN Packages
February, 2013
Page 2 of 2
Qualification Results:
Test Plan
Stress Test
Conditions
Moisture Induced Stress Sensitivity
HTRB
125 °C,1000 h
HTST
150 °C, 1000 h
121 °C / 100 %
PCT
RH, 2 atm, 168 h
65 / +150 °C,
TCT
500 cs
Solderability
8 h Steam
Dimensions
Data Sheet
Flammability
3 mm
W/Bond Pull
Strength
Die Shear
X-Ray
-
Standard
J-STD-020
MIL STD 750
J-STD-22
Method
1048
A103
SS/Acc
Level 1
22/0
22/0
Lot 1
SS/fail
154/0
22/0
22/0
J-STD-22
A102
22/0
22/0
J-STD-22
A104
22/0
22/0
JESD22MIL STD 883
UL 94-VO
B102E
2025
5/0
5/0
5/0
5
MIL STD 883
2011
76/0
76/0
MIL STD 883
MIL STD 883
2019
2012
5/0
5/0
5/0
5/0
Samples subjected are preconditioned according to JESD22-A113 (260 °C).
If you have any questions or need additional information, please feel free to contact Customer Service/Inside Sales.
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