a FEATURES On-Chip Latches for Both DACs +12 V to +15 V Operation DACs Matched to 1% Four Quadrant Multiplication TTL/CMOS Compatible from +12 V to +15 V Latch Free (Protection Schottkys not Required) CMOS Dual 8-Bit Buffered Multiplying DAC AD7628 FUNCTIONAL BLOCK DIAGRAM APPLICATIONS Disk Drives Programmable Filters X-Y Graphics Gain/Attenuation GENERAL DESCRIPTION PRODUCT HIGHLIGHTS The AD7628 is a monolithic dual 8-bit digital/analog converter featuring excellent DAC-to-DAC matching. It is available in small 0.3" wide 20-pin DIPs and in 20-terminal surface mount packages. 1. DAC to DAC matching: since both of the AD7628 DACs are fabricated at the same time on the same chip, precise matching and tracking between DAC A and DAC B is inherent. The AD7628’s matched CMOS DACs make a whole new range of applications circuits possible, particularly in the audio, graphics and process control areas. Separate on-chip latches are provided for each DAC to allow easy microprocessor interface. Data is transferred into either of the two DAC data latches via a common 8-bit TTL/CMOS compatible input port. Control input DAC A/DAC B determines which DAC is to be loaded. The AD7628’s load cycle is similar to the write cycle of a random access memory, and the device is bus compatible with most 8-bit microprocessors, including 6502, 6809, 8085, Z80. The device operates from a +12 V to +15 V power supply and is TTL-compatible over this range. Power dissipation is a low 20 mW. 2. Small package size: combining the inputs to the on-chip DAC latches into a common data bus and adding a DAC A/ DAC B select line has allowed the AD7628 to be packaged in a small 20-pin 0.3" wide DIP, 20-pin SOIC, 20-terminal PLCC and 20-terminal LCC. 3. TTL-Compatibility: All digital inputs are TTL-compatible over a +12 V to +15 V power supply range. Both DACs offer excellent four quadrant multiplication characteristics with a separate reference input and feedback resistor for each DAC. REV. A Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 617/329-4700 World Wide Web Site: http://www.analog.com Fax: 617/326-8703 © Analog Devices, Inc., 1996 = +10.8 V to +15.75 V, V AD7628–SPECIFICATIONS (Votherwise noted) DD REF A = VREF B = +10 V; OUT A = OUT B = 0 V unless Parameter TA = +258C1 TA = –408C to +858C TA = –558C to +1258C1 Units STATIC PERFORMANCE 2 Resolution Relative Accuracy Differential Nonlinearity 8 ± 1/2 ±1 8 ± 1/2 ±1 8 ± 1/2 ±l Bits LSB max LSB max ±2 ±3 ±3 LSB max ± 0.0035 ± 0.0035 %/°C max ± 50 ± 50 8 15 ± 200 ± 200 8 15 ± 200 ± 200 8 15 nA max nA max kΩ min kΩ max ±1 ±1 ±1 % max Gain Error Gain Temperature Coefficient 3 ∆Gain/∆Temperature Output Leakage Current OUT A (Pin 2) OUT B (Pin 20) Input Resistance (V REFA, VREFB) VREFA/VREFB Input Resistance Match DIGITAL INPUTS 4 Input High Voltage (V IH) Input Low Voltage (V IL) Input Current (IIN) Input Capacitance DB0–DB7 WR, CS, DACA/DACB 2.4 0.8 ±1 2.4 0.8 ± 10 2.4 0.8 ± 10 V min V max µA max 10 15 10 15 10 15 pF max pF max SWITCHING CHARACTERISTICS 3 See Timing Diagram Chip Select to Write Set Up Time (t CS) Chip Select to Write Hold Time (t CH) DAC Select to Write Set Up Time (t AS) DAC Select to Write Hold Time (t AH) Data Valid to Write Set Up Time (t DS) Data Valid to Write Hold Time (t DH) Write Pulse Width (t WR) 160 10 160 10 160 10 150 160 10 160 10 160 10 170 210 10 210 10 210 10 210 ns min ns min ns min ns min ns min ns min ns min POWER SUPPLY IDD, K Grade B, T Grades All Grades 2 2 100 2 2.5 500 2.5 500 mA mA µA Test Conditions/Comments This is an Endpoint Linearity Specification All Grades Guaranteed Monotonic Over Full Operating Temperature Range Measured Using Internal RFB A and RFB B. Both DAC Latches Loaded with 11111111. Gain Error is Adjustable Using Circuits of Figures 4 and 5. DAC Latches Loaded with 00000000 Input Resistance TC = –300 ppm/°C, Typical Input Resistance is 11 kΩ VIN = 0 or VDD See Figure 3 All Digital Inputs V IL or VIH All Digital Inputs V IL or VIH All Digital Inputs 0 V or V DD Specifications subject to change without notice. AC PERFORMANCE CHARACTERISTICS These characteristics are included for Design Guidance only and are not subject to test. VDD = +10.8 V to +15.75 V. (Measured Using Recommended PC Board Layout (Figure 7) and AD644 as Output Amplifiers) Parameter TA = +258C1 TA = –408C to +858C1 TA = –558C to +1258πC1 Units DC SUPPLY REJECTION (∆GAIN/∆VDD) 0.01 0.02 0.02 % per % max ∆VDD = ± 5% CURRENT SETTLING TIME 350 400 400 ns max To 1/2 LSB OutA/OutB Load = 100 Ω. WR = CS = 0 V. DB0–DB7 = 0 V to V DD or VDD to 0 V DIGITAL-TO-ANALOG GLITCH IMPULSE 330 nV sec typ For Code Transition 00000000 to 11111111 OUTPUT CAPACITANCE COUTA COUTB COUTA COUTB 25 25 60 60 25 25 60 60 25 25 60 60 pF max pF max pF max pF max DAC Latches Loaded with 00000000 AC FEEDTHROUGH VREFA to OUT A VREFB to OUT B –70 –70 –65 –65 –65 –65 dB max dB max VREFA, V REFB = 20 V p-p Sine Wave @ 10 kHz CHANNEL-TO-CHANNEL ISOLATION VREFA to OUT B –80 VREFB to OUTA dB typ Test Conditions/Comments DAC Latches Loaded with 11111111 Both DAC Latches Loaded with 11111111. VREFA = 20 V p-p Sine Wave @ 10 kHz VREFB = 0 V See Figure 6. VREFB = 20 V p-p Sine Wave @ 10 kHz VREFA = 0 V See Figure 6. –80 dB typ DIGITAL CROSSTALK 60 nV sec typ Measured for Code Transition 00000000 to 11111111 HARMONIC DISTORTION –85 dB typ VIN = 6 V rms @ 1 kHz NOTES 1 Temperature Ranges are K Version; –40°C to +85°C; B Version; –40°C to +85°C; T Version; –55°C to +125°C. 2 Specification applies to both DACs in AD7628. 3 Guaranteed by design but not production tested. 4 Logic inputs are MOS Gates. Typical input current (+25°C) is less than 1 nA. Specifications subject to change without notice. –2– REV. A AD7628 TERMINOLOGY ABSOLUTE MAXIMUM RATINGS (TA = +25°C unless otherwise noted) Relative Accuracy: VDD to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 V, +17 V VDD to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 V, +17 V AGND to DGND . . . . . . . . . . . . . . . . . . . . . . . . VDD + 0.3 V DGND to AGND . . . . . . . . . . . . . . . . . . . . . . . . VDD + 0.3 V Digital Input Voltage to DGND . . . . . . –0.3 V, VDD + 0.3 V VPIN2, VPIN20 to AGND . . . . . . . . . . . . . . –0.3 V, VDD + 0.3 V VREF A, VREF B to AGND . . . . . . . . . . . . . . . . . . . . . . . ± 25 V VRFB A, VRFB B to AGND . . . . . . . . . . . . . . . . . . . . . . . ± 25 V Power Dissipation (Any Package) to +75°C . . . . . . . . 450 mW Derates above +75°C by . . . . . . . . . . . . . . . . . . . 6 mW/°C Operating Temperature Range Commercial (K) Grades . . . . . . . . . . . . . . . –40°C to +85°C Industrial (B) Grades . . . . . . . . . . . . . . . . . –40°C to +85°C Extended (T) Grades . . . . . . . . . . . . . . . . –55°C to +125°C Storage Temperature . . . . . . . . . . . . . . . . . –65°C to +150°C Lead Temperature (Soldering, 10 sec) . . . . . . . . . . . . +300°C Relative accuracy or endpoint nonlinearity is a measure of the maximum deviation from a straight line passing through the endpoints of the DAC transfer function. It is measured after adjusting for zero and full-scale, and is normally expressed in LSBs or as a percentage of full-scale reading. Differential Nonlinearity: Differential nonlinearity is the difference between the measured change and the ideal 1 LSB change between any two adjacent codes. A specified differential nonlinearity of ± 1 LSB max over the operating temperature range ensures monotonicity. Gain Error: Gain error is a measure of the output error between an ideal DAC and the actual device output. It is measured with all 1s in the DAC latches after offset error has been adjusted out. Gain error of both DACs is adjustable to zero with external resistance. Output Capacitance: ORDERING GUIDE Capacitance from OUT A or OUT B to AGND. Model1 Temperature Range Relative Gain Accuracy Error Package Option2 AD7628KN AD7628KP AD7628KR AD7628BQ AD7628TQ AD7628TE –40°C to +85°C –40°C to +85°C –40°C to +85°C –40°C to +85°C –55°C to +125°C –55°C to +125°C ± 1/2 LSB ± 1/2 LSB ± 1/2 LSB ± 1/2 LSB ± 1/2 LSB ± 1/2 LSB N-20 P-20A R-20 Q-20 Q-20 E-20A ± 2 LSB ± 2 LSB ± 2 LSB ± 2 LSB ± 2 LSB ± 2 LSB Digital-to-Analog Glitch Impulse: The amount of charge injected from the digital inputs to the analog output when the inputs change state. This is normally specified as the area of the glitch in either pA-secs or nV-secs, depending upon whether the glitch is measured as a current or voltage signal. Glitch impulse is measured with VREF A, VREF B = AGND. Channel-to-Channel Isolation: The proportion of input signal from one DAC’s reference input that appears at the output of the other DAC, expressed as a ratio in dB. NOTES 1 To order MIL-STD-883, Class B process parts, add /883B to part number. Contact your local sales office for military data sheet. 2 E = Leadless Ceramic Chip Carrier; N = Plastic DIP; P = Plastic Leaded Chip Carrier; Q = Cerdip; R = SOIC. Digital Crosstalk: The glitch energy transferred to the output of one converter due to a change in digital input code to the other converter. Specified in nV secs. PIN CONFIGURATIONS LCCC 17 VDD DGND 5 DB6 8 13 DB1 DB5 9 12 DB2 DB4 10 11 DB3 16 WR DB7 (MSB) 7 15 CS DB6 8 10 11 12 13 4 5 AD7628 17 VDD DAC A/DAC B 6 16 WR DB7 (MSB) 7 TOP VIEW (Not to Scale) DB6 8 CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD7628 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality. REV. A –3– 20 19 DGND 14 DB0 (LSB) 9 1 VREF A DB1 14 DB0 (LSB) TOP VIEW (Not to Scale) DB2 7 DAC A /DAC B 6 DB3 (MSB) DB7 17 VDD DB5 6 16 WR TOP VIEW (Not to Scale) 15 CS 18 VREF B AD7628 DGND 5 DB4 DAC A/DAC B AD7628 VREF A 4 OUT B 4 2 RFB B VREF A 3 18 VREF B 15 CS 14 DB0 (LSB) 9 10 11 12 13 DB1 18 VREF B DB2 3 OUT A RFB A AGND 1 20 19 DB3 2 RFB A 3 DB5 OUT A 19 RFB B DB4 20 OUT B 2 RFB B 1 OUT A OUT B AGND AGND PLCC RFB A DIP, SOIC WARNING! ESD SENSITIVE DEVICE AD7628 INTERFACE LOGIC INFORMATION DAC Selection weighted currents are switched between the DAC output and AGND, thus maintaining fixed currents in each ladder leg independent of switch state. Both DAC latches share a common 8-bit input port. The control input DAC A/DAC B selects which DAC can accept data from the input port. EQUIVALENT CIRCUIT ANALYSIS Figure 2 shows an approximate equivalent circuit for one of the AD7628’s D/A converters, in this case DAC A. A similar equivalent circuit can be drawn for DAC B. Note that AGND (Pin 1) is common for both DAC A and DAC B. Mode Selection Inputs CS and WR control the operating mode of the selected DAC. See Mode Selection Table below. Write Mode The current source ILEAKAGE is composed of surface and junction leakages and, as with most semiconductor devices, approximately doubles every 10°C. The resistor Ro, as shown in Figure 2, is the equivalent output resistance of the device, which varies with input code (excluding all 0s code) from 0.8R to 2R. R is typically 11 kΩ. COUT is the capacitance due to the N-channel switches and varies from about 50 pF to 120 pF, depending on the digital input. g(VREF A, N) is the Thevenin equivalent voltage generator due to the reference input voltage VREF A and the transfer function of the R-2R ladder. When CS and WR are both low, the selected DAC is in the write mode. The input data latches of the selected DAC are transparent and its analog output responds to activity on DB0–DB7. Hold Mode The selected DAC latch retains the data that was present on DB0–DB7 just prior to CS or WR assuming a high state. Both analog outputs remain at the values corresponding to the data in their respective latches. Mode Selection Table DAC A/ DAC B CS WR DAC A DAC B L H X X L L H X L L X H WRITE HOLD HOLD HOLD HOLD WRITE HOLD HOLD For further information on CMOS multiplying D/A converters, refer to “CMOS DAC Application Guide, 2ND Edition” available from Analog Devices, Publication Number G872a–15–4/86. L = Low State, H = High State, X = Don’t Care WRITE CYCLE TIMING DIAGRAM Figure 2. Equivalent Analog Output Circuit of DAC A CIRCUIT INFORMATION–DIGITAL SECTION The input buffers are simple CMOS level-shifters designed so that when the AD7628 is operated with VDD from 10.8 V to 15.75 V, the buffer converts TTL input levels (2.4 V and 0.8 V) into CMOS logic levels. When VIN is in the region of 1.0 volt to 2.0 volts, the input buffers operate in their linear region and pass a quiescent current (see Figure 3). To minimize power supply currents, it is recommended that the digital input voltages be as close to the supply rails (VDD and DGND) as practicably possible. The AD7628 may be operated with any supply voltage in the range 10.8 ≤ VDD ≤ 15.75 volts. CIRCUIT INFORMATION—D/A SECTION The AD7628 contains two identical 8-bit multiplying D/A converters, DAC A and DAC B. Each DAC consists of a highly stable thin film R-2R ladder and eight N-channel current steering switches. A simplified D/A circuit for DAC A is shown in Figure 1. An inverted R-2R ladder structure is used; that is, binary Figure 3. Typical Plot of Supply Current, IDD vs. Logic Input Voltage VIN to VDD = +15 V Figure 1. Simplified Functional Circuit for DAC A –4– REV. A AD7628 Figure 4. Dual DAC Unipolar Binary Operation (2 Quadrant Multiplication). See Table I. Figure 5. Dual DAC Bipolar Operation (4 Quadrant Multiplication). See Table II. Table II. Bipolar (Offset Binary) Code Table Table I. Unipolar Binary Code Table DAC Latch Contents MSB LSB Analog Output (DAC A or DAC B) 255 –V IN 256 129 –V IN 256 128 V IN –V IN =– 2 256 127 –V IN 256 1 –V IN 256 0 –V IN =0 256 11111111 10000001 10000000 01111111 00000001 00000000 NOTE: 1 LSB = (2–8)(VIN) = ( ) 1 V IN 256 DAC Latch Contents MSB LSB 127 +V IN 128 1 +V IN 128 11111111 10000001 10000000 0 1 –V IN 128 127 –V IN 128 01111111 00000001 128 128 –V IN 00000000 NOTE: 1 LSB = (2 –7)(VIN) = Table III. Recommended Trim Resistor Values REV. A Analog Output (DAC A or DAC B) Trim Resistor K/B/T R1; R3 R2; R4 500 150 –5– ( 1 V IN 128 ) AD7628 APPLICATIONS INFORMATION Application Hints Figure 7 shows a printed circuit layout for the AD7628 and the AD644 dual op amp, which minimizes feedthrough and crosstalk. To ensure system performance consistent with AD7628 specifications, careful attention must be given to the following points: SINGLE SUPPLY APPLICATIONS 1. GENERAL GROUND MANAGEMENT: AC or transient voltages between the AD7628 AGND and DGND can cause noise injection into the analog output. The simplest method of ensuring that voltages at AGND and DGND are equal is to tie AGND and DGND together at the AD7628. In more omplex systems where the AGND–DGND intertie is on the backplane, it is recommended that diodes be connected in inverse parallel between the AD7628 AGND and DGND pins (1N914 or equivalent). 2. OUTPUT AMPLIFIER OFFSET: CMOS DACs exhibit a code-dependent output resistance which, in turn, causes a code-dependent amplifier noise gain. The effect is a codedependent differential nonlinearity term at the amplifier output that depends on VOS (VOS is amplifier input offset voltage). This differential nonlinearity term adds to the R/2R differential nonlinearity. To maintain monotonic operation, it is recommended that amplifier VOS be no greater than 10% of 1 LSB over the temperature range of interest. The AD7628 DAC R-2R ladder termination resistors are connected to AGND within the device. This arrangement is particularly convenient for single supply operation because AGND may be biased at any voltage between DGND and VDD. Figure 8 shows a circuit that provides two +5 V to +8 V analog outputs by biasing AGND +5 V up from DGND. The two DAC reference inputs are tied together and a reference input voltage is obtained without a buffer amplifier by making use of the constant and matched impedances of the DAC A and DAC B reference inputs. Current flows through the two DAC R-2R ladders into R1, and R1 is adjusted until the VREF A and VREF B inputs are at +2 V. The two analog output voltages range from +5 V to +8 V for DAC codes 00000000 to l l l l l l l l . 3. HIGH FREQUENCY CONSIDERATIONS: The output capacitance of a CMOS DAC works in conjunction with the amplifier feedback resistance to add a pole to the open loop response. This can cause ringing or oscillation. Stability can be restored by adding a phase compensation capacitor in parallel with the feedback resistor. DYNAMIC PERFORMANCE The dynamic performance of the two DACs in the AD7628 will depend on the gain and phase characteristics of the output amplifiers, together with the optimum choice of the PC board layout and decoupling components. Figure 6 shows the relationship between input frequency and channel-to-channel isolation. Figure 8. AD7628 Single Supply Operation Figure 9 shows DAC A of the AD7628 connected in a positive reference, voltage switching mode. This configuration is useful because VOUT is the same polarity as VIN, allowing single supply operation. However, to retain specified linearity, VIN must be in the range 0 V to +2.5 V and the output buffered or loaded with a high impedance (see Figure 10). Note that the input voltage is connected to the DAC OUT A, and the output voltage is taken from the DAC VREF A pin. Figure 6. Channel-to-Channel Isolation Figure 9. AD7628 Single Supply, Voltage Switching Mode Figure 7. Suggested PC Board Layout for AD7628 with AD644 Dual Op Amp Figure 10. Typical AD7628 Performance in Single Supply Voltage Switching Mode REV. A –6– AD7628 MICROPROCESSOR INTERFACE Figure 11. AD7628 Dual DAC to 6800 CPU Interface Figure 12. AD7628 Dual DAC to 8085 CPU Interface PROGRAMMABLE WINDOW COMPARATOR In the circuit of Figure 13, the AD7628 is used to implement a programmable window comparator. DACs A and B are loaded with the required upper and lower voltage limits for the test, respectively. If the test input is not within the programmed limits, the pass/fail output will indicate a fail (logic zero). Figure 13. Digitally Programmable Window Comparator (Upper and Lower Limit Detector) CIRCUIT EQUATIONS PROGRAMMABLE STATE VARIABLE FILTER C1 = C2, R1 = R2, R4 = R5 1 fC = 2 π R C 1 1 Q= R3 . RF R4 RFBB1 AO = – RF RS NOTE DAC equivalent resistance equals ( 256 × DAC Ladder resistance ) DAC Digital Code Figure 14. Digitally Controlled State Variable Filter In this state, variable or universal filter configuration (Figure 14) for DACs A1 and B1 control the gain and Q of the filter characteristic, while DACs A2 and B2 control the cutoff frequency, fC. DACs A2 and B2 must track accurately for the simple expression for fC to hold. This is readily accomplished by the AD7628. Op amps are 2 × AD644. C3 compensates for the effects of op amp gain-bandwidth limitations. REV. A The filter provides low pass, high pass and band pass outputs and is ideally suited for applications where microprocessor control of filter parameters is required, e.g., equalizer, tone controls, etc. Programmable range for component values shown is fC = 0 kHz to 15 kHz and Q = 0.3 to 4.5. –7– AD7628 DIGITALLY CONTROLLED DUAL TELEPHONE ATTENUATOR MECHANICAL INFORMATION OUTLINE DIMENSIONS In this configuration, the AD7628 functions as a 2-channel digitally controlled attenuator; ideal for stereo audio and telephone signal level control applications. Table IV gives input codes vs. attenuation for a 0 dB to 15.5 dB range. Dimensions shown in inches and (mm). C1029a–8–3/88 20-Pin Cerdip (Q Suffix) Attenuation, dB 20 Input Code = 256 × 10 exp − 20-Pin Plastic DIP (N Suffix) Figure 15. Digitally Controlled Dual Telephone Attenuator Table IV. Attenuation vs. DAC A, DAC B Code for the Circuit of Figure 15 Code in DAC Input Decimal Attn. dB Code Code in Decimal 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0 6.5 7.0 7.5 255 242 228 215 203 192 181 171 162 152 144 136 128 121 114 108 102 96 91 86 81 76 72 68 64 61 57 54 51 48 46 43 11111111 11110010 11100100 11010111 11001011 11000000 10110101 10101011 10100010 10011000 10010000 10001000 10000000 0111001 01110010 01101100 8.0 8.5 9.0 9.5 10.0 10.5 11.0 11.5 12.0 12.5 13.0 13.5 14.0 14.5 15.0 15.5 01100110 01100000 01011011 01010110 01010001 01001100 01001000 01000100 01000000 00111101 00111001 00110110 0011001 00110000 00101110 00101011 20-Terminal Plastic Leaded Chip Carrier (P Suffix) –8– PRINTED IN U.S.A. DAC Input Attn. dB Code 20-Terminal Leadless Chip Carrier (E Suffix) REV. A