KEC PG15FBUSC_08

SEMICONDUCTOR
PG15FBUSC
MARKING SPECIFICATION
USC PACKAGE
1. Marking method
Laser Marking
2. Marking
CATHODE MARK
2
BD
1
0 1
2
1
No.
Item
Marking
Description
Device Mark
BD
PG15FBUSC
hFE Grade
-
-
* Lot No.
01
2006. 1st Week
[0:1st Character, 1:2nd Character]
Note) * Lot No. marking method
Character
arrangement
1 st Character
1
(A)
2
(B)
3
(C)
4
(D)
5
(E)
6
(F)
7
(G)
8
(H)
9
(I)
0
(J)
2nd Character
A
(1)
B
(2)
C
(3)
D
(4)
E
(5)
F
(6)
G
(7)
H
(8)
I
(9)
J
(0)
Year
Marking (Week)
Periode (Year)
1 st Year (2006)
01
02
51
52
2006-2010-2014...
2 nd Year (2007)
0A
0B
5A
5B
2007-2011-2015...
4 rd Year (2008)
J1
J2
E1
E2
2008-2012-2016...
4 th Year (2009)
JA
JB
EA
EB
2009-2013-2017...
Remark
Rotation for 4 years
2008. 9. 11
Revision No : 0
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