SAMSUNG K7B163625A

K7B163625A
K7B161825A
512Kx36 & 1Mx18 Synchronous SRAM
Document Title
512Kx36 & 1Mx18-Bit Synchronous Burst SRAM
Revision History
Rev. No.
0.0
History
1. Initial draft
Draft Date
Feb. 23. 2001
Remark
Preliminary
0.1
1. Add JTAG Scan Order
May. 10. 2001
Preliminary
0.2
1. Add x32 org and industrial temperature .
2. Add 165FBGA package
Aug. 30. 2001
Preliminary
1.0
1. Final spec release
May. 10. 2002
Final
1.1
1. Delete 119BGA package.
2. Correct the Ball Size of 165 FBGA.
April 04. 2003
Final
2.0
1. Delete x32 Org.
2. Delete 165FBGA package.
3. Delelte the 6.5 ns speed bin.
Nov. 17, 2003
Final
-1-
Nov. 2003
Rev 2.0
K7B163625A
K7B161825A
512Kx36 & 1Mx18 Synchronous SRAM
16Mb SB/SPB Synchronous SRAM Ordering Information
Org.
Mode
VDD
Speed
SB ; Access Time(ns)
SPB ; Cycle Time(MHz)
SB
3.3
7.5/8.5ns
K7A161800A-QC(I)25/16/14
SPB(2E1D)
3.3
250/167/138MHz
K7A161801A-QC(I)20/16
SPB(2E2D)
3.3
200/167MHz
K7B163625A-QC(I)75/85
SB
3.3
7.5/8.5ns
SPB(2E1D)
3.3
250/167/138MHz
SPB(2E2D)
3.3
200/167MHz
Part Number
K7B161825A-QC(I)75/85
1Mx18
512Kx36 K7A163600A-QC(I)25/16/14
K7A163601A-QC(I)20/16
-2-
PKG
Temp
C
; Commercial
Temp.Range
Q : 100TQFP
I
; Industrial
Temp.Range
Nov. 2003
Rev 2.0
K7B163625A
K7B161825A
512Kx36 & 1Mx18 Synchronous SRAM
512Kx36 & 1Mx18-Bit Synchronous Burst SRAM
FEATURES
GENERAL DESCRIPTION
• Synchronous Operation.
• On-Chip Address Counter.
• Self-Timed Write Cycle.
• On-Chip Address and Control Registers.
• 3.3V+0.165V/-0.165V Power Supply.
• I/O Supply Voltage 3.3V+0.165V/-0.165V for 3.3V I/O
or 2.5V+0.4V/-0.125V for 2.5V I/O
• 5V Tolerant Inputs Except I/O Pins.
• Byte Writable Function.
• Global Write Enable Controls a full bus-width write.
• Power Down State via ZZ Signal.
• LBO Pin allows a choice of either a interleaved burst or a linear burst.
• Three Chip Enables for simple depth expansion with No Data
Contention only for TQFP.
• Asynchronous Output Enable Control.
• ADSP , ADSC, ADV Burst Control Pins.
• TTL-Level Three-State Output.
• 100-TQFP-1420A
• Operating in commeical and industrial temperature range.
The K7B163625A and K7B161825A are 18,874,368-bit Synchronous Static Random Access Memory designed for high
performance second level cache of Pentium and Power PC
based System.
It is organized as 512K(1M) words of 36(32/18) bits and integrates address and control registers, a 2-bit burst address
counter and added some new functions for high performance
cache RAM applications; GW, BW, LBO, ZZ. Write cycles are
internally self-timed and synchronous.
Full bus-width write is done by GW, and each byte write is performed by the combination of W Ex and BW when G W is high.
And with CS 1 high, ADSP is blocked to control signals.
Burst cycle can be initiated with either the address status processor(ADSP) or address status cache controller(ADSC)
inputs. Subsequent burst addresses are generated internally in
the system′s burst sequence and are controlled by the burst
address advance(ADV) input.
LBO pin is DC operated and determines burst sequence(linear
or interleaved).
ZZ pin controls Power Down State and reduces Stand-by current regardless of CLK.
The K7B163625A and K7B161825A are fabricated using SAMSUNG′s high performance CMOS technology and is available
in a 100pin TQFP package. Multiple power and ground pins are
utilized to minimize ground bounce.
FAST ACCESS TIMES
Symbol
-75
-85
Unit
Cycle Time
PARAMETER
tCYC
8.5
10
ns
Clock Access Time
tCD
7.5
8.5
ns
Output Enable Access Time
tOE
3.5
4.0
ns
LOGIC BLOCK DIAGRAM
CLK
LBO
BURST CONTROL
LOGIC
CONTROL
REGISTER
ADV
ADSC
A0~A18
or A0~A19
A′0~A′1
ADDRESS
REGISTER
A2~A18
or A2~A19
DATA-IN
REGISTER
CONTROL
REGISTER
GW
BW
WEx
(x=a,b,c,d or a,b)
512Kx36, 1Mx18
MEMORY
ARRAY
A0~A1
ADSP
CS1
CS2
CS2
BURST
ADDRESS
COUNTER
OUTPUT
BUFFER
CONTROL
LOGIC
OE
ZZ
DQa0 ~ DQd 7 or DQa0 ~ DQb7
DQPa ~ DQPd DQPa,DQPb
-3-
Nov. 2003
Rev 2.0
K7B163625A
K7B161825A
512Kx36 & 1Mx18 Synchronous SRAM
A6
A7
CS 1
CS 2
W Ed
W Ec
W Eb
W Ea
CS 2
V DD
V SS
CLK
GW
BW
OE
A DSC
A DSP
A DV
A8
A9
99
98
97
96
95
94
93
92
91
90
89
88
87
86
85
84
83
82
81
100 Pin TQFP
(20mm x 14mm)
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
A4
A3
A2
A1
A0
N.C.
N.C.
V SS
V DD
A 18
A 17
A 10
A 11
A 12
A 13
A 14
A 15
A 16
K7B163625A(512Kx36)
A5
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
LBO
NC/DQPc
DQc 0
DQc 1
V DDQ
V SSQ
DQc 2
DQc 3
DQc 4
DQc 5
V SSQ
V DDQ
DQc 6
DQc 7
N.C.
V DD
N.C.
V SS
DQd 0
DQd 1
V DDQ
V SSQ
DQd 2
DQd 3
DQd 4
DQd 5
V SSQ
V DDQ
DQd 6
DQd 7
NC/DQPd
100
PIN CONFIGURATION(TOP VIEW)
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
DQPb/NC
DQb7
DQb6
V DDQ
V SSQ
DQb5
DQb4
DQb3
DQb2
V SSQ
V DDQ
DQb1
DQb0
V SS
N.C.
V DD
ZZ
DQa7
DQa6
V DDQ
V SSQ
DQa5
DQa4
DQa3
DQa2
V SSQ
V DDQ
DQa1
DQa0
DQPa/NC
PIN NAME
SYMBOL
A 0 - A 18
PIN NAME
TQFP PIN NO.
Address Inputs
32,33,34,35,36,37,42
43,44,45,46,47,48,49
50,81,82,99,100
ADV
Burst Address Advance
83
ADSP
Address Status Processor 84
ADSC
Address Status Controller 85
CLK
Clock
89
CS 1
Chip Select
98
CS 2
Chip Select
97
CS 2
Chip Select
92
WE x(x=a,b,c,d) Byte Write Inputs
93,94,95,96
OE
Output Enable
86
GW
Global Write Enable
88
BW
Byte Write Enable
87
ZZ
Power Down Input
64
LBO
Burst Mode Control
31
SYMBOL
PIN NAME
TQFP PIN NO.
V DD
V SS
Power Supply(+3.3V)
Ground
15,41,65,91
17,40,67,90
N.C.
No Connect
14,16,38,39,66
DQa0~a 7
DQb0~b 7
DQc0 ~c7
DQd0~d 7
DQPa~P d
or NC
Data Inputs/Outputs
52,53,56,57,58,59,62,63
68,69,72,73,74,75,78,79
2,3,6,7,8,9,12,13
18,19,22,23,24,25,28,29
51,80,1,30
V DDQ
Output Power Supply
(2.5V or 3.3V)
Output Ground
4,11,20,27,54,61,70,77
V SSQ
5,10,21,26,55,60,71,76
Notes : 1. A0 and A1 are the two least significant bits(LSB) of the address field and set the internal burst counter if burst is desired.
-4-
Nov. 2003
Rev 2.0
K7B163625A
K7B161825A
512Kx36 & 1Mx18 Synchronous SRAM
A6
A7
CS 1
CS 2
N.C.
N.C.
WEb
WEa
CS 2
V DD
V SS
CLK
GW
BW
OE
ADS C
ADS P
ADV
A8
A9
99
98
97
96
95
94
93
92
91
90
89
88
87
86
85
84
83
82
81
100 Pin TQFP
(20mm x 14mm)
47
48
49
50
A 14
A 15
A 16
A 17
41
V DD
46
40
V SS
A 13
39
N.C.
45
38
N.C.
A 12
37
A0
44
36
A1
A 11
35
A2
43
34
A3
A 18
33
A4
42
32
A 19
31
K7B161825A(1Mx18)
A5
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
LBO
N.C.
N.C.
N.C.
V DDQ
V SSQ
N.C.
N.C.
DQb0
DQb1
V SSQ
V DDQ
DQb2
DQb3
N.C.
V DD
N.C.
V SS
DQb4
DQb5
V DDQ
V SSQ
DQb6
DQb7
DQPb
N.C.
V SSQ
V DDQ
N.C.
N.C.
N.C.
100
PIN CONFIGURATION(TOP VIEW)
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
A 10
N.C.
N.C.
V DDQ
V SSQ
N.C.
DQPa
DQa7
DQa6
V SSQ
V DDQ
DQa5
DQa4
V SS
N.C.
V DD
ZZ
DQa3
DQa2
V DDQ
V SSQ
DQa1
DQa0
N.C.
N.C.
V SSQ
V DDQ
N.C.
N.C.
N.C.
PIN NAME
SYMBOL
PIN NAME
A 0 - A 19
Address Inputs
ADV
ADSP
ADSC
CLK
CS 1
CS 2
CS 2
W Ex(x=a,b)
OE
GW
BW
ZZ
LBO
Burst Address Advance
Address Status Processor
Address Status Controller
Clock
Chip Select
Chip Select
Chip Select
Byte Write Inputs
Output Enable
Global Write Enable
Byte Write Enable
Power Down Input
Burst Mode Control
TQFP PIN NO.
SYMBOL
32,33,34,35,36,37,42
43,44,45,46,47,48,49
50 80,81,82,99,100
83
84
85
89
98
97
92
93,94
86
88
87
64
31
PIN NAME
TQFP PIN NO.
V DD
V SS
N.C.
Power Supply(+3.3V)
Ground
No Connect
15,41,65,91
17,40,67,90
1,2,3,6,7,14,16,25,28,29,
30,38,39,51,52,53,56,57,
66,75,78,79,95,96
DQa 0 ~ a7
DQb 0 ~ b7
DQPa, Pb
Data Inputs/Outputs
58,59,62,63,68,69,72,73
8,9,12,13,18,19,22,23
74,24
V DDQ
Output Power Supply
(2.5V or 3.3V)
Output Ground
4,11,20,27,54,61,70,77
V SSQ
5,10,21,26,55,60,71,76
Notes : 1. A0 and A1 are the two least significant bits(LSB) of the address field and set the internal burst counter if burst is desired.
-5-
Nov. 2003
Rev 2.0
K7B163625A
K7B161825A
512Kx36 & 1Mx18 Synchronous SRAM
FUNCTION DESCRIPTION
The K7B163625A and K7B161825A are synchronous SRAM designed to support the burst address accessing sequence of the
Power PC based microprocessor. All inputs (with the exception of OE, LBO and ZZ) are sampled on rising clock edges. The start and
duration of the burst access is controlled by ADSC, ADSP and ADV and chip select pins.
The accesses are enabled with the chip select signals and output enabled signals. Wait states are inserted into the access with
ADV.
When ZZ is pulled high, the SRAM will enter a Power Down State. At this time, internal state of the SRAM is preserved. When ZZ
returns to low, the SRAM normally operates after 2cycles of wake up time. ZZ pin is pulled down internally.
Read cycles are initiated with ADSP(or ADSC) using the new external address clocked into the on-chip address register when both
G W and BW are high or when BW is low and WEa, WEb, WEc, and WE d are high. When ADSP is sampled low, the chip selects are
sampled active, and the output buffer is enabled with O E. the data of cell array accessed by the current address are projected to the
output pins.
Write cycles are also initiated with ADSP(or ADSC) and are differentiated into two kinds of operations; All byte write operation and
individual byte write operation.
All byte write occurs by enabling G W(independent of BW and WEx.), and individual byte write is performed only when GW is high
and BW is low. In K7B163625M, a 512Kx36 organization, W Ea controls DQa0 ~ DQa7 and DQPa, WEb controls DQb0 ~ DQb7 and
DQPb, WEc controls DQc0 ~ DQc7 and DQPc and WEd controls DQd0 ~ DQd7 and DQPd.
CS1 is used to enable the device and conditions internal use of ADSP and is sampled only when a new external address is loaded.
ADV is ignored at the clock edge when ADSP is asserted, but can be sampled on the subsequent clock edges. The address
increases internally for the next access of the burst when ADV is sampled low.
Addresses are generated for the burst access as shown below, The starting point of the burst sequence is provided by the external
address. The burst address counter wraps around to its initial state upon completion. The burst sequence is determined by the state
of the LBO pin. When this pin is Low, linear burst sequence is selected. And this pin is High, Interleaved burst sequence is selected.
BURST SEQUENCE TABLE
LBO PIN
HIGH
First Address
Fourth Address
(Interleaved Burst)
Case 1
A1
0
0
1
1
Case 2
A0
0
1
0
1
A1
0
0
1
1
Case 3
A0
1
0
1
0
A1
1
1
0
0
Case 4
A0
0
1
0
1
A1
1
1
0
0
BQ TABLE
LBO PIN
A0
1
0
1
0
(Linear Burst)
LOW
First Address
Fourth Address
Case 1
A1
0
0
1
1
Case 2
A0
0
1
0
1
A1
0
1
1
0
Case 3
A0
1
0
1
0
A1
1
1
0
0
Case 4
A0
0
1
0
1
A1
1
0
0
1
A0
1
0
1
0
Note : 1. LBO pin must be tied to High or Low, and Floating State must not be allowed .
-6-
Nov. 2003
Rev 2.0
K7B163625A
K7B161825A
512Kx36 & 1Mx18 Synchronous SRAM
TRUTH TABLES
SYNCHRONOUS TRUTH TABLE
CS 1
CS2
CS 2
ADV
WRITE
CLK
ADDRESS ACCESSED
OPERATION
H
X
X
ADSP ADSC
X
L
X
X
↑
N/A
Not Selected
L
L
X
L
X
X
X
↑
N/A
Not Selected
L
X
H
L
X
X
X
↑
N/A
Not Selected
L
L
X
X
L
X
X
↑
N/A
Not Selected
L
X
H
X
L
X
X
↑
N/A
Not Selected
L
H
L
L
X
X
X
↑
External Address
Begin Burst Read Cycle
L
H
L
H
L
X
L
↑
External Address
Begin Burst Write Cycle
L
H
L
H
L
X
H
↑
External Address
Begin Burst Read Cycle
X
X
X
H
H
L
H
↑
Next Address
Continue Burst Read Cycle
H
X
X
X
H
L
H
↑
Next Address
Continue Burst Read Cycle
X
X
X
H
H
L
L
↑
Next Address
Continue Burst Write Cycle
H
X
X
X
H
L
L
↑
Next Address
Continue Burst Write Cycle
X
X
X
H
H
H
H
↑
Current Address
Suspend Burst Read Cycle
H
X
X
X
H
H
H
↑
Current Address
Suspend Burst Read Cycle
X
X
X
H
H
H
L
↑
Current Address
Suspend Burst Write Cycle
H
X
X
X
H
H
L
↑
Current Address
Suspend Burst Write Cycle
Notes : 1. X means "Don ′t Care".
2. The rising edge of clock is symbolized by ↑.
3. WRITE = L means Write operation in WRITE TRUTH TABLE.
WRITE = H means Read operation in WRITE TRUTH TABLE.
4. Operation finally depends on status of asynchronous input pins(ZZ and OE ).
WRITE TRUTH TABLE( x36)
GW
BW
WEa
WEb
WEc
WE d
OPERATION
H
H
X
X
X
X
READ
H
L
H
H
H
H
READ
H
L
L
H
H
H
WRITE BYTE a
H
L
H
L
H
H
WRITE BYTE b
H
L
H
H
L
L
WRITE BYTE c and d
H
L
L
L
L
L
WRITE ALL BYTEs
L
X
X
X
X
X
WRITE ALL BYTEs
Notes : 1. X means "Don′t Care".
2. All inputs in this table must meet setup and hold time around the rising edge of CLK(↑).
WRITE TRUTH TABLE(x18)
GW
BW
WEa
WEb
OPERATION
H
H
X
X
READ
H
L
H
H
READ
H
L
L
H
WRITE BYTE a
H
L
H
L
WRITE BYTE b
H
L
L
L
WRITE ALL BYTEs
L
X
X
X
WRITE ALL BYTEs
Notes : 1. X means "Don′t Care".
2. All inputs in this table must meet setup and hold time around the rising edge of CLK(↑).
-7-
Nov. 2003
Rev 2.0
K7B163625A
K7B161825A
512Kx36 & 1Mx18 Synchronous SRAM
ASYNCHRONOUS TRUTH TABLE
Operation
ZZ
OE
I/O STATUS
Sleep Mode
H
X
High-Z
L
L
DQ
L
H
High-Z
Write
L
X
Din, High-Z
Deselected
L
X
High-Z
Read
Notes
1. X means "Don′t Care".
2. ZZ pin is pulled down internally
3. For write cycles that following read cycles, the output buffers must be
disabled with OE, otherwise data bus contention will occur.
4. Sleep Mode means power down state of which stand-by current does
not depend on cycle time.
5. Deselected means power down state of which stand-by current
depends on cycle time.
ABSOLUTE MAXIMUM RATINGS*
PARAMETER
SYMBOL
RATING
UNIT
Voltage on V DD Supply Relative to V SS
V DD
-0.3 to 4.6
V
Voltage on V DDQ Supply Relative to V SS
V DDQ
V DD
V
Voltage on Input Pin Relative to V SS
VI N
-0.3 to V DD+0.3
V
Voltage on I/O Pin Relative to V SS
V IO
-0.3 to VDDQ+0.3
V
Power Dissipation
PD
1.6
W
TSTG
-65 to 150
°C
Commercial
T OPR
0 to 70
°C
Industrial
T OPR
-40 to 85
°C
TBIAS
-10 to 85
°C
Storage Temperature
Operating Temperature
Storage Temperature Range Under Bias
*Note : Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or any other conditions above those indicated in the operating sections of this specification is not
implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
OPERATING CONDITIONS at 3.3V I/O(0°C ≤ TA ≤ 70°C)
PARAMETER
Supply Voltage
Ground
SYMBOL
MIN
Typ.
MAX
UNIT
V DD
3.135
3.3
3.465
V
V DDQ
3.135
3.3
3.465
V
V SS
0
0
0
V
* The above parameters are also guaranteed at industrial temperature range.
OPERATING CONDITIONS at 2.5V I/O(0°C ≤ TA ≤ 70°C)
PARAMETER
Supply Voltage
Ground
SYMBOL
MIN
Typ.
MAX
UNIT
V DD
3.135
3.3
3.465
V
V DDQ
2.375
2.5
2.9
V
V SS
0
0
0
V
* The above parameters are also guaranteed at industrial temperature range.
CAPACITANCE* (TA=25°C, f=1MHz)
PARAMETER
Input Capacitance
Output Capacitance
SYMBOL
TEST CONDITION
MIN
MAX
UNIT
C IN
V IN=0V
-
5
pF
C OUT
V OUT =0V
-
7
pF
*Note : Sampled not 100% tested.
-8-
Nov. 2003
Rev 2.0
K7B163625A
K7B161825A
512Kx36 & 1Mx18 Synchronous SRAM
DC ELECTRICAL CHARACTERISTICS (VDD =3.3V+0.165V/-0.165V, TA =0°C to +70°C)
Parameter
Symbol
Input Leakage Current(except ZZ)
IIL
V DD=Max ; VIN=VSS to V DD
Output Leakage Current
IOL
Output Disabled, Vout=V SS to V DDQ
Operating Current
ICC
ISB
Test Conditions
Min
Max
Unit
-2
+2
µA
µA
-2
+2
Device Selected, I OUT=0mA,
-75
-
250
ZZ ≤V IL , Cycle Time ≥ tCYC Min
-85
-
230
Device deselected, I OUT=0mA,
-75
-
90
-85
-
80
-
70
mA
-
60
mA
0.4
V
ZZ ≤V IL, f=Max, All Inputs ≤0.2V or
≥ V DD-0.2V
mA
Notes
1,2
mA
Device deselected, I OUT=0mA,
Standby Current
ISB1
ZZ ≤0.2V, f=0,
All Inputs=fixed (VDD-0.2V or
Device deselected, I OUT=0mA,
ISB2
ZZ≥V DD-0.2V, f=Max, All
Inputs ≤V IL or ≥V I H
Output Low Voltage(3.3V I/O)
V OL
IOL =8.0mA
-
Output High Voltage(3.3V I/O)
V OH
IOH=-4.0mA
2.4
-
V
Output Low Voltage(2.5V I/O)
V OL
IOL =1.0mA
-
0.4
V
Output High Voltage(2.5V I/O)
V OH
IOH=-1.0mA
Input Low Voltage(3.3V I/O)
V IL
Input High Voltage(3.3V I/O)
Input Low Voltage(2.5V I/O)
Input High Voltage(2.5V I/O)
2.0
-
V
-0.3*
0.8
V
V IH
2.0
V DD+0.3**
V
V IL
-0.3*
0.7
V
V IH
1.7
V DD+0.3**
V
3
3
Notes : 1. The above parameters are also guaranteed at industrial temperature range.
2. Reference AC Operating Conditions and Characteristics for input and timing.
3. Data states are all zero.
4. In Case of I/O Pins, the Max. VIH =V DDQ +0.3V
VIH
VSS
VSS- 1.0V
20% tCYC (MIN)
TEST CONDITIONS
(V DD=3.3V+0.165V/-0.165V,VDDQ =3.3V+0.165/-0.165V or VDD=3.3V+0.165V/-0.165V,VDDQ =2.5V+0.4V/-0.125V, TA=0to70°C)
PARAMETER
VALUE
Input Pulse Level(for 3.3V I/O)
0 to 3.0V
Input Pulse Level(for 2.5V I/O)
0 to 2.5V
Input Rise and Fall Time(Measured at 20% to 80% for 3.3V I/O)
1.0V/ns
Input Rise and Fall Time(Measured at 20% to 80% for 2.5V I/O)
1.0V/ns
Input and Output Timing Reference Levels for 3.3V I/O
1.5V
Input and Output Timing Reference Levels for 2.5V I/O
V DDQ/2
Output Load
See Fig. 1
* The above parameters are also guaranteed at industrial temperature range.
-9-
Nov. 2003
Rev 2.0
K7B163625A
K7B161825A
512Kx36 & 1Mx18 Synchronous SRAM
Output Load(A)
Output Load(B),
(for tLZC, tLZOE, tHZOE & tHZC)
+3.3V for 3.3V I/O
/+2.5V for 2.5V I/O
RL=50Ω
Dout
Zo=50Ω
30pF*
VL=1.5V for 3.3V I/O
V DDQ/2 for 2.5V I/O
319Ω / 1667Ω
Dout
353Ω / 1538Ω
5pF*
* Including Scope and Jig Capacitance
Fig. 1
AC TIMING CHARACTERISTICS (VDD =3.3V+0.165V/-0.165V, TA=0°C to +70°C)
-75
PARAMETER
SYMBOL
-85
MIN
MAX
MIN
MAX
UNIT
Cycle Time
tCYC
8.5
-
10
-
ns
Clock Access Time
tCD
-
7.5
-
8.5
ns
Output Enable to Data Valid
tOE
-
3.5
-
4.0
ns
Clock High to Output Low-Z
tLZC
2.5
-
2.5
-
ns
Output Hold from Clock High
tOH
2.5
-
2.5
-
ns
Output Enable Low to Output Low-Z
tLZOE
0
-
0
-
ns
Output Enable High to Output High-Z
tHZOE
-
3.5
-
4.0
ns
Clock High to Output High-Z
tHZC
-
4.0
-
5.0
ns
Clock High Pulse Width
tCH
2.5
-
3.0
-
ns
Clock Low Pulse Width
tCL
2.5
-
3.0
-
ns
Address Setup to Clock High
tAS
2.0
-
2.0
-
ns
Address Status Setup to Clock High
tSS
2.0
-
2.0
-
ns
Data Setup to Clock High
tDS
2.0
-
2.0
-
ns
Write Setup to Clock High (GW , BW , WE X)
tWS
2.0
-
2.0
-
ns
Address Advance Setup to Clock High
tADVS
2.0
-
2.0
-
ns
Chip Select Setup to Clock High
tCSS
2.0
-
2.0
-
ns
Address Hold from Clock High
tAH
0.5
-
0.5
-
ns
Address Status Hold from Clock High
tSH
0.5
-
0.5
-
ns
Data Hold from Clock High
tDH
0.5
-
0.5
-
ns
Write Hold from Clock High (G W, BW, WE X )
tWH
0.5
-
0.5
-
ns
Address Advance Hold from Clock High
tADVH
0.5
-
0.5
-
ns
Chip Select Hold from Clock High
tCSH
0.5
-
0.5
-
ns
ZZ High to Power Down
tPDS
2
-
2
-
cycle
ZZ Low to Power Up
tPUS
2
-
2
-
cycle
Notes : 1. The above parameters are also guaranteed at industrial temperature range.
2. All address inputs must meet the specified setup and hold times for all rising clock edges whenever ADSC and/or ADSP is sampled low and CS
is sampled low. All other synchronous inputs must meet the specified setup and hold times whenever this device is chip selected.
3. Both chip selects must be active whenever ADSC or ADSP is sampled low in order for the this device to remain enabled.
4. ADSC or ADSP must not be asserted for at least 2 Clock after leaving ZZ state.
- 10 -
Nov. 2003
Rev 2.0
- 11 -
Data Out
OE
ADV
CS
WRITE
ADDRESS
ADSC
ADSP
CLOCK
tCSS
tAS
tSS
tOE
Q1-1
tHZOE
tADVH
tWH
tSS
A2
tSH
Q2-1
tCD
tOH
Q2-2
CS = L means CS1 = L, CS2 = H and CS 2 = L
CS = H mean s CS1 = H, or CS1 = L and CS2 = H, or CS1 = L , and CS2 = L
Q 2-3
A3
Q2-4
(ADV INSERTS WAIT STATE)
BURST CONTINUED WITH
NEW BASE ADDRESS
tCYC
tCL
NOTES : WRITE = L mea ns GW = L, or GW = H, B W = L, WEx.= L
tADVS
tCSH
tWS
tLZOE
A1
tAH
tSH
tCH
TIMING WAVEFORM OF READ CYCLE
Q3-1
Q 3-2
Q3-3
Undefined
Don′t Care
Q3-4
tHZC
K7B163625A
K7B161825A
512Kx36 & 1Mx18 Synchronous SRAM
Nov. 2003
Rev 2.0
- 12 -
Data Out
Data In
OE
ADV
CS
WRITE
ADDRESS
ADSC
ADSP
CLOCK
Q0-3
tCSS
tAS
tSS
Q 0-4
A1
tLZOE
tCSH
tAH
tSH
D1-1
tCH
tCYC
tCL
A2
D2-1
D2-2
(ADV SUSPENDS BURST)
D2-2
D2-3
(ADSC EXTENDED BURST)
TIMING WAVEFORM OF WRTE CYCLE
D2-4
D3-1
A3
tDS
tADVS
tWS
tSS
D3-2
tDH
tADVH
tWH
tSH
D3-3
Unde fine d
Don′t Care
D3-4
K7B163625A
K7B161825A
512Kx36 & 1Mx18 Synchronous SRAM
Nov. 2003
Rev 2.0
- 13 -
Data Out
Data In
OE
ADV
CS
WRITE
ADDRESS
ADSP
CLOCK
tHZC
tSS
A1
tLZC
tCD
tSH
Q1-1
tHZOE
tAS
A2
tCL
tCYC
tDS
tADVS
tWS
tAH
tCH
D2-1
tDH
tADVH
tWH
A3
tLZOE
tOE
Q3-1
Q 3-2
Q3-3
tOH
Q3-4
TIMING WAVEFORM OF COMBINATION READ/WRTE CYCLE(ADSP CONTROLLED, ADSC=HIGH)
Unde fine d
Don′t Care
K7B163625A
K7B161825A
512Kx36 & 1Mx18 Synchronous SRAM
Nov. 2003
Rev 2.0
- 14 -
Data In
Data Out
OE
ADV
CS
WRITE
ADDRESS
ADSC
CLOCK
tCSS
tSS
A1
tLZOE
tOE
tCSH
tSH
Q1-1
A2
Q 2-1
A3
Q3-1
A4
Q4-1
tHZOE
D5-1
A5
tDS
tWS
D6-1
A6
tDH
tWH
D7-1
A7
tWS
tCD
A8
A9
Q8-1
tCL
tCYC
tWH
tCH
TIMING WAVEFORM OF SINGLE READ/WRITE CYCLE(ADSC CONTROLLED, ADSP=HIGH)
Unde fine d
Don′t Care
Q9-1
tOH
K7B163625A
K7B161825A
512Kx36 & 1Mx18 Synchronous SRAM
Nov. 2003
Rev 2.0
- 15 -
Data In
Data Out
OE
ADV
CS
WRITE
ADDRESS
ADSP
CLOCK
tCSS
tSS
t OE
tCSH
tL ZOE
A1
tSH
Q1-1
A2
Q2-1
A3
tAS
Q 3-1
A4
tAH
tCYC
tCH
Q4-1
A5
tCL
tHZOE
D5-1
A6
tDS
D6-1
tDH
A7
D7-1
tCD
A8
Q8-1
A9
TIMING WAVEFORM OF SINGLE READ/WRITE CYCLE(ADSP CONTROLLED, ADSC=HIGH)
Q9-1
tOH
Unde fine d
Don′t Care
K7B163625A
K7B161825A
512Kx36 & 1Mx18 Synchronous SRAM
Nov. 2003
Rev 2.0
- 16 -
ZZ
Data Out
Data In
OE
ADV
CS
WRITE
ADDRESS
ADSC
ADSP
CLOCK
tCSS
tAS
tSS
A1
tLZOE
tOE
tCSH
tAH
tSH
Q1-1
ZZ Setup Cycle
tPDS
tHZC
Sleep State
ZZ Recovery Cycle
tPUS
tCL
tCYC
tCH
TIMING WAVEFORM OF POWER DOWN CYCLE
tWS
Normal Operation Mode
tHZOE
A2
D2-1
tWH
Unde fine d
Don′t Care
D2-2
K7B163625A
K7B161825A
512Kx36 & 1Mx18 Synchronous SRAM
Nov. 2003
Rev 2.0
K7B163625A
K7B161825A
512Kx36 & 1Mx18 Synchronous SRAM
APPLICATION INFORMATION
DEPTH EXPANSION
The Samsung 512Kx36 Synchronous Burst SRAM has two additional chip selects for simple depth expansion.
This permits easy secondary cache upgrades from 512K depth to 1M depth without extra logic.
I/O[0:71]
Data
Address
A[0:19]
A[19]
A[0:18]
A[19]
A[0:18]
Address Data
CLK
CS2
CS2
CS2
CLK
Microprocessor
Address
ADSC
CLK
Address Data
CS2
512Kx36
SB
SRAM
CLK
ADSC
WEx
OE
Cache
Controller
WEx
(Bank 0)
(Bank 1)
OE
CS1
CS1
ADV
512Kx36
SB
SRAM
ADSP
ADV
ADSP
ADS
INTERLEAVE READ TIMING (Refer to non-interleave write timing for interleave write timing)
(ADSP CONTROLLED , ADSC=HIGH)
CLOCK
tSS
tSH
ADSP
tAS
ADDRESS
[0:n]
tAH
A1
A2
tWS
tWH
WRITE
tCSS
tCSH
CS1
Bank 0 is selected by CS 2, and Bank 1 deselected by CS2
An+1
tADVS
Bank 0 is deselected by CS2, and Bank 1 selected by CS2
tADVH
ADV
OE
tOE
Data Out
(Bank 0)
Data Out
(Bank 1)
tLZOE
tHZC
Q1-1
Q1-2
Q1-3
Q1-4
tCD
tLZC
Q2-1
*Notes : n = 14 32K depth ,
16 128K depth ,
18 512K depth ,
15 64K depth
17 256K depth
19 1M depth
Q2-2
Q2-3
Q2-4
Don′t Care
- 17 -
Undefined
Nov. 2003
Rev 2.0
K7B163625A
K7B161825A
512Kx36 & 1Mx18 Synchronous SRAM
APPLICATION INFORMATION
DEPTH EXPANSION
The Samsung 1Mx18 Synchronous Burst SRAM has two additional chip selects for simple depth expansion.
This permits easy secondary cache upgrades from 1M depth to 2M depth without extra logic.
I/O[0:71]
Data
Address
A[20]
A[0:20]
A[20]
A[0:19]
Address Data
CLK
Address Data
CS2
CS2
CS2
Microprocessor
CLK
Address
ADSC
CLK
CS2
1Mx18
SB
SRAM
CLK
ADSC
WEx
OE
OE
CS1
ADV
1Mx18
SB
SRAM
WEx
(Bank 0)
Cache
Controller
A[0:19]
(Bank 1)
CS1
ADSP
ADV
ADSP
ADS
INTERLEAVE READ TIMING (Refer to non-interleave write timing for interleave write timing)
(ADSP CONTROLLED , ADSC=HIGH)
CLOCK
tSS
tSH
ADSP
tAS
ADDRESS
[0:n]
tAH
A1
A2
tWS
tWH
WRITE
tCSS
tCSH
CS1
Bank 0 is selected by CS 2, and Bank 1 deselected by CS2
An+1
tADVS
Bank 0 is deselected by CS2, and Bank 1 selected by CS2
tADVH
ADV
OE
tOE
Data Out
(Bank 0)
Data Out
(Bank 1)
tLZOE
tHZC
Q1-1
Q1-2
Q1-3
Q1-4
tCD
tLZC
Q2-1
*Notes : n = 14
16
18
20
32K depth ,
128K depth ,
512K depth ,
2M depth
15 64K depth
17 256K depth
19 1M depth
Q2-2
Q2-3
Q2-4
Don′t Care
- 18 -
Undefined
Nov. 2003
Rev 2.0
K7B163625A
K7B161825A
512Kx36 & 1Mx18 Synchronous SRAM
PACKAGE DIMENSIONS
100-TQFP-1420A
Units ; millimeters/Inches
22.00
±0.30
20.00
±0.20
0~8°
0.10
0.127 +- 0.05
16.00
± 0.30
14.00 ± 0.20
0.10 MAX
(0.83)
0.50
#1
0.65
±0.10
(0.58)
0.30 ±0.10
0.10 MAX
1.40
0.50 ± 0.10
- 19 -
± 0.10
1.60 MAX
0.05 MIN
Nov. 2003
Rev 2.0