TI TPIC5223L

TPIC5223L
2-CHANNEL INDEPENDENT GATE-PROTECTED LOGIC-LEVEL
POWER DMOS ARRAY
SLIS043A – NOVEMBER 1994 – REVISED SEPTEMBER 1995
D
D
D
D
D
D
Low rDS(on) . . . 0.38 Ω Typ
Voltage Output . . . 60 V
Input Protection Circuitry . . . 18 V
Pulsed Current . . . 3 A Per Channel
Extended ESD Capability . . . 4000 V
Direct Logic-Level Interface
D PACKAGE
(TOP VIEW)
GND
SOURCE1
GATE2
DRAIN2
1
8
2
7
3
6
4
5
DRAIN1
GATE1
SOURCE2
NC
NC – No internal connection
description
The TPIC5223L is a monolithic gate-protected logic-level power DMOS array that consists of two electrically
isolated independent N-channel enhancement-mode DMOS transistors. Each transistor features integrated
high-current zener diodes (ZCXa and ZCXb) to prevent gate damage in the event that an overstress condition
occurs. These zener diodes also provide up to 4000 V of ESD protection when tested using the human-body
model of a 100-pF capacitor in series with a 1.5-kΩ resistor.
The TPIC5223L is offered in a standard eight-pin small-outline surface-mount (D) package and is characterized
for operation over the case temperature of – 40°C to 125°C.
schematic
DRAIN1
8
DRAIN2
4
GATE2
3
Q1
Q2
D1
D2
Z1
7
GATE1
ZC1b
Z2
ZC2b
ZC1a
ZC2a
2
1
SOURCE1
GND
6
SOURCE2
NOTE A: For correct operation, no terminal may be taken below GND.
Copyright  1995, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
1
TPIC5223L
2-CHANNEL INDEPENDENT GATE-PROTECTED LOGIC-LEVEL
POWER DMOS ARRAY
SLIS043A – NOVEMBER 1994 – REVISED SEPTEMBER 1995
absolute maximum ratings over operating case temperature range (unless otherwise noted)†
Drain-to-source voltage, VDS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60 V
Source-to-GND voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 V
Drain-to-GND voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 V
Gate-to-source voltage range, VGS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 9 V to 18 V
Continuous drain current, each output, TC = 25°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 A
Continuous source-to-drain diode current, TC = 25°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 A
Pulsed drain current, each output, Imax, TC = 25°C (see Note 1 and Figure 15) . . . . . . . . . . . . . . . . . . . . . 3 A
Continuous gate-to-source zener diode current, TC = 25°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 50 mA
Pulsed gate-to-source zener-diode current, TC = 25°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 500 mA
Single-pulse avalanche energy, EAS, TC = 25°C (see Figures 4 and 16) . . . . . . . . . . . . . . . . . . . . . . . 108 mJ
Continuous total power dissipation, TC = 25°C (see Figure 15) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.95 W
Operating virtual junction temperature range, TJ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 40°C to 150°C
Operating case temperature range, TC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 40°C to 125°C
Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 65°C to 150°C
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260°C
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: Pulse duration = 10 ms, duty cycle = 2%
2
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• DALLAS, TEXAS 75265
TPIC5223L
2-CHANNEL INDEPENDENT GATE-PROTECTED LOGIC-LEVEL
POWER DMOS ARRAY
SLIS043A – NOVEMBER 1994 – REVISED SEPTEMBER 1995
electrical characteristics, TC = 25°C (unless otherwise noted)
PARAMETER
V(BR)DSX
Drain-to-source breakdown voltage
VGS(th)
Gate-to-source threshold voltage
V(BR)GS
V(BR)SG
Gate-to-source breakdown voltage
TEST CONDITIONS
ID = 250 µA,
ID = 1 mA,
See Figure 5
VGS = 0
VDS = VGS,
IGS = 250 µA
ISG = 250 µA
Source-to-gate breakdown voltage
MIN
TYP
MAX
60
1.5
V
2.05
2.2
V
9
V
100
V
Reverse drain-to-GND breakdown voltage
(across D1, D2)
Drain-to-GND current = 250 µA
VDS(on)
Drain-to-source on-state voltage
ID = 1 A,
See Notes 2 and 3
VF(SD)
Forward on-state voltage, source-to-drain
IS = 1 A,
VGS = 0 (Z1, Z2),
See Notes 2 and 3 and Figure 12
VF
Forward on-state voltage, GND-to-drain
ID = 1 A (D1, D2),
See Notes 2 and 3
IDSS
Zero gate voltage drain current
Zero-gate-voltage
VDS = 48 V,,
VGS = 0
TC = 25°C
TC = 125°C
IGSSF
IGSSR
Forward-gate current, drain short circuited to source
Reverse-gate current, drain short circuited to source
VGS = 15 V,
VSG = 5 V,
VDS = 0
VDS = 0
Ilk
lkg
current drain-to-GND
drain to GND
Leakage current,
VDGND = 48 V
TC = 25°C
TC = 125°C
0.05
1
0.5
10
0.38
0.43
Static drain-to-source
drain to source on-state
on state resistance
VGS = 5 V,
ID = 1 A,,
See Notes 2 and 3
and Figures 6 and 7
TC = 25°C
rDS(on)
DS( )
TC = 125°C
0.61
0.65
VGS = 5 V,
Ciss
Short-circuit input capacitance, common source
Coss
Short-circuit output capacitance, common source
Crss
Short-circuit reverse transfer capacitance,
common source
VDS = 25 V,
f = 1 MHz,
0.375
0.425
V
0.85
1.2
V
3
VDS = 15 V,
ID = 500 mA,
See Notes 2 and 3 and Figure 9
Forward transconductance
V
18
V(BR)
gfs
UNIT
V
0.05
1
0.5
10
20
200
nA
10
100
nA
µA
µA
Ω
1.2
VGS = 0,
See Figure 11
1.49
S
150
190
100
125
40
50
pF
F
NOTES: 2. Technique should limit TJ – TC to 10°C maximum.
3. These parameters are measured with voltage-sensing contacts separate from the current-carrying contacts.
source-to-drain and GND-to-drain diode characteristics, TC = 25°C
PARAMETER
trr
Reverse recovery time
Reverse-recovery
QRR
Total diode charge
TEST CONDITIONS
IS = 500 mA,
VGS = 0
0,
See Figures 1 and 14
POST OFFICE BOX 655303
VDS = 48 V,
di/dt = 100 A/µs
A/µs,
• DALLAS, TEXAS 75265
MIN
TYP
Z1 and Z2
50
D1 and D2
210
Z1 and Z2
50
D1 and D2
800
MAX
UNIT
ns
nC
3
TPIC5223L
2-CHANNEL INDEPENDENT GATE-PROTECTED LOGIC-LEVEL
POWER DMOS ARRAY
SLIS043A – NOVEMBER 1994 – REVISED SEPTEMBER 1995
resistive-load switching characteristics, TC = 25°C
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
34
70
20
40
28
55
td(on)
td(off)
Turn-on delay time
tr1
tf2
Rise time
Fall time
15
30
Qg
Total gate charge
3.1
3.8
Qgs(th)
Threshold gate-to-source charge
0.5
0.6
Qgd
Gate-to-drain charge
1.9
2.3
LD
LS
Internal drain inductance
5
Internal source inductance
5
Rg
Internal gate resistance
Turn-off delay time
RL = 50 Ω,,
See Figure 2
VDD = 25 V,,
tf1 = 10 ns,
VDS = 48 V,
V
See Figure 3
ID = 500 mA,
A
tr1 = 10 ns,,
VGS = 5 V,
V
UNIT
ns
nC
nH
Ω
0.25
thermal resistance
PARAMETER
TEST CONDITIONS
MIN
TYP
RθJA
Junction-to-ambient thermal resistance
See Notes 4 and 7
130
RθJB
Junction-to-board thermal resistance
See Notes 5 and 7
78.6
See Notes 6 and 7
34
RθJP Junction-to-pin thermal resistance
NOTES: 4. Package mounted on an FR4 printed-circuit board with no heatsink.
5. Package mounted on a 24 in2, 4-layer FR4 printed-circuit board.
6. Package mounted in intimate contact with infinite heatsink.
7. All outputs with equal power
PARAMETER MEASUREMENT INFORMATION
1.5
VDS = 48 V
VGS = 0
TJ = 25°C
Z1, and Z2‡
I S – Source-to-Drain Diode Current – A
1
Reverse di/dt = 100 A/µs
0.5
0
25% of IRM†
– 0.5
Shaded Area = QRR
–1
– 1.5
IRM†
–2
trr(SD)
– 2.5
0
50
100
150
200 250 300 350 400 450
Time – ns
† IRM = maximum recovery current
‡ The above waveform is representative of D1 and D2 in shape only.
500
Figure 1. Reverse-Recovery-Current Waveform of Source-to-Drain Diode
4
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• DALLAS, TEXAS 75265
MAX
UNIT
°C/W
TPIC5223L
2-CHANNEL INDEPENDENT GATE-PROTECTED LOGIC-LEVEL
POWER DMOS ARRAY
SLIS043A – NOVEMBER 1994 – REVISED SEPTEMBER 1995
PARAMETER MEASUREMENT INFORMATION
VDD = 25 V
RL
Pulse Generator
tr1
VDS
5V
VGS
VGS
0V
DUT
Rgen
tf1
50 Ω
td(off)
td(on)
CL = 30 pF
(see Note A)
50 Ω
tr2
tf2
VDD
VDS
VDS(on)
VOLTAGE WAVEFORMS
TEST CIRCUIT
NOTE A: CL includes probe and jig capacitance.
Figure 2. Resistive-Switching Test Circuit and Voltage Waveforms
Current
Regulator
12-V
Battery
0.2 µF
Same Type
as DUT
50 kΩ
0.3 µF
Qg
5V
Qgs(th)
VDD
VDS
0V
Qgd
VGS
DUT
IG = 100 µA
Gate Voltage
Time
IG CurrentSampling Resistor
ID CurrentSampling Resistor
VOLTAGE WAVEFORM
TEST CIRCUIT
Figure 3. Gate-Charge Test Circuit and Voltage Waveform
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• DALLAS, TEXAS 75265
5
TPIC5223L
2-CHANNEL INDEPENDENT GATE-PROTECTED LOGIC-LEVEL
POWER DMOS ARRAY
SLIS043A – NOVEMBER 1994 – REVISED SEPTEMBER 1995
PARAMETER MEASUREMENT INFORMATION
VDD = 25 V
tav
tw
14 mH
Pulse Generator
(see Note A)
ID
5V
VGS
VDS
0V
IAS
(see Note B)
VGS
50 Ω
ID
DUT
0V
Rgen
50 Ω
V(BR)DSX = 60 V Min
VDS
0V
VOLTAGE AND CURRENT WAVEFORMS
TEST CIRCUIT
NOTES: A. The pulse generator has the following characteristics: tr ≤ 10 ns, tf ≤ 10 ns, ZO = 50 Ω.
B. Input pulse duration (tw) is increased until peak current IAS = 3 A.
I
V
t av
AS
(BR)DSX
108 mJ, where t av
Energy test level is defined as E
AS
2
+
+
+ avalanche time.
Figure 4. Single-Pulse Avalanche-Energy Test Circuit and Waveforms
TYPICAL CHARACTERISTICS
STATIC DRAIN-TO-SOURCE ON-STATE RESISTANCE
vs
JUNCTION TEMPERATURE
1
2.5
VDS = VGS
2
ID = 1 mA
ID = 100 µA
1.5
1
0.5
0
– 40 – 20
0 20 40 60 80 100 120 140 160
TJ – Junction Temperature – °C
ID = 1 A
r DS(on) – Static Drain-to-Source
On-State Resistance – Ω
VGS(th) – Gate-to-Source Threshold Voltage – V
GATE-TO-SOURCE THRESHOLD VOLTAGE
vs
JUNCTION TEMPERATURE
0.8
0.6
VGS = 4.5 V
0.4
VGS = 5 V
0.2
0
– 40 – 20
Figure 5
6
0 20 40 60 80 100 120 140 160
TJ – Junction Temperature – °C
Figure 6
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• DALLAS, TEXAS 75265
TPIC5223L
2-CHANNEL INDEPENDENT GATE-PROTECTED LOGIC-LEVEL
POWER DMOS ARRAY
SLIS043A – NOVEMBER 1994 – REVISED SEPTEMBER 1995
TYPICAL CHARACTERISTICS
DRAIN CURRENT
vs
DRAIN-TO-SOURCE VOLTAGE
3
1
0.9
0.8
0.7
TJ = 25°C
VGS = 4 V
0.6
0.5
I D – Drain Current – A
On-State Resistance – Ω
r DS(on) – Static Drain-to-Source
STATIC DRAIN-TO-SOURCE ON-STATE RESISTANCE
vs
DRAIN CURRENT
VGS = 4.5 V
0.4
VGS = 5 V
0.3
nVGS = 0.2 V
TJ = 25°C
2
1
0.2
VGS = 3 V
0
0.1
1
ID – Drain Current – A
10
1
2
3
4
5
6
7
8
9
VDS – Drain-to-Source Voltage – V
Figure 7
Figure 8
DRAIN CURRENT
vs
GATE-TO-SOURCE VOLTAGE
DISTRIBUTION OF
FORWARD TRANSCONDUCTANCE
50
40
TJ = 75°C
I D – Drain Current – A
35
30
25
20
15
2
1
TJ = 125°C
10
TJ = 25°C
TJ = 150°C
5
1.515
1.510
1.505
1.500
1.495
1.490
1.485
1.480
1.475
TJ = – 40°C
1.470
Percentage of Units – %
3
Total Number
of Units = 1554
VDS = 15 V
ID = 500 mA
TJ = 25°C
45
0
10
0
0
1
2
3
4
5
VGS – Gate-to-Source Voltage – V
gfs – Forward Transconductance – S
Figure 9
Figure 10
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• DALLAS, TEXAS 75265
7
TPIC5223L
2-CHANNEL INDEPENDENT GATE-PROTECTED LOGIC-LEVEL
POWER DMOS ARRAY
SLIS043A – NOVEMBER 1994 – REVISED SEPTEMBER 1995
TYPICAL CHARACTERISTICS
SOURCE-TO-DRAIN DIODE CURRENT
vs
SOURCE-TO-DRAIN VOLTAGE
CAPACITANCE
vs
DRAIN-TO-SOURCE VOLTAGE
10
350
280
245
I SD – Source-to-Drain Diode Current – A
315
C – Capacitance – pF
VGS = 0
VGS = 0
f = 1 MHz
TJ = 25°C
Ciss(0) = 245 pF
Coss(0) = 3700 pF
Crss(0) = 132 pF
210
175
Ciss
140
Coss
105
70
Crss
35
4
8
12
16
20
24
28
32
36
TJ = 125°C
TJ = 25°C
TJ = 150°C
TJ = 75°C
0.1
0.1
0
0
TJ = – 40°C
1
40
VDS – Drain-to-Source Voltage – V
1
VSD – Source-to-Drain Voltage – V
Figure 11
Figure 12
DRAIN-TO-SOURCE VOLTAGE AND
GATE-TO-SOURCE VOLTAGE
vs
GATE CHARGE
200
10
8
6
30
4
20
VDD = 48 V
10
2
0
0
0.5
1
1.5
2
2.5
3
3.5
180
D1 and D2
160
140
120
100
80
60
Z1 and Z2
40
4
4.5
5
0
0
100
200
300
400
Reverse di/dt – A/µs
Qg – Gate Charge – nC
Figure 13
8
VDS = 48 V
VGS = 0
IS = 500 mA
TJ = 25°C
See Figure 1
20
VDD = 20 V
0
trr – Reverse-Recovery Time – ns
VDD = 20 V
VDD = 30 V
40
220
12
ID = 500 mA
TJ = 25°C
See Figure 3
50
REVERSE-RECOVERY TIME
vs
REVERSE di/dt
VGS – Gate-to-Source Voltage – V
VDS – Drain-to-Source Voltage – V
60
10
Figure 14
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• DALLAS, TEXAS 75265
500
600
TPIC5223L
2-CHANNEL INDEPENDENT GATE-PROTECTED LOGIC-LEVEL
POWER DMOS ARRAY
SLIS043A – NOVEMBER 1994 – REVISED SEPTEMBER 1995
THERMAL INFORMATION
MAXIMUM DRAIN CURRENT
vs
DRAIN-TO-SOURCE VOLTAGE
MAXIMUM PEAK AVALANCHE CURRENT
vs
TIME DURATION OF AVALANCHE
5
10
I AS – Maximum Peak Avalanche Current – A
I D – Maximum Drain Current – A
TC = 25°C
1 µs†
1 ms†
10 ms†
1
ÁÁ
ÁÁ
ÁÁ
0.1
0.1
500 µs†
θJA§
θJP‡
DC Conditions
1
10
VDS – Drain-to-Source Voltage – V
100
See Figure 4
4
3
TC = 25°C
TC = 125°C
2
1
0.01
0.1
1
10
100
tav – Time Duration of Avalanche – ms
† Less than 2% duty cycle
‡ Device mounted in intimate contact with infinite heatsink.
§ Device mounted on FR4 printed-circuit board with no heatsink.
Figure 16
Figure 15
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
9
TPIC5223L
2-CHANNEL INDEPENDENT GATE-PROTECTED LOGIC-LEVEL
POWER DMOS ARRAY
SLIS043A – NOVEMBER 1994 – REVISED SEPTEMBER 1995
THERMAL INFORMATION
D PACKAGE†
JUNCTION-TO-BOARD THERMAL RESISTANCE
vs
PULSE DURATION
100
DC Conditions
RθJB – Junction-to-Board Thermal Resistance – °C/W
d = 0.5
d = 0.2
10
d = 0.1
d = 0.05
d = 0.02
d = 0.01
1
tc
Single Pulse
tw
ID
0
0.1
0.0001
0.001
0.01
0.1
tw – Pulse Duration – s
† Device mounted on 24 in2, 4-layer FR4 printed-circuit board with no heatsink.
NOTE A: ZθB(t) = r(t) RθJB
tw
pulse duration
tc
cycle time
d
duty cycle
tw tc
+
+
+
10
+ ń
Figure 17
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
1
10
100
PACKAGE OPTION ADDENDUM
www.ti.com
8-Apr-2005
PACKAGING INFORMATION
Orderable Device
Status (1)
Package
Type
Package
Drawing
TPIC5223LD
OBSOLETE
SOIC
D
Pins Package Eco Plan (2)
Qty
8
TBD
Lead/Ball Finish
Call TI
MSL Peak Temp (3)
Call TI
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS) or Green (RoHS & no Sb/Br) - please check
http://www.ti.com/productcontent for the latest availability information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
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Addendum-Page 1
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