Reliability Report 2012 (January 2009- December 2011), Power Semiconductor Devices

Efficiency Through Technology
RELIABILITY REPORT
2012
Power Semiconductor Devices
January 2009 - December 2011
IXYS Corporation
1590 Buckeye Dr.
Milpitas CA 95035-7418
USA
Published March 2012
Q11 - A. Schlamp
IXYS Semiconductor GmbH
Edisonstrasse 15
D-68623 Lampertheim
Germany
Humidity Test
QUALITY AND RELIABILITY
Failure Modes: Degradation of electrical leakage
characteristics due to moisture penetration into plastic
packages.
Sensitive Parameters: BVDSS, BVCES, VDRRM, VRRM,
IDSS, ICES, IDRM, IRRM, IGSS, IGES,
VTH.
IXYS is committed to setting a new standard for
excellence in Power Semiconductors. Reflecting our
dedication to industry leadership in the manufacture of
medium to high power devices, reliability has
assumed a primary position in raw material selection,
design, and process technology.
Reliability utilizes information derived from applied
research, engineering design, analysis of field
applications and accelerated stress testing and
integrates this knowledge to optimize device design
and manufacturing processes.
All areas that impact reliability have received
considerable attention in order to achieve our goal to
be the # 1 Reliability Supplier of Power
Semiconductor products. We believe IXYS products
should be the most reliable components in your
system.
We have committed significant resources to
continuously improve and optimize our device design,
wafer fab processes, assembly processes and test
capabilities. As a result of this investment, IXYS has
realized a dramatic improvement in reliability
performance on all standardized tests throughout the
product line.
Excellence in product reliability is “built-in”, not testedin. Moreover, it requires a total systems approach,
involving all parties: from design to raw materials to
manufacturing.
In addition to qualifying new products released to the
market, life and environmental tests are periodically
performed on standard products to maintain feedback
on assembly and fabrication performance to assure
product reliability. Further information on reliability of
power devices is provided on www.ixys.com.
Power Cycle
Failure Modes: Thermal fatigue of silicon-metal and
metal-metal interfaces due to heating and cooling can
cause
thermal
and
electrical
performance
degradation.
Sensitive Parameters: RthJC, RDS(on), VCE(sat), VT, VF, IDSS,
ICES, IDRM, IRRM, BVDSS, BVCES, VDRRM,
VRRM.
High Accelerated Stress Test (HAST)
Failure Modes: Degradation of electrical leakage
characteristics due to moisture penetration into plastic
packages.
Sensitive Parameters: BVDSS, BVCES, VDRRM, VRRM,
IDSS, ICES, IDRM, IRRM, IGSS, IGES,
VTH.
TERMS IN TABLES
SUMMARY TABLES 1 AND 2:
AF: acceleration factor
AF = exp { Ea *[ (T2 -T1) / ( T2 * T1 ) ] / k }
(1)
Ea: activation energy; @ HTRB Ea = 1.0 eV
@ HTGB Ea = 0.4 eV
-5
k: Boltzmann’s constant 8.6—10 eV/K
T1: abs. application junction temperature (273+Tj) K
T2: abs. test junction temperature (273+Tj) K
RELIABILITY TESTS
High Temperature Reverse Bias (HTRB)
Failure Modes: Gradual degradation of break-down
characteristics due to presence of foreign materials
and polar/ionic contaminants disturbing the electric
field termination structure.
Sensitive Parameters: BVDSS, BVCES, VDRRM, VRRM,
IDSS, ICES, IDRM, IRRM, VTH.
UCL: upper confidence limit (60%)
Total Failures @ 60% UCL:
N = r + dr
(2)
r: number of failed devices
dr: additional term, depending on both r and UCL
High Temperature Gate Bias (HTGB)
MTTF: Mean Time To Failures = 1/Failure Rate
9
FIT: 1 FIT = 1 failure / 10 hrs
Failure Modes: Rupture of the gate oxide due to
localized thickness variations, structural anomalies,
particulates in the oxide, channel inversion due to
presence of mobile ions in the gate oxide.
Sensitive Parameters: IGSS, IGES,VTH, IDSS, ICES.
TABLES 3:
∆T: max Tj - min Tj during Test
DEFINITION OF FAILURE
Temperature Cycle
Failure modes: Thermal fatigue of silicon-metal and
metal-metal interfaces due to heating and cooling,
causing thermal and electrical performance degradation.
Sensitive Parameters: RthJC, RDS(on), VCE(sat), VT, VF.
Failure criteria are defined according to IEC 60747
standard series
2
Summary of Tables 1A - 1H: HTRB
Table 1A
Table 1B
Table 1C
Table 1D
Table 1E
Table 1F
Table 1G
Table 1H
MOSFET/IGBT
MOSFET/IGBT
Thyr./Diode
Controller/
FRED
Schottky
Thyr./Diode
Breakover
discrete device
Module
Module
Rec. Bridge
Diode
discrete device
Diode
171
10
394
12285
0
2,10
14744
883
11
104
0
0,92
15293
916
16
160
0
0,92
10599
635
13
170
0
0,92
7190
431
32
550
2
2,10
7576
454
17
340
0
0,92
4863
291
19
330
0
0,92
30585
1831
4
80
0
0,92
12270331
667
11139
62400
8
129
60160
7
125
86800
11
180
292080
16
265
121440
15
252
189177
23
392
30080
4
62
Failure Rate [FIT] 125°C, 60% UCL
Failure Rate [FIT] 90°C, 60% UCL
Total Lots Tested
Total Devices Tested
Total
Actual
Failures
60% UCL {eq. (2)}
Total Equivalent Device Hours
@ 125°C {AF eq. (1)}
MTTF
125°C 60% UCL
(Years)
90°C 60% UCL
Summary of Table 2A - 2B: HTGB
Failure Rate [FIT] 125°C, 60% UCL
Failure Rate [FIT] 90°C, 60% UCL
Total Lots Tested
Total Devices Tested
Total
Actual
Failures
60% UCL {eq. (2)}
Total Equivalent Device Hours
@ 125°C {AF eq. (1)}
MTTF
125°C 60% UCL
(Years)
90°C 60% UCL
IXYS Semiconductor GmbH
Table 2A
Table 2B
MOSFET/IGBT
MOSFET/IGBT
discrete device
Module
106
34
286
8960
0
0,92
21495
6934
13
126
0
0,92
8715780
1081
3353
42800
5
16
3
Summary of Tables 3A - 3G: Power Cycle
Total Lots Tested
Total Devices Tested
Total Failures
Total Device Cycles
Table 3A
Table 3B
Table 3C
Table3D
Table 3E
Table 3F
MOSFET/IGBT
MOSFET/IGBT
Thyr./Diode
Controller/
FRED
Schottky
Table 3G
Thyr./Diode
discrete device
Module
Module
Rec. Bridge
Diode
discrete device
89
2423
0
24496000
4
36
0
620000
5
50
0
500000
5
50
0
220000
15
280
0
660000
7
140
0
1080000
17
280
0
670000
Summary of Tables 4A - 4H: Temperature Cycle
Total Lots Tested
Total Devices Tested
Total Failures
Total Device Cycles
Table 4A
Table 4B
Table 4C**
Table4D
Table 4E
Table 4F
Table 4G
Table 4H
MOSFET/IGBT
MOSFET/IGBT
Thyr./Diode
Controller/
FRED
Schottky
Thyr./Diode
Breakover
discrete device
Module
Module
Rec. Bridge
Diode
discrete device
Diode
325
22317
0
8052290
11
116
0
8000
15
170
1
11100
13
200
1
12900
29
590
0
40600
19
400
0
43000
41
749
5
79330
4
80
0
5000
** Max. storage temperature specified = 125°C. For accelleration temperature cycling conditions Tmax = 150°C applied
Summary of Tables 5A - 5H: Humidity Test
Total Lots Tested
Total Devices Tested
Total Failures
Total Device Hours
Table 5A
Table 5B
Table 5C
Table5D
Table 5E
Table 5F
Table 5G
Table 5H
MOSFET/IGBT
MOSFET/IGBT
Thyr./Diode
Controller/
FRED
Schottky
Thyr./Diode
Breakover
discrete device
Module
Module
Rec. Bridge
Diode
discrete device
Diode
9
297
0
46592
5
46
0
29360
4
35
0
18360
3
30
0
13360
6
120
2
8640
7
120
0
17680
4
80
0
4800
Summary of Tables 6A: HAST
Table 6A
MOSFET/IGBT
discrete device
Total Lots Tested
Total Devices Tested
Total Failures
Total Device Hours
IXYS Semiconductor GmbH
116
3622
0
347712
4
11
240
0
19680
HTRB (Tables 1A .. 1H)
TABLE 1A: MOSFET/IGBT single device
Date Code
# Part Number
or
Test #
1 GWM100-01X1 SL
3030
2 GWM100-01X1 SL
3031
3 GWM160-0055X1SL
3232
4 GWM160-0055X2SL
3233
5 IEA21PG1200LA
2805
6 IXA27IF1200HJ
3376
7 IXA45IF1200HB
3023
8 IXA4IF1200UC
3116
9 IXA55I1200HJ
2585
10 IXA60IF1200NA
2613
11 IXBH9N160G
2446
12 IXBH9N160G
3075
13 IXBX64N250
TP0952
14 IXBX64N250
TP1130
15 IXBX75N170
TP1031
16 IXCH36N250
TP1139
17 IXDH20N120
3356
18 IXDH30N120D1
2603
19 IXDH35N60BD1
2951
20 IXDH35N60BD1
3229
21 IXEH25N120D1
2628
22 IXFA4N100Q
TS1108
23 IXFB100N50Q3
SP1106
24 IXFB110N60P3
SP1110
25 IXFB120N50P2
SP1015
26 IXFB132N50P3
SP1110
27 IXFB170N30P
SP0842
28 IXFB38N100Q2
TP0924
29 IXFB38N100Q2
TP0933
30 IXFB38N100Q2
TP1115
31 IXFB40N110P
SP0851
32 IXFB40N110P
SP0924
33 IXFB40N110P
TP0934
34 IXFB40N110P
TP0952
35 IXFB40N110P
TP1026
36 IXFB44N100P
TP0930
37 IXFB44N100Q3
SP1106
38 IXFB62N80Q3
SP1118
39 IXFB80N50Q2
SP0908
40 IXFB82N60P
SP0851
41 IXFB82N60P
SP0851
42 IXFB82N60Q3
SP1118
43 IXFC26N50
SF0938
44 IXFH100N25P
SS1049
45 IXFH10N100
SP0848
46 IXFH110N15T2
SP0848
47 IXFH120N25T
SS1115
48 IXFH120N25T
SP1141
49 IXFH12N100
TP0848
50 IXFH12N100F
SS1104
51 IXFH12N100F
SS1052
52 IXFH12N100F
SS1052
53 IXFH12N100Q
TP1043
54 IXFH12N80P
SS1051
55 IXFH12N90
SS0911
IXYS Semiconductor GmbH
Voltage
[V]
80
80
44
44
960
960
960
960
960
960
1280
1280
960
960
960
960
960
960
480
480
960
800
400
480
400
400
240
800
800
800
800
880
880
880
880
800
800
640
400
480
480
480
400
200
800
120
200
200
800
800
800
800
800
640
720
Temp.
[°C]
125
125
150
150
125
125
125
150
125
125
125
125
85
125
125
80
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
168
1000
1000
1000
168
168
1000
1000
1000
1000
168
168
168
168
168
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
20
20
20
20
60
20
20
20
20
20
20
20
30
30
30
30
20
20
20
20
20
30
30
30
30
30
30
30
30
30
30
30
25
30
30
30
30
30
30
30
30
30
30
30
30
30
30
77
30
30
30
30
30
30
30
5
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
20000
20000
20000
20000
60000
20000
3360
20000
20000
20000
3360
3360
30000
30000
30000
30000
3360
3360
3360
3360
3360
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 1A (cont'd): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
56 IXFH13N80
SK0727
640
57 IXFH150N17T
SK0841
136
58 IXFH150N17T
SS1014
136
59 IXFH150N17T
SS1014
136
60 IXFH150N17T
SS1020
136
61 IXFH150N17T
SP1021
136
62 IXFH150N17T2
SS0952
136
63 IXFH15N100Q
TP0848
800
64 IXFH15N100Q3
SP1121
800
65 IXFH15N60
SS1104
480
66 IXFH15N80
TP0835
640
67 IXFH15N80
TP0850
640
68 IXFH160N15T2
SS0926
120
69 IXFH18N100Q3
SP1136
800
70 IXFH20N60
TP0848
480
71 IXFH20N60
SS0905
480
72 IXFH20N80P
SS1121
640
73 IXFH20N80Q
TP0850
640
74 IXFH22N60P3
SS1108
480
75 IXFH22N60P3
SS1143
480
76 IXFH230N075T2
SP0928
60
77 IXFH23N80Q
SS0945
640
78 IXFH26N50
SS0846
400
79 IXFH26N50
TP0835
400
80 IXFH26N50P
SK0843
400
81 IXFH26N50Q
SP0850
400
82 IXFH28N60P3
SS1105
480
83 IXFH30N50P
SK0842
400
84 IXFH30N50P
SA0915
400
85 IXFH30N50Q3
SS1117
400
86 IXFH400N075T2
SP0948
60
87 IXFH40N30
TP0848
240
88 IXFH40N30Q
TP0916
240
89 IXFH40N30Q
SS1020
240
90 IXFH42N50P2
SP1009
400
91 IXFH42N60P3
SP1110
480
92 IXFH44N50P
SA0915
400
93 IXFH44N50Q3
SP1133
400
94 IXFH4N100Q
TP0850
800
95 IXFH4N100Q
TP0850
800
96 IXFH50N30Q3
SP1117
240
97 IXFH50N60P3
SP1109
480
98 IXFH50N60P3
SP1127
480
99 IXFH50N60P3
SP1127
480
100 IXFH50N60P3
SP1127
480
101 IXFH52N50P2
SP1010
400
102 IXFH58N20
TK0849
160
103 IXFH60N50P3
SP1109
400
104 IXFH66N20Q
TP0917
160
105 IXFH6N120P
TP0937
960
106 IXFH70N15
SP0850
120
107 IXFH70N20Q3
SS1117
160
108 IXFH70N30Q3
SP1133
240
109 IXFH74N20P
SS1039
160
110 IXFH75N10Q
TP0917
80
111 IXFH88N30P
SP1009
240
112 IXFH94N30T
SS1115
240
113 IXFH94N30T
SP1141
250
114 IXFK230N20T
SP1106
160
IXYS Semiconductor GmbH
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
77
30
77
30
6
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 1A (cont'd): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
115 IXFK230N20T
SP1106
160
116 IXFK26N120P
TP1037
960
117 IXFK26N120P
TP1102
960
118 IXFK26N90
SP0936
720
119 IXFK38N80Q2
TP1105
640
120 IXFK420N10T
SP1046
80
121 IXFK80N60P3
SP1142
480
122 IXFK94N50P2
SP1051
400
123 IXFK94N50P2
SP1111
400
124 IXFN170N30P
SP1045
240
125 IXFN200N10P
SP0918
80
126 IXFN21N100Q
SF1040
800
127 IXFN26N90
SF0942
720
128 IXFN26N90
SF0942
720
129 IXFN26N90
SF1006
720
130 IXFN360N10T
SP0830
80
131 IXFN44N60
SP1103
480
132 IXFN80N50
SF0836
400
133 IXFP4N100Q
TS1013
800
134 IXFP4N100Q
TS1013
800
135 IXFP4N100Q
TS1018
800
136 IXFP4N100QM
T0919
800
137 IXFP76N15T2
SS0920
120
138 IXFP7N100P
SS0931
139 IXFP7N100P
SS0933
800
140 IXFP7N100P
SS0938
800
141 IXFR140N30P
SS1001
240
142 IXFR32N100Q3
SP1133
800
143 IXFR4N100Q
TP0920
800
144 IXFR4N100Q
TP0920
800
145 IXFR4N100Q
TP0920
800
146 IXFR66N50Q2
TP1122
400
147 IXFT14N80P
SP0731
640
148 IXFT36N60P
SF0928
480
149 IXFV30N60PS
SF0929
480
150 IXFX120N25P
SS0922
200
151 IXFX120N25P
SF0942
240
152 IXFX120N25P
2746
200
153 IXFX120N30T
SP0849
240
154 IXFX140N25T
SP0917
200
155 IXFX140N30P
SK0747
240
156 IXFX160N30T
SP0917
240
157 IXFX180N07
SP1005
56
158 IXFX180N10
SK0833
80
159 IXFX180N10
SF0928
80
160 IXFX180N25T
SS0908
200
161 IXFX180N25T
SP0908
200
162 IXFX210N17T
SS0912
136
163 IXFX21N100Q
SS0922
800
164 IXFX21N100Q
SS0922
800
165 IXFX21N100Q
SS0922
800
166 IXFX21N100Q
SS0922
800
167 IXFX21N100Q
SS0922
800
168 IXFX21N100Q
SS0930
800
169 IXFX21N100Q
SS0930
800
170 IXFX21N100Q
SS0930
800
171 IXFX220N17T2
SP0931
136
172 IXFX230N20T
SS0911
160
173 IXFX240N15T2
SS0931
120
174 IXFX24N100Q3
SP1137
800
IXYS Semiconductor GmbH
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
25
30
77
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
80
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
7
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
80000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 1A (cont'd): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
175 IXFX260N17T
SS0912
136
176 IXFX26N120P
TP1102
960
177 IXFX30N110P
SK0837
880
178 IXFX320N17T2
SP0931
136
179 IXFX32N80Q3
SS1122
640
180 IXFX32N90P
TS1122
720
181 IXFX360N10T
SP0931
80
182 IXFX44N55Q
SP0944
440
183 IXFX44N80P
SF1006
640
184 IXFX44N80P
SF1006
640
185 IXFX44N80Q3
SP1123
640
186 IXFX48N50Q
SS0846
400
187 IXFX48N50Q
TP0849
400
188 IXFX48N50Q
SF0938
400
189 IXFX48N60Q3
SS1118
480
190 IXFX64N50P
SS0921
400
191 IXFX64N50P
SP0942
400
192 IXFX64N50P
2924
200
193 IXFX64N50Q3
SP1118
400
194 IXFX64N50Q3
SS1118
400
195 IXFX64N60P3
SP1110
480
196 IXFX64N60Q3
SS1118
480
197 IXFX73N30Q
SF0938
240
198 IXFX78N50P3
SP1109
400
199 IXFX80N50Q3
SP1106
400
200 IXFX80N60P3
SP1109
480
201 IXFX90N20Q
TP0849
160
202 IXFX98N50P3
SP1110
400
203 IXGH12N100
TP0907
800
204 IXGH12N100
TP0907
800
205 IXGH12N120A3
TP0942
960
206 IXGH15N160
TP1020
960
207 IXGH15N160
TP1020
960
208 IXGH16N170
TP0946
960
209 IXGH16N170
TP0946
960
210 IXGH17N100
TP0848
800
211 IXGH17N100
TP0848
800
212 IXGH17N100
TP0848
800
213 IXGH17N100
TP0907
800
214 IXGH17N100
TP0907
800
215 IXGH17N100
TP0943
800
216 IXGH17N100
TP0943
800
217 IXGH17N100
TP0943
800
218 IXGH20N100
TP0924
800
219 IXGH20N100A3
TP1117
800
220 IXGH24N170A
TP0917
960
221 IXGH24N60C4D1
SS1006
480
222 IXGH25N160
SP1001
960
223 IXGH25N160
TP1016
960
224 IXGH2N250
TP1010
960
225 IXGH30N120B3
TP0806
960
226 IXGH30N60B2
SP1003
480
227 IXGH30N60C3D1
SK0840
480
228 IXGH48N60B3
SP0916
480
229 IXGH48N60C3
SS1006
480
230 IXGH50N60C4
SP1133
480
231 IXGH50N60C4
SP1133
480
232 IXGH56N60B3D1
TK0838
480
233 IXGH60N60C3D1
SS0931
480
234 IXGH72N60B3
SS0912
480
IXYS Semiconductor GmbH
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
85
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
80
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
8
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
80000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 1A (cont'd): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
235 IXGH8N100
TP0944
800
236 IXGH8N100
TP0944
800
237 IXGH8N100
TP0944
800
238 IXGK75N250
TP1110
960
239 IXGK75N250
TP1047
960
240 IXGP20N120A3
TS0905
960
241 IXGQ240N30PB
SS0911
240
242 IXGQ240N30PB
SS0911
240
243 IXGQ240N30PB
SS0920
240
244 IXGR16N170
TP0946
960
245 IXGR48N60C3D1
SP0948
800
246 IXGR48N60C3D1
SP0916
480
247 IXGR48N60C3D1
SP0948
480
248 IXGR48N60C3D1
SP0931
480
249 IXGR60N60C2C1
SP0850
480
250 IXGR60N60C3C1
SP0849
480
251 IXGR72N60C3D1
SP0952
480
252 IXGT32N120A3
TP1121
960
253 IXGT60N60B2
SP0826
480
254 IXGX120N120A3
TP0848
960
255 IXGX320N60B3
SS1002
480
256 IXGX320N60B3
SS1002
480
257 IXGX64N250
TP1130
960
258 IXGX72N60A3H1
SP0848
480
259 IXGX72N60B3H1
SS0904
480
260 IXGX72N60B3H1
SS0904
480
261 IXGX72N60B3H1
SS0905
480
262 IXGX72N60B3H1
SS0924
480
263 IXGX72N60B3H1
SS0924
480
264 IXGX72N60B3H1
SS0924
480
265 IXGX72N60B3H1
SS0924
480
266 IXGX72N60B3H1
SS0924
480
267 IXGX72N60B3H1
SS0924
480
268 IXGX72N60B3H1
SS0924
480
269 IXGX72N60B3H1
SS0924
480
270 IXGX72N60B3H1
SS0906
480
271 IXGX72N60C3D1
SS1002
480
272 IXGX72N60C3D1
SS1002
480
273 IXKN75N60C
2955
480
274 IXKR40N60C
3077
480
275 IXLV1861
3061
2300
276 IXSD40N330-8T
3143
2000
277 IXSD40N330-8T
3143
2000
278 IXSD40N330-8T
3143
2000
279 IXSN55N120AU1
TP1017
960
280 IXTA1N100
TS1047
800
281 IXTA2N100
K815
800
282 IXTA2N100P
K736
800
283 IXTA2R4N120P
TP0829
960
284 IXTA36N30P
SS0905
240
285 IXTA3N120
TS1115
960
286 IXTA62N15P
SS1047
120
287 IXTH03N100P
TP0844
800
288 IXTH05N100
TP0943
800
289 IXTH05N100
TP0943
800
290 IXTH05N100
TP0943
800
IXYS Semiconductor GmbH
Temp.
[°C]
125
125
125
85
85
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
85
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
70
150
60
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
168
168
300
1000
168
163
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
77
30
30
30
30
30
30
30
30
30
30
45
30
30
30
30
30
30
30
30
77
77
77
18
30
29
30
30
30
10
15
30
30
30
10
20
20
19
20
19
30
30
30
30
30
30
30
30
70
30
30
30
9
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
1680
3360
6000
19000
3360
3097
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 1A (cont'd): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
291 IXTH05N100
TP1046
800
292 IXTH05N100
TP1046
800
293 IXTH05N100
TP1046
800
294 IXTH08N100P
TP0848
800
295 IXTH12N140
TP1119
960
296 IXTH140P10T
SP1130
-80
297 IXTH15N50L2
TK0837
400
298 IXTH1N80P
TP0905
640
299 IXTH20N60
SP0848
480
300 IXTH21N50
SS1008
400
301 IXTH24N60K
SP1017
480
302 IXTH24N60K
SP1017
480
303 IXTH24P20
TP1003
-160
304 IXTH250N075T
SP0801
60
305 IXTH260N055T2
SP0830
44
306 IXTH260N055T2
SS0937
44
307 IXTH30N60L2
TP0835
480
308 IXTH32P20T
SP1035
-160
309 IXTH360N055T2
SP0926
44
310 IXTH360N055T2
SS0926
44
311 IXTH3N120
SS0922
960
312 IXTH3N120
SS0922
960
313 IXTH3N120
SS0922
960
314 IXTH3N120
SS0922
960
315 IXTH3N120
SS0922
960
316 IXTH440N055T2
SP0948
44
317 IXTH48P20P
S1040
-160
318 IXTH48P20P
SS1050
-160
319 IXTH48P20P
SS1105
-160
320 IXTH48P20P
SP1049
-160
321 IXTH500N04T2
SP0945
32
322 IXTH50P10
SS1033
-80
323 IXTH50P10
TP1002
-80
324 IXTH68P20T
SP1130
-160
325 IXTH75N10
TP0848
80
326 IXTH76P10T
SS1052
-80
327 IXTH96N20P
SS0938
160
328 IXTH96P085T
SP0926
-68
329 IXTK40P50P
SP0747
-400
330 IXTM21N50
SP1023
400
331 IXTP100N04T2
SS0917
32
332 IXTP102N15T
K834
120
333 IXTP10P15T
SS1038
-120
334 IXTP120P065T
SS1013
-52
335 IXTP15P15T
SS1036
-120
336 IXTP182N055T
SS1003
44
337 IXTP1N80P
SS0908
640
338 IXTP200N055T2
SS0847
44
339 IXTP200N055T2
SS0951
44
340 IXTP200N055T2
SS0951
44
341 IXTP220N04T2
SS0927
32
342 IXTP220N04T2
SS1001
44
343 IXTP220N04T2
SS1051
32
344 IXTP22N50PM
SS0924
800
345 IXTP260N055T2
SS908
44
346 IXTP26P10T
SS1040
-80
347 IXTP2N100
SS0914
800
348 IXTP32N20T
SS1051
160
349 IXTP36N30P
SS0842
240
350 IXTP3N120
SS0922
960
IXYS Semiconductor GmbH
Temp.
[°C]
125
125
125
125
85
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
80
30
30
100
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
10
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 1A (cont'd): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
351 IXTP3N120
SS0922
960
352 IXTP3N120
SS0922
960
353 IXTP3N120
SS0930
960
354 IXTP3N120
SS0930
960
355 IXTP3N120
SS0930
960
356 IXTP3N50P
SS1048
400
357 IXTP450P2
SS1047
400
358 IXTP48P05T
SS1040
-40
359 IXTP60N10T
S1038
80
360 IXTP80N12T2
SS1009
96
361 IXTP80N12T2
SS1043
96
362 IXTP8N50P
SS1050
400
363 IXTQ100N25P
SS0846
200
364 IXTQ110N10P
SS1045
80
365 IXTQ130N15T
SK0715
120
366 IXTQ170N10P
SS1041
80
367 IXTQ22N60P
SK1040
480
368 IXTQ22N60P
SS1104
480
369 IXTQ36N30P
SS1029
240
370 IXTQ40N50L2
SS0849
400
371 IXTQ48N20T
SS1004
160
372 IXTQ75N10P
SK0838
80
373 IXTQ88N28T
SK0842
224
374 IXTQ88N30P
SS0939
240
375 IXTQ96N20P
SK0836
160
376 IXTR170P10P
SP1106
-80
377 IXTT140P10T
SP1142
-80
378 IXTT60N20L2
TP1005
160
379 IXTT80N20L
TP1046
160
380 IXTX20N140
TP1126
960
381 IXTX210P10T
SP1130
-80
382 IXTX24N100
SP0837
800
383 IXTX550N055T2
SS1002
44
384 IXTX550N055T2
SS1002
44
385 IXTX600N04T2
SP0945
32
386 IXXH100N60C3
TP1101
480
387 IXXH50N60B3
SS1105
480
388 IXXH50N60C3
SS1105
480
389 IXXH75N60B3
TP1115
480
390 IXYH30N120C3
TP1137
960
391 IXYH50N120C3
TP1137
960
392 IXYH82N120C3
TP1115
960
393 IXYP8N90C3
TS1144
720
394 MKE39A600LA
3038
480
IXYS Semiconductor GmbH
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
77
30
30
77
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
10
11
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
10000
Remark
TABLE 1B: MOSFET/IGBT Module
Date Code
# Part Number
or
Test #
1 MID200-12A4
3326
2 MID200-12A4
3326
3 MITA15WB1200TMH
2502
4 MITB15WB1200TMH
2502
5 MIXA100W1200TEH
3248
6 MKI450-12E9
2636
7 MUBW36-12E7
2487
8 MUBW50-06A7
3128
9 VMM90-09F
2467
10 VMM90-09F
3214
11 VWM270-0075X2
2825
Voltage
[V]
960
960
960
960
960
960
960
1120
720
720
60
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
168
168
1000
1000
1000
1000
168
1000
168
168
1000
Sample
Size
10
10
10
10
10
6
10
8
10
10
10
Failures
TABLE 1C: Thyristor/Diode Module
Date Code
# Part Number
or
Test #
1 MCC26-16io1
2616
2 MCC310-16
2537
3 MCC312
2820
4 MCC312-16
3028
5 MCC312-16
3511
6 MCC312-16io1
3099
7 MCC56-16io1
3127
8 MCC56-18
3129
9 MCC95-16io1
2450
10 MCC95-16io1B
3276
11 MCO150-16io1
3339
12 MDD172
3465
13 MDD172-12
3331
14 MDD312-16N1
3301
15 MDD312-18N1
2959
16 UGE0421AY4
2464
Voltage
[V]
1120
1120
1120
1120
1120
1120
1120
1260
1120
1120
1120
1260
1260
1120
1260
2240
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
168
168
1000
1000
168
168
168
1000
168
168
168
1000
168
168
168
168
Sample
Size
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
Failures
TABLE 1D: Controller/Rectifier Bridge
Date Code
# Part Number
or
Test #
1 MMO230-14io7
2459
2 MMO74-16io6
2469
3 MMO75-16io1
2457
4 VUC36-16go2
3320
5 VUC36-16go2
3320
6 VUO 192-16NO7
2615
7 VUO155-16
3101
8 VUO52
2824
9 VUO52
3118
10 VUO52-16
2563
11 VUO52-16
2563
12 VUO52-22
3240
13 VUO82-16NO7
3087
Voltage
[V]
980
1120
1120
1120
1120
1260
1120
1120
1400
1120
1120
1540
1120
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
168
168
168
168
168
1000
168
1000
1000
168
168
1000
168
Sample
Size
10
20
10
10
10
10
10
20
20
10
10
20
10
Failures
Voltage
[V]
1440
960
480
960
240
320
480
960
840
480
480
960
960
960
480
320
960
480
480
800
480
960
960
960
480
480
480
480
960
480
960
480
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
168
1000
1000
1000
1000
168
168
168
1000
168
1000
1000
1000
168
168
168
168
1000
168
1000
168
168
168
168
168
1000
168
1000
168
168
168
Sample
Size
10
20
20
20
20
20
10
20
20
20
20
10
10
10
10
10
10
20
20
20
20
20
20
10
20
20
40
20
20
20
10
10
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
1680
1680
10000
10000
10000
6000
1680
8000
1680
1680
10000
Remark
Device Hours
[hrs]
1680
1680
10000
10000
1680
1680
1680
10000
1680
1680
1680
10000
1680
1680
1680
1680
Remark
Device Hours
[hrs]
1680
3360
1680
1680
1680
10000
1680
20000
20000
1680
1680
20000
1680
Remark
Device Hours
[hrs]
10000
3360
20000
20000
20000
20000
1680
3360
3360
20000
3360
10000
10000
10000
1680
1680
1680
3360
20000
3360
20000
3360
3360
1680
3360
3360
40000
3360
20000
3360
1680
1680
Remark
TABLE 1E: FRED
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
DH2x60-18A
DHG30I1200HA
DHG30IM600PC
DHG50X1200NA
DPG30P300PJ
DPG60IM400QB
DSEC240-06A
DSEE55-24N1F
DSEE55-24N1F
DSEI12-06A
DSEI12-06A
DSEI2x101-12A
DSEI2x101-12A
DSEI2x101-12A
DSEI2x31-06P
DSEI2x61-04C
DSEI2x61-12B
DSEI30-06A
DSEI30-06A
DSEI30-10A
DSEP15-06A
DSEP15-12CR
DSEP29-12A
DSEP2x31-12A
DSEP30-06A
DSEP30-06BR
DSEP60-06A
DSEP60-06A
DSEP60-12A
DSEP75-06AR
MEA75-12DA
MEK95-06DA
IXYS Semiconductor GmbH
Date Code
or
Test #
2609
2608
3393
2624
2715
3280
2479
2627
2627
2604
2881
2509
2773
3325
3461
2565
3091
2602
2833
3069
3002
2600
3183
3226
2440
2879
2830
2974
2672
3343
2958
3212
12
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
0
0
0
0
0
0
0
0
0
0
0
0
0
1
0
TABLE 1F: Schottky Diode
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
DSA10C150PB
DSA50C100QB
DSA50C100QB
DSA60C150PB
DSA70C150HB
DSA90C200HR
DSSK38-0025B
DSSK60-015A
DSSK60-015AR
DSSK60-015AR
DSSK60-02A
DSSK70-008AR
DSSK70-008AR
DSSK80-0025B
DSSK80-003B
DSSK80-006B
DSSS35-008AR
Date Code
or
Test #
2956
2532
3451
2577
3350
2622
2953
3181
2478
2772
2981
2982
2982
3199
3072
2878
3446
TABLE 1G: Thyristor/Diode single device
Date Code
# Part Number
or
Test #
1 CLA30E1200PC
2657
2 CS20-25MoT1
2485
3 CS22-12io1M
3187
4 CS30-12io1
3344
5 CS30-16io1
2980
6 CS35-14io4
3090
7 CS45-16io1
2438
8 CS45-16io1
3180
9 CS60-12io1
2581
10 CS60-16io1
2960
11 CS60-16io1
2960
12 CS8-12io2
2458
13 CSM401B
3377
14 DSA17-18A
2954
15 DSA9-18
3337
16 DSI45-16A
3443
17 DSP25-12A
2876
18 DSP25-16A
2601
19 DSP45-16A
3068
Voltage
[V]
150
100
100
150
150
200
20
150
150
150
200
80
80
20
24
48
80
Temp.
[°C]
125
125
125
125
125
125
100
125
125
125
125
125
125
100
100
100
125
Time
[hrs]
1000
168
168
1000
168
1000
1000
168
168
1000
168
168
168
1000
1000
1000
168
Sample
Size
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
Failures
Voltage
[V]
840
2100
840
840
1120
980
1120
1120
840
1120
1120
1280
2000
1260
1260
1120
1120
1120
1120
Temp.
[°C]
125
85
125
125
125
125
125
125
125
125
125
125
85
150
150
150
150
150
150
Time
[hrs]
1000
311
168
168
168
168
168
168
1000
1000
1000
168
1000
168
168
168
168
168
168
Sample
Size
20
20
20
20
20
10
20
20
20
20
20
10
10
10
10
20
20
20
20
Failures
Voltage
[V]
480
640
800
1120
Temp.
[°C]
125
125
125
125
Time
[hrs]
168
168
168
1000
Sample
Size
20
20
20
20
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
20000
3360
3360
20000
3360
20000
20000
3360
3360
20000
3360
3360
3360
20000
20000
20000
3360
Remark
Device Hours
[hrs]
20000
6220
3360
3360
3360
1680
3360
3360
20000
20000
20000
1680
10000
1680
1680
3360
3360
3360
3360
Remark
Device Hours
[hrs]
3360
3360
3360
20000
Remark
TABLE 1H: Breakover Diode
#
Part Number
1
2
3
4
IXBOD1-06
IXBOD1-08
IXBOD1-10
IXBOD2-14EPI
IXYS Semiconductor GmbH
Date Code
or
Test #
3458
3079
2436
2905
13
0
0
0
0
HTGB (Tables 2A .. 2B)
TABLE 2A: MOSFET/IGBT single device
Date Code
# Part Number
or
Test #
1
IXTQ75N10P
SK0838
2
IXDR30N120D1
2541
3
IXBH5N160G
2983
4
IXBP5N160G
2454
5
IXDN75N120
2566
6
IXKH70N60C5
3361
7
IXKN75N60C
3094
8
IXKR40N60C
3360
9
GWM160-0055X1SL
2786
10 GWM100-01X1 SL
3030
11 GWM100-01X1 SL
3031
12 IEA21PG1200LA
2598
13 IXA40PG1200DHGLA
3211
14 IXA55I1200HJ
2585
15 IXA55I200HJ
2511
16 IXFH26N50
SS0846
17 IXFX48N50Q
SS0846
18 IXGR48N60C3D1
SP0948
19 IXFH150N17T
SK0841
20 IXTP36N30P
SS0842
21 IXFH26N50
TP0835
22 IXFH15N80
TP0835
23 IXFH26N50Q
SP0850
24 IXFH10N100
SP0848
25 IXFH30N50P
SK0842
26 IXTH260N055T2
SP0830
27 IXFX180N10
SK0833
28 IXFH12N100
TP0848
29 IXGX72N60B3H1
SS0904
30 IXGX72N60B3H1
SS0904
31 IXGX72N60B3H1
SS0905
32 IXGH17N100
TP0907
33 IXTH30N60L2
TP0835
34 IXFX48N50Q
TP0849
35 IXTQ40N50L2
SS0849
36 IXFH20N80Q
TP0850
37 IXTH15N50L2
TK0837
38 IXFH15N100Q
TP0848
39 IXTP260N055T2
SS908
40 IXGQ150N33TCD1
SS0908
41 IXTA36N30P
SS0905
42 IXFH20N60
SS0905
43 IXFB80N50Q2
SP0908
44 IXGQ240N30PB
SS0911
45 IXFH13N80
SK0727
46 IXGR60N60C3C1
SP0849
47 IXTX24N100
SP0837
48 IXGP20N120A3
TS0905
49 IXGH40N120C3D1
TK0840
50 IXGH72N60B3
SS0912
51 IXFH44N50P
SA0915
52 IXFH30N50P
SA0915
53 IXFX260N17T
SS0912
54 IXFX210N17T
SS0912
55 IXFX230N20T
SS0911
56 IXFX180N25T
SS0908
57 IXGX72N60A3H1
SP0848
58 IXGH30N60C3D1
SK0840
59 IXFX140N30P
SK0747
60 IXFX120N30T
SP0849
IXYS Semiconductor GmbH
Voltage
[V]
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
Temp.
[°C]
125
150
150
150
150
150
150
150
150
150
150
125
150
150
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
168
168
168
168
168
168
168
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
10
20
20
20
20
20
20
10
20
20
20
20
20
20
30
30
30
30
30
30
30
30
30
30
30
30
30
77
77
77
30
30
30
30
30
30
30
30
30
30
30
30
30
30
45
30
30
30
30
30
30
30
30
30
30
30
30
30
30
14
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
1680
3360
3360
3360
3360
3360
3360
10000
20000
20000
20000
20000
20000
20000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 2A (cont`d): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
61 IXFX140N25T
SP0917
16
62 IXFX160N30T
SP0917
16
63 IXGR48N60C3D1
SP0916
16
64 IXTK40P50P
SP0747
-16
65 IXTQ100N25P
SS0846
16
66 IXFX64N50P
SS0921
16
67 IXFH70N15
SP0850
16
68 IXFH110N15T2
SP0848
16
69 IXFX120N25P
SS0922
16
70 IXFN200N10P
SP0918
16
71 IXFX180N25T
SP0908
16
72 IXGH48N60B3
SP0916
16
73 IXGQ240N30PB
SS0920
16
74 IXFR4N100Q
TP0920
16
75 IXTP2N100
SS0914
16
76 IXFB38N100Q2
TP0924
16
77 IXGH56N60B3D1
TK0838
16
78 IXTA2N100
K815
16
79 IXFV30N60PS
SF0929
16
80 IXFP4N100QM
T0919
16
81 IXFT36N60P
SF0928
16
82 IXFH40N30Q
TP0916
16
83 IXTH250N075T
SP0801
16
84 IXFB44N100P
TP0930
16
85 IXFB170N30P
SP0842
16
86 IXFH12N90
SS0911
16
87 IXTH75N10
TP0848
16
88 IXFP7N100P
SS0931
16
89 IXFB82N60P
SP0851
16
90 IXFB82N60P
SP0851
16
91 IXTA2N100P
K736
16
92 IXTP22N50PM
SS0924
16
93 IXFB38N100Q2
TP0933
16
94 IXFB40N110P
SP0924
16
95 IXFP7N100P
SS0933
16
96 IXFK26N90
SP0936
16
97 IXTP100N04T2
SS0917
16
98 IXFX90N20Q
TP0849
16
99 IXFH66N20Q
TP0917
16
100 IXTP220N04T2
SS0927
16
101 IXFP76N15T2
SS0920
16
102 IXFX240N15T2
SS0931
16
103 IXGH30N120B3
TP0806
16
104 IXTQ130N15T
SK0715
16
105 IXFX64N50P
SP0942
16
106 IXTQ88N28T
SK0842
16
107 IXGH8N100
TP0944
16
108 IXGH8N100
TP0944
16
109 IXGH8N100
TP0944
16
110 IXTH05N100
TP0943
16
111 IXFX48N50Q
SF0938
16
112 IXFH6N120P
TP0937
16
113 IXFH12N100Q
TP1043
16
114 IXFH74N20P
SS1039
16
115 IXTH96N20P
SS0938
16
116 IXTH96P085T
SP0926
16
117 IXFX360N10T
SP0931
16
118 IXTX600N04T2
SP0945
16
119 IXTH260N055T2
SS0937
16
120 IXFH75N10Q
TP0917
16
121 IXGH20N100
TP0924
16
122 IXTQ88N30P
SS0939
16
IXYS Semiconductor GmbH
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
77
15
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 2A (cont`d): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
123 IXFX73N30Q
SF0938
16
124 IXFX120N25P
SF0942
16
125 IXFH230N075T2
SP0928
16
126 IXTH500N04T2
SP0945
16
127 IXTH440N055T2
SP0948
16
128 IXFH400N075T2
SP0948
16
129 IXFN26N90
SF0942
16
130 IXGR48N60C3D1
SP0948
16
131 IXGR48N60C3D1
SP0931
16
132 IXGH25N160
SP1001
16
133 IXGR72N60C3D1
SP0952
16
134 IXGH60N60C3D1
SS0931
16
135 IXGH30N60B2
SP1003
16
136 IXFX220N17T2
SP0931
16
137 IXFH160N15T2
SS0926
16
138 IXFH150N17T2
SS0952
16
139 IXTP182N055T
SS1003
16
140 IXTH50P10
TP1002
16
141 IXTH24P20
TP1003
16
142 IXTQ48N20T
SS1004
16
143 IXTQ96N20P
SK0836
16
144 IXFR140N30P
SS1001
16
145 IXTP80N12T2
SS1009
16
146 IXFX180N07
SP1005
16
147 IXFH58N20
TK0849
16
148 IXTH21N50
SS1008
16
149 IXGH24N60C4D1
SS1006
16
150 IXFC26N50
SF0938
16
151 IXFX44N55Q
SP0944
16
152 IXFX44N80P
SF1006
16
153 IXFN80N50
SF0836
16
154 IXFN26N90
SF1006
16
155 IXGT60N60B2
SP0826
16
156 IXFH26N50P
SK0843
16
157 IXFH52N50P2
SP1010
16
158 IXFH42N50P2
SP1009
16
159 IXFB120N50P2
SP1015
16
160 IXFH150N17T
SS1014
16
161 IXFH150N17T
SS1014
16
162 IXFH150N17T
SS1020
16
163 IXGH25N160
TP1016
16
164 IXFH150N17T
SP1021
16
165 IXFB40N110P
TP1026
16
166 IXFH88N30P
SP1009
16
167 IXFH40N30Q
TP0916
16
168 IXGH48N60C3
SS1006
16
169 IXTP60N10T
S1038
16
170 IXFK26N120P
TP1037
16
171 IXTH48P20P
S1040
-16
172 IXTA2R4N120P
TP0829
16
173 IXTP10P15T
SS1038
-16
174 IXTP15P15T
SS1036
-16
175 IXTH32P20T
SP1035
-16
176 IXTP48P05T
SS1040
-16
177 IXTP26P10T
SS1040
-16
178 IXFN21N100Q
SF1040
16
179 IXTH50P10
SS1033
-16
180 IXTQ22N60P
SK1040
16
181 IXTH48P20P
SS1050
-16
182 IXSN55N120AU1
TP1017
16
183 IXBX75N170
TP1031
16
IXYS Semiconductor GmbH
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
77
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
16
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 2A (cont`d): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
184 IXFX26N120P
TP1102
16
185 IXFK26N120P
TP1102
16
186 IXXH100N60C3
TP1101
16
187 IXTQ36N30P
SS1029
16
188 IXFH12N100F
SS1104
16
189 IXTA1N100
TS1047
16
190 IXTQ110N10P
SS1045
16
191 IXTQ170N10P
SS1041
16
192 IXTQ22N60P
ss1104
16
193 IXFH15N60
SS1104
16
194 IXTP3N50P
SS1048
16
195 IXTP8N50P
SS1050
16
196 IXFK94N50P2
SP1051
16
197 IXTP450P2
SS1047
16
198 IXTP80N12T2
SS1043
16
199 IXFH12N80P
SS1051
16
200 IXTA62N15P
SS1047
16
201 IXTP32N20T
SS1051
16
202 IXFH100N25P
SS1049
16
203 IXGH24N170A
TP0917
16
204 IXTP120P065T
SS1013
-16
205 IXFN170N30P
SP1045
16
206 IXTP220N04T2
SS1051
16
207 IXTH48P20P
SS1105
-16
208 IXTH48P20P
SP1049
-16
209 IXFK230N20T
SP1106
16
210 IXFX98N50P3
SP1110
24
211 IXTH76P10T
SS1052
-16
212 IXFH12N100F
SS1052
16
213 IXFH12N100F
SS1052
16
214 IXXH50N60C3
SS1105
16
215 IXFN44N60
SP1103
16
216 IXXH50N60B3
SS1105
16
217 IXGH50N60C4
SS1052
16
218 IXFH40N30Q
SS1020
16
219 IXGK75N250
TP1110
16
220 IXGH2N250
TP1010
16
221 IXFA4N100Q
TS1108
16
222 IXFK420N10T
SP1046
16
223 IXFX80N50Q3
SP1106
24
224 IXFX78N50P3
SP1109
24
225 IXTR170P10P
SP1106
-16
226 IXFH50N60P3
SP1109
24
227 IXFX80N60P3
SP1109
24
228 IXFH60N50P3
SP1109
24
229 IXFX64N60P3
SP1110
24
230 IXFT14N80P
SP0731
16
231 IXTT16N20D2
TP1019
16
232 IXFH42N60P3
SP1110
24
233 IXTT80N20L
TP1046
16
234 IXFH22N60P3
SS1108
24
235 IXFB38N100Q2
TP1115
16
236 IXFB44N100Q3
SP1106
24
237 IXFB100N50Q3
SP1106
24
238 IXFB110N60P3
SP1110
24
239 IXTM21N50
SP1023
16
240 IXTT60N20L2
TP1005
16
241 IXTA3N120
TS1115
16
242 IXFK230N20T
SP1106
16
243 IXFH50N30Q3
SP1117
16
244 IXFB132N50P3
SP1110
24
245 IXFH28N60P3
SS1105
24
IXYS Semiconductor GmbH
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
17
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 2A (cont`d): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
246 IXFH70N20Q3
SS1117
16
247 IXTP102N15T
K834
16
248 IXFK94N50P2
SP1111
30
249 IXYH82N120C3
TP1115
16
250 IXFH30N50Q3
SS1117
16
251 IXTH12N140
TP1119
16
252 IXFX64N50Q3
SP1118
24
253 IXFB62N80Q3
SP1118
24
254 IXFB82N60Q3
SP1118
24
255 IXFR66N50Q2
TP1122
24
256 IXGK75N250
TP1047
16
257 IXFX48N60Q3
SS1118
24
258 IXFX64N60Q3
SS1118
24
259 IXFH15N100Q3
SP1121
24
260 IXFX44N80Q3
SP1123
24
261 IXFX32N80Q3
SS1122
24
262 IXFH20N80P
SS1121
24
263 IXFK38N80Q2
TP1105
24
264 IXGT32N120A3
TP1121
16
265 IXBX64N250
TP1130
16
266 IXTH68P20T
SP1130
-12
267 IXTH140P10T
SP1130
-12
268 IXTX20N140
TP1126
24
269 IXFR32N100Q3
SP1133
16
270 IXFH44N50Q3
SP1133
24
271 IXFH70N30Q3
SP1133
24
272 IXFH120N25T
SS1115
16
273 IXFH94N30T
SS1115
16
274 IXYH50N120C3
TP1137
16
275 IXYH30N120C3
TP1137
16
276 IXFX32N90P
TS1122
24
277 IXTH1N80P
TP0905
16
278 IXTP1N80P
SS0908
16
279 IXFX24N100Q3
SP1137
24
280 IXFH18N100Q3
SP1136
24
281 IXFH120N25T
SP1141
16
282 IXFH94N30T
SP1141
16
283 IXYP8N90C3
TS1144
16
284 IXA55I200HJ
2511
20
285 IXFX120N25P
2746
20
286 IXFX64N50P
2924
20
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
85
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
150
150
150
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
77
30
30
30
30
30
30
30
77
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
77
77
30
32
80
80
Failures
TABLE 2B: MOSFET/IGBT Module
Date Code
# Part Number
or
Test #
1 MID200-12A4
3328
2 MII300-12E4
2432
3 MIXA20W1200MC
3089
4 MKI450-12E9
2636
5 MUBW20-06A6K
3007
6 MWI452-17E9
2904
7 VMM90-09F
3217
8 VMO1200-01
2480
9 VUB145-16NOXT
3281
10 VUM33-06PH
3302
11 VVZB170-16IOXT
3282
12 VWI20-06P1
2462
13 VWM270-0075X2
2825
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
168
168
168
1000
168
1000
168
168
168
168
168
168
1000
Sample
Size
10
10
10
6
10
10
10
10
10
10
10
10
10
Failures
IXYS Semiconductor GmbH
Voltage
[V]
16
16
16
16
16
16
16
16
16
16
16
16
16
18
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
32000
80000
80000
Remark
Device Hours
[hrs]
1680
1680
1680
6000
1680
10000
1680
1680
1680
1680
1680
1680
10000
Remark
POWER CYCLE (Tables 3A ..3G)
TABLE 3A: MOSFET/IGBT single device
Date Code
#
Part Number
or
Tj(max)
Test #
[°C]
1
IXBH40N160
3243
125
2
IXBH9N160G
3357
125
3
IXKH35N60C5
3160
125
4
IXKR47N60C5
3188
145
5
IXA20PG1200DHGLA
3211
125
6
IXGX72N60B3H1
SP0809
7
IXFX48N50Q
SS0846
8
IXFK26N90
SP0936
9
IXFB80N50Q2
SP0908
10 IXGH72N60B3
SS0912
11 IXGX72N60A3H1
SP0848
12 IXGR48N60C3D1
SP0916
13 IXFX64N50P
TP0907
14 IXFX210N17T
SS0912
15 IXGH32N170
TP0907
16 IXGQ240N30PB
SS0912
17 IXFT36N60P
SF0929
18 IXTA2N100P
K736
19 IXTP220N04T2
SS0927
20 IXTP2N100
SS0914
21 IXFP7N100P
SP0924
22 IXFK140N30P
SP0940
23 IXFX240N15T2
SS0920
24 IXGH24N60C4D1
SS1006
25 IXFC26N50
SF0938
26 IXFB38N100Q2
TP0933
27 IXFX64N50P
SP0942
28 IXFB40N110P
SP0924
29 IXFB40N110P
TP1026
30 IXTP60N10T
S1038
31 IXFH12N100Q
TP1043
32 IXTH32P20T
SP1035
33 IXTH48P20P
SP0931
34 IXTH96N20P
SS0938
35 IXTH48P20P
SS1050
36 IXTQ22N60P
SK1040
37 IXBX75N170
TP1031
38 IXTH50P10
SS1033
39 IXFK26N120P
TP1102
40 IXTP120P065T
SS1013
41 IXTH76P10T
SS1052
42 IXFK230N20T
SP1106
43 IXTR170P10P
SP1106
44 IXGH30N120B3
SS0920
45 IXFB110N60P3
SP1110
46 IXFK94N50P2
SP1051
IXYS Semiconductor GmbH
∆Τ
[K]
80
80
80
100
80
125
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
Number
of
Cycles
2000
2000
2000
2000
8000
3000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
Sample
Size
20
20
20
20
10
77
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
16
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
40000
40000
40000
40000
80000
231000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
Remark
TABLE 3A: MOSFET/IGBT single device
Date Code
#
Part Number
or
Tj(max)
Test #
[°C]
47 IXFH42N60P3
SP1110
48 IXFH12N100F
SS1052
49 IXFH50N30Q3
SP1117
50 IXFH50N60P3
SP1109
51 IXTM21N50
SP1023
52 IXTA3N120
TS1115
53 IXFA4N100Q
TS1108
54 IXFR66N50Q2
TP1122
55 IXFX64N50Q3
SP1118
56 IXTT80N20L
TP1046
57 IXFB170N30P
SP0842
58 IXBX64N250
TP0952
59 IXFK420N10T
SP1046
60 IXGK75N250
TP1046
61 IXBX64N250
TP1130
62 IXFB44N100Q3
SP1106
63 IXTT16N20D2
TP1019
64 IXFX44N80Q3
SP1123
65 IXGT32N120A3
TP1121
66 IXTH140P10T
SP1130
67 IXTH68P20T
SP1130
68 IXTH96P085T
SP0926
69 IXFH40N30Q
SS1020
70 IXGH2N250
TP1010
71 IXFH28N60P3
SS1115
72 IXTP26P10T
SS1040
73 IXTP10P15T
SS1038
74 IXFH120N25T
SS1115
75 IXTP1N80P
SS0908
76 IXYH30N120C3
TP1137
77 IXFH94N30T
SS1115
78 IXFH52N50P2
SP1010
79 IXXH100N60C3
TP1101
80 IXFH40N30Q
TP0916
81 IXTX20N140
TP1126
82 IXFX48N50Q
SF0938
83 IXGH50N60C4
SP1133
84 IXFX120N25P
2746
150
85 IXFH88N30P
SP1009
86 IXFH120N25T
SP1141
87 IXTT140P10T
SP1142
88 IXFK94N50P2
SP1111
89 IEA21PG1200LA
2598
125
IXYS Semiconductor GmbH
∆Τ
[K]
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
80
Number
of
Cycles
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
6000
10000
10000
10000
15000
80000
Sample
Size
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
80
77
77
77
77
20
17
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
480000
770000
770000
770000
1155000
1600000
Remark
TABLE 3B: MOSFET/IGBT Module
Date Code
#
Part Number
or
Test #
1
MIXA60WB1200TEH
2513
2
MKI450-12E9
2636
3
MKI65A7T
2728
4
VWM270-0075X2
2825
Tj(max)
[°C]
125
125
125
125
∆Τ
[K]
80
80
80
80
Number
of
Cycles
20000
20000
20000
10000
Sample
Size
10
6
10
10
Failures
Device Cycles
0
0
0
0
200000
120000
200000
100000
TABLE 3C: Thyristor/Diode Module
Date Code
#
Part Number
or
Test #
1 MCC162-14io1
2555
2 MCC44-16io1B
2989
3 MDD172-16
3202
4 MDD26-16
3205
5 MDD95-16
3330
Tj(max)
[°C]
125
125
125
125
125
∆Τ
[K]
80
80
80
80
80
Number
of
Cycles
10000
10000
10000
10000
10000
Sample
Size
10
10
10
10
10
Failures
Device Cycles
0
0
0
0
0
100000
100000
100000
100000
100000
TABLE 3D: Controller, Rectifier Bridge
Date Code
#
Part Number
or
Test #
1 VUO 192-16NO7
2615
2 VUO52-16NO1
3001
3 VUO52-16NO1
3234
4 VUO82-16NO7
3463
5 VVZ40-14
3103
Tj(max)
[°C]
125
125
125
125
125
∆Τ
[K]
80
80
80
80
80
Number
of
Cycles
5000
5000
5000
2000
5000
Sample
Size
10
10
10
10
10
Failures
Device Cycles
0
0
0
0
0
50000
50000
50000
20000
50000
Tj(max)
[°C]
145
145
145
145
145
125
145
145
145
145
145
145
145
145
125
∆Τ
[K]
100
100
100
100
100
80
100
100
100
100
100
100
100
100
80
Number
of
Cycles
2000
4000
2000
4000
2000
2000
4000
2000
4000
2000
2000
2000
2000
2000
5000
Sample
Size
20
20
20
20
20
10
20
20
20
20
20
20
20
20
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
40000
80000
40000
80000
40000
20000
80000
40000
80000
40000
40000
40000
40000
40000
50000
Remark
Remark
Remark
TABLE 3E: FRED
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
DPG15I300PA
DPG30P300PJ
DPG60C300HB
DSEI12-06A
DSEI12-06A
DSEI2x121-02A
DSEI30-06A
DSEK60-02A
DSEP15-06A
DSEP15-12CR
DSEP30-06BR
DSEP60-06A
DSEP60-12A
DSEP60-12AR
MEE300-06
IXYS Semiconductor GmbH
Date Code
or
Test #
3354
2715
2477
2604
2875
3093
2833
3448
3002
2883
2984
3071
3179
3444
2992
18
Remark
TABLE 3F: Schottky Diode
Tj(max)
[°C]
145
145
145
145
145
145
145
∆Τ
[K]
100
100
100
100
100
100
100
Number
of
Cycles
2000
4000
40000
2000
2000
2000
2000
Sample
Size
20
20
20
20
20
20
20
Failures
Device Cycles
0
0
0
0
0
0
0
40000
80000
800000
40000
40000
40000
40000
TABLE 3G: Thyristor/Diode single device
Date Code
#
Part Number
or
Tj(max)
Test #
[°C]
1 CLA30E1200PC
2657
125
2 CLA80E1200HF
2670
125
3 CLA80E1200HF
2670
125
4 CS20-12io1
2957
125
5 CS30-16io1
2986
125
6 CS35-14io4
3090
125
7 CS45-12io1
3162
125
8 DSA1-16D
2471
150
9 DSA1-18D
3200
150
10 DSA17-18A
2954
130
11 DSA30I150PA
3185
145
12 DSA9-18F
3338
115
13 DSI2x55-16A
3340
125
14 DSI30-12A
3490
145
15 DSI45-12A
3227
145
16 DSI45-16AR
3348
145
17 DSP25-12A
3355
145
∆Τ
[K]
80
80
80
80
80
80
80
100
100
100
100
85
80
100
100
100
100
Number
of
Cycles
4000
4000
4000
2000
2000
2000
2000
2000
2000
2000
2000
2000
5000
2000
2000
2000
2000
Sample
Size
20
10
10
20
20
10
20
20
20
10
20
10
10
20
20
20
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
80000
40000
40000
40000
40000
20000
40000
40000
40000
20000
40000
20000
50000
40000
40000
40000
40000
#
Part Number
1
2
3
4
5
6
9
DSA70C150HB
DSA90C200HR
DSA90C200HR
DSSK30-018A
DSSK40-008B
DSSK50-01A
DSSK60-015A
IXYS Semiconductor GmbH
Date Code
or
Test #
2985
2993
2993
3074
3450
3349
2947
19
Remark
Remark
TEMPERATURE CYCLE (Tables 4A ..4H)
TABLE 4A: MOSFET/IGBT single device
Date Code
#
Part Number
or
Test #
1 IXFB80N50Q2
SP0908
2 IXGH40N120C3D1
TK0840
3 IXTQ40N50L2
SS0849
4 IXTH15N50L2
TK0837
5 IXTP260N055T2
SJ136F
6 IXFH15N100Q
TP0848
7 IXFH20N80Q
TP0850
8 IXFX48N50Q
TP0849
9 IXTA36N30P
SS0905
10 IXGQ150N33TCD1
SS0908
11 IXFH20N60
SS0905
12 IEA21/36PG1200
3041
13 IXBH40N160
3497
14 IXBH40N160
3242
15 IXBH5N160G
3076
16 IXBH9N160G
2446
17 IXBH9N160G
2952
18 IXDR30N120D1
2442
19 IXEH25N120D1
2542
20 IXKH70N60C5
3358
21 IXKR47N60C5
2979
22 IXFB40N110P
TP1129
23 FDM47-06KC5
2642
24 IXA27IF1200HJ
3376
25 IXA60IF1200NA
2613
26 IXLV1861
3061
27 IXRH25N120
2500
28 IXBH9N160G
TP0920
29 IXFB38N100Q2
TP0914
30 IXTP100N04T2
SS0917
31 IXGH72N60B3
SS0912
32 IXGQ240N30PB
SS0911
33 IXGH40N120C3D1
TK0840
34 IXTX8N150L
TP0912
35 IXSN55N120AU1
TP1017
36 IXFK38N80Q2
TP1105
37 IXBX64N250
TP1130
38 IXBH40N160
2761
39 IXFR90N30
SP1017
40 IXA60IF1200NA
2710
41 IXGR60N60C3C1
SP0849
42 IXGH56N60B3D1
TK0838
43 IXGH60N60C3D1
SS0931
44 IXFH52N50P2
SP1010
45 IXXH100N60C3
TP1101
46 IXTQ110N10P
SS1045
47 IXTR170P10P
SP1106
48 IXXH50N60B3
SS1105
49 IXFK420N10T
SP1046
50 IXGH2N250
TP1010
51 IXFK64N50P
SP0916
52 IXFK120N25P
SP0824
53 IXFX120N25P
SP0847
54 IXFX120N30T
SP0847
55 IXFX210N17T
SS0912
56 IXFX140N25T
SP0917
IXYS Semiconductor GmbH
Low
Temp.
[°C]
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-40
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
High
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
150
150
150
150
150
150
150
150
150
150
125
150
150
150
150
150
125
125
125
125
125
125
125
125
125
125
150
125
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Number
of
Cycles
10
10
10
10
10
10
10
10
10
10
10
50
50
50
50
50
50
50
50
50
50
50
100
100
100
100
100
250
250
250
100
100
100
100
100
100
100
100
192
300
250
250
250
250
250
250
250
250
250
250
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
77
77
77
77
77
77
77
77
77
20
20
20
20
20
20
20
20
20
20
30
20
20
20
20
20
10
10
10
30
30
30
30
30
30
30
40
30
20
30
30
30
30
30
30
30
30
30
30
10
10
10
10
10
10
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
300
300
770
770
770
770
770
770
770
770
770
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1500
2000
2000
2000
2000
2000
2500
2500
2500
3000
3000
3000
3000
3000
3000
3000
4000
5760
6000
7500
7500
7500
7500
7500
7500
7500
7500
7500
7500
10000
10000
10000
10000
10000
10000
Remark
TABLE 4A (cont'd): MOSFET/IGBT single device
Date Code
Low
#
Part Number
or
Temp.
Test #
[°C]
57 IXFX210N17T
SS0912
-55
58 IXFX64N50P
SS0921
-55
59 IXFH44N50P
SA0915
-55
60 IXFH30N50P
SA0915
-55
61 IXFX160N30T
SP0917
-55
62 IXFX260N17T
SS0912
-55
63 IXGH30N60C3D1
SK0840
-55
64 IXFX140N30P
SK0747
-55
65 IXGR48N60C3D1
SP0916
-55
66 IXTK40P50P
SP0747
-55
67 IXFB170N30P
SP0842
-55
68 IXFH66N20Q
TP0917
-55
69 IXTH75N10
TP0848
-55
70 IXGH24N170A
TP0917
-55
71 IXA20SV1200DHGLA
3211
-40
72 IXA40PG1200DHGLA
3211
-40
73 IXFN44N50Q
TP0919
-55
74 IXTQ170N10P
SS1041
-55
75 IXFN170N30P
SP1045
-55
76 IXTA62N15P
SS1047
-55
77 IXFB110N60P3
SP1110
-55
78 IXGH50N60C4
SS1052
-55
79 IEA21PG1200LA
2598
-40
80 IXTH3N120
SS0922
-55
81 IXTH3N120
SS0922
-55
82 IXTH3N120
SS0922
-55
83 IXFX21N100Q
SS0922
-55
84 IXFX21N100Q
SS0922
-55
85 IXGQ240N30PB
SS0920
-55
86 IXGP20N120A3
TS0905
-55
87 IXTH3N120
SS0922
-55
88 IXFX21N100Q
SS0922
-55
89 IXTP2N100
SS0914
-55
90 IXTH3N120
SS0922
-55
91 IXTH3N120
SS0922
-55
92 IXTH3N120
SS0922
-55
93 IXTQ100N25P
SS0846
-55
94 IXFX21N100Q
SS0922
-55
95 IXFX21N100Q
SS0922
-55
96 IXFN200N10P
SS0918
-55
97 IXFX180N25T
SP0908
-55
98 IXFX180N10
SF0928
-55
99 IXFH70N15
SP0850
-55
100 IXFH110N15T2
SP0848
-55
101 IXFV30N60PS
SF0929
-55
102 IXFP4N100QM
TP0919
-55
103 IXFX21N100Q
SS0930
-55
104 IXFX21N100Q
SS0930
-55
105 IXFX21N100Q
SS0930
-55
106 IXTP3N120
SS0930
-55
107 IXTP3N120
SS0930
-55
108 IXTP3N120
SS0930
-55
109 IXFT36N60P
SF0928
-55
110 IXFB44N100P
TP0930
-55
111 IXTH250N075T
SP0801
-55
112 IXTX24N100
SP0837
-55
113 IXGH48N60B3
SP0916
-55
IXYS Semiconductor GmbH
High
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
150
150
125
125
125
125
125
125
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Number
of
Cycles
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
500
500
500
500
500
500
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
30
30
30
30
30
30
20
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
21
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
15000
15000
15000
15000
15000
15000
20000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 4A (cont'd): MOSFET/IGBT single device
Date Code
Low
#
Part Number
or
Temp.
Test #
[°C]
114 IXTA2N100
K815
-55
115 IXTH360N055T2
SP0926
-55
116 IXTH360N055T2
SS0926
-55
117 IXFB100N50P
SP0929
-55
118 IXTP22N50PM
SS0924
-55
119 IXGH32N170
TP0907
-55
120 IXFH12N90
SS0911
-55
121 IXFP7N100P
SS0931
-55
122 IXTA2N100P
K736
-55
123 IXFB38N100Q2
TP0933
-55
124 IXFB40N110P
SP0924
-55
125 IXFK26N90
SP0936
-55
126 IXFP7N100P
SS0933
-55
127 IXFX420N10T
SP0931
-55
128 IXFX320N17T2
SP0931
-55
129 IXTP220N04T2
SS0927
-55
130 IXFP76N15T2
SS0920
-55
131 IXTP200N055T2
SS0847
-55
132 IXFX240N15T2
SS0931
-55
133 IXGH30N120B3
TP0806
-55
134 IXTQ130N15T
TP0806
-55
135 IXFH40N30Q
SS0933
-55
136 IXFX64N50P
SP0942
-55
137 IXFX48N50Q
SF0938
-55
138 IXTQ88N28T
SK0842
-55
139 IXFX64N50P
SS0939
-55
140 IXFH6N120P
TP0937
-55
141 IXFX360N10T
SP0931
-55
142 IXTX600N04T2
SP0945
-55
143 IXFK140N30P
SP0940
-55
144 IXFR140N30P
SP0923
-55
145 IXFH75N10Q
TP0917
-55
146 IXTH260N055T2
SS0937
-55
147 IXFH230N075T2
SP0928
-55
148 IXGH20N100
TP0917
-55
149 IXGR48N60C3D1
SP0948
-55
150 IXFX73N30Q
SF0938
-55
151 IXFX120N25P
SF0942
-55
152 IXFH23N80Q
SS0945
-55
153 IXGR48N60C3D1
SP0945
-55
154 IXGR48N60C3D1
SP0945
-55
155 IXGR72N60C3D1
SP0952
-55
156 IXGX320N60B3
SS1002
-55
157 IXGX320N60B3
SS1002
-55
158 IXTX550N055T2
SS1002
-55
159 IXTX550N055T2
SS1002
-55
160 IXTH500N04T2
SP0945
-55
161 IXTH440N055T2
SP0948
-55
162 IXFH400N075T2
SP0948
-55
163 IXFR140N30P
SP1001
-55
164 IXFH160N15T2
SS0926
-55
165 IXFH150N17T2
SS0952
-55
166 IXGH30N60B2
SP1003
-55
167 IXFX220N17T2
SP0931
-55
168 IXTP182N055T
SS1003
-55
169 IXTH50P10
TP1002
-55
170 IXTH24P20
TP1002
-55
IXYS Semiconductor GmbH
High
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Number
of
Cycles
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
22
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 4A (cont'd): MOSFET/IGBT single device
Date Code
Low
#
Part Number
or
Temp.
Test #
[°C]
171 IXTQ48N20T
SS1004
-55
172 IXTQ96N20P
SK0836
-55
173 IXFN80N50
SF0936
-55
174 IXFX180N07
SP1005
-55
175 IXFH58N20
TK0849
-55
176 IXGH24N60C4D1
SS1006
-55
177 IXFX44N55Q
SP0944
-55
178 IXFX44N80P
SF1006
-55
179 IXFC26N50
SF0938
-55
180 IXFN230N20T
SP1011
-55
181 IXFN320N17T2
SP0929
-55
182 IXGN60N60
SP0841
-55
183 IXFN180N07
SP0643
-55
184 IXFN34N80
SP0919
-55
185 IXGN200N60B3
SP1008
-55
186 IXFN150N10
SP1009
-55
187 IXFN82N60P
SP1004
-55
188 IXFN48N60P
SP0949
-55
189 IXGT60N60B2
SP0826
-55
190 IXFH26N50P
SK0843
-55
191 IXFH42N50P2
SP1009
-55
192 IXFP44N100Q
TS1013
-55
193 IXFP44N100Q
TS1013
-55
194 IXFB120N50P2
SP1015
-55
195 IXFP44N100Q
TS1018
-55
196 IXFH150N17T
SS1020
-55
197 IXGH25N160
TP1016
-55
198 IXFH150N17T
SP1021
-55
199 IXFB40N110P
TP1026
-55
200 IXFH88N30P
SP1009
-55
201 IXGH48N60C3
SS1006
-55
202 IXTP60N10T
S1038
-55
203 IXFK26N120P
TP1037
-55
204 IXFX44N80P
SF1006
-55
205 IXTA2R4N120P
K636
-55
206 IXTH48P20P
S1040
-55
207 IXTP10P15T
SS1038
-55
208 IXTP15P15T
SS1036
-55
209 IXTH32P20T
SP1035
-55
210 IXTP48P05T
SS1040
-55
211 IXTP26P10T
SS1040
-55
212 IXFN21N100Q
SF1040
-55
213 IXTQ88N30P
SS0939
-55
214 IXFH12N100Q
TP1043
-55
215 IXFH74N20P
SS1039
-55
216 IXTH96N20P
SS0938
-55
217 IXTH50P10
SS1033
-55
218 IXTH96P085T
SP0926
-55
219 IXTX600N055T
SS0940
-55
220 IXTX600N055T
SS0940
-55
221 IXTX600N055T
SS0940
-55
222 IXTH48P20P
SS1050
-55
223 IXBX75N170
TP1031
-55
224 IXFX26N120P
TP1102
-55
225 IXFK26N120P
TP1102
-55
226 IXTQ22N60P
SS1104
-55
227 IXFK94N50P2
SP1051
-55
IXYS Semiconductor GmbH
High
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Number
of
Cycles
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
23
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 4A (cont'd): MOSFET/IGBT single device
Date Code
Low
#
Part Number
or
Temp.
Test #
[°C]
228 IXTP450P2
SS1047
-55
229 IXTQ36N30P
SS1029
-55
230 IXTP3N50P
SS1048
-55
231 IXTP8N50P
SS1050
-55
232 IXTP120P065T
SS1013
-55
233 IXTP80N12T2
SS1043
-55
234 IXTA1N100
TS1047
-55
235 IXFH15N60
SS1104
-55
236 IXTH48P20P
SS1105
-55
237 IXFN44N60
SP1103
-55
238 IXTP220N04T2
SS1051
-55
239 IXTP32N20T
SS1051
-55
240 IXFH12N80P
SS1051
-55
241 IXFH100N25P
SS1049
-55
242 IXFN340N07
SF1105
-55
243 IXTN21N100
SF1105
-55
244 IXFN90N30
SF1105
-55
245 IXFN34N80
SF1105
-55
246 IXFK230N20T
SP1106
-55
247 IXTH48P20P
SP1049
-55
248 IXTH76P10T
SS1052
-55
249 IXFH12N100F
SS1052
-55
250 IXXH50N60C3
SS1105
-55
251 IXFB44N100Q3
SP1106
-55
252 IXFB100N50Q3
SP1106
-55
253 IXFH50N60P3
SP1109
-55
254 IXFX80N60P3
SP1109
-55
255 IXFH40N30Q
SS1020
-55
256 IXGK75N250
TP1110
-55
257 IXFX78N50P3
SS1108
-55
258 IXFX78N50P3
SP1109
-55
259 IXFX98N50P3
SP1110
-55
260 IXFA4N100Q
TS1108
-55
261 IXFT14N80P
SP0731
-55
262 IXTT16N20D2
TP1019
-55
263 IXFH60N50P3
SP1109
-55
264 IXFB132N50P3
SP1110
-55
265 IXFX80N50Q3
SP1106
-55
266 IXTM21N50
SP1023
-55
267 IXFX64N60P3
SP1110
-55
268 IXFH42N60P3
SP1110
-55
269 IXTT80N20L
TP1046
-55
270 IXFH22N60P3
SS1108
-55
271 IXFB38N100Q2
TP1115
-55
272 IXTT60N20L2
TP1005
-55
273 IXFH28N60P3
SS1115
-55
274 IXTA3N120
TS1115
-55
275 IXFK230N20T
SP1116
-55
276 IXFH50N30Q3
SP1117
-55
277 IXFK94N50P2
SP1111
-55
278 IXFH70N20Q3
SS1117
-55
279 IXFH30N50Q3
SS1117
-55
280 IXTP102N15T
K834
-55
281 IXYH82N120C3
TP1115
-55
282 IXFB62N80Q3
SP1118
-55
283 IXFB82N60Q3
SP1118
-55
284 IXTH12N140
TP1119
-55
IXYS Semiconductor GmbH
High
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Number
of
Cycles
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
24
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 4A (cont'd): MOSFET/IGBT single device
Date Code
Low
#
Part Number
or
Temp.
Test #
[°C]
285 IXFR66N50Q2
TP1122
-55
286 IXFX64N50Q3
SP1118
-55
287 IXFX48N60Q3
SS1118
-55
288 IXFX64N60Q3
SS1118
-55
289 IXFH15N100Q3
SP1121
-55
290 IXGK75N250
TP1047
-55
291 IXFX32N80Q3
SS1122
-55
292 IXFX44N80Q3
SP1123
-55
293 IXFH20N80P
SS1121
-55
294 IXGT32N120A3
TP1121
-55
295 IXTH68P20T
SP1130
-55
296 IXTH140P10T
SP1130
-55
297 IXTX20N140
TP1126
-55
298 IXFR32N100Q3
SP1133
-55
299 IXFH70N30Q3
SP1133
-55
300 IXFH44N50Q3
SP1133
-55
301 IXGH50N60C4
SP1133
-55
302 IXYH50N120C3
TP1137
-55
303 IXYH30N120C3
TP1137
-55
304 IXFH120N25T
SS1115
-55
305 IXFH94N30T
SS1115
-55
306 IXCH36N250
TP1139
-55
307 IXFX160N30T
SS1140
-55
308 IXFH120N25T
SP1141
-55
309 IXFH94N30T
SP1141
-55
310 IXTT140P10T
SP1142
-55
311 IXTH1N80P
TP0905
-55
312 IXTP1N80P
SS0908
-55
313 IXFX24N100Q3
SP1137
-55
314 IXFH18N100Q3
SP1136
-55
315 IXFK32N90P
TP1123
-55
316 IXTX120P20T
SP1133
-55
317 IXTX210P10T
SP1130
-55
318 IXYX100N120C3
TP1137
-55
319 IXYH24N90C3
TS1144
-55
320 IXYP8N90C3
TS1144
-55
321 IXGK120N120B3
TP1143
-55
322 GWM160-0055X2SL
2575
-40
323 IXFX120N25P
2746
-55
324 GWM160-0055X2SL
2575
-40
325 IXFX120N25P
2746
-55
IXYS Semiconductor GmbH
High
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
150
150
150
150
Number
of
Cycles
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
77
80
77
80
25
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
77000
80000
77000
80000
Remark
TABLE 4B: MOSFET/IGBT Module
Date Code
#
Part Number
or
Test #
1 MID75-12A3
3050
2 MII300-12E4
2432
3 MITA10WB1200TMH
2519
4 MITA15WB1200TMH
2502
5 MITB15WB1200TMH
2502
6 MIXA20W1200TML
3207
7 MKI450-12E9
2636
8 MUBW15-12A7
3146
9 MUBW50-12A8
2521
10 VMM90-09F
3215
11 VWM270-0075X2
2825
Low
Temp.
[°C]
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
50
50
50
100
100
50
250
50
50
50
50
Sample
Size
10
10
10
10
10
20
6
10
10
10
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
500
500
500
1000
1000
1000
1500
500
500
500
500
TABLE 4C: Thyristor/Diode Module
Date Code
#
Part Number
or
Test #
1
MCC162-16
2451
2
MCC21-14io8
2617
3
MCC225-14
3102
4
MCC26-14
3104
5
MCC312
2690
6
MCC312
2865
7
MCC312-16
3028
8
MCC312-16
3470
9
MCC44-16io1
2770
10 MCC56-16io1B
3275
11 MCC95-14
2902
12 MCC95-16
3510
13 MCC95-16io1
2450
14 MDD312-16N1
3274
15 UGE0421AY4
2464
Low
Temp.
[°C]
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
50
50
50
50
100
100
100
50
100
50
50
50
50
50
10
Sample
Size
10
10
10
10
20
10
10
10
20
10
10
10
10
10
10
Failures
Device Cycles
0
0
0
0
1
0
0
0
0
0
0
0
0
0
0
500
500
500
500
2000
1000
1000
500
2000
500
500
500
500
500
100
TABLE 4D: Controller, Rectifier Bridge
Date Code
#
Part Number
or
Test #
1 MMO62-16
2516
2 MMO62-16io6
3223
3 MMO90-16io6
2994
4 VUB116-16NO1
2914
5 VUB120-16NOXT
3297
6 VUB72-16
3086
7 VUM33--05N
2534
8 VUO 192-16NO7
2615
9 VUO35-16NO7
2790
10 VUO36-16NO8
3088
11 VUO52
3118
12 VUO68-08NO7
2461
13 VVY50-16
3235
Low
Temp.
[°C]
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
20
20
20
50
100
25
25
100
100
10
150
10
50
Sample
Size
20
20
20
10
10
10
10
10
20
10
40
10
10
Failures
Device Cycles
0
0
1
0
0
0
0
0
0
0
0
0
0
400
400
400
500
1000
250
250
1000
2000
100
6000
100
500
IXYS Semiconductor GmbH
26
Remark
Remark
Remark
TABLE 4E: FRED
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
DHG50X1200NA
DPG120C300QB
DPG15I300PA
DPG20C300PB
DPG30C400HB
DPG30P300PJ
DSEC60-04A
DSEC60-06A
DSEC60-06A
DSEC60-06A
DSEE55-24N1
DSEI12-06A
DSEI2x31-06P
DSEI2x61-06AL
DSEI2x61-12B
DSEI30-06A
DSEI30-06A
DSEI30-10A
DSEI60-06A
DSEP12-12AR
DSEP15-06A
DSEP15-12CR
DSEP29-12A
DSEP2x25C12C
DSEP30-12AR
DSEP60-06A
MEE300-06DA
MEK95-06DA €
MEO450-12
Date Code
or
Test #
2624
2546
3353
2540
2831
2715
2441
2874
2619
3449
2627
2604
3462
2775
3456
2833
2978
3070
2895
2877
3002
3096
3184
2832
3345
2830
2536
3213
2890
Low
Temp.
[°C]
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-40
-40
-40
-40
-40
-40
-40
-55
-55
-55
-55
-55
-40
-55
-55
-40
-40
-40
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
140
150
150
150
150
150
150
150
150
150
Number
of
Cycles
50
100
50
50
100
100
50
50
50
50
50
100
10
50
50
100
50
50
100
50
100
50
50
100
50
100
50
50
50
Sample
Size
20
20
20
20
20
20
20
20
20
20
20
20
10
20
20
20
20
20
20
20
20
20
20
50
20
40
10
10
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1000
2000
1000
1000
2000
2000
1000
1000
1000
1000
1000
2000
100
1000
1000
2000
1000
1000
2000
1000
2000
1000
1000
5000
1000
4000
500
500
500
Date Code
or
Test #
2956
2448
2456
2577
3347
2530
2803
2622
2993
2993
2495
2774
2539
2880
2975
2772
3452
3073
3445
Low
Temp.
[°C]
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-40
-55
-55
-55
-55
-55
-55
-55
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
100
100
50
100
50
100
100
100
300
500
100
50
50
50
50
100
50
50
50
Sample
Size
20
20
20
20
20
40
20
20
20
20
20
20
20
20
20
20
20
20
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
2000
2000
1000
2000
1000
4000
2000
2000
6000
10000
2000
1000
1000
1000
1000
2000
1000
1000
1000
Remark
TABLE 4F: Schottky Diode
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
DSA10C150PB
DSA50C100HB
DSA60C100PB
DSA60C150PB
DSA90C200HB
DSA90C200HB
DSA90C200HB
DSA90C200HR
DSA90C200HR
DSA90C200HR
DSB60C30PB
DSS2x101-015A
DSSK20-015A
DSSK30-18A
DSSK60-015A
DSSK60-015AR
DSSK60-02A
DSSK70-008A
DSSS35-008AR
IXYS Semiconductor GmbH
27
Remark
TABLE 4G: Thyristor/Diode single device
Date Code
#
Part Number
or
Test #
1 CLA30E1200PC
2657
2 CLA50E1200HB
3346
3 CLA50E1200HB
2543
4 CLA80E1200HF
2670
5 CS19-12H01
2849
6 CS19-12ho1
3484
7 CS19-12ho1
3119
8 CS20-25MoT1
2485
9 CS20-25moT1
2735
10 CS20-25MoT1
2582
11 CS22-12io1M
3186
12 CS23-16
3336
13 CS30-12io1
3300
14 CS30-16io1
2437
15 CS35-14io4
3090
16 CS45-08io1
2884
17 CS45-12io1
3098
18 CS60-16io1
2960
19 CS60-16io1
2960
20 CS8-12io2
2458
21 CSM400A
2847
22 CSM400A
2501
23 CSM400A
3333
24 DMA30E1800HA
3273
25 DSA17-16A
2954
26 DSA17-16A
2564
27 DSA300I100NA
2848
28 DSA30I150PA
3182
29 DSA35-18A
3442
30 DSA9-12F
3178
31 DSAI75-18
2531
32 DSAI75-18
2995
33 DSDI60-18A
3228
34 DSI2x55-12A
2538
35 DSI2x55-16A
3341
36 DSI45-16AR
2599
37 DSP25-16A
2716
38 DSP25-16A
2976
39 DSP45-16A
2661
40 DSP45-16A
3193
41 DSP45-16A
3021
Low
Temp.
[°C]
-55
-55
-40
-55
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-25
-40
-40
-55
-40
-40
-40
-55
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-55
-55
-55
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
125
150
150
150
150
150
150
85
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
100
50
50
100
100
50
100
100
100
100
50
20
100
50
20
50
50
100
100
20
1000
100
25
100
20
20
50
50
20
20
20
20
50
20
20
50
1000
50
100
100
100
Sample
Size
20
20
20
20
20
20
20
20
20
20
20
10
20
20
10
20
20
20
20
10
10
10
10
20
10
10
10
20
10
10
10
10
20
20
19
20
20
20
20
80
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
5
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
2000
1000
1000
2000
2000
1000
2000
2000
2000
2000
1000
200
2000
1000
200
1000
1000
2000
2000
200
10000
1000
250
2000
200
200
500
1000
200
200
200
200
1000
400
380
1000
20000
1000
2000
8000
2000
Low
Temp.
[°C]
-40
-40
-40
-40
High
Temp.
[°C]
150
150
150
150
Number
of
Cycles
50
50
50
100
Sample
Size
20
20
20
20
Failures
Device Cycles
0
0
0
0
1000
1000
1000
2000
Remark
TABLE 4H: Breakover Diode
#
Part Number
1
2
3
4
IXBOD1-06
IXBOD1-08
IXBOD1-10
IXBOD2-14EPI
IXYS Semiconductor GmbH
Date Code
or
Test #
3459
3079
2436
2905
28
Remark
HUMIDITY TEST (Tables 5A - 5H)
TABLE 5A: MOSFET/IGBT single device
Date Code
# Part Number
or
Test #
1 GWM160-0055X1SL
2786
2 GWM160-0055X2 S
3455
3 IEA21PG1200LA
2598
4 IXBP5N160G
2454
5 IXDH35N60BD1
3161
6 IXDN75N120
2566
7 IXFX120N25P
2746
8 IXKN75N60C
2955
9 IXLV1861
3061
Temp.
[°C]
121
121
85
121
121
121
121
121
85
Rel. H.
[%]
100
100
85
100
100
100
100
100
85
Time
[hrs]
96
96
1000
48
48
168
96
48
168
Sample
Size
20
77
20
20
20
20
80
20
20
Failures
TABLE 5B: MOSFET/IGBT Module
Date Code
# Part Number
or
Test #
1 MIXA60WB12TEH
2514
2 MKI450-12E9
2636
3 VMM90-09F
3216
4 VMO1200-01
2480
5 VWM270-0075X2
2825
Temp.
[°C]
85
85
85
85
85
Rel. H.
[%]
85
85
85
85
85
Time
[hrs]
1000
1000
168
168
1000
Sample
Size
10
6
10
10
10
Failures
TABLE 5C: Thyristor/Diode Module
Date Code
# Part Number
or
Test #
1 MCC312-16
3028
2 MCD162
3465
3 MCD162-16
3471
4 MCD162-16io1
2482
Temp.
[°C]
85
85
85
85
Rel. H.
[%]
85
85
85
85
Time
[hrs]
1000
1000
168
168
Sample
Size
10
5
10
10
Failures
TABLE 5D: Controller, Rectifier Bridge
Date Code
# Part Number
or
Test #
1 VGO36-14io7
2460
2 VUO 192-16NO7
2615
3 VUO52-16
2563
Temp.
[°C]
85
85
85
Rel. H.
[%]
85
85
85
Time
[hrs]
168
1000
168
Sample
Size
10
10
10
Failures
IXYS Semiconductor GmbH
29
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
1920
7392
20000
960
960
3360
7680
960
3360
Remark
Device Hours
[hrs]
10000
6000
1680
1680
10000
Remark
Device Hours
[hrs]
10000
5000
1680
1680
Remark
Device Hours
[hrs]
1680
10000
1680
Remark
TABLE 5E: FRED
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
DHG60I1200HA
DPG30C400HB
DSEC60-06B
DSEE55-24N1F
DSEI2x101-12A
DSEI2x101-12A
DSEI30-06A
DSEI60-10A
DSEP15-06A
DSEP15-12CR
DSEP60-06A
Date Code
or
Test #
2518
2831
3095
2627
3325
3222
2949
2439
3002
3097
2830
Temp.
[°C]
121
121
121
121
121
121
121
121
121
121
121
Rel. H.
[%]
100
100
100
100
100
100
100
100
100
100
100
Time
[hrs]
96
96
48
48
96
48
48
168
96
48
96
Sample
Size
20
20
20
20
20
20
20
20
20
20
40
Failures
Date Code
or
Test #
3192
2456
2948
3177
2772
3351
Temp.
[°C]
121
121
121
121
121
121
Rel. H.
[%]
100
100
100
100
100
100
Time
[hrs]
96
48
48
96
96
48
Sample
Size
20
20
20
20
20
20
Failures
Temp.
[°C]
121
121
121
85
121
121
121
Rel. H.
[%]
100
100
100
85
100
100
100
Time
[hrs]
48
96
96
1000
48
96
48
Sample
Size
20
20
10
10
20
20
20
Failures
Temp.
[°C]
121
121
121
121
Rel. H.
[%]
100
100
100
100
Time
[hrs]
48
48
48
96
Sample
Size
20
20
20
20
Failures
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
1920
1920
960
960
1920
960
960
3360
1920
960
3840
Remark
Device Hours
[hrs]
1920
960
960
1920
1920
960
Remark
Device Hours
[hrs]
960
1920
960
10000
960
1920
960
Remark
Device Hours
[hrs]
960
960
960
1920
Remark
TABLE 5F: Schottky Diode
#
Part Number
1
2
3
4
5
6
DSA30C100PB
DSA60C100PB
DSA90C200HB
DSS6-015AS
DSSK60-015AR
DSSK80-006B
TABLE 5G: Thyristor/Diode single device
Date Code
# Part Number
or
Test #
1 DSP45-12A
2455
2 CLA30E1200PC
2657
3 CLA80E1200HF
2670
4 CSM400A
2847
5 DSP25-16A
2950
6 CS60-16io1
2960
7 DSDI60-16A
3342
0
0
2
0
0
0
0
0
0
0
0
0
0
TABLE 5H: Breakover diode
#
Part Number
1
2
3
4
IXBOD1-06
IXBOD1-08
IXBOD1-10
IXBOD2-14EPI
IXYS Semiconductor GmbH
Date Code
or
Test #
3460
3079
2436
2905
30
0
0
0
0
HAST TEST (Table 6A)
TABLE 6A: MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
1 IXBX64N250
TP0952
130
2 IXFX80N50Q3
SP1106
130
3 IXFK32N80Q3
SP1119
130
4 IXFK64N60Q3
SP1119
130
5 IXFP12N80P3
SS1120
130
6 IXFK120N27P3
SP1119
130
7 IXFX120N27P3
SS1120
130
8 IXFB62N80Q3
SP1118
130
9 IXFB82N60Q3
SP1118
130
10 IXFR66N50Q2
TP1122
130
11 IXFX64N50Q3
SP1118
130
12 IXFX64N50Q3
SS1118
130
13 IXFR64N50Q3
SP1123
130
14 IXFK64N50Q3
SP1121
130
15 IXFA4N100Q
TS1108
130
16 IXTT16N20D2
TP1019
130
17 IXFB38N100Q2
TP1115
130
18 IXTA3N120
TS1115
130
19 IXTP102N15T
K834
130
20 IXGH2N250
TP1010
130
21 IXGH50N60C4
SP1052
130
22 IXFH22N60P3
SS1108
130
23 IXFH28N60P3
SS1115
130
24 IXFX48N60Q3
SS1118
130
25 IXFX64N60Q3
SS1118
130
26 IXFH15N100Q3
SP1121
130
27 IXFH70N20Q3
SS1117
130
28 IXFK38N80Q2
TP1105
130
29 IXFX44N80Q3
SP1123
130
30 IXFX32N80Q3
SS1122
130
31 IXFK94N50P2
SP1111
130
32 IXFK160N30T
SP1120
130
33 IXFK180N25T
SP1120
130
34 IXFX230N20T
SP0947
130
35 IXYH82N120C3
TP1115
130
36 IXFT14N80P
SP0731
130
37 IXFK26N120P
TP1037
130
38 IXFK230N20T
SP1116
130
39 IXGT32N120A3
TP1121
130
40 IXTT60N20L2
TP1005
130
41 IXXH50N60C3
SS1105
130
42 IXBX64N250
TP1130
130
43 IXTP220N04T2
SS1051
130
44 IXFX64N50P
SS0939
130
45 IXTQ130N15T
SK0715
130
46 IXFX48N50Q
SF0938
130
47 IXFH70N15
SP0850
130
48 IXFH42N50P2
SP1009
130
49 IXTH68P20T
SP1130
130
50 IXTH140P10T
SP1130
130
51 IXTH96P085T
SP0926
130
52 IXGH32N170
TP0907
130
53 IXTH75N10
TP0848
130
54 IXFB44N100Q3
SP1106
130
55 IXFB44N100P
TP0930
130
56 IXFR32N100Q3
SP1133
130
57 IXFH120N25T
SS1115
130
58 IXFH94N30T
SS1115
130
59 IXFH44N50Q3
SP1133
130
60 IXFH70N30Q3
SP1133
130
Temp.
[°C]
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
0
42
42
0
42
42
42
42
42
42
42
42
42
42
42
42
42
42
-42
-42
-42
42
42
42
42
42
42
42
42
42
Rel. H.
[%]
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
Time
[hrs]
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
27
28
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2592
2688
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
Remark
TABLE 6A: MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
61 IXFB100N50Q3
SP1106
130
62 IXTH48P20P
SS1105
130
63 IXFB40N110P
TP1026
130
64 IXTP182N055T
SS1003
130
65 IXTP120P065T
SS1013
130
66 IXGH50N60C4
SP1133
130
67 IXYH50N120C3
TP1137
130
68 IXYH30N120C3
TP1137
130
69 IXTP10P15T
SS1038
130
70 IXTP26P10T
SS1040
130
71 IXTP220N04T2
SS0927
130
72 IXFK32N90P
TP1123
130
73 IXTP48P05T
SS1040
130
74 IXTP8N50P
SS1050
130
75 IXTP3N50P
S1048
130
76 IXFH26N50P
SK0843
130
77 IXTH1N80P
TP0905
130
78 IXTP1N80P
SS0908
130
79 IXFX24N100Q3
SP1137
130
80 IXFH18N100Q3
SP1136
130
81 IXFH6N120P
TP0937
130
82 IXFH120N25T
SP1141
130
83 IXFH94N30T
SP1141
130
84 IXTH48P20P
SS1040
130
85 IXTT140P10T
SP1142
130
86 IXFK94N50P2
SP1111
130
87 IXFK98N50P3
SP1142
130
88 IXFK80N60P3
SP1142
130
89 IXFK80N60P3
SP1142
130
90 IXTX120P20T
SP1133
130
91 IXTX210P10T
SP1130
130
92 IXTP15P15T
SS1036
130
93 IXFH22N60P3
SS1143
130
94 IXGK120N120B3
TP1143
130
95 IXTP2N100
SS0914
130
96 IXFH28N60P3
SS1144
130
97 IXYH24N90C3
TS1144
130
98 IXYP8N90C3
TS1144
130
99 IXFK94N50P2
SP1146
130
100 IXFH20N50P3
SP1141
130
101 IXGK120N60B3
SP1146
130
102 IXGH48N60C3D1
TP1148
130
103 IXFH16N60P3
SS1142
130
104 IXFN32N100Q3
SP1132
130
105 IXTV03N400S
TP1134
130
106 IXGH40N120B2D1
TP0940
130
107 IXTP80N10T
SS1150
130
108 IXFH150N20T
SP1147
130
109 IXFT20N100P
TP1147
130
110 IXXH50N60B3D1
TP1150
130
111 IXTH3N120
TS1136
130
112 IXFP14N60P3
SS1144
130
113 IXTA80N10T
SS1150
130
114 IXFP4N60P3
SS1143
130
115 IXBT24N170
TP1202
130
116 IXSH45N120
TP1204
130
Temp.
[°C]
42
-42
42
42
-42
42
42
42
-42
-42
42
42
-42
42
42
42
42
42
42
42
42
42
42
-42
-42
0
42
42
42
-42
-42
-42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
Rel. H.
[%]
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
50
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
Time
[hrs]
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
10
30
30
30
30
77
77
30
77
30
25
25
25
30
30
30
30
30
24
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
77
30
30
30
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
960
2880
2880
2880
2880
7392
7392
2880
7392
2880
2400
2400
2400
2880
2880
2880
2880
2880
2304
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
7392
2880
2880
2880
Remark