FOD3150 High Noise Immunity, 1.0A Output Current, Gate Drive Optocoupler Features Description ■ High noise immunity characterized by 20kV/µs The FOD3150 is a 1.0A Output Current Gate Drive Optocoupler, capable of driving most 800V/20A IGBT/MOSFET. It is ideally suited for fast switching driving of power IGBT and MOSFETs used in motor control inverter applications, and high performance power system. ■ ■ ■ ■ ■ ■ ■ minimum common mode rejection Use of P-channel MOSFETs at output stage enables output voltage swing close to the supply rail Wide supply voltage range from 15V to 30V Fast switching speed – 500ns max. propagation delay – 300ns max. pulse width distortion Under Voltage LockOut (UVLO) with hysteresis Extended industrial temperate range, -40°C to 100°C temperature range Safety and regulatory approvals – UL1577, 5000 VRMS for 1 min. – IEC60747-5-2 >8.0mm clearance and creepage distance (option ‘T’) Applications ■ ■ ■ ■ It utilizes Fairchild’s patented coplanar packaging technology, Optoplanar®, and optimized IC design to achieve high noise immunity, characterized by high common mode rejection. It consists of a gallium aluminum arsenide (AlGaAs) light emitting diode optically coupled to an integrated circuit with a high-speed driver for push-pull MOSFET output stage. Related Resources Industrial inverter Uninterruptible power supply Induction heating Isolated IGBT/Power MOSFET gate drive ■ FOD3120, 2.5A Output Current, Gate Drive Optocoupler Datasheet ■ www.fairchildsemi.com/products/opto/ Functional Block Diagram Package Outlines NC 1 8 VCC ANODE 2 7 VO2 8 1 CATHODE 3 6 VO1 NC 4 5 VEE Note: A 0.1µF bypass capacitor must be connected between pins 5 and 8. ©2008 Fairchild Semiconductor Corporation FOD3150 Rev. 1.0.4 8 8 1 1 www.fairchildsemi.com FOD3150 — High Noise Immunity, 1.0A Output Current, Gate Drive Optocoupler October 2011 LED VCC – VEE “Positive Going” (Turn-on) VCC – VEE “Negative Going” (Turn-off) VO Off 0V to 30V 0V to 30V Low On 0V to 11V 0V to 9.5V Low On 11V to 13.5V 9.5V to 12V Transition On 13.5V to 30V 12V to 30V High Pin Definitions Pin # Name Description 1 NC 2 Anode Not Connected 3 Cathode 4 NC Not Connected LED Anode LED Cathode 5 VEE Negative Supply Voltage 6 VO2 Output Voltage 2 (internally connected to VO1) 7 VO1 Output Voltage 1 8 VCC Positive Supply Voltage ©2008 Fairchild Semiconductor Corporation FOD3150 Rev. 1.0.4 www.fairchildsemi.com 2 FOD3150 — High Noise Immunity, 1.0A Output Current, Gate Drive Optocoupler Truth Table As per IEC 60747-5-2. This optocoupler is suitable for “safe electrical insulation” only within the safety limit data. Compliance with the safety ratings shall be ensured by means of protective circuits. Symbol Parameter Min. Typ. Max. Unit Installation Classifications per DIN VDE 0110/1.89 Table 1 For Rated Main Voltage < 150Vrms I–IV For Rated Main Voltage < 300Vrms I–IV For Rated Main Voltage < 450Vrms I–III For Rated Main Voltage < 600Vrms I–III Climatic Classification 55/100/21 Pollution Degree (DIN VDE 0110/1.89) 2 CTI Comparative Tracking Index 175 VPR Input to Output Test Voltage, Method b, VIORM x 1.875 = VPR, 100% Production Test with tm = 1 sec., Partial Discharge < 5pC 1669 Input to Output Test Voltage, Method a, VIORM x 1.5 = VPR, Type and Sample Test with tm = 60 sec.,Partial Discharge < 5 pC 1335 VIORM Max Working Insulation Voltage 890 Vpeak VIOTM Highest Allowable Over Voltage 6000 Vpeak 8 mm External Creepage External Clearance 7.4 mm 10.16 mm 0.5 mm Case Temperature 150 °C Input Current 25 mA Output Power (Duty Factor ≤ 2.7%) 250 mW 109 Ω External Clearance (for Option T-0.4” Lead Spacing) Insulation Thickness Safety Limit Values – Maximum Values Allowed in the Event of a Failure TCase IS,INPUT PS,OUTPUT RIO Insulation Resistance at TS, VIO = 500V ©2008 Fairchild Semiconductor Corporation FOD3150 Rev. 1.0.4 www.fairchildsemi.com 3 FOD3150 — High Noise Immunity, 1.0A Output Current, Gate Drive Optocoupler Safety and Insulation Ratings Symbol Value Units TSTG Storage Temperature Parameter -55 to +125 ºC TOPR Operating Temperature -40 to +100 ºC Junction Temperature -40 to +125 ºC 260 for 10sec ºC TJ TSOL Lead Wave Solder Temperature (refer to page 19 for reflow solder profile) IF(AVG) Average Input Current 25 mA VR Reverse Input Voltage 5 V IO(PEAK) Current(1) Peak Output VCC – VEE Supply Voltage Peak Output Voltage VO(PEAK) tR(IN), tF(IN) 1.5 A 0 to 35 V 0 to VCC V 500 ns 45 mW 250 mW Input Signal Rise and Fall Time Dissipation(2)(4) PDI Input Power PDO Output Power Dissipation(3)(4) Recommended Operating Conditions The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not recommend exceeding them or designing to absolute maximum ratings. Symbol Parameter TA Ambient Operating Temperature Value Units -40 to +100 °C Power Supply 15 to 30 V IF(ON) Input Current (ON) 7 to 16 mA VF(OFF) Input Voltage (OFF) 0 to 0.8 V VCC – VEE Isolation Characteristics Apply over all recommended conditions, typical value is measured at TA = 25ºC Symbol Parameter Conditions VISO Input-Output Isolation Voltage TA = 25ºC, R.H.< 50%, t = 1.0min, II-O ≤ 10µA, 50Hz(5)(6) RISO Isolation Resistance VI-O = 500V(5) CISO Isolation Capacitance ©2008 Fairchild Semiconductor Corporation FOD3150 Rev. 1.0.4 VI-O = 0V, Freq = 1.0MHz(5) Min. Typ. 5000 Max. Units VRMS 1011 Ω 1 pF www.fairchildsemi.com 4 FOD3150 — High Noise Immunity, 1.0A Output Current, Gate Drive Optocoupler Absolute Maximum Ratings (TA = 25ºC unless otherwise specified) Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be operable above the recommended operating conditions and stressing the parts to these levels is not recommended. In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability. The absolute maximum ratings are stress ratings only. Symbol VF Parameter Input Forward Voltage Conditions IF = 10mA Min. 1.2 ∆(VF / TA) Temperature Coefficient of Forward Voltage Input Reverse Breakdown Voltage IR = 10µA CIN Input Capacitance f = 1MHz, VF = 0V IOH High Level Output Max. 1.5 1.8 mV/ºC 5 0.2 VO = VCC – 4V 1.0 VO = VCC + 0.75V 0.2 IOL Low Level Output Current(1) VOH High Level Output Voltage VOL Low Level Output Voltage ICCH High Level Supply Current VO = Open, IF = 7 to 16mA ICCL Low Level Supply Current IFLH VO = VCC + 4V V 60 VO = VCC – 0.75V Units V -1.8 BVR Current(1) Typ. pF A A 1.0 IF = 10mA, IO = -1A IF = 10mA, IO = -100mA VCC – 4V VCC – 6V VCC – 0.5V VCC – 0.1V IF = 0mA, IO = 1A V VEE + 6V VEE + 4V VEE + 0.1V VEE + 0.5V 2.8 5 mA VO = Open, VF = 0 to 0.8V 2.8 5 mA Threshold Input Current Low to High IO = 0mA, VO > 5V 2.3 5.0 mA VFHL Threshold Input Voltage High to Low IO = 0mA, VO < 5V VUVLO+ Under Voltage Lockout Threshold IF = 0mA, IO = 100mA VUVLO– V IF = 10mA, VO > 5V 11 12.7 13.5 V IF = 10mA, VO < 5V 9.5 11.2 12.0 V UVLOHYS Under Voltage Lockout Threshold Hysteresis ©2008 Fairchild Semiconductor Corporation FOD3150 Rev. 1.0.4 0.8 V 1.5 V www.fairchildsemi.com 5 FOD3150 — High Noise Immunity, 1.0A Output Current, Gate Drive Optocoupler Electrical Characteristics Apply over all recommended conditions, typical value is measured at VCC = 30V, VEE = Ground, TA = 25°C unless otherwise specified. Apply over all recommended conditions, typical value is measured at VCC = 30V, VEE = Ground, TA = 25°C unless otherwise specified. Symbol tPHL tPLH Parameter Conditions Propagation Delay Time to Logic IF = 7mA to 16mA, Low Output Rg = 20Ω, Cg =10nF, Propagation Delay Time to Logic f = 10kHz, Duty Cycle = 50% Min. Typ. Max. Units 100 275 500 ns 100 255 500 ns 20 300 ns 350 ns High Output PWD PDD (Skew) Pulse Width Distortion, | tPHL – tPLH | -350 Propagation Delay Difference Between Any Two Parts or Channels, (tPHL – tPLH)(7) tr Output Rise Time (10% – 90%) tf Output Fall Time (90% – 10%) 60 ns 60 ns tUVLO ON UVLO Turn On Delay IF = 10mA , VO > 5V 1.6 µs tUVLO OFF UVLO Turn Off Delay IF = 10mA , VO < 5V 0.4 µs | CMH | Common Mode Transient Immunity at Output High TA = 25°C, VCC = 30V, IF = 7 to 16mA, VCM = 2000V(8) 20 50 kV/µs | CML | Common Mode Transient Immunity at Output Low TA = 25°C, VCC = 30V, VF = 0V, VCM = 2000V(9) 20 50 kV/µs Notes: 1. Maximum pulse width = 10µs, maximum duty cycle = 0.2% 2. Derate linearly above 87°C, free air temperature at a rate of 0.77mW/°C 3. No derating required across temperature range. 4. Functional operation under these conditions is not implied. Permanent damage may occur if the device is subjected to conditions outside these ratings. 5. Device is considered a two terminal device: Pins 2 and 3 are shorted together and Pins 5, 6, 7 and 8 are shorted together. 6. 5,000 VRMS for 1 minute duration is equivalent to 6,000 VACRMS for 1 second duration. 7. The difference between tPHL and tPLH between any two FOD3150 parts under same test conditions. 8. Common mode transient immunity at output high is the maximum tolerable negative dVcm/dt on the trailing edge of the common mode impulse signal, Vcm, to assure that the output will remain high (i.e. VO > 15.0V). 9. Common mode transient immunity at output low is the maximum tolerable positive dVcm/dt on the leading edge of the common pulse signal, Vcm, to assure that the output will remain low (i.e. VO < 1.0V). ©2008 Fairchild Semiconductor Corporation FOD3150 Rev. 1.0.4 www.fairchildsemi.com 6 FOD3150 — High Noise Immunity, 1.0A Output Current, Gate Drive Optocoupler Switching Characteristics Fig. 2 Output High Voltage Drop vs. Ambient Temperature 0.5 (VO H- VCC) - HIGH OUTPUT VOLTAGE DROP (V) (V OH - VCC) - OUTPUT HIGH VOLTAGE DROP (V) Fig. 1 Output High Voltage Drop vs. Output High Current Frequency = 250Hz Duty Cycle = 0.1% IF = 7 to 16mA VCC = 15 to 30V VEE = 0V 0.0 -0.5 TA = -40°C -1.0 TA = 25°C TA = 100°C -1.5 -2.0 0.00 0.25 0.50 0.75 1.00 1.25 1.50 0. 00 -0. 15 -0. 20 -0. 25 -0. 30 -40 0 20 40 60 80 100 Fig. 4 Output Low Voltage vs. Ambient Temperature Fig. 3 Output Low Voltage vs. Output Low Current 0.2 5 VOL - OUTPUT LOW VOLTAGE (V) T A = 100°C TA = 25°C 1.0 T A = -40°C 0.5 VCC = 15 V to 30V VE E = 0V VF(OFF) = -3V to 0.8V I O = 100 mA 0.2 0 0.1 5 0.1 0 0.0 5 0.0 0 0.0 0.00 0.25 0.50 0.75 1.00 1.25 -40 1.50 -2 0 0 20 40 60 80 100 TA - AMBIENT TEMPERATURE (°C) IOL - OUTPUT LOW CURRENT (A) Fig. 5 Supply Current vs. Ambient Temperature Fig. 6 Supply Current vs. Supply Voltage 3.6 3.6 ICC - SUPPLY CURRENT (mA) VCC = 30V VEE = 0V IF = 0mA (for ICCL ) IF = 10mA (for ICCH ) 3.4 ICC - SUPPLY CURRENT (mA) -20 TA - AMBIENT TEMPERATURE (°C) 2.0 VOL - OUTPUT LOW VOLTAGE (V) IF = 7mA to 16mA IO = -100mA -0. 10 IOH - OUTPUT HIGH CURRENT (A) Frequency = 250Hz Duty Cycle = 99.9% VF (OF F) = -3.0V to 0.8V VCC = 15V to 30V 1.5 VEE = 0V VCC = 15V to 30V VE E = 0V -0. 05 3.2 3.0 ICCH 2.8 ICCL 2.6 IF = 10mA (for ICCH ) IF = 0mA (for ICCL ) VEE = 0 , T A =25 °C 3.2 2.8 ICCH ICCL 2.4 2.4 2.0 2.2 -40 -20 0 20 40 60 80 100 15 TA - AMBIENT TEMPEATURE (°C) ©2008 Fairchild Semiconductor Corporation FOD3150 Rev. 1.0.4 20 25 30 VCC - SUPPLY VOLTAGE (V) www.fairchildsemi.com 7 FOD3150 — High Noise Immunity, 1.0A Output Current, Gate Drive Optocoupler Typical Performance Curves Fig. 8 Propagation Delay vs. Supply Voltage 400 4.0 VCC = 15V to 30V VEE = 0V Output = Open 3.5 tP – PROPAGATION DELAY (ns) IFLH - LOW TO HIGH CURRENT THRESHOLD (mA) Fig. 7 Low to High Input Current Threshold vs. Ambient Temperature 3.0 2.5 2.0 1.5 IF = 10mA TA = 25 °C Rg = 20Ω, Cg = 10nF DUTY CYCLE = 50% f = 10 kHz 350 300 tPHL 250 tPLH 200 150 100 1.0 -40 -20 0 20 40 60 80 15 100 18 21 500 300 tP – PROPAGATION DELAY (ns) tP – PROPAGATION DELAY (ns) V CC = 30V, VEE = 0V Rg = 20Ω, Cg = 10nF T A = 25°C DU TY CYCLE = 50% f = 10 kHz 400 tPHL tPLH 200 8 10 12 14 400 300 tPHL tPLH 200 16 Fig. 11 Propagation Delay vs. Series Load Resistance Cg = 10nF TA = 25°C DUTY CYCLE = 50% f = 10 kHz tP – PROPAGATION DELAY (ns) tP – PROPAGATION DELAY (ns) 0 20 40 60 80 100 Fig. 12 Propagation Delay vs. Load Capacitance 500 IF = 10mA V CC = 30V, V EE = 0V 400 -20 T A – AMBIENT TEMPERATURE (°C) IF – FORWARD LED CURRENT (mA) 500 30 IF = 10mA V CC = 30V, V EE = 0V Rg = 20Ω, Cg = 10 nF DUTY CYCLE = 50% f = 10 kHz 100 -40 100 6 27 Fig. 10 Propagation Delay vs. Ambient Temperature Fig. 9 Propagation Delay vs. LED Forward Current 500 24 VCC – SUPPLY VOLTAGE (V) T A - AMBIENT TEMPERATURE (°C) 300 tPHL tPLH 200 100 IF = 10mA V CC = 30V, V EE = 0V Rg = 20Ω TA = 25°C DUTY C YCLE = 50% f = 10 kHz 400 300 t PHL t PLH 200 100 0 10 20 30 40 50 0 Rg - SERIES LOAD RESISTANCE (Ω) ©2008 Fairchild Semiconductor Corporation FOD3150 Rev. 1.0.4 20 40 60 80 100 C g - LOAD CAPACITANCE (nF) www.fairchildsemi.com 8 FOD3150 — High Noise Immunity, 1.0A Output Current, Gate Drive Optocoupler Typical Performance Curves (Continued) Fig. 13 Transfer Characteristics 35 Fig. 14 Input Forward Current vs. Forward Voltage TA = 25°C 1 00 VCC = 30V IF - FORWARD CURRENT (mA) 25 20 15 O V – OUTPUT VOLTAGE (V) 30 10 10 TA = 100 °C 1 T A = -4 0°C 0 .1 TA = 25°C 0. 01 5 0.0 01 0 0 .6 0 1 2 3 4 I – FORWARD LED CURRENT (mA) 0. 8 5 1.0 1.2 1.4 1.6 1.8 VF - FORWARD VOLTAGE (V) F Fig. 15 Under Voltage Lockout 14 (12.75, 12.80) 12 8 6 O V – OUTPUT VOLTAGE (V) (11.25, 11.30) 10 4 2 (11.20, 0.00) 0 0 5 10 (12.70, 0.00) 15 20 (VCC - V EE ) – SUPPLY VOLT AGE (V) ©2008 Fairchild Semiconductor Corporation FOD3150 Rev. 1.0.4 www.fairchildsemi.com 9 FOD3150 — High Noise Immunity, 1.0A Output Current, Gate Drive Optocoupler Typical Performance Curves (Continued) Power Supply + + C1 0.1µF VCC = 15V to 30V C2 47µF Pulse Generator PW = 4.99ms Period = 5ms ROUT = 50Ω 1 8 2 7 3 6 Pulse-In Iol R2 100Ω D1 VOL LED-IFmon 4 Power Supply + + C3 0.1µF V = 4V C4 47µF 5 R1 100Ω To Scope Test Conditions: Frequency = 200Hz Duty Cycle = 99.8% VCC = 15V to 30V VEE = 0V VF(OFF) = -3.0V to 0.8V Figure 20. IOL Test Circuit Power Supply + + C1 0.1µF VCC = 15V to 30V C2 47µF Pulse Generator PW = 10µs Period = 5ms ROUT = 50Ω 1 8 2 7 Pulse-In + + C3 0.1µF Ioh R2 100Ω 3 6 4 5 Power Supply V = 4V – VOH LED-IFmon C4 47µF D1 Current Probe To Scope R1 100Ω Test Conditions: Frequency = 200Hz Duty Cycle = 0.2% VCC = 15V to 30V VEE = 0V IF = 7mA to 16mA Figure 21. IOH Test Circuit ©2008 Fairchild Semiconductor Corporation FOD3150 Rev. 1.0.4 www.fairchildsemi.com 10 FOD3150 — High Noise Immunity, 1.0A Output Current, Gate Drive Optocoupler Test Circuit 1 8 2 7 0.1µF + – IF = 7 to 16mA VO 6 3 VCC = 15 to 30V 100mA 4 5 Figure 22. VOH Test Circuit 1 8 2 7 100mA + – 0.1µF 3 6 4 5 VCC = 15 to 30V VO Figure 23. VOL Test Circuit ©2008 Fairchild Semiconductor Corporation FOD3150 Rev. 1.0.4 www.fairchildsemi.com 11 FOD3150 — High Noise Immunity, 1.0A Output Current, Gate Drive Optocoupler Test Circuit (Continued) FOD3150 — High Noise Immunity, 1.0A Output Current, Gate Drive Optocoupler Test Circuit (Continued) 1 8 2 7 0.1µF IF = 7 to 16mA 3 6 4 5 + – VCC = 30V + – VCC = 30V VO Figure 24. ICCH Test Circuit + – 1 8 2 7 0.1µF VF = 0 to 0.8V 3 6 4 5 VO Figure 25. ICCL Test Circuit ©2008 Fairchild Semiconductor Corporation FOD3150 Rev. 1.0.4 www.fairchildsemi.com 12 IF 1 8 2 7 3 6 4 5 0.1µF + – VCC = 15 to 30V + – VCC = 15 to 30V VO > 5V Figure 26. IFLH Test Circuit + – 1 8 2 7 0.1µF VF = 0 to 0.8V 3 6 4 5 VO Figure 27. VFHL Test Circuit 1 8 2 7 0.1µF + – IF = 10mA 3 6 4 5 VO = 5V 15V or 30V VCC Ramp Figure 28. UVLO Test Circuit ©2008 Fairchild Semiconductor Corporation FOD3150 Rev. 1.0.4 www.fairchildsemi.com 13 FOD3150 — High Noise Immunity, 1.0A Output Current, Gate Drive Optocoupler Test Circuit (Continued) FOD3150 — High Noise Immunity, 1.0A Output Current, Gate Drive Optocoupler Test Circuit (Continued) 1 8 0.1µF 2 + – Probe F = 10kHz DC = 50% 7 3 6 4 5 VO + – VCC = 15 to 30V Rg = 20Ω Cg = 10nF 50Ω IF tr tf 90% 50% VOUT 10% tPLH tPHL Figure 29. tPHL, tPLH, tR and tF Test Circuit and Waveforms IF 1 8 2 7 A 0.1µF + – B 5V + – 3 6 4 5 VCC = 30V VO +– VCM = 2,000V VCM 0V ∆t VO VOH Switch at A: IF = 10mA VO VOL Switch at B: IF = 0mA Figure 30. CMR Test Circuit and Waveforms ©2008 Fairchild Semiconductor Corporation FOD3150 Rev. 1.0.4 www.fairchildsemi.com 14 Through Hole 0.4" Lead Spacing PIN 1 ID. 4 3 2 PIN 1 ID. 1 4 3 2 1 0.270 (6.86) 0.250 (6.35) 5 6 7 0.270 (6.86) 0.250 (6.35) 8 5 6 0.070 (1.78) 0.045 (1.14) 0.020 (0.51) MIN 0.200 (5.08) 0.140 (3.55) 0.154 (3.90) 0.120 (3.05) 0.022 (0.56) 0.016 (0.41) 7 8 0.390 (9.91) 0.370 (9.40) SEATING PLANE SEATING PLANE 0.390 (9.91) 0.370 (9.40) 0.016 (0.40) 0.008 (0.20) 0.100 (2.54) TYP 0.070 (1.78) 0.045 (1.14) 0.004 (0.10) MIN 0.200 (5.08) 0.140 (3.55) 15° MAX 0.154 (3.90) 0.120 (3.05) 0.300 (7.62) TYP 0.022 (0.56) 0.016 (0.41) 0.016 (0.40) 0.008 (0.20) 0.100 (2.54) TYP Surface Mount 0° to 15° 0.400 (10.16) TYP 8-Pin DIP – Land Pattern 0.390 (9.91) 0.370 (9.40) 4 3 2 1 0.070 (1.78) PIN 1 ID. 0.060 (1.52) 0.270 (6.86) 0.250 (6.35) 5 6 7 0.100 (2.54) 8 0.295 (7.49) 0.070 (1.78) 0.045 (1.14) 0.020 (0.51) MIN 0.022 (0.56) 0.016 (0.41) 0.100 (2.54) TYP Lead Coplanarity : 0.004 (0.10) MAX 0.415 (10.54) 0.300 (7.62) TYP 0.030 (0.76) 0.016 (0.41) 0.008 (0.20) 0.045 [1.14] 0.315 (8.00) MIN 0.405 (10.30) MAX. Note: All dimensions are in inches (millimeters) Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specifically the warranty therein, which covers Fairchild products. Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings: http://www.fairchildsemi.com/packaging/ ©2008 Fairchild Semiconductor Corporation FOD3150 Rev. 1.0.4 www.fairchildsemi.com 15 FOD3150 — High Noise Immunity, 1.0A Output Current, Gate Drive Optocoupler Package Dimensions Part Number Package Packing Method FOD3150 DIP 8-Pin Tube (50 units per tube) FOD3150S SMT 8-Pin (Lead Bend) Tube (50 units per tube) FOD3150SD SMT 8-Pin (Lead Bend) Tape and Reel (1,000 units per reel) FOD3150V DIP 8-Pin, IEC60747-5-2 option Tube (50 units per tube) FOD3150SV SMT 8-Pin (Lead Bend), IEC60747-5-2 option Tube (50 units per tube) FOD3150SDV SMT 8-Pin (Lead Bend), IEC60747-5-2 option Tape and Reel (1,000 units per reel) FOD3150T DIP 8-Pin, 0.4” Lead Spacing Tube (50 units per tube) FOD3150TV DIP 8-Pin, 0.4” Lead Spacing , IEC60747-5-2 option Tube (50 units per tube) Marking Information 1 3150 V XX YY B 3 2 6 5 4 Definitions 1 Fairchild logo 2 Device number 3 IEC60747-5-2 Option (only appears on component ordered with this option) 4 Two digit year code, e.g., ‘08’ 5 Two digit work week ranging from ‘01’ to ‘53’ 6 Assembly package code ©2008 Fairchild Semiconductor Corporation FOD3150 Rev. 1.0.4 www.fairchildsemi.com 16 FOD3150 — High Noise Immunity, 1.0A Output Current, Gate Drive Optocoupler Ordering Information D0 P0 t K0 P2 E F A0 W1 d t P User Direction of Feed Symbol W W B0 Description D1 Dimension in mm Tape Width 16.0 ± 0.3 Tape Thickness 0.30 ± 0.05 P0 Sprocket Hole Pitch 4.0 ± 0.1 D0 Sprocket Hole Diameter 1.55 ± 0.05 E Sprocket Hole Location 1.75 ± 0.10 F Pocket Location 7.5 ± 0.1 2.0 ± 0.1 P2 P Pocket Pitch A0 Pocket Dimensions 12.0 ± 0.1 10.30 ±0.20 B0 10.30 ±0.20 K0 4.90 ±0.20 W1 d R ©2008 Fairchild Semiconductor Corporation FOD3150 Rev. 1.0.4 Cover Tape Width 13.2 ± 0.2 Cover Tape Thickness 0.1 max Max. Component Rotation or Tilt 10° Min. Bending Radius 30 www.fairchildsemi.com 17 FOD3150 — High Noise Immunity, 1.0A Output Current, Gate Drive Optocoupler Carrier Tape Specifications FOD3150 — High Noise Immunity, 1.0A Output Current, Gate Drive Optocoupler Reflow Profile 245 C, 10–30 s Temperature (°C) 300 260 C peak 250 200 150 Time above 183C, <160 sec 100 50 Ramp up = 2–10C/sec 0 0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 Time (Minute) • Peak reflow temperature: 260 C (package surface temperature) • Time of temperature higher than 183 C for 160 seconds or less • One time soldering reflow is recommended ©2008 Fairchild Semiconductor Corporation FOD3150 Rev. 1.0.4 www.fairchildsemi.com 18 FOD3150 — High Noise Immunity, 1.0A Output Current, Gate Drive Optocoupler ©2008 Fairchild Semiconductor Corporation FOD3150 Rev. 1.0.4 www.fairchildsemi.com 19