Philips Semiconductors Objective specification Silicon Diffused Power Transistor BU4523DW GENERAL DESCRIPTION Enhanced performance, new generation, high-voltage, high-speed switching npn transistor in a plastic envelope with an integrated damper diode intended for use in horizontal deflection circuits of colour television receivers and p.c monitors. Features exceptional tolerance to base drive and collector current load variations resulting in a very low worst case dissipation. QUICK REFERENCE DATA SYMBOL PARAMETER CONDITIONS TYP. MAX. UNIT VCESM VCEO IC ICM Ptot VCEsat ICsat Collector-emitter voltage peak value Collector-emitter voltage (open base) Collector current (DC) Collector current peak value Total power dissipation Collector-emitter saturation voltage Collector saturation current. VBE = 0 V VF tf Diode forward voltage Fall time 8 6.5 0.3 t.b.f 1500 800 11 29 125 3.0 2.2 0.4 t.b.f V V A A W V A A V µs µs PINNING - SOT429 PIN PIN CONFIGURATION SYMBOL DESCRIPTION 1 base 2 collector 3 emitter tab Ths ≤ 25 ˚C IC = 8 A; IB = 2 A f = 16 kHz f = 70 kHz IF = 8.0 A ICsat = 8 A; f = 16 kHz f = 70 kHz collector c b Rbe 1 2 e 3 LIMITING VALUES Limiting values in accordance with the Absolute Maximum Rating System (IEC 134) SYMBOL PARAMETER CONDITIONS VCESM VCEO IC ICM IB IBM -IBM Ptot Tstg Tj Collector-emitter voltage peak value Collector-emitter voltage (open base) Collector current (DC) Collector current peak value Base current (DC) Base current peak value Reverse base current peak value 1 Total power dissipation Storage temperature Junction temperature VBE = 0 V Ths ≤ 25 ˚C MIN. MAX. UNIT -55 - 1500 800 11 29 7 10 7 125 150 150 V V A A A A A W ˚C ˚C 1 Turn-off current. July 1998 1 Rev 1.000 Philips Semiconductors Objective specification Silicon Diffused Power Transistor BU4523DW THERMAL RESISTANCES SYMBOL PARAMETER CONDITIONS Rth j-mb Junction to mounting base with heatsink compound Rth j-a Junction to ambient in free air TYP. MAX. UNIT - 1 K/W 45 - K/W MIN. TYP. MAX. UNIT - - 1.0 2.0 mA mA 7.5 800 12.5 46 - - V Ω V 0.85 4.2 - 0.95 t.b.f 5.8 - 3.0 1.1 7.3 2.2 V V TYP. MAX. UNIT 4.5 0.30 5.5 0.40 µs µs t.b.f t.b.f t.b.f t.b.f µs µs STATIC CHARACTERISTICS Ths = 25 ˚C unless otherwise specified SYMBOL PARAMETER CONDITIONS 2 ICES ICES Collector cut-off current BVEBO Rbe VCEOsust Emitter-base breakdown voltage Base-emitter resistance Collector-emitter sustaining voltage VCEsat VBEsat hFE hFE VF Collector-emitter saturation voltage Base-emitter saturation voltage DC current gain Diode forward voltage VBE = 0 V; VCE = VCESMmax VBE = 0 V; VCE = VCESMmax; Tj = 125 ˚C IB = 600 mA VEB = 7.5 V IB = 0 A; IC = 100 mA; L = 25 mH IC = 8 A; IB = 2 A IC = 8 A; IB = 2 A IC = 1 A; VCE = 5 V IC = 8 A; VCE = 5 V IF = 8.0 A V DYNAMIC CHARACTERISTICS Ths = 25 ˚C unless otherwise specified SYMBOL ts tf PARAMETER CONDITIONS Switching times (16 kHz line deflection circuit) ICsat = 8.0 A;IB1 = 1.6 A (IB2 = -4.0 A) Turn-off storage time Turn-off fall time Switching times (70 kHz line deflection circuit) ts tf ICsat = t.b.f Turn-off storage time Turn-off fall time 2 Measured with half sine-wave voltage (curve tracer). July 1998 2 Rev 1.000 Philips Semiconductors Objective specification Silicon Diffused Power Transistor BU4523DW MECHANICAL DATA Dimensions in mm 5.3 max 16 max 1.8 Net Mass: 5 g 5.3 o 3.5 max 7.3 3.5 21 max 15.5 max seating plane 2.5 15.5 min 4.0 max 1 2 3 0.9 max 2.2 max 1.1 3.2 max 5.45 0.4 M 5.45 Fig.1. SOT429; pin 2 connected to mounting base. Notes 1. Refer to mounting instructions for SOT429 envelope. 2. Epoxy meets UL94 V0 at 1/8". July 1998 3 Rev 1.000 Philips Semiconductors Objective specification Silicon Diffused Power Transistor BU4523DW DEFINITIONS Data sheet status Objective specification This data sheet contains target or goal specifications for product development. Preliminary specification This data sheet contains preliminary data; supplementary data may be published later. Product specification This data sheet contains final product specifications. Limiting values Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of this specification is not implied. Exposure to limiting values for extended periods may affect device reliability. Application information Where application information is given, it is advisory and does not form part of the specification. Philips Electronics N.V. 1998 All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner. The information presented in this document does not form part of any quotation or contract, it is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent or other industrial or intellectual property rights. LIFE SUPPORT APPLICATIONS These products are not designed for use in life support appliances, devices or systems where malfunction of these products can be reasonably expected to result in personal injury. Philips customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such improper use or sale. July 1998 4 Rev 1.000