NSC 54ACT563F

54ACT563
Octal Latch with TRI-STATE ® Outputs
General Description
The ’ACT563 is a high-speed octal latch with buffered common Latch Enable (LE) and buffered common Output Enable
(OE) inputs.
The ’ACT563 device is functionally identical to the ’ACT573,
but with inverted outputs.
Features
n Inputs and outputs on opposite sides of package allow
easy interface with microprocessors
n Useful as input or output port for microprocessors
n Functionally identical to ’ACT573 but with inverted
outputs
n Outputs source/sink 24 mA
n ’ACT563 has TTL-compatible inputs
n Standard Military Drawing (SMD)
— ’ACT563: 5962-89556
n ICC and IOZ reduced by 50%
Logic Symbols
IEEE/IEC
DS100331-1
DS100331-2
Pin Names
Description
D0–D7
Data Inputs
LE
Latch Enable Input
OE
TRI-STATE Output Enable Input
O0–O7
TRI-STATE Latch Outputs
TRI-STATE ® is a registered trademark of National Semiconductor Corporation.
FACT™ is a trademark of Fairchild Semiconductor Corporation.
© 1998 National Semiconductor Corporation
DS100331
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54ACT563 Octal Latch with TRI-STATE Outputs
July 1998
Connection Diagrams
Pin Assignment
for DIP and Flatpak
Pin Assignment
for LCC
DS100331-3
DS100331-4
Functional Description
The ’ACT563 contains eight D-type latches with TRI-STATE
complementary outputs. When the Latch Enable (LE) input
is HIGH, data on the Dn inputs enters the latches. In this condition the latches are transparent, i.e., a latch output will
change state each time its D input changes. When LE is
LOW the latches store the information that was present on
the D inputs a setup time preceding the HIGH-to-LOW transition of LE. The TRI-STATE buffers are controlled by the
Output Enable (OE) input. When OE is LOW, the buffers are
in the bi-state mode. When OE is HIGH the buffers are in the
high impedance mode but that does not interfere with entering new data into the latches.
Function Table
Inputs
OE
Internal
Outputs
Q
O
Function
LE
D
H
X
X
X
Z
High-Z
H
H
L
H
Z
High-Z
H
H
H
L
Z
High-Z
H
L
X
NC
Z
Latched
L
H
L
H
H
Transparent
L
H
H
L
L
L
L
X
NC
NC
Transparent
Latched
H = HIGH Voltage Level
L = LOW Voltage Level
X = Immaterial
Z = High Impedance
NC = No Change
Logic Diagram
DS100331-5
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.
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2
Absolute Maximum Ratings (Note 1)
Junction Temperature (TJ)
CDIP
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Supply Voltage (VCC)
DC Input Diode Current (IIK)
VI = −0.5V
VI = VCC + 0.5V
DC Input Voltage (VI)
DC Output Diode Current (IOK)
VO = −0.5V
VO = VCC + 0.5V
DC Output Voltage (VO)
DC Output Source
or Sink Current (IO)
DC VCC or Ground Current
per Output Pin (ICC or IGND)
Storage Temperature (TSTG)
175˚C
Recommended Operating
Conditions
−0.5V to +7.0V
Supply Voltage (VCC)
’ACT
Input Voltage (VI)
Output Voltage (VO)
Operating Temperature (TA)
54ACT
Minimum Input Edge Rate (∆V/∆t)
’ACT Devices
VIN from 0.8V to 2.0V
VCC @ 4.5V, 5.5V
−20 mA
+20 mA
−0.5V to VCC + 0.5V
−20 mA
+20 mA
−0.5V to VCC + 0.5V
± 50 mA
4.5V to 5.5V
0V to VCC
0V to VCC
−55˚C to +125˚C
125 mV/ns
Note 1: Absolute maximum ratings are those values beyond which damage
to the device may occur. The databook specifications should be met, without
exception, to ensure that the system design is reliable over its power supply,
temperature, and output/input loading variables. National does not recommend operation of FACT™ circuits outside databook specifications.
± 50 mA
−65˚C to +150˚C
DC Characteristics for ’ACT Family Devices
Symbol
Parameter
VCC
54ACT
TA =
(V)
−55˚C to +125˚C
Units
Conditions
Guaranteed Limits
VIH
VIL
VOH
VOL
IIN
Minimum High Level
4.5
2.0
Input Voltage
5.5
2.0
Maximum Low Level
4.5
0.8
Input Voltage
5.5
0.8
Minimum High Level
4.5
4.4
Output Voltage
5.5
5.4
4.5
3.70
5.5
4.70
Maximum Low Level
4.5
0.1
Output Voltage
5.5
0.1
Maximum Input
V
VOUT = 0.1V
V
or VCC − 0.1V
VOUT = 0.1V
V
or VCC − 0.1V
IOUT = −50 µA
V
(Note 2)
VIN = VIL or VIH
IOH = −24 mA
V
IOH = −24 mA
IOUT = 50 µA
V
(Note 2)
VIN = VIL or VIH
IOL = 24 mA
IOL = 24 mA
VI = VCC, GND
4.5
0.50
5.5
0.50
5.5
± 1.0
µA
5.5
± 5.0
µA
VI = VIL, VIH
VO = VCC, GND
5.5
1.6
mA
VI = VCC − 2.1V
Leakage Current
IOZ
Maximum TRI-STATE
Current
ICCT
Maximum ICC/Input
(Note 3)
IOLD
Minimum Dynamic
5.5
50
mA
IOHD
Output Current
5.5
−50
mA
VOLD = 1.65V Max
VOHD = 3.85V Min
ICC
Maximum Quiescent
5.5
80.0
µA
VIN = VCC
Supply Current
or GND
Note 2: All outputs loaded; thresholds on input associated with output under test.
Note 3: Maximum test duration 2.0 ms, one output loaded at a time.
Note 4: ICC for 54ACT @ 25˚C is identical to 74ACT @ 25˚C.
3
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AC Electrical Characteristics
54ACT
TA = −55˚C
VCC
Symbol
Parameter
(V)
(Note 5)
tPLH
Propagation Delay
Fig.
to +125˚C
CL = 50 pF
Units
Min
Max
5.0
1.0
14.5
ns
5.0
1.0
12.0
ns
5.0
1.0
12.5
ns
5.0
1.0
11.5
ns
No.
Dn to On
tPHL
Propagation Delay
Dn to On
tPLH
Propagation Delay
LE to On
tPHL
Propagation Delay
LE to On
tPZH
Output Enable Time
5.0
1.0
11.5
ns
tPZL
Output Enable Time
5.0
1.0
11.0
ns
tPHZ
Output Disable Time
5.0
1.0
12.0
ns
tPLZ
Output Disable Time
5.0
1.0
9.5
ns
Note 5: Voltage Range 5.0 is 5.0V ± 0.5V
AC Operating Requirements
54ACT
TA = −55˚C
VCC
Symbol
Parameter
(V)
to +125˚C
CL = 50 pF
(Note 6)
Fig.
Units
Guaranteed Minimum
ts
Setup Time, HIGH or LOW
5.0
4.5
ns
5.0
1.5
ns
5.0
5.0
ns
Dn to LE
th
Hold Time, HIGH or LOW
Dn to LE
tw
LE Pulse Width, HIGH
Note 6: Voltage Range 5.0 is 5.0V ± 0.5V
Capacitance
Symbol
CIN
CPD
Typ
Units
Input Capacitance
Parameter
4.5
pF
Power Dissipation
50.0
pF
Capacitance
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4
Conditions
VCC = OPEN
VCC = 5.0V
No.
Physical Dimensions
inches (millimeters) unless otherwise noted
20 Terminal Ceramic Leadless Chip Carrier (L)
NS Package Number E20A
20-Lead Ceramic Dual-In-Line Package (D)
NS Package Number J20A
5
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54ACT563 Octal Latch with TRI-STATE Outputs
Physical Dimensions
inches (millimeters) unless otherwise noted (Continued)
20-Lead Ceramic Flatpak (F)
NS Package Number W20A
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