AT24C04A (AT3552D) Serial EEPROM Product Qualification • 2325 Orchard Parkway • San Jose CA 95131 • The AT24C04A Serial EEPROM is fabricated on the AT35000 CMOS process. With the exception of HBM ESD, all tests were performed at Atmel’s Colorado Springs Facility. This report summarizes the product level qualification data, ESD, Latchup, and Write Endurance for the AT24C04A Serial EEPROM using similarity data from the AT24C04, which is a single metal mask option. This data, in conjunction with the AT35000 Process Qualification and Reliability Report, qualifies the AT24C04A. Package specific qualification data is provided separately. • 2325 Orchard Parkway • San Jose CA 95131 • AT3552D Product Qualification ESD Characterization Device: AT24C04A Lot Number: Lot#4e2825 Quantity Tested: 3/ lot per Voltage Test Temperature: 25C ESD Stress Equipment:: ORYX Model 11000 ESD Test System; Human Body Model Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester @ -40C, 25C, 125C Test per Mil Std 883, Method 3015: 3 Pulses Each Polarity per Specified Pin Combinations AT24C04A Pin Name Vcc Gnd CS Hold SI WP SCK SO Function Tested As Power Ground Chip Select Suspend Input Serial Data IN Write Protect Serial Clock Serial Data OUT Vcc Gnd Input Input Input Input Input Output Functional Test Only Failing Pin Not Identified See Above 3 Positive & 3 Negative Pulses per The Specified Pin Combinations Max Passing Voltage Qty/Fail Qty/Fail Qty/Fail Qty/Fail Qty/Fail Voltage 2000V 500V 1000V 4000V 3/0 3/0 3/0 3/3 3/0 2000 3/0 3/0 3/0 3/3 3/0 2000 3/0 3/0 3/0 3/3 3/0 2000 3/0 3/0 3/0 3/3 3/0 2000 3/0 3/0 3/0 3/3 3/0 2000 3/0 3/0 3/0 3/3 3/0 2000 3/0 3/0 3/0 3/3 3/0 2000 3/0 3/0 3/0 3/3 3/0 2000 3/0 3/0 • 2325 Orchard Parkway • San Jose CA 95131 • 3/0 3/3 3/0 2000 AT3552D Product Qualification Latch-Up Characterization Device: AT24C04 Lot Number: Lot# 3e3886 Quantity Tested: 5 per lot Test Method: JEDEC 78 Final Production Test Program: EPRO Model 142AX Tester @ -40C, 25C, 125C Over Current Test Voltage Vcc = 5.0V Maximum Applied Trigger Current = 200 mA Maximum Applied Trigger Voltage = 7.0 V Max Trigger Current Pin Name Vcc Gnd CS Hold SI WP SCK SO Function Power Ground Chip Select Suspend Input Serial Data IN Write Protect Serial Clock Serial Data OUT Max Trigger Voltage Passing* Passing* Compliance Passing* Passing* Compliance Tested As -I (mA) +V (V) Setting (mA) +I (mA) Setting (V) -V (V) Vcc --------7.0 250 Gnd ------------Input 200 200 7.0 ------Input 200 200 7.0 ------Input 200 200 7.0 ------Input 200 200 7.0 ------Input 200 200 7.0 ------Output 200 200 7.0 ------- * 0 Fails for Latchup or Post Stress Functional Tests. Write Endurance Characterization Device: AT24C04 Lot Number: Lot# 3e3886 Quantity Tested: 100 Test Temperature: 25C Final Production Test Program: EPRO Model 142AX Tester @ -40C, 25C, 125C Vcc: 5 Volts Write Mode: Page Highest Passing Cycles: 900,000 Cycles To First Failure: 1,000,000 • 2325 Orchard Parkway • San Jose CA 95131 •