TI TB5R1D

TB5R1, TB5R2
www.ti.com
SLLS588B – NOVEMBER 2003 – REVISED MAY 2004
QUAD DIFFERENTIAL PECL RECEIVERS
FEATURES
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DESCRIPTION
Functional Replacements for the Agere
BRF1A, BRF2A, BRS2A, and BRS2B
Pin Equivalent to General Trade 26LS32
High Input Impedance Approximately 8 kΩ
4-ns Maximum Propagation Delay
TB5R1 Provides 50-mV Hysteresis
TB5R2 With -125-mV Threshold Offset for
Preferred State Output
-1.1-V to 7.1-V Common Mode Range
Single 5-V ±10% Supply
Slew Rate Limited (1 ns min 80% to 20%)
TB5R2 Output Defaults to Logic 1 When Inputs Left Open or Shorted to VCC or GND
ESD Protection HBM > 3 kV, CDM > 2 kV
Operating Temperature Range: -40°C to 85°C
Available in Gull-Wing SOIC (JEDEC MS-013,
DW) and SOIC (D) Package
APPLICATIONS
•
Digital Data or Clock Transmission Over Balanced Lines
These quad differential receivers accept digital data
over balanced transmission lines. They translate
differential input logic levels to TTL output logic
levels.
The TB5R1 is a pin- and function-compatible replacement for the Agere systems BRF1A and BRF2A; it
includes 3-kV HBM and 2-kV CDM ESD protection.
The TB5R2 is a pin- and function-compatible replacement for the Agere systems BRS2A and BRS2B and
incorporates a 125-mV receiver input offset, preferred
state output, 3-kV HBM and 2-kV CDM ESD protection. The TB5R2 preferred state feature places the
high state when the inputs are open, shorted to
ground, or shorted to the power supply.
The power-down loading characteristics of the receiver input circuit are approximately 8 kΩ relative to
the power supplies; hence they do not load the
transmission line when the circuit is powered down.
The packaging for these differential line receivers
include a 16-pin gull wing SOIC (DW) and SOIC (D).
The enable inputs of this device include internal
pullup resistors of approximately 40 kΩ that are
connected to VCC to ensure a logical high level input
if the inputs are open circuited.
FUNCTIONAL BLOCK DIAGRAM
PIN ASSIGNMENTS
AI
D PACKAGE
(TOP VIEW)
AO
AI
BI
AI
AI
AO
E1
BO
BI
BI
GND
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
VCC
DI
DI
DO
E2
CO
CI
CI
BO
BI
C1
CO
C1
D1
DO
D1
E1
E2
ENABLE TRUTH TABLE
E1
E2
CONDITION
0
0
Active
1
0
Active
0
1
Disabled
1
1
Active
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2003–2004, Texas Instruments Incorporated
TB5R1, TB5R2
www.ti.com
SLLS588B – NOVEMBER 2003 – REVISED MAY 2004
These devices have limited built-in ESD protection. The leads should be shorted together or the device
placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates.
ORDERING INFORMATION
PART NUMBER
PART MARKING
Package
LEAD FINISH
STATUS
TB5R1DW
TB5R1
Gull-Wing SOIC
NiPdAu
Production
TB5R1D
TB5R1
SOIC
NiPdAu
Production
TB5R2DW
TB5R2
Gull-Wing SOIC
NiPdAu
Production
TB5R2D
TB5R2
SOIC
NiPdAu
Production
TB5R1LDW
TB5R1
Gull-Wing SOIC
SnPb
Production
TB5R1LD
TB5R1
SOIC
SnPb
Production
TB5R2LDW
TB5R2
Gull-Wing SOIC
SnPb
Production
TB5R2LD
TB5R2
SOIC
SnPb
Production
POWER DISSIPATION RATINGS
PACKAGE
CIRCUIT BOARD
MODEL
POWER RATINGTA≤
25°C
THERMAL RESISTANCE,JUNCTION-TOAMBIENTWITH NO AIR
FLOW
DERATINGFACT
OR (1)TA≥ 25°C
POWER RATINGTA =
85°C
Low-K (2)
763 mW
131.1°C/W
7.6 mW/°C
305 mW
High-K (3)
1190 mW
84.1°C/W
11.9 mW/°C
475 mW
Low-K (2)
831 mW
120.3°C/W
8.3 mW/°C
332 mW
High-K (3)
1240 mW
80.8°C/W
12.4 mW/°C
494 mW
D
DW
(1)
(2)
(3)
This is the inverse of the junction-to-ambient thermal resistance when board-mounted with no air flow.
In accordance with the low-K thermal metric definitions of EIA/JESD51-3.
In accordance with the high-K thermal metric definitions of EIA/JESD51-7.
THERMAL CHARACTERISTICS
PARAMETER
Junction-to-Board
Thermal Resistance
θJB
Junction-to-Case
Thermal Resistance
θJC
PACKAGE
VALUE
UNIT
D
47.5
°C/W
DW
53.7
°C/W
D
44.2
°C/W
DW
47.1
°C/W
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted (1)
UNIT
Supply voltage, VCC
0 V to 6 V
Magnitude of differential bus (input) voltage, |VAI - V|, |VBI - V|, |VCI - V|, |VDI - V|
ESD
Human Body
Charged-Device Model (3)
Continuous power dissipation
Storage temperature, Tstg
(1)
(2)
(3)
2
Model (2)
All pins
All pins
8.4 V
±3 kV
±2 kV
See Dissipation Rating Table
-65°C to 150°C
Stresses beyond those listed under,, absolute maximum ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under,, recommended operating
conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Tested in accordance with JEDEC Standard 22, Test Method A114-A.
Tested in accordance with JEDEC Standard 22, Test Method C101.
TB5R1, TB5R2
www.ti.com
SLLS588B – NOVEMBER 2003 – REVISED MAY 2004
RECOMMENDED OPERATING CONDITIONS
Supply voltage, VCC
MIN
Nom
4.5
5
-1.2 (1)
Bus pin input voltage, VAI, V, VBI, V, VCI, V, VDI, V
MAX UNIT
5.5
V
7.2
V
Magnitude of differential input voltage, |VAI - V|, |VBI - V|, |VCI - V|, |VDI - V|
0.1
6
V
Operating free-air temperature, TA
-40
85
°C
(1)
The algebraic convention, in which the least positive (most negative) limit is designated as minimum is used in this data sheet, unless
otherwise noted.
DEVICE ELECTRICAL CHARACTERISTICS
over operating free-air temperature range unless otherwise noted
PARAMETER
Supply current (1)
ICC
(1)
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Outputs disabled
40
mA
Outputs enabled
38
mA
Current is dc power draw as measured through GND pin and does not include power delivered to load.
RECEIVER ELECTRICAL CHARACTERISTICS
over operating free-air temperature range unless otherwise noted
parameter
test conditions
VOL
Output low voltage
VCC = 4.5 V,
IOL = 8 mA
VOH
Output high voltage
VCC = 4.5 V,
IOH = -400 µA
VIL
Low level enable input voltage (1)
VCC = 5.5 V
VIH
High level enable input voltage (1)
VCC = 5.5 V
VIK
Enable input clamp voltage
VTH+
Positive-going differential input threshold voltage (1), (Vxl - V)
VCC = 4.5 V,
x = A, B, C, or D
VTH-
Negative-going differential input threshold voltage (1), (Vxl - V)
x = A, B, C, or D
VHYST
Differential input threshold voltage hysteresis, (VTH+ - VTH_)
TB5R1
IOZL
Output off-state current, (High-Z)
VCC = 5.5 V
IOS
Output short circuit current (4)
VCC = 5.5 V
IIL
Enable input low current
VCC = 5.5 V,
IOZH
IIH
Enable input high current
Enable input reverse current
VCC = 5.5 V
unit
V
V
V
V
II = -5 mA
-1 (2)
V
TB5R1
100
mV
TB5R2 (3)
-50
mV
TB5R1
-100 (2)
mV
TB5R2 (3)
-200 (2)
mV
50
mV
VO = 0.4 V
-20 (2)
VO = 2.4 V
20
µA
-100 (2)
mA
-400 (2)
µA
VIN = 2.7 V
20
µA
VIN = 5.5 V
100
µA
-2 (2)
mA
1
mA
VIN = 0.4 V
VCC = 5.5V,
VIN = -1.2 V
IIH
Differential input high current
VCC= 5.5V,
VIN = 7.2 V
RO
Output resistance
(4)
0.4
2.4
2
Differential input low current
(3)
max
0.8
IIL
(1)
(2)
min typ
20
µA
Ω
The input levels and difference voltage provide no noise immunity and should be tested only in a static, noise-free environment.
This parameter is listed using a magnitude and polarity/direction convention, rather than an algebraic convention, to match the original
Agere data sheet.
Outputs of unused receivers assume a logic 1 level when the inputs are left open. (It is recomended that all unused positive inputs be
tied to the positive power supply. No external series resistor is required.)
Test must be performed one lead at a time to prevent damage to the device.
3
TB5R1, TB5R2
www.ti.com
SLLS588B – NOVEMBER 2003 – REVISED MAY 2004
SWITCHING CHARACTERISTICS
over operating free-air temperature range unless otherwise noted
parameter
test conditions
tPLH
Propagation delay time, low-to-high-level output
tPHL
Propagation delay time, high-to-low-level output
tPLH
Propagation delay time, low-to-high-level output
tPHL
Propagation delay time, high-to-low-level output
tPHZ
Output disable time, high-level-to-high-impedance output (2)
tPLZ
Output disable time, low-level-to-high-impedance output (2)
tskew1
Pulse width distortion, |tPHL - tPLH|
∆tskew1p-
Output enable time, high-impedance-to-high-level output (4)
Fall time (80%-20%)
(1)
(2)
(3)
(4)
4
4
3
5
3
5
4.1
12
ns
2.8
12
ns
0.7
ns
4
ns
1.4
ns
CL = 10 pF, TA = -40°C to 85°C, See
Figure 2 and Figure 4
1.5
ns
CL = 10 pF, See Figure 2 and Figure 4
0.3
ns
12
ns
CL = 5 pF, See Figure 3 and Figure 5
CL = 10 pF, TA = 75°C, See Figure 2 and
Figure 4
tPZH
tTHL
4
2.5
CL = 150 pF, See Figure 2 and Figure 4
Same part output waveform skew (3)
Rise time (20%-80%)
2.5
CL = 10 pF, See Figure 2 and Figure 4
∆tskew
Output enable time, high-impedance-to-low-level
max
CL = 15 pF, See Figure 2 and Figure 4
p
tTLH
typ
CL = 0 pF (1), See Figure 2 and Figure 4
Part-to-part output waveform skew (3)
tPZL
min
0.8
5
CL = 10 pF, See Figure 3 and Figure 4
output (4)
4
CL = 10 pF, See Figure 2 and Figure 4
unit
ns
ns
12
ns
1
3.5
ns
1
3.5
ns
The propagation delay values with a 0 pF load are based on design and simulation.
See Table 1.
Output waveform skews are when devices operate with the same supply voltage at the same temperature and have the same packages
and the same test circuits.
See Table 1.
TB5R1, TB5R2
www.ti.com
SLLS588B – NOVEMBER 2003 – REVISED MAY 2004
TYPICAL CHARACTERISTICS
TYPICAL PROPAGATION DELAY
vs
LOAD CAPACITANCE
t pd - Propagation Delay Time - ns
10
8
tPLH
6
tPHL
4
2
0
0
A.
50
100
150
CL - Load Capacitance - pF
200
NOTE: This graph is included as an aid to the system designers. Total circuit delay varies with load capacitance. The
total delay is the sum of the delay due to external capacitance and the intrinsic delay of the device. Intrinsic delay is
listed in the table above as the 0 pF load condition. The incremental increase in delay between the 0 pF load
condition and the actual total load capacitance represents the extrinsic, or external delay contributed by the load.
Figure 1. Typical Propagation Delay
vs
Load Capacitance at 25°C
3.7 V
INPUT
3.2 V
2.7 V
INPUT
t PHL
OUTPUT
t PLH
80%
80%
V OH
1.5 V
20%
20%
t THL
V OL
t TLH
Figure 2. Receiver Propagation Delay Times
5
TB5R1, TB5R2
www.ti.com
SLLS588B – NOVEMBER 2003 – REVISED MAY 2004
TYPICAL CHARACTERISTICS (continued)
E1(1)
2.4 V
1.5 V
0.4 V
2.4 V
E1(2)
1.5 V
0.4 V
t PHZ
t PZH
t PLZ
t PZL
VOH
OUTPUT
0.2 V
VOL
0.2 V
0.2 V
0.2 V
A.
E2 = 1 while E1 changes states.
B.
E1 = 0 while E2 changes states.
Figure 3. Receiver Enable and Disable Timing
Parametric values specified under the Electrical Characteristics and Timing Characteristics sections for the data
transmission driver devices are measured with the following output load circuits.
5V
TO OUTPUT
OF DEVICE
UNDER TEST
2k
CL
5k
DIODES TYPE
458E, 1N4148,
OR EQUIVALENT
CL includes test-fixture and probe capacitance.
Figure 4. Receiver Propagation Delay Time and Enable Time (tPZH, tPZL) Test Circuit
TO OUTPUT
OF DEVICE
UNDER TEST
500 1.5 V
CL
CL includes test-fixture and probe capacitance.
Figure 5. Receiver Disable Time (tPHZ, tPLZ) Test Circuit
6
TB5R1, TB5R2
www.ti.com
SLLS588B – NOVEMBER 2003 – REVISED MAY 2004
TYPICAL CHARACTERISTICS (continued)
LOW-TO-HIGH PROPAGATION DELAY
vs
FREE-AIR TEMPERATURE
HIGH-TO-LOW PROPAGATION DELAY
vs
FREE-AIR TEMPERATURE
6
t PHL- High-to-Low Propagation Delay - ns
tPLH - Low-to-High Propagation Delay - ns
6
VCC = 5 V
5
Max
4
Nom
3
Min
2
-50
0
50
100
TA - Free-Air Temperature - C
VCC = 5 V
5
Max
4
Nom
3
Min
2
-50
150
0
50
100
150
TA - Free-Air Temperature - C
Figure 6.
Figure 7.
MINIMUM VOH AND MAXIMUM VOL
vs
FREE-AIR TEMPERATURE
TYPICAL AND MAXIMUM ICC
vs
FREE-AIR TEMPERATURE
4
45
VCC = 4.5 V
3.5
VOH min
40
ICC - Supply Current - mA
VO - Output Voltage - V
3
2.5
2
1.5
1
ICC max at VCC = 5.5 V
35
30
ICC Typical at VCC = 5 V
25
20
0.5
0
-50
VOL min
0
50
100
TA - Free-Air Temperature - °C
Figure 8.
150
15
-50
0
50
100
TA - Free-Air Temperature - C
150
Figure 9.
7
TB5R1, TB5R2
www.ti.com
SLLS588B – NOVEMBER 2003 – REVISED MAY 2004
APPLICATION INFORMATION
Power Dissipation
The power dissipation rating, often listed as the
package dissipation rating, is a function of the ambient temperature, TA, and the airflow around the
device. This rating correlates with the device's maximum junction temperature, sometimes listed in the
absolute maximum ratings tables. The maximum
junction temperature accounts for the processes and
materials used to fabricate and package the device,
in addition to the desired life expectancy.
There are two common approaches to estimating the
internal die junction temperature, TJ. In both of these
methods, the device internal power dissipation PD
needs to be calculated This is done by totaling the
supply power(s) to arrive at the system power
dissispation:
V Sn I Sn
(1)
and then subtracting the total power dissipation of the
external load(s):
(V
Ln
I Ln)
(2)
The first TJ calculation uses the power dissipation
and ambient temperature, along with one parameter:
θJA, the junction-to-ambient thermal resistance, in
degrees Celsius per watt.
The product of PD and θJA is the junction temperature
rise above the ambient temperature. Therefore:
T J T A PD JA
(3)
140
Thermal Impedance − C/W
120
In this analysis, there are two parallel paths, one
through the case (package) to the ambient, and
another through the device to the PCB to the ambient. The system-level junction-to-ambient thermal impedance, θJA(S), is the equivalent parallel impedance
of the two parallel paths:
JA(S) 80
DW, High−K
D, High−K
100
200
300
(4)
where
100
60
400
500
Figure 10. Thermal Impedance vs Air Flow
8
The standardized θJA values may not accurately
represent the conditions under which the device is
used. This can be due to adjacent devices acting as
heat sources or heat sinks, to nonuniform airflow, or
to the system PCB having significantly different thermal characteristics than the standardized test PCBs.
The second method of system thermal analysis is
more accurate. This calculation uses the power
dissipation and ambient temperature, along with two
device and two system-level parameters:
• θJC, the junction-to-case thermal resistance, in
degrees Celsius per watt
• θJB, the junction-to-board thermal resistance, in
degrees Celsius per watt
• θCA, the case-to-ambient thermal resistance, in
degrees Celsius per watt
• θBA, the board-to-ambient thermal resistance, in
degrees Celsius per watt.
T J T A PD JA(S)
D, Low−K
DW, Low−K
40
0
Note that θJA is highly dependent on the PCB on
which the device is mounted and on the airflow over
the device and PCB. JEDEC/EIA has defined
standardized test conditions for measuring θJA. Two
commonly used conditions are the low-K and the
high-K boards, covered by EIA/JESD51-3 and
EIA/JESD51-7 respectively. Figure 10 shows the
low-K and high-K values of θJA versus air flow for this
device and its package options.
JC CA JB BA
JC CA JB BA
(5)
The device parameters θJC and θJB account for the
internal structure of the device. The system-level
parameters θCA and θBA take into account details of
the PCB construction, adjacent electrical and mechanical components, and the environmental conditions
including airflow. Finite element (FE), finite difference
(FD), or computational fluid dynamics (CFD) programs can determine θCA and θBA. Details on using
these programs are beyond the scope of this data
sheet, but are available from the software manufacturers.
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