ETC QS74FCT2244ATQ

QS54/74FCT240T, 244T, 2240T, 2244T
Q
QUALITY
SEMICONDUCTOR, INC.
High-Speed CMOS
8-Bit
Buffers/Line Drivers
QS54/74FCT240T
QS54/74FCT244T
QS54/74FCT2240T
QS54/74FCT2244T
FEATURES/BENEFITS
DESCRIPTION
• Pin and function compatible to the 74F240/4
74FCT240/4 and 74ABT240/4
• Industrial temperature –40°C to 85°C
• CMOS power levels: <7.5mW static
• Available in DIP, SOIC, QSOP, ZIP, HQSOP
• Undershoot clamp diodes on all inputs
• TTL-compatible input and output levels
• Ground bounce controlled outputs
• Reduced output swing of 0-3.5V
• Military product compliant to MIL-STD-883,
Class B
The FCT240T and FCT244T are 8-bit buffers/line
drivers with three-state outputs that are ideal for
driving high-capacitance loads as in memory address and data buses. The FCT2240T and FCT2244T
are 25Ω resistor output versions useful for driving
transmission lines and reducing system noise. The
2240 and 2244 series parts can replace the 240/244
series to reduce noise in an existing design. All inputs
have clamp diodes for undershoot noise suppression. All outputs have ground bounce suppression
(see QSI Application Note AN-001), and outputs will
not load an active bus when VCC is removed from the
device.
FCT-T 240T, 244T
• JEDEC-FCT spec compatible
• Std. thru D speed grades with 3.8ns tPD for D
• IOL = 64mA Ind., 48mA Mil.
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FCT-T 2240T, 2244T
• Built-in 25Ω series resistor outputs reduce
reflection and other system noise
• Std. thru C speed grades with 4.1ns tPD for C
• IOL = 12mA Ind.
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Figure 1. Functional Block Diagram
No
FCT240
FCT2240
FCT244
FCT2244
1G(1)
1G(1)
1A1(2)
1Y1(18)
1A1(2)
1Y1(18)
1A2(4)
1Y2(16)
1A2(4)
1Y2(16)
1A3(6)
1Y3(14)
1A3(6)
1Y3(14)
1A4(8)
1Y4(12)
1A4(8)
1Y4(12)
2G(19)
2G(19)
2A1(11)
2Y1(9)
2A1(11)
2Y1(9)
2A2(13)
2Y2(7)
2A2(13)
2Y2(7)
2A3(15)
2Y3(5)
2A3(15)
2Y3(5)
2A4(17)
2Y4(3)
2A4(17)
2Y4(3)
Note: Pin 19 is 2G on the FCT244.
MDSL-00011-04
DECEMBER 28, 1998
QUALITY SEMICONDUCTOR, INC.
1
QS54/74FCT240T, 244T, 2240T, 2244T
Figure 2. Pin Configurations (All Pins Top View)
PDIP, SOIC, QSOP, HQSOP
1G
1A1
2Y4
1A2
2Y3
1A3
2Y2
1A4
2Y1
GND
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
ZIP
1G
2Y4
2Y3
2Y2
2Y1
2A1
2A2
2A3
2A4
2G
VCC
2G
1Y1
2A4
1Y2
2A3
1Y3
2A2
1Y4
2A1
1
3
5
7
9
11
13
15
17
19
2
4
6
8
10
12
14
16
18
20
1A1
1A2
1A3
1A4
GND
1Y4
1Y3
1Y2
1Y1
VCC
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Table 1. Pin Description
Name
I/O
Description
xA4-xA0
I
Data Inputs
xY4-xY0
O
Data Outputs - Three State
1G/2G
I
Output Enables
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Table 2. Function Tables
FCT240/FCT2240
1G
2G
1G/2G
Input A
Output Y
H
X
Z
L
L
H
L
H
L
FCT244/FCT2244
2
1G
2G
1G/2G
Input A
Output Y
H
X
Z
L
L
L
L
H
H
QUALITY SEMICONDUCTOR, INC.
MDSL-00011-04
DECEMBER 28, 1998
QS54/74FCT240T, 244T, 2240T, 2244T
Table 3. Absolute Maxuimum Ratings
Supply Voltage to Ground ................................................. –0.5V to 7.0V
DC Output Voltage VOUT ................................................... –0.5V to 7.0V
DC Input Voltage VIN ......................................................... –0.5V to 7.0V
AC Input Voltage (for a pulse width ≤ 20ns) ................................. –3.0V
DC Input Diode Current with VIN < 0 ........................................... –20mA
DC Output Diode Current with VOUT < 0 ...................................... –50mA
DC Output Current Max. Sink Current/Pin .................................. 120mA
Maximum Power Dissipation ................................................... 0.5 watts
TSTG Storage Temperature ............................................... –65° to 150°C
Note: Stresses greater than
those listed under ABSOLUTE
MAXIMUM RATINGS may
cause permanent damage to
QSI devices that result in functional or reliability type failures.
Table 4. Capacitance(1)
TA = 25°C, f = 1MHz, VIN = 0V, VOUT = 0V
Pins(2)
SOIC
QSOP
PDIP
ZIP
Unit
1, 19
4
4
5
7
pF
2-9,11-18
8
8
9
10
Notes:
1. Capacitance is characterized but not tested.
2. Pin reference for 20-pin package.
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Table 5. Power Supply Characteristics
No
Symbol
Parameter
Test Conditions(1)
Quiescent Power
Supply Current
∆ICC
QCCD
ICC
Min
Max
Unit
VCC = Max., freq = 0
0V ≤ VIN ≤ 0.2V or VCC-0.2V ≤ VIN ≤ VCC
—
1.5
mA
Supply Current per
Input @ TTL HIGH
VCC = Max., VIN = 3.4V, freq = 0(2)
—
2.0
mA
Supply Current per
Input per MHz
VCC = Max., Outputs Open and Enabled
One BitToggling @ 50% Duty Cycle
Other Inputs at GND or VCC(3,4)
—
0.25
mA/
MHz
Notes:
1. For conditions shown as Min. or Max., use the appropriate values specified under DC specifications.
2. Per TTL driven input (VIN = 3.4V).
3. For flip-flops, QCCD is measured by switching one of the data input pins so that the output changes every clock cycle.
This is a measurement of device power consumption only and does not include power to drive load capacitance or tester
capacitance. This parameter is guaranteed by design but not tested.
4. IC can be computed using the above parameters as explained in the Technical Overview section.
MDSL-00011-04
DECEMBER 28, 1998
QUALITY SEMICONDUCTOR, INC.
3
QS54/74FCT240T, 244T, 2240T, 2244T
Table 6. DC Electrical Characteristics Over Operating Range
Industrial TA = –40°C to 85°C, VCC = 5.0V ±5%
Symbol
Military TA = –55°C to 125°C, VCC = 5.0V ±10%
Parameter
Test Conditions
Min
Typ(1)
Max
Unit
VIH
Input HIGH Voltage
Logic HIGH for All Inputs
2.0
—
—
V
VIL
Input LOW Voltage
Logic LOW for All Inputs
—
—
0.8
V
∆VT
Input Hysteresis
VTLH – VTHL for All Inputs
—
0.2
—
V
| IIH |
| IIL |
Input Current
Input HIGH or LOW
VCC = Max., 0 ≤ VIN < VCC
—
—
5
µA
| IOZ |
Off-State Output
Current (Hi-Z)
VCC = Max., 0 ≤ VIN ≤ VCC
—
—
5
µA
IOS
Short Circuit Current
(FCTXXX)
VCC = Max., VOUT = GND(2,3)
–60
—
—
mA
IOR
Current Drive
(FCT2XXX – 25Ω)
VCC = Min., VOUT = 2.0V(3)
50
—
—
mA
VIC
Input Clamp Voltage
VCC = Min., IIN = –18mA, TA = 25°C(3)
—
VOH
Output HIGH Voltage
VCC = Min.
IOH = –12mA (MIL)
IOH = –15mA (IND)
2.4
2.4
VOL
Output LOW Voltage
(FCTXXX)
VCC = Min.
IOL = 48mA (MIL)
IOL = 64mA (IND)
VOL
Output LOW Voltage
(FCT2XXX – 25Ω)
VCC = Min.
ROUT
Output Resistance
(FCT2XXX – 25Ω)
VCC = Min.
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–0.7
–1.2
V
—
—
—
—
V
—
—
—
—
0.55
0.55
V
IOL = 12mA (MIL)
IOL = 12mA (IND)
—
—
—
—
0.50
0.50
V
IOL = 12mA (MIL)
IOL = 12mA (IND)
—
20
25
28
—
40
Ω
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Notes:
1. Typical values indicate VCC = 5.0V and TA = 25°C.
2. Not more than one output should be shorted and the duration is ≤1 second.
3. These parameters are guaranteed by design but not tested.
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QUALITY SEMICONDUCTOR, INC.
MDSL-00011-04
DECEMBER 28, 1998
QS54/74FCT240T, 244T, 2240T, 2244T
Table 7. FCT240T, FCT2240T Switching Characteristics Over Operating Range
Industrial TA = –40°C to 85°C, VCC = 5.0V ±5%
CLOAD = 50pF, RLOAD = 500Ω unless otherwise noted.
Military TA = –55°C to 125°C, VCC = 5.0V ±10%
2240
Symbol
Description(1)
Min
240A
2240A
240C
2240C
240D
Max Min Max Min Max Min Max Unit
tPHL
tPLH
Propagation Delay
Ai to Yi (FCT240)
IND
MIL
1.5
1.5
8
9
1.5
1.5
4.8
5.1
1.5
1.5
4.1
4.7
1.5
—
3.8
—
ns
tPHL
tPLH
Propagation Delay
Ai to Yi (FCT2240)
IND
MIL
1.5
1.5
8
9
1.5
1.5
4.8
5.1
1.5
1.5
4.1
4.7
—
—
—
—
ns
tPZH
tPZL
Output Enable Time
G to Yi (FCT240)
IND
MIL
1.5
1.5
10
10.5
1.5
1.5
6.2
6.5
1.5
1.5
5.8
6.5
1.5
—
5.6
—
ns
tPZH
tPZL
Output Enable Time
G to Yi (FCT2240)
IND
MIL
1.5
1.5
10
10.5
1.5
1.5
6.2
6.5
1.5
1.5
5.8
6.5
—
—
—
—
ns
tPHZ
tPLZ
Output Disable Time
G to Yi
IND(2)
MIL(2)
1.5
1.5
9.5
10
1.5
1.5
5.6
5.9
1.5
1.5
5.2
5.7
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1.5
—
5.2
—
ns
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Table 8. FCT244T, FCT2244T Switching Characteristics Over Operating Range
Industrial TA = –40°C to 85°C, VCC = 5.0V ±5%
CLOAD = 50pF, RLOAD = 500Ω unless otherwise noted.
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Symbol
an
Description
Military TA = –55°C to 125°C, VCC = 5.0V ±10%
244
2244
(1)
244A
2244A
244C
2244C
244D
Min
Max Min Max Min Max Min Max Unit
tPHL
tPLH
Propagation Delay
Ai to Yi (FCT244)
IND
MIL
1.5
1.5
6.5
7.5
1.5
1.5
4.8
5.1
1.5
1.5
4.1
4.6
1.5
—
3.8
—
ns
tPHL
tPLH
Propagation Delay
Ai to Yi (FCT2244)
IND
MIL
1.5
1.5
6.5
7.5
1.5
1.5
4.8
5.1
1.5
1.5
4.1
4.6
1.5
—
3.8
—
ns
tPZH
tPZL
Output Enable Time
G to Yi (FCT244)
IND
MIL
1.5
1.5
8
8.5
1.5
1.5
6.2
6.5
1.5
1.5
5.8
6.5
1.5
—
5.6
—
ns
tPZH
tPZL
Output Enable Time
G to Yi (FCT2244)
IND
MIL
1.5
1.5
8
8.5
1.5
1.5
6.2
6.5
1.5
1.5
5.8
6.5
1.5
—
5.6
—
ns
tPHZ
tPLZ
Output Disable Time
G to Yi
IND(2)
MIL(2)
1.5
1.5
7
7.5
1.5
1.5
5.6
5.9
1.5
1.5
5.2
5.7
1.5
—
5.2
—
ns
Notes:
1. Minimums guaranteed but not tested.
2. This parameter is guaranteed by design but not tested.
3. See Test Circuit and Waveforms.
MDSL-00011-04
DECEMBER 28, 1998
QUALITY SEMICONDUCTOR, INC.
5