FAIRCHILD 74F132SC

74F132
Quad 2-Input NAND Schmitt Trigger
tm
General Description
The F132 contains four 2-input NAND gates which
accept standard TTL input signals and provide standard
TTL output levels. They are capable of transforming
slowly changing input signals into sharply defined, jitterfree output signals. In addition, they have a greater noise
margin than conventional NAND gates.
Each circuit contains a 2-input Schmitt Trigger followed
by level shifting circuitry and a standard FAST output
structure. The Schmitt Trigger uses positive feedback to
effectively speed-up slow input transitions, and provide
different input threshold voltages for positive and
negative-going transitions. This hysteresis between the
positive-going and negative-going input threshold (typically 800mV) is determined by resistor ratios and is
essentially insensitive to temperature and supply voltage
variations.
Ordering Information
Order
Number
Package
Number
Package Description
74F132SC
M14A
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow
74F132SJ
M14D
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering number.
Connection Diagram
Logic Symbol
IEEE/IEC
Function Table
Unit Loading/Fan Out
Inputs
Outputs
Pin
U.L.
Input IIH/IIL,
Names Description HIGH/LOW Output IOH/IOL
A
B
O
An, Bn
Inputs
1.0 / 1.0
20µA / –0.6mA
L
L
H
On
Outputs
50 / 33.3
–1mA / 20mA
L
H
H
H
L
H
H
H
L
H = HIGH Voltage Level
FAST® is a registered trademark of Fairchild Semiconductor Corporation.
©1988 Fairchild Semiconductor Corporation
74F132 Rev. 1.3
L = LOW Voltage Level
www.fairchildsemi.com
74F132 Quad 2-Input NAND Schmitt Trigger
May 2007
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
TSTG
Parameter
Rating
Storage Temperature
–65°C to +150°C
TA
Ambient Temperature Under Bias
–55°C to +125°C
TJ
Junction Temperature Under Bias
–55°C to +150°C
VCC
VCC Pin Potential to Ground Pin
–0.5V to +7.0V
VIN
Input Voltage(1)
–0.5V to +7.0V
IIN
Input Current(1)
–30mA to +5.0mA
VO
Voltage Applied to Output in HIGH State (with VCC = 0V)
Standard Output
–0.5V to VCC
3-STATE Output
–0.5V to 5.5V
Current Applied to Output in LOW State (Max.)
twice the rated IOL (mA)
ESD Last Passing Voltage (Min.)
4000V
Note:
1. Either voltage limit or current limit is sufficient to protect inputs.
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not
recommend exceeding them or designing to absolute maximum ratings.
Symbol
TA
VCC
Parameter
Rating
Free Air Ambient Temperature
0°C to +70°C
Supply Voltage
©1988 Fairchild Semiconductor Corporation
74F132 Rev. 1.3
+4.5V to +5.5V
www.fairchildsemi.com
2
74F132 Quad 2-Input NAND Schmitt Trigger
Absolute Maximum Ratings
Symbol
Parameter
VCC
Conditions
Min.
Typ.
Max.
Units
VT+
Positive-going Threshold
5.0
1.5
2.0
V
VT–
Negative-going Threshold
5.0
0.7
1.1
V
+
–)
∆VT
Hysteresis (VT – VT
VCD
Input Clamp Diode Voltage
Min.
IIN = –18mA
VOH
Output HIGH Voltage 10% VCC
5% VCC
Min.
IOH = –1mA
2.5
IOH = –1mA
2.7
5.0
0.4
V
–1.2
V
V
VOL
Output LOW Voltage
Min.
IOL = 20mA
0.5
V
IIH
Input HIGH Current
Max.
VIN = 2.7V
5.0
µA
IBVI
Input HIGH Current Breakdown
Test
Max.
VIN = 7.0V
7.0
µA
ICEX
Output HIGH Leakage Current
Max.
50
µA
VID
Input Leakage Test
0.0
IID = 1.9µA, All Other
Pins Grounded
IOD
Output Leakage Circuit Current
0.0
VIOD = 150mV, All Other
Pins Grounded
3.75
µA
IIL
Input LOW Current
Max
VIN = 0.5V
–0.6
mA
IOS
Output Short-Circuit Current
Max
VOUT = 0V
–150
mA
ICCH
Power Supply Current
Max
VO = HIGH
17.0
mA
ICCL
Power Supply Current
Max
VO = LOW
18.0
mA
10% VCC
VOUT = VCC
4.75
V
–60
AC Electrical Characteristics
TA = +25°C,
VCC = +5.0V,
CL = 50pF
Symbol
tPLH
tPHL
Parameter
Propagation Delay,
An, Bn to On
©1988 Fairchild Semiconductor Corporation
74F132 Rev. 1.3
Min.
Typ.
TA = 0°C to +70°C,
VCC = +5.0V,
CL = 50pF
Max.
Min.
Max.
Units
4.0
10.5
3.5
12.0
ns
5.0
12.5
5.0
13.0
www.fairchildsemi.com
3
74F132 Quad 2-Input NAND Schmitt Trigger
DC Electrical Characteristics
74F132 Quad 2-Input NAND Schmitt Trigger
Physical Dimensions
Dimensions are in millimeters unless otherwise noted.
Figure 1. 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow
Package Number M14A
©1988 Fairchild Semiconductor Corporation
74F132 Rev. 1.3
www.fairchildsemi.com
4
74F132 Quad 2-Input NAND Schmitt Trigger
Physical Dimensions (Continued)
Dimensions are in millimeters unless otherwise noted.
Figure 2. 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M14D
©1988 Fairchild Semiconductor Corporation
74F132 Rev. 1.3
www.fairchildsemi.com
5
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DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS
HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE
APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER
ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S
WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR
SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the body or
(b) support or sustain life, and (c) whose failure to perform
when properly used in accordance with instructions for use
provided in the labeling, can be reasonably expected to
result in a significant injury of the user.
2. A critical component in any component of a life support,
device, or system whose failure to perform can be
reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Advance Information
Formative or In Design
This datasheet contains the design specifications for product
development. Specifications may change in any manner without notice.
Definition
Preliminary
First Production
This datasheet contains preliminary data; supplementary data will be
published at a later date. Fairchild Semiconductor reserves the right to
make changes at any time without notice to improve design.
No Identification Needed
Full Production
This datasheet contains final specifications. Fairchild Semiconductor
reserves the right to make changes at any time without notice to improve
design.
Obsolete
Not In Production
This datasheet contains specifications on a product that has been
discontinued by Fairchild Semiconductor. The datasheet is printed for
reference information only.
Rev. I26
©1988 Fairchild Semiconductor Corporation
74F132 Rev. 1.3
www.fairchildsemi.com
6
74F132 Quad 2-Input NAND Schmitt Trigger
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an
exhaustive list of all such trademarks.