CYPRESS CY7C15632KV18

CY7C15632KV18
72-Mbit QDR® II+ SRAM Four-Word Burst
Architecture (2.5 Cycle Read Latency)
72-Mbit QDR® II+ SRAM Four-Word Burst Architecture (2.5 Cycle Read Latency)
Features
Configurations
Separate Independent Read and Write Data Ports
❐ Supports concurrent transactions
With Read Cycle Latency of 2.5 cycles:
■
500 MHz Clock for High Bandwidth
■
Four-word Burst for Reducing Address Bus Frequency
Functional Description
■
Double Data Rate (DDR) Interfaces on both Read and Write
Ports (data transferred at 1000 MHz) at 500 MHz
■
Available in 2.5 Clock Cycle Latency
■
Two Input Clocks (K and K) for precise DDR Timing
❐ SRAM uses rising edges only
■
Echo Clocks (CQ and CQ) simplify Data Capture in High Speed
Systems
■
Data Valid Pin (QVLD) to indicate Valid Data on the Output
■
Single Multiplexed Address Input Bus latches Address Inputs
for Read and Write Ports
■
Separate Port selects for Depth Expansion
■
Synchronous Internally Self-timed Writes
■
QDR® II+ operates with 2.5 cycle read latency when DOFF is
asserted HIGH
■
■
Operates similar to QDR I Device with one Cycle Read Latency
when DOFF is asserted LOW
■
Available in × 18 Configuration
■
Full Data Coherency, providing Most Current Data
■
Core VDD = 1.8 V ± 0.1 V; I/O VDDQ = 1.4 V to VDD [1]
❐ Supports both 1.5 V and 1.8 V I/O supply
■
HSTL Inputs and Variable Drive HSTL Output Buffers
■
Available in 165-ball FBGA Package (13 × 15 × 1.4 mm)
■
Offered in both Pb-free and non Pb-free Packages
■
JTAG 1149.1 compatible Test Access Port
■
Phase-Locked Loop (PLL) for Accurate Data Placement
CY7C15632KV18 – 4 M × 18
The CY7C15632KV18 is a 1.8 V Synchronous Pipelined SRAM,
equipped with QDR II+ architecture. Similar to QDR II
architecture, QDR II+ architecture consists of two separate ports:
the read port and the write port to access the memory array. The
read port has dedicated data outputs to support read operations
and the write port has dedicated data inputs to support write
operations. QDR II+ architecture has separate data inputs and
data outputs to completely eliminate the need to “turnaround” the
data bus that exists with common I/O devices. Each port is
accessed through a common address bus. Addresses for read
and write addresses are latched on alternate rising edges of the
input (K) clock. Accesses to the QDR II+ read and write ports are
completely independent of one another. To maximize data
throughput, both read and write ports are equipped with DDR
interfaces. Each address location is associated with four 18-bit
words that burst sequentially into or out of the device. Because
data is transferred into and out of the device on every rising edge
of both input clocks (K and K), memory bandwidth is maximized
while simplifying system design by eliminating bus
“turnarounds”.
Depth expansion is accomplished with port selects, which
enables each port to operate independently.
All synchronous inputs pass through input registers controlled by
the K or K input clocks. All data outputs pass through output
registers controlled by the K or K input clocks. Writes are
conducted with on-chip synchronous self-timed write circuitry.
Selection Guide
Description
Maximum Operating Frequency
Maximum Operating Current
× 18
500 MHz
450 MHz
400 MHz
Unit
500
450
400
MHz
850
780
710
mA
Note
1. The Cypress QDR II+ devices surpass the QDR consortium specification and can support VDDQ = 1.4 V to VDD.
Cypress Semiconductor Corporation
Document Number: 001-54932 Rev. *F
•
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised June 26, 2012
CY7C15632KV18
Logic Block Diagram – CY7C15632KV18
DOFF
Address
Register
Read Add. Decode
Write
Reg
1M x 18 Array
K
CLK
Gen.
Write
Reg
1M x 18 Array
K
Write
Reg
1M x 18 Array
Address
Register
Write
Reg
1M x 18 Array
A(19:0)
20
18
Write Add. Decode
D[17:0]
Control
Logic
20
A(19:0)
RPS
Read Data Reg.
CQ
72
VREF
WPS
BWS[1:0]
36
Control
Logic
36
Reg.
Reg.
Reg. 18
18
18
18
CQ
18
Q[17:0]
QVLD
Document Number: 001-54932 Rev. *F
Page 2 of 30
CY7C15632KV18
Contents
Pin Configurations ........................................................... 4
Pin Definitions .................................................................. 5
Functional Overview ........................................................ 6
Read Operations ......................................................... 6
Write Operations ......................................................... 6
Byte Write Operations ................................................. 6
Concurrent Transactions ............................................. 7
Depth Expansion ......................................................... 7
Programmable Impedance .......................................... 7
Echo Clocks ................................................................ 7
Valid Data Indicator (QVLD) ........................................ 7
PLL .............................................................................. 7
Application Example ........................................................ 8
Truth Table ........................................................................ 9
Write Cycle Descriptions ............................................... 10
IEEE 1149.1 Serial Boundary Scan (JTAG) .................. 11
Disabling the JTAG Feature ...................................... 11
Test Access Port ....................................................... 11
Performing a TAP Reset ........................................... 11
TAP Registers ........................................................... 11
TAP Instruction Set ................................................... 11
TAP Controller State Diagram ....................................... 13
TAP Controller Block Diagram ...................................... 14
TAP Electrical Characteristics ...................................... 14
TAP AC Switching Characteristics ............................... 15
TAP Timing and Test Conditions .................................. 16
Identification Register Definitions ................................ 17
Scan Register Sizes ....................................................... 17
Document Number: 001-54932 Rev. *F
Instruction Codes ........................................................... 17
Boundary Scan Order .................................................... 18
Power Up Sequence in QDR II+ SRAM ......................... 19
Power Up Sequence ................................................. 19
PLL Constraints ......................................................... 19
Maximum Ratings ........................................................... 20
Operating Range ............................................................. 20
Neutron Soft Error Immunity ......................................... 20
Electrical Characteristics ............................................... 20
DC Electrical Characteristics ..................................... 20
AC Electrical Characteristics ..................................... 21
Capacitance .................................................................... 21
Thermal Resistance ........................................................ 21
AC Test Loads and Waveforms ..................................... 22
Switching Characteristics .............................................. 23
Switching Waveforms .................................................... 25
Read/Write/Deselect Sequence ................................ 25
Ordering Information ...................................................... 26
Ordering Code Definitions ......................................... 26
Package Diagram ............................................................ 27
Acronyms ........................................................................ 28
Document Conventions ................................................. 28
Units of Measure ....................................................... 28
Document History Page ................................................. 29
Sales, Solutions, and Legal Information ...................... 30
Worldwide Sales and Design Support ....................... 30
Products .................................................................... 30
PSoC Solutions ......................................................... 30
Page 3 of 30
CY7C15632KV18
Pin Configurations
The pin configuration for CY7C15632KV18 follows. [2]
Figure 1. 165-ball FBGA (13 × 15 × 1.4 mm) pinout
CY7C15632KV18 (4 M × 18)
1
2
3
4
5
6
7
8
9
10
11
A
CQ
NC/144M
A
WPS
BWS1
K
NC/288M
RPS
A
A
CQ
B
NC
Q9
D9
A
NC
K
BWS0
A
NC
NC
Q8
C
NC
NC
D10
VSS
A
NC
A
VSS
NC
Q7
D8
D
NC
D11
Q10
VSS
VSS
VSS
VSS
VSS
NC
NC
D7
E
NC
NC
Q11
VDDQ
VSS
VSS
VSS
VDDQ
NC
D6
Q6
F
NC
Q12
D12
VDDQ
VDD
VSS
VDD
VDDQ
NC
NC
Q5
G
NC
D13
Q13
VDDQ
VDD
VSS
VDD
VDDQ
NC
NC
D5
H
DOFF
VREF
VDDQ
VDDQ
VDD
VSS
VDD
VDDQ
VDDQ
VREF
ZQ
J
NC
NC
D14
VDDQ
VDD
VSS
VDD
VDDQ
NC
Q4
D4
K
NC
NC
Q14
VDDQ
VDD
VSS
VDD
VDDQ
NC
D3
Q3
L
NC
Q15
D15
VDDQ
VSS
VSS
VSS
VDDQ
NC
NC
Q2
M
NC
NC
D16
VSS
VSS
VSS
VSS
VSS
NC
Q1
D2
N
NC
D17
Q16
VSS
A
A
A
VSS
NC
NC
D1
P
NC
NC
Q17
A
A
QVLD
A
A
NC
D0
Q0
R
TDO
TCK
A
A
A
NC
A
A
A
TMS
TDI
Note
2. NC/144M and NC/288M are not connected to the die and can be tied to any voltage level.
Document Number: 001-54932 Rev. *F
Page 4 of 30
CY7C15632KV18
Pin Definitions
Pin Name
I/O
Pin Description
D[17:0]
InputData Input Signals. Sampled on the rising edge of K and K clocks when valid write operations are active.
Synchronous
WPS
InputWrite Port Select  Active LOW. Sampled on the rising edge of the K clock. When asserted active, a
Synchronous write operation is initiated. Deasserting deselects the write port. Deselecting the write port ignores D[x:0].
BWS0,
BWS1
InputByte Write Select 0, 1, 2, and 3  Active LOW. Sampled on the rising edge of the K and K clocks when
Synchronous write operations are active. Used to select which byte is written into the device during the current portion
of the write operations. Bytes not written remain unaltered. BWS0 controls D[8:0] and BWS1 controls
D[17:9]. All the Byte Write Selects are sampled on the same edge as the data. Deselecting a Byte Write
Select ignores the corresponding byte of data and it is not written into the device.
A
InputAddress Inputs. Sampled on the rising edge of the K clock during active read and write operations.
Synchronous These address inputs are multiplexed for both read and write operations. Internally, the device is
organized as 4 M × 18 (4 arrays each of 1 M × 18) for CY7C15632KV18. Therefore, only 20 address
inputs are needed to access the entire memory array of CY7C15632KV18. These inputs are ignored
when the appropriate port is deselected.
Q[17:0]
OutputsData Output Signals. These pins drive out the requested data when the read operation is active. Valid
Synchronous data is driven out on the rising edge of the K and K clocks during read operations. On deselecting the
read port, Q[17:0] are automatically tristated.
RPS
InputRead Port Select  Active LOW. Sampled on the rising edge of positive input clock (K). When active,
Synchronous a read operation is initiated. Deasserting deselects the read port. When deselected, the pending access
is allowed to complete and the output drivers are automatically tristated following the next rising edge of
the K clock. Each read access consists of a burst of four sequential transfers.
QVLD
Valid output Valid Output Indicator. The Q Valid indicates valid output data. QVLD is edge aligned with CQ and CQ.
indicator
K
Input Clock
Positive Input Clock Input. The rising edge of K is used to capture synchronous inputs to the device
and to drive out data through Q[17:0]. All accesses are initiated on the rising edge of K.
K
Input Clock
Negative Input Clock Input. K is used to capture synchronous inputs being presented to the device
and to drive out data through Q[17:0].
CQ
Echo Clock
Synchronous Echo Clock Outputs. This is a free running clock and is synchronized to the input clock
(K) of the QDR II+. The timings for the echo clocks are shown in the Switching Characteristics on page 23.
CQ
Echo Clock
Synchronous Echo Clock Outputs. This is a free running clock and is synchronized to the input clock
(K) of the QDR II+.The timings for the echo clocks are shown in the Switching Characteristics on page 23.
ZQ
Input
Output Impedance Matching Input. This input is used to tune the device outputs to the system data
bus impedance. CQ, CQ, and Q[17:0] output impedance are set to 0.2 × RQ, where RQ is a resistor
connected between ZQ and ground. Alternatively, this pin can be connected directly to VDDQ, which
enables the minimum impedance mode. This pin cannot be connected directly to GND or left
unconnected.
DOFF
Input
PLL Turn Off  Active LOW. Connecting this pin to ground turns off the PLL inside the device. The
timings in the PLL turned off operation differs from those listed in this data sheet. For normal operation,
this pin can be connected to a pull up through a 10 k or less pull up resistor. The device behaves in
QDR I mode when the PLL is turned off. In this mode, the device can be operated at a frequency of up
to 167 MHz with QDR I timing.
TDO
Output
TDO for JTAG
TCK
Input
TCK Pin for JTAG
TDI
Input
TDI Pin for JTAG
TMS
Input
TMS Pin for JTAG
NC
N/A
Not Connected to the Die. Can be tied to any voltage level.
NC/144M
N/A
Not Connected to the Die. Can be tied to any voltage level.
NC/288M
N/A
Not Connected to the Die. Can be tied to any voltage level.
Document Number: 001-54932 Rev. *F
Page 5 of 30
CY7C15632KV18
Pin Definitions (continued)
Pin Name
VREF
VDD
VSS
VDDQ
I/O
Pin Description
InputReference
Reference Voltage Input. Static input used to set the reference level for HSTL inputs, outputs, and AC
measurement points.
Power Supply Power Supply Inputs to the Core of the Device
Ground
Ground for the Device
Power Supply Power Supply Inputs for the Outputs of the Device
Functional Overview
The CY7C15632KV18 is a synchronous pipelined Burst SRAM
equipped with a read port and a write port. The read port is
dedicated to read operations and the write port is dedicated to
write operations. Data flows into the SRAM through the write port
and flows out through the read port. These devices multiplex the
address inputs to minimize the number of address pins required.
By having separate read and write ports, the QDR II+ completely
eliminates the need to “turnaround” the data bus and avoids any
possible data contention, thereby simplifying system design.
Each access consists of four 18-bit data transfers in two clock
cycles.
These devices operate with a read latency of two and half cycles
when DOFF pin is tied HIGH. When DOFF pin is set LOW or
connected to VSS then device behaves in QDR I mode with a
read latency of one clock cycle.
Accesses for both ports are initiated on the positive input clock
(K). All synchronous input and output timing are referenced from
the rising edge of the input clocks (K and K).
All synchronous data inputs (D[x:0]) pass through input registers
controlled by the input clocks (K and K). All synchronous data
outputs (Q[x:0]) outputs pass through output registers controlled
by the rising edge of the input clocks (K and K) as well.
All synchronous control (RPS, WPS, NWS[x:0], BWS[x:0]) inputs
pass through input registers controlled by the rising edge of the
input clocks (K and K).
CY7C15632KV18 is described in the following sections.
Read Operations
The CY7C15632KV18 is organized internally as four arrays of
1 M × 18. Accesses are completed in a burst of four sequential
18-bit data words. Read operations are initiated by asserting
RPS active at the rising edge of the positive input clock (K). The
address presented to the address inputs is stored in the read
address register. Following the next two K clock rise, the
corresponding lowest order 18-bit word of data is driven onto the
Q[17:0] using K as the output timing reference. On the
subsequent rising edge of K, the next 18-bit data word is driven
onto the Q[17:0]. This process continues until all four 18-bit data
words have been driven out onto Q[17:0]. The requested data is
valid 0.45 ns from the rising edge of the input clock (K or K). To
maintain the internal logic, each read access must be allowed to
complete. Each read access consists of four 18-bit data words
and takes two clock cycles to complete. Therefore, read
Document Number: 001-54932 Rev. *F
accesses to the device can not be initiated on two consecutive
K clock rises. The internal logic of the device ignores the second
read request. Read accesses can be initiated on every other K
clock rise. Doing so pipelines the data flow such that data is
transferred out of the device on every rising edge of the input
clocks (K and K).
When the read port is deselected, the CY7C15632KV18 first
completes the pending read transactions. Synchronous internal
circuitry automatically tristates the outputs following the next
rising edge of the negative input clock (K). This enables for a
seamless transition between devices without the insertion of wait
states in a depth expanded memory.
Write Operations
Write operations are initiated by asserting WPS active at the
rising edge of the positive input clock (K). On the following K
clock rise the data presented to D[17:0] is latched and stored into
the lower 18-bit write data register, provided BWS[1:0] are both
asserted active. On the subsequent rising edge of the negative
input clock (K) the information presented to D[17:0] is also stored
into the write data register, provided BWS[1:0] are both asserted
active. This process continues for one more cycle until four 18-bit
words (a total of 72 bits) of data are stored in the SRAM. The
72 bits of data are then written into the memory array at the
specified location. Therefore, write accesses to the device can
not be initiated on two consecutive K clock rises. The internal
logic of the device ignores the second write request. Write
accesses can be initiated on every other rising edge of the
positive input clock (K). Doing so pipelines the data flow such
that 18 bits of data can be transferred into the device on every
rising edge of the input clocks (K and K).
When deselected, the write port ignores all inputs after the
pending write operations have been completed.
Byte Write Operations
Byte write operations are supported by the CY7C15632KV18. A
write operation is initiated as described in the Write Operations
section. The bytes that are written are determined by BWS0 and
BWS1, which are sampled with each set of 18-bit data words.
Asserting the appropriate Byte Write Select input during the data
portion of a write latches the data being presented and writes it
into the device. Deasserting the Byte Write Select input during
the data portion of a write enables the data stored in the device
for that byte to remain unaltered. This feature can be used to
simplify read, modify, or write operations to a byte write
operation.
Page 6 of 30
CY7C15632KV18
Concurrent Transactions
The read and write ports on the CY7C15632KV18 operates
completely independently of one another. As each port latches
the address inputs on different clock edges, the user can read or
write to any location, regardless of the transaction on the other
port. If the ports access the same location when a read follows a
write in successive clock cycles, the SRAM delivers the most
recent information associated with the specified address
location. This includes forwarding data from a write cycle that
was initiated on the previous K clock rise.
Read access and write access must be scheduled such that one
transaction is initiated on any clock cycle. If both ports are
selected on the same K clock rise, the arbitration depends on the
previous state of the SRAM. If both ports are deselected, the
read port takes priority. If a read was initiated on the previous
cycle, the write port takes priority (as read operations cannot be
initiated on consecutive cycles). If a write was initiated on the
previous cycle, the read port takes priority (as write operations
can not be initiated on consecutive cycles). Therefore, asserting
both port selects active from a deselected state results in alternating read or write operations being initiated, with the first
access being a read.
Depth Expansion
The CY7C15632KV18 has a port select input for each port. This
enables for easy depth expansion. Both port selects are sampled
on the rising edge of the positive input clock only (K). Each port
select input can deselect the specified port. Deselecting a port
does not affect the other port. All pending transactions (read and
write) are completed before the device is deselected.
Programmable Impedance
An external resistor, RQ, must be connected between the ZQ pin
on the SRAM and VSS to allow the SRAM to adjust its output
driver impedance. The value of RQ must be 5 × the value of the
Document Number: 001-54932 Rev. *F
intended line impedance driven by the SRAM, the allowable
range of RQ to guarantee impedance matching with a tolerance
of ±15% is between 175  and 350 , with VDDQ = 1.5V. The
output impedance is adjusted every 1024 cycles upon power up
to account for drifts in supply voltage and temperature.
Echo Clocks
Echo clocks are provided on the QDR II+ to simplify data capture
on high-speed systems. Two echo clocks are generated by the
QDR II+. CQ is referenced with respect to K and CQ is
referenced with respect to K. These are free running clocks and
are synchronized to the input clock of the QDR II+. The timing
for the echo clocks is shown in the Switching Characteristics on
page 23.
Valid Data Indicator (QVLD)
QVLD is provided on the QDR II+ to simplify data capture on high
speed systems. The QVLD is generated by the QDR II+ device
along with data output. This signal is also edge-aligned with the
echo clock and follows the timing of any data pin. This signal is
asserted half a cycle before valid data arrives.
PLL
These chips use a PLL that is designed to function between
120 MHz and the specified maximum clock frequency. During
power up, when the DOFF is tied HIGH, the PLL is locked after
20 s of stable clock. The PLL can also be reset by slowing or
stopping the input clocks K and K for a minimum of 30 ns.
However, it is not necessary to reset the PLL to lock to the
desired frequency. The PLL automatically locks 20 s after a
stable clock is presented. The PLL may be disabled by applying
ground to the DOFF pin. When the PLL is turned off, the device
behaves in QDR I mode (with one cycle latency and a longer
access time). For information, refer to the application note, PLL
Considerations in QDRII/DDRII/QDRII+/DDRII+.
Page 7 of 30
CY7C15632KV18
Application Example
Figure 2 shows two QDR II+ used in an application.
Figure 2. Application Example
Vt
R
DATA IN
DATA OUT
Address
ZQ
SRAM #1 CQ/CQ
Q
D
A RPS WPS BWS K K
RQ = 250 ohms
SRAM #2
RQ = 250 ohms
CQ/CQ
Q
RPS WPS BWS K K
D
A
R
R
BUS MASTER RPS
(CPU or ASIC) WPS
ZQ
Vt
Vt
BWS
CLKIN1/CLKIN1
CLKIN2/CLKIN2
Source K
Source K
R
Document Number: 001-54932 Rev. *F
R = 50ohms, Vt = VDDQ /2
Page 8 of 30
CY7C15632KV18
Truth Table
The truth table for CY7C15632KV18 follows. [3, 4, 5, 6, 7, 8]
Operation
K
RPS WPS
[9]
DQ
DQ
DQ
D(A) at K(t + 1) D(A + 1) at K(t + 1) D(A + 2) at K(t + 2) D(A + 3) at K(t + 2)
Write Cycle:
Load address on the
rising edge of K; input
write data on two
consecutive K and K
rising edges.
L–H
H
Read Cycle:
(2.5 cycle Latency)
Load address on the
rising edge of K; wait two
and half cycles; read
data on two consecutive
K and K rising edges.
L–H
L [10]
X
Q(A) at K(t + 2) Q(A + 1) at K(t + 3) Q(A + 2) at K(t + 3) Q(A + 3) at K(t + 4)
NOP: No Operation
L–H
H
H
D=X
Q = High Z
D=X
Q = High Z
D=X
Q = High Z
D=X
Q = High Z
X
X
Previous State
Previous State
Previous State
Previous State
Standby: Clock Stopped Stopped
L
DQ
[10]
Notes
3. X = “Don't Care,” H = Logic HIGH, L = Logic LOW, represents rising edge.
4. Device powers up deselected with the outputs in a tristate condition.
5. “A” represents address location latched by the devices when transaction was initiated. A + 1, A + 2, and A + 3 represents the address sequence in the burst.
6. “t” represents the cycle at which a read/write operation is started. t + 1, t + 2, and t + 3 are the first, second and third clock cycles respectively succeeding the “t” clock
cycle.
7. Data inputs are registered at K and K rising edges. Data outputs are delivered on K and K rising edges as well.
8. It is recommended that K = K = HIGH when clock is stopped. This is not essential, but permits most rapid restart by overcoming transmission line charging symmetrically.
9. If this signal was LOW to initiate the previous cycle, this signal becomes a “Don’t Care” for this operation.
10. This signal was HIGH on previous K clock rise. Initiating consecutive read or write operations on consecutive K clock rises is not permitted. The device ignores the
second read or write request.
Document Number: 001-54932 Rev. *F
Page 9 of 30
CY7C15632KV18
Write Cycle Descriptions
The write cycle description table for CY7C15632KV18 follows. [11, 12]
BWS0/ BWS1/
K
K
L
L–H
–
L
L
–
L
H
L–H
L
H
–
H
L
L–H
H
L
–
H
H
L–H
H
H
–
NWS0
NWS1
L
Comments
During the data portion of a write sequence
CY7C15632KV18 both bytes (D[17:0]) are written into the device.
L–H During the data portion of a write sequence:
CY7C15632KV18 both bytes (D[17:0]) are written into the device.
–
During the data portion of a write sequence:
CY7C15632KV18 only the lower byte (D[8:0]) is written into the device, D[17:9] remains unaltered.
L–H During the data portion of a write sequence
CY7C15632KV18 only the lower byte (D[8:0]) is written into the device, D[17:9] remains unaltered.
–
During the data portion of a write sequence
CY7C15632KV18 only the upper byte (D[17:9]) is written into the device, D[8:0] remains unaltered.
L–H During the data portion of a write sequence
CY7C15632KV18 only the upper byte (D[17:9]) is written into the device, D[8:0] remains unaltered.
–
No data is written into the devices during this portion of a write operation.
L–H No data is written into the devices during this portion of a write operation.
Notes
11. X = “Don't Care,” H = Logic HIGH, L = Logic LOW, represents rising edge.
12. Is based on a write cycle that was initiated in accordance with Write Cycle Descriptions. NWS0, NWS1, BWS0, BWS1, BWS2, and BWS3 can be altered on different
portions of a write cycle, as long as the setup and hold requirements are achieved.
Document Number: 001-54932 Rev. *F
Page 10 of 30
CY7C15632KV18
IEEE 1149.1 Serial Boundary Scan (JTAG)
These SRAMs incorporate a serial boundary scan Test Access
Port (TAP) in the FBGA package. This part is fully compliant with
IEEE Standard #1149.1-2001. The TAP operates using JEDEC
standard 1.8 V I/O logic levels.
Disabling the JTAG Feature
It is possible to operate the SRAM without using the JTAG
feature. To disable the TAP controller, TCK must be tied LOW
(VSS) to prevent clocking of the device. TDI and TMS are
internally pulled up and may be unconnected. They may
alternatively be connected to VDD through a pull up resistor. TDO
must be left unconnected. Upon power up, the device comes up
in a reset state, which does not interfere with the operation of the
device.
Test Access Port
Test Clock
The test clock is used only with the TAP controller. All inputs are
captured on the rising edge of TCK. All outputs are driven from
the falling edge of TCK.
Test Mode Select (TMS)
The TMS input is used to give commands to the TAP controller
and is sampled on the rising edge of TCK. This pin may be left
unconnected if the TAP is not used. The pin is pulled up
internally, resulting in a logic HIGH level.
Test Data-In (TDI)
The TDI pin is used to serially input information into the registers
and can be connected to the input of any of the registers. The
register between TDI and TDO is chosen by the instruction that
is loaded into the TAP instruction register. For information on
loading the instruction register, see TAP Controller State
Diagram on page 13. TDI is internally pulled up and can be
unconnected if the TAP is unused in an application. TDI is
connected to the most significant bit (MSB) on any register.
Test Data-Out (TDO)
The TDO output pin is used to serially clock data out from the
registers. The output is active, depending upon the current state
of the TAP state machine (see Instruction Codes on page 17).
The output changes on the falling edge of TCK. TDO is
connected to the least significant bit (LSB) of any register.
Performing a TAP Reset
A Reset is performed by forcing TMS HIGH (VDD) for five rising
edges of TCK. This Reset does not affect the operation of the
SRAM and can be performed while the SRAM is operating. At
power up, the TAP is reset internally to ensure that TDO comes
up in a High Z state.
TAP Registers
Registers are connected between the TDI and TDO pins to scan
the data in and out of the SRAM test circuitry. Only one register
can be selected at a time through the instruction registers. Data
is serially loaded into the TDI pin on the rising edge of TCK. Data
is output on the TDO pin on the falling edge of TCK.
Document Number: 001-54932 Rev. *F
Instruction Register
Three-bit instructions can be serially loaded into the instruction
register. This register is loaded when it is placed between the TDI
and TDO pins, as shown in TAP Controller Block Diagram on
page 14. Upon power up, the instruction register is loaded with
the IDCODE instruction. It is also loaded with the IDCODE
instruction if the controller is placed in a reset state, as described
in the previous section.
When the TAP controller is in the Capture-IR state, the two least
significant bits are loaded with a binary “01” pattern to allow for
fault isolation of the board level serial test path.
Bypass Register
To save time when serially shifting data through registers, it is
sometimes advantageous to skip certain chips. The bypass
register is a single-bit register that can be placed between TDI
and TDO pins. This enables shifting of data through the SRAM
with minimal delay. The bypass register is set LOW (VSS) when
the BYPASS instruction is executed.
Boundary Scan Register
The boundary scan register is connected to all of the input and
output pins on the SRAM. Several No Connect (NC) pins are also
included in the scan register to reserve pins for higher density
devices.
The boundary scan register is loaded with the contents of the
RAM input and output ring when the TAP controller is in the
Capture-DR state and is then placed between the TDI and TDO
pins when the controller is moved to the Shift-DR state. The
EXTEST, SAMPLE/PRELOAD, and SAMPLE Z instructions can
be used to capture the contents of the input and output ring.
The section Boundary Scan Order on page 18 shows the order
in which the bits are connected. Each bit corresponds to one of
the bumps on the SRAM package. The MSB of the register is
connected to TDI, and the LSB is connected to TDO.
Identification (ID) Register
The ID register is loaded with a vendor-specific, 32-bit code
during the Capture-DR state when the IDCODE command is
loaded in the instruction register. The IDCODE is hardwired into
the SRAM and can be shifted out when the TAP controller is in
the Shift-DR state. The ID register has a vendor code and other
information described in Identification Register Definitions on
page 17.
TAP Instruction Set
Eight different instructions are possible with the three-bit
instruction register. All combinations are listed in Instruction
Codes on page 17. Three of these instructions are listed as
RESERVED and must not be used. The other five instructions
are described in this section in detail.
Instructions are loaded into the TAP controller during the Shift-IR
state when the instruction register is placed between TDI and
TDO. During this state, instructions are shifted through the
instruction register through the TDI and TDO pins. To execute
the instruction after it is shifted in, the TAP controller must be
moved into the Update-IR state.
Page 11 of 30
CY7C15632KV18
IDCODE
The IDCODE instruction loads a vendor-specific, 32-bit code into
the instruction register. It also places the instruction register
between the TDI and TDO pins and shifts the IDCODE out of the
device when the TAP controller enters the Shift-DR state. The
IDCODE instruction is loaded into the instruction register at
power up or whenever the TAP controller is supplied a
Test-Logic-Reset state.
SAMPLE Z
The SAMPLE Z instruction connects the boundary scan register
between the TDI and TDO pins when the TAP controller is in a
Shift-DR state. The SAMPLE Z command puts the output bus
into a High Z state until the next command is supplied during the
Update IR state.
SAMPLE/PRELOAD
SAMPLE/PRELOAD is a 1149.1 mandatory instruction. When
the SAMPLE/PRELOAD instructions are loaded into the
instruction register and the TAP controller is in the Capture-DR
state, a snapshot of data on the input and output pins is captured
in the boundary scan register.
The TAP controller clock can only operate at a frequency up to
20 MHz, while the SRAM clock operates more than an order of
magnitude faster. Because there is a large difference in the clock
frequencies, it is possible that during the Capture-DR state, an
input or output undergoes a transition. The TAP may then try to
capture a signal while in transition (metastable state). This does
not harm the device, but there is no guarantee as to the value
that is captured. Repeatable results may not be possible.
To guarantee that the boundary scan register captures the
correct value of a signal, the SRAM signal must be stabilized
long enough to meet the TAP controller’s capture setup plus hold
times (tCS and tCH). The SRAM clock input might not be captured
correctly if there is no way in a design to stop (or slow) the clock
during a SAMPLE/PRELOAD instruction. If this is an issue, it is
still possible to capture all other signals and simply ignore the
value of the CK and CK captured in the boundary scan register.
After the data is captured, it is possible to shift out the data by
putting the TAP into the Shift-DR state. This places the boundary
scan register between the TDI and TDO pins.
Document Number: 001-54932 Rev. *F
PRELOAD places an initial data pattern at the latched parallel
outputs of the boundary scan register cells before the selection
of another boundary scan test operation.
The shifting of data for the SAMPLE and PRELOAD phases can
occur concurrently when required, that is, while the data
captured is shifted out, the preloaded data can be shifted in.
BYPASS
When the BYPASS instruction is loaded in the instruction register
and the TAP is placed in a Shift-DR state, the bypass register is
placed between the TDI and TDO pins. The advantage of the
BYPASS instruction is that it shortens the boundary scan path
when multiple devices are connected together on a board.
EXTEST
The EXTEST instruction drives the preloaded data out through
the system output pins. This instruction also connects the
boundary scan register for serial access between the TDI and
TDO in the Shift-DR controller state.
EXTEST OUTPUT BUS TRI-STATE
IEEE Standard 1149.1 mandates that the TAP controller be able
to put the output bus into a tristate mode.
The boundary scan register has a special bit located at bit #108.
When this scan cell, called the “extest output bus tristate”, is
latched into the preload register during the Update-DR state in
the TAP controller, it directly controls the state of the output
(Q-bus) pins, when the EXTEST is entered as the current
instruction. When HIGH, it enables the output buffers to drive the
output bus. When LOW, this bit places the output bus into a
High Z condition.
This bit can be set by entering the SAMPLE/PRELOAD or
EXTEST command, and then shifting the desired bit into that cell,
during the Shift-DR state. During Update-DR, the value loaded
into that shift-register cell latches into the preload register. When
the EXTEST instruction is entered, this bit directly controls the
output Q-bus pins. Note that this bit is preset HIGH to enable the
output when the device is powered up, and also when the TAP
controller is in the Test-Logic-Reset state.
Reserved
These instructions are not implemented but are reserved for
future use. Do not use these instructions.
Page 12 of 30
CY7C15632KV18
TAP Controller State Diagram
The state diagram for the TAP controller follows. [13]
1
TEST-LOGIC
RESET
0
0
TEST-LOGIC/
IDLE
1
SELECT
DR-SCAN
1
1
SELECT
IR-SCAN
0
0
1
1
CAPTURE-DR
CAPTURE-IR
0
0
SHIFT-DR
0
SHIFT-IR
1
1
EXIT1-DR
1
EXIT1-IR
0
0
PAUSE-IR
1
0
1
EXIT2-DR
0
EXIT2-IR
1
1
UPDATE-IR
UPDATE-DR
1
1
0
PAUSE-DR
0
0
0
1
0
Note
13. The 0/1 next to each state represents the value at TMS at the rising edge of TCK.
Document Number: 001-54932 Rev. *F
Page 13 of 30
CY7C15632KV18
TAP Controller Block Diagram
0
Bypass Register
2
Selection
Circuitry
TDI
1
0
Selection
Circuitry
Instruction Register
31
30
29
.
.
2
1
0
1
0
TDO
Identification Register
108
.
.
.
.
2
Boundary Scan Register
TCK
TAP Controller
TMS
TAP Electrical Characteristics
Over the Operating Range
Parameter [14, 15, 16]
Description
Test Conditions
Min
Max
Unit
IOH =2.0 mA
1.4
–
V
VOH1
Output HIGH Voltage
VOH2
Output HIGH Voltage
IOH =100 A
1.6
–
V
VOL1
Output LOW Voltage
IOL = 2.0 mA
–
0.4
V
VOL2
Output LOW Voltage
IOL = 100 A
–
0.2
V
VIH
Input HIGH Voltage
–
VIL
Input LOW Voltage
–
IX
Input and Output Load Current
GND  VI  VDD
0.65 × VDD VDD + 0.3
V
–0.3
0.35 × VDD
V
–5
5
A
Notes
14. These characteristics pertain to the TAP inputs (TMS, TCK, TDI and TDO). Parallel load levels are specified in the Electrical Characteristics on page 20.
15. Overshoot: VIH(AC) < VDDQ + 0.35 V (Pulse width less than tCYC/2), Undershoot: VIL(AC) > 0.3 V (Pulse width less than tCYC/2).
16. All Voltage referenced to Ground.
Document Number: 001-54932 Rev. *F
Page 14 of 30
CY7C15632KV18
TAP AC Switching Characteristics
Over the Operating Range
Parameter [17, 18]
Description
Min
Max
Unit
50
–
ns
tTCYC
TCK Clock Cycle Time
tTF
TCK Clock Frequency
–
20
MHz
tTH
TCK Clock HIGH
20
–
ns
tTL
TCK Clock LOW
20
–
ns
tTMSS
TMS Setup to TCK Clock Rise
5
–
ns
tTDIS
TDI Setup to TCK Clock Rise
5
–
ns
tCS
Capture Setup to TCK Rise
5
–
ns
tTMSH
TMS Hold after TCK Clock Rise
5
–
ns
tTDIH
TDI Hold after Clock Rise
5
–
ns
tCH
Capture Hold after Clock Rise
5
–
ns
tTDOV
TCK Clock LOW to TDO Valid
–
10
ns
tTDOX
TCK Clock LOW to TDO Invalid
0
–
ns
Setup Times
Hold Times
Output Times
Notes
17. tCS and tCH refer to the setup and hold time requirements of latching data from the boundary scan register.
18. Test conditions are specified using the load in TAP AC Test Conditions. tR/tF = 1 ns.
Document Number: 001-54932 Rev. *F
Page 15 of 30
CY7C15632KV18
TAP Timing and Test Conditions
Figure 3 shows the TAP timing and test conditions. [19]
Figure 3. TAP Timing and Test Conditions
0.9 V
ALL INPUT PULSES
1.8 V
50 
0.9 V
TDO
0V
Z0 = 50 
(a)
CL = 20 pF
tTH
GND
tTL
Test Clock
TCK
tTMSH
tTMSS
tTCYC
Test Mode Select
TMS
tTDIS
tTDIH
Test Data In
TDI
Test Data Out
TDO
tTDOV
tTDOX
Note
19. Test conditions are specified using the load in TAP AC Test Conditions. tR/tF = 1 ns.
Document Number: 001-54932 Rev. *F
Page 16 of 30
CY7C15632KV18
Identification Register Definitions
Value
Instruction Field
Description
CY7C15632KV18
Revision Number (31:29)
000
Cypress Device ID (28:12)
11010010001010100
Cypress JEDEC ID (11:1)
00000110100
ID Register Presence (0)
1
Version number.
Defines the type of SRAM.
Allows unique identification of SRAM vendor.
Indicates the presence of an ID register.
Scan Register Sizes
Register Name
Bit Size
Instruction
3
Bypass
1
ID
32
Boundary Scan
109
Instruction Codes
Instruction
Code
Description
EXTEST
000
Captures the input and output ring contents.
IDCODE
001
Loads the ID register with the vendor ID code and places the register between TDI and TDO.
This operation does not affect SRAM operation.
SAMPLE Z
010
Captures the input and output contents. Places the boundary scan register between TDI and
TDO. Forces all SRAM output drivers to a High Z state.
RESERVED
011
Do Not Use: This instruction is reserved for future use.
SAMPLE/PRELOAD
100
Captures the input and output ring contents. Places the boundary scan register between TDI
and TDO. Does not affect the SRAM operation.
RESERVED
101
Do Not Use: This instruction is reserved for future use.
RESERVED
110
Do Not Use: This instruction is reserved for future use.
BYPASS
111
Places the bypass register between TDI and TDO. This operation does not affect SRAM
operation.
Document Number: 001-54932 Rev. *F
Page 17 of 30
CY7C15632KV18
Boundary Scan Order
Bit #
Bump ID
Bit #
Bump ID
Bit #
Bump ID
Bit #
Bump ID
0
6R
28
10G
56
6A
84
1J
1
6P
29
9G
57
5B
85
2J
2
6N
30
11F
58
5A
86
3K
3
7P
31
11G
59
4A
87
3J
4
7N
32
9F
60
5C
88
2K
5
7R
33
10F
61
4B
89
1K
6
8R
34
11E
62
3A
90
2L
7
8P
35
10E
63
2A
91
3L
8
9R
36
10D
64
1A
92
1M
9
11P
37
9E
65
2B
93
1L
10
10P
38
10C
66
3B
94
3N
11
10N
39
11D
67
1C
95
3M
12
9P
40
9C
68
1B
96
1N
13
10M
41
9D
69
3D
97
2M
14
11N
42
11B
70
3C
98
3P
15
9M
43
11C
71
1D
99
2N
16
9N
44
9B
72
2C
100
2P
17
11L
45
10B
73
3E
101
1P
18
11M
46
11A
74
2D
102
3R
19
9L
47
10A
75
2E
103
4R
20
10L
48
9A
76
1E
104
4P
21
11K
49
8B
77
2F
105
5P
22
10K
50
7C
78
3F
106
5N
23
9J
51
6C
79
1G
107
5R
24
9K
52
8A
80
1F
108
Internal
25
10J
53
7A
81
3G
26
11J
54
7B
82
2G
27
11H
55
6B
83
1H
Document Number: 001-54932 Rev. *F
Page 18 of 30
CY7C15632KV18
Power Up Sequence in QDR II+ SRAM
PLL Constraints
QDR II+ SRAMs must be powered up and initialized in a
predefined manner to prevent undefined operations.
■
PLL uses K clock as its synchronizing input. The input must
have low phase jitter, which is specified as tKC Var.
■
The PLL functions at frequencies down to 120 MHz.
■
If the input clock is unstable and the PLL is enabled, then the
PLL may lock onto an incorrect frequency, causing unstable
SRAM behavior. To avoid this, provide 20 s of stable clock to
relock to the desired clock frequency.
Power Up Sequence
■
Apply power and drive DOFF either HIGH or LOW (All other
inputs can be HIGH or LOW).
❐ Apply VDD before VDDQ.
❐ Apply VDDQ before VREF or at the same time as VREF.
❐ Drive DOFF HIGH.
■
Provide stable DOFF (HIGH), power and clock (K, K) for 20 s
to lock the PLL.
~
~
Figure 4. Power Up Waveforms
K
K
~
~
Unstable Clock
> 20μs Stable clock
Start Normal
Operation
Clock Start (Clock Starts after V DD / V DDQ Stable)
VDD / VDDQ
DOFF
Document Number: 001-54932 Rev. *F
V DD / V DDQ Stable (< +/- 0.1V DC per 50ns )
Fix HIGH (or tie to VDDQ)
Page 19 of 30
CY7C15632KV18
Maximum Ratings
Operating Range
Exceeding maximum ratings may shorten the useful life of the
device. User guidelines are not tested.
Range
Storage Temperature ............................... –65 °C to +150 °C
Commercial
Ambient Temperature
with Power Applied .................................. –55 °C to +125 °C
Industrial
Supply Voltage on VDD Relative to GND .....–0.5 V to +2.9 V
Ambient
Temperature (TA)
VDD [21]
VDDQ [21]
0 °C to +70 °C
1.8 ± 0.1 V
1.4 V to VDD
–40 °C to +85 °C
Neutron Soft Error Immunity
Supply Voltage on VDDQ Relative to GND .... –0.5 V to +VDD
Parameter
DC Applied to Outputs in High Z ...... –0.5 V to VDDQ + 0.3 V
DC Input Voltage [20] ........................... –0.5 V to VDD + 0.3 V
Latch up Current .................................................... > 200 mA
Test
Conditions Typ
Max*
Unit
LSBU
Logical
Single-Bit
Upsets
25 °C
197
216
FIT/
Mb
LMBU
Logical
Multi-Bit
Upsets
25 °C
0
0.01
FIT/
Mb
Single Event
Latch up
85 °C
0
0.1
FIT/
Dev
Current into Outputs (LOW) ........................................ 20 mA
Static Discharge Voltage
(MIL-STD-883, M. 3015) ......................................... > 2001 V
Description
SEL
* No LMBU or SEL events occurred during testing; this column represents a
statistical 2, 95% confidence limit calculation. For more details refer to
Application Note AN54908 “Accelerated Neutron SER Testing and Calculation of
Terrestrial Failure Rates”.
Electrical Characteristics
Over the Operating Range
DC Electrical Characteristics
Over the Operating Range
Parameter [22]
Description
Test Conditions
Min
Typ
Max
Unit
1.7
1.8
1.9
V
1.4
1.5
VDD
V
VDDQ/2 – 0.12
–
VDDQ/2 + 0.12
V
VDDQ/2 – 0.12
–
VDDQ/2 + 0.12
V
IOH =0.1 mA, Nominal Impedance
VDDQ – 0.2
–
VDDQ
V
IOL = 0.1 mA, Nominal Impedance
VSS
–
0.2
V
VREF + 0.1
–
VDDQ + 0.15
V
–0.15
–
VREF – 0.1
V
2
–
2
A
VDD
Power Supply Voltage
VDDQ
I/O Supply Voltage
VOH
Output HIGH Voltage
Note 23
VOL
Output LOW Voltage
Note 24
VOH(LOW)
Output HIGH Voltage
VOL(LOW)
Output LOW Voltage
VIH
Input HIGH Voltage
VIL
Input LOW Voltage
IX
Input Leakage Current
GND  VI  VDDQ
IOZ
Output Leakage Current
GND  VI  VDDQ, Output Disabled
VREF
Input Reference Voltage [25]
Typical Value = 0.75 V
2
–
2
A
0.68
0.75
0.95
V
Notes
20. Overshoot: VIH(AC) < VDDQ + 0.35 V (Pulse width less than tCYC/2), Undershoot: VIL(AC) > 0.3 V (Pulse width less than tCYC/2).
21. Power up: Assumes a linear ramp from 0 V to VDD(min) within 200 ms. During this time VIH < VDD and VDDQ < VDD.
22. All Voltage referenced to Ground.
23. Output are impedance controlled. IOH = (VDDQ/2)/(RQ/5) for values of 175 ohms < RQ < 350 ohms.
24. Output are impedance controlled. IOL = (VDDQ/2)/(RQ/5) for values of 175 ohms < RQ < 350 ohms.
25. VREF(min) = 0.68V or 0.46VDDQ, whichever is larger, VREF (max) = 0.95V or 0.54VDDQ, whichever is smaller.
Document Number: 001-54932 Rev. *F
Page 20 of 30
CY7C15632KV18
Electrical Characteristics (continued)
Over the Operating Range
DC Electrical Characteristics (continued)
Over the Operating Range
Parameter [22]
IDD
[26]
ISB1
Description
VDD Operating Supply
Automatic Power down Current
Test Conditions
Min
Typ
Max
Unit
VDD = Max, IOUT = 0 mA, f 500 MHz
= fMAX = 1/tCYC
450 MHz
–
–
850
mA
–
–
780
mA
400 MHz
–
–
710
mA
500 MHz
–
–
360
mA
450 MHz
–
–
340
mA
400 MHz
–
–
320
mA
Min
Typ
Max
Unit
Max VDD,
Both Ports Deselected,
VIN  VIH or VIN  VIL
f = fMAX = 1/tCYC,
Inputs Static
AC Electrical Characteristics
Over the Operating Range
Parameter [27]
Description
Test Conditions
VIH
Input HIGH Voltage
VREF + 0.2
–
VDDQ + 0.24
V
VIL
Input LOW Voltage
–0.24
–
VREF – 0.2
V
Max
Unit
4
pF
4
pF
Capacitance
Parameter [28]
Description
CIN
Input Capacitance
CO
Output Capacitance
Test Conditions
TA = 25 C, f = 1 MHz, VDD = 1.8 V, VDDQ = 1.5 V
Thermal Resistance
Parameter [28]
Description
JA
Thermal Resistance
(Junction to Ambient)
JC
Thermal Resistance
(Junction to Case)
Test Conditions
Test conditions follow standard test methods and
procedures for measuring thermal impedance, in
accordance with EIA/JESD51.
165-ball FBGA Unit
Package
13.7
°C/W
3.73
°C/W
Notes
26. The operation current is calculated with 50% read cycle and 50% write cycle.
27. Overshoot: VIH(AC) < VDDQ + 0.35 V (Pulse width less than tCYC/2), Undershoot: VIL(AC) > 0.3 V (Pulse width less than tCYC/2).
28. Tested initially and after any design or process change that may affect these parameters.
Document Number: 001-54932 Rev. *F
Page 21 of 30
CY7C15632KV18
AC Test Loads and Waveforms
Figure 5. AC Test Loads and Waveforms
VREF = 0.75V
VREF
0.75 V
VREF
OUTPUT
Z0 = 50 
Device
Under
Test
ZQ
RL = 50 
R = 50 
ALL INPUT PULSES
1.25 V
0.75 V
OUTPUT
Device
Under
VREF = 0.75 V Test ZQ
RQ =
250 
(a)
0.75 V
INCLUDING
JIG AND
SCOPE
5 pF
[29]
0.25 V
Slew Rate = 2 V/ns
RQ =
250 
(b)
Note
29. Unless otherwise noted, test conditions are based on signal transition time of 2 V/ns, timing reference levels of 0.75 V, VREF = 0.75 V, RQ = 250 , VDDQ = 1.5 V,
input pulse levels of 0.25 V to 1.25 V, and output loading of the specified IOL/IOH and load capacitance shown in (a) of Figure 5.
Document Number: 001-54932 Rev. *F
Page 22 of 30
CY7C15632KV18
Switching Characteristics
Over the Operating Range
Parameters [30, 31]
500 MHz
Description
Cypress Consortium
Parameter Parameter
VDD(typical) to the First Access [32]
tPOWER
450 MHz
400 MHz
Unit
Min
Max
Min
Max
Min
Max
1
–
1
–
1
–
ms
tCYC
tKHKH
K Clock Cycle Time
2.0
8.4
2.2
8.4
2.5
8.4
ns
tKH
tKHKL
Input Clock (K/K) HIGH
0.4
–
0.4
–
0.4
–
ns
tKL
tKLKH
Input Clock (K/K) LOW
0.4
–
0.4
–
0.4
–
ns
tKHKH
tKHKH
K Clock Rise to K Clock Rise (rising edge to rising
edge)
0.85
–
0.94
–
1.06
–
ns
0.4
–
ns
Setup Times
tSA
tAVKH
Address Setup to K Clock Rise
0.25
–
0.275
–
tSC
tIVKH
Control Setup to K Clock Rise (RPS, WPS)
0.25
–
0.275
–
0.4
–
ns
tSCDDR
tIVKH
Double Data Rate Control Setup to Clock (K/K) Rise
(BWS0, BWS1, BWS2, BWS3)
0.20
–
0.22
–
0.28
–
ns
tSD
tDVKH
D[X:0] Setup to Clock (K/K) Rise
0.20
–
0.22
–
0.28
–
ns
tHA
tKHAX
Address Hold after K Clock Rise
0.25
–
0.275
–
0.4
–
ns
tHC
tKHIX
Control Hold after K Clock Rise (RPS, WPS)
0.25
–
0.275
–
0.4
–
ns
tHCDDR
tKHIX
Double Data Rate Control Hold after Clock (K/K) Rise 0.20
(BWS0, BWS1, BWS2, BWS3)
–
0.28
–
0.28
–
ns
tHD
tKHDX
D[X:0] Hold after Clock (K/K) Rise
0.20
–
0.28
–
0.28
–
ns
–
0.45
–
0.45
–
0.45
ns
–
–0.45
–
–0.45
–
ns
–
0.45
–
0.45
–
0.45
ns
–0.45
–
–0.45
–
–0.45
–
ns
–
0.15
–
0.15
–
0.20
ns
Hold Times
Output Times
tCO
tCHQV
K/K Clock Rise to Data Valid
tDOH
tCHQX
Data Output Hold after Output K/K Clock Rise (Active –0.45
to Active)
tCCQO
tCHCQV
K/K Clock Rise to Echo Clock Valid
tCQOH
tCHCQX
Echo Clock Hold after K/K Clock Rise
tCQD
tCQHQV
Echo Clock High to Data Valid
tCQDOH
tCQHQX
Echo Clock High to Data Invalid
–0.15
–
–0.15
–
–0.20
–
ns
tCQH
tCQHCQL
Output Clock (CQ/CQ) HIGH [33]
0.75
–
0.85
–
1.0
–
ns
tCQHCQH
tCQHCQH
CQ Clock Rise to CQ Clock Rise (rising edge to rising
edge) [33]
0.75
–
0.85
–
1.0
–
ns
Notes
30. Unless otherwise noted, test conditions are based on signal transition time of 2 V/ns, timing reference levels of 0.75 V, VREF = 0.75 V, RQ = 250 , VDDQ = 1.5 V,
input pulse levels of 0.25 V to 1.25 V, and output loading of the specified IOL/IOH and load capacitance shown in (a) of Figure 5 on page 22.
31. When a part with a maximum frequency above 400 MHz is operating at a lower clock frequency, it requires the input timings of the frequency range in which it is being
operated and outputs data with the output timings of that frequency range.
32. This part has a voltage regulator internally; tPOWER is the time that the power must be supplied above VDD minimum initially before a read or write operation can be
initiated.
33. These parameters are extrapolated from the input timing parameters (tCYC/2 – 250 ps, where 250 ps is the internal jitter). These parameters are only guaranteed by
design and are not tested in production.
Document Number: 001-54932 Rev. *F
Page 23 of 30
CY7C15632KV18
Switching Characteristics (continued)
Over the Operating Range
Parameters [30, 31]
500 MHz
Description
Cypress Consortium
Parameter Parameter
tCHZ
tCHQZ
tCLZ
tCHQX1
Clock (K/K) Rise to High Z (Active to High Z) [34, 35]
Clock (K/K) Rise to Low Z
[34, 35]
[36]
Min
Max
450 MHz
Min
Max
400 MHz
Min
Max
Unit
–
0.45
–
0.45
–
0.45
ns
–0.45
–
–0.45
–
–0.45
–
ns
–0.15
0.15
–0.15
0.15
–0.20
0.20
ns
tCQHQVLD
Echo Clock High to QVLD Valid
tKC Var
tKC Var
Clock Phase Jitter
–
0.15
–
0.15
–
0.20
ns
tKC lock
tKC lock
PLL Lock Time (K)
20
–
20
–
20
–
s
tKC Reset
tKC Reset
K Static to PLL Reset [37]
30
–
30
–
30
–
ns
tQVLD
PLL Timing
Notes
34. tCHZ, tCLZ, are specified with a load capacitance of 5 pF as in (b) of Figure 5 on page 22. Transition is measured ±100 mV from steady-state voltage.
35. At any voltage and temperature tCHZ is less than tCLZ and tCHZ less than tCO.
36. tQVLD spec is applicable for both rising and falling edges of QVLD signal.
37. Hold to >VIH or <VIL.
Document Number: 001-54932 Rev. *F
Page 24 of 30
CY7C15632KV18
Switching Waveforms
Read/Write/Deselect Sequence
Figure 6. Waveform for 2.5 Cycle Read Latency [38, 39, 40]
NOP
1
WRITE
3
READ
2
READ
4
NOP
6
WRITE
5
7
8
K
t KH
t KL
t CYC
t KHKH
K
RPS
t SC
tHC
t SC
t HC
WPS
A
A0
t SA
A1
A3
A2
t HD
t HA
t SD
D
t HD
t SD
D11
D10
D12
D30
D13
D31
D32
tQVLD
t QVLD
QVLD
D33
t
tDOH
t
CLZ
CO
Q
Q00
tCQDOH
tCQD
Q01
(Read Latency = 2.5 Cycles)
Q02
Q03
Q20
Q21
tCHZ
Q22
Q23
tCCQO
tCQOH
CQ
t CQH
t CQHCQH
tCQOH
t CCQO
CQ
DON’T CARE
UNDEFINED
Notes
38. Q00 refers to output from address A0. Q01 refers to output from the next internal burst address following A0, that is, A0 + 1.
39. Outputs are disabled (High Z) one clock cycle after a NOP.
40. In this example, if address A2 = A1, then data Q20 = D10, Q21 = D11, Q22 = D12, and Q23 = D13. Write data is forwarded immediately as read results. This note
applies to the whole diagram.
Document Number: 001-54932 Rev. *F
Page 25 of 30
CY7C15632KV18
Ordering Information
The following table contains only the parts that are currently available. If you do not see what you are looking for, contact your local
sales representative. For more information, visit the Cypress website at www.cypress.com and refer to the product summary page
at http://www.cypress.com/products.
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives and distributors. To find the office
closest to you, visit us at http://www.cypress.com/go/datasheet/offices.
Speed
(MHz)
500
Ordering Code
CY7C15632KV18-500BZC
Package
Diagram
Part and Package Type
51-85180 165-ball FBGA (13 × 15 × 1.4 mm)
CY7C15632KV18-500BZXC
CY7C15632KV18-450BZC
Industrial
51-85180 165-ball FBGA (13 × 15 × 1.4 mm)
CY7C15632KV18-450BZXC
CY7C15632KV18-400BZC
Commercial
165-ball FBGA (13 × 15 × 1.4 mm) Pb-free
CY7C15632KV18-450BZXI
400
Commercial
165-ball FBGA (13 × 15 × 1.4 mm) Pb-free
CY7C15632KV18-500BZXI
450
Operating
Range
Industrial
51-85180 165-ball FBGA (13 × 15 × 1.4 mm)
CY7C15632KV18-400BZXC
Commercial
165-ball FBGA (13 × 15 × 1.4 mm) Pb-free
CY7C15632KV18-400BZXI
Industrial
Ordering Code Definitions
CY 7 C 15632 K
V18 - XXX BZ
X
X
Temperature range: X = C or I
C = Commercial; I = Industrial
Pb-free
Package Type:
BZ = 165-ball FBGA
Speed grade: XXX = 500 MHz or 450 MHz or 400 MHz
Voltage: V18 = 1.8 V VDD
Die Revision
Part Identifier:
15632 = 72-Mbit QDR II+ SRAM 4-Word Burst Architecture (2.5 Cycle Read
Latency)
Technology Code: C = CMOS
Marketing Code: 7 = SRAM
Company ID: CY = Cypress
Document Number: 001-54932 Rev. *F
Page 26 of 30
CY7C15632KV18
Package Diagram
Figure 7. 165-ball FBGA (13 × 15 × 1.4 mm) BB165D/BW165D (0.5 Ball Diameter) Package Outline, 51-85180
51-85180 *E
Document Number: 001-54932 Rev. *F
Page 27 of 30
CY7C15632KV18
Acronyms
Acronym
Document Conventions
Description
Units of Measure
DDR
double data rate
FBGA
fine-pitch ball grid array
°C
degree Celsius
HSTL
high-speed transceiver logic
MHz
megahertz
I/O
input/output
µA
microampere
JTAG
joint test action group
µs
microsecond
LSB
least significant bit
mA
milliampere
LSBU
logical single-bit upsets
mm
millimeter
LMBU
logical multi-bit upsets
ms
millisecond
MSB
most significant bit
mV
millivolt
PLL
phase-locked loop
ns
nanosecond
QDR
quad data rate

ohm
SEL
single event latch-up
%
percent
SRAM
static random access memory
pF
picofarad
TAP
test access port
ps
picosecond
TCK
test clock
V
volt
TDI
test data-in
W
watt
TDO
test data-out
TMS
test mode select
Document Number: 001-54932 Rev. *F
Symbol
Unit of Measure
Page 28 of 30
CY7C15632KV18
Document History Page
Document Title: CY7C15632KV18, 72-Mbit QDR® II+ SRAM Four-Word Burst Architecture (2.5 Cycle Read Latency)
Document Number: 001-54932
Rev.
ECN No.
Orig. of
Change
Submission
Date
Description of Change
**
2746858
VKN
07/31/09
New data sheet.
*A
2896003
NJY
03/19/10
Updated Ordering Information (Removed inactive parts).
Updated Package Diagram.
Updated links in Sales, Solutions, and Legal Information.
*B
2931775
VKN
03/13/10
Updated Capacitance (Changed value of Input Capacitance (CIN) from 2 pF to
4 pF, changed value of Output Capacitance (CO) from 3 pF to 4 pF).
Updated Ordering Information (Included CY7C15632KV18-550BZC,
CY7C15632KV18-550BZXC, CY7C15632KV18-550BZXI in the Ordering
information table).
*C
3053132
HMLA
10/12/2010
Updated Ordering Information (Updated part numbers) and added Ordering
Code Definitions.
*D
3331971
PRIT
07/29/2011
Added Acronyms and Units of Measure.
Updated in new template.
*E
3404578
PRIT
10/13/2011
Updated Ordering Information (Removed prune part number
CY7C15632KV18-500BZC).
*F
3656445
NJY / PRIT
06/26/2012
Updated Features (Removed 550 MHz frequency related information).
Updated Selection Guide (Removed 550 MHz frequency related information).
Updated Write Cycle Descriptions (Removed CY7C1561KV18 related
information).
Updated Electrical Characteristics (Removed 550 MHz frequency related
information).
Updated Switching Characteristics (Removed 550 MHz frequency related
information).
Updated Ordering Information (Updated part numbers).
Updated Package Diagram (spec 51-85180 (changed revision from *C to *E)).
Document Number: 001-54932 Rev. *F
Page 29 of 30
CY7C15632KV18
Sales, Solutions, and Legal Information
Worldwide Sales and Design Support
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office
closest to you, visit us at Cypress Locations.
Products
Automotive
Clocks & Buffers
Interface
Lighting & Power Control
PSoC Solutions
cypress.com/go/automotive
cypress.com/go/clocks
psoc.cypress.com/solutions
cypress.com/go/interface
PSoC 1 | PSoC 3 | PSoC 5
cypress.com/go/powerpsoc
cypress.com/go/plc
Memory
Optical & Image Sensing
cypress.com/go/memory
cypress.com/go/image
PSoC
Touch Sensing
cypress.com/go/psoc
cypress.com/go/touch
USB Controllers
Wireless/RF
cypress.com/go/USB
cypress.com/go/wireless
© Cypress Semiconductor Corporation, 2009-2012. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of
any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for
medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as
critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems
application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign),
United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of,
and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress
integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without
the express written permission of Cypress.
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not
assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer
assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Use may be limited by and subject to the applicable Cypress software license agreement.
Document Number: 001-54932 Rev. *F
Revised June 26, 2012
All products and company names mentioned in this document may be the trademarks of their respective holders.
Page 30 of 30