Revised September 2000 74F10 Triple 3-Input NAND Gate General Description This device contains three independent gates, each of which performs the logic NAND function. Ordering Code: Order Number Package Number Package Description 74F10SC M14A 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow 74F10SJ M14D 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 74F10PC N14A 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code. Logic Symbol Connection Diagram IEEE/IEC Unit Loading/Fan Out Pin Names U.L. Input IIH/IIL HIGH/LOW Output IOH/IOL Description A n , B n , Cn Inputs 1.0/1.0 20 µA/−0.6 mA On Outputs 50/33.3 −1 mA/20 mA © 2000 Fairchild Semiconductor Corporation DS009458 www.fairchildsemi.com 74F10 Triple 3-Input NAND Gate April 1988 74F10 Absolute Maximum Ratings(Note 1) Recommended Operating Conditions Storage Temperature −65°C to +150°C Ambient Temperature under Bias −55°C to +125°C Free Air Ambient Temperature Junction Temperature under Bias −55°C to +150°C Supply Voltage 0°C to +70°C +4.5V to +5.5V −0.5V to +7.0V VCC Pin Potential to Ground Pin Input Voltage (Note 2) −0.5V to +7.0V Input Current (Note 2) −30 mA to +5.0 mA Voltage Applied to Output in HIGH State (with VCC = 0V) Standard Output −0.5V to VCC 3-STATE Output −0.5V to +5.5V Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs. Current Applied to Output in LOW State (Max) twice the rated IOL (mA) DC Electrical Characteristics Symbol Parameter Min Typ Max Units Conditions Input HIGH Voltage VIL Input LOW Voltage 0.8 V VCD Input Clamp Diode Voltage −1.2 V Min V Min 0.5 V Min IOL = 20 mA 5.0 µA Max VIN = 2.7V 7.0 µA Max VIN = 7.0V 50 µA Max VOUT = VCC V 0.0 3.75 µA 0.0 −0.6 mA Max VIN = 0.5V −150 mA Max VOUT = 0V VOH Output HIGH Voltage VOL Output LOW 2.0 VCC VIH 10% VCC 2.5 5% VCC 2.7 V 10% VCC Voltage IIH Input HIGH Current IBVI Input HIGH Current Breakdown Test ICEX Output HIGH Leakage Current VID Input Leakage 4.75 Test IOD Output Leakage Circuit Current Recognized as a HIGH Signal Recognized as a LOW Signal IIN = −18 mA IOH = −1 mA IOH = −1 mA IID = 1.9 µA All other pins grounded VIOD = 150 mV All other pins grounded IIL Input LOW Current IOS Output Short-Circuit Current ICCH Power Supply Current 1.4 2.1 mA Max VO = HIGH ICCL Power Supply Current 5.1 7.7 mA Max VO = LOW −60 AC Electrical Characteristics Symbol Parameter TA = +25°C TA = −55°C to +125°C TA = 0°C to +70°C VCC = +5.0V VCC = +5.0V VCC = +5.0V CL = 50 pF CL = 50 pF CL = 50 pF Min Typ Max Min Max Min Max tPLH Propagation Delay 2.4 3.7 5.0 2.0 7.0 2.4 6.0 tPHL An, Bn, Cn to O n 1.5 3.2 4.3 1.5 6.5 1.5 5.3 www.fairchildsemi.com 2 Units ns 74F10 Physical Dimensions inches (millimeters) unless otherwise noted 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow Package Number M14A 3 www.fairchildsemi.com 74F10 Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide Package Number M14D www.fairchildsemi.com 4 74F10 Triple 3-Input NAND Gate Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Package Number N14A Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. www.fairchildsemi.com 5 www.fairchildsemi.com