FAIRCHILD QED523

PLASTIC INFRARED
LIGHT EMITTING DIODE
QED522
QED523
PACKAGE DIMENSIONS
REFERENCE
SURFACE
0.190 (4.83)
0.178 (4.52)
0.220 (5.59)
0.030 (0.76)
NOM
0.800 (20.3)
MIN
0.050 (1.27)
CATHODE
0.100 (2.54)
NOM
Ø 0.215 (5.46)
NOM
45°
SCHEMATIC
0.020 (0.51)
SQ. (2X)
ANODE
R 0.022 (0.56)
CATHODE
NOTES:
1. Dimensions for all drawings are in inches (mm).
2. Tolerance of ± .010 (.25) on all non-nominal dimensions unless
otherwise specified.
DESCRIPTION
The QED522/523 is an 880 nm AlGaAs LED encapsulated in a clear, peach tinted, plastic TO-46 package.
FEATURES
•
•
•
•
•
•
•
λ= 880 nm
Chip material = AlGaAs
Package type: Plastic TO-46
Matched Photosensor: QSD722/723/724
Narrow Emission Angle, 20°
High Output Power
Package material and color: clear, peach tinted, plastic
© 2002 Fairchild Semiconductor Corporation
Page 1 of 4
6/13/02
PLASTIC INFRARED
LIGHT EMITTING DIODE
QED522
QED523
ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise specified)
Parameter
Symbol
Rating
Unit
Operating Temperature
TOPR
-40 to + 100
°C
Storage Temperature
TSTG
-40 to + 100
°C
(Iron)(2,3,4)
TSOL-I
240 for 5 sec
°C
Soldering Temperature (Flow)(2,3)
TSOL-F
260 for 10 sec
°C
Continuous Forward Current
IF
100
mA
Reverse Voltage
VR
5
V
PD
200
mW
Soldering Temperature
Power
Dissipation(1)
NOTES:
1. Derate power dissipation linearly 2.67 mW/°C above 25°C.
2. RMA flux is recommended.
3. Methanol or isopropyl alcohols are recommended as cleaning agents.
.4. Soldering iron 1/16" (1.6 mm) minimum from housing
ELECTRICAL / OPTICAL CHARACTERISTICS (TA =25°C)
Parameter
Test Conditions
Symbol
Min
Typ
Max
Units
Peak Emission Wavelength
IF = 100 mA
λPE
—
880
—
nm
Emission Angle
IF = 100 mA
2Θ1/2
—
20
—
Deg.
Forward Voltage
IF = 100 mA, tp = 20 ms
VF
—
—
1.8
V
Reverse Current
VR = 5 V
IR
—
—
10
µA
Radiant Intensity QEC522
IF = 100 mA, tp = 20 ms
IE
20
—
80
mW/sr
Radiant Intensity QEC523
IF = 100 mA, tp = 20 ms
IE
40
—
—
mW/sr
tr
—
800
—
ns
tf
—
800
—
ns
Rise Time
Fall Time
© 2002 Fairchild Semiconductor Corporation
IF = 100 mA
Page 2 of 4
6/13/02
PLASTIC INFRARED
LIGHT EMITTING DIODE
QED522
Fig. 2 Forward Voltage vs. Ambient Temperature
Fig. 1 Normalized Radiant Intensity vs. Forward Current
2.0
10
IF = 50 mA
Normalized to:
IF = 100 mA Pulsed
tpw = 100 µs
Duty Cycle = 0.1 %
TA = 25°C
1
VF - FORWARD VOLTAGE (V)
Ie - NORMALIZED RADIANT INTENSITY
QED523
0.1
0.01
IF = 100 mA
1.5
0.5
1
10
100
Normalized to:
IF Pulsed
tpw = 100 µs
Duty Cycle = 0.1 %
0.0
-40
0.001
1000
IF = 10 mA
IF = 20 mA
1.0
-20
0
IF - FORWARD CURRENT (mA)
20
40
60
80
100
TA - AMBIENT TEMPERATURE (°C)
Fig. 3 Normalized Radiant Intensity vs. Wavelength
Fig. 4 Radiation Diagram
NORMALIZED RADIANT INTENSITY
1.0
0.9
110
0.8
100
90
80
70
120
0.7
60
130
50
0.6
140
40
0.5
150
0.4
30
160
0.3
0.2
20
170
10
0.1
180
775
800
825
850
875
900
925
950
0
1.0
0.8
0.6
0.4
0.2
0.0
0.2
0.4
0.6
0.8
1.0
λ(nm)
© 2002 Fairchild Semiconductor Corporation
Page 3 of 4
6/13/02
PLASTIC INFRARED
LIGHT EMITTING DIODE
QED522
QED523
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO
ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME
ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN;
NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES
OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR
CORPORATION. As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the body, or
(b) support or sustain life, and (c) whose failure to perform
when properly used in accordance with instructions for use
provided in the labeling, can be reasonably expected to
result in a significant injury of the user.
© 2002 Fairchild Semiconductor Corporation
2. A critical component in any component of a life support
device or system whose failure to perform can be
reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
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6/13/02