Order this document by MTE30N50E/D SEMICONDUCTOR TECHNICAL DATA Motorola Preferred Device N–Channel Enhancement–Mode Silicon Gate TMOS POWER FET 30 AMPERES 500 VOLTS RDS(on) = 0.150 OHM This advanced TMOS E–FET is designed to withstand high energy in the avalanche mode and switch efficiently. This new energy design also offers a drain–to–source diode with fast recovery time. Designed for high voltage, high speed switching applications in power supplies, PWM motor controls, and other inductive loads. The avalanche energy capability is specified to eliminate the guesswork in designs where inductive loads are switched and offer additional safety margin against unexpected voltage transients. • 2500 V RMS Isolated ISOTOP Package • Avalanche Energy Specified • Source–to–Drain Diode Recovery Time Comparable to a Discrete Fast Recovery Diode • Diode is Characterized for Use in Bridge Circuits • Very Low Internal Parasitic Inductance • IDSS and VDS(on) Specified at Elevated Temperature • U.L. Recognized, File #E69369 4 1 3 2 D G SOT–227B S 1. 2. 3. 4. Source Gate Drain Source 2 MAXIMUM RATINGS (TC = 25°C unless otherwise noted) Symbol Value Unit Drain–to–Source Voltage VDSS 500 Vdc Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 500 Vdc Gate–to–Source Voltage — Continuous — Non–Repetitive (tp ≤ 10 ms) VGS VGSM ± 20 ± 40 Vdc Vpk Drain Current — Continuous @ 25°C Drain Current — Continuous @ 100°C Drain Current — Single Pulse (tp ≤ 10 µs) ID ID IDM 30 12 80 Adc Total Power Dissipation @ 25°C Derate above 25°C PD 250 2.0 Watts W/°C TJ, Tstg – 55 to 150 °C Rating Operating and Storage Temperature Range Apk Single Pulse Drain–to–Source Avalanche Energy – Starting TJ = 25°C (VDD = 100 Vdc, VGS = 10 Vdc, Peak IL= 30 Apk, L = 10 mH, RG = 25 Ω) EAS Thermal Resistance — Junction to Case Thermal Resistance — Junction to Ambient RθJC RθJA 0.5 62.5 °C/W TL 260 °C Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 10 seconds mJ 3000 This document contains information on a new product. Specifications and information herein are subject to change without notice. E–FET is a trademark of Motorola, Inc. TMOS is a registered trademark of Motorola, Inc. ISOTOP is a trademark of SGS–THOMSON Microelectronics. Preferred devices are Motorola recommended choices for future use and best overall value. TMOS Motorola Motorola, Inc. 1996 Power MOSFET Transistor Device Data 1 MTE30N50E ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) Symbol Min Typ Max 500 — 560 566 — — — — — — 10 200 — — 100 2.0 — 3.2 7.0 4.0 — mV/°C — 0.13 0.15 Ohms — — 4.1 — 5.0 7.0 gFS 17 — — mhos Ciss — 7200 10080 pF Coss — 775 1200 Crss — 120 250 td(on) — 32 60 tr — 105 175 td(off) — 160 275 tf — 115 200 QT — 235 350 Q1 — 35 — Q2 — 110 — Q3 — 65 — — — 0.95 0.88 1.2 — trr — 485 — ta — 312 — tb — 173 — QRR — 8.2 — µC Internal Drain Inductance LD — 5.0 — nH Internal Source Inductance LS — 5.0 — nH Characteristic Unit OFF CHARACTERISTICS Drain–to–Source Breakdown Voltage (VGS = 0 Vdc, ID = 0.25 mAdc) Temperature Coefficient (Positive) V(BR)DSS Zero Gate Voltage Drain Current (VDS = 500 Vdc, VGS = 0 Vdc) (VDS = 500 Vdc, VGS = 0 Vdc, TJ = 125°C) IDSS Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) IGSS Vdc mV/°C µAdc nAdc ON CHARACTERISTICS (1) Gate Threshold Voltage (VDS = VGS, ID = 250 µAdc) Threshold Temperature Coefficient (Negative) VGS(th) Static Drain–to–Source On–Resistance (VGS = 10 Vdc, ID = 15 Adc) RDS(on) Drain–to–Source On–Voltage (VGS = 10 Vdc, ID = 30 Adc) (VGS = 10 Vdc, ID = 15 Adc) VDS(on) Forward Transconductance (VDS = 15 Vdc, ID = 15 Adc) Vdc Vdc DYNAMIC CHARACTERISTICS Input Capacitance Output Capacitance (VDS = 25 Vdc, VGS = 0 Vdc, f = 1.0 MHz) Transfer Capacitance SWITCHING CHARACTERISTICS (2) Turn–On Delay Time Rise Time Turn–Off Delay Time (VDD = 250 Vdc, ID = 30 Adc, VGS = 10 Vdc, RG = 4.7 Ω) Fall Time Gate Charge (see figure 8) (VDS = 400 Vdc, ID = 30 Adc, VGS = 10 Vdc) ns nC SOURCE–DRAIN DIODE CHARACTERISTICS Forward On–Voltage (IS = 30 Adc, VGS = 0 Vdc) (IS = 30 Adc, VGS = 0 Vdc, TJ = 125°C) Reverse Recovery Time (IS = 30 Adc, VGS = 0 Vdc, dIS/dt = 100 A/µs) Reverse Recovery Stored Charge VSD Vdc ns INTERNAL PACKAGE INDUCTANCE (1) Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%. (2) Switching characteristics are independent of operating junction temperature. 2 Motorola TMOS Power MOSFET Transistor Device Data MTE30N50E TYPICAL ELECTRICAL CHARACTERISTICS TJ = 25°C 50 I D , DRAIN CURRENT (AMPS) 60 VGS = 10 V 8V 6V 40 30 5V 20 VDS ≥ 10 V 50 I D , DRAIN CURRENT (AMPS) 60 40 30 100°C 20 10 10 25°C 4V 0 TJ = – 55°C 0 0 4 8 2 6 10 VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) 12 2 0.35 VGS = 10 V 0.3 TJ = 100°C 0.25 0.2 25°C 0.15 0.1 – 55°C 0.5 0 0 10 20 30 40 ID, DRAIN CURRENT (AMPS) 6.5 7 50 60 0.17 TJ = 25°C 0.16 0.15 VGS = 10 V 0.14 15 V 0.13 0.12 0 Figure 3. On–Resistance versus Drain Current and Temperature 2.5 10 20 30 40 ID, DRAIN CURRENT (AMPS) 50 60 Figure 4. On–Resistance versus Drain Current and Gate Voltage 10000 VGS = 10 V ID = 15 A VGS = 0 V TJ = 125°C 2 1000 I DSS, LEAKAGE (nA) RDS(on) , DRAIN–TO–SOURCE RESISTANCE (NORMALIZED) 3 4 3.5 4.5 5.5 5 6 VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) Figure 2. Transfer Characteristics RDS(on) , DRAIN–TO–SOURCE RESISTANCE (OHMS) RDS(on) , DRAIN–TO–SOURCE RESISTANCE (OHMS) Figure 1. On–Region Characteristics 2.5 1.5 1 100 25°C 10 0.5 0 – 50 100°C – 25 25 75 0 50 100 TJ, JUNCTION TEMPERATURE (°C) 125 150 Figure 5. On–Resistance Variation with Temperature Motorola TMOS Power MOSFET Transistor Device Data 1 0 100 200 300 400 VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) 500 Figure 6. Drain–To–Source Leakage Current versus Voltage 3 MTE30N50E POWER MOSFET SWITCHING Switching behavior is most easily modeled and predicted by recognizing that the power MOSFET is charge controlled. The lengths of various switching intervals (∆t) are determined by how fast the FET input capacitance can be charged by current from the generator. The capacitance (Ciss) is read from the capacitance curve at a voltage corresponding to the off–state condition when calculating td(on) and is read at a voltage corresponding to the on–state when calculating td(off). The published capacitance data is difficult to use for calculating rise and fall because drain–gate capacitance varies greatly with applied voltage. Accordingly, gate charge data is used. In most cases, a satisfactory estimate of average input current (IG(AV)) can be made from a rudimentary analysis of the drive circuit so that At high switching speeds, parasitic circuit elements complicate the analysis. The inductance of the MOSFET source lead, inside the package and in the circuit wiring which is common to both the drain and gate current paths, produces a voltage at the source which reduces the gate drive current. The voltage is determined by Ldi/dt, but since di/dt is a function of drain current, the mathematical solution is complex. The MOSFET output capacitance also complicates the mathematics. And finally, MOSFETs have finite internal gate resistance which effectively adds to the resistance of the driving source, but the internal resistance is difficult to measure and, consequently, is not specified. The resistive switching time variation versus gate resistance (Figure 9) shows how typical switching performance is affected by the parasitic circuit elements. If the parasitics were not present, the slope of the curves would maintain a value of unity regardless of the switching speed. The circuit used to obtain the data is constructed to minimize common inductance in the drain and gate circuit loops and is believed readily achievable with board mounted components. Most power electronic loads are inductive; the data in the figure is taken with a resistive load, which approximates an optimally snubbed inductive load. Power MOSFETs may be safely operated into an inductive load; however, snubbing reduces switching losses. t = Q/IG(AV) During the rise and fall time interval when switching a resistive load, VGS remains virtually constant at a level known as the plateau voltage, VSGP. Therefore, rise and fall times may be approximated by the following: tr = Q2 x RG/(VGG – VGSP) tf = Q2 x RG/VGSP where VGG = the gate drive voltage, which varies from zero to VGG RG = the gate drive resistance and Q2 and VGSP are read from the gate charge curve. During the turn–on and turn–off delay times, gate current is not constant. The simplest calculation uses appropriate values from the capacitance curves in a standard equation for voltage change in an RC network. The equations are: td(on) = RG Ciss In [VGG/(VGG – VGSP)] td(off) = RG Ciss In (VGG/VGSP) 100000 24000 VDS = 0 V VGS = 0 V TJ = 25°C Ciss C, CAPACITANCE (pF) C, CAPACITANCE (pF) 20000 VGS = 0 V 16000 12000 Crss Ciss 8000 Coss 4000 0 10 Crss 5 0 VGS 5 10 15 20 25 10000 Ciss 1000 Coss 100 10 10 Crss 100 1000 VDS GATE–TO–SOURCE OR DRAIN–TO–SOURCE VOLTAGE (VOLTS) Figure 7. Capacitance Variation 4 TJ = 25°C DRAIN–TO–SOURCE VOLTAGE (VOLTS) Figure 7b. High Voltage Capacitance Variation Motorola TMOS Power MOSFET Transistor Device Data 600 QT 10 500 8 VGS Q1 6 400 Q2 300 4 200 ID = 30 A TJ = 25°C 2 0 VDS Q3 0 50 100 150 Qg, TOTAL GATE CHARGE (nC) 200 100 0 250 10000 t, TIME (ns) 12 VDS , DRAIN–TO–SOURCE VOLTAGE (VOLTS) VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) MTE30N50E VDD = 250 V ID = 30 A VGS = 10 V TJ = 25°C 1000 td(off) tf tr 100 td(on) 10 1 10 RG, GATE RESISTANCE (OHMS) Figure 8. Gate–To–Source and Drain–To–Source Voltage versus Total Charge 100 Figure 9. Resistive Switching Time Variation versus Gate Resistance SAFE OPERATING AREA The Forward Biased Safe Operating Area curves define the maximum simultaneous drain–to–source voltage and drain current that a transistor can handle safely when it is forward biased. Curves are based upon maximum peak junction temperature and a case temperature (TC) of 25°C. Peak repetitive pulsed power limits are determined by using the thermal response data in conjunction with the procedures discussed in AN569, “Transient Thermal Resistance–General Data and Its Use.” Switching between the off–state and the on–state may traverse any load line provided neither rated peak current (IDM) nor rated voltage (VDSS) is exceeded and the transition time (tr,tf) do not exceed 10 µs. In addition the total power aver- aged over a complete switching cycle must not exceed (TJ(MAX) – TC)/(RθJC). A Power MOSFET designated E–FET can be safely used in switching circuits with unclamped inductive loads. For reliable operation, the stored energy from circuit inductance dissipated in the transistor while in avalanche must be less than the rated limit and adjusted for operating conditions differing from those specified. Although industry practice is to rate in terms of energy, avalanche energy capability is not a constant. The energy rating decreases non–linearly with an increase of peak current in avalanche and peak junction temperature. 9 30 QRR, STORED CHARGE (µ C) 8 I S , SOURCE CURRENT (AMPS) dlS/dt = 100 A/µs VDD = 50 V TJ = 25°C 7 6 5 4 3 2 0 6 12 18 24 30 VGS = 0 V TJ = 25°C 20 10 0 0.5 0.55 0.6 0.65 0.7 0.75 0.8 0.85 0.9 0.95 IS, SOURCE CURRENT (AMPS) VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS) Figure 10. Stored Charge Figure 11. Diode Forward Voltage versus Current Motorola TMOS Power MOSFET Transistor Device Data 5 MTE30N50E SAFE OPERATING AREA EAS, SINGLE PULSE DRAIN–TO–SOURCE AVALANCHE ENERGY (mJ) I D , DRAIN CURRENT (AMPS) 100 10 µs VGS = 20 V SINGLE PULSE TC = 25°C 100 µs 10 1 ms 10 ms dc 1 RDS(on) LIMIT THERMAL LIMIT PACKAGE LIMIT 0.1 0.1 10 1 100 VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) 3000 ID = 30 A 2500 2000 1500 1000 500 0 1000 r(t), EFFECTIVE TRANSIENT THERMAL RESISTANCE (NORMALIZED) Figure 12. Maximum Rated Forward Biased Safe Operating Area 25 50 75 100 125 TJ, STARTING JUNCTION TEMPERATURE (°C) 150 Figure 13. Maximum Avalanche Energy versus Starting Junction Temperature 1.0 D = 0.5 0.2 0.1 0.1 0.05 0.02 0.01 SINGLE PULSE 0.01 1.0E–05 1.0E–04 1.0E–03 1.0E–02 t, TIME (s) 1.0E–01 1.0E+00 1.0E+01 Figure 14. Thermal Response di/dt IS trr ta tb TIME 0.25 IS tp IS Figure 15. Diode Reverse Recovery Waveform 6 Motorola TMOS Power MOSFET Transistor Device Data MTE30N50E PACKAGE DIMENSIONS A H B L C R Q G 4 3 1 2 M N P D E F S " 0.2 Nm STYLE 1: PIN 1. 2. 3. 4. Recommended screw torque: 1.3 Maximum screw torque: 1.5 Nm NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: MILLIMETERS. DIM A B C D E F G H L M N P Q R S MILLIMETERS MIN MAX 31.50 31.70 7.80 8.20 4.10 4.30 14.90 15.10 30.10 30.30 38.00 38.20 4.00 11.80 12.20 8.90 9.10 12.60 12.80 25.20 25.40 1.95 2.05 4.10 0.75 0.85 5.50 INCHES MIN MAX 1.240 1.248 0.307 0.322 0.161 0.169 0.586 0.590 1.185 1.193 1.496 1.503 0.157 0.464 0.480 0.350 0.358 0.496 0.503 0.992 1.000 0.076 0.080 0.157 0.030 0.033 0.217 SOURCE GATE DRAIN SOURCE 2 SOT–227B Motorola TMOS Power MOSFET Transistor Device Data 7 MTE30N50E Motorola reserves the right to make changes without further notice to any products herein. Motorola makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does Motorola assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation consequential or incidental damages. “Typical” parameters can and do vary in different applications. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. Motorola does not convey any license under its patent rights nor the rights of others. Motorola products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the Motorola product could create a situation where personal injury or death may occur. Should Buyer purchase or use Motorola products for any such unintended or unauthorized application, Buyer shall indemnify and hold Motorola and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that Motorola was negligent regarding the design or manufacture of the part. Motorola and are registered trademarks of Motorola, Inc. Motorola, Inc. is an Equal Opportunity/Affirmative Action Employer. How to reach us: USA / EUROPE: Motorola Literature Distribution; P.O. Box 20912; Phoenix, Arizona 85036. 1–800–441–2447 JAPAN: Nippon Motorola Ltd.; Tatsumi–SPD–JLDC, Toshikatsu Otsuki, 6F Seibu–Butsuryu–Center, 3–14–2 Tatsumi Koto–Ku, Tokyo 135, Japan. 03–3521–8315 MFAX: [email protected] – TOUCHTONE (602) 244–6609 INTERNET: http://Design–NET.com HONG KONG: Motorola Semiconductors H.K. Ltd.; 8B Tai Ping Industrial Park, 51 Ting Kok Road, Tai Po, N.T., Hong Kong. 852–26629298 8 ◊ *MTE30N50E/D* Motorola TMOS Power MOSFET Transistor Device Data MTE30N50E/D

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