ETC NID9N05.REV3

NID9N05CL
Power MOSFET
9 Amps, 52 Volts
N-Channel, Logic Level, Clamped
MOSFET w/ ESD Protection in a
DPAK Package
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Benefits
9 AMPERES
52 V CLAMPED
RDS(on) = 90 m (Typ.)
• High Energy Capability for Inductive Loads
• Low Switching Noise Generation
Features
•
•
•
•
•
Drain
(Pins 2, 4)
Diode Clamp Between Gate and Source
ESD Protection - HBM 5000 V
Active Over-Voltage Gate to Drain Clamp
Scalable to Lower or Higher RDS(on)
Internal Series Gate Resistance
Gate
(Pin 1)
Applications
RG
MPWR
Overvoltage
Protection
ESD Protection
• Automotive and Industrial Markets:
Solenoid Drivers, Lamp Drivers, Small Motor Drivers
Source
(Pin 3)
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating
Symbol
Value
Unit
Drain-to-Source Voltage Internally Clamped
VDSS
52-59
Vdc
Gate-to-Source Voltage - Continuous
VGS
±12
Vdc
Drain Current - Continuous @ TA = 25°C
Drain Current - Single Pulse (tp = 10 s)
ID
IDM
9.0
35
A
Total Power Dissipation @ TA = 25°C
PD
28.8
W
TJ, Tstg
-55 to
175
°C
Single Pulse Drain-to-Source Avalanche Energy - Starting TJ = 125°C
(VDD = 50 V, ID(pk) = 1.5 A, VGS = 10 V, RG =
25 )
EAS
160
mJ
Thermal Resistance - Junction-to-Case
- Junction-to-Ambient (Note 1)
- Junction-to-Ambient (Note 2)
RJC
RJA
RJA
5.2
72
100
°C/W
TL
260
°C
Operating and Storage Temperature Range
Maximum Lead Temperature for Soldering
Purposes, 1/8″ from Case for 10 Sec.
March, 2003 - Rev. 3
YWW
1
2
DPAK
CASE 369A
STYLE 2
D9N05CL
Y
WW
3
= Device Code
= Year
= Work Week
X
4
D9N05CL
1
2
3
4
= Gate
= Drain
= Source
= Drain
ORDERING INFORMATION
1. When surface mounted to an FR4 board using 1″ pad size, (Cu area 1.127 in2)
2. When surface mounted to an FR4 board using minimum recommended pad
size, (Cu area 0.412 in2)
 Semiconductor Components Industries, LLC, 2003
MARKING
DIAGRAM
1
Device
Package
Shipping
NID9N05CLT4
DPAK
2500/Tape & Reel
NID9N05CL
DPAK
75 Units/Rail
Publication Order Number:
NID9N05CL/D
NID9N05CL
MOSFET ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)
Characteristic
Symbol
Min
Typ
Max
Unit
52
-
55
-10
59
-
Vdc
mV/°C
-
-
10
25
-
±22
±10
-
1.3
-
1.75
-4.5
2.5
-
70
67
153
175
90
95
181
364
1210
-
gFS
-
24
-
Mhos
Ciss
-
155
250
pF
Coss
-
60
100
Transfer Capacitance
Crss
-
25
40
Input Capacitance
Ciss
-
175
-
Coss
-
70
-
Crss
-
30
-
OFF CHARACTERISTICS
Drain-to-Source Breakdown Voltage (Note 3)
(VGS = 0 Vdc, ID = 1.0 mAdc)
Temperature Coefficient (Negative)
V(BR)DSS
Zero Gate Voltage Drain Current
(VDS = 40 Vdc, VGS = 0 Vdc)
(VDS = 40 Vdc, VGS = 0 Vdc, TJ = 125°C)
IDSS
Gate-Body Leakage Current
(VGS = ±8 Vdc, VDS = 0 Vdc)
(VGS = ±14 Vdc, VDS = 0 Vdc)
IGSS
Adc
Adc
ON CHARACTERISTICS (Note 3)
Gate Threshold Voltage (Note 3)
(VDS = VGS, ID = 100 Adc)
Threshold Temperature Coefficient (Negative)
VGS(th)
Static Drain-to-Source On-Resistance (Note 3)
(VGS = 4.0 Vdc, ID = 1.5 Adc)
(VGS = 3.5 Vdc, ID = 0.6 Adc)
(VGS = 3.0 Vdc, ID = 0.2 Adc)
(VGS = 12 Vdc, ID = 9.0 Adc)
(VGS = 12 Vdc, ID = 12 Adc)
RDS(on)
Forward Transconductance (Note 3) (VDS = 15 Vdc, ID = 9.0 Adc)
Vdc
mV/°C
m
DYNAMIC CHARACTERISTICS
Input Capacitance
Output Capacitance
Output Capacitance
(VDS = 40 Vdc, VGS = 0 V,
f = 10 kHz)
(VDS = 25 Vdc, VGS = 0 V,
f = 10 kHz)
Transfer Capacitance
3. Pulse Test: Pulse Width ≤ 300 s, Duty Cycle ≤ 2%.
4. Switching characteristics are independent of operating junction temperatures.
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2
pF
NID9N05CL
MOSFET ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)
Characteristic
Symbol
Min
Typ
Max
Unit
td(on)
-
130
200
ns
tr
-
500
750
td(off)
-
1300
2000
tf
-
1150
1850
td(on)
-
200
-
tr
-
500
-
td(off)
-
2500
-
tf
-
1800
-
td(on)
-
120
-
tr
-
275
-
td(off)
-
1600
-
tf
-
1100
-
QT
-
4.5
7.0
Q1
-
1.2
-
Q2
-
2.7
-
QT
-
3.6
-
Q1
-
1.0
-
Q2
-
2.0
-
VSD
-
0.86
0.845
0.725
1.2
-
Vdc
trr
-
700
-
ns
ta
-
200
-
tb
-
500
-
QRR
-
6.5
-
C
ESD
5000
-
-
V
500
-
-
SWITCHING CHARACTERISTICS (Note 4)
Turn-On Delay Time
Rise Time
Turn-Of f Delay Time
(VGS = 10 Vdc, VDD = 40 Vdc,
ID = 9.0 Adc, RG = 9.0 )
Fall Time
Turn-On Delay Time
Rise Time
Turn-Of f Delay Time
(VGS = 10 Vdc, VDD = 15 Vdc,
ID = 1.5 Adc, RG = 2 k)
Fall Time
Turn-On Delay Time
Rise Time
Turn-Of f Delay Time
(VGS = 10 Vdc, VDD = 15 Vdc,
ID = 1.5 Adc, RG = 50 )
Fall Time
Gate Charge
(VGS = 4.5 Vdc, VDS = 40 Vdc,
ID = 9.0 Adc) (Note 3)
Gate Charge
(VGS = 4.5 Vdc, VDS = 15 Vdc,
ID = 1.5 Adc) (Note 3)
ns
ns
nC
nC
SOURCE-DRAIN DIODE CHARACTERISTICS
Forward On-Voltage
(IS = 4.5 Adc, VGS = 0 Vdc) (Note 3)
(IS = 4.0 Adc, VGS = 0 Vdc)
(IS = 4.5 Adc, VGS = 0 Vdc, TJ = 125°C)
Reverse Recovery Time
(IS = 4.5 Adc, VGS = 0 Vdc,
dIs/dt = 100 A/s) (Note 3)
Reverse Recovery Stored Charge
ESD CHARACTERISTICS
Electro-Static Discharge Capability
Human Body Model (HBM)
Machine Model (MM)
3. Pulse Test: Pulse Width ≤ 300 s, Duty Cycle ≤ 2%.
4. Switching characteristics are independent of operating junction temperatures.
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NID9N05CL
18
18
TJ = 25°C
8V
14
6.5 V
ID, DRAIN CURRENT (AMPS)
16
ID, DRAIN CURRENT (AMPS)
6V
VGS = 10 V
5V
12
4.6 V
10
4.2 V
4V
3.8 V
8
6
3.2 V
4
3.4 V
2
1
2
3
4
5
6
7
TJ = 100°C
10
8
6
4
VDS ≥ 10 V
1
8
2
6
5
7
8
Figure 1. On-Region Characteristics
Figure 2. Transfer Characteristics
RDS(on), DRAIN-TO-SOURCE RESISTANCE (Ω)
VGS, GATE-T O-SOURCE VOLTAGE (VOLTS)
0.5
ID = 4.5 A
TJ = 25°C
0.4
0.3
0.2
0.1
2
4
6
8
10
12
9
0.4
0.35
TJ = 25°C
VGS = 4 V
0.3
0.25
0.2
0.15
VGS = 12 V
0.1
0.05
0
0
2
4
6
8
10
12
14
16
18
VGS, GATE-T O-SOURCE VOLTAGE (VOLTS)
ID, DRAIN CURRENT (AMPS)
Figure 3. On-Resistance versus
Gate-to-Source Voltage
Figure 4. On-Resistance versus Drain Current
and Gate Voltage
2.5
1,000,000
ID = 9 A
VGS = 12 V
VGS = 0 V
2
100,000
1.5
TJ = 150°C
10,000
1
0.5
-50
4
3
VDS, DRAIN-TO-SOURCE VOLTAGE (VOLTS)
IDSS, LEAKAGE (nA)
RDS(on), DRAIN-TO-SOURCE RESISTANCE (Ω)
TJ = 25°C
12
0
0
RDS(on), DRAIN-TO-SOURCE RESISTANCE
(NORMALIZED)
14
2
2.8 V
0
0
TJ = -55°C
16
TJ = 100°C
1000
100
-25
0
25
50
75
100
125
150
175
20
25
30
35
40
45
TJ, JUNCTION TEMPERATURE (°C)
VDS, DRAIN-TO-SOURCE VOLTAGE (VOLTS)
Figure 5. On-Resistance Variation with
Temperature
Figure 6. Drain-to-Source Leakage Current
versus Voltage
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4
50
NID9N05CL
500
C, CAPACITANCE (pF)
Frequency = 10 kHz
TJ = 25°C
VGS = 0 V
400
300
200
Ciss
Coss
100
Crss
0
0
20
10
30
40
50
VDS, DRAIN-TO-SOURCE VOLTAGE (VOLTS)
50
QT
4
40
VGS
Qgs
3
Qgd
30
20
2
ID = 9 A
TJ = 25°C
VDS
1
10
0
0
0
1
2
3
4
Qg, TOTAL GATE CHARGE (nC)
5
10,000
VDD = 40 V
ID = 9 A
VGS = 10 V
t, TIME (ns)
5
VDS, DRAIN-TO-SOURCE VOLTAGE (VOLTS)
td(off)
1000
tf
tr
td(on)
100
1
Figure 8. Gate-To-Source and Drain-To-Source
Voltage versus Total Charge
10
RG, GATE RESISTANCE (OHMS)
Figure 9. Resistive Switching Time
Variation versus Gate Resistance
DRAIN-T O-SOURCE DIODE CHARACTERISTICS
10
IS, SOURCE CURRENT (AMPS)
VGS , GATE-T O-SOURCE VOLTAGE (VOLTS)
Figure 7. Capacitance Variation
VGS = 0 V
TJ = 25°C
8
6
4
2
0
0.4
0.6
0.8
1.0
VSD, SOURCE-TO-DRAIN VOLTAGE (VOLTS)
1.2
Figure 10. Diode Forward Voltage versus Current
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100
NID9N05CL
SAFE OPERATING AREA
The Forward Biased Safe Operating Area curves define
the maximum simultaneous drain-to-source voltage and
drain current that a transistor can handle safely when it is
forward biased. Curves are based upon maximum peak
junction temperature and a case temperature (TC) of 25°C.
Peak repetitive pulsed power limits are determined by using
the thermal response data in conjunction with the procedures
discussed in AN569, “Transient Thermal Resistance General Data and Its Use.”
Switching between the off-state and the on-state may
traverse any load line provided neither rated peak current
(IDM) nor rated voltage (VDSS) is exceeded and the
transition time (tr,tf) do not exceed 10 µs. In addition the total
power averaged over a complete switching cycle must not
exceed (TJ(MAX) - TC)/(RθJC).
A Power MOSFET designated E-FET can be safely used
in switching circuits with unclamped inductive loads. For
reliable operation, the stored energy from circuit inductance
dissipated in the transistor while in avalanche must be less
than the rated limit and adjusted for operating conditions
differing from those specified. Although industry practice is
to rate in terms of energy, avalanche energy capability is not
a constant. The energy rating decreases non-linearly with an
increase of peak current in avalanche and peak junction
temperature.
Although many E- FETs can withstand the stress of
drain- to- source avalanche at currents up to rated pulsed
current (IDM), the energy rating is specified at rated
continuous current (ID), in accordance with industry custom.
The energy rating must be derated for temperature as shown
in the accompanying graph (Figure 12). Maximum energy at
currents below rated continuous ID can safely be assumed to
equal the values indicated.
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NID9N05CL
SAFE OPERATING AREA
I D, DRAIN CURRENT (AMPS)
100
VGS = 12 V
SINGLE PULSE
TC = 25°C
100 µs
10
1 ms
10 ms
1
dc
RDS(on) LIMIT
THERMAL LIMIT
PACKAGE LIMIT
0.1
0.1
r(t), EFFECTIVE TRANSIENT THERMAL RESISTANCE
(NORMALIZED)
10 µs
10
1
VDS, DRAIN-TO-SOURCE VOLTAGE (VOLTS)
100
Figure 11. Maximum Rated Forward Biased
Safe Operating Area
10
D = 0.5
0.2
1
0.1
P(pk)
0.05
0.01
t1
t2
DUTY CYCLE, D = t1/t2
SINGLE PULSE
001
0.00001
0.0001
0.001
0.01
t, TIME (s)
Figure 12. Thermal Response
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0.1
RθJC(t) = r(t) RθJC
D CURVES APPLY FOR POWER
PULSE TRAIN SHOWN
READ TIME AT t1
TJ(pk) - TC = P(pk) RθJC(t)
1
10
NID9N05CL
PACKAGE DIMENSIONS
DPAK
CASE 369A-13
ISSUE AB
C
B
V
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
SEATING
PLANE
-T-
E
R
4
Z
A
S
1
2
3
U
K
F
J
L
H
D
G
2 PL
0.13 (0.005)
M
T
DIM
A
B
C
D
E
F
G
H
J
K
L
R
S
U
V
Z
INCHES
MIN
MAX
0.235
0.250
0.250
0.265
0.086
0.094
0.027
0.035
0.033
0.040
0.037
0.047
0.180 BSC
0.034
0.040
0.018
0.023
0.102
0.114
0.090 BSC
0.175
0.215
0.020
0.050
0.020
−−−
0.030
0.050
0.138
−−−
STYLE 2:
PIN 1.
2.
3.
4.
MILLIMETERS
MIN
MAX
5.97
6.35
6.35
6.73
2.19
2.38
0.69
0.88
0.84
1.01
0.94
1.19
4.58 BSC
0.87
1.01
0.46
0.58
2.60
2.89
2.29 BSC
4.45
5.46
0.51
1.27
0.51
−−−
0.77
1.27
3.51
−−−
GATE
DRAIN
SOURCE
DRAIN
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8
NID9N05CL/D