ONSEMI NUF4001MUT2G

NUF4001MU
Low Capacitance
4 Line EMI Filter with
ESD Protection in UDFN8
Package
This device is a 4 line EMI filter array for wireless applications.
Greater than −25 dB attenuation is obtained at frequencies from
800 MHz to 5.0 GHz. The NUF4001MU has a cut−off frequency of
150 MHz and can be used in applications for data rate up to 58 MHz or
116 Mbps. This UDFN package is specifically designed to enhance
EMI filtering for low−profile or slim design electronics especially
where space and height is a premium. It also offers ESD
protection−clamping transients from static discharges. ESD protection
is provided across all capacitors.
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1
•
•
•
•
Cd
Cd
Cd
Cd
Cd
Cd
Cd
2
7
6
3
Features
• EMI Filtering and ESD Protection
• Integration of 20 Discrete Components
• Compliance with IEC61000−4−2 (Level 4)
Cd
4
>14 kV (Contact)
>15 kV (Air)
UDFN Package, 1.2 x 1.8 mm
Moisture Sensitivity Level 1
ESD Ratings: Machine Model = C
Human Body Model = 3B
This is a Pb−Free Device*
5
(Top View)
MARKING
DIAGRAM
8
1
1
41 MG
G
UDFN8
CASE 517AD
Benefits
41
= Specific Device Code
M
= Month Code
G
= Pb−Free Package
(Note: Microdot may be in either location)
• Reduces EMI/RFI Emmisions on a Data Line
• Low Profile Package; Typical Height of 0.5 mm
• Design−Friendly and Easy−to−Use Pin Configurations,
Particularly for Portable Electronics
PIN CONNECTIONS
• Integrated Solution Offers Cost and Space Savings in UDFN Package
• Reduces Parasitic Inductances Which Offer a More “Ideal” Low Pass
1
4
8
5
Filter Response
• Integrated Solution Improves System Reliability
Applications
•
•
•
•
•
•
EMI Filtering and ESD Protection for Data Lines
Keypad Interface and Protection for Portable Electronics
Bottom Connector Interface for Mobile Handsets
Notebook Computers and Digital Cameras
LCD Display Interface in Mobile Handsets
Camera Display Interface in Mobile Handsets
ORDERING INFORMATION
*For additional information on our Pb−Free strategy and soldering details, please
download the ON Semiconductor Soldering and Mounting Techniques
Reference Manual, SOLDERRM/D.
© Semiconductor Components Industries, LLC, 2006
December, 2006 − Rev. 1
1
Device
Package
Shipping †
NUF4001MUT2G
UDFN8
(Pb−Free)
3000 / Tape & Reel
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D.
Publication Order Number:
NUF4001MU/D
NUF4001MU
MAXIMUM RATINGS
Parameter
Symbol
ESD Discharge IEC61000−4−2
Value
VPP
Unit
kV
Contact Discharge
Machine Model
Human Body Model
14
0.4
8.0
Operating Temperature Range
TOP
−40 to 85
°C
Storage Temperature Range
TSTG
−55 to 150
°C
TL
260
°C
Maximum Lead Temperature for Soldering Purposes (1.8 in from case for 10 seconds)
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)
Parameter
Maximum Reverse Working Voltage
Breakdown Voltage
Symbol
Test Conditions
Min
Typ
Max
Unit
5.0
V
8.0
V
100
nA
100
115
13
16
VRWM
VBR
IR = 1.0 mA
Leakage Current
IR
VRWM = 3.3 V
Resistance
RA
IR = 10 mA
85
Capacitance (Notes 1 and 2)
Cd
VR = 2.5 V, f = 1.0 MHz
10
Cut−Off Frequency (Note 3)
f3dB
Above this frequency,
appreciable attenuation occurs
1. Measured at 25°C.
2. Total Line Capacitance is two times the Diode Capacitance (Cd).
3. 50 source and 50 load termination.
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2
6.0
7.0
150
pF
MHz
NUF4001MU
TYPICAL PERFORMANCE CURVES (TA= 25°C unless otherwise specified)
0
0
−5
−10
−10
−20
−20
S41 (dB)
S21 (dB)
−15
−25
−30
−30
−40
−35
−40
−50
−45
−50
1.0E+6
10.0E+6
100E+6
1.0E+9
−60
10.0E+6
10.0E+9
100E+6
FREQUENCY (Hz)
10.0E+9
FREQUENCY (Hz)
Figure 1. Insertion Loss Characteristic
Figure 2. Insertion Loss Characteristic
110
2.0
108
106
1.5
RESISTANCE ()
NORMALIZED CAPACITANCE
1.0E+9
1.0
0.5
104
102
100
98
96
94
92
0
0
1.0
2.0
3.0
4.0
90
−40
5.0
−20
0
20
40
60
80
REVERSE VOLTAGE (V)
TEMPERATURE (°C)
Figure 3. Typical Capacitance vs.
Reverse Biased Voltage
(Normalized Capacitance Cd at 2.5 V)
Figure 4. Typical Resistance over Temperature
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NUF4001MU
PACKAGE DIMENSIONS
UDFN8, 1.8x1.2, 0.4P
CASE 517AD−01
ISSUE O
A
B
D
2X
0.15 C
PIN ONE
REFERENCE
2X
ÉÉÉ
ÉÉÉ
A3
E
A1
ÉÉ
ÇÇ
ÇÇ
DETAIL A
0.15 C
DIM
A
A1
A3
b
D
D2
E
E2
e
K
L
TOP VIEW
(A3)
DETAIL A
A
0.10 C
8X
0.08 C
SEATING
PLANE
SIDE VIEW
8X
6X
e
L
8X
MILLIMETERS
MIN
NOM MAX
0.45
0.50
0.55
0.00
0.03
0.05
0.127 REF
0.15
0.20
0.25
1.80 BSC
0.90
1.00
1.10
1.20 BSC
0.20
0.30
0.40
0.40 BSC
0.20
−−−
−−−
0.20
0.25
0.30
C
A1
D2
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION b APPLIES TO PLATED TERMINAL
AND IS MEASURED BETWEEN 0.15 AND
0.20 mm FROM TERMINAL.
4. COPLANARITY APPLIES TO THE EXPOSED
PAD AS WELL AS THE TERMINALS.
1
K
8
4
5
E2
8X b
BOTTOM VIEW
0.10 C A B
0.05 C
NOTE 3
ON Semiconductor and
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights
nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should
Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates,
and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death
associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal
Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
LITERATURE FULFILLMENT:
Literature Distribution Center for ON Semiconductor
P.O. Box 5163, Denver, Colorado 80217 USA
Phone: 303−675−2175 or 800−344−3860 Toll Free USA/Canada
Fax: 303−675−2176 or 800−344−3867 Toll Free USA/Canada
Email: [email protected]
N. American Technical Support: 800−282−9855 Toll Free
USA/Canada
Europe, Middle East and Africa Technical Support:
Phone: 421 33 790 2910
Japan Customer Focus Center
Phone: 81−3−5773−3850
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ON Semiconductor Website: www.onsemi.com
Order Literature: http://www.onsemi.com/orderlit
For additional information, please contact your local
Sales Representative
NUF4001MU/D