54ACQ573 • 54ACTQ573 Quiet Series Octal Latch with TRI-STATE ® Outputs General Description The ’ACQ/’ACTQ573 is a high-speed octal latch with buffered common Latch Enable (LE) and buffered common Output Enable (OE) inputs. The ’ACQ/’ACTQ573 is functionally identical to the ’ACQ/’ACTQ373 but with inputs and outputs on opposite sides of the package. The ’ACQ/’ACTQ utilizes NSC Quiet Series technology to guarantee quiet output switching and improved dynamic threshold performance. FACT Quiet Series™ features GTO™ output control and undershoot corrector in addition to a split ground bus for superior performance. n Guaranteed simultaneous switching noise level and dynamic threshold performance n Improved latch-up immunity n Inputs and outputs on opposite sides of package allow easy interface with microprocessors n Outputs source/sink 24 mA n Faster prop delays than standard ’ACT573 n 4 kV minimum ESD immunity n Standard Microcircuit Drawing (SMD) — ’ACTQ573: 5962-92194 — ’ACQ573: 5962-92180 Features n ICC and IOZ reduced by 50% Logic Symbols IEEE/IEC DS100242-1 DS100242-2 Pin Names Description D0–D7 Data Inputs LE Latch Enable Input OE TRI-STATE Output Enable Input O0–O7 TRI-STATE Latch Outputs GTO™ is a trademark of National Semiconductor Corporation. TRI-STATE ® is a registered trademark of National Semiconductor Corporation. FACT ® is a registered trademark of Fairchild Semiconductor Corporation. FACT Quiet Series™ is a trademark of Fairchild Semiconductor Corporation. © 1998 National Semiconductor Corporation DS100242 www.national.com 54ACQ573 • 54ACTQ573 Quiet Series Octal Latch with TRI-STATE Outputs August 1998 Connection Diagrams Functional Description The ’ACQ/’ACTQ573 contains eight D-type latches with TRI-STATE output buffers. When the Latch Enable (LE) input is HIGH, data on the Dn inputs enters the latches. In this condition the latches are transparent, i.e., a latch output will change state each time its D input changes. When LE is LOW the latches store the information that was present on the D inputs a setup time preceding the HIGH-to-LOW transition of LE. The TRI-STATE buffers are controlled by the Output Enable (OE) input. When OE is LOW, the buffers are enabled. When OE is HIGH the buffers are in the high impedance mode but this does not interfere with entering new data into the latches. Pin Assignment for DIP and Flatpak Truth Table DS100242-3 Inputs Pin Assignment for LCC Outputs OE LE D On L H H H L H L L L L X O0 H X X Z H = HIGH Voltage L = LOW Voltage Z = High Impedance X = Immaterial O0 = Previous O0 before HIGH-to-LOW transition of Latch Enable DS100242-4 Logic Diagram DS100242-5 Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays. www.national.com 2 Absolute Maximum Ratings (Note 2) Recommended Operating Conditions If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. Supply Voltage (VCC) DC Input Diode Current (IIK) VI = −0.5V VI = VCC + 0.5V DC Input Voltage (VI) DC Output Diode Current (IOK) VO = −0.5V VO = VCC + 0.5V DC Output Voltage (VO) DC Output Source or Sink Current (IO) DC VCC or Ground Current per Output Pin (ICC or IGND) Storage Temperature (TSTG) DC Latchup Source or Sink Current Junction Temperature (TJ) CDIP Supply Voltage (VCC) ’ACQ ’ACTQ Input Voltage (VI) Output Voltage (VO) Operating Temperature (TA) 54ACQ/ACTQ Minimum Input Edge Rate ∆V/∆t ’ACQ Devices VIN from 30% to 70% of VCC VCC @ 3.0V, 4.5V, 5.5V Minimum Input Edge Rate ∆V/∆t ’ACTQ Devices VIN from 0.8V to 2.0V VCC @ 4.5V, 5.5V −0.5V to +7.0V −20 mA +20 mA −0.5V to VCC + 0.5V −20 mA +20 mA −0.5V to VCC + 0.5V ± 50 mA ± 50 mA −65˚C to +150˚C 2.0V to 6.0V 4.5V to 5.5V 0V to VCC 0V to VCC −55˚C to +125˚C 125 mV/ns 125 mV/ns Note 1: All commercial packaging is not recommended for applications requiring greater than 2000 temperature cycles from −40˚C to +125˚C. ± 300 mA Note 2: Absolute maximum ratings are those values beyond which damage to the device may occur. The databook specifications should be met, without exception, to ensure that the system design is reliable over its power supply, temperature, and output/input loading variables. National does not recommend operation of FACT ® circuits outside databook specifications. 175˚C DC Characteristics for ’ACQ Family Devices Symbol VIH VIL VOH VOL IIN Parameter VCC 54ACQ TA = −55˚C to +125˚C (V) Guaranteed Limits Minimum High Level 3.0 2.1 Input Voltage 4.5 3.15 5.5 3.85 Maximum Low Level 3.0 0.9 Input Voltage 4.5 1.35 5.5 1.65 Minimum High Level 3.0 2.9 Output Voltage 4.5 4.4 5.5 5.4 3.0 2.4 4.5 3.7 5.5 4.7 Maximum Low Level 3.0 0.1 Output Voltage 4.5 0.1 5.5 0.1 Maximum Input 3.0 0.50 4.5 0.50 5.5 0.50 5.5 ± 1.0 Leakage Current Units Conditions VOUT = 0.1V V or VCC − 0.1V V or VCC − 0.1V VOUT = 0.1V IOUT = −50 µA V (Note 3) VIN = VIL or VIH IOH = −12 mA V IOH = −24 mA IOH = −24 mA IOUT = 50 µA V (Note 3) VIN = VIL or VIH IOL = 12 mA V µA IOL = 24 mA IOL = 24 mA VI = VCC, GND (Note 5) 3 www.national.com DC Characteristics for ’ACQ Family Devices Symbol IOLD IOHD ICC Parameter (Continued) VCC 54ACQ TA = −55˚C to +125˚C (V) Guaranteed Limits 5.5 50 mA VOLD = 1.65 VMax Units (Note 4) Minimum Dynamic Output Current 5.5 −50 mA Maximum Quiescent 5.5 80.0 µA VOHD = 3.85 VMin VIN = VCC or GND (Note 5) VI(OE) = VIL, VIH VI = VCC, GND Supply Current IOZ Conditions Maximum TRI-STATE Leakage Current 5.5 ± 5.0 µA Quiet Output 5.0 1.75 V 5.0 −1.2 V VO = VCC, GND VOLP Maximum Dynamic VOL VOLV Quiet Output (Notes 6, 7) Minimum Dynamic VOL (Notes 6, 7) Note 3: All outputs loaded; thresholds on input associated with output under test. Note 4: Maximum test duration 2.0 ms, one output loaded at a time. Note 5: IIN and ICC @ 3.0V are guaranteed to be less than or equal to the respective limit @ 5.5V VCC. ICC for 54ACQ @ 25˚C is identical to 74ACQ @ 25˚C. Note 6: Plastic DIP package. Note 7: Max number of outputs defined as (n). Data Inputs are driven 0V to 5V. One output @ GND. DC Characteristics for ’ACTQ Family Devices Symbol VIH VIL VOH VOL IIN Parameter VCC 54ACTQ TA = −55˚C to +125˚C (V) Guaranteed Limits Minimum High Level 4.5 2.0 Input Voltage 5.5 2.0 Maximum Low Level 4.5 0.8 Input Voltage 5.5 0.8 Minimum High Level 4.5 4.4 Output Voltage 5.5 5.4 4.5 3.70 5.5 4.70 Maximum Low Level 4.5 0.1 Output Voltage 5.5 0.1 Maximum Input Units Conditions V VOUT = 0.1V V or VCC − 0.1V VOUT = 0.1V V or VCC − 0.1V IOUT = −50 µA V (Note 8) VIN = VIL or VIH IOH = −24 mA V IOH = −24 mA IOUT = 50 µA V (Note 8) VIN = VIL or VIH IOL = 24 mA IOL = 24 mA VI = VCC, GND 4.5 0.50 5.5 0.50 5.5 ± 1.0 µA 5.5 ± 5.0 µA 5.5 1.6 mA Leakage Current IOZ Maximum TRI-STATE Leakage Current ICCT Maximum ICC/Input www.national.com 4 VI = VIL, VIH VO = VCC, GND VI = VCC − 2.1V DC Characteristics for ’ACTQ Family Devices Symbol IOLD IOHD ICC Parameter (Continued) VCC 54ACTQ TA = −55˚C to +125˚C (V) Guaranteed Limits 5.5 50 mA VOLD = 1.65V Max Units (Note 9) Minimum Dynamic Output Current 5.5 −50 mA Maximum Quiescent 5.5 80.0 µA VOHD = 3.85V Min VIN = VCC 5.0 1.5 V (Notes 11, 12) 5.0 −1.2 V (Notes 11, 12) Supply Current VOLP Conditions or GND (Note 10) Quiet Output Maximum Dynamic VOL VOLV Quiet Output Minimum Dynamic VOL Note 8: All outputs loaded; thresholds on input associated with output under test. Note 9: Maximum test duration 2.0 ms, one output loaded at a time. Note 10: ICC for 54ACTQ @ 25˚C is identical to 74ACTQ @ 25˚C. Note 11: Plastic DIP package. Note 12: Max number of outputs defined as (n). Data Inputs are driven 0V to 3V. One output @ GND. AC Electrical Characteristics 54ACQ TA = −55˚C VCC Symbol Parameter (V) Fig. to +125˚C CL = 50 pF (Note 13) Min Units Max tPHL, Propagation Delay 3.3 1.5 16.0 tPLH Dn to On 5.0 1.5 11.0 tPLH, Propagation Delay 3.3 1.5 15.0 tPHL LE to On 5.0 1.5 11.0 tPZL, Output Enable Time tPZH tPHZ, Output Disable Time tPLZ No. 3.3 1.5 13.5 5.0 1.5 10.0 3.3 1.5 13.0 5.0 1.0 10.5 ns ns ns ns Note 13: Voltage Range 5.0 is 5.0V ± 0.5V Voltage Range 3.3 is 3.3V ± 0.3V AC Operating Requirements VCC Symbol Parameter (V) (Note 14) 54ACQ TA = −55˚C to +125˚C CL = 50 pF Units Guaranteed Minimum tS tH tW Setup Time, HIGH or LOW 3.3 4.0 Dn to LE 5.0 4.0 Hold Time, HIGH or LOW 3.3 2.0 Dn to LE 5.0 2.0 LE Pulse Width, HIGH 3.3 5.0 5.0 5.0 ns ns ns Note 14: Voltage Range 5.0 is 5.0V ± 0.5V Voltage Range 3.3 is 3.3V ± 0.3V 5 www.national.com AC Electrical Characteristics 54ACTQ TA = −55˚C VCC Symbol Parameter (V) to +125˚C CL = 50 pF (Note 15) tPHL, Propagation Delay tPLH Dn to On Fig. Units Min Max 5.0 1.5 10.0 ns 5.0 1.5 11.0 ns tPLH, Propagation Delay tPHL LE to On tPZL, tPZH Output Enable Time 5.0 1.5 11.0 ns tPHZ, tPLZ Output Disable Time 5.0 1.5 11.0 ns No. Note 15: Voltage Range 5.0 is 5.0V ± 0.5V AC Operating Requirements 54ACTQ TA = −55˚C VCC Symbol Parameter (V) to +125˚C CL = 50 pF (Note 16) Fig. Units Guaranteed Minimum tS Setup Time, HIGH or LOW 5.0 3.5 ns 5.0 1.5 ns 5.0 5.0 ns Dn to LE tH Hold Time, HIGH or LOW Dn to LE tW LE Pulse Width, HIGH Note 16: Voltage Range 5.0 is 5.0V ± 0.5V Capacitance Symbol CIN CPD Typ Units Input Capacitance Parameter 4.5 pF Power Dissipation 42.0 pF Capacitance www.national.com 6 Conditions VCC = OPEN VCC = 5.0V No. Physical Dimensions inches (millimeters) unless otherwise noted 20-Terminal Ceramic Leadless Chip Carrier (L) NS Package Number E20A 20-Lead Ceramic Dual-In-Line Package (D) NS Package Number J20A 7 www.national.com 54ACQ573 • 54ACTQ573 Quiet Series Octal Latch with TRI-STATE Outputs Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 20-Lead Ceramic Flatpak (F) NS Package Number W20A LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component in any component of a life support 1. Life support devices or systems are devices or sysdevice or system whose failure to perform can be reatems which, (a) are intended for surgical implant into sonably expected to cause the failure of the life support the body, or (b) support or sustain life, and whose faildevice or system, or to affect its safety or effectiveness. ure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 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