TC74VHC165F/FT/FK
TOSHIBA CMOS Digital Integrated Circuit
Silicon Monolithic
TC74VHC165F,TC74VHC165FT,TC74VHC165FK
8-Bit Shift Register (P-IN, S-OUT)
TC74VHC165F
The TC74VHC165 is an advanced high speed CMOS 8-BIT
PARALLEL/SERIAL-IN, SERIAL-OUT SHIFT REGISTER
fabricated with silicon gate C2MOS technology.
It achieves the high speed operation similar to equivalent Bipolar
Schottky TTL while maintaining the CMOS low power dissipation.
It consists of parallel-in or serial-in, serial-out 8-bit shift register
with a gated clock input. When the SHIFT/ LOAD input is held
high, the serial data input is enabled and the eight frip-frops
perform serial shifting with each clock pulse.
When the SHIFT/ LOAD input is held low, the parallel data is
loaded synchronously into the register at positive going transition of
the clock pulse.
The CK-INH input should be shifted high only when the CK input
is held high.
An Input protection circuit ensures that 0 to 5.5 V can be applied
to the input pins without regard to the supply voltage. This device
can be used to interface 5 V to 3 V systems and on two supply
systems such as battery back up. This circuit prevents device
destruction due to mismatched supply and input voltages.
TC74VHC165FT
TC74VHC165FK
Features
•
High speed: fmax = 150 MHz (typ.) at VCC = 5 V
•
Low power dissipation: ICC = 4 μA (max) at Ta = 25°C
•
High noise immunity: VNIH = VNIL = 28% VCC (min)
•
•
Power down protection is provided on all inputs.
Balanced propagation delays: tpLH ∼
− tpHL
•
Wide operating voltage range: VCC (opr) = 2 V to 5.5 V
•
Pin and function compatible with 74ALS165
Weight
SOP16-P-300-1.27A: 0.18 g (typ.)
TSSOP16-P-0044-0.65A: 0.06 g (typ.)
VSSOP16-P-0030-0.50: 0.02 g (typ.)
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2012-02-29
TC74VHC165F/FT/FK
Pin Assignment
IEC Logic Symbol
S/L
S/L
1
16
VCC
CK
2
15
CK INH
E
3
14
D
F
4
13
C
G
5
12
B
H
6
11
A
QH
7
10
SI
GND
8
9
QH
CK INH
CK
SI
A
B
C
D
E
F
G
H
(1)
(15)
(2)
(10)
(11)
(12)
(13)
(14)
(3)
SRG 8
C1 [LOAD]
> 1
C2/
2D
1D
1D
(4)
(5)
(6)
1D
(9)
(7)
QH
QH
Truth Table
Internal
Outputs
Inputs
Outputs
SHIFT/
LOAD
CK
INH
CK
SERIAL
IN
PARALLEL
A······H
QA
QB
QH
QH
L
X
X
X
a······h
a
b
h
h
H
L
H
X
H
QAn
QGn
QGn
H
L
L
X
L
QAn
QGn
QGn
H
L
H
X
H
QAn
QGn
QGn
H
L
L
X
L
QAn
QGn
QGn
H
X
H
X
X
No Change
H
H
X
X
X
No Change
X: Don’t care
a······h: The level of steady state input voltage at inputs A through H respectively
QAn to QGn: The level of QA to QG, respectively, before the most recent positive transition of the CK.
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TC74VHC165F/FT/FK
Timing Chart
CK
CK INH
Serial Input
Shift/ LOAD
A
H
B
L
C
L
D
H
E
L
F
H
G
L
H
H
Output
QH
H
L
H
L
H
L
L
H
Output
QH
L
H
L
H
L
H
H
L
Parallel
Inputs
SERIAL SHIFT
DON’T CARE UNTIL S/L GOES “L”
INHIBIT
LOAD
3
SERIAL SHIFT
2012-02-29
TC74VHC165F/FT/FK
System Diagram
A
B
C
D
E
F
G
4
H
11
12
13
14
3
5
6
PD
D Q
PD
D Q
PD
D Q
PD
D Q
PD
D Q
PD
D Q
PD
D Q
PD
D Q
9
CK
S/L
CK
S/L
CK
S/L
CK
S/L
CK
S/L
CK
S/L
CK
S/L
CK
S/L
7
SERIAL
INPUT
10
CLOCK
2
QH
QH
15
CLOCK
INHIBIT
PD
φL
Qn
D
1
ϕL
ϕ
SHIFT/
LOAD
φ
φ
φ
ϕ
ϕ
CK
ϕL
φL
S/L
Absolute Maximum Ratings (Note)
Characteristics
Symbol
Rating
Unit
Supply voltage range
VCC
−0.5 to 7.0
V
DC input voltage
VIN
−0.5 to 7.0
V
DC output voltage
VOUT
−0.5 to VCC + 0.5
V
Input diode current
IIK
−20
mA
Output diode current
IOK
±20
mA
DC output current
IOUT
±25
mA
DC VCC/ground current
ICC
±50
mA
Power dissipation
PD
180
mW
Storage temperature
Tstg
−65 to 150
°C
Note:
Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or
even destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
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TC74VHC165F/FT/FK
Operating Ranges (Note)
Characteristics
Symbol
Rating
Unit
Supply voltage
VCC
2.0 to 5.5
V
Input voltage
VIN
0 to 5.5
V
VOUT
0 to VCC
V
−40 to 85
°C
Output voltage
Operating temperature
Topr
Input rise and fall time
Note:
0 to 100 (VCC = 3.3 ± 0.3 V)
dt/dv
ns/V
0 to 20 (VCC = 5 ± 0.5 V)
The operating ranges must be maintained to ensure the normal operation of the device.
Unused inputs must be tied to either VCC or GND.
Electrical Characteristics
DC Characteristics
Test Condition
Characteristics
Symbol
VCC
(V)
2.0
High-level input
voltage
VIH
3.0
to
5.5
―
Min
Typ.
Max
―
―
VCC ×
0.7
―
―
―
―
1.50
2.0
Low-level input
voltage
High-level output
voltage
Low-level output
voltage
VIL
VOH
VOL
3.0
to
5.5
―
VIN
= VIH or
VIL
VIN
= VIH or
VIL
Ta =
−40 to 85°C
Ta = 25°C
0.50
Min
1.50
VCC ×
0.7
―
―
―
―
―
―
2.0
1.9
2.0
―
1.9
―
3.0
2.9
3.0
―
2.9
―
4.5
4.4
4.5
―
4.4
―
IOH = −4 mA
3.0
2.58
―
―
2.48
―
IOH = −8 mA
4.5
3.94
―
―
3.80
―
2.0
―
0.0
0.1
―
0.1
3.0
―
0.0
0.1
―
0.1
4.5
―
0.0
0.1
―
0.1
IOL = 4 mA
3.0
―
―
0.36
―
0.44
IOL = 8 mA
4.5
―
―
0.36
―
0.44
IOL = 50 μA
V
0.50
VCC ×
0.3
VCC ×
0.3
IOH = −50 μA
Unit
Max
V
V
V
Input leakage
current
IIN
VIN = 5.5 V or GND
0 to
5.5
―
―
±0.1
―
±1.0
μA
Quiescent supply
current
ICC
VIN = VCC or GND
5.5
―
―
4.0
―
40.0
μA
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TC74VHC165F/FT/FK
Timing Requirements (input: tr = tf = 3 ns)
Characteristics
Symbol
Minimum pulse width
tw (L)
(CK, CK INH)
tw (H)
Minimum pulse width
( S/L )
Minimum set-up time
(PI- S/L )
Minimum set-up time
(SI-CK, CK INH)
Minimum set-up time
( S/L -CK, CK INH)
Minimum hold time
(PI- S/L )
Minimum hold time
(SI-CK, CK INH)
Minimum hold time
( S/L -CK, CK INH)
―
tw (L)
―
ts
―
ts
―
ts
―
th
―
th
―
th
―
trem
―
Minimum removal time
(CK INH-CK)
Ta =
25°C
Ta =
−40 to
85°C
VCC (V)
Limit
Limit
3.3 ± 0.3
6.0
7.0
5.0 ± 0.5
4.0
4.0
3.3 ± 0.3
7.5
9.0
5.0 ± 0.5
5.0
6.0
3.3 ± 0.3
7.5
8.5
5.0 ± 0.5
5.0
5.0
3.3 ± 0.3
5.0
6.0
5.0 ± 0.5
4.0
4.0
3.3 ± 0.3
5.0
6.0
5.0 ± 0.5
4.0
4.0
3.3 ± 0.3
0.5
0.5
5.0 ± 0.5
1.0
1.0
3.3 ± 0.3
0.0
0.0
5.0 ± 0.5
0.5
0.5
3.3 ± 0.3
0.0
0.0
5.0 ± 0.5
0.5
0.5
3.3 ± 0.3
5.0
5.0
5.0 ± 0.5
3.5
3.5
Test Condition
(CK-CK INH)
6
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
2012-02-29
TC74VHC165F/FT/FK
AC Characteristics (input: tr = tf = 3 ns)
Characteristics
VCC (V)
Propagation delay time
tpLH
(CK, CK INH-QH, QH )
tpHL
Propagation delay time
tpLH
( S/L -QH, QH )
tpHL
Propagation delay time
tpLH
(H-QH, QH )
tpHL
3.3 ± 0.3
―
5.0 ± 0.5
3.3 ± 0.3
―
5.0 ± 0.5
3.3 ± 0.3
―
5.0 ± 0.5
3.3 ± 0.3
Maximum clock frequency
fmax
―
5.0 ± 0.5
Input capacitance
CIN
Power dissipation
capacitance
CPD
Ta = −40 to
85°C
Ta = 25°C
Test Condition
Symbol
Unit
CL (pF)
Min
Typ.
Max
Min
Max
15
―
9.9
15.4
1.0
18.0
50
―
12.4
18.9
1.0
21.5
15
―
6.6
9.9
1.0
11.5
50
―
8.1
11.9
1.0
13.5
15
―
9.9
15.8
1.0
18.5
50
―
12.4
19.3
1.0
22.0
15
―
6.7
9.9
1.0
11.5
50
―
8.2
11.9
1.0
13.5
15
―
9.2
14.1
1.0
16.5
50
―
11.7
17.6
1.0
20.0
15
―
5.9
9.0
1.0
10.5
50
―
7.4
11.0
1.0
12.5
15
65
85
―
55
―
50
60
105
―
50
―
15
110
150
―
90
―
50
95
130
―
85
―
―
4
10
―
10
pF
―
50
―
―
―
pF
―
(Note)
ns
ns
ns
MHz
Note: CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating
current consumption without load.
Average operating current can be obtained by the equation:
ICC (opr) = CPD·VCC·fIN + ICC
Input Equivalent Circuit
INPUT
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TC74VHC165F/FT/FK
Package Dimensions
Weight: 0.18 g (typ.)
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TC74VHC165F/FT/FK
Package Dimensions
Weight: 0.06 g (typ.)
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TC74VHC165F/FT/FK
Package Dimensions
Weight: 0.02 g (typ.)
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TC74VHC165F/FT/FK
RESTRICTIONS ON PRODUCT USE
• Toshiba Corporation, and its subsidiaries and affiliates (collectively "TOSHIBA"), reserve the right to make changes to the information
in this document, and related hardware, software and systems (collectively "Product") without notice.
• This document and any information herein may not be reproduced without prior written permission from TOSHIBA. Even with
TOSHIBA's written permission, reproduction is permissible only if reproduction is without alteration/omission.
• Though TOSHIBA works continually to improve Product's quality and reliability, Product can malfunction or fail. Customers are
responsible for complying with safety standards and for providing adequate designs and safeguards for their hardware, software and
systems which minimize risk and avoid situations in which a malfunction or failure of Product could cause loss of human life, bodily
injury or damage to property, including data loss or corruption. Before customers use the Product, create designs including the
Product, or incorporate the Product into their own applications, customers must also refer to and comply with (a) the latest versions of
all relevant TOSHIBA information, including without limitation, this document, the specifications, the data sheets and application notes
for Product and the precautions and conditions set forth in the "TOSHIBA Semiconductor Reliability Handbook" and (b) the
instructions for the application with which the Product will be used with or for. Customers are solely responsible for all aspects of their
own product design or applications, including but not limited to (a) determining the appropriateness of the use of this Product in such
design or applications; (b) evaluating and determining the applicability of any information contained in this document, or in charts,
diagrams, programs, algorithms, sample application circuits, or any other referenced documents; and (c) validating all operating
parameters for such designs and applications. TOSHIBA ASSUMES NO LIABILITY FOR CUSTOMERS' PRODUCT DESIGN OR
APPLICATIONS.
• PRODUCT IS NEITHER INTENDED NOR WARRANTED FOR USE IN EQUIPMENTS OR SYSTEMS THAT REQUIRE
EXTRAORDINARILY HIGH LEVELS OF QUALITY AND/OR RELIABILITY, AND/OR A MALFUNCTION OR FAILURE OF WHICH
MAY CAUSE LOSS OF HUMAN LIFE, BODILY INJURY, SERIOUS PROPERTY DAMAGE AND/OR SERIOUS PUBLIC IMPACT
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limitation, equipment used in nuclear facilities, equipment used in the aerospace industry, medical equipment, equipment used for
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including without limitation, the EU RoHS Directive. TOSHIBA ASSUMES NO LIABILITY FOR DAMAGES OR LOSSES
OCCURRING AS A RESULT OF NONCOMPLIANCE WITH APPLICABLE LAWS AND REGULATIONS.
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