REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Change to one part-one number format. Add table III. Editorial changes throughout. 91-12-11 M. A. FRYE B Changes in accordance with NOR 5962-R049-95. 94-12-21 M. A. FRYE C Changes in accordance with NOR 5962-R035-97. 96-11-26 R. MONNIN D Removed table III, burn-in, dynamic burn-in, static and dynamic test circuits. Drawing updated to reflect current requirements. -rrp 02-12-17 R. MONNIN E Update boilerplate paragraphs to current MIL-PRF-38535 requirements. -rrp 10-03-02 C. SAFFLE THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV E E E E E E E E E E E OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Marcia B. Kelleher STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http://www.dscc.dla.mil CHECKED BY D. A. DiCenzo APPROVED BY Michael A. Frye MICROCIRCUIT, LINEAR, QUAD LOW OFFSET, LOW POWER, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON DRAWING APPROVAL DATE 87-12-11 REVISION LEVEL E SIZE CAGE CODE A 67268 SHEET DSCC FORM 2233 APR 97 1 OF 5962-87771 11 5962-E506-07 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 87771 Federal stock class designator \ RHA designator (see 1.2.1) 01 M C X Device type (see 1.2.2) Device class designator (see 1.2.3) Case outline (see 1.2.4) Lead finish (see 1.2.5) / \/ Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type 01 Generic number Circuit function OP400A Quad low offset low power operational amplifier 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class M Device requirements documentation Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter C 3 K Descriptive designator GDIP1-T14 or CDIP2-T14 CQCC1-N28 GDFP2-F24 or CDFP3-F24 Terminals 14 28 24 Package style Dual-in-line Square leadless chip carrier Flat pack 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-87771 A REVISION LEVEL E SHEET 2 1.3 Absolute maximum ratings. 1/ Supply voltage (VCC) ..................................................................................... Differential input voltage .............................................................................. Input voltage ................................................................................................ Output short-circuit duration ........................................................................ Power dissipation (PD) ................................................................................. Storage temperature range .......................................................................... Lead temperature range (soldering, 60 seconds) ........................................ Junction temperature (TJ) ............................................................................ Thermal resistance, junction-to-case (θJC) ................................................... Thermal resistance, junction-to-ambient (θJA): Cases C and K ......................................................................................... Case 3 ...................................................................................................... ±20 V ±30 V Supply voltage Continuous 800 mW -65°C to +150°C +300°C -65°C to +150°C See MIL-STD-1835 91°C/W 110°C/W 1.4 Recommended operating conditions. Ambient operating temperature range (TA) .................................................. -55°C to +125°C Supply voltage (VCC) ..................................................................................... ±15 V 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 MIL-STD-1835 - Test Method Standard Microcircuits. Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 MIL-HDBK-780 - List of Standard Microcircuit Drawings. Standard Microcircuit Drawings. (Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-87771 A REVISION LEVEL E SHEET 3 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Schematic diagram. The schematic diagram shall be as specified on figure 2. 3.3 Electrical performance characteristics and post irradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and post irradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 49 (see MIL-PRF-38535, appendix A). 3.11 Supersession and substitution. PIN substitution information shall be as specified in appendix A. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-87771 A REVISION LEVEL E SHEET 4 TABLE I. Electrical performance characteristics. Test Input offset voltage Symbol Conditions -55°C ≤ TA ≤ +125°C VCC = ±15 V unless otherwise specified Group A subgroups Device type 1 01 VIO 2, 3 Input offset current IIO VCM = 0 V 1 01 2, 3 Input bias current ±IIB VCM = 0 V 1 01 2, 3 Input voltage range +IVR 1/ 1, 2, 3 01 Limits Min -150 Max +150 -270 +270 -1.0 +1.0 -2.5 +2.5 -3.0 +3.0 -5.0 +5.0 +12 -IVR Common mode rejection ratio CMRR Power supply rejection ratio PSRR VCM = ±12 V 1 01 AVS VCC = ±3 V and ±18 V 1 No load 2/ 01 VOUT = ±10 V, RL = 2 kΩ 01 2.9 01 2000 5, 6 1000 4 5000 Input noise voltage density eN V/mV 3000 4, 5, 6 01 +11 V +12 RL = 10 kΩ -VOP mA 3.1 4 RL = 2 kΩ µV/V 1.8 5, 6 +VOP dB 3.2 1 VOUT = ±10 V, RL = 10 kΩ Output voltage swing nA 115 2, 3 Large signal voltage gain nA V 120 2, 3 ISY µV -12 2, 3 Supply current Unit RL = 2 kΩ -11 RL = 10 kΩ -12 7 fO = 10 Hz, TA = +25°C 3/ 01 22 fO = 1000 Hz, nV/ Hz 22 TA = +25°C 3/ Input noise voltage eNT 1 Hz to 100 Hz, 7 01 7 01 8 01 438 nVRMS 1.2 µV/°C TA = +25°C Slew rate SR Average input offset voltage drift TCVIO AV = +1, TA = +25°C 0.05 V/µs 1/ IVR guaranteed by CMRR test. 2/ ISY limit = total all four amplifiers. 3/ eN at fO = 10 Hz and fO = 1000 Hz is guaranteed by eNT test. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-87771 A REVISION LEVEL E SHEET 5 Device type Case outlines Terminal numbers 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 C OUT A -IN A +IN A VCC+ +IN B -IN B OUT B OUT C -IN C +IN C VCC+IN D -IN D OUT D ------------------------------------------- 01 3 K Terminal symbols NC OUT A OUT A -IN A -IN A NC NC NC NC +IN A +IN A VCC+ NC +IN B VCC+ NC NC NC +IN B NC NC -IN B NC OUT B -IN B OUT C OUT B -IN C NC NC OUT C NC -IN C NC NC +IN C NC VCC+IN C +IN D NC NC VCCNC NC -IN D +IN D OUT D NC ---NC ----IN D ---OUT D ---- NC = No connection FIGURE 1. Terminal connections. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-87771 A REVISION LEVEL E SHEET 6 FIGURE 2. Schematic diagram. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-87771 A REVISION LEVEL E SHEET 7 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. 4.2.1 Additional criteria for device class M. a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA = +125°C, minimum. b. Interim and final electrical test parameters shall be as specified in table IIA herein. 4.2.2 Additional criteria for device classes Q and V. a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table IIA herein. c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in MIL-PRF-38535, appendix B. 4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). 4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified herein. Quality conformance inspection for device class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-87771 A REVISION LEVEL E SHEET 8 TABLE IIA. Electrical test requirements. Test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Subgroups (in accordance with MIL-PRF-38535, table III) Device class M Device class Q Device class V Interim electrical parameters (see 4.2) 1 Final electrical parameters (see 4.2) 1,2,3,4,7 Group A test requirements (see 4.4) 1,2,3,4,5,6, 7,8 1 1,2,3,4,5,6, 7,8 1 Group D end-point electrical parameters (see 4.4) 1 1 1,2,3, 1/ 2/ 4,7 1,2,3,4,5,6, 7,8 1,2,3,4,5, 2/ 6,7,8 1 Group E end-point electrical parameters (see 4.4) 1,2,3,4,7 1,2,3,4,7 1,2,3,4,7 Group C end-point electrical parameters (see 4.4) 1 1/ 1 1,2,3,4,7 1/ 1/ PDA applies to subgroup 1. 2/ Delta limits in accordance with table IIB shall be computed with reference to the previous interim electrical parameters. TABLE IIB. 240 hour burn-in and group C end-point electrical parameters. Test VIO +IIB -IIB Limit Min -150 -3 -3 Max 150 3 3 Delta Max +75 2 2 Min -75 -2 -2 Unit µV nA nA 4.4.1 Group A inspection. a. Tests shall be as specified in table IIA herein. b. Subgroups 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein. 4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883: a. Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. b. TA = +125°C, minimum. c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-87771 A REVISION LEVEL E SHEET 9 4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MILSTD-883. 4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein. 4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured (see 3.5 herein). a. End-point electrical parameters shall be as specified in table IIA herein. b. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All device classes must meet the post irradiation end-point electrical parameter limits as defined in table I at TA = +25°C ±5°C, after exposure, to the subgroups specified in table IIA herein. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor prepared specification or drawing. 6.1.2 Substitutability. Device class Q devices will replace device class M devices. 6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military and industrial users should inform Defense Supply Center Columbus (DSCC) when a system application requires configuration control and which SMD's are applicable to that system. DSCC will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0544. 6.4 Comments. Comments on this drawing should be directed to DSCC-VA , Columbus, Ohio 43218-3990, or telephone (614) 692-0547. 6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in MIL-PRF-38535 and MIL-HDBK-1331. 6.6 Sources of supply. 6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in QML-38535. The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein) to DSCC-VA and have agreed to this drawing. 6.6.2 Approved sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103. The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by DSCC-VA. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-87771 A REVISION LEVEL E SHEET 10 APPENDIX A APPENDIX A FORMS A PART OF SMD 5962-87771 SUBSTITUTION DATA A.1 SCOPE A.1.1 Scope. This appendix contains the PIN substitution information to support the one part-one part number system. For new system designs, after the date of this document the new PIN shall be used in lieu of the old PIN. For existing system designs prior to the date of this document the new PIN can be used in lieu of the old PIN. This is a mandatory part of the document. The information herein is intended for compliance. The PIN substitution data shall be as follows: A.2 APPLICABLE DOCUMENTS. This section is not applicable to this appendix. A.3 SUBSTITUTION DATA New PIN 5962-8777101MCA 5962-8777101CA 5962-8777101M3A 5962-87771013A STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 Old PIN SIZE 5962-87771 A REVISION LEVEL E SHEET 11 STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 10-03-02 Approved sources of supply for SMD 5962-87771 are listed below for immediate acquisition information only and shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DSCC-VA. This information bulletin is superseded by the next dated revision of MIL-HDBK-103 and QML-38535. DSCC maintains an online database of all current sources of supply at http://www.dscc.dla.mil/Programs/Smcr/. Standard microcircuit drawing PIN 1/ 5962-8777101CA 5962-87771013A 5962-8777101MCA 5962-8777101M3A 5962-8777101VCA 5962-8777101V3A 5962-8777101VKA Vendor CAGE number 3/ 3/ 24355 (2) 24355 (2) 24355 (4) 24355 (4) 24355 (4) Vendor similar PIN 2/ OP400AY/883 OP400ATC/883 OP400AY/883 OP400ATC/883 OP400AY/QMLV OP400ATC/QMLV OP400AN/QMLV 1/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the manufacturer listed for that part. If the desired lead finish is not listed, contact the vendor to determine its availability. 2/ Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. 3/ Not available from an approved source of supply. Vendor CAGE number Vendor name and address 24355 Analog Devices (2) RT 1 Industrial Park P.O. Box 9106 Norwood, MA 02062 Point of contact: 804 Woburn Street Wilmington, MA 01887-3462 24355 Analog Devices (4) RT 1 Industrial Park P.O. Box 9106 Norwood, MA 02062 Point of contact: 7910 Triad Center Drive Greensboro, NC 27409-9605 The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in the information bulletin.