TC74HC4511AP/AF TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC74HC4511AP,TC74HC4511AF BCD-to-7 Segment Latch/Decoder/Driver The TC74HC4511A is a high speed CMOS BCD-TO-7 SEGMENT LATCH/DECODER/DRIVER fabricated with silicon gate C2MOS technology. It achieves the high speed operation similar to equivalent LSTTL while maintaining the CMOS low power dissipation. The segment output driver, which is of CMOS construction, has a large IOH capability which permits the device to drive cathode common LED directly. When lamp test (LT) is held low, all segment outputs will go high, and when the blanking input (BI) is held low and LT is held high, all segment outputs will go low. These functions are independent of other inputs and used to test the display. BI is used to pulse - modulate the brightness of the display. When error code (over 10) is applied to BCD inputs, all segment outputs will go to low (turn off). All inputs are equipped with protection circuits against static discharge or transient excess voltage. TC74HC4511AP TC74HC4511AF Features • High speed: tpd = 28 ns (typ.) at VCC = 5 V • Low power dissipation: ICC = 4 μA (max) at Ta = 25°C • High noise immunity: VNIH = VNIL = 28% VCC (min) • Output drive capability: 10 LSTTL loads • Symmetrical output impedance: |IOH| = 20 mA • Wide operating voltage range: VCC (opr) = 2 to 6 V • Pin and function compatible with TC4511B Weight DIP16-P-300-2.54A SOP16-P-300-1.27A : 1.00 g (typ.) : 0.18 g (typ.) Pin Assignment 1 2007-10-01 TC74HC4511AP/AF IEC Logic Symbol LT BI LE A B C D (3) (4) (5) (7) (1) (2) (6) BCD / 7･SEG ［T］ V11 G10 C9 9D 1 2 4 8 a10,11 b10,11 c10,11 d10,11 e10,11 f10,11 g10,11 (13) (12) (11) (10) (9) (15) (14) a b c d e f g [T]: Truth Table Display Mode Block Diagram 2 2007-10-01 TC74HC4511AP/AF Truth Table Inputs Outputs Display Mode LE BI LT D C B A a b c d e f g * * L * * * * H H H H H H H 8 * L H * * * * L L L L L L L Blank L H H L L L L H H H H H H L 0 L H H L L L H L H H L L L L 1 L H H L L H L H H L H H L H 2 L H H L L H H H H H H L L H 3 L H H L H L L L H H L L H H 4 L H H L H L H H L H H L H H 5 L H H L H H L L L H H H H H 6 L H H L H H H H H H L L L L 7 L H H H L L L H H H H H H H 8 L H H H L L H H H H L L H H 9 L H H H L H * L L L L L L L Blank L H H H H * * L L L L L L L Blank H H H * * * * Hold the stage at the leading edge of LE *: Don’t care 3 2007-10-01 TC74HC4511AP/AF Logic Diagram 4 2007-10-01 TC74HC4511AP/AF Absolute Maximum Ratings (Note 1) Characteristics Symbol Rating Unit Supply voltage range VCC −0.5 to 7 V DC input voltage VIN −0.5 to VCC + 0.5 V VOUT −0.5 to VCC + 0.5 V Input diode current IIK ±20 mA Output diode current IOK ±20 mA DC output current IOUT +25 (sinc)/−35 (source) mA DC VCC/ground current ICC +150 (ICC)/−50 (IGND) mA Power dissipation PD 500 (DIP) (Note 2)/180 (SOP) mW Storage temperature Tstg −65 to 150 °C DC output voltage Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 2: 500 mW in the range of Ta = −40 to 65°C. From Ta = 65 to 85°C a derating factor of −10 mW/°C shall be applied until 300 mW. Operating Ranges (Note) Characteristics Symbol Rating Unit Supply voltage VCC 2 to 6 V Input voltage VIN 0 to VCC V VOUT 0 to VCC V Operating temperature Topr −40 to 85 °C Input rise and fall time tr, tf Output voltage 0 to 1000 (VCC = 2.0 V) 0 to 500 (VCC = 4.5 V) ns 0 to 400 (VCC = 6.0 V) Note: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND. 5 2007-10-01 TC74HC4511AP/AF Electrical Characteristics DC Characteristics High-level input voltage Low-level input voltage High-level output voltage Low-level output voltage Symbol ⎯ VIH ⎯ VIL VOH VOL Ta = −40 to 85°C Ta = 25°C Test Condition Characteristics VCC (V) Min Typ. Max Min Max 2.0 1.50 ⎯ ⎯ 1.50 ⎯ 4.5 3.15 ⎯ ⎯ 3.15 ⎯ 6.0 4.20 ⎯ ⎯ 4.20 ⎯ 2.0 ⎯ ⎯ 0.50 ⎯ 0.50 4.5 ⎯ ⎯ 1.35 ⎯ 1.35 6.0 ⎯ ⎯ 1.80 ⎯ 1.80 2.0 1.9 2.0 ⎯ 1.9 ⎯ IOH = −20 μA 4.5 4.4 4.5 ⎯ 4.4 ⎯ VIN = VIH or IOH = −6 mA VIL 6.0 5.9 6.0 ⎯ 5.9 ⎯ 4.5 4.18 4.31 IOH = −20 mA 4.5 3.20 3.80 IOH = −7.8 mA 6.0 5.68 5.80 2.0 ⎯ 0.0 0.1 ⎯ 0.1 4.5 ⎯ 0.0 0.1 ⎯ 0.1 6.0 ⎯ 0.0 0.1 ⎯ 0.1 IOL = 4 mA 4.5 ⎯ 0.17 0.26 ⎯ 0.33 IOL = 5.2 mA 6.0 ⎯ 0.18 0.26 ⎯ 0.33 VIN = VIH or VIL IOL = 20 μA ⎯ ⎯ 4.13 2.90 5.63 Unit V V V ⎯ ⎯ V Input leakage current IIN VIN = VCC or GND 6.0 ⎯ ⎯ ±0.1 ⎯ ±1.0 μA Quiescent supply current ICC VIN = VCC or GND 6.0 ⎯ ⎯ 4.0 ⎯ 40.0 μA Ta = −40 to 85°C Unit Timing Requirements (input: tr = tf = 6 ns) Characteristics Minimum pulse width (LE) Minimum set-up time Minimum hold time Ta = 25°C Test Condition Symbol ⎯ tW (L) ⎯ ts ⎯ th 6 VCC (V) Typ. Limit Limit 2.0 ⎯ 75 95 4.5 ⎯ 15 19 6.0 ⎯ 13 16 2.0 ⎯ 75 95 4.5 ⎯ 15 19 6.0 ⎯ 13 16 2.0 ⎯ 0 0 4.5 ⎯ 0 0 6.0 ⎯ 0 0 ns ns ns 2007-10-01 TC74HC4511AP/AF AC Characteristics (CL = 15 pF, VCC = 5 V, Ta = 25°C, input: tr = tf = 6 ns) Characteristics Symbol Test Condition Min Typ. Max Unit Output transition time tTLH ⎯ ⎯ 4 8 ns Output transition time tTHL ⎯ ⎯ 4 8 ns Propagation delay time tpLH (BCD-segment) tpHL ⎯ ⎯ 28 45 ns Propagation delay time tpLH ( BI -segment) tpHL ⎯ ⎯ 18 31 ns Propagation delay time tpLH ( LT -segment) tpHL ⎯ ⎯ 12 21 ns Propagation delay time tpLH (LE-segment) tpHL ⎯ ⎯ 26 44 ns AC Characteristics (CL = 50 pF, input: tr = tf = 6 ns) Characteristics Output transition time low to high Output transition time high to low Symbol tTLH tTHL Propagation delay time tpLH (BCD-segment) tpHL Propagation delay time tpLH ( BI -segment) tpHL Propagation delay time tpLH ( LT -segment) tpHL Propagation delay time tpLH (LE-segment) tpHL Input capacitance CIN Power dissipation capacitance CPD Note: (Note) Ta = −40 to 85°C Ta = 25°C Test Condition Unit VCC (V) Min Typ. Max Min Max 2.0 ⎯ 25 60 ⎯ 75 4.5 ⎯ 7 12 ⎯ 15 6.0 ⎯ 6 11 ⎯ 13 2.0 ⎯ 30 75 ⎯ 95 4.5 ⎯ 8 15 ⎯ 19 6.0 ⎯ 7 13 ⎯ 16 2.0 ⎯ 125 255 ⎯ 320 4.5 ⎯ 33 51 ⎯ 64 6.0 ⎯ 23 43 ⎯ 54 2.0 ⎯ 70 175 ⎯ 220 4.5 ⎯ 22 35 ⎯ 44 6.0 ⎯ 17 30 ⎯ 37 2.0 ⎯ 60 120 ⎯ 150 4.5 ⎯ 15 24 ⎯ 30 6.0 ⎯ 12 20 ⎯ 26 2.0 ⎯ 95 240 ⎯ 300 4.5 ⎯ 32 48 ⎯ 60 6.0 ⎯ 23 41 ⎯ 51 ⎯ ⎯ 5 10 ⎯ 10 pF ⎯ ⎯ 95 ⎯ ⎯ ⎯ pF ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ns ns ns ns ns ns CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC (opr) = CPD･VCC･fIN + ICC 7 2007-10-01 TC74HC4511AP/AF Application Circuit Static Display Circuit Recommended Resistance R 8 Display Color Letter Hight R TLR358T Red 13.4 mm 390 Ω TLR362T Red 14.2 390 Ω TLR332T Red 7.6 390 Ω TLR342T Red 10.9 390 Ω TLG358T Green 13.4 mm 160 Ω TLG362T Green 14.2 160 Ω TLG332T Green 7.6 160 Ω TLG342T Green 10.9 160 Ω 2007-10-01 TC74HC4511AP/AF Package Dimensions Weight: 1.00 g (typ.) 9 2007-10-01 TC74HC4511AP/AF Package Dimensions Weight: 0.18 g (typ.) 10 2007-10-01 TC74HC4511AP/AF RESTRICTIONS ON PRODUCT USE 20070701-EN GENERAL • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 11 2007-10-01