IXYS IXTH35N30

MegaMOSTMFET
IXTH 35N30
IXTH 40N30
IXTM 40N30
VDSS
ID25
RDS(on)
300 V
300 V
300 V
35 A
40 A
40 A
0.10 Ω
0.085 Ω
0.088 Ω
N-Channel Enhancement Mode
Symbol
Test Conditions
Maximum Ratings
VDSS
TJ = 25°C to 150°C
300
V
VDGR
TJ = 25°C to 150°C; RGS = 1 MΩ
300
V
VGS
Continuous
±20
V
VGSM
Transient
±30
V
ID25
TC = 25°C
35N30
40N30
35
40
A
A
IDM
TC = 25°C, pulse width limited by TJM
35N30
40N30
140
160
A
A
PD
TC = 25°C
300
W
-55 ... +150
°C
TJM
150
°C
T stg
-55 ... +150
°C
TJ
Md
Mounting torque
TO-247 AD (IXTH)
D (TAB)
TO-204 AE (IXTM)
D
G = Gate,
S = Source,
D = Drain,
TAB = Drain
1.13/10 Nm/lb.in.
Weight
TO-204 = 18 g, TO-247 = 6 g
Maximum lead temperature for soldering
1.6 mm (0.062 in.) from case for 10 s
°C
300
Features
l
l
l
l
l
Symbol
G
Test Conditions
Characteristic Values
(TJ = 25°C, unless otherwise specified)
min. typ. max.
VDSS
VGS = 0 V, ID = 250 µA
300
VGS(th)
VDS = VGS, ID = 250 µA
2
IGSS
VGS = ±20 VDC, VDS = 0
IDSS
VDS = 0.8 • VDSS
VGS = 0 V
R DS(on)
VGS = 10 V, ID = 0.5 ID25
TJ = 25°C
TJ = 125°C
IXTH35N30
IXTH40N30
IXTM40N30
Pulse test, t ≤ 300 µs, duty cycle d ≤ 2 %
IXYS reserves the right to change limits, test conditions, and dimensions.
© 2000 IXYS All rights reserved
V
4
V
±100
nA
200
1
µA
mA
0.10
0.085
0.088
Ω
Ω
Ω
International standard packages
Low RDS (on) HDMOSTM process
Rugged polysilicon gate cell structure
Low package inductance (< 5 nH)
- easy to drive and to protect
Fast switching times
Applications
l
l
l
l
Switch-mode and resonant-mode
power supplies
Motor controls
Uninterruptible Power Supplies (UPS)
DC choppers
Advantages
l
l
l
Easy to mount with 1 screw (TO-247)
(isolated mounting screw hole)
Space savings
High power density
91535E(5/96)
1-4
IXTH 35N30
Symbol
Test Conditions
Characteristic Values
(TJ = 25°C, unless otherwise specified)
min. typ. max.
gfs
VDS = 10 V; ID = 0.5 • ID25, pulse test
Ciss
Coss
VGS = 0 V, VDS = 25 V, f = 1 MHz
Crss
t d(on)
22
25
S
4600
pF
650
pF
240
pF
24
30
ns
tr
VGS = 10 V, VDS = 0.5 • VDSS, ID = 0.5 ID25
40
90
ns
td(off)
RG = 2 Ω, (External)
75
100
ns
40
90
ns
190
220
nC
28
50
nC
85
105
nC
0.42
K/W
tf
Q g(on)
Q gs
VGS = 10 V, VDS = 0.5 • VDSS, ID = 0.5 ID25
Q gd
R thJC
R thCK
0.25
Source-Drain Diode
K/W
Characteristic Values
(TJ = 25°C, unless otherwise specified)
min. typ. max.
Symbol
Test Conditions
IS
VGS = 0 V
35N30
40N30
35
40
A
A
ISM
Repetitive;
pulse width limited by TJM
35N30
40N30
140
160
A
A
VSD
IF = IS, VGS = 0 V,
Pulse test, t ≤ 300 µs, duty cycle d ≤ 2 %
1.5
V
t rr
IF = IS, -di/dt = 100 A/µs, VR = 100 V
400
IXTH 40N30
IXTM 40N30
TO-247 AD (IXTH) Outline
1
2
Terminals: 1 - Gate
3 - Source
3
2 - Drain
Tab - Drain
Dim.
Millimeter
Inches
Min.
Max.
Min. Max.
A
4.7
5.3
.185 .209
A1
2.2
2.54
.087 .102
A2
2.2
2.6
.059 .098
b
1.0
1.4
.040 .055
b1
1.65
2.13
.065 .084
b2
2.87
3.12
.113 .123
C
.4
.8
.016 .031
D 20.80 21.46
.819 .845
E
15.75 16.26
.610 .640
e
5.20
5.72 0.205 0.225
L
19.81 20.32
.780 .800
L1
4.50
.177
∅ P 3.55
3.65
.140 .144
Q
5.89
6.40 0.232 0.252
R
4.32
5.49
.170 .216
S
6.15 BSC
242 BSC
TO-204AE (IXTM) Outline
ns
Pins
Dim.
A
A1
∅b
∅D
e
e1
1 - Gate
2 - Source
Case - Drain
Millimeter
Min.
Max.
6.4
11.4
1.53
3.42
1.45
1.60
22.22
10.67 11.17
5.21
5.71
L
11.18 12.19
∅ p 3.84
4.19
∅p 1 3.84
4.19
q
30.15 BSC
R 12.58 13.33
R1 3.33
4.77
s
16.64 17.14
© 2000 IXYS All rights reserved
IXYS MOSFETS and IGBTs are covered by one or more of the following U.S. patents:
4,835,592
4,881,106
5,017,508
5,049,961
5,187,117
5,486,715
4,850,072
4,931,844
5,034,796
5,063,307
5,237,481
5,381,025
Inches
Min. Max.
.250 .450
.060 .135
.057 .063
.875
.420 .440
.205 .225
.440
.151
.151
1.187
.495
.131
.655
.480
.165
.165
BSC
.525
.188
.675
2-4
IXTH 35N30
Fig. 1 Output Characteristics
80
Fig. 2 Input Admittance
80
8V
7V
VGS = 10V
70
70
TJ = 25°C
60
ID - Amperes
ID - Amperes
60
50
6V
40
30
20
50
TJ = 25°C
40
30
20
5V
10
10
0
0
0
2
4
6
8
10
12
14
0
1
2
3
VDS - Volts
4
5
6
8
9
10
Fig. 4 Temperature Dependence
of Drain to Source Resistance
2.50
2.0
TJ = 25°C
2.25
RDS(on) - Normalized
1.8
1.6
1.4
VGS = 10V
1.2
VGS = 15V
1.0
0.8
2.00
1.75
1.50
ID = 20A
1.25
1.00
0.75
0.6
0
20
40
60
80
100
0.50
-50
120
-25
0
ID - Amperes
25
50
75
100 125 150
TJ - Degrees C
Fig. 5 Drain Current vs.
Case Temperature
Fig. 6 Temperature Dependence of
Breakdown and Threshold Voltage
1.2
50
BVDSS
VGS(th)
1.1
BV/VG(th) - Normalized
40N30
40
ID - Amperes
7
VGS - Volts
Fig. 3 RDS(on) vs. Drain Current
RDS(on) - Normalized
IXTH 40N30
IXTM 40N30
35N30
30
20
10
1.0
0.9
0.8
0.7
0.6
0
-50
-25
0
25
50
75
TC - Degrees C
© 2000 IXYS All rights reserved
100 125 150
0.5
-50
-25
0
25
50
75
100 125 150
TJ - Degrees C
3-4
IXTH 35N30
Fig.7 Gate Charge Characteristic Curve
IXTH 40N30
IXTM 40N30
Fig.8 Forward Bias Safe Operating Area
10
VDS = 150V
10µs
100 Limited by RDS(on)
ID = 21A
8
ID - Amperes
VGE - Volts
IG = 10mA
6
4
100µs
1ms
10
10ms
2
100ms
0
1
0
25
50
75
100 125 150 175 200
1
10
Gate Charge - nCoulombs
VDS - Volts
Fig.9 Capacitance Curves
4500
Fig.10 Source Current vs. Source
to Drain Voltage
80
Ciss
70
4000
60
3500
ID - Amperes
Capacitance - pF
300
100
f = 1 MHz
VDS = 25V
3000
2500
2000
1500
1000
500
5
40
TJ = 25°C
20
Crss
10
10
15
20
0
0.0
25
TJ = 125°C
30
Coss
0
0
50
0.2
Vds - Volts
0.4
0.6
0.8
1.0
1.2
1.4
1.6
VSD - Volts
Fig.11 Transient Thermal Impedance
Thermal Response - K/W
1
D=0.5
0.1
D=0.2
D=0.1
D=0.05
0.01 D=0.02
D=0.01
Single Pulse
0.001
0.00001
0.0001
0.001
0.01
0.1
1
10
Time - Seconds
© 2000 IXYS All rights reserved
4-4