LA0152CSGEVB_TEST_PROCEDURE.PDF - 151 KB

Test Procedure for the LA0152CSGEVB Evaluation Board
28/Mar/2012
Evaluation Board
Photo Diode
IC1
4pin
OUT
C1
0.1μF
R1
33KΩ
1pin
VCC
2pin
EN
3pin
GND
Monitoring
or
To CPU AD port
EN
Low
High
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State
Sleep
Active
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LIGHT
SOURCE
ILLUMINANCE
METER
GND
OUT
EN
VCC
01.3200 V DC
MULTIMETER
POWER SUPPLY
Test Procedure:
1.
2.
3.
4.
5.
6.
Connect the test setup as shown above.
Connect IC power supply (2.2V to 5.5V) between VCC and GND.
Connect multimeter between OUT and GND.
Irradiate a light, and put on the illuminance meter near the IC.
Control the light source and to be adjusted 500 lux.
Then, OUT terminal of LA0152CS is outputted roughly 40uA. Therefore, multimeter is showed roughly
1.32V. (1.32V = 40uA×33kΩ)
LA0152CS features:
・No sensibility in infrared area.
・Less difference in sensibility depending on the type of light source.
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