FINAL PRODUCT/PROCESS CHANGE NOTIFICATION Generic Copy 02 Jun 2009 SUBJECT: ON Semiconductor Final Product/Process Change Notification #16271 TITLE: Final Notification for Transfer of Products from MOS9 Wafer Fab (East Kilbride, Scotland) to CZ4 Wafer Fab (Roznov, Czech Republic) PROPOSED FIRST SHIP DATE: 31 Aug 2009 AFFECTED CHANGE CATEGORY(S): ON Semiconductor Wafer Fab site AFFECTED PRODUCT DIVISION(S): Emitter-Coupled Logic (ECL) E-Plus Translators FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION: Contact Sales Office or Eric Rupnow < [email protected] > SAMPLES: Samples will be available at the beginning of July 2009 ADDITIONAL RELIABILITY DATA: Available Contact your local ON Semiconductor Sales Office or Matt Kas < [email protected] > NOTIFICATION TYPE: Final Product/Process Change Notification (FPCN) Final change notification sent to customers. FPCNs are issued at least 90 days prior to implementation of the change. ON Semiconductor will consider this change approved unless specific conditions of acceptance are provided in writing within 30 days of receipt of this notice. To do so, contact your local ON Semiconductor Sales Office. DESCRIPTION AND PURPOSE: This is the FPCN to IPCN16242 available at www.onsemi.com. MOS9 wafer fab will no longer support the fabrication of the E-Plus ECL translators. In order to continue to support our customer’s requirements for E-Plus ECL Translator products, the fabrication of these devices is being moved from current wafer fab, MOS9 in East Kilbride Scotland, to ON Semiconductor’s wafer fab, CZ4 in Roznov Czech Republic. Due to slight increase in circuit current observed on CZ4 material, ICCH and ICCL upper specification limits are being changed. For MC100EPT23 and MC100LVELT23: Change ICCH Limits at all temperatures from (10mA, 25mA) to (10mA, 30mA) Change ICCL Limits at all temperatures from (15mA, 36mA) to (15mA, 40mA) Issue Date: 02 Jun 2009 Rev.14 Jun 2007 Page 1 of 3 Final Product/Process Change Notification #16271 For NB100ELT23L: Change ICCH Limits at all temperatures from (10mA, 20mA) to (10mA, 25mA) Change ICCL Limits at all temperatures from (15mA, 25mA) to (15mA, 30mA) For MC100EPT21: Change ICCH Limits at all temperatures from (5mA, 20mA) to (5mA, 25mA) Change ICCL Limits at all temperatures from (8mA, 26mA) to (8mA, 30mA) For MC100EPT26: Change ICCH Limits at all temperatures from (10mA, 18mA) to (10mA, 25mA) Change ICCL Limits at all temperatures from (15mA, 35mA) to (15mA, 40mA) QUALIFICATION PLAN: Reliability testing will be performed on the MC100EPT23DG qualification vehicle chosen based on die size, voltage rating, and run rates. RELIABILITY TEST RESULTS: Reliability Test 1. High Temp Op Life 2. High Temp Storage (150 °C) 3. Pre-Conditioning MSL1 260 4. HAST (130°C/85%RH) 5. Autoclave (121°C/100%RH/15PSIG) 6. Temp Cycling (-65 °C to +150 °C) 8. ESD - Human Body Model 9. ESD - Machine Model 10. Latch-Up 11. SAT (Pre-condition 260 C, MSL 1 Conditions 1008 hrs. (FIT < 1000) 504 hrs. 96 hrs. 96 hrs. 500 cycles 2000 V Minimum 200 V Minimum JESD78 Minimum Results 0/80 0/80 0/80 0/80 0/80 0/80 4000V 200V Passed Passed ELECTRICAL CHARACTERISTIC SUMMARY: DC,AC, ESD, and Latch-up testing has been performed on representative qualification vehicle and compared to historical data. Characterization results on all qualification device matched historical data. Characterization results are available for review upon request. CHANGED PART IDENTIFICATION: N/A Issue Date: 02 Jun 2009 Rev.14 Jun 2007 Page 2 of 3 Final Product/Process Change Notification #16271 AFFECTED DEVICE LIST MC100EPT21D MC100EPT21DG MC100EPT21DR2 MC100EPT21DR2G MC100EPT21DT MC100EPT21DTG MC100EPT21DTR2 MC100EPT21DTR2G MC100EPT21MNR4 MC100EPT21MNR4G MC100EPT23D MC100EPT23DG MC100EPT23DR2 MC100EPT23DR2G MC100EPT23DT MC100EPT23DTG MC100EPT23DTR2 MC100EPT23DTR2G MC100EPT23MNR4 MC100EPT23MNR4G MC100EPT26D MC100EPT26DG MC100EPT26DR2 MC100EPT26DR2G MC100EPT26DT MC100EPT26DTG MC100EPT26DTR2 MC100EPT26DTR2G MC100EPT26MNR4 MC100EPT26MNR4G MC100LVELT23D MC100LVELT23DG MC100LVELT23DR2 MC100LVELT23DR2G MC100LVELT23DT MC100LVELT23DTG MC100LVELT23DTR2 MC100LVELT23DTRG MC100LVELT23MNRG NB100ELT23LD NB100ELT23LDG NB100ELT23LDR2 NB100ELT23LDR2G NB100ELT23LDT NB100ELT23LDTG NB100ELT23LDTR2 NB100ELT23LDTR2G Issue Date: 02 Jun 2009 Rev.14 Jun 2007 Page 3 of 3