TOSHIBA TLP759IGM

TLP759(IGM)
TENTATIVE
TOSHIBA Photocoupler GaAℓAs Ired + Photo IC
TLP759(IGM)
Transistor Invertor
Inverter For Air Conditioner
Line Receiver
IPM Interfaces
Unit in mm
The TOSHIBA TLP759(IGM) consists of a GaAℓAs high−output light
emitting diode and a high speed detector of one chip photo diodetransistor.
This unit is 8−lead DIP.
TLP759(IGM) has no internal base connection, and a faraday shield
integrated on the photodetector chip provides an effective common
mode noise transient immunity.
TLP759(IGM) guarantees minimum and maximum of propagation
delay time, switching time dispersion, and high common mode
transient immunity. Therefor TLP759(IGM) is suitable for isolation
interface between IPM(intelligent power module) and control IC
circuits in motor control application.
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·
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TOSHIBA
Weight: 0.54 g
11−10C4
Isolation voltage: 5000Vrms (min.)
Common mode transient immunity
: ±10kV / µs (min.)
@VCM = 1500 V
Pin Configuration(top view)
Switching Time
: tpHL,tpLH = 0.1µs (min.)
= 0.8µs (max.)
@IF = 10mA,VCC = 15V,RL = 20kΩ,Ta = 25°C
·
Switching time dispersion: 0.7µs (max.)
(|tpLH-tpHL|)
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TTL compatible
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UL recognized: UL1577, file no.E67349
1
8
2
7
3
6
4
5
Shield
1 : N.C.
2 : Anode
3 : Cathode
4 : N.C.
5 : Emitter
6 : Collector
7 : N.C.
8 : VCC
Schematic
ICC
IF
VF
2
8
IO
3
6
Shield
1
VCC
VO
GND
5
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TLP759(IGM)
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Option (D4) type
VDE approved: DIN VDE0884 / 06.92,
Maximum operating insulation voltage: 890VPK
Highest permissible over voltage: 6000VPK
(Note 1) When a VDE0884 approved type is needed,
please designate the “Option (D4)”
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Structural parameter
7.62mm pich TLP759 (IGM)
Creepage distance: 7.0mm (min.)
Clearance: 7.0mm (min.)
Insulation thickness: 0.4mm (min.)
Maximum Ratings (Ta = 25°C)
LED
Characteristic
Rating
Unit
Forward current
(Note 2)
IF
25
mA
Pulse forward current
(Note 3)
IFP
50
mA
Peak transient forward current
(Note 4)
IFPT
1
A
VR
5
V
PD
45
mW
Output current
IO
8
mA
Peak output current
IOP
16
mA
Output voltage
VO
-0.5~20
V
supply voltage
VCC
-0.5~30
V
PO
100
mW
Topr
-55~100
°C
°C
Reverse voltage
Diode power dissipation
Detector
Symbol
(Note 5)
Output power dissipation
(Note 6)
Operating temperature range
Tstg
-55~125
Lead solder temperature(10s)
(Note 7)
Tsol
260
°C
Isolation voltage(AC,1min.,R.H.≤60%,Ta=25°C)
(Note 8)
BVS
5000
Vrms
Storage temperature range
(Note 2): Derate 0.8mA above 70°C.
(Note 3): 50% duty cycle,1ms pulse width.
Derate 1.6mA / °C above 70°C.
(Note 4): Pulse width PW ≤ 1µs,300pps.
(Note 5): Derate 0.9mW / °C above 70°C.
(Note 6): Derate 2mW / °C above 70°C.
(Note 7): Soldering portion of lead: Up to 2mm from the body of the device.
(Note 8): Device considerd a two terminal device: Pins 1, 2, 3 and 4 shorted together and
pins 5, 6, 7 and 8 shorted together.
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TLP759(IGM)
Electrical Characteristics (Ta = 25°C)
Characteristic
LED
Forward voltage
Forward voltage
temperature coefficient
Test Condition
Min.
Typ.
Max.
Unit
1.65
1.85
V
VF
IF = 16mA
∆VF / ∆Ta
IF = 16mA
―
-2
―
mV / °C
Reverse current
IR
VR = 5V
―
―
10
µA
Capacitance between
terminal
CT
VF = 0,f = 1MHz
―
45
―
pF
IOH (1)
IF = 0mA,VCC = VO = 5.5V
―
3
500
nA
IOH (2)
IF = 0mA,VCC = 30V
VO = 20V
―
―
5
IOH
IF = 0mA,VCC = 30V
VO = 20V,Ta = 70°C
―
―
50
High level supply
voltage
ICCH
IF = 0mA,VCC = 30V
―
0.01
1
µA
Supply voltage
VCC
ICC = 0.01mA
30
―
―
V
Output voltage
VO
IO = 0.5mA
20
―
―
V
Min.
Typ.
Max.
Unit
IF = 10mA,VCC = 4.5V
VO = 0.4V
25
35
75
IF = 16mA,VCC = 4.5V
VO = 0.4V,Ta = -25~100°C
15
―
―
IF = 16mA,VCC = 4.5V
IO = 2.4mA
―
―
0.4
V
Min.
Typ.
Max.
Unit
―
0.8
―
pF
1×1012
1014
―
Ω
5000
―
―
Vrms
AC,1 second,in oil
―
10000
―
DC,1 minute,in oil
―
10000
―
High level output current
Detector
Symbol
µA
Coupled Electrical Characteristics (Ta = 25°C)
Characteristic
Current transfer ratio
Low level output voltage
Symbol
IO / IF
VOL
Test Condition
%
Isolation Characteristics (Ta = 25°C)
Characteristic
Symbol
Capacitance input to output
CS
Isolation resistance
RS
Test Condition
V = 0,f = 1MHz
R.H. ≤ 60%,VS = 500V
AC,1 minute
Isolation voltage
BVS
3
(Note 8)
(Note 8)
Vdc
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TLP759(IGM)
Switching Characteristics (Ta = 25°C,VCC = 15V)
Characteristic
Test
Circuit
Symbol
Propagation delay time
(H→L)
tpHL
Propagation delay time
(L→H)
tpLH
1
Switching time
dispersion between on
and off
|tpLH-tpHL|
Common mode
transient immunity at
logic high output
CMH
(Note 9)
Common mode
transient immunity at
logic low output
2
CML
(Note 9)
Test Condition
Min.
Typ.
Max.
Unit
IF = 10mA,RL = 20kΩ
0.1
0.45
0.8
IF = 10mA,RL = 20kΩ
Ta = 0~85°C
0.1
0.45
0.9
IF = 10mA,RL = 20kΩ
Ta = -25~100°C
0.1
0.45
1.0
IF = 10mA,RL = 20kΩ
―
0.15
0.7
IF = 10mA,RL = 20kΩ
Ta = 0~85°C
―
0.25
0.8
IF = 10mA,RL = 20kΩ
Ta = -25~100°C
―
0.25
0.9
IF = 0mA
VCM = 1500Vp-p
RL = 20kΩ
10000
15000
―
V / µs
IF =10mA
VCM = 1500Vp-p
RL = 20kΩ
-10000 -15000
―
V / µs
µs
µs
(Note 9): CML is the maximum rate of fall of the common mode voltage that can be
sustained with the output voltage in the logic low state(VO < 1V).
CMH is the maximum rate of rise of the common mode voltage that can be
sustained with the output voltage in the logic high state(VO < 4V).
(Note 10): Maximum electrostatic discharge voltage for any pins: 100V(C = 200pF, R = 0).
Test Circuit 1: Switching Time Test Circuit
IF
IF
PW = 100µs
Duty ratio = 1 / 10
51Ω
IF Monitor
1
8
2
7
3
6
4
5
VCC = 15 V
VO
Output
monitor
4
0
VO
RL
0.1µF
Pulse input
15V
1.5V
tpHL
1.5V
VOL
tpLH
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TLP759(IGM)
Test Circuit 2: Common Mode Noise Immunity Test Circuit
1
8
2
7
3
6
4
5
1500V
VCM
10%
RL
0.1µF
IF
90%
VCC = 15 V
VO
Output
monitor
tr
VO
(IF = 0mA)
0V
tf
15V
4V
1V
VCM
VO
(IF = 10mA)
Pulse generator
ZO = 50Ω
VOL
1200(V)
1200(V)
CMH =
, CML =
tr (ms)
t f (ms)
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TLP759(IGM)
RESTRICTIONS ON PRODUCT USE
000707EAA
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TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc..
·
The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this
document shall be made at the customer’s own risk.
·
The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other
rights of the third parties which may result from its use. No license is granted by implication or otherwise under
any intellectual property or other rights of TOSHIBA CORPORATION or others.
·
The information contained herein is subject to change without notice.
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