ONSEMI MC74VHCT125A_11

MC74VHCT125A
Quad Bus Buffer
with 3−State Control Inputs
The MC74VHCT125A is a high speed CMOS quad bus buffer
fabricated with silicon gate CMOS technology. It achieves high speed
operation similar to equivalent Bipolar Schottky TTL while
maintaining CMOS low power dissipation.
The MC74VHCT125A requires the 3−state control input (OE) to be
set High to place the output into the high impedance state.
The VHCT inputs are compatible with TTL levels. This device can
be used as a level converter for interfacing 3.3 V to 5.0 V, because it
has full 5.0 V CMOS level output swings.
The VHCT125A input structures provide protection when voltages
between 0 V and 5.5 V are applied, regardless of the supply voltage.
The output structures also provide protection when VCC = 0 V. These
input and output structures help prevent device destruction caused by
supply voltage − input/output voltage mismatch, battery backup, hot
insertion, etc.
The internal circuit is composed of three stages, including a buffer
output which provides high noise immunity and stable output. The
inputs tolerate voltages up to 7.0 V, allowing the interface of 5.0 V
systems to 3.0 V systems.
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MARKING
DIAGRAMS
14
SOIC−14
D SUFFIX
CASE 751A
1
1
14
1
•
•
1
14
High Speed: tPD = 3.8 ns (Typ) at VCC = 5.0 V
Low Power Dissipation: ICC = 4.0 mA (Max) at TA = 25°C
TTL−Compatible Inputs: VIL = 0.8 V; VIH = 2.0 V
Power Down Protection Provided on Inputs
Balanced Propagation Delays
Designed for 2.0 V to 5.5 V Operating Range
Low Noise: VOLP = 0.8 V (Max)
Pin and Function Compatible with Other Standard Logic Families
Latchup Performance Exceeds 300 mA
ESD Performance:
Human Body Model > 2000 V;
Machine Model > 200 V
Chip Complexity: 72 FETs or 18 Equivalent Gates
These Devices are Pb−Free and are RoHS Compliant
© Semiconductor Components Industries, LLC, 2011
May, 2011 − Rev. 9
VHCT
125A
ALYWG
G
TSSOP−14
DT SUFFIX
CASE 948G
Features
•
•
•
•
•
•
•
•
•
•
VHCT125AG
AWLYWW
1
1
SOEIAJ−14
M SUFFIX
CASE 965
VHCT125
ALYWG
1
A
L, WL
Y, YY
WW, W
G or G
= Assembly Location
= Wafer Lot
= Year
= Work Week
= Pb−Free Package
(Note: Microdot may be in either location)
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 2 of this data sheet.
Publication Order Number:
MC74VHCT125A/D
MC74VHCT125A
PIN CONNECTION
(Top View)
OE1
1
14
VCC
A1
2
13
OE4
Y1
3
12
A4
OE2
4
11
Y4
A2
5
10
OE3
Y2
6
9
A3
GND
7
8
Y3
LOGIC DIAGRAM
Active−Low Output Enables
A1
OE1
A2
OE2
A3
OE3
FUNCTION TABLE
A4
VHCT125A
Inputs
OE4
Output
A
OE
Y
H
L
X
L
L
H
H
L
Z
2
3
Y1
1
5
6
Y2
4
9
8
Y3
10
12
11
Y4
13
ORDERING INFORMATION
Package
Shipping†
MC74VHCT125ADR2G
SOIC−14
(Pb−Free)
2500 Tape & Reel
MC74VHCT125ADTRG
TSSOP−14*
2500 Tape & Reel
MC74VHCT125AMG
SOEIAJ−14
(Pb−Free)
50 Units / Rail
MC74VHCT125AMELG
SOEIAJ−14
(Pb−Free)
2000 Tape & Reel
Device
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
*This package is inherently Pb−Free.
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2
MC74VHCT125A
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MAXIMUM RATINGS
Symbol
Parameter
VCC
DC Supply Voltage
Value
Unit
–0.5 to +7.0
V
–0.5 to +7.0
V
–0.5 to +7.0
–0.5 to VCC +0.5
V
Vin
DC Input Voltage
Vout
DC Output Voltage
IIK
Input Diode Current
−20
mA
IOK
Output Diode Current (VOUT < GND; VOUT > VCC)
$20
mA
Iout
DC Output Current, per Pin
$25
mA
ICC
DC Supply Current, VCC and GND Pins
$75
mA
PD
Power Dissipation in Still Air,
500
450
mW
Tstg
Storage Temperature
–65 to +150
°C
Output in 3−State
High or Low State
SOIC Packages†
TSSOP Package†
This device contains protection
circuitry to guard against damage
due to high static voltages or electric
fields. However, precautions must
be taken to avoid applications of any
voltage higher than maximum rated
voltages to this high−impedance circuit. For proper operation, Vin and
Vout should be constrained to the
range GND v (Vin or Vout) v VCC.
Unused inputs must always be
tied to an appropriate logic voltage
level (e.g., either GND or V CC ).
Unused outputs must be left open.
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress
ratings only. Functional operation above the Recommended Operating Conditions is not implied.
Extended exposure to stresses above the Recommended Operating Conditions may affect device
reliability.
†Derating — SOIC Packages: – 7 mW/°C from 65° to 125°C
TSSOP Package: − 6.1 mW/°C from 65° to 125°C
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RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
VCC
DC Supply Voltage
Vin
DC Input Voltage
Vout
DC Output Voltage
TA
Operating Temperature
tr, tf
Input Rise and Fall Time
Min
Max
Unit
2.0
5.5
V
0
5.5
V
0
0
5.5
VCC
V
−55
+125
°C
0
20
ns/V
Output in 3−State
High or Low State
VCC = 5.0 V $0.5 V
DC ELECTRICAL CHARACTERISTICS
Symbol
Parameter
Test Conditions
Min
1.2
2.0
2.0
VIH
Minimum High−Level Input
Voltage
3.0
4.5
5.5
VIL
Maximum Low−Level Input
Voltage
3.0
4.5
5.5
VOH
Minimum High−Level Output
Voltage
VIN = VIH or VIL
VOL
Maximum Low−Level Output
Voltage
VIN = VIH or VIL
TA = 25°C
VCC
(V)
Typ
TA ≤ 85°C
Max
Min
1.2
2.0
2.0
0.53
0.8
0.8
VIN = VIH or VIL
IOH = − 50 mA
3.0
4.5
2.9
4.4
VIN = VIH or VIL
IOH = −4.0 mA
IOH = −8.0 mA
3.0
4.5
2.58
3.94
VIN = VIH or VIL
IOL = 50 mA
3.0
4.5
VIN = VIH or VIL
IOL = 4.0 mA
IOL = 8.0 mA
Max
3.0
4.5
0.0
0.0
TA ≤ 125°C
Min
Max
1.2
2.0
2.0
0.53
0.8
0.8
V
0.53
0.8
0.8
2.9
4.4
2.9
4.4
2.48
3.80
2.34
3.66
Unit
V
V
0.1
0.1
0.1
0.1
0.1
0.1
3.0
4.5
0.36
0.36
0.44
0.44
0.52
0.52
V
IIN
Maximum Input Leakage Current
VIN = 5.5 V or GND
0 to
5.5
$0.1
$0.1
$0.1
mA
ICC
Maximum Quiescent Supply
Current
VIN = VCC or GND
5.5
2.0
20
40
mA
ICCT
Quiescent Supply Current
Input: VIN = 3.4 V
5.5
1.35
1.50
1.65
mA
IOZ
Maximum Three−State Leakage
Current
VIN = VIH or VILVOUT = VCC or
GND
5.5
$0.25
$2.5
$2.5
mA
Output Leakage Current
VOUT = 5.5 V
0.0
0.5
5.0
10
mA
IOPD
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3
MC74VHCT125A
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ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ
AC ELECTRICAL CHARACTERISTICS (Input tr = tf = 3.0 ns)
TA = 25°C
Min
TA = ≤ 85°C
TA ≤ 125°C
Typ
Max
Min
Max
Min
Max
Unit
9.5
13.0
12.0
16.0
ns
1.0
1.0
6.5
8.5
8.5
10.5
8.0
11.5
1.0
1.0
9.5
13.0
11.5
15.0
3.6
5.1
5.1
7.1
1.0
1.0
6.0
8.0
7.5
9.5
VCC = 3.3 $ 0.3 V CL = 50 pF
RL = 1.0 kW
9.5
13.2
1.0
15.0
18.0
VCC = 5.0 $ 0.5 V CL = 50 pF
RL = 1.0 kW
6.1
8.8
1.0
10.0
12.0
Symbol
Parameter
Test Conditions
tPLH,
tPHL
Maximum Propagation Delay,
A to Y
VCC = 3.3 $ 0.3 V CL = 15 pF
CL = 50 pF
5.6
8.1
8.0
11.5
1.0
1.0
VCC = 5.0 $ 0.5 V CL = 15 pF
CL = 50 pF
3.8
5.3
5.5
7.5
VCC = 3.3 $ 0.3 V CL = 15 pF
RL = 1.0 kW
CL = 50 pF
5.4
7.9
VCC = 5.0 $ 0.5 V CL = 15 pF
RL = 1.0 kW
CL = 50 pF
tPZL,
tPZH
tPLZ,
tPHZ
tOSLH,
tOSHL
Maximum Output Enable
TIme,OE to Y
Maximum Output Disable
Time,OE to Y
Output−to−Output Skew
VCC = 3.3 $ 0.3 V CL = 50 pF
(Note 1)
1.5
1.5
2.0
VCC = 5.0 $ 0.5 V CL = 50 pF
(Note 1)
1.0
1.0
1.5
10
10
10
Cin
Maximum Input Capacitance
4
Cout
Maximum Three−State Output
Capacitance (Output in High
Impedance State)
6
ns
ns
ns
pF
pF
Typical @ 25°C, VCC = 5.0V
CPD
14
Power Dissipation Capacitance (Note 2)
pF
1. Parameter guaranteed by design. tOSLH = |tPLHm − tPLHn|, tOSHL = |tPHLm − tPHLn|.
2. CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load.
Average operating current can be obtained by the equation: ICC(OPR) = CPD VCC fin + ICC / 4 (per buffer). CPD is used to determine the
no−load dynamic power consumption; PD = CPD VCC2 fin + ICC VCC.
NOISE CHARACTERISTICS (Input tr = tf = 3.0 ns, CL = 50 pF, VCC = 5.0 V)
TA = 25°C
Symbol
Characteristic
Typ
Max
Unit
VOLP
Quiet Output Maximum Dynamic VOL
0.3
0.8
V
VOLV
Quiet Output Minimum Dynamic VOL
− 0.3
− 0.8
V
VIHD
Minimum High Level Dynamic Input Voltage
3.5
V
VILD
Maximum Low Level Dynamic Input Voltage
1.5
V
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4
MC74VHCT125A
SWITCHING WAVEFORMS
3.0V
1.5V
A
GND
tPHL
tPLH
VOH
1.5V
Y
VOL
Figure 1.
3.0V
OE
1.5V
GND
tPZL
Y
tPLZ
HIGH
IMPEDANCE
1.5V
tPZH
VOL + 0.3V
tPHZ
VOH - 0.3V
Y
1.5V
HIGH
IMPEDANCE
Figure 2.
TEST POINT
OUTPUT
DEVICE
UNDER
TEST
CL*
*Includes all probe and jig capacitance
Figure 3. Test Circuit
TEST POINT
DEVICE
UNDER
TEST
OUTPUT
CONNECT TO VCC WHEN
TESTING tPLZ AND tPZL.
CONNECT TO GND WHEN
TESTING tPHZ AND tPZH.
1 kW
CL *
*Includes all probe and jig capacitance
Figure 4. Test Circuit
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5
MC74VHCT125A
PACKAGE DIMENSIONS
SOIC−14
D SUFFIX
CASE 751A−03
ISSUE J
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSIONS A AND B DO NOT INCLUDE
MOLD PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006)
PER SIDE.
5. DIMENSION D DOES NOT INCLUDE
DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.127
(0.005) TOTAL IN EXCESS OF THE D
DIMENSION AT MAXIMUM MATERIAL
CONDITION.
−A−
14
8
−B−
P 7 PL
0.25 (0.010)
B
M
7
1
G
−T−
0.25 (0.010)
M
T B
J
M
K
D 14 PL
F
R X 45 _
C
SEATING
PLANE
M
S
A
S
DIM
A
B
C
D
F
G
J
K
M
P
R
SOLDERING FOOTPRINT
7X
7.04
14X
1.52
1
14X
0.58
1.27
PITCH
DIMENSIONS: MILLIMETERS
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6
MILLIMETERS
MIN
MAX
8.55
8.75
3.80
4.00
1.35
1.75
0.35
0.49
0.40
1.25
1.27 BSC
0.19
0.25
0.10
0.25
0_
7_
5.80
6.20
0.25
0.50
INCHES
MIN
MAX
0.337 0.344
0.150 0.157
0.054 0.068
0.014 0.019
0.016 0.049
0.050 BSC
0.008 0.009
0.004 0.009
0_
7_
0.228 0.244
0.010 0.019
MC74VHCT125A
PACKAGE DIMENSIONS
TSSOP−14
DT SUFFIX
CASE 948G−01
ISSUE B
14X K REF
0.10 (0.004)
0.15 (0.006) T U
M
T U
V
S
S
N
2X
14
L/2
0.25 (0.010)
8
M
B
−U−
L
PIN 1
IDENT.
N
F
7
1
0.15 (0.006) T U
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION A DOES NOT INCLUDE MOLD
FLASH, PROTRUSIONS OR GATE BURRS.
MOLD FLASH OR GATE BURRS SHALL NOT
EXCEED 0.15 (0.006) PER SIDE.
4. DIMENSION B DOES NOT INCLUDE
INTERLEAD FLASH OR PROTRUSION.
INTERLEAD FLASH OR PROTRUSION SHALL
NOT EXCEED 0.25 (0.010) PER SIDE.
5. DIMENSION K DOES NOT INCLUDE
DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.08
(0.003) TOTAL IN EXCESS OF THE K
DIMENSION AT MAXIMUM MATERIAL
CONDITION.
6. TERMINAL NUMBERS ARE SHOWN FOR
REFERENCE ONLY.
7. DIMENSION A AND B ARE TO BE
DETERMINED AT DATUM PLANE −W−.
S
S
DETAIL E
K
A
−V−
ÉÉÉ
ÇÇÇ
ÇÇÇ
ÉÉÉ
K1
J J1
SECTION N−N
−W−
C
0.10 (0.004)
−T− SEATING
PLANE
D
H
G
DETAIL E
DIM
A
B
C
D
F
G
H
J
J1
K
K1
L
M
MILLIMETERS
INCHES
MIN
MAX
MIN MAX
4.90
5.10 0.193 0.200
4.30
4.50 0.169 0.177
−−−
1.20
−−− 0.047
0.05
0.15 0.002 0.006
0.50
0.75 0.020 0.030
0.65 BSC
0.026 BSC
0.50
0.60 0.020 0.024
0.09
0.20 0.004 0.008
0.09
0.16 0.004 0.006
0.19
0.30 0.007 0.012
0.19
0.25 0.007 0.010
6.40 BSC
0.252 BSC
0_
8_
0_
8_
SOLDERING FOOTPRINT
7.06
1
0.65
PITCH
14X
0.36
14X
1.26
DIMENSIONS: MILLIMETERS
http://onsemi.com
7
MC74VHCT125A
PACKAGE DIMENSIONS
SOEIAJ−14
M SUFFIX
CASE 965−01
ISSUE B
14
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSIONS D AND E DO NOT INCLUDE
MOLD FLASH OR PROTRUSIONS AND ARE
MEASURED AT THE PARTING LINE. MOLD FLASH
OR PROTRUSIONS SHALL NOT EXCEED 0.15
(0.006) PER SIDE.
4. TERMINAL NUMBERS ARE SHOWN FOR
REFERENCE ONLY.
5. THE LEAD WIDTH DIMENSION (b) DOES NOT
INCLUDE DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.08 (0.003)
TOTAL IN EXCESS OF THE LEAD WIDTH
DIMENSION AT MAXIMUM MATERIAL CONDITION.
DAMBAR CANNOT BE LOCATED ON THE LOWER
RADIUS OR THE FOOT. MINIMUM SPACE
BETWEEN PROTRUSIONS AND ADJACENT LEAD
TO BE 0.46 ( 0.018).
LE
8
Q1
E HE
L
7
1
M_
DETAIL P
Z
D
VIEW P
A
e
A1
b
0.13 (0.005)
c
M
0.10 (0.004)
DIM
A
A1
b
c
D
E
e
HE
L
LE
M
Q1
Z
MILLIMETERS
MIN
MAX
--2.05
0.05
0.20
0.35
0.50
0.10
0.20
9.90
10.50
5.10
5.45
1.27 BSC
7.40
8.20
0.50
0.85
1.10
1.50
10 _
0_
0.70
0.90
--1.42
INCHES
MIN
MAX
--0.081
0.002
0.008
0.014
0.020
0.004
0.008
0.390
0.413
0.201
0.215
0.050 BSC
0.291
0.323
0.020
0.033
0.043
0.059
10 _
0_
0.028
0.035
--0.056
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MC74VHCT125A/D